A device, method, terminal and storage medium for measuring component aging equipment

Abstract

The present application relates to a component aging equipment metering device, method, terminal and storage medium, which are used to measure the aging equipment. The device includes: a calibration board, a standard metering device and an industrial control device. The industrial control device is used to obtain the signal test requirements of the aging equipment, determine the target test signal based on the signal test requirements, generate a test instruction, and send the test instruction to the aging equipment, the calibration board and the standard metering device; the aging equipment is used to output a test signal based on the test instruction; the calibration board is used to configure a signal test path based on the target test signal, and obtain the target test signal in the test signal based on the signal test path; the standard metering device is used to measure the target test signal based on the test instruction to obtain metering data; the industrial control device is also used to organize and analyze the metering data, obtain the organized results and output them. The present application has the effect of improving the signal metering accuracy and efficiency of the aging equipment.

Description

Technical Field

[0001] The present application relates to the technical field of component aging, and in particular to a component aging equipment measurement device, method, terminal and storage medium. Background Art

[0002] Component burn-in occurs when components are subjected to continuous environmental stress over an extended period at a specific ambient temperature. This combined electrical and thermal stress accelerates various physical and chemical reactions within the components. Environmental stress screening includes not only high-temperature stress but also a variety of other stresses, such as temperature cycling and random vibration. Component burn-in can expose potential defects early, thereby eliminating prematurely failing products.

[0003] Aging of components is generally achieved using a dedicated aging system or aging equipment. After a long period of use, there will be a certain deviation between the actual output parameters inside the aging equipment and the set parameters. Therefore, the aging equipment needs to be measured and calibrated regularly.

[0004] Due to the special functional structure of component aging equipment, the output value of the measured parameter of each aging unit is inside the component aging equipment. Direct measurement cannot reach the measurement point, so a calibration board must be designed to lead out the measured signals separately to realize various measurement operations of the measured signals.

[0005] The current implementation requires plugging an extended test board into the corresponding slot on the burn-in device to establish a connection between the extended test board and the burn-in device. The extended test board's test port is then connected to the metering device and a standard load via a line. The burn-in device is then manually controlled to generate the required test voltage, and the data on the meter is manually read and recorded. However, when the number of signals to be tested is large, staff must constantly switch test lines, significantly increasing the workload. This switching process can easily lead to misoperations, resulting in test line errors and extremely low signal measurement accuracy and efficiency for the burn-in device. Summary of the Invention

[0006] In order to improve the signal measurement accuracy and efficiency of aging equipment, the present application provides a component aging equipment measurement device, method, terminal and storage medium.

[0007] In a first aspect, the present application provides a device for measuring component aging equipment, which adopts the following technical solution:

[0008] A component aging equipment measuring device, used for measuring the aging equipment, wherein the aging equipment is used for performing aging treatment on the components, comprising:

[0009] a calibration board connected to the aging test equipment;

[0010] a standard metrology device connected to the calibration plate;

[0011] and industrial control equipment, the industrial control equipment being connected to the aging equipment, the standard board, and the standard measurement equipment respectively;

[0012] The industrial control device is configured to obtain a signal test requirement of the burn-in device, generate a test instruction based on the signal test requirement, the test instruction including a target test signal, and send the test instruction to the burn-in device, the calibration board, and the standard measurement device;

[0013] The aging device is configured to output a test signal based on the test instruction;

[0014] The calibration board is configured to configure a signal test path based on the target test signal, and obtain the target test signal from the test signal based on the signal test path;

[0015] The standard metering device is used to measure the target test signal based on the test instruction to obtain metering data.

[0016] By adopting the above technical solution, the aging equipment automatically starts according to the test instructions and outputs the test signal; the calibration board automatically configures the signal test path according to the target test signal to obtain the target test signal in the aging equipment test signal, and the standard measuring equipment measures the target test signal. The obtained measurement data is automatically obtained by the industrial control equipment. The entire process reduces the misoperation caused by manual operation and the measurement errors caused by improper operation, and greatly improves the signal measurement accuracy and efficiency of the aging equipment.

[0017] Optionally, the calibration board includes an extension test board and a voltage test board card, the extension test board is connected to the aging device, the voltage test board card is configured with a matrix switch circuit, and the voltage test board card is respectively connected to the extension test board and the standard measurement device through the matrix switch circuit;

[0018] The extended test board is used to lead the test signal out of the aging device;

[0019] The voltage test board is used to receive the test signal led out by the extended test board, and adjust the matrix switch circuit according to the test instruction, turn on the signal test path of the target test signal, and output the target test signal based on the signal test path.

[0020] By adopting the above technical solution, the test signal can be led out from the inside of the aging equipment, and the signal test path can be automatically configured according to the test instructions. The target test signal can be selected from the test signals. Compared with workers adjusting the test line, the measurement accuracy and efficiency are improved.

[0021] Optionally, the industrial control device is further used to organize and analyze the measurement data, obtain and output the organized results;

[0022] The industrial control equipment includes a processing module, a display module and an output module;

[0023] The processing module is used to obtain the measurement data, organize and analyze the measurement data, and obtain calibration information;

[0024] The display module is used to display the measurement data and the calibration information in real time;

[0025] The output module is used to obtain a preset data report, and record the measurement data and the calibration information into the data report and output it.

[0026] By adopting the above technical solution, the measurement data and calibration information can be displayed in real time and output in the form of data reports, so that the signal measurement status of the aging equipment can be intuitively understood.

[0027] Optionally, the signal test type of the test signal includes a secondary power supply test signal, a digital signal and / or an analog signal generated by the aging device.

[0028] Optionally, the calibration board includes a communication interface, a voltage test interface, a current test interface, a control circuit, a voltage test switch, a range switching switch, a current switching matrix switch, a voltage and 40-way current output interface;

[0029] The calibration board is connected to the industrial control equipment via the communication interface;

[0030] The voltage and 40-channel current output interface is connected to the aging device, and is used to lead out the voltage and 40-channel current test signals of the aging device;

[0031] The calibration board is connected to the standard measurement equipment through the voltage test interface and the current test interface;

[0032] The control circuit is used to control the conduction of the voltage test switch, the range switching switch and the current switching matrix switch according to the test instruction, and configure the signal test path of the target test signal to obtain the target test signal.

[0033] By adopting the above technical solution, the voltage and 40 current signals of the aging equipment can be measured.

[0034] Optionally, the component aging equipment measuring device according to claim 1 is characterized in that the calibration board includes a communication interface, a signal test interface, a control circuit, a test switching matrix switch, a load switching matrix switch and a 64-channel digital signal output interface;

[0035] The communication interface is used to establish a communication connection between the calibration board and the industrial control equipment;

[0036] The 64-channel digital signal output interface is used to lead out the 64-channel digital signals inside the aging device;

[0037] The signal test interface is used to establish a connection between the calibration board and a preset test instrument for testing digital signals;

[0038] The control circuit is used to control the conduction of the test switching matrix switch and the load switching matrix switch, and configure a signal test path of the target test signal to obtain the target test signal.

[0039] By adopting the above technical solution, 64 channels of digital signals of aging equipment can be measured.

[0040] Optionally, the calibration board includes a communication interface, a secondary power supply test interface, an analog signal test interface, a control circuit, a secondary power supply test switch, an analog signal switch, a secondary power supply and an analog signal output interface;

[0041] The communication interface is used to establish a connection between the calibration board and the industrial control equipment;

[0042] The secondary power supply test interface is used to establish a connection between the calibration board and the standard measurement equipment;

[0043] The analog signal test interface is used to establish a connection between the calibration board and a preset analog signal test instrument;

[0044] The secondary power supply and analog signal output interface is used to lead out the secondary power supply signal and analog signal inside the aging device;

[0045] The control circuit is used to control the conduction of the secondary power supply test switching switch and the analog signal switching switch, and configure the signal test path of the target test signal to obtain the target test signal.

[0046] By adopting the above technical solution, the secondary power supply signal and analog signal of the aging equipment can be measured.

[0047] In a second aspect, the present application provides a component aging equipment measurement method, which adopts the following technical solution:

[0048] A component aging equipment measurement method, characterized in that it is applied to the above-mentioned component aging equipment measurement device, comprising the following steps:

[0049] Acquiring a signal test requirement of the burn-in device, and generating a test instruction based on the signal test requirement, wherein the test instruction includes a target test signal;

[0050] Based on the test instruction, controlling the aging device to output a test signal;

[0051] Based on the target test signal, controlling the calibration board to configure a signal test path, and acquiring the target test signal in the test signal based on the signal test path;

[0052] Based on the test instruction, the standard metering device is controlled to measure the target test signal to obtain metering data.

[0053] By adopting the above technical solution, test instructions are generated according to the signal test requirements of the aging equipment, and the aging equipment is controlled to automatically start according to the test instructions and output the test signal; according to the test instructions, the calibration board is controlled to automatically configure the signal test path according to the target test signal to obtain the target test signal in the aging equipment test signal, and then the standard measuring equipment is controlled based on the test instructions to measure the target test signal, and the obtained measurement data is automatically obtained by the industrial control equipment. The whole process reduces the misoperation caused by manual operation and the measurement errors caused by improper operation, and greatly improves the signal measurement accuracy and efficiency of the aging equipment.

[0054] In a third aspect, the present application provides a terminal device that adopts the following technical solution:

[0055] A terminal device includes a memory, a processor, and a computer program stored in the memory and capable of running on the processor. When the processor loads and executes the computer program, the above-mentioned component aging equipment measurement method is adopted.

[0056] By adopting the above technical solution, a computer program is generated by the above-mentioned component aging equipment measurement method and stored in a memory so as to be loaded and executed by a processor. Thus, a terminal device is manufactured based on the memory and the processor for easy use.

[0057] In a fourth aspect, the present application provides a computer-readable storage medium, which adopts the following technical solution:

[0058] A computer-readable storage medium stores a computer program, which, when loaded and executed by a processor, uses the above-mentioned component aging equipment measurement method.

[0059] By adopting the above technical solution, a computer program is generated by the above-mentioned component aging equipment measurement method and stored in a computer-readable storage medium so as to be loaded and executed by a processor. The computer-readable storage medium facilitates the readability and storage of the computer program. BRIEF DESCRIPTION OF THE DRAWINGS

[0060] Figure 1 This is a schematic diagram of the overall connection of a component aging equipment metering device according to an embodiment of the present application.

[0061] Figure 2 This is a schematic diagram of the module structure of the industrial control equipment in a component aging equipment metering device according to an embodiment of the present application.

[0062] Figure 3 This is a schematic diagram of the circuit structure for testing a secondary power supply of an aging unit in a component aging equipment measurement device according to an embodiment of the present application.

[0063] Figure 4 This is a working diagram of an extended test board and a voltage test board in a component aging equipment measurement device according to an embodiment of the present application.

[0064] Figure 5 This is a schematic diagram of the signal output ports on the end face of a calibration board for secondary power supplies of eight aging units in a component aging equipment measurement device according to an embodiment of the present application;

[0065] Figure 6 This is a schematic diagram of the circuit structure for testing the secondary power supplies of eight aging units in a component aging equipment measurement device according to an embodiment of the present application.

[0066] Figure 7 This is a module schematic diagram of a single-channel voltage and 40-channel current calibration board in a component aging equipment metering device according to an embodiment of the present application.

[0067] Figure 8 This is a module schematic diagram of a 64-channel digital signal calibration board in a component aging equipment measurement device according to an embodiment of the present application.

[0068] Figure 9 This is a module schematic diagram of a 4-channel analog signal single-channel secondary power supply calibration board in a component aging equipment measurement device according to an embodiment of the present application.

[0069] Figure 10 A schematic diagram of the overall process of a component aging equipment measurement method according to an embodiment of the present application.

[0070] Description of reference numerals:

[0071] 1. Industrial control equipment; 11. Input module; 12. Transmitting module; 13. Processing module; 14. Display module; 15. Output module; 2. Aging equipment; 3. Calibration board; 31. Extension test board; 32. Voltage test board; 321. Matrix switch circuit; 322. Control circuit; 323. Line switch; 4. Standard measuring equipment; 41. Voltage measuring equipment; 42. Current measuring equipment. DETAILED DESCRIPTION

[0072] The present application is further described in detail below with reference to the accompanying drawings.

[0073] An embodiment of the present application discloses a device for measuring component aging equipment.

[0074] Example 1

[0075] Reference Figure 1 and Figure 2 , this embodiment discloses a component aging equipment measurement device, which is used to measure the aging equipment 2, including an industrial control device 1, a calibration board 3 and a standard measurement device 4, wherein the industrial control device 1 is connected to the aging equipment 2, the calibration board 3 and the standard measurement device 4 respectively, and the calibration board 3 is connected to the aging equipment 2 and the standard measurement device 4 respectively.

[0076] Burn-in equipment 2 is used to burn in components. In this embodiment, an SPCP-T capacitor high-temperature burn-in station or a SPIC-T integrated circuit burn-in station is used as burn-in equipment 2. The internal structures of burn-in equipment 2 described in this embodiment are similar to those of these two burn-in stations. Burn-in equipment 2, calibration board 3, standard measurement equipment 4, and industrial control equipment 1 are integrated and installed in a system integration cabinet, resulting in a component burn-in and measurement device that is portable, flexible, and easy to operate.

[0077] The user configures the signal test requirements on the industrial control device 1 according to the measurement requirements of the aging device 2, determines the target test signal according to the signal test requirements, and generates a test instruction, which includes the flag information of the target test signal to be tested and the test information.

[0078] Specifically, industrial control device 1 can be an industrial personal computer (IPC) or other central processing unit (CPU) with computer properties and characteristics. Industrial control device 1 includes an input module 11 and a transmission module 12. A user inputs signal test requirements through input module 11, which determines a target test signal based on the signal test requirements. Transmission module 12 then sends test instructions to burn-in equipment 2, calibration board 3, and standard measurement equipment 4 based on the signal test requirements and the target test signal.

[0079] In one embodiment of this invention, both input module 11 and transmission module 12 are implemented by automatic measurement software installed on an industrial computer. The automatic measurement software's operating program is pre-written, and LabVIEW may be selected as the preferred language. During use, the user configures signal test requirements within the automatic measurement software, which then issues test instructions to the burn-in device 2, calibration board 3, and standard measurement device 4 based on the signal test requirements.

[0080] The signal test requirements include the signal test type and the signal test sequence. The signal test type includes the secondary power supply test signal type, digital signal and / or analog signal generated by the aging device 2. The aging device 2 may include multiple aging units inside. When the test signal type is a secondary power supply test signal, the output signal of the secondary power supply of an aging unit inside the aging device 2 is tested. It is necessary to measure the voltage and current of the secondary power supply (including the positive voltage power supply - Vcc, the auxiliary positive level - Vmux and the negative voltage power supply - Vee) of the aging unit under test respectively. The signal test sequence specifies the test order of these secondary power supplies. For example, the signal test sequence can be to measure the voltage and current of Vcc first, then the voltage and current of Vmux, and finally the voltage and current of Vee. The specific signal test sequence can be configured according to actual needs.

[0081] The industrial computer is provided with a variety of communication interfaces, such as GPIB, RS232, RS485, etc., through which the industrial computer is connected to the aging equipment 2, the calibration board 3 and the standard measuring equipment 4 for information transmission.

[0082] After the user inputs the signal test requirements, the industrial computer first determines the target test signal to be tested, and issues a test instruction based on the target test signal. The test instruction is used to drive the aging equipment 2 to output the test signal, the calibration board 3 to output the target test signal, and the standard measuring equipment 4 to measure the target test signal.

[0083] After receiving the test instruction, the aging device 2 reads the target test signal's flag information and test information. The flag information here is the name of the target test signal, and the test information includes the signal type, signal strength, and output time that the aging device needs to output. Based on this, the aging device configures various operating parameters, controls the internal device driver board to output the target test signal, and feeds back the self-test information to the industrial computer as a standard parameter for subsequent calibration. For example, if the target test signal in the test instruction received by the aging device 2 is a secondary power supply Vcc signal, the aging device 2 controls the secondary power supply Vcc to generate a voltage through the internal device driver board, and uses this voltage as the target test signal. At the same time, the aging device 2 performs a self-test and feeds back the self-test voltage to the industrial computer as a standard parameter. If the target test signal in the test instruction received by the aging device 2 is an analog signal, the aging device 2 generates an analog signal through the internal device driver board, and feeds back the self-test analog signal parameters to the industrial computer as a standard parameter.

[0084] After receiving the test instruction, the calibration board 3 reads the flag information of the target test signal, that is, the target test signal name. The calibration board 3 configures the signal test path of the target test signal according to the pre-set path configuration program, so that the target test signal can be led out of the aging device 2.

[0085] Specifically, refer to Figure 3 The calibration board 3 includes an extension test board 31 and a voltage test board 32. The extension test board 31 is connected to the signal output port of the burn-in device 2 and the signal input port of the voltage test board 32 through its own communication interface. The output port of the voltage test board 32 is connected to the standard measurement device 4. The extension test board 31 is used to extract the test signal from the burn-in device 2, and the voltage test board 32 is used to control the output mode of the test signal, thereby obtaining the target test signal from all the test signals extracted by all the extension test boards 31 and transmitting the target test signal to the standard measurement device 4.

[0086] More specifically, the internal structure of the extended test board 31 can be considered a conductive circuit. For example, when testing the secondary power supply of an aging unit in the aging device 2, the extended test board 31 is provided with input ports and output ports that match the secondary power supplies Vcc, Vmux, Vee, and the ground port GND. The output ports of the extended test board 31 are respectively the Vcc port, the Vmux port, the Vee port, and the ground terminal GND. The extended test board 31 is plugged in to establish a connection between the extended test board 31 and the secondary power supply. The output signal obtained at the output port of the extended test board 31 can be regarded as the test signal of the secondary power supply inside the aging device 2. At the same time, in order to facilitate the testing of voltage and current separately, the output port of the extended test board 31 can be set to two groups.

[0087] More specifically, the voltage test board 32 includes a matrix switch circuit 321 and a control circuit 322. The matrix switch circuit 321 is equipped with multiple line switches 323, each of which is connected to the output ports of the extended test board 31. Taking the secondary power supply of the aging unit as an example, the output ports on the extended test board 31 are the Vcc port, the Vmux port, the Vee port, and the GND port. The matrix switch circuit 321 in the voltage test board 32 is connected to the output ports of the extended test board 31. The first line switch is connected to the Vcc port to control the output of the Vcc port signal; the second line switch is connected to the Vmux port to control the output of the Vmux port signal; the third line switch is connected to the Vee port to control the output of the Vee port signal; and the fourth line switch is connected to the GND port. It can be seen that the circuit switches 323 correspond one-to-one to the output ports of the extended test board 31. By controlling the conduction of all circuit switches 323, the signal transmission path can be configured so that the signal output end of the voltage test board 32 outputs the required target test signal. For example, in the test instruction obtained by the voltage test board, the name of the target test signal is a Vcc signal. In this case, the first circuit switch is controlled to be closed, and the second and third circuit switches are controlled to be disconnected. After the signal test path of the Vcc signal is configured, the voltage test board 32 can output the Vcc signal.

[0088] Reference Figure 4 To facilitate control of circuit switch 323, a 40-80 circuit-controlled electronic matrix switch (or relay matrix switch) is selected as circuit switch 323. Control circuit 322 is used to control the conduction of circuit switch 323. In this embodiment, the functions of control circuit 322 can be implemented using a single-chip microcomputer. When the industrial computer issues a test command, the single-chip microcomputer programmatically controls the automatic switching of circuit switches 323 in matrix switch circuit 321, configuring the signal test path for the target test signal to achieve the desired test signal switching.

[0089] Through the configuration of the calibration board 3 described above, the calibration board 3 can extract the test signal output by the aging device 2 from the aging device 2. Furthermore, after the calibration board 3 receives the test instruction, the circuit switch 323 within the calibration board 3 can automatically configure to form a signal test path for the target test signal, allowing the signal output port of the calibration board 3 (including the Vcc port, the Vmux port, and the Vee port) to output the target test signal. This is more convenient than the traditional manual switching of circuits and improves test efficiency. Since the extended test board 31 is provided with two groups of output ports, the calibration board 3 has two groups of signal output ports, which are respectively named as the voltage acquisition terminal and the current acquisition terminal. The voltage acquisition terminal and the current acquisition terminal also each include a ground port GND. That is, the target test signal output by the voltage acquisition terminal is subjected to voltage testing, and the target test signal output by the current acquisition terminal is subjected to current testing, which facilitates management and testing.

[0090] The above is a calibration board 3 setting for testing a secondary power supply of an aging unit. When there are multiple secondary power supplies of aging units that need to be tested, multiple calibration boards 3 can be set one by one. The setting method of the calibration board 3 is the same as the above setting method. Figure 5 , which is a schematic diagram of the signal output port on the end face of the calibration board for the secondary power supplies of the eight aging units.

[0091] Reference Figure 3 In one implementation of this embodiment, the standard metering device 4 includes a voltage metering device 41 and a current metering device 42, wherein the input end of the voltage metering device 41 is connected to the signal output port (including the Vcc port, the Vmux port, and the Vee port) of the voltage acquisition terminal of the calibration board 3, and the output end is connected to the ground port GND of the voltage acquisition terminal; the input end of the current metering device 42 is connected to the signal output port (including the Vcc port, the Vmux port, and the Vee port) of the current acquisition terminal of the calibration board 3, and the output end is connected to the ground port GND of the current acquisition terminal.

[0092] Specifically, the voltage metering device 41 is internally provided with a DC voltmeter and an AC voltmeter, as well as a bidirectional switch for switching between the DC voltmeter and the AC voltmeter. When the DC voltmeter is selected, the input terminal of the DC voltmeter is connected to the signal output port of the voltage acquisition terminal, and the output terminal of the DC voltmeter is connected to the ground port GND of the voltage acquisition terminal, forming a test loop for performing a voltage test on the target test signal output by the calibration board 3. When the AC voltmeter is selected, the input terminal of the AC voltmeter is connected to the signal output port of the voltage acquisition terminal of the calibration board 3, and the output terminal of the AC voltmeter is connected to the ground port GND of the voltage acquisition terminal, forming a test loop for performing a voltage test on the target test signal output by the calibration board 3.

[0093] Specifically, current measurement device 42 includes an ammeter, a sliding rheostat, and an electronic load. The ammeter's input is connected to the signal output of the current acquisition terminal of calibration board 3, and its output is connected to a bidirectional switch within current measurement device 42. By controlling the connection direction of the bidirectional switch, either the sliding rheostat or the electronic load can be selected for current measurement. The end of the sliding rheostat or the electronic load, remote from the bidirectional switch, is connected to the ground terminal GND of the current acquisition terminal. In actual use, an appropriate load can be selected as needed to perform current testing of the target test signal to determine the load capacity of the target test signal.

[0094] The voltage metering device 41 and the current metering device 42 are configured accordingly according to the name of the target test signal and the test information in the test instruction. After performing voltage and current tests on the target test signal, metering data such as voltage, current, and ripple can be obtained. The industrial computer reads and stores the metering data through automatic testing software.

[0095] Since the aging device 2 has fed back the self-test standard parameters, such as voltage and current standards, to the industrial computer when outputting the test signal, the standard metering device 4 measures the target test signal to obtain the metering data. The automatic test software in the industrial computer can analyze and obtain the calibration information of the aging device 2 by comparing the metering data with the standard parameters, which can also be called error information, to facilitate the use of subsequent calibration signals.

[0096] Reference Figure 2 The industrial control device 1 also includes a processing module 13, a display module 14, and an output module 15. The processing module 13 is used to receive metering data and compare and analyze the metering data with pre-set standard parameters to obtain calibration information such as the secondary power supply program control accuracy, the secondary power supply load change rate, and the secondary power supply AC ripple. The display module 14 is a display screen on the industrial computer, used to display metering data and calibration information in real time. The output module 15 is pre-set with a data report. After obtaining metering data or calibration information, the output module 15 is responsible for entering the signal test type, target test signal, metering data, calibration information, and other test data into the pre-set data report to form a report, which is then printed out as needed.

[0097] Reference Figure 3 The specific test / measurement process of a component aging equipment measurement device for a secondary power supply test signal of an aging unit in an embodiment of the present application is as follows:

[0098] The measurement of the secondary power supplies Vcc, Vmux, and Vee of an aging unit is performed by setting the signal test requirements through the industrial computer, including the voltage measurement range, load current size, and the measurement order of Vcc, Vmux, and Vee. Then, the automatic test software inside the industrial computer issues an automatic measurement command. The target test signal is respectively led out from the inside of the aging device 2 under test to the voltage acquisition port and the current acquisition port through the calibration board 3. The control circuit 322 controls the line switch 323 to be configured one by one according to the measurement order of Vcc, Vmux, and Vee, and all target test signals are input into the voltage metering device 41 and the current metering device 42 for measurement.

[0099] The specific test / measurement process of the component aging equipment measurement device according to the embodiment of the present application for the secondary power supply test signals of eight aging units is as follows:

[0100] Reference Figure 6 For the measurement of the secondary power supplies Vcc, Vmux, and Vee of the eight units under test, the signal test requirements are set through the industrial computer. The signal test requirements include the unit measurement sequence, the measurement sequence of Vcc, Vmux, and Vee, the voltage measurement range, and the load current size. Then, the automatic measurement command is issued through the automatic test software inside the industrial computer. The target test signal is respectively led out from the inside of the aging device under test 2 to the voltage collection end and the current collection end through the calibration board 3. The control circuit 322 controls the line switch 323 to be configured one by one according to the unit measurement sequence and the measurement sequence of Vcc, Vmux, and Vee, and all target test signals are input into the voltage metering device 41 and the current metering device 42 for measurement.

[0101] Example 2

[0102] This embodiment discloses a component aging equipment measurement device. The difference from embodiment 1 is that this embodiment, based on the calibration board 3 in embodiment 1, also discloses a single-channel voltage and 40-channel current calibration board. Figure 7 The single-channel voltage and 40-channel current calibration board consists of a calibration board power supply interface, a communication interface, a voltage test interface, a current test interface, a control circuit 322, a voltage test switch Kv, a range switching switch, a KI1~KI40-channel current switching matrix switch, and a voltage and 40-channel current output interface.

[0103] Among them, the calibration board power supply interface is used to supply power to the single-channel voltage and 40-channel current calibration board; the single-channel voltage and 40-channel current calibration board is connected to the industrial computer through the communication interface; the voltage and 40-channel current output interface is connected to the aging equipment 2, used to output voltage and 40-channel current test signals; the single-channel voltage and 40-channel current calibration board is connected to the voltage metering equipment through the voltage test interface, and the current test interface is connected to the current metering equipment; the control circuit 322 is used to control the voltage test switch Kv, the 1-5 range switching switch and the KI1-KI40 current switching matrix switch to be turned on or off according to the test instructions, and configure the signal test path of the target test signal to obtain the target test signal.

[0104] Combine Figure 1 、 Figure 2 and Figure 3 The specific working process is described as follows:

[0105] During a voltage test, the automatic test software within the industrial computer sends a test command to the control circuit 322 via the communication interface. Control circuit 322 controls the voltage test switch Kv to close, and the 1-5 range switches and the 40-way current switching matrix switches to open, establishing a signal test path and outputting the target test signal to the voltage test interface. The voltage metering device 41 measures the test signal via the voltage test interface, generating metering data that the industrial computer can read and acquire. The automatic test software within the industrial computer sends the test command again via the communication interface to the control circuit 322, which controls the voltage test switch Kv to open. During the 40-way current test, the voltage test switch KV will no longer operate.

[0106] During the 40-channel current test, it is necessary to test the 40-channel current values ​​of Range 1. The automatic test software sends the test command to the control circuit 322 through the communication interface. The control circuit 322 controls the range switch to connect the Range 1 circuit to the current test loop until the 40-channel current value measurement of Range 1 is completed.

[0107] Taking the test of a single current as an example, when testing the first current of range 1, the automatic test software sends a test instruction to the control circuit 322 via the communication interface. The control circuit 322 controls KI1 in the 40-channel current switching matrix switch to be closed (the remaining KI2 to KI40 are open). The automatic test software controls the current metering device to measure the target test signal via the current test interface, obtains the relevant current measurement data, and enables the industrial computer to read and obtain the measurement data, completing the measurement test of the first current value. When the second current value needs to be tested, the automatic test software sends a new test instruction to the control circuit 322 via the communication interface. The control circuit 322 controls KI1 in the 40-channel current switching matrix switch to be opened and KI2 to be closed (the remaining KI3 to KI40 are open). The automatic test software then controls the current metering device 42 to measure the target test signal via the current test interface and obtain the current measurement data, so that the industrial computer can read and obtain the measurement data, completing the measurement test of the second current value. The same procedure is applied to the testing of the remaining 38 current values.

[0108] When the 40-channel current value of Range 2 needs to be measured, the automatic test software sends a test instruction to the control circuit 322 via the communication interface. The control circuit 322 controls the range switch to disconnect the Range 1 circuit from the current test loop and connect the Range 2 circuit to the current test loop, establishing a signal test path until the 40-channel current value measurement of Range 2 is completed. The measurement process of the 40-channel current value is the same as that of Range 1. The process of measuring the data of Range 3 is similar.

[0109] The function of the control circuit 322 in this embodiment can be realized by a single-chip microcomputer control device, and the voltage and 40-way current output interface function can be realized by the extended test board 31 in Example 1 or its improvement.

[0110] Example 3

[0111] This embodiment discloses a component aging equipment measurement device. The difference from the embodiment 1 is that this embodiment further discloses a 64-channel digital signal calibration board based on the calibration board 3 in the embodiment 1. Figure 8 The 64-channel digital signal calibration board is composed of a calibration board power supply interface, a communication interface, a signal test interface, a load circuit, a control circuit 322, a KT1-KT64 test switching matrix switch, a KL1-KL64 load switching matrix switch and a 64-channel digital signal output interface.

[0112] Among them, the calibration board power supply interface is used for power supply; the 64-channel digital signal calibration board is connected to the industrial computer through the communication interface; the 64-channel digital signal calibration board is connected to the preset test instrument for testing digital signals through the signal test interface; the 64-channel digital signal output interface is used to lead out the test signal to be tested inside the aging equipment 2; the load circuit is used for the load required for the 64-channel digital signal test to measure the load capacity of the 64-channel digital signal.

[0113] Combine Figure 1 、 Figure 2 and Figure 3 The specific working process is described as follows:

[0114] When testing the first channel of the digital signal, the automatic test software sends a test instruction to the control circuit 322 through the communication interface, and the control circuit 322 controls KT1 in the test switching matrix switch circuit to close (the rest of KT2 to KT64 are open), and connects the first channel of the digital signal to the signal test interface (at this time, the first channel of the digital signal is in a no-load state). The automatic test software controls the test instrument to test the relevant measurement data of the first channel of the digital signal in the no-load state through the test instruction; after the industrial computer reads the data, it sends an instruction to the control circuit 322 through the communication interface, and the control circuit 322 controls KL1 in the load switching matrix switch circuit to close (the rest of KL2 to KL64 are open). At this time, the first channel of the digital signal is in a loaded state, and the test switching matrix switch circuit maintains its original state. At this time, the automatic test software controls the test instrument to test the relevant measurement data of the first channel of the digital signal in the loaded state, and the industrial computer reads the relevant measurement data and performs calculation processing; at this point, the test and measurement process of the first channel of the digital signal is completed. The industrial computer outputs data such as digital signal program control accuracy, digital signal load capacity, etc., and fills in data reports.

[0115] When testing the second channel of the digital signal, the automatic test software sends a new test instruction to the control circuit 322 through the communication interface, and the control circuit 322 controls KT1 in the test switching matrix switch circuit to be disconnected and KT2 to be closed (the remaining KT3 to KT64 are open), and the second channel of the digital signal is connected to the signal test interface (at this time, the second channel of the digital signal is in a no-load state), and then the automatic test software controls the test instrument to test the relevant measurement data of the second channel of the digital signal in the no-load state through the test instruction; after the industrial computer reads the relevant data, the automatic test software continues to send the test instruction to the control circuit through the communication interface. In path 322, control circuit 322 controls KL1 of the load switching matrix circuit to open and KL2 to close (the remaining KL3 to KL64 are open). At this point, digital signal path 2 is in a loaded state, and the test switching matrix circuit remains in its original state. The automatic test software then controls the test instrument to measure the relevant metering data of digital signal path 2 under the loaded state. The industrial computer reads the relevant metering data and performs calculations on it. Finally, the industrial computer outputs calibration information such as digital signal program control accuracy and digital signal load capacity, and fills in a data report. This completes the metering test process for digital signal path 2. The test process for the remaining digital signals is similar.

[0116] The function of the control circuit 322 in this embodiment can be realized by a single-chip microcomputer control device, and the function of the 64-channel digital signal output interface can be realized by the extended test board 31 in Example 1 or its improvement.

[0117] Example 4

[0118] This embodiment discloses a component aging equipment measurement device. The difference from embodiment 1 is that this embodiment, based on the calibration board 3 in embodiment 1, also discloses a 4-way analog signal single-channel secondary power supply calibration board. Figure 9 The 4-way analog signal single-channel secondary power calibration board 3 is composed of a calibration board power supply interface, a communication interface, a secondary power test interface, an analog signal test interface, a control circuit 322, a secondary power test switch, a secondary power load circuit, Ks1~Ks4 analog signal switch, an analog signal load circuit, a secondary power supply and an analog signal output interface.

[0119] Among them, the calibration board power supply interface is used to supply power to the 4-channel analog signal single-channel secondary power supply calibration board 3; the 4-channel analog signal single-channel secondary power supply calibration board is connected to the industrial computer through the communication interface; the 4-channel analog signal single-channel secondary power supply calibration board is connected to the preset standard measuring equipment through the secondary power supply test interface; the 4-channel analog signal single-channel secondary power supply calibration board is connected to the preset analog signal test instrument through the analog signal test interface; the secondary power supply and analog signal output interface is used to lead out the test signal to be tested inside the aging equipment 2; the secondary power supply load circuit is used to provide a load during the secondary power supply signal test to test the load capacity of the secondary power supply signal; the analog signal load circuit is used to provide a load during the analog signal test to test the load capacity of the analog signal.

[0120] Combine Figure 1 、 Figure 2 and Figure 3 The specific working process is described as follows:

[0121] Since the device has four analog signal outputs per channel, each analog signal can generate five different signal waveforms (including sine wave, rectangular wave, triangle wave, leading edge sawtooth wave, and trailing edge sawtooth wave). When testing analog signals, multiple measurements need to be performed on each signal.

[0122] When testing the analog signal, the automatic test software first sends the test instruction to the control circuit 322 through the communication interface, and the control circuit 322 disconnects and maintains the secondary power supply test switch and the secondary power supply load circuit, and then starts the analog signal test program.

[0123] Taking the test of the first analog signal as an example, the control circuit 322 closes the analog signal switching switch KS1 (the remaining switches KS2 to KS4 are open), connecting the first analog signal to the test loop and establishing a signal test path. At this point, the first analog signal is in an unloaded state. Simultaneously, the automatic test software sends a test instruction for the first analog signal waveform to the aging device 2. The device driver board of the aging device 2 generates the first analog signal waveform. The test software then controls the test instrument to measure the relevant metering data of the first analog signal waveform in the unloaded state. After the industrial computer obtains the relevant metering data, it sends an instruction to the control circuit 322 via the communication interface. The control circuit 322 controls the analog signal load circuit to connect to the test loop. At this point, the first analog signal is in a loaded state. The automatic test software then controls the test instrument to measure the relevant metering data of the first analog signal waveform in the loaded state. The industrial computer reads the relevant metering equipment and calculates the relevant data. Ultimately, calibration information such as the analog signal program control accuracy and analog signal load capacity is obtained, and a data report is filled in. This completes the metering test of the first analog signal waveform in the first analog signal.

[0124] When the second waveform of the first analog signal needs to be tested, the automatic test software controls the analog signal load circuit 322 to disconnect from the test loop, restoring the first analog signal to an unloaded state. Simultaneously, the automatic test software sends a test instruction for the second analog signal waveform to the aging device 2. The device driver board of the aging device 2 generates the second analog signal waveform. The automatic test software then controls the test instrument to measure the relevant metering data of the second waveform of the first analog signal in the unloaded state. After the industrial computer reads and stores the relevant metering data, the automatic test software sends a new test instruction to the control circuit 322 via the communication interface. The control circuit 322 controls the analog signal load circuit 322 to reconnect to the test loop. At this point, the first analog signal returns to a loaded state. The automatic test software then controls the test instrument to measure the relevant metering data of the second waveform of the first analog signal in the loaded state. The industrial computer reads and stores the relevant metering data, completes the calculation of the relevant metering data, and ultimately obtains calibration information such as the analog signal program control accuracy and the analog signal load capacity, and fills in a data report. This completes the metering test of the second waveform of the first analog signal. The test process for the other three signal waveforms is similar.

[0125] When testing the second analog signal, the automatic test software closes analog signal switch KS2 via control circuit 322 (leaving KS1, KS3, and KS4 open), connecting the second analog signal to the test loop. The testing process for the five different waveforms of the second analog signal is identical to the measurement test process for the five different waveforms of the first analog signal. The same process applies to the remaining two analog signals.

[0126] After completing all data measurements of the 4-channel analog signals, the automatic test software sends the test instructions to the control circuit 322 through the communication interface. The control circuit 322 disconnects and maintains all analog signal switches and analog signal load circuits, and then starts the secondary power supply test program.

[0127] Taking the test of the Vcc power supply as an example, the automatic test software sends the test instruction to the control circuit 322 through the communication interface, and the control circuit 322 controls the secondary power supply test switching switch KVcc to be closed (KVmux and KVee are open). At this time, the Vcc power supply is in a no-load state. Then the automatic test software controls the test instrument to test the relevant metering data of the Vcc power supply in the no-load state, and the industrial computer reads the relevant metering data and stores it; then the automatic test software controls the secondary power supply load circuit to be connected to the test loop through the control circuit 322. At this time, the Vcc power supply is in a loaded state. Then the automatic test software controls the standard metering equipment 4 to test the relevant metering data of the Vcc power supply in the loaded state, and the industrial computer reads the relevant metering data and stores it, completing the relevant data calculation; at this point, the metering test process of the Vcc power supply is completed.

[0128] When testing the Vmux power supply, the automatic test software sends a test command to the control circuit 322 via the communication interface. The control circuit 322 controls the secondary power supply test switch KVmux to close (KVcc and KVee are open). At this point, the Vmux power supply is in an unloaded state. The automatic test software then controls the standard metering device 4 to measure the relevant metering data of the Vmux power supply in the unloaded state. The industrial computer reads and stores the relevant metering data. The test software then controls the secondary power supply load circuit to connect to the test loop via the control circuit 322. At this point, the Vmux power supply is in a loaded state. The test software then controls the test instrument to measure the relevant metering data of the Vmux power supply in the loaded state. The industrial computer reads and stores the relevant metering data, completing the relevant data calculation. This completes the metering test process for the Vmux power supply. The test process for the Vee power supply is similar.

[0129] The function of the control circuit 322 in this embodiment can be realized by a single-chip microcomputer control device, and the functions of the secondary power supply and analog signal output interface can be realized by the extended test board 31 in Example 1 or its improvement.

[0130] The present application also discloses a component aging equipment measurement method, which is applied to the above-mentioned component aging equipment measurement device, referring to Figure 10 , including the following steps:

[0131] S101, obtaining a signal test requirement of the aging device 2, and generating a test instruction based on the signal test requirement, the test instruction including a target test signal;

[0132] S102, based on the test instruction, controlling the aging device 2 to output a test signal;

[0133] S103, based on the target test signal, controlling the calibration board 3 to configure a signal test path, and obtaining a target test signal from the test signal based on the signal test path;

[0134] S104 : Based on the test instruction, control the standard measuring device 4 to measure the target test signal to obtain measurement data.

[0135] In step S101, the user configures signal test requirements on the industrial control device 1 according to the measurement requirements of the aging device 2, determines the target test signal according to the signal test requirements, and generates a test instruction, which includes the flag information of the target test signal to be tested and test information.

[0136] Specifically, industrial control device 1 is an industrial computer (IPC) that includes an input module 11. A user enters signal test requirements through input module 11, and target test signals are determined based on these requirements. Signal test requirements include a signal test type and a signal test sequence. Signal test types include secondary power supply test signal types, digital signals, and / or analog signals generated by burn-in equipment 2. The signal test sequence specifies the order in which all target test signals are tested.

[0137] In step S102 to step S104 , the industrial computer further includes a sending module 12 , which sends a test instruction to the aging device 2 , the calibration board 3 and the standard measurement device 4 according to the signal test requirements and the target test signal.

[0138] In one embodiment of this invention, both input module 11 and transmission module 12 are implemented by automatic measurement software installed on an industrial computer. The automatic measurement software's operating program is pre-written, and LabVIEW may be selected as the preferred language. During use, the user configures signal test requirements within the automatic measurement software, which then issues test instructions to the burn-in device 2, calibration board 3, and standard measurement device 4 based on the signal test requirements to achieve the measurement requirements.

[0139] Specifically, after receiving the test instruction, the aging device 2 drives the internal device driver board to work and sends a test signal.

[0140] Specifically, the calibration board 3 configures the corresponding signal test path according to the test instruction to obtain the target test signal in the test signal. The calibration board 3 includes an extension test board 31 and a voltage test board 32. The extension test board 31 is connected to the signal output port of the aging device 2 and the signal input port of the voltage test board 32 through its own communication interface. The output port of the voltage test board 32 is connected to the standard measurement device 4. The extension test board 31 is used to lead the test signal from the aging device 2, and the voltage test board 32 is used to control the output mode of the test signal, so as to obtain the target test signal from all test signals led by all extension test boards 31, and transmit the target test signal to the standard measurement device 4.

[0141] More specifically, the internal structure of the extended test board 31 can be considered a conductive circuit. For example, when testing the secondary power supply of an aging unit in the aging device 2, the extended test board 31 is provided with input ports and output ports that match the secondary power supplies Vcc, Vmux, Vee, and the ground port GND. The output ports of the extended test board 31 are respectively the Vcc port, the Vmux port, the Vee port, and the ground terminal GND. The extended test board 31 is plugged in to establish a connection between the extended test board 31 and the secondary power supply. The output signal obtained at the output port of the extended test board 31 can be regarded as the test signal of the secondary power supply inside the aging device 2. At the same time, in order to facilitate the testing of voltage and current separately, the output port of the extended test board 31 can be set to two groups.

[0142] More specifically, the voltage test board 32 includes a matrix switch circuit 321 and a control circuit 322. The matrix switch circuit 321 is equipped with multiple line switches 323, each of which is connected to the output ports of the extended test board 31. Taking the secondary power supply of the aging unit as an example, the output ports on the extended test board 31 are the Vcc port, the Vmux port, the Vee port, and the GND port. The matrix switch circuit 321 in the voltage test board 32 is connected to the output ports of the extended test board 31. Furthermore, the first line switch 323 is connected to the Vcc port to control the output of the signal at the Vcc port; the second line switch 323 is connected to the Vmux port to control the output of the signal at the Vmux port; the third line switch 323 is connected to the Vee port to control the output of the signal at the Vee port; and the fourth line switch 323 is connected to the GND port. It can be seen that the circuit switches 323 correspond one-to-one to the output ports of the extended test board 31. By controlling the conduction of all circuit switches 323, the signal transmission path can be configured so that the signal output end of the voltage test board 32 outputs the required target test signal. For example, in the test instruction obtained by the voltage test board, the name of the target test signal is a Vcc signal. In this case, the first circuit switch 323 is controlled to be closed, and the second and third circuit switches 323 are controlled to be disconnected. After the signal test path of the Vcc signal is configured, the voltage test board 32 can output the Vcc signal.

[0143] Refer to the figure (handing Figure 8To facilitate control of circuit switch 323, a 40-80° circuit-controlled electronic switch (or relay switch) is selected as circuit switch 323. Control circuit 322 is used to control the conduction of circuit switch 323. In this embodiment, a single-chip microcomputer control device is used as control circuit 322. When the industrial computer issues a test command, the single-chip microcomputer controls the circuit switches 323 in the matrix switch circuit 321 in a program-controlled manner according to the test command, automatically switching the circuit switches 323 in the matrix switch circuit 321 in sequence, configuring the signal test path for the target test signal to achieve the desired test signal switching.

[0144] Through the configuration of the calibration board 3 described above, the calibration board 3 can extract the test signal output by the aging device 2 from the aging device 2. Furthermore, after the calibration board 3 receives the test instruction, the circuit switch 323 within the calibration board 3 can automatically configure to form a signal test path for the target test signal, allowing the signal output port of the calibration board 3 (including the Vcc port, the Vmux port, and the Vee port) to output the target test signal. This is more convenient than the traditional manual switching of circuits and improves test efficiency. Since the extended test board 31 is provided with two groups of output ports, the calibration board 3 has two groups of signal output ports, which are respectively named as the voltage acquisition terminal and the current acquisition terminal. The voltage acquisition terminal and the current acquisition terminal also each include a ground port GND. That is, a voltage test is performed on the target test signal output by the voltage acquisition terminal, and a current test is performed on the target test signal output by the current acquisition terminal, facilitating management and testing.

[0145] The above configuration shows a calibration board 3 for testing a single burn-in unit's secondary power supply. If multiple burn-in units require testing, multiple calibration boards 3 can be configured for each. The configuration method for these boards is the same as described above. See Figure 4.3 for a schematic diagram of the signal output ports on the end face of a calibration board 3 for eight burn-in units' secondary power supplies.

[0146] Standard metering device 4 includes a voltage meter 41 and a current meter 42. The voltage meter 41's input is connected to the signal output ports (including Vcc, Vmux, and Vee) of the voltage acquisition terminal on the calibration board 3, and its output is connected to the voltage acquisition terminal's ground port (GND). The current meter 42's input is connected to the signal output ports (including Vcc, Vmux, and Vee) of the current acquisition terminal on the calibration board 3, and its output is connected to the current acquisition terminal's ground port (GND). When inputting signal test requirements, the user can set the burn-in unit's voltage test range and load current, allowing standard metering device 4 to configure accordingly.

[0147] Specifically, the voltage metering device 41 is internally provided with a DC voltmeter and an AC voltmeter, as well as a bidirectional switch for switching between the DC voltmeter and the AC voltmeter. When the DC voltmeter is selected, the input terminal of the DC voltmeter is connected to the signal output port of the voltage acquisition terminal, and the output terminal of the DC voltmeter is connected to the ground port GND of the voltage acquisition terminal, forming a test loop for performing a voltage test on the target test signal output by the calibration board 3. When the AC voltmeter is selected, the input terminal of the AC voltmeter is connected to the signal output port of the voltage acquisition terminal of the calibration board 3, and the output terminal of the AC voltmeter is connected to the ground port GND of the voltage acquisition terminal, forming a test loop for performing a voltage test on the target test signal output by the calibration board 3.

[0148] Specifically, current measurement device 42 includes an ammeter, a sliding rheostat, and an electronic load. The ammeter's input is connected to the signal output of the current acquisition terminal of calibration board 3, and its output is connected to a bidirectional switch within current measurement device 42. By controlling the bidirectional switch's connection direction, either the sliding rheostat or the electronic load can be selected for current measurement. The end of the sliding rheostat or the electronic load, remote from the bidirectional switch, is connected to the ground terminal GND of the current acquisition terminal. In actual use, an appropriate load can be selected as needed to perform current measurement of the target test signal.

[0149] When testing the voltage and current of the target test signal, voltage metering device 41 and current metering device 42 can obtain measurement data such as voltage, current, and ripple. When the user enters signal test requirements, standard parameters such as voltage and current standards are also specified. Standard metering device 4 measures the target test signal to obtain measurement data. By comparing the measurement data with the standard parameters, calibration information for burn-in device 2 can be analyzed and obtained, facilitating subsequent calibration.

[0150] After step S104, the process also includes step S105: organizing and analyzing the metering data, obtaining and outputting the organized results. The industrial control device 1 also includes a processing module 13, a display module 14, and an output module 15. The processing module 13 is configured to receive metering data and compare and analyze the metering data with pre-set standard parameters to obtain calibration information, such as the secondary power supply programmable accuracy, the secondary power supply load change rate, and the secondary power supply AC ripple. The display module 14 is a display screen on the industrial computer, configured to display metering data and calibration information in real time. The output module 15 is pre-set with a data report. After obtaining metering data or calibration information, the output module 15 is responsible for entering the signal test type, target test signal, metering data, calibration information, and other test data into the pre-set data report to form a report, which is then printed out as needed.

[0151] Other implementations of the component aging equipment measurement method of this embodiment are the same as the implementations of the component aging equipment measurement device described above, and are not described in detail again.

[0152] An embodiment of the present application further discloses a terminal device, including a memory, a processor, and a computer program stored in the memory and capable of running on the processor, wherein when the processor executes the computer program, a component aging equipment measurement method in the above embodiment is adopted.

[0153] Among them, the terminal device can be a computer device such as a desktop computer, a laptop computer or a cloud server, and the terminal device includes but is not limited to a processor and a memory. For example, the terminal device can also include input and output devices, network access devices and buses, etc.

[0154] Among them, the processor can adopt a central processing unit (CPU). Of course, according to actual usage, other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. can also be adopted. The general-purpose processor can adopt a microprocessor or any conventional processor, etc., and this application does not impose any restrictions on this.

[0155] Among them, the memory can be an internal storage unit of the terminal device, such as the hard disk or memory of the terminal device, or it can be an external storage device of the terminal device, such as a plug-in hard disk, smart memory card (SMC), secure digital card (SD) or flash memory card (FC) equipped on the terminal device, etc., and the memory can also be a combination of the internal storage unit and the external storage device of the terminal device. The memory is used to store computer programs and other programs and data required by the terminal device. The memory can also be used to temporarily store data that has been output or is to be output. This application does not impose any restrictions on this.

[0156] Among them, through this terminal device, a component aging equipment measurement method in the above embodiment is stored in the memory of the terminal device, and is loaded and executed on the processor of the terminal device for easy use.

[0157] An embodiment of the present application further discloses a computer-readable storage medium, and the computer-readable storage medium stores a computer program. When the computer program is executed by a processor, a component aging equipment measurement method in the above embodiment is adopted.

[0158] Among them, the computer program can be stored in a computer-readable medium, the computer program includes computer program code, the computer program code can be in the form of source code, object code, executable file or certain middleware, etc. The computer-readable medium includes any entity or device that can carry computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal and software distribution medium, etc. It should be noted that computer-readable medium includes but is not limited to the above-mentioned components.

[0159] Among them, through this computer-readable storage medium, a component aging equipment measurement method in the above embodiment is stored in a computer-readable storage medium, and is loaded and executed on a processor to facilitate the storage and application of the above method.

[0160] The above are all preferred embodiments of the present application, and are not intended to limit the scope of protection of the present application. Therefore, any equivalent changes made based on the structure, shape, and principle of the present application should be included in the scope of protection of the present application.

Claims

1. A component aging equipment measuring device, used for measuring the aging equipment (2), the aging equipment (2) is used for performing aging treatment on the component, characterized in that: Also includes: A calibration board (3), the calibration board (3) being connected to the aging device (2); A standard measuring device (4), the standard measuring device (4) being connected to the calibration plate (3); and an industrial control device (1), wherein the industrial control device (1) is respectively connected to the aging device (2), the calibration board (3) and the standard measurement device (4); The industrial control device (1) is used to obtain the signal test requirements of the aging device (2), generate a test instruction based on the signal test requirements, and send the test instruction to the aging device (2), the calibration board (3) and the standard measurement device (4), wherein the test instruction includes the flag information of the target test signal; the industrial control device (1) is also used to organize and analyze the measurement data, obtain the organized results and output them; the industrial control device (1) includes a processing module (13), a display module (14) and an output module (15); the processing module (13) is used to obtain the measurement data, organize and analyze the measurement data, and obtain calibration information; the display module (14) is used to display the measurement data and the calibration information in real time; the output module (15) is used to obtain a preset data report, and record the measurement data and the calibration information into the data report and output it; The aging device (2) is used to output a test signal based on the test instruction; The calibration board (3) is used to configure a signal test path based on the flag information, and to obtain the target test signal in the test signal based on the signal test path; the calibration board (3) comprises an extended test board (31) and a voltage test board (32); the extended test board (31) is connected to the aging device (2); the voltage test board (32) is provided with a matrix switch circuit (321); the voltage test board (32) is respectively connected to the extended test board (31) and the standard measurement device (4) through the matrix switch circuit (321); the extended test board (31) is used to lead the test signal from the aging device (2); the voltage test board (32) is used to receive the test signal led by the extended test board (31), and adjust the matrix switch circuit (321) according to the test instruction, so as to conduct the signal test path of the target test signal, and output the target test signal based on the signal test path; The calibration board (3) comprises a communication interface, a signal test interface, a control circuit, a test switching matrix switch, a load switching matrix switch and a 64-channel digital signal output interface; the communication interface is used to establish a communication connection between the calibration board (3) and the industrial control device (1); the 64-channel digital signal output interface is used to lead out the 64-channel digital signals inside the aging device (2); the signal test interface is used to establish a connection between the calibration board (3) and a preset test instrument for testing digital signals; the control circuit is used to control whether the test switching matrix switch and the load switching matrix switch are turned on or off, and configure the signal test path of the target test signal to obtain the target test signal; The standard metering device (4) is used to measure the target test signal based on the test instruction to obtain metering data.

2. A component aging equipment measuring device according to claim 1, characterized in that: The signal test type of the test signal includes a secondary power supply test signal, a digital signal and / or an analog signal generated by the aging device (2).

3. A component aging equipment measurement method, characterized in that: A device for measuring component aging equipment as claimed in any one of claims 1 to 2, comprising the following steps: Acquiring a signal test requirement of the aging device (2), and generating a test instruction based on the signal test requirement, wherein the test instruction includes a target test signal; Based on the test instruction, controlling the aging device (2) to output a test signal; Based on the target test signal, controlling the calibration board (3) to configure a signal test path, and acquiring the target test signal in the test signal based on the signal test path; Based on the test instruction, the standard metering device (4) is controlled to measure the target test signal to obtain metering data.

4. A terminal device, comprising a memory, a processor, and a computer program stored in the memory and capable of running on the processor, characterized in that: When the processor loads and executes the computer program, the method described in claim 3 is adopted.

5. A computer-readable storage medium, wherein a computer program is stored in the computer-readable storage medium, characterized in that: When the computer program is loaded and executed by a processor, the method described in claim 3 is adopted.

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