Electrical test socket

Abstract

The present invention provides an electrical test socket, comprising: an intermediate sheet including a plurality of first conductive portions, wherein a plurality of first conductive particles are disposed in a first elastic material; an upper sheet disposed above the intermediate sheet and including a plurality of second conductive portions, wherein a plurality of second conductive particles are disposed in a second elastic material; and a lower sheet disposed below the intermediate sheet and including a plurality of third conductive portions, wherein a plurality of third conductive particles are disposed in a third elastic material, wherein the first elastic material comprises a material having a lower expansion rate than the second elastic material and the third elastic material at high temperatures.

Description

Technical Field

[0001] The present disclosure relates to an electrical test socket, and more particularly, to an electrical test socket that can maintain excellent electrical characteristics even in high and low temperature environments and has an increased service life. Background Art

[0002] Generally, an electrical test socket is disposed between a device under test and a test device to electrically connect the terminals of the device under test to the pads of the test device. The electrical test socket is used during a test to determine whether the device under test is defective.

[0003] Figure 1 An electrical test socket 10 according to the prior art is shown.

[0004] The electrical test socket 10 may include a socket body that includes: a conductive portion 11 that extends in a thickness direction, and in which a plurality of conductive particles 11a are disposed in a thickness direction in a silicone rubber; and an insulating portion 12 that is disposed between the conductive portions 11 to support the conductive portions 11 and includes a silicone rubber.

[0005] Figure 2 is a view showing Figure 1 the operation of the electrical test socket. When the electrical test socket 10 is placed on a test device 30, the terminals 21 of the device under test 20 contact and press on the upper ends of the conductive portions 11, and then a certain electrical signal is applied from the test device 30 to the device under test 20, and the electrical signal is transmitted from the pads 31 of the test device 30 to the terminals 21 of the device under test 20 via the conductive portions 11, thereby performing a certain electrical test.

[0006] Electrical tests are performed not only at room temperature but also in very high or very low temperature environments to determine potentially defective products. In the electrical tests performed in high or low temperature environments, first, when the test device is disposed below the electrical test socket and the device under test is disposed above the electrical test socket, the test device and the device under test are pressed against each other in the thickness direction to form an electrical connection between the device under test and the test device.

[0007] Next, the device under test is heated or cooled to a certain temperature using a hot air stream or a heater and held in that state for a certain period of time. Subsequently, an electrical test is performed on the device under test.

[0008] When performing an electrical test in a high temperature environment, the electrical test socket may expand and deform. Specifically, the electrical test socket may include 50% by volume of silicone rubber, and silicone rubber is susceptible to heat and expands at high temperatures. Specifically, as Figure 3As shown, in the electrical test socket, the central portion of the conductive portion 11 expands significantly in a high-temperature environment. Thus, when the electrical test socket expands, not only does the interval between the conductive particles 11a increase, but also the conductive portions are not arranged in series in the thickness direction, and thus the electrical connection ability may deteriorate significantly.

[0009] In addition, in a low-temperature environment, the polysiloxane rubber undergoes shrinkage deformation, especially a lot of shrinkage deformation occurs at the upper or lower portion of the conductive portion 11. Therefore, since the elastic ability of the polysiloxane rubber deteriorates significantly, the electrical connection ability may also deteriorate significantly or the service life of the electrical test socket may be shortened. Summary of the Invention

[0010] Technical Challenges

[0011] To solve the above problems, the present disclosure provides an electrical test socket whose electrical connection ability does not deteriorate and whose service life can be improved in high-temperature or low-temperature environments.

[0012] Means for Solving the Problems

[0013] Additional embodiments will be partially described below and will be partially obvious from the description or may be learned by practicing the presented embodiments of the present disclosure.

[0014] According to an embodiment of the present disclosure, an electrical test socket for electrically connecting the terminals of a component to be tested and the pads of a test component, the electrical test socket comprising:

[0015] An intermediate sheet, comprising: a plurality of first conductive portions extending in the thickness direction at each position corresponding to the terminals of the component to be tested, and wherein a plurality of first conductive particles are disposed in a first elastic material; and a first insulating support portion disposed between the plurality of first conductive portions, supporting each of the plurality of first conductive portions and comprising a first elastic material;

[0016] An upper sheet disposed above the intermediate sheet and comprising: a plurality of second conductive portions extending in the thickness direction at positions corresponding to the plurality of first conductive portions, and wherein a plurality of second conductive particles are disposed in a second elastic material; and a second insulating support portion disposed between the plurality of second conductive portions, supporting the plurality of second conductive portions and comprising a second elastic material; and

[0017] A lower sheet disposed below the intermediate sheet and comprising: a plurality of third conductive portions extending in the thickness direction at positions corresponding to the plurality of first conductive portions, and wherein a plurality of third conductive particles are disposed in a third elastic material; and a third insulating support portion disposed between the plurality of third conductive portions, supporting the plurality of third conductive portions and comprising a third elastic material,

[0018] The first elastic material includes a material with an expansion rate less than that of the second and third elastic materials at high temperatures.

[0019] In the electrical test socket, the second and third elastic materials may each include a material with a shrinkage rate less than that of the first elastic material at low temperatures.

[0020] In the electrical test socket, the high temperature may be about 150 °C or higher than 150 °C.

[0021] In the electrical test socket, the first elastic material may use heat-resistant silicone rubber or silicone rubber containing heat-resistant materials.

[0022] In the electrical test socket, the heat-resistant material may include any one of iron oxide, boron nitride, and aluminum nitride.

[0023] In the electrical test socket, the low temperature may be about -55 °C or lower than -55 °C.

[0024] In the electrical test socket, the second and third elastic materials may each use low-temperature silicone rubber.

[0025] In the electrical test socket, the low-temperature silicone rubber may include fluorosilicone rubber.

[0026] In the electrical test socket, the insulating sheet covering the surface of the intermediate sheet may be integrally attached to the intermediate sheet at at least one of the upper and lower surfaces of the intermediate sheet.

[0027] In the electrical test socket, communication holes may be formed in the insulating sheet at each position corresponding to each of the plurality of first conductive portions.

[0028] In the electrical test socket, the insulating sheet may include heat-resistant performance.

[0029] According to another embodiment of the present disclosure, an electrical test socket for electrically connecting the terminals of a component to be tested and the pads of a test component, the electrical test socket comprising:

[0030] An intermediate sheet, comprising: a plurality of first conductive portions extending in the thickness direction at each position corresponding to the terminals of the component to be tested, and wherein a plurality of first conductive particles are disposed in the first elastic material; and a first insulating support portion disposed between the plurality of first conductive portions, supporting each of the plurality of first conductive portions and comprising the first elastic material;

[0031] An upper sheet, disposed above the intermediate sheet, and comprising: a plurality of second conductive portions extending in the thickness direction at positions corresponding to the plurality of first conductive portions, and wherein a plurality of second conductive particles are disposed in the second elastic material; and a second insulating support portion disposed between the plurality of second conductive portions, supporting the plurality of second conductive portions and comprising the second elastic material; and

[0032] The lower sheet is disposed below the middle sheet and includes: a plurality of third conductive portions extending in the thickness direction at positions corresponding to the plurality of first conductive portions, and wherein a plurality of third conductive particles are disposed in a third elastic material; and a third insulating support portion disposed between the plurality of third conductive portions, supporting the plurality of third conductive portions and including a third elastic material,

[0033] wherein each of the second elastic material and the third elastic material includes a material having a shrinkage rate lower than that of the first elastic material at low temperatures.

[0034] In the electrical test socket, the low temperature can be about -55°C or lower than -55°C.

[0035] In the electrical test socket, the first elastic material can include a material having an expansion rate of about 3% at a temperature of about 150°C or higher than 150°C.

[0036] According to another embodiment of the present disclosure, an electrical test socket for electrically connecting the terminals of a component to be tested and the pads of a test component to each other, the electrical test socket includes:

[0037] An upper sheet including: a plurality of fourth conductive portions extending in the thickness direction at each position corresponding to the terminals of the component to be tested, and wherein a plurality of fourth conductive particles are disposed in a fourth elastic material; and a fourth insulating support portion disposed between the plurality of fourth conductive portions, supporting the plurality of fourth conductive portions and including a fourth elastic material; and

[0038] A lower sheet disposed below the upper sheet and including: a plurality of fifth conductive portions extending in the thickness direction at positions corresponding to the plurality of fourth conductive portions, and wherein a plurality of fifth conductive particles are disposed in a fifth elastic material; and a fifth insulating support portion disposed between the plurality of fifth conductive portions, supporting the plurality of fifth conductive portions and including a fifth elastic material,

[0039] wherein the fifth elastic material includes a material having an expansion rate lower than that of the fourth elastic material at high temperatures.

[0040] Advantages of the present invention

[0041] In the electrical test socket according to the present disclosure, since a material with excellent heat resistance is used for the middle part of the electrical test socket, and materials with excellent cold resistance are used for the upper part and the lower part, the electrical characteristics may not deteriorate and the service life of the electrical test socket can be increased in ultra-high temperature and ultra-low temperature environments. Description of the Drawings

[0042] Figure 1 is a view of an electrical test socket according to the prior art.

[0043] Figure 2 is a view showing Figure 1 the operation of an electrical test socket.

[0044] Figure 3 is Figure 1 a view of the electrical test socket expanding and deforming in a high-temperature environment.

[0045] Figure 4 is a view of an electrical test socket according to a first embodiment of the present disclosure.

[0046] Figure 5 is Figure 4 a view of the operation of the electrical test socket.

[0047] Figure 6 is a view of an electrical test socket according to a second embodiment of the present disclosure.

[0048] Figure 7 is a view of an electrical test socket according to a third embodiment of the present disclosure.

[0049] Figure 8 is a view of an electrical test socket according to a fourth embodiment of the present disclosure. Detailed Description

[0050] In the following description, the present disclosure is described with reference to the accompanying drawings. However, the present disclosure may be implemented in various forms, and thus, the present disclosure is not limited to the embodiments described below. In the drawings, parts irrelevant to the description are omitted to clearly describe the present disclosure, and throughout the specification, like reference numerals refer to like parts.

[0051] In this specification, when a component "connects" or "is connected" to another component, the component contacts or connects to the other component directly or via at least one of the other components. Terms such as "comprises" or "includes" may not be construed as necessarily including any and all components or steps described in this specification, but may be construed as excluding some of the components or steps or further including additional components or steps.

[0052] The terms used herein are for the purpose of describing particular embodiments only and are not intended to limit the embodiments. Unless otherwise clearly specified in the context, the expressions used in the singular form in this specification also include their plural forms. In this specification, terms such as "comprises" or "includes" may be construed as referring to a certain feature, number, step, operation, component, or combination thereof, but may not be construed as excluding the possibility of the existence or addition of one or more other features, numbers, steps, operations, components, or combinations thereof.

[0053] The electrical test socket 100 according to the present disclosure is disposed between the element 140 to be tested and the electrical test socket 100 so that the terminals 141 of the element 140 to be tested and the pads of the electrical test socket 100 are electrically connected to each other. Specifically, providing the electrical test socket 100 is a technical feature. In the electrical test socket 100, even in an ultra-high temperature environment of 150 °C or higher than 150 °C or in an ultra-low temperature environment of -55 °C or lower than -55 °C, the electrical connection ability may not deteriorate and the lifespan may not be shortened.

[0054] The electrical test socket 100 may include an intermediate sheet 110, an upper sheet 120, and a lower sheet 130.

[0055] The intermediate sheet 110 may include: an intermediate sheet body including a first conductive portion 111 and a first insulating support portion 112; and a pair of insulating sheets 113 respectively attached to the upper surface and the lower surface of the intermediate sheet body.

[0056] The first conductive portion 111 extends in the thickness direction at each position corresponding to the terminal 141 of the element 140 to be tested, and a plurality of first conductive particles 111a are disposed in the first elastic material. The first conductive portion 111 may include a plurality of first conductive portions spaced apart from each other in the surface direction.

[0057] The first conductive portion 111 is pressed in the thickness direction so that the first conductive particles 111a are in close contact with each other in a conductive state.

[0058] Considering that the first conductive particles 111a are prone to movement, particles having magnetism in the material may be used as the first conductive particles 111a for forming the intermediate sheet body by the method described below. Detailed examples of the first conductive particles 111a having magnetism may include: magnetic metal particles such as iron, nickel, cobalt, and the like; alloy particles thereof; particles containing metals; any of the above particles as core particles, the core particles having a surface electroplated with a metal having excellent conductivity such as gold, silver, palladium, rhodium, and the like; inorganic material particles such as non-magnetic metal particles or glass beads and the like; or polymer particles as core particles, the core particles having a surface electroplated with an electromagnetic conductor such as nickel, cobalt, and the like; or core particles coated with both an electromagnetic conductor and a metal having excellent conductivity and the like.

[0059] Among the above materials, nickel particles may be used as core particles, the core particles having a surface electroplated with a metal having excellent conductivity such as gold, silver, and the like.

[0060] The surface of the core particles may be coated with a conductive metal by, for example, electroless plating, but is not particularly limited thereto.

[0061] When core particles coated with a conductive metal are used as the first conductive particles 111a, considering obtaining excellent conductivity, the coverage rate of the conductive metal on the particle surface (the ratio of the coating area of the conductive metal to the surface area of the core particles) can be 40% or more than 40%, especially 45% or more than 45% or 47% to 95%.

[0062] In addition, the coverage rate of the conductive metal can be 2.5 wt% to 50 wt% of the silver core particles, especially 3 wt% to 30 wt%, 3.5 wt% to 25 wt% or 4 wt% to 20 wt%. When the conductive metal to be coated is gold, the coverage rate of the conductive metal can be 3 wt% to 30 wt% of the core particles, especially 3.5 wt% to 25 wt%, 4 wt% to 20 wt% or 4.5 wt% to 10 wt%. In addition, when the conductive metal to be coated is silver, the coverage rate of the conductive metal can be 3 wt% to 30 wt% of the core particles, especially 4 wt% to 25 wt%, 5 wt% to 23 wt% or 6 wt% to 20 wt%.

[0063] In addition, the particle size of the first conductive particles 111a can be 1 μm to 500 μm, especially 2 μm to 400 μm, 5 μm to 300 μm or 10 μm to 150 μm.

[0064] The intermediate sheet obtained by using the first conductive particles 111a that meet the conditions can be easily deformed under pressure, and sufficient electrical contact can be obtained between the first conductive particles 111a in the first conductive portion 111 in the intermediate sheet.

[0065] In addition, although not particularly limited, the shape of the first conductive particles 111a can be spherical, star-shaped or a mass formed by secondary particles that are its agglomerates, because the particles are easily dispersed in the polymer material forming material.

[0066] In addition, the moisture content of the first conductive particles 111a can be 5% or less than 5%, especially 3% or less than 3%, 2% or less than 2% or 1% or less than 1%. By using the first conductive particles 111a that meet the conditions, the generation of air bubbles in the molding material layer when hardening the molding material layer in the manufacturing method described below can be prevented or reduced.

[0067] The content ratio of the first conductive particles 111a in the first conductive portion 111 can be 10% to 60%, especially 15% to 50%. When the ratio is less than 10%, a conductive portion with a sufficiently small resistance value may not be obtained. When the ratio exceeds 60%, the obtained conductive portion can be easily affected, and the elasticity necessary for the conductive portion may not be obtained.

[0068] The polymer material forming material may contain inorganic fillers such as typical silica powder, colloidal silica, aerogel silica, alumina, and the like as required. Due to the inclusion of inorganic fillers, the viscosity can be increased, the further dispersion stability of the first conductive particles 111a can be improved, and at the same time, the strength of the intermediate sheet obtained through the hardening process can be increased.

[0069] The first elastic material forming the first conductive portion 111 may include a heat-resistant material in the elastic material, or a heat-resistant elastic material may be used as the first elastic material by changing the polymer structure so that the expansion rate can be lower even in a high-temperature environment of 150 °C or higher than 150 °C.

[0070] A heat-resistant polymer material having a crosslinked structure can be used as an elastic polymer material for forming the first elastic material. The curable polymer material forming material for obtaining the crosslinked polymer material may include various materials. Specifically, it may include: conjugated diene rubbers such as polysiloxane rubber, polybutadiene rubber, natural rubber, polyisoprene rubber, styrene-butadiene copolymer rubber, acrylonitrile-butadiene copolymer rubber, and the like, and their hydrogenated additives; block copolymer rubbers such as styrene-butadiene-diene block copolymer rubber, styrene-isoprene block copolymer rubber, and the like, and their hydrogenated additives; chloroprene rubber; urethane rubber; polyester rubber; epichlorohydrin rubber; ethylene-propylene copolymer rubber; ethylene-propylene-diene copolymer rubber; soft liquid epoxy rubber; and the like.

[0071] Among the above materials, polysiloxane rubber can be used considering the moldability and adhesiveness regarding electrical properties.

[0072] The material obtained by crosslinking or condensing liquid polysiloxane rubber can be used as polysiloxane rubber. The liquid polysiloxane rubber can be any one of a condensation type, an addition type, and a material containing vinyl or hydroxyl. Specifically, the liquid polysiloxane rubber may include dimethylsiloxane raw rubber, methylvinylsiloxane raw rubber, methylphenylvinylsiloxane raw rubber, and the like.

[0073] Among the above materials, a liquid polysiloxane rubber containing vinyl (vinyl-containing polydimethylsiloxane) is usually obtained by performing a hydrolysis and condensation reaction on dimethyldichlorosilane or dimethyldialkoxysilane in the presence of dimethylethenylchlorosilane or dimethylethenylalkoxysilane and then performing separation on it by repeating dissolution-precipitation.

[0074] In addition, anionic polymerization of a cyclic siloxane such as octamethylcyclotetrasiloxane can be carried out in the presence of a catalyst using dimethyldivinylsiloxane as a polymerization terminator and appropriately selecting other reaction conditions (e.g., the amount of the cyclic siloxane and the amount of the polymerization terminator) to obtain a liquid polysiloxane rubber having vinyl groups at both ends. In this state, a base such as tetramethylammonium hydroxide, tetrabutylphosphonium hydroxide, and the like, or a solution of its silanolate and the like can be used as a catalyst for anionic polymerization, and the reaction temperature is 80°C to 130°C.

[0075] The vinyl group-containing polydimethylsiloxane may have a molecular weight Mw (referring to the weight-average molecular weight based on standard polystyrene, the same hereinafter) of 10,000 to 40,000. In addition, from the viewpoint of the heat resistance of the obtained anisotropic conductive sheet, the molecular weight distribution index (referring to the value of Mw / Mn, that is, the ratio of the weight-average molecular weight Mw to the number-average molecular weight Mn based on standard polystyrene, the same hereinafter) is 2 or less than 2.

[0076] A liquid polysiloxane rubber containing hydroxyl groups (hydroxyl group-containing polydimethylsiloxane) is usually obtained by carrying out a hydrolysis and condensation reaction on dimethyldichlorosilane or dimethyldialkoxysilane in the presence of dimethylhydrochlorosilane or dimethyldihydroalkoxysilane and then separating it by repeating dissolution-precipitation.

[0077] In addition, anionic polymerization of a cyclic siloxane can be carried out in the presence of a catalyst using, for example, dimethylhydrochlorosilane, methyldihydrochlorosilane, dimethyldihydroalkoxysilane, and the like as a polymerization terminator and roughly selecting other reaction conditions (the amount of the siloxane and the amount of the polymerization terminator) to obtain a liquid polysiloxane rubber containing hydroxyl groups. In this state, a base such as tetramethylammonium hydroxide, tetrabutylphosphonium hydroxide, and the like, or a solution of its silanolate and the like can be used as a catalyst for anionic polymerization, and the reaction temperature can be 80°C to 130°C.

[0078] The hydroxyl group-containing polydimethylsiloxane preferably may have a molecular weight Mw of 10,000 to 40,000. In addition, from the viewpoint of the heat resistance of the obtained anisotropic conductive sheet 10, the molecular weight distribution index may be 2 or less than 2.

[0079] In the present disclosure, either of the above-described vinyl group-containing polydimethylsiloxane and hydroxyl group-containing polydimethylsiloxane can be used, or both can be used in combination.

[0080] In addition, in a high-temperature environment, to improve the heat resistance of the first elastic material, any one of iron oxide, boron nitride, and aluminum nitride can be used as the heat-resistant material contained in the elastic polymer material. However, the present disclosure is not limited thereto, and any material that can increase heat resistance by being included in silicone rubber is possible.

[0081] In a high-temperature environment, an elastic polymer material with relatively high heat resistance can be used. The expansion rate of the elastic polymer material at 150 °C is 6% or less than 6%, especially 4% or less than 4% or 3% or less than 3%. When the expansion rate exceeds 6%, the anisotropic conductive sheet obtained by repeated use multiple times or in a high-temperature environment may cause permanent deformation in the first conductive portion 111. Therefore, the conductive particle chain in the conductive portion is disturbed, and thus it may be difficult to maintain the required conductivity.

[0082] The insulating sheet 113, which is a structure attached to the upper and lower surfaces of the intermediate sheet to restrict the thermal expansion of the intermediate sheet, can have heat-resistant performance. The insulating sheet 113 can include: a resin sheet including polyimide resin, liquid crystal polymer, polyester, fluororesin, and the like; a sheet obtained by impregnating a woven fabric with the resin described above; and the like, and various materials with heat-resistant performance can be used.

[0083] The thickness of each of the insulating sheets 113 (not particularly limited when the insulating sheet 113 is flexible) can be 10 μm to 50 μm, especially 10 μm to 25 μm.

[0084] In the insulating sheet 113, communication holes 113a are formed at positions corresponding to the first conductive portion 111, and thus the first conductive portion 111 can be connected to the second conductive portion 121 and the third conductive portion 131. Since the insulating sheet 113 with heat-resistant performance is attached to the upper and lower surfaces of the intermediate sheet, the heat-resistant performance of the intermediate sheet 110 can be improved.

[0085] The upper sheet 120 can be disposed above the intermediate sheet 110 and can include a plurality of second conductive portions 121 and second insulating support portions 122. The second conductive portions 121 extend in the thickness direction at positions corresponding to the first conductive portion 111, and a plurality of second conductive particles are disposed in the second elastic material. The second insulating support portions 122 are provided between the second conductive portions 121 and support the second conductive portions 121, and include a second elastic material.

[0086] Specifically, the second conductive portions 121 are disposed at each position corresponding to the first conductive portion 111 and are connected to the first conductive portion 111 above the first conductive portion 111.

[0087] In the second conductive portion 121, a plurality of second conductive particles are disposed in the second elastic material. In this state, the second conductive particles may include the same material as the first conductive particles 111a, and if necessary, the second conductive particles may use a material having better conductivity than the first conductive particles 111a, thereby improving the electrical connection ability as compared with the case when contacting the terminal 141 of the component 140 to be tested.

[0088] The second elastic material may include a material having a shrinkage rate lower than that of the first elastic material at low temperatures. Specifically, the second elastic material may include a material having a lower shrinkage rate at a temperature of -55°C or lower than -55°C. For this purpose, silicone rubber for low temperatures may be used.

[0089] In this state, fluorosilicone rubber may be used as the silicone rubber for low temperatures. The fluorosilicone rubber may include (i) a silicone polymer composed only of repeating units containing one or more fluorine atoms in the side chain and (ii) a copolymer or block copolymer composed of a total of two or more repeating units and containing repeating units containing one or more fluorine atoms in the side chain and repeating units not containing fluorine atoms. The present disclosure is not limited thereto, and various things may be used as long as those skilled in the art can select things based on common knowledge in the art. A crosslinked polymer between another type of polymer and the polymer (i) or copolymer (ii) that does not impair the properties of the connector for testing according to the present disclosure may be included within the scope of the silicone rubber for low temperatures.

[0090] Thus, since the second elastic material maintains a low shrinkage rate at low temperatures, even at a temperature of -55°C or lower than -55°C, the second conductive portion 121 does not undergo excessive shrinkage, so that the elastic force does not deteriorate and the properties of the silicone rubber change less, thereby finally preventing deterioration of conductivity.

[0091] The lower sheet 130 may be disposed below the intermediate sheet 110 and may include: a plurality of third conductive portions 131 that extend in the thickness direction at positions corresponding to the first conductive portions 111, and in which a plurality of third conductive particles are disposed in the third elastic material; and a third insulating support portion 132 that is provided between the third conductive portions 131, supports the third conductive portions 131 and includes the third elastic material.

[0092] Specifically, the third conductive portions 131 are disposed at each position corresponding to the first conductive portions 111 and are connected to the first conductive portions 111 below the first conductive portions 111.

[0093] In the third conductive portion 131, a plurality of third conductive particles are disposed in the third elastic material. In this state, the third conductive particles may include the same material as the first conductive particles 111a.

[0094] The third elastic material may include a material with a shrinkage rate lower than that of the first elastic material at low temperatures. Specifically, the elastic material may include a material with a lower shrinkage rate at a temperature of -55°C or lower than -55°C. For this purpose, silicone rubber for low temperatures can be used. The second elastic material is not limited to silicone rubber, and various materials with excellent elasticity and cold resistance can be used.

[0095] In addition, although various materials can be used as cold-resistant materials added to silicone rubber to enhance cold resistance, boron nitride can be used.

[0096] The electrical test socket 100 according to the present disclosure has a structure manufactured by inserting an intermediate sheet 110 with heat-resistant performance into the middle of the electrical test socket 100. Therefore, when the terminal 141 of the element 140 to be tested is disposed above the electrical test socket 100 and the test element is disposed below the electrical test socket 100, even in a high-temperature environment of 150°C or higher than 150°C, not only can the middle part of the electrical test socket 100 be prevented from over-expanding, but also the electrical test socket 100 can be supported as a whole, thereby extending the service life of the electrical test socket 100.

[0097] In addition, since over-expansion is prevented at extremely high temperatures, an excessive increase in the interval between the conductive particles is prevented, so that the conductive particles can maintain a dense configuration state, thereby preventing deterioration of the conductive performance.

[0098] In addition, since the upper sheet 120 and the lower sheet 130 of the electrical test socket 100 according to the present disclosure are configured by using a material with a lower shrinkage rate in an ultra-low temperature environment, even when an electrical test is performed in an ultra-low temperature environment, over-contraction is prevented so that deterioration of the elastic force or reduction of the conductive performance can be prevented.

[0099] [Table 1]

[0100]

[0101]

[0102] The above Table 1 shows a comparison of the average value and the maximum value of the loads applied in ultra-high temperature and ultra-low temperature environments by using the electrical test socket of the prior art according to Figure 1 and the electrical test socket of the present disclosure according to Figure 4 As can be seen from the above table, for the prior art, a larger load (contact pressure) is applied in an extremely low temperature state, while in the present disclosure, it can be seen that the change amount of the load is smaller and remains in a relatively stable state. In addition, it can be seen that although the load changes greatly at extremely high temperatures in the prior art, the load does not change much in the present disclosure.

[0103] The electrical test socket according to the present disclosure is not limited thereto, and various modifications can be made as shown below.

[0104] Figure 6 Shows an electrical test socket according to the second embodiment, which shows the state of removing the insulating sheet from the embodiment of Figure 4 and Figure 5 .

[0105] Specifically, although the first embodiment shows an example in which insulating sheets having heat-resistant performance are attached to each of the upper surface and the lower surface of the intermediate sheet body, the present disclosure is not limited thereto, and the electrical test socket 200 according to the second embodiment can be manufactured to have an intermediate sheet 210, and the intermediate sheet 210 includes a first conductive portion 211 and a first insulating support portion 212 in a state where the insulating sheet is removed. In this state, the second embodiment is the same as the first embodiment in that the upper sheet 220 and the lower sheet 230 are respectively disposed above and below the intermediate sheet 210.

[0106] Figure 7 Shows a third embodiment of an electrical test socket 300 having an intermediate sheet 310, in which a guiding film 340 and a lower film 350 are respectively added to the upper sheet 320 and the lower sheet 330.

[0107] In this state, in the guiding film 340 attached to the upper surface of the upper sheet 320, a first through hole 341 is formed at a position corresponding to the second conductive portion 321, and the first through hole 341 has an inverted conical shape, in which its inner diameter decreases from the upper end to the lower end. This can facilitate the contact of the terminals of the element to be tested with the second conductive portion 321 at its center.

[0108] The lower film 350 is attached to the lower surface of the lower sheet 330, and the lower film 350 can prevent foreign materials from attaching to the lower surface of the lower sheet 330 at the side of the test element and can increase the overall service life of the electrical test socket.

[0109] Figure 8 Shows an electrical test socket 400 according to the fourth embodiment.

[0110] The electrical test socket 400 according to the fourth embodiment may include: an upper sheet 410, including: a plurality of fourth conductive portions 411, extending in the thickness direction at each position corresponding to the terminals of the element to be tested and in which a plurality of fourth conductive particles are disposed in a first elastic material; and a fourth insulating support portion 412, disposed between the fourth conductive portions 411, supporting each of the fourth conductive portions 411 and including a fourth elastic material; and a lower sheet 420, disposed below the upper sheet 410, and including: a plurality of fifth conductive portions 421, extending in the thickness direction at positions corresponding to the fourth conductive portions 411 and in which a plurality of fifth conductive particles are disposed in a fifth elastic material; and a fifth insulating support portion 422, disposed between the fifth conductive portions 421, supporting the fifth conductive portions 421 and including a fifth elastic material.

[0111] The fifth elastic material may include a material having a lower expansion rate than the fourth elastic material at high temperatures.

[0112] The first embodiment includes a structure in which an intermediate sheet maintains a relatively small expansion state in a high-temperature environment, and an upper sheet and a lower sheet having relatively small contractions in a low-temperature environment are disposed above and below the intermediate sheet. However, the present disclosure is not limited thereto, and as shown in Figure 8 the lower sheet may maintain a lower expansion rate at high temperatures. In the structure, a material having a lower contraction rate at low temperatures may be used for the upper sheet.

[0113] It should be understood that the embodiments described herein should be considered only in a descriptive sense and not for purposes of limitation. Generally, the features within each embodiment or the description of an embodiment should be considered as other similar features or embodiments that may be used in other embodiments. Although one or more embodiments have been described with reference to the figures, those skilled in the art will understand that various changes in form and detail may be made herein without departing from the spirit and scope of the present disclosure as defined by the appended claims.

Claims

1. An electrical test socket for electrically connecting the terminals of a component to be tested and the pads of a test component to each other, said electrical test socket comprises: An intermediate sheet, comprising: a plurality of first conductive portions extending in the thickness direction at each position corresponding to the terminals of the component to be tested, and wherein a plurality of first conductive particles are disposed in a first elastic material; and a first insulating support portion disposed between the plurality of first conductive portions, supporting each of the plurality of first conductive portions and comprising the first elastic material; An upper sheet disposed above the intermediate sheet, and comprising: a plurality of second conductive portions extending in the thickness direction at positions corresponding to the plurality of first conductive portions, and wherein a plurality of second conductive particles are disposed in a second elastic material; and a second insulating support portion disposed between the plurality of second conductive portions, supporting the plurality of second conductive portions and comprising the second elastic material; and A lower sheet disposed below the intermediate sheet, and comprising: a plurality of third conductive portions extending in the thickness direction at positions corresponding to the plurality of first conductive portions, and wherein a plurality of third conductive particles are disposed in a third elastic material; and a third insulating support portion disposed between the plurality of third conductive portions, supporting the plurality of third conductive portions and comprising the third elastic material, wherein the first elastic material comprises a material having an expansion rate at high temperature less than that of the second elastic material and the third elastic material.

2. The electrical test socket according to claim 1, wherein the second elastic material and the third elastic material each comprise a material having a shrinkage rate at low temperature less than that of the first elastic material.

3. The electrical test socket according to claim 1, wherein the high temperature is 150 °C or higher than 150 °C.

4. The electrical test socket according to claim 1, wherein the first elastic material comprises heat-resistant silicone rubber or silicone rubber containing a heat-resistant material.

5. The electrical test socket according to claim 4, wherein the heat-resistant material comprises any one of iron oxide, boron nitride, and aluminum nitride.

6. The electrical test socket according to claim 2, wherein the low temperature is -55 °C or lower than -55 °C.

7. The electrical test socket according to claim 2, wherein the second elastic material and the third elastic material each comprise low-temperature silicone rubber.

8. The electrical test socket according to claim 7, wherein the low-temperature silicone rubber comprises fluorosilicone rubber.

9. The electrical test socket according to claim 1, wherein an insulating sheet covering the surface of the intermediate sheet is integrally attached to the intermediate sheet at at least one of the upper surface or the lower surface of the intermediate sheet.

10. The electrical test socket according to claim 9, wherein communication holes are formed in the insulating sheet at each position corresponding to each of the plurality of first conductive portions.

11. The electrical test socket according to claim 9, wherein the insulating sheet has heat-resistant performance.

12. An electrical test socket for electrically connecting the terminals of a component to be tested and the pads of a test component to each other, said electrical test socket comprises: The middle sheet, comprising: a plurality of first conductive portions extending in the thickness direction at each position corresponding to the terminals of the element to be tested, and wherein a plurality of first conductive particles are disposed in a first elastic material; and a first insulating support portion disposed between the plurality of first conductive portions, supporting each of the plurality of first conductive portions and including the first elastic material; The upper sheet, disposed above the middle sheet, and comprising: a plurality of second conductive portions extending in the thickness direction at positions corresponding to the plurality of first conductive portions, and wherein a plurality of second conductive particles are disposed in a second elastic material; and a second insulating support portion disposed between the plurality of second conductive portions, supporting the plurality of second conductive portions and including the second elastic material; and The lower sheet, disposed below the middle sheet, and comprising: a plurality of third conductive portions extending in the thickness direction at positions corresponding to the plurality of first conductive portions, and wherein a plurality of third conductive particles are disposed in a third elastic material; and a third insulating support portion disposed between the plurality of third conductive portions, supporting the plurality of third conductive portions and including the third elastic material, wherein the second elastic material and the third elastic material each comprise a material having a shrinkage rate lower than that of the first elastic material at low temperatures.

13. The electrical test socket according to claim 12, wherein the low temperature is -55 °C or lower than -55 °C.

14. The electrical test socket according to claim 12, wherein the first elastic material comprises a material having an expansion rate of 3% at a temperature of 150 °C or higher than 150 °C.

15. An electrical test socket for electrically connecting the terminals of an element to be tested and the pads of a test element, the electrical test socket comprising: An upper sheet, comprising: a plurality of fourth conductive portions extending in the thickness direction at each position corresponding to the terminals of the element to be tested, and wherein a plurality of fourth conductive particles are disposed in a fourth elastic material; and a fourth insulating support portion disposed between the plurality of fourth conductive portions, supporting the plurality of fourth conductive portions and including the fourth elastic material; and A lower sheet, disposed below the upper sheet, and comprising: a plurality of fifth conductive portions extending in the thickness direction at positions corresponding to the plurality of fourth conductive portions, and wherein a plurality of fifth conductive particles are disposed in a fifth elastic material; and a fifth insulating support portion disposed between the plurality of fifth conductive portions, supporting the plurality of fifth conductive portions and including the fifth elastic material, wherein the fifth elastic material comprises a material having an expansion rate lower than that of the fourth elastic material at high temperatures.

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