A parameter quality management method and related device and medium program product

Abstract

The present application provides a parameter quality management method and related apparatus and medium program product, which can be applied to a server and includes: obtaining a first parameter scorecard used to characterize the quality status of a target parameter; updating a first upper specification limit USL and / or a first lower specification limit LSL of component parameters and process equipment parameters in the target parameter to obtain a second upper specification limit USL and / or a second lower specification limit LSL; updating the first parameter scorecard based on the second upper specification limit USL and / or the second lower specification limit LSL to obtain a second parameter scorecard; and determining the updated parameter quality standard of the target parameter based on the second parameter scorecard. In this way, the parameter quality standard can be updated in real time, improving user production efficiency.

Description

Technical Field

[0001] The present application belongs to the general data processing technology field of the Internet industry, and specifically relates to a parameter quality management method and related devices and medium program products. Background Art

[0002] During a company's manufacturing process, various production parameters exist, such as product parameters, component parameters, and process equipment parameters. However, quality management of these parameters is currently fragmented across various departments, leading to information dissemination and the inability to dynamically update parameter quality standards based on actual production conditions, thus reducing a company's production efficiency. Summary of the Invention

[0003] This application provides a parameter quality management method and related devices and media program products, in order to update parameter quality standards in real time and improve user production efficiency.

[0004] In a first aspect, an embodiment of the present application provides a parameter quality management method, which is applied to a server and includes:

[0005] Obtaining a first parameter scorecard for characterizing a quality status of a target parameter, the first parameter scorecard including a first specification upper limit value USL of the target parameter and / or a first specification lower limit value LSL of the target parameter, the target parameter including at least one of the following: a product parameter, a component parameter, and a process equipment parameter, wherein the product parameter refers to a parameter of a production result obtained through a production process, the component parameter refers to a parameter of an initial material added and / or a parameter of an intermediate product obtained during the production process, and the process equipment parameter refers to a parameter of equipment used during the production process;

[0006] Updating the first upper specification limit USL and / or the first lower specification limit LSL of the component parameter and the process equipment parameter in the target parameter to obtain the second upper specification limit USL and / or the second lower specification limit LSL;

[0007] updating the first parameter scorecard according to the second specification upper limit USL and / or the second specification lower limit LSL to obtain a second parameter scorecard, wherein the second parameter scorecard is used to represent the quality status of the target parameter after the update;

[0008] The parameter quality standard of the updated target parameter is determined according to the second parameter scorecard, where the parameter quality standard refers to a standard for the quality of the target parameter in the production process to be qualified.

[0009] In a second aspect, an embodiment of the present application provides a parameter quality management device, the device comprising:

[0010] an acquisition unit, configured to acquire a first parameter scorecard for characterizing the quality status of a target parameter, wherein the first parameter scorecard includes a first specification upper limit value USL of the target parameter and / or a first specification lower limit value LSL of the target parameter, wherein the target parameter includes product parameters, component parameters, and process equipment parameters, wherein the product parameters refer to parameters of a production result obtained through a production process, the component parameters refer to parameters of an initial material added in the production process and / or parameters of an intermediate product obtained, and the process equipment parameters refer to parameters of equipment used in the production process; and a first updating unit, configured to update the component parameters in the target parameter. The parameter and the first specification upper limit value USL and / or the first specification lower limit value LSL of the process equipment parameter are used to obtain the second specification upper limit value USL and / or the second specification lower limit value LSL; a second updating unit is used to update the first parameter scorecard according to the second specification upper limit value USL and / or the second specification lower limit value LSL to obtain a second parameter scorecard, and the second parameter scorecard is used to characterize the quality status of the target parameter after the update; a determination unit is used to determine the parameter quality standard of the target parameter after the update according to the second parameter scorecard, and the parameter quality standard refers to the standard for the quality of the target parameter in the production process.

[0011] In a third aspect, an embodiment of the present application provides a server comprising a processor, a memory, a communication interface, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the processor, and the programs include instructions for executing the steps in the first aspect of the embodiment of the present application.

[0012] In a fourth aspect, an embodiment of the present application provides a computer storage medium that stores a computer program for electronic data exchange, wherein the computer program enables a computer to execute some or all of the steps described in the first aspect of this embodiment.

[0013] In a fifth aspect, embodiments of the present application provide a computer program product, wherein the computer program product includes a non-transitory computer-readable storage medium storing a computer program, wherein the computer program is operable to cause a computer to perform some or all of the steps described in the first aspect of the embodiments of the present application. The computer program product may be a software installation package.

[0014] It can be seen that in the embodiment of the present application, the server first obtains a first parameter scorecard for characterizing the quality status of the target parameter, the first parameter scorecard includes the first specification upper limit USL of the target parameter and / or the first specification lower limit LSL of the target parameter, and the target parameter includes at least one of the following: product parameters, component parameters and process equipment parameters, and then updates the first specification upper limit USL and / or the first specification lower limit LSL of the component parameters and the process equipment parameters in the target parameters to obtain the second specification upper limit USL and / or the second specification lower limit LSL, and then updates the first parameter scorecard according to the second specification upper limit USL and / or the second specification lower limit LSL to obtain the second parameter scorecard, and finally determines the parameter quality standard of the updated target parameter according to the second parameter scorecard. In this way, by obtaining parameters from different departments and designing them into scorecards for unified management, and updating the scorecards according to actual production conditions, the quality standards of each parameter can be updated in real time, thereby improving user production efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0016] Figure 1 This is a schematic diagram of a system architecture provided by an embodiment of the present application;

[0017] Figure 2 This is a flow chart of a parameter quality management method provided in an embodiment of the present application;

[0018] Figure 3 This is a schematic diagram of the method steps before obtaining the first parameter scorecard provided in an embodiment of the present application;

[0019] Figure 4a This is a schematic diagram of a blank parameter scorecard provided in an embodiment of the present application;

[0020] Figure 4b is a schematic diagram of a parameter scorecard with first configuration data provided in an embodiment of the present application;

[0021] Figure 4c is a schematic diagram of a parameter scorecard with second configuration data provided in an embodiment of the present application;

[0022] Figure 4d This is a schematic diagram of a product scorecard provided in an embodiment of the present application;

[0023] Figure 4e This is a schematic diagram of a component scorecard provided in an embodiment of the present application;

[0024] Figure 4f This is a schematic diagram of a process equipment scorecard provided in an embodiment of the present application;

[0025] Figure 5a This is a block diagram of the functional units of a parameter quality management device provided in an embodiment of the present application;

[0026] Figure 5b This is a block diagram of the functional units of another parameter quality management device provided in an embodiment of the present application;

[0027] Figure 6 This is a structural block diagram of a server provided in an embodiment of the present application. DETAILED DESCRIPTION

[0028] In order to enable those skilled in the art to better understand the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0029] The terms "first," "second," and the like in the specification and claims of this application and the accompanying drawings are used to distinguish between different objects, not to describe a particular order. Furthermore, the terms "including," "having," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or elements is not limited to the listed steps or elements but may optionally include steps or elements not listed, or may optionally include other steps or elements inherent to the process, method, product, or apparatus.

[0030] References herein to "embodiments" mean that a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the present application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0031] The following is an introduction to the relevant terms involved in this application.

[0032] Production process: The production process in the embodiment of this application refers to the process by which an enterprise obtains a certain result in manufacturing or production. For example, component B is used as the initial material, processed by equipment C, and finally the production result of product A is obtained. The above process is the production process.

[0033] Parameters: The parameters in the embodiments of the present application refer to the values ​​of indicators calculated by the enterprise for products, materials or equipment during the production process. For example, product parameters refer to the parameters of the production results obtained through the production process, component parameters refer to the parameters of the initial materials added in the production process and the parameters of the intermediate products obtained, and process equipment parameters refer to the equipment parameters in the production process. By setting parameters, the processes managed by different departments can be uniformly managed, and the specific parameter values ​​of each type of parameters can be unified, which facilitates the real-time update and comparison of subsequent parameter quality standards.

[0034] Parameter scorecard: The parameter scorecard in the embodiment of the present application is a tool for summarizing the above parameters and parameter values. It can be in a tabular form and has the ability to update numerical values.

[0035] Upper Spec Limit (USL) and Lower Spec Limit (LSL) refer to the range of values ​​within which parameter values ​​are allowed to fluctuate.

[0036] Capability Index of Process (Cpk): refers to the degree to which process capability meets product quality standard requirements (specification range, etc.).

[0037] Performance Index of Process (Ppk): refers to the process performance of sample data when considering deviations caused by special causes of the process. It is generally used only for comparison with Cp and Cpk, and / or together with Cp and Cpk to measure and confirm the priority of improvement over a period of time.

[0038] Defects per Million Opportunities (DPMO) refers to the chance of a defect occurring in 1 million opportunities. A defect is when the output of a product, service, or process does not meet customer requirements or exceeds specifications.

[0039] Sigma level (Z value): Used to describe the degree to which the output range is free of deviation. It is the ratio of the specification range to twice the standard deviation, that is, Z = (USL - LSL) / 2σ, where σ is the standard deviation.

[0040] At present, in the production process, the quality management of various parameters is scattered among various departments. For example, product parameters are managed by the R&D department, component parameters are managed by the quality department, and process equipment parameters are managed by the manufacturing department. Information cannot be communicated, making it impossible to dynamically update parameter quality standards according to changes in actual production conditions. The lack of a unified parameter quality management system in the production process has reduced the company's production efficiency.

[0041] To solve the above problems, an embodiment of the present application provides a parameter quality management method, which can be applied to the field of production and manufacturing business. This method can be used to uniformly manage the parameters of different production qualities that each department of the enterprise is responsible for, and form a first parameter scorecard through the configuration of each department. In subsequent simulation experiments or actual production processes, the first parameter scorecard is updated according to the specific circumstances to form the latest version of the second parameter scorecard, and then the latest parameter quality standard is determined based on the second parameter scorecard, thereby realizing real-time update of the parameter quality standard. The present application can be applicable to a variety of application scenarios that require parameter quality management or update, including but not limited to the application scenarios mentioned above.

[0042] The following introduces the system architecture involved in the embodiments of this application.

[0043] See also Figure 1 , Figure 1 This is a schematic diagram of a system architecture provided by an embodiment of the present application. Figure 1 As shown, the system architecture 10 includes a server 11 and multiple clients 12. The server 11 is in communication with the multiple clients 12, wherein the server 11 obtains various parameter values ​​in the first parameter scorecard that need to be configured by the clients from the multiple clients 12. The server 11 can be a single server, or a server cluster consisting of several servers, or a cloud computing service center. The multiple clients 12 can be mobile terminals, tablet computers, laptop computers, vehicle-mounted terminals, etc. Exemplarily, the multiple clients 12 can be computers used by various departments of an enterprise to configure the first parameter scorecard.

[0044] The following describes a parameter quality management method provided in an embodiment of the present application.

[0045] See also Figure 2 , Figure 2 This is a flow chart of a parameter quality management method provided by an embodiment of the present application, wherein the method is applied to a server, such as Figure 2 As shown, the parameter quality management method includes:

[0046] Step 201: Obtain a first parameter scorecard for characterizing the quality status of a target parameter, wherein the first parameter scorecard includes a first upper specification limit value USL of the target parameter and / or a first lower specification limit value LSL of the target parameter, and the target parameter includes at least one of the following: a product parameter, a component parameter, and a process equipment parameter.

[0047] Among them, the product parameters refer to the parameters of the production results obtained through the production process, the component parameters refer to the parameters of the initial materials added in the production process and / or the parameters of the intermediate products obtained, the process equipment parameters refer to the parameters of the equipment used in the production process, and the quality status refers to the various parameter values ​​of the target parameters, and the parameter values ​​can reflect the quality of the target parameters; corresponding to the target parameters, the first parameter scorecard includes at least one of the following: a product scorecard, a component scorecard, and a process equipment scorecard.

[0048] Step 202 , updating the first upper specification limit USL and / or the first lower specification limit LSL of the component parameter and the process equipment parameter in the target parameter to obtain a second upper specification limit USL and / or a second lower specification limit LSL;

[0049] Among them, in the actual production process, since the product is the final result directly facing the customer, the product needs to be locked in a specification range that will not bring a negative experience to the user. Therefore, the upper and lower limits of the product parameters are relatively fixed after the engineer completes the configuration of the first parameter scorecard. The product specification limits will not be changed during the subsequent automatic update of the server. If modifications are required under special circumstances, the designer can manually change them. Therefore, in this step, the server only needs to update the upper and lower limits of the component parameters and process equipment parameters in the target parameters.

[0050] Step 203: Update the first parameter scorecard according to the second specification upper limit USL and / or the second specification lower limit LSL to obtain a second parameter scorecard.

[0051] The second parameter scorecard is used to represent the quality status of the target parameter after the update. After the second specification upper and lower limits are updated, the other parameter values ​​on the first parameter scorecard can be recalculated and the calculated values ​​can be entered into the first parameter scorecard to achieve data update.

[0052] Step 204: Determine the parameter quality standard of the updated target parameter according to the second parameter scorecard.

[0053] The parameter quality standard refers to the standard for the quality of the target parameter in the production process. The parameter quality standard may be the various parameter value indicators of the target parameter in the parameter scorecard when the final product is available to customers and customer feedback is high in satisfaction.

[0054] As can be seen, in this example, the server first obtains a first parameter scorecard used to characterize the quality status of the target parameter. The first parameter scorecard includes the first upper specification limit USL and / or the first lower specification limit LSL of the target parameter. The target parameter includes at least one of the following: product parameters, component parameters, and process equipment parameters. The server then updates the first upper specification limit USL and / or the first lower specification limit LSL of the component parameter and the process equipment parameter in the target parameter to obtain the second upper specification limit USL and / or the second lower specification limit LSL. The server then updates the first parameter scorecard based on the second upper specification limit USL and / or the second lower specification limit LSL to obtain the second parameter scorecard. Finally, the updated parameter quality standard of the target parameter is determined based on the second parameter scorecard. In this way, by obtaining parameters from different departments and designing them into scorecards for unified management, and updating the scorecards according to actual production conditions, the quality standards of each parameter can be updated in real time, thereby improving user production efficiency.

[0055] For a possible example, see Figure 3 , Figure 3 This is a schematic diagram of the method steps before obtaining the first parameter scorecard provided in an embodiment of the present application. Figure 3 As shown, before obtaining the first parameter scorecard for characterizing the quality status of the target parameter, the method further includes:

[0056] Step S301: Create a blank parameter scorecard.

[0057] The blank parameter scorecard is set with various parameter indicators of the target parameter, but the parameter values ​​corresponding to the parameter indicators are empty and need to be filled in and configured by the R&D personnel of each department. Figure 4a , Figure 4a This is a schematic diagram of a blank parameter scorecard provided in an embodiment of the present application, such as Figure 4a As shown, taking the product scorecard with target product A as an example, the title of the blank parameter scorecard is "Product A Parameter Management". The blank parameter scorecard can contain several target parameters, and each target parameter has corresponding parameter indicators, such as variable parameter number, variable parameter name, parameter unit, measurement method, data attribute, target value, etc., and in this step, the parameter value of each parameter indicator is empty, which needs to be configured later by R&D personnel from each department.

[0058] Step S302: Acquire first configuration data from the client.

[0059] The first configuration data includes the variable parameter number, variable parameter name, parameter unit, measurement method, data type and data attribute of the target parameter. The data attribute includes short-term data and long-term data. When the data attribute is short-term data, ST=1, and the standard deviation of the target parameter is the short-term standard deviation σ1. When the data attribute is long-term data, ST=0, and the standard deviation of the target parameter is the long-term standard deviation σ0. The value of ST can be used to subsequently calculate the sigma level of the target parameter. For example, please refer to Figure 4b , Figure 4b This is a schematic diagram of a parameter scorecard with first configuration data provided by an embodiment of the present application, such as Figure 4b As shown, taking the product scorecard of the target product A as an example, the title of the product scorecard is "Product A Parameter Management". The R&D personnel fill the first configuration data into the parameter scorecard in sequence based on the experimental data, and obtain the result shown in the figure.

[0060] Step S303: Acquire second configuration data from the client, where the second configuration data includes a first specification upper limit value USL of the target parameter and / or a first specification lower limit value LSL of the target parameter.

[0061] In one possible example, before obtaining the second configuration data from the client, the method further includes: obtaining a measurement score of the target parameter, the measurement score being used to characterize whether the target parameter meets the qualification standard; and determining whether the target parameter meets the qualification standard based on the measurement score and a preset parameter measurement qualification standard.

[0062] Among them, the server stores a parameter measurement system database, which is connected to the laboratory management system data source of the R&D department and the production quality system data source of the quality department. Before configuring the second configuration data, the parameter measurement system database will obtain product data from the production quality system, measure the target parameter according to the product data, obtain a measurement score, and compare the measurement score with the preset parameter measurement qualification standard to determine whether the target parameter meets the qualification standard. Only when the target parameter meets the qualification standard will the server allow the configuration of the second configuration data.

[0063] As can be seen, in this example, the target parameters are evaluated according to the qualification standards through the parameter measurement system database, and only qualified target parameters are allowed to enter the process. Unqualified parameters can be clearly eliminated, so that product defects can be quickly found, which facilitates enterprise management and ensures the accuracy of the entire process in subsequent updates.

[0064] In one possible example, obtaining the second configuration data from the client includes: screening out N target parameters that meet the qualification criteria; calculating the values ​​of the specification limits of the N target parameters; if the specification requirement of the target parameter is a single specification, selecting the maximum value of the specification limit as the first specification upper limit value USL or selecting the minimum value of the specification limit as the first specification lower limit value LSL; if the specification requirement of the target parameter is a double specification, selecting the maximum value of the specification limit as the first specification upper limit value USL and selecting the minimum value of the specification limit as the first specification lower limit value LSL.

[0065] Among them, the specification requirements of parameters can be divided into single specification and double specification. The specification limit of the parameter with single specification is only one of USL and LSL, which needs to be flexibly determined based on experimental data or production conditions. At this time, the value of its specification limit is calculated, and the maximum value is taken as USL, or the minimum value is taken as LSL; the specification limit of the parameter with double specification includes USL and LSL. After calculating the value of its specification limit, the maximum value is taken as USL and the minimum value is taken as LSL.

[0066] For example, see Figure 4c , Figure 4c This is a schematic diagram of a parameter scorecard with second configuration data provided by an embodiment of the present application, such as Figure 4c As shown, taking the product scorecard of the target product A as an example, the title of the product scorecard is "Product A Parameter Management". When the target parameter reaches the qualified standard, "Qualified" is filled in the "Analysis Result" of the parameter scorecard, and the upper and lower limits of the specification are filled in according to the experimental data.

[0067] Step S304: Calculate and obtain a first attribute value of the target parameter based on a preset algorithm.

[0068] The first attribute values ​​include a first mean, a first standard deviation, a first process capability index (Cpk), a first process performance index (Ppk), a first defect rate per million samples (DPMO), and a first sigma level (Z). The preset algorithm can be an existing algorithm or calculated using a database system with computing capabilities. In this example, the preset algorithm can calculate the first attribute values ​​using a scorecard database stored on a server. The scorecard database is connected to the R&D department's laboratory management system data source and design simulation system data source, providing them with data information and computing capabilities. The scorecard database can also fully record the data set of the N target parameters that meet the qualification standards.

[0069] In a possible example, the first attribute value of the target parameter is calculated based on a preset algorithm, including: determining the first process capability index Cpk and the first process performance index Ppk based on the first mean, the first standard deviation, the first specification upper limit USL and / or the first specification lower limit LSL; determining the first defect rate per million samples DPMO based on the first mean, the first standard deviation, the data attribute, the first specification upper limit USL and / or the first specification lower limit LSL; determining the first sigma level Z value based on the first defect rate per million samples DPMO.

[0070] Where, Cpk=min{Cpl, Cpu}, Cpl=(μ-LSL) / 3σ1, Cpu=(USL-μ) / 3σ1, μ is the mean, σ1 is the short-term standard deviation; Ppk=min{Ppu, Ppl}, Ppu=(USL-μ) / 3σ0, Ppl=(μ-LSL / 3σ0), μ is the mean, σ0 is the long-term standard deviation; from Z LSL =(μ-LSL) / σ-1.5*ST, DPMO can be obtained LSL =IF(Z LSL <4.51,1000000*(1-NORMSDIST(Z LSL )), 0); by Z USL =(USL-μ) / σ-1.5*ST, DPMO can be obtained USL =IF(Z USL <4.51,1000000*(1-NORMSDIST(Z USL )), 0), wherein, when the data attribute is short-term, ST=1, when the data attribute is long-term, ST=0, NORMSDIST represents the normal cumulative distribution function, and from the above, DPMO=DPMO LSL +DPMO USL Sigma level Z value (short term) = -NORMSINV(DPMO / 1000000) + 1.5, where NORMSINV represents the normal inverse cumulative distribution function, and if DPMO < 3.4, then Z value > 6. Optionally, the present application can also predict the pass rate of the target parameter based on the defect rate per million samples DPMO, that is, pass rate = 1-DPMO / 1000000.

[0071] Step S305: determining a first target value of the target parameter according to the first standard deviation, the first upper specification limit USL and / or the first lower specification limit LSL.

[0072] Among them, target value = USL-4σ or target value = LSL+4σ.

[0073] Step S306: Fill the blank parameter scorecard with the first configuration data, the second configuration data, the first target value, and the first attribute value to obtain the first parameter scorecard.

[0074] For example, see Figure 4d , Figure 4d This is a schematic diagram of a product scorecard provided in an embodiment of the present application. Figure 4d As shown, the title of the product scorecard is "Product A Parameter Management". After filling the above configuration data and calculated parameter values ​​into the blank parameter scorecard, the product scorecard in the first parameter scorecard is obtained. The first parameter scorecard also includes component scorecards and process equipment scorecards. For auxiliary understanding, please refer to Figure 4e and Figure 4f , Figure 4e is a schematic diagram of a component scorecard provided in an embodiment of the present application. For example, the title of the component scorecard is “B Component Parameter Management”; Figure 4f This is a schematic diagram of a process equipment scorecard provided in an embodiment of the present application. For example, the title of the process equipment scorecard is "C Equipment Parameter Management". The parameter value configuration and calculation process in the component scorecard and process equipment scorecard refer to the parameter value configuration and calculation part in the above-mentioned product scorecard, which will not be repeated here. As shown in the figure, Figure 4e The component scorecard is a component scorecard with component B as the original material, which is used to manage the relevant parameters of component B. Figure 4f The process equipment scorecard is a process equipment scorecard based on C equipment, which is used to manage the relevant parameters of production using C equipment.

[0075] As can be seen, in this example, the design of the first parameter scorecard unifies the quality parameters that are separately managed by various departments during the enterprise's production process, and presents various parameter indicators to users in a visual form, which facilitates user management, improves user production efficiency, and lays the foundation for subsequent updating of the parameter scorecard based on actual production conditions.

[0076] In one possible example, the updating of the first specification upper limit USL and / or the first specification lower limit LSL of the component parameters and the process equipment parameters in the target parameters to obtain the second specification upper limit USL and / or the second specification lower limit LSL includes: determining whether the component parameters and the process equipment parameters meet the qualification standard after updating based on the updated measurement scores of the component parameters and the process equipment parameters and the preset parameter measurement qualification standard; screening out M updated target parameters that meet the qualification standard, wherein the M updated target parameters include x updated component parameters and y updated process equipment parameters; calculating the specification limit values ​​of the x updated component parameters and the y updated process equipment parameters respectively; if the specification requirement of the updated parameter is a single specification, selecting the maximum value of the specification limit value as the second specification upper limit USL or selecting the minimum value of the specification limit value as the second specification lower limit LSL; if the specification requirement of the updated parameter is a double specification, selecting the maximum value of the specification limit value as the second specification upper limit USL and selecting the minimum value of the specification limit value as the second specification lower limit LSL.

[0077] As mentioned in step 202, since the upper and lower specification limits of the product parameters are relatively fixed after the engineers have completed the configuration, when the parameter scorecard is subsequently updated, only the upper and lower specification limits of the component parameters and process equipment parameters will be updated; similar to the above example, before updating the upper and lower specification limits, it is still necessary to first measure the updated target parameters through the parameter measurement system database to obtain the measurement score and determine whether the updated target parameters are qualified based on the measurement score. Only when the qualified standards are met will the update be allowed; when the updated target parameters meet the qualified standards, the server will screen out all M updated target parameters that meet the qualified standards, including x updated component parameters and y updated process equipment parameters, so the updated product parameters are (Mxy); similar to the above example, according to the single specification or dual specification requirements, by calculating the specification limit values ​​of x updated component parameters and y updated process equipment parameters, the corresponding updated second specification upper and lower limits are obtained respectively.

[0078] As can be seen, in this example, by differentially updating the upper and lower specification limits and retaining the pre-update qualification standard screening, the rationality and reliability of updating the parameter scorecard based on actual production conditions are guaranteed.

[0079] In a possible example, updating the first parameter scorecard according to the second specification upper limit value USL and / or the second specification lower limit value LSL to obtain the second parameter scorecard includes: calculating the second attribute value after the target parameter is updated based on a preset algorithm, the second attribute value including the second mean, the second standard deviation, the second process capability index Cpk, the second process performance index Ppk, the second defect rate per million sampling times DPMO and the second sigma level Z value; determining the second target value after the target parameter is updated according to the second standard deviation, the second specification upper limit value USL and / or the second specification lower limit value LSL; filling the second specification upper limit value USL, the second specification lower limit value LSL, the second target value and the second attribute value into the first parameter scorecard for data update to obtain the second parameter scorecard.

[0080] As in the previous example, the preset algorithm can be an existing algorithm or calculated using a database system with computing capabilities. In this example, the preset algorithm can be used to calculate the second attribute value using a scorecard database stored on a server. The scorecard database is connected to the R&D department's laboratory management system data source, the design simulation system data source, and the quality department's production quality system, providing them with data information and computing capabilities. The scorecard database can also fully record the data set of the M updated target parameters that meet the qualification standards. Also, as in the previous example, the target value = USL - 4σ or the target value = LSL + 4σ.

[0081] In a possible example, the second attribute value after the target parameter is updated is calculated based on a preset algorithm, including: determining the second process capability index Cpk and the second process performance index Ppk based on the second mean, the second standard deviation, the second specification upper limit USL and / or the second specification lower limit LSL; determining the second defect rate per million samplings DPMO based on the second mean, the second standard deviation, the data attribute corresponding to the target parameter, the second specification upper limit USL and / or the second specification lower limit LSL; determining the second sigma level Z value based on the second defect rate per million samplings DPMO.

[0082] Among them, since only the parameter values ​​are changed after the parameter scorecard is updated, and the relevant calculation formulas are not changed, the calculation formulas for the process capability index Cpk, the process performance index Ppk, the defect rate per million samples DPMO, and the sigma level Z value are as shown in the aforementioned step S304 and are not repeated here.

[0083] It can be seen that in this example, the other parameter values ​​in the first parameter scorecard are updated according to the actual production situation to obtain the second parameter scorecard, so that the real-time changes of the entire production process are presented to the user in a concrete way. The user can understand the parameter quality standards in the current state based on the real-time update of the parameter scorecard, which facilitates management and improves production efficiency.

[0084] In accordance with the above-mentioned embodiment, please refer to Figure 5a , Figure 5a This is a functional unit block diagram of a parameter quality management device provided in an embodiment of the present application, wherein the device is applied to a server, such as Figure 5a As shown, the parameter quality management device 50 includes: an acquisition unit 501, which is used to acquire a first parameter scorecard for characterizing the quality status of the target parameter, the first parameter scorecard including a first specification upper limit value USL of the target parameter and / or a first specification lower limit value LSL of the target parameter, the target parameter including product parameters, component parameters and process equipment parameters, the product parameters refer to parameters of the production results obtained through the production process, the component parameters refer to parameters of the initial materials added in the production process and / or parameters of the intermediate products obtained, and the process equipment parameters refer to parameters of the equipment used in the production process; a first updating unit 502, which is used to update the The first specification upper limit value USL and / or the first specification lower limit value LSL of the component parameter and the process equipment parameter in the target parameter obtains the second specification upper limit value USL and / or the second specification lower limit value LSL; the second updating unit 503 is used to update the first parameter scorecard according to the second specification upper limit value USL and / or the second specification lower limit value LSL to obtain the second parameter scorecard, and the second parameter scorecard is used to characterize the quality status of the target parameter after the update; the determining unit 504 is used to determine the parameter quality standard of the target parameter after the update according to the second parameter scorecard, and the parameter quality standard refers to the standard for the quality of the target parameter in the production process.

[0085] In one possible example, before obtaining the first parameter scorecard for characterizing the quality status of the target parameter, the parameter quality management device 50 is further used to: create a blank parameter scorecard; obtain first configuration data from the client, the first configuration data including the variable parameter number, variable parameter name, parameter unit, measurement method, data type and data attribute of the target parameter; obtain second configuration data from the client, the second configuration data including the first specification upper limit value USL of the target parameter and / or the first specification lower limit value LSL of the target parameter; calculate the first attribute value of the target parameter based on a preset algorithm, the first attribute value including the first mean, the first standard deviation, the first process capability index Cpk, the first process performance index Ppk, the first defect rate per million sampling times DPMO and the first sigma level Z value; determine the first target value of the target parameter according to the first standard deviation, the first specification upper limit value USL and / or the first specification lower limit value LSL; fill the first configuration data, the second configuration data, the first target value and the first attribute value into the blank parameter scorecard to obtain the first parameter scorecard.

[0086] In one possible example, before obtaining the second configuration data from the client, the parameter quality management device 50 is further used to: obtain a measurement score of the target parameter, the measurement score being used to characterize whether the target parameter meets the qualification standard; and determine whether the target parameter meets the qualification standard based on the measurement score and a preset parameter measurement qualification standard.

[0087] In one possible example, in terms of obtaining the second configuration data from the client, the acquisition unit 501 is specifically used to: screen out N target parameters that meet the qualification criteria; calculate the values ​​of the specification limits of the N target parameters; if the specification requirement of the target parameter is a single specification, the maximum value of the specification limit is selected as the first specification upper limit value USL or the minimum value of the specification limit is selected as the first specification lower limit value LSL; if the specification requirement of the target parameter is a double specification, the maximum value of the specification limit is selected as the first specification upper limit value USL and the minimum value of the specification limit is selected as the first specification lower limit value LSL.

[0088] In one possible example, in terms of calculating the first attribute value of the target parameter based on a preset algorithm, the acquisition unit 501 is specifically used to: determine the first process capability index Cpk and the first process performance index Ppk based on the first mean, the first standard deviation, the first specification upper limit USL and / or the first specification lower limit LSL; determine the first defect rate per million samplings DPMO based on the first mean, the first standard deviation, the data attribute, the first specification upper limit USL and / or the first specification lower limit LSL; determine the first sigma level Z value based on the first defect rate per million samplings DPMO.

[0089] In one possible example, in terms of updating the first specification upper limit USL and / or the first specification lower limit LSL of the component parameter and the process equipment parameter in the target parameter to obtain the second specification upper limit USL and / or the second specification lower limit LSL, the first updating unit 502 is specifically used to: determine whether the component parameter and the process equipment parameter meet the qualification standard after updating based on the updated measurement scores of the component parameter and the process equipment parameter and the preset parameter measurement qualification standard; screen out M updated target parameters that meet the qualification standard, wherein the M updated target parameters include x updated component parameters and y updated process equipment parameters; calculate the specification limit values ​​of the x updated component parameters and the y updated process equipment parameters respectively; if the specification requirement of the updated parameter is a single specification, select the maximum value of the specification limit value as the second specification upper limit USL or select the minimum value of the specification limit value as the second specification lower limit LSL; if the specification requirement of the updated parameter is a double specification, select the maximum value of the specification limit value as the second specification upper limit USL and select the minimum value of the specification limit value as the second specification lower limit LSL.

[0090] In a possible example, in updating the first parameter scorecard according to the second specification upper limit value USL and / or the second specification lower limit value LSL to obtain the second parameter scorecard, the second updating unit 503 is specifically used to: calculate the second attribute value after the target parameter is updated based on a preset algorithm, the second attribute value including the second mean, the second standard deviation, the second process capability index Cpk, the second process performance index Ppk, the second defect rate per million sampling times DPMO and the second sigma level Z value; determine the second target value after the target parameter is updated according to the second standard deviation, the second specification upper limit value USL and / or the second specification lower limit value LSL; fill the second specification upper limit value USL, the second specification lower limit value LSL, the second target value and the second attribute value into the first parameter scorecard for data update to obtain the second parameter scorecard.

[0091] In one possible example, in terms of obtaining the second attribute value after the target parameter is updated by calculating based on a preset algorithm, the second updating unit 503 is specifically used to: determine the second process capability index Cpk and the second process performance index Ppk based on the second mean, the second standard deviation, the second upper specification limit USL and / or the second lower specification limit LSL; determine the second defect rate per million samplings DPMO based on the second mean, the second standard deviation, the data attribute corresponding to the target parameter, the second upper specification limit USL and / or the second lower specification limit LSL; determine the second sigma level Z value based on the second defect rate per million samplings DPMO.

[0092] It can be understood that since the method embodiment and the device embodiment are different presentation forms of the same technical concept, the content of the method embodiment part in this application should be synchronously adapted to the device embodiment part and will not be repeated here.

[0093] In the case of integrated units, such as Figure 5b As shown, Figure 5b This is a block diagram of the functional units of another parameter quality management device provided by an embodiment of the present application. Figure 5b In the embodiment, the parameter quality management device 51 includes: a processing module 512 and a communication module 511. The processing module 512 is used to control and manage the actions of the parameter quality management device, for example, executing the steps of the acquisition unit 501, the first update unit 502, the second update unit 503 and the determination unit 504, and / or other processes for performing the technology described herein. The communication module 511 is used to support the interaction between the parameter quality management device and other devices. Figure 5bAs shown, the parameter quality management device may further include a storage module 513, which is used to store program codes and data of the parameter quality management device. The parameter quality management device 51 may be the aforementioned parameter quality management device 50.

[0094] The processing module 512 may be a processor or controller, such as a central processing unit (CPU), a general-purpose processor, a digital signal processor (DSP), an ASIC, an FPGA, or other programmable logic device, a transistor logic device, a hardware component, or any combination thereof. It may implement or execute the various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. The processor may also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like. The communication module 511 may be a transceiver, an RF circuit, or a communication interface, and the like. The storage module 513 may be a memory.

[0095] Among them, all relevant contents of each scenario involved in the above method embodiment can be referred to the functional description of the corresponding functional module, and will not be repeated here. The above parameter quality management device 51 can execute the above Figure 2 Parameter quality management method shown.

[0096] The above embodiments can be implemented in whole or in part by software, hardware, firmware or any other combination. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer program are loaded or executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from one website, computer, server or data center to another website, computer, server or data center via wired or wireless means. The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device such as a server or data center that contains one or more available media sets. The available medium can be a magnetic medium (for example, a floppy disk, a hard disk, a tape), an optical medium (for example, a DVD), or a semiconductor medium. The semiconductor medium can be a solid-state drive.

[0097] Figure 6This is a structural block diagram of a server provided in an embodiment of the present application. Figure 6 As shown, the server 600 may include one or more of the following components: a processor 601, and a memory 602 coupled to the processor 601. The memory 602 may store one or more computer programs, and the one or more computer programs may be configured to implement the methods described in the above embodiments when executed by the one or more processors 601. The server 600 may be the aforementioned server 11.

[0098] Processor 601 may include one or more processing cores. Processor 601 utilizes various interfaces and circuits to connect various components within server 600. It executes instructions, programs, code sets, or instruction sets stored in memory 602, and accesses data stored in memory 602 to perform various server 600 functions and process data. Optionally, processor 601 may be implemented using at least one of the following hardware forms: digital signal processing (DSP), field-programmable gate array (FPGA), and programmable logic array (PLA). Processor 601 may integrate one or a combination of a central processing unit (CPU), a graphics processing unit (GPU), and a modem. The CPU primarily processes the operating system, user interface, and application programs; the GPU is responsible for rendering and drawing display content; and the modem handles wireless communications. It is understood that the modem may not be integrated into processor 601 and may be implemented separately via a communications chip.

[0099] The memory 602 may include a random access memory (RAM) or a read-only memory (ROM). The memory 602 may be used to store instructions, programs, codes, code sets, or instruction sets. The memory 602 may include a program storage area and a data storage area. The program storage area may store instructions for implementing an operating system, instructions for implementing at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above-mentioned various method embodiments, etc. The data storage area may also store data created by the server 600 during use.

[0100] It is understandable that the server 600 may include more or fewer structural elements than those in the above structural block diagram, for example, including a power module, physical buttons, WiFi (Wireless Fidelity) module, speakers, Bluetooth modules, sensors, etc., which are not limited here.

[0101] An embodiment of the present application also provides a computer storage medium, wherein the computer storage medium stores a computer program for electronic data exchange, and the computer program enables a computer to execute part or all of the steps of any method described in the above method embodiments.

[0102] The present application also provides a computer program product comprising a non-transitory computer-readable storage medium storing a computer program, wherein the computer program is operable to cause a computer to execute some or all of the steps of any of the methods described in the above method embodiments. The computer program product may be a software installation package.

[0103] It should be understood that in the various embodiments of the present application, the size of the serial numbers of the above-mentioned processes does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0104] In the several embodiments provided in this application, it should be understood that the disclosed methods, devices, and systems can be implemented in other ways. For example, the device embodiments described above are merely schematic; for example, the division of the units is merely a logical function division, and there may be other division methods in actual implementation; for example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed may be through some interfaces, indirect coupling or communication connection of devices or units, which may be electrical, mechanical, or other forms.

[0105] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0106] In addition, the functional units in various embodiments of the present invention may be integrated into a single processing unit, each unit may be physically included separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or hardware plus software functional units.

[0107] The above-mentioned integrated unit implemented in the form of a software functional unit can be stored in a computer-readable storage medium. The above-mentioned software functional unit is stored in a storage medium and includes a number of instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to perform some steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: a USB flash drive, a mobile hard disk, a magnetic disk, an optical disk, a volatile memory or a non-volatile memory. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM) or a flash memory. The volatile memory can be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of random access memory (RAM) are available, such as static RAM (SRAM), dynamic random access memory (DRAM), synchronous DRAM (SDRAM), double data rate synchronous dynamic random access memory (DDR SDRAM), enhanced synchronous dynamic random access memory (ESDRAM), synchronous link dynamic random access memory (SLDRAM), and direct RAM bus random access memory (DR RAM), among other media that can store program code.

[0108] Although the present invention is disclosed above, it is not limited thereto. Any person skilled in the art may readily conceive of variations or substitutions, and may make various modifications and alterations without departing from the spirit and scope of the present invention. Combinations of the above-described functions and implementation steps, including software and hardware implementations, are all within the scope of protection of the present invention.

Claims

1. A parameter quality management method, characterized in that: The method comprises: Obtaining a first parameter scorecard for characterizing a quality status of a target parameter, the first parameter scorecard including a first specification upper limit value USL of the target parameter and / or a first specification lower limit value LSL of the target parameter, the target parameter including at least one of the following: a product parameter, a component parameter, and a process equipment parameter, wherein the product parameter refers to a parameter of a production result obtained through a production process, the component parameter refers to a parameter of an initial material added and / or a parameter of an intermediate product obtained during the production process, and the process equipment parameter refers to a parameter of equipment used during the production process; Updating the first upper specification limit USL and / or the first lower specification limit LSL of the component parameter and the process equipment parameter in the target parameter to obtain the second upper specification limit USL and / or the second lower specification limit LSL; updating the first parameter scorecard according to the second specification upper limit USL and / or the second specification lower limit LSL to obtain a second parameter scorecard, wherein the second parameter scorecard is used to represent the quality status of the target parameter after the update; determining a parameter quality standard for the updated target parameter according to the second parameter scorecard, wherein the parameter quality standard refers to a standard for the quality of the target parameter in the production process; in, The updating of the first upper specification limit USL and / or the first lower specification limit LSL of the component parameter and the process equipment parameter in the target parameter to obtain the second upper specification limit USL and / or the second lower specification limit LSL includes: Determining whether the updated component parameters and process equipment parameters meet the qualified standards based on the updated measurement scores of the component parameters and the process equipment parameters and the preset parameter measurement qualified standards; Screening out M updated target parameters that meet the qualification criteria, wherein the M updated target parameters include x updated component parameters and y updated process equipment parameters; Calculating values ​​of specification limits of the x updated component parameters and the y updated process equipment parameters respectively; If the specification requirement of the updated parameter is a single specification, the maximum value of the specification limit is selected as the second specification upper limit USL or the minimum value of the specification limit is selected as the second specification lower limit LSL; If the specification requirement of the updated parameter is dual specification, the maximum value of the specification limit is selected as the second specification upper limit value USL, and the minimum value of the specification limit is selected as the second specification lower limit value LSL.

2. The method according to claim 1, characterized in that Before obtaining the first parameter scorecard for characterizing the quality status of the target parameter, the method further includes: Create a blank parameter scorecard; Acquire first configuration data from a client, where the first configuration data includes a variable parameter number, a variable parameter name, a parameter unit, a measurement method, a data type, and data attributes of the target parameter; Acquire second configuration data from a client, where the second configuration data includes a first specification upper limit value USL of the target parameter and / or a first specification lower limit value LSL of the target parameter; Obtaining, based on a preset algorithm, a first attribute value of the target parameter by calculation, the first attribute value including a first mean, a first standard deviation, a first process capability index Cpk, a first process performance index Ppk, a first defect rate per million samples DPMO, and a first sigma level Z value; Determine a first target value of the target parameter according to the first standard deviation, the first upper specification limit USL and / or the first lower specification limit LSL; Fill the first configuration data, the second configuration data, the first target value, and the first attribute value into the blank parameter scorecard to obtain the first parameter scorecard.

3. The method according to claim 2, characterized in that Before obtaining the second configuration data from the client, the method further includes: Obtaining a measurement score of the target parameter, wherein the measurement score is used to indicate whether the target parameter meets a qualified standard; It is determined whether the target parameter meets the qualification standard based on the measurement score and the preset parameter measurement qualification standard.

4. The method according to claim 3, characterized in that The obtaining of the second configuration data from the client includes: Screen out N target parameters that meet the qualification standards; Calculating the values ​​of the specification limits of the N target parameters; If the specification requirement of the target parameter is a single specification, the maximum value of the specification limit is selected as the first specification upper limit USL, or the minimum value of the specification limit is selected as the first specification lower limit LSL; If the specification requirement of the target parameter is dual specification, the maximum value of the specification limit is selected as the first specification upper limit value USL, and the minimum value of the specification limit is selected as the first specification lower limit value LSL.

5. The method according to claim 2, characterized in that: The calculating and obtaining the first attribute value of the target parameter based on a preset algorithm includes: Determine the first process capability index Cpk and the first process performance index Ppk according to the first mean, the first standard deviation, the first upper specification limit USL and / or the first lower specification limit LSL; Determine the first defect rate per million samples DPMO based on the first mean, the first standard deviation, the data attribute, the first upper specification limit USL and / or the first lower specification limit LSL; The first sigma level Z value is determined according to the first defect rate per million samples DPMO.

6. The method according to any one of claims 1 to 5, characterized in that Updating the first parameter scorecard according to the second specification upper limit USL and / or the second specification lower limit LSL to obtain a second parameter scorecard includes: Obtaining, based on a preset algorithm, a second attribute value of the updated target parameter, the second attribute value including a second mean, a second standard deviation, a second process capability index Cpk, a second process performance index Ppk, a second defect rate per million samples DPMO, and a second sigma level Z value; Determine a second target value after the target parameter is updated according to the second standard deviation, the second upper specification limit USL and / or the second lower specification limit LSL; The second specification upper limit value USL, the second specification lower limit value LSL, the second target value, and the second attribute value are filled into the first parameter scorecard to update the data and obtain the second parameter scorecard.

7. A parameter quality management device, characterized in that: The device comprises: an acquisition unit, configured to acquire a first parameter scorecard for characterizing a quality status of a target parameter, the first parameter scorecard including a first specification upper limit USL of the target parameter and / or a first specification lower limit LSL of the target parameter, the target parameters including product parameters, component parameters, and process equipment parameters, the product parameters being parameters of a production result obtained through a production process, the component parameters being parameters of an initial material added and / or parameters of an intermediate product obtained during the production process, and the process equipment parameters being parameters of equipment used during the production process; a first updating unit, configured to update a first upper specification limit USL and / or a first lower specification limit LSL of the component parameter and the process equipment parameter in the target parameter to obtain a second upper specification limit USL and / or a second lower specification limit LSL; a second updating unit, configured to update the first parameter scorecard according to the second specification upper limit USL and / or the second specification lower limit LSL to obtain a second parameter scorecard, wherein the second parameter scorecard is used to represent the quality status of the target parameter after the update; a determining unit, configured to determine a parameter quality standard of the updated target parameter according to the second parameter scorecard, wherein the parameter quality standard refers to a standard for the quality of the target parameter in the production process to be qualified; in, The updating of the first upper specification limit USL and / or the first lower specification limit LSL of the component parameter and the process equipment parameter in the target parameter to obtain the second upper specification limit USL and / or the second lower specification limit LSL includes: Determining whether the component parameters and the process equipment parameters meet the qualification standards after being updated based on the updated measurement scores of the component parameters and the process equipment parameters and the preset parameter measurement qualification standards; Screening out M updated target parameters that meet the qualification criteria, wherein the M updated target parameters include x updated component parameters and y updated process equipment parameters; Calculating values ​​of specification limits of the x updated component parameters and the y updated process equipment parameters respectively; If the specification requirement of the updated parameter is a single specification, the maximum value of the specification limit is selected as the second specification upper limit USL or the minimum value of the specification limit is selected as the second specification lower limit LSL; If the specification requirement of the updated parameter is dual specification, the maximum value of the specification limit is selected as the second specification upper limit value USL, and the minimum value of the specification limit is selected as the second specification lower limit value LSL.

8. A server, characterized in that: The method comprises a processor, a memory and a communication interface, wherein one or more programs are stored in the memory and configured to be executed by the processor, wherein the programs include instructions for executing the steps of the method according to any one of claims 1 to 6.

9. A computer-readable storage medium or a computer program product, characterized in that: The computer program stored in the computer-readable storage medium enables a computer to execute the method according to any one of claims 1 to 6, and the computer program product enables a computer to execute the method according to any one of claims 1 to 7.

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