Headphone active noise reduction background noise testing method, device and equipment

Abstract

The embodiments of the present application provide a method, device and equipment for testing the active noise reduction background noise of headphones. The method includes: comparing the frequency domain noise data of the target headphone with the first preset threshold noise data; if it is higher than the first preset threshold noise data, comparing it with the second preset threshold noise data; if it is lower than or equal to the second preset threshold noise data, judging whether there is a frequency point with a preset bad feature in the frequency domain noise data to determine whether the target headphone is a good product. The method improves the accuracy of testing in an ordinary shielding box, does not require the establishment of an anechoic chamber or the modification of an ordinary shielding box, and avoids the problem of increased testing costs.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of headphone technology, and more particularly to a method, device and equipment for testing active noise reduction and background noise of a headphone. Background Art

[0002] With the development of True Wireless Stereo (TWS) headphones, in-ear headphones and semi-in-ear headphones occupy most of the headphone market. In-ear headphones are not suitable for all users due to the existence of stethoscope effect and obvious foreign body sensation when worn continuously, while semi-in-ear headphones do not have these problems and are more comfortable to wear. Active noise cancellation (ANC) is a noise reduction technology that generates reverse sound waves equal to external noise through the noise reduction system to neutralize the noise, thereby achieving the effect of noise reduction. ANC background noise is the noise generated when ANC is turned on due to the structure of the ANC headphones themselves, the delay of Bluetooth itself, the current sound from internal electrical components such as circuit boards, and improper filter settings in chip algorithms. The headphones need to be tested for ANC background noise before leaving the factory. Headphones that meet the test standards are good products and are allowed to leave the factory. Since the ANC background noise test of semi-in-ear headphones is a small signal test, the quietness of the test environment is very high.

[0003] In the current existing technology, the ANC background noise test of semi-in-ear headphones is mainly carried out in an anechoic chamber or a shielding box with very good isolation effect (ordinary shielding boxes cannot meet the requirements).

[0004] However, the inventors have discovered that the prior art has at least the following technical problems: setting up an anechoic chamber in a headphone production line, or modifying the isolation effect of an ordinary shielding box, will both increase testing costs. Summary of the invention

[0005] The embodiments of the present application provide a method, device and apparatus for testing the background noise of active noise reduction of headphones, so as to overcome the problem that the reply content is irrelevant to the user's inquiry statement and the user experience is poor.

[0006] In a first aspect, an embodiment of the present application provides a method for testing active noise reduction background noise of headphones, comprising:

[0007] Obtain frequency domain noise data of the active noise reduction (ANC) background noise test of the target headset, where the frequency domain noise data is the corresponding relationship between the frequency value and the noise value;

[0008] If the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data, the target earphone is determined to be a good product and a first test result is output;

[0009] If the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, comparing the frequency domain noise data of the target earphone with the second preset threshold noise data, wherein the second preset threshold noise data is higher than the first preset threshold noise data;

[0010] If the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, the target earphone is determined to be a defective product and a second test result is output;

[0011] If the frequency domain noise data of the target earphone is lower than or equal to the second preset threshold noise data, determining whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone;

[0012] If yes, the target earphone is determined to be a defective product and a second test result is output;

[0013] If not, the target earphone is determined to be a good product and the first test result is output.

[0014] In a possible implementation, after determining whether there are frequency points with preset bad characteristics in the frequency domain noise data of the target earphone, it also includes: if there are no frequency points with preset bad characteristics, determining whether the number of frequency points in the frequency domain noise data of the target earphone that exceed the first preset threshold noise data exceeds a preset condition; if it exceeds the preset condition, determining that the target earphone is a non-conforming product and outputting a second test result; if it does not exceed the preset condition, determining that the target earphone is a conforming product and outputting the first test result.

[0015] In a possible implementation, frequency domain noise data of an active noise reduction (ANC) background noise test of a target headset is obtained, wherein the frequency domain noise data is a correspondence between frequency points and noise values, including: obtaining original noise data of the target headset during an ANC background noise test in a test device; and preprocessing the original noise data to obtain the frequency domain noise data of the target headset.

[0016] In one possible implementation, the original noise data is preprocessed to obtain frequency domain noise data of the target earphone, including: performing Fourier transform processing on the original noise data of the target earphone to convert the correspondence between the time and the noise value of the original noise data into a correspondence between the frequency value and the noise value to obtain the frequency domain noise data of the target earphone.

[0017] In one possible implementation, determining whether there are frequency points with preset bad characteristics in the frequency domain noise data of the target earphone includes: determining whether there are a preset number of frequency points whose frequency values ​​have an arithmetic progression relationship among all frequency points whose frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data; if so, determining that there are frequency points with preset bad characteristics in the frequency domain noise data of the target earphone; if not, determining that there are no frequency points with preset bad characteristics in the frequency domain noise data of the target earphone.

[0018] In a possible implementation, the setting process of the first preset threshold noise data and the second preset threshold noise data is: performing an ANC background noise test on a preset number of headphones, averaging the obtained first preset number of frequency domain noise data to obtain average frequency domain noise data; adding the noise values ​​of different frequencies of the average frequency domain noise data to the first noise value to obtain the first preset threshold noise data; adding the noise values ​​of different frequencies of the average frequency domain noise data to the second noise value to obtain the second preset threshold noise data; wherein the second noise value is greater than the first noise value.

[0019] In a second aspect, an embodiment of the present application provides a headphone active noise reduction background noise testing device, comprising:

[0020] An acquisition module is used to acquire frequency domain noise data of an active noise reduction (ANC) background noise test of a target headset, wherein the frequency domain noise data is a correspondence between a frequency value and a noise value;

[0021] A first output module, configured to determine that the target earphone is a good product and output a first test result if the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data;

[0022] A first comparison module, configured to compare the frequency domain noise data of the target earphone with a second preset threshold noise data if the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, wherein the second preset threshold noise data is higher than the first preset threshold noise data;

[0023] A second output module, if the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, determines that the target earphone is a defective product and outputs a second test result;

[0024] A first judgment module is used to judge whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone if the frequency domain noise data of the target earphone is lower than or equal to the second preset threshold noise data;

[0025] A third output module, for determining that the target earphone is a non-conforming product and outputting a second test result if the target earphone exists;

[0026] The fourth output module is used to determine that the target earphone is a good product and output the first test result if it does not exist.

[0027] In a possible implementation, the second judgment module is specifically used to: if there is no frequency point with a preset bad characteristic, determine whether the number of frequency points in the frequency domain noise data of the target earphone that exceeds the first preset threshold noise data exceeds a preset condition; if it exceeds the preset condition, determine that the target earphone is a non-conforming product and output the second test result; if it does not exceed the preset condition, determine that the target earphone is a conforming product and output the first test result.

[0028] In a possible implementation, the acquisition module is specifically used to acquire original noise data of a target headset during an ANC noise floor test in a test device; and preprocess the original noise data to obtain frequency domain noise data of the target headset.

[0029] In a possible implementation, the original noise data in the acquisition module is the correspondence between time and noise value; the acquisition module is further specifically used to perform Fourier transform processing on the original noise data of the target earphone to convert the correspondence between time and noise value of the original noise data into a correspondence between frequency value and noise value to obtain frequency domain noise data of the target earphone.

[0030] In a possible implementation, the first judgment module is specifically used to determine whether there are a preset number of frequency points whose frequency values ​​have an arithmetic progression relationship among all frequency points whose frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data; if so, it is determined that there are frequency points with preset bad characteristics in the frequency domain noise data of the target earphone; if not, it is determined that there are no frequency points with preset bad characteristics in the frequency domain noise data of the target earphone.

[0031] In one possible implementation, a module is set up to perform an ANC background noise test on a preset number of headphones, average a first preset number of frequency domain noise data obtained to obtain average frequency domain noise data; add a first noise value to the noise values ​​of different frequencies of the average frequency domain noise data to obtain the first preset threshold noise data; add a second noise value to the noise values ​​of different frequencies of the average frequency domain noise data to obtain the second preset threshold noise data; wherein the second noise value is greater than the first noise value.

[0032] In a third aspect, an embodiment of the present application provides a headphone active noise reduction background noise testing device, including: at least one processor and a memory;

[0033] Memory stores computer-executable instructions;

[0034] At least one processor executes the computer-executable instructions stored in the memory, so that the at least one processor executes the headphone active noise reduction background noise testing method as described in the first aspect and various possible designs of the first aspect.

[0035] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, in which computer execution instructions are stored. When a processor executes the computer execution instructions, the active noise reduction and noise floor testing method for headphones as described in the first aspect and various possible designs of the first aspect are implemented.

[0036] In a fifth aspect, an embodiment of the present application provides a computer program product, including a computer program. When the computer program is executed by a processor, it implements the headphone active noise reduction and noise floor testing method as described in the first aspect and various possible designs of the first aspect.

[0037] The embodiments of the present application provide a method, device and equipment for testing the active noise reduction background noise of headphones. The method compares the frequency domain noise data of the target headphone with the first preset threshold noise data. If it is higher than the first preset threshold noise data, it is compared with the second preset threshold noise data. If it is lower than or equal to the second preset threshold noise data, it is determined whether there is a frequency point with a preset bad characteristic in the frequency domain noise data to determine whether the target headphone is a good product. The method improves the accuracy of testing in an ordinary shielding box, does not require the establishment of an anechoic chamber or the modification of an ordinary shielding box, and avoids the problem of increased testing costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, a brief introduction will be given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0039] Figure 1 A schematic diagram of the architecture of a headphone active noise reduction and background noise testing system provided in an embodiment of the present application;

[0040] Figure 2 Schematic diagram of the process of testing the active noise reduction background noise of headphones provided in the embodiment of the present application Figure 1 ;

[0041] Figure 3 Schematic diagram of the process of testing the active noise reduction background noise of headphones provided in the embodiment of the present application Figure 2 ;

[0042] Figure 4 Schematic diagram of the process of testing the active noise reduction background noise of headphones provided in the embodiment of the present application Figure 3 ;

[0043] Figure 5 A schematic diagram of the structure of a headphone active noise reduction and background noise testing device provided in an embodiment of the present application;

[0044] Figure 6 A schematic diagram of the hardware structure of the headphone active noise reduction and noise floor testing device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0045] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0046] For semi-in-ear headphones, in the prior art, setting up an anechoic chamber in the headphone production line or modifying the isolation effect of an ordinary shielding box will increase the testing cost. The embodiments of the present disclosure propose the following technical concepts:

[0047] Based on the noise data of the ANC background noise test of semi-in-ear headphones in an ordinary shielding box, by setting multiple thresholds and judgment conditions, the accuracy of determining good and bad products is improved. There is no need to add a new anechoic chamber or modify the shielding box, which reduces the test cost.

[0048] Figure 1 This is a schematic diagram of the architecture of the headphone active noise reduction background noise testing system provided in the embodiment of the present application. Figure 1 As shown, the system provided by this embodiment includes: a server 101 , a test device 102 and an artificial ear 103 .

[0049] The test device 101 is used to place the earphone to be tested to isolate the environmental noise. The test device 101 can be a common shielding box.

[0050] The artificial ear 102 is installed in the test device 101 and is used to wear the earphone to be tested and collect noise data of the ANC noise floor test of the earphone to be tested.

[0051] The server 103 may be connected to the artificial ear by wireless communication or wired communication, and is used to receive the noise data of the ANC noise floor test of the headset to be tested, and analyze the noise data to determine whether the headset to be tested is a good product.

[0052] The technical solution of the present application and how the technical solution of the present application solves the above-mentioned technical problems are described in detail below with specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the accompanying drawings.

[0053] Figure 2 Schematic diagram of the process of testing the active noise reduction background noise of headphones provided in the embodiment of the present application Figure 1 , the execution subject of this embodiment can be Figure 1 The server in the embodiment shown may also be other computing and processing devices, and this embodiment is not particularly limited here. Figure 2 As shown, the method includes:

[0054] S201: Obtain frequency domain noise data of an ANC noise floor test of a target headset, wherein the frequency domain noise data is a correspondence between a frequency value and a noise value.

[0055] In this embodiment, S201 specifically includes S2011 to S2012, as follows:

[0056] S2011: Acquire original noise data of the target headset during the ANC noise floor test in the test device.

[0057] In this embodiment, the test equipment may be a common shielding box.

[0058] Among them, the ANC background noise test is a test of the background noise generated when the ANC function of the headset is turned on.

[0059] Specifically, the original noise data sent by the artificial ear for performing an ANC noise floor test on a target earphone in the test equipment is received.

[0060] S2012: Preprocessing the original noise data to obtain frequency domain noise data of the target earphone.

[0061] The original noise data is the corresponding relationship between time and noise value.

[0062] Specifically, the original noise data of the target earphone is subjected to Fourier transformation processing to transform the correspondence between the time and the noise value of the original noise data into the correspondence between the frequency value and the noise value to obtain the frequency domain noise data of the target earphone.

[0063] The corresponding relationship between the frequency value and the noise value may be a curve, and each corresponding relationship between the frequency value and the noise value is recorded as a frequency point.

[0064] S202: Compare the frequency domain noise data of the target earphone with the first preset threshold noise data. If the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data, execute S203; if the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, execute S204.

[0065] The first preset threshold noise data is determined based on the pre-statistical average frequency domain noise data of the earphone. The first preset threshold noise data is the corresponding relationship between each frequency value and the first noise threshold value.

[0066] Specifically, the noise value of each frequency point in the frequency domain noise data of the target earphone is compared with the first noise threshold value corresponding to the frequency point. If the noise values ​​of all frequency points are less than or equal to the first noise threshold value, it is determined that the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data; otherwise, it is determined that the frequency domain noise data of the target earphone is higher than the first preset threshold noise data.

[0067] S203: Determine that the target earphone is a good product and output a first test result.

[0068] Among them, the first test result shows that the test is successful and the target headset is allowed to leave the factory.

[0069] S204: Compare the frequency domain noise data of the target headset with the second preset threshold noise data, wherein the test standard of the second preset threshold noise data is lower than the first preset threshold noise data; if the frequency domain noise data of the target headset is higher than the second preset threshold noise data, execute S205; if the frequency domain noise data of the target headset is lower than or equal to the second preset threshold noise data, execute S206.

[0070] The second preset threshold noise data is determined based on the average frequency domain noise data of a preset number of headphones that are pre-statistically obtained. The second preset threshold noise data is the corresponding relationship between each frequency value and the second noise threshold value.

[0071] Specifically, the noise value of each frequency point in the frequency domain noise data of the target earphone is compared with the second noise threshold value corresponding to the frequency point. If the noise value of any frequency point is greater than the second noise threshold value, it is determined that the frequency domain noise data of the target earphone is higher than the second preset threshold noise data; otherwise, it is determined that the frequency domain noise data of the target earphone is lower than or equal to the second preset threshold noise data.

[0072] S205: Determine that the target earphone is a defective product and output the test result.

[0073] The second test result indicates that the test has failed, and the target headset is not allowed to leave the factory.

[0074] S206: Determine whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone. If yes, execute S205; if no, execute S203.

[0075] Among them, the frequency points with preset bad characteristics refer to the preset frequency points with specific regular characteristics during certain specific ANC background noise tests.

[0076] For example, the frequency points of the preset bad characteristics are that the noise values ​​at different frequency points have a specific numerical relationship or mathematical relationship, or the frequency values ​​at different frequency points have a specific numerical relationship or mathematical relationship.

[0077] The numerical relationship or mathematical relationship may be an arithmetic progression relationship or a geometric progression relationship.

[0078] In summary, by comparing the frequency domain noise data of the target earphone with the first preset threshold noise data, if it is higher than the first preset threshold noise data, it is compared with the second preset threshold noise data, if it is lower than or equal to the second preset threshold noise data, it is determined whether there is a frequency point of preset bad characteristics in the frequency domain noise data to determine whether the target earphone is a good product. This method improves the accuracy of testing in an ordinary shielding box, does not require the establishment of an anechoic chamber or the modification of an ordinary shielding box, and avoids the problem of increased testing costs.

[0079] Figure 3 Schematic diagram of the process of testing the active noise reduction background noise of headphones provided in the embodiment of the present application Figure 2 In this embodiment, Figure 2 Based on the embodiment, the processing process after determining whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone is described in detail as follows:

[0080] If there is no frequency point with preset bad characteristics, it is determined whether the number of frequency points exceeding the first preset threshold noise data in the frequency domain noise data of the target earphone exceeds a preset condition. If yes, execute S205; if no, execute S203.

[0081] In this embodiment, the preset condition may be a preset number or a preset ratio.

[0082] In one embodiment of the present application, determining whether the number of frequency points in the frequency domain noise data of the target earphone that exceeds the first preset threshold noise data exceeds a preset condition is determining whether the frequency domain noise data of the target earphone exceeds the preset number.

[0083] Among them, the preset number can be 100.

[0084] Here, if the target earphone is a defective product, the corresponding frequency domain noise data exceeding the first threshold noise data will show the characteristics of lifting and bulging. Therefore, whether the target earphone is a good product can be determined by whether the number of frequency points in the frequency domain noise data exceeding the first preset threshold noise data exceeds the preset conditions.

[0085] In another embodiment of the present application, determining whether the number of frequency points in the frequency domain noise data of the target earphone that exceeds the first preset threshold noise data exceeds a preset condition is to determine whether the frequency domain noise data of the target earphone exceeds a preset proportion.

[0086] The preset ratio may be 10%.

[0087] In summary, after determining that there are no frequency points with preset adverse characteristics in the frequency domain noise data of the target earphone, it is determined whether the number of frequency points in the frequency domain noise data of the target earphone that exceeds the first preset threshold noise data exceeds the preset conditions, and it is determined whether the first threshold noise data shows the characteristics of lifting and bulging, thereby improving the efficiency and accuracy of the active noise reduction background noise measurement of the earphone.

[0088] In an optional embodiment of the present application, Figure 2 Based on the embodiment, the specific implementation process of determining whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone in this embodiment is described in detail. The method includes:

[0089] S301: Determine whether there are a preset number of frequency points whose frequency values ​​have an arithmetic progression relationship among all frequency points whose frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data.

[0090] S302: If yes, determine whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone.

[0091] S303: If not, determining that the frequency point with the preset bad characteristic does not exist in the frequency domain noise data of the target earphone.

[0092] In this embodiment, the preset number of frequency points is at least three frequency points, and may also be a larger number of frequency points, which is not limited in this application.

[0093] The arithmetic progression relationship is due to the fact that some poor ANC noise floor characteristics are manifested in the frequency domain noise data as a frequency point based on which the frequency value appears in the form of 2 times, 3 times, etc.

[0094] In summary, by judging whether there are a preset number of frequency points whose frequency values ​​have an arithmetic progression relationship among all frequency points, it is determined whether there are frequency points with preset adverse characteristics in the frequency domain noise data of the target earphone. This can quickly and easily identify the frequency points with adverse characteristics, and the identification result is relatively accurate, thereby improving the efficiency and accuracy of the active noise reduction background noise measurement of the earphone.

[0095] Figure 4 Schematic diagram of the process of testing the active noise reduction background noise of headphones provided in the embodiment of the present application Figure 3 In this embodiment, Figure 2 Based on the embodiment, the process of setting the first preset threshold noise data and the second preset threshold noise data is also included, which is described in detail as follows:

[0096] S401: Performing an ANC noise floor test on a first preset number of headphones, averaging the obtained first preset number of frequency domain noise data to obtain average frequency domain noise data.

[0097] Specifically, an ANC background noise test is performed on a first preset number of headphones to obtain a first preset number of frequency domain noise data, wherein each frequency domain noise data is a correspondence curve between different frequency values ​​and noise values; according to each correspondence curve between the frequency value and the noise value, the noise value of each frequency is averaged to obtain the average noise value corresponding to each frequency, and the correspondence curve between each frequency and the average noise value is determined as the average frequency domain noise data.

[0098] Exemplarily, the first preset number is 100. An ANC noise floor test is performed on 100 headphones, and the average value of the obtained 100 sets of frequency domain noise data is calculated, wherein the average frequency domain noise value for a frequency point of 1000 Hz is 5 dB.

[0099] S402: Add the noise values ​​of different frequencies of the average frequency domain noise data to the first noise value to obtain first preset threshold noise data.

[0100] Among them, the first noise value is 5dB.

[0101] Exemplarily, the noise value corresponding to the frequency point of 1000 Hz in the average frequency domain noise data is 5 dB, the first noise value is 5 dB, and the noise value corresponding to the frequency point of 1000 Hz in the first preset threshold noise data is 10 dB.

[0102] S403: Add the noise values ​​of different frequencies of the average frequency domain noise data to a second noise value to obtain second preset threshold noise data; wherein the second noise value is greater than the first noise value.

[0103] The second noise value is 15dB.

[0104] Exemplarily, the noise value corresponding to the frequency point of 1000 Hz in the average frequency domain noise data is 5 dB, and the second noise value is 15 dB. Then, the noise value corresponding to the frequency point of 1000 Hz in the second preset threshold noise data is 20 dB.

[0105] In summary, by conducting ANC background noise tests on a certain number of headphones, obtaining the average value of the frequency domain noise data, and adding different noise values, the first preset threshold noise data and the second preset threshold noise data are obtained, which increases the accuracy of the judgment process.

[0106] Figure 5 This is a schematic diagram of the structure of the headphone active noise reduction background noise testing device provided in the embodiment of the present application. Figure 5 As shown, in this embodiment Figure 2 Based on the embodiment, the headphone active noise reduction background noise testing device 50 includes: an acquisition module 501, a first output module 502, a first comparison module 503, a second output module 504, a first judgment module 505, a third output module 506 and a fourth output module 507.

[0107] An acquisition module 501 is used to acquire frequency domain noise data of an active noise reduction (ANC) background noise test of a target headset, wherein the frequency domain noise data is a correspondence between a frequency value and a noise value;

[0108] A first output module 502, configured to determine that the target earphone is a good product and output a first test result if the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data;

[0109] A first comparison module 503 is used to compare the frequency domain noise data of the target earphone with a second preset threshold noise data if the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, wherein the second preset threshold noise data is higher than the first preset threshold noise data;

[0110] A second output module 504, if the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, determines that the target earphone is a defective product and outputs a second test result;

[0111] A first judgment module 505 is used to judge whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone if the frequency domain noise data of the target earphone is lower than or equal to the second preset threshold noise data;

[0112] A third output module 506, for determining that the target earphone is a non-conforming product and outputting a second test result if the target earphone exists;

[0113] The fourth output module 507 is used to determine that the target earphone is a good product and output the first test result if it does not exist.

[0114] This embodiment Figure 5 On the basis of the embodiment, the headphone active noise reduction background noise testing device 50 also includes: a second judgment module 508, which is specifically used to: if there is no frequency point with a preset bad characteristic, determine whether the number of frequency points in the frequency domain noise data of the target headphone that exceeds the first preset threshold noise data exceeds a preset condition; if it exceeds the preset condition, determine that the target headphone is a non-conforming product and output the second test result; if it does not exceed the preset condition, determine that the target headphone is a conforming product and output the first test result.

[0115] In a possible implementation, the acquisition module 501 is specifically configured to acquire original noise data of a target headset during an ANC noise floor test in a test device; and preprocess the original noise data to obtain frequency domain noise data of the target headset.

[0116] In a possible implementation, the original noise data is a correspondence between time and noise value; the acquisition module 501 is further specifically used to perform Fourier transform processing on the original noise data of the target earphone to convert the correspondence between time and noise value of the original noise data into a correspondence between frequency value and noise value to obtain frequency domain noise data of the target earphone.

[0117] In a possible implementation, the first judgment module 505 is specifically used to determine whether there are a preset number of frequency points whose frequency values ​​have an arithmetic progression relationship among all frequency points whose frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data; if so, it is determined that there are frequency points with preset bad characteristics in the frequency domain noise data of the target earphone; if not, it is determined that there are no frequency points with preset bad characteristics in the frequency domain noise data of the target earphone.

[0118] This embodiment Figure 5 On the basis of the embodiment, the headphone active noise reduction background noise testing device 50 also includes: a setting module 509, which is specifically used to: perform ANC background noise testing on a preset number of headphones, average the obtained first preset number of frequency domain noise data to obtain average frequency domain noise data; add the noise values ​​of different frequencies of the average frequency domain noise data to the first noise value to obtain the first preset threshold noise data; add the noise values ​​of different frequencies of the average frequency domain noise data to the second noise value to obtain the second preset threshold noise data; wherein the second noise value is greater than the first noise value.

[0119] The device provided in this embodiment can be used to execute the technical solution of the above method embodiment. Its implementation principle and technical effect are similar, and this embodiment will not be repeated here.

[0120] Figure 6 This is a hardware structure diagram of the headphone active noise reduction background noise testing device provided in the embodiment of the present application. Figure 6As shown, the headphone active noise reduction background noise testing device 60 of this embodiment includes: a processor 601 and a memory 602;

[0121] Memory 602, used to store computer-executable instructions;

[0122] The processor 601 is used to execute the computer-executable instructions stored in the memory to implement the various steps executed by the server in the above embodiment. For details, please refer to the relevant description in the above method embodiment.

[0123] Optionally, the memory 602 may be independent or integrated with the processor 601 .

[0124] When the memory 602 is independently provided, the headphone active noise reduction and background noise testing device further includes a bus 603 for connecting the memory 602 and the processor 601 .

[0125] An embodiment of the present application also provides a computer-readable storage medium, in which computer-executable instructions are stored. When a processor executes the computer-executable instructions, the above-mentioned headphone active noise reduction background noise testing method is implemented.

[0126] An embodiment of the present application also provides a computer program product, including a computer program. When the computer program is executed by a processor, the above-mentioned headphone active noise reduction background noise testing method is implemented.

[0127] In the several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of modules is only a logical function division, and there may be other division methods in actual implementation, such as multiple modules can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or modules, which can be electrical, mechanical or other forms.

[0128] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the modules may be selected according to actual needs to implement the solution of this embodiment.

[0129] In addition, each functional module in each embodiment of the present application can be integrated into one processing unit, or each module can exist physically separately, or two or more modules can be integrated into one unit. The above-mentioned module-composed unit can be implemented in the form of hardware or in the form of hardware plus software functional units.

[0130] The above-mentioned integrated module implemented in the form of a software function module can be stored in a computer-readable storage medium. The above-mentioned software function module is stored in a storage medium, including a number of instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) or a processor to perform some steps of the methods of various embodiments of the present application.

[0131] It should be understood that the processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. A general-purpose processor may be a microprocessor or any conventional processor. The steps of the method disclosed in the invention may be directly implemented as being executed by a hardware processor, or may be implemented by a combination of hardware and software modules in the processor.

[0132] The memory may include a high-speed RAM memory, and may also include a non-volatile storage NVM, such as at least one disk memory, and may also be a USB flash drive, a mobile hard disk, a read-only memory, a magnetic disk or an optical disk, etc.

[0133] The bus may be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. The bus may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, the bus in the drawings of the present application is not limited to only one bus or one type of bus.

[0134] The above storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk. The storage medium can be any available medium that can be accessed by a general or special purpose computer.

[0135] An exemplary storage medium is coupled to a processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an application specific integrated circuit (ASIC). Of course, the processor and the storage medium can also exist as discrete components in an electronic device or a main control device.

[0136] Those skilled in the art can understand that all or part of the steps of implementing the above-mentioned method embodiments can be completed by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the aforementioned storage medium includes: ROM, RAM, disk or optical disk and other media that can store program codes.

[0137] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for testing the background noise of active noise reduction headphones, characterized in that: include: Obtain frequency domain noise data of an active noise reduction (ANC) background noise test of a target headset, wherein the frequency domain noise data is a correspondence between a frequency value and a noise value; If the frequency domain noise data of the target earphone is lower than or equal to the first preset threshold noise data, the target earphone is determined to be a good product and a first test result is output; If the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, comparing the frequency domain noise data of the target earphone with second preset threshold noise data, wherein the second preset threshold noise data is higher than the first preset threshold noise data; If the frequency domain noise data of the target earphone is higher than the second preset threshold noise data, determining that the target earphone is a defective product and outputting a second test result; If the frequency domain noise data of the target earphone is lower than or equal to the second preset threshold noise data, determining whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone; If yes, determine that the target earphone is a defective product and output a second test result; If not, determine that the target headset is a good product and output a first test result; The determining whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone includes: Determine whether there are a preset number of frequency points whose frequency values ​​have an arithmetic progression relationship among all frequency points whose frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data; If so, determining that there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone; If not, it is determined that there is no frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone.

2. The method according to claim 1, characterized in that: After determining whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone, the method further includes: If there is no frequency point with a preset bad characteristic, determining whether the number of frequency points exceeding the first preset threshold noise data in the frequency domain noise data of the target earphone exceeds a preset condition; If the preset condition is exceeded, determining that the target headset is a defective product and outputting a second test result; If the preset condition is not exceeded, the target earphone is determined to be a good product and a first test result is output.

3. The method according to any one of claims 1 to 2, characterized in that: The step of obtaining frequency domain noise data of an active noise reduction (ANC) background noise test of a target headset, wherein the frequency domain noise data is a correspondence between frequency points and noise values, includes: Obtaining original noise data of the target headset during an ANC noise floor test in a test device; The original noise data is preprocessed to obtain frequency domain noise data of the target earphone.

4. The method according to claim 3, characterized in that The original noise data is the corresponding relationship between time and noise value; Accordingly, the preprocessing of the original noise data to obtain the frequency domain noise data of the target earphone includes: The original noise data of the target earphone is subjected to Fourier transformation processing to convert the correspondence between the time and the noise value of the original noise data into the correspondence between the frequency value and the noise value to obtain the frequency domain noise data of the target earphone.

5. The method according to any one of claims 1 to 2, characterized in that: The process of setting the first preset threshold noise data and the second preset threshold noise data is also included as follows: Performing an ANC noise floor test on a preset number of headphones, averaging a first preset number of obtained frequency domain noise data to obtain average frequency domain noise data; Adding the noise values ​​of different frequencies of the average frequency domain noise data to the first noise value to obtain the first preset threshold noise data; Adding the noise values ​​of different frequencies of the average frequency domain noise data to the second noise value to obtain the second preset threshold noise data; The second noise value is greater than the first noise value.

6. A headphone active noise reduction background noise testing device, characterized in that: Applicable to servers, including: An acquisition module is used to acquire frequency domain noise data of an active noise reduction (ANC) background noise test of a target headset, wherein the frequency domain noise data is a correspondence between a frequency value and a noise value; A first output module, configured to determine that the target earphone is a good product and output a first test result if the frequency domain noise data of the target earphone is lower than or equal to a first preset threshold noise data; a first comparison module, configured to compare the frequency domain noise data of the target earphone with second preset threshold noise data if the frequency domain noise data of the target earphone is higher than the first preset threshold noise data, wherein the second preset threshold noise data is higher than the first preset threshold noise data; a second output module, determining that the target earphone is a defective product and outputting a second test result if the frequency domain noise data of the target earphone is higher than the second preset threshold noise data; A first judgment module, configured to judge whether there is a frequency point with a preset bad characteristic in the frequency domain noise data of the target earphone if the frequency domain noise data of the target earphone is lower than or equal to the second preset threshold noise data; A third output module, configured to determine that the target earphone is a non-conforming product and output a second test result if the target earphone exists; A fourth output module, configured to determine that the target earphone is a good product and output a first test result if the target earphone does not exist; The first judgment module is specifically used to judge whether there are a preset number of frequency points whose frequency values ​​have an arithmetic progression relationship among all frequency points whose frequency domain noise data of the target earphone is greater than the first threshold noise data and less than or equal to the second threshold noise data; if so, it is determined that there are frequency points with preset bad characteristics in the frequency domain noise data of the target earphone; if not, it is determined that there are no frequency points with preset bad characteristics in the frequency domain noise data of the target earphone.

7. A headphone active noise reduction background noise testing device, characterized in that: include: at least one processor and memory; The memory stores computer-executable instructions; The at least one processor executes the computer-executable instructions stored in the memory, so that the at least one processor executes the headphone active noise reduction background noise testing method as described in any one of claims 1 to 5.

8. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions. When the processor executes the computer-executable instructions, the headphone active noise reduction background noise testing method according to any one of claims 1 to 5 is implemented.

9. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the headphone active noise reduction background noise testing method according to any one of claims 1 to 5 is implemented.

Images