A detection circuit, a driving circuit, a chip, an electronic device and a detection method

Abstract

The application discloses a detection circuit, a driving circuit, a chip, an electronic device and a detection method. The detection circuit is used for detecting the impedance of a wire unit to be detected and comprises a detection unit and a current source unit. The current source unit is connected with the wire unit to be detected and is used for adjusting a preset current and providing the adjusted preset current to the wire unit to be detected. The detection unit is connected with the wire unit to be detected and is used for acquiring the voltage of the wire unit to be detected when the preset current is transmitted to the wire unit to be detected, and determining the impedance of the wire unit to be detected according to the voltage of the wire unit to be detected and the preset current. The application can improve the accuracy of measuring the impedance of a shape memory alloy wire.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electronic circuits, in particular to a detection circuit, a driving circuit, a chip, an electronic device and a detection method. BACKGROUND

[0002] A shape memory alloy (SMA) module is an important component of a mobile phone camera module. The shape memory alloy module includes a shape memory alloy wire for preventing camera shaking. Since the impedance of the shape memory alloy wire is related to the deformation amount of the shape memory alloy wire itself, in order to determine the deformation amount of the shape memory alloy wire itself, in the existing technical solution, the impedance of the shape memory alloy wire after being energized and deformed is measured each time the shape memory alloy wire is driven (current flows through the shape memory alloy wire, the shape memory alloy wire heats up and deforms) to determine the deformation. However, the existing detection circuit cannot directly measure the impedance of the shape memory alloy wire, resulting in inaccurate measured impedance values, and therefore there is a need for a new impedance measurement scheme for the shape memory alloy wire in the technical field. SUMMARY

[0003] In view of the above technical problems, the present application provides a detection circuit, a driving circuit, a chip, an electronic device and a detection method, which can improve the accuracy of measuring the impedance of the shape memory alloy wire.

[0004] The detection circuit provided by the present application is used for detecting the impedance of a to-be-measured wire unit, and includes a detection unit and a current source unit.

[0005] The current source unit is connected with the to-be-measured wire unit, and is used for adjusting a preset current and providing the adjusted preset current to the to-be-measured wire unit.

[0006] The detection unit is connected with the to-be-measured wire unit, and is used for acquiring the voltage of the to-be-measured wire unit when the preset current is transmitted to the to-be-measured wire unit, and determining the impedance of the to-be-measured wire unit according to the voltage of the to-be-measured wire unit and the preset current.

[0007] Optionally, the current source unit includes a current source module, an output module and a control module.

[0008] The current source module is connected with the output module, and is used for transmitting a preset current to the output module.

[0009] The output module is used for outputting the preset current to the to-be-measured wire unit after adjusting the preset current according to a preset ratio.

[0010] The control module is connected with the output module and is configured to control the output channel of the output module to be turned on or turned off.

[0011] Optionally, the current source module comprises a first operational amplifier, a first switch tube and a sampling resistor.

[0012] The first input end of the first operational amplifier is configured to input a preset voltage, the second input end of the first operational amplifier is connected with one end of the sampling resistor, and the output end of the first operational amplifier is connected with the control end of the first switch tube.

[0013] The first end of the first switch tube is the output end of the current source module, and the second end of the first switch tube is connected with one end of the sampling resistor.

[0014] The other end of the sampling resistor is grounded.

[0015] Optionally, the output module comprises a first current mirror module and a second current mirror module.

[0016] The input end of the first current mirror module is the input end of the output module and is connected with the output end of the current source module.

[0017] The output end of the first current mirror module is connected with the input end of the second current mirror module, and the output end of the second current mirror module is the output end of the output module, wherein the current output by the output end of the second current mirror module is N times of the current input by the input end of the second current mirror module, and N is greater than 1.

[0018] Optionally, the output module further comprises:

[0019] A clamping sub-module connected with the input end of the second current mirror module and the output end of the second current mirror module respectively, and configured to realize that the voltage of the input end of the second current mirror module is equal to the voltage of the output end of the second current mirror module.

[0020] Optionally, the first current mirror module comprises a first input tube and a first output tube.

[0021] The first end of the first input tube is configured to input a working voltage, the second end of the first input tube is the input end of the first current mirror module and is connected with the third end of the first input tube.

[0022] The first end of the first output tube is configured to input a working voltage, the second end of the first output tube is the output end of the first current mirror module, and the third end of the first output tube is connected with the third end of the first input tube.

[0023] Optionally, the second current mirror module comprises a second input tube and a second output tube, wherein a ratio between an aspect ratio of the second input tube and an aspect ratio of the second output tube is 1:M, M being greater than 1;

[0024] A first end of the second input tube is an input end of the second current mirror module, a second end of the second input tube is grounded, and a third end of the second input tube is connected to the first end of the second input tube;

[0025] A first end of the second output tube is an output end of the second current mirror module, a second end of the second output tube is grounded, and a third end of the second output tube is connected to the third end of the second input tube.

[0026] Optionally, the control module comprises a first switch, a second switch, and a switch controller;

[0027] One end of the first switch is used for inputting a working voltage, and the other end of the first switch is connected to the first end of the second output tube;

[0028] One end of the second switch is connected to the wire unit to be tested, and the other end of the second switch is connected to the first end of the second output tube;

[0029] The switch controller is connected to the first switch and the second switch respectively, and is used for controlling closing or opening of the first switch and controlling closing or opening of the second switch.

[0030] Optionally, the switch controller is used for:

[0031] When the current source unit enters a working state, the first switch is controlled to be closed, and the second switch is controlled to be opened;

[0032] When the current source unit is in the working state, the first switch is controlled to be closed within a preset time length, and the second switch is controlled to be closed;

[0033] When the preset time length ends, the first switch is controlled to be opened, and the second switch is controlled to be closed until the current source unit stops the working state;

[0034] When the current source unit stops the working state, the first switch is controlled to be opened, and the second switch is controlled to be opened.

[0035] Optionally, the detection unit comprises an amplifier module;

[0036] The first input end of the amplifier module is connected with the first end of the wire unit to be tested, and the second input end of the amplifier module is connected with the second end of the wire unit to be tested, so as to amplify the voltage of the wire unit to be tested.

[0037] Optionally, the detection unit comprises an analog-to-digital converter module.

[0038] The first input end of the analog-to-digital converter module is connected with the first output end of the amplifier module, and the second input end of the analog-to-digital converter module is connected with the second output end of the amplifier module, so as to convert the amplified voltage into a voltage digital signal and output.

[0039] The embodiment of the present application provides a driving circuit, which comprises a wire unit to be tested, a driving unit and any one of the detection circuits described above.

[0040] The driving unit is connected with the wire unit to be tested, and is used to provide a driving current to the wire unit to be tested to drive the shape memory alloy wire in the wire unit to be tested to deform, and stop providing the driving current to the wire unit to be tested when the detection circuit detects the impedance of the wire unit to be tested.

[0041] Optionally, the driving unit comprises a first switch module.

[0042] The first end of the first switch module is connected with a power supply.

[0043] The second end of the first switch module is connected with the first end of the wire unit to be tested.

[0044] The first switch module is used to obtain a first driving signal through the control end of the first switch module, and is in a conductive or non-conductive state under the control of the first driving signal.

[0045] Optionally, the driving unit comprises a second switch module.

[0046] The first end of the second switch module is connected with the second end of the wire unit to be tested.

[0047] The second end of the second switch module is grounded.

[0048] The second switch module is used to obtain a second driving signal through the control end of the second switch module, and is in a conductive or non-conductive state under the control of the second driving signal.

[0049] Optionally, the wire unit to be tested comprises a plurality of impedance modules, and each impedance module comprises a shape memory alloy wire.

[0050] The first end of each impedance module is connected to each other and serves as the first end of the wire unit to be detected;

[0051] The second end of each impedance module is connected to each other and serves as the second end of the wire unit to be detected.

[0052] Optionally, each impedance module comprises a third switch;

[0053] The first end of the shape memory alloy wire is the first end of the impedance module;

[0054] The second end of the shape memory alloy wire is connected to one end of the third switch;

[0055] The other end of the third switch is the second end of the impedance module.

[0056] The chip provided by the embodiments of the present application comprises any one of the detection circuits described above or comprises any one of the driving circuits described above.

[0057] The electronic device provided by the embodiments of the present application comprises any one of the detection circuits described above or comprises any one of the driving circuits described above.

[0058] The detection method provided by the embodiments of the present application is used for any one of the driving circuits described above, and comprises the following steps:

[0059] When a detection instruction is received, the driving unit is controlled to stop transmitting a driving current to the wire unit to be detected;

[0060] According to the detection instruction, the current source unit is controlled to adjust a preset current and transmit the adjusted preset current to the wire unit to be detected;

[0061] When the preset current is transmitted to the wire unit to be detected, the detection unit is controlled to acquire the voltage of the wire unit to be detected, and according to the voltage of the wire unit to be detected and the preset current, the impedance of the wire unit to be detected is determined.

[0062] Compared with the prior art, the embodiments of the present application have the following beneficial effects:

[0063] The detection circuit, driving circuit, chip, electronic device, and detection method provided in this application embodiment include a detection circuit for detecting the impedance of a wire unit under test, comprising a detection unit and a current source unit. The current source unit is connected to the wire unit under test and is used to adjust a preset current and provide the adjusted preset current to the wire unit under test. The detection unit is connected to the wire unit under test and is used to acquire the voltage of the wire unit under test when the preset current is transmitted to the wire unit under test, and determine the impedance of the wire unit under test based on the voltage and the preset current. Therefore, the detection circuit of this embodiment, based on the voltage and current of the wire unit under test (the current being the preset current transmitted to the wire unit under test), can directly calculate the impedance of the wire unit under test through the relationship between impedance, voltage, and current, thereby achieving direct measurement of the impedance of the shape memory alloy wire. Compared to existing detection circuits that can only indirectly measure the impedance of shape memory alloy wire, the detection circuit of this application embodiment measures the impedance of shape memory alloy wire more accurately. Attached Figure Description

[0064] Figure 1 This is a first structural schematic diagram of the detection circuit provided in an embodiment of this application;

[0065] Figure 2 This is a first structural schematic diagram of the current source unit provided in the embodiments of this application;

[0066] Figure 3 This is a schematic diagram of the second structure of the current source unit provided in the embodiments of this application;

[0067] Figure 4 This is a circuit diagram of the current source unit provided in the embodiments of this application;

[0068] Figure 5 This is a schematic diagram of the detection unit provided in the embodiments of this application;

[0069] Figure 6 This is a schematic diagram of the driving circuit provided in the embodiment of this application;

[0070] Figure 7 This is a first circuit diagram of the driving circuit provided in the embodiments of this application;

[0071] Figure 8 This is a schematic diagram of the structure of the wire unit under test provided in the embodiments of this application;

[0072] Figure 9 This is a second circuit diagram of the driving circuit provided in the embodiments of this application;

[0073] Figure 10 This is a schematic diagram of the chip structure provided in the embodiments of this application;

[0074] Figure 11 is a structural schematic diagram of an electronic device provided by an embodiment of the present application;

[0075] Figure 12 is a flowchart of a detection method provided by an embodiment of the present application;

[0076] wherein 1 is a current source unit; 2 is a detection unit; 3 is a to-be-detected wire unit; 4 is a driving unit; 11 is a current source module; 12 is an output module; 13 is a control module; 21 is an amplifier module; 22 is an analog-to-digital converter module; 31 is an impedance module; 41 is a first switch module; 42 is a second switch module; 121 is a first current mirror module; 122 is a second current mirror module; 123 is a clamping sub-module; 1101 is a first operational amplifier; 1102 is a first switch tube; 1103 is a sampling resistor; 1211 is a first input tube; 1212 is a first output tube; 1221 is a second input tube; 1222 is a second output tube; 1301 is a first switch; and 1302 is a second switch. DETAILED DESCRIPTION

[0077] The applicant finds that the existing detection circuit usually detects the impedance of the SMA wire through resistance voltage division, for example, the detection circuit in the scheme of CN111201376A. In the scheme of CN111201376A, the calculated impedance of the SMA wire is R=(Vm*Rs / Vs)-Rs, but the impedance R of the SMA wire in the scheme also includes the impedance Rds(on) of the NFET tube (although the impedance Rds(on) of the NFET tube is very small, but cannot be ignored), so the impedance of the SMA wire detected by the detection circuit in the scheme of CN111201376A is not equal to the actual impedance of the SMA wire, that is, the existing detection circuit does not accurately detect the impedance of the SMA wire.

[0078] In order to solve the above problems, the applicant proposes a new technical solution. In the following, the technical solution in the embodiments of the present application will be described clearly and completely in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative labor are within the scope of protection of the present application.

[0079] The present application provides a detection circuit. Please refer to Figure 1 , Figure 1 is a first structural schematic diagram of a detection circuit provided by an embodiment of the present application. For detecting the impedance of the to-be-detected wire unit 3, comprising:

[0080] The current source unit 1 is connected with the wire unit 3 to be tested, and is used to adjust the preset current and provide the adjusted preset current to the wire unit 3 to be tested.

[0081] The detection unit 2 is connected with the wire unit 3 to be tested, and is used to acquire the voltage of the wire unit 3 to be tested when the preset current is transmitted to the wire unit 3 to be tested, and determine the impedance of the wire unit 3 to be tested according to the voltage of the wire unit 3 to be tested and the preset current.

[0082] It can be understood that, in some embodiments, the current source unit 1 is an adjustable current source, and the preset current of the current source is adjusted according to specific requirements, and the adjusted preset current is transmitted to the wire unit 3 to be tested. In some embodiments, the wire unit 3 to be tested contains SMA wire, and the deformation of the SMA wire of the wire unit 3 to be tested caused by the preset current acting on the SMA wire will make the SMA wire deform. Preferably, the preset current transmitted to the wire unit 3 to be tested by the current source unit 1 is 0 to 100 mA, which is conducive to preventing the SMA wire from deforming and thus causing the impedance of the SMA wire to change greatly during the impedance detection process.

[0083] The detection circuit of the embodiment can directly calculate the impedance of the wire unit 3 to be tested through the calculation relationship between the impedance and the voltage and the current of the wire unit 3 to be tested according to the voltage acquired from the wire unit 3 to be tested and the current of the wire unit 3 to be tested, which is the preset current transmitted to the wire unit 3 to be tested, so as to realize the direct measurement of the impedance of the shape memory alloy wire. Compared with the existing detection circuit which can only indirectly measure the impedance of the shape memory alloy wire, the impedance of the shape memory alloy wire directly measured by the detection circuit of the embodiment of the present application is the actual impedance of the shape memory alloy wire, so the detection circuit of the embodiment of the present application can measure the impedance more accurately.

[0084] The researchers found that the preset current of the existing current source is fixed, and once the preset current of the current source needs to be adjusted, another current source can only be replaced, which is not convenient for adjusting the preset current. In order to solve this problem, the present application provides an embodiment, please refer to Figure 2 , Figure 2 is the first structural schematic diagram of the current source unit 1 provided by the embodiment of the present application.

[0085] In the embodiment, the current source unit 1 comprises:

[0086] The current source module 11 is connected with the output module 12, and is used to transmit the preset current to the output module 12; the control module 13 is connected with the output module 12, and is used to control the output channel of the output module 12 to be turned on or turned off; and the output module 12 is used to output the preset current adjusted according to the preset proportion to the wire unit 3 to be tested.

[0087] In the embodiment, the current source module 11 can be a current source of large current (current of ampere level or above) or a current source of small current (current of milliampere level or below). Compared with a mode of using only a current source of small current, the mode of arranging the current source module 11 in the embodiment is more flexible and has more choices.

[0088] In some embodiments, the output module 12 is an amplification circuit; in other embodiments, the output module 12 is an inverse amplification circuit. It can be understood that the output module 12 adjusts the preset current according to a preset ratio, that is, the small current can be amplified according to the preset ratio, and the amplified current is transmitted to the wire unit 3 to be tested, or the large current can be reduced according to the preset ratio, and the reduced current is transmitted to the wire unit 3 to be tested.

[0089] In some embodiments, the control module 13 is a switch or a switch tube. It can be understood that the current source unit 1 in the embodiment can not only adjust the preset current through the output module 12, but also control the output channel of the output module 12 to be turned on or turned off through the control module 13, so as to control the output time of the preset current, which is beneficial to improve the control ability of the current source unit 1 to output the preset current.

[0090] Further, in order to improve the control ability of the current source unit 1 to output the preset current, the application also provides the following embodiments, please refer to Figure 3 , Figure 3 is a second structural schematic diagram of the current source unit 1 provided by the embodiment of the application.

[0091] In the embodiment, the output module 12 includes a first current mirror module 121 and a second current mirror module 122; the input end of the first current mirror module 121 is the input end of the output module 12 and is connected with the output end of the current source module 11; the output end of the first current mirror module 121 is connected with the input end of the second current mirror module 122, and the output end of the second current mirror module 122 is the output end of the output module 12, wherein the current output by the output end of the second current mirror module 122 is N times of the current input by the input end of the second current mirror module 122, and N is greater than 1.

[0092] In a preferred embodiment, the control module 13 is connected with the first current mirror module 121 and the second current mirror module 122 respectively, and is used for controlling the output channel of the first current mirror module 121 to be turned on or turned off, the output channel of the second current mirror module 122 to be turned on or turned off, and the connection channel between the first current mirror module 121 and the second current mirror module 122 to be turned on or turned off respectively.

[0093] It can be understood that when the current output by the first current mirror module 121 is output to the wire unit 3 to be tested, the control module 13 controls the connection channel between the first current mirror module 121 and the second current mirror module 122 to be disconnected, and controls the output channel of the first current mirror module 121 to be turned on, so that the output end of the first current mirror module 121 is connected with the wire unit 3 to be tested; when the current output by the second current mirror module 122 is output to the wire unit 3 to be tested, the control module 13 controls the connection channel between the first current mirror module 121 and the second current mirror module 122 to be turned on, and controls the output channel of the first current mirror module 121 to be turned on, so that the output end of the first current mirror module 121 is connected with the input end of the second current mirror module 122, and then the output channel of the second current mirror module 122 is controlled to be turned on, so that the output end of the second current mirror module 122 is connected with the wire unit 3 to be tested.

[0094] In another embodiment, the output module 12 comprises a first current mirror module 121 and a second current mirror module 122; the input end of the first current mirror module 121 is the input end of the output module 12, and is connected with the output end of the current source module 11; the output end of the first current mirror module 121 is connected with the input end of the second current mirror module 122, and the output end of the second current mirror module 122 is the output end of the output module 12, wherein the current output by the output end of the first current mirror module 121 is N times of the current input by the input end of the first current mirror module 121, and N is greater than 1.

[0095] On this basis, some embodiments provided by the present application are provided to provide the construction mode of the specific circuit of the current source unit 1.

[0096] Researchers found that the existing current source has the problems of complex structure and unstable current. In order to solve this problem, the present application provides a kind of implementation, such as Figure 4 , Figure 4 is the circuit diagram of the current source unit 1 provided by the embodiment of the present application.

[0097] Please refer to Figure 4 In the embodiment, the current source module 11 comprises a first operational amplifier 1101, a first switch tube 1102 and a sampling resistor 1103; the first input end of the first operational amplifier 1101 is used for inputting a preset voltage, the second input end of the first operational amplifier 1101 is connected with one end of the sampling resistor 1103, and the output end of the first operational amplifier 1101 is connected with the control end of the first switch tube 1102; the first end of the first switch tube 1102 is the output end of the current source module 11, and the second end of the first switch tube 1102 is connected with one end of the sampling resistor 1103; the other end of the sampling resistor 1103 is grounded.

[0098] In the embodiment, the preset current of the current source module 11 is I=VBG / Ra, VBG is a preset voltage input to the first input terminal of the first operational amplifier 1101, and Ra is the resistance value of the sampling resistor 1103. The first input terminal of the first operational amplifier 1101 is a positive input terminal, the second input terminal of the first operational amplifier 1101 is a negative input terminal, and the second input terminal of the first operational amplifier 1101 is connected with one end of the sampling resistor 1103. The voltage of the sampling resistor 1103 can be stabilized by the feedback action of the first operational amplifier 1101, and the output terminal of the first operational amplifier 1101 outputs stably. At the same time, the current of the sampling resistor 1103 is stabilized by the switching action of the first switch tube 1102, thereby improving the current stability of the current source module 11. Moreover, the current source module 11 of the embodiment only needs three electronic devices, and has a simple structure and is practical. Preferably, the first operational amplifier 1101 is a voltage-to-current operational amplifier.

[0099] Optionally, the first current mirror module 121 comprises a first input tube 1211 and a first output tube 1212. The first end of the first input tube 1211 is configured to input a working voltage, the second end of the first input tube 1211 is an input terminal of the first current mirror module 121 and is connected with the third end of the first input tube 1211. The first end of the first output tube 1212 is configured to input a working voltage, the second end of the first output tube 1212 is an output terminal of the first current mirror module 121, and the third end of the first output tube 1212 is connected with the third end of the first input tube 1211.

[0100] In the embodiment, the current output by the output terminal of the current source module 11 is I=VBG / Ra, the output terminal of the current source module 11 is connected with the input terminal of the first current mirror, that is, the input current of the input terminal of the first current mirror is I=VBG / Ra, and the ratio between the width-length ratio of the first input tube 1211 and the width-length ratio of the first output tube 1212 is 1:1. The second end of the first output tube 1212, that is, the output terminal of the first current mirror module 121, outputs a current of I=VBG / Ra.

[0101] Optionally, the second current mirror module 122 comprises a second input tube 1221 and a second output tube 1222. The ratio between the width-length ratio of the second input tube 1221 and the width-length ratio of the second output tube 1222 is 1:M, and M is greater than 1. The first end of the second input tube 1221 is an input terminal of the second current mirror module 122, the second end of the second input tube 1221 is grounded, and the third end of the second input tube 1221 is connected with the first end of the second input tube 1221. The first end of the second output tube 1222 is an output terminal of the second current mirror module 122, the second end of the second output tube 1222 is grounded, and the third end of the second output tube 1222 is connected with the third end of the second input tube 1221.

[0102] It can be understood that the ratio of the current inputted into the first end of the second output transistor 1222 to the current outputted from the second end of the second output transistor 1222 is 1:M. Therefore, if the current inputted into the input end of the second current mirror module 122 is equal to the current outputted from the output end of the first current mirror module 121, i.e. the current inputted into the input end of the second current mirror module 122 is I=VBG / Ra, then the current outputted from the second end of the second output transistor 1222, i.e. the output end of the second current mirror module 122, is I=M*VBG / Ra.

[0103] Optionally, the control module 13 comprises a first switch 1301, a second switch 1302 and a switch controller; one end of the first switch 1301 is used for inputting the working voltage, the other end of the first switch 1301 is connected with the first end of the second output transistor 1222; one end of the second switch 1302 is connected with the wire unit 3 to be measured, the other end of the second switch 1302 is connected with the first end of the second output transistor 1222; the switch controller is connected with the first switch 1301 and the second switch 1302 respectively, and is used for controlling the closing or opening of the first switch 1301 and the closing or opening of the second switch 1302.

[0104] Further, in order to make the voltage at the input end of the second current mirror module 122 equal to the voltage at the output end of the second current mirror module 122, the present application further provides an embodiment, in which the output module 12 further comprises:

[0105] a clamping sub-module 123 connected with the input end of the second current mirror module 122 and the output end of the second current mirror module 122 respectively, and used for making the voltage at the input end of the second current mirror module 122 equal to the voltage at the output end of the second current mirror module 122.

[0106] In the embodiment, one kind of clamping sub-module 123 is a clamping operational amplifier, the positive input end of the clamping operational amplifier is connected with the first end of the second input transistor 1221, the negative input end of the clamping operational amplifier is connected with the first end of the second output transistor 1222, and the output end of the clamping operational amplifier is connected with the third end of the second input transistor 1221 and the third end of the second output transistor 1222.

[0107] Optionally, another clamping sub-module 123 is connected with the input end of the first current mirror module 121 and the output end of the first current mirror module 121 respectively, and used for making the voltage at the input end of the first current mirror module 121 equal to the voltage at the output end of the first current mirror module 121.

[0108] It should be noted that when detecting the impedance, the current output by the current source unit 1 is a large current in the order of mA, and when the first switch 1301 is open and the second switch 1302 is closed, the current of the second output tube 1222 will be temporarily lost, the loop in which the clamping operational amplifier is located will appear to be disconnected and then re-established, and a stable current of tens of mA needs to be established, and the current establishment speed is very slow, which will affect the efficiency of impedance detection.

[0109] Optionally, the switch controller is configured to:

[0110] When the current source unit 1 enters the working state, the first switch 1301 is controlled to be closed, and the second switch 1302 is controlled to be open;

[0111] When the current source unit 1 is in the working state, the first switch 1301 is controlled to be closed within a preset time period, and the second switch 1302 is controlled to be closed;

[0112] When the preset time period ends, the first switch 1301 is controlled to be open, and the second switch 1302 is controlled to be closed until the current source unit 1 stops the working state;

[0113] When the current source unit 1 stops the working state, the first switch 1301 is controlled to be open, and the second switch 1302 is controlled to be open.

[0114] It can be understood that when the current source unit 1 transmits the preset current to the wire unit 3 to be detected, the current source unit 1 is in the working state.

[0115] In the embodiment, when the current source unit 1 transmits the preset current to the wire unit 3 to be detected, first, the control module 13 controls the first switch 1301 to be closed and the second switch 1302 to be open through the switch controller, so that the second current mirror module 122 inputs the working voltage and is in the working state, thereby making the stable preset current flow through the second output tube 1222; after a period of time, the control module 13 controls the first switch 1301 to be closed and the second switch 1302 to be closed through the switch controller, and then controls the first switch 1301 to be open after an instant through the switch controller and keeps the second switch 1302 closed, thereby realizing that the preset current output time is short and the stable speed is fast. It can be avoided that the SMA wire impedance changes caused by the too long preset current output time.

[0116] Preferably, the first switch 1301 is controlled to be closed and the second switch 1302 is controlled to be closed through the switch controller, and then the first switch 1301 is controlled to be open after 100 ns and the second switch 1302 is kept closed, so that the current change of the wire unit 3 to be detected in the test time of detecting the impedance is: 0 changes to I / 2 and then changes to I, I is the preset current.

[0117] From the above, the preset time length is set to 100 ns, the loop in which the clamping operational amplifier is located will not be disconnected, and the current of the second output tube 1222 will not disappear, but the current transfer is controlled by the switch. The current change I of the branch in which the first switch 1301 is located becomes I / 2 and then 0, and the current change 0 of the branch in which the second switch 1302 is located becomes I / 2 and then I. Thus, the total current of each stage is unchanged. At this time, the current of the branch in which the first switch 1301 is located is established quickly, meeting the requirement of rapid establishment of the SMA impedance detection current.

[0118] It can be understood that in some cases, the voltage of the to-be-detected wire unit 3 is very small, which makes it difficult to detect the voltage of the to-be-detected wire. Therefore, the present application provides an embodiment, which refers to Figure 5 , Figure 5 FIG. 1 is a structural schematic diagram of a detection unit 2 provided by an embodiment of the present application.

[0119] Referring to Figure 5 , in the embodiment, the detection unit 2 includes an amplifier module 21; a first input end of the amplifier module 21 is connected with a first end of the to-be-detected wire unit 3, and a second input end of the amplifier module 21 is connected with a second end of the to-be-detected wire unit 3, for amplifying the voltage of the to-be-detected wire unit 3.

[0120] Optionally, the detection unit 2 includes an analog-to-digital converter module 22; a first input end of the analog-to-digital converter module 22 is connected with a first output end of the amplifier module 21, and a second input end of the analog-to-digital converter module 22 is connected with a second output end of the amplifier module 21, for converting the amplified voltage into a voltage digital signal and outputting.

[0121] The embodiment is advantageous in reducing the difficulty of detecting the voltage of the to-be-detected wire unit 3 by amplifying the voltage of the to-be-detected wire unit 3 through the amplifier module 21 without affecting the detection of the real voltage of the to-be-detected wire unit 3.

[0122] Referring to Figure 6 , Figure 6 FIG. 2 is a structural schematic diagram of a driving circuit provided by an embodiment of the present application.

[0123] The embodiment of the present application provides a driving circuit, which includes a to-be-detected wire unit 3, a driving unit 4, and any one of the detection circuits as described above.

[0124] The driving unit 4 is connected with the to-be-detected wire unit 3, for providing a driving current to the to-be-detected wire unit 3 to drive the shape memory alloy wire in the to-be-detected wire unit 3 to deform, and stopping the provision of the driving current to the to-be-detected wire unit 3 when the detection circuit detects the impedance of the to-be-detected wire unit 3.

[0125] Referring to Figure 7 ,Figure 7 is a first circuit diagram of a driving circuit provided by an embodiment of the present application.

[0126] Optionally, the driving unit 4 comprises a first switch module 41; a first end of the first switch module 41 is connected to a power supply; a second end of the first switch module 41 is connected to the first end of the wire unit under test 3; the first switch module 41 is configured to obtain a first driving signal through a control end of the first switch module 41 and be in a conductive or non-conductive state under control of the first driving signal.

[0127] Optionally, the driving unit 4 comprises a second switch module 42; a first end of the second switch module 42 is connected to the second end of the wire unit under test 3; a second end of the second switch module 42 is grounded; the second switch module 42 is configured to obtain a second driving signal through a control end of the second switch module 42 and be in a conductive or non-conductive state under control of the second driving signal.

[0128] It can be understood that the first switch module 41 and the second switch module 42 both have a switching function, and in an embodiment, the first switch module 41 and the second switch module 42 are both switches. Through the first switch module 41 and the second switch module 42, various control modes of the switches can be realized, for example, the first switch module 41 and the second switch module 42 are both closed or opened, the first switch module 41 is opened while the second switch module 42 is closed, and the first switch module 41 is closed while the second switch module 42 is opened, thereby more flexibly controlling the driving unit 4 to output or not output the driving current.

[0129] In addition, in order to realize periodic driving and detection of multiple SMA wires, the present application further provides the following embodiments, please refer to Figure 8 , Figure 8 is a structural schematic diagram of the wire unit under test 3 provided by an embodiment of the present application.

[0130] In the present embodiment, the wire unit under test 3 comprises a plurality of impedance modules 31, each of which comprises a shape memory alloy wire; a first end of each of the impedance modules 31 is connected to each other and serves as a first end of the wire unit under test 3; a second end of each of the impedance modules 31 is connected to each other and serves as a second end of the wire unit under test 3.

[0131] It can be understood that since each of the impedance modules 31 comprises a shape memory alloy wire, when the impedance detection is performed on the plurality of impedance modules 31 of the wire unit under test 3 or the driving current is provided to the plurality of impedance modules 31 of the wire unit under test 3 by the driving unit 4, the periodic driving and detection of multiple SMA wires can be realized.

[0132] Please refer to Figure 9 , Figure 9Fig. 2 is a second circuit diagram of the driving circuit provided in the embodiment of the present application.

[0133] Optionally, each impedance module 31 comprises a third switch; the first end of the SMA wire is the first end of the impedance module 31; the second end of the SMA wire is connected with one end of the third switch; the other end of the third switch is the second end of the impedance module 31.

[0134] It can be understood that when the SMA wire of a certain impedance module 31 needs to be tested, the SMA wire of the impedance module 31 can be connected with the detection circuit by closing the third switch of the impedance module 31, so as to realize impedance detection of the SMA wire of the impedance module 31; otherwise, the SMA wire of the impedance module 31 that does not need to be detected is opened by the corresponding third switch; when the SMA wire of a certain impedance module 31 needs to be driven, the SMA wire of the impedance module 31 can be connected with the driving unit 4 by closing the third switch of the impedance module 31, so as to realize transmission of the driving current to the SMA wire of the impedance module 31; otherwise, the SMA wire of the impedance module 31 that does not need to be driven is opened by the corresponding third switch. It can be seen that the embodiment can control the number of SMA wires that are driven or detected, which is conducive to achieving the most suitable balance state of the detection number and the detection accuracy.

[0135] Referring to Fig. 2, Figure 10 The embodiment of the present application provides a chip, which comprises any one of the detection circuits or any one of the driving circuits, Figure 10 Fig. 3 is a structural schematic diagram of the chip provided in the embodiment of the present application.

[0136] Referring to Fig. 2, Figure 11 The embodiment of the present application provides an electronic device, which comprises any one of the detection circuits or any one of the driving circuits, Figure 11 Fig. 4 is a structural schematic diagram of the electronic device provided in the embodiment of the present application.

[0137] Referring to Fig. 2, Figure 12 , Figure 12 Fig. 5 is a flow schematic diagram of the detection method provided in the embodiment of the present application.

[0138] The embodiment of the present application further provides a detection method, which is used for any one of the driving circuits, and the detection method comprises the following steps:

[0139] S101, when a detection instruction is received, controlling the driving unit to stop transmitting the driving current to the to-be-tested wire unit.

[0140] S102, controlling the current source unit to adjust the preset current according to the detection instruction, and transmitting the adjusted preset current to the to-be-tested wire unit.

[0141] S103, when the preset current is transmitted to the wire unit to be measured, the control detection unit acquires the voltage of the wire unit to be measured, and determines the impedance of the wire unit to be measured according to the voltage of the wire unit to be measured and the preset current.

[0142] The application provides a detection circuit, a driving circuit, a chip, an electronic device or a detection method, which can directly calculate the impedance of the wire unit to be measured according to the voltage acquired from the wire unit to be measured and the current of the wire unit to be measured, the current of the wire unit to be measured being a preset current transmitted to the wire unit to be measured, so that the impedance of the shape memory alloy wire is directly measured. Compared with the existing detection circuit which can only indirectly measure the impedance of the shape memory alloy wire, the impedance of the shape memory alloy wire can be more accurately measured.

[0143] That is, the above description is only an embodiment of the application, and does not limit the patent scope of the application. Any equivalent structure or equivalent flow transformation using the content of the specification and drawings, such as the mutual combination of technical features between embodiments, or direct or indirect application in other related technical fields, is also included in the patent protection scope of the application.

[0144] In addition, the same or different reference numerals can be used to identify the same or similar structural elements in the application. In addition, the terms "first", "second" are only used for description purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features with "first" and "second" can explicitly or implicitly include one or more features. In the description of the application, the meaning of "multiple" is two or more, unless otherwise specifically limited.

[0145] In the application, the word "for example" is used to indicate "as an example, illustration or description". Any embodiment described as "for example" in the application is not necessarily interpreted as more preferred or more advantageous than other embodiments. In order to enable any person skilled in the art to implement and use the application, the above description is given. In the above description, various details are listed for the purpose of explanation.

[0146] It should be understood that those skilled in the art can realize the application without using these specific details. In other embodiments, well-known structures and processes will not be described in detail to avoid unnecessary details making the description of the application obscure. Therefore, the application is not intended to be limited to the embodiments shown, but is consistent with the broadest scope of principles and characteristics disclosed in the application.

Claims

1. A detection circuit, characterized by, The application relates to a device for detecting the impedance of a wire unit to be detected, which comprises a detection unit and a current source unit. The current source unit is connected with the wire unit to be detected, and is used for adjusting a preset current and providing the adjusted preset current to the wire unit to be detected. The detection unit is connected with the wire unit to be detected, and is used for acquiring the voltage of the wire unit to be detected when the preset current is transmitted to the wire unit to be detected, and determining the impedance of the wire unit to be detected according to the voltage of the wire unit to be detected and the preset current. The current source unit comprises a control module; the control module comprises a first switch, a second switch and a switch controller; the switch controller is used for controlling the first switch to be closed and the second switch to be opened when the current source unit enters a working state. When the current source unit is in the working state, the first switch is controlled to be closed and the second switch is controlled to be closed within a preset time length; when the preset time length ends, the first switch is controlled to be opened and the second switch is controlled to be closed until the current source unit stops the working state. When the current source unit stops the working state, the first switch is controlled to be opened and the second switch is controlled to be opened.

2. The detection circuit of claim 1, wherein, The current source unit further comprises a current source module and an output module. The current source module is connected with the output module, and is used for transmitting a preset current to the output module. The output module is used for outputting the preset current to the wire unit to be detected after the preset current is adjusted according to a preset ratio. The control module is connected with the output module, and is used for controlling the output channel of the output module to be conducted or opened.

3. The detection circuit of claim 2, wherein, The current source module comprises a first operational amplifier, a first switch tube and a sampling resistor. A first input end of the first operational amplifier is used for inputting a preset voltage; a second input end of the first operational amplifier is connected with one end of the sampling resistor; and an output end of the first operational amplifier is connected with a control end of the first switch tube. A first end of the first switch tube is an output end of the current source module; and a second end of the first switch tube is connected with one end of the sampling resistor. The other end of the sampling resistor is grounded.

4. The detection circuit of claim 2, wherein, The output module comprises a first current mirror module and a second current mirror module. An input end of the first current mirror module is an input end of the output module, and is connected with an output end of the current source module. An output end of the first current mirror module is connected with an input end of the second current mirror module; and an output end of the second current mirror module is an output end of the output module, wherein the current outputted from the output end of the second current mirror module is N times of the current inputted from the input end of the second current mirror module, and N is greater than 1.

5. The detection circuit of claim 4, wherein, The output module further comprises: A clamping sub-module is connected with the input end of the second current mirror module and the output end of the second current mirror module respectively, and is used for realizing that the voltage of the input end of the second current mirror module is equal to the voltage of the output end of the second current mirror module.

6. The detection circuit of claim 5, wherein, The first current mirror module comprises a first input tube and a first output tube. The first end of the first input tube is used for inputting working voltage, and the second end of the first input tube is the input end of the first current mirror module and is connected with the third end of the first input tube; The first end of the first output tube is used for inputting working voltage, and the second end of the first output tube is the output end of the first current mirror module, and the third end of the first output tube is connected with the third end of the first input tube.

7. The detection circuit of claim 5, wherein, The ratio between the aspect ratio of the second input tube and the aspect ratio of the second output tube is 1: M, and M is greater than 1; The first end of the second input tube is the input end of the second current mirror module, the second end of the second input tube is grounded, and the third end of the second input tube is connected with the first end of the second input tube; The first end of the second output tube is the output end of the second current mirror module, the second end of the second output tube is grounded, and the third end of the second output tube is connected with the third end of the second input tube.

8. The detection circuit according to claim 7, wherein One end of the first switch is used for inputting working voltage, and the other end of the first switch is connected with the first end of the second output tube; One end of the second switch is connected with the wire unit to be detected, and the other end of the second switch is connected with the first end of the second output tube; The switch controller is connected with the first switch and the second switch respectively, and is used for controlling the closing or opening of the first switch and the closing or opening of the second switch.

9. The detection circuit of claim 1, wherein, The detection unit comprises an amplifier module; The first input end of the amplifier module is connected with the first end of the wire unit to be detected, and the second input end of the amplifier module is connected with the second end of the wire unit to be detected, so as to amplify the voltage of the wire unit to be detected.

10. The detection circuit of claim 9, wherein, The detection unit comprises an analog-to-digital converter module; The first input end of the analog-to-digital converter module is connected with the first output end of the amplifier module, and the second input end of the analog-to-digital converter module is connected with the second output end of the amplifier module, so as to convert the amplified voltage into a voltage digital signal and output.

11. A drive circuit, characterized by The detection circuit comprises a wire unit to be detected, a driving unit and any one of the detection circuits according to claims 1 to 10. The driving unit is connected with the wire unit to be detected, and is used for providing driving current to the wire unit to be detected to drive the shape memory alloy wire in the wire unit to be detected to deform, and stopping the driving current from being provided to the wire unit to be detected when the detection circuit detects the impedance of the wire unit to be detected.

12. The drive circuit of claim 11, wherein, The driving unit comprises a first switch module; The first end of the first switch module is connected with a power supply; The second end of the first switch module is connected with the first end of the wire unit to be detected; The first switch module is used for obtaining a first driving signal through the control end of the first switch module, and is in a conductive or non-conductive state under the control of the first driving signal.

13. The drive circuit according to claim 11 or 12, characterized in that, The driving unit comprises a second switch module; The first end of the second switch module is connected with the second end of the wire unit to be tested. The second end of the second switch module is grounded. The second switch module is configured to obtain a second driving signal through a control end of the second switch module and be in a conductive or non-conductive state under control of the second driving signal.

14. The drive circuit of claim 11, wherein, The wire unit to be tested comprises a plurality of impedance modules, and each impedance module comprises a shape memory alloy wire. The first ends of the impedance modules are connected with each other and serve as the first end of the wire unit to be tested. The second ends of the impedance modules are connected with each other and serve as the second end of the wire unit to be tested.

15. The drive circuit of claim 14, wherein, Each impedance module comprises a third switch. The first end of the shape memory alloy wire serves as the first end of the impedance module. The second end of the shape memory alloy wire is connected with one end of the third switch. The other end of the third switch serves as the second end of the impedance module.

16. A chip, characterized by The detection circuit comprises any one of claims 1 to 10, or the driving circuit comprises any one of claims 11 to 15.

17. An electronic device, comprising: The detection circuit comprises any one of claims 1 to 10, or the driving circuit comprises any one of claims 11 to 15.

18. A method of detection, characterized in that, The detection method comprises the following steps for the driving circuit of any one of claims 11 to 15: When a detection instruction is received, the driving unit is controlled to stop transmitting a driving current to the wire unit to be tested; The current source unit is controlled to adjust a preset current according to the detection instruction, and the adjusted preset current is transmitted to the wire unit to be tested; When the preset current is transmitted to the wire unit to be tested, the detection unit is controlled to obtain a voltage of the wire unit to be tested, and the impedance of the wire unit to be tested is determined according to the voltage of the wire unit to be tested and the preset current.

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