A testing method for the IO loop of a multiple unit power car

Abstract

The present invention provides a method for IO loopback testing of a multiple unit power car. The method of the present invention includes: performing DO device testing and DI device testing of the multiple unit power car based on a loopback testing device; the loopback testing device includes a device switch, a PC, an Ethernet bus interface, a CPU, switch A, switch B, a signal acquisition module, and a current adjustable module. The present invention designs an IO loopback testing device, uses the device to perform IO testing of the multiple unit power car, and completes the IO testing before the multiple unit leaves the factory. The technical solution of the present invention solves the problems in the prior art that when two multiple unit power cars are connected in real vehicle for IO testing, the operation is cumbersome and inflexible, and it is easy to cause unnecessary waste of human and material resources costs, etc.

Description

Technical Field

[0001] The present invention relates to the technical field of IO loop testing for EMU power cars, and more particularly to an IO loop testing method for EMU power cars. Background Art

[0002] Currently, the multiple unit test of EMUs must be carried out between two EMUs, and a high-voltage power grid and a dynamic commissioning line are required to ensure the test. The test conditions are relatively demanding and the pull-down cycle before the test is long. Especially when the multiple unit test is unsuccessful, it is necessary to arrange the test conditions again for repeated verification, which seriously restricts the commissioning cycle of EMUs and results in low multiple unit efficiency of EMUs. Using the actual multiple unit of two EMU power cars for IO testing has problems such as cumbersome operation and inflexibility, and is prone to waste of unnecessary human and material resources. Summary of the Invention

[0003] In view of the above technical problems, an IO loop testing method for EMU power cars is provided. The present invention designs an IO loop testing device and uses the device to perform IO testing on EMU power cars to complete the IO testing before the EMUs leave the factory.

[0004] The technical means adopted by the present invention are as follows:

[0005] An IO loop testing method for EMU power cars includes: performing DO device testing and DI device testing on EMU power cars based on a loop testing device; the loop testing device includes a device switch, a PC, an Ethernet bus interface, a CPU, switch A, switch B, a signal acquisition module, and a current adjustable module.

[0006] Further, the DO device testing of the EMU power car specifically includes:

[0007] S1. Power on the loop testing device. By default, when just powered on, switches A and B of the loop testing device are in the off state. Perform channel self-check of the loop testing device. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A of the loop testing device to close and switch B to close to form a conduction path, and observe the acquisition result received by the PC.

[0008] S2. If the acquisition result in step S1 is normal, power off the loopback test device. First, connect the heavy-duty connectors Y1 and Y3 pins of the DO device of the EMU power car to the X1 and X2 pins of the loopback test device respectively through the tooling cable with a heavy-duty connector. At the same time, interconnect the on-vehicle switch and the device switch through the network cable. After the tooling cable is connected, power on both the EMU power car IO device and the loopback test device. The DO device defaults to normally closed when powered on. According to the maximum conduction current I of the EMU power car DO device, within the allowable value range as needed, freely set the conduction current of the loopback test device through the PC.

[0009] S3. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A to close and switch B to close. At the same time, through the interconnection of the switches, an Ethernet data loopback is formed. The PC can monitor in real time the action commands sent by the on-vehicle microcomputer to the DO device. At this time, observe the acquisition result received by the PC and the instruction monitoring result of the on-vehicle microcomputer.

[0010] S4. Restore to the default initial state through the PC. In the default initial state, switches A and B of the loopback test device are in the off state. Restore to the default initial state through the on-vehicle microcomputer. In the default initial state, the DO device is in the normally closed state. Then connect the heavy-duty connectors Y1 and Y2 pins of the EMU power car DO device to the X1 and X2 pins of the loopback test device respectively for the normally closed contact test.

[0011] S5. According to the maximum conduction current I of the EMU power car DO device, freely set the conduction current of the loopback test device through the PC within the allowable value range as needed.

[0012] S6. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A to close and switch B to close. At the same time, through the interconnection of the switches, an Ethernet data loopback is formed. The PC can monitor in real time the action commands sent by the on-vehicle microcomputer to the DO device. At this time, observe the acquisition result received by the PC and the instruction monitoring result of the on-vehicle microcomputer.

[0013] Further, in step S1, the acquisition results received by the PC include the "1" state and the "0" state. When the acquisition result is in the "1" state, it means that the loopback test device is in a normal situation; when the acquisition result is in the "0" state, it means that there is a device failure in the loopback test device and the test is aborted.

[0014] Further, in step S2 and step S5, set the conduction current of the loopback test device to I / 2 through the PC.

[0015] Further, the test of the DI device of the EMU power car specifically includes:

[0016] A1. Power on the loopback test device. By default, when it is just powered on, switch A and switch B of the loopback test device are in the off state. Conduct a channel self-check of the loopback test device. The PC gives a switch command, which is transmitted to the CPU via the Ethernet bus. The CPU controls switch A to close and switch B to close to form a conductive path. At this time, observe the acquisition results received by the PC.

[0017] A2. If the acquisition results in step A1 are normal, power off the loopback test device. First, connect the heavy-duty connectors Z1 and Z2 pins of the DI device of the EMU power car to the X2 and X3 pins of the loopback test device respectively through a tooling cable with a heavy-duty connector. At the same time, interconnect the on-vehicle switch and the device switch through a network cable. After the tooling cable is connected, power on both the EMU power car IO device and the loopback test device. The DI device is in the default working state. According to the required conduction current I of the EMU power car DI device, freely set the conduction current of the loopback test device within the allowable value range through the PC.

[0018] A3. The PC gives a switch command, which is transmitted to the CPU via the Ethernet bus. The CPU controls switch A to close and switch B to open. At the same time, through the interconnection of the switches, an Ethernet data loopback is formed. The PC can perform real-time loopback monitoring on the acquisition results sent by the DI device to the on-vehicle microcomputer. At this time, observe the acquisition results received by the PC and the acquisition results of the monitored DI device.

[0019] Further, in step A1, the acquisition results received by the PC include the "1" state and the "0" state. When the acquisition result is in the "1" state, it indicates that the loopback test device is in a normal situation; when the acquisition result is in the "0" state, it indicates a device failure of the loopback test device and the test is aborted.

[0020] Further, in step A2, set the conduction current of the loopback test device to I through the PC.

[0021] Compared with the prior art, the present invention has the following advantages:

[0022] The IO loopback test method for the EMU power car provided by the present invention improves the automation efficiency, is flexible in operation, has strong versatility, and can efficiently perform the IO loopback test for the EMU power car. The whole set of devices is invested once, greatly reducing the subsequent economic investment.

[0023] For the above reasons, the present invention can be widely promoted in the fields such as the IO loopback test of the EMU power car. Description of the Drawings

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the attached drawings required for the description of the embodiments or the prior art. Obviously, the attached drawings in the following description are some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other attached drawings can also be obtained based on these attached drawings.

[0025] Figure 1 This is the schematic diagram of the IO loop test device for the power car of the EMU of the present invention.

[0026] Figure 2 This is the schematic diagram of the DO device test for the power car of the EMU based on the loop test device provided by the embodiment of the present invention.

[0027] Figure 3 This is the schematic diagram of the DI device test for the power car of the EMU based on the loop test device provided by the embodiment of the present invention. Detailed implementation manners

[0028] It should be noted that, without conflict, the embodiments in the present invention and the features in the embodiments can be combined with each other. The following will describe the present invention in detail with reference to the attached drawings and in combination with the embodiments.

[0029] To make the objectives, technical solutions and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the attached drawings in the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, rather than all embodiments. The following description of at least one exemplary embodiment is actually only illustrative and in no way limits the present invention and its application or use. Based on the embodiments in the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present invention.

[0030] It should be noted that the terms used here are only for describing the specific implementation manners and are not intended to limit the exemplary embodiments according to the present invention. As used here, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should also be understood that when the terms "comprise" and / or "include" are used in this specification, they indicate the presence of features, steps, operations, devices, components and / or their combinations.

[0031] Unless otherwise specifically stated, the relative arrangements of components and steps, numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present invention. At the same time, it should be clear that, for the sake of convenience in description, the dimensions of the various parts shown in the drawings are not drawn in actual proportional relationships. Technologies, methods, and devices known to those of ordinary skill in the relevant art may not be discussed in detail, but where appropriate, the said technologies, methods, and devices should be regarded as part of the authorization specification. In all the examples shown and discussed here, any specific values should be construed as merely exemplary and not as a limitation. Therefore, other examples of the exemplary embodiments may have different values. It should be noted that like reference numerals and letters denote like items in the following drawings, and thus, once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0032] In the description of the present invention, it should be understood that the orientation or positional relationships indicated by orientation words such as "front, rear, upper, lower, left, right", "lateral, vertical, perpendicular, horizontal", and "top, bottom", etc. are generally based on the orientation or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description. Without contrary statements, these orientation words do not indicate and imply that the devices or elements referred to must have a specific orientation or be constructed and operated in a specific orientation, and thus cannot be construed as limiting the protection scope of the present invention: the orientation words "inside, outside" refer to the inside and outside relative to the contour of each component itself.

[0033] For the convenience of description, spatial relative terms such as "above...", "over...", "on the upper surface of...", "above", etc. can be used here to describe the spatial positional relationships of one device or feature shown in the drawings with other devices or features. It should be understood that the spatial relative terms are intended to encompass different orientations in use or operation in addition to the orientations described in the drawings for the device. For example, if the device in the drawing is inverted, the device described as "above other devices or structures" or "over other devices or structures" will then be positioned as "below other devices or structures" or "under other devices or structures". Thus, the exemplary term "above..." can include both the orientations of "above..." and "below...". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and corresponding interpretations are made for the spatial relative descriptions used here.

[0034] In addition, it should be noted that the use of words such as "first", "second", etc. to limit components is only for the convenience of differentiating the corresponding components. Without otherwise stating, the above words have no special meanings, and thus cannot be construed as limiting the protection scope of the present invention.

[0035] Such as Figure 1As shown in the figure, the present invention provides a method for testing the IO loop of a motor car of a multiple unit train, which is used to test the DO equipment and DI equipment of the motor car of the multiple unit train based on a loop test device; the loop test device includes a device switch, a PC, an Ethernet bus interface, a CPU, switch A, switch B, a signal acquisition module, and a current adjustable module.

[0036] Specifically, as a preferred embodiment of the present invention, the testing of the DO equipment of the motor car of the multiple unit train is as follows Figure 2 shown, and specifically includes:

[0037] S1. Power on the loop test device. By default, when the device is just powered on, switches A and B of the loop test device are in the open state. Perform channel self-check of the loop test device. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A of the loop test device to close and switch B to close, forming a conduction path (as Figure 2 indicated by the blue line in the figure), and observe the acquisition result received by the PC; in this embodiment, the acquisition result received by the PC includes the "1" state and the "0" state. When the acquisition result is in the "1" state, it means that the loop test device is in a normal condition; when the acquisition result is in the "0" state, it means that there is a device failure in the loop test device and the test is aborted.

[0038] S2. If the acquisition result in step S1 is normal, power off the loop test device. First, through a tooling cable with a heavy-duty connector, connect the heavy-duty connector pins Y1 and Y3 of the DO equipment of the motor car of the multiple unit train to the pins X1 and X2 of the loop test device respectively. At the same time, connect the on-vehicle switch and the device switch through a network cable. After the tooling cable is connected (as Figure 2 indicated by the orange line in the figure), both the IO equipment of the motor car of the multiple unit train and the loop test device start to be powered on. The DO equipment is in the normally closed point by default when it is just powered on. According to the maximum conduction current I of the DO equipment of the motor car of the multiple unit train, within the allowable value range as needed, freely set the conduction current of the loop test device through the PC; in this embodiment, the conduction current of the loop test device is set to I / 2 through the PC.

[0039] S3. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A to close and switch B to close. At the same time, through the interconnection of the switches, an Ethernet data loop is formed. The PC can monitor in real time the action commands sent by the on-vehicle microcomputer to the DO equipment (as Figure 2 indicated by the green line in the figure). At this time, observe the acquisition result received by the PC and the monitoring result of the on-vehicle microcomputer command.

[0040] S4. Restore to the default initial state through the PC. In the default initial state, switch A and switch B of the loopback test device are in the off state. Restore to the default initial state through the on-vehicle microcomputer. In the default initial state, the DO device is in the normally closed state. Then, connect the heavy-duty connector Y1 and Y2 pins of the DO device of the EMU power car to the X1 and X2 pins of the loopback test device respectively (as shown by the purple line in Figure 2 ) for the normally closed contact test;

[0041] S5. According to the maximum conduction current I of the DO device of the EMU power car, freely set the conduction current of the loopback test device within the allowable value range through the PC as needed. In this embodiment, the conduction current of the loopback test device is set to I / 2 through the PC.

[0042] S6. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A to close and switch B to close. At the same time, through the interconnection of the switch, an Ethernet data loop is formed. The PC can monitor in real time the action commands sent by the on-vehicle microcomputer to the DO device (as shown by the green line in Figure 2 ). At this time, observe the acquisition results received by the PC and the instruction monitoring results of the on-vehicle microcomputer. The judgment basis is as follows:

[0043]

[0044] During specific implementation, as a preferred implementation mode of the present invention, the test of the DI device of the EMU power car is as shown in Figure 3 and specifically includes:

[0045] A1. Power on the loopback test device. By default, when just powered on, switch A and switch B of the loopback test device are in the off state. Perform channel self-check of the loopback test device. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A to close and switch B to close to form a conduction path (as shown by the blue line in Figure 3 ). At this time, observe the acquisition results received by the PC. In this embodiment, the acquisition results received by the PC include the "1" state and the "0" state. When the acquisition result is in the "1" state, it indicates that the loopback test device is in a normal situation; when the acquisition result is in the "0" state, it indicates that there is a device failure in the loopback test device and the test is aborted.

[0046] A2. If the acquisition result in step A1 is normal, power off the loopback test device. First, connect the heavy-duty connectors of pins Z1 and Z2 of the DI device of the EMU power car to pins X2 and X3 of the loopback test device respectively through the tooling cable with a heavy-duty connector. At the same time, interconnect the on-vehicle switch and the device switch through a network cable. After the tooling cable is connected (as shown by the red line in the figure above), power on both the EMU power car IO device and the loopback test device. The DI device is in the default working state. According to the conduction current I required by the DI device of the EMU power car, within the allowable value range as needed, freely set the conduction current of the loopback test device through the PC. In this embodiment, the conduction current of the loopback test device is set to I through the PC.

[0047] A3. The PC issues a switch command, which is sent to the CPU through the Ethernet bus. The CPU controls switch A to close and switch B to open. At the same time, through the interconnection of the switches, an Ethernet data loopback is formed. The PC can monitor in real time the acquisition result sent by the DI device to the on-vehicle microcomputer (as Figure 3 shown by the green line in the figure). At this time, observe the acquisition result received by the PC and the acquisition result monitored by the DI device. The judgment basis is as follows:

[0048]

[0049] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements on some or all of the technical features. And these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for testing the IO loop of a multiple unit power car, characterized in that, it includes: Based on the loop test device, conduct the DO device test and DI device test of the multiple unit power car; the loop test device includes a device switch, a PC, an Ethernet bus interface, a CPU, switch A, switch B, a signal acquisition module, and a current adjustable module; among them: The test of the DO device of the multiple unit power car specifically includes: S1. Power on the loop test device. By default, when just powered on, switch A and B of the loop test device are in the open state. Conduct the channel self-check of the loop test device. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A of the loop test device to close and switch B to close, forming a conduction path, and observe the acquisition result received by the PC. S2. If the acquisition result in step S1 is normal, power off the loop test device. First, through the tooling cable with a heavy-duty connector, connect the heavy-duty connector pins Y1 and Y3 of the DO device of the multiple unit power car to the pins X1 and X2 of the loop test device respectively. At the same time, interconnect the on-vehicle switch and the device switch through a network cable. After the tooling cable is connected, both the multiple unit power car IO device and the loop test device start to power on. The DO device is in the normally closed state by default when just powered on. According to the maximum conduction current I of the DO device of the multiple unit power car, freely set the conduction current of the loop test device through the PC within the allowable value range as needed. S3. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A to close and switch B to close. At the same time, through the interconnection of the switches, an Ethernet data loop is formed. The PC can real-time loop monitor the action commands sent by the on-vehicle microcomputer to the DO device. At this time, observe the acquisition result received by the PC and the on-vehicle microcomputer command monitoring result. S4. Set it back to the default initial state through the PC. In the default initial state, switch A and B of the loop test device are in the open state. Restore it to the default initial state through the on-vehicle microcomputer. In the default initial state, the DO device is in the normally closed state. Then connect the heavy-duty connector pins Y1 and Y2 of the DO device of the multiple unit power car to the pins X1 and X2 of the loop test device respectively to conduct the normally closed contact test. S5. According to the maximum conduction current I of the DO device of the multiple unit power car, freely set the conduction current of the loop test device through the PC within the allowable value range as needed. S6. The PC gives a switch command, which is transmitted to the CPU through the Ethernet bus. The CPU controls switch A to close and switch B to close. At the same time, through the interconnection of the switches, an Ethernet data loop is formed. The PC can real-time loop monitor the action commands sent by the on-vehicle microcomputer to the DO device. At this time, observe the acquisition result received by the PC and the on-vehicle microcomputer command monitoring result.

2. The method for testing the IO loop of a multiple unit power car according to claim 1, characterized in that, In the step S1, the acquisition results received by the PC include the "1" state and the "0" state. When the acquisition result is in the "1" state, it indicates that the loopback test device is in a normal condition; when the acquisition result is in the "0" state, it indicates a device failure of the loopback test device and the test is aborted.

3. The method for testing the IO loopback of the EMU power car according to claim 1, characterized in that in the steps S2 and S5, the conduction current of the loopback test device is set to I / 2 by the PC.

4. The method for testing the IO loopback of the EMU power car according to claim 1, characterized in that the test of the EMU power car DI device specifically includes: A1. Power on the loopback test device. By default, when it is just powered on, the switches A and B of the loopback test device are in the open state. Perform the channel self-check of the loopback test device. The PC issues a switch command, which is transmitted to the CPU via the Ethernet bus. The CPU controls the closing of switch A and switch B to form a conduction path. At this time, observe the acquisition results received by the PC. A2. If the acquisition results in step A1 are normal, power off the loopback test device. First, connect the heavy-duty connectors Z1 and Z2 pins of the EMU power car DI device to the X2 and X3 pins of the loopback test device respectively through the tooling cable with a heavy-duty connector. At the same time, interconnect the vehicle-mounted switch and the device switch through the network cable. After the tooling cable is connected, both the EMU power car IO device and the loopback test device start to be powered on. The DI device is in the working state by default. According to the conduction current I required by the EMU power car DI device, within the allowable value range as needed, freely set the conduction current of the loopback test device by the PC. A3. The PC issues a switch command, which is transmitted to the CPU via the Ethernet bus. The CPU controls the closing of switch A and the opening of switch B. At the same time, through the interconnection of the switches, an Ethernet data loopback is formed. The PC can perform real-time loopback monitoring on the acquisition results sent by the DI device to the vehicle-mounted microcomputer. At this time, observe the acquisition results received by the PC and the acquisition results of the monitored DI device.

5. The method for testing the IO loopback of the EMU power car according to claim 4, characterized in that in the step A1, the acquisition results received by the PC include the "1" state and the "0" state. When the acquisition result is in the "1" state, it indicates that the loopback test device is in a normal condition; when the acquisition result is in the "0" state, it indicates a device failure of the loopback test device and the test is aborted.

6. The method for testing the IO loopback of the EMU power car according to claim 4, characterized in that in the step A2, the conduction current of the loopback test device is set to I by the PC.

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