High-sensitivity aerosol single-particle laser ionization device and mass spectrometer

Abstract

The invention discloses a high-sensitivity aerosol single particle laser ionization device and a mass spectrometer. The high-sensitivity aerosol single particle laser ionization device comprises a pulse laser, an ultraviolet laser reflecting lens, a focusing lens, a re-reflecting lens and a concave reflecting mirror; the pulse laser, the ultraviolet laser reflecting lens, the focusing lens, the re-reflecting lens and the concave reflecting mirror are sequentially distributed along the advancing direction of the optical path, the pulse laser is used to generate pulse laser ionization aerosol single particles, the ultraviolet laser reflecting lens is used to reflect the pulse laser generated by the pulse laser to the focusing lens, the focusing lens is used to focus the pulse laser to the front surface of the aerosol single particle, the re-reflecting lens is used to reflect the re-amplified laser focused on the aerosol single particle and reflect it to the concave reflecting mirror, and the concave reflecting mirror is used to reflect and refocus the amplified laser to the rear surface of the aerosol single particle. The high-sensitivity aerosol single particle laser ionization device can improve the ionization sensitivity.

Description

Technical Field

[0001] The present invention relates to the technical field of mass spectrometry detection, and particularly to a high-sensitivity aerosol single-particle laser ionization device and a mass spectrometer. Background Art

[0002] As is well known, atmospheric aerosols have a huge impact on the environment and human health, so people pay more and more attention to and conduct in-depth research on them. Due to the complex sources and evolution of atmospheric aerosols, it becomes difficult to deeply study their sources, physical and chemical properties, and evolution mechanisms. As a new type of aerosol analysis instrument, the single-particle aerosol mass spectrometer can measure the particle size and chemical composition at the single-particle level, and plays an important role in studying the types, mixing states, sources, and evolution processes of particulate matter in atmospheric aerosols.

[0003] The single-particle aerosol mass spectrometer consists of an injection system, a vacuum system, a laser particle size measurement system, an ionization system, a mass analyzer, an electronic control system, a software analysis system, etc. When the instrument is working properly, the sample to be measured first passes through the injection system, which converges the aerosol particles in the sample into a particle beam passing through the center of the aerodynamic lens. Different-sized particles have different speeds, and the speed decreases as the particle size increases. After passing through the multi-stage vacuum system, the converged particles are detected by the laser particle size measurement system, and information such as the particle size and speed of the particulate matter is obtained through calculation. At the same time, the moment T1 when the particulate matter generates a pulse trigger signal when passing through the particle size measurement system is recorded. Based on the above information, the moment T2 when the ionization laser emits light is calculated, so that when the ions fly to the ionization laser ionization position, the ionization system operates to ionize the particulate matter. The ionized charged

[0004] particles are analyzed in the mass analyzer to obtain the composition information of the particles. From the working principle of the instrument, it can be seen that the laser ionization system is an important part of the single-particle aerosol mass spectrometer, and the laser ionization system determines the ionization effect of the particulate matter. Commonly used aerosol particle ionization methods include chemical ionization, electron bombardment, ultraviolet photoionization, and laser desorption ionization. Laser desorption ionization can efficiently ionize aerosol particles with different chemical compositions, including low-volatility aerosol particles such as soot, dust, and sea salt, and is a necessary means for the instrument to achieve real-time online omnidirectional detection. However, the traditional laser ionization method reflects the pulsed laser emitted by the laser through a three-dimensional adjustment device and focuses it to the center of the ionization region through an optical lens for ionization. This ionization can only ionize one side of the aerosol particle (the side close to the laser emission direction), the ionization efficiency is insufficient, the ionization sensitivity is low, and it is difficult to meet the existing detection requirements. Summary of the Invention

[0005] Based on this, it is necessary to provide a high-sensitivity aerosol single-particle laser ionization device that can recycle the laser spot and re-reflect and focus it onto aerosol particles for ionization to improve ionization sensitivity.

[0006] A high-sensitivity aerosol single-particle laser ionization device includes a pulsed laser, an ultraviolet laser reflection lens, a focusing lens, a re-reflection lens, and a concave mirror; the pulsed laser, the ultraviolet laser reflection lens, the focusing lens, the re-reflection lens, and the concave mirror are sequentially distributed along the forward direction of the light path. The pulsed laser is used to generate pulsed laser for ionizing aerosol single particles. The ultraviolet laser reflection lens is used to reflect the pulsed laser generated by the pulsed laser to the focusing lens. The focusing lens is used to focus the pulsed laser onto the front surface of the aerosol single particle. The re-reflection lens is used to reflect the amplified laser after being focused on the aerosol single particle and re-amplified to the concave mirror. The concave mirror is used to reflect and re-focus the amplified laser onto the rear surface of the aerosol single particle.

[0007] In one embodiment, the re-reflection lens forms a 45° angle with the plane where the focusing lens is located, the concave mirror forms a 45° angle with the plane where the focusing lens is located, and the reflecting surfaces of the re-reflection lens and the concave mirror face each other.

[0008] In one embodiment, the high-sensitivity aerosol single-particle laser ionization device further includes a lens adjustment assembly. The lens adjustment assembly is connected to the focusing lens and is used to adjust the position of the focusing lens.

[0009] In one embodiment, the lens adjustment assembly can drive the focusing lens to move in a first direction, a second direction, and a third direction, where the first direction, the second direction, and the third direction are perpendicular to each other.

[0010] In one embodiment, the lens adjustment assembly includes a lens XY moving platform and a lens Y-axis lifting platform. The focusing lens is connected to the lens XY moving platform, and the lens XY moving platform is installed on the lens Y-axis lifting platform. The lens XY moving platform is used to drive the focusing lens to move along the X-axis direction or the Y-axis direction, and the lens Y-axis lifting platform is used to drive the lens XY moving platform and the focusing lens to move along the Y-axis direction.

[0011] In one embodiment, the high-sensitivity aerosol single-particle laser ionization device further includes a bracket assembly, and the ultraviolet laser reflection lens is installed on the bracket assembly.

[0012] In one embodiment, the position of the ultraviolet laser reflecting lens on the bracket assembly is adjustable.

[0013] In one embodiment, the pulsed laser is a 266 nm ultraviolet pulsed laser.

[0014] In one embodiment, the ultraviolet laser reflecting lens forms a 45° angle with the emission direction of the pulsed laser and the plane where the focusing lens is located respectively, and the ultraviolet laser reflecting lens can reflect the pulsed laser generated by the pulsed laser at a 90° angle to the focusing lens.

[0015] Another object of the present invention is also to provide a mass spectrometer.

[0016] A mass spectrometer includes the high-sensitivity aerosol single-particle laser ionization device described above.

[0017] The above-mentioned high-sensitivity aerosol single-particle laser ionization device can recycle the laser spot and re-reflect and focus it on the aerosol particle for ionization, which is a high-sensitivity aerosol single-particle laser ionization device that improves the ionization sensitivity. The traditional ionization structure is that a 266 nm ultraviolet pulsed laser reflects the emitted pulsed laser and then focuses it on the aerosol single particle through a focusing lens. However, this structure can only focus the focused spot on one side of the aerosol single particle, and the back of the aerosol single particle cannot be ionized by the laser, which greatly affects the ionization efficiency of the single-particle aerosol and thus the ionization sensitivity; while the above-mentioned high-sensitivity aerosol single-particle laser ionization device adds a re-reflecting lens and a concave mirror. Since the concave mirror not only has the function of reflecting the laser, but also can refocus the reflected spot on the back of the aerosol single particle. In this way, when the pulsed laser emitted by the pulsed laser reaches the front of the aerosol single particle, the back of the aerosol single particle is also focused and ionized by the laser, which will greatly improve the ionization efficiency and ionization sensitivity of the aerosol single particle.

[0018] When the above-mentioned high-sensitivity aerosol single-particle laser ionization device is in use, the pulsed laser generates pulsed laser to ionize the aerosol single-particle; the bracket assembly is used to fix the ultraviolet laser reflecting lens; the ultraviolet laser reflecting lens is used to reflect the laser emitted by the pulsed laser to the focusing lens; the lens Y-axis lifting platform and the lens XY moving platform are used to fix the focusing lens and adjust the movement of the focusing lens in the X-axis direction, Y-axis direction, and Z-axis direction; the re-reflecting lens is used to reflect the amplified laser after re-amplifying the pulsed laser emitted by the pulsed laser and focused on the aerosol single-particle to the concave mirror; the concave mirror reflects and focuses the light spot reflected by the re-reflecting lens onto the aerosol single-particle. The above-mentioned pulsed laser, ultraviolet laser reflecting lens, focusing lens, re-reflecting lens, and concave mirror cooperate with each other to simultaneously ionize the front surface and the back surface of the aerosol single-particle, improving the ionization efficiency and ionization sensitivity of the aerosol single-particle.

[0019] The above-mentioned high-sensitivity aerosol single-particle laser ionization device drives the focusing lens to move in the first direction, the second direction, and the third direction by setting a lens adjustment assembly. The focusing lens can move in the first direction, the second direction, and the third direction according to actual needs to adjust the position and angle.

[0020] The above-mentioned high-sensitivity aerosol single-particle laser ionization device realizes the movement of the focusing lens in the X-axis direction, Y-axis direction, and Z-axis direction by setting the lens XY moving platform and the lens Y-axis lifting platform. The lens XY moving platform and the lens Y-axis lifting platform have a simple structure, are easy to set, are easy to obtain materials, and have a low cost.

[0021] The above-mentioned high-sensitivity aerosol single-particle laser ionization device is provided with a bracket assembly for installing the ultraviolet laser reflecting lens, and realizes that the position of the ultraviolet laser reflecting lens on the bracket assembly is adjustable, and the angle and position of the ultraviolet laser reflecting lens can be adjusted according to actual needs, which is convenient to operate.

[0022] The mass spectrometer using the above-mentioned high-sensitivity aerosol single-particle laser ionization device can greatly improve the ionization efficiency and ionization sensitivity of the aerosol single-particle, and also improve the detection efficiency and sensitivity of the mass spectrometer. Brief Description of the Drawings

[0023] Figure 1 Schematic diagram of the high-sensitivity aerosol single-particle laser ionization device according to an embodiment of the present invention;

[0024] Figure 2 Schematic structural diagram of the high-sensitivity aerosol single-particle laser ionization device according to an embodiment of the present invention.

[0025] Description of reference numerals

[0026] 10. High-sensitivity aerosol single particle laser ionization device; 100. Pulse laser; 200. UV laser reflective lens; 300. Focusing lens; 400. Re-reflective lens; 500. Concave reflector; 600. Lens adjustment assembly; 610. Lens XY moving platform; 620. Lens Y-axis lifting platform; 700. Bracket assembly; 20. Optical path. Specific implementation method

[0027] In order to make the above-mentioned purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the accompanying drawings. Many specific details are set forth in the following description to facilitate a full understanding of the present invention. However, the present invention can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0028] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention.

[0029] In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0030] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to the specific circumstances.

[0031] ​In the present invention, unless otherwise clearly specified and defined, the first feature being "on" or "under" the second feature may mean that the first and second features are in direct contact, or the first and second features are indirectly in contact through an intermediate medium. Moreover, the first feature being "above", "over" and "on top of" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply indicates that the horizontal height of the first feature is higher than that of the second feature. The first feature being "under", "below" and "beneath" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply indicates that the horizontal height of the first feature is less than that of the second feature.

[0032] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or there may also be an intermediate element. When an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be an intermediate element at the same time. The terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used herein are only for the purpose of illustration and do not represent the only implementation.

[0033] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those of ordinary skill in the technical field to which this invention belongs. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0034] Please refer to Figure 1 and Figure 2 as shown, an embodiment of the present invention provides a high-sensitivity aerosol single-particle laser ionization device 10.

[0035] A high-sensitivity aerosol single-particle laser ionization device 10 includes a pulsed laser 100, an ultraviolet laser reflection lens 200, a focusing lens 300, a re-reflection lens 400, and a concave mirror 500.

[0036] Please refer to Figure 1 as shown, the pulsed laser 100, the ultraviolet laser reflection lens 200, the focusing lens 300, the re-reflection lens 400, and the concave mirror 500 are sequentially distributed along the advancing direction of the optical path 20.

[0037] The pulsed laser 100 is used to generate pulsed laser for ionizing single aerosol particles. The ultraviolet laser reflecting lens 200 is used to reflect the pulsed laser generated by the pulsed laser 100 to the focusing lens 300. The focusing lens 300 is used to focus the pulsed laser onto the front surface of the single aerosol particle. The re - reflecting lens 400 is used to reflect the amplified laser after being focused onto the single aerosol particle and reflected to the concave mirror 500. The concave mirror 500 is used to reflect and refocus the amplified laser onto the rear surface of the single aerosol particle.

[0038] In one embodiment, please refer to Figure 1 As shown, the re - reflecting lens 400 forms a 45° angle with the plane where the focusing lens 300 is located, the concave mirror 500 forms a 45° angle with the plane where the focusing lens 300 is located, and the reflecting surface of the re - reflecting lens 400 and the reflecting surface of the concave mirror 500 are arranged facing each other.

[0039] In one embodiment, please refer to Figure 1 As shown, the high - sensitivity single aerosol particle laser ionization device 10 further includes a lens adjustment assembly 600. The lens adjustment assembly 600 is connected to the focusing lens 300, and the lens adjustment assembly 600 is used to adjust the position of the focusing lens 300.

[0040] In one embodiment, the lens adjustment assembly 600 can drive the focusing lens 300 to move in the first direction, the second direction, and the third direction, where the first direction, the second direction, and the third direction are perpendicular to each other. The above - mentioned high - sensitivity single aerosol particle laser ionization device 10 drives the focusing lens 300 to move in the first direction, the second direction, and the third direction by setting the lens adjustment assembly 600. The focusing lens 300 can move in the first direction, the second direction, and the third direction according to actual needs to adjust the position and angle.

[0041] In one embodiment, please refer to Figure 1 As shown, the lens adjustment assembly 600 includes a lens XY moving platform 610 and a lens Y - axis lifting platform 620. The focusing lens 300 is connected to the lens XY moving platform 610. The lens XY moving platform 610 is installed on the lens Y - axis lifting platform 620. The lens XY moving platform 610 is used to drive the focusing lens 300 to move along the X - axis direction or the Y - axis direction, and the lens Y - axis lifting platform 620 is used to drive the lens XY moving platform 610 and the focusing lens 300 to move along the Y - axis direction. The above - mentioned high - sensitivity single aerosol particle laser ionization device 10 realizes the movement of the focusing lens 300 in the X - axis direction, the Y - axis direction, and the Z - axis direction by setting the lens XY moving platform 610 and the lens Y - axis lifting platform 620. The lens XY moving platform 610 and the lens Y - axis lifting platform 620 have simple structures, are easy to set up, are easy to obtain materials, and have low costs.

[0042] In one embodiment, please refer to Figure 1 As shown, the high-sensitivity aerosol single-particle laser ionization device 10 further includes a bracket assembly 700, and the ultraviolet laser reflecting lens 200 is installed on the bracket assembly 700.

[0043] In one embodiment, the position of the ultraviolet laser reflecting lens 200 on the bracket assembly 700 is adjustable. The above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 is provided with a bracket assembly 700 for installing the ultraviolet laser reflecting lens 200, and the position of the ultraviolet laser reflecting lens 200 on the bracket assembly 700 is adjustable, and the angle and position of the ultraviolet laser reflecting lens 200 can be adjusted according to actual needs, which is convenient to operate.

[0044] In one embodiment, the pulsed laser 100 is a 266 nm ultraviolet pulsed laser 100. It can be understood that in other embodiments, the pulsed laser 100 is not limited to the above, and the pulsed laser 100 can also be selected as other lasers according to needs.

[0045] In one embodiment, please refer to Figure 2 As shown, the ultraviolet laser reflecting lens 200 is respectively at a 45° angle to the emission direction of the pulsed laser 100 and the plane where the focusing lens 300 is located. The ultraviolet laser reflecting lens 200 can reflect the pulsed laser generated by the pulsed laser 100 at a 90° angle to the focusing lens 300.

[0046] When the above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 is in use, the pulsed laser 100 generates pulsed laser to ionize aerosol single particles; the bracket assembly 700 is used to fix the ultraviolet laser reflecting lens 200; the ultraviolet laser reflecting lens 200 is used to reflect the laser emitted by the pulsed laser 100 onto the focusing lens 300; the lens Y-axis lifting platform 620 and the lens XY moving platform 610 are used to fix the focusing lens 300 and adjust the movement of the focusing lens 300 in the X-axis direction, Y-axis direction, and Z-axis direction; the re-reflecting lens 400 is used to reflect the amplified laser after the pulsed laser emitted by the pulsed laser 100 is focused on the aerosol single particle and then re-amplified onto the concave mirror 500; the concave mirror 500 reflects and focuses the light spot reflected by the re-reflecting lens 400 onto the aerosol single particle. The above-mentioned pulsed laser 100, ultraviolet laser reflecting lens 200, focusing lens 300, re-reflecting lens 400, and concave mirror 500 cooperate with each other to simultaneously ionize the front surface and the back surface of the aerosol single particle, improving the ionization efficiency and ionization sensitivity of the aerosol single particle.

[0047] This embodiment also provides a mass spectrometer.

[0048] A mass spectrometer includes the above-mentioned high-sensitivity aerosol single particle laser ionization device 10. The mass spectrometer using the above-mentioned high-sensitivity aerosol single particle laser ionization device 10 can greatly improve the ionization efficiency and ionization sensitivity of aerosol single particles, and also improve the efficiency and sensitivity of mass spectrometer detection.

[0049] The mass spectrometer mentioned above can be a commonly used mass spectrometer, such as a gas chromatography-mass spectrometer, a liquid chromatography-mass spectrometer, a liquid chromatography-quadrupole mass spectrometer, a liquid chromatography-ion trap mass spectrometer, a liquid chromatography-time-of-flight mass spectrometer, a liquid chromatography-mass spectrometer-mass spectrometer, a matrix-assisted laser desorption time-of-flight mass spectrometer, and a Fourier transform mass spectrometer.

[0050] The above-mentioned high-sensitivity aerosol single-particle laser ionization device 10 is capable of recovering the laser spot and re-reflecting and focusing it onto the aerosol particles for ionization, thereby improving the ionization sensitivity of the high-sensitivity aerosol single-particle laser ionization device 10. The traditional ionization structure is that the 266nm ultraviolet pulse laser 100 reflects the emitted pulse laser and then focuses it onto the aerosol single particle through the focusing lens 300. However, this structure can only focus the focused light spot on a single side of the aerosol single particle, and the back of the aerosol single particle cannot be ionized by the laser, which greatly affects the ionization efficiency of the single particle aerosol, and further affects the ionization sensitivity; while the above-mentioned high-sensitivity aerosol single particle laser ionization device 10 adds a re-reflecting lens 400 and a concave reflector 500. Since the concave reflector 500 not only has the function of reflecting the laser, but also can refocus the reflected light spot on the back of the aerosol single particle, so that when the pulse laser emitted by the pulse laser 100 reaches the front of the aerosol single particle, the back of the aerosol single particle is also ionized by the laser focus, which will greatly improve the ionization efficiency and ionization sensitivity of the aerosol single particle.

[0051] The technical features of the above-mentioned embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0052] The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the patent of the present invention. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be based on the attached claims.

Claims

1. A high-sensitivity aerosol single-particle laser ionization device, characterized in that: It includes a pulse laser, an ultraviolet laser reflecting lens, a focusing lens, a re-reflecting lens, a concave reflecting mirror and a lens adjustment component; the pulse laser, the ultraviolet laser reflecting lens, the focusing lens, the re-reflecting lens and the concave reflecting mirror are sequentially distributed along the advancing direction of the optical path, the pulse laser is used to generate pulse laser for ionizing aerosol single particles, the ultraviolet laser reflecting lens is used to reflect the pulse laser generated by the pulse laser to the focusing lens, the lens adjustment component is connected to the focusing lens, the lens adjustment component is used to adjust the position of the focusing lens, the focusing lens is used to focus the pulse laser to the front surface of the aerosol single particle, the re-reflecting lens is used to reflect the re-amplified laser after being focused on the aerosol single particle to the concave reflecting mirror, and the concave reflecting mirror is used to reflect and refocus the amplified laser to the rear surface of the aerosol single particle.

2. The high-sensitivity aerosol single-particle laser ionization device according to claim 1, characterized in that: The re-reflecting lens forms an angle of 45° with the plane where the focusing lens is located, the concave reflector forms an angle of 45° with the plane where the focusing lens is located, and the reflective surface of the re-reflecting lens is arranged opposite to the reflective surface of the concave reflector.

3. The high-sensitivity aerosol single-particle laser ionization device according to claim 1, characterized in that: The lens adjustment assembly can drive the focusing lens to move in a first direction, a second direction, and a third direction, wherein the first direction, the second direction, and the third direction are perpendicular to each other.

4. The high-sensitivity aerosol single-particle laser ionization device according to claim 1, characterized in that: The lens adjustment assembly includes a lens XY moving platform and a lens Y-axis lifting platform, the focusing lens is connected to the lens XY moving platform, the lens XY moving platform is installed on the lens Y-axis lifting platform, the lens XY moving platform is used to drive the focusing lens to move along the X-axis direction or the Y-axis direction, and the lens Y-axis lifting platform is used to drive the lens XY moving platform and the focusing lens to move along the Y-axis direction.

5. The high-sensitivity aerosol single-particle laser ionization device according to any one of claims 1 to 4, characterized in that: The high-sensitivity aerosol single-particle laser ionization device also includes a bracket assembly, and the ultraviolet laser reflecting lens is installed on the bracket assembly.

6. The high-sensitivity aerosol single-particle laser ionization device according to claim 5, characterized in that: The position of the ultraviolet laser reflecting lens on the bracket assembly is adjustable.

7. The high-sensitivity aerosol single-particle laser ionization device according to any one of claims 1 to 4 and 6, characterized in that: The pulse laser is a 266nm ultraviolet pulse laser.

8. The high-sensitivity aerosol single-particle laser ionization device according to any one of claims 1 to 4 and 6, characterized in that: The ultraviolet laser reflecting lens is at an angle of 45° to the emission direction of the pulse laser and the plane where the focusing lens is located. The ultraviolet laser reflecting lens can reflect the pulse laser generated by the pulse laser to the focusing lens at an angle of 90°.

9. A mass spectrometer, characterized in that A high-sensitivity aerosol single-particle laser ionization device comprising the device described in any one of claims 1 to 8.

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