A high-temperature latch-up detection system for integrated circuits

Abstract

The present invention relates to the field of circuit detection technology, and specifically discloses a high-temperature latch effect detection system for integrated circuits, comprising a test box, a box door, a detection box connected to the bottom of the test box, and a detection cavity arranged in the test box, wherein the test box is provided with a control panel on the side close to the box door; a first mounting plate and two groups of second mounting plates for mounting circuit boards are provided in the detection cavity, and the sides close to the first mounting plate and the second mounting plate are connected to a plurality of mounting guide rails; a plurality of electric heating plates corresponding to the circuit boards are connected to the side of the box door close to the detection cavity; the present invention is improved upon the existing test box, facilitates the installation of test circuit boards, and can detect multiple groups of circuit boards. When the box door is closed, it can cut off the connection between the detection cavity and the outside world, facilitates stable detection of the circuit, and heats evenly. When the box door is subsequently opened, it facilitates heat dissipation of the circuit board and the detection cavity, which is convenient for use.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit detection, in particular to a high-temperature latch-up effect detection system for an integrated circuit. Background Art

[0002] Integrated circuits are widely used in the electronics industry. Before they are put into use, they and their discrete components must undergo high-temperature testing, as well as testing for latch-up effects (a significant issue in CMOS integrated circuits, which can disrupt chip functionality, cause circuits to become inoperable, or even burn out). Testing typically involves a test chamber equipped with temperature detection, monitoring, and over-temperature alarm systems. A microcomputer monitors and records the chamber's temperature in real time, and monitors the circuit board's operating status.

[0003] Existing high-temperature integrated circuit test chambers often include a test cabinet for placing circuit boards, which is equipped with a heater for heating. For example, in a high-temperature aging test chamber control system disclosed in patent publication number CN108121377A, a blower operates after the heater begins operating to prevent excessive temperature concentration after the heater is powered on. The high temperature during the test is generated by the thermal element of the thermal relay FR in the main circuit. This can easily lead to concentrated heating points when multiple circuit boards are tested together, necessitating improvements. To address these issues, a high-temperature latch-up detection system for integrated circuits is proposed. Summary of the Invention

[0004] An object of the present invention is to provide a high-temperature latch-up detection system for an integrated circuit to solve the problems raised in the above-mentioned background technology.

[0005] To achieve the above object, the present invention provides the following technical solutions:

[0006] A high-temperature latch-up effect detection system for integrated circuits includes a test box, a box door, a detection box connected to the bottom of the test box, and a detection cavity arranged in the test box. The test box is provided with a control panel on a side close to the box door.

[0007] The detection chamber is provided with a first mounting plate for mounting a circuit board and two sets of second mounting plates, and the adjacent sides of the first mounting plate and the second mounting plate are connected to a plurality of mounting rails;

[0008] The box door is connected to a side close to the detection chamber with several electric heating plates corresponding to the circuit boards. The top and one side of the test box are provided with ventilation areas corresponding to the detection chamber. The box door is connected to a third partition plate and a second partition plate for isolating the detection chamber from the ventilation area.

[0009] The second partition plate is connected to a connecting block on a side away from the box door. A positioning seat hinged to the connecting block is provided in the test box, and the positioning seat is slidably arranged between the inner and outer walls of the test box.

[0010] The outer side wall of the test box is connected with a fixing piece for fixing the position of the second partition board when the second partition board flips around the positioning seat.

[0011] In an optional solution: a third partition cavity for placing a third partition plate is provided between the inner and outer walls of the top of the test box, a second partition cavity for placing a second partition plate is provided between the inner and outer walls of the side walls corresponding to the test box and the second partition plate, a first partition cavity is provided between the inner wall of the test box away from the second partition cavity and the components, and the box door is connected to the first partition plate placed in the first partition cavity on the side close to the electric heating plate.

[0012] In an optional solution: the positioning seat includes a movable plate, the movable plate is connected to an extension plate on the side close to the second partition plate, the extension plate is connected to a hinge block hinged to the connecting block, a limiting groove for sliding of the movable plate is provided in the second partition cavity, a rectangular groove for the second partition plate and the extension plate to pass through is provided at one end of the limiting groove, and the limiting groove is connected to the outside through the rectangular groove.

[0013] In an optional solution: the second partition cavity and the third partition cavity correspond to two groups of ventilation areas, and a number of ventilation holes are provided on the two side panels of the cavity where the second partition cavity and the third partition cavity are located, for detecting the connection between the cavity and the outside.

[0014] In an optional solution: the fixing member includes a fixing sleeve connected to the outer wall of the test box and a fixing plate slidably arranged in the fixing sleeve, the fixing plate is connected to the limit plate at one end away from the box door, the top and bottom of the fixing plate close to the box door are provided with protrusions, a connecting block connected to the protrusion is provided inside the fixing plate, an adjustment block connected to the connecting block is provided on the side of the fixing plate away from the test box, a sliding groove for the adjusting block to slide up and down is provided on the fixing plate, a sliding groove for the connecting block to slide up and down is provided inside the fixing plate, and the adjacent sides of the two groups of connecting blocks are connected to springs arranged in the corresponding sliding grooves.

[0015] In an optional solution: a fixing groove corresponding to the end of the fixing plate is provided on one side of the second partition plate, and a clamping groove corresponding to the protrusion is provided on the top and bottom of the fixing groove.

[0016] In an optional solution: the control panel is electrically connected to the components in the test box, a heat dissipation area for dissipating heat from the components is provided on one side of the test box, and heat dissipation areas are provided on both sides of the test box.

[0017] In an optional solution, the first mounting plate and the second mounting plate are both provided with a plurality of rectangular through holes for air circulation.

[0018] In an optional solution, two groups of second mounting plates are symmetrically arranged on both sides of the first mounting plate, and the first mounting plate and the second mounting plate are both fixed in the detection cavity by bolts. A detection component corresponding to the circuit board is installed in the detection cavity.

[0019] In an optional solution, four sets of evenly arranged self-locking universal wheels are connected to the bottom of the detection box.

[0020] Compared with the prior art, the present invention has the following beneficial effects:

[0021] The present invention improves the existing test box, facilitates the installation of test circuit boards, and can test multiple groups of circuit boards. When the box door is closed, it can cut off the connection between the test cavity and the outside world, which is convenient for stable detection of the circuit and uniform heating. When the box door is subsequently opened, it is convenient for the circuit board and the test cavity to dissipate heat, which is convenient for use. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a structural schematic diagram of the present invention.

[0023] Figure 2 This is a schematic structural diagram of the second partition board after flipping over in the present invention.

[0024] Figure 3 It is a structural schematic diagram of the first mounting plate and the second mounting plate in the present invention.

[0025] Figure 4 It is a structural schematic diagram of the positioning seat in the present invention.

[0026] Figure 5 It is a structural schematic diagram of the location where the fixing member is set in the present invention.

[0027] Figure 6 It is a structural schematic diagram of the fixing member fixing the second partition board in the present invention.

[0028] Figure 7 For the present invention Figure 5 Schematic diagram of the local enlarged structure.

[0029] In the figure: 11. test chamber; 12. detection chamber; 13. control panel; 14. chamber door; 15. detection chamber; 16. first mounting plate; 17. second mounting plate; 18. mounting rail; 21. first partition chamber; 22. third partition chamber; 23. first partition plate; 24. third partition plate; 25. second partition plate; 26. connecting block; 27. electric heating plate; 28. positioning seat; 29. ​​movable plate; 30. extension plate; 31. hinge block; 32. fixing sleeve; 33. fixing plate; 34. limiting plate; 35. protrusion; 36. adjustment block; 37. fixing groove; 38. ventilation area. DETAILED DESCRIPTION

[0030] See also Figure 1-Figure 7 In this embodiment, a high-temperature latch-up detection system for integrated circuits includes a test chamber 11, a chamber door 14, a control panel 13 connected to one side of the test chamber 11, a detection chamber 12 connected to the bottom of the test chamber 11, and a detection cavity 15 disposed within the test chamber 11. Components within the test chamber 11 and the detection chamber 12 can be existing test chamber components, such as a test power supply, an oscilloscope, and a drive control board.

[0031] like Figure 2 As shown, the detection chamber 15 is provided with a first mounting plate 16 for mounting a circuit board and two sets of second mounting plates 17, as shown in FIG. Figure 3 As shown, the first mounting plate 16 and the second mounting plate 17 are connected to a plurality of mounting rails 18 on the side close to each other. The two sides of the test circuit board can be slid into the mounting rails 18 and then installed between the first mounting plate 16 and the second mounting plate 17. In this application, 16 sets of circuit boards can be installed in the detection chamber 15, and 8 sets are installed between the first mounting plate 16 and a set of second mounting plates 17;

[0032] like Figure 2 As shown, the door 14 is connected to a side close to the detection chamber 15 with a plurality of electric heating plates 27 corresponding to the circuit boards. When the door 14 is docked and closed, the electric heating plates 27 are placed at the bottom of the corresponding circuit boards. The top and one side of the test box 11 are provided with a ventilation area 38 corresponding to the detection chamber 15. The door 14 is connected to a third partition plate 24 and a second partition plate 25 for isolating the detection chamber 15 from the ventilation area 38.

[0033] like Figure 2 As shown, the second partition plate 25 is connected to the connecting block 26 on the side away from the box door 14, and a positioning seat 28 hinged to the connecting block 26 is provided in the test box 11. When the box door 14 and the electric heating plate 27 are pulled out, the positioning seat 28 is slidably arranged between the inner and outer walls of the test box 11;

[0034] The outer wall of the test box 11 is connected to a fixing member for fixing the position of the second partition plate 25 when the second partition plate 25 is turned around the positioning seat 28;

[0035] In this embodiment, both sides of the circuit board can be slid into the mounting rails 18 and installed between the first mounting plate 16 and the second mounting plate 17. When the box door 14 is closed, the second partition plate 25 is flipped to be level with the first mounting plate 16. The second partition plate 25 and the third partition plate 24 can be docked in the test box 11 and then slid into the test box 11. The box door 14 blocks the opening of the detection chamber 15, and the electric heating plate 27 is placed at the bottom of the corresponding circuit board. The test box 11 can perform detection operations.

[0036] In one embodiment, Figure 2 As shown, a third partition cavity 22 for placing a third partition plate 24 is provided between the inner and outer walls of the top of the test box 11, a second partition cavity for placing the second partition plate 25 is provided between the inner and outer walls of the side walls corresponding to the test box 11 and the second partition plate 25, a first partition cavity 21 is provided between the inner wall of the test box 11 away from the second partition cavity and the components, and the box door 14 is connected to the side close to the electric heating plate 27 with a first partition plate 23 placed in the first partition cavity 21. The first partition plate 23 can reduce the heat transfer to the components, and the second partition plate 25 and the third partition plate 24 can isolate the connection between the detection cavity 15 and the outside.

[0037] In one embodiment, Figure 4 As shown, the positioning seat 28 includes a movable plate 29, and the movable plate 29 is connected to an extension plate 30 near the side of the second partition plate 25. The extension plate 30 is connected to a hinge block 31 hinged to the connecting block 26. The second partition plate 25 can flip around the axis of the hinge block 31, so that the box door 14, the electric heating plate 27, the third partition plate 24 and the first partition plate 23 are flipped as a whole. A limiting groove for the sliding of the movable plate 29 is provided in the second partition cavity, and a rectangular groove for the second partition plate 25 and the extension plate 30 to pass through is provided at one end of the limiting groove. The limiting groove is connected to the outside through the rectangular groove. When the box door 14 is opened, the third partition plate 24 and the first partition plate 23 gradually move out of the corresponding partition cavity, and the second partition plate 25 pulls the movable plate 29 to slide in the limiting groove, and then pulls the extension plate 30 out of the rectangular groove, so that the hinge block 31 is exposed to the outside, which is convenient for flipping the second partition plate 25.

[0038] In one embodiment, Figure 2 and Figure 6 As shown, the second partition cavity and the third partition cavity 22 correspond to two groups of ventilation areas 38. A number of ventilation holes are provided on the two side panels of the cavity where the second partition cavity and the third partition cavity 22 are located, which are used to connect the detection cavity 15 with the outside. When the second partition cavity and the third partition cavity 22 are placed in the corresponding partition cavity, the detection cavity 15 cannot be connected with the outside through the ventilation holes.

[0039] In one embodiment, Figure 5 、 Figure 6 and Figure 7When the lever 32 is unlocked, the lever 33 is unlocked and the lock 35 is unlocked, so that the lock 35 can be unlocked when the lever 32 is unlocked.

[0040] In one embodiment, Figure 6 As shown, one side of the second partition plate 25 is provided with a fixing groove 37 corresponding to the end of the fixing plate 33, and the top and bottom of the fixing groove 37 are provided with a card slot corresponding to the protrusion 35; when the second partition plate 25 is fixed, the end of the fixing plate 33 extends into the fixing groove, the pressing of the adjustment block 36 is released, and under the action of the spring, the protrusion 35 docks in the card slot, and the position of the second partition plate 25 is fixed after it is flipped over.

[0041] In one embodiment, the control panel 13 is electrically connected to the components in the test box 11 . A heat dissipation area for dissipating heat from the components is provided on one side of the test box 11 , and heat dissipation areas are provided on both sides of the test box 12 .

[0042] In one embodiment, Figure 3 As shown, the first mounting plate 16 and the second mounting plate 17 are both provided with a plurality of rectangular through holes for airflow.

[0043] In one embodiment, Figure 2 and Figure 3 As shown, two groups of second mounting plates 17 are symmetrically arranged on both sides of the first mounting plate 16. The first mounting plate 16 and the second mounting plate 17 are both fixed in the detection cavity 15 by bolts. A detection component corresponding to the circuit board is installed in the detection cavity 15. When the circuit board is installed between the first mounting plate 16 and the second mounting plate 17, it can be docked on the device corresponding to the detection component.

[0044] In one embodiment, Figure 1 As shown, four sets of evenly arranged self-locking universal wheels are connected to the bottom of the test box 12 to facilitate the movement of the test box 11.

[0045] When the present invention is used, both sides of the circuit board can be slid into the mounting guide rails 18 and installed between the first mounting plate 16 and the second mounting plate 17. When the box door 14 is closed, the second partition plate 25 is flipped to be level with the first mounting plate 16. The second partition plate 25 and the third partition plate 24 can be docked in the test box 11. Then, they are slid into the test box 11. The box door 14 blocks the opening of the detection cavity 15. The electric heating plate 27 is placed at the bottom of the corresponding circuit board. The test box 11 can then perform detection operations.

[0046] When the box door 14 is opened, the third partition plate 24 and the first partition plate 23 gradually move out of the corresponding partition cavity, and the second partition plate 25 pulls the movable plate 29 to slide in the limit groove, and then pulls the extension plate 30 out of the rectangular groove, so that the hinge block 31 is exposed to the outside, which is convenient for flipping the second partition plate 25, and drags the end of the fixed plate 33 into the fixed groove, releases the press on the adjustment block 36, and is acted upon by the spring. The protrusion 35 docks in the card slot, and the position of the second partition plate 25 is fixed after flipping, which is convenient for removing the circuit board.

Claims

1. A high-temperature latch-up effect detection system for an integrated circuit, comprising a test box (11), a box door (14), a detection box (12) connected to the bottom of the test box (11), and a detection cavity (15) arranged in the test box (11), wherein a control panel (13) is provided on a side of the test box (11) close to the box door (14); Its characteristics are: A first mounting plate (16) and two sets of second mounting plates (17) for mounting a circuit board are provided in the detection chamber (15); a plurality of mounting guide rails (18) are connected to the adjacent sides of the first mounting plate (16) and the second mounting plate (17); A plurality of electric heating plates (27) corresponding to the circuit boards are connected to the side of the box door (14) close to the detection chamber (15); a ventilation area (38) corresponding to the detection chamber (15) is provided on the top and one side of the test box (11); and a third partition plate (24) and a second partition plate (25) for isolating the detection chamber (15) from communicating with the ventilation area (38) are connected to the box door (14); The second partition plate (25) is connected to the first connecting block (26) on the side away from the box door (14), and a positioning seat (28) hinged to the first connecting block (26) is provided in the test box (11), and the positioning seat (28) is slidably arranged between the inner and outer walls of the test box (11); The outer side wall of the test box (11) is connected to a fixing member for fixing the position of the second partition plate (25) when the second partition plate (25) turns around the positioning seat (28).

2. The high-temperature latch-up detection system for integrated circuits according to claim 1, wherein: A third partition cavity (22) for inserting a third partition plate (24) is provided between the inner and outer walls of the top of the test box (11); a second partition cavity for inserting the second partition plate (25) is provided between the inner and outer walls of the side walls corresponding to the test box (11) and the second partition plate (25); a first partition cavity (21) is provided between the inner wall of the test box (11) away from the second partition cavity and the components; and a first partition plate (23) inserted into the first partition cavity (21) is connected to the side of the box door (14) close to the electric heating plate (27).

3. The high-temperature latch-up detection system for integrated circuits according to claim 2, wherein: The positioning seat (28) includes a movable plate (29), and the movable plate (29) is connected to an extension plate (30) on a side close to the second partition plate (25). The extension plate (30) is connected to a hinge block (31) hinged to the first connecting block (26). A limiting groove for sliding the movable plate (29) is provided in the second partition cavity, and a rectangular groove for the second partition plate (25) and the extension plate (30) to pass through is provided at one end of the limiting groove, and the limiting groove is connected to the outside through the rectangular groove.

4. The high-temperature latch-up detection system for integrated circuits according to claim 2, wherein: The second partition cavity and the third partition cavity (22) correspond to two groups of ventilation areas (38), and a plurality of ventilation holes are provided on the two side panels of the cavity where the second partition cavity and the third partition cavity (22) are located, for communicating the detection cavity (15) with the outside.

5. The high-temperature latch-up detection system for integrated circuits according to claim 1, wherein: The fixing member includes a fixing sleeve (32) connected to the outer wall of the test box (11) and a fixing plate (33) slidably arranged in the fixing sleeve (32), the fixing plate (33) is connected to the limit plate (34) at one end away from the box door (14), and the top and bottom of the fixing plate (33) close to the box door (14) are provided with protrusions (35), a second connecting block connected to the protrusion (35) is provided inside the fixing plate (33), an adjustment block (36) connected to the second connecting block is provided on the side of the fixing plate (33) away from the test box (11), a slide groove for the adjustment block (36) to slide up and down is provided on the fixing plate (33), a slide groove for the second connecting block to slide up and down is provided inside the fixing plate (33), and the two groups of second connecting blocks are connected to the side where they are close to each other with springs arranged in the corresponding slide grooves.

6. The high-temperature latch-up detection system for integrated circuits according to claim 5, wherein: A fixing groove (37) corresponding to the end of the fixing plate (33) is provided on one side of the second partition plate (25), and a clamping groove corresponding to the protrusion (35) is provided at the top and bottom of the fixing groove (37).

7. The integrated circuit high temperature latch-up detection system according to claim 1, wherein: The control panel (13) is electrically connected to the components in the test box (11); a heat dissipation area for dissipating heat from the components is provided on one side of the test box (11); and heat dissipation areas are provided on both sides of the test box (12).

8. The high-temperature latch-up detection system for integrated circuits according to claim 1, wherein: The first mounting plate (16) and the second mounting plate (17) are both provided with a plurality of rectangular through holes for airflow.

9. The high-temperature latch-up detection system for integrated circuits according to claim 1, wherein: Two groups of second mounting plates (17) are symmetrically arranged on both sides of the first mounting plate (16); the first mounting plate (16) and the second mounting plate (17) are both fixed in the detection cavity (15) by bolts; and a detection component corresponding to the circuit board is installed in the detection cavity (15).

10. The integrated circuit high temperature latch-up detection system according to claim 1, characterized in that: The bottom of the detection box (12) is connected to four sets of evenly arranged self-locking universal wheels.

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