A circuit parameter calibration method and automatic calibration device

Abstract

This invention discloses a method and automatic calibration device for calibrating circuit parameters. The method includes: determining a current device under test (DUT) to be calibrated and a calibration type for each DUT; determining calibration information corresponding to each DUT based on its target calibration type, wherein the target calibration type for each DUT includes at least one calibration type from a set of calibration types; and calibrating the circuit parameters of each DUT based on the determined calibration information. Therefore, implementing this invention enables the calibration of different types of circuit parameters in multiple DUTs, thereby improving the efficiency of circuit parameter calibration.

Description

Technical Field

[0001] This invention relates to the field of electronic technology, and in particular to a method for calibrating circuit parameters and an automatic calibration device. Background Technology

[0002] With the development of science and technology, the variety and number of electronic products are increasing, and various types of electronic products have become an indispensable part of people's daily lives.

[0003] Testing and calibration are essential steps in the manufacturing of electronic products. However, current testing methods often suffer from discrepancies between the collected parameters and the actual required parameters due to factors such as the electrical components, PCB boards, and manufacturing processes. This leads to inaccurate or even erroneous test results. Furthermore, most calibrations currently involve manual testing and calibration of each device, or a unified calibration using software followed by manual calibration. These methods are not only labor-intensive but also suffer from low accuracy and efficiency. Therefore, developing a new calibration method to improve both accuracy and efficiency is crucial. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a method and an automatic calibration device for calibrating circuit parameters, which can improve the efficiency and accuracy of calibrating circuit parameters by calibrating different types of circuit parameters in multiple devices under test.

[0005] To address the aforementioned technical problems, the first aspect of this invention discloses a method for calibrating circuit parameters, the method comprising:

[0006] Determine the current device under test to be calibrated and the target calibration type for each of the current devices under test;

[0007] Based on the target calibration type of each current device under test, calibration information corresponding to each current device under test is determined, wherein the target calibration type of each current device under test includes at least one calibration type in the calibration type set;

[0008] For each device under test, the circuit parameters of the device under test are calibrated according to the calibration information corresponding to the current device under test.

[0009] As an optional implementation, in the first aspect of the present invention, the calibration type set includes one or more of output signal calibration type, proprietary circuit calibration type, and input signal calibration type.

[0010] As an optional implementation, in the first aspect of the present invention, for each of the current devices under test, calibrating the circuit parameters in the current device under test according to the determined calibration information corresponding to the current device under test includes:

[0011] When the target calibration type of the current device under test includes the output signal calibration type, the first circuit signal currently output by the current device under test is obtained;

[0012] The system determines whether the first circuit signal currently output by the device under test (DUT) matches the first calibration signal included in the first calibration information corresponding to the DUT. If a mismatch is found, the system analyzes the difference parameter between the first circuit signal currently output by the DUT and the first calibration signal, sends the difference parameter to the DUT, and continues to trigger the operation of acquiring the first circuit signal currently output by the DUT and the operation of determining whether the first circuit signal currently output by the DUT matches the first calibration signal included in the first calibration information corresponding to the DUT, until the first circuit signal currently output by the DUT matches the first calibration signal or the accumulated verification parameters meet the preset verification parameter conditions. The difference parameter is used to trigger the DUT to perform a self-adjustment operation matching the difference parameter to adjust the first circuit signal currently output by the DUT. The first calibration information is calibration information matching the output signal calibration type.

[0013] When it is determined that the first circuit signal currently output by the device under test matches the first calibration signal, it is determined that the calibration operation corresponding to the output signal calibration type has been completed for the circuit parameters in the device under test.

[0014] As an optional implementation, in the first aspect of the present invention, for each of the current devices under test, calibrating the circuit parameters in the current device under test according to the determined calibration information corresponding to the current device under test includes:

[0015] When the target calibration type of the current device under test includes the proprietary circuit calibration type, acquire the second circuit signal collected for the current device under test;

[0016] The second circuit signal is sent to the current device under test to trigger the current device under test to perform a matching self-adjustment operation and feed back the adjustment result signal;

[0017] Receive the adjustment result signal sent by the current device under test, and determine whether the current device under test has been adjusted based on the adjustment result signal. When it is determined that the current device under test has been adjusted based on the adjustment result signal, determine that the calibration operation corresponding to the proprietary circuit calibration type has been performed on the circuit parameters in the current device under test.

[0018] The device under test performs a matching self-adjustment operation, including:

[0019] The device under test (DUT) performs a content update operation on the calibration object included in the second calibration information corresponding to the DUT based on the second circuit signal.

[0020] The content update operation is used to update the content of the object to be calibrated to the second circuit signal or to update the content corresponding to the object to be calibrated to the calculation result obtained by calculating the second circuit information based on the calibration algorithm included in the second calibration information.

[0021] As an optional implementation, in the first aspect of the present invention, for each of the current devices under test, calibrating the circuit parameters in the current device under test according to the determined calibration information corresponding to the current device under test includes:

[0022] When the target calibration type of the current device under test includes the input signal calibration type, a circuit signal matching the calibration signal type is sent to the current device under test according to the calibration signal type included in the third calibration information corresponding to the current device under test, so as to trigger the current device under test to send a feedback signal upon receiving the circuit signal matching the calibration signal type.

[0023] Receive the feedback signal sent by the current device under test, and determine whether the feedback signal matches the circuit signal that it sends to the current device under test that matches the type of the calibration signal;

[0024] When it is determined that the feedback signal matches a circuit signal sent to the current device under test that matches the calibration signal type, it is determined that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the current device under test.

[0025] As an optional implementation, in the first aspect of the present invention, for each of the current devices under test, calibrating the circuit parameters of the current device under test according to the determined calibration information corresponding to the current device under test further includes:

[0026] When the target calibration type of the current device under test includes the input signal calibration type, and when it is determined that the feedback signal does not match the circuit signal sent to the current device under test that matches the calibration signal type, the offset parameter between the feedback signal and the circuit signal sent to the current device under test that matches the calibration signal type is calculated.

[0027] The offset parameter is sent to the current device under test (DUT) to trigger the DUT to perform a self-adjustment operation matching the offset parameter. The DUT then re-executes the operation of sending a circuit signal matching the calibration signal type to the DUT based on the calibration signal type included in the third calibration information corresponding to the DUT. This triggers the DUT to send a feedback signal upon receiving the circuit signal matching the calibration signal type, and re-executes the operation of receiving the feedback signal sent by the DUT and determining whether the feedback signal matches the circuit signal matching the calibration signal type it sent to the DUT.

[0028] As an optional implementation, in the first aspect of the present invention, the method further includes:

[0029] For any target calibration type of any current device under test, when the calibration operation corresponding to the target calibration type is completed for the current device under test, it is determined whether there are any remaining target calibration types for the current device under test that have not yet undergone corresponding calibration operations. If it is determined that there are remaining target calibration types, a first circuit switching operation is performed to switch the signal acquisition circuit to a signal acquisition circuit used to acquire the circuit signal corresponding to the remaining target calibration type; and / or,

[0030] For any of the current devices under test, when all calibration operations corresponding to the target calibration types have been performed for the current devices under test, it is determined whether there are any remaining devices under test. When it is determined that there are any remaining devices under test, a second circuit switching operation is performed to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the target calibration type of the remaining devices under test, wherein the remaining devices under test have calibration operations that have not been completed.

[0031] A second aspect of the present invention discloses an automatic calibration device for circuit parameters, the automatic calibration device comprising:

[0032] A microcontroller is used to determine the current device under test to be calibrated and the target calibration type for each of the current devices under test;

[0033] The microcontroller is further configured to determine calibration information corresponding to each current device under test based on the target calibration type of each current device under test, wherein the target calibration type of each current device under test includes at least one calibration type in a set of calibration types;

[0034] The microcontroller is also configured to calibrate the circuit parameters of each current device under test (DUT) based on the determined calibration information corresponding to that current DUT.

[0035] As an optional implementation, in a second aspect of the invention, the calibration type set includes one or more of output signal calibration types, proprietary circuit calibration types, and input signal calibration types.

[0036] As an optional implementation, in a second aspect of the present invention, the automatic calibration device further includes a signal detection circuit and a communication circuit;

[0037] For each device under test (DUT), the microcontroller calibrates the circuit parameters of the DUT based on the determined calibration information, including the following methods:

[0038] When the target calibration type of the current device under test includes the output signal calibration type, the first circuit signal currently output by the current device under test is obtained through the signal detection circuit.

[0039] The system determines whether the first circuit signal currently output by the device under test (DUT) matches the first calibration signal included in the first calibration information corresponding to the DUT. If a mismatch is found, the system analyzes the difference parameter between the first circuit signal currently output by the DUT and the first calibration signal. The difference parameter is then sent to the DUT via the communication circuit. The system continues to trigger the operation of acquiring the first circuit signal currently output by the DUT through the signal detection circuit and the operation of determining whether the first circuit signal currently output by the DUT matches the first calibration signal included in the first calibration information corresponding to the DUT, until the first circuit signal currently output by the DUT matches the first calibration signal or the accumulated verification parameters meet the preset verification parameter conditions. The difference parameter is used to trigger the DUT to perform a self-adjustment operation matching the difference parameter to adjust the first circuit signal currently output by the DUT. The first calibration information is calibration information matching the output signal calibration type.

[0040] When it is determined that the first circuit signal currently output by the device under test matches the first calibration signal, it is determined that the calibration operation corresponding to the output signal calibration type has been completed for the circuit parameters in the device under test.

[0041] As an optional implementation, in a second aspect of the present invention, the automatic calibration device further includes a signal detection circuit and a communication circuit;

[0042] For each device under test (DUT), the microcontroller calibrates the circuit parameters of the DUT based on the determined calibration information, including the following methods:

[0043] When the target calibration type of the current device under test includes the proprietary circuit calibration type, the second circuit signal collected for the current device under test is obtained through the signal detection circuit.

[0044] The second circuit signal is sent to the current device under test through the communication circuit to trigger the current device under test to perform a matching self-adjustment operation and feed back the adjustment result signal;

[0045] The communication circuit receives the adjustment result signal sent by the current device under test, and determines whether the current device under test has been adjusted based on the adjustment result signal. When it is determined that the current device under test has been adjusted based on the adjustment result signal, it is determined that the calibration operation corresponding to the proprietary circuit calibration type has been performed on the circuit parameters in the current device under test.

[0046] The device under test performs a matching self-adjustment operation, including:

[0047] The device under test (DUT) performs a content update operation on the calibration object included in the second calibration information corresponding to the DUT based on the second circuit signal.

[0048] The content update operation is used to update the content of the object to be calibrated to the second circuit signal or to update the content corresponding to the object to be calibrated to the calculation result obtained by calculating the second circuit information based on the calibration algorithm included in the second calibration information.

[0049] As an optional implementation, in a second aspect of the present invention, the automatic calibration device further includes a communication circuit and a signal generation circuit;

[0050] For each device under test (DUT), the microcontroller calibrates the circuit parameters of the DUT based on the determined calibration information, including the following methods:

[0051] When the target calibration type of the current device under test includes the input signal calibration type, the signal generation circuit sends a circuit signal that matches the calibration signal type included in the third calibration information corresponding to the current device under test to the current device under test, so as to trigger the current device under test to send a feedback signal upon receiving the circuit signal that matches the calibration signal type.

[0052] The communication circuit receives the feedback signal sent by the current device under test and determines whether the feedback signal matches the circuit signal sent to the current device under test that matches the type of calibration signal.

[0053] When it is determined that the feedback signal matches a circuit signal sent to the current device under test that matches the calibration signal type, it is determined that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the current device under test.

[0054] As an optional implementation, in the second aspect of the present invention, for each of the current devices under test, the microcontroller calibrates the circuit parameters in the current device under test based on the determined calibration information corresponding to the current device under test, further comprising:

[0055] When the target calibration type of the current device under test includes the input signal calibration type, and when it is determined that the feedback signal does not match the circuit signal sent to the current device under test that matches the calibration signal type, the offset parameter between the feedback signal and the circuit signal sent to the current device under test that matches the calibration signal type is calculated.

[0056] The offset parameter is sent to the current device under test (DUT) via the communication circuit to trigger the DUT to perform a self-adjustment operation matching the offset parameter. The DUT then re-executes the operation of sending a circuit signal matching the calibration signal type included in the third calibration information corresponding to the DUT via the signal generation circuit. This triggers the DUT to send a feedback signal upon receiving the circuit signal matching the calibration signal type and re-executes the operation of receiving the feedback signal sent by the DUT via the communication circuit, determining whether the feedback signal matches the circuit signal matching the calibration signal type it sent to the DUT.

[0057] As an optional implementation, in a second aspect of the invention, the automatic calibration device further includes a channel switching circuit;

[0058] The microcontroller is further configured to, for any target calibration type of any current device under test, when the calibration operation corresponding to the target calibration type has been completed for the current device under test, determine whether there are any remaining target calibration types for the current device under test for which the corresponding calibration operation has not been performed; if it is determined that there are remaining target calibration types, perform a first circuit switching operation through the channel switching circuit to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the remaining target calibration type; and / or,

[0059] The microcontroller is further configured to, for any current device under test, determine whether there are any remaining devices under test after all calibration operations corresponding to the target calibration types have been performed for the current device under test; if it is determined that there are remaining devices under test, perform a second circuit switching operation through the channel switching circuit to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the target calibration type of the remaining devices under test, wherein the remaining devices under test have calibration operations that have not been completed.

[0060] A third aspect of the present invention discloses another automatic calibration device, the automatic calibration device comprising:

[0061] Memory containing executable program code;

[0062] A processor coupled to the memory;

[0063] The processor calls the executable program code stored in the memory to execute the circuit parameter calibration method disclosed in the first aspect of the present invention.

[0064] The fourth aspect of the present invention discloses a computer-storable medium storing computer instructions, which, when invoked, are used to execute the circuit parameter calibration method disclosed in the first aspect of the present invention.

[0065] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0066] In this embodiment of the invention, the current device under test (DUT) to be calibrated and the target calibration type for each DUT are determined. Based on the target calibration type for each DUT, calibration information corresponding to each DUT is determined. For each DUT, the circuit parameters in that DUT are calibrated according to the determined calibration information. Therefore, implementing this invention enables the calibration of different types of circuit parameters in multiple DUTs, which improves both the efficiency and accuracy of circuit parameter calibration. Attached Figure Description

[0067] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0068] Figure 1 This is a schematic diagram of the architecture of an automatic calibration device disclosed in an embodiment of the present invention;

[0069] Figure 2 This is a schematic flowchart of a circuit parameter calibration method disclosed in an embodiment of the present invention;

[0070] Figure 3 This is a flowchart illustrating a method for calibrating circuit parameters in a device under test, as disclosed in an embodiment of the present invention.

[0071] Figure 4 This is a flowchart illustrating another method for calibrating circuit parameters in a device under test, as disclosed in an embodiment of the present invention.

[0072] Figure 5 This is a flowchart illustrating another method for calibrating circuit parameters in a device under test, as disclosed in an embodiment of the present invention.

[0073] Figure 6 This is a schematic diagram of the structure of an automatic calibration device disclosed in an embodiment of the present invention;

[0074] Figure 7 This is a schematic diagram of another automatic calibration device disclosed in an embodiment of the present invention;

[0075] Figure 8 This is a schematic diagram of the structure of another automatic calibration device disclosed in an embodiment of the present invention. Detailed Implementation

[0076] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0077] The terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this invention are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, apparatus, product, or end that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or ends.

[0078] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0079] This invention discloses a method and automatic calibration device for calibrating circuit parameters. It calibrates different types of circuit parameters in multiple devices under test, improving both the efficiency and accuracy of circuit parameter calibration. These are described in detail below.

[0080] To better understand the circuit parameter calibration method and automatic calibration device disclosed in this invention, the architecture of the automatic calibration device is first described. Specifically, the schematic diagram of the automatic calibration device architecture can be shown as follows: Figure 1 As shown, Figure 1 This is a schematic diagram of the architecture of an automatic calibration device disclosed in an embodiment of the present invention. Figure 1As shown, the automatic calibration device may include a microcontroller. The automatic calibration device is used to calibrate the circuit parameters of all devices under test (DUTs). The DUTs can be multiple types of electronic devices, and the circuit parameters can be of multiple different types, such as voltage, current, and frequency. It should be noted that the automatic calibration device calibrates the circuit parameters in the DUTs in the following way: It determines the current DUT to be calibrated and the target calibration type for each current DUT; based on the target calibration type for each current DUT, it determines the calibration information corresponding to each current DUT; and for each current DUT, it calibrates the circuit parameters in that current DUT based on the determined calibration information. The target calibration type for each current DUT includes at least one calibration type from a calibration type set, which includes one or more of output signal calibration types, internal circuit calibration types, and input signal calibration types. This allows for the calibration of different types of circuit parameters in multiple DUTs, which improves both the efficiency and accuracy of circuit parameter calibration.

[0081] Optionally, the automatic calibration device may also include a signal detection circuit and a communication circuit. The signal detection circuit can be used to acquire or detect one or more of the circuit signals of the current device under test (DUT), and the communication circuit can be used for signal communication between the automatic calibration device and each current DUT.

[0082] Optionally, for each current device under test (DUT), the circuit parameters in the DUT are calibrated according to the determined calibration information corresponding to the current DUT. This may include: when the target calibration type of the current DUT includes an output signal calibration type, obtaining the first circuit signal currently output by the current DUT through a signal detection circuit, determining whether the first circuit signal currently output by the current DUT matches the first calibration signal included in the first calibration information corresponding to the current DUT, and if they do not match, analyzing the difference parameters between the first circuit signal currently output by the current DUT and the first calibration signal, and sending the difference parameters to the current DUT through a communication circuit, and continuing to trigger the operation of obtaining the first circuit signal currently output by the current DUT through the signal detection circuit and continuing to trigger the operation of determining whether the obtained first circuit signal currently output by the current DUT matches the first calibration signal included in the first calibration information corresponding to the current DUT, until the first circuit signal currently output by the current DUT matches the first calibration signal or the accumulated verification parameters meet the preset verification parameter conditions.

[0083] Optionally, for each current device under test (DUT), the circuit parameters in the DUT are calibrated according to the determined calibration information. This may include: when the target calibration type of the DUT includes a proprietary circuit calibration type, acquiring a second circuit signal collected for the DUT through a signal detection circuit, and sending the second circuit signal to the DUT through a communication circuit to trigger the DUT to perform a matching self-adjustment operation and provide feedback on the adjustment result signal; receiving the adjustment result signal and determining whether the DUT has completed the adjustment based on the adjustment result signal; if so, determining that the calibration operation corresponding to the proprietary circuit calibration type has been completed for the circuit parameters in the DUT.

[0084] Optionally, the automatic calibration device may further include a signal generation circuit and a channel switching circuit. The signal generation circuit generates the signal to be sent to the device under test (DUT), and the channel switching circuit performs a circuit switching operation to switch the signal acquisition circuit to a signal acquisition circuit for acquiring circuit signals corresponding to the remaining target calibration types and / or to a signal acquisition circuit for acquiring circuit signals corresponding to the remaining target calibration types of the DUT.

[0085] Optionally, for each current device under test (DUT), the circuit parameters in the DUT are calibrated according to the determined calibration information. This may include: when the target calibration type of the DUT includes an input signal calibration type, the signal generation circuit sends a circuit signal matching the calibration signal type to the DUT according to the calibration signal type included in the third calibration information corresponding to the DUT, thereby triggering the DUT to send a feedback signal upon receiving the circuit signal matching the calibration signal type; receiving the feedback signal sent by the DUT, determining whether the feedback signal matches the circuit signal matching the calibration signal type sent to the DUT; if so, determining that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the DUT; if not, calculating the offset parameter between the feedback signal and the circuit signal matching the calibration signal type sent to the DUT, and sending the offset parameter to the DUT to trigger the DUT to perform a self-adjustment operation matching the offset parameter.

[0086] Optionally, for any target calibration type of any current device under test, when the calibration operation corresponding to the target calibration type is completed for the current device under test, it is determined whether there are any remaining target calibration types for the current device under test that have not yet undergone corresponding calibration operations. If so, a first circuit switching operation is performed through the channel switching circuit to switch to the signal acquisition circuit for acquiring the circuit signals corresponding to the remaining target calibration types; and / or, when the calibration operations corresponding to all target calibration types are completed for the current device under test, it is determined whether there are any remaining devices under test. If so, a second circuit switching operation is performed through the channel switching circuit to switch to the signal acquisition circuit for acquiring the circuit signals corresponding to the target calibration types of the remaining devices under test.

[0087] Optionally, the automatic calibration device may also include a power supply circuit, a display circuit, and a button circuit. The power supply circuit can be connected to an external power adapter to access AC220 mains power and supply power to the automatic calibration device; the display circuit may include a display screen and a display screen driver, which can be used to display the current calibration status of each device under test; the button circuit may include buttons, which can be used to manually set the corresponding calibration steps and calibration values.

[0088] It should be noted that, Figure 1 The scenario architecture shown is only to illustrate the architecture of the automatic calibration device. The microcontroller, signal detection circuit, communication circuit, signal generation circuit, channel switching circuit, power supply circuit, display circuit, and button circuit involved are also only schematically shown. The specific structure, size, shape, location, and installation method can be adapted to the actual scenario. Figure 1 The scenario architecture shown is not limited in this respect.

[0089] The architecture of the automatic calibration equipment has been described above. The following section provides a detailed description of a circuit parameter calibration method and the automatic calibration equipment.

[0090] Example 1

[0091] Please see Figure 2 , Figure 2 This is a schematic flowchart of a circuit parameter calibration method disclosed in an embodiment of the present invention. Wherein, Figure 2 The described circuit parameter calibration method can be applied to circuit parameter calibration equipment, as well as to cloud servers or local servers for circuit parameter-based calibration; this embodiment of the invention does not limit the application. Figure 2 As shown, the calibration method for this circuit parameter may include the following operations:

[0092] 101. Determine the current device under test to be calibrated and the target calibration type for each current device under test.

[0093] In this embodiment of the invention, optionally, the number of current devices under test to be calibrated can be one or more, and this embodiment of the invention does not limit this. Optionally, the number of target calibration types for each current device under test can be one or more, and this embodiment of the invention does not limit this. Thus, by having multiple current devices under test to be calibrated and multiple target calibration types for each current device under test, the efficiency of calibrating the circuit parameters in each device under test can be improved.

[0094] In an optional embodiment, before determining the current device under test (DUT) to be calibrated and the target calibration type for each current DUT, the method further includes:

[0095] For each device under test (DUT), the system determines whether it has a target interface that can directly connect to the automatic calibration equipment. If the determination is yes, the signal acquisition circuit is switched to connect to the target interface of the DUT. If the determination is no, the system identifies the DUT that does not have a target interface and sends a reminder message to the DUT, triggering it to place its PCBA into a custom fixture to obtain the relevant target interface for connection to the automatic calibration equipment. It should be noted that PCBA stands for Printed Circuit Board Assembly, which is the entire process of a bare PCB board undergoing SMT component mounting and DIP insertion. In other words, a PCBA is a finished product of a PCB board; by assembling components onto a PCB, a PCBA is created.

[0096] 102. Determine the calibration information corresponding to each current device under test based on the target calibration type of each device under test.

[0097] In this embodiment of the invention, the target calibration type for each current device under test includes at least one calibration type from the calibration type set.

[0098] In this embodiment of the invention, optionally, the calibration information corresponding to each current device under test may include one or more of calibration circuit signals and calibration algorithms.

[0099] In this embodiment of the invention, optionally, the calibration information corresponding to each calibration type can be different from the calibration information corresponding to another calibration type.

[0100] 103. For each current device under test, calibrate the circuit parameters of the current device under test according to the calibration information corresponding to the current device under test.

[0101] In this embodiment of the invention, optionally, the circuit parameters in the current device under test are calibrated according to the determined calibration information. This calibration can be performed by one or more of the following: calibration steps, calibration circuit signals, and calibration algorithms corresponding to the current device under test.

[0102] As can be seen, the circuit parameter calibration method described in the embodiments of the present invention can determine the current device under test (DUT) to be calibrated and the target calibration type of each current DUT. Based on the target calibration type of each current DUT, calibration information corresponding to each current DUT is determined. For each current DUT, the circuit parameters in the current DUT are calibrated according to the determined calibration information. By calibrating different types of circuit parameters in multiple DUTs, the efficiency and accuracy of circuit parameter calibration can be improved.

[0103] In an optional embodiment, the calibration type set includes one or more of the following: output signal calibration type, proprietary circuit calibration type, and input signal calibration type.

[0104] In this optional embodiment, it should be noted that the output signal calibration type is the type of calibration performed on the signal output by the current device under test; the proprietary circuit calibration type is the type of calibration performed on the circuit signal of the current device under test; and the input signal calibration type is the type of calibration performed on the signal input to the current device under test.

[0105] As can be seen, the set of calibration types in this optional embodiment includes one or more of output signal calibration types, proprietary circuit calibration types, and input signal calibration types, which can help improve the efficiency of calibrating the circuit parameters in each current device under test.

[0106] In another alternative embodiment, such as Figure 3 As shown, Figure 3 This is a flowchart illustrating a method for calibrating circuit parameters in a device under test (DUT) according to an embodiment of the present invention. For each DUT, the circuit parameters are calibrated based on the determined calibration information corresponding to that DUT, including:

[0107] 1031. When the target calibration type of the current device under test includes the output signal calibration type, obtain the first circuit signal currently output by the current device under test.

[0108] In this optional embodiment, the acquisition of the first circuit signal currently output by the device under test (DUT) may be based on the target calibration type of the DUT. Further optionally, the first circuit signal may be one or more of a voltage value, a current value, and a waveform, wherein the waveform may be one of a rectangular wave, a triangular wave, or a sine wave.

[0109] 1032. Determine whether the first circuit signal currently output by the current device under test matches the first calibration signal included in the first calibration information corresponding to the current device under test.

[0110] In this optional embodiment, when it is determined that the first circuit signal currently output by the current device under test does not match the first calibration signal included in the first calibration information corresponding to the current device under test, step 1033 is triggered; when it is determined that the first circuit signal currently output by the current device under test matches the first calibration signal included in the first calibration information corresponding to the current device under test, step 1034 is triggered.

[0111] 1033. Analyze the difference parameters between the first circuit signal currently output by the device under test and the first calibration signal, and send the difference parameters to the device under test.

[0112] In this optional embodiment, the difference parameter is used to trigger the current device under test to perform a self-adjustment operation that matches the difference parameter in order to adjust the first circuit signal currently output by the current device under test, wherein the first calibration information is calibration information that matches the calibration type of the output signal.

[0113] In this optional embodiment, after the difference parameters are sent to the current device under test, step 1031 is triggered again until the first circuit signal currently output by the current device under test matches the first calibration signal or the cumulative verification parameters meet the preset verification parameter conditions.

[0114] In this optional embodiment, the difference parameter can optionally be the difference or ratio between the first circuit signal and the first calibration signal. Optionally, the matching of the first circuit signal currently output by the device under test with the first calibration signal can be defined as the first circuit signal and the first calibration signal being equal; the cumulative verification parameter of the first circuit signal and the first calibration signal currently output by the device under test satisfying a preset verification parameter condition can be defined as the difference parameter between the first circuit signal and the first calibration signal being less than a preset verification parameter threshold.

[0115] 1034. Determine that the calibration operation corresponding to the output signal calibration type has been completed for the circuit parameters in the current device under test.

[0116] In this optional embodiment, optionally, for example, when the target calibration type of the current device under test includes an output signal calibration type and the first calibration signal included in the first calibration information corresponding to the current device under test is a 50Hz first rectangular wave with a low point of 0V and a high point of 5V, the first circuit signal currently output by the current device under test is obtained. The first circuit signal is a second rectangular wave that starts from 0V, increases by one millivolt every millisecond, and ends at 6V. It is determined whether the first rectangular wave and the second rectangular wave match. If they do not match, the difference parameter between the first rectangular wave and the second rectangular wave is calculated and the difference parameter is sent to the current device under test so that the current device under test calibrates the device parameters according to the difference parameter and re-outputs the second rectangular wave until the first rectangular wave and the second rectangular wave match or the accumulated verification parameters meet the preset verification parameter conditions.

[0117] In this optional embodiment, when it is determined that the number of times the first circuit signal currently output by the current device under test does not match the first calibration signal included in the first calibration information corresponding to the current device under test is greater than or equal to a preset target number, a prompt message is sent to the current device under test. The prompt message is used to remind the current device under test or the personnel corresponding to the current device under test that the circuit in the current device under test is abnormal and needs further inspection. The preset target number can be 3 times.

[0118] As can be seen, implementing this optional embodiment can, when the target calibration type of the current device under test includes an output signal calibration type, acquire the first circuit signal currently output by the current device under test, and determine whether the first circuit signal matches the first calibration signal included in the first calibration information corresponding to the current device under test. If they match, it is determined that the calibration operation corresponding to the output signal calibration type has been completed for the circuit parameters in the current device under test. If they do not match, the difference parameters between the first circuit signal and the first calibration signal are analyzed, and the difference parameters are sent to the current device under test. The operation of acquiring the first circuit signal currently output by the current device under test and determining whether the acquired first circuit signal currently output by the current device under test matches the first calibration signal is continued until the first circuit signal currently output by the current device under test matches the first calibration signal or the accumulated verification parameters meet the preset verification parameter conditions. This can help improve the accuracy of calibrating the circuit parameters of multiple current devices under test and improve the efficiency of calibrating the circuit parameters of multiple current devices under test.

[0119] In another alternative embodiment, such as Figure 4 As shown, Figure 4This is a flowchart illustrating another method for calibrating circuit parameters in a device under test (DUT) according to an embodiment of the present invention. For each DUT, the circuit parameters are calibrated based on the determined calibration information corresponding to that DUT, including:

[0120] 1035. When the target calibration type of the current device under test includes the self-circuit calibration type, acquire the second circuit signal collected for the current device under test.

[0121] In this optional embodiment, the acquired second circuit signal is optionally obtained according to the target calibration type of the current device under test. Further optionally, the second circuit signal can be one or more of a voltage value, a current value, and a waveform, wherein the waveform can be one of a rectangular wave, a triangular wave, or a sine wave.

[0122] 1036. Send the second circuit signal to the current device under test to trigger the current device under test to perform a matching self-adjustment operation and feed back the adjustment result signal.

[0123] In this optional embodiment, the current device under test performs a matching self-tuning operation, including:

[0124] The device under test (DUT) performs a content update operation on the calibration object included in the second calibration information corresponding to the DUT based on the second circuit signal.

[0125] The content update operation is used to update the content of the object to be calibrated to the second circuit signal or to update the content corresponding to the object to be calibrated to the calculation result obtained by calculating the second circuit information based on the calibration algorithm included in the second calibration information.

[0126] In this optional embodiment, the object to be calibrated may be one or more of the following: voltage value, current value, and waveform.

[0127] By sending the second circuit signal to the current device under test (DUT) to trigger the DUT to perform a content update operation on the calibration object included in the second calibration information corresponding to the current DUT based on the second circuit signal, it is beneficial to improve the accuracy of updating the circuit parameters corresponding to the proprietary circuit calibration type in the current DUT, and also to improve the efficiency of updating the circuit parameters corresponding to the proprietary circuit calibration type in the current DUT.

[0128] 1037. Receive the adjustment result signal sent by the current device under test, and determine whether the current device under test has been adjusted based on the adjustment result signal.

[0129] 1038. When it is determined from the adjustment result signal that the current device under test has been adjusted, the calibration operation corresponding to the self-circuit calibration type is completed for the circuit parameters in the current device under test.

[0130] In this optional embodiment, when it is determined from the adjustment result signal that the current device under test has been adjusted, the adjustment result signal can be an output completion signal, which indicates that the current device under test has completed the self-adjustment operation according to the content included in the second calibration information.

[0131] In this optional embodiment, if it is determined from the adjustment result signal that the current device under test has not been adjusted, steps 1035-1037 are re-executed until it is determined from the adjustment result signal that the current device under test has been adjusted.

[0132] In this optional embodiment, optionally, for example, when the target calibration type of the current device under test includes proprietary circuit calibration and the current device under test needs to calibrate a voltage divider circuit consisting of two resistors connected in series, the input power supply voltage of 5V and a preset voltage divider point are used as the input detection points of the current device under test, and the voltages of the two input detection points are acquired. The preset voltage divider point can be a half-voltage divider point. When the acquired actual power supply voltage is 5.02V and the actual voltage divider point voltage is 2.48V, the actual... The power supply voltage and the actual voltage divider point voltage are sent to the device under test (DUT) to trigger the DUT to calculate the actual power supply voltage and the actual voltage divider point voltage according to the calibration algorithm included in the second calibration information. The calibration algorithm can be to calculate the ratio between the actual power supply voltage and the actual voltage divider point voltage, i.e., 5.02 / 2.48 = 2.024194, and update the calibration object in the DUT according to the obtained ratio, i.e., update the original theoretical value of 2 times to the calculated value of 2.024194 times.

[0133] In this optional embodiment, optionally, for example, when the target calibration type of the current device under test includes the proprietary circuit calibration type and the current device under test needs to calibrate the reference voltage 5V, the reference voltage 5V is used as the input detection point, and the actual voltage of the current device under test is obtained; if the obtained actual voltage of the current device under test is 5.02V, the obtained 5.02V is sent to the current device under test to trigger the current device under test to replace the reference voltage 5V with 5.02V.

[0134] As can be seen, implementing this optional embodiment enables the acquisition of a second circuit signal collected from the current device under test (DUT) when the target calibration type of the current DUT includes a proprietary circuit calibration type. This second circuit signal is then sent to the current DUT to trigger a matching self-adjustment operation and feedback of the adjustment result signal. The system receives the adjustment result signal from the current DUT and determines whether the current DUT has completed the adjustment based on the signal. If so, it confirms that the calibration operation corresponding to the proprietary circuit calibration type has been completed for the circuit parameters in the current DUT. This improves both the accuracy and efficiency of updating the circuit parameters corresponding to the proprietary circuit calibration type in the current DUT.

[0135] In yet another alternative embodiment, such as Figure 5 As shown, Figure 5 This is a flowchart illustrating another method for calibrating circuit parameters in a device under test (DUT) according to an embodiment of the present invention. For each DUT, the circuit parameters are calibrated based on the determined calibration information corresponding to that DUT, including:

[0136] 1039. When the target calibration type of the current device under test includes the input signal calibration type, a circuit signal matching the calibration signal type is sent to the current device under test according to the calibration signal type included in the third calibration information corresponding to the current device under test, so as to trigger the current device under test to send a feedback signal upon receiving the circuit signal matching the calibration signal type.

[0137] In this optional embodiment, the circuit signal sent by the current device under test that matches the calibration signal type can be one or more of voltage value, current value, and waveform, wherein the waveform can be one of rectangular wave, triangular wave, and sine wave.

[0138] 10310. Receive the feedback signal sent by the current device under test, and determine whether the feedback signal matches the circuit signal sent to the current device under test that matches the type of calibration signal.

[0139] In this optional embodiment, when it is determined that the feedback signal matches the circuit signal that it sends to the current device under test and that matches the type of calibration signal, step 10311 is triggered; when it is determined that the feedback signal does not match the circuit signal that it sends to the current device under test and that matches the type of calibration signal, step 10312 is triggered.

[0140] 10311. Determine that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the current device under test.

[0141] 10312. Calculate the offset parameter between the feedback signal and the circuit signal sent to the current device under test that matches the type of calibration signal.

[0142] In this optional embodiment, the offset parameter may be the difference or ratio between the feedback signal and the circuit signal sent to the current device under test that matches the type of calibration signal.

[0143] 10313. Send the offset parameters to the current device under test to trigger the current device under test to perform a self-adjustment operation that matches the offset parameters.

[0144] In this optional embodiment, after sending the offset parameter to the current device under test to trigger the current device under test to perform a self-adjustment operation that matches the offset parameter, steps 1039-10310 are re-executed until it is determined that the feedback signal matches the circuit signal that it sends to the current device under test that matches the type of calibration signal.

[0145] In this optional embodiment, when it is determined that the number of times the feedback signal does not match the circuit signal sent to the current device under test that matches the type of calibration signal is greater than or equal to a preset target number, a prompt message is sent to the current device under test. The prompt message is used to remind the current device under test or the personnel corresponding to the current device under test that the circuit in the current device under test is abnormal and needs further inspection. The preset target number can be 3 times.

[0146] In this optional embodiment, optionally, for example, when the target calibration type of the current device under test includes the proprietary circuit calibration type and the signal to be calibrated is a 50Hz rectangular wave with a low point of 0V and a high point of 5V, a third rectangular wave is sent to the current device under test, increasing by one millivolt every millisecond from 0V to 6V, and the rectangular wave is sent to the current device under test. A fourth rectangular wave is received from the current device under test, and it is determined whether the third and fourth rectangular waves match. If they match, it is determined that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the current device under test; if they do not match, the third rectangular wave is calculated... The offset parameter between the rectangular wave and the fourth rectangular wave is sent to the current device under test (DUT) to trigger the DUT to perform a self-adjustment operation matching the offset parameter. The DUT then re-executes the operation of sending a circuit signal matching the calibration signal type to the DUT based on the calibration signal type included in the third calibration information corresponding to the DUT. This triggers the DUT to send a feedback signal upon receiving the circuit signal matching the calibration signal type and to re-execute the operation of receiving the feedback signal sent by the DUT and determining whether the feedback signal matches the circuit signal matching the calibration signal type sent to the DUT.

[0147] As can be seen, implementing this optional embodiment enables the sending of a circuit signal matching the calibration signal type to the current device under test (DUT) when the target calibration type includes an input signal calibration type, based on the calibration signal type included in the third calibration information corresponding to the DUT. This triggers the DUT to send a feedback signal upon receiving the circuit signal matching the calibration signal type. The system receives the feedback signal and determines whether it matches the circuit signal matching the calibration signal type sent to the DUT. If they match, it confirms that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the DUT. If they do not match, it calculates the offset parameter between the third and fourth rectangular waves and sends the offset parameter to the DUT. This triggers the current device under test (DUT) to perform a self-adjustment operation matching the offset parameters, and re-executes the sending of a circuit signal matching the calibration signal type to the current DUT based on the calibration signal type included in the third calibration information corresponding to the current DUT. This triggers the current DUT to send a feedback signal upon receiving the circuit signal matching the calibration signal type, and re-executes the receiving of the feedback signal sent by the current DUT, determining whether the feedback signal matches the circuit signal matching the calibration signal type sent to the current DUT. This can improve the accuracy of updating the circuit parameters corresponding to the input signal type in the current DUT, and can also improve the efficiency of updating the circuit parameters corresponding to the input signal calibration type in the current DUT.

[0148] In yet another optional embodiment, the method further includes:

[0149] For any target calibration type of any current device under test, when the calibration operation corresponding to that target calibration type is completed for the current device under test, it is determined whether there are any remaining target calibration types for the current device under test that have not yet undergone corresponding calibration operations. If it is determined that there are remaining target calibration types, a first circuit switching operation is performed to switch the signal acquisition circuit to a signal acquisition circuit used to acquire the circuit signals corresponding to the remaining target calibration types; and / or,

[0150] For any current device under test, when all calibration operations corresponding to the target calibration type have been performed for the current device under test, it is determined whether there are any remaining devices under test. If it is determined that there are any remaining devices under test, a second circuit switching operation is performed to switch the signal acquisition circuit to the signal acquisition circuit used to acquire the circuit signal corresponding to the target calibration type of the remaining devices under test, wherein there are calibration operations that have not been completed for the remaining devices under test.

[0151] In this optional embodiment, if it is determined that there are no remaining target calibration types, an operation to determine whether there are any remaining devices under test is performed. Alternatively, if it is determined that there are no remaining devices under test, this process can be terminated.

[0152] In this optional embodiment, for example, when the target calibration type of the current device under test is the output signal calibration type and the current device under test has completed the output signal calibration type, it is determined whether there are any remaining target calibration types for the current device under test that have not yet performed the corresponding calibration operation. When it is determined that the remaining target calibration type of the current device under test is the proprietary circuit calibration type, a first circuit switching operation is performed to switch the signal acquisition circuit to the signal acquisition circuit used to acquire the circuit signal corresponding to the proprietary circuit calibration type.

[0153] In this optional embodiment, for example, when the current device under test has completed the calibration operation corresponding to all target calibration types and it is determined that there are remaining devices under test, and the target calibration type of the remaining devices under test is the input signal calibration type, a second circuit switching operation is performed to switch the signal acquisition circuit to the signal acquisition circuit used to acquire the circuit signal corresponding to the input signal calibration type of the remaining devices under test.

[0154] As can be seen, implementing this optional embodiment can perform a first circuit switching operation when it is determined that there are remaining target calibration types in the current device under test, so as to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the remaining target calibration type, and / or perform a second circuit switching operation when it is determined that there are remaining devices under test, so as to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the target calibration type of the remaining devices under test. This can calibrate the circuit parameters of different calibration types in multiple devices under test, which can help improve the efficiency of calibrating the circuit parameters of different calibration types in multiple devices under test.

[0155] Example 3

[0156] Please see Figure 6 , Figure 6 This is a schematic diagram of the structure of an automatic calibration device disclosed in an embodiment of the present invention. Figure 6 As shown, the automatic calibration device may include:

[0157] Microcontroller 201 is used to determine the current device under test to be calibrated and the target calibration type for each current device under test.

[0158] The microcontroller 201 is also configured to determine calibration information corresponding to each current device under test based on the target calibration type of each current device under test, wherein the target calibration type of each current device under test includes at least one calibration type in a set of calibration types.

[0159] The microcontroller 201 is also used to calibrate the circuit parameters of each current device under test based on the calibration information corresponding to that current device under test.

[0160] It is evident that implementation Figure 6 The described apparatus can determine the current device under test (DUT) to be calibrated and the target calibration type for each current DUT, determine calibration information corresponding to each current DUT based on the target calibration type, and calibrate the circuit parameters in each current DUT according to the determined calibration information. By calibrating different types of circuit parameters in multiple DUTs, it is beneficial to improve the efficiency and accuracy of circuit parameter calibration.

[0161] In an optional embodiment, the calibration type set includes one or more of the following: output signal calibration type, proprietary circuit calibration type, and input signal calibration type.

[0162] As can be seen, the set of calibration types in this optional embodiment includes one or more of output signal calibration types, proprietary circuit calibration types, and input signal calibration types, which can help improve the efficiency of calibrating the circuit parameters in each current device under test.

[0163] In another alternative embodiment, such as Figure 7 As shown, the automatic calibration device also includes a signal detection circuit 202 and a communication circuit 203;

[0164] For each device under test (DUT), the microcontroller 201 calibrates the circuit parameters of the DUT based on the determined calibration information, including the following methods:

[0165] When the target calibration type of the current device under test includes the output signal calibration type, the first circuit signal currently output by the current device under test is obtained through the signal detection circuit 202.

[0166] The system determines whether the first circuit signal currently output by the device under test (DUT) matches the first calibration signal included in the first calibration information corresponding to the DUT. If a mismatch is found, the system analyzes the difference parameter between the first circuit signal currently output by the DUT and the first calibration signal. The difference parameter is then sent to the DUT via the communication circuit 203. The system continues to trigger the operation of acquiring the first circuit signal currently output by the DUT via the signal detection circuit 202 and the operation of determining whether the first circuit signal currently output by the DUT matches the first calibration signal included in the first calibration information corresponding to the DUT, until the first circuit signal currently output by the DUT matches the first calibration signal or the accumulated verification parameters meet the preset verification parameter conditions. The difference parameter is used to trigger the DUT to perform a self-adjustment operation matching the difference parameter to adjust the first circuit signal currently output by the DUT. The first calibration information is calibration information matching the output signal calibration type.

[0167] When it is determined that the first circuit signal currently output by the device under test matches the first calibration signal, it is determined that the calibration operation corresponding to the output signal calibration type has been completed for the circuit parameters in the device under test.

[0168] It is evident that implementation Figure 7 The described device can acquire the first circuit signal currently output by the current device under test (DUT) when the target calibration type of the current DUT includes an output signal calibration type, and determine whether the first circuit signal matches the first calibration signal included in the first calibration information corresponding to the current DUT. If they match, it determines that the calibration operation corresponding to the output signal calibration type has been completed for the circuit parameters in the current DUT. If they do not match, it analyzes the difference parameter between the first circuit signal and the first calibration signal, sends the difference parameter to the current DUT, and continues to trigger the operation of acquiring the first circuit signal currently output by the current DUT and determining whether the acquired first circuit signal currently output by the current DUT matches the first calibration signal, until the first circuit signal currently output by the current DUT matches the first calibration signal or the accumulated verification parameters meet the preset verification parameter conditions. This can help improve the accuracy of calibrating the circuit parameters of multiple current DUTs and improve the efficiency of calibrating the circuit parameters of multiple current DUTs.

[0169] In yet another alternative embodiment, such as Figure 7 As shown, the automatic calibration device also includes a signal detection circuit 202 and a communication circuit 203;

[0170] For each device under test (DUT), the microcontroller 201 calibrates the circuit parameters of the DUT based on the determined calibration information, including the following methods:

[0171] When the target calibration type of the current device under test includes the proprietary circuit calibration type, the second circuit signal collected for the current device under test is obtained through the signal detection circuit 202.

[0172] The second circuit signal is sent to the current device under test via the communication circuit 203 to trigger the current device under test to perform a matching self-adjustment operation and feed back the adjustment result signal;

[0173] The communication circuit 203 receives the adjustment result signal sent by the current device under test, and determines whether the current device under test has been adjusted based on the adjustment result signal. When it is determined that the current device under test has been adjusted based on the adjustment result signal, it is determined that the calibration operation corresponding to the self-circuit calibration type has been completed for the circuit parameters in the current device under test.

[0174] The device under test performs a matching self-adjustment operation, including:

[0175] The device under test (DUT) performs a content update operation on the calibration object included in the second calibration information corresponding to the DUT based on the second circuit signal.

[0176] The content update operation is used to update the content of the object to be calibrated to the second circuit signal or to update the content corresponding to the object to be calibrated to the calculation result obtained by calculating the second circuit information based on the calibration algorithm included in the second calibration information.

[0177] It is evident that implementation Figure 7 The described apparatus, when the target calibration type of the current device under test (DUT) includes a proprietary circuit calibration type, acquires a second circuit signal collected from the DUT and sends the second circuit signal to the DUT to trigger the DUT to perform a matching self-adjustment operation and provide feedback an adjustment result signal. It also receives the adjustment result signal from the DUT and determines whether the DUT has completed adjustment based on the signal. If so, it confirms that the calibration operation corresponding to the proprietary circuit calibration type has been completed for the circuit parameters in the DUT. This improves both the accuracy and efficiency of updating the circuit parameters corresponding to the proprietary circuit calibration type in the DUT.

[0178] In yet another alternative embodiment, such as Figure 7As shown, the automatic calibration device also includes a communication circuit 203 and a signal generation circuit 204;

[0179] For each device under test (DUT), the microcontroller 201 calibrates the circuit parameters of the DUT based on the determined calibration information, including the following methods:

[0180] When the target calibration type of the current device under test includes the input signal calibration type, the signal generation circuit 204 sends a circuit signal that matches the calibration signal type included in the third calibration information corresponding to the current device under test to the current device under test, so as to trigger the current device under test to send a feedback signal upon receiving the circuit signal that matches the calibration signal type.

[0181] The communication circuit 203 receives the feedback signal sent by the current device under test and determines whether the feedback signal matches the circuit signal sent to the current device under test that matches the type of calibration signal.

[0182] When it is determined that the feedback signal matches the circuit signal sent to the current device under test that matches the calibration signal type, it is confirmed that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the current device under test.

[0183] It is evident that implementation Figure 7 The described apparatus, when the target calibration type of the current device under test (DUT) includes an input signal calibration type, sends a circuit signal to the DUT via a signal generation circuit that matches the calibration signal type included in the third calibration information corresponding to the DUT. This triggers the DUT to send a feedback signal upon receiving the circuit signal that matches the calibration signal type. The apparatus receives the feedback signal via a communication circuit and determines whether the feedback signal matches the circuit signal that the DUT sent to the DUT that matches the calibration signal type. If they match, it is determined that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the DUT. This improves both the accuracy and efficiency of calibrating the circuit parameters in the DUT.

[0184] In yet another alternative embodiment, such as Figure 7 As shown, for each current device under test, the microcontroller 201 calibrates the circuit parameters of the current device under test based on the determined calibration information corresponding to that device, further including:

[0185] When the target calibration type of the current device under test includes the input signal calibration type, and when it is determined that the feedback signal does not match the circuit signal sent to the current device under test that matches the calibration signal type, the offset parameter between the feedback signal and the circuit signal sent to the current device under test that matches the calibration signal type is calculated.

[0186] The offset parameter is sent to the device under test (DUT) via communication circuit 203 to trigger the DUT to perform a self-adjustment operation matching the offset parameter. The circuit signal generation circuit 204 then sends a circuit signal to the DUT that matches the calibration signal type included in the third calibration information corresponding to the DUT. This triggers the DUT to send a feedback signal upon receiving the circuit signal that matches the calibration signal type. The circuit signal generation circuit 203 then receives the feedback signal sent by the DUT and determines whether the feedback signal matches the circuit signal that the DUT sent to the DUT that matches the calibration signal type.

[0187] It is evident that implementation Figure 7 The described apparatus, when the target calibration type of the current device under test (DUT) includes an input signal calibration type, sends a circuit signal matching the calibration signal type to the DUT according to the calibration signal type included in the third calibration information corresponding to the current DUT. This triggers the DUT to send a feedback signal upon receiving the circuit signal matching the calibration signal type. The apparatus receives the feedback signal sent by the DUT, determines whether the feedback signal matches the circuit signal matching the calibration signal type sent to the DUT, and if they do not match, calculates an offset parameter and sends the offset parameter to the DUT to trigger the DUT to perform a self-adjustment operation matching the offset parameter. This improves the accuracy of updating the circuit parameters corresponding to the input signal type in the current DUT and the efficiency of updating the circuit parameters corresponding to the input signal calibration type in the current DUT.

[0188] In yet another alternative embodiment, such as Figure 7 As shown, the automatic calibration device also includes a channel switching circuit 205;

[0189] The microcontroller 201 is further configured to, for any target calibration type of any current device under test, after completing the calibration operation corresponding to the target calibration type for the current device under test, determine whether there are any remaining target calibration types for the current device under test for which the corresponding calibration operation has not been performed; if it is determined that there are remaining target calibration types, perform a first circuit switching operation through the channel switching circuit 205 to switch the signal acquisition circuit to a signal acquisition circuit used to acquire the circuit signal corresponding to the remaining target calibration type; and / or,

[0190] The microcontroller 201 is also configured to, for any current device under test, determine whether there are any remaining devices under test after all calibration operations corresponding to the target calibration types have been performed for the current device under test. When it is determined that there are remaining devices under test, a second circuit switching operation is performed through the channel switching circuit 205 to switch the signal acquisition circuit to the signal acquisition circuit used to acquire the circuit signal corresponding to the target calibration type of the remaining devices under test, wherein there are calibration operations that have not been completed for the remaining devices under test.

[0191] It is evident that implementation Figure 7 The described apparatus is capable of performing a first circuit switching operation when it is determined that there are remaining target calibration types in the current device under test, to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the remaining target calibration type, and / or performing a second circuit switching operation when it is determined that there are remaining devices under test, to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the target calibration type of the remaining devices under test. It is capable of calibrating circuit parameters of different calibration types in multiple devices under test, which can help improve the efficiency of calibrating circuit parameters of different calibration types in multiple devices under test.

[0192] Example 4

[0193] Please see Figure 8 , Figure 8 This is a schematic diagram of the structure of another automatic calibration device disclosed in an embodiment of the present invention. For example... Figure 8 As shown, the automatic calibration device may include:

[0194] Memory 301 storing executable program code;

[0195] Processor 302 coupled to memory 301;

[0196] The processor 302 calls the executable program code stored in the memory 301 to execute the steps in the circuit parameter calibration method described in Embodiment 1 or Embodiment 2 of the present invention.

[0197] Example 5

[0198] This invention discloses a computer-storable medium storing computer instructions. When these computer instructions are invoked, they are used to execute the steps in the circuit parameter calibration method described in Embodiment 1 or Embodiment 2 of this invention.

[0199] Example 6

[0200] This invention discloses a computer program product, which includes a non-transitory computer-readable storage medium storing a computer program, and the computer program is operable to cause a computer to perform the steps in the calibration method for circuit parameters described in Embodiment 1 or Embodiment 2.

[0201] The device embodiments described above are merely illustrative. The modules described as separate components may or may not be physically separate. The components shown as modules may or may not be physical modules; that is, they may be located in one place or distributed across multiple network modules. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.

[0202] Through the detailed description of the above embodiments, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, including read-only memory (ROM), random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), one-time programmable read-only memory (OTPROM), electrically-Erasable Programmable Read-Only Memory (EEPROM), compact disc read-only memory (CD-ROM) or other optical disc storage, disk storage, magnetic tape storage, or any other computer-readable medium that can be used to carry or store data.

[0203] Finally, it should be noted that the circuit parameter calibration method and automatic calibration device disclosed in the embodiments of the present invention are merely preferred embodiments of the present invention and are only used to illustrate the technical solutions of the present invention, not to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for calibrating circuit parameters, characterized in that, The method includes: Determine the current device under test to be calibrated and the target calibration type for each of the current devices under test; Based on the target calibration type of each current device under test, calibration information corresponding to each current device under test is determined, wherein the target calibration type of each current device under test includes at least one calibration type in the calibration type set; For each device under test, the circuit parameters of the device under test are calibrated according to the calibration information corresponding to the determined device under test. The set of calibration types includes one or more of the following: output signal calibration type, proprietary circuit calibration type, and input signal calibration type. Furthermore, the method further includes: For any target calibration type of any current device under test, when the calibration operation corresponding to the target calibration type is completed for the current device under test, it is determined whether there are any remaining target calibration types for the current device under test that have not yet undergone corresponding calibration operations. If it is determined that there are remaining target calibration types, a first circuit switching operation is performed to switch the signal acquisition circuit to a signal acquisition circuit used to acquire the circuit signal corresponding to the remaining target calibration type; and / or, For any of the current devices under test, when all calibration operations corresponding to the target calibration types have been performed for the current devices under test, it is determined whether there are any remaining devices under test. When it is determined that there are any remaining devices under test, a second circuit switching operation is performed to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the target calibration type of the remaining devices under test, wherein the remaining devices under test have calibration operations that have not been completed.

2. The method for calibrating circuit parameters according to claim 1, characterized in that, For each of the current devices under test (DUTs), the step of calibrating the circuit parameters of the DUT based on the determined calibration information includes: When the target calibration type of the current device under test includes the output signal calibration type, the first circuit signal currently output by the current device under test is obtained; The system determines whether the first circuit signal currently output by the device under test (DUT) matches the first calibration signal included in the first calibration information corresponding to the DUT. If a mismatch is found, the system analyzes the difference parameter between the first circuit signal currently output by the DUT and the first calibration signal, sends the difference parameter to the DUT, and continues to trigger the operation of acquiring the first circuit signal currently output by the DUT and the operation of determining whether the first circuit signal currently output by the DUT matches the first calibration signal included in the first calibration information corresponding to the DUT, until the first circuit signal currently output by the DUT matches the first calibration signal or the accumulated verification parameters meet the preset verification parameter conditions. The difference parameter is used to trigger the DUT to perform a self-adjustment operation matching the difference parameter to adjust the first circuit signal currently output by the DUT. The first calibration information is calibration information matching the output signal calibration type. When it is determined that the first circuit signal currently output by the device under test matches the first calibration signal, it is determined that the calibration operation corresponding to the output signal calibration type has been completed for the circuit parameters in the device under test.

3. The method for calibrating circuit parameters according to claim 1, characterized in that, For each of the current devices under test (DUTs), the step of calibrating the circuit parameters of the DUT based on the determined calibration information includes: When the target calibration type of the current device under test includes the proprietary circuit calibration type, acquire the second circuit signal collected for the current device under test; The second circuit signal is sent to the current device under test to trigger the current device under test to perform a matching self-adjustment operation and feed back the adjustment result signal; Receive the adjustment result signal sent by the current device under test, and determine whether the current device under test has been adjusted based on the adjustment result signal. When it is determined that the current device under test has been adjusted based on the adjustment result signal, determine that the calibration operation corresponding to the proprietary circuit calibration type has been performed on the circuit parameters in the current device under test. The device under test performs a matching self-adjustment operation, including: The device under test (DUT) performs a content update operation on the calibration object included in the second calibration information corresponding to the DUT based on the second circuit signal. The content update operation is used to update the content of the object to be calibrated to the second circuit signal or to update the content corresponding to the object to be calibrated to the calculation result obtained by calculating the second circuit signal based on the calibration algorithm included in the second calibration information.

4. The method for calibrating circuit parameters according to claim 1, characterized in that, For each of the current devices under test (DUTs), the step of calibrating the circuit parameters of the DUT based on the determined calibration information includes: When the target calibration type of the current device under test includes the input signal calibration type, a circuit signal matching the calibration signal type is sent to the current device under test according to the calibration signal type included in the third calibration information corresponding to the current device under test, so as to trigger the current device under test to send a feedback signal upon receiving the circuit signal matching the calibration signal type. Receive the feedback signal sent by the current device under test, and determine whether the feedback signal matches the circuit signal that it sends to the current device under test that matches the type of the calibration signal; When it is determined that the feedback signal matches a circuit signal sent to the current device under test that matches the calibration signal type, it is determined that the calibration operation corresponding to the input signal calibration type has been completed for the circuit parameters in the current device under test.

5. The method for calibrating circuit parameters according to claim 4, characterized in that, For each of the current devices under test (DUTs), the step of calibrating the circuit parameters of the DUT based on the determined calibration information corresponding to the current DUT further includes: When the target calibration type of the current device under test includes the input signal calibration type, and when it is determined that the feedback signal does not match the circuit signal sent to the current device under test that matches the calibration signal type, the offset parameter between the feedback signal and the circuit signal sent to the current device under test that matches the calibration signal type is calculated. The offset parameter is sent to the current device under test (DUT) to trigger the DUT to perform a self-adjustment operation matching the offset parameter. The DUT then re-executes the operation of sending a circuit signal matching the calibration signal type to the DUT based on the calibration signal type included in the third calibration information corresponding to the DUT. This triggers the DUT to send a feedback signal upon receiving the circuit signal matching the calibration signal type, and re-executes the operation of receiving the feedback signal sent by the DUT and determining whether the feedback signal matches the circuit signal matching the calibration signal type it sent to the DUT.

6. An automatic calibration device, characterized in that, The automatic calibration device is used to perform the calibration method for circuit parameters as described in any one of claims 1-5, and the automatic calibration device comprises: A microcontroller is used to determine the current device under test to be calibrated and the target calibration type for each of the current devices under test; The microcontroller is further configured to determine calibration information corresponding to each current device under test based on the target calibration type of each current device under test, wherein the target calibration type of each current device under test includes at least one calibration type in a set of calibration types; The microcontroller is also configured to calibrate the circuit parameters in each current device under test according to the determined calibration information corresponding to the current device under test; The set of calibration types includes one or more of the following: output signal calibration type, proprietary circuit calibration type, and input signal calibration type. The automatic calibration device also includes a channel switching circuit; The microcontroller is further configured to, for any target calibration type of any current device under test, when the calibration operation corresponding to the target calibration type has been completed for the current device under test, determine whether there are any remaining target calibration types for the current device under test for which the corresponding calibration operation has not been performed; if it is determined that there are remaining target calibration types, perform a first circuit switching operation through the channel switching circuit to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the remaining target calibration type; and / or, The microcontroller is further configured to, for any current device under test, determine whether there are any remaining devices under test after all calibration operations corresponding to the target calibration types have been performed for the current device under test; if it is determined that there are remaining devices under test, perform a second circuit switching operation through the channel switching circuit to switch the signal acquisition circuit to a signal acquisition circuit for acquiring the circuit signal corresponding to the target calibration type of the remaining devices under test, wherein the remaining devices under test have calibration operations that have not been completed.

7. An automatic calibration device, characterized in that, The automatic calibration device includes: Memory containing executable program code; A processor coupled to the memory; The processor calls the executable program code stored in the memory to execute the circuit parameter calibration method as described in any one of claims 1-5.

8. A computer storage medium, characterized in that, The computer storage medium stores computer instructions, which, when invoked, are used to execute the calibration method for circuit parameters as described in any one of claims 1-5.

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