Fault determination method, fault determination device, medium, and electronic device

Abstract

The present disclosure relates to the technical field of communication, in particular to a fault judgment method, a fault judgment device, a computer readable storage medium, an electronic device and a computer program product, comprising: obtaining light receiving power time sequence data corresponding to a plurality of optical channels of an optical module; extracting the light receiving power time sequence data corresponding to the plurality of optical channels respectively by using a window with a first window length to obtain a plurality of first light receiving power sub-data corresponding to each optical channel; for any first light receiving power sub-data, in the case that the first light receiving power sub-data meets the corresponding fitting requirements, fitting a plurality of sampling data points in the first light receiving power sub-data to obtain a power drop parameter and a trust parameter corresponding to the power drop parameter; and determining a fault risk of an optical module at the other end according to any power drop parameter and the corresponding trust parameter. Through the technical scheme of the embodiment of the present disclosure, the problem of how to identify a faulty optical module in the related art can be solved.

Description

Technical Field

[0001] This disclosure relates to the field of communication technology, and more specifically, to fault diagnosis methods, fault diagnosis devices, computer-readable storage media, electronic devices, and computer program products. Background Technology

[0002] With the rapid development of software and hardware, the internet is being used in increasingly wider fields. To meet the demands for high bandwidth and low latency, fiber optic cables are typically used for communication to improve efficiency. When using fiber optic cables, optical modules can be used to convert optical signals into photoelectric signals. These modules can be installed on various devices to enable communication between them (such as servers, switches, routers, etc.).

[0003] When using optical fiber for communication, optical modules can fail. In related technologies, after an optical module fails, an engineer needs to locate the faulty module and repair or replace it to ensure the normal operation of the optical fiber communication.

[0004] However, when an optical module fails, it can cause network port transmission errors, resulting in unmet user service needs and impacting the user experience. Furthermore, locating, repairing, or replacing faulty optical modules requires significant manpower and resources, making it difficult to address faulty optical modules in a timely manner.

[0005] It should be noted that the information disclosed in the background section above is only used to enhance the understanding of the background of this disclosure, and therefore may include information that does not constitute related technology known to those skilled in the art. Summary of the Invention

[0006] The purpose of this disclosure is to provide a fault diagnosis method, a fault diagnosis device, a computer-readable storage medium, an electronic device, and a computer program product, which can solve the problem of how to identify faulty optical modules in related technologies.

[0007] Other features and advantages of this disclosure will become apparent from the following detailed description, or may be learned in part from practice of this disclosure.

[0008] According to a first aspect of this disclosure, a fault diagnosis method is provided, comprising: acquiring received optical power timing data corresponding to multiple optical channels of an optical module; wherein the optical module has a corresponding peer optical module; extracting received optical power timing data corresponding to multiple optical channels using a window of a first window length to obtain multiple first received optical power sub-data for each optical channel; wherein the first received optical power sub-data includes multiple sampling data points, the sampling data points being used to indicate the received optical power and the timestamp corresponding to the received optical power; for any first received optical power sub-data, if the first received optical power sub-data satisfies the corresponding fitting requirements, fitting the multiple sampling data points within the first received optical power sub-data to obtain a power drop parameter and a confidence parameter corresponding to the power drop parameter; and determining the fault risk of the peer optical module based on any power drop parameter and the corresponding confidence parameter.

[0009] Optionally, based on the aforementioned scheme, the fitting requirements include: the number of samples of the sampling data points within the first received optical power sub-data is greater than or equal to a first threshold, wherein the first threshold is less than the product of the number of samples per unit time and the number of samples per unit time included in the first received optical power sub-data.

[0010] Optionally, based on the aforementioned scheme, fitting multiple sampling data points within the first received optical power sub-data includes: determining first received optical power time-series data, wherein the first received optical power time-series data is received optical power time-series data associated with the first received optical power sub-data; counting the number of first sub-data; wherein the number of first sub-data is the number of first received optical power sub-data whose sampling data point count is greater than or equal to a first threshold among the multiple first received optical power sub-data included in the first received optical power time-series data; when the number of first sub-data is greater than a second threshold, fitting multiple sampling data points within the first received optical power sub-data; wherein the second threshold is less than the number of second sub-data; wherein the number of second sub-data is the number of multiple first received optical power sub-data included in the first received optical power time-series data.

[0011] Optionally, based on the aforementioned scheme, the failure risk of the peer optical module is determined according to any power drop parameter and the corresponding trust parameter, including: when the absolute value of the power drop parameter is greater than the third threshold and the absolute value of the trust parameter is greater than the fourth threshold, it is determined that the peer optical module has a failure risk.

[0012] Optionally, based on the aforementioned scheme, when the absolute value of the power drop parameter is greater than the third threshold and the absolute value of the trust parameter is greater than the fourth threshold, it is determined that the peer optical module has a fault risk, including: when the power drop parameter is less than the third threshold and the trust parameter is less than the fourth threshold, determining that the first received optical power sub-data associated with the power drop parameter is risky sub-data; obtaining the number of third sub-data; wherein, the number of third sub-data is the number of risky sub-data among the multiple first received optical power sub-data included in the first received optical power time-series data associated with the power drop parameter; when the number of third sub-data is greater than or equal to the fifth threshold, it is determined that the peer optical module has a fault risk.

[0013] Optionally, based on the aforementioned scheme, the failure risk of the peer optical module is determined according to any power degradation parameter and the corresponding trust parameter, including: determining a first evaluation result of the peer optical module based on the power degradation parameter and the trust parameter; wherein the first evaluation result is used to indicate the failure risk of the peer optical module; extracting the received optical power timing data corresponding to multiple optical channels using a window of a second window length to obtain multiple second received optical power sub-data for each optical channel; wherein the second received optical power sub-data includes multiple sampling data points, the sampling data points are used to indicate the received optical power and the timestamp corresponding to the received optical power, and the first window length is different from the second window length; determining a second evaluation result of the peer optical module based on any second received optical power sub-data; wherein the second evaluation result is used to indicate the failure risk of the peer optical module; and determining the failure risk of the peer optical module based on the first evaluation result and the second evaluation result.

[0014] Optionally, based on the aforementioned scheme, the second evaluation result of the peer optical module is determined according to any second received optical power sub-data, including: for any second received optical power sub-data, if the second received optical power sub-data meets the corresponding fitting requirements, fitting multiple sampling data points in the second received optical power sub-data to obtain a power drop parameter and a confidence parameter corresponding to the power drop parameter; and determining the second evaluation result based on the power drop parameter obtained for any second received optical power sub-data and the corresponding confidence parameter.

[0015] According to a second aspect of this disclosure, a fault diagnosis device is provided, comprising: a power timing data acquisition unit configured to acquire received optical power timing data corresponding to multiple optical channels of an optical module; wherein the optical module has a corresponding peer optical module; a received optical power sub-data division unit configured to extract received optical power timing data corresponding to multiple optical channels using a window of a first window length, to obtain multiple first received optical power sub-data corresponding to each optical channel; wherein the first received optical power sub-data includes multiple sampling data points, the sampling data points being used to indicate the received optical power and the timestamp corresponding to the received optical power; a parameter acquisition unit configured to, for any first received optical power sub-data, if the first received optical power sub-data satisfies the corresponding fitting requirements, fit multiple sampling data points within the first received optical power sub-data to obtain a power drop parameter and a trust parameter corresponding to the power drop parameter; and a risk determination unit configured to determine the fault risk of the peer optical module based on any power drop parameter and the corresponding trust parameter.

[0016] According to a third aspect of this disclosure, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the fault judgment method of the first aspect in the above embodiments.

[0017] According to a fourth aspect of this disclosure, an electronic device is provided, comprising:

[0018] Processor; and

[0019] The memory is used to store one or more programs, which, when executed by one or more processors, enable the one or more processors to implement the fault judgment method of the first aspect in the above embodiments.

[0020] According to a fifth aspect of this disclosure, a computer program product is provided, including a computer program / instructions, characterized in that the computer program / instructions, when executed by a processor, implement the fault judgment method of the first aspect in the above embodiments.

[0021] The technical solutions provided in this disclosure may have the following beneficial effects:

[0022] In one embodiment of the fault judgment method provided by this disclosure, the received optical power timing data corresponding to multiple optical channels of an optical module can be obtained. The received optical power timing data corresponding to multiple optical channels is extracted by using a window of the first window length to obtain multiple first received optical power sub-data corresponding to each optical channel. For any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points in the first received optical power sub-data are fitted to obtain power drop parameters and trust parameters corresponding to the power drop parameters. Based on any power drop parameter and the corresponding trust parameter, the fault risk of the peer optical module is determined.

[0023] The embodiments disclosed herein, on the one hand, can determine whether there is a risk of failure in the peer optical module based on the received optical power of the optical module, and take corresponding measures to handle the optical module before the failure occurs, so as to avoid the problem of not being able to meet the user's usage needs after the failure occurs; on the other hand, it can repair or replace the faulty optical module in a timely manner without spending a lot of manpower and resources to locate the faulty optical module, thus ensuring the continuity of user services.

[0024] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0025] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure. It is obvious that the drawings described below are merely some embodiments of this disclosure, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. In the drawings:

[0026] Figure 1 The schematic diagram illustrates an exemplary system architecture of the fault determination method in an exemplary embodiment of the present disclosure;

[0027] Figure 2 A flowchart illustrating a fault determination method in an exemplary embodiment of this disclosure is shown schematically.

[0028] Figure 3 This schematic diagram illustrates the received power timing data corresponding to the optical channel of the optical module in an exemplary embodiment of the present disclosure.

[0029] Figure 4 This schematic diagram illustrates how, in an exemplary embodiment of the present disclosure, a window of the first window length is used to extract the received optical power timing data corresponding to multiple optical channels, thereby obtaining multiple first received optical power sub-data corresponding to each optical channel.

[0030] Figure 5This schematically illustrates a flowchart of fitting multiple sampling data points within the first received optical power sub-data when the number of first sub-data points is greater than a second threshold, in an exemplary embodiment of this disclosure.

[0031] Figure 6 This schematically illustrates a flowchart of determining the risk of failure of the peer optical module when the number of third sub-data is greater than or equal to a fifth threshold in an exemplary embodiment of this disclosure;

[0032] Figure 7 This schematically illustrates a flowchart of determining the failure risk of the peer optical module based on a first evaluation result and a second evaluation result in an exemplary embodiment of this disclosure;

[0033] Figure 8 This schematically illustrates a flowchart of an exemplary embodiment of the present disclosure, in which a second evaluation result is determined based on a power drop parameter obtained for any second received optical power sub-data and a corresponding confidence parameter;

[0034] Figure 9 This schematically illustrates how, in an exemplary embodiment of the present disclosure, the received optical power timing data corresponding to multiple optical channels are extracted to obtain multiple first received optical power sub-data corresponding to each optical channel.

[0035] Figure 10 The illustration shows a schematic diagram of using windows of different lengths to extract multiple received optical power timing data to obtain multiple received optical power sub-data in an exemplary embodiment of this disclosure, and displays a schematic diagram of power drop parameters;

[0036] Figure 11 This illustration schematically shows an exemplary embodiment of the present disclosure in which multiple optical power timing data corresponding to multiple optical channels are extracted and multiple optical power sub-data are displayed, and power drop parameters are shown.

[0037] Figure 12 The schematic diagram illustrates a system architecture in an exemplary embodiment of the present disclosure;

[0038] Figure 13 This schematic diagram illustrates the composition of a fault determination apparatus according to an exemplary embodiment of the present disclosure;

[0039] Figure 14 The schematic diagram illustrates a structural schematic of a computer system suitable for implementing an electronic device according to exemplary embodiments of the present disclosure. Detailed Implementation

[0040] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, they are provided so that this disclosure will be more comprehensive and complete, and will fully convey the concept of the exemplary embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of embodiments of this disclosure. However, those skilled in the art will recognize that the technical solutions of this disclosure can be practiced without one or more of the specific details, or other methods, components, apparatuses, steps, etc., may be employed. In other instances, well-known structures, methods, apparatuses, implementations, materials, or operations are not shown or described in detail to avoid obscuring various aspects of this disclosure.

[0041] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities can be implemented in software, or in one or more software-hardened modules, or in different network and / or processor devices and / or microcontroller devices.

[0042] Figure 1 A schematic diagram of an exemplary system architecture to which the fault diagnosis method of the present disclosure embodiments can be applied is shown.

[0043] like Figure 1 As shown, system architecture 1000 may include one or more of terminal devices 1001, 1002, and 1003, network 1004, and server 1005. Network 1004 is used as a medium to provide a communication link between terminal devices 1001, 1002, and 1003 and server 1005. Network 1004 may include various connection types, such as wired or wireless communication links or fiber optic cables, etc.

[0044] It should be understood that Figure 1 The number of terminal devices, networks, and servers shown is merely illustrative. Depending on implementation needs, any number of terminal devices, networks, and servers can be included. For example, server 1005 could be a server cluster composed of multiple servers.

[0045] Users can use terminal devices 1001, 1002, and 1003 to interact with server 1005 via network 1004 to receive or send messages, etc. Terminal devices 1001, 1002, and 1003 can be various electronic devices with displays, including but not limited to smartphones, tablets, laptops, and desktop computers. Additionally, server 1005 can be a server providing various services.

[0046] In one embodiment, the execution entity of the fault judgment method disclosed herein may be a server 1005. The server 1005 can acquire the received optical power timing data corresponding to multiple optical channels of the optical module sent by the terminal devices 1001, 1002, and 1003, and extract the received optical power timing data corresponding to the multiple optical channels using a window of the first window length to obtain multiple first received optical power sub-data for each optical channel. For any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points within the first received optical power sub-data are fitted to obtain a power drop parameter and a trust parameter corresponding to the power drop parameter. Based on any power drop parameter and the corresponding trust parameter, the fault risk of the peer optical module is determined.

[0047] Furthermore, the fault determination method disclosed herein can also be implemented jointly by terminal devices 1001, 1002, and 1003 and server 1005. For example, terminal devices 1001, 1002, and 1003 can acquire received optical power timing data corresponding to multiple optical channels of the optical module, and then send the received optical power timing data corresponding to multiple optical channels of the optical module to server 1005. This allows server 1005 to extract the received optical power timing data corresponding to multiple optical channels using a window of the first window length, obtaining multiple first received optical power sub-data for each optical channel. For any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points within the first received optical power sub-data are fitted to obtain power drop parameters and corresponding trust parameters. Based on any power drop parameter and the corresponding trust parameter, the fault risk of the peer optical module is determined.

[0048] With the rapid development of software and hardware, the internet is being used in increasingly wider fields. To meet the demands for high bandwidth and low latency, fiber optic cables are typically used for communication to improve efficiency. When using fiber optic cables, optical modules can be used to convert optical signals into photoelectric signals. These modules can be installed on various devices to enable communication between them (such as servers, switches, routers, etc.).

[0049] When using optical fiber for communication, optical modules can fail. In related technologies, after an optical module fails, an engineer needs to locate the faulty module and repair or replace it to ensure the normal operation of the optical fiber communication.

[0050] However, when an optical module fails, it can cause network port transmission errors, resulting in unmet user service needs and impacting the user experience. Furthermore, locating, repairing, or replacing faulty optical modules requires significant manpower and resources, making it difficult to address faulty optical modules in a timely manner.

[0051] According to the fault judgment method provided in this exemplary embodiment, the received optical power timing data corresponding to multiple optical channels of the optical module can be obtained. The received optical power timing data corresponding to multiple optical channels is extracted by using a window of the first window length to obtain multiple first received optical power sub-data corresponding to each optical channel. For any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points in the first received optical power sub-data are fitted to obtain the power drop parameter and the trust parameter corresponding to the power drop parameter. Based on any power drop parameter and the corresponding trust parameter, the fault risk of the peer optical module is determined.

[0052] like Figure 2 As shown, the fault diagnosis method may include the following steps S210 to S240:

[0053] Step S210: Obtain the received optical power timing data corresponding to multiple optical channels of the optical module; wherein, the optical module has a corresponding peer optical module;

[0054] Step S220: Extract the received optical power timing data corresponding to multiple optical channels using a window of the first window length to obtain multiple first received optical power sub-data for each optical channel; wherein, the first received optical power sub-data includes multiple sampling data points, and the sampling data points are used to indicate the received optical power and the timestamp corresponding to the received optical power;

[0055] Step S230: For any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, fit multiple sampling data points in the first received optical power sub-data to obtain the power drop parameter and the confidence parameter corresponding to the power drop parameter.

[0056] Step S240: Determine the failure risk of the peer optical module based on any power drop parameter and the corresponding trust parameter.

[0057] In the embodiments of this disclosure, received optical power timing data corresponding to multiple optical channels of an optical module can be obtained. The received optical power timing data corresponding to multiple optical channels are extracted using a window of the first window length to obtain multiple first received optical power sub-data for each optical channel. For any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points within the first received optical power sub-data are fitted to obtain a power drop parameter and a trust parameter corresponding to the power drop parameter. Based on any power drop parameter and the corresponding trust parameter, the fault risk of the peer optical module is determined.

[0058] The steps S210 to S240 of the fault judgment method in this exemplary embodiment will now be described in more detail with reference to the accompanying drawings and embodiments.

[0059] Step S210: Obtain the received optical power timing data corresponding to multiple optical channels of the optical module; wherein, the optical module has a corresponding peer optical module;

[0060] In one example embodiment of this disclosure, received optical power timing data corresponding to multiple optical channels of an optical module is acquired. Specifically, the optical module may include multiple optical channels, and different channels may be used to carry different optical signals. The received optical power timing data corresponding to an optical channel can be acquired by a receiver in the optical module, wherein the received optical power refers to the power of the light emitted by the optical signal transmitter of the peer optical module. Specifically, the received optical power timing data corresponding to an optical channel can be used to indicate the received optical power of that optical channel within a preset time period and the acquisition time corresponding to that received optical power.

[0061] In one example embodiment of this disclosure, the received optical power timing data corresponding to multiple optical channels of the optical module can be obtained through server monitoring. For example, optical module performance data can be obtained through the server, which includes the received optical power corresponding to multiple optical channels of the optical module. The received optical power timing data corresponding to multiple optical channels of the optical module can be obtained through the received optical power corresponding to multiple optical channels of the optical module.

[0062] It should be noted that this disclosure does not impose any special limitations on the specific method for obtaining the received optical power timing data corresponding to multiple optical channels of the optical module.

[0063] In one example embodiment of this disclosure, the optical module may include 4 optical channels or 8 optical channels.

[0064] It should be noted that this disclosure does not impose any special limitation on the number of optical channels in the optical module.

[0065] In one example embodiment of this disclosure, the optical module has a corresponding peer optical module. Specifically, the peer optical module refers to an optical module that transmits optical signals through its transmitter, and the peer optical module has the same number of optical channels as the aforementioned optical module.

[0066] In one example embodiment of this disclosure, the peer optical module corresponding to an optical module can be determined through the optical module itself. For example, optical module asset information of multiple network devices can be obtained. The optical module asset information may include the model and identity information of the optical module, the model and identity information of the network devices, and the connection relationship between the ports of the network devices. The peer optical module corresponding to an optical module can be determined through the optical module asset information.

[0067] It should be noted that this disclosure does not impose any special limitations on the specific method by which the optical module determines the corresponding peer optical module.

[0068] For example, such as Figure 3 As shown, the received optical power timing data (6 days) corresponding to the four optical channels of the optical module can be obtained.

[0069] Step S220: Extract the received optical power timing data corresponding to multiple optical channels using a window of the first window length to obtain multiple first received optical power sub-data corresponding to each optical channel;

[0070] In one exemplary embodiment of this disclosure, after obtaining the received optical power timing data corresponding to multiple optical channels of the optical module through the above steps, the received optical power timing data corresponding to the multiple optical channels can be extracted separately using a window of the first window length to obtain multiple first received optical power sub-data for each optical channel. The first received optical power sub-data includes multiple sampling data points, which are used to indicate the received optical power and the timestamp corresponding to the received optical power. Specifically, the unit of the first window length can include a time unit, which can be used to divide the received optical power timing data corresponding to the multiple optical channels into multiple first received optical power sub-data.

[0071] It should be noted that this disclosure does not impose any special limitations on the specific method of extracting the received optical power timing data corresponding to multiple optical channels using a window of the first window length to obtain multiple first received optical power sub-data corresponding to each optical channel.

[0072] For example, such as Figure 4 As shown, the received optical power timing data corresponding to the 4 optical channels is the received optical power timing data corresponding to the 4 optical channels with a duration of 6 days. At this time, the first window length can be set to 3 days, that is, the received optical power timing data corresponding to the 4 optical channels can be divided into 8 first received optical power sub-data 401 using the first window length.

[0073] In one example embodiment of this disclosure, the first received optical power sub-data includes multiple sampling data points, which are used to indicate the received optical power and the timestamp corresponding to the collected optical power. For example, the sampling data point is: 11:38 AM on February 22, 2022, -1.6 dBm (decibel relative to one milliwatt).

[0074] Step S230: For any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, fit multiple sampling data points in the first received optical power sub-data to obtain the power drop parameter and the confidence parameter corresponding to the power drop parameter.

[0075] In one exemplary embodiment of this disclosure, after obtaining multiple first received optical power sub-data points corresponding to each optical channel through the above steps, for any first received optical power sub-data point, provided that the first received optical power sub-data point meets the corresponding fitting requirements, multiple sampling data points within the first received optical power sub-data point can be fitted to obtain a power drop parameter and a confidence parameter corresponding to the power drop parameter. It should be noted that this disclosure does not specifically limit the content of the fitting requirements. Specifically, the power drop parameter corresponding to the first received optical power sub-data point can be used to indicate the rate at which the received optical power of the optical module's channel decreases over time. The larger the absolute value of the power drop parameter corresponding to the first received optical power sub-data point, the faster the received optical power of the optical module's channel decreases over time. The trust parameter of the first received optical power sub-data is used to indicate the reliability of the power drop parameter corresponding to the first received optical power. That is, the trust parameter of the first received optical power sub-data can be used to indicate the stability of the drop in received optical power of the optical module channel. If the stability of the drop in received optical power of the optical module channel is high, it means that the reliability of the fitted power drop parameter is high, that is, the absolute value of the trust parameter of the first received optical power sub-data is large. If the stability of the drop in received optical power of the optical module channel is low, it means that the reliability of the fitted power drop parameter is low, that is, the absolute value of the trust parameter of the first received optical power sub-data is small.

[0076] In one exemplary embodiment of this disclosure, multiple sampled data points within the first received optical power sub-data can be fitted to obtain a power drop parameter and a corresponding confidence parameter. Specifically, linear fitting can be used to fit multiple sampled data points within the first received optical power sub-data to obtain the power drop parameter and confidence parameter corresponding to the first received optical power sub-data. More specifically, the received optical power and the corresponding timestamp within the first received optical power sub-data can be fitted. For example, the least squares method can be used to fit multiple sampled data points within the first received optical power sub-data to obtain the power drop parameter and confidence parameter corresponding to the first received optical power sub-data.

[0077] For example, the power drop parameter corresponding to the first received optical power sub-data ranges from positive infinity to negative infinity, and the trust parameter of the first received optical power sub-data ranges from -1 to +1.

[0078] It should be noted that this disclosure does not impose any special limitations on the specific method of fitting multiple sampled data points within the first received optical power sub-data to obtain the power drop parameter and the corresponding confidence parameter.

[0079] Step S240: Determine the failure risk of the peer optical module based on any power drop parameter and the corresponding trust parameter.

[0080] In one exemplary embodiment of this disclosure, after obtaining the power degradation parameter and the corresponding trust parameter through the above steps, the failure risk of the peer optical module can be determined based on any power degradation parameter and the corresponding trust parameter. Specifically, when the absolute value of the power degradation parameter corresponding to any first received optical power sub-data is large, and the absolute value of the trust parameter of the first received optical power sub-data is also large, it can be determined that the optical module corresponding to the first received optical power sub-data has a problem with receiving light, that is, the peer optical module corresponding to the optical module has a failure risk.

[0081] Specifically, a first parameter condition can be set for the power drop parameter of the first received optical power sub-data, and a second parameter condition can be set for the trust parameter of the first received optical power sub-data. When the power drop parameter of the first received optical power sub-data satisfies the first parameter condition and the trust parameter of the first received optical power sub-data satisfies the second parameter condition, it is determined that there is a problem with the optical module receiving light corresponding to the first received optical power sub-data, that is, there is a risk of failure in the peer optical module corresponding to the optical module.

[0082] Furthermore, multiple sampling data points within the multiple first received optical power sub-data obtained through the above steps can be fitted to obtain power degradation parameters and confidence parameters corresponding to the multiple first received optical power sub-data. Then, the failure risk of the peer optical module can be determined based on the power degradation parameters and confidence parameters corresponding to the multiple first received optical power sub-data. For example, it can be determined whether a first received optical power sub-data is a risky sub-data based on the power degradation parameters and confidence parameters corresponding to the first received optical power sub-data, and the number of risky sub-data can be counted. If the number of risky sub-data exceeds a preset number, it is determined that the peer optical module of the optical module has a failure risk, and the peer optical module needs to be repaired or replaced.

[0083] It should be noted that this disclosure does not impose any special limitations on the specific method for determining the failure risk of the peer optical module based on any power degradation parameter and the corresponding trust parameter.

[0084] In one exemplary embodiment of this disclosure, after extracting the received optical power timing data corresponding to multiple optical channels using a window of the first window length through the above steps to obtain multiple first received optical power sub-data for each optical channel, the sampling number of sampling data points within any first received optical power sub-data can be obtained. Specifically, the first threshold is less than the product of the sampling number per unit time and the number of times per unit time included within the first received optical power sub-data. The sampling number per unit time is N, and the number of times per unit time is M; that is, the first threshold is less than the product M·N of the sampling number per unit time and the number of times per unit time included within the first received optical power sub-data.

[0085] For example, if the unit of time is a day, the number of samples per day is 24, and the number of sampling days is 3, then the first threshold is less than the product of the number of samples per day and the number of sampling days, which is 72.

[0086] In one exemplary embodiment of this disclosure, fitting can be performed on multiple sampled data points within the first received optical power sub-data when the number of samples is greater than or equal to a first threshold. Specifically, if the number of samples of the first received optical power sub-data is less than the first threshold, it indicates that the number of samples of the first received optical power sub-data is small, and the reference value of the first received optical power sub-data is not strong. Therefore, fitting is performed on multiple sampled data points within the first received optical power sub-data only when the number of samples is greater than or equal to the first threshold.

[0087] It should be noted that this disclosure does not impose any special limitations on the specific value of the first threshold.

[0088] By setting a first threshold, the first received optical power sub-data with a small number of samples can be discarded, thus avoiding the problem of poor reliability when determining the failure risk of the peer optical module using the first received optical power sub-data.

[0089] In one example embodiment of this disclosure, first received optical power time-series data can be determined. This first received optical power time-series data is received optical power time-series data associated with first received optical power sub-data. The number of first sub-data is counted. When the number of first sub-data is greater than a second threshold, multiple sampling data points within the first received optical power sub-data are fitted. (Refer to...) Figure 5 As shown, when the number of first sub-data points is greater than the second threshold, fitting multiple sampling data points within the first received optical power sub-data point may include the following steps S510 to S530:

[0090] Step S510: Determine the timing data of the first received optical power;

[0091] In one example embodiment of this disclosure, after sampling the number of sampling data points within the first received optical power sub-data in the above steps, the first received optical power timing data can be determined. The first received optical power timing data is the received optical power timing data associated with the first received optical power sub-data. Specifically, in the above steps, the received optical power timing data corresponding to multiple optical channels are extracted using a window of the first window length, resulting in multiple first received optical power sub-data corresponding to each optical channel. Therefore, the first received optical power timing data to which the first received optical power sub-data belongs can be determined through the first received optical power sub-data.

[0092] Step S520: Count the number of the first sub-data items;

[0093] In one example embodiment of this disclosure, after determining the first received optical power timing data through the above steps, the number of first sub-data points can be counted. The number of first sub-data points is the number of first received optical power sub-data points whose sample count is greater than or equal to a first threshold among the multiple first received optical power sub-data points included in the first received optical power timing data. Specifically, the sample count of sampled data points among the multiple first received optical power sub-data points included in the first received optical power timing data can be obtained using the method described in the above embodiment. The sample count of sampled data points among the multiple first received optical power sub-data points included in the first received optical power timing data is compared with the first threshold. If the sample count of sampled data points within the first received optical power sub-data points is greater than the first threshold, then a first sub-data point is accumulated. Appropriate processing is then performed on the multiple first received optical power sub-data points included in the first received optical power timing data to obtain the first sub-data point count.

[0094] It should be noted that this disclosure does not impose any special restrictions on the specific method for counting the number of first sub-data points.

[0095] Step S530: When the number of first sub-data points is greater than the second threshold, fit multiple sampling data points within the first received optical power sub-data.

[0096] In one exemplary embodiment of this disclosure, after obtaining the first sub-data quantity through the above steps, multiple sampling data points within the first received optical power sub-data can be fitted when the first sub-data quantity is greater than a second threshold. The second threshold is less than the second sub-data quantity, and the second sub-data quantity is the number of multiple first received optical power sub-data included in the first received optical power time-series data.

[0097] For example, the first received optical power time series data includes first received optical power sub-data A, first received optical power sub-data B, first received optical power sub-data C, and first received optical power sub-data D. That is, the number of second sub-data corresponding to the first received optical power time series data is 4. Among them, the number of sampling data points in the first received optical power sub-data A is greater than the first threshold, the number of sampling data points in the first received optical power sub-data B is greater than the first threshold, the number of sampling data points in the first received optical power sub-data C is greater than the first threshold, and the number of sampling data points in the first received optical power sub-data D is less than the first threshold. At this time, the number of first sub-data is 3, and the second threshold can be set to 2. At this time, the number of first sub-data is greater than the second threshold, and the multiple sampling data points in the first received optical power sub-data can be fitted.

[0098] Through the above steps S510 to S530, the first received optical power timing data can be determined, the number of first sub-data points can be counted, and when the number of first sub-data points is greater than a second threshold, multiple sampling data points within the first received optical power sub-data points are fitted. Through the embodiments of this disclosure, fitting is only performed on sampling data points within the first received optical power sub-data points when the number of reliable first received optical power sub-data points in the received optical power timing data is relatively large. This improves the reliability of power degradation parameters and trust parameters, thereby increasing the accuracy of judging the failure risk of the peer optical module.

[0099] In one example embodiment of this disclosure, a fault risk can be determined when the absolute value of the power drop parameter is greater than a third threshold and the absolute value of the trust parameter is greater than a fourth threshold.

[0100] For example, if the third threshold is 1.1, the fourth threshold is 0.5, the power drop parameter of the first received optical power sub-data is -1.6 dBm / day, the absolute value of the power drop parameter of the first received optical power sub-data is 1.6, the trust parameter of the first received optical power sub-data is -0.8, and the absolute value of the trust parameter of the first received optical power sub-data is 0.8, then the absolute value of the power drop parameter is greater than the third threshold and the absolute value of the trust parameter is greater than the fourth threshold. This indicates a potential fault risk in the peer optical module, requiring repair or replacement. Through the embodiments of this disclosure, the absolute value of the power drop parameter can be used to determine whether a fault risk exists in the peer optical module, thus improving the efficiency of fault risk determination.

[0101] In one example embodiment of this disclosure, when the power drop parameter is less than a third threshold and the trust parameter is less than a fourth threshold, the first received optical power sub-data associated with the power drop parameter can be determined as risk sub-data. The number of third sub-data items is then obtained. When the number of third sub-data items is greater than or equal to a fifth threshold, it is determined that the peer optical module has a fault risk. (Refer to...) Figure 6 As shown, when the number of third sub-data is greater than or equal to the fifth threshold, determining that the peer optical module has a fault risk may include the following steps S610 to S630:

[0102] Step S610: When the power drop parameter is less than the third threshold and the trust parameter is less than the fourth threshold, the first received optical power sub-data associated with the power drop parameter is determined to be risk sub-data.

[0103] Step S620: Obtain the number of third sub-data items;

[0104] In one exemplary embodiment of this disclosure, after obtaining the power drop parameter and the corresponding trust parameter in the first received optical power sub-data through the above steps, it is possible to determine whether the first received optical power sub-data is risky sub-data using a third threshold and a fourth threshold. The number of third sub-data refers to the number of risky sub-data among the multiple first received optical power sub-data included in the first received optical power time-series data associated with the power drop parameter. Specifically, when the power drop parameter is less than the third threshold and the trust parameter is less than the fourth threshold, the first received optical power sub-data associated with the power drop parameter is determined to be risky sub-data. The number of risky sub-data among the multiple first received optical power sub-data included in the first received optical power time-series data associated with the power drop parameter is counted, and this number is the number of third sub-data.

[0105] Step S630: When the number of third sub-data is greater than or equal to the fifth threshold, it is determined that there is a risk of failure in the peer optical module.

[0106] In one example embodiment of this disclosure, after obtaining the number of third sub-data points through the above steps, a fault risk can be determined for the peer optical module when the number of third sub-data points is greater than or equal to a fifth threshold. Specifically, if the number of risky sub-data points among the multiple first received optical power sub-data points included in the first received optical power time-series data associated with the power degradation parameter is greater than the fifth threshold, it indicates that multiple first received optical power sub-data points in the first received optical power time-series data associated with the power degradation parameter have problems, i.e., there is a problem with the received optical power of the optical module, and at this time, a fault risk can be determined for the peer optical module.

[0107] It should be noted that this disclosure does not impose any special limitations on the specific value of the fifth threshold.

[0108] Through the above steps S610 to S630, when the power drop parameter is less than the third threshold and the trust parameter is less than the fourth threshold, the first received optical power sub-data associated with the power drop parameter can be determined as risk sub-data. The number of third sub-data is then obtained. When the number of third sub-data is greater than or equal to the fifth threshold, it is determined that the peer optical module has a failure risk. Through the embodiments of this disclosure, the reliability of determining that the peer optical module has a failure risk can be improved.

[0109] In one example embodiment of this disclosure, a first evaluation result of the peer optical module can be determined based on power degradation parameters and trust parameters. A window of second window length is used to extract the received optical power timing data corresponding to multiple optical channels, obtaining multiple second received optical power sub-data for each optical channel. A second evaluation result of the peer optical module is determined based on any second received optical power sub-data. The failure risk of the peer optical module is determined based on the first and second evaluation results. (Refer to...) Figure 7 As shown, determining the failure risk of the peer optical module based on the first and second assessment results may include the following steps S710 to S740:

[0110] Step S710: Determine the first evaluation result of the peer optical module based on the power degradation parameter and the trust parameter; wherein, the first evaluation result is used to indicate the failure risk of the peer optical module;

[0111] In one exemplary embodiment of this disclosure, after obtaining the power degradation parameter and the trust parameter of the first received optical power sub-data through the above steps, a first evaluation result of the peer optical module can be determined based on the power degradation parameter and the trust parameter. Specifically, the first evaluation result can be used to indicate whether there is a fault risk in the peer optical module. For example, the first evaluation result may include that the peer optical module has a fault risk, that the peer optical module may have a fault risk, or that the peer optical module does not have a fault risk.

[0112] It should be noted that this disclosure does not impose any special restrictions on the specific form of the first assessment results.

[0113] Step S720: Extract the received optical power timing data corresponding to multiple optical channels using a window of the second window length to obtain multiple second received optical power sub-data corresponding to each optical channel;

[0114] In one exemplary embodiment of this disclosure, a window of second window length can be used to divide the received optical power timing data corresponding to multiple optical channels into multiple second received optical power sub-data for each optical channel. The second received optical power sub-data includes multiple sampling data points, which are used to indicate the received optical power and the corresponding timestamp. The first window length is different from the second window length. Specifically, the unit of the second window length can include a time unit, allowing for the extraction of the received optical power timing data corresponding to multiple optical channels separately using the time unit, resulting in multiple second received optical power sub-data for each optical channel.

[0115] In one example embodiment of this disclosure, the second received optical power sub-data includes multiple sampling data points, which are used to indicate the received optical power and the timestamp corresponding to the received optical power. For example, the sampling data point is: (February 22, 2022, 13:14, -1.5dBm).

[0116] Step S730: Determine the second evaluation result of the peer optical module based on any second received optical power sub-data;

[0117] In one exemplary embodiment of this disclosure, after obtaining multiple second received optical power sub-data corresponding to each optical channel through the above steps, a second evaluation result of the peer optical module can be determined based on any second received optical power sub-data. Specifically, the second evaluation result can be used to indicate whether there is a fault risk in the peer optical module. For example, the second evaluation result may include that the peer optical module has a fault risk, that the peer optical module may have a fault risk, or that the peer optical module does not have a fault risk.

[0118] It should be noted that this disclosure does not impose any special restrictions on the specific form of the second assessment results.

[0119] Step S740: Determine the failure risk of the peer optical module based on the first evaluation result and the second evaluation result.

[0120] In one example embodiment of this disclosure, the failure risk of the peer optical module can be determined based on the first evaluation result and the second evaluation result. Specifically, the failure risk of the peer optical module can be determined by combining the first evaluation result and the second evaluation result.

[0121] For example, if the first assessment result is that the peer optical module has a failure risk, and the second assessment result is that the peer optical module may have a failure risk, then it can be determined that the peer optical module has a failure risk; or, if the first assessment result is that the peer optical module may have a failure risk, and the second assessment result is that the peer optical module may have a failure risk, then it can be determined that the peer optical module has a failure risk; or, if the first assessment result is that the peer optical module has a failure risk, and the second assessment result is that the peer optical module does not have a failure risk, then it can be determined that the peer optical module does not have a failure risk.

[0122] It should be noted that this disclosure does not impose any special limitations on the specific method for determining the failure risk of the peer optical module based on the first assessment results and the second assessment results.

[0123] Through the steps S710-S740 described above, a first evaluation result for the peer optical module can be determined based on the power degradation parameter and the trust parameter. The received optical power timing data corresponding to multiple optical channels are extracted using a window of second window length, resulting in multiple second received optical power sub-data for each optical channel. A second evaluation result for the peer optical module is determined based on any second received optical power sub-data. The failure risk of the peer optical module is determined based on the first and second evaluation results. Through the embodiments of this disclosure, the presence of failure risk in the peer optical module can be judged by combining the received optical power sub-data divided by windows of different lengths, thus enhancing the reliability of the judgment results.

[0124] In one example embodiment of this disclosure, the received optical power timing data corresponding to multiple optical channels can be extracted using windows of different lengths to obtain multiple sets of received optical power sub-data corresponding to the optical channels. The evaluation result of the peer optical module corresponding to each set is determined based on the received optical power sub-data of each set, and the failure risk of the peer optical module is determined based on the evaluation results of the peer optical modules corresponding to multiple sets.

[0125] For example, time-series data of received optical power corresponding to multiple optical channels can be extracted using windows of different lengths to obtain multiple sets of second received optical power sub-data for N optical channels. Based on the multiple sets of second received optical power sub-data for the first set of optical channels, the first evaluation result of the peer optical module corresponding to that set is determined. Based on the multiple sets of second received optical power sub-data for the optical channels in the second set, the second evaluation result of the peer optical module corresponding to that set is determined. And based on the multiple sets of second received optical power sub-data for the optical channels in the Nth set, the Nth evaluation result of the peer optical module corresponding to that set is determined. Finally, the failure risk of the peer optical module is determined based on the first evaluation result, the second evaluation result, and so on, the Nth evaluation result. For example, the failure risk of the peer optical module can only be determined when the first evaluation result, the second evaluation result, and so on, all indicate a failure risk in the peer optical module.

[0126] In one example embodiment of this disclosure, for any second received optical power sub-data, provided that the second received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points within the second received optical power sub-data can be fitted to obtain a power drop parameter and a confidence parameter corresponding to the power drop parameter. Based on the power drop parameter obtained for any second received optical power sub-data and the corresponding confidence parameter, a second evaluation result is determined. (Refer to...) Figure 8 As shown, determining the second evaluation result based on the power drop parameter obtained for any second received optical power sub-data and the corresponding confidence parameter may include the following steps S810 to S820:

[0127] Step S810: For any second received optical power sub-data, if the second received optical power sub-data meets the corresponding fitting requirements, fit multiple sampling data points in the second received optical power sub-data to obtain the power drop parameter and the confidence parameter corresponding to the power drop parameter.

[0128] In one example embodiment of this disclosure, for any second received optical power sub-data, if the second received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points within the second received optical power sub-data can be fitted to obtain a power drop parameter and a corresponding confidence parameter. Specifically, the power drop parameter corresponding to the second received optical power sub-data can be used to indicate the rate at which the received optical power of the optical module's channel decreases over time. The larger the absolute value of the power drop parameter corresponding to the second received optical power sub-data, the faster the received optical power of the optical module's channel decreases over time. The power drop parameter corresponding to the second received optical power sub-data can also be used to indicate the stability of the decrease in the received optical power of the optical module's channel. If the stability of the decrease in the received optical power of the optical module's channel is high, it indicates that the confidence level of the fitted power drop parameter is high, i.e., the absolute value of the confidence parameter corresponding to the power drop parameter is large; if the stability of the decrease in the received optical power of the optical module's channel is low, it indicates that the confidence level of the fitted power drop parameter is low, i.e., the absolute value of the confidence parameter corresponding to the power drop parameter is small.

[0129] It should be noted that this disclosure does not impose any special limitations on the specific content of the fitting requirements.

[0130] In one exemplary embodiment of this disclosure, if the second received optical power sub-data satisfies the corresponding fitting requirements, multiple sampling data points within the second received optical power sub-data can be fitted to obtain a power drop parameter and a corresponding confidence parameter. Specifically, multiple sampling data points within the second received optical power sub-data can be fitted using linear fitting to obtain the power drop parameter and the corresponding confidence parameter. More specifically, the received optical power and the corresponding timestamp within the second received optical power sub-data can be fitted. For example, the least squares method can be used to fit multiple sampling data points within the second received optical power sub-data to obtain the power drop parameter and the corresponding confidence parameter.

[0131] It should be noted that this disclosure does not impose any special limitations on the specific method of fitting multiple sampled data points within the second received optical power sub-data to obtain the power drop parameter and the corresponding confidence parameter.

[0132] Step S820: Determine the second evaluation result based on the power drop parameter obtained for any second received optical power sub-data and the corresponding confidence parameter.

[0133] In one exemplary embodiment of this disclosure, after obtaining the power degradation parameter and the corresponding trust parameter through the above steps, a second evaluation result can be determined based on the power degradation parameter obtained for any second received optical power sub-data and the corresponding trust parameter. Specifically, the second evaluation result can be used to indicate whether there is a risk of failure in the peer optical module. For example, the second evaluation result may include whether the peer optical module has a risk of failure, whether the peer optical module may have a risk of failure, or whether the peer optical module does not have a risk of failure.

[0134] It should be noted that this disclosure does not impose any special restrictions on the specific form of the second assessment results.

[0135] Through the aforementioned steps S810-S820, for any second received optical power sub-data, provided that the second received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points within the second received optical power sub-data can be fitted to obtain a power drop parameter and a corresponding confidence parameter. Based on the power drop parameter obtained for any second received optical power sub-data and the corresponding confidence parameter, a second evaluation result is determined. Through the embodiments of this disclosure, the power drop parameter corresponding to the second received optical power sub-data and the confidence parameter of the second received optical power sub-data can be determined, improving the accuracy of the second evaluation result and thus strengthening the reliability of judging whether there is a fault risk in the peer optical module.

[0136] In one exemplary embodiment of this disclosure, time-series data of received optical power corresponding to multiple optical channels can be extracted using windows of different lengths to obtain multiple first received optical power sub-data corresponding to each optical channel. For example, such as Figure 9 As shown, the received optical power time series data corresponding to multiple optical channels are extracted using windows with lengths of 3 days, 2 days, and 1 day, respectively, to obtain multiple first received optical power sub-data 901, 902, and 903 corresponding to each optical channel.

[0137] In one example embodiment of this disclosure, different thresholds can be set for different window lengths. For example, as shown in the table below, the number of received optical power sub-data points refers to the number of multiple received optical power sub-data points, and the number of samples per day is 48.

[0138]

[0139] Furthermore, for shorter windows, a third threshold with a larger absolute value can be set to avoid frequently detecting data with severe fluctuations in received optical power; for longer windows, a third threshold with a smaller absolute value can be set to identify received optical power that has been slowly decreasing over a long period.

[0140] It should be noted that this disclosure does not impose any special limitations on the specific values ​​of each threshold.

[0141] like Figure 10 As shown, time-series data of received optical power for multiple optical channels are extracted using window lengths of 2 days, 5 days, and 10 days, respectively. This yields multiple received optical power sub-data sets for each optical channel. Data within each received optical power sub-data set is then fitted to obtain a power drop parameter and its corresponding confidence parameter. The power drop parameter is displayed (the figure shows the power drop parameter corresponding to the received optical power sub-data set, for example -0.6, in dBm / day). By dividing the received optical power sub-data into sub-data sets with different window lengths, a negative power drop parameter for a received optical power sub-data set of one optical channel of the optical module indicates a potential fault risk in the peer optical module.

[0142] like Figure 11As shown, a window with a length of 10 days is used to extract the received optical power time-series data corresponding to multiple optical channels, resulting in multiple received optical power sub-data for each optical channel. The data within the received optical power sub-data are then fitted to obtain the power drop parameter and the corresponding confidence parameter. The power drop parameter is displayed (the figure shows the power drop parameter corresponding to the received optical power sub-data, for example, -2.0, in dBm / day). It can be seen that the power drop parameters of multiple optical channels of the optical module are all negative, which indicates that there is a risk of failure in the optical module at the other end. For example, the port of the optical module is contaminated and needs to be cleaned.

[0143] In one exemplary embodiment of this disclosure, such as Figure 12 As shown, the monitoring server can receive the received optical power timing data corresponding to multiple optical channels of the optical module, and send the obtained received optical power timing data corresponding to multiple optical channels of the optical module to the database. The database processes the received optical power timing data corresponding to multiple optical channels of the optical module, and then sends the processed received optical power timing data corresponding to multiple optical channels of the optical module to the offline computing server cluster. The offline computing server cluster uses the scheme disclosed in this paper to determine the fault risk of the peer optical module, and returns the result to the database and displays it through the front-end page for the operators to handle accordingly.

[0144] Furthermore, the optical module can communicate with the network device to which it belongs via I2C (Inter-Integrated Circuit), and the network device can communicate with the monitoring server via Ethernet, for example, using SNMP (Simple Network Management Protocol) and GRPC (gRPCRemote Procedure Calls) communication protocols.

[0145] For example, the database can include a MySQL database or a Hive database. It should be noted that this disclosure does not impose any special restrictions on the type of database.

[0146] Furthermore, after receiving the received optical power timing data corresponding to multiple optical channels of the optical module through the database, data processing can be performed on the received optical power timing data corresponding to multiple optical channels of the optical module. For example, due to the complexity and heterogeneity of the network architecture, problems such as lost received optical power data and inability to find the corresponding peer optical module may occur. In this case, data cleaning can be performed to ensure data quality.

[0147] Furthermore, distributed computing engines such as MapReduce and Spark can be used to determine the failure risk of the peer optical module using the scheme disclosed herein.

[0148] In one embodiment of the fault judgment method provided by this disclosure, the received optical power timing data corresponding to multiple optical channels of an optical module can be obtained. The received optical power timing data corresponding to multiple optical channels is extracted by using a window of the first window length to obtain multiple first received optical power sub-data corresponding to each optical channel. For any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, multiple sampling data points in the first received optical power sub-data are fitted to obtain power drop parameters and trust parameters corresponding to the power drop parameters. Based on any power drop parameter and the corresponding trust parameter, the fault risk of the peer optical module is determined.

[0149] The embodiments disclosed herein, on the one hand, can determine whether there is a risk of failure in the peer optical module based on the received optical power of the optical module, and take corresponding measures to handle the optical module before the failure occurs, so as to avoid the problem of not being able to meet the user's usage needs after the failure occurs; on the other hand, it can repair or replace the faulty optical module in a timely manner without spending a lot of manpower and resources to locate the faulty optical module, thus ensuring the continuity of user services.

[0150] It should be noted that the above figures are merely illustrative of the processes included in the method according to exemplary embodiments of this disclosure, and are not intended to be limiting. It is readily understood that the processes shown in the above figures do not indicate or limit the temporal order of these processes. Furthermore, it is readily understood that these processes may be executed synchronously or asynchronously, for example, in multiple modules.

[0151] Furthermore, in an exemplary embodiment of this disclosure, a fault diagnosis device is also provided. (Refer to...) Figure 13 As shown, a fault diagnosis device 1300 includes: a power timing data acquisition unit 1310, a received optical power sub-data division unit 1320, a parameter acquisition unit 1330, and a risk determination unit 1340.

[0152] The system includes a power timing data acquisition unit, configured to acquire received optical power timing data corresponding to multiple optical channels of an optical module, wherein the optical module has a corresponding peer optical module; a received optical power sub-data partitioning unit, configured to extract received optical power timing data corresponding to multiple optical channels using a window of a first window length, to obtain multiple first received optical power sub-data for each optical channel; wherein the first received optical power sub-data includes multiple sampling data points, which are used to indicate the received optical power and the timestamp corresponding to the received optical power; a parameter acquisition unit, configured to fit multiple sampling data points within any first received optical power sub-data, provided that the first received optical power sub-data meets the corresponding fitting requirements, to obtain a power drop parameter and a confidence parameter corresponding to the power drop parameter; and a risk determination unit, configured to determine the fault risk of the peer optical module based on any power drop parameter and the corresponding confidence parameter.

[0153] In an exemplary embodiment of this disclosure, based on the foregoing scheme, the fitting requirement includes: the number of sampling data points within the first received optical power sub-data is greater than or equal to a first threshold; wherein, the first threshold is less than the product of the number of samples per unit time and the number of samples per unit time included in the first received optical power sub-data.

[0154] In an exemplary embodiment of this disclosure, based on the aforementioned scheme, the apparatus further includes: a first time-series data acquisition unit configured to determine first optical power time-series data; the first optical power time-series data being optical power time-series data associated with the first optical power sub-data; a first quantity statistics unit configured to count the number of first sub-data; wherein the number of first sub-data is the number of first optical power sub-data in which the number of sampled data points is greater than or equal to a first threshold among the multiple first optical power sub-data included in the first optical power time-series data; and a second fitting unit configured to fit the multiple sampled data points within the first optical power sub-data when the number of first sub-data is greater than a second threshold; wherein the second threshold is less than the number of second sub-data, and the number of second sub-data is the number of multiple first optical power sub-data included in the first optical power time-series data.

[0155] In an exemplary embodiment of this disclosure, based on the foregoing scheme, the fault risk of the peer optical module is determined according to any power drop parameter and the corresponding trust parameter. The device further includes: a fourth threshold comparison unit, configured to determine that there is a fault risk in the peer optical module when the absolute value of the power drop parameter is greater than a third threshold and the absolute value of the trust parameter is greater than a fourth threshold.

[0156] In an exemplary embodiment of this disclosure, based on the aforementioned scheme, when the absolute value of the power drop parameter is greater than a third threshold and the absolute value of the trust parameter is greater than a fourth threshold, it is determined that the peer optical module has a fault risk. The apparatus further includes: a risk sub-data determination unit, configured to determine that the first received optical power sub-data associated with the power drop parameter is risk sub-data when the power drop parameter is less than the third threshold and the trust parameter is less than the fourth threshold; a window quantity acquisition unit, configured to acquire the number of third sub-data; wherein the number of third sub-data is the number of risk sub-data among the multiple first received optical power sub-data included in the first received optical power timing data associated with the power drop parameter; and a second fault risk determination unit, configured to determine that the peer optical module has a fault risk when the number of third sub-data is greater than or equal to a fifth threshold.

[0157] In an exemplary embodiment of this disclosure, based on the foregoing scheme, the failure risk of the peer optical module is determined according to any power drop parameter and the corresponding trust parameter. The apparatus further includes: a first evaluation result acquisition unit, configured to perform a first evaluation result of the peer optical module based on the power drop parameter and the trust parameter; wherein the first evaluation result is used to indicate the failure risk of the peer optical module.

[0158] The second received optical power sub-data partitioning unit is configured to extract the received optical power timing data corresponding to multiple optical channels using a window of the second window length, thereby obtaining multiple second received optical power sub-data for each optical channel; wherein, the second received optical power sub-data includes multiple sampling data points, which are used to indicate the received optical power and the timestamp corresponding to the received optical power, and the first window length is different from the second window length; the second evaluation result determination unit is configured to determine the second evaluation result of the peer optical module based on any second received optical power sub-data; wherein, the second evaluation result is used to indicate the failure risk of the peer optical module; the comprehensive evaluation unit is configured to determine the failure risk of the peer optical module based on the first evaluation result and the second evaluation result.

[0159] In an exemplary embodiment of this disclosure, based on the aforementioned scheme, the apparatus further includes: a third fitting unit configured to perform fitting on multiple sampling data points within the second received optical power sub-data, provided that the second received optical power sub-data meets the corresponding fitting requirements, to obtain a power drop parameter and a trust parameter corresponding to the power drop parameter; and a second evaluation result acquisition unit configured to determine the second evaluation result based on the power drop parameter obtained for any second received optical power sub-data and the corresponding trust parameter.

[0160] Since the functional modules of the fault judgment device in the example embodiments of this disclosure correspond to the steps of the example embodiments of the fault judgment method described above, for details not disclosed in the device embodiments of this disclosure, please refer to the embodiments of the fault judgment method described above.

[0161] It should be noted that although several modules or units for the device used to perform actions have been mentioned in the detailed description above, this division is not mandatory. In fact, according to embodiments of this disclosure, the features and functions of two or more modules or units described above can be embodied in one module or unit. Conversely, the features and functions of one module or unit described above can be further divided and embodied by multiple modules or units.

[0162] Furthermore, in an exemplary embodiment of this disclosure, an electronic device capable of implementing the above-described fault diagnosis method is also provided.

[0163] Those skilled in the art will understand that various aspects of this disclosure can be implemented as a system, method, or program product. Therefore, various aspects of this disclosure can be embodied in the following forms: a completely hardware embodiment, a completely software embodiment (including firmware, microcode, etc.), or an embodiment combining hardware and software aspects, collectively referred to herein as a "circuit," "module," or "system."

[0164] The following reference Figure 14 To describe an electronic device 1400 according to such an embodiment of the present disclosure. Figure 14 The electronic device 1400 shown is merely an example and should not be construed as limiting the functionality and scope of use of the embodiments disclosed herein.

[0165] like Figure 14 As shown, the electronic device 1400 is manifested in the form of a general-purpose computing device. The components of the electronic device 1400 may include, but are not limited to: at least one processing unit 1410, at least one storage unit 1420, a bus 1430 connecting different system components (including storage unit 1420 and processing unit 1410), and a display unit 1440.

[0166] The storage unit stores program code, which can be executed by the processing unit 1410 to perform the steps described in the "Exemplary Methods" section of this specification according to various exemplary embodiments of this disclosure. For example, the processing unit 1410 can perform actions such as... Figure 2Step S210, as shown, acquires the received optical power timing data corresponding to multiple optical channels of the optical module; wherein the optical module has a corresponding peer optical module; Step S220, extracts the received optical power timing data corresponding to multiple optical channels using a window of the first window length, to obtain multiple first received optical power sub-data for each optical channel; wherein the first received optical power sub-data includes multiple sampling data points, which are used to indicate the received optical power and the timestamp corresponding to the received optical power; Step S230, for any first received optical power sub-data, if the first received optical power sub-data meets the corresponding fitting requirements, fits the multiple sampling data points in the first received optical power sub-data to obtain the power drop parameter and the trust parameter corresponding to the power drop parameter; Step S240, determines the fault risk of the peer optical module based on any power drop parameter and the corresponding trust parameter.

[0167] For example, electronic devices can achieve such Figure 2 The steps shown.

[0168] Storage unit 1420 may include readable media in the form of volatile storage units, such as random access memory (RAM) 1421 and / or cache memory 1422, and may further include read-only memory (ROM) 1423.

[0169] Storage unit 1420 may also include a program / utility 1424 having a set (at least one) of program modules 1425, such program modules 1425 including but not limited to: an operating system, one or more application programs, other program modules and program data, each or some combination of these examples may include an implementation of a network environment.

[0170] Bus 1430 can represent one or more of several types of bus structures, including a memory cell bus or memory cell controller, a peripheral bus, a graphics acceleration port, a processing unit, or a local bus using any of the various bus structures.

[0171] Electronic device 1400 can also communicate with one or more external devices 1470 (e.g., keyboard, pointing device, Bluetooth device, etc.), and with one or more devices that enable a user to interact with electronic device 1400, and / or with any device that enables electronic device 1400 to communicate with one or more other computing devices (e.g., router, modem, etc.). This communication can be performed via input / output (I / O) interface 1450. Furthermore, electronic device 1400 can also communicate with one or more networks (e.g., local area network (LAN), wide area network (WAN), and / or public networks, such as the Internet) via network adapter 1460. As shown, network adapter 1460 communicates with other modules of electronic device 1400 via bus 1430. It should be understood that, although not shown in the figures, other hardware and / or software modules can be used in conjunction with electronic device 1400, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, and data backup storage systems.

[0172] From the above description of the embodiments, those skilled in the art will readily understand that the exemplary embodiments described herein can be implemented by software or by combining software with necessary hardware. Therefore, the technical solutions according to the embodiments of this disclosure can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (such as a CD-ROM, USB flash drive, external hard drive, etc.) or on a network, including several instructions to cause a computing device (such as a personal computer, server, terminal device, or network device, etc.) to execute the methods according to the embodiments of this disclosure.

[0173] In an exemplary embodiment, a computer-readable storage medium including instructions is also provided, such as a memory including instructions that can be executed by a processor of the device to perform the described method. Optionally, the computer-readable storage medium may be a ROM, random access memory (RAM), CD-ROM, magnetic tape, floppy disk, and optical data storage device, etc.

[0174] In an exemplary embodiment, a computer program product is also provided, including a computer program / instructions, which, when executed by a processor, implement the fault judgment method in the above embodiments.

[0175] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the following claims.

[0176] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A fault diagnosis method, characterized in that, The method includes: Acquire the received power timing data corresponding to multiple optical channels of the optical module; wherein, the optical module has a corresponding peer optical module; The received optical power timing data corresponding to the multiple optical channels are extracted using a window of the first window length to obtain multiple first received optical power sub-data for each optical channel; wherein, the first received optical power sub-data includes multiple sampling data points, and the sampling data points are used to indicate the received optical power and the timestamp corresponding to the received optical power. For any first received optical power sub-data, if the first received optical power sub-data satisfies the corresponding fitting requirements, multiple sampling data points in the first received optical power sub-data are fitted to obtain the power drop parameter and the confidence parameter corresponding to the power drop parameter. Based on any of the power degradation parameters and the corresponding trust parameters, determine the failure risk of the peer optical module; The step of determining the failure risk of the peer optical module based on any of the power degradation parameters and the corresponding trust parameters includes: The first evaluation result of the peer optical module is determined based on the power degradation parameter and the trust parameter; wherein the first evaluation result is used to indicate the failure risk of the peer optical module. The received optical power timing data corresponding to the multiple optical channels are extracted using a window of the second window length to obtain multiple second received optical power sub-data for each optical channel; wherein, the second received optical power sub-data includes multiple sampling data points, the sampling data points are used to indicate the received optical power and the timestamp corresponding to the received optical power, and the first window length is different from the second window length; A second evaluation result of the peer optical module is determined based on any of the second received optical power sub-data; wherein the second evaluation result is used to indicate the failure risk of the peer optical module; The failure risk of the peer optical module is determined based on the first assessment result and the second assessment result.

2. The method according to claim 1, characterized in that, The fitting requirements include: The number of samples in the first received optical power sub-data is greater than or equal to a first threshold; wherein the first threshold is less than the product of the number of samples per unit time and the number of samples per unit time included in the first received optical power sub-data.

3. The method according to claim 2, characterized in that, The fitting of multiple sampled data points within the first received optical power sub-data includes: Determine the first received optical power timing data; the first received optical power timing data is the received optical power timing data associated with the first received optical power sub-data; The number of first sub-data points is counted; wherein, the number of first sub-data points is the number of first sub-data points whose sampling number is greater than or equal to a first threshold among the multiple first sub-data points included in the first received optical power time series data. When the number of the first sub-data points is greater than the second threshold, multiple sampling data points within the first received optical power sub-data are fitted. Wherein, the second threshold is less than the number of second sub-data, and the number of second sub-data is the number of multiple first received optical power sub-data included in the first received optical power time series data.

4. The method according to claim 1, characterized in that, The step of determining the failure risk of the peer optical module based on any of the power degradation parameters and the corresponding trust parameters includes: When the absolute value of the power degradation parameter is greater than the third threshold and the absolute value of the trust parameter is greater than the fourth threshold, it is determined that the peer optical module has a risk of failure.

5. The method according to claim 4, characterized in that, The step of determining that the peer optical module has a fault risk when the absolute value of the power drop parameter is greater than a third threshold and the absolute value of the trust parameter is greater than a fourth threshold includes: When the power drop parameter is less than the third threshold and the trust parameter is less than the fourth threshold, the first received optical power sub-data associated with the power drop parameter is determined to be risk sub-data. Obtain the number of third sub-data; wherein, the number of third sub-data is the number of risk sub-data among the multiple first received optical power sub-data included in the first received optical power time series data associated with the power drop parameter; When the number of the third sub-data is greater than or equal to the fifth threshold, it is determined that the peer optical module has a risk of failure.

6. The method according to claim 1, characterized in that, The step of determining the second evaluation result of the peer optical module based on any of the second received optical power sub-data includes: For any second received optical power sub-data, if the second received optical power sub-data satisfies the corresponding fitting requirements, multiple sampling data points in the second received optical power sub-data are fitted to obtain the power drop parameter and the confidence parameter corresponding to the power drop parameter. The second evaluation result is determined based on the power drop parameter obtained for any of the second received optical power sub-data and the corresponding confidence parameter.

7. A fault diagnosis device, characterized in that, include: The power timing data acquisition unit is configured to acquire the received power timing data corresponding to multiple optical channels of the optical module; wherein the optical module has a corresponding peer optical module; The received optical power sub-data partitioning unit is configured to extract the received optical power time-series data corresponding to the multiple optical channels respectively using a window of the first window length, to obtain multiple first received optical power sub-data corresponding to each optical channel; wherein, the first received optical power sub-data includes multiple sampling data points, and the sampling data points are used to indicate the received optical power and the timestamp corresponding to the received optical power. The parameter acquisition unit is configured to perform a fitting operation on multiple sampling data points within the first received optical power sub-data for any first received optical power sub-data, provided that the first received optical power sub-data satisfies the corresponding fitting requirements, to obtain a power drop parameter and a confidence parameter corresponding to the power drop parameter. The risk determination unit is configured to determine the failure risk of the peer optical module based on any of the power degradation parameters and the corresponding trust parameters. The risk determination unit is further configured to perform a first evaluation result of the peer optical module based on the power degradation parameter and the trust parameter; wherein the first evaluation result is used to indicate the failure risk of the peer optical module; The received optical power timing data corresponding to the multiple optical channels are extracted using a window of the second window length to obtain multiple second received optical power sub-data for each optical channel; wherein, the second received optical power sub-data includes multiple sampling data points, the sampling data points are used to indicate the received optical power and the timestamp corresponding to the received optical power, and the first window length is different from the second window length; A second evaluation result of the peer optical module is determined based on any of the second received optical power sub-data; wherein the second evaluation result is used to indicate the failure risk of the peer optical module; The failure risk of the peer optical module is determined based on the first assessment result and the second assessment result.

8. An electronic device, characterized in that, include: processor; Memory used to store the processor's executable instructions; The processor is configured to execute the executable instructions to implement the fault determination method as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, When the instructions in the computer-readable storage medium are executed by the processor of the electronic device, the electronic device is able to perform the fault diagnosis method as described in any one of claims 1 to 6.

10. A computer program product comprising a computer program / instructions, characterized in that, When the computer program / instruction is executed by the processor, it implements the fault judgment method as described in any one of claims 1 to 6.

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