Radiation thermometry probe structure

Abstract

The present disclosure provides a radiation thermometry probe structure, relating to the technical field of non-contact temperature measurement, comprising: a case, an internal test hole is formed; a mounting seat is installed on the case; a probe seat is installed on the mounting seat and sealed with the mounting seat; an air inlet is arranged on the probe seat for introducing high-pressure clean low-temperature gas into the inside of the probe seat; a probe shell is inserted into the inside of the probe seat and passes through the slide of the case, and can slide relative to the case and the probe seat; the probe shell is a closed structure, and an air inlet hole is arranged in the circumference; a sliding seal is used to form a seal between the probe shell and the probe seat when the probe shell axially expands and contracts; a probe light path inner tube is installed in the inside of the probe shell and sealed by a first sealing ring; a mirror is installed at the end of the probe light path inner tube away from the probe seat, and the mirror can rotate relative to the axial direction of the probe light path inner tube to form different reflection angles.

Description

Technical Field

[0001] This disclosure relates to the field of non-contact temperature measurement technology, and in particular to a radiation temperature probe structure. Background Technology

[0002] Gas turbines contain high-temperature, high-pressure, and high-speed gas. Turbine blades are in a harsh high-temperature environment, and their service life directly affects the overall service life of the gas turbine. Therefore, monitoring the surface temperature of turbine blades is crucial. However, since turbine blades rotate at high speeds of several thousand to tens of thousands of revolutions per minute, measuring their surface temperature is extremely difficult.

[0003] Existing temperature measurement methods, particularly contact-based methods, suffer from complex installation, high cost, and short lifespan, limiting their application in gas turbines. This has led to the development of non-contact radiation thermometry. Radiation thermometry is primarily based on Planck's radiation principle, using a temperature probe to receive spectral energy and transmit it to a photodetector for photoelectric conversion. High-speed data acquisition and processing are then combined to obtain the temperature of the measured object. In turbine blade temperature measurement, the radiation thermometry probe needs to be aimed at the surface of the blade to collect its surface radiation energy. Due to the high-temperature gas environment inside the turbine, commonly used probes employ a fixed design with an opening in the casing, aiming at a specific location on the blade. The probe does not enter the gas environment; instead, purging gas is introduced into the probe to isolate it from contact with the gas. However, this method, due to its limited viewing angle, can only measure the temperature along a single line on the blade surface, failing to obtain the overall temperature field distribution. Summary of the Invention

[0004] To address the aforementioned technical problems, this disclosure provides a radiation temperature probe structure that at least partially solves these problems.

[0005] Based on this, the present disclosure provides a radiation temperature measurement probe structure, including: a housing with a test hole formed inside; a mounting base mounted on the housing; a probe base mounted on the mounting base and sealed to the mounting base; an air inlet on the probe base for introducing high-pressure clean low-temperature gas into the probe base; a probe housing inserted into the probe base and passing through the test hole of the housing, and capable of sliding relative to the housing and the probe base; the probe housing is a closed structure with an air inlet in the circumferential direction; a sliding seal for forming a seal between the probe housing and the probe base when the probe housing extends or retracts axially; a probe optical path inner tube installed inside the probe housing and sealed by a first sealing ring; a reflector mounted on the end of the probe optical path inner tube away from the probe base, the reflector being capable of rotating axially relative to the probe optical path inner tube to form different reflection angles.

[0006] According to an embodiment of this disclosure, a lens group is also provided inside the inner tube of the probe optical path, which is used for optical path modulation; an optical window is also provided at the other end of the inner tube of the probe optical path opposite to the reflector, which is used to seal the high-pressure gas inside the inner tube of the probe optical path and form a transmission window for measuring the energy of the radiation spectrum.

[0007] According to an embodiment of this disclosure, the optical window is connected and pressed to the inner tube of the probe optical path via a connector. The connector is provided with an aperture and an optical path connection interface. The aperture is used for light limiting, and the optical path connection interface is used for connecting to an external optical path structure. A gasket is also provided between the connector and the optical window to protect the optical window. The optical window and the inner tube of the probe optical path are also sealed under high pressure by a second sealing ring.

[0008] According to an embodiment of this disclosure, the reflector is provided with a rotating shaft and a sliding groove; the end of the inner tube of the probe optical path away from the probe seat is also provided with a support structure, and the reflector is mounted on the support structure via the rotating shaft; a control rod is also provided in the circumferential gap between the inner tube of the probe optical path and the probe shell, and a slide rod is provided at the end of the control rod near the reflector. The slide rod is installed in the sliding groove, and the slide rod is pushed to slide in the sliding groove by the extension and retraction of the control rod, so as to drive the reflector to rotate around the rotating shaft.

[0009] According to embodiments of this disclosure, the radiation temperature probe structure further includes: a rack mounted on the other end of a control rod; a gear meshing with the rack; a stepper motor mounted on the probe housing via a mounting plate, used to drive the rack by rotating the gear, thereby driving the control rod to extend or retract; a rotary seal mounted on the optical shaft portion of the gear, used to ensure high-pressure sealing during gear rotation; and a fixing member mounted on the probe housing, used to fix and press the rotary seal.

[0010] According to an embodiment of this disclosure, a measuring hole is also provided on the end of the probe housing near the reflector; wherein, the high-pressure clean gas entering from the air inlet is divided into two paths, one path enters the probe housing through the air inlet, and then flows into the inner side of the probe housing near the measuring hole along the gap between the probe housing and the inner tube of the probe optical path, and flows out from the measuring hole; the other path flows into the gap between the probe housing and the mounting base through the gap between the probe base and the probe housing, and then enters the housing.

[0011] According to an embodiment of this disclosure, the radiation temperature probe structure further includes: a probe slip flange, which is connected to the flange on the mounting base by bolts to fix the probe base on the mounting base.

[0012] According to embodiments of this disclosure, the probe holder and the mounting base are sealed by a metal gasket.

[0013] According to embodiments of this disclosure, the reflector is made of a high-temperature alloy and polished.

[0014] According to embodiments of this disclosure, the stepper motor includes an encoder and a stepper motor controller, and the encoder and the stepper motor controller work together to control the reflection angle of the reflector corresponding to different measurement positions.

[0015] The radiation temperature probe structure provided according to the embodiments of this disclosure has at least the following beneficial effects:

[0016] By employing an adjustable-angle reflector, the various structures work together to change the measurement position, enabling the measurement of the surface temperature distribution of the blade under test with a short insertion distance into the high-temperature gas environment, thus achieving high safety.

[0017] By sealing the joints with various sealing components, high-pressure clean low-temperature gas is introduced to prevent high-temperature gas from entering the probe housing, thus preventing contamination of the reflector and other optical paths inside the housing. Attached Figure Description

[0018] The above and other objects, features and advantages of this disclosure will become clearer from the following description of embodiments with reference to the accompanying drawings, in which:

[0019] Figure 1 The diagram schematically illustrates the overall structure of the temperature probe provided in the embodiments of this disclosure.

[0020] Figure 2 The schematic diagram illustrates the probe optical path sealing structure provided in the embodiments of this disclosure.

[0021] Figure 3 The schematic diagram illustrates the mirror connection structure provided in an embodiment of this disclosure.

[0022] Figure 4 The schematic illustration shows a mirror driving structure provided in an embodiment of the present disclosure. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of this disclosure clearer, the following detailed description is provided in conjunction with specific embodiments and accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this disclosure. All other embodiments obtained by those skilled in the art based on the embodiments of this disclosure without inventive effort are within the scope of protection of this disclosure.

[0024] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit this disclosure. The terms “comprising,” “including,” etc., as used herein indicate the presence of the stated features, steps, operations, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, or components.

[0025] In this disclosure, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.

[0026] In the description of this disclosure, it should be understood that the terms "longitudinal", "length", "circumferential", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this disclosure and simplifying the description, and do not indicate or imply that the subsystem or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this disclosure.

[0027] Throughout the accompanying drawings, identical elements are represented by the same or similar reference numerals. Conventional structures or constructions have been omitted where they may cause confusion in understanding this disclosure. Furthermore, the shapes, dimensions, and positional relationships of the components in the drawings do not reflect actual size, scale, or actual positional relationships. Additionally, any reference numerals placed between parentheses in the claims should not be construed as limiting the claims.

[0028] Similarly, to simplify this disclosure and aid in understanding one or more of the various aspects of the disclosure, in the above description of exemplary embodiments of the present disclosure, various features of the present disclosure are sometimes grouped together in a single embodiment, figure, or description thereof. The use of terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., refers to a specific feature, structure, material, or characteristic described in connection with that embodiment or example, which is included in at least one embodiment or example of the present disclosure. In this specification, illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0029] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this disclosure, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0030] Figure 1 The diagram schematically illustrates the overall structure of the temperature probe provided in the embodiments of this disclosure.

[0031] like Figure 1 As shown, the structure of a radiation temperature probe may include, for example:

[0032] Casing 1, with test holes formed inside (e.g. along...) Figure 1 (As shown in the direction from left to right).

[0033] Mounting bracket 3 is mounted on casing 1.

[0034] In one embodiment of this disclosure, a probe slip flange 4 can be provided and fixedly connected to the probe seat 7. The probe slip flange 4 is then connected to the flange on the mounting base 3 by bolts to fix the probe seat 7 on the mounting base 3.

[0035] The probe holder 7 is mounted on the mounting base 3 and is sealed to the mounting base 3. The probe holder 7 is provided with an air inlet 21 for introducing high-pressure clean low-temperature gas into the probe holder 7.

[0036] In one embodiment of this disclosure, the sealing point between the probe holder 7 and the mounting base 3 can be sealed by a metal gasket 2.

[0037] The probe housing 10 is inserted into the probe holder 7 and passes through the test hole of the housing 1, with a certain gap, allowing it to slide relative to the housing 1 and the probe holder 7. The probe housing 10 is a closed structure with an air inlet 5 in the circumferential direction. When not measuring temperature, the probe housing 10 retracts into the mounting base 3 to prevent the high-temperature gas from continuously heating the probe and causing thermal erosion.

[0038] The sliding seal 6 is used to form a seal between the probe housing 10 and the probe seat 7 when the probe housing 10 is axially extended or retracted.

[0039] In one embodiment of this disclosure, the sliding seal 6 can operate under high pressure. The sliding seal 6 can be fixed by the sealing block 8. When the probe housing 10 is axially extended or retracted, a seal is still formed between it and the probe seat 7, ensuring that the high-pressure clean low-temperature gas introduced into the probe seat 7 is ultimately introduced into the casing to protect the probe.

[0040] The probe optical path inner tube 11 is installed inside the probe housing 10 and sealed by the first sealing ring 9. A reflector 23 is installed at the end of the probe optical path inner tube 11 away from the probe base 7. The reflector 23 can rotate relative to the axial direction of the probe optical path inner tube 11 to form different reflection angles.

[0041] In one embodiment of this disclosure, a lens group 32 is further disposed inside the inner tube 11 of the probe optical path, and the lens group 32 is used for optical path modulation. An optical window 14 is also disposed at the other end of the inner tube 11 of the probe optical path opposite to the reflector 23. The optical window 14 is used to seal the high-pressure gas inside the inner tube 11 of the probe optical path and to form a transmission window for measuring the energy of the radiation spectrum. Since the reflector 23 operates in a high-temperature environment, it is made of a high-temperature alloy and polished.

[0042] Figure 2 The schematic diagram illustrates the probe optical path sealing structure provided in the embodiments of this disclosure.

[0043] Continue reading Figure 1 and Figure 2 Based on the above embodiment, the optical window 14 is connected and pressed tightly to the inner tube 11 of the probe optical path via a connector 12. The connector 12 is provided with an aperture 27 and an optical path connection interface 28. The aperture 27 is used for light limiting, and the optical path connection interface 28 is used for connecting to an external optical path structure. A gasket 13 is also provided between the connector 12 and the optical window 14 to protect the optical window 14. The optical window 14 and the inner tube 11 of the probe optical path are also sealed under high pressure by a second sealing ring 15. The external optical path structure may include, for example, an optical fiber, a lens group, or a beam splitter structure.

[0044] Figure 3 The schematic diagram illustrates the mirror connection structure provided in an embodiment of this disclosure.

[0045] Continue reading Figure 1 and Figure 3 Based on the above embodiment, the reflector 23 is provided with a rotating shaft 29 and a sliding groove 31. A support structure 25 is also provided at the end of the probe optical path inner tube 11 away from the probe seat 7, and the reflector 23 is mounted on the support structure 25 via the rotating shaft 29. A control rod 22 is also provided in the circumferential gap between the probe optical path inner tube 11 and the probe housing 10. A slide rod 30 is provided at the end of the control rod 22 near the reflector 23, and the slide rod 30 is installed in the sliding groove 31. The extension and retraction of the control rod 22 pushes the slide rod 30 to slide in the sliding groove 31, thereby driving the reflector 23 to rotate around the rotating shaft 29. This, in turn, drives the reflector 23 to rotate around the rotating shaft.

[0046] Figure 4 The schematic illustration shows a mirror driving structure provided in an embodiment of the present disclosure.

[0047] Continue reading Figure 1 and Figure 4 Based on the above embodiments, the radiation temperature probe structure further includes:

[0048] Rack 26 is mounted on the other end of control lever 22.

[0049] Gear 19 meshes with rack 26.

[0050] The stepper motor 16 is mounted on the probe housing 10 via the mounting plate 17. It is used to drive the rack 26 by rotating the gear 19, thereby driving the control lever 22 to extend and retract.

[0051] Rotary seal 20 is installed on the optical shaft portion of gear 19 to ensure high-pressure sealing during the rotation of gear 19.

[0052] The fixing member 18 is installed on the probe housing 10 and is used to fix and press the rotary seal 20.

[0053] Furthermore, a measuring hole 24 is provided on the end of the probe housing 10 near the reflector 23. The high-pressure clean gas entering from the inlet 21 is divided into two paths. One path enters the probe housing 10 through the inlet 5, then flows along the gap between the probe housing 10 and the inner tube 11 of the probe optical path, into the inner side of the probe housing 10 near the measuring hole 24, and exits from the measuring hole 24, preventing the gas from entering the probe housing 10 and thus preventing contamination of the reflector 23 and other optical paths inside the housing 10. The other path flows through the gap between the probe base 7 and the probe housing 10 into the gap between the probe housing 10 and the mounting base 3, and then into the casing 1, preventing high-temperature gas from entering the gap between the probe housing 10 and the mounting base 3, thereby protecting the probe housing 10.

[0054] During testing, high-pressure, clean, low-temperature gas must be continuously introduced through the air inlet 21 to purge and cool the probe. The pressure of the introduced protective gas must be higher than the working pressure of the gas. The extension measurement and retraction protection of the probe within the mounting base 3 can be controlled by an electric actuator or a cylinder.

[0055] The stepper motor 16 includes an encoder and a stepper motor controller. The encoder, in conjunction with the high-precision stepper motor controller, enables high-precision control of the reflection angle of the reflector corresponding to different measurement positions.

[0056] In summary, the radiation temperature probe structure provided in this embodiment of the present disclosure, by using an adjustable angle reflector to change the measurement position, realizes the measurement of the surface temperature distribution of the blade being measured. It is suitable for working in high-temperature gas environments, has a short insertion length into the gas, and is highly safe.

[0057] The specific embodiments described above further illustrate the purpose, technical solutions, and beneficial effects of this disclosure. It should be understood that the above descriptions are merely specific embodiments of this disclosure and are not intended to limit this disclosure. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this disclosure should be included within the protection scope of this disclosure.

Claims

1. A radiation temperature measurement probe structure, characterized in that, include: The casing (1) has test holes formed inside; Mounting base (3) is mounted on the casing (1); The probe holder (7) is installed on the mounting base (3) and sealed to the mounting base (3); the probe holder (7) is provided with an air inlet (21) for introducing high-pressure clean low-temperature gas into the probe holder (7); The probe housing (10) is inserted into the probe base (7) and passes through the test hole of the housing (1), and can slide relative to the housing (1) and the probe base (7); the probe housing (10) is a closed structure and has an air inlet (5) in the circumferential direction. A sliding seal (6) is used to form a seal between the probe housing (10) and the probe seat (7) when the probe housing (10) is axially extended or retracted; The probe optical path inner tube (11) is installed inside the probe housing (10) and sealed by the first sealing ring (9); a reflector (23) is installed at the end of the probe optical path inner tube (11) away from the probe seat (7), and the reflector (23) can rotate relative to the axial direction of the probe optical path inner tube (11) to form different reflection angles; The reflector (23) is provided with a rotating shaft (29) and a sliding groove (31); The inner tube (11) of the probe optical path is provided with a support structure (25) at the end away from the probe seat (7), and the reflector (23) is mounted on the support structure (25) through the rotating shaft (29); A control rod (22) is provided in the circumferential gap between the inner tube (11) of the probe optical path and the outer shell (10) of the probe. A slide rod (30) is provided at one end of the control rod (22) near the reflector (23). The slide rod (30) is installed in the sliding groove (31). The slide rod (30) is pushed to slide in the sliding groove (31) by the extension and retraction of the control rod (22) so as to drive the reflector (23) to rotate around the rotation axis (29).

2. The radiation temperature measurement probe structure according to claim 1, characterized in that, The probe optical path inner tube (11) is also provided with a lens group (32), which is used for optical path modulation; An optical window (14) is provided at the other end of the probe optical path inner tube (11) opposite to the reflector (23). The optical window (14) is used to seal the high-pressure gas inside the probe optical path inner tube (11) and form a transmission window for measuring the energy of the radiation spectrum.

3. The radiation temperature probe structure according to claim 2, characterized in that, The optical window (14) is connected and pressed to the inner tube (11) of the probe optical path through the connector (12). The connector (12) is provided with an aperture (27) and an optical path connection interface (28). The aperture (27) is used for light limiting, and the optical path connection interface (28) is used for connecting to an external optical path structure. A gasket (13) is also provided between the connector (12) and the optical window (14), and the gasket (13) is used to protect the optical window (14). The optical window (14) and the inner tube of the probe optical path (11) are also sealed under high pressure by a second sealing ring (15).

4. The radiation temperature probe structure according to claim 1, characterized in that, The radiation temperature probe structure also includes: A rack (26) is mounted on the other end of the control lever (22); The gear (19) meshes with the rack (26); A stepper motor (16) is mounted on the probe housing (10) via a mounting plate (17) and is used to drive the rack (26) by rotating the gear (19) to drive the control rod (22) to extend and retract. A rotary seal (20) is installed on the optical shaft portion of the gear (19) to ensure high-pressure sealing during the rotation of the gear (19); The fixing element (18) is installed on the probe housing (10) to fix and press the rotary seal (20).

5. The radiation temperature probe structure according to claim 1, characterized in that, The probe housing (10) is also provided with a measuring hole (24) at one end near the reflector (23); The high-pressure clean gas entering from the air inlet (21) is divided into two paths. One path enters the probe housing (10) through the air inlet (5), and then flows into the probe housing (10) near the measuring hole (24) through the gap between the probe housing (10) and the probe optical path inner tube (11), and flows out from the measuring hole (24). The other path flows into the gap between the probe housing (10) and the mounting base (3) through the gap between the probe seat (7) and the probe housing (10), and then enters the casing (1).

6. The radiation temperature probe structure according to claim 1, characterized in that, The radiation temperature probe structure also includes: The probe loose flange (4) is bolted to the flange on the mounting base (3) to fix the probe seat (7) on the mounting base (3).

7. The radiation temperature probe structure according to claim 1, characterized in that, The probe holder (7) and the mounting base (3) are sealed by a metal gasket (2).

8. The radiation temperature probe structure according to claim 1, characterized in that, The reflector (23) is made of high-temperature alloy polishing.

9. The radiation temperature probe structure according to claim 4, characterized in that, The stepper motor (16) includes an encoder and a stepper motor controller. The encoder and the stepper motor controller work together to control the reflection angle of the reflector (23) corresponding to different measurement positions.

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