Liquid crystal display panel and detection and repair method thereof

Abstract

Embodiments of the present application disclose a liquid crystal display panel and a detection and maintenance method thereof. In a specific embodiment, the detection method comprises: performing multiple array substrate detections on an array substrate in a panel to obtain at least one fuzzy coordinate value of a first short circuit point, the fuzzy coordinate value comprising a first coordinate in a first direction and a second coordinate in a second direction, wherein the array substrate comprises a first substrate and a plurality of gate lines extending along the first direction, a plurality of data lines extending along the second direction and a common electrode line composed of a plurality of parts extending along the first and second directions respectively, and the first short circuit point is a short circuit point between the data line and the common electrode line; performing a lighting detection on the panel to obtain a fifth coordinate of the first short circuit point in the first direction; determining a seventh coordinate of the first short circuit point in the second direction according to a relationship between the fifth coordinate and the first coordinate of the first short circuit point and the second coordinate, and obtaining a coordinate value of the first short circuit point comprising the fifth and seventh coordinates.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of display. More particularly, it relates to a liquid crystal display panel and a detection and repair method thereof. BACKGROUND

[0002] Thin film transistor liquid crystal display panel (TFT-LCD display panel) is the mainstream product currently used in liquid crystal display panel, especially large-size liquid crystal display panel. With the mass production of high-end products such as 8K, 120Hz and stacked screen liquid crystal display panel (BD Cell), it is proved that liquid crystal (LCD) technology still maintains core competitiveness. At present, TFT-LCD display panel technology is mature, but in actual production, some defects may occur in each process, which are manifested as point defects, line defects, Mura defects, picture defects and the like in the display picture. Among them, the occurrence probability of point defects and line defects is higher, and the influence of line defects is greater than that of point defects. Therefore, how to detect and repair line defects is an important link in the mass production of TFT-LCD display panel. SUMMARY

[0003] The present application aims to provide a liquid crystal display panel and a detection and repair method thereof, so as to solve at least one of the problems in the prior art.

[0004] To achieve the above-mentioned purpose, the present application adopts the following technical solutions:

[0005] The first aspect of the present application provides a detection method of a liquid crystal display panel, comprising:

[0006] Performing multiple array substrate detections on an array substrate in the liquid crystal display panel to obtain at least one fuzzy coordinate value of a first short-circuit point and / or at least one fuzzy coordinate value of a second short-circuit point, wherein the array substrate comprises a first substrate and a plurality of gate lines extending in a first direction, a plurality of data lines extending in a second direction and a common electrode line composed of a plurality of parts extending in the first direction and a plurality of parts extending in the second direction, which are arranged on the first substrate, the first short-circuit point is a short-circuit point between the data line and the common electrode line, and the second short-circuit point is a short-circuit point between the gate line and the common electrode line, the fuzzy coordinate value of the first short-circuit point comprises a first coordinate in the first direction and a second coordinate in the second direction, and the fuzzy coordinate value of the second short-circuit point comprises a third coordinate in the first direction and a fourth coordinate in the second direction;

[0007] Performing a lighting detection on the liquid crystal display panel to obtain a fifth coordinate in the first direction of the first short-circuit point and / or a sixth coordinate in the second direction of the second short-circuit point;

[0008] determining a seventh coordinate of the first short-circuit point in the second direction according to the relationship between the fifth coordinate of the first short-circuit point and at least one first coordinate and at least one second coordinate, obtaining a coordinate value of the first short-circuit point including the fifth coordinate and the seventh coordinate, and / or determining an eighth coordinate of the second short-circuit point in the first direction according to the relationship between the sixth coordinate of the second short-circuit point and at least one fourth coordinate and at least one third coordinate, obtaining a coordinate value of the second short-circuit point including the eighth coordinate and the sixth coordinate.

[0009] Optionally, the multiple array substrate detections include at least two types of array substrate detections.

[0010] Optionally, each type of array substrate detection is performed at least once, wherein for a type of array substrate detection performed at least twice, at least two obtained fuzzy coordinate values are averaged to obtain one fuzzy coordinate value.

[0011] Optionally,

[0012] The determining of the seventh coordinate of the first short-circuit point in the second direction according to the relationship between the fifth coordinate of the first short-circuit point and at least one first coordinate and at least one second coordinate includes: determining the second coordinate corresponding to the first coordinate closest in value to the fifth coordinate as the seventh coordinate of the first short-circuit point in the second direction; and / or

[0013] The determining of the eighth coordinate of the second short-circuit point in the first direction according to the relationship between the sixth coordinate of the second short-circuit point and at least one fourth coordinate and at least one third coordinate includes: determining the third coordinate corresponding to the fourth coordinate closest in value to the sixth coordinate as the eighth coordinate of the second short-circuit point in the first direction.

[0014] Optionally,

[0015] The determining of the seventh coordinate of the first short-circuit point in the second direction according to the relationship between the fifth coordinate of the first short-circuit point and at least one first coordinate and at least one second coordinate includes: sorting the first coordinates according to the difference between the value and the fifth coordinate from small to large, determining the average of the second coordinates corresponding to the first n1 coordinates in the sorted order as the seventh coordinate of the first short-circuit point in the second direction, n1 being a first preset value; and / or

[0016] The determining of the eighth coordinate of the second short-circuit point in the first direction according to the relationship between the sixth coordinate of the second short-circuit point and at least one fourth coordinate and at least one third coordinate includes: sorting the fourth coordinates according to the difference between the value and the sixth coordinate from small to large, determining the average of the third coordinates corresponding to the first n2 coordinates in the sorted order as the eighth coordinate of the second short-circuit point in the first direction, n2 being a second preset value, n2=n1 or n2≠n1.

[0017] Optionally,

[0018] determining the seventh coordinate in the second direction of the first short-circuit point according to the relationship between the fifth coordinate of the first short-circuit point and the at least one first coordinate and the at least one second coordinate comprises: determining the average of the second coordinates corresponding to the first coordinates with a difference between the numerical value and the fifth coordinate less than a first preset threshold as the seventh coordinate in the second direction of the first short-circuit point; and / or

[0019] determining the eighth coordinate in the first direction of the second short-circuit point according to the relationship between the sixth coordinate of the second short-circuit point and the at least one fourth coordinate and the at least one third coordinate comprises: determining the average of the third coordinates corresponding to the fourth coordinates with a difference between the numerical value and the sixth coordinate less than a second preset threshold as the eighth coordinate in the first direction of the second short-circuit point.

[0020] The second aspect of the present application provides a method for repairing a liquid crystal display panel, comprising:

[0021] The method according to the first aspect of the present application is used for detecting to obtain coordinate values of the first short-circuit point and / or coordinate values of the second short-circuit point.

[0022] For the obtained coordinate values of the first short-circuit point, at least one region of the common electrode line overlapping with the data line in orthographic projection on the first substrate is cut according to the coordinate values of the first short-circuit point; and for the coordinate values of the second short-circuit point, at least one region of the common electrode line overlapping with the gate line in orthographic projection on the first substrate is cut according to the coordinate values of the second short-circuit point.

[0023] Optionally,

[0024] cutting the at least one region of the common electrode line overlapping with the data line in orthographic projection on the first substrate according to the coordinate values of the first short-circuit point comprises: cutting the region of the common electrode line closest to the first short-circuit point and overlapping with the data line in orthographic projection on the first substrate;

[0025] cutting the at least one region of the common electrode line overlapping with the gate line in orthographic projection on the first substrate according to the coordinate values of the second short-circuit point comprises: cutting the region of the common electrode line closest to the second short-circuit point and overlapping with the gate line in orthographic projection on the first substrate.

[0026] Optionally,

[0027] The cutting of the area of the at least one of the common electrode lines overlapping the data line in the orthogonal projection on the first substrate according to the coordinate value of the first short-circuit point comprises: cutting a first preset number of areas of the common electrode lines overlapping the data line in the orthogonal projection on the first substrate and centered on the first short-circuit point in the second direction.

[0028] The cutting of the area of the at least one of the common electrode lines overlapping the gate line in the orthogonal projection on the first substrate according to the coordinate value of the second short-circuit point comprises: cutting a first preset number of areas of the common electrode lines overlapping the gate line in the orthogonal projection on the first substrate and centered on the second short-circuit point in the first direction.

[0029] The third aspect of the present application provides a liquid crystal display panel, comprising an array substrate and a color film substrate arranged in a cell, and a liquid crystal layer between the array substrate and the color film substrate, wherein the array substrate comprises a first substrate and a drive circuit layer arranged on the first substrate, the drive circuit layer comprises a plurality of gate lines extending in a first direction, a plurality of data lines extending in a second direction, and a common electrode line composed of a plurality of parts extending in the first direction and a plurality of parts extending in the second direction, the gate lines are located in a gate line layer, the data lines are located in a data line layer, and the common electrode line is located in a common electrode line layer, and an insulating layer is arranged between the common electrode line layer and the gate line layer and the data line layer respectively, wherein the drive circuit layer comprises a poor conductive particle penetrating through the insulating layer and not penetrating through the common electrode line layer, and forming a short-circuit point between the gate line and / or the data line and the common electrode line, the orthogonal projection of the short-circuit point on the first substrate falls into an overlapping area of the orthogonal projection of a gate line or a data line on the first substrate and the common electrode line; for the short-circuit point formed by the gate line and the common electrode line, the common electrode line forms a cutting part in the area overlapping the gate line in the orthogonal projection on the first substrate and a second preset number of areas adjacent to the area in the first direction; for the short-circuit point formed by the data line and the common electrode line, the common electrode line forms a cutting part in the area overlapping the data line in the orthogonal projection on the first substrate and a second preset number of areas adjacent to the area in the second direction.

[0030] The beneficial effects of the present application are as follows:

[0031] Compared with the existing detection scheme using optical detection, there are problems such as low detection rate, high false detection rate, inability to detect invisible short circuit points, and low repair success rate. The detection method provided by the present application can accurately locate the short circuit points between the data line and the common electrode line and the short circuit points between the gate line and the common electrode line, and can meet the production requirements of TFT-LCD display panels. The repair method provided by the present application can effectively repair the short circuit points located by detection, and has a high repair success rate for the line defects caused by the gradual change of the short circuit points between the data line and the common electrode line and the short circuit points between the gate line and the common electrode line in the lighting detection. BRIEF DESCRIPTION OF DRAWINGS

[0032] The specific embodiments of the present application will be further described in detail below with reference to the accompanying drawings.

[0033] Figure 1 A schematic diagram showing a structure of an array substrate of a liquid crystal display panel.

[0034] Figure 2 An enlarged schematic diagram showing the position of a DCS short circuit point 107. Figure 1

[0035] An enlarged schematic diagram showing the position of a DCS short circuit point 107. Figure 3 Figure 2 An AA cross-sectional view of the DCS short circuit point 107.

[0036] Figure 4 A schematic diagram showing the performance of a DCS defect in lighting detection.

[0037] Figure 5 A flowchart showing the detection method of the liquid crystal display panel provided by the first embodiment.

[0038] Figure 6 A data flowchart showing the first embodiment.

[0039] Figure 7 A flowchart showing the repair method of the liquid crystal display panel provided by the second embodiment.

[0040] Figure 8 A schematic diagram showing an invisible defective conductive particle penetrating through the insulating layer and not penetrating through the common electrode line layer.

[0041] Figure 9 A schematic diagram showing a visible defective conductive particle penetrating through the insulating layer and penetrating through the common electrode line layer.

[0042] Figure 10 A schematic diagram showing an enlarged repair.

[0043] Figure 11 A flowchart showing the detection method of the liquid crystal display panel provided by the fourth embodiment.

[0044] ​Figure 12 Figure 1 shows a flowchart of a method for repairing a liquid crystal display panel according to an embodiment of the present application. DETAILED DESCRIPTION

[0045] In order to more clearly illustrate the application, the application will be further described with examples and drawings. Like components are denoted by the same reference signs in the drawings. It should be understood by those skilled in the art that the specific description below is illustrative rather than limiting, and should not be used to limit the scope of the application.

[0046] Thin film transistor liquid crystal display panels (TFT-LCD display panels) are currently mainstream products used in liquid crystal display panels, especially large-size liquid crystal display panels. With the mass production of high-end products such as 8K, 120Hz, and stacked screen liquid crystal display panels (BD Cell), it is proved that liquid crystal (LCD) technology still maintains core competitiveness. Currently, TFT-LCD display panel technology is mature, but in actual production, some defects may occur in each process, which are manifested as point defects, line defects, Mura defects, and picture defects on the display screen. Among them, the occurrence probability of point defects and line defects is relatively high, and the impact of line defects is greater than that of point defects. Therefore, how to detect and repair line defects is an important link in the mass production of TFT-LCD display panels.

[0047] There are three types of common liquid crystal display modes in the prior art, twist nematic (TN), vertical alignment (VA), and in-plane switching (IPS). Among them, the IPS mode has a wider display viewing angle. In the IPS mode liquid crystal display panel, the liquid crystal molecules are in the plane parallel to the glass substrate. Without voltage, the light passing through the lower polarizing plate forms a straight line polarization parallel to the short axis of the liquid crystal molecules, and the polarization direction cannot rotate, so it is absorbed by the upper polarizing plate and cannot be emitted; after applying voltage, the liquid crystal forms a horizontal electric field, and the liquid crystal molecules arrange along the electric field direction, and the light passing through the lower polarizing plate and the liquid crystal layer becomes (elliptical) circularly polarized light state, which can be transmitted through the upper polarizing plate and emitted. Among them, the relationship between the polarizing plates on the array substrate side and the color film substrate side is orthogonal configuration, and the alignment film position is parallel arrangement; the pixel electrode and the common electrode are on the same side of the liquid crystal and are located on the array substrate side; the normal mode is long black display mode.

[0048] For a liquid crystal display panel in which the pixel electrode and the common electrode of, for example, the IPS mode are located on the same side of the array substrate, a schematic diagram of the overall structure of the pixel of the array substrate is as follows: Figure 1As shown, for example, a liquid crystal display panel includes multiple sub-pixels arranged in an array. The array substrate includes a first substrate and a driving circuit layer disposed on the first substrate. The driving circuit layer is provided with a pixel electrode (e.g., an ITO electrode, which may be called PITO, Pixel Indium Tin Oxide) 101 and a thin film transistor (TFT) 102 in each sub-pixel region. The thin film transistor here can be a top-gate thin film transistor, a bottom-gate thin film transistor, or a dual-gate thin film transistor. For example, the thin film transistor includes, for example, a polysilicon (P-SI) active layer, a gate insulator (GI), a gate, an inter-layer dielectric (ILD), a source, and a drain. For example, the materials of the gate insulator and the inter-layer dielectric can be one or more of silicon oxide (SiOx), silicon nitride (SiNx), or silicon oxynitride (SiOxNy). For example, the inter-layer dielectric includes a first sub-inter-layer dielectric layer and a second sub-inter-layer dielectric layer stacked together, and the materials of the first sub-inter-layer dielectric layer and the second sub-inter-layer dielectric layer are different. For example, the material of the first interlayer dielectric layer is silicon oxide, and the material of the second interlayer dielectric layer is silicon oxide. Figure 1 As shown, the driving circuit layer also includes multiple edges Figure 1 The first direction shown in the X direction ( Figure 1 The diagram shows the gate lines (103) extending in the row direction and multiple lines along the edge. Figure 1 The second direction shown in the Y direction ( Figure 1 The data line 104 extends in the column direction. For example, the gate of a thin-film transistor is electrically connected to the gate line 103, the source is electrically connected to the data line 104, and the drain is electrically connected to the pixel electrode 101 in the same sub-pixel. The driving circuit layer also includes a common electrode line 105 composed of multiple portions extending in a first direction and multiple portions extending in a second direction. The common electrode line 105 is electrically connected to a common electrode (e.g., an ITO electrode, which may be referred to as CITO, Common Indium Tin Oxide).

[0049] In the prior art, bright spots and foreign matter in point defects can be accurately located, and the repair process is mature and the repair success rate is high. The causes of line defects are complex, mainly including the following: 1, Data Open (DO) defect caused by the disconnection of the data line 104, Data Common Short (DCS) defect caused by the short circuit between the data line 104 and the common electrode line 105, Gate Common Short (GCS) defect caused by the short circuit between the gate line 103 and the common electrode line 105, and Data Gate Short (DGS) defect caused by the short circuit between the data line 104 and the gate line 103. Among them, the short circuit point causing the DCS defect can be referred to as a DCS short circuit point, which is basically located in the overlapping area of the data line 104 and the common electrode line 105 on the first substrate, that is, the position where the data line 104 and the common electrode line 105 cross in Figure 1 , for example, the DCS short circuit point 107 in Figure 1 , Figure 2 is an enlarged schematic view of the position of the DCS short circuit point 107 in Figure 1 , Figure 3 is an AA cross-sectional view of Figure 2 , as shown in Figure 3 , an insulating layer 106 is provided between the data line 104 and the common electrode line 105, when a defective conductive particle such as a metal particle foreign matter exists and damages the insulating layer 106, a short circuit point between the data line 104 and the common electrode line 105, that is, a DCS short circuit point, is formed at the position of the defective conductive particle, causing a DCS defect. The DCS defect is a common defect in TFT-LCD display panels due to process reasons and cannot be fundamentally avoided. Similar to the DCS short circuit point, the short circuit point causing the GCS defect can be referred to as a GCS short circuit point, which is basically located in the overlapping area of the gate line 103 and the common electrode line 105 on the first substrate, that is, the position where the gate line 103 and the common electrode line 105 cross in Figure 1 . The GCS short circuit point is formed due to the existence of a defective conductive particle such as a metal particle foreign matter damaging the insulating layer provided between the gate line 103 and the common electrode line 105, and cannot be fundamentally avoided.

[0050] The above several line defects have different manifestations in the display screen. The DO defect appears as a line extending in the second direction (Y direction) with an end point in the light-on detection (or light-on test), and the position of the DO defect can be determined by observing the position of the end point for repair. The DGS defect appears as two lines extending in the first direction (X direction) and the second direction (Y direction) to form a cross in the light-on detection, and the position of the DGS defect can be determined by observing the position of the cross point for repair. The DCS defect appears as a line extending in the second direction (Y direction) without an end point in the light-on detection, for example Figure 4 As shown, due to the absence of an end point, the coordinate of the DCS short-circuit point in the first direction (X direction) can be determined by observation, but the coordinate in the second direction (Y direction) cannot be determined, that is, it can be determined by observation that the DCS short-circuit point corresponds to which data line 104, but it cannot be determined that it corresponds to which part or line extending in the first direction (X direction) of the common electrode line 105. The GCS defect appears as a line extending in the first direction (X direction) without an end point in the light-on detection, and due to the absence of an end point, the coordinate of the GCS short-circuit point in the second direction (Y direction) can be determined by observation, but the coordinate in the first direction (X direction) cannot be determined, that is, it can be determined by observation that the DCS short-circuit point corresponds to which gate line 103, but it cannot be determined that it corresponds to which part or line extending in the second direction (Y direction) of the common electrode line 105.

[0051] It can be seen that it is difficult to detect and locate the DCS defect and the GCS defect. Taking the DCS defect as an example, the existing repair scheme includes two kinds. The first kind is to determine the coordinate of the DCS short-circuit point in the first direction (X direction) according to the light-on detection, and the repair personnel finds the DCS short-circuit point by manually patrolling the corresponding data line Data line under a microscope for repair. However, this scheme has extremely low efficiency, and it takes more than 2 hours to repair one TFT-LCD display panel, and the repair personnel needs to have high concentration of attention, and the technical difficulty is high, the failure rate is high, and the invisible short-circuit point cannot be repaired. It has been verified that the success rate of this scheme is not more than 3%, which does not meet the mass production requirements of TFT-LCD display panels. The second kind is an automatic patrolling scheme by introducing an automated optical inspection (AOI) device. Although the repair efficiency of this scheme is improved compared with the first scheme, it takes about 1 hour to repair one TFT-LCD display panel, but the defect detection rate is low under a low-power lens, the false detection rate is high under a high-power lens, and the invisible short-circuit point cannot be repaired. The success rate of repair can only be increased to about 8%, and the problems of difficult detection and positioning of DCS defect and GCS defect, and low repair success rate cannot be effectively solved.

[0052] In view of this, in order to solve the problems of difficulty in detecting and locating DCS and GCS malfunctions and low repair success rate in existing maintenance solutions, the present invention provides the following embodiments.

[0053] Example One

[0054] like Figure 5 As shown, Embodiment 1 provides a method for detecting a liquid crystal display panel, including the following steps:

[0055] S110. Perform multiple array substrate detections on the array substrate in the liquid crystal display panel to obtain at least one fuzzy coordinate value of the first short circuit point. The array substrate includes a first substrate and multiple gate lines extending along a first direction, multiple data lines extending along a second direction, and a common electrode line formed by multiple portions extending along the first direction and multiple portions extending along the second direction, all disposed on the first substrate. The first short circuit point is a short circuit point between the data line and the common electrode line. The fuzzy coordinate value of the first short circuit point includes a first coordinate in the first direction and a second coordinate in the second direction.

[0056] For example Figure 1 As shown, the liquid crystal display panel includes multiple sub-pixels arranged in an array. The array substrate includes a first substrate and a driving circuit layer disposed on the first substrate. The driving circuit layer has a pixel electrode 101 and a thin film transistor 102 disposed in each sub-pixel region. The driving circuit layer also includes multiple edges Figure 1 The first direction shown in the X direction ( Figure 1 The grid lines 103 (shown in the row direction) extend along multiple lines. Figure 1 The second direction shown in the Y direction ( Figure 1 The diagram shows a data line 104 extending in the column direction and a common electrode line 105 composed of multiple portions extending in the first direction (X direction) and multiple portions extending in the second direction (Y direction). The first short-circuit point is the short-circuit point between the data line 104 and the common electrode line 105, i.e., the first short-circuit point is a DCS short-circuit point. The fuzzy coordinate value obtained by the array substrate includes a first coordinate x1 in the first direction (X direction) and a second coordinate y1 in the second direction (Y direction). Therefore, the fuzzy coordinate value of the first short-circuit point is (x1, y1). It can be understood that the fuzzy coordinate value of the first short-circuit point is the coordinate value in the rectangular coordinate system formed by the X-axis and the Y-axis.

[0057] In one possible implementation, the multiple array substrate detections include at least two types of array substrate detection. This allows for the effective and accurate acquisition of the fuzzy coordinates of the first short-circuit point through array substrate detection, thereby ensuring the effectiveness and accuracy of subsequent processes.

[0058] In a specific example, array substrate inspection is, for example, the inspection of the array substrate before the array substrate and the color filter substrate are aligned. Array substrate inspection can also be called array substrate testing (ArrayTest). At least two types of array substrate inspection include, for example, optical inspection based on AOI equipment (AOI optical inspection), open and short circuit detection by test signals (OS detection), inspection based on array inspection machine (AT detection), CSI detection, etc.

[0059] For example, in step S110, multiple array substrate inspections are performed to detect and locate the DCS short-circuit point, including one AOI optical inspection, one OS inspection, and one AT inspection. The fuzzy coordinates of the DCS short-circuit point obtained by the AOI optical inspection are (x... 1,1 ,y 1,1 The fuzzy coordinates of the DCS short-circuit point obtained by OS detection are (x 1,2 ,y 1,2 The fuzzy coordinates of the DCS short-circuit point obtained by AT detection are (x 1,3 ,y 1,3 ), (x 1,1 ,y 1,1 ), (x 1,2 ,y 1,2 ) and (x 1,3 ,y 1,3 All of these belong to the fuzzy coordinates of the DCS short circuit point (x1, y1). It is understandable that, for example, since AOI optical inspection may not detect short circuit points, that is, there are invisible short circuit points for AOI optical inspection, although multiple array substrate inspections are performed, not every array substrate inspection may obtain at least one fuzzy coordinate value of a DCS short circuit point. Therefore, the number of fuzzy coordinate values ​​may be less than the number of times the array substrate inspection is performed.

[0060] In one possible implementation, each type of array substrate detection is performed at least once. For an array substrate type that is detected at least twice, the average of the at least two fuzzy coordinate values ​​obtained is combined into a single fuzzy coordinate value. This further ensures the effectiveness and accuracy of the detection for each type of array substrate.

[0061] For example, in step S110, the array substrate detection for detecting and locating the DCS short-circuit point includes one AOI optical inspection, three OS inspections, and one AT inspection. The fuzzy coordinate value of the DCS short-circuit point obtained by the AOI optical inspection is (x... 1,1 ,y 1,1 The fuzzy coordinates of the DCS short-circuit point obtained from the three OS detections are (x 1,2` ,y 1,2` ), (x1,2`` 1,2`` 1,2``` 1,2``` 1,3 1,3 1,2 1,2 1,2 1,2` 1,2`` 1,2``` 1,2 1,2` 1,2`` 1,2``` 1,1 1,1 1,2 1,2 1,3 1,3

[0062] S120, performing light-on detection on the liquid crystal display panel to obtain a fifth coordinate of the first short-circuit point in a first direction.

[0063] In one specific example, the light-on detection is performed on the liquid crystal display panel after the array substrate and the color film substrate are bonded to form the liquid crystal display panel, and the DCS defect is manifested as a gradual change type line without end points extending along the second direction (Y direction) in the light-on detection. The fifth coordinate x0 of the DCS short-circuit point in the first direction (X direction) can be determined by observation. It should be noted that the first embodiment regards the fifth coordinate x0 of the DCS short-circuit point in the first direction (X direction) as an accurate coordinate.

[0064] S130, determining a seventh coordinate of the first short-circuit point in a second direction according to a relationship between the fifth coordinate of the first short-circuit point and at least one first coordinate and at least one second coordinate, and obtaining a coordinate value of the first short-circuit point including the fifth coordinate and the seventh coordinate.

[0065] ​​​​​​​​​​​​​​​​​​​​​​For example, the first coordinate x1 and the second coordinate y1 of the DCS short-circuit point are included in the fuzzy coordinate value (x1, y1) of the DCS short-circuit point detected by the array substrate detection, that is, in the embodiment, the first coordinate x1 and the second coordinate y1 of the DCS short-circuit point are both regarded as fuzzy coordinates, and since the DCS defect appears as a gradual change type line without end points extending in the second direction (Y direction) in the light-on detection, the light-on detection of step S120 cannot determine the coordinate of the DCS short-circuit point in the second direction (Y direction), and step S130, for example, performs matching between the accurate first direction coordinate x0 of the DCS short-circuit point and the fuzzy first direction coordinate x1 based on big data analysis, so as to determine the more accurate second direction coordinate y of the DCS short-circuit point through the fuzzy second direction coordinate y1 corresponding to the fuzzy first direction coordinate x1 0` , to obtain the coordinate value (x0, y 0` ) composed of the accurate first direction coordinate x0 and the more accurate second direction coordinate y 0` of the DCS short-circuit point, and complete the detection and positioning of the DCS short-circuit point.

[0066] In a possible implementation, for step S130, the embodiment one provides the following three matching modes:

[0067] (1) The second coordinate y1 corresponding to the first coordinate x1 closest in value to the fifth coordinate x0 is determined as the seventh coordinate y 0` in the second direction of the first short-circuit point.

[0068] For example, seven different types of array substrate detections are performed through step S110, and seven fuzzy coordinate values of the DCS short-circuit point are obtained, which are (x 1,1 , y 1,1 ), (x 1,2 , y 1,2 ), (x 1,3 , y 1,3 ), (x 1,4 , y 1,4 ), (x 1,5 , y 1,5 ), (x 1,6 , y 1,6 ) and (x 1,7 , y 1,7 ), and in this matching mode (1), the difference between the seven fuzzy first direction coordinates x 1,1 -x 1,7 and the accurate first direction coordinate x0 obtained in step S120 is traversed, and the fuzzy second direction coordinate corresponding to the fuzzy first direction coordinate closest in value is taken as the more accurate second direction coordinate y 0` , for example, the fuzzy first direction coordinate x 1,4the fuzzy second direction coordinate y 1,4 as the more accurate second direction coordinate y 0` .

[0069] (2) The first coordinate x1 is sorted according to the difference between the value and the fifth coordinate x0 from small to large, and the average of the second coordinate y1 corresponding to the first n1 first coordinates x1 in the sorted order is determined as the seventh coordinate y 0` of the second direction of the first short circuit point, and n1 is a first preset value.

[0070] For example, seven different types of array substrate detection are performed through step S110, and seven fuzzy coordinate values of the DCS short circuit point are obtained, which are (x 1,1 , y 1,1 ), (x 1,2 , y 1,2 ), (x 1,3 , y 1,3 ), (x 1,4 , y 1,4 ), (x 1,5 , y 1,5 ), (x 1,6 , y 1,6 ) and (x 1,7 , y 1,7 ). In this matching mode (2), for example, n1 = 3 is set, the difference between the fuzzy first direction coordinate x 1,1 -x 1,7 and the accurate first direction coordinate x0 obtained in step S120 is calculated, and the average of the fuzzy second direction coordinates corresponding to the three fuzzy first direction coordinates with smaller difference is taken as the more accurate second direction coordinate y 0` . For example, after traversal, it is determined that the fuzzy first direction coordinates x 1,3 , x 1,4 and x 1,5 are the three fuzzy first direction coordinates closest to the value of the accurate first direction coordinate x0, and the more accurate second direction coordinate y 0` is taken as y 0` = (y 1,3 +y 1,4 +y 1,5 ) / 3.

[0071] (3) The average of the second coordinate y1 corresponding to the first coordinate x1 whose value is less than the first preset threshold from the difference between the value and the fifth coordinate x0 is determined as the seventh coordinate y 0` of the second direction of the first short circuit point.

[0072] The matching mode (3) in the embodiment one can adapt to the structure of the liquid crystal display panel to ensure the accuracy of the coordinate values of the DCS short-circuit points obtained in the step S130, for example, the first preset threshold can be set as the interval between the adjacent parts of the common electrode line extending along the first direction.

[0073] For example, seven different types of array substrate detection are performed through the step S110, and seven fuzzy coordinate values of the DCS short-circuit points are obtained, which are (x 1,1 ,y 1,1 ), (x 1,2 ,y 1,2 ), (x 1,3 ,y 1,3 ), (x 1,4 ,y 1,4 ), (x 1,5 ,y 1,5 ), (x 1,6 ,y 1,6 ) and (x 1,7 ,y 1,7 ) respectively. In the matching mode (3), the difference between the fuzzy first direction coordinate x 1,1 -x 1,7 and the accurate first direction coordinate x0 obtained in the step S120 is traversed, and the mean value of the fuzzy second direction coordinates corresponding to the fuzzy first direction coordinates with the difference less than the first preset threshold is taken as the more accurate second direction coordinate y 0` , for example, after traversing, it is determined that the difference between the fuzzy first direction coordinates x 1,4 and x 1,5 and the accurate first direction coordinate x0 is less than the first preset threshold, and the more accurate second direction coordinate y 0` is taken as y 0` =(y 1,4 +y 1,5 ) / 2.

[0074] In a specific example, the embodiment one also designs the data flow of the detection method, for example, as shown in the following figure: Figure 6

[0075] In the foregoing example, seven different types of array substrate detection are performed in the step S110, which are named as array substrate detection processes 1-7 respectively. Figure 6

[0076] In the array substrate detection process 1, the computer device controlling the array substrate detection process 1 uploads the file 1 containing the fuzzy coordinate values (x 1,1 ,y 1,1 ) of the DCS short-circuit points detected by the array substrate detection process 1 to the Ftp server. ​​

[0077] When the array substrate detecting procedure 2 detects the DCS short-circuit point, the computer device of the array substrate detecting procedure 2 is controlled to upload the file 2 containing the fuzzy coordinate value (x 1,2 ,y 1,2 ) of the DCS short-circuit point detected by the array substrate detecting procedure 2 into the Ftp server.

[0078] When the array substrate detecting procedure 3 detects the DCS short-circuit point, the computer device of the array substrate detecting procedure 3 is controlled to upload the file 3 containing the fuzzy coordinate value (x 1,3 ,y 1,3 ) of the DCS short-circuit point detected by the array substrate detecting procedure 2 into the Ftp server.

[0079] When the array substrate detecting procedure 4 detects the DCS short-circuit point, the computer device of the array substrate detecting procedure 4 is controlled to upload the file 4 containing the fuzzy coordinate value (x 1,4 ,y 1,4 ) of the DCS short-circuit point detected by the array substrate detecting procedure 4 into the Ftp server.

[0080] When the array substrate detecting procedure 5 detects the DCS short-circuit point, the computer device of the array substrate detecting procedure 5 is controlled to upload the file 5 containing the fuzzy coordinate value (x 1,5 ,y 1,5 ) of the DCS short-circuit point detected by the array substrate detecting procedure 5 into the Ftp server.

[0081] When the array substrate detecting procedure 6 detects the DCS short-circuit point, the computer device of the array substrate detecting procedure 6 is controlled to upload the file 6 containing the fuzzy coordinate value (x 1,6 ,y 1,6 ) of the DCS short-circuit point detected by the array substrate detecting procedure 6 into the Ftp server.

[0082] When the array substrate detecting procedure 7 detects the DCS short-circuit point, the computer device of the array substrate detecting procedure 7 is controlled to upload the file 7 containing the fuzzy coordinate value (x 1,7 ,y 1,7 ) of the DCS short-circuit point detected by the array substrate detecting procedure 7 into the Ftp server.

[0083] It can be understood that the computer devices of the array substrate detecting procedures 1-7 can be independent computer devices or the same computer device.

[0084] The Ftp server converts the files 1-7 and extracts the key field information, i.e. the fuzzy coordinate value of the DCS short-circuit point contained in the files 1-7, and saves it into the file 8 (not shown in the figure).

[0085] When the light-on detection procedure detects a DCS short-circuit point exhibiting a gradient-like line extending in the second direction (Y direction) without an end point, the computer device controlling the light-on detection procedure uploads file 9 containing the accurate first direction (X direction) coordinate x0 of the DCS short-circuit point detected by the light-on detection procedure to the Ftp server.

[0086] The Ftp server compares file 8 and file 9, and matches the accurate first direction coordinate x0 of the DCS short-circuit point and the more accurate second direction coordinate y 0` of the DCS short-circuit point to form a coordinate value (x0, y 0` ), which is saved to file 10, archived, and available for subsequent computer devices controlling maintenance to call.

[0087] In summary, the detection method for DCS short-circuit points of a liquid crystal display panel provided by embodiment one can effectively and with high accuracy locate the DCS short-circuit points, and can meet the mass production requirements of TFT-LCD display panels.

[0088] Example Two

[0089] As shown in Figure 7 , embodiment two provides a maintenance method for a liquid crystal display panel, including the following steps:

[0090] S210, detecting the liquid crystal display panel to obtain a coordinate value of a first short-circuit point, wherein the detection of the liquid crystal display panel is performed according to the detection method provided by embodiment one, and in the foregoing example, the coordinate value of the first short-circuit point is (x0, y 0` ), including an accurate first direction coordinate x0 and a more accurate second direction coordinate y 0` .

[0091] S220, cutting at least one region of the common electrode line overlapping with the orthogonal projection of the data line on the first substrate according to the coordinate value of the first short-circuit point.

[0092] It can be understood that in embodiment two, step S210 is a detection and positioning step, and step S220 is a maintenance step.

[0093] In one specific example, the cutting of the common electrode line in step S220 uses laser cutting, for example, from one side of the first substrate. Illustratively, the laser used to perform the laser cutting is a Nd:YAG laser with a wavelength of 1064 nm, which can penetrate the first substrate such as glass without damaging it and achieve pinpoint cutting of the common electrode line.

[0094] In one possible implementation, for step S220, Embodiment 2 provides the following two cutting methods:

[0095] (a) Cut the area of ​​the common electrode line that is closest to the first short-circuit point and overlaps with the data line on the first substrate by its orthographic projection.

[0096] (b) Cut the first predetermined number of regions of the common electrode line that overlap with the orthographic projection of the data line on the first substrate in the second direction centered on the first short-circuit point.

[0097] In particular, the cutting method (b) in Example 2 is an expanded maintenance method for DCS short circuit points, which can further ensure the success rate of maintenance.

[0098] In a specific example, the cutting methods (a) and (b) in Embodiment 2 can be further confirmed by AOI optical detection when determining the cutting position, for example:

[0099] The cutting method (a) in Example 2 can be further designed as follows:

[0100] Based on the coordinates (x0, y) of the first short-circuit point (DCS short-circuit point) 0` Optical detection is performed on at least one area of ​​the common electrode line that is close to the first short-circuit point and overlaps with the data line in the orthographic projection on the first substrate. If the actual position of the first short-circuit point is determined by the optical detection, the common electrode line corresponding to the first short-circuit point is cut. If the actual position of the first short-circuit point is not determined by the optical detection, the area of ​​the common electrode line that is closest to the first short-circuit point and overlaps with the data line in the orthographic projection on the first substrate is cut.

[0101] The cutting method (b) in Example 2 can be further designed as follows:

[0102] Based on the coordinates (x0, y) of the first short-circuit point (DCS short-circuit point) 0` Optical detection is performed on at least one area of ​​the common electrode line that is close to the first short-circuit point and overlaps with the data line in the orthographic projection on the first substrate. If the actual position of the first short-circuit point is determined by the optical detection, the common electrode line corresponding to the first short-circuit point is cut. If the actual position of the first short-circuit point is not determined by the optical detection, a first preset number of areas of the common electrode line that overlap with the data line in the orthographic projection on the first substrate in the second direction centered on the first short-circuit point are cut.

[0103] Further design of the cutting mode (b) in the above embodiment two is taken as an example, the realization principle is, in the circuit manufacturing process of the driving circuit layer, there can be for example small metal particle foreign matter and other bad conductive particles, causing the data line and the common electrode line short circuit. As shown in Figure 8 , taking the small metal particle foreign matter as an example, when the small metal particle foreign matter 107 is small in size, for example, it is buried between the data line 104 and the common electrode line 105, or in other words, it penetrates the insulating layer 106 between the data line 104 and the common electrode line 105 and does not contact the common electrode 108, it is invisible in optical detection. As shown in Figure 9 , when the small metal particle foreign matter 107` is large in size, for example, its thickness exceeds the sum of the thickness of the insulating layer 106 and the common electrode line 105, so that it penetrates the insulating layer 106 between the data line 104 and the common electrode line 105 and penetrates the common electrode line layer 105 to contact the common electrode 108, it is visible in optical detection, for example, the small metal particle foreign matter 107` can be observed as a black dot of 1 μm-2 μm through optical detection. Thus, after the coordinate value of the DCS short circuit point is determined by the detection method provided in embodiment one, the area near the coordinate value of the DCS short circuit point is first subjected to targeted optical detection based on the AOI equipment, if the bad conductive particles such as small metal particle foreign matter can be observed, it is directly cut, if the bad conductive particles such as small metal particle foreign matter cannot be observed, the first preset number of areas of the common electrode line 105 overlapping with the orthographic projection of the data line 104 on the first substrate in the second direction (Y direction) and centered on the coordinate value of the DCS short circuit point are subjected to laser cutting, so as to ensure that the cutting can cover the invisible bad conductive particles such as small metal particle foreign matter, and realize the repair of invisible bad. For example Figure 10 , if no bad conductive particles are observed in the area near the coordinate value of the DCS short circuit point shown by the cross in the middle of the solid circle in Figure 10 , the first preset number of areas of the common electrode line 105 overlapping with the orthographic projection of the data line 104 on the first substrate in the second direction (Y direction) and centered on the coordinate value of the DCS short circuit point are subjected to laser cutting, the object of laser cutting is the common electrode line 105, and the position of laser cutting is shown by the two diagonal lines in the dashed circle in Figure 10 .

[0104] Example Three

[0105] Embodiment three provides a liquid crystal display panel, comprising an array substrate and a color film substrate arranged in a cell, and a liquid crystal layer between the array substrate and the color film substrate, wherein the array substrate comprises a first substrate and a drive circuit layer arranged on the first substrate, the drive circuit layer comprises a plurality of gate lines extending in a first direction, a plurality of data lines extending in a second direction, and a common electrode line comprising a plurality of portions extending in the first direction and a plurality of portions extending in the second direction, the gate lines are arranged in a gate line layer, the data lines are arranged in a data line layer, and the common electrode line is arranged in a common electrode line layer, and an insulating layer is arranged between the common electrode line layer and the gate line layer and the data line layer, respectively, wherein the drive circuit layer comprises a poor conductive particle penetrating through the insulating layer and not penetrating through the common electrode line layer, the poor conductive particle forms a short circuit point between the data line and the common electrode line, and a projection of the short circuit point on the first substrate falls in an overlapping area of a projection of the data line on the first substrate and a projection of the common electrode line on the first substrate; for the short circuit point between the data line and the common electrode line, a cutting part is formed by a region of the common electrode line corresponding to the short circuit point and a second preset number of regions adjacent to the region in the second direction, the region and the second preset number of regions are regions in which the projection of the data line on the first substrate and the projection of the common electrode line on the first substrate overlap.

[0106] For example, the liquid crystal display panel provided by embodiment three is obtained by using the cutting method (b) of the expansion repair method provided by embodiment two to repair the poor conductive particles such as micro metal particle foreign matters that cannot be observed, and it can be understood that, in the example in embodiment two, when the first preset number is 5, the second preset number is 4, that is, the second preset number is one less than the first preset number.

[0107] The liquid crystal display panel provided by embodiment three can be any product or component with a display function, such as a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, a navigator, and the like, and the present embodiment is not limited thereto.

[0108] Example Four

[0109] As shown in Figure 11 embodiment four provides a detection method of a liquid crystal display panel, comprising the following steps:

[0110] S410. Perform multiple array substrate detections on the array substrate in the liquid crystal display panel to obtain at least one fuzzy coordinate value of the second shorting point. Among them, the array substrate includes a first substrate, multiple gate lines extending along a first direction, multiple data lines extending along a second direction, and a common electrode line composed of multiple parts extending along the first direction and multiple parts extending along the second direction on the first substrate. The second shorting point is a shorting point between the gate line and the common electrode line, and the fuzzy coordinate value of the second shorting point includes a third coordinate x2 in the first direction and a fourth coordinate in the second direction.

[0111] For example Figure 1 As shown, the liquid crystal display panel includes multiple sub-pixels arranged in an array. The array substrate includes a first substrate and a driving circuit layer provided on the first substrate. The driving circuit layer is provided with a pixel electrode 101 and a thin film transistor 102 in each sub-pixel region. The driving circuit layer further includes multiple Figure 1 gate lines 103 extending along the first direction ( Figure 1 shown as the row direction) shown in the X direction in Figure 1 multiple data lines 104 extending along the second direction ( Figure 1 shown as the column direction) shown in the Y direction in

[0112] and a common electrode line 105 composed of multiple parts extending along the first direction (X direction) and multiple parts extending along the second direction (Y direction). The second shorting point is a shorting point between the gate line 103 and the common electrode line 105, that is, the second shorting point is a GCS shorting point. The fuzzy coordinate value obtained by the array substrate detection includes a third coordinate x2 in the first direction (X direction) and a fourth coordinate y2 in the second direction (Y direction). Then, the fuzzy coordinate value of the second shorting point is (x2, y2). It can be understood that the fuzzy coordinate value of the second shorting point is the coordinate value in the rectangular coordinate system formed by the X-axis and the Y-axis.

[0112] In a possible implementation manner, the multiple array substrate detections include at least two types of array substrate detections. Thus, the fuzzy coordinate value of the second shorting point can be effectively and accurately obtained through the array substrate detection, thereby ensuring the effectiveness and accuracy of the subsequent processes.

[0113] In a specific example, similar to Embodiment 1, the array substrate detection in Embodiment 4 is, for example, the detection of the array substrate before the array substrate is paired with the color filter substrate. The at least two types of array substrate detections, for example, include optical detection based on an AOI device (abbreviated as AOI optical detection), open / short detection through a test signal (abbreviated as OS detection), detection based on an array detector (abbreviated as AT detection), CSI detection, etc.

[0114] In a possible implementation, each type of array substrate detection is performed at least once, and for a type of array substrate detection performed at least twice, the obtained at least two fuzzy coordinate values are averaged to obtain one fuzzy coordinate value. In this way, the effectiveness and accuracy of each type of array substrate detection can be further ensured.

[0115] S420, performing light-on detection on the liquid crystal display panel to obtain a sixth coordinate y0 of the second short-circuit point in the second direction.

[0116] In one specific example, the light-on detection is performed on the liquid crystal display panel after the array substrate is combined with the color film substrate to form the liquid crystal display panel, the GCS defect is manifested as a gradual line without end points extending along the first direction (X direction) in the light-on detection, and the sixth coordinate y0 of the GCS short-circuit point in the second direction (Y direction) can be determined by observation. It should be noted that the sixth coordinate y0 of the GCS short-circuit point in the second direction (Y direction) is regarded as an accurate coordinate in Embodiment Four.

[0117] S430, determining an eighth coordinate x of the second short-circuit point in the first direction according to a relationship between the sixth coordinate y0 of the second short-circuit point and at least one fourth coordinate y2 and at least one third coordinate x2. 0` , obtaining a coordinate value of the second short-circuit point including the eighth coordinate x 0` and the sixth coordinate y0.

[0118] For example, the third coordinate x2 and the fourth coordinate y2 of the GCS short-circuit point are included in the fuzzy coordinate value (x2, y2) of the GCS short-circuit point obtained by the array substrate detection, that is, in this embodiment, the third coordinate x2 and the fourth coordinate y2 of the GCS short-circuit point are both regarded as fuzzy coordinates. Since the GCS defect is manifested as a gradual line without end points extending along the first direction (X direction) in the light-on detection, the light-on detection of step S420 cannot determine the coordinate of the GCS short-circuit point in the first direction (X direction), and step S430, for example, matches the accurate second direction coordinate y0 of the GCS short-circuit point with the fuzzy second direction coordinate y1 based on big data analysis, so as to determine the more accurate first direction coordinate x of the GCS short-circuit point corresponding to the fuzzy first direction coordinate x1 of the fuzzy second direction coordinate y1. 0` , obtaining a coordinate value (x 0` , y0) composed of the more accurate first direction coordinate x 0` of the GCS short-circuit point and the accurate second direction coordinate y0, and completing the detection and positioning of the GCS short-circuit point.

[0119] In a possible implementation, for step S430, Embodiment Four provides the following three matching modes:

[0120] (1) determining the third coordinate x2 corresponding to the fourth coordinate y2 closest in value to the sixth coordinate y0 as the eighth coordinate x 0` .

[0121] (2) sorting the fourth coordinates y2 in ascending order of the difference between the value and the sixth coordinate y0, and determining the average of the third coordinates x2 corresponding to the first n2 sorted fourth coordinates y2 as the eighth coordinate x 0` in the first direction of the second short-circuit point, where n2 is a second preset value, and the second preset value n2 and the first preset value n1 in Embodiment One can be set to be equal or not equal.

[0122] (3) determining the average of the third coordinates x2 corresponding to the fourth coordinates y2 whose difference between the value and the sixth coordinate y0 is less than a second preset threshold value as the eighth coordinate x 0` .

[0123] The matching mode (3) in Embodiment Four can adapt to the structure of the liquid crystal display panel and ensure the accuracy of the coordinate value of the GCS short-circuit point obtained in step S430, for example, the second preset threshold value can be set to the interval between the adjacent parts extending along the second direction of the common electrode line.

[0124] Example Five

[0125] As shown in Figure 12 , Embodiment Five provides a maintenance method of a liquid crystal display panel, comprising the following steps:

[0126] S510, detecting the liquid crystal display panel to obtain the coordinate value of the second short-circuit point, wherein the detection of the liquid crystal display panel is performed according to the detection method provided in Embodiment Four, and in the foregoing examples, the coordinate value of the second short-circuit point is (x 0` , y0), including the relatively accurate first direction coordinate x 0` and the accurate second direction coordinate y0.

[0127] S520, cutting at least one area of the common electrode line overlapping with the orthogonal projection of the gate line on the first substrate according to the coordinate value of the second short-circuit point.

[0128] It can be understood that in Embodiment Five, step S510 is a detection positioning step, and step S520 is a maintenance step.

[0129] In one specific example, the cutting of the common electrode line in step S520 employs laser cutting, for example, from the first substrate side, and illustratively, the laser used to perform the laser cutting is a Nd:YAG laser with a wavelength of 1064 nm, the laser light emitted by which can penetrate through the first substrate, for example, glass, without damaging it and achieve point cutting of the common electrode line.

[0130] In one possible implementation, for step S520, embodiment five provides two cutting methods as follows:

[0131] (a) cutting the common electrode line in the region of the first substrate that overlaps the orthogonal projection of the gate line closest to the second short-circuit point.

[0132] (b) cutting the common electrode line in a first preset number of regions of the first substrate that overlap the orthogonal projection of the gate line and that are centered on the second short-circuit point in the first direction.

[0133] In which, the cutting method (b) in embodiment four is an expansion repair method for the GCS short-circuit point, whereby the success rate of the repair can be further guaranteed.

[0134] In one specific example, the cutting method (a) in embodiment four and the cutting method (b) in embodiment four can be further confirmed by AOI optical detection when determining the cutting position, if the actual position of the second short-circuit point is determined by the optical detection, the common electrode line corresponding to the second short-circuit point is cut, if the actual position of the first short-circuit point is not determined by the optical detection, the cutting is performed according to the above cutting method (a) or (b).

[0135] Example Six

[0136] Embodiment six provides a liquid crystal display panel, comprising an array substrate and a color film substrate arranged in a cell, and a liquid crystal layer between the array substrate and the color film substrate, wherein the array substrate comprises a first substrate and a drive circuit layer arranged on the first substrate, the drive circuit layer comprises a plurality of gate lines extending in a first direction, a plurality of data lines extending in a second direction, and a common electrode line comprising a plurality of portions extending in the first direction and a plurality of portions extending in the second direction, the gate lines are arranged in a gate line layer, the data lines are arranged in a data line layer, and the common electrode line is arranged in a common electrode line layer, and an insulating layer is arranged between the gate line layer and the data line layer, respectively, wherein the drive circuit layer comprises a poor conductive particle penetrating through the insulating layer and not penetrating through the common electrode line layer, the poor conductive particle forms a short circuit point between the gate line and the common electrode line, and a projection of the short circuit point on the first substrate falls in an overlapping area of a projection of the gate line on the first substrate and a projection of the common electrode line on the first substrate. For the short circuit point between the gate line and the common electrode line, a cutting portion is formed by an area of the common electrode line on the first substrate, which is overlapped by a projection of the gate line on the first substrate, and a second preset number of areas of the common electrode line on the first substrate, which are adjacent to the area in the first direction and are overlapped by a projection of the gate line on the first substrate.

[0137] For example, the liquid crystal display panel provided by Embodiment thirty-six is obtained by using the cutting method (b) of the expansion repair mode to repair the poor conductive particles such as micro metal particle foreign matters, which cannot be observed, by the repair method provided by Embodiment five.

[0138] The liquid crystal display panel provided by Embodiment six can be any product or component with display function, such as a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital photo frame, a navigator, etc., and the present embodiment is not limited thereto.

[0139] It can be understood that the detection methods of the liquid crystal display panels provided by Embodiments one and four can be simultaneously performed in the same detection process, that is, both the DCS short circuit points and the GCS short circuit points are detected in the same detection process, so as to simultaneously detect the two kinds of poor conductive particles. However, in actual process, the detection data uploading and saving are considered for easy realization of automation, and the detection methods are usually performed in different detection processes, respectively. In addition, the repair steps in the repair methods provided by Embodiments two and five can also be simultaneously performed in the same repair process, but in actual process, the repair methods are usually performed in different repair processes, respectively.

[0140] In the description of the present application, it needs to be explained that the terms "upper", "lower" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application. Unless otherwise expressly specified and limited, the terms "mounting", "connecting", "connecting" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or integrally connected; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium, or it can be the communication between two elements inside. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0141] It also needs to be explained that in the description of the present application, the relationship terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between the entities or operations. Moreover, the terms "include", "contain" or any other variant thereof are intended to cover non-exclusive inclusion, so that the process, method, article or equipment including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or further includes elements inherent to such process, method, article or equipment. Without more limitation, the element defined by the sentence "including a…" does not exclude the presence of other identical elements in the process, method, article or equipment including the element.

[0142] Obviously, the above embodiments of the present application are only examples for clearly illustrating the present application, and are not a limitation on the embodiments of the present application. For those skilled in the art, on the basis of the above description, other different forms of changes or variations can also be made, and it is impossible to enumerate all the embodiments here. Any obvious changes or variations derived from the technical solutions of the present application are still within the protection scope of the present application.

Claims

1. A method of detecting a liquid crystal display panel, characterized by, The method comprises the following steps: performing multiple array substrate detections on an array substrate in a liquid crystal display panel to obtain at least one fuzzy coordinate value of a first short-circuit point and / or at least one fuzzy coordinate value of a second short-circuit point, wherein the array substrate comprises a first substrate, a plurality of gate lines extending in a first direction, a plurality of data lines extending in a second direction, and a common electrode line composed of a plurality of parts extending in the first direction and a plurality of parts extending in the second direction, the first short-circuit point is a short-circuit point between a data line and the common electrode line, the second short-circuit point is a short-circuit point between a gate line and the common electrode line, the fuzzy coordinate value of the first short-circuit point comprises a first coordinate in the first direction and a second coordinate in the second direction, and the fuzzy coordinate value of the second short-circuit point comprises a third coordinate in the first direction and a fourth coordinate in the second direction; performing a lighting detection on the liquid crystal display panel to obtain a fifth coordinate in the first direction of the first short-circuit point and / or a sixth coordinate in the second direction of the second short-circuit point; determining a seventh coordinate in the second direction of the first short-circuit point according to a relationship between the fifth coordinate and at least one first coordinate of the first short-circuit point and at least one second coordinate, obtaining a coordinate value of the first short-circuit point comprising the fifth coordinate and the seventh coordinate, and / or determining an eighth coordinate in the first direction of the second short-circuit point according to a relationship between the sixth coordinate and at least one fourth coordinate of the second short-circuit point and at least one third coordinate, obtaining a coordinate value of the second short-circuit point comprising the eighth coordinate and the sixth coordinate; wherein the determining of the seventh coordinate in the second direction of the first short-circuit point according to the relationship between the fifth coordinate and at least one first coordinate of the first short-circuit point and at least one second coordinate comprises: determining the second coordinate corresponding to the first coordinate closest to the fifth coordinate as the seventh coordinate in the second direction of the first short-circuit point; or sorting the first coordinates in ascending order of the difference between the value and the fifth coordinate, and determining the average of the second coordinates corresponding to the first n1 coordinates in the sorted order as the seventh coordinate in the second direction of the first short-circuit point, n1 being a first preset value; or determining the average of the second coordinates corresponding to the first coordinates with a difference between the value and the fifth coordinate less than a first preset threshold value as the seventh coordinate in the second direction of the first short-circuit point; the determining of the eighth coordinate in the first direction of the second short-circuit point according to the relationship between the sixth coordinate and at least one fourth coordinate of the second short-circuit point and at least one third coordinate comprises: determining the third coordinate corresponding to the fourth coordinate closest to the sixth coordinate as the eighth coordinate in the first direction of the second short-circuit point; or sorting the fourth coordinates in ascending order of the difference between the value and the sixth coordinate, and determining the average of the third coordinates corresponding to the first n2 coordinates in the sorted order as the eighth coordinate in the first direction of the second short-circuit point, n2 being a second preset value, n2 = n1 or n2 ≠ n1; or determining the average of the third coordinates corresponding to the fourth coordinates with a difference between the value and the sixth coordinate less than a second preset threshold value as the eighth coordinate in the first direction of the second short-circuit point.

2. The method of claim 1, wherein, The multiple array substrate detections include at least two types of array substrate detections.

3. The method of claim 2, wherein, Each type of array substrate detection is performed at least once, and for a type of array substrate detection performed at least twice, at least two obtained fuzzy coordinate values are averaged to obtain one fuzzy coordinate value.

4. A method of repairing a liquid crystal display panel, characterized by, comprising: detecting according to the method of any one of claims 1-3 to obtain a coordinate value of a first short-circuit point and / or a coordinate value of a second short-circuit point; for the coordinate value of the first short-circuit point, cutting an area of at least one of the common electrode lines that overlaps with the data line in the orthogonal projection on the first substrate according to the coordinate value of the first short-circuit point; and for the coordinate value of the second short-circuit point, cutting an area of at least one of the common electrode lines that overlaps with the gate line in the orthogonal projection on the first substrate according to the coordinate value of the second short-circuit point.

5. The method of claim 4, wherein the cutting of the area of at least one of the common electrode lines that overlaps with the data line in the orthogonal projection on the first substrate according to the coordinate value of the first short-circuit point includes cutting an area of the common electrode line that is closest to the first short-circuit point and overlaps with the data line in the orthogonal projection on the first substrate; the cutting of the area of at least one of the common electrode lines that overlaps with the gate line in the orthogonal projection on the first substrate according to the coordinate value of the second short-circuit point includes cutting an area of the common electrode line that is closest to the second short-circuit point and overlaps with the gate line in the orthogonal projection on the first substrate.

6. The method of claim 4, wherein the cutting of the area of at least one of the common electrode lines that overlaps with the data line in the orthogonal projection on the first substrate according to the coordinate value of the first short-circuit point includes cutting a first preset number of areas of the common electrode line that overlap with the data line in the orthogonal projection on the first substrate and are centered on the first short-circuit point in a second direction; the cutting of the area of at least one of the common electrode lines that overlaps with the gate line in the orthogonal projection on the first substrate according to the coordinate value of the second short-circuit point includes cutting a first preset number of areas of the common electrode line that overlap with the gate line in the orthogonal projection on the first substrate and are centered on the second short-circuit point in a first direction.

7. A liquid crystal display panel, characterized by comprising: The liquid crystal display panel repaired according to the repairing method of any one of claims 4-6 comprises an array substrate and a color film substrate arranged in a cell, and a liquid crystal layer between the array substrate and the color film substrate, wherein the array substrate comprises a first substrate and a drive circuit layer arranged on the first substrate, the drive circuit layer comprises a plurality of gate lines extending in a first direction, a plurality of data lines extending in a second direction, and a common electrode line comprising a plurality of portions extending in the first direction and a plurality of portions extending in the second direction, the gate lines are located in a gate line layer, the data lines are located in a data line layer, and the common electrode line is located in a common electrode line layer, and an insulating layer is arranged between the common electrode line layer and the gate line layer and the data line layer, respectively, wherein the drive circuit layer comprises a poor conductive particle penetrating through the insulating layer and not penetrating through the common electrode line layer, and the poor conductive particle forms a short circuit point between the gate line and / or the data line and the common electrode line, and a normal projection of the short circuit point on the first substrate falls in an overlapping area of a normal projection of the gate line or the data line on the first substrate and a normal projection of the common electrode line on the first substrate; for the short circuit point between the gate line and the common electrode line, a cutting portion is formed in an area of the common electrode line corresponding to the short circuit point and a second preset number of areas adjacent to the area in the first direction, and the areas of the common electrode line correspond to an area of the gate line in the first substrate and an area of the gate line in the first substrate; and for the short circuit point between the data line and the common electrode line, a cutting portion is formed in an area of the common electrode line corresponding to the short circuit point and a second preset number of areas adjacent to the area in the second direction, and the areas of the common electrode line correspond to an area of the data line in the first substrate and an area of the data line in the first substrate.

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