Display substrate, detection method thereof and display device
By designing the connection method and detection method between the touch electrodes and signal lines in the display substrate, the problems of short circuit and open circuit of the touch electrodes are solved, achieving efficient detection and screening, and ensuring the independence of the touch function and the feasibility of detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BOE TECHNOLOGY GROUP CO LTD
- Filing Date
- 2021-08-31
- Publication Date
- 2026-04-10
AI Technical Summary
During the manufacturing process of touch display panels, short circuits may occur between adjacent touch electrodes, and the traces connecting the touch electrodes to the driver chip may become open, making detection difficult.
A display substrate structure was designed, in which the touch electrode is connected to the driver chip through a signal line, the test signal line passes through the gap between the driver chip and the circuit board and is connected to the test probe, and short circuit and open circuit are determined by detecting the resistance and capacitance values, and the test signal line does not cross other signal lines.
This technology enables effective detection of touch electrodes, filters out defective products, reduces the space occupied by test signal lines, and ensures the independence of touch functions and the feasibility of testing.
Smart Images

Figure CN115734692B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of display, in particular to a display substrate, a detection method thereof and a display device. BACKGROUND
[0002] The touch display panel comprises a light-emitting layer and a touch layer located on the light-emitting layer, the light-emitting layer comprises a plurality of sub-pixels, and the touch layer comprises a plurality of touch electrodes.
[0003] In the preparation process of the touch display panel, short circuit may occur between adjacent touch electrodes, and the wire connected to the driving chip may be disconnected, so the touch electrodes need to be detected in the preparation process of the touch display panel. SUMMARY
[0004] According to a first aspect of the embodiments of the present application, a display substrate is provided. The display substrate comprises a display area and a non-display area located at least on one side of the display area; the display substrate comprises:
[0005] a substrate;
[0006] a touch layer located on the substrate, the touch layer comprising a plurality of touch electrodes, the touch layer being located at least partially in the display area;
[0007] a driving chip located on the substrate, the driving chip being located in the non-display area, an area of the driving chip close to the display area being provided with a plurality of output pins, and an area of the driving chip away from the display area being provided with a plurality of input pins;
[0008] a circuit board located on the substrate, the circuit board being located in the non-display area and on the side of the driving chip away from the display area; the circuit board is provided with a plurality of connection pins; the input pins are electrically connected to the connection pins;
[0009] a plurality of signal lines, at least part of the touch electrodes being connected to the signal lines one by one; the signal lines comprise touch signal lines and test signal lines; the touch signal lines are connected to the touch electrodes and the output pins, and different test signal lines are connected to different output pins; one end of the test signal line is electrically connected to the output pin, and the other end extends beyond the side of the circuit board away from the display area, and at least part of the test signal lines pass through the gaps between adjacent input pins and the gaps between adjacent connection pins.
[0010] In one embodiment, the display substrate further comprises a plurality of test probes located in the non-display area, the plurality of test probes being located on the side of the circuit board away from the display area;
[0011] The plurality of touch electrodes are arranged in multiple rows and multiple columns, the plurality of touch electrodes are divided into a plurality of electrode groups, at least one of the electrode groups includes two or more of the touch electrodes, and adjacent two of the touch electrodes in the same electrode group are located in different rows and different columns; in the same electrode group, each of the touch electrodes is connected to the same test probe through a corresponding signal line, and test signal lines of different electrode groups do not intersect.
[0012] In one embodiment, at least two of the electrode groups include two or more of the touch electrodes, and the arrangement directions of the touch electrodes in the at least two electrode groups are the same.
[0013] In one embodiment, in at least one of the electrode groups, the number of rows in which each of the touch electrodes is located is equal to the number of columns in which each of the touch electrodes is located.
[0014] In one embodiment, the display substrate further includes a pixel driving circuit layer and a light emitting layer between the substrate and the touch layer, the pixel driving circuit layer and the light emitting layer are located in the display area, the light emitting layer is located between the pixel driving circuit layer and the touch layer, and the pixel driving circuit layer includes a plurality of conductive layers.
[0015] At least one of the test signal lines is arranged in the same layer as one of the conductive layers, and at least one of the test signal lines is arranged in the same layer as the touch electrodes; in the test signal lines arranged in the same layer, the test signal lines connected to different test probes do not intersect.
[0016] In one embodiment, the pixel driving circuit layer includes a pixel circuit, the pixel circuit includes a thin film transistor and a capacitor, the plurality of conductive layers include a gate electrode of the thin film transistor, a source electrode of the thin film transistor, and a capacitor plate of the capacitor, and at least one of the test signal lines is arranged in the same layer as at least one of the gate electrode, the source electrode, and the capacitor plate.
[0017] In one embodiment, the display substrate further includes a pixel driving circuit layer and a light emitting layer between the substrate and the touch layer, the light emitting layer is located between the pixel driving circuit layer and the touch layer, and the pixel driving circuit layer includes a plurality of pixel circuits, and the pixel circuits are electrically connected to the output pins.
[0018] According to a second aspect of the embodiments of the present application, a display device is provided, which includes the display substrate described above.
[0019] According to a fourth aspect of the embodiments of the present application, a detection method of a display substrate is provided. The display substrate includes a display area and a non-display area. The display substrate includes a substrate, a touch layer on the substrate, a plurality of test probes and a plurality of signal lines. The touch layer is located in the display area, and the plurality of test probes and the plurality of signal lines are located in the non-display area. The touch layer includes a plurality of touch electrodes arranged in multiple rows and multiple columns. The plurality of touch electrodes are divided into a plurality of electrode groups. At least one touch electrode includes two or more touch electrodes, and adjacent two touch electrodes in the same electrode group are located in different rows and different columns. Each touch electrode is electrically connected to the test probe through a signal line. In the same electrode group, each touch electrode is connected to the same test probe through a corresponding signal line, and the signal lines of different electrode groups do not intersect.
[0020] The detection method includes:
[0021] For each test probe, the resistance value between the test probe and other test probes is detected, and whether a short circuit occurs between the touch electrodes and the signal lines of the electrode group corresponding to the test probe and the touch electrodes and the signal lines of the electrode groups corresponding to other test probes is determined according to the resistance value.
[0022] For each test probe, the capacitance value of the touch electrodes and the signal lines of the electrode group corresponding to the test probe is detected, and whether a disconnection occurs in the signal line corresponding to the electrode group is determined according to the capacitance value.
[0023] In one embodiment, in at least one electrode group, the number of rows in which the touch electrodes are located and the number of columns in which the touch electrodes are located are equal.
[0024] The main technical effects achieved by the embodiments of the present application are:
[0025] The display substrate, the detection method thereof, the display panel and the display device provided by the embodiments of the present application are as follows: the touch electrodes are electrically connected to the output pins of the driving chip through the touch signal lines, the driving chip drives the touch electrodes, at least part of the touch electrodes are connected to the signal lines one by one, and the touch electrodes are independent of each other, so that the touch function of the display substrate is ensured; one end of the test signal line is electrically connected to the touch signal line through the output pin, and the other end is electrically connected to the test probe; the touch electrodes and the signal lines can be detected by applying an electrical signal to the test probe; at least part of the test signal lines pass through the gaps between the adjacent input pins and the gaps between the adjacent connection pins, that is, the test signal lines occupy part of the space of the driving chip and the circuit board, so that the size of the other wiring space occupied by the test signal lines can be reduced, and a large number of test signal lines arranged in the non-display area are possible, and therefore, the display substrate provided by the embodiments of the present application can detect the touch electrodes, screen out products with unqualified touch function, and prevent the products with unqualified touch function from flowing into the market. BRIEF DESCRIPTION OF DRAWINGS
[0026] Figure 1 FIG. 1 is a structural schematic diagram of a display substrate provided by an example embodiment of the present application;
[0027] Figure 2 FIG. 2 is a partial cross-sectional view of the display substrate provided by an example embodiment of the present application;
[0028] Figure 3 FIG. 3 is a structural schematic diagram of a display substrate provided by another example embodiment of the present application;
[0029] Figure 4 FIG. 4 is a structural schematic diagram of a display substrate provided by still another example embodiment of the present application;
[0030] Figure 5 FIG. 5 is an arrangement schematic diagram of the touch electrodes of the display substrate provided by an example embodiment of the present application;
[0031] Figure 6 FIG. 6 is an equivalent circuit diagram of one electrode group and the corresponding test probe provided by an example embodiment of the present application;
[0032] Figure 7 FIG. 7 is an equivalent circuit diagram of another electrode group and the corresponding test probe provided by an example embodiment of the present application;
[0033] Figure 8 FIG. 8 is an equivalent circuit diagram of still another electrode group and the corresponding test probe provided by an example embodiment of the present application;
[0034] Figure 9 FIG. 9 is an equivalent circuit diagram of two electrode groups provided by an example embodiment of the present application. DETAILED DESCRIPTION
[0035] The exemplary embodiments will be described in detail herein with reference to the attached drawings. In the following description, like reference numerals refer to like elements, unless the context clearly dictates otherwise. The following description is not meant to limit the application to all of the embodiments set forth herein. Rather, the following description is meant to provide examples of apparatus and methods consistent with the application as detailed in the appended claims.
[0036] The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and / or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.
[0037] It should be understood that although the terms first, second, third, etc. can be used herein to describe various information, but these information should not be limited to these terms. These terms are only used to distinguish one type of information from another type of information. For example, without departing from the scope of the application, the first information can also be called the second information, and similarly, the second information can also be called the first information. Depending on the context, the word "if" as used herein can be interpreted as "when" or "upon" or "in response to determining".
[0038] As described in the background, in the preparation process of the touch display panel, the touch electrodes need to be detected. The inventors found that when the touch display panel is a self-capacitance touch panel, the number of touch electrodes of the touch layer is large, and each touch electrode is connected to the driving chip through a signal line, so the number of signal lines is also large. If the touch electrodes are to be detected, each signal line needs to be connected to a test probe through a test signal line, and the number of test signal lines is also large. Limited by the wiring space of the display panel, there is no feasible solution for the arrangement of the test signal lines in the display panel, and the touch electrodes cannot be detected.
[0039] Embodiments of the present application provide a display substrate and a detection method thereof, a display panel and a display device. In the following, the display substrate and the detection method thereof, the display panel and the display device in the embodiments of the present application will be described in detail. In the case of no conflict, the features in the following embodiments can be complementary or combined with each other.
[0040] Embodiments of the present application provide a display substrate. As shown in Figure 1 and Figure 2As shown, the display substrate comprises a display area 101 and a non-display area 102 located at one side of the display area 101. Figure 1 In the embodiment shown, the non-display area 102 is located at one side of the display area 101. In other embodiments, part of the non-display area 102 is located at one side of the display area 101, and the other part is located at a different side of the display area 101, for example, the non-display area 102 can be arranged around the display area 101.
[0041] The display substrate comprises a substrate 85, a touch layer 87 located on the substrate 85, a driving chip 20 located on the substrate 85, a circuit board 30 located on the substrate 85, and a plurality of signal lines 50.
[0042] The touch layer 87 is at least partially located in the display area 101. Figure 1 In the embodiment shown, the touch layer 87 is located in the display area 101. In other embodiments, part of the touch layer 87 is located in the display area 101, and part of the touch layer 87 is located in the non-display area 101, for example, to ensure touch effect, the edge part of the touch layer 87 can cover the edge area of the non-display area 102 adjacent to the display area 101. The touch layer 87 comprises a plurality of touch electrodes 10, and the plurality of touch electrodes 10 can be arranged in an array. The driving chip 20 is located in the non-display area 102, and the driving chip 20 is provided with a plurality of output pins 21 near the area of the display area 101, and the driving chip 20 is provided with a plurality of input pins 22 away from the display area 101. The circuit board 30 is located in the non-display area 102 and located on the side of the driving chip 20 away from the display area 101. The circuit board 30 is provided with a plurality of connection pins 31. The input pins 22 and the connection pins 31 are electrically connected. One input pin 22 can be electrically connected to one connection pin 31.
[0043] At least part of the touch electrodes 10 are connected one by one with the signal lines 50. The signal lines 50 comprise touch signal lines 51 and test signal lines 52. The touch signal lines 51 connect the touch electrodes 10 and the output pins 21, and different touch signal lines 51 are connected to different output pins 21. One end of the test signal line 52 is electrically connected to the output pin 21, and the other end extends beyond the side of the circuit board 30 away from the display area 101, and at least part of the test signal line 52 passes through the gap between adjacent input pins 22 and the gap between adjacent connection pins 31.
[0044] The display substrate provided by the embodiment of the present application, the touch electrode 10 is electrically connected with the output pin 21 of the driving chip 20 through the touch signal line 51, the driving chip drives the touch electrode, at least part of the touch electrode is connected with the signal line one by one, then the touch electrodes are independent of each other, which can ensure the realization of the touch function of the display substrate; one end of the test signal line 52 is electrically connected with the touch signal line 51 through the output pin 21, and the other end can be electrically connected with the test probe, the touch electrode and the signal line can be detected by applying an electrical signal to the test probe; at least part of the test signal line 52 passes through the gap between the adjacent input pins 22 and the gap between the adjacent connection pins 31, that is, the part of the test signal line 52 occupies part of the space of the driving chip 20 and the circuit board 30, then the size of the other wiring space occupied by the test signal line 52 can be reduced, so that it is possible to arrange a large number of test signal lines 52 in the non-display area 102, therefore, the display substrate provided by the embodiment of the present application can detect the touch electrode, and screen out the products with unqualified touch function, so as to prevent the products with unqualified touch function from flowing into the market.
[0045] In one embodiment, the display substrate is a self-capacitive touch display substrate.
[0046] In some embodiments, each touch substrate of the display substrate corresponds to a signal line one by one, and each touch electrode 10 is connected with the corresponding signal line 50. Then, each touch electrode of the display substrate is independent of each other.
[0047] In one embodiment, in the display substrate, each test signal line 52 passes through the gap between the adjacent input pins 22 and the gap between the adjacent connection pins 31. In this way, the non-display area 102 of the display substrate does not need to additionally set a space for arranging the test signal line 52, which is more helpful for the arrangement of the test signal line 52.
[0048] In one embodiment, the non-display area 102 includes a fan-out area 1021 and a binding area 1022, and the binding area 1022 is located on the side of the fan-out area 1021 away from the display area 101. The driving chip 20 and the circuit board 30 are located in the binding area 1022. The touch signal line 51 passes through the fan-out area 1021.
[0049] In one embodiment, the width of the input pin 22 of the driving chip 20 is about 20 μm, the gap between the adjacent input pins 22 is about 10 μm, and the line width of the test signal line 52 ranges from 1.7 μm to 2 μm. The gap between the adjacent input pins 22 allows the test signal line 52 to pass through. In some embodiments, the gap between the adjacent input pins 22 can pass through one test signal line 52 or a plurality of test signal lines 52.
[0050] In one embodiment, the width of the connecting pins 31 of the circuit board 30 is about 65 μm, the gap between adjacent connecting pins 31 is about 55 μm, and the width of the test signal lines 52 is in the range of 1.7 μm to 2 μm. The gap between adjacent connecting pins 31 allows the test signal lines 52 to pass through. In some embodiments, the gap between adjacent connecting pins 31 can pass through one or more test signal lines 52.
[0051] In one embodiment, the circuit board is a flexible circuit board.
[0052] In one embodiment, the plurality of touch electrodes 10 are arranged in multiple rows and multiple columns. In the row direction, the plurality of touch signal lines 51 connected to the touch electrodes 10 in the same column of touch electrodes are located on the same side of the portion of the display area 101. Further, the touch signal lines 51 corresponding to each column of touch electrodes are located on the same side of the portion of the display area 101.
[0053] In one embodiment, referring to Figure 3 and Figure 4 , the display substrate further comprises a plurality of test probes 40 located in the non-display area 102, and the plurality of test probes 40 are located on the side of the circuit board 30 away from the display area 101. Each of the touch electrodes 10 is connected to one test probe 40. By applying an electrical signal to the test probe, the touch electrodes 10 can be detected to determine whether the touch signal lines 51 between the touch electrodes 10 and the test probe 40 are broken, and whether there is a short circuit between the touch electrodes 10 and adjacent touch electrodes 10.
[0054] In one embodiment, as shown in Figure 3 , the touch electrodes 10 correspond one-to-one to the test probes 40, and the touch electrodes 10 are connected to the corresponding test probes 40 through the signal lines 50.
[0055] In another embodiment, as shown in Figure 4 , the plurality of touch electrodes 10 are divided into a plurality of electrode groups 60, at least one of the electrode groups 60 includes two or more touch electrodes 10, and adjacent two touch electrodes 10 in the same electrode group 60 are located in different rows and different columns. In the same electrode group 60, each of the touch electrodes 10 is connected to the same test probe 40 through the corresponding signal line 50, and the test signal lines 52 of different electrode groups 60 do not intersect. Wherein, the intersection of the test signal lines refers to that the test signal lines are located in the same film layer and are arranged in a cross manner. The adjacent touch electrodes in the same electrode group refer to the two touch electrodes closest to each other in the electrode group, and there can be touch electrodes of other electrode groups between the two adjacent touch electrodes in the same electrode group. Figure 4The positional relationship of the normal projection of the test signal lines 52 of different electrode groups 60 on the substrate is shown. In practice, the test signal lines 52 of different electrode groups 60 do not cross each other, and the test signal lines 52 of different electrode groups 60 can be arranged on different layers to avoid crossing.
[0056] Since the two adjacent touch electrodes 10 in the same electrode group 60 are located in different rows and different columns, the two adjacent touch electrodes 10 in the same electrode group 60 basically do not have the problem of short circuit, and the touch signal lines 51 connected to the two adjacent touch electrodes 10 are far apart, and basically do not have the problem of short circuit. Therefore, when detecting the touch electrodes of the display substrate, it is not necessary to detect whether the touch electrodes in the same electrode group and the corresponding touch signal lines have the problem of short circuit.
[0057] In this embodiment, when detecting the touch electrodes of the display substrate, it is necessary to detect whether the different electrode groups have the problem of short circuit and whether the same electrode group has the problem of open circuit. The detection method of the display substrate includes the following steps:
[0058] For each test probe, the resistance value between the test probe and other test probes is detected, and it is determined according to the resistance value whether the touch electrodes and signal lines of the electrode group corresponding to the test probe and the touch electrodes and signal lines of the electrode group corresponding to other test probes have the problem of short circuit;
[0059] For each test probe, the capacitance value of the touch electrodes and signal lines of the electrode group corresponding to the test probe is detected, and it is determined according to the capacitance value whether the signal lines of the electrode group have the problem of open circuit.
[0060] When detecting the resistance value between the test probe and other test probes, the positive and negative poles of the power supply of the tester can be respectively contacted with two test probes. If it is detected that the resistance value between the two test probes is greater than a preset threshold, then the electrode groups and signal lines corresponding to the two test probes do not have the problem of short circuit; if it is detected that the resistance value between the two test probes is less than the preset threshold, then the electrode groups and signal lines corresponding to the two test probes have the problem of short circuit. This is because, when there is no short circuit between the two electrode groups and the corresponding signal lines, there is no electrical connection between the two electrode groups, and the resistance value between the two electrode groups is very large; when there is a short circuit between the two electrode groups and the corresponding signal lines, a path is formed by the two electrode groups and the corresponding signal lines, the test probe and the power supply of the tester, and then the resistance value between the two test probes detected by the tester is greatly reduced.
[0061] When testing the capacitance of the touch electrodes and signal lines of the electrode group corresponding to the test probe, a high-frequency electrical signal can be applied to the test probe using a tester to measure the capacitance value of the electrode group. When the electrode group includes two or more touch electrodes, the capacitance value detected by the test probe is equal to the sum of the capacitance to ground of each touch electrode and the capacitance to ground of the signal line. If an open circuit occurs in the same electrode group, such as a broken signal line, the capacitance value detected by the test probe decreases. When the capacitance value detected by the tester is within the corresponding threshold range, it is determined that there is no open circuit in the electrode group and signal line corresponding to the test probe; when the capacitance value detected by the tester is not within the corresponding threshold range, it is determined that there is an open circuit in the electrode group and signal line corresponding to the test probe. The threshold range of the electrode group is mainly related to the number of touch electrodes included in the electrode group. Different electrode groups include different numbers of touch motors, and the corresponding threshold range may be different. If the capacitance of the signal line is ignored, and there is no open circuit in the signal line, the capacitance value detected by the test probe is proportional to the number of touch electrodes in the electrode group.
[0062] In one embodiment, at least two electrode groups 60 include two or more of the aforementioned touch electrodes 10, and the touch electrodes 10 in the at least two electrode groups 60 are arranged in the same direction. This configuration results in a more regular arrangement of the touch electrodes in the touch electrode groups, facilitating the division of the electrode groups.
[0063] like Figure 5 As shown, the multiple touch electrodes 10 are divided into multiple rows, and the number of rows of touch electrodes can gradually increase from the side away from the non-display area 102 to the side closer to the non-display area 102; the multiple touch electrodes are also divided into multiple columns, and in the row direction, from one side of the display area to the other side, the number of columns of touch electrodes can gradually increase.
[0064] Furthermore, in at least one of the electrode groups, the sum of the number of rows and columns of each touch electrode is equal. This arrangement helps reduce the number of electrode groups and the number of test probes, resulting in a smaller space occupied by the test probes. This makes it easier for the display panel to accommodate the required test probes, enabling the touch electrodes to be tested using the test probes.
[0065] Furthermore, among the multiple touch electrodes on the display substrate, touch electrodes whose row number and column number are equal in sum belong to the same electrode group. This arrangement further reduces the number of electrode groups while ensuring that adjacent touch electrodes within the same electrode group are located in different rows and columns. This, in turn, further reduces the number of test probes and the space occupied by the test probes. Given the limited space in the non-display area of the display substrate, this arrangement better accommodates the required test probes.
[0066] Figure 5In the illustrated embodiment, the multiple touch electrodes of the display substrate are divided into m rows and n columns, with a total number of touch electrodes of m×n, and the touch electrodes are divided into m+n-1 electrode groups. Wherein, touch electrode S i,j This represents the touch electrode located in the i-th row and j-th column, for example, touch electrode S. 1,3 This represents the touch electrode located in row 1 and column 3, touch electrode S. m,n-1 This represents the touch electrode located in row m and column n-1. Figure 5 In the middle, the touch electrode S 1,1 For one electrode group 60; touch electrode S 2,1 With touch electrode S 1,2 Belonging to the same electrode group 60; touch electrode S 3,1 Touch electrode S 2,2 With touch electrode S 1,3 Belonging to the same electrode group 60; ... Touch electrode S m,n-1 With touch electrode S m-1,n Belonging to the same electrode group 60; touch electrode S m,n For one electrode group 60.
[0067] See you again Figure 4 The display substrate includes sixteen touch electrodes 10 arranged in four rows and four columns, which are divided into seven electrode groups 60. Electrode group 61 includes touch electrodes S. 1,1 Touch electrode S 1,1 The electrode assembly 62 is connected to the test probe 41 via signal line 50; the electrode assembly 62 includes touch electrodes S. 2,1 With touch electrode S 1,2 Touch electrode S 2,1 With touch electrode S 1,2 Each electrode is connected to the test probe 42; the electrode assembly 63 includes a touch electrode S. 3,1 Touch electrode S 2,2 With touch electrode S 1,3 Touch electrode S 3,1 Touch electrode S 2,2 With touch electrode S 1,3 Each electrode is connected to the test probe 43; the electrode assembly 64 includes the touch electrode S. 4,1 Touch electrode S 3,2 Touch electrode S 2,3 With touch electrode S 1,4 Touch electrode S 4,1 Touch electrode S 3,2 Touch electrode S 2,3 With touch electrode S 1,4 Each electrode is connected to the test probe 44; the electrode assembly 65 includes the touch electrode S. 4,2 Touch electrode S 3,3 With touch electrode S2,4 , touch electrode S 4,2 , touch electrode S 3,3 , touch electrode S 2,4 are connected to test probe 45 respectively; electrode group 66 includes touch electrode S 4,3 , touch electrode S 3,4 , touch electrode S 4,3 , touch electrode S 3,4 are connected to test probe 46 respectively; electrode group 67 includes touch electrode S 4,4 , touch electrode S 4,4 is connected to test probe 47. It is to be noted that, Figure 4 The touch electrodes are shown only schematically, in practice, the number of touch electrodes of the display substrate is much more than sixteen.
[0068] Figure 6 is an equivalent circuit diagram of test probe 41, electrode group 61 and its corresponding signal line 50. In the diagram, C1 represents the capacitance of touch electrode S 1,1 to ground, C1' represents the capacitance of signal line 50 to ground, R1 represents the resistance of touch electrode S 1,1 , and R1' represents the resistance of signal line 50. When the tester detects electrode group 61 and its corresponding signal line, the capacitance value of the detected electrode group and signal line is the sum of C1' and C1. When the signal line 50 connected to touch electrode S 1,1 is disconnected, the capacitance value detected by the tester is less than the sum of C1' and C1.
[0069] Figure 7 is an equivalent circuit diagram of test probe 42, electrode group 62 and its corresponding signal line 50. In the diagram, C1,2 represents the capacitance of touch electrode S 1,2 to ground, C1,2' represents the capacitance of signal line 50 connected to touch electrode S 1,2 to ground, R1,2 represents the resistance of touch electrode S 1,2 , and R1,2' represents the resistance of signal line 50 connected to touch electrode S 1,2 ; C2,1 represents the capacitance of touch electrode S 2,1 to ground, C2,1' represents the capacitance of signal line 50 connected to touch electrode S 2,1 to ground, R2,1 represents the resistance of touch electrode S 2,1 , and R2,1' represents the resistance of signal line 50 connected to touch electrode S 2,1 . When the tester detects electrode group 61 and its corresponding signal line, the capacitance value of the detected electrode group and signal line is the sum of C1' and C1. When the signal line 50 connected to touch electrode S 1,2 and / or touch electrode S 2,1When the connected signal line 50 is disconnected, the capacitance value detected by the tester is less than the sum of C1,2, C1,2', C2,1 and C2,1'.
[0070] Figure 8 The equivalent circuit diagram for testing probe 42, electrode group 62, and their corresponding signal lines 50 is shown. Where C1 and C3 represent touch electrodes S. 1,3 The capacitance to ground, C1,3' represents the capacitance to the touch electrode S. 1,3 The capacitance to ground of the connected signal line 50, R1,3 represent the touch electrode S 1,3 The resistors R1,3' represent the resistors connected to the touch electrode S. 1,3 The resistor of the connected signal line 50; C2,2 represents the touch electrode S 2,2 The capacitance to ground, C2,2' represents the capacitance to the touch electrode S. 2,2 The capacitance to ground of the connected signal line 50, R2,2 represents the touch electrode S 2,2 The resistor R2,2' represents the resistor connected to the touch electrode S. 2,2 The resistor connected to signal line 50; C3,1 represents the touch electrode S 3,1 The capacitance to ground, C3,1' represents the capacitance to the touch electrode S. 3,1 The capacitance to ground of the connected signal line 50, R3,1 represents the touch electrode S 3,1 The resistor R3,1' represents the resistor connected to the touch electrode S. 3,1 The resistance of the connected signal line 50. When the touch electrode S 1,3 Connected signal line 50, touch electrode S 2,2 Connected signal line 50 and / or touch electrode S 3,1 When the connected signal line 50 is disconnected, the capacitance value detected by the tester is less than the sum of C1,3, C1,3', C2,2, C2,2', C3,1 and C3,1'.
[0071] When the tester detects the resistance between two test probes, if there is no short circuit between the corresponding electrode groups and signal lines, the measured resistance value will be large, exceeding the resistance threshold, which can be in the kiloohm range. If there is a short circuit between the two electrode groups and signal lines, the measured resistance will be less than the preset threshold. During the manufacturing process of the display substrate, two adjacent touch electrodes located in the same row or column of two electrode groups may short-circuit. For example, Figure 4 In the embodiment shown, the touch electrode S 2,1 With touch electrode S 3,1 There may be residual conductive material between them, which could cause problems with the touch electrode S. 2,1 With touch electrode S 3,1 Short circuit.
[0072] Touch electrode S2,1 C2 represents the sum of capacitances of the touch electrode S 3,1 Short-circuiting, the equivalent circuit diagram of the electrode group 62 and the corresponding signal line, the electrode group 63 and the corresponding signal line, the test probe 42 and the test probe 43 is as shown in Figure 9 Figure 9 C2 represents the sum of capacitances of the touch electrode S 2,1 C2 represents the sum of capacitances of the touch electrode S 1,2 C2 represents the sum of capacitances of the touch electrode S 2,1 C2 represents the sum of capacitances of the touch electrode S 1,2 C2 represents the sum of capacitances of the touch electrode S 2,1 C2 represents the sum of capacitances of the touch electrode S 2,1 C2 represents the sum of capacitances of the touch electrode S 2,1 C2 represents the sum of capacitances of the touch electrode S 2,1 C2 represents the sum of capacitances of the touch electrode S 3,1 C2 represents the sum of capacitances of the touch electrode S 2,2 C2 represents the sum of capacitances of the touch electrode S 1,3 C2 represents the sum of capacitances of the touch electrode S 3,1 C2 represents the sum of capacitances of the touch electrode S 2,2 C2 represents the sum of capacitances of the touch electrode S 1,3 C2 represents the sum of capacitances of the touch electrode S 3,1 C2 represents the sum of capacitances of the touch electrode S 2,2 C2 represents the sum of capacitances of the touch electrode S 1,3 C2 represents the sum of capacitances of the touch electrode S 3,1 C2 represents the sum of capacitances of the touch electrode S 2,2 C2 represents the sum of capacitances of the touch electrode S 1,3 C2 represents the sum of capacitances of the touch electrode S 2,1 C2 represents the sum of capacitances of the touch electrode S 3,1 Short-circuiting, the test probe 42, the test probe 43, the electrode group 62 and the electrode group 63 form a loop, so the test probe 42 and the test probe 43 are less than the resistance threshold value.
[0073] In some embodiments, Figure 3 and Figure 4 may be a structural schematic diagram of an intermediate product of a display substrate. After detecting the touch substrate, the structure of the intermediate product shown in Figure 3 and Figure 4 may be cut, and the test probe is removed to obtain Figure 1 The structure is shown. In this way, the structural complexity of the display substrate can be reduced, and the size of the frame of the display panel can be reduced. The arrangement of the touch signal lines provided by the embodiments of the present application can ensure that the touch signal lines connected by each touch electrode are still independent after the test probe is removed, and the touch function of the display substrate is not affected.
[0074] In one embodiment, referring again to Figure 2 , the display substrate further comprises a pixel driving circuit layer and a light emitting layer 70 between the substrate 85 and the touch layer 87, the pixel driving circuit layer and the light emitting layer 70 are located in the display area 101, and the light emitting layer 70 is located between the pixel driving circuit layer and the touch layer 87. The pixel driving circuit layer comprises a plurality of pixel circuits, the light emitting layer 70 comprises a plurality of sub-pixels 701, the pixel circuits can correspond to the sub-pixels 701 one by one, and the pixel circuits drive the corresponding sub-pixels 701.
[0075] In one embodiment, the pixel circuit comprises a thin film transistor 90, the thin film transistor 90 comprises an active layer 91, a gate electrode 92, a first electrode 93, and a second electrode 94. One of the first electrode 93 and the second electrode 94 is a source electrode, and the other is a drain electrode.
[0076] The pixel driving circuit layer can further comprise a gate insulating layer 81, an interlayer dielectric layer 82, and a planarization layer 83. The gate insulating layer 81 is located between the active layer 91 and the gate electrode 92, the interlayer dielectric layer 82 is located between the gate electrode 92 and the planarization layer 83, part of the first electrode 93 and the second electrode 94 is located on the interlayer dielectric layer 82, and part thereof is electrically connected to the active layer 91 through a via hole penetrating the interlayer dielectric layer 82 and the gate insulating layer 81.
[0077] The pixel circuit can further comprise a capacitor (not shown), the capacitor comprises a first capacitor plate and a second capacitor plate located on the side of the first capacitor plate away from the substrate. The first capacitor plate can be formed in one process step with the gate electrode 92, the second capacitor plate can be located between the gate electrode 92 and the interlayer dielectric layer 82, and the display substrate further comprises a capacitor insulating layer located between the second capacitor plate and the gate electrode 92.
[0078] The pixel driving circuit layer comprises a plurality of conductive layers, the plurality of conductive layers comprise the gate electrode of the thin film transistor, the source electrode of the thin film transistor, and the capacitor plate of the thin film transistor, specifically the second capacitor plate of the capacitor.
[0079] In one embodiment, at least one of the test signal lines is arranged in the same layer as the conductive layer of the pixel driving circuit layer, and at least one of the test signal lines is arranged in the same layer as the touch electrode. The test signal lines arranged in the same layer are not intersected by the test signal lines connected to different test probes. By arranging at least one test signal line in the same layer as the conductive layer of the pixel driving circuit layer, and arranging at least one test signal line in the same layer as the touch electrode, it is helpful to avoid the test signal lines connected to different test probes from intersecting. It should be noted that the "same layer" in the embodiments of the present application can refer to a film layer on the same structure layer. Alternatively, for example, the film layers on the same layer can be layers formed by using the same film forming process to form a film layer for forming a specific pattern, and then patterning the film layer by using the same mask plate through a one-time patterning process. According to different specific patterns, the one-time patterning process can include multiple exposure, development or etching processes, and the specific patterns in the formed layer structure can be continuous or discontinuous. These specific patterns can also be at different heights or have different thicknesses.
[0080] In one embodiment, at least one of the test signal lines is arranged in the same layer as at least one of the gate electrode, the source electrode and the second capacitor plate of the capacitor.
[0081] In one embodiment, each conductive layer of the pixel driving circuit layer and the touch electrode are formed with at least one test signal line in a one-time patterning process. In this way, the test signal lines are distributed in multiple layers, which is more conducive to avoiding the test signal lines connected to different test probes from intersecting. In some embodiments, no two test signal lines intersect.
[0082] In one embodiment, referring again to Figure 2 The light emitting layer 70 includes a plurality of sub-pixels 701, each of which includes a first electrode 71, an organic light emitting layer 72 located on a side of the first electrode 71 away from the substrate 85, and a second electrode 73 located on a side of the organic light emitting layer 72 away from the substrate 85. The first electrode 71 can be an anode, and the second electrode can be a cathode. The second electrodes 73 of the sub-pixels 701 of the light emitting layer 70 can be a continuous surface electrode.
[0083] The light emitting layer 70 further includes a pixel defining layer 84 provided with a pixel opening corresponding to each sub-pixel. The first electrode is located between the pixel defining layer 84 and the planarization layer 83, and the pixel opening exposes at least part of the corresponding first electrode 71.
[0084] The sub-pixel 701 of the light-emitting layer 70 corresponds to a pixel circuit, and the pixel circuit drives the corresponding sub-pixel. The first electrode 71 of the sub-pixel 701 is electrically connected to a thin film transistor of the corresponding pixel circuit through a via hole penetrating the planarization layer 83.
[0085] In one embodiment, the pixel circuit is electrically connected to the output pin 21 of the driving chip 20, and one output pin is electrically connected to one pixel circuit. That is, the pixel circuit and the touch electrode are both driven by the driving chip 20. Such an arrangement can reduce the number of driving chips and help simplify the structural complexity of the display substrate.
[0086] The embodiments of the present application also provide a detection method of a display substrate. The detection method of the display substrate is used in any of the display substrates described in the above embodiments. The detection method comprises:
[0087] For each test probe, the resistance value between the test probe and other test probes is detected, and it is judged according to the resistance value whether a short circuit occurs between the touch electrodes and the signal lines of the electrode group corresponding to the test probe and the touch electrodes and the signal lines of the electrode groups corresponding to other test probes.
[0088] For each test probe, the capacitance value of the touch electrodes and the signal lines of the electrode group corresponding to the test probe is detected, and it is judged according to the capacitance value whether a short circuit occurs between the touch electrodes and the signal lines of the electrode group corresponding to the test probe.
[0089] The detection method provided by the embodiments of the present application can detect whether a short circuit occurs between different electrode groups and whether a short circuit occurs between the touch signal lines between the touch electrodes and the driving chip, and can reduce the number of test probes, so that the space occupied by the test probes is small, which is conducive to the display panel accommodating the required test probes, so that the detection of the touch electrodes is possible when the display substrate includes a large number of touch electrodes, and the yield of the display substrate can be improved.
[0090] In one embodiment, in at least one of the electrode groups, the number of rows in which the touch electrodes are located is equal to the number of columns in which the touch electrodes are located.
[0091] In one embodiment, the display substrate further comprises a driving chip and a circuit board located on the substrate, the driving chip and the circuit board are located in the non-display area, and the circuit board is located on the side of the driving chip away from the display area. The region close to the display area of the driving chip is provided with a plurality of output pins, and the region away from the display area of the driving chip is provided with a plurality of input pins; the circuit board is provided with a plurality of connection pins; and the input pins are electrically connected to the connection pins.
[0092] The signal lines include touch signal lines and test signal lines, the touch signal lines are connected with the touch electrodes and the output pins, one end of the test signal lines is electrically connected with the touch electrodes, the other end extends beyond the circuit board and is electrically connected with the test probe, and the test signal lines pass through the gaps between adjacent input pins and the gaps between adjacent connection pins.
[0093] The display substrate provided by the embodiments of the present application and the detection method of the display substrate belong to the same inventive concept, and the descriptions of related details and beneficial effects can be mutually referred to, and will not be repeated.
[0094] The embodiments of the present application also provide a display device, which comprises the display substrate according to any one of the above embodiments.
[0095] In one embodiment, the display device is a display panel, and the display panel further comprises an encapsulation layer 86 located on a side of the light-emitting layer 70 away from the substrate 85, and a touch layer 87 located on a side of the encapsulation layer 86 away from the substrate 85. In some embodiments, the encapsulation layer 86 can be a thin-film encapsulation layer.
[0096] In one embodiment, the display device comprises a housing and a display panel, and the display panel is arranged in the housing.
[0097] The display device provided by the embodiments of the present application may, for example, be any device having a display function, such as a mobile phone, a tablet computer, a television, a notebook computer, a vehicle-mounted device, etc.
[0098] It should be noted that in the drawings, the sizes of the layers and regions can be exaggerated for clarity. Also, it can be understood that when a component or layer is referred to as being "on" another component or layer, it can be directly on the other component or layer, or intervening layers can also be present. Further, it can be understood that when a component or layer is referred to as being "under" another component or layer, it can be directly under the other component or layer, or one or more intervening layers or components can also be present. In addition, it can be understood that when a layer or component is referred to as being "between" two layers or components, it can be the only layer or component between the two layers or components, or one or more intervening layers or components can also be present. Similar reference numerals denote like components throughout the specification.
[0099] Other embodiments of the present application will be apparent to those skilled in the art from consideration of the specification and practice of the application disclosed herein. It is intended that the present application cover any and all variations of the application that come within the scope of the claims and their equivalents. It is intended that the specification and examples be considered exemplary only, with the true scope and spirit of the application indicated by the following claims.
[0100] It is to be understood that the application is not limited to the precise construction already described above and shown in the drawings, and that various modifications and changes can be made by those skilled in the art without departing from the scope of the application. The scope of the application should only be limited by the claims appended hereto.
Claims
1. A display substrate, characterized by, The display substrate comprises a display area and a non-display area located at one side of the display area; the display substrate comprises: a substrate; a touch layer located on the substrate, the touch layer comprising a plurality of touch electrodes, the touch layer being at least partially located in the display area; a driving chip located on the substrate, the driving chip being located in the non-display area, the driving chip being provided with a plurality of output pins in a region close to the display area, the driving chip being provided with a plurality of input pins in a region away from the display area; a circuit board located on the substrate, the circuit board being located in the non-display area and on a side of the driving chip away from the display area; the circuit board being provided with a plurality of connecting pins; the input pins being electrically connected with the connecting pins; a plurality of signal lines, at least part of the touch electrodes being connected with the signal lines one by one; the signal lines comprising touch signal lines and test signal lines; the touch signal lines being connected with the touch electrodes and the output pins, different test signal lines being connected with different output pins; one end of the test signal lines being electrically connected with the output pins, the other end of the test signal lines extending beyond the side of the circuit board away from the display area, and at least part of the test signal lines passing through gaps between adjacent input pins and gaps between adjacent connecting pins.
2. The display substrate of claim 1, wherein, The display substrate further comprises a plurality of test probes located in the non-display area, the plurality of test probes being located on the side of the circuit board away from the display area; the plurality of touch electrodes being arranged in multiple rows and multiple columns, the plurality of touch electrodes being divided into a plurality of electrode groups, at least one of the electrode groups comprising two or more touch electrodes, and adjacent two touch electrodes in the same electrode group being located in different rows and different columns; in the same electrode group, each touch electrode is connected to the same test probe through a corresponding signal line, and test signal lines of different electrode groups do not intersect. 3.The display substrate of claim 2, wherein, At least two electrode groups comprise two or more touch electrodes, and the arrangement directions of the touch electrodes in the at least two electrode groups are the same.
4. The display substrate of claim 3, wherein, In at least one of the electrode groups, the number of rows in which each touch electrode is located is equal to the number of columns in which each touch electrode is located. 5.The display substrate of claim 2, wherein, The display substrate further comprises a pixel driving circuit layer and a light-emitting layer located between the substrate and the touch layer, the pixel driving circuit layer and the light-emitting layer being located in the display area, the light-emitting layer being located between the pixel driving circuit layer and the touch layer; the pixel driving circuit layer comprising a plurality of conductive layers; At least one test signal line is arranged in the same layer as one conductive layer, and at least one test signal line is arranged in the same layer as a touch electrode; among the test signal lines arranged in the same layer, the test signal lines connected with different test probes do not intersect. 6.The display substrate of claim 5, wherein, The pixel driving circuit layer comprises a pixel circuit, the pixel circuit comprising a thin film transistor and a capacitor, the plurality of conductive layers comprising a gate electrode of the thin film transistor, a source electrode of the thin film transistor, and a capacitor plate of the capacitor; At least one of the test signal lines is arranged in the same layer as at least one of the gate electrode, the source electrode, and a capacitor plate of the capacitor.
7. The display substrate of claim 1, wherein, The display substrate further comprises a pixel driving circuit layer and a light emitting layer between the substrate and the touch layer, the light emitting layer being between the pixel driving circuit layer and the touch layer; the pixel driving circuit layer comprises a plurality of pixel circuits, and the pixel circuits are electrically connected with the output pins.
8. A display device, characterized by comprising: The display device comprises the display substrate according to any one of claims 1 to 7.
9. A method for detecting a display substrate, characterized by, The display substrate comprises a display area and a non-display area; the display substrate comprises a substrate, a touch layer on the substrate, a plurality of test probes, and a plurality of signal lines; the touch layer is in the display area, and the plurality of test probes and the plurality of signal lines are in the non-display area; the touch layer comprises a plurality of touch electrodes arranged in a plurality of rows and a plurality of columns; the plurality of touch electrodes are divided into a plurality of electrode groups, at least one of the touch electrodes comprises two or more of the touch electrodes, and adjacent two of the touch electrodes in the same electrode group are located in different rows and different columns; each of the touch electrodes is electrically connected with the test probe through one of the signal lines; in the same electrode group, each of the touch electrodes is connected to the same test probe through a corresponding signal line, and the signal lines of different electrode groups do not intersect; The detection method comprises: For each of the test probes, detecting the resistance value between the test probe and each of the other test probes, and determining whether the touch electrodes and the signal lines of the electrode group corresponding to the test probe and the touch electrodes and the signal lines of the electrode group corresponding to each of the other test probes are short-circuited according to the resistance value; For each of the test probes, detecting the capacitance value of the touch electrodes and the signal lines of the electrode group corresponding to the test probe, and determining whether the signal lines of the electrode group are disconnected according to the capacitance value. 10.The detection method of the display substrate according to claim 9, characterized in that, In at least one of the electrode groups, the sum of the number of rows in which the touch electrodes are located and the number of columns in which the touch electrodes are located is equal.
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