A controllable voltage regulating circuit, method and testing system for detonator testing

Abstract

The application provides a controllable voltage regulating circuit, method and test system for detonator testing, which can automatically regulate output voltage for detonator chip testing, improves test efficiency, and has high output precision. The controllable voltage regulating circuit comprises a power management chip, a voltage sampling unit connected to a test voltage output end of the power management chip, which samples output voltage of the power management chip, an AD conversion unit connected to the voltage sampling unit, which converts collected analog voltage signals into digital voltage signals, a control unit connected to an output end of the AD conversion unit, which is used for receiving the converted digital voltage signals, a digital potentiometer connected to the control unit and the power management chip, the control unit communicates with the digital potentiometer according to the received digital voltage signals, adjusts resistance of the digital potentiometer, and the power management chip adjusts output test voltage according to resistance change of the digital potentiometer.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electronic detonator, in particular to a controllable voltage regulating circuit, method and testing system for detonator testing. BACKGROUND

[0002] The present application is used in the field of industrial electronic detonator chip, in particular to test the electrical performance parameters and return parameters of detonator chip under different temperatures, different voltages, different polarities and different instructions. A large amount of test data can find the bug or various limit parameters of the chip, and provide data support for the revision and optimization of the chip.

[0003] When testing the detonator chip, various electrical performance parameters under different voltages need to be tested, which has certain requirements for voltage regulation. The manual voltage regulation is manually inputting the required voltage through a direct current power supply. The output accuracy of the direct current power supply directly determines the accuracy of voltage regulation. Assuming that the voltage test range is 5-25V (step 0.2V), it needs to be manually adjusted (25-5) / 0.2=100 times, which is time-consuming and laborious, and the test efficiency is too low to affect the overall project progress. Therefore, a test circuit capable of automatically adjusting the voltage is needed. SUMMARY

[0004] In view of the above problems, the present application provides a controllable voltage regulating circuit, method and testing system for detonator testing, which can automatically adjust the output voltage for detonator chip testing, improve the test efficiency, and has high output accuracy.

[0005] The technical scheme is as follows: a controllable voltage regulating circuit for detonator testing, comprising the following in connection:

[0006] A power management chip for outputting adjustable test voltage;

[0007] A voltage sampling unit connected to the test voltage output end of the power management chip for sampling the output voltage of the power management chip;

[0008] An AD conversion unit connected to the sampling output end of the voltage sampling unit for converting the collected analog voltage signal into a digital voltage signal;

[0009] A control unit connected to the output end of the AD conversion unit for receiving the converted digital voltage signal;

[0010] A digital potentiometer connected to the control unit and the power management chip;

[0011] The control unit communicates with the digital potentiometer according to the received digital voltage signal, adjusts the resistance value of the digital potentiometer, and the power management chip adjusts the output test voltage according to the resistance value change of the digital potentiometer.

[0012] Further, the output precision adjusting unit further comprises a relay, a first switch circuit of the relay is connected with one end of a first resistor, the other end of the first resistor is connected with the digital potentiometer; a second switch circuit of the relay is connected with one end of a second resistor, the other end of the second resistor is connected with the digital potentiometer, the relay is further connected with the control unit, the control unit can control the opening and closing of the first switch circuit and the second switch circuit of the relay, and the resistance value of the second resistor is much larger than that of the first resistor.

[0013] Further, the power management chip adopts a DC-DC power chip, the 1 port of the power management chip U1 can output a voltage Vout, the 1 port of the power management chip U1 is further connected with a diode D2 and connected with capacitors C5, C6 and C2 in parallel and then grounded, the 2 port of the power management chip U1 is grounded, the 3 port of the power management chip U1 is connected with a resistor R7 and then connected with the 7 port of a digital potentiometer U4, the model of the digital potentiometer U4 is AD5160BRJZ10-RL7, the 4, 5 and 6 ports of the digital potentiometer U4 are used for connecting with the control unit, the 6 port of the digital potentiometer U4 is connected with a resistor R9 and then connected with a 3.3V voltage, the 2 port of a relay K14 belonging to the first switch circuit is connected with one end of a first resistor R1, the other end of the first resistor R1 is connected with one end of the resistor R7, the 4 port of the relay K14 belonging to the second switch circuit is connected with one end of a second resistor R2, the other end of the second resistor R2 is connected with one end of the resistor R7, the 1 and 8 ports of the relay K14 are connected with a diode D31, the 8 port of the relay K14 is connected with the 3 port of a triode Q3, the 2 port of the triode Q3 is grounded, the 1 port of the triode Q3 is connected with a resistor R4 and then connected with the control unit, and the 1 port of the triode Q3 is connected with the resistors R4 and R48 and then grounded.

[0014] A method for adjusting output voltage of a controllable voltage regulating circuit for detonator testing, comprising the following steps:

[0015] The control unit controls the relay to close the first switch circuit, the control unit communicates with the digital potentiometer, adjusts the resistance value of the digital potentiometer, and then adjusts the output voltage of the power management chip;

[0016] The precision of the output voltage ΔVout is calculated, and when ΔVout is greater than a set threshold value, the control unit controls the relay to open the first switching circuit and close the second switching circuit, so that the output voltage precision ΔVout is kept within an allowable range by the second resistor.

[0017] Further, the output voltage Vout is calculated according to the following formula:

[0018] Vout = Vfb * (1 + R 继 / R)

[0019] Wherein, Vfb is the feedback voltage of the known power management chip, R is the resistance value of the digital potentiometer, R 继 is the resistance value of the resistor in the switching circuit accessed by the relay.

[0020] Further, the output voltage precision ΔVout is calculated according to the following formula:

[0021] ΔVout = Vfb * (1 + R 继 / R-ΔR) - Vfb * (1 + R 继 / R)

[0022] Wherein, ΔVout is the output voltage precision, Vfb is the feedback voltage of the known power management chip, R is the resistance value of the digital potentiometer, R 继 is the resistance value of the resistor in the switching circuit accessed by the relay, and ΔR is the adjustment precision of the potentiometer.

[0023] A test system for electronic detonators, characterized in that it comprises the controllable voltage regulating circuit for detonator testing described above, and further comprises:

[0024] A system control module, which is connected to the detonator chip to be tested through a bus channel switching circuit, wherein the bus channel switching circuit is provided with multiple channels for connecting detonators; the controllable voltage regulating circuit is connected to the detonator chip to be tested through the bus channel switching circuit, and is used to provide different test voltages for the detonator chip to be tested;

[0025] A communication module, which is connected to the detonator chip to be tested through the bus channel switching circuit, and is further connected to the system control module; the system control module receives the test feedback results of the detonator chip to be tested through the communication module;

[0026] A power module for power supply;

[0027] A serial communication circuit, which is connected to the system control module and is used for communication with the upper computer.

[0028] The application is a controllable voltage regulating circuit for detonator testing, which can realize automatic voltage regulation through cooperation of a control module and a digital potentiometer. The control module can change the resistance R of the digital potentiometer through communication, so as to realize regulation of the output voltage. Through voltage sampling and AD conversion, the control module can obtain the specific value of the output voltage at this time. If the deviation from the set value exceeds the range, the single-chip microcomputer can continue to regulate the resistance of the digital potentiometer, so that the output voltage is infinitely close to the set value. In addition, the controllable voltage regulating circuit for detonator testing can realize precision control of the output voltage in different voltage ranges through the output precision adjusting unit, control module, relay switching and connection with the first resistor and the second resistor, so as to ensure that the precision of the output voltage is within the allowable range and ensure the reliability of the test. BRIEF DESCRIPTION OF DRAWINGS

[0029] Figure 1 A circuit block diagram of a controllable voltage regulating circuit for detonator testing in the embodiment;

[0030] Figure 2 An equivalent circuit schematic diagram of part of the controllable voltage regulating circuit for detonator testing in the embodiment;

[0031] Figure 3 A partial circuit principle diagram of the controllable voltage regulating circuit for detonator testing in the embodiment;

[0032] Figure 4 A system composition block diagram of the test system of the electronic detonator in the embodiment. DETAILED DESCRIPTION

[0033] See Figure 1 The controllable voltage regulating circuit for detonator testing of the application comprises the following in connection:

[0034] A power management chip 1 for outputting adjustable test voltage;

[0035] A voltage sampling unit 2 connected to the test voltage output end of the power management chip 1 for sampling the output voltage of the power management chip 1;

[0036] An AD conversion unit 3 connected to the sampling output end of the voltage sampling unit 2 for converting the collected analog voltage signal into a digital voltage signal;

[0037] A control unit 4 connected to the output end of the AD conversion unit 3 for receiving the converted digital voltage signal. The control unit 4 can adopt a single-chip microcomputer or other control chip;

[0038] A digital potentiometer 5 connected to the control unit 4 and the power management chip 1.

[0039] The control unit 4 communicates with the digital potentiometer 5 according to the received digital voltage signal, adjusts the resistance value of the digital potentiometer 5, and the power management chip 1 adjusts the output test voltage according to the resistance value change of the digital potentiometer.

[0040] The feedback voltage of the power management chip 1 is Vfb, the resistance value of the digital potentiometer 5 is R, and the output voltage of the power management chip 1 is Vout. Figure 1 The controllable voltage regulating circuit is simplified to obtain Figure 2 , Figure 2 The equivalent circuit schematic diagram of part of the controllable voltage regulating circuit is shown in the figure;

[0041] According to Ohm's law, there are:

[0042]

[0043] Among them, the feedback voltage of the power management chip is Vfb, the resistance value of the digital potentiometer is R, and the output voltage is Vout. Vfb can be obtained from the power management chip manual and is a fixed known number.

[0044] After transformation, Vout = Vfb*(1+R1 / R) can be obtained, so that the single-chip microcomputer can change the resistance value R of the digital potentiometer through SPI communication, and the output voltage Vout can be adjusted, that is, the voltage can be regulated. Through the voltage sampling circuit and the ADC (analog-to-digital conversion) function, the single-chip microcomputer can obtain the specific value of the voltage output Vout at this time. If the deviation from the set value exceeds the range, the single-chip microcomputer can continue to adjust the resistance value of the digital potentiometer, so that the output of Vout is infinitely close to the set value.

[0045] In order to realize the precision control of the output voltage in different voltage ranges, ensure the precision of the output voltage within the allowed range, and ensure the reliability of the test, in the embodiment of the application, an output precision adjusting unit is further included. The output precision adjusting unit includes a relay 61, a first switch circuit of the relay is connected with one end of a first resistor R1, the other end of the first resistor R1 is connected with the digital potentiometer 4; a second switch circuit of the relay 61 is connected with one end of a second resistor R2, the other end of the second resistor R2 is connected with the digital potentiometer 4, and the relay 61 is further connected with the control unit 4. The control unit 4 can control the opening and closing of the first switch circuit and the second switch circuit of the relay 5. The resistance value of the second resistor 62 is much larger than that of the first resistor 61. By controlling the relay to switch the first resistor R1 and the second resistor R2 through the single-chip microcomputer, the precision of the output voltage Vout in different voltage ranges can be realized. The following is an example:

[0046] Assuming the maximum resistance of the digital potentiometer is Rmax, and there are 256 steps, the precision of this potentiometer is ΔR = Rmax / 256, when the current resistance of the potentiometer R is much greater than ΔR, it can be approximated that R ≈ R + ΔR ≈ R - ΔR,

[0047] At this time, the precision of the output voltage is:

[0048] ΔVout = Vfb * (1 + R1 / R - ΔR) - Vfb * (1 + R1 / R) ≈ 0, that is, the precision of the output voltage is very high;

[0049] But as R decreases to and ΔR of the same order of magnitude, ΔVout will also increase, that is, if R1 is used at this time, the precision of the voltage will be lower and lower when the output voltage is high, that is, as ΔR increases, the value of ΔVout will also increase. In order to solve the problem that the precision of the output voltage is getting lower and lower in the high voltage range, a second resistor R2 is introduced in the embodiment, the resistance of the second resistor 62 is much larger than the resistance of the first resistor 61, ΔVout can be calculated by the voltage acquisition circuit through the single-chip microcomputer, a threshold value can be set, when ΔVout > threshold value, the single-chip microcomputer controls the relay to switch the first resistor R1 to the second resistor R2, so that the problem of precision decline caused by the current resistance R of the potentiometer decreasing to and the precision ΔR of the potentiometer to an order of magnitude can be offset by the increase of the second resistor R2, so as to continue to maintain the output voltage precision ΔVout within the allowable range.

[0050] The settings of the first resistor R1 and the second resistor R2 are necessary, assuming that the first resistor R1 is not switched to the second resistor R2, and a second resistor R2 with a large resistance is used directly, when the resistance of the digital potentiometer is the minimum resistance Rmin, the maximum output voltage at this time is:

[0051] Vout(max) = Vfb * (1 + R2 / Rmin);

[0052] And when the resistance of the digital potentiometer is Rmax, the minimum output voltage at this time is

[0053] Vout(min) = Vfb * (1 + R2 / Rmax);

[0054] If R2 is large, R2 / Rmin will be close to R2 / Rmax, which will result in that the maximum and minimum values of the output voltage are close, that is, the output voltage range is very narrow, although the precision of the output voltage is high, but the output range is very narrow and cannot meet the requirement of wide voltage range for testing.

[0055] See Figure 3In the embodiment of the application, a partial circuit diagram of the controllable voltage regulating circuit for detonator testing is also given, the power management chip adopts a DC-DC power chip, which can include a step-down chip and a step-up chip, the 1 port of the power management chip U1 can output a voltage Vout, the 1 port of the power management chip U1 is grounded after being connected with a diode D2 and parallel capacitors C5, C6 and C2, the 2 port of the power management chip U1 is grounded, the 3 port of the power management chip U1 is connected to the 7 port of a digital potentiometer U4 after being connected with a resistor R7, the digital potentiometer U4 is of the model AD5160BRJZ10-RL7, the 4, 5 and 6 ports of the digital potentiometer U4 are used for connecting a control unit, the 6 port of the digital potentiometer U4 is connected to a 3.3V voltage after being connected with a resistor R9, the 2 port of a relay K14 belonging to a first switch circuit is connected to one end of a first resistor R1, the other end of the first resistor R1 is connected to one end of the resistor R7, the 4 port of the relay K14 belonging to a second switch circuit is connected to one end of a second resistor R2, the other end of the second resistor R2 is connected to one end of the resistor R7, a diode D31 is connected between the 1 and 8 ports of the relay K14, the 8 port of the relay K14 is connected to the 3 port of a triode Q3, the 2 port of the triode Q3 is grounded, the 1 port of the triode Q3 is connected to the control unit after being connected with a resistor R4, the 1 port of the triode Q3 is grounded after being connected with resistors R4 and R48, the power management chip in the embodiment adopts the model AP3012KTR-G1, and in other embodiments, other models of DC-DC power chips, including LMR64010XMF and LT1935ES5, can also be adopted.

[0056] In the embodiment of the application, a method for adjusting the output voltage of the controllable voltage regulating circuit for detonator testing is also provided, which includes the following steps:

[0057] In the first stage, when the output voltage is small, the control unit controls the relay to close the first switch circuit, the control unit communicates with the digital potentiometer, adjusts the resistance value of the digital potentiometer, and then adjusts the output voltage of the power management chip.

[0058] In the second stage, when the output voltage is large, the accuracy ΔVout of the output voltage is continuously calculated, when ΔVout is greater than a set threshold value, the control unit controls the relay to open the first switch circuit and close the second switch circuit, and the second resistor is used to keep the accuracy ΔVout of the output voltage within the allowed range.

[0059] Specifically, the accuracy ΔVout of the output voltage is calculated by the following formula:

[0060] ΔVout = Vfb * (1 + R 继 / R - ΔR) - Vfb * (1 + R继

[0061] Wherein, the output voltage precision is ΔVout, the feedback voltage of the known power management chip is Vfb, the resistance value of the digital potentiometer is R, the resistance value of the resistance on the switch circuit to which the relay is connected is R 继 , and the adjustment precision of the potentiometer is ΔR.

[0062] The first stage: in use, assuming that the current set voltage is V1, the maximum output precision is ΔVout, at this time, the relay is controlled to switch to the first resistance R1 gear, and the resistance R can be obtained through the formula Vout = Vfb*(1+R1 / R), wherein Vfb is known from the manual of the power management chip. When the resistance of the potentiometer is equal to R, the corresponding gear m = R / ΔR can be obtained from the specification book of the digital potentiometer, at this time, the value of m is converted into binary, and the binary data is sent to the digital potentiometer through the SPI bus by the single-chip microcomputer as the control module, so that the corresponding resistance R is obtained, and the required output voltage V1 is obtained.

[0063] The second stage: when the resistance of the potentiometer is R, the corresponding output voltage is V1; at this time, the digital potentiometer is adjusted again, the resistance of the potentiometer is adjusted to R+ΔR, the corresponding output voltage is V2, and the output voltage precision is V1-V2, V1-V2 = ΔVout.

[0064] At this time, the acceptable voltage output precision threshold is ΔV, so when V1-V2>ΔV, the relay needs to be controlled to switch to the second resistance R2 gear, so as to realize the controllable precision of the output voltage.

[0065] See Figure 4 , in the embodiment of the application, a test system of an electronic detonator is also provided, which comprises the controllable voltage regulating circuit 100 for testing the detonator described above, and further comprises:

[0066] a system control module 200, the system control module 200 is connected with a detonator chip 400 to be tested through a bus channel switching circuit 300, the bus channel switching circuit 300 is provided with a plurality of channels and is respectively used for connecting the detonator; the controllable voltage regulating circuit 100 is connected with the detonator chip 400 to be tested through the bus channel switching circuit 300 and is used for providing different test voltages for the detonator chip 400 to be tested;

[0067] a communication module 500, the communication module 500 is connected with the detonator chip 400 to be tested through the bus channel switching circuit 300, the communication module 500 is also connected with the system control module 200, and the system control module 200 receives the test feedback result of the detonator chip 400 to be tested through the communication module 500;

[0068] ​A power module 600 for supplying power;

[0069] A serial communication circuit 700 connected to the system control module 200 for communication with the host computer.

[0070] As shown in Figure 4 , wherein the to-be-tested detonator chip 400 is provided with 10, and the to-be-tested detonator chip 400 is connected to the test system of the electronic detonator of the application through two BUS buses. Assuming that 10 detonator chips need to be tested, each detonator chip needs to test the chip data under 100 different voltages and two polarities of 5-25V with a step of 0.2V at low temperature / normal temperature / high temperature three temperatures. Before the test system of the application, 6000 times of testing are required, which is a great burden on the progress of the project and the working hours of the personnel. If the above test system is used, only the test parameters need to be configured at three different temperatures, and then sent to the single-chip microcomputer as the system control module. The system can realize different voltages, different polarities and switching of different modules through the BUS channel switching circuit 300. Finally, the data of the 10 to-be-tested detonator chips 400 are processed and summarized and returned to the system control module and sent to the host computer through the serial communication circuit. The personnel only need to collect data, and the personnel can do other things during the test without full-time attendance, which greatly improves the test efficiency and reduces the working hours.

[0071] The working method of the test system of the electronic detonator in the embodiment is described below, taking normal temperature test as an example.

[0072] 1. Connect 10 to-be-tested detonator chips 400 to the corresponding interfaces;

[0073] 2. Set the required test voltage range, BUS polarity and required chip reading frequency and other parameters on the host computer, and then send instructions to the system control module 200 through the serial communication circuit 700;

[0074] 3. The system control module 200 receives and analyzes the data, and sends the corresponding data to the corresponding module, such as the controllable voltage regulating circuit 100, etc.

[0075] 4. After the BUS channel switching circuit 300 completes the setting, the system control module 200 starts to read the chip under the set conditions through the communication module 500, and then sends the data back to the host computer PC through the serial communication circuit 700, and to the user;

[0076] 5. After waiting for all the test items to be completed, the user only needs to collect the test data to complete the test work at normal temperature.

[0077] The high-temperature and low-temperature test only needs to put the module to be tested into a high-low temperature test box, and after a certain time, the normal-temperature steps are repeated.

[0078] It is apparent to those skilled in the art that the application is not limited to the details of the foregoing exemplary embodiments, and that the application can be implemented in other particular forms without departing from the spirit or essential characteristics of the application. The embodiments should therefore be considered in all respects as illustrative and not restrictive, the scope of the application being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein.

[0079] Furthermore, it should be understood that although the present specification describes exemplary embodiments, the present specification does not limit the application to these embodiments alone. The specification is only exemplary and illustrative and, as such, variations or modifications exist therein that should be considered as falling within the scope of the application.

Claims

1. A controllable voltage regulating circuit for testing of detonators, characterized in that, The application relates to a power management chip, which comprises the following parts which are connected with each other: a power management chip for outputting adjustable test voltage; a voltage sampling unit connected to the test voltage output end of the power management chip for sampling the output voltage of the power management chip; an AD conversion unit connected with the sampling output end of the voltage sampling unit for converting the collected analog voltage signal into a digital voltage signal; a control unit connected with the output end of the AD conversion unit for receiving the converted digital voltage signal; a digital potentiometer connected with the control unit and the power management chip; the control unit communicates with the digital potentiometer according to the received digital voltage signal, adjusts the resistance value of the digital potentiometer, and the power management chip adjusts the output test voltage according to the resistance value change of the digital potentiometer; the output precision adjusting unit further comprises a relay, the first switch loop of the relay is connected with one end of a first resistor, the other end of the first resistor is connected with the digital potentiometer; the second switch loop of the relay is connected with one end of a second resistor, the other end of the second resistor is connected with the digital potentiometer, and the relay is further connected with the control unit; the control unit can control the opening and closing of the first switch loop and the second switch loop of the relay, and the resistance value of the second resistor is much larger than that of the first resistor; the control unit controls the relay to close the first switch loop, the control unit communicates with the digital potentiometer, adjusts the resistance value of the digital potentiometer, and further adjusts the output voltage of the power management chip; the precision AVout of the output voltage is calculated, with the increase of the output voltage, when AVout is greater than a set threshold value, the control unit controls the relay to open the first switch loop and close the second switch loop, and the second resistor is used to keep the output voltage precision AVout within the allowable range.

2. A controllable voltage regulating circuit for testing detonators according to claim 1, characterized in that: The power management chip adopts a DC-DC power chip, the 1 port of the power management chip U1 can output a voltage Vout, the 1 port of the power management chip U1 is connected to ground after connecting a diode D2 and parallel capacitors C5, C6 and C2, the 2 port of the power management chip U1 is connected to ground, the 3 port of the power management chip U1 is connected to the 7 port of a digital potentiometer U4 after connecting a resistor R7, the digital potentiometer U4 is of a model AD5160BRJZ10-RL7, the 4, 5 and 6 ports of the digital potentiometer U4 are used for connecting a control unit, the 6 port of the digital potentiometer U4 is connected to a 3.3V voltage after connecting a resistor R9, the 2 port of a relay K14 belonging to a first switch circuit is connected to one end of a first resistor R1, the other end of the first resistor R1 is connected to one end of the resistor R7, the 4 port of the relay K14 belonging to a second switch circuit is connected to one end of a second resistor R2, the other end of the second resistor R2 is connected to one end of the resistor R7, a diode D31 is connected between the 1 and 8 ports of the relay K14, the 8 port of the relay K14 is connected to the 3 port of a triode Q3, the 2 port of the triode Q3 is connected to ground, the 1 port of the triode Q3 is connected to the control unit after connecting a resistor R4, the 1 port of the triode Q3 is connected to ground after connecting resistors R4 and R48.

3. The controllable voltage regulating circuit for testing detonators according to claim 1, characterized in that: The output voltage Vout is calculated according to the following formula: Vout = Vfb * (1 + R 继 / R) Wherein, Vfb is the known feedback voltage of the power management chip, R is the resistance value of the digital potentiometer, R 继 is the resistance value of the resistance on the switch circuit to which the relay is connected.

4. The controllable voltage regulating circuit for testing detonators according to claim 1, characterized in that: The accuracy ΔVout of the output voltage is calculated according to the following formula: AVout = Vfb * (1 + R 继 / R - ΔR) - Vfb * (1 + R 继 / R) Wherein, ΔVout is the output voltage accuracy, Vfb is the known feedback voltage of the power management chip, R is the resistance value of the digital potentiometer, R 继 is the resistance value of the switch circuit on which the relay is connected, and ΔR is the adjustment accuracy of the potentiometer.

5. A test system for electronic detonators, characterized in that, The controllable voltage regulating circuit for testing detonators according to claim 1 further comprises: a system control module connected to the detonator chip to be tested through a bus channel switching circuit, the bus channel switching circuit is provided with a plurality of channels for connecting detonators respectively, the controllable voltage regulating circuit is connected to the detonator chip to be tested through the bus channel switching circuit to provide different test voltages for the detonator chip to be tested; a communication module connected to the detonator chip to be tested through the bus channel switching circuit, the communication module is also connected to the system control module, the system control module receives test feedback results of the detonator chip to be tested through the communication module; a power module for power supply; a serial communication circuit connected to the system control module for communication with an upper computer.

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