A connector high-frequency performance testing device and testing method

Abstract

The embodiment of the specification provides a kind of connector high-frequency performance testing device, comprising: high-frequency testing tool, high-frequency testing tool is switching structure, for with the connection end coaxial connection of the coaxial connector to be measured, high-frequency testing tool is identical with the high-frequency characteristic of the coaxial connector to be measured, when high-frequency testing tool is connected with the coaxial connector to be measured, high-frequency testing tool and the coaxial connector to be measured are symmetrical about the junction;The first high-frequency signal line of vector network analyzer is connected with the coaxial connector to be measured, the second high-frequency signal line of vector network analyzer is connected with high-frequency testing tool, and vector network analyzer is used to send high-frequency test signal to the coaxial connector to be measured by the first high-frequency signal line, and high-frequency test signal is received by the second high-frequency signal line, and high-frequency test signal is forwarded from the coaxial connector to be measured by high-frequency testing tool. Through the high-frequency testing tool of interface, the high-frequency performance of coaxial connector can be simply and effectively tested.

Description

Technical Field

[0001] This specification relates to the field of semiconductor technology, and in particular to a connector high-frequency performance testing device and testing method. Background Art

[0002] Coaxial connectors are commonly used microwave components and are one of the most fundamental interconnect components for microwave electronic equipment. With the current trend toward miniaturization of entire systems, RF coaxial connectors and adapters are also moving toward miniaturization and higher frequencies. Simultaneously, the requirements for high-frequency performance testing are becoming increasingly stringent. Therefore, a high-frequency performance test fixture for small-interface coaxial wiring connectors has been designed.

[0003] When testing coaxial wiring connectors, since the tail end is a wiring structure, it cannot be directly connected to test equipment such as a vector network analyzer. Usually, post-wiring testing and estimation are used. The test results cannot accurately locate the high-frequency characteristics of the connector itself. Summary of the Invention

[0004] In view of this, the embodiments of this specification provide a connector high-frequency performance testing device and testing method, so as to achieve the purpose of obtaining the high-frequency performance indicators of the coaxial wiring connector to be tested through theoretical calculation.

[0005] The embodiments of this specification provide the following technical solutions:

[0006] A connector high-frequency performance testing device, comprising:

[0007] A high-frequency test fixture is a transfer structure used for coaxial connection with the connecting end of the coaxial wiring connector to be tested. The high-frequency test fixture and the coaxial wiring connector to be tested have the same high-frequency characteristics. When the high-frequency test fixture is connected to the coaxial wiring connector to be tested, the high-frequency test fixture and the coaxial wiring connector to be tested are symmetrical about the connection point.

[0008] A vector network analyzer, wherein the first high-frequency signal line of the vector network analyzer is connected to the coaxial wiring connector to be tested, and the second high-frequency signal line of the vector network analyzer is connected to the high-frequency test tooling. The vector network analyzer is used to send a high-frequency test signal to the coaxial wiring connector to be tested through the first high-frequency signal line, and receive the high-frequency test signal forwarded by the high-frequency test tooling from the coaxial wiring connector to be tested through the second high-frequency signal line.

[0009] Furthermore, the high-frequency test tooling includes:

[0010] outer shell;

[0011] The inner shell, the outer shell and the inner shell are fixed to each other by interference fit;

[0012] an insulator, the insulator being fixed between the outer shell and the inner shell;

[0013] The inner ferrule is fixed inside the insulator, and the high-frequency test fixture and the connecting end of the coaxial wiring connector to be tested are coaxially connected through the inner ferrule.

[0014] Furthermore, annular grooves are provided on both sides of the insulator to form impedance transition compensation, and the inner core is fixed and supported by the annular grooves.

[0015] Furthermore, the inner shell and the outer shell are made of tin bronze plated with gold.

[0016] Furthermore, the insulator is made of polyetherimide.

[0017] Furthermore, the inner core is made of beryllium copper.

[0018] Furthermore, the tail portion of the high-frequency test fixture for connecting to the connecting end of the coaxial wiring connector to be tested is in the form of a pin.

[0019] Furthermore, the vector network analyzer is also used to calculate the voltage standing wave ratio and insertion loss of the coaxial wiring connector to be tested based on the received high-frequency test signal.

[0020] Furthermore, a test method for a connector high-frequency performance test device includes:

[0021] Sending a high-frequency test signal to the coaxial wiring connector to be tested through a vector network analyzer;

[0022] Transfer the high-frequency test signal to the high-frequency test fixture through the coaxial wiring connector to be tested;

[0023] Sending high-frequency test signals to the vector network analyzer through a high-frequency test fixture;

[0024] The high-frequency characteristic parameters of the coaxial wiring connector to be tested are calculated based on the received high-frequency test signal through the vector network analyzer.

[0025] Furthermore, the high-frequency characteristic parameters of the coaxial wiring connector to be tested are calculated based on the received high-frequency test signal by the vector network analyzer, including:

[0026] A symmetrical structure is formed when the high-frequency test fixture is connected to the coaxial wiring connector to be tested, and the impedance at the connection between the high-frequency test fixture and the coaxial wiring connector to be tested is consistent. The insertion loss of the symmetrical structure is determined based on the received high-frequency test signal, and the insertion loss of the coaxial wiring connector to be tested is calculated based on the insertion loss of the symmetrical structure.

[0027] Compared with the prior art, the at least one technical solution adopted in the embodiments of this specification can achieve the following beneficial effects:

[0028] A high-frequency performance test fixture for 2.92mm coaxial wiring connectors is designed. The test fixture can directly connect to the 2.92mm coaxial wiring connector to form a nearly symmetrical coaxial structure. Both ends have 2.92mm coaxial interfaces and can be directly connected to high-frequency instruments such as vector network analyzers for testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0030] Figure 1 is a cross-sectional view of a connector high-frequency performance testing device according to an embodiment of the present invention;

[0031] Figure 2 This is a three-dimensional diagram of a connector high-frequency performance testing device according to an embodiment of the present invention;

[0032] Figure 3 is a schematic diagram of the connection structure of the testing method according to an embodiment of the present invention;

[0033] Figure 4 1 is a schematic structural diagram of the inner shell of the high-frequency testing tool according to an embodiment of the present invention;

[0034] Figure 5 2 is a schematic structural diagram of an outer shell of a high-frequency testing tool according to an embodiment of the present invention;

[0035] Figure 6 1 is a schematic structural diagram of an insulator of a high-frequency test tool according to an embodiment of the present invention;

[0036] Figure 7 1 is a schematic structural diagram of an inner core of a high-frequency test fixture according to an embodiment of the present invention;

[0037] Figure 8 This is a cross-sectional view of the high-frequency test fixture and the coaxial wiring connector to be tested during docking test;

[0038] Figure 9 This is an axial diagram of a connector high-frequency performance test device and a coaxial wiring connector to be tested during a docking test.

[0039] Explanation of the accompanying reference numerals: 1. outer shell; 2. inner shell; 3. insulator; 4. inner core; 5. high-frequency test tooling; 6. coaxial wiring connector to be tested. DETAILED DESCRIPTION

[0040] The embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0041] The following describes the embodiments of the present application through specific examples, and those skilled in the art can easily understand other advantages and effects of the present application from the contents disclosed in this specification. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. The present application can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present application. It should be noted that, in the absence of conflict, the features in the following embodiments and embodiments can be combined with each other. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without making creative work are within the scope of protection of this application.

[0042] It should be noted that various aspects of the embodiments within the scope of the appended claims are described below. It should be apparent that the aspects described herein can be embodied in a wide variety of forms, and any specific structure and / or function described herein is merely illustrative. Based on this application, it should be understood by those skilled in the art that an aspect described herein can be implemented independently of any other aspect, and two or more of these aspects can be combined in various ways. For example, any number and aspect described herein can be used to implement an apparatus and / or practice a method. In addition, other structures and / or functionalities other than one or more of the aspects described herein can be used to implement this apparatus and / or practice this method.

[0043] It should also be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present application. The illustrations only show components related to the present application and are not drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component can be changed at will, and the component layout type may also be more complicated.

[0044] Additionally, in the following description, specific details are provided to provide a thorough understanding of the examples. However, one skilled in the art will appreciate that the aspects described can be practiced without these specific details.

[0045] Therefore, a high-frequency performance test fixture for small-interface coaxial wiring connectors is designed. The test fixture can be directly connected to the small-interface coaxial wiring connector to form an approximately symmetrical coaxial structure. Both ends have small interfaces and can be directly connected to high-frequency instruments such as vector network analyzers for testing. After the test, the measured voltage standing wave ratio and insertion loss can be calculated to obtain the high-frequency characteristic parameters of the single connector itself.

[0046] The following describes the technical solutions provided by various embodiments of the present application in conjunction with the accompanying drawings.

[0047] like Figure 1 、 Figure 2 As shown, a high-frequency test fixture 5 is designed for testing the high-frequency performance of a 2.92mm interface RF coaxial connector. The high-frequency test fixture 5 includes a rear shell, a front shell, an insulator, and an inner core. The outer shell and the inner shell are fixed to each other by an interference fit. The insulator 3 is fixed between the outer shell 1 and the inner shell 2. The inner core 4 is fixed inside the insulator 3 via a slot insulator, ensuring the fixation between the various parts inside the high-frequency test fixture 5. The insulator and the inner core of the high-frequency test fixture 5 form a transition structure that can be transferred to the coaxial wiring connector 6 to be tested. When the high-frequency test fixture 5 and the coaxial wiring connector 6 to be tested are connected, a symmetrical structure is formed, and the impedance of the high-frequency test fixture 5 and the coaxial wiring connector 6 to be tested are consistent (the symmetrical structure can directly calculate the voltage standing wave ratio and insertion loss of the coaxial wiring connector 6 to be tested).

[0048] refer to Figure 3 The inner shell 2 is made of tin bronze with gold plating, and the internal interface size is guaranteed to be 2.92mm. At the same time, it cooperates with the inner core to ensure the consistency of impedance.

[0049] like Figure 4 As shown, the outer shell 1 is made of tin bronze with gold plating. The outer shell 1 and the inner shell 2 are matched with the inner core 4 on the basis of interference fit to ensure the consistency of impedance.

[0050] like Figure 5 As shown, the insulator 3 is made of polyetherimide, and annular grooves are dug on both sides to compensate for impedance transition and provide support.

[0051] like Figure 6 As shown, the inner core 4 is made of beryllium copper and ensures the impedance matching size with the shell. The tail is in the form of a pin to ensure the connection with the tail wiring position of the 2.92mm interface wiring coaxial connector.

[0052] like Figure 7 、 Figure 8 As shown, the tail of the high-frequency test fixture is docked with the tail of the 2.92mm interface wiring connector to achieve an approximately symmetrical connection, so that the insertion loss and voltage standing wave ratio of the coaxial wiring connector 6 to be tested can be obtained by calculation.

[0053] The test method using the connector high frequency performance test device includes the following steps:

[0054] S01. Connect all parts.

[0055] S011. Connect the coaxial wiring connector 6 to be tested to the tail of the corresponding high-frequency test tool 5 and fix them to form a symmetrical transfer structure;

[0056] S012. Calibrate the vector network analyzer using a conventional calibration method (such as SOLT), requiring the first high-frequency signal line and the second high-frequency signal line to be symmetrical, and calibrate the test plane to both ends of the test line of the vector network analyzer;

[0057] S013, connecting the coaxial wiring connector 6 to be tested and both ends of the high-frequency test fixture 5 of the symmetrical transfer structure to two high-frequency signal lines of the vector network analyzer to form a microwave test loop;

[0058] S02. Send a test high-frequency signal.

[0059] S021. Sending a high-frequency test signal to the coaxial wiring connector to be tested through a vector network analyzer;

[0060] S022. Transfer the high-frequency test signal to the high-frequency test fixture through the coaxial wiring connector to be tested;

[0061] S023. Send the high-frequency test signal to the vector network analyzer through the high-frequency test tooling.

[0062] S03. Calculate the high-frequency characteristic parameters of the coaxial wiring connector to be tested.

[0063] S031. Calculating high-frequency characteristic parameters of the coaxial wiring connector to be tested based on the received high-frequency test signal using a vector network analyzer;

[0064] S032. When the high-frequency test fixture is connected to the coaxial wiring connector to be tested, a symmetrical structure is formed. The return loss RL of the symmetrical structure is determined according to the received high-frequency test signal. Then, the formula is used. And according to the voltage standing wave ratio VSWR of the symmetrical structure 双 , calculate the voltage standing wave ratio VSWR of the coaxial connector to be tested 单 ;

[0065] Specifically, VSWR 单 is the voltage standing wave ratio of the connector under test;

[0066] VSWR 双 is the voltage standing wave ratio measured directly after docking;

[0067]

[0068] S033. Determine the insertion loss of the symmetrical structure according to the received high-frequency test signal, and calculate the insertion loss of the coaxial wiring connector to be tested according to the insertion loss of the symmetrical structure;

[0069] Specifically, IL 单is the insertion loss of the connector under test;

[0070] IL 双 The insertion loss is measured directly after docking;

[0071] Insertion loss IL 单 =IL 双 / 2.

[0072] S04. Determine whether the coaxial wiring connector to be tested meets the requirements based on the high-frequency characteristic parameters of the coaxial wiring connector to be tested.

[0073] Determine whether the insertion loss of the coaxial wiring connector meets the technical conditions for the IL 单 The absolute value is less than 0.3dB.

[0074] The condition for judging whether the voltage standing wave ratio of the coaxial wiring connector meets the technical requirements is the VSWR 单 Less than 1.2.

[0075] For the overall test parameters of the connector, since the voltage standing wave ratio has a greater impact on the performance of the product, and to ensure that the comprehensive performance of the two parameters of the product meets the actual use requirements, a comprehensive performance weighted evaluation can be performed, and the evaluation coefficient is set to P.

[0076] P=((|IL 单 |-1)×0.3+VSWR 单 ×0.7),

[0077] The condition for judging whether the evaluation coefficient of the coaxial wiring connector meets the technical requirements is that P is less than 0.2.

[0078] The embodiments of the present invention have the following beneficial effects:

[0079] A high-frequency performance test fixture for 2.92mm interface coaxial wiring connectors has been designed. The test fixture can be directly connected to the 2.92mm interface coaxial wiring connector to form an approximately symmetrical coaxial structure. Both ends have 2.92mm coaxial interfaces and can be directly connected to high-frequency vector network analyzers for testing. After the test, the measured voltage standing wave ratio and insertion loss can be calculated to obtain the high-frequency characteristic parameters of the single connector itself. The transfer structure design of the high-frequency test fixture uses a coaxial transfer form with direct pin connection to avoid the impact of the cable on the test indicators during the transfer process. The high-frequency test fixture and the coaxial wiring connector to be tested form an approximately symmetrical structure on both sides, which facilitates the theoretical calculation of the high-frequency performance indicators of the coaxial wiring connector to be tested, avoiding the problem of difficulty in calibration in high-frequency testing of coaxial wiring connectors due to wiring problems.

[0080] The various embodiments in this specification are described in a progressive manner. Similar parts between the various embodiments can be referred to in conjunction with each other. Each embodiment focuses on the differences from other embodiments. In particular, the method embodiments described later are relatively simple to describe because they correspond to the system. For relevant parts, refer to the description of the system embodiments.

[0081] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in the present application should be included in the scope of protection of the present application. Therefore, the scope of protection of the present application should be based on the scope of protection of the claims.

Claims

1. A connector high frequency performance test device, characterized in that: include: A high-frequency test fixture (5), the high-frequency test fixture (5) is a transfer structure, used for coaxially connecting with the connection end of the coaxial wiring connector to be tested, wherein the high-frequency test fixture (5) and the coaxial wiring connector to be tested (6) have the same high-frequency characteristics, and when the high-frequency test fixture (5) is connected to the coaxial wiring connector to be tested (6), the high-frequency test fixture (5) and the coaxial wiring connector to be tested (6) are symmetrical about the connection; A vector network analyzer, wherein a first high-frequency signal line of the vector network analyzer is connected to the coaxial wiring connector (6) to be tested, and a second high-frequency signal line of the vector network analyzer is connected to the high-frequency test fixture (5), and the vector network analyzer is used to send a high-frequency test signal to the coaxial wiring connector (6) to be tested through the first high-frequency signal line, and receive the high-frequency test signal forwarded from the coaxial wiring connector (6) to be tested by the high-frequency test fixture (5) through the second high-frequency signal line; High frequency test fixture (5), including: outer shell (1); The inner shell (2), the outer shell (1) and the inner shell (2) are fixed to each other through interference fit; an insulator (3), the insulator (3) being fixed between the outer shell (1) and the inner shell (2); The inner core (4) is fixed inside the insulator (3) through the slot insulator, the high-frequency test fixture (5) and the connecting end of the coaxial wiring connector (6) to be tested are coaxially connected through the inner core (4), and the high-frequency test fixture (5) and the coaxial wiring connector (6) to be tested form a symmetrical structure when connected, and the impedance of the high-frequency test fixture (5) and the coaxial wiring connector (6) to be tested are consistent; Annular grooves are provided on both sides of the insulator (3) to form impedance transition compensation, and the inner core (4) is fixed and supported by the annular grooves.

2. The connector high frequency performance testing device according to claim 1, characterized in that: The inner shell and the outer shell are made of tin bronze plated with gold.

3. The connector high frequency performance testing device according to claim 1, characterized in that: The insulator is made of polyetherimide.

4. The connector high frequency performance testing device according to claim 1, characterized in that: The inner core is made of beryllium copper.

5. The connector high frequency performance testing device according to any one of claims 1 to 4, characterized in that: The tail portion of the high-frequency testing tool used for connecting to the connecting end of the coaxial wiring connector to be tested is in the form of a pin.

6. The connector high frequency performance testing device according to any one of claims 1 to 4, characterized in that: The vector network analyzer is further configured to calculate the voltage standing wave ratio and insertion loss of the coaxial wiring connector to be tested based on the received high-frequency test signal.

7. A testing method for a connector high frequency performance testing device according to any one of claims 1 to 6, characterized in that: include: Sending a high-frequency test signal to the coaxial wiring connector to be tested by the vector network analyzer; Transferring the high-frequency test signal to the high-frequency test fixture via the coaxial wiring connector to be tested; Sending the high-frequency test signal to the vector network analyzer through the high-frequency test fixture; The vector network analyzer calculates the high-frequency characteristic parameters of the coaxial wiring connector to be tested based on the received high-frequency test signal.

8. The testing method according to claim 7, characterized in that: Calculating high-frequency characteristic parameters of the coaxial wiring connector to be tested by the vector network analyzer based on the received high-frequency test signal, including: The high-frequency test fixture forms a symmetrical structure when connected to the coaxial wiring connector to be tested, and the impedance of the connection between the high-frequency test fixture and the coaxial wiring connector to be tested is consistent, determining the voltage standing wave ratio of the symmetrical structure based on the received high-frequency test signal, and calculating the voltage standing wave ratio of the coaxial wiring connector to be tested based on the voltage standing wave ratio of the symmetrical structure; The insertion loss of the symmetrical structure is determined according to the received high-frequency test signal, and the insertion loss of the coaxial wiring connector to be tested is calculated according to the insertion loss of the symmetrical structure.

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