A switch VLAN testing method and system

Abstract

The present invention relates to a switch VLAN test method and system. The test system is composed of a power supply, a PC host computer, a DUT power supply module and a signal input and output system. The system can realize automatic test execution and result determination through simple configuration, and record data. The signal input and output system can receive instructions from the PC host computer, simulate the sending of Ethernet frames, and contain multiple submodules. The system can independently simulate the sending and receiving of Ethernet frames at the same time, and simulate the sending and monitoring of different channels respectively. It can simulate the sending of marked frames and unmarked frames of different lengths, and can cyclically access each inlet and outlet port. The DUT power supply provides multiple independent 2-channel power supplies, respectively realizes the control of the KL30 and KL15 power of the DUT, and meets the power supply requirements of different controllers. The present invention can design personalized test cases according to development requirements, and improve the test quality and test coverage.

Description

Technical Field

[0001] The invention belongs to the technical field of vehicle-mounted Ethernet testing, and in particular relates to a switch VLAN testing method and system. Background Art

[0002] The switch VLAN test is a must-do test for switches in automotive Ethernet to ensure that the switch functions can be implemented normally and that the relevant nodes of the vehicle Ethernet can communicate normally.

[0003] Currently, most OEMs adopt the method of approving third-party laboratory test reports to evaluate whether the controller switch function tests are correct.

[0004] However, if the controller has functional defects during the Ethernet switch VLAN test verification process, the problem cannot be reproduced. At present, mainstream Ethernet testing service providers are simultaneously undertaking testing tasks for multiple OEMs, and the test scope is mostly general test items. The advantage is that it is applicable to all OEM controller development requirements, but the disadvantage is also very obvious. The test content is not targeted and the test coverage is low. Summary of the invention

[0005] The purpose of the present invention is to provide a switch VLAN testing method and a switch VLAN testing system to solve the problem of improving the test quality and test coverage.

[0006] The objective of the present invention is achieved through the following technical solutions:

[0007] A switch VLAN test system, consisting of a power supply, a PC host computer, a DUT power supply module and a signal input and output system;

[0008] The PC host computer is connected to the power supply through the PC supporting power line to obtain power, the PC host computer and the DUT power supply module are connected and communicated through the data line, and the PC host computer and the signal input and output system are connected through the USB data line to ensure that the commands of the PC host computer can be normally delivered to the signal input and output system, and the data collected in real time by the signal input and output system can be transmitted back to the PC host computer;

[0009] The DUT power supply module is connected to the power supply module through its own supporting power supply line to obtain power, and the DUT power supply module provides two channels of external output voltage;

[0010] The signal input and output system contains two or more input and output modules, each independent submodule can independently send and receive Ethernet frames, can simulate the sending of marked frames and unmarked frames, and can also send Ethernet frames with different data lengths according to test needs; the independent submodules in the signal input and output system are respectively connected to different ports of the DUT.

[0011] Furthermore, the power supply provides power support for the test system and provides power for the PC, DUT power supply module, and signal input and output system.

[0012] Furthermore, the PC host computer can control the voltage output and current limiting of the DUT power supply module, control the signal input and output system, and coordinate the working modes of each submodule in the signal input and output system.

[0013] Furthermore, the DUT power supply module provides a stable operating voltage for the controller under test.

[0014] Furthermore, the signal input and output system can simulate and output Ethernet frames, and has the function of real-time data detection; each input and output module can send simulated data to the subnet where the module is located, and can receive data in real time.

[0015] Furthermore, the input and output module can send different frame structures according to requirements, can send Ethernet frames with a minimum of 64 bytes, and can also send Ethernet frames with a maximum of 1522 bytes; can carry a correct frame check sequence, and can also carry an incorrect frame check sequence.

[0016] Furthermore, each signal transceiver module is connected to different ports of the DUT via a standard banana plug interface and a pair of twisted pair cables, and the power supply method in the signal input and output system is to connect its own matching power cord to the system power supply module.

[0017] A switch VLAN function testing method comprises the following steps:

[0018] A. Ensure that the controller under test and the signal transceiver module of the test system are stably connected;

[0019] B. Set all modules in the signal transceiver system to start detecting all DUT communication ports;

[0020] C. Send an untagged broadcast frame from the test station to each port of the DUT;

[0021] D. Send a single-tagged broadcast frame from the test station to each port of the DUT, with a TPID of 0x8100. The test station iterates through each VID for each inbound and outbound port node combination.

[0022] E. Send a double-tagged broadcast frame from the test station to each port of the DUT. The internal TPID is 0x8100; the external TPID is 0x88a8. The labels of the internal and external VIDs must be the same. The test station loops through each VID for each inbound and outbound port combination.

[0023] F. On each test station port, check that Ethernet frames are received as expected.

[0024] Furthermore, each VID includes VID0 and VID4095.

[0025] Compared with the prior art, the present invention has the following beneficial effects:

[0026] The switch VLAN test method and system of the present invention can realize automatic test execution and result determination and record data through simple configuration;

[0027] The PC coordinates the DUT power supply, the signal receiving and sending system cooperates, and the signal input and output system includes multiple independent signal receiving and sending modules;

[0028] The signal input and output system can receive instructions from the PC host computer and simulate the sending of Ethernet frames. The system contains multiple submodules, which can independently simulate the sending and receiving of Ethernet frames at the same time, simulate the sending and monitoring of different channels respectively; can simulate the sending of marked frames and unmarked frames of different lengths, and can cyclically access each inlet and outlet port;

[0029] The DUT power supply provides multiple independent 2-channel power supplies, which respectively realize the control of the KL30 and KL15 power of the DUT, meeting the power supply requirements of different controllers.

[0030] The switch VLAN testing method and system of the present invention can design personalized test cases according to development requirements, thereby improving test quality and test coverage. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0032] Figure 1 Switch VLAN test system structure diagram. DETAILED DESCRIPTION

[0033] The present invention will be further described below in conjunction with embodiments:

[0034] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0035] It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in the subsequent drawings. At the same time, in the description of the present invention, the terms "first", "second", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0036] like Figure 1 As shown, the switch VLAN testing system of the present invention is composed of a power supply, a PC host computer, a DUT power supply module and a signal input and output system.

[0037] The power supply provides power support for the test system, provides power for the PC, DUT power supply module, and signal input and output system, and ensures that each subsystem and module can work stably.

[0038] The PC host computer can control the voltage output and current limiting of the DUT power supply module, control the signal input and output system, and coordinate the working modes of various submodules in the signal input and output system.

[0039] The DUT power supply module provides a stable operating voltage for the controller under test, ensuring that the controller under test works at a rated voltage.

[0040] The signal input and output system can simulate and output Ethernet frames and has the function of real-time data detection. The subsystem includes multiple signal input and output modules, each of which can send simulated data to the subnet where the module is located and receive data in real time.

[0041] The input and output module can send different frame structures according to needs, for example, it can send marked frames or unmarked frames; it can send Ethernet frames with a minimum of 64 bytes or a maximum of 1522 bytes; it can carry a correct frame check sequence or an incorrect frame check sequence.

[0042] The PC is connected to the system power supply through the PC supporting power cable to obtain power, and the PC is connected to the DUT power supply module through the RJ45 data cable to ensure the communication between the PC and the DUT power supply module. The PC is connected to the signal input and output system through the USB data cable to ensure that the commands of the PC host computer can be normally delivered to the signal input and output system, and the data collected in real time by the signal input and output system can be transmitted back to the PC host computer.

[0043] The DUT power supply module is connected to the power supply module through its own supporting power supply line to obtain power. The DUT power supply module provides two channels of external output voltage to provide a stable working voltage for the DUT, ensuring that the controller can work normally.

[0044] The signal input and output system contains two or more signal transceiver modules. The submodules can independently send and receive Ethernet frames, simulate the sending of marked frames and unmarked frames, and can also send Ethernet frames of different data lengths according to the needs of the test. The independent submodules in this system are connected to different ports of the DUT respectively. Each signal transceiver module is connected to different ports of the DUT through a standard banana head interface and a pair of twisted pair cables. The power supply method in this system is to connect its own matching power cord to the system power supply module. Ensure that the signal input and output system works under stable voltage.

[0045] The switch VLAN function testing method of the present invention comprises the following steps:

[0046] 1. Ensure that the controller under test and the signal transceiver module of the test system are stably connected;

[0047] 2. Set all modules in the signal input and output system to start detecting all DUT communication ports;

[0048] 3. Send an untagged broadcast frame from the test station to each port of the DUT;

[0049] 4. Send a single-tagged broadcast frame from the test station to each port of the DUT, with TPID 0x8100. The test station loops through each VID (including VID0 and VID4095) for each inbound and outbound port node combination.

[0050] 5. Send a double-tagged broadcast frame from the test station to each port of the DUT. The internal TPID is 0x8100; the external TPID is 0x88a8. The labels of the internal and external VIDs must be the same. The test station loops through each VID (including VID0 and VID4095) for each inbound and outbound port combination;

[0051] 6. On each test station port, check that Ethernet frames are received as expected.

[0052] The switch VLAN testing method and system of the present invention can realize automatic test execution and record corresponding test data through simple configuration, and can design test cases that meet development requirements in a targeted manner according to development requirements, thereby improving test quality and coverage.

[0053] Note that the above are only preferred embodiments of the present invention and the technical principles used. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and that various obvious changes, readjustments and substitutions can be made by those skilled in the art without departing from the scope of protection of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments, and may include more other equivalent embodiments without departing from the concept of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. A switch VLAN testing system, characterized in that: It consists of power supply, PC host computer, DUT power supply module and signal input and output system; The PC host computer is connected to the power supply through the PC supporting power line to obtain power, the PC host computer and the DUT power supply module are connected and communicated through the data line, and the PC host computer and the signal input and output system are connected through the USB data line to ensure that the commands of the PC host computer can be normally delivered to the signal input and output system, and the data collected in real time by the signal input and output system can be transmitted back to the PC host computer; The DUT power supply module is connected to the power supply module through its own supporting power supply line to obtain power, and the DUT power supply module provides two channels of external output voltage; The signal input and output system contains two or more input and output modules, each independent submodule can independently send and receive Ethernet frames, can simulate the sending of marked frames and unmarked frames, and can also send Ethernet frames with different data lengths according to test needs; the independent submodules in the signal input and output system are respectively connected to different ports of the DUT.

2. A switch VLAN testing system according to claim 1, characterized in that: The power supply provides power support for the test system and provides power for the PC, DUT power supply module, and signal input and output system.

3. A switch VLAN testing system according to claim 1, characterized in that: The PC host computer can control the voltage output and current limiting of the DUT power supply module, control the signal input and output system, and coordinate the working modes of various submodules in the signal input and output system.

4. A switch VLAN testing system according to claim 1, characterized in that: The DUT power supply module provides a stable operating voltage for the controller under test.

5. A switch VLAN testing system according to claim 1, characterized in that: The signal input and output system can simulate and output Ethernet frames, and has the function of real-time data detection; each input and output module can send simulated data to the subnet where the module is located, and can receive data in real time.

6. A switch VLAN testing system according to claim 1, characterized in that: The input and output module can send different frame structures according to requirements, can send Ethernet frames with a minimum of 64 bytes, and can also send Ethernet frames with a maximum of 1522 bytes; can carry a correct frame check sequence, and can also carry an incorrect frame check sequence.

7. A switch VLAN testing system according to claim 1, characterized in that: Each signal transceiver module is connected to different ports of the DUT through a standard banana plug interface and a pair of twisted pair cables. The power supply in the signal input and output system is connected to the system power supply module through its own matching power cord.

8. A switch VLAN function testing method, characterized in that: The following steps are involved: A. Ensure that the controller under test and the signal transceiver module of the test system are stably connected; B. Set all modules in the signal transceiver system to start detecting all DUT communication ports; C. Send an untagged broadcast frame from the test station to each port of the DUT; D. Send a single-tagged broadcast frame from the test station to each port of the DUT, with a TPID of 0x8100. The test station iterates through each VID for each inbound and outbound port node combination. E. Send a double-tagged broadcast frame from the test station to each port of the DUT. The internal TPID is 0x8100; the external TPID is 0x88a8. The labels of the internal and external VIDs must be the same. The test station loops through each VID for each inbound and outbound port combination. F. On each test station port, check whether Ethernet frames are received as expected; Each of the VIDs includes VID0 and VID4095.

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