Antenna testing method and system

Abstract

The present invention provides an antenna testing method and system. The antenna testing method includes establishing a position parameter of at least one noise element in a device under test based on a two-dimensional coordinate system; measuring a radiation signal from the device under test to generate a three-dimensional gain information, wherein the three-dimensional gain information includes a plurality of three-dimensional coordinate parameters; converting the plurality of three-dimensional coordinate parameters into a plurality of two-dimensional coordinate parameters and a plurality of gain parameters in the two-dimensional coordinate system, wherein the plurality of two-dimensional coordinate parameters correspond to the plurality of gain parameters respectively; generating a gain variation map according to the plurality of two-dimensional coordinate parameters and the plurality of gain parameters; matching the position parameter to the gain variation map to obtain a noise interference level corresponding to the at least one noise element respectively; and determining whether the device under test is a poor radiation device according to the noise interference level.

Description

TECHNICAL FIELD

[0001] The present invention relates to an antenna technology, and more particularly, to an antenna testing method and system. BACKGROUND

[0002] Nowadays, there are many wireless communication devices in our life, and these devices are generally provided with antennas to achieve the function of wireless communication. However, the radiation signal of the antenna is easily affected by noise, which causes the efficiency of wireless communication to decrease. Therefore, when the products are shipped or repaired, the manufacturers will use some testing instruments to test and adjust the radiation signal of the antenna of the wireless communication device (i.e. the device under test) to avoid the radiation signal of the antenna being affected by noise. However, since the device under test can have many elements that can affect the radiation signal, it is impossible to determine the location of the noise source and to eliminate the noise source fundamentally when testing the radiation signal of the antenna. In addition, some testing instruments (such as spectrum analyzers) can also increase the testing cost. SUMMARY

[0003] In view of the above, the present invention provides an antenna testing method and system. According to some embodiments, the present invention can analyze the location of the noise source in the device under test and the interference degree of the noise source to the radiation signal of the antenna. According to some embodiments, the antenna testing can be realized by simple testing equipment, thereby reducing the testing cost.

[0004] According to some embodiments, the antenna testing method comprises establishing a location parameter of at least one noise element in a device under test based on a two-dimensional coordinate system; measuring the radiation signal from the device under test to generate a three-dimensional gain information, wherein the three-dimensional gain information comprises a plurality of three-dimensional coordinate parameters; converting the plurality of three-dimensional coordinate parameters into a plurality of two-dimensional coordinate parameters and a plurality of gain parameters in the two-dimensional coordinate system, and the plurality of two-dimensional coordinate parameters correspond to the plurality of gain parameters respectively; generating a gain variation map according to the plurality of two-dimensional coordinate parameters and the plurality of gain parameters; matching the location parameter to the gain variation map to obtain a noise interference degree corresponding to the at least one noise element respectively; and determining whether the device under test is a poor radiation device according to the noise interference degree.

[0005] According to some embodiments, an antenna testing system includes an antenna testing chamber, a network analyzer, and a computing device. The antenna testing chamber is configured to accommodate a device under test and receive a radiated signal emitted by the device under test. The network analyzer is coupled to the antenna testing chamber. The network analyzer is configured to measure the radiated signal and generate an analysis information. The computing device is coupled to the network analyzer. The computing device is configured to establish a location parameter of at least one noise element in the device under test based on a two-dimensional coordinate system; generate a three-dimensional gain information based on the analysis information, wherein the three-dimensional gain information includes a plurality of three-dimensional coordinate parameters; convert the plurality of three-dimensional coordinate parameters into a plurality of two-dimensional coordinate parameters and a plurality of gain parameters in the two-dimensional coordinate system, and the plurality of two-dimensional coordinate parameters correspond to the plurality of gain parameters respectively; generate a gain variation map based on the plurality of two-dimensional coordinate parameters and the plurality of gain parameters; match the location parameter to the gain variation map to obtain a noise interference level corresponding to the at least one noise element respectively; and determine whether the device under test is a poor radiation device based on the noise interference level.

[0006] In summary, according to some embodiments, the location of the noise source and the interference level of the noise source to the radiated signal can be obtained from the gain variation map by matching the location parameter of the noise element of the device under test to the gain variation map of the radiated signal of the device under test. According to some embodiments, since the gain variation map can be a visualized graph, the user can quickly determine the location of the noise source and the interference level. According to some embodiments, since the antenna testing can be implemented by simple testing equipment, the testing cost can be reduced. For example, only passive antenna testing instruments (e.g. the antenna testing chamber and the network analyzer) can be used to measure the radiated signal, and the computing device can be used to obtain the gain variation map and the noise interference level, thereby reducing the cost of the antenna testing instruments. BRIEF DESCRIPTION OF DRAWINGS

[0007] Figure 1 FIG. 1 is a schematic diagram of an antenna testing system according to some embodiments of the present application.

[0008] Figure 2 FIG. 2 is a schematic diagram of an antenna testing method according to some embodiments of the present application.

[0009] Figure 3 FIG. 3 is a schematic diagram of the location of a noise element of a device under test on a first cross-section according to some embodiments of the present application.

[0010] Figure 4 FIG. 4 is a schematic diagram of the location of a noise element of a device under test on a third cross-section according to some embodiments of the present application.

[0011] Figure 5 FIG. 5 is a schematic diagram of a gain variation map according to some embodiments of the present application.

[0012] Figure 6 A flowchart of an antenna testing method according to some embodiments of the present application.

[0013] Figure 7 A flowchart of an antenna testing method according to some embodiments of the present application.

[0014] Reference signs are as follows:

[0015] 10: antenna testing system

[0016] 12: antenna testing chamber

[0017] 121: body

[0018] 123: measurement antenna

[0019] 125: wave-absorbing element

[0020] 127: support to be tested

[0021] 1271: rotation shaft

[0022] 1273: rotating disc

[0023] 14: network analyzer

[0024] 16: computing device

[0025] 20: device to be tested

[0026] 31, 51: central processing unit

[0027] 33, 52: graphics processing unit

[0028] 35A, 35B, 53: memory

[0029] 54: universal serial bus

[0030] 55: solid state drive

[0031] 60: gain step

[0032] RD1: first rotation direction

[0033] RD2: second rotation direction

[0034] X: first dimension

[0035] Y: second dimension

[0036] Z: third dimension

[0037] S201-S211, S601-S603, S701-S703: steps

[0038] θ: angle

[0039] φ: angle DETAILED DESCRIPTION

[0040] Referring to Figure 1 Fig. 1 is a schematic diagram of an architecture of an antenna test system 10 according to some embodiments of the present application. The antenna test system 10 includes an antenna test chamber 12, a network analyzer 14, and a computing device 16. The network analyzer 14 is coupled to the antenna test chamber 12. The computing device 16 is coupled to the network analyzer 14. The antenna test chamber 12 is configured to accommodate a device under test 20 and receive a radiated signal emitted by the device under test 20. For example, the antenna test chamber 12 includes a body 121 and a measurement antenna 123. The body 121 is configured to accommodate the device under test 20. The measurement antenna 123 is configured to receive the radiated signal from the device under test 20 and transmit the radiated signal to the network analyzer 14. In some embodiments, the antenna test chamber 12 includes an absorbing element 125. The absorbing element 125 is configured to absorb electromagnetic waves within the antenna test chamber 12 to eliminate the mixing effect of the superposition of the reflected radiated signal, thereby simulating an open field. The measurement antenna 123 can be a horn antenna. The antenna test chamber 12 can be an electromagnetic anechoic chamber. The device under test 20 can be a device having an antenna configured to emit a radiated signal, such as a notebook computer, a television set, or the like. The network analyzer 14 is configured to measure the radiated signal and generate an analysis information for processing by the computing device 16. The computing device 16 can be a computer, a microprocessor, an embedded system, or the like.

[0041] Referring to Figure 2 Fig. 2 is a schematic diagram of a flow of an antenna test method according to some embodiments of the present application. The antenna test method is suitable for execution by the computing device 16. First, the computing device 16 establishes a position parameter of at least one noise element in the device under test 20 based on a two-dimensional coordinate system (step S201). The noise element can be a high frequency element in the device under test 20, such as a central processing unit, a graphics processing unit, a memory, or the like. The high frequency refers to a measurable frequency range of the measurement antenna 123, such as 500 MHz (million hertz) to 26.5 GHz (giga hertz). The two-dimensional coordinate system can be a spherical coordinate system in unit vectors, and the position parameter can be represented by (θ, φ).

[0042] For example, the device under test 20 is a notebook computer. As shown in Fig. 3, the notebook computer includes a central processing unit 301, a graphics processing unit 302, a memory 303, and a wireless communication module 304. The central processing unit 301, the graphics processing unit 302, and the memory 303 are high frequency elements. The wireless communication module 304 is configured to emit a radiated signal. The notebook computer is placed in the antenna test chamber 12. The measurement antenna 123 is configured to receive the radiated signal from the notebook computer and transmit the radiated signal to the network analyzer 14. The network analyzer 14 is configured to measure the radiated signal and generate an analysis information for processing by the computing device 16. Figure 1As shown, the antenna test chamber 12 comprises a test support 127. The test support 127 is configured to support the device under test 20 (e.g., a notebook computer). The keyboard, input / output ports, circuit board, and noise elements of the notebook computer are arranged on a first cross-section formed by the first dimension X and the second dimension Y of the test support 127. The display screen of the notebook computer is arranged on a second cross-section formed by the third dimension Z and the first dimension X of the test support 127. The angle between the first dimension X and the second dimension Y is defined as the φ angle in a two-dimensional coordinate system, and the angle between the third dimension Z and the first dimension X (or the angle between the third dimension Z and the second dimension Y) is defined as the θ angle in the two-dimensional coordinate system. The computing device 16 establishes the position parameters of the noise elements according to the positions of the noise elements in the two-dimensional coordinate system.

[0043] Referring to Figure 3 and Figure 4 . Figure 3 FIG. 4 is a diagram illustrating the positions of the noise elements of the device under test 20 on a first cross-section according to some embodiments of the present application. Figure 4 FIG. 5 is a diagram illustrating the positions of the noise elements of the device under test 20 on a third cross-section according to some embodiments of the present application. The third cross-section is formed by the third dimension Z and the second dimension Y. Figure 3 and Figure 4 The device under test 20 is exemplified by a notebook computer, and the noise elements are exemplified by a central processing unit 31, a graphics processing unit 33, and memories 35A-35B. As shown in Figure 3 and Figure 4 The computing device 16 obtains the φ angles of the central processing unit 31, the graphics processing unit 33, and the memories 35A-35B as 15°, 145°, 45°, and 80°, respectively, and obtains the θ angles of the central processing unit 31, the graphics processing unit 33, and the memories 35A-35B as 105°, according to the positions of the central processing unit 31, the graphics processing unit 33, and the memories 35A-35B in the two-dimensional coordinate system, to establish the position parameters of the central processing unit 31, the graphics processing unit 33, and the memories 35A-35B.

[0044] Referring back to Figure 2 , the computing device 16 measures the radiated signals from the device under test 20 by the network analyzer 14 to generate three-dimensional gain information (step S203). Specifically, the computing device 16 generates the three-dimensional gain information according to the analysis information of the network analyzer 14. The three-dimensional gain information comprises a plurality of three-dimensional coordinate parameters. The three-dimensional coordinate parameters are coordinate parameters in a rectangular coordinate system, and can be represented as (x, y, z). In some embodiments, as shown in Figure 1As shown, the test support 127 comprises a rotating shaft 1271 and a rotating disc 1273. The rotating shaft 1271 is used to rotate the test device 20 in a first rotational direction RD1 in a first plane. The rotating disc 1273 is used to rotate the test device 20 in a second rotational direction RD2 in a second plane. The rotating angles of the rotating shaft 1271 and the rotating disc 1273 can be controlled by the computing device 16. By rotating the test device 20, the radiation signals measured by the network analyzer 14 can be a three-dimensional antenna field pattern.

[0045] Next, the computing device 16 converts the plurality of three-dimensional coordinate parameters into a plurality of two-dimensional coordinate parameters and a plurality of gain parameters in a two-dimensional coordinate system (step S205). The plurality of two-dimensional coordinate parameters correspond to the plurality of gain parameters respectively. Then, the computing device 16 generates a gain variation map according to the plurality of two-dimensional coordinate parameters and the plurality of gain parameters (step S207). The gain variation map can present the variation of gain in a visually recognizable manner, for example, the positions with higher gain are presented in darker color, and the positions with lower gain are presented in lighter color. In some embodiments, the gain parameter can be the antenna gain, i.e. the absolute gain obtained by comparing the antenna's base field pattern with the omni-directional field pattern. In some embodiments, the same two-dimensional coordinate system is used for establishing the position parameter and converting the three-dimensional coordinate parameter. For example, the computing device 16 converts the three-dimensional coordinate parameter into the two-dimensional coordinate parameter and the gain parameter according to the equations 1-3, where the two-dimensional coordinate parameter can be represented as (θ, φ), the gain parameter is represented as γ, and the three-dimensional coordinate parameter is represented as (x, y, z) as previously described.

[0046]

[0047]

[0048]

[0049] After the gain variation map is generated, the computing device 16 matches the position parameter with the gain variation map to obtain a noise interference degree corresponding to at least one noise element respectively (step S209). Since the gain variation map is generated according to the two-dimensional coordinate parameter and the gain parameter, and the two-dimensional coordinate parameter and the position parameter are generated based on the same two-dimensional coordinate system, the computing device 16 can match the position parameter with the gain variation map according to the θ angle and the φ angle of the position parameter, and take the gain parameter in the matched position of the position parameter in the gain variation map as the noise interference degree. For example, when the gain parameter in the matched position is larger (or is presented in darker color), it indicates that the noise interference degree is larger; otherwise, it indicates that the noise interference degree is smaller. In this way, the user can quickly know the magnitude of the noise interference degree of the noise element, and can determine the source of the noise to eliminate the noise fundamentally.

[0050] Reference Figure 5 This is a schematic diagram of gain variation according to some embodiments of the present invention. From Figure 5 As can be seen, the gain variation graph uses angles θ and φ as coordinate axes for position parameter matching. Gain parameters are represented by numerical values ​​or color intensity. The gain parameters of noisy components (such as the CPU 51, GPU 52, memory 53, USB 54, and SSD 55) at their matching positions on the gain variation graph are either large or deep (i.e., the noise interference level is large or deep), thus these noisy components can be considered noise sources. In other words, users can determine the location and magnitude of noise sources by analyzing the gain variation graph and the degree of noise interference.

[0051] Rereference Figure 2 After obtaining the noise interference level, the computing device 16 determines whether the device under test 20 is a device with poor radiation based on the noise interference level (step S211). In some embodiments, when the noise interference level is not greater than a noise threshold, the computing device 16 determines that the device under test 20 is a device with good radiation. When the noise interference level is greater than the noise threshold, the computing device 16 determines that the device under test 20 is a device with poor radiation and notifies the user (e.g., by color indication, flashing indication, vibration indication, ringing indication, etc.) so that the user can improve the noise source. The noise threshold can be pre-stored or input into the computing device 16.

[0052] In some embodiments, since the noise interference level is calculated by the computing device 16, the influence of human variables can be reduced, thereby improving the stability of the analysis. In some embodiments, by using simple testing equipment (such as the antenna test chamber 12 and the network analyzer 14), energy consumption can be reduced, so that the noise interference level obtained from the analysis can be substantially consistent with the noise interference level experienced by the device under test 20 during actual use. In some embodiments, since the antenna testing method has relatively simple procedures, the time required to analyze the noise interference level can be reduced.

[0053] Reference Figure 6FIG. 1 illustrates a flowchart of an antenna testing method according to some embodiments of the present application. In some embodiments, the computing device 16 obtains an image file of the device under test 20 before or after generating the gain variation map (step S601). For example, the computing device 16 can obtain the image file of the device under test 20 from an external or internal storage device. The image file can be a schematic diagram or a photograph of the device under test 20. Next, the computing device 16 combines the gain variation map with the image file based on a two-dimensional coordinate system (step S603). In this way, the gain variation map can further present the element distribution of the device under test 20. In this embodiment, the same two-dimensional coordinate system is used when establishing the position parameters, converting the three-dimensional coordinate parameters, and combining the image file. For example, the computing device 16 performs image recognition on the image file to identify each element (e.g., noise element) of the computing device 16, and then superimposes the image of each element in the image file onto the corresponding position in the gain variation map according to the position of each element in the two-dimensional coordinate system. In this way, the user can know the element distribution of the device under test 20 while knowing the gain value through the processed gain variation map.

[0054] Referring to Figure 7 FIG. 1 illustrates a flowchart of an antenna testing method according to some embodiments of the present application. In some embodiments, the computing device 16 divides the plurality of gain parameters into a plurality of different gain levels before generating the gain variation map (step S701). For example, as shown in Table 1, each different gain level corresponds to a plurality of different gain parameters. Next, the computing device 16 generates the gain variation map according to the plurality of two-dimensional coordinate parameters and the plurality of gain levels (step S703). Referring to Figure 5 It can be seen that generating the gain variation map using the two-dimensional coordinate parameters and the gain levels 60 can simplify the information presented on the gain variation map. For example, the gain values presented on the gain variation map are simplified and replaced by the gain levels 60.

[0055] [Table 1] is a comparison table of some gain levels 60 and gain parameters according to some embodiments of the present application.

[0056] Gain step Gain parameter 5 dBi 5 ~ 3 dBi 3 dBi 3 ~ 1 dBi 1 dBi 1 ~ - 1 dBi - 1 dBi - 1 ~ - 3 dBi - 3 dBi - 3 ~ - 5 dBi - 5 dBi - 5 ~ - 7 dBi - 7 dBi - 7 ~ - 9 dBi

[0057] In some embodiments, before distinguishing the gain steps 60, the computing device 16 can delete gain parameters that are beyond a critical upper limit value and a critical lower limit value, and keep gain parameters that are within the critical upper limit value and the critical lower limit value, according to the critical upper limit value and the critical lower limit value. Then, the computing device 16 distinguishes the different gain steps 60 according to the kept gain parameters (step S701). In this way, the data amount of gain parameters can be simplified to reduce the computational burden of the computing device 16. In some embodiments, the critical upper limit value and the critical lower limit value can be pre-stored in the computing device 16 or input to the computing device 16.

[0058] In some embodiments, as shown in FIG. 6, the computing device 16 can perform operation processing on the plurality of two-dimensional coordinate parameters and the plurality of gain steps 60 according to a contour function to generate a contour map formed by the plurality of gain steps 60, and take the contour map as the gain variation map. In this way, the gain variation map can be presented in a continuous distribution and gradual change manner, and the user can quickly obtain the position and size of the noise source. Figure 5

[0059] In summary, according to some embodiments, by matching the position parameters of the noise elements of the to-be-tested element with the gain variation map of the radiation signal of the to-be-tested device, the position of the noise source and the interference degree of the noise source to the radiation signal can be obtained from the gain variation map. According to some embodiments, since the gain variation map can be a visualized graph, the user can quickly determine the position of the noise source and the interference degree. According to some embodiments, since simple test equipment can be used for antenna testing, the test cost can be reduced. For example, only passive antenna test instruments (such as an antenna test chamber and a network analyzer) can be used to measure the radiation signal, and a computing device can be used to obtain the gain variation map and the noise interference degree, so as to reduce the cost of the antenna test instruments.​

Claims

1. A method for testing an antenna, comprising: establishing a position parameter of at least one noise element in a device under test based on a position of the at least one noise element in the device under test in a two-dimensional coordinate system, wherein the device under test is a device having an antenna for emitting a radiated signal; measuring a radiated signal from the device under test to generate a three-dimensional gain information, wherein the three-dimensional gain information comprises a plurality of three-dimensional coordinate parameters; converting the plurality of three-dimensional coordinate parameters into a plurality of two-dimensional coordinate parameters and a plurality of gain parameters in the two-dimensional coordinate system, wherein the plurality of two-dimensional coordinate parameters correspond to the plurality of gain parameters, respectively; generating a gain variation map based on the plurality of two-dimensional coordinate parameters and the plurality of gain parameters; matching the position parameter to the gain variation map to obtain a noise interference level corresponding to the at least one noise element, respectively; and judging whether the device under test is a poor radiated device based on the noise interference level.

2. The method for testing an antenna as claimed in claim 1, further comprising: classifying the plurality of gain parameters into a plurality of different gain levels; and generating the gain variation map based on the plurality of two-dimensional coordinate parameters and the plurality of gain levels. The step of generating the gain variation map based on the plurality of two-dimensional coordinate parameters and the plurality of gain levels is further based on a contour function to form a contour map from the plurality of gain levels as the gain variation map.

3. The antenna test method of claim 2, wherein, The device under test is judged as the poor radiated device when the noise interference level is greater than a noise threshold.

4. The antenna test method of claim 1, wherein, 5. The method for testing an antenna as claimed in claim 1, further comprising: obtaining an image file of the device under test; and combining the gain variation map with the image file based on the two-dimensional coordinate system to further present element distribution of the device under test in the gain variation map.

6. A system for testing an antenna, comprising: an antenna test chamber for accommodating a device under test and receiving a radiated signal emitted from the device under test; and a computing device coupled to the network analyzer for a network analyzer coupled to the antenna test chamber for measuring the radiated signal and generating an analysis information; establishing a position parameter of at least one noise element in a device under test based on a position of the at least one noise element in the device under test in a two-dimensional coordinate system, wherein the device under test is a device having an antenna for emitting a radiated signal; generating a three-dimensional gain information based on the analysis information, wherein the three-dimensional gain information comprises a plurality of three-dimensional coordinate parameters; converting the plurality of three-dimensional coordinate parameters into a plurality of two-dimensional coordinate parameters and a plurality of gain parameters in the two-dimensional coordinate system, wherein the plurality of two-dimensional coordinate parameters correspond to the plurality of gain parameters, respectively; generating a gain variation map based on the plurality of two-dimensional coordinate parameters and the plurality of gain parameters; matching the position parameter to the gain variation map to obtain a noise interference level corresponding to the at least one noise element, respectively; and judging whether the device under test is a poor radiated device based on the noise interference level. ​ ​ ​ 7. The antenna test system of claim 6, wherein, The computing device divides the plurality of gain parameters into a plurality of different gain levels, and generates the gain variation map according to the plurality of two-dimensional coordinate parameters and the plurality of gain levels.

8. The antenna test system of claim 7, wherein, The computing device generates a contour map formed by the plurality of gain levels as the gain variation map according to the plurality of two-dimensional coordinate parameters, the plurality of gain levels, and a contour function.

9. The antenna test system of claim 6, wherein, When the noise interference level is greater than a noise threshold, the computing device determines that the device under test is the radiation defective device.

10. The antenna test system of claim 6, wherein, The computing device acquires an image file of the device under test, and combines the gain variation map with the image file based on the two-dimensional coordinate system, so that the gain variation map further presents the element distribution of the device under test.

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