Mechanical shock testing method, device, electronic device and storage medium

Abstract

The present application relates to the field of impact test technology, and in particular to a mechanical impact test method, device, electronic device, and storage medium. The method includes: analyzing the acquired impact test result information to determine the impact test abnormal result information, where the impact test result information is the test result information summarized after the tests of multiple test objects in the same batch are completed; judging whether the impact test abnormal result information falls within a preset first test abnormal deviation range; if not, obtaining the first impact test information corresponding to the impact test abnormal result information and the second impact test information corresponding to other test objects in the same batch; determining the test compensation information corresponding to the impact test abnormal result information based on the first impact test information and the second impact test information, and correcting the impact test abnormal result information based on the test compensation information. The present application has the effect of improving the accuracy of mechanical impact testing.

Description

Technical Field

[0001] The present application relates to the field of impact testing technology, and in particular to a mechanical impact testing method, device, electronic device, and storage medium. Background Art

[0002] During the production process, transportation, and use, equipment may be subject to mechanical shock, which may lead to performance degradation or failure. To ensure the safety, stability, and timeliness of equipment during the production process, transportation, and application, a portion of equipment within a batch will be selected for mechanical shock testing to simulate real-world conditions. The equipment's various phases of information during the mechanical shock test will be recorded and analyzed to determine the batch's mechanical shock tolerance and the extent of damage. During the mechanical shock test of the device under test, if the number of mechanical shocks is not specified, each surface of the device will generally be impacted three times. Once all surfaces of the device have been mechanically impacted, the mechanical shock test is complete.

[0003] However, before the device under test undergoes a mechanical shock test, it may have already experienced a certain degree of mechanical shock during the production process, transportation, or even during use, which has caused the device under test's ability to withstand mechanical shock to decrease. If the device under test is subjected to a mechanical shock test at this time, the test results of its mechanical shock resistance will be inaccurate. Summary of the Invention

[0004] In order to improve the accuracy of mechanical shock testing, the present application provides a mechanical shock testing method, device, electronic device and storage medium.

[0005] In a first aspect, the present application provides a mechanical shock testing method, which adopts the following technical solution:

[0006] A mechanical shock testing method comprising:

[0007] Analyze the acquired impact test result information to determine abnormal impact test result information, wherein the impact test result information is test result information summarized after the completion of the tests on multiple DUTs in the same batch;

[0008] Determining whether the impact test abnormal result information falls within a preset first test abnormal deviation range;

[0009] If not, obtaining the first impact test information corresponding to the impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch;

[0010] According to the first shock test information and the second shock test information, test compensation information corresponding to the shock test abnormal result information is determined, and the shock test abnormal result information is corrected based on the test compensation information.

[0011] By adopting the above technical solution, the impact test result information is first obtained, and the impact test result information is analyzed and processed. When the impact test abnormal result information is determined, it indicates that there is a test deviation in the impact test result information. At this time, the impact test abnormal result information is substituted into the preset first test abnormal deviation range. If it is determined that the impact test abnormal result information does not fall within the first test abnormal deviation range, it indicates that the abnormality of the impact test abnormal result information may be caused by external factors. At this time, according to the first impact test information corresponding to the obtained impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch, the test compensation information corresponding to the impact test abnormal result information is determined, and the impact test abnormal result information is corrected based on the test compensation information, thereby solving the problem of negative impact of external factors on the test results, thereby improving the accuracy of the impact test results.

[0012] In a possible implementation, the shock test result information includes a plurality of sub-shock test result information, and the analyzing the acquired shock test result information to determine the shock test abnormal result information includes:

[0013] Determining whether each of the plurality of sub-impact test result information falls within a preset second test abnormal deviation range;

[0014] If there is sub-shock test result information that does not fall within the preset second test abnormal deviation range, the sub-shock test result information that does not fall within the preset second test abnormal deviation range is defined as shock test abnormal result information.

[0015] By adopting the above technical solution, the impact test result information includes multiple sub-impact side result information, and the multiple sub-impact test result information are respectively substituted into the preset second test abnormal deviation range for comparison. When there is sub-impact test result information that does not fall within the second test abnormal deviation range, the sub-impact test result information that does not fall within the preset second test abnormal deviation range is defined as impact test abnormal result information, so as to accurately determine the impact test abnormal result information.

[0016] In a possible implementation, the determining whether the plurality of sub-impact test result information respectively fall within a preset second test abnormal deviation range further includes:

[0017] If the plurality of sub-impact test result information do not fall within the preset second test abnormal deviation range, impact test equipment inspection information is generated and fed back to the display terminal for display.

[0018] By adopting the above technical solution, when it is determined that multiple sub-impact test result information does not fall within the preset second test abnormality deviation range, it indicates that all the objects to be tested in this batch may have a large amount of abnormal result information due to the abnormality of the impact equipment during the impact test using the impact equipment. At this time, the impact test equipment inspection information is generated and the information is fed back to the corresponding terminal device of the inspection personnel for display, so as to achieve the purpose of reminding the inspection personnel to check whether the impact test equipment is normal.

[0019] In a possible implementation, obtaining the second impact test information corresponding to other objects to be tested in the same batch then includes:

[0020] Determining reference impact test information corresponding to the previous batch of objects to be tested that is adjacent to the same batch;

[0021] If the second impact test information does not fall within the preset reference test deviation range, the second impact test information is discarded, and the second impact test information corresponding to the objects to be tested other than the objects to be tested corresponding to the second impact test is obtained. The preset reference test deviation range is set based on the reference impact test information, and the reference impact test information is within the preset reference test deviation range.

[0022] By adopting the above-mentioned technical solution, reference impact test information corresponding to the object to be tested in the previous batch adjacent to the same batch is obtained. The impact test information is the impact test information tested on the premise that there is no quality problem with the object to be tested. Subsequently, the second impact test information is substituted into the preset parameter deviation range set according to the reference impact test information. If the second impact test information does not fall within the preset reference test deviation range, it indicates that the second impact test information has a deviation and cannot be used as information for determining the test compensation information corresponding to the abnormal impact test result information. Then, the second impact test information is eliminated to ensure the accuracy of the second impact test information.

[0023] In a possible implementation, determining, based on the first shock test information and the second shock test information, the test compensation information corresponding to the shock test abnormal result information includes:

[0024] determining whether the first impact test information is the same as the second impact test information;

[0025] If not, a difference calculation is performed between the first shock test information and the second shock test information to determine compensation information corresponding to the shock test abnormal result information.

[0026] By adopting the above technical solution, the first impact test information is compared with the second impact test information to determine whether the first impact test information and the second impact test information are the same. If they are not the same, it indicates that there is a deviation in the quality of the objects to be tested corresponding to the first impact test information and the second impact test information respectively. Then, the difference between the first impact test information and the second impact test information is calculated to determine the compensation information corresponding to the abnormal impact test result information.

[0027] In a possible implementation, the first shock test information includes first initial information, the second shock test information includes second initial information, and the test compensation information corresponding to the shock test abnormal result information is determined, and then the following steps are further included:

[0028] A difference calculation is performed on the first initial information and the second initial information to determine initial abnormal deviation information corresponding to the impact test abnormal result information and feed it back to the display terminal.

[0029] By adopting the above technical solution, the initial abnormal deviation information corresponding to the impact test abnormal result information determined by performing difference calculation on the first initial information and the second initial information can reflect the difference between the object to be tested corresponding to the first initial information and the object to be tested corresponding to the second initial information before the impact test.

[0030] In a possible implementation, determining reference impact test information corresponding to the objects to be tested of the previous batch and adjacent to the same batch includes:

[0031] Obtain historical impact test information corresponding to a plurality of objects to be tested from a previous batch adjacent to the same batch;

[0032] The historical shock test information corresponding to the multiple objects to be tested is averaged to determine the reference shock test information.

[0033] By adopting the above technical solution, the historical impact test information corresponding to all the objects to be tested contained in the previous batch adjacent to the same batch is obtained, and then the average of the historical impact test information corresponding to all the objects to be tested is calculated to determine the average impact test information corresponding to the batch as the reference impact test information, thereby ensuring the accuracy of the preset reference test deviation range set based on the reference impact test information.

[0034] In a second aspect, the present application provides a mechanical shock testing device, which adopts the following technical solution:

[0035] A mechanical shock test device includes: an abnormal result information determination module, a judgment module, a test information acquisition module, and a deviation compensation information determination module, wherein:

[0036] An abnormal result information determination module is used to analyze the acquired impact test result information and determine the impact test abnormal result information, wherein the impact test result information is the test result information summarized after the completion of the tests on multiple DUTs of the same batch;

[0037] A judgment module, configured to judge whether the impact test abnormal result information falls within a preset first test abnormal deviation range;

[0038] A test information acquisition module is used to obtain, if it does not belong to, the first impact test information corresponding to the impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch;

[0039] The deviation compensation information determination module is used to determine the test compensation information corresponding to the shock test abnormal result information according to the first shock test information and the second shock test information, and to correct the shock test abnormal result information based on the test compensation information.

[0040] By adopting the above technical solution, first, the abnormal result information determination module obtains the impact test result information, and analyzes and processes the impact test result information. When the impact test abnormal result information is determined, it indicates that there is a test deviation in the impact test result information. At this time, the judgment module substitutes the impact test abnormal result information into the preset first test abnormal deviation range. If it is judged that the impact test abnormal result information does not fall within the first test abnormal deviation range, it indicates that the abnormality of the impact test abnormal result information may be caused by external factors. At this time, according to the first impact test information corresponding to the impact test abnormal result information obtained by the test information acquisition module and the second impact test information corresponding to other test objects in the same batch, the deviation compensation information determination module determines the test compensation information corresponding to the impact test abnormal result information, and corrects the impact test abnormal result information based on the test compensation information, thereby solving the problem of negative impact of external factors on the test results, thereby improving the accuracy of the impact test results.

[0041] In a possible implementation, the abnormal result information determination module further includes: a first judgment unit and an information determination unit, wherein:

[0042] The impact test result information includes a plurality of sub-impact test result information;

[0043] A first judging unit is configured to judge whether each of the plurality of sub-impact test result information falls within a preset second test abnormal deviation range;

[0044] The information determining unit is configured to define the sub-shock test result information not belonging to the preset second test abnormal deviation range as shock test abnormal result information if there is sub-shock test result information not belonging to the preset second test abnormal deviation range.

[0045] In a possible implementation, the mechanical shock testing device further includes: a first feedback module, wherein:

[0046] The first feedback module is configured to generate impact test equipment inspection information and feed it back to the display terminal for display if none of the plurality of sub-impact test result information falls within a preset second test abnormal deviation range.

[0047] In a possible implementation, the mechanical shock testing device further includes: a test information determination module and a test information acquisition module, wherein:

[0048] A test information determination module, configured to determine reference impact test information corresponding to the objects to be tested of the previous batch and adjacent to the same batch;

[0049] a test information acquisition module configured to discard the second shock test information if the second shock test information does not fall within a preset reference test deviation range, and to obtain second shock test information corresponding to objects to be tested other than the object to be tested corresponding to the second shock test, wherein the preset reference test deviation range is set based on the reference shock test information, and the reference shock test information is within the preset reference test deviation range.

[0050] In a possible implementation, the deviation compensation information determination module further includes: a second judgment unit and a compensation information determination unit, wherein:

[0051] a second determining unit, configured to determine whether the first shock test information is the same as the second shock test information;

[0052] A compensation information determining unit is configured to perform a difference calculation on the first impact test information and the second impact test information if the first impact test information is different from the second impact test information, so as to determine compensation information corresponding to the impact test abnormal result information.

[0053] In a possible implementation, the mechanical shock testing device further includes: a second feedback module, wherein:

[0054] The second feedback module is configured to perform difference calculation on the first initial information and the second initial information, determine initial abnormal deviation information corresponding to the impact test abnormal result information, and feed back the information to the display terminal.

[0055] In a possible implementation, the test information determination module further includes: a historical test information acquisition unit and a test information determination unit, wherein:

[0056] A historical test information acquisition unit, configured to acquire historical impact test information corresponding to a plurality of objects to be tested from a previous batch adjacent to the same batch;

[0057] The test information determining unit is configured to calculate the average of the historical shock test information corresponding to the plurality of objects to be tested, and determine the reference shock test information.

[0058] In a third aspect, the present application provides an electronic device, which adopts the following technical solution:

[0059] An electronic device, comprising:

[0060] at least one processor;

[0061] Memory;

[0062] At least one application, wherein the at least one application is stored in the memory and configured to be executed by at least one processor, the at least one application configured to: perform the above-mentioned mechanical shock test method.

[0063] In a fourth aspect, the present application provides a computer-readable storage medium, which adopts the following technical solution:

[0064] A computer-readable storage medium includes: a computer program stored therein that can be loaded by a processor and execute the mechanical shock testing method.

[0065] In summary, this application has the following beneficial technical effects:

[0066] First, the impact test result information is obtained and analyzed and processed. When the impact test abnormal result information is determined, it indicates that there is a test deviation in the impact test result information. At this time, the impact test abnormal result information is substituted into the preset first test abnormal deviation range. If it is determined that the impact test abnormal result information does not fall within the first test abnormal deviation range, it indicates that the abnormality of the impact test abnormal result information may be caused by external factors. At this time, according to the first impact test information corresponding to the obtained impact test abnormal result information and the second impact test information corresponding to other test objects in the same batch, the test compensation information corresponding to the impact test abnormal result information is determined, and the impact test abnormal result information is corrected based on the test compensation information, thereby solving the problem of negative impact of external factors on the test results, thereby improving the accuracy of the impact test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] Figure 1 1 is a flow chart of a mechanical shock testing method according to an embodiment of the present application;

[0068] Figure 2 is a block diagram of a mechanical shock testing device according to an embodiment of the present application;

[0069] Figure 3 It is a schematic diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0070] The following is combined with Figure 1-3 This application is described in further detail.

[0071] To make the purpose, technical solutions, and advantages of the embodiments of this application more clear, the technical solutions in the embodiments of this application will be clearly and completely described below in conjunction with the drawings in the embodiments of this application. Obviously, the described embodiments are part of the embodiments of this application, not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0072] The embodiments of the present application provide a mechanical shock testing method performed by an electronic device, wherein the device can be a server or a terminal device. The server can be an independent physical server, a server cluster or distributed device composed of multiple physical servers, or a cloud server providing cloud computing services. The terminal device can be a smartphone, tablet computer, laptop computer, desktop computer, etc., but is not limited to these. The terminal device and the server can be directly or indirectly connected via wired or wireless communication, which is not limited in the embodiments of the present application.

[0073] Reference Figure 1 The method includes: step S101, step S102, step S103 and step S104, wherein,

[0074] S101: Analyze the acquired impact test result information to determine abnormal impact test result information.

[0075] For the embodiment of the present application, the impact test result information is the test result information summarized after the tests of multiple test objects in the same batch are completed; the impact test abnormal result information is the impact test result information obtained after the impact test of a test object with quality problems in the same batch is completed.

[0076] Multiple identical objects to be tested from the same batch are placed in the impact testing equipment in turn for impact testing. Each object to be tested undergoes multiple impact tests and the impact test information corresponding to each impact test is recorded. Based on the multiple impact test information, the impact test results corresponding to each object to be tested are obtained. Subsequently, based on the impact test results corresponding to each object to be tested, the final impact test result information is determined and sent to the electronic device. Since the impact test result information covers the impact test results of all objects to be tested from the same batch during the impact test process, the electronic device analyzes the impact test result information when it obtains it, and further determines the impact test abnormal result information, which indicates that the quality of the object to be tested corresponding to the impact test abnormal result information is different from the quality of other objects to be tested in the same batch. At this time, the electronic device uses the impact test abnormal result information as information for determining the corresponding test compensation information.

[0077] S102: Determine whether the impact test abnormal result information falls within a preset first test abnormal deviation range.

[0078] For the embodiment of the present application, the first test abnormality deviation range is used to determine whether the impact test abnormality result information should be comparative information tested after the corresponding object to be tested has quality problems due to external factors. The first test abnormality deviation range can be set with reference to the maximum impact test deviation amount that occurs when the object to be tested has no quality problems.

[0079] After the electronic device determines the abnormal impact test result information, it needs to further determine whether the abnormal impact test result information is caused by the quality of the corresponding object to be tested itself, or whether it is caused by the object to be tested being affected by external factors. That is, the electronic device substitutes the abnormal impact test result information into the preset first test abnormal deviation range to determine whether the abnormal impact test result information falls within the preset first test abnormal deviation range.

[0080] S103: If not, obtaining first shock test information corresponding to the shock test abnormal result information and second shock test information corresponding to other objects to be tested in the same batch.

[0081] For the embodiment of the present application, the first impact test information is the impact test information output by the object to be tested during a single round of multiple impact tests, and the second impact test information is the impact test information output by other objects to be tested in the same batch during a single round of multiple impact tests.

[0082] If it is determined that the impact test abnormal result information does not fall within the preset first test abnormal deviation range, it indicates that the object to be tested corresponding to the impact test abnormal result information has been affected by external factors, resulting in the testing of the impact test abnormal result information. For example, the object to be tested has collided before arriving at the impact test site, resulting in quality problems of the object to be tested before the impact test; then, the electronic device obtains the first impact test information corresponding to the impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch, wherein the other objects to be tested are objects to be tested that have not been affected by external factors before the impact test. Subsequently, the electronic device incorporates the first impact test information and the second impact test into the process of improving the accuracy of the impact test.

[0083] S104 : Determine test compensation information corresponding to the shock test abnormal result information according to the first shock test information and the second shock test information, and correct the shock test abnormal result information based on the test compensation information.

[0084] In the embodiment of the present application, the test compensation information is information for compensating for the impact of external factors on the object under test corresponding to the abnormal result information of the impact test before the impact test.

[0085] The electronic device uses the second impact test information as the reference information, compares the first impact test, determines the deviation between the first impact test information and the second impact test, that is, determines the test compensation information corresponding to the impact test abnormal result information. Subsequently, the electronic device uses the test compensation information to correct the impact test abnormal result information so that the influence of external factors on the object to be tested corresponding to the impact test abnormal result information is eliminated, and the impact test information tested when there is no problem with the quality of the object to be tested itself is obtained, thereby improving the accuracy of the impact test.

[0086] An embodiment of the present application provides a mechanical shock testing method, in which the electronic device first obtains shock test result information and analyzes and processes the shock test result information. When the electronic device determines that the shock test abnormal result information is obtained, it indicates that there is a test deviation in the shock test result information. At this time, the electronic device substitutes the shock test abnormal result information into a preset first test abnormal deviation range. If it is determined that the shock test abnormal result information does not fall within the first test abnormal deviation range, it indicates that the abnormality in the shock test abnormal result information is likely caused by external factors. At this time, the electronic device determines the test compensation information corresponding to the shock test abnormal result information based on the first shock test information corresponding to the obtained shock test abnormal result information and the second shock test information corresponding to other objects to be tested in the same batch, and corrects the shock test abnormal result information based on the test compensation information, thereby solving the problem of negative impact of external factors on the test results, thereby improving the accuracy of the shock test results.

[0087] Specifically, the impact test result information includes multiple sub-impact test result information. In step S101, the acquired impact test result information is analyzed to determine the impact test abnormal result information, specifically including: judging whether the multiple sub-impact test result information respectively belong to the preset second test abnormal deviation range; if there is sub-impact test result information that does not belong to the preset second test abnormal deviation range, the sub-impact test result information that does not belong to the preset second test abnormal deviation range is defined as impact test abnormal result information.

[0088] For the embodiment of the present application, the electronic device is preset with a second test abnormal deviation range, which serves as judgment information on whether the impact test results corresponding to multiple test objects in the same batch exceed the normal deviation amount; the sub-shock test result information is the test result information after the impact test of a single test object in the same batch.

[0089] The electronic device first determines multiple sub-shock test result information contained in the impact test result information, and then substitutes each sub-shock test result information into a preset second test abnormality deviation range that is preset in advance, and determines whether each sub-shock test result information belongs to the preset second test abnormality deviation range. If there is a sub-shock test result information that does not belong to the preset second test abnormality deviation range, it indicates that the impact test of the object to be tested corresponding to the sub-shock test result information that does not belong to the preset second test abnormality deviation range has failed. At this time, the sub-shock test result that does not belong to the preset second test abnormality deviation range is defined as impact test abnormal result information.

[0090] To further illustrate, if there is sub-shock test result information that falls within the preset second test abnormal deviation range, it indicates that the object under test corresponding to the sub-shock test information that falls within the preset second test abnormal deviation range is qualified during the shock test process, and the electronic device will not use this type of object under test as an object of test compensation.

[0091] Specifically, after determining whether multiple sub-impact test result information respectively belongs to the preset second test abnormal deviation range, it also includes: if multiple sub-impact test result information does not belong to the preset second test abnormal deviation range, impact test equipment inspection information is generated and fed back to the display terminal for display.

[0092] By adopting the above technical solution, the electronic device substitutes multiple sub-impact test result information into the preset second test abnormality deviation range for judgment. If it is judged that multiple sub-impact test result information does not fall within the second test abnormality deviation range, it indicates that there may be an abnormality in the impact test equipment, which causes the impact test results of all the objects to be tested in the same batch to be abnormal. At this time, the impact test results will not be objective and convincing. Therefore, the electronic device generates impact test equipment verification information and sends the verification information to relevant testing personnel to remind the testing personnel that a large number of abnormalities have occurred in the impact test results of the batch of objects to be tested, and it is necessary to check whether the impact test equipment is operating normally to eliminate the impact of the impact test equipment on the impact test results.

[0093] The purpose of the electronic device obtaining the second shock test information corresponding to other objects to be tested in the same batch is to determine the information deviation existing in the first shock test information corresponding to the shock test abnormal result information. Therefore, in order to ensure the accuracy of the information deviation corresponding to the first shock test information, it is necessary to ensure the accuracy of the obtained second shock side information. Specifically, in step S103, the second shock test information corresponding to other objects to be tested in the same batch is obtained, and then the following steps are included: determining the reference shock test information corresponding to the objects to be tested that are adjacent to the same batch and in the previous batch; if the second shock test information does not fall within the preset reference test deviation range, the second shock test information is discarded, and the second shock test information corresponding to the objects to be tested other than the objects to be tested corresponding to the second shock test is obtained. The preset reference test deviation range is set based on the reference shock test information, and the reference shock test information is within the preset reference test deviation range.

[0094] In the embodiment of the present application, the reference shock test information is shock test information output when the shock test is performed on the objects to be tested in the previous batch and adjacent to the current batch.

[0095] The electronic device sets a preset reference test deviation range based on the determined reference shock test information corresponding to any one of the objects to be tested that is adjacent to the same batch and in the previous batch. The preset reference test deviation range includes the reference shock test information. Subsequently, the electronic device substitutes the second shock test information into the preset reference test deviation range to determine whether the second shock test information belongs to the second preset reference test deviation range. If not, it indicates that the information deviation amount corresponding to the second shock test information exceeds the reasonable deviation amount in the shock test process under the premise of ensuring that there is no problem with the quality of the object to be tested. At this time, it is considered that the second shock test information cannot be involved in the process of determining the test compensation information corresponding to the test abnormal result information. The electronic device then eliminates the second shock information and simultaneously obtains the second shock test information corresponding to the objects to be tested other than the object to be tested corresponding to the second shock test, and includes the second shock test information in the process of determining the test compensation information corresponding to the test abnormal result information.

[0096] Furthermore, after the electronic device obtains the second impact test information corresponding to the object to be tested other than the object to be tested corresponding to the second impact test information, it will also substitute the second impact test information into the preset reference test deviation range for comparison. If the second impact test information does not yet belong to the preset reference test deviation range, the second impact test information will continue to be eliminated until the second impact test information that belongs to the preset reference test deviation range is determined.

[0097] The reference shock test information determined by the electronic device is used to set a preset reference test deviation range. The previous batch of objects to be tested contains multiple objects, and there are certain differences in the shock test information corresponding to the multiple objects to be tested. Therefore, in order to enable the preset reference test deviation range set based on the determined reference shock test information to cover the differences between the shock test information corresponding to the multiple objects to be tested as much as possible, it is necessary to determine more accurate reference shock test information. Specifically, in the process of determining the reference shock test information corresponding to the objects to be tested of the previous batch and adjacent to the same batch, it specifically includes: obtaining the historical shock test information corresponding to the multiple objects to be tested of the previous batch and adjacent to the same batch; calculating the average of the historical shock test information corresponding to the multiple objects to be tested, and determining the reference shock test information.

[0098] For the embodiment of the present application, the electronic device obtains the historical impact test information corresponding to all the objects to be tested contained in the previous batch adjacent to the same batch, and then the electronic device calculates the average of the historical impact test information corresponding to all the objects to be tested, and then determines the average impact test information corresponding to the batch. The electronic device uses the average impact test information as the reference impact test information to ensure the accuracy of the preset reference test deviation range set based on the reference impact test information.

[0099] If the object to be tested has been collided by external factors before the shock test, and this has caused quality problems for the object to be tested, and the shock test is then performed on the object to be tested again, the shock test information obtained during the shock test will have a larger information deviation than the relay test information of the object to be tested that has not collided before the shock test. Therefore, it is necessary to determine the portion of the information deviation that exceeds the normal amount due to the collision and perform corresponding information compensation. Specifically, in step S104, based on the first shock test information and the second shock test information, test compensation information corresponding to the shock test abnormal result information is determined, specifically including: determining whether the first shock test information is the same as the second shock test information; if not, performing a difference calculation between the first shock test information and the second shock test information to determine the compensation information corresponding to the shock test abnormal result information.

[0100] For the embodiment of the present application, the electronic device compares the first impact test information with the second impact test information to determine whether the first impact test information is the same as the second impact test information. If the first impact test information is different from the second impact test information, it means that the object to be tested corresponding to the first impact test information has been collided with external factors. At this time, the electronic device calculates the difference between the first impact test information and the second impact test information to determine the compensation information corresponding to the abnormal impact test result information, thereby compensating for the information deviation caused by the collision of the object to be tested with external factors.

[0101] Furthermore, since the quality of the object to be tested has problems due to a collision before the impact test, the initial information corresponding to the object to be tested obtained by the impact testing equipment during the impact test will also be different from the initial information under normal circumstances. Since it is caused by the collision, the difference in the initial information can be used as another reference information for the generation process of the object to be tested. Therefore, it is necessary to determine this part of the reference information. Specifically, the first impact test information includes the first initial information, the second impact test information includes the second initial information, and the test compensation information corresponding to the impact test abnormal result information is determined. It then also includes: performing a difference calculation on the first initial information and the second initial information, determining the initial abnormal deviation information corresponding to the impact test abnormal result information and feeding it back to the display terminal.

[0102] For the embodiment of the present application, the first initial information is the basic information of the object to be tested before the impact test if a collision occurs, and the second initial information is the basic information of the object to be tested before the impact test if no collision occurs.

[0103] After obtaining the first initial information contained in the first impact test information and the second initial information contained in the second impact test information, the electronic device calculates the difference between the first initial information and the second initial information to determine the initial abnormal deviation information corresponding to the impact test abnormal result information. Subsequently, the electronic device feeds back the initial abnormal deviation information to the display terminal for display, thereby using the initial abnormal information as a test information of the impact test process.

[0104] It is further explained that the initial abnormal deviation information can also be fed back to the display terminal of the technician corresponding to the manufacturer of the object to be tested for display, so that the technician corresponding to the manufacturer can know the problems that may occur during the transportation of the equipment in the first time, and then quickly adjust the transportation environment of the equipment to reduce the occurrence of collisions during transportation.

[0105] The above embodiment introduces a method for mechanical shock testing from the perspective of method flow, and the following embodiment introduces a device for mechanical shock testing from the perspective of a virtual module or virtual unit. Please refer to the following embodiment for details.

[0106] Reference Figure 2 The mechanical shock testing device 20 may specifically include: an abnormal result information determination module 201, a judgment module 202, a test information acquisition module 203, and a deviation compensation information determination module 204, wherein:

[0107] Abnormal result information determination module 201 is used to analyze the acquired impact test result information and determine abnormal impact test result information. The impact test result information is the test result information summarized after the tests of multiple DUTs in the same batch are completed.

[0108] The judgment module 202 is used to judge whether the impact test abnormal result information falls within a preset first test abnormal deviation range;

[0109] The test information acquisition module 203 is configured to acquire, if it does not belong to, first shock test information corresponding to the shock test abnormal result information and second shock test information corresponding to other test objects in the same batch;

[0110] The deviation compensation information determination module 204 is used to determine the test compensation information corresponding to the shock test abnormal result information based on the first shock test information and the second shock test information, and to correct the shock test abnormal result information based on the test compensation information.

[0111] In a possible implementation of the embodiment of the present application, the abnormal result information determination module 201 further includes: a first judgment unit and an information determination unit, wherein:

[0112] The impact test result information includes multiple sub-impact test result information;

[0113] The first judgment unit is used to judge whether the result information of the plurality of sub-impact tests respectively falls within a preset second test abnormal deviation range;

[0114] The information determining unit is configured to define the sub-shock test result information not belonging to the preset second test abnormal deviation range as shock test abnormal result information if there is sub-shock test result information not belonging to the preset second test abnormal deviation range.

[0115] In a possible implementation of the embodiment of the present application, the mechanical shock testing device further includes: a first feedback module, wherein:

[0116] The first feedback module is configured to generate impact test equipment inspection information and feed it back to the display terminal for display if the plurality of sub-impact test result information do not fall within the preset second test abnormal deviation range.

[0117] In a possible implementation of the embodiment of the present application, the mechanical shock testing device 20 further includes: a test information determination module and a test information acquisition module, wherein:

[0118] A test information determination module is used to obtain reference impact test information corresponding to any object to be tested in a previous batch adjacent to the same batch;

[0119] A test information acquisition module is configured to discard the second shock test information if the second shock test information does not fall within a preset reference test deviation range, and to obtain second shock test information corresponding to objects to be tested other than the object to be tested corresponding to the second shock test, wherein the preset reference test deviation range is set based on the reference shock test information, and the reference shock test information is within the preset reference test deviation range.

[0120] In a possible implementation of the embodiment of the present application, the deviation compensation information determination module 204 further includes: a second judgment unit and a compensation information determination unit, wherein:

[0121] a second judging unit, configured to judge whether the first shock test information is the same as the second shock test information;

[0122] The compensation information determining unit is configured to perform difference calculation on the first shock test information and the second shock test information if the first shock test information is different from the second shock test information, so as to determine compensation information corresponding to the shock test abnormal result information.

[0123] In a possible implementation of the embodiment of the present application, the mechanical shock testing device 20 further includes: a second feedback module, wherein:

[0124] The second feedback module is used to perform difference calculation on the first initial information and the second initial information, determine the initial abnormal deviation information corresponding to the abnormal result information of the impact test, and feed back the initial abnormal deviation information to the display terminal.

[0125] In a possible implementation of the embodiment of the present application, the test information determination module further includes: a historical test information acquisition unit and a test information determination unit, wherein:

[0126] A historical test information acquisition unit, used to acquire historical impact test information corresponding to a plurality of DUTs in a previous batch adjacent to the same batch;

[0127] The test information determining unit is used to calculate the average of the historical shock test information corresponding to the multiple objects to be tested, and determine the reference shock test information.

[0128] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0129] The embodiment of the present application also introduces an electronic device from the perspective of a physical device, such as Figure 3 As shown, Figure 3 The electronic device 30 shown includes a processor 301 and a memory 303. The processor 301 and the memory 303 are connected, for example, via a bus 302. Optionally, the electronic device 30 may further include a transceiver 304. It should be noted that in practice, the number of transceivers 304 is not limited to one, and the structure of the electronic device 30 does not constitute a limitation on the embodiments of the present application.

[0130] Processor 301 can be a CPU (Central Processing Unit), a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), or other programmable logic device, transistor logic device, hardware component, or any combination thereof. It can implement or execute the various exemplary logic blocks, modules, and circuits described in conjunction with the disclosure of this application. Processor 301 can also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, etc.

[0131] Bus 302 may include a path for transmitting information between the above components. Bus 302 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus. Bus 302 may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, Figure 3 Only one thick line is used in the diagram, but this does not mean that there is only one bus or one type of bus.

[0132] The memory 303 may be a ROM (Read Only Memory) or other type of static storage device that can store static information and instructions, a RAM (Random Access Memory) or other type of dynamic storage device that can store information and instructions, or an EEPROM (Electrically Erasable Programmable Read Only Memory), a CD-ROM (Compact Disc Read Only Memory) or other optical disk storage, optical disk storage (including compact discs, laser discs, optical discs, digital versatile discs, Blu-ray discs, etc.), a magnetic disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store desired program code in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto.

[0133] The memory 303 is used to store application code for executing the solution of the present application, and the execution is controlled by the processor 301. The processor 301 is used to execute the application code stored in the memory 303 to implement the content shown in the above method embodiment.

[0134] Figure 3 The electronic device shown is merely an example and should not limit the functions and scope of use of the embodiments of the present application.

[0135] It should be understood that although the steps in the flowcharts of the accompanying drawings are shown in sequence as indicated by the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some of the steps in the flowcharts of the accompanying drawings may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily executed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be executed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.

[0136] The above are only some of the implementation methods of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. A mechanical shock testing method, characterized in that: include: Analyze the acquired impact test result information to determine abnormal impact test result information, wherein the impact test result information is test result information summarized after the completion of the tests on multiple DUTs in the same batch; Determining whether the impact test abnormal result information falls within a preset first test abnormal deviation range; If not, obtaining the first impact test information corresponding to the impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch; According to the first shock test information and the second shock test information, test compensation information corresponding to the shock test abnormal result information is determined, and the shock test abnormal result information is corrected based on the test compensation information.

2. The method according to claim 1, characterized in that The shock test result information includes a plurality of sub-shock test result information, and the analysis of the acquired shock test result information to determine shock test abnormal result information includes: Determining whether each of the plurality of sub-impact test result information falls within a preset second test abnormal deviation range; If there is sub-shock test result information that does not fall within the preset second test abnormal deviation range, the sub-shock test result information that does not fall within the preset second test abnormal deviation range is defined as shock test abnormal result information.

3. The method according to claim 2, characterized in that The step of determining whether the plurality of sub-impact test result information respectively fall within a preset second test abnormal deviation range further includes: If the plurality of sub-impact test result information do not fall within the preset second test abnormal deviation range, impact test equipment inspection information is generated and fed back to the display terminal for display.

4. The method according to claim 1, wherein The step of obtaining the second impact test information corresponding to other objects to be tested in the same batch then includes: Determining reference impact test information corresponding to the previous batch of objects to be tested that is adjacent to the same batch; If the second impact test information does not fall within the preset reference test deviation range, the second impact test information is discarded, and the second impact test information corresponding to the objects to be tested other than the objects to be tested corresponding to the second impact test is obtained. The preset reference test deviation range is set based on the reference impact test information, and the reference impact test information is within the preset reference test deviation range.

5. The method according to claim 1, wherein The determining, based on the first shock test information and the second shock test information, test compensation information corresponding to the shock test abnormal result information includes: determining whether the first impact test information is the same as the second impact test information; If not, a difference calculation is performed between the first shock test information and the second shock test information to determine compensation information corresponding to the shock test abnormal result information.

6. The method according to claim 4, characterized in that The first shock test information includes first initial information, the second shock test information includes second initial information, and the test compensation information corresponding to the shock test abnormal result information is determined, and then the following further includes: A difference calculation is performed on the first initial information and the second initial information to determine initial abnormal deviation information corresponding to the impact test abnormal result information and feed it back to the display terminal.

7. The method according to claim 1, characterized in that The determining of reference impact test information corresponding to the objects to be tested of the previous batch and adjacent to the same batch includes: Obtain historical impact test information corresponding to a plurality of objects to be tested from a previous batch adjacent to the same batch; The historical shock test information corresponding to the multiple objects to be tested is averaged to determine the reference shock test information.

8. A mechanical shock testing device, characterized in that: include: An abnormal result information determination module is used to analyze the acquired impact test result information and determine the impact test abnormal result information, wherein the impact test result information is the test result information summarized after the completion of the tests on multiple DUTs of the same batch; A judgment module, configured to judge whether the impact test abnormal result information falls within a preset first test abnormal deviation range; A test information acquisition module is used to obtain the first impact test information corresponding to the impact test abnormal result information and the second impact test information corresponding to other objects to be tested in the same batch if it does not belong to the impact test abnormal result information; The deviation compensation information determination module is used to determine the test compensation information corresponding to the shock test abnormal result information according to the first shock test information and the second shock test information, and to correct the shock test abnormal result information based on the test compensation information.

9. An electronic device, characterized in that: The electronic device includes: at least one processor; Memory; At least one application, wherein the at least one application is stored in a memory and configured to be executed by at least one processor, and the at least one application is configured to: execute the mechanical shock testing method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed in a computer, the computer is caused to execute the mechanical impact testing method according to any one of claims 1 to 7.

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