Method for measuring the thickness of an aluminum layer of an aluminum-plastic film corner

Abstract

The application discloses a kind of measurement methods of aluminium plastic film angle position aluminium layer thickness, it is related to data measurement technical field.The measurement method of aluminium plastic film angle position aluminium layer thickness includes: obtaining the multiple thickness values measured when X-ray laser point of X-ray thickness gauge moves along preset scanning path, wherein the preset scanning path passes through the thinnest area of sample;Contrast the thickness value, take the minimum value as measurement value in it.The above-mentioned mode can improve the accuracy of aluminium plastic film angle position aluminium layer thickness thinnest point measurement, and not damage sample, convenient for multiple measurement inspection.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of data measurement, in particular to a kind of measurement method of aluminium plastic film corner position aluminium layer thickness. BACKGROUND

[0002] With the increasing demand of new energy automobile industry on the energy density of lithium ion battery, the structural design of soft package battery constantly pursues the design demand of large size and thick battery, to ensure the high temperature and high humidity storage and safety performance of battery, higher requirements are put forward for the aluminium plastic film corner position aluminium layer thickness after punching, therefore, it is particularly important to accurately measure the aluminium plastic film corner position aluminium layer thickness after punching.

[0003] At present, the commonly used measurement method of aluminium plastic film corner position aluminium layer thickness is to mark the thinnest point of corner position before sampling the aluminium plastic film corner position, and to cut the aluminium plastic film corner position as test sample along the center line of the thinnest point of corner position, to flatten the corner position of sample, clamp between two PP plates, place in straight line type clamp and clamp, adjust the position of tool, make the blade align with the sample, push the tool to cut until the thinnest point of punching aluminium plastic film corner position mark, and then take down the sample to measure the aluminium layer thickness of corner position under video microscope.

[0004] When cutting measurement is carried out by using the above measurement method, it is generally operated by personal subjective operation, the thinnest point of aluminium plastic film corner position aluminium layer thickness after punching cannot be accurately determined, and the aluminium layer thickness change of point position near the center line cannot be accurately observed, which is easy to mislead the design and adjustment of the top angle of punching die. SUMMARY

[0005] The present application aims to provide a kind of measurement method of aluminium plastic film corner position aluminium layer thickness, which can improve the accuracy of measuring the thinnest point of aluminium plastic film corner position aluminium layer thickness, and does not damage the sample, which is convenient for multiple measurement and inspection.

[0006] The embodiment of the present application is implemented as follows:

[0007] The embodiment of the present application provides a kind of measurement method of aluminium plastic film corner position aluminium layer thickness, the method comprises: obtaining multiple thickness values measured when X-ray laser point of X-ray thickness gauge moves along preset scanning path, wherein the preset scanning path passes through the thinnest region of sample;Compare the thickness values, take the minimum value as measurement value.

[0008] Optionally, before the multiple thickness values measured when X-ray laser point of X-ray thickness gauge moves along preset scanning path are obtained, the method comprises: cutting the corner position of aluminium plastic film to be measured as detection sample, marking detection area on the detection sample;Place the detection sample in the clamp, and make the corner position measurement surface parallel to the clamp surface;Make the extension line of one of the stamping corners of the detection sample correspond to the preset scanning path.

[0009] Optionally, the marking the detection area on the detection sample comprises: determining the intersection of the top edge R-angle, the side edge R-angle and the vertical edge R-angle of the detection sample according to the top edge R-angle, the side edge R-angle and the vertical edge R-angle of the detection sample; marking the detection sample along the extension line of the top edge R-angle, the side edge R-angle or the vertical edge R-angle, and the marking area covers the entire length of the extension line on the detection sample.

[0010] Optionally, the maximum width of the detection sample is less than 30mm.

[0011] Optionally, the plurality of thickness values measured when the X-ray laser point of the X-ray thickness gauge moves along the preset scanning path comprises: positioning and marking the preset scanning path using coordinate points; determining the number of coordinate points according to the size of the X-ray laser point; and obtaining the thickness values measured at each coordinate point.

[0012] Optionally, the spacing between adjacent coordinate points is equal.

[0013] Optionally, the spacing is between 0.1mm and 0.5mm.

[0014] Optionally, after taking the minimum value as the measurement value, the method further comprises: measuring the detection sample multiple times.

[0015] Optionally, the coordinate points are located within the coverage range of the detection sample.

[0016] Optionally, the X-ray laser points on adjacent coordinate points have an overlapping area.

[0017] The beneficial effects of the embodiments of the present application include:

[0018] The method for measuring the thickness of the aluminum layer at the corner position of the aluminum-plastic film provided by the embodiments of the present application, when measuring the thinnest point of the aluminum-plastic film after the punching, makes the X-ray laser point of the X-ray thickness gauge move along a preset scanning path, which can measure the thickness at different positions on the scanning path, avoids missing the point positions on the scanning path, and thus guarantees the integrity of the measurement data. In this way, the minimum value from the measured thickness is the required measurement value. The above-mentioned method can improve the accuracy of measuring the thinnest point of the aluminum layer at the corner position of the aluminum-plastic film, does not damage the sample, and is convenient for multiple measurements. BRIEF DESCRIPTION OF DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments. It should be understood that the following drawings only show some of the embodiments of the present application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor on the basis of these drawings.

[0020] Figure 1 One of the flowcharts of the measurement method of the aluminum layer thickness of the aluminum-plastic film corner position provided by the embodiments of the present application;

[0021] Figure 2 The second flowchart of the measurement method of the aluminum layer thickness of the aluminum-plastic film corner position provided by the embodiments of the present application;

[0022] Figure 3 The structure schematic diagram of the aluminum-plastic film to be measured provided by the embodiments of the present application;

[0023] Figure 4 The flowchart of marking the detection area on the detection sample provided by the embodiments of the present application;

[0024] Figure 5 The first structure schematic diagram of the detection sample provided by the embodiments of the present application;

[0025] Figure 6 The flowchart of obtaining the thickness value along the preset scanning path provided by the embodiments of the present application;

[0026] Figure 7 The second structure schematic diagram of the detection sample provided by the embodiments of the present application.

[0027] Icon: 100-aluminum-plastic film to be measured; 110-detection sample; 112-top edge R corner; 114-side edge R corner; 116-vertical edge R corner; 120-X-ray laser point. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical solutions and advantages of the embodiments of the present application more clear, the following will combine the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, not all the embodiments. The components of the embodiments of the present application described and shown in the drawings can be arranged and designed in various different configurations.

[0029] The following detailed description of embodiments of the application provided in the accompanying drawings is not intended to limit the scope of the application claimed, but merely represents selected embodiments of the application. Based upon the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of the present application.

[0030] For the current destructive measurement method of cutting measurement by cutter, the cutting measurement by cutter is generally performed by personal subjective operation, the thinnest point of the aluminum layer thickness of the aluminum plastic film angle position after the punching is not accurately determined, and the aluminum layer thickness change of the point position near the center line cannot be accurately observed, which is easy to mislead the design and adjustment of the top angle of the punching die. The embodiments of the present application provide the following technical solutions to overcome the above problems.

[0031] Please refer to Figure 1 The embodiments of the present application provide a measurement method for the aluminum layer thickness of the aluminum plastic film angle position, which comprises the following steps.

[0032] S100, a plurality of thickness values measured when an X-ray laser point 120 of an X-ray thickness gauge moves along a preset scanning path are obtained, wherein the preset scanning path passes through the thinnest region of the sample.

[0033] S200, the minimum value of the compared thickness values is taken as the measurement value.

[0034] Specifically, for the angle position of the aluminum plastic film to be detected, there are three punching angles, and the thinnest region is at the position where the three punching angles jointly act. In order to accurately determine the thickness of the position on the aluminum plastic film to be detected, in the actual detection process, only the extension line of one of the punching angles is taken as the preset scanning path, and a plurality of thickness values are measured on the preset scanning path by the X-ray thickness gauge, so as to measure all regions of the above preset scanning path and avoid missing the thinnest region. After each position on the scanning path is detected by the X-ray thickness gauge, the thickness value of the position is correspondingly output. Only by comparing all the collected thickness values, the minimum value can be determined, which is the measurement value, that is, the thinnest point of the aluminum layer thickness of the aluminum plastic film angle position after the punching.

[0035] The measurement method for the aluminum layer thickness of the aluminum plastic film angle position provided by the embodiments of the present application can measure the thickness of different positions on the above scanning path by moving the X-ray laser point 120 of the X-ray thickness gauge along the preset scanning path when measuring the thinnest point of the aluminum plastic film thickness, avoid missing the point position on the scanning path, and ensure the integrity of the measurement data. In this way, the minimum value from the thickness in the measurement is the measurement value. The above method can improve the accuracy of measuring the thinnest point of the aluminum layer thickness of the aluminum plastic film angle position, does not damage the sample, and is convenient for multiple measurements.

[0036] As shown in Figure 2 and Figure 3 Before obtaining a plurality of thickness values measured when the X-ray laser point 120 of the X-ray thickness gauge moves along the preset scanning path, the method comprises the following steps:

[0037] S300, cut the corner position of the aluminum plastic film 100 to be measured as a detection sample 110, and mark a detection area on the detection sample 110.

[0038] Specifically, when the aluminum plastic film is formed by stamping, the stretching force acts on the aluminum plastic film, and at the tangent position of the bottom corner of the convex die and the side wall of the concave die, stress and thinning are generated by stretching, and the force is the largest and the stretching is the most serious at the corner position of the aluminum plastic film. Therefore, the thinnest area of the entire aluminum plastic film is located at the corner position, and when measuring the thickness, the corner position of the aluminum plastic film to be measured 100 is cut off as a detection sample 110. In order to ensure the certainty of the subsequent detection position and facilitate traceability inspection, it is necessary to mark a detection area on the detection sample 110, and in the actual measurement process, the above detection area can be measured.

[0039] S400, place the detection sample 110 in the clamp, and make the corner measurement surface parallel to the clamp surface.

[0040] In order to ensure the reliability of the placement position of the detection sample 110 during detection, and the accuracy of the detection surface orientation, and reduce the measurement error, it is necessary to place the detection sample 110 in the clamp to limit the detection sample 110 by the clamp. By using the above method, not only the operation difficulty of placing the detection sample 110 in a posture can be reduced, but also the corner measurement surface can be made parallel to the clamp surface, which provides a detection basis for subsequent measurement. When placing the detection sample 110 in the clamp, the flatness of the measurement surface needs to be ensured. If the measurement surface has a concave or drumming phenomenon, the measurement surface needs to be gently flattened by hand to ensure the accuracy of subsequent measurement.

[0041] S500, make the extension line of one of the stamping corners of the detection sample 110 correspond to the preset scanning path.

[0042] By using the above method, the corner position of the aluminum plastic film 100 to be measured is cut as a detection sample 110, and a detection area is marked on the detection sample 110, so that the detection sample 110 can be placed in a corresponding placement posture, thereby facilitating the detection area to adapt to the path in which the measurement head of the X-ray thickness gauge can move. When placing the detection sample 110 in the clamp, in order to ensure the accuracy of measurement, the corner measurement surface needs to be made parallel to the clamp surface, and during measurement, the measurement head of the X-ray thickness gauge can correspond to the measurement surface, thereby reducing the measurement error.

[0043] It should be noted that, in order to ensure the consistency of the preset scanning path and the scanning path required on the detection sample 110, the fixture and the X-ray thickness gauge need to have a relatively determined positional relationship, that is, when the X-ray laser point moves along the preset scanning path, the X-ray laser point must be in the marked detection area. In actual application, the fixture is matched with the shape of the detection sample 110, and one of the corner lines of the fixture is consistent with the scanning path. When measuring, only the detection sample 110 needs to be placed in the fixture, which can ensure the stability and reliability of the measurement while positioning the detection sample 110.

[0044] As shown in Figure 4 and Figure 5 , marking the detection area on the detection sample 110 includes:

[0045] S320, according to the top edge R corner 112, the side edge R corner 114 and the vertical edge R corner 116 of the detection sample 110, determining the intersection of the top edge R corner 112, the side edge R corner 114 and the vertical edge R corner 116.

[0046] S340, marking the detection sample 110 along the extension line of the top edge R corner 112, the side edge R corner 114 or the vertical edge R corner 116, and the marking area covers the entire length of the extension line on the detection sample 110.

[0047] Specifically, the stamping corner of the detection sample 110 has a top edge R corner 112, a side edge R corner 114 and a vertical edge R corner 116, which is subjected to the impact force of the three edge corners at the intersection of the top edge R corner 112, the side edge R corner 114 and the vertical edge R corner 116, and thus forms the thinnest area of the entire aluminum plastic film. In actual application, only the thinnest thickness at the corner position of the aluminum plastic film needs to be measured, which is the thinnest thickness of the entire aluminum plastic film. When marking, only the extension line of the top edge R corner 112, the side edge R corner 114 or the vertical edge R corner 116 needs to be marked to cover the thinnest area generated during stamping. In addition, by covering the entire length of the extension line on the detection sample 110, it is convenient to determine whether the detection sample 110 is qualified according to the change of the thickness during the thickness measurement process, so as to avoid affecting the final detection result due to the detection sample 110 mixed with defects during detection.

[0048] In an optional embodiment of the present application, the maximum width of the detection sample 110 is less than 30 mm.

[0049] In the above manner, during the process of cutting the detection sample 110, the cutting position can be kept a certain distance from the position to be detected, so as to avoid affecting the area to be detected due to stress during cutting when the distance to be detected is too close. However, the cutting cannot be too large, so as to avoid affecting the normal placement into the fixture.

[0050] As shown in Figure 6 andFigure 7 As shown, the plurality of thickness values measured when the X-ray laser point 120 of the X-ray thickness gauge moves along the preset scanning path includes:

[0051] S120, the coordinate points are used to locate and identify the preset scanning path.

[0052] S140, the number of coordinate points is determined according to the size of the X-ray laser point 120.

[0053] S160, the thickness value measured at each coordinate point is obtained.

[0054] Specifically, in the process of detecting the detection sample 110, the measurement head of the X-ray thickness gauge needs to move along the preset scanning path, and the position of each movement needs to be determined according to the coordinate points. After the coordinate points are determined, the measurement head only needs to move to the preset coordinate point position each time. The number and position of the coordinate points can be determined according to the size of the X-ray laser point 120, as long as the thickness measurement at each coordinate point avoids missing any area on the detection sample 110. After the thickness measurement at each coordinate point, the thickness value on the entire scanning path can be obtained.

[0055] In an optional embodiment of the present application, the spacing between adjacent coordinate points is equal.

[0056] In the above form, it is convenient to calculate the number of coordinate points, and it is also convenient to determine the position of the coordinate points on the scanning path, which is beneficial to simplify the determination process of the coordinate points.

[0057] In an optional embodiment of the present application, the spacing between adjacent coordinate points is between 0.1mm and 0.5mm.

[0058] Specifically, the spacing between adjacent coordinate points is mainly determined according to the size of the laser point irradiated on the detection sample 110. In actual application, the above spacing can be set to 0.1mm, 0.3mm or 0.5mm, etc. The smaller the spacing, the more thickness values are detected. As long as all areas on the scanning path are detected under the premise of ensuring measurement accuracy.

[0059] In an optional embodiment of the present application, after taking the minimum value as the measurement value, the method further includes: measuring the detection sample 110 multiple times.

[0060] Specifically, by measuring the detection sample 110 multiple times for rechecking, it is beneficial to avoid measurement errors caused by operation errors, and it is convenient to trace and check. The rechecking of the measurement result provides a guarantee.

[0061] In an optional embodiment of the present application, the coordinate points are located within the coverage range of the detection sample 110.

[0062] Specifically, when measuring the thickness of the detection sample 110, the intensity attenuation of the X-ray when penetrating the detection sample 110 is converted to measure the thickness, that is, the amount of X-ray absorbed by the detection sample 110 is measured, and the thickness of the measured member is determined according to the energy value of the X-ray. If part of the coordinate points are located outside the coverage range of the detection sample 110, the thickness detection value of part of the positions may be affected by other factors, causing the detection result to be distorted.

[0063] In an optional embodiment of the present application, the X-ray laser points 120 on adjacent coordinate points have overlapping regions.

[0064] Specifically, when the X-ray laser points 120 on adjacent coordinate points have overlapping regions, it can better ensure that each position on the preset scanning path is detected, which is beneficial to the screening measurement of the thinnest point at the corner position, so as to ensure the accuracy of the measurement result.

[0065] The above only describes the preferred embodiments of the present application and is not intended to limit the present application. For those skilled in the art, the present application can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A method of measuring the thickness of an aluminum layer at an angle of an aluminum-plastic film, characterized by, The method comprises: acquiring a plurality of thickness values measured by an X-ray laser point of an X-ray thickness gauge when moving along a preset scanning path, wherein the preset scanning path passes through the thinnest region of the sample; comparing the thickness values and taking the minimum value as the measurement value; Before the acquisition of the plurality of thickness values measured by the X-ray laser point of the X-ray thickness gauge when moving along the preset scanning path, the method comprises: cutting the corner position of the aluminum plastic film to be measured as a detection sample and marking a detection region on the detection sample; placing the detection sample in a clamp and making the corner position measurement surface parallel to the clamp surface; making the extension line of one of the punched corners of the detection sample correspond to the preset scanning path.

2. The method of claim 1, wherein the method is performed by a film angle tester. The marking of the detection region on the detection sample comprises: determining the intersection of the top edge R corner, the side edge R corner and the vertical edge R corner of the detection sample according to the top edge R corner, the side edge R corner and the vertical edge R corner of the detection sample; identifying the detection sample along the extension line of the top edge R corner, the side edge R corner or the vertical edge R corner, and the identification area covers the entire length of the extension line on the detection sample.

3. The method of claim 2, wherein the angle of the aluminum plastic film is 45 degrees. The maximum width of the detection sample is less than 30 mm.

4. The method of measuring the thickness of the aluminum layer of an ACF corner angle according to any one of claims 1 to 3, characterized in that, The acquisition of the plurality of thickness values measured by the X-ray laser point of the X-ray thickness gauge when moving along the preset scanning path comprises: positioning and identifying the preset scanning path using coordinate points; determining the number of coordinate points according to the size of the X-ray laser point; acquiring the thickness values measured at each coordinate point.

5. The method of claim 4, wherein the angle of the ACF is 45 degrees. The spacing between adjacent coordinate points is equal.

6. The method of claim 5, wherein the angle of the ACF is measured by a thickness of the aluminum layer. The spacing is between 0.1 mm and 0.5 mm.

7. The method of measuring the thickness of an aluminum layer at an angle of an aluminum-plastic film according to any one of claims 1 to 3, characterized by, After taking the minimum value as the measurement value, the method further comprises: measuring the detection sample multiple times.

8. The method of claim 4, wherein the method is characterized by: The coordinate points are within the coverage range of the detection sample.

9. The method of claim 4, wherein the method is characterized by: The X-ray laser points on adjacent coordinate points have an overlapping region.

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