A capacitor parameter test proficiency verification article and method of making

Abstract

The application is suitable for the technical field of proficiency testing, and provides a capacitor parameter test proficiency testing article and a preparation method.The capacitor parameter test proficiency testing article comprises a PCB board, a measured capacitor, a sealing plate and a protective shell.The PCB board is provided with a first calibration port, a second calibration port and a parameter test port.The measured capacitor is installed on the back of the PCB board.The sealing plate is arranged below the PCB board, and the sealing plate is provided with a first window hole at a position corresponding to the measured capacitor.The PCB board and the sealing plate are located inside the protective shell, and the upper bottom of the protective shell, the PCB board and the sealing plate are sequentially attached and fixed.The upper bottom of the protective shell is provided with a second window hole, and the first calibration port, the second calibration port and the parameter test port are exposed to the outside through the second window hole, so that a test clamp can clamp the proficiency testing article for testing.The capacitor parameter test proficiency testing article can meet the proficiency testing requirements, thereby effectively comprehensively investigating the participants.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of proficiency testing, and particularly relates to a capacitor parameter test proficiency testing article and a preparation method. BACKGROUND

[0002] Proficiency testing is an activity for determining the calibration, detection capability of a laboratory or detection capability of an inspection agency by comparison between laboratories. Proficiency testing activity refers to any comparison between laboratories and measurement audit for evaluating the capability of a laboratory.

[0003] The capacitor parameter test proficiency testing project is a common proficiency testing activity, which requires applying a specified electrical signal, such as 1 kHz / 1 V or 1 MHz / 1 V, to a capacitor and measuring a specified electrical parameter. At present, the capacitor proficiency testing article used in the capacitor capacitance proficiency testing project is basically in the form of a standard part or uses a structure similar to a standard part, and the measured proficiency testing article is directly connected to an LCR test instrument for verification.

[0004] However, the capacitor as a standard part or a similar standard part as the proficiency testing article only investigates the instruments and equipment of the participating laboratories, and more closely measures the equipment of the participants, which is contrary to the original intention of the proficiency testing project and cannot meet the requirements of the proficiency testing. SUMMARY

[0005] To overcome the problems in the related art, the embodiments of the application provide a capacitor parameter test proficiency testing article and a preparation method, to solve the problem that the capacitor as a standard part or a similar standard part cannot meet the requirements of the proficiency testing.

[0006] The application is implemented by the following technical solutions:

[0007] In a first aspect, the embodiments of the application provide a capacitor parameter test proficiency testing article, which comprises: a PCB board provided with a first calibration port, a second calibration port and a parameter test port; a measured capacitor installed on the back of the PCB board; a sealing plate arranged below the PCB board, the sealing plate being provided with a first window hole at a position corresponding to the measured capacitor; and a protective shell, the PCB board and the sealing plate being located inside the protective shell, and the upper bottom of the protective shell, the PCB board and the sealing plate being sequentially attached and fixed; the upper bottom of the protective shell is provided with a second window hole, and the first calibration port, the second calibration port and the parameter test port are exposed outside through the second window hole, so that a test clamp can clamp the proficiency testing article for testing.

[0008] With reference to the first aspect, in some embodiments, the parameter test port comprises two metallized vias, the first calibration port comprises two metallized vias without electrical connection, and the second calibration port comprises two metallized vias with electrical connection.

[0009] With reference to the first aspect, in some embodiments, the first calibration port, the second calibration port, and the parameter test port are all identical in shape and size.

[0010] With reference to the first aspect, in some embodiments, the front surface of the PCB is provided with a first mark, a second mark, and a third mark, the first mark is used to indicate the position of the first calibration port, the second mark is used to indicate the position of the second calibration port, and the third mark is used to indicate the position of the parameter test port.

[0011] With reference to the first aspect, in some embodiments, the protective shell comprises a shell upper portion, a shell lower portion, a shell left portion, and a shell right portion; the shell upper portion is a first U-shaped groove with an opening facing downward, the shell lower portion is a second U-shaped groove with an opening facing upward, the side plate edges of the first U-shaped groove and the second U-shaped groove are provided with concave-convex structures corresponding to each other in up-down direction, for the up-down butt joint of the shell upper portion and the shell lower portion; the shell left portion and the shell right portion are both flat plate structures, and are fixedly connected with the shell upper portion and the shell lower portion to form a box-shaped structure.

[0012] With reference to the first aspect, in some embodiments, the bottom surface of the shell upper portion is provided with a plurality of first screw holes.

[0013] The edge and / or corner of the PCB is provided with a plurality of second screw holes corresponding to the first screw holes one by one; the edge and / or corner of the sealing plate is provided with a plurality of third screw holes corresponding to the first screw holes one by one.

[0014] With reference to the first aspect, in some embodiments, the outer surface of the shell upper portion is provided with a code of the capability verification plan and a number of the capability verification article.

[0015] In a second aspect, the embodiments of the present application provide a preparation method of the capacitor parameter test capability verification article according to any one of the first aspect, comprising: opening the first calibration port, the second calibration port and the parameter test port on the PCB board; mounting the measured capacitor on the solder pad connected with the parameter test port on the back of the PCB board; opening a second window hole on the upper bottom of the protective shell, placing the sealing plate on the back of the PCB board, and fixing the PCB board and the sealing plate together under the upper bottom of the protective shell; the first calibration port, the second calibration port and the parameter test port are exposed to the outside through the second window hole, and the upper bottom of the protective shell is the bottom surface of the upper part of the shell; and mounting the lower part of the shell, the left part of the shell and the right part of the shell.

[0016] In combination with the second aspect, in some embodiments, opening the first calibration port on the PCB board comprises: opening two first metallized vias with a first distance at a first position of the PCB board, and the two first metallized vias are not electrically connected.

[0017] Opening the second calibration port on the PCB board comprises: opening two second metallized vias with the first distance at a second position of the PCB board, and electrically connecting the two second metallized vias.

[0018] Opening the parameter test port on the PCB board comprises: opening two third metallized vias with the first distance at a third position of the PCB board, and the two third metallized vias are respectively connected with a solder pad for mounting the measured capacitor.

[0019] Wherein, the first metallized via, the second metallized via and the third metallized via are the same in shape and size.

[0020] In combination with the second aspect, in some embodiments, the placing the sealing plate on the back of the PCB board comprises: opening a first window hole on the sealing plate, the position of the first window hole corresponds to the mounting position of the measured capacitor, and the size of the first window hole matches the size of the area occupied by the mounted measured capacitor; aligning the first window hole with the mounted measured capacitor, so that the sealing plate is tightly attached to the back of the PCB board.

[0021] Compared with the prior art, the embodiments of the present application have the following beneficial effects:

[0022] The embodiment of the application provides a capacitor parameter test capability verification article, which comprises a PCB board provided with a first calibration port, a second calibration port and a parameter test port, and a measured capacitor is installed on the back surface of the PCB board, and the measured capacitor cannot be seen on the front surface of the PCB board, so that the model, parameters and packaging information of the measured capacitor can be hidden. The above-mentioned capability verification article further comprises a sealing plate arranged below the PCB board and provided with a first window hole at a position corresponding to the measured capacitor, so that the installed measured capacitor can pass through the first window hole, the sealing plate and the PCB board are closely attached, and the effect of blocking the metallized via and the measured capacitor is achieved. The capability verification article further comprises a protective shell, the PCB board and the sealing plate are located in the interior of the protective shell, and the upper bottom of the protective shell, the PCB board and the sealing plate are sequentially attached and fixed, the upper bottom of the protective shell is provided with a second window hole, the first calibration port, the second calibration port and the parameter test port are exposed outside through the second window hole, so that a test clamp can directly clamp the capability verification article for testing; the second window hole is arranged on the upper bottom of the protective shell, and the calibration port and the test port on the PCB board are exposed, during testing, the clamp and the laboratory clamp provided with the LCR instrument can be directly used for clamping and testing, the testing process is simple, and the testing process can be highly consistent with the daily testing process, and the man, machine, material, method and environment of the participants can be effectively investigated.

[0023] It should be understood that the foregoing general description and the following detailed description are only exemplary and explanatory, and cannot limit the specification. BRIEF DESCRIPTION OF DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the application, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are only some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative labor.

[0025] Figure 1 is a whole structure schematic diagram of the capacitor parameter test capability verification article provided by an embodiment of the application;

[0026] Figure 2 is a component structure schematic diagram of the capacitor parameter test capability verification article provided by an embodiment of the application;

[0027] Figure 3 is a schematic diagram of the sealing plate attached and placed on the back surface of the PCB board provided by an embodiment of the application;

[0028] Figure 4 is a schematic diagram of the PCB board provided by an embodiment of the application;

[0029] Figure 5is a wiring schematic diagram of a PCB provided by an embodiment of the present application;

[0030] Figure 6 is a schematic diagram of an upper part of a shell provided by an embodiment of the present application;

[0031] Figure 7 is a schematic diagram of a lower part of a shell provided by an embodiment of the present application;

[0032] Figure 8 is a schematic diagram of an upper part of a shell and a lower part of a shell provided by an embodiment of the present application;

[0033] Figure 9 is a flowchart diagram of a preparation method of a capacitor parameter test capability verification article in the present application provided by an embodiment of the present application;

[0034] Figure 10 is a flowchart diagram of a preparation method of a capacitor parameter test capability verification article in the present application provided by an embodiment of the present application. DETAILED DESCRIPTION

[0035] In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system configurations, techniques, etc., in order to provide a thorough understanding of the embodiments of the present application. However, it will be apparent to those skilled in the art that the present application can be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0036] It is to be understood that the terminology "includes", "has", "holds", "contains" and / or "comprising", when used in this specification and in the following claims, indicates the presence of the described features, integers, steps, operations, elements, and / or components but does not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0037] It is also to be understood that the terminology "and / or" when used in this specification and in the following claims, refers to at least one of the items, or any combination of one or more of the items, associated with the "and / or" term.

[0038] As used in this specification and in the claims, the term "if" can be interpreted as meaning "when", or "once", or "in response to a determination", or "in response to detecting", as appropriate, depending on the context. Similarly, the phrase "if determined", or "if detected [the described condition or event]" can be interpreted as meaning "once determined", or "in response to a determination", or "once detected [the described condition or event]", or "in response to detecting [the described condition or event]", as appropriate, depending on the context.

[0039] In addition, in the description of the present application and the appended claims, the terms "first", "second", "third", etc. are used only to distinguish descriptions and cannot be understood as indicating or implying relative importance.

[0040] Reference to "one embodiment" or "some embodiments" or "one implementation" or "some implementations" etc. in the present application description means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment of the present application. Thus, the appearance of the phrases "in one embodiment", "in some embodiments", "in other some embodiments", "in yet some embodiments" etc. in various places in the specification is not necessarily all referring to the same embodiment, but means "one or more but not all embodiments", unless otherwise specifically stated. The terms "comprise", "include", "have" and their conjugates mean "including but not limited to", unless otherwise specifically stated.

[0041] At present, the capacitor capacity verification items used by the capacitor capacity verification articles are basically in the form of standard parts or using similar standard parts structure, and the measured capacity verification articles are directly connected to the LCR test instrument for verification. Such capacity verification articles only investigate the instruments and equipment of the participating laboratory, and are more like a measurement activity, which is contrary to the original intention of the capacity verification project. The capacity verification project requires that the capacity verification articles should be as suitable as possible for the daily detection of the laboratory, and the capacity verification article testing process should be as close as possible to the daily testing process, so as to realize the investigation of the whole testing process of the laboratory.

[0042] Based on the above problems, the present application embodiment provides a capacitor parameter test capacity verification article and a preparation method. The present application will be further described in detail below in combination with the drawings and specific embodiments.

[0043] Referring to Figures 1 to 3 The capacitor parameter test capacity verification article in the present application embodiment includes a PCB board 110, a measured capacitor 120, a sealing plate 130 and a protective shell 140. The measured capacitor 120 is installed on the back of the PCB board 110, the sealing plate 130 is arranged below the PCB board 110, the PCB board 110 and the sealing plate 130 are located inside the protective shell 140, and the upper bottom of the protective shell 140, the PCB board and the sealing plate are sequentially adhered and fixed.

[0044] In the present application embodiment, the PCB board 110 is provided with a first calibration port 111, a second calibration port 112 and a parameter test port 113.

[0045] Referring to Figure 4In the embodiment of the present application, the parameter test port 113 can include two metallized vias, the first calibration port 111 can include two metallized vias without electrical connection, and the second calibration port 112 can include two metallized vias with electrical connection. The shapes and sizes of the first calibration port 111, the second calibration port 112, and the parameter test port 113 are all the same. Specifically, referring to Figures 4 to 5 The shapes and sizes of the metallized vias in the first calibration port 111, the second calibration port 112, and the parameter test port 113 are all the same; the distance between the two metallized vias of the first calibration port 111, the distance between the two metallized vias of the second calibration port 112, and the distance between the two metallized vias of the parameter test port 113 are all the same; and the lines of the first calibration port 111, the second calibration port 112, and the parameter test port 113 on the PCB 110 are all the same except for the electrical connection part of the second calibration port 112.

[0046] The calibration of the capacitor electrical parameter test is mainly the calibration of the test system. The test system includes test instruments and auxiliary fixtures. In the calibration process, it is usually necessary to select a calibration piece of corresponding size according to the packaging information of the capacitor. For example, the Open calibration piece can be a non-conductive article consistent with the packaging size of the measured capacitor, which is used for open circuit calibration; the Short calibration piece can be a conductive article consistent with the packaging size of the measured capacitor, such as a copper block, which is used for short circuit calibration.

[0047] In some embodiments, the first calibration port 111 can be an Open calibration port, and the second calibration port 112 can be a Short calibration port. The first calibration port 111 can be used for open circuit calibration, and the second calibration port 112 can be used for short circuit calibration. In the actual test process, if open circuit calibration is required, only the fixture provided by the test instrument is clamped on the first calibration port 111, and calibration is performed through the calibration function of the test instrument, without the need to use other calibration pieces. Similarly, when short circuit calibration is performed, only the fixture provided by the test instrument is clamped on the second calibration port 112, without the need to use other calibration pieces.

[0048] In the above embodiment, the first calibration port 111, the second calibration port 112, and the parameter test port 113 are of the same shape and size, which can eliminate the error of the test fixture itself when the test fixture clamps the calibration port or the test port, and ensure that the external conditions of the calibration process and the test process are completely consistent. Moreover, except for the electrical connection part of the second calibration port 112, the lines of the first calibration port 111, the second calibration port 112, and the parameter test port 113 on the PCB board are the same, which can calibrate the two ends of the measured capacitor 120 to the greatest extent and improve the calibration accuracy. In addition, when the measured device is very small, if the calibration method of using a calibration piece is used, that is, directly clamping a calibration piece of the same size with a fixture, it is not only difficult to clamp, but also the error caused by human touch is generated, thereby reducing the calibration accuracy. In the embodiment of the present application, the first calibration port 111, the second calibration port 112, and the parameter test port 113 are all metallized vias of the same size, and the clamping size is fixed during calibration and testing, which is simple to operate.

[0049] In some embodiments, the front surface of the PCB board 110 can be provided with a first mark, a second mark, and a third mark. The first mark is used to indicate the position of the first calibration port, the second mark is used to indicate the position of the second calibration port, and the third mark is used to indicate the position of the parameter test port.

[0050] In the embodiment of the present application, the measured capacitor 120 is installed on the back surface of the PCB board 110.

[0051] In some embodiments, the back surface of the PCB board 110 is the surface of the PCB board 110 on which the lines are arranged.

[0052] In some embodiments, the measured capacitor 120 can be installed on the solder pad on the back surface of the PCB board 110 by welding, and the solder pad is connected to the metallized via of the parameter test port 113. The fixture clamps the parameter test port 113, which is equivalent to clamping the measured capacitor 120, so that the measured capacitor can be tested.

[0053] In some embodiments, the measured capacitor can be a surface-mounted capacitor. It should be understood that the measured capacitor in the embodiment of the present application can also be selected from other suitable types of capacitors.

[0054] Referring to Figure 2 and Figure 3 The sealing plate 130 is arranged below the PCB board 110, and the first window hole 131 is arranged at the position corresponding to the measured capacitor 120 on the sealing plate 130.

[0055] Referring to Figure 3On the back of the PCB 110, the measured capacitor 120 is mounted on the pad connected with the metallized via of the parameter test port, the size of the first window hole 131 matches the size of the area occupied by the mounted measured capacitor 120, and the sealing plate 130 can be tightly attached to the back of the PCB 110.

[0056] The sealing plate 130 in the above embodiment can separate the metallized via on the PCB 110 from the measured capacitor 120, and protect the measured capacitor 120; the sealing plate 130 can also completely cover the wiring on the back of the PCB 110, thereby protecting the circuit of the PCB 110.

[0057] In the embodiments of the present application, the PCB 110 and the sealing plate 130 are located inside the protective shell 140, and the upper bottom of the protective shell 140, the PCB 110 and the sealing plate 130 are sequentially attached and fixed. The upper bottom of the protective shell 140 can be provided with a second window hole 145, and the first calibration port 111, the second calibration port 112 and the parameter test port 113 are exposed to the outside through the second window hole 145, so that the test fixture can test the above-mentioned capacity verification article.

[0058] In some embodiments, the protective shell 140 can include a shell upper portion 141, a shell lower portion 142, a shell left portion 143 and a shell right portion 144. The shell upper portion 141 can be a first U-shaped groove with the opening facing downward, and the shell lower portion 142 can be a second U-shaped groove with the opening facing upward. The side plate edges of the first U-shaped groove and the second U-shaped groove can be provided with concave-convex structures corresponding to each other in the up-down direction, for the up-down butt joint of the shell upper portion 141 and the shell lower portion 142. The shell left portion 143 and the shell right portion 144 can be flat plate structures, which are fixedly connected with the shell upper portion 141 and the shell lower portion 142 to form a box-shaped structure.

[0059] For example, referring to Figure 6 , the bottom of one side of the shell upper portion 141 can include a first recess 1411, and the bottom of the other side can include a first protrusion 1412. Referring to Figure 7 , the bottom of one side of the shell lower portion 142 can include a second protrusion 1421, and the bottom of the other side can include a second recess 1422. Referring to Figure 8The first groove 1411 can be fixedly connected with the second protrusion 1421, and the second groove 1422 can be fixedly connected with the first protrusion 1412. The left shell part 143 and the right shell part 144 can be mounted on the left and right ends of the upper shell part and the lower shell part by screws, thereby forming the closed protective shell 140. The protective shell 140 in the embodiment includes four parts in total, and the upper shell part and the lower shell part are fixedly connected through the concave-convex structure, thereby facilitating quick installation and disassembly, reducing the use of other fasteners, and improving the sealing performance of the joint, thereby being conducive to stably maintaining the test environment of the measured capacitor.

[0060] Referring to Figure 1 , Figure 3 and Figure 4 , in the embodiment, the bottom surface of the upper shell part 141 can be provided with a plurality of first screw holes 146. The edges and / or corners of the PCB board 110 can be provided with a plurality of second screw holes 114 corresponding to the first screw holes 146 in one-to-one correspondence. The edges and / or corners of the sealing plate 130 can be provided with a plurality of third screw holes 132 corresponding to the first screw holes 146 in one-to-one correspondence. The upper bottom of the protective shell 140, the PCB board 110 and the sealing plate 130 can be sequentially attached and fixed through screws, the first screw holes 146, the second screw holes 114 and the third screw holes 132. The upper bottom of the protective shell 140 is the bottom surface of the upper shell part 141.

[0061] In some embodiments, the outer surface of the upper shell part 141 can be provided with a code of a capability verification plan and a number of a capability verification article.

[0062] In the embodiment of the present application, a capacitor parameter test capability verification article is provided, which comprises a PCB board 110 provided with a first calibration port 111, a second calibration port 112 and a parameter test port 113, and a measured capacitor 120 is mounted on the back surface of the PCB board 110, and the measured capacitor 120 cannot be seen on the front surface of the PCB board 110, so that the model, parameters and packaging information of the measured capacitor 120 can be hidden. The above-mentioned capability verification article further comprises a sealing plate 130 arranged below the PCB board 110 and provided with a first window hole 131 at a position corresponding to the measured capacitor 120, so that the mounted measured capacitor 120 can pass through the first window hole 131, and the sealing plate 130 and the PCB board 110 are tightly attached to achieve the effect of blocking the metallized via and the measured capacitor. The capability verification article further comprises a protective shell 140, the PCB board 110 and the sealing plate 130 are located inside the protective shell 140, and the upper bottom of the protective shell 140, the PCB board 110 and the sealing plate 130 are sequentially attached and fixed, the upper bottom of the protective shell 140 is provided with a second window hole 145, and the first calibration port 111, the second calibration port 112 and the parameter test port 113 are exposed outside through the second window hole 145, so that a test clamp can directly clamp the capability verification article for testing; the second window hole 145 is arranged on the upper bottom of the protective shell 140, and the calibration port and the test port on the PCB board 110 are exposed, and during testing, the clamp and the laboratory clamp provided with the LCR instrument can be directly used for clamping and testing, the testing process is simple, and the testing process can be highly consistent with the daily testing process, and the man, machine, material, method and environment of the participants can be effectively investigated. The problem that the capacitor of the standard part or the similar standard part cannot meet the capability verification requirement is solved.

[0063] Figure 9 is a schematic flow chart of a preparation method of the capacitor parameter test capability verification article provided in the above-mentioned embodiment of the present application, and the detailed description of the preparation method is as follows: Figure 9

[0064] S901, a first calibration port, a second calibration port and a parameter test port are arranged on a PCB board.

[0065] Specifically, the above-mentioned S901 can be realized by S9011 to S9013, and the corresponding processing is as follows:

[0066] S9011, a first calibration port is arranged on a PCB board, comprising: two first metallized vias with a first distance are arranged at a first position of the PCB board, and the two first metallized vias are not electrically connected.

[0067] ​S9012, a second calibration opening is formed on the PCB board, comprising: forming two second metallized vias with a first distance at a second position of the PCB board, and electrically connecting the two second metallized vias.

[0068] S9013, a parameter test opening is formed on the PCB board, comprising: forming two third metallized vias with a first distance at a third position of the PCB board, and connecting each of the two third metallized vias with a pad, and the pad is used to install the measured capacitor.

[0069] The shapes and sizes of the first metallized via, the second metallized via and the third metallized via are the same.

[0070] S902, the measured capacitor is installed on the pad connected with the parameter test opening on the back of the PCB board.

[0071] Exemplarily, the measured capacitor can be welded on the pad on the back of the PCB board, and the pad is connected with the metallized via of the parameter test opening.

[0072] S903, a second window hole is formed on the upper bottom of the protective shell, the sealing plate is placed on the back of the PCB board, and the PCB board and the sealing plate are fixed together below the upper bottom of the protective shell.

[0073] Specifically, the protective shell includes a shell upper part, a shell lower part, a shell left part and a shell right part, both the shell upper part and the shell lower part are U-shaped groove structures, the upper bottom of the protective shell is the bottom surface of the shell upper part, and the first calibration opening, the second calibration opening and the parameter test opening can be exposed to the outside through the second window hole.

[0074] In some embodiments, the process of placing the sealing plate on the back of the PCB board in the above S903 can be realized by S9031 and S9032, and the corresponding processes are as follows:

[0075] S9031, a first window hole is formed on the sealing plate, the position of the first window hole corresponds to the installation position of the measured capacitor, and the size of the first window hole matches the size of the area occupied by the installed measured capacitor.

[0076] S9032, the first window hole is aligned with the installed measured capacitor, and the sealing plate is tightly attached to the back of the PCB board.

[0077] S904, the shell lower part, the shell left part and the shell right part are installed.

[0078] In some embodiments, the side edges of the shell upper part and the shell lower part are provided with corresponding concave-convex structures, the shell lower part can be vertically connected with the shell upper part, and then the shell left part and the shell right part are fixed with the connected shell upper part and shell lower part.

[0079] Referring to Figure 10 In some embodiments, based on Figure 9 As shown in the embodiment, the preparation method can further include:

[0080] S905, marking the code of the ability verification plan and the number of the ability verification article on the outer surface of the upper part of the shell.

[0081] In this way, the ability verification article prepared according to the above preparation method of the ability verification article can be used for uniformity and stability tests. When the uniformity test and the stability test pass, the ability verification article can be stored in a customized packaging box to prevent the ability verification article from being damaged during transportation and transfer. Finally, it is issued to participants in the laboratory for the ability verification project.

[0082] In the embodiment of the present application, a preparation method of a capacitor parameter test ability verification article is provided. First, a first calibration port, a second calibration port and a parameter test port are opened on a PCB board, and a measured capacitor is installed on the back of the PCB board. The measured capacitor cannot be seen on the front of the PCB board, and the model, parameters and packaging information of the measured capacitor can be hidden. Then, a sealing plate is placed on the back of the PCB board, which can block the metallized via and the measured capacitor. Then, the sealing plate and the PCB board are fixed together below the upper bottom of the protective shell, and the first calibration port, the second calibration port and the parameter test port can be exposed to the outside through the second window hole of the upper bottom of the protective shell. During testing, the clamp of the LCR instrument and the laboratory clamp can be directly used for clamping and testing. The testing process is simple, and the testing process can be highly consistent with the daily testing process, which meets the ability verification requirements and can effectively investigate the man, machine, material, method and environment of the participants.

[0083] It should be understood that the size of the serial number of each step in the above embodiment does not mean the order of execution. The execution order of each process should be determined by its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiment of the present application.

[0084] In the above embodiments, the description of each embodiment has its own focus. The parts not described or recorded in detail in a certain embodiment can be referred to the relevant description of other embodiments.

[0085] The above-described embodiments are only used to illustrate the technical solutions of the present application, but not limit them; although the present application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement to part of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A capacitor parameter test proficiency article, characterized by, The utility model relates to a kind of ability verification article and its testing device, including: PCB board is equipped with first calibration port, second calibration port and parameter test port; The shape and size of the first calibration port, the second calibration port and the parameter test port are all same;The first calibration port is used for open circuit calibration, and the second calibration port is used for short circuit calibration;The parameter test port includes two metallized via holes, the first calibration port includes two non-electrically connected metallized via holes, and the second calibration port includes two electrically connected metallized via holes; The measured capacitor is installed on the back of the PCB board, and is installed on the pad connected with the parameter test port; Sealing plate is arranged below the PCB board, and the sealing plate is provided with a first window hole at the position corresponding to the measured capacitor; The PCB board and the sealing plate are located in the interior of the protective shell, and the upper bottom of the protective shell, the PCB board and the sealing plate are sequentially adhered and fixed;The upper bottom of the protective shell is provided with a second window hole, and the first calibration port, the second calibration port and the parameter test port are exposed to the outside through the second window hole, so that the test fixture can clamp the ability verification article for testing.

2. The capacitor parameter test proficiency item of claim 1, wherein, The front of the PCB board is provided with a first mark, a second mark and a third mark, the first mark is used to indicate the position of the first calibration port, the second mark is used to indicate the position of the second calibration port, and the third mark is used to indicate the position of the parameter test port.

3. The capacitor parameter test proficiency item of claim 1, wherein, The protective shell includes a shell upper portion, a shell lower portion, a shell left portion and a shell right portion; The shell upper portion is a first U-shaped groove with the opening facing downward, the shell lower portion is a second U-shaped groove with the opening facing upward, and the side plate edges of the first U-shaped groove and the second U-shaped groove are provided with concave-convex structures corresponding to each other in the up-down direction, for the up-down butt joint of the shell upper portion and the shell lower portion; The shell left portion and the shell right portion are both flat plate structures, fixedly connected with the shell upper portion and the shell lower portion to form a box-like structure.

4. The capacitor parameter test proficiency item of claim 3, wherein, The bottom surface of the shell upper portion is provided with a plurality of first screw holes; The edge and / or corner of the PCB board is provided with a plurality of second screw holes corresponding to the first screw holes one by one; The edge and / or corner of the sealing plate is provided with a plurality of third screw holes corresponding to the first screw holes one by one.

5. The capacitor parameter test proficiency item of claim 4, wherein, The outer surface of the shell upper portion is provided with the code of the ability verification plan and the number of the ability verification article.

6. A method of preparing a capacitor parameter test proficiency testing article according to any one of claims 3 to 5, characterized in that, The utility model relates to a kind of ability verification article and its testing device, including: The first calibration port, the second calibration port and the parameter test port are opened on the PCB board; The measured capacitor is installed on the back of the PCB board, and is installed on the pad connected with the parameter test port; Second window hole is opened in the upper bottom of the protective shell, the sealing plate is placed on the back of the PCB board, and the PCB board and the sealing plate are fixed below the upper bottom of the protective shell; The first calibration port, the second calibration port and the parameter test port are exposed to the outside through the second window hole, and the upper bottom of the protective shell is the bottom surface of the shell upper portion; The shell lower portion, the shell left portion and the shell right portion are installed.

7. The method of claim 6, wherein the method further comprises the step of: The first calibration hole is opened on the PCB, including: two first metallized vias with a first distance are opened at a first position of the PCB, and the two first metallized vias are not electrically connected; ​ The second calibration hole is opened on the PCB, including: two second metallized vias with the first distance are opened at a second position of the PCB, and the two second metallized vias are electrically connected; The parameter test hole is opened on the PCB, including: two third metallized vias with the first distance are opened at a third position of the PCB, and the two third metallized vias are respectively connected to a pad, and the pad is used for mounting the measured capacitor; The first metallized via, the second metallized via and the third metallized via are the same in shape and size.

8. The method of claim 6, wherein the method further comprises the step of: The sealing plate is placed on the back of the PCB, including: ​ The first window hole is opened on the sealing plate, the position of the first window hole corresponds to the mounting position of the measured capacitor, and the size of the first window hole matches the size of the area occupied by the mounted measured capacitor; The first window hole is aligned with the mounted measured capacitor, and the sealing plate is tightly attached to the back of the PCB.

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