Temperature detection trimming circuit and temperature test system

Abstract

The application provides a temperature detection adjustment circuit and a temperature test system, and belongs to the technical field of electronic circuits. The circuit comprises a signal judgment unit, a control generation unit, a temperature change unit, an amplifier unit and an output and feedback unit; the signal judgment unit is connected with the amplifier unit and the output and feedback unit; the control generation unit is connected with each unit; the temperature change unit is connected with the amplifier unit, and the temperature change unit is used for changing the potential signal corresponding to the amplifier unit according to the temperature of the current environment of the temperature change unit; and the amplifier unit is connected with the output and feedback unit. The application can improve the efficiency and accuracy of determining the temperature interval.

Description

Technical Field

[0001] This application relates to the field of electronic circuit technology, and more specifically, to a temperature detection and adjustment circuit and a temperature testing system. Background Technology

[0002] In the field of electronic circuit technology, different electronic components have different circuit structures, and therefore usually need to operate at different temperatures. Therefore, there is an urgent need for a technical means to determine the operating temperature range of electronic components.

[0003] In existing technologies, the temperature range is determined mainly by making numerous adjustments manually.

[0004] However, manual adjustments require inputting a large number of adjustment commands, which is a huge workload and time-consuming, and involves too much repetitive work, resulting in relatively low efficiency. Summary of the Invention

[0005] The purpose of this application is to provide a temperature detection and adjustment circuit and a temperature testing system that can improve the efficiency and accuracy of determining temperature ranges.

[0006] The embodiments of this application are implemented as follows:

[0007] One aspect of this application provides a temperature detection and adjustment circuit, including: a signal determination unit, a control generation unit, a temperature change unit, an amplifier unit, and an output and feedback unit;

[0008] The signal determination unit is connected to the amplifier unit and the output and feedback unit. The signal determination unit is used to send the target signal to the amplifier unit according to the feedback signal sent by the output and feedback unit.

[0009] The control generation unit is connected to the signal determination unit, the temperature change unit, the amplifier unit, and the output and feedback unit respectively. The control generation unit is used to generate at least one control signal and send at least one control signal to the signal determination unit, the amplifier unit, and the output and feedback unit.

[0010] The temperature change unit is connected to the amplifier unit. The temperature change unit is used to change the corresponding potential signal of the amplifier unit according to the temperature of the current environment where the temperature change unit is located.

[0011] The amplifier unit is connected to the output and feedback unit. The amplifier unit is used to generate a result signal based on the target signal and the potential signal, and send the result signal to the output and feedback unit.

[0012] The output and feedback unit is used to send the result signal as a feedback signal to the signal determination unit, and to perform interval determination processing on the result signal to obtain and output the temperature range of the current environment of the temperature change unit.

[0013] Optionally, the amplifier unit includes: an adjustable resistor, at least one current source, at least one capacitor, at least one switch, and at least one transistor. The amplifier unit is used to obtain a result signal based on the target signal and the potential signal, and to send the result signal to the output and feedback unit.

[0014] Optionally, the temperature change unit includes: at least one temperature control diode, the input terminal of which is connected to the amplifier unit, and the output terminal of which is grounded.

[0015] Optionally, the temperature control diode is connected to the amplifier unit via an access switch, and the control terminal of the access switch is used to receive the control signal generated by the control generation unit.

[0016] Optionally, the signal determination unit includes: a counting module, a selector, and at least one buffer;

[0017] The counting module is connected to the selector. The counting module is used to generate different counting signals and send the counting signals to the selector.

[0018] The selector is connected to at least one buffer and an output and feedback unit respectively. The selector is used to send the corresponding target signal to at least one buffer according to the counting signal and the feedback signal.

[0019] At least one buffer is connected to the amplifier unit. The buffer is used to store the target signal and send the target signal to the amplifier unit.

[0020] Optionally, the signal determination unit further includes: a first comparator;

[0021] The output and feedback unit is connected to the signal determination unit through the first comparator, and the input of the first comparator is respectively connected to the feedback signal and the control signal.

[0022] Optionally, the counting module includes a first counter, a third selector, and a second counter connected in sequence;

[0023] The first counter is an incrementing counter, and the second counter is an octet counter.

[0024] Optionally, the output and feedback unit includes: a second comparator, a third comparator, a first synchronizer, a second synchronizer, and a feedback module;

[0025] The second comparator is connected to the amplifier unit and the first synchronizer. The second comparator is used to obtain the high temperature result to be synchronized based on the control signal and the result signal, and send the high temperature result to the first synchronizer.

[0026] The third comparator is connected to the amplifier unit and the second synchronizer. The third comparator is used to obtain the low temperature result to be synchronized based on the control signal and the result signal, and send the low temperature result to the second synchronizer.

[0027] The first synchronizer and the second synchronizer are used to output the upper and lower temperature limits corresponding to the result signal, respectively;

[0028] The feedback module is connected to the amplifier unit and the signal determination unit.

[0029] Optionally, the circuit further includes a trigger unit connected to the first synchronizer and the second synchronizer, used to send an enable signal.

[0030] Another aspect of this application provides a temperature testing system, including a circuit to be tested and a temperature detection and adjustment circuit, wherein the temperature change unit in the temperature detection and adjustment circuit is arranged at the location of the circuit to be tested.

[0031] The beneficial effects of the embodiments of this application include:

[0032] This application provides a temperature detection and adjustment circuit and a temperature testing system, which may include: a signal determination unit, a control generation unit, a temperature change unit, an amplifier unit, and an output and feedback unit. The signal determination unit is connected to the amplifier unit and the output and feedback unit; the control generation unit is connected to each of the units; the temperature change unit is connected to the amplifier unit; and the amplifier unit is connected to the output and feedback unit. Specifically, the signal determination unit can send a target signal to the amplifier unit based on the feedback signal sent by the output and feedback unit. The control generation unit can generate at least one control signal and send it to the signal determination unit, the amplifier unit, and the output and feedback unit. The temperature change unit can change the corresponding potential signal of the amplifier unit based on the temperature of the current environment of the temperature change unit. The amplifier unit can generate a result signal based on the target signal and the potential signal and send the result signal to the output and feedback unit. The output and feedback unit can send the result signal as a feedback signal to the signal determination unit and perform interval determination processing on the result signal to obtain and output the temperature range of the current environment of the temperature change unit. The temperature change unit can detect the ambient temperature and perform repeated calculations based on the closed-loop feedback between the signal determination unit, amplifier unit, and output and feedback unit. This allows for faster and more accurate results, making the temperature range of the current environment more efficient and accurate. Attached Figure Description

[0033] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0034] Figure 1 This is a schematic diagram of the temperature detection and adjustment circuit provided in an embodiment of this application;

[0035] Figure 2 This is a schematic diagram of the amplifier unit in the temperature detection and adjustment circuit provided in the embodiments of this application;

[0036] Figure 3 This is a schematic diagram of the temperature change unit in the temperature detection and adjustment circuit provided in the embodiments of this application;

[0037] Figure 4 This is a schematic diagram of the signal determination unit in the temperature detection and adjustment circuit provided in the embodiments of this application;

[0038] Figure 5This is a schematic diagram of the output and feedback unit in the temperature detection and adjustment circuit provided in the embodiments of this application;

[0039] Figure 6 This is a schematic diagram of the overall structure of the temperature detection and adjustment circuit provided in the embodiments of this application;

[0040] Figure 7 This is a schematic diagram of the temperature testing system provided in an embodiment of this application.

[0041] Icons: 10-Temperature detection and adjustment circuit; 20-Circuit under test; 100-Signal determination unit; 200-Control generation unit; 300-Temperature change unit; 400-Amplifier unit; 500-Output and feedback unit; 110-Counting module; 111-First counter; 112-Third selector; 113-Second counter; 120-Selector; 130-Buffer; 140-First comparator; 310-Temperature control diode; 320-Connection switch; 510-Second comparator; 520-Third comparator; 530-First synchronizer; 540-Second synchronizer; 550-Feedback module; 600-Trigger unit. Detailed Implementation

[0042] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0043] Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0044] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0045] In the description of this application, it should be noted that the terms "first," "second," "third," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0046] It should be noted that in the existing technology, when the temperature range is determined, it is mainly through manual adjustment to make a large number of adjustments. For example, each time an adjustment is made, an adjustment command needs to be input, and then the corresponding content is executed to obtain the result.

[0047] Obviously, manual adjustment requires inputting a large number of adjustment commands, which is a huge workload and time-consuming, and involves too much repetitive work, resulting in low efficiency in determining the temperature range.

[0048] To address the aforementioned problems in the prior art, this application proposes a temperature detection and adjustment circuit, the structure of which will be explained in detail below.

[0049] Figure 1 Please refer to the schematic diagram of the temperature detection and adjustment circuit provided in the embodiment of this application. Figure 1 The temperature detection and adjustment circuit includes: a signal determination unit 100, a control generation unit 200, a temperature change unit 300, an amplifier unit 400, and an output and feedback unit 500.

[0050] The signal determination unit 100 is connected to the amplifier unit 400 and the output and feedback unit 500. The signal determination unit 100 is used to send a target signal to the amplifier unit 400 according to the feedback signal sent by the output and feedback unit 500. The control generation unit 200 is connected to the amplifier unit 400. The control generation unit 200 is used to generate at least one control signal and send at least one control signal to the signal determination unit 100, the amplifier unit 400 and the output and feedback unit 500. The temperature change unit 300 is connected to the amplifier unit 400. The temperature change unit 300 is used to change the potential signal corresponding to the amplifier unit according to the temperature of the current environment of the temperature change unit 300. The amplifier unit 400 is connected to the output and feedback unit 500. The amplifier unit 400 is used to generate a result signal according to the target signal and the potential signal and send the result signal to the output and feedback unit 500. The output and feedback unit 500 is used to send the result signal as a feedback signal to the signal determination unit 100, and perform interval determination processing on the result signal to obtain and output the temperature range of the current environment of the temperature change unit 300.

[0051] Optionally, the signal determination unit 100 can be a unit that makes input determination based on the feedback signal. For example, when the feedback signal meets the preset requirements, the target signal can be output.

[0052] The control generation unit 200 can be a unit that generates control signals of different frequencies through a frequency divider, for example, it can generate two control signals DIV2 and DIV4 of different frequencies.

[0053] The temperature change unit 300 can specifically be a unit that generates different voltages as the temperature changes, and the potential signal in the amplifier unit can be changed through the temperature change unit.

[0054] The amplifier unit 400 can be a processing circuit unit based on the potential signal and the target signal. Specifically, the signal can be processed through the connection relationship in the circuit to obtain the result signal.

[0055] The result feedback signal can be a unit that outputs and feeds back results. Specifically, it can feed back the result signal to the signal determination unit, or it can perform interval determination processing on the result signal to obtain and output the temperature range of the current environment of the temperature change unit.

[0056] The working principle of the temperature detection and adjustment circuit will be explained in detail below:

[0057] When the target signal is sent for the first time, since there is no feedback signal yet, the signal determination unit can send the first instruction as the target signal to the amplifier unit based on the counter set therein. Correspondingly, the control generation unit and the temperature change unit will generate corresponding control signals and potential signals. The amplifier unit can process the target signal and potential signal to obtain the result signal and send the result signal to the output and feedback unit. The output and feedback unit can feed back the result signal to the signal determination unit.

[0058] After receiving the feedback signal, the signal determination unit can send the next instruction as the target signal to the amplifier unit based on the counter set therein, and then repeat the above steps until the signal in the counter is the last signal. The output and feedback unit can then determine the range based on the result signal of this time, and obtain and output the temperature range of the current environment of the temperature change unit.

[0059] This application provides a temperature detection and adjustment circuit that may include: a signal determination unit, a control generation unit, a temperature change unit, an amplifier unit, and an output and feedback unit. The signal determination unit is connected to the amplifier unit and the output and feedback unit; the control generation unit is connected to each of the other units; the temperature change unit is connected to the amplifier unit; and the amplifier unit is connected to the output and feedback unit. Specifically, the signal determination unit can send a target signal to the amplifier unit based on the feedback signal sent by the output and feedback unit. The control generation unit can generate at least one control signal and send it to the signal determination unit, the amplifier unit, and the output and feedback unit. The temperature change unit can change the corresponding potential signal of the amplifier unit based on the current temperature of the environment where the temperature change unit is located. The amplifier unit can generate a result signal based on the target signal and the potential signal and send the result signal to the output and feedback unit. The output and feedback unit can send the result signal as a feedback signal to the signal determination unit and perform interval determination processing on the result signal to obtain and output the temperature range of the current environment where the temperature change unit is located. The temperature change unit can detect the ambient temperature and perform repeated calculations based on the closed-loop feedback between the signal determination unit, amplifier unit, and output and feedback unit. This allows for faster and more accurate results, making the temperature range of the current environment more efficient and accurate.

[0060] The structure and working principle of the amplifier unit in the temperature detection and adjustment circuit provided in the embodiments of this application will be explained in detail below.

[0061] Figure 2 Please refer to the schematic diagram of the amplifier unit in the temperature detection and adjustment circuit provided in this application embodiment. Figure 2 The amplifier unit 400 includes: an adjustable resistor, at least one current source, at least one capacitor, at least one switch, and at least one transistor. The amplifier unit 400 is used to obtain a result signal based on the target signal and the potential signal, and send the result signal to the output and feedback unit 500.

[0062] The amplifier unit 400 can determine the result signal through adjustable resistors, current sources, capacitors and transistors in the circuit. The result signal can be obtained based on the target signal and the potential signal.

[0063] Optionally, the amplifier unit 400 may specifically include: an adjustable resistor R, a first capacitor C1, a second capacitor C2, a first transistor Q1, a second transistor Q2, three current sources providing supply currents for I0, 2I0, and 2I0 respectively, and five switches SW0-SW4. For specific connection relationships, please refer to [reference needed]. Figure 3No further explanation will be given here.

[0064] The structure and working principle of the temperature change unit in the temperature detection and adjustment circuit provided in this application embodiment will be explained in detail below.

[0065] Figure 3 Please refer to the schematic diagram of the temperature change unit in the temperature detection and adjustment circuit provided in the embodiments of this application. Figure 3 The temperature change unit 300 includes at least one temperature control diode 310, the input terminal of which is connected to the amplifier unit 400, and the output terminal of which is grounded.

[0066] Optionally, the temperature control diode 310 can be one or more. Figure 3 Taking two temperature control diodes as an example, in actual use, only one of them can be used.

[0067] It should be noted that the temperature control diode can be a diode whose resistance changes with temperature, thereby causing the value of the corresponding potential signal to change. In actual use, the temperature control diode 310 can be placed at a certain position in other circuits, chips or devices, and the temperature range of that position can be determined by the above-mentioned method provided in the embodiments of this application.

[0068] Optionally, the temperature control diode 310 is connected to the amplifier unit 400 via the access switch 320, and the control terminal of the access switch 320 is used to receive the control signal generated by the control generation unit 200.

[0069] It should be noted that, Figure 3 Taking two temperature control diodes as an example, one is not connected to the access switch, while the other is connected to the access switch. Specifically, in actual use, if only one is needed, the access switch can be disconnected; if both are needed, the access switch can be turned on. The specific control method can be based on the control signal.

[0070] The structure and working principle of the signal determination unit in the temperature detection and adjustment circuit provided in this application embodiment will be explained in detail below.

[0071] Figure 4 Please refer to the schematic diagram of the signal determination unit in the temperature detection and adjustment circuit provided in this application embodiment. Figure 4 The signal determination unit 100 includes: a counting module 110, a selector 120, and at least one buffer 130.

[0072] The counting module 110 is connected to the selector 120. The counting module 110 is used to generate different counting signals and send the counting signals to the selector 120.

[0073] Selector 120 is connected to at least one buffer 130 and output and feedback unit 500 respectively. Selector 120 is used to send a corresponding target signal to at least one buffer 130 according to the counting signal and the feedback signal.

[0074] At least one buffer 130 is connected to the amplifier unit 400. The buffer 130 is used to store the target signal and send the target signal to the amplifier unit 400.

[0075] Optionally, the counting module 110 can be used to output different counting signals. The selector 120 can determine whether to output the corresponding target signal based on the result fed back by the output and feedback unit 500. If yes, the target signal can be sent to the buffer 130; otherwise, the target signal is not sent. The buffer 130 may include multiple buffers. Figure 4 The diagram shows a buffer, which can be controlled by a control signal.

[0076] Optionally, the signal determination unit further includes: a first comparator 140; the output and feedback unit 500 is connected to the signal determination unit 100 through the first comparator 140, and the input terminals of the first comparator 140 are respectively connected to the feedback signal and the control signal.

[0077] The first comparator 140 can be a dual-input AND gate comparator, which can determine the signal input to the selector 120 by comparing the feedback signal and the control signal, thereby enabling the selector 120 to make different selections based on the control signal or the feedback signal.

[0078] For example, when the output of the first comparator 140 is a feedback signal, the selector can choose to send the target signal to the buffer 130; when the output of the first comparator 140 is a control signal, the selector can choose not to send the target signal to the buffer 130.

[0079] Optionally, the counting module 110 includes a first counter 111, a third selector 112, and a second counter 113 connected in sequence; the first counter 111 is an incrementing counter, and the second counter 113 is an eight-bit counter.

[0080] The first counter 111 increments by one each time it counts, the third selector 112 is controlled by an external clock signal and control signal, and is used to select the output of the first counter 111. The second counter 113 is an 8-bit counter.

[0081] It should be noted that the external clock signal FCNT can include multiple input values ​​from 0 to 8. The specific working process is as follows:

[0082] Assuming that the control signal DIV2 input to the first comparator 140 is low and the feedback signal Fre_OK is high, it is normal feedback.

[0083] When the value of the external clock signal FCNT input is 0 and the feedback is normal, the eighth bit of the second counter 113 can be set to 0, the seventh bit to 1, and the others remain unchanged.

[0084] When the value of the external clock signal FCNT input is 1 and there is abnormal feedback, the seventh bit of the second counter 113 can be kept, the sixth bit can be set to 1, and the others can remain unchanged.

[0085] When the value of the external clock signal FCNT input is 2 and there is abnormal feedback, the sixth bit of the second counter 113 can be kept, the fifth bit can be set to 1, and the others can remain unchanged.

[0086] When the value of the external clock signal FCNT input is 3 and the feedback is normal, the fifth bit of the second counter 113 can be set to 0, the fourth bit to 1, and the others remain unchanged.

[0087] When the value of the external clock signal FCNT input is 4 and there is abnormal feedback, the fourth bit of the second counter 113 can be held, the third bit can be set to 1, and the others can remain unchanged.

[0088] When the value of the external clock signal FCNT input is 5 and there is abnormal feedback, the third bit of the second counter 113 can be held, the second bit can be set to 1, and the others can remain unchanged.

[0089] When the value of the external clock signal FCNT input is 6 and there is abnormal feedback, the second bit of the second counter 113 can be held, the first bit can be set to 1, and the others can remain unchanged.

[0090] When the external clock signal FCNT input value is 7 and the feedback is normal, the first bit of the second counter 113 can be set to 0, while the others remain unchanged.

[0091] When the value of the external clock signal FCNT input is 8, the required adjustment value, which is the target signal, can be obtained. The target signal can be sent to the selector 120 through the second counter 113.

[0092] The following section will explain in detail the structure and working principle of the output and feedback units in the temperature detection and adjustment circuit provided in the embodiments of this application.

[0093] Figure 5 Please refer to the schematic diagram of the output and feedback unit in the temperature detection and adjustment circuit provided in the embodiments of this application. Figure 5The output and feedback unit 500 includes: a second comparator 510, a third comparator 520, a first synchronizer 530, a second synchronizer 540, and a feedback module 550.

[0094] The second comparator 510 is connected to the amplifier unit 400 and the first synchronizer 530. The second comparator 510 is used to obtain the high temperature result to be synchronized according to the control signal and the result signal, and send the high temperature result to the first synchronizer 530.

[0095] The third comparator 520 is connected to the amplifier unit 400 and the second synchronizer 540. The third comparator 520 is used to obtain the low temperature result to be synchronized according to the control signal and the result signal, and send the low temperature result to the second synchronizer 540.

[0096] The first synchronizer 530 and the second synchronizer 540 are used to output the upper and lower temperature limits corresponding to the result signal, respectively.

[0097] The feedback module 550 is connected to the amplifier unit 400 and the signal determination unit 100.

[0098] It should be noted that the inputs of the second comparator 510 can be the inversion of the control signal DIV2, the control signal DIV4, and the result signal; the inputs of the third comparator 520 can be the inversion of the control signal DIV2, the inversion of the control signal DIV4, and the result signal.

[0099] The high-temperature result to be synchronized can be obtained through the second comparator 510, and the low-temperature result to be synchronized can be obtained through the third comparator 520. Then, they can be synchronized through the first synchronizer 530 and the second synchronizer 540 respectively to obtain the upper and lower temperature limits corresponding to the result signals.

[0100] To provide a more comprehensive explanation of the circuit structures involved in the embodiments of this application, the overall structural relationship of the temperature detection and adjustment circuit provided in the embodiments of this application will be explained below.

[0101] Figure 6 Please refer to the overall structural diagram of the temperature detection and adjustment circuit provided in the embodiments of this application. Figure 6 , Figure 6 This includes all the components in the various parts explained above.

[0102] Optionally, the circuit further includes a trigger unit 600, which is connected to the first synchronizer 530 and the second synchronizer 540 and is used to send an enable signal.

[0103] in addition, Figure 6Multiple nodes can be defined within the amplifier unit 400, including node D to the left of switch SW0, nodes A0 and A1 on either side of the first capacitor C1, nodes B0 and B1 on either side of the second capacitor C2, nodes C and F on either side of switch SW4, and node E connected to the temperature change unit.

[0104] It should be noted that switches SW0 and SW4 are controlled by the inverted signal of the control signal DIV2, while switches SW1, SW2, and SW3 are controlled by the control signal DIV2.

[0105] In Figure 6 , the working principle of the amplifier unit 400 is as follows:

[0106] The working cycle of the circuit can be divided into six time nodes T0 - T5.

[0107] During T0 - T1, the control signal DIV2 is at a high level, switches SW1, SW2, and SW3 are gated, and switches SW0 and SW4 are closed. Since point E and point A0 are gated by SW1, the voltage VA0 at point E / A0 jumps to the conduction voltage VH.

[0108] During T1 - T3, the control signal DIV2 is at a low level, switches SW1, SW2, and SW3 are closed, and switches SW0 and SW4 are gated. Since point D and point A0 are gated by SW0, it is analyzed in two cases:

[0109] (1) If the voltage VH at point D / A0 < VHVerf, then B0 is pulled high, the voltage at point C / F and the result signal Fre_OK are pulled low. Sampling the result signal Fro_OK at point T2 can obtain a sampling result of 0, which means the high - temperature detection passes.

[0110] (2) If the voltage VH at point D / A0 > VHVerf, then B0 is pulled low, the voltage at point C / F and the result signal Fre_OK are pulled high. Sampling the result signal Fro_OK at point T2 can obtain a sampling result of 1, which means the high - temperature detection fails.

[0111] During T3 - T4, the control signal DIV2 is at a high level, switches SW1, SW2, and SW3 are gated, and switches SW0 and SW4 are closed. Since point E and point A0 are gated by SW1, the voltage VA0 at point E / A0 jumps to the conduction voltage VL.

[0112] During T4 - T5, the control signal DIV2 is at a low level, switches SW1, SW2, and SW3 are closed, and switches SW0 and SW4 are gated. Since point D and point A0 are gated by SW0, it is analyzed in two cases:

[0113] (1) If the voltage VL at point D / A0 > VLVerf, then B0 is pulled low, the voltage at point C / F and the result signal Fre_OK are pulled high. The result signal Fro_OK is inversely sampled at point T5, and the sampling result is 0, which means the low-temperature detection passes.

[0114] (2) If the voltage VL at point D / A0 < VLVerf, then B0 is pulled high, the voltage at point C / F and the result signal Fre_OK are pulled low. The result signal Fro_OK is inversely sampled at point T5, and the sampling result is 1, which means the low-temperature detection fails.

[0115] In summary, when the temperature is within a certain range, no error will occur. Since VH < VHVerf & VL > VLVerf, the temperature range is between (TempLVerf, TempHVerf). That is, the temperature interval can be determined.

[0116] Among them, TempLVerf is the lowest temperature at which the circuit can operate, and TempHVerf is the highest temperature at which the circuit can operate.

[0117] It should be noted that Figure 6 the connection relationship of the control generation unit 200 is not drawn in []. In the actual circuit, the control generation unit 200 can be connected to the components that require control signals in any of the above units, and no specific limitation is made here.

[0118] Next, the specific structural relationship and working principle of the temperature test system provided in the embodiment of the present application will be explained.

[0119] Figure 7 For the structural schematic diagram of the temperature test system provided in the embodiment of the present application, please refer to Figure 7 , the temperature test system includes a circuit under test 20 and a temperature detection and trimming circuit 10. The temperature change unit 300 in the temperature detection and trimming circuit 10 is arranged at the position where the circuit under test 20 is located.

[0120] Optionally, the circuit under test 20 can be any type of circuit structure. For example, it can be an electronic chip, a certain circuit in a device to be tested, etc., and no specific limitation is made here.

[0121] Through the above method, the temperature of the circuit under test 20 can be obtained through the temperature change unit 300, and thus the operating temperature range of the circuit under test 20 can be determined.

[0122] The above are merely specific embodiments of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

[0123] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A temperature detection and adjustment circuit, characterized in that, include: Signal determination unit, control generation unit, temperature change unit, amplifier unit, and output and feedback unit; The signal determination unit is connected to the amplifier unit and the output and feedback unit. The signal determination unit is used to send a target signal to the amplifier unit according to the feedback signal sent by the output and feedback unit. The control generation unit is connected to the signal determination unit, the temperature change unit, the amplifier unit, and the output and feedback unit respectively. The control generation unit is used to generate at least one control signal and send at least one of the control signals to the signal determination unit, the amplifier unit, and the output and feedback unit. The temperature change unit is connected to the amplifier unit, and the temperature change unit is used to change the potential signal corresponding to the amplifier unit according to the temperature of the current environment where the temperature change unit is located. The amplifier unit is connected to the output and feedback unit. The amplifier unit is used to generate a result signal based on the target signal and the potential signal, and send the result signal to the output and feedback unit. The output and feedback unit is used to send the result signal as a feedback signal to the signal determination unit, and to perform interval determination processing on the result signal to obtain and output the temperature range of the current environment of the temperature change unit.

2. The temperature detection and adjustment circuit as described in claim 1, characterized in that, The amplifier unit includes: an adjustable resistor, at least one current source, at least one capacitor, at least one switch, and at least one transistor.

3. The temperature detection and adjustment circuit as described in claim 1, characterized in that, The temperature change unit includes at least one temperature control diode, the input terminal of which is connected to the amplifier unit, and the output terminal of which is grounded.

4. The temperature detection and adjustment circuit as described in claim 3, characterized in that, The temperature control diode is connected to the amplifier unit via an access switch, and the control terminal of the access switch is used to receive the control signal generated by the control generation unit.

5. The temperature detection and adjustment circuit as described in claim 1, characterized in that, The signal determination unit includes: a counting module, a selector, and at least one buffer; The counting module is connected to the selector, and the counting module is used to generate different counting signals and send the counting signals to the selector. The selector is connected to at least one of the buffers and the output and feedback unit respectively, and the selector is used to send a corresponding target signal to the at least one buffer according to the counting signal and the feedback signal; The at least one buffer is connected to the amplifier unit, and the buffer is used to store the target signal and send the target signal to the amplifier unit.

6. The temperature detection and adjustment circuit as described in claim 5, characterized in that, The signal determination unit further includes: a first comparator; The output and feedback unit is connected to the signal determination unit through the first comparator, and the input terminal of the first comparator is respectively connected to the feedback signal and the control signal.

7. The temperature detection and adjustment circuit as described in claim 5, characterized in that, The counting module includes a first counter, a third selector, and a second counter connected in sequence. The first counter is an incrementing counter, and the second counter is an octet counter.

8. The temperature detection and adjustment circuit as described in claim 1, characterized in that, The output and feedback unit includes: a second comparator, a third comparator, a first synchronizer, a second synchronizer, and a feedback module; The second comparator is connected to the amplifier unit and the first synchronizer. The second comparator is used to obtain the high temperature result to be synchronized according to the control signal and the result signal, and send the high temperature result to the first synchronizer. The third comparator is connected to the amplifier unit and the second synchronizer. The third comparator is used to obtain the low temperature result to be synchronized according to the control signal and the result signal, and send the low temperature result to the second synchronizer. The first synchronizer and the second synchronizer are respectively used to output the upper temperature limit and the lower temperature limit corresponding to the result signal; The feedback module is connected to the amplifier unit and the signal determination unit.

9. The temperature detection and adjustment circuit as described in claim 8, characterized in that, The circuit further includes a trigger unit, which is connected to the first synchronizer and the second synchronizer and is used to send an enable signal.

10. A temperature testing system, characterized in that, It includes a circuit to be tested and a temperature detection and adjustment circuit as described in any one of claims 1-9, wherein the temperature change unit in the temperature detection and adjustment circuit is located at the location of the circuit to be tested.

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