Anti-radiation test device of multi-channel laser transmitter applied to space environment

Abstract

The application discloses a kind of multi-channel laser transmitter anti-radiation test device applied to space environment, it is related to wireless high-speed laser communication technical field, including: first test computer, electric signal generator, multi-channel space laser transmitter, radiation test box, second test computer, dense wavelength division multiplexer, 1x2 optical switch, adjustable optical attenuator, optical spectrum analyzer, demultiplexer, Nx1 matrix switch, beam splitter, optical power meter, adjustable optical attenuator and eye diagram instrument.The application adopts a set of test platform to test the performance parameters of multi-wavelength laser output in real time, cooperates with electric signal generator, dense wavelength division multiplexer, to reduce the system complexity of single parameter independent test, simplifies test optical path, reduces test time, improves test efficiency, improves the stability and reliability of test system.

Description

Technical Field

[0001] This invention relates to the field of wireless high-speed laser communication technology, and more specifically to a radiation resistance testing device for multi-channel laser emitters applied in a space environment. Background Technology

[0002] In recent years, high spatiotemporal resolution space cameras for both space-based and ground-based targets have become a hot research topic in modern optical observation. Due to the high spectral and spatial resolution characteristics of existing space cameras and other payloads, these payloads generate a large number of high-pixel images or high-definition videos per unit time. Therefore, there is an urgent need for real-time transmission of large amounts of data from the payload bay, with data transmission rates reaching hundreds of gigabits per second or even higher. Currently, the bandwidth of inter-vehicle wireless microwave communication is insufficient to meet such high-speed communication requirements. Optical communication, due to its advantages of high communication speed, small size, and light weight, has become a superior choice for addressing this challenge.

[0003] Semiconductor lasers (LDs) have been widely used in the space industry due to their advantages such as small size, light weight, high efficiency, all-solid-state operation, and low cost. In the space environment, semiconductor lasers are subject to various types of radiation, including rays and particles. Therefore, a deep understanding of their radiation effects is essential to prevent degradation and failure of device performance parameters. This necessitates accurate, comprehensive, and continuous testing of all laser performance parameters to fully verify the reliability of laser operation.

[0004] my country's national standards (GB / T 31359-2015, GB / T 21548-2021, GB / T 42403-2023) provide basic specifications for testing methods of (semiconductor) lasers, specifically including test methods for spectral characteristics and power parameters. However, traditional laser testing systems lack comprehensive test parameters, have unclear parameters and debugging status of test components, and cannot perform real-time monitoring and immediate feedback of laser parameters. This results in complex test platform setup, large test errors, and an inability to conduct long-term stable testing. Furthermore, testing multi-wavelength laser emitters is slow and cannot meet the testing requirements of aerospace irradiation environments. Summary of the Invention

[0005] To improve the stability and reliability of laser testing systems, this invention proposes a highly integrated, highly reliable multi-wavelength laser testing system that can quickly and effectively overcome these problems, enabling its widespread application in the aerospace and communications fields.

[0006] This invention proposes a radiation resistance testing device for a multi-channel laser emitter applied in a space environment, comprising: a first test computer, an electrical signal generator, a multi-channel space laser emitter, a radiation test chamber, a second test computer, a dense wavelength division multiplexer, a 1×2 optical switch, an adjustable optical attenuator, a spectrum analyzer, a de-wavelength division multiplexer, an N×1 matrix switch, a beam splitter, an optical power meter, an adjustable optical attenuator, and an eye diagram analyzer;

[0007] The first test computer is connected to the electrical signal generator via a cable. The electrical signal generator is connected to the multi-channel space laser emitter via a through-chamber flange cable. The multi-channel space laser emitter is located inside the radiation test chamber. The multi-channel space laser emitter is connected to the multi-channel fiber optic input of the dense wavelength division multiplexer via the through-chamber flange multi-channel fiber optic output. The output wavelength of the multi-channel space laser emitter corresponds one-to-one with the channel wavelength of the dense wavelength division multiplexer.

[0008] The second test computer is connected to the multi-channel space laser transmitter via a through-cabin flange cable and is used for control and telemetry signals;

[0009] The fiber optic output of the dense wavelength division multiplexer is connected to the fiber optic of the 1×2 optical switch; the output port a of the 1×2 optical switch is connected to the first adjustable optical attenuator through a through-cabin flange, and the output of the first adjustable optical attenuator is connected to the spectrometer.

[0010] The output port b of the 1×2 optical switch is connected to the optical fiber at the input end of the dewavelength division multiplexer.

[0011] The N output terminals of the dewavelength division multiplexer are connected one by one to the input terminals of the N×1 matrix switch via optical fibers;

[0012] The output of the N×1 matrix switch is optically connected to the input port of the beam splitter, the output port c of the beam splitter is connected to the optical power meter, the output port d of the beam splitter is connected to the input of the second adjustable optical attenuator, and the output of the second adjustable optical attenuator is optically connected to the eye diagram meter.

[0013] The first test computer and the second test computer are industrial computers, which control and telemetry the electrical signal generator and the multi-channel space laser emitter respectively via R232.

[0014] The electrical signal generator is used to generate a driving electrical signal, which is used to control the multi-channel space laser emitter.

[0015] The multi-channel space laser transmitter is a combination of multiple laser modules, and its wavelength meets the requirements of dense wavelength division multiplexing optical communication.

[0016] The radiation test chamber contains Co.60 A radiation source used to generate adjustable radiation levels.

[0017] The dense wavelength division multiplexer is used for multiplexing multiple wavelengths, and the wavelengths meet the requirements of dense wavelength division multiplexing optical communication.

[0018] The optical power meter is a photoelectric optical power meter, used to sample and record the input optical power value in real time.

[0019] The spectrometer is a fiber optic spectrometer, whose wavelength accuracy and resolution meet the requirements for laser testing.

[0020] Through the above design scheme, the present invention can bring the following beneficial effects:

[0021] This invention employs a testing platform to perform real-time testing of various performance parameters of multi-wavelength lasers. Combined with an electrical signal generator and a dense wavelength division multiplexer, it reduces the system complexity of independent testing of individual parameters, simplifies the test optical path, reduces test time, and improves test efficiency while enhancing the stability and reliability of the test system.

[0022] This invention sets up a multi-channel space laser emitter inside a radiation test chamber. Based on the original traditional laser, a radiation test chamber is added to realize the simulation of the irradiation environment. As required, it can be applied to the online testing of various parameters of the laser after irradiation by different particles or rays (such as heavy ions, electrons, protons, reactor neutrons, X-rays, gamma rays, etc.).

[0023] This invention combines all the components required for laser parameter measurement into one unit, along with a dense wavelength division multiplexer. During the measurement process, there is no need to change the test equipment or test platform; only initial calibration is required sequentially. No repeated calibration is needed during the test, resulting in high testing efficiency and good consistency of test data.

[0024] This invention combines optical switches and matrix switches for testing, enabling simultaneous measurement of multiple parameters. It is simple to operate, highly efficient, and thus ensures the reliability of the testing system and reduces testing system errors. Attached Figure Description

[0025] Figure 1 This is a schematic diagram of the structure of the multi-channel laser emitter radiation resistance test device applied to the space environment according to the present invention. Detailed Implementation

[0026] The present invention will be further described below with reference to the accompanying drawings and specific embodiments:

[0027] like Figure 1As shown, the radiation resistance test device for a multi-channel laser emitter applied to a space environment includes: a first test computer 1, an electrical signal generator 2, a multi-channel space laser emitter 3, a radiation test chamber 4, a second test computer 5, a dense wavelength division multiplexer 6, a 1×2 optical switch 7, an adjustable optical attenuator 1 8, a spectrum analyzer 9, a de-wavelength division multiplexer 10, an N×1 matrix switch 11, a beam splitter 12, an optical power meter 13, an adjustable optical attenuator 2 14, and an eye diagram meter 15.

[0028] The first test computer 1 is connected to the electrical signal generator 2 via a cable. The electrical signal generator 2 is connected to the multi-channel space laser emitter 3 via a through-chamber flange cable. The multi-channel space laser emitter 3 is located inside the radiation test chamber 4. The multi-channel space laser emitter 3 is connected to the multi-channel fiber optic input of the dense wavelength division multiplexer 6 via the through-chamber flange multi-channel fiber optic output. The output wavelength of the multi-channel space laser emitter 3 corresponds one-to-one with the channel wavelength of the dense wavelength division multiplexer 6.

[0029] The second test computer 5 is connected to the multi-channel space laser transmitter 3 via a through-cabin flange cable for control and telemetry signals.

[0030] The fiber optic output of the dense wavelength division multiplexer 6 is optically connected to the 1×2 optical switch 7; the output port a of the 1×2 optical switch 7 is connected to the adjustable optical attenuator 8 through a through-cabin flange, and the output of the adjustable optical attenuator 8 is connected to the spectrometer 9.

[0031] The output port b of the 1×2 optical switch 7 is optically connected to the input optical fiber of the dewavelength division multiplexer 10.

[0032] The N output terminals of the dewavelength division multiplexer 10 are connected to the input terminals of the N×1 matrix switch 11 via optical fibers.

[0033] The output of the N×1 matrix switch 11 is optically connected to the input port of the beam splitter 12. The output port c of the beam splitter 12 is connected to the optical power meter 13. The output port d of the beam splitter 12 is connected to the input of the adjustable optical attenuator 14. The output of the adjustable optical attenuator 14 is optically connected to the eye diagram meter 15.

[0034] The first test computer 1 and the second test computer 5 are industrial computers, which control and telemetry the electrical signal generator 2 and the multi-channel spatial laser emitter 3 respectively via R232. In other embodiments, other connection methods can be used instead of R232 for connection.

[0035] The electrical signal generator 2 is used to generate a driving electrical signal, which is used to control the multi-channel space laser emitter 3.

[0036] The multi-channel spatial laser transmitter 3 is a combination of multiple laser modules, and its wavelength meets the requirements of dense wavelength division multiplexing optical communication.

[0037] The radiation test chamber 4 contains Co. 60 A radiation source used to generate adjustable radiation levels.

[0038] The dense wavelength division multiplexer 6 is used for multiplexing multiple wavelengths, and the wavelengths meet the requirements of dense wavelength division multiplexing optical communication.

[0039] The optical power meter 13 is a photoelectric optical power meter used to sample and record the input optical power value in real time.

[0040] The spectrum analyzer 9 is a fiber optic spectrum analyzer, whose wavelength accuracy and resolution meet the requirements for laser testing.

[0041] The working process of this device is as follows:

[0042] The first test computer 1 controls the power-on of the electrical signal generator 2 and adjusts the electrical signal (rate and power). The electrical signal output from the electrical signal generator 2 enters the multi-channel spatial laser emitter 3 under test. The second test computer 5 controls and remotely measures the multi-channel spatial laser emitter 3, which is located in the radiation test chamber 4. The radiation test chamber 4 provides radiation coverage of the multi-channel spatial laser emitter 3 at different radiation levels. The optical signal from the multi-channel spatial laser emitter 3 enters the dense wavelength division multiplexer 6 and is combined into one beam. The output wavelength of the multi-channel spatial laser emitter 3 corresponds one-to-one with the channel wavelength of the dense wavelength division multiplexer 6. The combined laser signal reaches the adjustable optical attenuator 8 through the output port a of the 1×2 optical switch 7. The adjustable optical attenuator 8 is used to attenuate the intensity of the incident laser as needed to match the measurement requirements of the spectrum analyzer 9. The output of the adjustable optical attenuator 8 enters the spectrum analyzer 9, which tests the spectral information of each single wavelength under different power input conditions and radiation conditions.

[0043] Based on the above operations, the output port b of the 1×2 optical switch 7 is switched on, and the optical signal enters the dewavelength division multiplexer 10. At the same time, the N×1 matrix switch 11 is switched on, and the signal enters the beam splitter 12. The beam splitter 12 outputs a laser signal through output port c, which enters the optical power meter 13. The optical power meter 13 can test the amplified optical power values ​​and stability of all wavelengths under different dynamic attenuation laser signals and different radiation levels.

[0044] The output port d of the beam splitter 12 is then connected to the adjustable optical attenuator 14. The adjustable optical attenuator 14 attenuates the incident laser light intensity as needed to match the measurement requirements of the eye diagram analyzer 15. The output of the adjustable optical attenuator 14 is connected to the eye diagram analyzer 15, which can quickly analyze the quality of the optical signal. It can display the time-domain waveform of the optical signal and evaluate its transmission performance, including peak value, peak-to-peak value, rise time, and fall time. Through eye diagram analysis, problems in the digital communication system can be identified, and corresponding optimizations and improvements can be made.

[0045] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A radiation resistance testing device for multi-channel laser emitters applied in a space environment, characterized in that, include: First test computer (1), electrical signal generator (2), multi-channel spatial laser emitter (3), radiation test box (4), second test computer (5), dense wavelength division multiplexer (6), 1×2 optical switch (7), adjustable optical attenuator one (8), spectrum analyzer (9), dewavelength division multiplexer (10), N×1 matrix switch (11), beam splitter (12), optical power meter (13), adjustable optical attenuator two (14), and eye diagram meter (15); The first test computer (1) is connected to the electrical signal generator (2) via a cable. The electrical signal generator (2) is connected to the multi-channel space laser emitter (3) via a through-cabin flange cable. The multi-channel space laser emitter (3) is located inside the radiation test chamber (4). The multi-channel space laser emitter (3) is connected to the multi-channel fiber input of the dense wavelength division multiplexer (6) via the through-cabin flange multi-channel fiber output. The output wavelength of the multi-channel space laser emitter (3) corresponds one-to-one with the channel wavelength of the dense wavelength division multiplexer (6). The second test computer (5) is connected to the multi-channel space laser transmitter (3) via a through-cabin flange cable for control and telemetry signals; The fiber output end of the dense wavelength division multiplexer (6) is connected to the fiber of the 1×2 optical switch (7); the output port a of the 1×2 optical switch (7) is connected to the adjustable optical attenuator (8) through the through-cabin flange, and the output end of the adjustable optical attenuator (8) is connected to the spectrometer (9). The output port b of the 1×2 optical switch (7) is optically connected to the input end of the dewavelength division multiplexer (10); The N output terminals of the dewavelength division multiplexer (10) are connected one by one to the input terminal of the N×1 matrix switch (11) via optical fibers. The output of the N×1 matrix switch (11) is optically connected to the input port of the beam splitter (12), the output port c of the beam splitter (12) is connected to the optical power meter (13), the output port d of the beam splitter (12) is connected to the input of the adjustable optical attenuator (14), and the output of the adjustable optical attenuator (14) is optically connected to the eye diagram meter (15).

2. The radiation resistance testing device for multi-channel laser emitters applied in a space environment according to claim 1, characterized in that, The first test computer (1) and the second test computer (5) are industrial computers, which control and telemetry the electrical signal generator (2) and the multi-channel space laser emitter (3) respectively through R232.

3. The radiation resistance testing device for multi-channel laser emitters applied in a space environment according to claim 1, characterized in that, The electrical signal generator (2) is used to generate a driving electrical signal, which is used to control the multi-channel space laser emitter (3).

4. The radiation resistance testing device for multi-channel laser emitters applied in a space environment according to claim 1, characterized in that, The multi-channel spatial laser transmitter (3) is a combination of multiple laser modules, and the wavelength meets the requirements of dense wavelength division multiplexing optical communication.

5. The radiation resistance testing device for multi-channel laser emitters applied in a space environment according to claim 1, characterized in that, The radiation test chamber (4) contains Co. 60 A radiation source used to generate adjustable radiation levels.

6. The radiation resistance testing device for multi-channel laser emitters applied in a space environment according to claim 1, characterized in that, The dense wavelength division multiplexer (6) is used for multiplexing of multiple wavelengths, and the wavelengths meet the requirements of dense wavelength division multiplexing optical communication.

7. The radiation resistance testing device for multi-channel laser emitters applied in a space environment according to claim 1, characterized in that, The optical power meter (13) is a photoelectric optical power meter used to sample and record the input optical power value in real time.

8. The radiation resistance testing device for multi-channel laser emitters applied in a space environment according to claim 1, characterized in that, The spectrometer (9) is a fiber optic spectrometer, whose wavelength accuracy and resolution meet the requirements for laser testing.

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