Test system and method for radio frequency modules
By building multi-channel parallel automated test circuits and utilizing multiple host computers, RF test instruments, and pick-and-place equipment, efficient and automated testing of RF modules is achieved, solving the problems of low efficiency and electrostatic damage in existing technologies and improving test efficiency and consistency.
Patent Information
- Application Number
- CN202311236855.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-09-22
- Publication Date
- 2025-10-24
- Estimated Expiration
- 2043-09-22
AI Technical Summary
Existing RF module testing systems are inefficient and cannot test multiple modules simultaneously. Manual operation can easily lead to electrostatic damage and improper operation, increasing personnel costs and the risk of missed tests.
Multiple host computers, multi-port RF test instruments, server equipment and pick-and-place equipment are used to build automated test circuits. RF tests are performed simultaneously through multiple test circuits, and server equipment and pick-and-place equipment are used for automatic classification and placement to achieve multi-channel parallel testing.
It improves the efficiency of RF module testing, reduces personnel costs, and reduces the risk of electrostatic damage. Parallel testing reduces manual omissions and achieves efficient automated testing.
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Figure CN117375739B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of product testing, and particularly relates to a test system and method of a radio frequency module. BACKGROUND
[0002] In the production test process of a radio frequency (RF) module such as a Wireless Fidelity (WI-FI) module or a Bluetooth module, it is necessary to test whether the emission index data of the radio frequency module meets the standard requirements.
[0003] At present, a personal computer (PC) device, a radio frequency test instrument device, and a test fixture are usually required as a test system to perform one-to-one test and verification on a single radio frequency module. Specifically, the PC device is connected to the radio frequency test instrument device and the test fixture through a universal serial bus (USB) interface or a serial port to control the two devices. The test fixture is used to place the radio frequency module to be tested, and the radio frequency port of the radio frequency test instrument device is connected to the test fixture. During the test, the PC device controls the radio frequency module placed on the test fixture to emit radio frequency data, the radio frequency data is detected by the radio frequency test instrument device and sent to the PC device, and the PC device displays the radio frequency data and determines whether the radio frequency data meets the standard requirements.
[0004] In the batch production test of the radio frequency module, the above test system can only perform one-to-one test on a single radio frequency module, that is, after the one-to-one test on one radio frequency module is completed, the tested radio frequency module needs to be manually removed and replaced with another radio frequency module, so that the test system can be connected to the new radio frequency module for testing. Therefore, the test efficiency is low. SUMMARY
[0005] The present application provides a test system and method of a radio frequency module, which improves the test efficiency. The technical solution is as follows:
[0006] In a first aspect, a test system for radio frequency modules is provided. The system includes a plurality of host computers, a plurality of test devices, a multi-port radio frequency test instrument, a server device, and a pick-and-place device. The plurality of host computers, the plurality of test devices, and a plurality of test ports of the multi-port radio frequency test instrument are connected one-to-one. An output port of the multi-port radio frequency test instrument and the server device are connected to the plurality of host computers, respectively. The server device is connected to the pick-and-place device. The plurality of host computers are configured to control a plurality of radio frequency modules placed on the plurality of test devices to start a radio frequency test mode, respectively. The multi-port radio frequency test instrument is configured to detect radio frequency data generated by the plurality of radio frequency modules in the radio frequency test mode through the plurality of test ports, respectively, and send the radio frequency data generated by the plurality of radio frequency modules to the plurality of host computers, respectively. The plurality of host computers are further configured to send a plurality of test information corresponding to the plurality of radio frequency modules to the server device according to the radio frequency data generated by the plurality of radio frequency modules. Each test information is used to indicate whether the corresponding radio frequency module is qualified. The server device is configured to generate placement instructions of the plurality of radio frequency modules according to the plurality of test information, and send the placement instructions of the plurality of radio frequency modules to the pick-and-place device. The pick-and-place device is configured to classify and place the plurality of radio frequency modules according to the placement instructions of the plurality of radio frequency modules, so as to complete a test process of the plurality of radio frequency modules.
[0007] In a second aspect, a test method for radio frequency modules is provided. The method is applied to the test system for radio frequency modules in the first aspect. The method includes controlling a plurality of radio frequency modules to start a radio frequency test mode, respectively; generating a plurality of test information corresponding to the plurality of radio frequency modules according to radio frequency data generated by the plurality of radio frequency modules in the radio frequency test mode; generating placement instructions of the plurality of radio frequency modules according to the plurality of test information; and classifying and placing the plurality of radio frequency modules according to the placement instructions of the plurality of radio frequency modules, so as to complete a test process of the plurality of radio frequency modules.
[0008] The embodiment of the present application provides a kind of radio frequency module test system and method, according to the scheme provided in the present application, the radio frequency module test system includes: multiple host computers, multiple test equipment, multiple-port radio frequency test instrument, server equipment and pick-and-place equipment;Multiple host computers, multiple test equipment and multiple test ports of multiple-port radio frequency test instrument are connected one by one, and the output port of multiple-port radio frequency test instrument and server equipment are connected with multiple host computers respectively, and server equipment is connected with pick-and-place equipment;By setting multiple host computers, multiple test equipment for placing multiple radio frequency modules to be tested, multiple-port radio frequency test instrument, server equipment and pick-and-place equipment, multiple automated test lines are constructed, one host computer, one test equipment and one test port in multiple-port radio frequency test instrument are connected into a test line, and multiple test lines can be carried out simultaneously, that is, multiple radio frequency modules can simultaneously start radio frequency test mode.Multiple host computers are used to control multiple radio frequency modules to be tested placed on multiple test equipment to start radio frequency test mode;Multiple-port radio frequency test instrument is used to detect radio frequency data generated by multiple radio frequency modules in radio frequency test mode through multiple test ports respectively, and send the radio frequency data generated by multiple radio frequency modules to multiple host computers respectively;Multiple host computers are also used to send multiple test information corresponding to multiple radio frequency modules to server equipment according to the radio frequency data generated by multiple radio frequency modules, and each test information is used to indicate whether the corresponding radio frequency module is qualified;Server equipment is used to generate placement instructions of multiple radio frequency modules according to multiple test information, and send the placement instructions of multiple radio frequency modules to pick-and-place equipment;Pick-and-place equipment is used to classify and place multiple radio frequency modules according to the placement instructions of multiple radio frequency modules to complete the test process of multiple radio frequency modules.The multiple test ports of multiple-port radio frequency test instrument detect radio frequency data respectively and send them to the host computers connected with the test ports respectively, and the host computers judge whether the radio frequency module is qualified according to the radio frequency data and then feedback to the server equipment.Server equipment controls pick-and-place equipment to classify and place multiple radio frequency modules according to multiple test information indicating whether the radio frequency module is qualified, realizes multiple parallel automated test radio frequency modules, and improves test efficiency. BRIEF DESCRIPTION OF DRAWINGS
[0009] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.
[0010] Figure 1 It is a schematic diagram of a radio frequency module test system provided by the embodiment of the present application.
[0011] Figure 2is a schematic diagram of another test system of a radio frequency module provided by an embodiment of the present application;
[0012] Figure 3 is a schematic diagram of still another test system of a radio frequency module provided by an embodiment of the present application;
[0013] Figure 4 is a schematic diagram of yet another test system of a radio frequency module provided by an embodiment of the present application;
[0014] Figure 5 is a flow chart of a test method of a radio frequency module provided by an embodiment of the present application. DETAILED DESCRIPTION
[0015] In order to make the purpose, technical solutions and advantages of the present application clearer, the embodiments of the present application will be further described in detail below with reference to the drawings.
[0016] It should be understood that the "multiple" mentioned in the present application refers to two or more than two. In the description of the present application, unless otherwise specified, " / " represents the meaning of or, for example, A / B can represent A or B; "and / or" in the present application only describes the association relationship of the associated objects, which means that there can be three relationships, for example, A and / or B, which can represent three cases of A alone, A and B together, and B alone. In addition, in order to clearly describe the technical solutions of the present application, the same items or similar items with basically the same functions and effects are distinguished by using "first", "second", etc. The skilled in the art can understand that "first", "second", etc. do not limit the quantity and execution order, and "first", "second", etc. also do not necessarily mean different.
[0017] Before the embodiments of the present application are explained in detail, the related technologies of the embodiments of the present application are described.
[0018] Currently, a radio frequency module test scheme needs one radio frequency module to correspond to one PCIE or USB interface of a computer, wherein, PCIE (peripheral component interconnect express) is a high-speed serial computer expansion bus standard, USB (Universal Serial Bus) is a serial bus standard, the radio frequency module is connected between the computer and the radio frequency test instrument device, and one-to-one test is performed by the test personnel. Moreover, when the radio frequency module is manually taken and placed, the operator also needs to wear an electrostatic wristband to avoid electrostatic damage to the radio frequency module. Even if the radio frequency test instrument device has multiple test ports, it can connect multiple radio frequency modules, but if multiple radio frequency modules are to be tested at the same time, the same number of test stations as the number of test ports need to be added, and the corresponding number of test personnel also need to be added, so as to complete the test process of multiple radio frequency modules, which increases the personnel cost, and the efficiency is not substantially improved. The product test efficiency of the radio frequency module test scheme is low, the personnel investment is large, and the production capacity is difficult to standardize. Moreover, during the test process, manual test is prone to missing test, and it is difficult for personnel operation to guarantee the standardization of work and whether the electrostatic wristband is worn properly. The scheme of manually taking and placing the radio frequency module is prone to cause electrostatic damage to the radio frequency module and other problems.
[0019] The embodiment of the present application provides a radio frequency module test system, as shown in Figure 1 Figure 1 is a schematic diagram of a radio frequency module test system provided by the embodiment of the present application. The radio frequency module test system comprises: a plurality of host computers (host computer 11 and host computer 12 are shown in the figure), a plurality of test devices (test device 21 and test device 22 are shown in the figure), a multi-port radio frequency test instrument 30, a server device 40 and a taking and placing device 50. The multi-port radio frequency test instrument 30 is configured with an output port and a plurality of test ports (test ports 31 and 32 are shown in the figure), and each test device is used to place a radio frequency module to be tested.
[0020] The plurality of host computers, the plurality of test devices and the plurality of test ports of the multi-port radio frequency test instrument 30 are connected one by one (the host computer 11, the test device 21 and the test port 31 are connected correspondingly, and the host computer 12, the test device 22 and the test port 32 are connected correspondingly, which is shown in the figure), the output port of the multi-port radio frequency test instrument 30 and the server device 40 are connected with the plurality of host computers respectively, and the server device 40 is connected with the taking and placing device 50.
[0021] The plurality of host computers are configured to control a plurality of radio frequency modules to be tested placed on the plurality of test devices to start a radio frequency test mode; the multi-port radio frequency test instrument 30 is configured to detect radio frequency data generated by the plurality of radio frequency modules in the radio frequency test mode through a plurality of test ports respectively, and send the radio frequency data generated by the plurality of radio frequency modules to the plurality of host computers respectively; the plurality of host computers are further configured to send a plurality of test information corresponding to the plurality of radio frequency modules to the server device 40 according to the radio frequency data generated by the plurality of radio frequency modules, each test information being used to indicate whether the corresponding radio frequency module is qualified; the server device 40 is configured to generate a placement instruction of the plurality of radio frequency modules according to the plurality of test information, and send the placement instruction of the plurality of radio frequency modules to the taking and placing device 50; and the taking and placing device 50 is configured to classify and place the plurality of radio frequency modules according to the placement instruction of the plurality of radio frequency modules, so as to complete a test process of the plurality of radio frequency modules.
[0022] In the embodiments of the present application, the test device can be a test fixture connected to the host computer and the multi-port radio frequency test instrument 30 through a USB or PCIE interface, and each test device is used to place a radio frequency module to be tested. In the actual product detection line, the radio frequency module to be tested can be placed (for example, arranged through a card slot) on the test device. One host computer, one test device and one test port are connected correspondingly. After the radio frequency module is placed on the test device, the host computer, the radio frequency module and the test port can form a test line, thereby forming a plurality of test lines. The output port of the multi-port radio frequency test instrument 30 is in communication connection with the plurality of host computers, and is used to feed back the detected radio frequency data to each host computer; the server device 40 is in communication connection with the plurality of host computers respectively, and is used to receive the test information fed back by each host computer; and the server device 40 is connected with the taking and placing device 50, and is used to issue a placement instruction to the taking and placing device 50.
[0023] For a test line (including a host computer, a radio frequency module placed on a test device, and a test port), the host computer controls the radio frequency module placed on the test device to start a radio frequency test mode, which represents a mode that can make the radio frequency module generate radio frequency data during testing. The multi-port radio frequency test instrument 30 detects the radio frequency data generated by the radio frequency module in the radio frequency test mode through the test port (here, the test port can be controlled by the host computer to detect the radio frequency data), and sends the radio frequency data generated by the radio frequency module to the host computer. The host computer sends test information corresponding to the radio frequency module to the server device 40 according to the radio frequency data generated by the radio frequency module, to indicate whether the radio frequency module is qualified. In this way, the server device 40 receives test information sent by multiple test lines respectively, generates placement instructions of multiple radio frequency modules according to multiple test information. The placement instruction can represent an instruction indicating whether each radio frequency module needs to be placed in a qualified area or an unqualified area; the placement instruction can also represent multiple instructions, each instruction indicating whether the corresponding radio frequency module needs to be placed in the qualified area or the unqualified area. The server device 40 sends the placement instructions of the multiple radio frequency modules to the taking and placing device 50; the taking and placing device 50 classifies and places the multiple radio frequency modules according to the placement instructions of the multiple radio frequency modules, that is, places them in the qualified area or the unqualified area, to complete the test process of the multiple radio frequency modules.
[0024] In the embodiments of the present application, each host computer controls the corresponding radio frequency module to enter the radio frequency test mode, so that the radio frequency module transmits specific radio frequency information to generate radio frequency data, which is obtained by the corresponding test port. The radio frequency data is sent to the corresponding host computer, which judges whether the radio frequency module is qualified according to the radio frequency data, and sends test information indicating whether it is qualified to the server device 40. The server device 40 generates placement instructions of multiple radio frequency modules according to multiple test information, to control the taking and placing device 50 to classify and place multiple radio frequency modules, complete the automatic parallel test process, improve the test efficiency, and save the personnel expenses, thereby reducing the production cost. The automatic test reduces the phenomenon of manual omission test.
[0025] In the embodiments of the present application, the radio frequency data can be a radio frequency index parameter, including but not limited to receive sensitivity (Rx Sensitivity), signal-to-noise ratio (SINR), transmit power (Tx Power), error vector (error vector magnitude, EVM), frequency band, frequency offset, etc.
[0026] It should be noted that the test process is completed by means of conduction test, and in one test process, multiple test lines can be tested simultaneously or in sequence within a certain period of time, and the embodiments of the present application do not limit this, as long as the test time of at least two test lines is crossed.
[0027] In addition, the whole taking and placing device 50 can be electrostatically protected, and the part contacting the radio frequency module is made of electrostatic material, thereby reducing the risk of electrostatic damage caused by manual taking and placing of the radio frequency module.
[0028] According to the scheme provided in the present application, the test system of the radio frequency module includes: multiple host computers, multiple test devices, a multi-port radio frequency test instrument, a server device and a taking and placing device; the multiple host computers, the multiple test devices and the multiple test ports of the multi-port radio frequency test instrument are connected one by one, the output port of the multi-port radio frequency test instrument and the server device are connected with the multiple host computers respectively, and the server device is connected with the taking and placing device; by setting the multiple host computers, the multiple test devices for placing the multiple radio frequency modules to be tested, the multi-port radio frequency test instrument, the server device and the taking and placing device, multiple automated test lines are constructed, one host computer, one test device and one test port in the multi-port radio frequency test instrument are connected to form one test line, and multiple test lines can be tested simultaneously, that is, multiple radio frequency modules can be simultaneously opened in radio frequency test mode. The multiple host computers are used to control the multiple radio frequency modules to be tested placed on the multiple test devices to open the radio frequency test mode respectively; the multi-port radio frequency test instrument is used to detect the radio frequency data generated by the multiple radio frequency modules in the radio frequency test mode through the multiple test ports respectively, and send the radio frequency data generated by the multiple radio frequency modules to the multiple host computers respectively; the multiple host computers are further used to send multiple test information corresponding to the multiple radio frequency modules to the server device according to the radio frequency data generated by the multiple radio frequency modules, and each test information is used to indicate whether the corresponding radio frequency module is qualified; the server device is used to generate placement instructions of the multiple radio frequency modules according to the multiple test information, and send the placement instructions of the multiple radio frequency modules to the taking and placing device; the taking and placing device is used to classify and place the multiple radio frequency modules according to the placement instructions of the multiple radio frequency modules, so as to complete the test process of the multiple radio frequency modules. The multiple test ports of the multi-port radio frequency test instrument detect the radio frequency data respectively and send them to the host computers connected with the test ports respectively, and the host computers judge whether the radio frequency module is qualified according to the radio frequency data and then feed back to the server device. The server device controls the taking and placing device to classify and place the multiple radio frequency modules according to the multiple test information representing whether the radio frequency module is qualified, realizes multiple parallel automated test of radio frequency modules, and improves the test efficiency.
[0029] In some embodiments, the plurality of host computers include a first host computer, the plurality of test devices include a first test device, the plurality of test ports include a first test port, and a first RF module is placed on the first test device. When the first host computer, the first RF module placed on the first test device, and the first test port among the plurality of test ports are connected to form a test line, the first host computer is used to send a test instruction to the first RF module; the first RF module is used to turn on the RF test mode based on the test instruction and generate RF data; the multi-port RF test instrument 30 is used to detect the RF data through the first test port and send the RF data to the first host computer; the first host computer is also used to determine whether the indicator data of the first RF module meets the standard requirements based on the RF data, and send test information corresponding to the first RF module to the server device 40.
[0030] Among them, the first host computer is any host computer among multiple host computers, the first test device is a test device connected to the first host computer, and the first test port is a test port connected to the first test device, that is, the first host computer, the first test device and the first test port are connected one-to-one.
[0031] When the test circuit is formed, the first host computer sends a test instruction to the first RF module placed on the first test device to control the first RF module to turn on the RF test mode and generate RF data. The multi-port RF test instrument 30 obtains the RF data generated by the first RF module through the first test port and sends the RF data generated by the first RF module to the first host computer. The first host computer determines whether the index data of the first RF module meets the standard requirements based on the RF data generated by the first RF module, for example, whether the frequency band meets the frequency deviation range, whether the transmission power meets the transmission power range, etc., thereby determining whether the first RF module is qualified and sending test information indicating whether the first RF module is qualified to the server device 40.
[0032] Among them, the RF data can be a waveform, and the first host computer extracts or parses the index data from the RF data. The index data can include frequency deviation (indicating the amplitude of the waveform frequency swing) and transmission power. Correspondingly, the standard requirements can be frequency band, frequency deviation range and transmission power range. The first host computer determines whether the first RF module is qualified by judging whether the index data of the first RF module meets the standard requirements. For example, if the index data of the first RF module meets the standard requirements, the first RF module is judged to be qualified; if the index data of the first RF module does not meet the standard requirements, the first RF module is judged to be unqualified.
[0033] It can be understood that there is a second host computer in the plurality of host computers, a second test device connected to the second host computer in the plurality of test devices, and a second test port connected to the second test device in the plurality of test ports. The second host computer, the second test device, and the second test port form another test line. In this way, a plurality of test lines can be formed, and the plurality of test lines can execute the test process simultaneously or in a preset time period. Thus, the automatic parallel test process is completed, and the test efficiency is improved.
[0034] In some embodiments, the first host computer is further configured to, in a case where it is determined according to the radio frequency data that the index data of the first radio frequency module meets the standard requirement, send first test information to the server device, the first test information being used to indicate that the first radio frequency module is qualified; in a case where it is determined according to the radio frequency data that the index data of the first radio frequency module does not meet the standard requirement, determine a radio frequency calibration parameter according to the radio frequency data and a preset standard range, and send the radio frequency calibration parameter to the first radio frequency module; the first radio frequency module is further configured to adjust its own parameters based on the radio frequency calibration parameter, and generate new radio frequency data; the multi-port radio frequency test instrument 30 is further configured to continue to detect the new radio frequency data through the first test port, and send the new radio frequency data to the first host computer; the first host computer is further configured to continue to determine whether the index data of the radio frequency module meets the standard requirement according to the new radio frequency data until the adjustment of the first radio frequency module meets a preset condition.
[0035] In the embodiments of the present application, the test information includes first test information indicating qualification and second test information indicating disqualification. The first host computer determines whether the index data of the first radio frequency module meets the standard requirement according to the radio frequency data. If it meets, the first host computer sends the first test information of the first radio frequency module to the server device. If it does not meet, the first host computer performs a calibration process on the first radio frequency module, and re-determines whether the index data of the first radio frequency module meets the standard requirement after the calibration. The process is repeated until the adjustment of the first radio frequency module meets a preset condition.
[0036] The preset condition is that the index data of the radio frequency module meets the standard requirement (i.e., the radio frequency module is calibrated to be within the preset standard range), or the number of adjustments reaches a preset number, or the adjustment time length reaches a preset time length. Of course, the preset condition can also be a combination of any two or more of the above, which is not limited in the embodiments of the present application.
[0037] In the actual product detection line, some RF modules can be calibrated, and some RF modules have problems, such as poor contact of the patch, etc. Based on this, the test time (adjustment time reaches the preset time) or the test number (adjustment number reaches the preset number) can be set to improve the test efficiency. If the index data of the first RF module meets the standard requirement within the preset time or the preset number, the test process is completed, and the first RF module is regarded as a qualified RF module. If the preset time or the preset number is reached, and the index data of the first RF module meets the standard requirement, the test process is completed, and the first RF module is regarded as a qualified RF module. If the preset time or the preset number is reached, and the index data of the first RF module does not meet the standard requirement, the test process is completed, and the first RF module is regarded as an unqualified RF module.
[0038] The calibration process is described here. According to the RF data and the preset standard range, the RF calibration parameter is determined, and the RF calibration parameter is sent to the first RF module. The preset standard range corresponds to the standard requirement, and the two are equivalent. According to the RF data and the preset standard range, the offset of the first RF module can be determined, such as the frequency band offset, the offset of the frequency offset range, and the offset of the transmission power. According to the offset of the first RF module, the RF calibration parameter is determined. The first RF module adjusts its own parameters based on the RF calibration parameter, and generates new RF data. The multi-port RF test instrument 30 continues to detect the new RF data through the first test port, and sends the new RF data to the first host computer. The first host computer continues to determine whether the index data of the RF module meets the standard requirement according to the new RF data. The cycle is repeated until the adjustment of the first RF module meets the preset condition. The RF module is calibrated by the RF calibration parameter, which ensures that the index data of the RF module meets the standard requirement, and can improve the consistency of the RF module in this batch.
[0039] It should be noted that the standard requirement and the preset standard range are related to the model of the RF module, and can be determined according to the parameters of the RF module to be tested. The preset number and the preset time can be appropriately set by the person skilled in the art according to the actual situation. For example, the preset number can be set to 5, 4 or 6, etc. The preset time can be set to 15 seconds (s), 18s, 20s, 30s or 40s, etc. The preset time can be set according to the single test time, and the preset time can be set as a multiple of the single test time. The present application does not limit this.
[0040] The scheme provides a radio frequency module parallel test calibration technique, a first host computer, a first test device and a first test port in a plurality of test ports constituting a test circuit perform an automatic test process, and a radio frequency module that does not meet standard requirements is calibrated multiple times, so that the radio frequency module parallel test calibration effect is achieved. And by setting a preset condition, the length of the test process is limited, and the test efficiency is improved.
[0041] In some embodiments, the first host computer is further configured to, in a case where the number of adjustments is less than the preset number of adjustments or the adjustment time is less than the preset adjustment time and it is determined that the index data of the first radio frequency module meets the standard requirements, write the last radio frequency calibration parameter to the first radio frequency module, and send first test information to the server device 40.
[0042] In the embodiments of the present application, in the calibration process of the first radio frequency module, if the number of adjustments is less than the preset number of adjustments and it is determined that the index data of the first radio frequency module meets the standard requirements, that is, the first radio frequency module can be calibrated, the first host computer writes the last radio frequency calibration parameter to the first radio frequency module, the radio frequency module is calibrated to a qualified radio frequency module, and sends first test information to the server device 40. If the adjustment time is less than the preset adjustment time and it is determined that the index data of the first radio frequency module meets the standard requirements, that is, the first radio frequency module can be calibrated, the first host computer writes the last radio frequency calibration parameter to the first radio frequency module, the radio frequency module is calibrated to a qualified radio frequency module, and sends first test information to the server device 40.
[0043] After the calibration of the radio frequency module is completed within the limited time or the limited number of times, the radio frequency module is also subjected to a write operation, so that the radio frequency module is calibrated to a qualified radio frequency module, and the consistency of the radio frequency modules in the batch is improved.
[0044] In some embodiments, the first host computer is further configured to, in a case where the number of adjustments reaches the preset number of adjustments or the adjustment time reaches the preset adjustment time and it is determined that the index data of the first radio frequency module does not meet the standard requirements, send a test interruption instruction to the first radio frequency module, and send second test information to the server device 40, the second test information being used to indicate that the first radio frequency module is unqualified; and the radio frequency module is further configured to close the radio frequency test mode based on the test interruption instruction.
[0045] In the embodiment of the present application, in the calibration process of the first radio frequency module, if the adjustment times reach the preset times and it is judged that the index data of the first radio frequency module does not meet the standard requirement, that is, the first radio frequency module itself has a problem and cannot be calibrated well, the first host computer sends a test interruption instruction to the first radio frequency module, and the radio frequency module is no longer calibrated, and is regarded as a radio frequency module that does not meet the standard requirement, and the second test information is sent to the server device 40. If the adjustment duration reaches the preset duration and it is judged that the index data of the first radio frequency module does not meet the standard requirement, that is, the first radio frequency module itself has a problem and cannot be calibrated well, the first host computer sends a test interruption instruction to the first radio frequency module, and the radio frequency module is no longer calibrated, and is regarded as a radio frequency module that does not meet the standard requirement, and the second test information is sent to the server device 40. The radio frequency module is closed based on the test interruption instruction.
[0046] The present example also sets a timeout test. For example, it usually takes 8s to test a radio frequency module, and a timing of 15s is set here. If it takes more than 15s and the test is not completed (at this time, the index data of the radio frequency module does not meet the standard requirement, because if it meets the standard requirement, it will not be tested again), the test will be forced to complete, and the radio frequency module will be regarded as a radio frequency module that does not meet the standard requirement.
[0047] If the calibration of the radio frequency module is completed within the limited duration or the limited times, and the radio frequency module still does not meet the standard requirement, the radio frequency module is no longer calibrated, the calibration time of the radio frequency module that has a problem itself is reduced, and the test efficiency is improved.
[0048] In some embodiments, each host computer is also used for sending a test state of the corresponding radio frequency module to the server device 40; and the server device 40 is used for sending a placement instruction of the plurality of radio frequency modules to the taking and placing device 50 in a case where the test states of the plurality of radio frequency modules all represent that the test is completed.
[0049] In the embodiment of the present application, a plurality of radio frequency modules are tested at the same time or within a preset time period on the product detection line. Some are tested quickly (the index data meets the standard requirement after single test, and no debugging is needed), and some are tested slowly (debugging is needed). Therefore, the test time of each test line (the host computer, the radio frequency module placed on the test device, and the test port) is different. Based on this, in the present example, after each test line is tested, in one case, the host computer reports the test state of the corresponding radio frequency module to the server device 40 every certain period of time or every test, and the test state includes completed test or incomplete test; in another case, the host computer reports the test state representing that the test is completed to the server device 40 only after the index data of the radio frequency module meets the standard requirement or the adjustment of the radio frequency module satisfies the preset condition (that is, the radio frequency module is no longer tested).
[0050] The server device 40 receives the test states of the plurality of radio frequency modules reported by the plurality of host computers, and in the case where the test states of the plurality of radio frequency modules all represent that the test is completed, sends a placing instruction of the plurality of radio frequency modules to the taking and placing device 50. That is, the server device 40 waits until the plurality of radio frequency modules are all tested, and then performs the placing action by the taking and placing device. In this way, the plurality of radio frequency modules can be placed in a classified manner, and the test efficiency is improved.
[0051] In some embodiments, the server device 40 is further configured to acquire the addresses of the plurality of host computers at a preset period, determine the working states of the plurality of host computers based on the addresses of the plurality of host computers, and generate an alarm information in the case where the working state of any host computer represents that the host computer is in an abnormal state. The alarm information is used to remind a worker to process the host computer in the abnormal state.
[0052] In the embodiments of the present application, since the test method of the radio frequency module is a multi-path parallel automatic test, the host computer may be down. Therefore, in the present example, the server device acquires the logical addresses (for example, the IP (Internet Protocol) addresses) of the plurality of host computers at a preset period, for example, by the PIN method. The network connection between the server device and the host computer is checked according to the connection of the logical addresses, that is, the working state of the host computer is checked. The working state includes a normal state and an abnormal state. If a host computer in the abnormal state is found, an alarm information is generated. The alarm information carries the identification information of the host computer, which can be in the form of voice, text or a combination of the two, to remind the worker to process the host computer in the abnormal state.
[0053] It should be noted that the preset period can be appropriately set by a person skilled in the art according to the actual situation. For example, the preset period can be determined according to a large number of experimental thresholds, for example, 30 minutes (min), 2 hours (h), 5 h, etc. The embodiments of the present application do not limit the preset period.
[0054] The working state of each host computer is checked by the server device at a preset period. In the case where a host computer in the abnormal state is determined to exist, an alarm information is generated, so that the worker can process in time based on the alarm information, and the automatic test efficiency is improved.
[0055] In some embodiments, the server device 40 is further configured to send an opening instruction to the taking and placing device 50 based on the test request; and the taking and placing device 50 is further configured to take out the plurality of radio frequency modules based on the opening instruction, and place the plurality of radio frequency modules one by one on the plurality of test devices, so that the radio frequency modules on each host computer, each test device, and each test port are connected to form a test line.
[0056] In the embodiment of the present application, when starting the test, the user initiates a test request, for example, starts the test, clicks the test button, etc. The server device 40 generates an opening instruction in response to the test request and sends the opening instruction to the taking and placing device 50. The taking and placing device 50 takes out the plurality of radio frequency modules based on the opening instruction and places the plurality of radio frequency modules one by one on the plurality of test devices. The host computer, the test device and the test port are physically connected. After the test device is placed on the radio frequency module (for example, by the form of the card slot), the host computer, the radio frequency module on the test device and the test port which are physically connected constitute a test line, thereby constituting a plurality of test lines. The plurality of radio frequency modules are placed on the test device one by one without manual operation, the multi-channel parallel automatic test is realized, and the test efficiency is improved.
[0057] In some embodiments, the taking and placing device 50 is configured to report a taking and placing state indicating that the current test is completed to the server device 40 after the classification and placement are completed; and the server device 40 is configured to send a continue test instruction to the taking and placing device 50 to test the next batch of radio frequency modules to be tested after receiving the taking and placing state.
[0058] In the embodiment of the present application, the taking and placing device 50 needs to take the plurality of radio frequency modules one by one and place them on the plurality of test devices when starting the test, and also needs to take the plurality of radio frequency modules from the plurality of test devices after a round of test is completed and place them in a classified manner. As can be seen, the taking and placing device 50 is needed at the end of the previous test and the beginning of the next test in adjacent two tests. Therefore, the taking and placing device 50 reports a taking and placing state indicating that the current test is completed to the server device 40 after the classification and placement are completed, and the server device 40 sends a continue test instruction to the taking and placing device 50 to test the next batch of radio frequency modules to be tested after receiving the taking and placing state, without manual participation, thereby realizing the multi-channel parallel automatic test and improving the test efficiency.
[0059] In some embodiments, as shown in FIG. 6, the taking and placing device 50 is configured to report a taking and placing state indicating that the current test is completed to the server device 40 after the classification and placement are completed; and the server device 40 is configured to send a continue test instruction to the taking and placing device 50 to test the next batch of radio frequency modules to be tested after receiving the taking and placing state. Figure 2 Figure 2 Schematic diagram of another RF module test system provided in an embodiment of the present application. The RF module test system also includes a switch 60; the output port of the multi-port RF test instrument 30 and the server device 40 are respectively connected to multiple host computers through the switch 60, and the server device 40 is connected to the pick-and-place device 50 through the switch 60; the multi-port RF test instrument 30 is used to detect RF data through the first test port and send the RF data to the first host computer through the switch 60; the first host computer is used to determine whether the indicator data of the first RF module meets the standard requirements based on the RF data, and send test information corresponding to the first RF module to the server device 40 through the switch 60; the server device 40 is used to send placement instructions for multiple RF modules to the pick-and-place device 50 through the switch 60.
[0060] In the embodiment of the present application, the output ports of the multi-port RF test instrument 30 are connected to multiple host computers through a switch 60, and the server device 40 is connected to multiple host computers through the switch 60. During the test process, data reporting and information transmission between the server device 40 and the host computer, between the multi-port RF test instrument 30 and the host computer, and between the server device 40 and the pick-and-place device 50 are all completed through the switch 60, which acts as a transfer station.
[0061] For example, taking the example that the first host computer is any host computer among multiple host computers, the first test device among multiple test devices is a test device connected to the first host computer, and the first test port among multiple test ports is a test port connected to the first test device, the multi-port RF test instrument 30 detects RF data through the first test port, and sends the RF data to the first host computer through the switch 60; the first host computer determines whether the index data of the first RF module meets the standard requirements based on the RF data, and sends the test information corresponding to the first RF module to the server device 40 through the switch 60; the server device 40 generates placement instructions for multiple RF modules based on multiple test information, and sends the placement instructions for multiple RF modules to the pick-and-place device 50 through the switch 60.
[0062] In the scheme, the host computer and the multi-port radio frequency test instrument 30, the host computer and the test equipment, the host computer and the server equipment 40, the taking and placing equipment 50 and the server equipment 40 are bidirectional interaction, the multi-port radio frequency test instrument 30 and the test equipment are unidirectional data interaction (since the test mode is to test the transmitting performance of the radio frequency module, here is unidirectional data interaction). The switch 60 is only a relay station, all data is only relayed through the switch, all devices connected to the switch (the multi-port radio frequency test instrument, the server equipment, the host computer, the taking and placing equipment all have unique IP addresses), each test port in the multi-port radio frequency test instrument has an independent processing unit, respectively sends the radio frequency test data (that is, the radio frequency data) of the corresponding test port to the corresponding host computer through the network, and the host computer controls the corresponding test port processing unit of the multi-port radio frequency test instrument to capture the radio frequency data through the network.
[0063] The data interaction between the devices in the test scheme is realized through the switch, without manual participation, realizing multi-channel parallel automatic test and improving the test efficiency.
[0064] In some embodiments, the server equipment 40 is configured to generate, according to a plurality of test information, a first placement instruction of unqualified radio frequency modules in the plurality of radio frequency modules and / or a second placement instruction of qualified radio frequency modules in the plurality of radio frequency modules, and send the first placement instruction and / or the second placement instruction to the taking and placing equipment 50; and the taking and placing equipment 50 is configured to place the unqualified radio frequency modules in the plurality of radio frequency modules in a first area according to the first placement instruction, and / or place the qualified radio frequency modules in the plurality of radio frequency modules in a second area according to the second placement instruction.
[0065] In the embodiments of the present application, the plurality of test information can all be first test information indicating qualification, can all be second test information indicating disqualification, or can include the first test information indicating qualification and the second test information indicating disqualification. Based on this, different placement instructions need to be generated according to different test information, and correspondingly, the placement instructions can be a first placement instruction that all the radio frequency modules are qualified, can be a second placement instruction that all the radio frequency modules are unqualified, or can include the first placement instruction of the qualified radio frequency modules and the second placement instruction of the unqualified radio frequency modules.
[0066] The server device 40 generates, according to first test information indicating passing in the plurality of test information, a first placement instruction about radio frequency modules that do not pass in the plurality of radio frequency modules, and generates, according to second test information indicating not passing in the plurality of test information, a second placement instruction about radio frequency modules that pass in the plurality of radio frequency modules. The generation order of the first placement instruction and the second placement instruction is not limited. The server device 40 sends the first placement instruction and / or the second placement instruction to the taking and placing device 50 through the switch 60. The taking and placing device 50 places, according to the first placement instruction, radio frequency modules that do not pass in the plurality of radio frequency modules in the first area, and / or the taking and placing device 50 places, according to the second placement instruction, radio frequency modules that pass in the plurality of radio frequency modules in the second area, so as to realize classified placement of the plurality of radio frequency modules without manual participation, realize multi-path parallel automatic testing, and improve testing efficiency.
[0067] In some embodiments, as shown in Figure 3 Figure 3 FIG. 14 is a schematic diagram of still another test system of a radio frequency module provided in an embodiment of the present application. The taking and placing device 50 includes a control device 51, a plurality of mechanical arms (mechanical arms 521 and 522 are shown in the figure), and a plurality of adsorption devices (adsorption devices 531 and 532 are shown in the figure). The control device 51 is connected with the plurality of mechanical arms and the plurality of adsorption devices respectively, and the plurality of mechanical arms and the plurality of adsorption devices are connected one by one (connection of the mechanical arm 521 and the adsorption device 531, and connection of the mechanical arm 522 and the adsorption device 532 are shown in the figure). The control device 51 is configured to control each adsorption device to perform adsorption operation on each radio frequency module and control each mechanical arm to drive each adsorption device to perform movement operation according to placement instructions of the plurality of radio frequency modules. The adsorption device is configured to release radio frequency modules that do not pass based on the first placement instruction when moving to the first area, and release radio frequency modules that pass based on the second placement instruction when moving to the second area.
[0068] In the embodiment of the present application, the control device 51 can be a programmable logic controller (PLC) or the like. The server device 40 is connected with the control device 51 through the switch 60. The control device 51 is connected with the plurality of mechanical arms and the plurality of adsorption devices respectively. One mechanical arm is connected with one adsorption device. The number of the mechanical arms is consistent with the number of the test devices. One mechanical arm corresponds to one test device. The control device 51 controls each mechanical arm to move respectively. The controller controls each adsorption device to perform adsorption operation on the radio frequency module respectively. The mechanical arm and the adsorption device cooperate with each other, so that the radio frequency module can be placed on the test device or moved away from the test device.
[0069] Regardless of whether the radio frequency module is qualified or unqualified, the radio frequency module needs to be removed from the test equipment and moved away, based on which the control device 51 controls each mechanical arm to drive each adsorption device to move to the corresponding position (for example, above the radio frequency module) of the radio frequency module according to the placement instructions of the plurality of radio frequency modules, and then controls each adsorption device to perform the adsorption operation on each radio frequency module, and controls each mechanical arm to drive each adsorption device to perform the movement operation.
[0070] The adsorption device releases the unqualified radio frequency module based on the first placement instruction when the radio frequency module on the adsorption device driven by the mechanical arm is moved to the first area, and releases the qualified radio frequency module based on the second placement instruction when the radio frequency module on the adsorption device driven by the mechanical arm is moved to the second area. That is, all the radio frequency modules are moved by the plurality of mechanical arms, when moved to the first area, only the unqualified radio frequency modules are released, and then the other radio frequency modules (i.e., qualified radio frequency modules) that are not released are moved by the plurality of mechanical arms, and when moved to the second area, the qualified radio frequency modules are released.
[0071] In the embodiments of the present application, by the automatic control technology of the control device, first passing through the first area and then passing through the second area, the situation that the unqualified radio frequency module is placed on the first area due to the adsorption of the adsorption device not being tight can be prevented, and the accuracy of the classified placement is improved.
[0072] Further, the mechanical arm can be grounded as a whole for electrostatic protection, and the adsorption device on the mechanical arm can be made of anti-static material, thereby reducing the risk of electrostatic damage caused by manual taking and placing of the radio frequency module.
[0073] In some embodiments, the adsorption device includes a gas circuit connected to the suction nozzle; and the control device 51 is configured to control each gas circuit to provide a preset air pressure to the corresponding connected suction nozzle according to the placement instructions of the plurality of radio frequency modules, so as to perform the adsorption operation on each radio frequency module through each suction nozzle; the gas circuit is configured to execute the closing operation under the first placement instruction when moved to the first area, so that the suction nozzle releases the unqualified radio frequency module; and execute the closing operation under the second placement instruction when moved to the second area, so that the suction nozzle releases the qualified radio frequency module.
[0074] In the embodiments of the present application, the suction nozzle uses the principle of air pressure to make the radio frequency module tightly adhere to the suction nozzle by air pressure. When the suction nozzle moves to the radio frequency module, the gas circuit is opened to provide a certain air pressure (i.e., a preset air pressure) to the suction nozzle, so as to adsorb the radio frequency module on the suction nozzle. When the suction nozzle moves to the target position (the first area or the second area), the gas circuit is closed to release the radio frequency module. Without manual intervention, the plurality of parallel automatic tests are realized, and the test efficiency is improved.
[0075] Below, an exemplary application of the embodiments of the present application in an actual application scenario will be described.
[0076] As Figure 4 shown, Figure 4 is a schematic diagram of another test system for a radio frequency module provided by the embodiments of the present application. Eight is taken as an example for description of the number of the plurality of host computers, the plurality of test devices, and the number of the plurality of test ports of the multi-port radio frequency test instrument. The test computer represents the device where the host computer is located. The host computer runs in the test computer. The radio frequency index parameters (i.e., radio frequency data) of the radio frequency module are displayed on the host computer interface of the corresponding test computer. The test station represents the test device. The server computer represents the server device 40. The eight-port radio frequency test instrument represents the multi-port radio frequency test instrument 30. The PLC control system represents the control device 51. The mechanical hand represents the mechanical arm. The suction nozzle represents the adsorption device. The plurality of host computers includes the test computer one, the test computer two, the test computer three, the test computer four, the test computer five, the test computer six, the test computer seven, and the test computer eight. The plurality of test devices includes the test station one, the test station two, the test station three, the test station four, the test station five, the test station six, the test station seven, and the test station eight. The plurality of test ports of the multi-port radio frequency test instrument includes the port one, the port two, the port three, the port four, the port five, the port six, the port seven, and the port eight. The plurality of mechanical arms includes the mechanical hand one to the mechanical hand eight. The adsorption device includes the suction nozzle one, the suction nozzle two, the suction nozzle three, the suction nozzle four, the suction nozzle five, the suction nozzle six, the suction nozzle seven, and the suction nozzle eight.
[0077] The server computer is connected with the switch 60 through a network cable. The eight-port radio frequency test instrument is connected with the switch 60 through a network cable. The test computer one to the test computer eight are connected with the switch 60 through network cables. The PLC control system is connected with the switch 60 through a network cable. The mechanical hand one to the mechanical hand eight correspond to the test station one to the test station eight respectively. The test station one and the port one are connected through the RF radio frequency port one. The test station two and the port two are connected through the RF radio frequency port two. The test station three and the port three are connected through the RF radio frequency port three. The test station four and the port four are connected through the RF radio frequency port four. The test station five and the port five are connected through the RF radio frequency port five. The test station six and the port six are connected through the RF radio frequency port six. The test station seven and the port seven are connected through the RF radio frequency port seven. The test station eight and the port eight are connected through the RF radio frequency port eight.
[0078] Figure 4The shown multi-channel parallel automatic test system includes eight-port radio frequency test instrument, server computer, switch 60, test stations one to eight, test computers one to eight, PLC control system and manipulator. Among them, the test computer and the eight-port radio frequency test instrument, the test computer and the test station, the test computer and the server computer, the PLC control system and the server computer are bidirectional interaction, and the eight-port radio frequency test instrument and the test station are one-way data interaction. The switch 60 is only a transit station, and all data is only transferred through the switch 60, and all devices connected to the switch 60 (eight-port radio frequency test instrument, server computer, test computer, PLC control system) have a unique IP address, Figure 4 The eight-port radio frequency test instrument has an independent processing unit for each port, which sends the radio frequency data of the corresponding port to the host computer of the corresponding test computer through the network, and the host computer of the test computer controls the radio frequency data capture of the corresponding port processing unit of the eight-port radio frequency test instrument through the network.
[0079] Figure 4 The switch 60 is used for network data interaction within the local area network. The test station is a jig (including a conversion board) for placing the radio frequency module to be tested, which leads out a USB or PCIE interface to connect the test computer, and the radio frequency test port of the test station is connected to the eight-port radio frequency test instrument. The test computer controls the radio frequency module to be tested on the test station to enter the radio frequency test mode through the USB or PCIE interface. Figure 4 The eight-port radio frequency test instrument is used to test the radio frequency index parameters (i.e. radio frequency data) of the corresponding radio frequency module of each port, and the corresponding radio frequency index parameters are displayed on the host computer of the corresponding test computer. If the radio frequency module does not meet the standard requirements, the test computer communicates with the radio frequency module to be tested through the USB / PCIE interface and sends the radio frequency calibration parameters. At the same time, the test computer connects the switch 60 through the network (or network cable) to send the test state of the radio frequency module to the server computer, i.e. the server computer obtains the test state of the radio frequency module on each test station through the network and informs the PLC controller to control the manipulator and suction nozzle to take and place the radio frequency module.
[0080] Next, the test process is described. The mechanical hand places the RF module on the test station, and the host computer sends test instructions to the test station. The RF module on the test station starts testing based on the test instructions. That is, the test computer controls the corresponding RF module to enter the RF test mode, allowing the RF module to transmit a specific RF signal and generate RF data (since this is a test of the RF module's transmission function, the eight-port RF test instrument and the test station are in one-way data interaction). The eight-port RF test instrument captures the RF data generated by the RF module on the corresponding test station through the corresponding test port and sends the RF data to the host computer through the switch 60. The host computer analyzes the RF data to determine whether the RF module's parameters meet the standard requirements (i.e., whether the RF module is qualified). If not, the test computer sends parameter modification instructions (i.e., RF calibration parameters) to the RF module until the RF signal transmitted by the RF module is within the range (i.e., the RF module's adjustment meets the preset conditions).
[0081] The adjustment process (also known as the calibration process) during testing is described. The host computer has a corresponding standard range for RF index parameters (i.e., RF data). The RF module's RF data is calibrated to the preset standard range through calibration. If the RF data does not meet the standard requirements, the difference between the RF data and the standard data range is calculated, and adjustment parameters (higher or lower) are generated based on the difference. The RF module's own parameters are adjusted based on the adjustment parameters (i.e., RF calibration parameters) and then tested again. In this way, after a preset number of calibrations or a preset period of time, if the RF data indicates that the index is still unqualified, the RF module is considered unqualified. Some RF modules can be calibrated, while others have inherent problems, such as poor contact due to poor patching. If the RF module meets the standard requirements after calibration, the test computer writes the last RF calibration parameters to the RF module's eFuse (one-time programmable memory) through a write instruction, and the RF module is considered a qualified product, completing the calibration process.
[0082] Further, the test computer sends the test status of the corresponding test station (test completed or needs to be debugged) to the server computer through the network. When the RF modules on the eight test stations have completed testing, the server computer determines whether to place the RF modules in the first conveyor belt (corresponding to the first area) or the second conveyor belt (corresponding to the second area). The server computer sends placement instructions for the eight RF modules to the PLC control system through the network, and the PLC control system controls the mechanical hand to perform the pick-and-place action of the RF modules. Then, the PLC control system sends the mechanical hand's execution status to the server computer, which controls the start of the next round of testing process (i.e., testing the next batch of multiple RF modules to be tested). Without human intervention, multiple parallel automated testing is achieved, improving testing efficiency.
[0083] The multi-channel parallel automated testing system can simultaneously test and calibrate eight RF modules. After the test is completed, the RF modules that have passed the test are placed on the second conveyor belt (corresponding to the second area) through eight suction nozzles and sent to the automatic winding system. The RF modules with abnormal tests (i.e., unqualified) are placed in the defective product area (i.e., the first area). The classification placement process is explained here. The test computer reports the first test information indicating that the RF module is qualified and the second test information indicating that the RF module is unqualified to the server computer through the switch 60. The server computer sends the action instructions of the suction nozzles on each manipulator to the PLC control system through the switch 60. The suction nozzles on the eight manipulators adsorb the eight RF modules, first pass through the first conveyor belt (i.e., the first area), release the air pressure of the suction nozzles corresponding to the unqualified products, so that they are placed on the first conveyor belt, and then pass through the second conveyor belt, release the air pressure of the suction nozzles corresponding to the qualified products, so that they are placed on the second conveyor belt. Here, passing through the first conveyor belt first and then the second conveyor belt can prevent the unqualified products from being placed on the second conveyor belt due to the loose suction nozzles, thereby improving the accuracy of classification placement.
[0084] Furthermore, the server computer periodically checks whether the IP of the test computer corresponding to the PIN is normal (used to prompt the working status of the corresponding test computer), that is, to detect whether the test computer is down. If a downtime occurs, an alarm message will be issued to remind the staff to restart the test computer and perform other operations to improve the efficiency of automated testing.
[0085] Based on the above Figures 1-4 The present invention provides a test system for a radio frequency module, and an embodiment of the present invention provides a test method for a radio frequency module, such as Figure 5 As shown, Figure 5 : is a flowchart of a test method for a radio frequency module provided in an embodiment of the present application, the test method for the radio frequency module comprising:
[0086] S101: Control multiple radio frequency modules to start radio frequency test mode respectively.
[0087] S102: Generate a plurality of test information corresponding one-to-one to the plurality of RF modules according to the RF data generated by the plurality of RF modules in the RF test mode.
[0088] S103: Generate placement instructions for multiple radio frequency modules based on the multiple test information.
[0089] S104: Classify and place the multiple RF modules according to the placement instructions of the multiple RF modules to complete the testing process of the multiple RF modules.
[0090] In the embodiment of the present application, the plurality of radio frequency modules are controlled to open the radio frequency test mode respectively; and a plurality of test information corresponding to the plurality of radio frequency modules are generated according to the radio frequency data generated by the plurality of radio frequency modules in the radio frequency test mode. By detecting the plurality of radio frequency data respectively, it is determined whether the radio frequency module is qualified according to the radio frequency data, and a plurality of test information corresponding to the plurality of radio frequency modules are generated, thereby improving the efficiency of the detection data. According to the plurality of test information representing whether the radio frequency module is qualified, a placement instruction of the plurality of radio frequency modules is generated; and the plurality of radio frequency modules are classified and placed according to the placement instruction of the plurality of radio frequency modules, so as to complete the test process of the plurality of radio frequency modules, thereby realizing the multi-channel parallel automatic test of the radio frequency module and improving the test efficiency.
[0091] Optionally, the test system of the radio frequency module includes a plurality of host computers, a plurality of test devices and a multi-port radio frequency test instrument, and the plurality of host computers, the plurality of test devices and the multi-port radio frequency test instrument are connected to form a test system. Figure 5 In the embodiment of the present application, the plurality of radio frequency modules are controlled to open the radio frequency test mode respectively; and a plurality of test information corresponding to the plurality of radio frequency modules are generated according to the radio frequency data generated by the plurality of radio frequency modules in the radio frequency test mode. By detecting the plurality of radio frequency data respectively, it is determined whether the radio frequency module is qualified according to the radio frequency data, and a plurality of test information corresponding to the plurality of radio frequency modules are generated, thereby improving the efficiency of the detection data. According to the plurality of test information representing whether the radio frequency module is qualified, a placement instruction of the plurality of radio frequency modules is generated; and the plurality of radio frequency modules are classified and placed according to the placement instruction of the plurality of radio frequency modules, so as to complete the test process of the plurality of radio frequency modules, thereby realizing the multi-channel parallel automatic test of the radio frequency module and improving the test efficiency.
[0092] Optionally, the step of generating the test information corresponding to the first radio frequency module can be implemented in the following manner: in the case that it is determined that the index data of the first radio frequency module meets the standard requirement according to the radio frequency data, the first test information is generated, and the first test information is used to indicate that the first radio frequency module is qualified; in the case that it is determined that the index data of the first radio frequency module does not meet the standard requirement according to the radio frequency data, the radio frequency calibration parameter is determined according to the radio frequency data and the preset standard range, the first radio frequency module is controlled to adjust its own parameters based on the radio frequency calibration parameter, and new radio frequency data is generated; the new radio frequency data is detected through the first test port; it is continuously determined whether the index data of the radio frequency module meets the standard requirement according to the new radio frequency data, until the adjustment of the first radio frequency module meets the preset condition, and the preset condition includes that the index data of the radio frequency module meets the standard requirement, or the adjustment times reaches the preset times, or the adjustment time length reaches the preset time length.
[0093] Optionally, the step of generating the test information corresponding to the first radio frequency module can be implemented in the following manner: in the case that the adjustment times is less than the preset times or the adjustment time length is less than the preset time length, and it is determined that the index data of the first radio frequency module meets the standard requirement, the last radio frequency calibration parameter is written into the first radio frequency module, and the first test information is generated; and the test information includes the first test information.
[0094] Optionally, the step of generating the test information corresponding to the first radio frequency module can also be implemented in the following manner: in a case where the number of adjustments reaches a preset number or the adjustment duration reaches a preset duration, and it is determined that the index data of the first radio frequency module does not meet the standard requirements, generating second test information, the second test information being used to indicate that the first radio frequency module is unqualified; and controlling the radio frequency module to close the radio frequency test mode based on a test interruption instruction; wherein the test information comprises the second test information.
[0095] Optionally, the step of generating the test information corresponding to the first radio frequency module can also be implemented in the following manner: in a case where the number of adjustments reaches a preset number or the adjustment duration reaches a preset duration, and it is determined that the index data of the first radio frequency module does not meet the standard requirements, generating second test information, the second test information being used to indicate that the first radio frequency module is unqualified; and controlling the radio frequency module to close the radio frequency test mode based on a test interruption instruction; wherein the test information comprises the second test information. Figure 5 Optionally, the step of generating the test information corresponding to the first radio frequency module can also be implemented in the following manner: in a case where the number of adjustments reaches a preset number or the adjustment duration reaches a preset duration, and it is determined that the index data of the first radio frequency module does not meet the standard requirements, generating second test information, the second test information being used to indicate that the first radio frequency module is unqualified; and controlling the radio frequency module to close the radio frequency test mode based on a test interruption instruction; wherein the test information comprises the second test information.
[0096] Optionally, the test system of the radio frequency module comprises a plurality of host computers, and the test method of the radio frequency module further comprises: every other preset period, acquiring the addresses of the plurality of host computers, determining the working states of the plurality of host computers based on the addresses of the plurality of host computers, and in a case where the working state of any host computer indicates that the host computer is in an abnormal state, generating an alarm information, the alarm information being used to remind processing of the host computer in the abnormal state.
[0097] Optionally, the test system of the radio frequency module comprises a plurality of host computers, a plurality of test devices and a multi-port radio frequency test instrument, and the test method of the radio frequency module further comprises: based on a test request, generating an opening instruction; based on the opening instruction, taking out the plurality of radio frequency modules and placing the plurality of radio frequency modules one by one on the plurality of test devices, so that the radio frequency modules on each host computer, each test device and each test port of the multi-port radio frequency test instrument are connected to form a test circuit.
[0098] Optionally, the test system of the radio frequency module comprises a plurality of host computers, a plurality of test devices and a multi-port radio frequency test instrument, and the test method of the radio frequency module further comprises: based on a test request, generating an opening instruction; based on the opening instruction, taking out the plurality of radio frequency modules and placing the plurality of radio frequency modules one by one on the plurality of test devices, so that the radio frequency modules on each host computer, each test device and each test port of the multi-port radio frequency test instrument are connected to form a test circuit. Figure 5 Optionally, the test system of the radio frequency module comprises a plurality of host computers, a plurality of test devices and a multi-port radio frequency test instrument, and the test method of the radio frequency module further comprises: based on a test request, generating an opening instruction; based on the opening instruction, taking out the plurality of radio frequency modules and placing the plurality of radio frequency modules one by one on the plurality of test devices, so that the radio frequency modules on each host computer, each test device and each test port of the multi-port radio frequency test instrument are connected to form a test circuit.
[0099] Figure 5 Optionally, the test system of the radio frequency module comprises a plurality of host computers, a plurality of test devices and a multi-port radio frequency test instrument, and the test method of the radio frequency module further comprises: based on a test request, generating an opening instruction; based on the opening instruction, taking out the plurality of radio frequency modules and placing the plurality of radio frequency modules one by one on the plurality of test devices, so that the radio frequency modules on each host computer, each test device and each test port of the multi-port radio frequency test instrument are connected to form a test circuit.
[0100] Optionally, the above Figure 5 S103 and S104 can also be implemented in the following manner: according to the placement instructions of the plurality of radio frequency modules, control is performed on the adsorption operation of each radio frequency module and the movement operation of each radio frequency module; when moving to the first area, the unqualified radio frequency modules are released based on the first placement instructions; when moving to the second area, the qualified radio frequency modules are released based on the second placement instructions.
[0101] The test method of the radio frequency module and the test system of the radio frequency module provided in the above embodiments belong to the same concept, and the specific working process of the method and the technical effects brought by the method in the above embodiments can be referred to the system embodiment part, which will not be described here.
[0102] The embodiments of the present application further provide a computer device, which comprises at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor executes the computer program to implement the steps in any of the above method embodiments.
[0103] The embodiments of the present application further provide a computer readable storage medium, which stores a computer program, wherein the computer program is executable by a processor to implement the steps in any of the above method embodiments.
[0104] The embodiments of the present application provide a computer program product, which, when running on a computer, causes the computer to perform the steps in any of the above method embodiments.
[0105] The integrated unit, if implemented in the form of a software function unit and sold or used as an independent product, can be stored in a computer readable storage medium. Based on such understanding, all or part of the processes in the above method embodiments can be completed by a computer program instructing related hardware, and the computer program can be stored in a computer readable storage medium. The computer program can implement the steps of each method embodiment when executed by a processor. The computer program includes computer program code, which can be in the form of source code, object code, executable files or some intermediate forms. The computer readable medium at least includes any entity or device capable of carrying the computer program code to the photographing device / terminal equipment, recording medium, computer memory, ROM (Read-Only Memory), RAM (Random Access Memory), CD-ROM (Compact Disc Read-Only Memory), magnetic tape, floppy disk and optical data storage equipment, etc. The computer readable storage medium mentioned in the present application can be a non-volatile storage medium, in other words, a non-transitory storage medium.
[0106] It should be understood that all or part of the steps of the above-mentioned embodiments can be realized by software, hardware, firmware or any combination thereof. When realized by software, it can be realized in the form of a computer program product in whole or in part. The computer program product includes one or more computer instructions. The computer instructions can be stored in the above-mentioned computer readable storage medium.
[0107] In the above embodiments, the description of each embodiment has its own focus, and the parts not described or recorded in detail in a certain embodiment can be referred to the relevant description of other embodiments.
[0108] Those skilled in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are executed in hardware or software depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.
[0109] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present application, and should all be included in the scope of protection of the present application.
Claims
1. A test system for radio frequency modules, characterized by, The system comprises a plurality of host computers, a plurality of test devices, a multi-port radio frequency test instrument, a server device and a pick-and-place device; the plurality of host computers, the plurality of test devices and a plurality of test ports of the multi-port radio frequency test instrument are connected one-to-one, an output port of the multi-port radio frequency test instrument and the server device are connected with the plurality of host computers respectively, and the server device is connected with the pick-and-place device; wherein the host computer, the radio frequency module and the test port constitute a test line, thereby forming a plurality of test lines, and the test time of at least two test lines exists intersection; The plurality of host computers are configured to control a plurality of radio frequency modules placed on the plurality of test devices to start a radio frequency test mode respectively; The multi-port radio frequency test instrument is configured to detect radio frequency data generated by the plurality of radio frequency modules in the radio frequency test mode through the plurality of test ports respectively, and send the radio frequency data generated by the plurality of radio frequency modules to the plurality of host computers respectively; The plurality of host computers are further configured to send a plurality of test information corresponding to the plurality of radio frequency modules to the server device according to the radio frequency data generated by the plurality of radio frequency modules, each test information being used to indicate whether the corresponding radio frequency module is qualified; The server device is configured to generate placement instructions of the plurality of radio frequency modules according to the plurality of test information, and send the placement instructions of the plurality of radio frequency modules to the pick-and-place device; The pick-and-place device is configured to classify and place the plurality of radio frequency modules according to the placement instructions of the plurality of radio frequency modules, so as to complete the test process of the plurality of radio frequency modules; The server device is configured to generate a first placement instruction of unqualified radio frequency modules in the plurality of radio frequency modules and / or a second placement instruction of qualified radio frequency modules in the plurality of radio frequency modules according to the plurality of test information, and send the first placement instruction and / or the second placement instruction to the pick-and-place device; The pick-and-place device is configured to place the unqualified radio frequency modules in the plurality of radio frequency modules in a first area according to the first placement instruction, and / or place the qualified radio frequency modules in the plurality of radio frequency modules in a second area according to the second placement instruction; The pick-and-place device comprises a control device, a plurality of mechanical arms and a plurality of adsorption devices; the control device is connected with the plurality of mechanical arms and the plurality of adsorption devices respectively, and the plurality of mechanical arms and the plurality of adsorption devices are connected one-to-one, The control device is configured to control each adsorption device to perform adsorption operation on each radio frequency module and control each mechanical arm to drive each adsorption device to perform movement operation according to the placement instructions of the plurality of radio frequency modules. The adsorption device is configured to release unqualified radio frequency modules based on the first placement instruction when moving to the first area, and release qualified radio frequency modules based on the second placement instruction when moving to the second area, wherein the mechanical arm drives all radio frequency modules to move, only releases unqualified radio frequency modules when moving to the first area, and drives other radio frequency modules to move by other mechanical arms, and releases qualified radio frequency modules when moving to the second area.
2. The system of claim 1, wherein, The first host computer in the plurality of host computers is configured to send a test instruction to a first radio frequency module placed on the first host computer, a first test device in the plurality of test devices, and a first test port in the plurality of test ports when the first radio frequency module and the first test port are connected to form a test circuit. The first radio frequency module is configured to start the radio frequency test mode based on the test instruction and generate radio frequency data. The multi-port radio frequency test instrument is configured to detect the radio frequency data through the first test port and send the radio frequency data to the first host computer. The first host computer is further configured to determine whether the index data of the first radio frequency module meets the standard requirement according to the radio frequency data, and send test information corresponding to the first radio frequency module to the server device.
3. The system of claim 2, wherein, The first host computer is further configured to send first test information to the server device when it is determined that the index data of the first radio frequency module meets the standard requirement according to the radio frequency data, the first test information being used to indicate that the first radio frequency module is qualified. When it is determined that the index data of the first radio frequency module does not meet the standard requirement according to the radio frequency data, radio frequency calibration parameters are determined according to the radio frequency data and a preset standard range, and the radio frequency calibration parameters are sent to the first radio frequency module. The first radio frequency module is further configured to adjust its parameters based on the radio frequency calibration parameters and generate new radio frequency data. The multi-port radio frequency test instrument is further configured to continue to detect the new radio frequency data through the first test port and send the new radio frequency data to the first host computer. The first host computer is further configured to continue to determine whether the index data of the first radio frequency module meets the standard requirement according to the new radio frequency data until the adjustment of the first radio frequency module meets a preset condition, the preset condition including that the index data of the first radio frequency module meets the standard requirement, or the number of adjustments reaches a preset number, or the adjustment time length reaches a preset time length.
4. The system of claim 3, wherein, The first host computer is further configured to write the last radio frequency calibration parameters into the first radio frequency module and send the first test information to the server device when the number of adjustments is less than the preset number or the adjustment time length is less than the preset time length, and it is determined that the index data of the first radio frequency module meets the standard requirement.
5. The system of claim 3, wherein the first host computer is further configured to, in a case where the adjustment number reaches the preset number or the adjustment duration reaches the preset duration and the index data of the first radio frequency module does not meet the standard requirement, send a test interruption instruction to the first radio frequency module and send second test information to the server device, the second test information being used to indicate that the first radio frequency module is unqualified. The first radio frequency module is further configured to close the radio frequency test mode based on the test interruption instruction.
6. The system of any one of claims 1-5, wherein the server device is further configured to, at a preset period, acquire addresses of the plurality of host computers respectively, determine working states of the plurality of host computers based on the addresses of the plurality of host computers respectively, and in a case where the working state of any host computer indicates that the host computer is in an abnormal state, generate an alarm information, the alarm information being used to remind to handle the host computer in the abnormal state. The system further comprises a switch, and the output port of the multi-port radio frequency test instrument and the server device are connected with the plurality of host computers through the switch, and the server device is connected with the pick-and-place device through the switch. The multi-port radio frequency test instrument is configured to detect the radio frequency data through the first test port and send the radio frequency data to the first host computer through the switch.
7. The system of any one of claims 2-5, wherein, The first host computer is configured to determine whether the index data of the first radio frequency module meets the standard requirement according to the radio frequency data and send test information corresponding to the first radio frequency module to the server device through the switch. The server device is configured to send placement instructions of the plurality of radio frequency modules to the pick-and-place device through the switch. The method is applied to the radio frequency module test system of any one of claims 1-7, and the method comprises: controlling a plurality of radio frequency modules to open a radio frequency test mode respectively; 8. A method for testing a radio frequency module, characterized in that: generating a plurality of test information corresponding to the plurality of radio frequency modules according to radio frequency data generated by the plurality of radio frequency modules in the radio frequency test mode; generating placement instructions of the plurality of radio frequency modules according to the plurality of test information; classifying and placing the plurality of radio frequency modules according to the placement instructions of the plurality of radio frequency modules to complete a test process of the plurality of radio frequency modules.
Citation Information
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