Wave correction method, device, equipment and readable storage medium

Abstract

Embodiments of the present application provide a wave correction method, device, equipment and readable storage medium. The method comprises: determining a working offset of the wave; determining a first offset of the wave at a first working temperature; wherein the first working temperature is any one of a plurality of working temperatures corresponding to the wave; in a case where the first offset is greater than the working offset, correcting a center wavelength corresponding to the wave according to the first offset; wherein the center wavelength represents a wavelength corresponding to a center of a wave coverage spectrum range that meets a first preset condition. By determining the first offset of the wave at the first working temperature, and in a case where the first offset is greater than the working offset, the center wavelength corresponding to the wave is corrected, which accurately and efficiently and significantly improves the qualified rate of product indicators.

Description

Technical Field

[0001] This invention relates to the field of optical fiber communication technology, and specifically to a wave correction method, apparatus, device, and readable storage medium. Background Technology

[0002] In optical communication systems, especially in wavelength division multiplexing (WDM) optical networks, filters are core components. Wavelength accuracy is a critical indicator for filters, and variations in wavelength accuracy, i.e., wavelength shifts, can further cause changes in the filter's insertion loss, bandwidth, and crosstalk, thus hindering the normal operation of the communication network. The wavelength of a filter can deviate from its design wavelength due to manufacturing process errors, and temperature changes can also cause wavelength shifts. Therefore, filter wavelength correction is necessary, which can be achieved by temperature control or altering the refractive index using laser radiation.

[0003] The essence of filter wavelength correction is the optimization of filter performance. Filter performance is optimal when the filter's center wavelength is the International Telecommunication Union (ITU) standard wavelength. Therefore, for wavelength correction due to process errors, the target center wavelength is selected from the ITU wavelength. Temperature also causes filter wavelength shifts. When the wavelength shifts significantly between high and low temperatures and room temperature, selecting the ITU wavelength as the target center wavelength for room temperature correction, while achieving optimal room temperature performance, can lead to excessive wavelength shift and unmet performance requirements at both high and low temperatures. This reduces the yield rate and increases costs. Therefore, the target center wavelength for filter correction must be selected based on the filter's wavelength-temperature characteristics to achieve precise correction. However, currently, there is a lack of a guiding method for achieving precise filter wavelength correction.

[0004] There is currently no effective solution to the problems mentioned above. Summary of the Invention

[0005] In view of this, the main objective of the present invention is to provide a wave correction method, apparatus, device, and readable storage medium.

[0006] To achieve the above-mentioned objectives, the technical solution of the present invention is implemented as follows:

[0007] This invention provides a wave correction method, comprising:

[0008] Determine the working offset of the wave;

[0009] Determine a first offset of the wave at a first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave;

[0010] If the first offset is greater than the working offset, the center wavelength corresponding to the wave is corrected according to the first offset; wherein, the center wavelength represents the wavelength corresponding to the center of the wave coverage spectrum range that satisfies the first preset condition.

[0011] In the above-described scheme, determining the working offset of the wave includes:

[0012] Obtain the loss data of the wave;

[0013] Determine whether the loss data meets the requirements of the preset indicators;

[0014] If the loss data meets the requirements of the preset index, the working offset of the wave is determined based on the loss data and the preset index.

[0015] In the above-described scheme, determining the first offset of the wave at the first operating temperature includes:

[0016] Determine the first wavelength of the wave at the first operating temperature;

[0017] Based on the first wavelength at the first operating temperature and the first wavelength at the first preset temperature, the first offset of the wave at the first operating temperature is determined.

[0018] In the above-described scheme, the step of correcting the center wavelength corresponding to the wave based on the first offset when the first offset is greater than the working offset includes:

[0019] The correction parameters are determined based on the first offset;

[0020] The center wavelength is corrected based on the correction parameters.

[0021] In the above-described scheme, the method further includes:

[0022] The operating wavelength of the wave is determined based on the operating offset.

[0023] In the above-described scheme, the method further includes:

[0024] The accuracy data of the wave is determined based on the center wavelength;

[0025] If the accuracy data does not meet the requirements of the preset accuracy index, the center wavelength corresponding to the wave is corrected according to the first offset.

[0026] This invention also provides a wave correction device, the device comprising: an interaction module, a control module, a storage module, and a first correction module; the control module is connected to the interaction module, the storage module, and the first correction module respectively.

[0027] The interaction module is used to input correction commands and send the correction commands to the control module;

[0028] The control module is used to receive the correction instruction, retrieve the correction task corresponding to the correction instruction from the storage module, and assign the correction task to the first correction module;

[0029] The first correction module is configured to receive the correction task, determine the corrected center wavelength based on the correction task, correct the center wavelength of the wave based on the corrected center wavelength to obtain a correction result, and store the correction result in the storage module.

[0030] The storage module is used to store the correction task corresponding to the correction instruction, and to store the correction result.

[0031] In the above-described scheme, the device further includes:

[0032] The control module is also used to send the correction results stored in the storage module to the interaction module;

[0033] The interaction module is also used to receive and display the correction results sent by the control module.

[0034] In the above-described scheme, the first correction module includes: a laser emitting unit, a polarization control unit, a beam splitting unit, a filter under test, a power monitoring unit, and a correction unit;

[0035] The laser emitting unit is used to emit laser light with a specific wavelength;

[0036] The polarization control unit is used to control the laser traversal polarization state;

[0037] The beam splitting unit is used to split the laser beam into multiple paths;

[0038] The filter under test is used to transmit the laser;

[0039] The power monitoring unit is used to monitor the optical power of the laser;

[0040] The correction unit is used to correct the center wavelength of the filter based on the wavelength-transmittance data corresponding to the optical power and the corrected center wavelength.

[0041] This invention also provides a wave correction device, comprising:

[0042] The first determining module is used to determine the working offset of the wave;

[0043] The second determining module is used to determine the first offset of the wave at the first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave;

[0044] The second correction module is used to correct the center wavelength of the wave according to the first offset when the first offset is greater than the working offset; wherein the center wavelength represents the wavelength corresponding to the center of the wave coverage spectrum range that satisfies the first preset condition.

[0045] This invention also provides a wave correction device, including a memory and a processor. The memory stores a computer program that can run on the processor, and the processor executes the program to implement the steps in the method described above.

[0046] This invention also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the method described above.

[0047] This invention provides a wave correction method, apparatus, device, and readable storage medium. The method includes: determining a working offset of the wave; determining a first offset of the wave at a first working temperature; wherein the first working temperature is any one of a plurality of working temperatures corresponding to the wave; and correcting the center wavelength of the wave according to the first offset when the first offset is greater than the working offset; wherein the center wavelength represents the wavelength corresponding to the center of the spectral range covered by the wave that satisfies a first preset condition. By determining the first offset of the wave at the first working temperature and correcting the center wavelength of the wave when the first offset is greater than the working offset, the method accurately, efficiently, and significantly improves the pass rate of product indicators. Attached Figure Description

[0048] Figure 1 This is a schematic diagram illustrating the implementation process of the wave correction method according to an embodiment of the present invention;

[0049] Figure 2 This is a schematic diagram of the wavelength-transmittance spectrum curve of the filter used in the wave correction method of this invention.

[0050] Figure 3 This is a schematic diagram illustrating the definition of the center wavelength and wavelength accuracy in the wave correction method of this invention.

[0051] Figure 4 This is a schematic diagram illustrating the insertion loss definition of the wave correction method according to an embodiment of the present invention;

[0052] Figure 5 This is a schematic diagram illustrating the bandwidth definition of the wave correction method according to an embodiment of the present invention;

[0053] Figure 6 This is a schematic diagram illustrating the crosstalk definition in the wave correction method of this invention embodiment;

[0054] Figure 7 The wavelength-temperature characteristic curve of the filter in the wave correction method of this invention is shown in the figure.

[0055] Figure 8 The wavelength-temperature characteristic curve after correction by the wave correction method of the present invention is shown in the figure.

[0056] Figure 9 This is a schematic diagram of the composition of the wave correction device according to an embodiment of the present invention;

[0057] Figure 10 This is a schematic diagram of the composition of the wave correction device according to an embodiment of the present invention;

[0058] Figure 11 This is a schematic diagram of the hardware structure of a wave correction device according to an embodiment of the present invention. Detailed Implementation

[0059] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the specific technical solutions of the invention will be further described in detail below with reference to the accompanying drawings of the embodiments of the present invention. The following embodiments are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0060] In related technologies, the performance of filters is significantly affected by manufacturing processes and temperature. Process errors can cause a discrepancy between the actual and designed wavelengths of the filter, necessitating wavelength correction. The target center wavelength for this correction is typically chosen as the ITU standard wavelength. However, when the wavelength shifts excessively from room temperature at high or low temperatures, selecting the ITU wavelength for room temperature correction, while achieving optimal performance at room temperature, can lead to excessive wavelength deviation and failure to meet high and low temperature performance requirements. This reduces the yield rate and increases costs. Therefore, to improve the yield rate and reduce costs, the filter wavelength needs to be precisely corrected by considering wavelength-temperature characteristics.

[0061] This embodiment proposes a wave correction method, which is applied to a wave correction device. The function implemented by this method can be achieved by the processor in the wave correction device calling program code. Of course, the program code can be stored in a computer storage medium. It can be seen that the computing device includes at least a processor and a storage medium.

[0062] Figure 1 This is a schematic diagram illustrating the implementation process of the wave correction method according to an embodiment of the present invention, as shown below. Figure 1 As shown, the method includes:

[0063] Step 101: Determine the working offset of the wave;

[0064] Step 102: Determine the first offset of the wave at the first operating temperature; wherein, the first operating temperature is any one of the multiple operating temperatures corresponding to the wave;

[0065] Step 103: When the first offset is greater than the working offset, the center wavelength corresponding to the wave is corrected according to the first offset; wherein, the center wavelength represents the wavelength corresponding to the center of the wave coverage spectrum range that satisfies the first preset condition.

[0066] In step 101: the wave correction process can be determined according to the actual situation and is not limited here. As an example, the wave correction method can be a method for accurately correcting the wavelength of a filter.

[0067] The determination of the wave's operating offset can be based on the wave's loss data. The loss data can be defined parameters of the wave at multiple temperatures. The loss data is related to these multiple temperatures. Specifically, the loss data can be any of the following: accuracy data, insertion loss data, bandwidth data, and crosstalk data. The loss data can also be passband flatness data, polarization-related loss data, and other parameter data; the wave offset calculation method is the same for all of these.

[0068] In step 102: The first operating temperature can be determined according to actual conditions and is not limited here. As an example, the first operating temperature can be any temperature among multiple temperatures. Determining the first offset of the wave at the first operating temperature can be based on the first wavelength of the wave at the first operating temperature.

[0069] In step 103: When the first offset is greater than the working offset, the center wavelength corresponding to the wave is corrected according to the first offset. This can be done when the first offset at any of the plurality of working temperatures is greater than the working offset, the center wavelength corresponding to the wave is corrected according to the first offset.

[0070] The first preset condition can be determined according to the actual situation and is not limited here. As an example, the first preset condition can be a decrease in peak insertion loss in dB. The center wavelength represents the wavelength corresponding to the center of the wave coverage spectral range that satisfies the first preset condition. The center wavelength can be the wavelength corresponding to the center of the wave coverage spectral range where the peak insertion loss decreases by dB. As an example, the first preset condition can be a decrease in peak insertion loss of 3 dB.

[0071] This invention provides a wave correction method, which involves determining the working offset of the wave; determining a first offset of the wave at a first working temperature; wherein the first working temperature is any one of a plurality of working temperatures corresponding to the wave; and correcting the center wavelength of the wave based on the first offset when the first offset is greater than the working offset. The center wavelength represents the wavelength corresponding to the center of the spectral range covered by the wave that satisfies a first preset condition. By determining the first offset of the wave at the first working temperature and correcting the center wavelength of the wave when the first offset is greater than the working offset, this method accurately and efficiently improves the pass rate of product indicators.

[0072] In an optional embodiment of the present invention, determining the working offset of the wave includes:

[0073] Obtain the loss data of the wave;

[0074] Determine whether the loss data meets the requirements of the preset indicators;

[0075] If the loss data meets the requirements of the preset index, the working offset of the wave is determined based on the loss data and the preset index.

[0076] In this embodiment, determining the operating offset of the wave may include: acquiring loss data of the wave at a first temperature; determining whether the loss data meets the requirements of a preset indicator; and, if the loss data meets the requirements of the preset indicator, determining the operating offset of the wave at the first temperature based on the loss data and the preset indicator. The first temperature can be determined according to actual conditions and is not limited here. As an example, the first temperature can be any temperature among multiple temperatures. The loss data can be data representing a defined indicator of the wave at the first temperature. The loss data is related to the first temperature.

[0077] As an example, the preset index may include a precision index; the working offset of the wave at the first temperature is determined based on the precision index. The working offset may be a precision offset, and the precision offset may be a precision offset range.

[0078] The accuracy index can be determined based on the actual situation and is not limited here. As an example, the accuracy index can be the wavelength accuracy requirement.

[0079] As an example, the loss data includes insertion loss data of the wave; the preset index includes an insertion loss index; based on the insertion loss data, a second wavelength data of the wave at the first temperature is determined; based on the insertion loss index, a third wavelength data of the wave at the first temperature is determined; if the insertion loss data meets the requirements of the insertion loss index, based on the second wavelength data and the third wavelength data, the operating offset of the wave at the first temperature is determined. Wherein, the operating offset can be an insertion loss offset, and the insertion loss offset can be an insertion loss offset range.

[0080] The insertion loss data can be determined based on actual conditions. It can be the maximum insertion loss within the effective bandwidth of the channel, the peak insertion loss, or the center wavelength insertion loss; no limitation is made here. The calculation method for the wave operating offset is the same. As an example, the insertion loss data can be the maximum insertion loss within the effective bandwidth of the channel.

[0081] The determination of the second wavelength data of the wave at the first temperature based on the insertion loss data can be achieved by determining the second wavelength data of the wave at the first temperature based on the maximum insertion loss within the effective bandwidth of the channel and the wavelength-transmittance data of the wave at room temperature.

[0082] The insertion loss index can be determined according to the actual situation and is not limited here. The insertion loss index can be the insertion loss index requirement within the effective bandwidth.

[0083] The determination of the third wavelength data of the wave at the first temperature based on the insertion loss index can be achieved by determining the third wavelength data of the wave at the first temperature based on the insertion loss index requirement within the effective bandwidth and the wavelength-transmittance data of the wave at room temperature.

[0084] When the insertion loss data meets the requirements of the insertion loss index, the working offset of the wave at the first temperature is determined based on the second wavelength data and the third wavelength data. This can be achieved by subtracting the third wavelength data from the second wavelength data to obtain the working offset of the wave at the first temperature, provided that the maximum insertion loss within the effective bandwidth of the channel is less than the insertion loss index requirement within the effective bandwidth.

[0085] As an example, the loss data includes the bandwidth data of the wave, which includes first bandwidth data and second bandwidth data; the preset index includes a bandwidth index; a fourth wavelength data of the wave at the first temperature is determined; the first bandwidth data and the second bandwidth data are determined based on the fourth wavelength data; if the first bandwidth data and the second bandwidth data meet the requirements of the bandwidth index, the operating offset of the wave at the first temperature is determined based on the bandwidth index. The operating offset can be a bandwidth offset, and the bandwidth offset can be a bandwidth offset range.

[0086] The fourth wavelength data can be determined based on actual conditions and is not limited here. As an example, the fourth wavelength data can be the first wavelength value and the second wavelength value corresponding to the spectral range covered by the peak insertion loss decrease ndB. As an example, the first wavelength value can characterize the short wavelength value corresponding to the peak insertion loss decrease ndB; the second wavelength value can characterize the long wavelength value corresponding to the peak insertion loss decrease ndB, and vice versa.

[0087] The bandwidth metric can be determined based on actual conditions and is not limited here. As an example, the bandwidth metric can be a requirement based on the ndB net bandwidth.

[0088] The first bandwidth data can be determined based on actual conditions and is not limited here. As an example, the first bandwidth data can be the full bandwidth data. The second bandwidth data can be determined based on actual conditions and is not limited here. As an example, the second bandwidth data can be the net bandwidth data.

[0089] The determination of the first bandwidth data and the second bandwidth data based on the fourth wavelength data can be performed as follows: determining the first bandwidth value based on the first wavelength value; determining the second bandwidth value based on the second wavelength value; summing the first bandwidth value and the second bandwidth value to obtain the first bandwidth data; and accumulating the smaller wavelength value between the first wavelength value and the second wavelength value twice to obtain the second bandwidth data.

[0090] If the first bandwidth data and the second bandwidth data meet the bandwidth index requirements, the working offset of the wave at the first temperature can be determined based on the bandwidth index if the first bandwidth data and the second bandwidth data are greater than the index requirements based on the ndB net bandwidth. The working offset of the wave at the first temperature can be determined based on the bandwidth index, the fourth wavelength data, and the center wavelength.

[0091] As an example, the loss data includes crosstalk data of the wave; the preset index includes a crosstalk index; if the crosstalk data meets the requirements of the crosstalk index, the operating offset of the wave at the first temperature is determined based on the crosstalk data and the crosstalk index. The operating offset can be a crosstalk offset, and the crosstalk offset can be a crosstalk offset range.

[0092] When the crosstalk data meets the requirements of the crosstalk index, the working offset of the wave at the first temperature can be determined based on the crosstalk data and the crosstalk index. Alternatively, when the crosstalk data exceeds the requirements of the crosstalk index, the working offset of the wave at the first temperature can be determined based on the crosstalk data and the crosstalk index.

[0093] The crosstalk data can be determined based on actual conditions and is not limited here. As an example, the crosstalk data can be adjacent crosstalk data, non-adjacent crosstalk data, or total crosstalk data. The crosstalk index can be determined based on actual conditions and is not limited here. As an example, the crosstalk index can be an adjacent crosstalk requirement index, a non-adjacent crosstalk requirement index, or a total crosstalk requirement index. The working offset can be an adjacent crosstalk offset, a non-adjacent crosstalk offset, or a total crosstalk offset. The adjacent crosstalk offset can be an adjacent crosstalk offset range, the non-adjacent crosstalk offset can be a non-adjacent crosstalk offset range, and the total crosstalk offset can be a total crosstalk offset range.

[0094] As an example, a first loss data point is obtained from a plurality of loss data points of the wave at a first temperature; wherein the first loss data point is any one of the plurality of loss data points; a target offset of the wave at the first temperature is determined based on the first loss data point and a first preset index among a plurality of preset indices; wherein the first preset index characterizes an index corresponding to the first loss data point; and a working offset of the wave at the first temperature is determined based on the target offset and a second loss data point among the plurality of loss data points; wherein the second loss data characterizes any one of the plurality of loss data points other than the first loss data point.

[0095] The first loss data can be determined based on actual conditions and may be any one of accuracy data, insertion loss data, bandwidth data, and crosstalk data; no limitation is imposed here. The first preset index can be determined based on actual conditions and is not limited here. As an example, the first preset index may be any one of accuracy index, insertion loss index, bandwidth index, and crosstalk index. As an example, the first loss data may be accuracy data, and the first preset index may be an accuracy index.

[0096] The determination of the target offset of the wave at the first temperature based on the first loss data and the first preset index among the multiple preset indicators can be, on the other hand, the determination of the accuracy offset of the wave at the first temperature based on the accuracy data and the accuracy index.

[0097] The determination of the wave's operating offset at the first temperature based on the precision offset and the second loss data among the plurality of loss data can be achieved by iterating through the precision offset and the second loss data among the plurality of loss data to determine the wave's operating offset at the first temperature.

[0098] The second loss data can be determined based on actual conditions and can be any of the following: insertion loss data, bandwidth data, and crosstalk data, excluding the first loss data which is precision data. No limitation is imposed here. As an example, the second preset indicator can be any of the following: insertion loss indicator, bandwidth indicator, and crosstalk indicator. As an example, the second loss data can be insertion loss data, and the second preset indicator can be the insertion loss indicator.

[0099] The step of determining the operating offset of the wave at the first temperature based on the precision offset and the second loss data among the plurality of loss data can be as follows: determining whether the insertion loss data meets the precision offset; if the insertion loss data meets the precision offset, determining whether the bandwidth data meets the precision offset; if the bandwidth data meets the precision offset, determining whether the crosstalk data meets the precision offset; and if the crosstalk data meets the precision offset, determining the operating offset of the wave at the first temperature.

[0100] For ease of understanding, assume a 48-channel, 100GHz channel-spaced filter (wavelength division multiplexer) with starting frequencies of 196100GHz and 191400GHz, and select one of the ITU wavelengths as = 1529.553nm (f ITU =196000GHz) channel. Figure 2 This is a schematic diagram of the wavelength-transmittance spectrum curve of the filter in the wave correction method of this invention, wherein... Figure 2 The ordinate represents transmittance. Figure 2 The horizontal axis represents wavelength. In related technologies, insertion loss and transmittance have an inverse relationship. The wavelength-transmittance data of the channel at room temperature (25°C) are as follows: Figure 2As shown. Due to fluctuations in chip manufacturing processes, the filter wavelength shifts. Assuming the filter's wavelength accuracy requirement is [-40, 40] pm, the insertion loss requirement is within 6 dB within an effective bandwidth of ±12.5 GHz, the net bandwidth requirement of 3 dB based on peak insertion loss is above 120 GHz, the adjacent crosstalk requirement is above 4 dB, the non-adjacent crosstalk requirement is above 30 dB, and the total crosstalk requirement is above 3 dB.

[0101] Figure 3 This is a schematic diagram illustrating the definition of the center wavelength and wavelength accuracy in the wave correction method of this invention, as shown below. Figure 3 As shown, based on the wavelength-transmittance data of this channel at room temperature (25℃), the center wavelength λ corresponding to the center of the spectral range covered by the 3dB peak insertion loss reduction is determined. c The wavelength is 1529.426 nm. The accuracy data of the wave is calculated as shown in formula (1):

[0102] Δλ=λ c -λ ITU (1)

[0103] In equation (1), Δλ represents the wave precision data. Based on the above equation (1), the wave precision data Δλ is determined to be -127 pm. Based on the wavelength precision requirement Δλ... WA The accuracy data of the wave is determined to be [-40, 40] pm, which does not meet the wavelength accuracy requirement. According to the wavelength accuracy requirement of [-40, 40] pm, WA = 40 pm, where WA represents the wavelength accuracy value. Therefore, the accuracy offset range based on the accuracy data of the wave is [-40, 40] pm.

[0104] Figure 4 This is a schematic diagram illustrating the insertion loss definition of the wave correction method according to an embodiment of the present invention, as shown below. Figure 4 As shown, it can be assumed that the insertion loss data is the maximum insertion loss within the effective bandwidth of the channel. It is particularly important to note that temperature-dependent wavelength offset does not affect the peak insertion loss, but temperature-dependent loss does. The insertion loss offset based on the wave's insertion loss data can be calculated using either the center wavelength or the ITU wavelength. In this embodiment, the center wavelength is used, i.e., the center wavelength is taken as the ITU wavelength, to calculate the insertion loss offset of the wave that meets the requirement of insertion loss within 6dB. Based on the wavelength-transmittance data, the insertion loss offset at a normal temperature of 25℃ is calculated using λ... c =1529.426nm is the minimum wavelength λ within the effective bandwidth of the ITU wavelength range. min With the maximum value λ max The calculations are shown in formulas (2) and (3) respectively:

[0105]

[0106]

[0107] In equations (2) and (3), c represents the speed of light constant, and c = 299792458 m / s, Δf passband This represents the effective bandwidth of the channel. In this embodiment, Δf... passband Substituting 25GHz into the equation, where Δf passband / 2 corresponds to 12.5GHz, -Δf passband / 2 corresponds to -12.5GHz.

[0108] Based on formulas (2) and (3) above, the second wavelength data is calculated based on the insertion loss data, that is, the wavelength data with λ is calculated. c =1529.426nm is the effective bandwidth of the ITU wavelength [1529.328, 1529.524]nm. Based on the insertion loss requirement of less than 6dB, and combined with the wavelength-transmittance data at room temperature (25℃), from 1529.328nm towards shorter wavelengths, the wavelength corresponding to 6dB insertion loss is 1529.054nm; from 1529.524nm towards longer wavelengths, the wavelength corresponding to 6dB insertion loss is 1529.807nm. The third wavelength data is calculated, that is, the bandwidth range corresponding to the insertion loss index is [1529.054, 1529.807]nm.

[0109] At this point, based on the second wavelength data and the third wavelength data, the wave offset from 1529.328 nm towards the shorter wavelength direction is calculated to be Δλ. IL- =1529.328-1529.054=0.274nm=274pm; The wave deflection from 1529.524nm towards the longer wavelength direction is Δλ. IL+ =1529.807-1529.524=0.283nm=283pm. In summary, the insertion loss offset range for waves requiring an insertion loss of less than 6dB is [-274,283]pm.

[0110] Figure 5 This is a schematic diagram illustrating the bandwidth definition of the wave correction method according to an embodiment of the present invention, as shown below. Figure 5 As shown, assuming the ndB bandwidth is defined as the spectral width covered by the peak insertion loss reduction ndB, the full bandwidth = BW1 + BW2, and the net bandwidth = 2 × min(BW1, BW2). Under this bandwidth definition, the full bandwidth specification is not affected by wavelength shift. The specification requirement based on the ndB net bandwidth is BW1 + BW2. net GHz, the maximum wavelength shift λ towards the shortwave direction nBW- The maximum wavelength shift λ towards the longer wavelength direction nBW+ The calculations are shown in formulas (4) and (5) respectively:

[0111]

[0112]

[0113] In equations (4) and (5), c represents the speed of light constant, and c = 299792458 m / s, λ n- λ represents the short-wavelength value corresponding to the decrease in peak insertion loss (ndB) at room temperature (25℃). n+ This represents the long wavelength value corresponding to the peak insertion loss decrease in dB at a normal temperature of 25℃. This calculation and analysis approach also applies to the definition of dB bandwidth based on ITU wavelength insertion loss decrease in dB, etc. The calculation approach for wave bandwidth offset is the same. The key to calculating bandwidth offset based on wave bandwidth data is calculating the bandwidth offset of waves that meet the bandwidth requirements based on the center wavelength; that is, using the center wavelength as the ITU wavelength, calculating the bandwidth offset of waves that meet the requirement of a net bandwidth of 120GHz or higher with a 3dB bandwidth. Based on wavelength-transmittance data, the short wavelength and long wavelength values ​​corresponding to a 3dB peak insertion loss decrease at a normal temperature of 25℃ are calculated as λ. 3- =1528.925nm and λ 3+ =1529.927nm. The calculation of the first bandwidth value BW1 and the second bandwidth value BW2 are shown in formulas (6) and (7), respectively:

[0114] BW1=c / λ 3- -f ITU =c / 1528.925-196000=64.23GHz (6)

[0115] BW2 = f ITU -c / λ 3+ =196000-c / 1529.927=64.19GHz (7)

[0116] At this time, BW1 = 64.23 GHz and BW2 = 64.19 GHz. Based on this, the net bandwidth data and the full bandwidth data are 128.38 GHz and 128.42 GHz, respectively. Based on the requirement that the 3dB net bandwidth index is above 120 GHz, and combined with the wavelength-transmittance data under normal temperature of 25℃, if there is a shift towards the shortwave direction, the calculation of the maximum wavelength shift is as shown in formula (8):

[0117]

[0118] Based on the requirement of a 3dB net bandwidth of over 120GHz, and combined with the wavelength-transmittance data at a normal temperature of 25℃, the calculation of the maximum wavelength shift if shifting towards longer wavelengths is shown in formula (9):

[0119] In summary, the bandwidth offset range for a wave with an insertion loss of 3dB and a bandwidth requirement within 120GHz is [-32, 33]pm.

[0120] Figure 6 This is a schematic diagram illustrating the crosstalk definition in the wave correction method of this invention. It can be assumed that adjacent crosstalk (AX) is defined as the difference between the maximum insertion loss within the effective bandwidth of the channel and the minimum insertion loss of adjacent channels within their corresponding effective bandwidths. Figure 6 As shown, adjacent crosstalk is usually taken as the minimum of the left and right adjacent crosstalk. Based on wavelength-transmittance data, the adjacent crosstalk at room temperature (25℃) is calculated to be 8.63dB. Given the requirement of adjacent crosstalk being above 4dB, and considering the wavelength-transmittance data at room temperature (25℃), if the wavelength shifts towards shorter wavelengths, the maximum value of the insertion loss within the effective bandwidth of the channel and the minimum value of the insertion loss of the adjacent channel within the corresponding effective bandwidth will both change, and the corresponding difference will also change. As the wavelength shifts towards shorter wavelengths, when the adjacent crosstalk first falls below 4dB, the adjacent crosstalk offset for the shorter wavelength shift is calculated. Similarly, the adjacent crosstalk offset for the longer wavelength shift can be calculated, thus determining the acceptable range of adjacent crosstalk offset.

[0121] Assume that non-adjacent crosstalk (NX) is defined as the difference between the maximum insertion loss within the effective bandwidth of a channel and the minimum insertion loss of non-adjacent channels within their respective effective bandwidths. Figure 6 As shown, non-adjacent crosstalk is typically taken as the minimum value among all non-adjacent crosstalk values. Based on wavelength-transmittance data, the non-adjacent crosstalk at room temperature (25℃) is calculated to be 38.33 dB. Given that the non-adjacent crosstalk requirement is above 30 dB, and considering the wavelength-transmittance data at room temperature (25℃), if shifting towards shorter wavelengths, the non-adjacent crosstalk offset amount for the first time below 30 dB can be calculated for shorter wavelengths. Similarly, the non-adjacent crosstalk offset amount for longer wavelengths can be calculated, thus determining the acceptable offset range for non-adjacent crosstalk.

[0122] Assuming that total crosstalk (TX) is defined as the sum of all adjacent crosstalk and non-adjacent crosstalk, the calculation of total crosstalk for channel j is shown in formula (10):

[0123]

[0124] In equation (10), 1 ≤ j ≤ N, 1 ≤ i ≤ N, N represents the total number of channels, and i, j, and N are all positive integers. AX j,i This represents the adjacent crosstalk of channel j to channel i, where AX j,j-1 Indicates left adjacent crosstalk, AX j,j+1 Indicates right adjacent crosstalk, NX j,iThis represents the non-adjacent crosstalk between channel j and channel i, i.e., i≠j, j±1. Based on wavelength-transmittance data, the total crosstalk index at room temperature (25℃) is calculated to be 5.7dB. Given the requirement of a total crosstalk of at least 3dB, and considering the wavelength-transmittance data at 25℃, if the total crosstalk first falls below 3dB when shifting towards shorter wavelengths, the total crosstalk offset for the short-wavelength shift can be calculated. Similarly, the total crosstalk offset for the long-wavelength shift can be calculated, thus determining the acceptable range of total crosstalk offset.

[0125] The wave precision offset calculated based on the wave precision data can be substituted into the calculation to determine whether the insertion loss data meets the requirements. If it does, the wave precision offset calculated based on the wave precision data is the working offset of the wave based on the wave precision data and the insertion loss data. Otherwise, the range is narrowed based on the wave precision offset calculated based on the wave precision data to calculate the insertion loss offset corresponding to the insertion loss data. Using this method, the insertion loss offset is substituted into the bandwidth data and crosstalk data to finally calculate the working offset [-Δλ] that meets the requirements for wavelength precision, insertion loss, bandwidth, and crosstalk. - ,Δλ + ].

[0126] Alternatively, based on the required precision offset, insertion loss offset, bandwidth offset, and crosstalk offset of the wave's precision data, insertion loss data, bandwidth data, and crosstalk data, the intersection of these offsets can be used to obtain the working offset [-Δλ]. - ,Δλ + ].

[0127] In an optional embodiment of the present invention, determining the first offset of the wave at the first operating temperature includes:

[0128] Determine the first wavelength of the wave at the first operating temperature;

[0129] Based on the first wavelength at the first operating temperature and the first wavelength at the first preset temperature, the first offset of the wave at the first operating temperature is determined.

[0130] In this embodiment, the process of determining the first wavelength of the wave at the first operating temperature can be determined according to actual conditions and is not limited here. As an example, the first wavelength of the wave at the first operating temperature is determined based on the wavelength-temperature characteristics of the filter.

[0131] The process of determining the first offset of the wave at the first operating temperature based on the first wavelength at the first operating temperature and the first wavelength at the first preset temperature can be determined according to actual conditions and is not limited here. As an example, the first offset of the wave at the first operating temperature can be determined by subtracting the first wavelength at the first operating temperature and the first wavelength at the first preset temperature. Here, the first preset temperature can be room temperature from among multiple temperatures, and the first wavelength at the first preset temperature can be the first wavelength of the wave at room temperature.

[0132] For ease of understanding, Figure 7 The wavelength-temperature characteristic curve of the filter in the wave correction method of this invention is shown in the figure. Figure 7 As shown, based on the operating wavelength of the wave [1529.521, 1529.586] nm, the required operating temperature range is [-5, 65] °C. Combining the wavelength-temperature characteristic curve, it is determined that the first wavelength of the wave at room temperature is the smallest. Compared to room temperature, the first wavelength values ​​at -5 °C and 65 °C are both greater than the first wavelength value at room temperature. The first wavelength of the wave at -5 °C is determined, and therefore, it is determined that the wave shifts to a longer wavelength of 30 pm at -5 °C. Similarly, the first wavelength of the wave at 65 °C is determined, and therefore, it is determined that the wave shifts to a longer wavelength of 36 pm at 65 °C.

[0133] In an optional embodiment of the present invention, the step of correcting the center wavelength corresponding to the wave according to the first offset when the first offset is greater than the working offset includes:

[0134] The correction parameters are determined based on the first offset;

[0135] The center wavelength is corrected based on the correction parameters.

[0136] In this embodiment, the process of determining the correction parameter based on the first offset can be determined according to the actual situation and is not limited here. As an example, half of the first offset is used as the correction parameter.

[0137] The process of correcting the center wavelength based on the correction parameter can be determined according to the actual situation and is not limited here. As an example, the difference between the ITU wavelength and the correction parameter is calculated to obtain the corrected center wavelength; the center wavelength is then corrected based on the corrected center wavelength.

[0138] For ease of understanding, it is determined that the wave is shifted 36 pm towards longer wavelengths at 65°C. If the ITU wavelength is selected as the target center wavelength for correction, the net bandwidth requirement at 65°C will not be met. Therefore, the target center wavelength for correction should be shifted towards a wavelength smaller than the ITU wavelength. The key is to ensure that the high, normal, and low temperature wavelength values ​​of the corrected filter are in the middle of the working wavelength range. Half of the 36 pm shift of the wave at 65°C is taken as the correction parameter, which is 18 pm. The difference between the ITU wavelength and the correction parameter is then calculated. Figure 8 The wavelength-temperature characteristic curve after correction by the wave correction method of this invention is shown in the figure. Figure 8 As shown, the wavelength value corresponding to room temperature at this time is calculated as 1529.553 - 0.018 = 1529.535nm, and the corrected center wavelength is obtained as 1529.535nm.

[0139] In an optional embodiment of the present invention, the method further includes:

[0140] The operating wavelength of the wave is determined based on the operating offset.

[0141] In this embodiment, determining the working wavelength of the wave based on the working offset can be achieved by calculating the working offset and the ITU wavelength based on a preset calculation formula.

[0142] The preset calculation formula can be determined according to the actual situation and is not limited here. As an example, the preset calculation formula can be to sum the ITU wavelength and the working offset to obtain the working wavelength range, and use the working wavelength range as the working wavelength of the wave.

[0143] For ease of understanding, based on the wave's working offset [-32, 33]pm, the λ ITU It is 1529.553 nm, combined with the calculation formula [λ ITU -Δλ - ,λ ITU +Δλ + The working wavelength [1529.521, 1529.586] nm is calculated. If the first wavelength of the wave at the first working temperature is greater than the working wavelength, the center wavelength corresponding to the wave is corrected according to the first offset.

[0144] In an optional embodiment of the present invention, the method further includes:

[0145] The accuracy data of the wave is determined based on the center wavelength;

[0146] If the accuracy data does not meet the requirements of the preset accuracy index, the center wavelength corresponding to the wave is corrected according to the first offset.

[0147] In this embodiment, the preset accuracy index can be determined according to the actual situation and is not limited here. As an example, the preset accuracy index can be a wavelength accuracy requirement.

[0148] The accuracy data for determining the wave based on the center wavelength can be: determining the center wavelength of the wave at the first operating temperature; or processing the center wavelength based on a preset method to determine the accuracy data of the wave at the first operating temperature.

[0149] The process of processing the center wavelength based on a preset method to determine the accuracy data of the wave at the first operating temperature can be as follows: a preset wavelength data is determined according to a preset criterion; the preset wavelength data and the center wavelength are processed based on the preset method to determine the accuracy data of the wave at the first operating temperature.

[0150] The determination of the preset wavelength data based on preset criteria can be determined according to actual conditions and is not limited here. As an example, one ITU wavelength can be selected according to the ITU standard. Based on the preset method, the preset wavelength data and the center wavelength are processed to determine the accuracy data of the wave at the first operating temperature. This can be achieved by subtracting the center wavelength from the preset wavelength data to determine the accuracy data of the wave at the first operating temperature.

[0151] For ease of understanding, based on the wavelength-transmittance data of this channel at room temperature (25℃), the center wavelength λ corresponding to the center of the spectral range covered by the 3dB peak insertion loss reduction is determined. c The wavelength is 1529.426 nm. Based on formula (1) above, the wave accuracy data Δλ is determined to be -127 pm. Based on the wavelength accuracy requirement Δλ... WA [-40,40]pm, determine that the wave's accuracy data does not meet the wavelength accuracy requirements, and correct the center wavelength corresponding to the wave according to the first offset.

[0152] This invention, based on wavelength-transmittance data and considering specific wave accuracy, insertion loss, bandwidth, and crosstalk requirements, calculates the operating offset of the filter wave. Then, combining wavelength-temperature characteristics, it calculates the corrected target center wavelength. The correction method provided by this invention is accurate, efficient, and can significantly improve the pass rate.

[0153] Based on the method described above, embodiments of the present invention also provide a wave correction device, wherein the wave correction device can be a precise correction filter wavelength device. Figure 9This is a schematic diagram of the composition of the wave correction device according to an embodiment of the present invention, as shown below. Figure 9 As shown, the device 900 includes: an interaction module 901, a control module 902, a storage module 903, and a first correction module 904; the control module 902 is connected to the interaction module 901, the storage module 903, and the first correction module 904 respectively.

[0154] The interaction module 901 is used to input correction instructions and send the correction instructions to the control module 902;

[0155] The control module 902 is used to receive the correction instruction, retrieve the correction task corresponding to the correction instruction from the storage module 903, and assign the correction task to the first correction module 904.

[0156] The first correction module 904 is configured to receive the correction task, determine the corrected center wavelength based on the correction task, correct the center wavelength of the wave based on the corrected center wavelength to obtain a correction result, and store the correction result in the storage module 903.

[0157] The storage module 903 is used to store the correction task corresponding to the correction instruction and to store the correction result.

[0158] In this embodiment, the interaction module 901 can be a web client, the control module 902 can be a server, the storage module 903 can be a database, and the first correction module 904 can be a wavelength correction system. A wavelength correction command is input through the web client and sent to the server. After receiving the wavelength correction command, the server retrieves the recorded wavelength correction task from the database and assigns the wavelength correction task to the wavelength correction system. The wavelength correction system records the wavelength correction results in the database. Specifically, the web client is used to input the wavelength correction command; the server is used to retrieve the corresponding wavelength correction task from the database based on the wavelength correction command, assign the wavelength correction task to the wavelength correction system, determine the corrected center wavelength based on the wavelength correction task, and the corrected center wavelength can be the target center wavelength; the database is used to record the wavelength correction task and wavelength correction result corresponding to the wavelength correction command; and the wavelength correction system is used to receive the wavelength correction task and perform wavelength correction.

[0159] In an optional embodiment of the present invention, the device 900 further includes:

[0160] The control module 902 is further configured to send the correction result stored in the storage module 903 to the interaction module 901;

[0161] The interaction module 901 is also used to receive and display the correction results sent by the control module 902.

[0162] In this embodiment, the wavelength correction results stored in the database are uploaded to a web application via a server for display. The server is also configured to send the wavelength correction results stored in the database to the web application; the web application is further configured to receive and display the wavelength correction results sent by the server.

[0163] In an optional embodiment of the present invention, the first correction module 904 includes: a laser emitting unit 9041, a polarization control unit 9042, a beam splitting unit 9043, a filter under test 9044, a power monitoring unit 9045, and a correction unit 9046.

[0164] The laser emitting unit 9041 is used to emit laser light with a specific wavelength;

[0165] The polarization control unit 9042 is used to control the laser traversal polarization state;

[0166] The beam splitting unit 9043 is used to split the laser beam into multiple paths;

[0167] The filter under test 9044 is used to pass the laser;

[0168] The power monitoring unit 9045 is used to monitor the optical power of the laser;

[0169] The correction unit 9046 is used to correct the center wavelength of the filter based on the wavelength-transmittance data corresponding to the optical power and the corrected center wavelength.

[0170] In this embodiment, the laser emitting unit 9041 can be a tunable laser, the polarization control unit 9042 can be a polarization controller, the beam splitting unit 9043 can be a beam splitter, the power monitoring unit 9045 can be a multi-channel power meter, and the correction unit 9046 can be a wavelength correction device. The main function of the tunable laser is to emit light within a certain wavelength range; the main function of the polarization controller is to allow the incoming light to traverse all polarization states; the main function of the beam splitter is to split the light into multiple paths, enabling simultaneous testing of many devices, i.e., devices sharing a single light source and polarization controller; the main function of the wavelength correction device is to correct the wavelength; and the main function of the multi-channel power meter is to monitor the power value.

[0171] The tunable laser emits light, and the wavelength of the light emitted by the tunable laser scans within a certain wavelength range. After passing through all polarization states by a polarization controller, the light emitted by the tunable laser is split by the beam splitter. At this time, the beam splitter is first connected to the multi-channel power meter to obtain the stored light value; then the beam splitter is connected to the filter under test, and the light split by the beam splitter enters the filter under test respectively. After the light is output from the filter under test, it reaches the multi-channel power meter to obtain the power value. Combined with the synchronization function, the wavelength value is obtained, and the stored light value is subtracted to finally obtain the wavelength-transmittance data. The center wavelength is corrected to the target center wavelength by a wavelength correction device, thereby realizing wavelength correction. The wavelength correction device can be a laser radiation device or a temperature control device.

[0172] The embodiments of the present invention complete the wavelength correction of the filter through a wavelength correction device. The correction device provided by the embodiments of the present invention sets the correction system and database in the cloud, realizing flexible access and sharing of the device and data, which is convenient, efficient and conducive to production.

[0173] This invention also provides a wave correction device. Figure 10 This is a schematic diagram of the composition of the wave correction device according to an embodiment of the present invention, as shown below. Figure 10 As shown, the device 1000 includes:

[0174] The first determining module 1001 is used to determine the working offset of the wave;

[0175] The second determining module 1002 is used to determine the first offset of the wave at the first operating temperature; wherein the first operating temperature is any one of a plurality of operating temperatures corresponding to the wave.

[0176] The second correction module 1003 is used to correct the center wavelength of the wave according to the first offset when the first offset is greater than the working offset; wherein the center wavelength represents the wavelength corresponding to the center of the wave coverage spectrum range that satisfies the first preset condition.

[0177] In other embodiments, the first determining module 1001 is further configured to acquire the loss data of the wave; determine whether the loss data meets the requirements of a preset index; and, if the loss data meets the requirements of the preset index, determine the working offset of the wave based on the loss data and the preset index.

[0178] In other embodiments, the second determining module 1002 is further configured to determine the first wavelength of the wave at the first operating temperature; and based on the first wavelength at the first operating temperature and the first wavelength at a first preset temperature, determine the first offset of the wave at the first operating temperature.

[0179] In other embodiments, the second correction module 1003 is further configured to determine correction parameters based on the first offset and to correct the center wavelength based on the correction parameters.

[0180] In other embodiments, the device 1000 further includes a third determining module for determining the operating wavelength of the wave based on the operating offset.

[0181] In other embodiments, the device 1000 further includes a fourth determining module and a fifth determining module, wherein the fourth determining module is used to determine the accuracy data of the wave based on the center wavelength; and the fifth determining module is used to correct the center wavelength corresponding to the wave according to the first offset when the accuracy data does not meet the requirements of a preset accuracy index.

[0182] It should be noted that, in the embodiments of the present invention, if the wave correction method described above is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium. Based on this understanding, the technical embodiments of the present invention, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a wave correction device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as a USB flash drive, external hard drive, read-only memory (ROM), magnetic disk, or optical disk. Thus, the embodiments of the present invention are not limited to any specific hardware and software combination.

[0183] Correspondingly, embodiments of the present invention provide a wave correction device, including a memory and a processor. The memory stores a computer program that can run on the processor. When the processor executes the program, it implements the steps in the wave correction method provided in the above embodiments.

[0184] Correspondingly, embodiments of the present invention provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps in the wave correction method provided in the above embodiments.

[0185] It should be noted that the descriptions of the above storage medium and device embodiments are similar to those of the above method embodiments, and have similar beneficial effects. For technical details not disclosed in the storage medium and device embodiments of the present invention, please refer to the descriptions of the method embodiments of the present invention for understanding.

[0186] It should be noted that, Figure 11 This is a schematic diagram of a hardware entity structure of a wave correction device according to an embodiment of the present invention, such as... Figure 11 As shown, the hardware entity of the wave correction device 1100 includes a processor 1101 and a memory 1103. Optionally, the wave correction device 1100 may also include a communication interface 1102.

[0187] It is understood that memory 1103 can be volatile memory or non-volatile memory, or both. Non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), ferromagnetic random access memory (FRAM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM); magnetic surface memory can be disk storage or magnetic tape storage. Volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), SyncLink Dynamic Random Access Memory (SLDRAM), and Direct Rambus Random Access Memory (DRRAM).The memory 1103 described in the embodiments of the present invention is intended to include, but is not limited to, these and any other suitable types of memory.

[0188] The methods disclosed in the embodiments of the present invention described above can be applied to processor 1101, or implemented by processor 1101. Processor 1101 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above-described method can be completed by the integrated logic circuit of the hardware in processor 1101 or by instructions in the form of software. The processor 1101 described above may be a general-purpose processor, a digital signal processor (DSP), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Processor 1101 can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of the present invention. A general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the methods disclosed in the embodiments of the present invention can be directly manifested as being executed by a hardware decoding processor, or being executed by a combination of hardware and software modules in the decoding processor. The software modules may be located in a storage medium, which is located in memory 1103. Processor 1101 reads the information in memory 1103 and, in conjunction with its hardware, completes the steps of the aforementioned method.

[0189] In an exemplary embodiment, the wave correction device may be implemented by one or more application-specific integrated circuits (ASICs), DSPs, programmable logic devices (PLDs), complex programmable logic devices (CPLDs), field-programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers (MCUs), microprocessors, or other electronic components to perform the aforementioned method.

[0190] In the several embodiments provided by this invention, it should be understood that the disclosed methods and apparatus can be implemented in other ways. The apparatus embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components may be combined, or integrated into another observation, or some features may be ignored or not executed. In addition, the communication connections between the various components shown or discussed may be through some interfaces, indirect coupling or communication connections between devices or units, and may be electrical, mechanical, or other forms.

[0191] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0192] Those skilled in the art will understand that all or part of the steps of the above-described method embodiments can be implemented by hardware related to program instructions. The program described above can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above-described method embodiments. The storage medium described above includes various media capable of storing program code, such as mobile storage devices, read-only memory (ROM), magnetic disks, or optical disks.

[0193] Alternatively, if the integrated units described in the embodiments of the present invention are implemented as software functional units and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical embodiments of the present invention, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a wave correction device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROMs, magnetic disks, or optical disks.

[0194] The wave correction method, apparatus, and computer storage medium described in this invention are only examples of embodiments of this invention, but are not limited thereto. Any wave correction method, apparatus, and computer storage medium involved are within the protection scope of this invention.

[0195] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of the invention. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It should be understood that in the various embodiments of the invention, the sequence numbers of the processes described above do not imply a sequential order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the invention. The sequence numbers of the embodiments of the invention described above are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0196] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0197] The above description is merely an embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method of modifying a wave, characterized by, The method comprises: determining a working offset of the wave; determining a first offset of the wave at a first working temperature; wherein the first working temperature is any one of a plurality of working temperatures corresponding to the wave; in a case where the first offset is greater than the working offset, correcting a center wavelength corresponding to the wave according to the first offset; wherein the center wavelength represents a wavelength corresponding to a center of a wave coverage spectrum range that meets a first preset condition.

2. The method of claim 1, wherein, The determination of the working offset of the wave comprises: obtaining loss data of the wave; determining whether the loss data meets a requirement of a preset index; in a case where the loss data meets the requirement of the preset index, determining the working offset of the wave based on the loss data and the preset index.

3. The method of claim 1, wherein, The determination of the first offset of the wave at the first working temperature comprises: determining a first wavelength of the wave at the first working temperature; determining the first offset of the wave at the first working temperature based on the first wavelength at the first working temperature and a first wavelength at a first preset temperature.

4. The method of claim 1, wherein, The correction of the center wavelength according to the first offset in the case where the first offset is greater than the working offset comprises: determining a correction parameter based on the first offset; correcting the center wavelength based on the correction parameter.

5. The method of claim 1, wherein, The method further comprises: determining a working wavelength of the wave based on the working offset.

6. The method of claim 1, wherein, The method further comprises: determining accuracy data of the wave based on the center wavelength; in a case where the accuracy data does not meet a requirement of a preset accuracy index, correcting the center wavelength corresponding to the wave according to the first offset.

7. A wave modification device, characterized by The device for correcting a filter wavelength comprises an interaction module, a control module, a storage module and a first correction module; the control module is connected with the interaction module, the storage module and the first correction module respectively; the interaction module is configured to input a correction instruction and send the correction instruction to the control module; the control module is configured to receive the correction instruction, call a correction task corresponding to the correction instruction in the storage module, and distribute the correction task to the first correction module; the first correction module is configured to receive the correction task, determine a corrected center wavelength based on the correction task, correct the center wavelength of the wave based on the corrected center wavelength to obtain a correction result, and store the correction result in the storage module; the corrected center wavelength is obtained by correcting the center wavelength according to the first offset in a case where a first offset of the wave at a first working temperature is greater than a working offset of the wave; the first working temperature is any one of a plurality of working temperatures corresponding to the wave; the storage module is configured to store the correction task corresponding to the correction instruction and store the correction result.

8. The apparatus of claim 7, wherein, The control module is further configured to send the correction result stored in the storage module to the interaction module; the interaction module is further configured to receive and display the correction result sent by the control module. ​ 9. The apparatus of claim 7, wherein, The first correction module comprises a laser emission unit, a polarization control unit, a light splitting unit, a filter to be measured, a power monitoring unit and a correction unit. The laser emission unit is configured to emit laser with a wavelength. The polarization control unit is configured to control the laser to traverse a polarization state. The light splitting unit is configured to split the laser. The filter to be measured is configured to pass the laser. The power monitoring unit is configured to monitor optical power of the laser. The correction unit is configured to correct a center wavelength of the filter based on wavelength-transmittance data corresponding to the optical power and the corrected center wavelength.

10. A wave modification device, characterized by Comprise: A first determination module configured to determine a working offset of the wave; A second determination module configured to determine a first offset of the wave at a first working temperature; wherein the first working temperature is any one of a plurality of working temperatures corresponding to the wave; A second correction module configured to correct a center wavelength corresponding to the wave according to the first offset when the first offset is greater than the working offset; wherein the center wavelength represents a wavelength corresponding to a center of a wave coverage spectrum that satisfies a first preset condition.

11. A wave modification device comprising a memory and a processor, said memory storing a computer program operable on the processor, characterized in that, The processor executes the program to realize the steps in the method of any one of claims 1 to 6.

12. A computer readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to realize the steps in the method of any one of claims 1 to 6.

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