Flexible SMA non-destructive interconnection high-frequency small module test tool and use method

Abstract

This invention relates to the field of flight technology, specifically to a flexible SMA (Surface Mount Microwave) non-destructive interconnection high-frequency small module test fixture and its usage method. The flexible SMA non-destructive interconnection high-frequency small module test fixture includes a base module, a power-on module, a slide module, and a push rod module. The usage method involves placing the device under test (DUT) in the test area, pushing the two slide modules to align the SMA connector with the signal pins at both ends of the DUT, continuously pushing the slide modules into place to complete the connection between the SMA connector and the signal pins at both ends of the DUT, and then applying a stop lever to the push rod module to apply a constraint force to the DUT against the base module and connect the power-on port of the DUT. Compared to existing designs, this invention employs a floating flexible docking scheme to achieve non-destructive interconnection between the SMA microwave RF connector and the signal pins of the DUT, simulating and replacing the rigid interconnection of the traditional mode. It uses elastic elements to flexibly constrain the DUT to the fixture, and a cam mechanism to achieve flexible constraint of the DUT while simultaneously completing the power-on connection.

Description

Technical Field

[0001] This invention relates to the field of electronic technology, specifically to a testing fixture and method for using a flexible SMA lossless interconnect high-frequency small module. Background Technology

[0002] With the rapid development of electronic products, high reliability and low cost have become crucial indicators. To ensure the performance of electronic components, it is necessary to strengthen component inspection and testing and eliminate unqualified products. Typically, large-volume testing requires the establishment of dedicated automated testing lines and the use of a complete set of specialized tooling to meet testing requirements. As the market develops, the demand for customized products in small batches and with diverse varieties is increasing. Dedicated automated testing lines are not suitable for testing such products in small batches. Testing different models of products requires changing the entire set of specialized tooling, resulting in poor flexibility. Meanwhile, the testing needs of small batches cannot reach the peak capacity of automation, leading to overcapacity and low line utilization. At the same time, the initial construction of the production line requires a large investment of financial and material resources, making it difficult to recoup the investment in the short term. Typically, RF connector assembly / disassembly testing fixtures are used. This process requires frequent removal of screws and soldering of wires. While both methods offer strong compatibility for different product models, neither is suitable for batch testing. Furthermore, considering the inherent assembly errors in product assembly—even small ones—rigid direct-insertion interconnects using SMP test connectors can cause irreversible damage to the base of the RF port signal pins on the test component, posing reliability risks. Therefore, this method is currently banned in the industry. Consequently, new testing methods need to be developed. Summary of the Invention

[0003] Purpose of the invention: To solve the above problems, this invention provides a flexible SMA non-destructive interconnection high-frequency small module testing fixture and its usage method, which solves the testing efficiency problem of high-frequency small module components, realizes non-destructive interconnection between SMA connectors and signal pins of the device under test, simulates the rigid fastening of traditional SMA connectors to avoid disassembly during testing, and reduces enterprise production costs.

[0004] Technical Solution: To achieve the above objectives, the flexible SMA non-destructive interconnection high-frequency small module testing fixture of the present invention includes a base module, a power-on module, a slide module, and a push rod module; the base module includes a base, a material placement area on the upper surface of the base, a crank limiting block and a limiting bracket, and a pry bar placed on the limiting bracket; the power-on module includes a power-on sliding plate, a first large probe installed on the side of the power-on sliding plate, a power-on plate, and power-on pins welded to the power-on plate; the slide module includes an SMA connector slide, a pre-tightening slide, and a push rod module. The slide includes a second large probe on the side of the pre-tightening slide, slide clips installed on both sides of the pre-tightening slide, an SMA connector, and a push rod module including a first crank, a second crank parallel to the first crank, a stop handle connecting the first crank and the second crank, a crank clip located on one side of the second crank, a connecting rod top block, and a third large probe located on the connecting rod top block; the electric plate is equipped with an electric plate for welding electric needles; the SMA connector slide is assembled with the SMA connector, and the second large probe is assembled between the pre-tightening slide and the SMA connector slide.

[0005] Furthermore, the first, second, and third large probes are all elastic probes, and a single-sided ramp structure is provided opposite the electric sliding plate on which the first large probe is installed.

[0006] Furthermore, the SMA connector can be translated within a certain range in the connector direction.

[0007] Furthermore, the electrode is an elastic electrode; the SMA connector slide is used to assemble the SMA connector and to allow the SMA connector to translate within a certain range in the connector direction.

[0008] Furthermore, the crank bracket mounts the assembled pushrod module onto the base module.

[0009] Furthermore, the second crank is a fixed bracket on both sides of the push rod module, and also serves as a cam component after the power module (Ⅱ) is assembled.

[0010] Furthermore, the crank bracket and crank buckle are used to lock the current state of the test fixture during the test.

[0011] Furthermore, the stop lever handle is a universal component for push rod module handles and limiters.

[0012] The method of using the flexible SMA non-destructive interconnect high-frequency small module test fixture of the present invention includes the following steps: 1) Place the test piece (DPT) into the base mold material placement area; 2) Push the handle to send the slide module towards the DPT, so that the SMA connector and the RF signal pin of the DPT enter the signal hole of the SMA connector, and continue to push the handle to lock the slide latch with the pry bar; 3) Pull down the stop lever handle to make the pressure block contact the DPT, and continue to pull down the stop lever handle until the crank contacts the crank limit block. At the same time, the crank latch contacts the ramp surface of the power-on slide plate. After the latch is locked, the DPT is tested; After the test is completed, push the power-on slide plate to unlock the push rod module and lift the push rod module so that the stop lever handle contacts the crank bracket and the push rod module is in the initial open state; gently lift the limit bracket to unlock the slide plate module, pull out the slide plate module to disengage the SMA connector from the signal pin of the DPT, and finally remove the DPT to complete the entire test process.

[0013] Furthermore, the signal hole is an integral structure of the SMA connector; the pressure block component includes a pressure block and ball bearings installed on both sides of the pressure block. The pressing process of the test piece is the rotation of the push rod module, and there is friction between the pressure block component and the test piece.

[0014] Beneficial effects: Compared with the prior art, the present invention has the following significant effects: Flexible docking between the SMA connector and the RF signal pins of the device under test (DUT) is achieved by adjusting the movement of the slide module towards the DUT; the pressure block component gradually contacts the DUT by pulling down the stop lever handle, thereby achieving a flexible docking scheme between the SMA microwave RF connector and the DUT, realizing lossless interconnection between the SMA microwave RF connector and the DUT signal pins, and simulating the rigid interconnection of the traditional mode; flexible constraint of the DUT to the tooling is achieved by using elastic elements; and the cam mechanism achieves flexible constraint of the DUT while simultaneously powering on the DUT. Attached Figure Description

[0015] Figure 1 This is an isometric view of the test fixture assembly described in this invention.

[0016] Figure 2 This is an isometric view of the base module described in this invention.

[0017] Figure 3 This is an isometric view of the power-on module described in this invention.

[0018] Figure 4 This is an isometric view of the protective cover component for the hidden power supply board of the power supply module described in this invention.

[0019] Figure 5 This is an isometric view a of the slide module described in this invention.

[0020] Figure 6 This is the isometric view b of the slide module described in this invention.

[0021] Figure 7 This is a cross-sectional view of the SMA connector slide assembly described in this invention.

[0022] Figure 8 This is a schematic diagram of the movable SMA connector described in this invention.

[0023] Figure 9 This is an isometric view of the push rod module described in this invention.

[0024] Figure 10 This is an isometric view of the hidden component of the push rod module described in this invention.

[0025] Figure 11 This is a partial assembly isometric view of the push rod module described in this invention.

[0026] Figure 12 This is a partially enlarged isometric view of the pressure block portion of the push rod module described in this invention.

[0027] Figure 13 This is an isometric view of the test piece placed in the tooling test position according to the present invention.

[0028] Figure 14 This is an isometric view a illustrating the test described in this invention.

[0029] Figure 15 This is an isometric view b illustrating the test described in this invention.

[0030] Figure 16 This is an isometric view of the connection between the electric sliding plate and the crank buckle described in this invention.

[0031] Figure 17 This is a schematic diagram showing the relationship between the slide module and the pry bar of the base module described in this invention.

[0032] Figure 18 This is a schematic diagram showing the relationship between the slide module being pushed into place and the pry bar of the base module according to the present invention.

[0033] Figure 19 This is a schematic diagram showing the relationship between the pry bar and the slide module of the upper base module described in this invention.

[0034] Figure 20 This is a cross-sectional view of the test piece and slide module assembly described in this invention.

[0035] Figure 21 This is a schematic diagram of the test fixture described in this invention. Detailed Implementation

[0036] This invention discloses a testing fixture and its usage method for flexible SMA lossless interconnect high-frequency small modules. Please refer to [link / reference]. Figures 1 to 12 , Figures 17 to 18As shown below, the testing fixture for flexible SMA lossless interconnection high-frequency small modules provided by this invention will be described in further detail: Figure 1 As shown, the test fixture for flexible SMA non-destructive interconnection high-frequency small modules includes base module I, power-on module II, slide module III, and push rod module IV.

[0037] like Figure 2 As shown, the base module I includes a base I-1, a crank limiting block I-2, a limiting bracket I-3, a bracket pin I-4, a pry bar handle I-5, a slide limiting block I-6, a limiting pin I-7, a pry bar I-8, a multi-core socket Z-1, a first guide rail Z-2, a cotter pin retaining ring Z-3, and a second guide rail Z-4. The base I-1 has a material placement area with a limiting pin hole I-7. The base I-1 also includes a crank limiting block I-2, a limiting bracket I-3, a slide limiting block I-6, a first guide rail Z-2, a second guide rail Z-4, and a limiting groove for the crank bracket IV-1. The limiting groove is designed to ensure accuracy during assembly and provides positioning. The side of the base I-1 has mounting holes for a multi-core socket Z-1 for its assembly. The limiting bracket I-3 has mounting holes that match those on the base I-1 and pin holes that match those on the bracket pin I-4. The bracket pin I-4 has grooves at both ends for mounting cotter pin retainers Z-3, ensuring that the bracket pin I-4 will not detach after assembly with the limiting bracket I-3. A pry bar handle I-5 is also included. Both ends are threaded and used to connect to the pry bar I-8. The tester can move the pry bar handle I-5 to limit the movement of the slide module III. The slide module limit block I-6 is used to limit the slide module III, preventing it from sliding off the track and affecting the testing process. The limit pin I-7 is installed in the material placement area of ​​the base I-1, i.e., the area where the product will be tested. The pin size and the pin hole position in the material placement area of ​​the base I-1 will match the mounting holes and pin holes on the test piece Z-12 for initial pre-positioning of the test piece Z-12. The positioned test piece Z-12 still has a slight wobble gap, unlike traditional rigid positioning. This slight wobble gap is an adjustable parameter during flexible testing. Figure 17 , Figure 18As shown, crowbar I-8 has a pin hole that matches the bracket pin I-4 and is installed with crowbar handle I-5. Crowbar I-8 is used for limiting the slide module III. Crowbar I-8 is placed on the limiting bracket I-3, with the pin hole of crowbar I-8 coinciding with that of the limiting bracket I-3. It passes through the bracket pin I-4 and has cotter pin retaining rings Z-3 installed in the grooves on both sides of the bracket pin I-4, forming a crowbar assembly. The four sets of crowbar assemblies are respectively installed in the limiting slots of the limiting bracket I-3 on the base I-1. The two sets of crowbar assemblies on both sides are connected by crowbar handle I-5, that is, moving the crowbar handle I-5 can simultaneously control the two sets of crowbar assemblies on one side. This crowbar assembly is used for limiting the slide module III during the test and for ending the test. The purpose of using two sets of crowbar assemblies on each side is to balance the force and ensure the dynamic balance of the entire tooling mechanism during operation. Figure 2 As shown, crank limiting block I-2, slide limiting block I-6, first guide rail Z-2, second guide rail Z-4, and multi-core socket Z-1 are respectively assembled with base I-1, thus completing the assembly of base module I.

[0038] like Figure 3 As shown, the power-on module II includes a power-on slide plate II-1, a power-on board II-2, a power-on board protective cover II-3, a T-type bearing Z-5, a power-on needle Z-6, a first large probe Z-7-a, and a slider Z-8. The power-on slide plate II-1 has a slider groove Z-8 and mounting holes for the T-type bearing Z-5 and the first large probe Z-7-a on its side. Opposite to the mounting holes of the large probes is a single-sided ramp structure, which functions as a locking mechanism in conjunction with the crank locking IV-6 of the push rod module IV to achieve the locking mechanism. The power-on needle Z-6 is welded to the power-on board II-2, and the power-on board II-2 with the welded power-on needle Z-6 is installed on the power-on slide plate II-1 to supply power to the test piece. Figure 4 As shown, the power supply board protective cover II-3 is used to protect the power supply board and prevent foreign objects from causing circuit abnormalities; the first large probe Z-7-a is used as an elastic element to provide mechanical energy for the reset after the processing module is tested; after the entire tooling is assembled, the T-type bearing Z-5 is used with the rolling cam terminal; the T-type bearing Z-5, the first large probe Z-7-a, the slider Z-8, the power supply board protective cover II-3, and the first large probe Z-7-a are respectively assembled with the power supply slide II-1, thus completing the assembly of the power supply module II.

[0039] like Figure 5 , Figure 6As shown, the slide module III includes an SMA connector slide III-1, an SMA limit buckle III-2, a handrail III-3, a cable tray III-4, a pre-tightening slide III-5, an SMA limit pin III-6, a slide latch III-7, a second large probe Z-7-b, a slider Z-8, a nut Z-9, a screw Z-10, and an SMA connector Z-11. This module is also a key module for achieving non-destructive interconnection. Figure 7 , Figure 8As shown, the SMA connector slide III-1 is used to assemble the SMA connector Z-11 and allow the SMA connector Z-11 to have a certain range of small-amplitude translation in the connector direction. The translation range is to accommodate the assembly error of the RF signal pins on the side of the test component Z-12. Its floating range should not be too large so that the interconnection and docking error between the SMA connector Z-11 and the test component Z-12 signal pins is not too large during testing, which would affect the docking efficiency. The vertical gap is <0.1mm. If the gap is too large, the SMA connector Z-11 will deflect at a large angle under the action of gravity or due to the pull of the external equipment cable, making it difficult to coaxially insert the SMA connector Z-11 and the test component Z-12 signal pins. If the gap is too small, it will affect the planar sliding of the SMA connector Z-11. The SMA connector slide table III-1 is equipped with a slider Z-8 limiting groove, an SMA connector Z-11 sliding groove, and a second large probe Z-7-b assembly hole on the side. The limiting groove is used for precise positioning during assembly. Both the SMA limiting buckle III-2 and the SMA limiting pin III-6 are used to limit the SMA connector Z-11, enabling the SMA connector Z-11 to move horizontally within the SMA connector slide table III-1. The handrail III-3 is arch-shaped and is used to protect the signal cable Y-3 of external equipment, preventing test personnel from touching or pressing the signal cable. Y-3, the connection between signal cable Y-3 and SMA connector Z-11 is subjected to significant external pressure, affecting the long-term reliability of the connector; Cable bracket III-4 is arch-shaped, used to support signal cable Y-3 of external equipment, preventing the signal cable Y-3 from sagging due to its own weight. The connection between it and SMA connector Z-11 is subjected to a certain torque, affecting the long-term reliability of the connector. Through holes on both sides are provided for adjusting the height of the supported cable; Pre-tightening slide III-5 has a slider Z-8 limiting groove and a second large probe Z- on the side. 7-b assembly hole, threaded hole of screw Z-10, and limiting groove are used for precise positioning during assembly; SMA connector Z-11 is placed in the sliding groove of SMA connector slide III-1, and through the assembly of SMA limiting buckle III-2 and SMA limiting pin III-6, SMA connector Z-11 can have a certain range of small-amplitude translation in the connector direction; slider Z-8 is installed in the slider limiting groove of SMA connector slide III-1 and pre-tightening slide III-5 respectively; handle III-3 is installed on pre-tightening slide III-5, pre-... Slide table III-5 is fitted with slide table clips III-7 and screws Z-10 on both sides. The hole of cable tray III-4 is fitted onto screw Z-10, and nuts Z-9 are installed on the top and bottom of cable tray III-4. The second large probe Z-7-b is installed between SMA connector slide table III-1 and pre-tightening slide table III-5. The second large probe Z-7-b is embedded in the hole of the second large probe Z-7-b in SMA connector slide table III-1 and pre-tightening slide table III-5. The Z-7 large probe is used as an elastic element. The assembly of slide table module III is now complete.

[0040] like Figure 9 As shown, the push rod module IV includes a crank bracket IV-1, a first bearing washer IV-2, a first crank IV-3, a stop handle IV-4, a second crank IV-5, a crank clip IV-6, a connecting rod top block IV-7, a rotating rod IV-8, a pull rod IV-9, a first limiting ring IV-10, a second bearing washer IV-11, a connecting rod IV-12, a shaft IV-13, a second limiting ring IV-14, a pressure block IV-15, a third large probe Z-7-c, a ball bearing Z-13, and a screw Z-14. The crank bracket IV-1 serves as the crank bracket for the rotating module during the entire test. IV-1 is used to install the assembled push rod module IV onto the base module I. It has limiting holes for the second bearing washer IV-11 on both sides. The limiting holes are threaded for precise assembly, and the threads are also used for fastening connections during subsequent assembly processes. Figure 10 , Figure 11As shown, both the first crank IV-3 and the second crank IV-5 have through holes for the ball bearing Z-13 and through holes for installing other components, and a limiting groove for the crank clip IV-6. The second crank IV-5 serves not only as a fixed bracket on both sides of the push rod module IV, but also as a cam component after assembly with the power module II. The stop handle IV-4 is a universal component for the push rod module IV handle and the limiting mechanism. The second crank IV-5 has a limiting groove on one side for installing the crank clip IV-6. The crank clip IV-6... Used to lock the current state during testing, preventing the push rod module IV push rod from returning to its original position under the action of the third large probe Z-7-c of the elastic element; the connecting rod top block IV-7 is rectangular in shape and has a hole for the third large probe Z-7-c, and a through hole on its side; the rotating rod IV-8 has a cylindrical structure and a transverse aperture in the middle, the diameter of which matches the outer diameter of the third large probe Z-7-c; the pull rod IV-9 has a flat structure and has a through hole and a waist groove hole, the diameter of which matches the second bearing gasket IV-11, and the width of the waist groove hole... Matching the rotating rod IV-8, the waist groove length serves as overtravel clearance and also limits the pressure block IV-15; the second bearing washer IV-11 and the first bearing washer IV-2 ensure smooth rotation of the ball bearing Z-13, and the second bearing washer IV-11 also serves as the bushing of the tie rod IV-9. Since the tie rod IV-9 does not require high rotational accuracy, the second bearing washer IV-11 can be used directly instead of the bushing; the first limiting ring IV-10 and the second limiting ring IV-14 are structurally identical, except for their length. The difference lies in the assembly on shaft IV-13, which restricts the axial displacement of connecting rod IV-12, thus affecting the position of the pressure block component and its constraint on the measured part Z-12. Connecting rod IV-12 has holes at both ends; one end's diameter matches the ball bearing Z-13, and the other end matches the diameter of shaft IV-13. A threaded mounting hole is located in the middle. The outer diameter of shaft IV-13 matches the hole in connecting rod IV-12, serving as a fulcrum for connecting rod IV-12. Pressure block IV-15 has threaded holes and mounting holes for the second bearing washer IV-11 on both sides. Figure 12As shown, two ball bearings Z-13 are installed in the mounting holes of the second bearing shim IV-11 on the pressure block IV-15 via the second bearing shim IV-11. The mounting holes of the second bearing shim IV-11 serve to position the bearings during assembly. Four ball bearings Z-13 are installed on both sides by screws Z-14. The ball bearings Z-13 are used to press against the test piece Z-12. The rolling friction of the ball bearings Z-13 avoids the sliding friction of the pressure block IV-15 against the test piece Z-12, thereby preventing press wear and assembling into the pressure block component. Since the pressing process of the tested component Z-12 involves the rotation of the push rod module VI rather than a perpendicular pressing, the pressing block component will rub against the tested component Z-12. Two ball bearings Z-13 are installed in the mounting holes of the second bearing washer IV-11 on the crank bracket IV-1 via the second bearing washer IV-11, assembling the crank bracket component. The crank clip IV-6 is installed in the limiting groove of the first crank IV-5. Two connecting rods are placed on the ball bearings Z-13 on both sides of the pressing block IV-15 containing the bearing washer Y-2. The pull rod IV-9, via the second bearing washer IV-11 (used as a bushing), is positioned on both sides of the two connecting rods, aligned with the threaded mounting holes of the connecting rod IV-12. Screws Z-14 pass through the second bearing washer IV-11 (used as a bushing) and are screwed into the threaded mounting holes of the connecting rod IV-12 for tightening. The excess screw passes through the smooth hole on the side of the connecting rod top block IV-7. Therefore, when the screw is tightened, the pull rod... Rod IV-12 still possesses rotational kinetic energy; the circumferential rod IV-8 passes through the waist groove hole of the pull rod IV-9; the third large probe Z-7-c is placed in the blind hole of the third large probe Z-7-c on the top block IV-7 of the connecting rod and the transverse light hole of the circumferential rod IV-8. The third large probe Z-7-c is only used as an elastic element, thus forming a three-bar linkage mechanism with a reset function; the first limiting ring IV-10 and the second limiting ring IV-14 are sleeved on the shaft IV-13 to limit the three-bar linkage mechanism, ensuring that the pressure block component can accurately press the measured part Z-12; the first crank IV-3 and the second crank IV-5 are respectively placed on both sides of the stop handle IV-4, the circumferential rod IV-8, the handle IV-7, and the shaft IV-13. The ball bearing Z-13 of the first crank IV-3 and the second crank IV-5 are connected to the bearing bracket component. The ball bearing Z-13 of the bearing bracket IV-1 is assembled, thus completing the assembly of the push rod module IV.

[0041] The multi-pin socket Z-1, first guide rail Z-2, cotter pin retaining ring Z-3, second guide rail Z-4, T-bearing Z-5, power-on needle Z-6, large probe Z-7, slider Z-8, nut Z-9, screw Z-10, SMA connector Z-11, ball bearing Z-13, and screw Z-14 are all existing standard parts. The slider Z-8 of power-on module II is assembled with the first guide rail Z-2 of base module I to form a guide rail pair; the two sliders of slide module III are both assembled with the second guide rail Z-4 of base module I to form guide rail pairs, located on both sides of base module I; the crank bracket IV-1 of push rod module IV is assembled with the crank bracket IV-1 limiting groove of base I-1; the power-on board II-2 of power-on module II is interconnected with the multi-pin socket Z-1 of base module I for applying external voltage to the test piece Z-12.

[0042] Please see Figures 13 to 15 , Figures 20 to 21 As shown, the following is a more detailed description of the usage method of the flexible SMA lossless interconnect high-frequency small module test fixture provided by the present invention: The usage method of the flexible SMA lossless interconnect high-frequency small module test fixture includes the following steps: 1) As shown Figure 13 As shown, place the test piece Z-12 into the material placement area of ​​base module I, aligning Z-12 with the limiting pin I-7 of base module I; 2) The tester's wrist rests on the handle III-3 of slide module III, and the signal cable Y-3 of the interconnection part guides slide module III towards test piece Z-12, so that the RF signal pins of SMA connector Z-11 and test piece Z-12 are inserted into the signal hole of SMA connector Z-11. The signal hole is a built-in structure of SMA connector Z-11. Continue to push the handle III-3 of slide module III to lock it with pry bar I-8. Push slide module III so that its SMA connector slide III-1 contacts the object in front, contacting test piece Z-12 during testing, and contacting the test area of ​​base I-1 when not testing; continue to push slide module III through handle III-3, and the second large probe Z-7-b, as an elastic element, begins to compress, pushing slide latch III-7 to contact pry bar I-8; as Figure 17 As shown, pushing the slide module III causes the slide latch III-7 to lift the pry bar I-8; as Figure 18 As shown, continue pushing slide module III. Slide latch III-7 disengages from pry bar I-8. Under gravity, pry bar I-8 falls. At this point, release the lever. Under the action of the elastic element of the second large probe Z-7-b, slide latch III-7 presses against pry bar I-8, achieving reverse self-locking. To unlock, simply lift pry bar handle I-5. Pry bar handle I-5 drives pry bar I-8, causing pry bar I-8 to engage in self-locking. Under the action of the elastic element of the second large probe Z-7-b, the pre-tightened slide module III-5 pops out, disengaging from the contact area of ​​pry bar I-8. Dragging slide module III will then release the lock. Figure 20 As shown, the second large probe Z-7-b, as a single-row element, provides flexible constraint on the axial force of the test component Z-12 during testing, accommodating the shape error of the test component Z-12 during production, while providing effective pressure to ensure that the SMA connector Z-11 is in close contact with the test component Z-12, ensuring the basic requirements of high-frequency microwave signal testing, good grounding, and simulating the traditional screw fastening test connector.

[0043] 3) such as Figure 14 As shown, the stop handle IV-4 of the pull-down push rod module IV, and the ball bearing Z-13 of the pressure block component contact the object below. During testing, it contacts the test piece Z-12; when not testing, it contacts the test area of ​​the base I-1. Continuing to pull down the stop handle IV-4 of the pull rod module IV, the three-bar linkage mechanism causes the third large probe Z-7-c, acting as an elastic element, to begin compression. This part accommodates the height-direction shape error of the test piece Z-12 during manufacturing and provides effective pressure to ensure that the test piece Z-12 is not damaged due to excessive pressure. This part also serves to fix the test piece Z-12, preventing the pulling of the signal cable Y-3 during testing from affecting the SMA connector Z-11 and indirectly affecting the test results. Figure 15 As shown, continue pulling down the IV-4 stop handle of push rod module IV. The second crank IV-5 of push rod module IV acts as a cam and contacts the T-type bearing Z-5 of the power supply module II. The T-type bearing Z-5 acts as a roller ejector pin. This contact forms a cam pair mechanism. Continue pulling down the stop handle IV-4 of push rod module IV. Under the action of the cam pair, the power supply module II moves towards the material placement area of ​​the base I-1 of the base module I. The power supply pin Z-6 of the power supply module II contacts the workpiece Z-12 under test, realizing the power supply of workpiece Z-12. The electrical contact is achieved through a flexible electrode Z-6, which effectively accommodates the portion of the test piece Z-12 that protrudes from the main body during production, ensuring flexible contact and preventing damage to the test piece Z-12. Continuing to pull down the push rod module IV, the stop IV-4 causes the second crank IV-5 to contact the crank limit block I-2, preventing excessive force from the tester. The third large probe Z-7-c acts as an elastic element to prevent damage to the test piece Z-12 during rigid pressure application. Simultaneously, as... Figure 16As shown, the crank clip IV-6 contacts the ramp surface of the power-on sliding plate II-1 to lock the clip, allowing the test piece Z-12 to be tested. After the test is completed, simply push the power-on sliding plate II-1 lightly to disengage the ramp surface of the power-on sliding plate II-1 from the crank clip IV-6. Under the action of the elastic element of the third large probe Z-7-c, the stop IV-4 of the push rod module IV rises in the reverse direction, and the push rod module IV is in the initial open state. Simply lift the limit bracket I-3 to unlock the sliding plate module III, pull out the sliding plate module III so that its SMA connector Z-11 disengages from the signal pin of the test piece Z-12, and remove the test piece Z-12. This completes the entire test process.

[0044] like Figure 21 As shown, during use, an external device under test (DUT) Z-12 is required, including a tester Y-1, a power cord Y-2, a signal cable Y-3, and a test fixture Y-4. "The tester rests their wrist on the handle III-3 of the slide module III, and by holding the signal cable Y-3 of the interconnection section, the slide module III is pushed towards the DUT Z-12, causing the SMA connector Z-11 and the RF signal pins of the DUT Z-12 to insert into the signal holes of the SMA connector Z-11." Under this operation, because the SMA connector Z-11 can slightly shift within the inner plane of the SMA connector slide III-1, when "the handle III-3 of the slide module III is continued to be pushed to lock it with the pry bar I-8," the SMA connector Z-11 can align with the position of the signal pins on the DUT Z-12 body, achieving non-destructive SMA interconnection.

Claims

1. A testing fixture for flexible SMA lossless interconnect high-frequency small modules, characterized in that, Includes base module, power supply module, slide module, and push rod module; The base module includes a base, a crank limiting block, a limiting bracket, a bracket pin, a pry bar handle, a slide limiting block, a limiting pin, a pry bar, a multi-core socket, a first guide rail, a cotter pin retaining ring, and a second guide rail. The base has a material placement area with limiting pin holes. The base also has limiting grooves for limiting the crank limiting block, limiting bracket, slide limiting block, first guide rail, second guide rail, and crank bracket. The side of the base has multi-core socket mounting holes. The limiting bracket has mounting holes that match the base and pin holes that match the bracket pins. The nail has grooves at both ends; the pry bar handle has threads at both ends for connecting the pry bar; the slide limit block is used for limiting the slide module; the limit pin is installed at the material placement area of ​​the base; the pry bar has pin holes that match the bracket pins and is installed in conjunction with the pry bar handle; the pry bar is placed on the limit bracket, the pry bar and the pin holes of the limit bracket coincide, it passes through the bracket pin, and cotter pin retainers are installed in the grooves at both ends of the bracket pin to form the pry bar component for limiting; the crank limit block, the slide limit block, the first guide rail, the second guide rail, and the multi-core socket are respectively assembled with the base; The power-on module includes a power-on sliding plate, a power-on board, a T-shaped bearing, a power-on needle, a first large probe, and a slider. The power-on sliding plate has a slider groove, and its side has mounting holes for the T-shaped bearing and the first large probe. Opposite to the first large probe mounting hole is a single-sided ramp structure, which functions as a latching mechanism in conjunction with the crank latch of the push rod module. The power-on needle is welded to the power-on board, and the power-on board with the welded power-on needle is installed on the power-on sliding plate. The T-shaped bearing is used as a rolling cam terminal. The T-shaped bearing, the first large probe, the slider, and the first large probe are respectively assembled with the power-on sliding plate. The slide module includes an SMA connector slide, SMA limit buckle, handrail, cable tray, pre-tightening slide, SMA limit pin, slide buckle, second large probe, slider, nut, screw, and SMA connector. The SMA connector slide is used to assemble SMA connectors, allowing them to move slightly within a certain range in the connector direction. The SMA connector slide has a slider limit groove, an SMA connector sliding groove, and a second large probe assembly hole on its side. The SMA limit buckle and SMA limit pin are used to limit the SMA connector, enabling the SMA connector to move horizontally within the SMA connector slide. The pre-tightening slide has a slider limit groove and a pre-tightening... The slide table has a second large probe mounting hole and a screw thread hole on its side. The SMA connector is placed in the sliding groove of the SMA connector slide table. Through the assembly of the SMA limit buckle and the SMA limit pin, the SMA connector can move slightly within a certain range in the connector direction. The sliders are respectively installed in the slider limit grooves of the SMA connector slide table and the pre-tightening slide table. The handrail is installed on the pre-tightening slide table. The slide table buckle and screw are installed on both sides of the pre-tightening slide table. The hole of the cable tray is fitted on the screw, and a nut is installed under the cable tray. The second large probe is installed between the SMA connector slide table and the pre-tightening slide table. The second large probe is embedded in the second large probe hole of the SMA connector slide table and the pre-tightening slide table. The push rod module includes a crank bracket, a first bearing washer, a first crank, a stop lever handle, a second crank, a crank clip, a connecting rod top block, a rotating rod, a pull rod, a first limiting ring, a second bearing washer, a connecting rod, a shaft, a second limiting ring, a pressure block, a third large probe, ball bearings, and screws. The crank bracket is used to install the assembled push rod module onto the base module. The crank bracket has second bearing washer limiting holes on both sides. Both the first and second cranks have through holes for installing ball bearings and crank clip limiting grooves. The second crank, in addition to serving as a push rod module's two... The side-mounted bracket also serves as a cam component after assembly with the power-on module; the stop lever handle is a universal component for the push rod module handle and limit position; a limit groove for installing the crank clip is provided on one side of the second crank; the connecting rod top block is rectangular in shape and has a third large probe hole, with a through hole on its side; the rotating rod has a cylindrical structure throughout and a transverse aperture in the middle, the aperture of which matches the outer diameter of the third large probe; the pull rod has a flat structure and has a through hole and a waist groove hole, the through hole diameter matching the second bearing gasket, the waist groove hole width matching the rotating rod, and the second bearing... The first bearing washer and the second bearing washer are used to ensure smooth rotation of the ball bearing, while the second bearing washer also serves as the bushing for the connecting rod. The first and second limiting rings are assembled on the shaft to limit the axial displacement of the connecting rod. The connecting rod has open holes at both ends; one end's diameter matches the ball bearing, and the other end's diameter matches the shaft diameter. A threaded mounting hole is provided in the middle. The outer diameter of the shaft matches the connecting rod hole, serving as the fulcrum for the connecting rod. The pressure block has threaded holes and second bearing washer mounting holes on both sides. The crank clip is installed in the limiting groove of the first crank. The two connecting rods are placed on either side of the pressure block containing the bearing washer. Ball bearings; the tie rods are positioned on both sides of the two connecting rods via the second bearing washer and aligned with the threaded mounting holes of the connecting rods. Screws are screwed through the second bearing washer and screwed into the threaded mounting holes of the connecting rods. The excess screw passes through the smooth hole on the side of the connecting rod top block. The rotating rod passes through the waist groove hole of the tie rod. The third large probe is placed in the blind hole of the third large probe on the connecting rod top block and the transverse smooth hole of the rotating rod. The first crank and the second crank are respectively placed on both sides of the stop handle, the rotating rod, the handle, and the shaft. The through holes of the ball bearings of the first crank and the second crank are assembled with the ball bearings of the bearing bracket.

2. The testing fixture for flexible SMA lossless interconnection high-frequency small modules according to claim 1, characterized in that, The first, second, and third large probes are all elastic probes.

3. The testing fixture for flexible SMA lossless interconnection high-frequency small modules according to claim 1, characterized in that, The electrode is an elastic electrode.

4. A method of using a testing fixture for flexible SMA lossless interconnect high-frequency small modules as described in any one of claims 1 to 3, characterized in that, Includes the following steps: S1. Place the part to be tested into the material placement area of ​​the base module; S2. Push the handle to send the slide module toward the device under test, so that the SMA connector and the radio frequency signal pin of the device under test enter the signal hole of the SMA connector. Continue to push the handle to lock the slide latch and the pry bar. S3. Pull down the stop lever handle to make the pressure block component contact the test piece. The pressure block component includes a pressure block and ball bearings installed on both sides of the pressure block. Then continue to pull down the stop lever handle until the crank contacts the crank limit block. At the same time, the crank latch contacts the ramp surface of the power-on sliding plate. After the latch is locked, the test piece is tested. After the test is completed, push the power-on sliding plate to unlock the push rod module and lift the push rod module so that the stop lever handle contacts the crank bracket. The push rod module is in the initial open state. Gently lift the limit bracket to unlock the sliding plate module. Pull out the sliding plate module to disengage the SMA connector from the test piece signal pin. Finally, remove the test piece to complete the entire test process.

5. The method of using the testing fixture for flexible SMA lossless interconnection high-frequency small modules according to claim 4, characterized in that, The signal hole is an integral part of the SMA connector.

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