Anti-electromagnetic interference test system, method, equipment and medium for electronic chips

Abstract

The embodiment of the present application is applicable to the field of chip technology, and provides an anti-electromagnetic interference test system, method, device and medium for an electronic chip. The system includes: a test unit, a control unit and a data processing unit. The test unit includes an electromagnetic signal output device, an electronic chip and an electromagnetic signal receiving device. The control unit includes a first control module, a second control module and a third control module. The first control module controls the intensity of the electromagnetic interference signal output by the electromagnetic signal output device; the second control module controls the electromagnetic signal receiving device to receive the electromagnetic interference signal; the third control module inputs a test signal to the electronic chip when the electromagnetic signal receiving device receives the electromagnetic interference signal; the data processing unit receives the output data obtained by the electronic chip based on the test signal processing, and determines the anti-electromagnetic interference performance of the electronic chip according to the output data. The application of the above system can simply and conveniently test the anti-electromagnetic interference performance of the electronic chip.

Description

Technical Field

[0001] The present application belongs to the field of chip technology, and in particular, relates to an anti-electromagnetic interference test system, method, equipment and medium for electronic chips. Background Art

[0002] Electromagnetic Interference (EMI) is electronic noise that interferes with cable signals and degrades signal integrity. EMI is usually generated by electromagnetic radiation sources such as motors and machinery.

[0003] At present, with the progress of vehicle intelligence, more and more electronic devices are installed in vehicles. The electronic devices installed in vehicles will cause electromagnetic interference to the electronic chips in the vehicle during operation. The electronic chips in the vehicle are used to manage and control various electronic systems in the vehicle. In order to ensure the normal operation of the vehicle, the electronic chips in the vehicle need to have anti-interference ability. Therefore, it is necessary to test the anti-interference ability of the electronic chips. Summary of the invention

[0004] In view of this, the embodiments of the present application provide an anti-electromagnetic interference testing system, method, device and medium for an electronic chip, so as to simply and conveniently achieve the anti-electromagnetic interference performance of the electronic chip.

[0005] A first aspect of an embodiment of the present application provides an anti-electromagnetic interference test system for an electronic chip, comprising a test unit, a control unit and a data processing unit, wherein the test unit comprises an electromagnetic signal output device, an electronic chip to be tested and an electromagnetic signal receiving device, and the control unit comprises a first control module, a second control module and a third control module, wherein:

[0006] The first control module is used to control the intensity of the electromagnetic interference electromagnetic signal output by the electromagnetic signal output device;

[0007] The second control module is used to control the electromagnetic signal receiving device to receive the electromagnetic interference signal;

[0008] The third control module is used to input a test signal to the electronic chip when the electromagnetic signal receiving device receives the electromagnetic interference signal;

[0009] The data processing unit is used to receive output data obtained by the electronic chip based on the test signal processing, and determine the anti-electromagnetic interference performance of the electronic chip according to the output data.

[0010] A second aspect of an embodiment of the present application provides an anti-electromagnetic interference test method for an electronic chip, which is applied to the test system described in the first aspect, and the method includes:

[0011] Outputting a first electromagnetic interference signal through the electromagnetic signal output device;

[0012] When the second electromagnetic interference signal received by the electromagnetic signal receiving device matches the first electromagnetic interference signal, inputting a test signal to the electronic chip to be tested;

[0013] The electromagnetic interference resistance of the electronic chip is determined according to output data obtained by the electronic chip in response to the test signal processing.

[0014] A third aspect of the embodiment of the present application provides an anti-electromagnetic interference test device for an electronic chip, which is applied to the test system described in the first aspect, and the device includes:

[0015] An output module, used for outputting a first electromagnetic interference signal through the electromagnetic signal output device;

[0016] A judgment module, configured to input a test signal to the electronic chip to be tested when the second electromagnetic interference signal received by the electromagnetic signal receiving device matches the first electromagnetic interference signal;

[0017] The determination module is used to determine the anti-electromagnetic interference performance of the electronic chip according to the output data obtained by the electronic chip processing the test signal.

[0018] A fourth aspect of an embodiment of the present application provides a testing device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the method described in the second aspect above when executing the computer program.

[0019] A fifth aspect of an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method described in the second aspect above is implemented.

[0020] A sixth aspect of the embodiments of the present application provides a computer program product. When the computer program product is run on a test device, the test device executes the method described in the second aspect.

[0021] Compared with the prior art, the embodiments of the present application have the following advantages:

[0022] The anti-electromagnetic interference test system in the embodiment of the present application includes a test unit, a control unit and a data processing unit. The test unit includes an electromagnetic signal output device, an electronic chip to be tested and an electromagnetic signal receiving device. The control unit includes a first control module, a second control module and a third control module, wherein: the first control module is used to control the intensity of the electromagnetic interference electromagnetic signal output by the electromagnetic signal output device; the second control module is used to control the electromagnetic signal receiving device to receive the electromagnetic interference signal; the third control module is used to input a test signal to the electronic chip when the electromagnetic signal receiving device receives the electromagnetic interference signal; the data processing unit is used to receive the output data of the electronic chip based on the test signal processing, and determine the anti-electromagnetic interference property of the electronic chip according to the output data.

[0023] By using the above-mentioned anti-electromagnetic interference test system for electronic chips, anti-electromagnetic interference test can be performed on electronic chips. When performing the test, the electromagnetic interference signal output by the electromagnetic signal output device can be controlled by the first control module, so as to create electromagnetic interference for the electronic chip to be tested; the electromagnetic signal can be received by the electromagnetic signal receiving device, so as to judge whether there is electromagnetic interference required for the test in the current environment of the electronic chip according to the received electromagnetic signal; if there is electromagnetic interference required for the test in the current environment, the test signal can be input to the electronic chip; the electronic chip can process the test signal to output data, and based on the output data of the electronic chip, it can be judged whether the electromagnetic interference in the current environment affects the normal operation of the electronic chip, so as to determine the anti-electromagnetic interference performance of the electronic chip. In the embodiment of the present application, when the electronic chip is tested for anti-electromagnetic interference, the devices required to be used are all commonly used devices, the test device is convenient and easy to obtain, and the test method is simple and easy to operate, so that the anti-electromagnetic interference performance of the electronic chip can be tested simply and quickly. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art.

[0025] Figure 1 An anti-electromagnetic interference test system for an electronic chip provided in an embodiment of the present application;

[0026] Figure 2 Another anti-electromagnetic interference test system for electronic chips provided in an embodiment of the present application;

[0027] Figure 3 It is a schematic diagram of the steps of an anti-electromagnetic interference testing method for an electronic chip provided in an embodiment of the present application;

[0028] Figure 4It is a flow chart of another method for testing the electromagnetic interference resistance of an electronic chip provided in an embodiment of the present application;

[0029] Figure 5 is a schematic diagram of an anti-electromagnetic interference testing device for an electronic chip provided in an embodiment of the present application;

[0030] Figure 6 It is a schematic diagram of a testing device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0031] In the following description, specific details such as specific system structures, technologies, etc. are proposed for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from hindering the description of the present application.

[0032] Since the development of the semiconductor industry, its application has penetrated into all walks of life, various products have emerged in an endless stream, and electronic chips have been applied to all aspects of life. For example, commonly used consumer electronics, vehicles, aircraft and other equipment now require the use of electronic chips for data processing. With the cyclical iteration of semiconductors, the weakness of consumer electronics and the vigorous development of new energy vehicles, a large number of chip manufacturers have flocked to the automotive track, setting off a wave of automotive chips; automotive electronic chips used in vehicles need to pass automotive certification, which can include ISO, IATF, AEC-Q, etc., among which AEC-Q100 is widely regarded as the so-called automotive certification.

[0033] In reality, many manufacturers believe that as long as they pass the AEC-Q100 certification, they have reached the so-called "automotive grade", but some manufacturers believe that they need to pass the AEC-Q100+ISO 26262 certification. Some manufacturers claim to have passed the relevant certification but have not yet entered the supply chain of car companies, and even fail to meet the standards during actual testing. Based on this, we can see the actual situation and difficulty of automotive electronic chip certification. Automotive electronic chips require a lot of data for certification and a wide range of data; each data collection method and certification method require strict requirements.

[0034] However, no matter which certification standard is used, automotive electronic chips need to be tested. When testing automotive electronic chips, the anti-electromagnetic interference capability test is one of the test items. At present, the anti-electromagnetic interference capability test of automotive electronic chips is relatively complicated.

[0035] Based on this, the present application provides a system and method for measuring the ability of electronic chips to resist electromagnetic interference, so that the ability of automotive chips to withstand electronic interference can be measured and judged.

[0036] The technical solution of the present application is described below through specific embodiments.

[0037] The present application provides an anti-electromagnetic interference test system for an electronic chip, comprising a test unit, a control unit and a data processing unit.

[0038] The test unit includes an electromagnetic signal output device, an electronic chip to be tested, and an electromagnetic signal receiving device. The electromagnetic signal output device is used to generate electromagnetic interference, and the electromagnetic signal receiving device is used to receive electromagnetic signals. Based on the electromagnetic signals received by the electromagnetic signal receiving device, it can be determined whether the electromagnetic interference currently generated meets the test requirements. The electromagnetic signal receiving device and the electronic chip are in the same test environment. In this test environment, the degree of electromagnetic interference received by the electromagnetic signal receiving device is basically the same as the degree of electromagnetic interference received by the electronic chip. Therefore, the electromagnetic interference intensity received by the electronic chip can be characterized based on the electromagnetic interference signal intensity received by the electromagnetic signal receiving device.

[0039] The electronic chip is a chip to be tested, and the electronic chip can be a vehicle electronic chip, a computer chip, a mobile phone electronic chip, etc. The embodiment of the present application takes the vehicle electronic chip as an example to illustrate the scheme in the present application. Persons skilled in the art should be aware that the electronic chip anti-electromagnetic interference test system and the electronic chip anti-electromagnetic interference test method in the present application can be applied to the anti-electromagnetic interference performance test of other electronic chips.

[0040] In a possible implementation, the test unit can be encapsulated in a signal shielding device, so that the external electromagnetic interference signal can be shielded, so that during the test, the electromagnetic interference to the electromagnetic signal receiving device and the electronic chip comes from the electromagnetic signal output device. For example, the signal shielding device can shield the electromagnetic interference existing in nature and the electromagnetic interference caused by other equipment. After shielding the external electromagnetic interference, during the test, the electromagnetic signal output device can be used to quantify and adjust the strength of the electromagnetic interference signal, which is conducive to quantifying the anti-interference performance of the electronic chip.

[0041] During the test, the wiring of each of the above units can be completed in the above signal shielding device. In addition, since the signal shielding device can shield the signal, the above units can perform data transmission through wired connection.

[0042] In the embodiment of the present application, in order to avoid leakage, the electromagnetic signal output device and the electromagnetic signal receiving device can be grounded, thereby avoiding abnormal test data caused by leakage during the test process.

[0043] The control unit may include a first control module, a second control module and a third control module. Among them: the first control module may be used to control the intensity of the electromagnetic interference electromagnetic signal output by the electromagnetic signal output device. The first control module may be used to provide energy to the electromagnetic signal output device so that the electromagnetic output signal can work normally. In addition, the first control module may include an adjustment device for adjusting the intensity of the electromagnetic interference signal output by the electromagnetic signal output device. For example, the first control module may include a knob, and the tester may turn the knob to adjust the intensity of the electromagnetic interference signal output by the electromagnetic signal output device. In another possible manner, the anti-electromagnetic interference test system of the electronic chip may receive a test script input by the tester, and based on the test script, the test system may issue an intensity adjustment instruction to the first control module, so that the first control module may adjust the electromagnetic interference intensity output by the electromagnetic signal output device according to the intensity adjustment instruction.

[0044] The second control module can be used to control the electromagnetic signal receiving device to receive the electromagnetic interference signal. The second control module can provide energy for the electromagnetic signal receiving device to support the normal operation of the electromagnetic signal receiving device. For example, the second control module can provide power for the electromagnetic signal receiving device.

[0045] The third control module can be used to input a test signal to the electronic chip when the electromagnetic signal receiving device receives an electromagnetic interference signal. The electronic chip can process the input signal to output a signal. When testing, it can be judged whether the electronic chip is resistant to electromagnetic interference by whether the signal output by the electronic chip is normal. Therefore, when testing, a test signal can be input to the electronic chip under an electromagnetic interference environment. The electronic chip can process the input test signal and output a signal. Based on whether the output signal meets expectations, the electromagnetic interference resistance of the electromagnetic signal can be judged.

[0046] In a possible implementation, a test case may be pre-written, and the test case may include multiple test signals, each of which may have a corresponding target output signal. When testing, each test case may be executed to input the test signal to the electronic chip and receive the signal output by the electronic chip.

[0047] The above-mentioned data processing unit can be used to receive the output data obtained by the electronic chip based on the test signal processing, and determine the anti-electromagnetic interference performance of the electronic chip according to the output data. The data processing unit can compare the signal output by the electronic chip with the corresponding target output signal to determine whether the output of the electronic chip is correct. When the output of the electronic chip is correct, it can be determined that the electronic chip has the performance of resisting electromagnetic interference of the corresponding intensity of the current electromagnetic interference signal.

[0048] Exemplarily, the output spectrum information corresponding to the output signal can be obtained through the spectrum processing device, the target signal has the corresponding target spectrum information, the output spectrum information includes the output amplitude, the output period and the output phase, and the target spectrum information includes the target amplitude, the target period and the target phase. If the error value between the output amplitude and the target amplitude is within the amplitude error range, the error value between the output period and the target period is within the period error range, and the error value between the output phase and the target phase is within the phase error range, it can be determined that the output spectrum information matches the target spectrum information. If the output spectrum information matches the target spectrum information, it can be determined that the output signal is the same as the target output signal.

[0049] In another possible implementation, the data processing unit may include a vehicle simulation module, and the data processing unit may send the signal output by the electronic chip to the vehicle simulation module, so that the vehicle simulation module may respond according to the signal. If the response behavior of the vehicle simulation module is consistent with the vehicle response behavior corresponding to the test signal, it can be determined that the output signal is the same as the target output signal.

[0050] When testing based on the above-mentioned anti-electromagnetic interference test system, the intensity of the electromagnetic interference signal output by the electromagnetic signal output device can be adjusted, and then the anti-electromagnetic interference performance of the electronic chip under different intensities can be determined, thereby determining the maximum electromagnetic interference signal intensity that the electronic chip can resist.

[0051] Of course, the names and integration methods of the various unit modules in the above-mentioned electronic chip anti-electromagnetic interference test system may be different. Figure 2 This is another anti-electromagnetic interference test system for electronic chips provided in an embodiment of the present application. Figure 2 As shown, Figure 2 The power system in is equivalent to Figure 1 The control unit in. Figure 2 The spectrum analysis system is the above-mentioned data processing unit. Based on the spectrum analysis system, the spectrum information of the electronic chip output signal can be obtained, so as to determine the anti-electromagnetic interference performance of the electronic chip based on the comparison of the spectrum information.

[0052] like Figure 2As shown, the anti-electromagnetic interference test system can be composed of power system 1, power system 2, power system 3, a small black room and a spectrum analysis system. Among them, the small black room is the above-mentioned signal shielding device. The small black room includes three layers, the first layer is an electromagnetic signal output device, the second layer is an electronic chip, and the third layer is an electromagnetic signal receiving device. Exemplarily, the size of the small black room can be 100mm*10mm*100mm; each layer of the edge of the small black room is at least 5mm tinned to ensure shielding of external electromagnetic interference signals; the first and third layers of the small black room require external grounding wires to avoid leakage; the automotive electronic chips in the second layer should be separated from other components and placed separately on both sides of the circuit board (Printed Circuit Board, PCB); all components and wiring need to be completed inside the small black room.

[0053] The power system 1 provides power for electromagnetic signal transmission to the first layer of the small black room, the power system 2 provides power for the second layer of the small black room for the operation of automotive electronic chips, for example, it can provide the rated current and rated voltage required for the electronic chips to work, the power system 3 provides power for electromagnetic signal reception to the third layer of the small black room, and the spectrum analysis system receives and collects data from the automotive electronic chips after they work. Each system cooperates with each other and works together to finally quantify the test data of the anti-electromagnetic interference ability of automotive electronic chips.

[0054] Based on the above-mentioned test system, the test process can be as follows: the electromagnetic signal transmitting device on the first layer of the small black room is controlled by the adjustable power system 1 to transmit electromagnetic signals of different intensities to the automotive electronic chip; the power system 3 controls the electromagnetic signal receiving device on the third layer of the small black room to confirm that the process of the electromagnetic signal passing through the automotive electronic chip is effective; after confirming the effectiveness of the electromagnetic signal, the power system 2 can control the automotive electronic chip on the second layer of the small black room to be in a working mode; the spectrum analysis system finally collects the data of the automotive electronic chip in various states, and then compares it with the data preset when the system is designed; each part works in sequence to ensure the reliability of the final result of the entire solution.

[0055] The work of each system during the test is as follows:

[0056] Power system 1 provides power for electromagnetic signal transmission for the first layer of the small black room. Power system 1 can control the strength of the electromagnetic transmission signal through knob adjustment, so that the entire automotive electronic chip can work in different environments, thereby obtaining multiple sets of sampling data. And a ground wire can be connected to the periphery of the first layer to reduce the influence of other factors and make the experimental scene closer to the actual situation.

[0057] Power system 3 can provide energy for the electromagnetic signal receiving device on the third floor of the small black room, thereby ensuring that the electromagnetic interference signal of the automotive electronic chip is effective. When the electromagnetic interference signal is confirmed to be effective, it can be activated through power system 2. Similarly, a ground wire needs to be connected to the periphery of the third floor to make the experimental scene closer to reality.

[0058] The power system 2 can provide energy for the second layer of automotive electronic chips in the small black room in normal working mode, and can also use different function buttons to make the chip simulate working in different working modes, so as to obtain data in different scenarios.

[0059] The spectrum analysis system can store the collected working data of automotive electronic chips in various states, and then compare it with the data preset by the system when the chip was designed, so as to determine the anti-electromagnetic interference ability of the electronic chip based on the experimental data. When comparing data, the comparison can be made by the waveform, amplitude, period and / or phase of the signal.

[0060] During the working process of the anti-electromagnetic interference test system, the entire small black room needs to be carried out in a closed environment during the experimental stage, and the automotive electronic chips need to be set inside the small black room to reduce the impact of other factors on electromagnetic waves, avoid human interference, and greatly improve the accuracy of test data.

[0061] The devices used in the anti-electromagnetic interference testing system in the embodiments of the present application are all simple and common devices, and the anti-electromagnetic interference performance of electronic chips can be tested by simple devices, thereby efficiently, quickly and accurately testing electronic chips.

[0062] The anti-electromagnetic interference test system described above can be used to test the anti-electromagnetic interference performance of electronic chips.

[0063] Reference Figure 3 , shows a schematic flow chart of the steps of an anti-electromagnetic interference test method for an electronic chip provided in an embodiment of the present application, which may specifically include the following steps:

[0064] S301, outputting a first electromagnetic interference signal through the electromagnetic signal output device.

[0065] The method in the embodiment of the present application can be applied to the anti-electromagnetic interference test system of the above-mentioned electronic chip, and the anti-electromagnetic interference test system of the above-mentioned electronic chip can be deployed in an electronic device, and the execution of the system is controlled by the electronic device. The electronic device is a test device, and the embodiment of the present application does not limit the specific type of the test device. Exemplarily, the test device can be a computer, and the computer can deploy the test software of the anti-electromagnetic interference test system of the electronic chip, and be wired to each module and unit in the anti-electromagnetic interference test system of the electronic chip. The test software in the computer may include a test interface, and the test interface may include test parameters. The user can enter the test script and test case in the test interface, so that the test software in the computer can call each module and unit in the anti-electromagnetic interference test system based on the test script and the test case, and obtain the test data of each module and unit in the anti-electromagnetic interference test system through a wired connection, so as to perform anti-electromagnetic interference test on the electronic chip.

[0066] In a possible implementation, a tester may pre-write a test script and a test case, wherein the test case may include the electromagnetic interference signal strength, a test signal input to the electronic chip, and a target output instruction corresponding to the test signal.

[0067] The test equipment can call various modules and units in the anti-electromagnetic interference test system of the electronic chip by executing the test script, so as to test the electronic chip.

[0068] The test equipment can adjust the electromagnetic signal output device according to the electromagnetic interference signal strength in the test case, so as to output the corresponding first electromagnetic interference signal.

[0069] S302: When the second electromagnetic interference signal received by the electromagnetic signal receiving device matches the first electromagnetic interference signal, input a test signal to the electronic chip to be tested.

[0070] After the electromagnetic signal output device outputs the first electromagnetic interference signal, the test device can call the second control module so that the electromagnetic signal receiving device receives the second electromagnetic interference signal. The test device can compare the received second electromagnetic interference signal with the first electromagnetic interference signal to determine whether the electromagnetic interference signal in the current test environment is consistent with the test case.

[0071] If the error value between the second electromagnetic interference signal and the first electromagnetic interference signal is within the preset error range, the test device can determine that the electromagnetic interference signal in the current test environment is consistent with the electromagnetic interference signal strength required in the test case. If the error value between the second electromagnetic interference signal and the first electromagnetic interference signal is not within the preset error range, the test device can determine that the electromagnetic interference signal in the current test environment does not reach the electromagnetic interference signal strength required in the test case.

[0072] After waiting for a preset time, if the electromagnetic interference signal in the current test environment still does not reach the electromagnetic interference signal strength required in the test case, an error prompt may be given to prompt the tester to check each test device.

[0073] When the electromagnetic interference signal in the current test environment is consistent with the electromagnetic interference signal strength required in the test case, a test signal can be input into the electronic chip according to the test case, thereby testing the electronic chip.

[0074] The electronic chip may be a vehicle electronic chip. The test signal may be vehicle parameter information, such as vehicle speed, remaining fuel, brake signal, throttle signal, etc. The vehicle parameter information is input into the electronic chip as a test signal, and the electronic chip may process the vehicle parameter information and output instructions.

[0075] S303: Determine the electromagnetic interference resistance of the electronic chip according to output data obtained by the electronic chip in response to the test signal processing.

[0076] In one possible implementation, the output data may be the output voltage and output current of the electronic chip. By comparing the output voltage with the target voltage and the output current with the target current, the anti-electromagnetic interference performance of the electronic chip can be determined. The target voltage is the voltage that can be output by the electronic chip in the absence of electromagnetic interference; the target current is the current that can be output by the electronic chip in the absence of electromagnetic interference. If the error between the output voltage and the target voltage is within a preset range, and the error between the output current and the target current is within a preset range, it can be determined that the electronic chip cannot resist the electromagnetic interference of the intensity corresponding to the first electromagnetic interference signal.

[0077] The test equipment can obtain the instructions output by the electronic chip after processing the vehicle parameter information; then compare the instructions output by the electronic chip with the target output instructions to determine whether the instructions output by the electronic chip are the same as the target output instructions; if the instructions output by the electronic chip are the same as the target output instructions, it is determined that the electronic chip has the performance of resisting electromagnetic interference of the intensity corresponding to the first electromagnetic interference signal; if the instructions output by the electronic chip are different from the target output instructions, it is determined that the electronic chip cannot resist electromagnetic interference of the intensity corresponding to the first electromagnetic interference signal.

[0078] The target output instruction may have corresponding target spectrum information. The data processing unit may be a spectrum processing device, and the test equipment may obtain the output spectrum information corresponding to the instruction through the spectrum processing device; the output spectrum information is compared with the target spectrum information to determine whether the output spectrum information matches the target spectrum information; if the output spectrum information matches the target spectrum information, it can be determined that the instruction is the same as the target output instruction.

[0079] Exemplarily, the output spectrum information includes output amplitude, output period and output phase, and the target spectrum information includes target amplitude, target period and target phase. If the error value between the output amplitude and the target amplitude is within the amplitude error range, the error value between the output period and the target period is within the period error range, and the error value between the output phase and the target phase is within the phase error range, then it is determined that the output spectrum information matches the target spectrum information.

[0080] In another possible implementation, the data processing unit may include a vehicle simulation module, and the data processing unit may send the instruction output by the electronic chip to the vehicle simulation module, so that the vehicle simulation module may respond according to the instruction to obtain a first response behavior. Send the target output instruction to the vehicle simulation module, so that the vehicle simulation module may respond according to the target output instruction to obtain a second response behavior. If the first response behavior of the vehicle simulation module is consistent with the second response behavior, it can be determined that the output instruction is the same as the target output instruction.

[0081] During the testing process, the testing equipment can adjust the strength of the first electromagnetic interference signal according to each test case; then, based on the above steps S301-S303, determine the anti-electromagnetic interference performance of the electronic chip under the first electromagnetic interference signals of different intensities; based on the anti-electromagnetic interference performance of the electronic chip under the first electromagnetic interference signals of different intensities, determine the maximum anti-electromagnetic interference strength of the electronic chip.

[0082] The embodiments of the present application can conveniently and quickly complete the test of the anti-electromagnetic interference capability of the electronic chip through a simple device, and quantify the anti-electromagnetic interference capability of the electronic chip, thereby improving the accuracy of the test results.

[0083] It should be noted that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0084] In order to better illustrate the solution in this application, the test method provided in this application is described below through a specific example. Figure 4, shows a flow chart of another method for testing the electromagnetic interference resistance of an electronic chip provided in an embodiment of the present application. Figure 4 As shown, when performing an anti-electromagnetic interference test on an electronic chip, an electromagnetic signal can be emitted first, and then received to determine whether the electromagnetic signal is received; if the electromagnetic signal is not received, the cause can be checked. If the electromagnetic signal is received, the electronic chip can be controlled to work, and after the electronic chip works, the spectrum data of the output signal of the electronic chip can be collected, and then the anti-electromagnetic interference performance can be judged based on the spectrum data.

[0085] pass Figure 4 The method in the present invention can simply and quantitatively create an electromagnetic interference environment for the electronic chip, and compare the signals output by the electronic chip, so as to conveniently, accurately and efficiently test the anti-electromagnetic interference performance of the electronic chip.

[0086] Reference Figure 5 , shows a schematic diagram of an anti-electromagnetic interference test device for an electronic chip provided in an embodiment of the present application, which is applied to the anti-electromagnetic interference test system for the electronic chip mentioned above, and may specifically include an output module 51, a judgment module 52 and a determination module 53, wherein:

[0087] An output module 51, configured to output a first electromagnetic interference signal through the electromagnetic signal output device;

[0088] A judgment module 52, configured to input a test signal to the electronic chip to be tested when the second electromagnetic interference signal received by the electromagnetic signal receiving device matches the first electromagnetic interference signal;

[0089] The determination module 53 is used to determine the anti-electromagnetic interference performance of the electronic chip according to the output data obtained by the electronic chip in processing the test signal.

[0090] In a possible implementation, the electronic chip is a vehicle electronic chip, and the determination module 52 includes:

[0091] An acquisition submodule, used to acquire vehicle parameter information for testing;

[0092] The input submodule is used to input the vehicle parameter information into the electronic chip as the test signal.

[0093] In a possible implementation, the vehicle parameter information has a corresponding target output instruction, and the determination module 53 includes:

[0094] An instruction determination submodule, used for obtaining the instruction output by the electronic chip after processing the vehicle parameter information;

[0095] An instruction comparison submodule, used to compare the instruction with the target output instruction to determine whether the instruction is the same as the target output instruction;

[0096] The performance determination submodule is used to determine whether the electronic chip has the performance of resisting electromagnetic interference of the intensity corresponding to the first electromagnetic interference signal if the instruction is the same as the target output instruction.

[0097] In a possible implementation, the data processing unit includes a spectrum processing device, the target output instruction has corresponding target spectrum information, and the instruction comparison submodule includes:

[0098] A spectrum information determining unit, configured to obtain output spectrum information corresponding to the instruction through the spectrum processing device;

[0099] A spectrum information comparison unit, used to compare the output spectrum information with the target spectrum information to determine whether the output spectrum information matches the target spectrum information;

[0100] A judgment unit is used to determine that the instruction is the same as the target output instruction if the output spectrum information matches the target spectrum information.

[0101] In a possible implementation, the output spectrum information includes an output amplitude, an output period, and an output phase, the target spectrum information includes a target amplitude, a target period, and a target phase, and the spectrum information comparison unit includes:

[0102] A comparison subunit is used to determine that the output spectrum information matches the target spectrum information if the error value between the output amplitude and the target amplitude is within the amplitude error range, the error value between the output period and the target period is within the period error range, and the error value between the output phase and the target phase is within the phase error range.

[0103] In a possible implementation, the above device further includes:

[0104] An interference intensity adjustment module, used to adjust the intensity of the first electromagnetic interference signal;

[0105] an electromagnetic interference resistance determination module, used to determine the electromagnetic interference resistance of the electronic chip under the first electromagnetic interference signal of different strengths;

[0106] The maximum anti-electromagnetic interference strength determination module is used to determine the maximum anti-electromagnetic interference strength of the electronic chip based on the anti-electromagnetic interference performance of the electronic chip under the first electromagnetic interference signals of different strengths.

[0107] As for the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the description of the method embodiment part.

[0108] Figure 6 This is a schematic diagram of the structure of a test device provided in an embodiment of the present application. Figure 6 As shown, the test device 6 of this embodiment includes: at least one processor 60 ( Figure 6 Only one is shown in the figure), a memory 61, and a computer program 62 stored in the memory 61 and executable on the at least one processor 60, wherein the processor 60 implements the steps of any of the above-mentioned method embodiments when executing the computer program 62.

[0109] The test device 6 may include, but is not limited to, a processor 60 and a memory 61. Those skilled in the art will appreciate that Figure 6 It is only an example of the test device 6 and does not constitute a limitation on the test device 6. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, it may also include input and output devices, network access devices, etc.

[0110] The processor 60 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0111] In some embodiments, the memory 61 may be an internal storage unit of the test device 6, such as a hard disk or memory of the test device 6. In other embodiments, the memory 61 may also be an external storage device of the test device 6, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the test device 6. Further, the memory 61 may also include both an internal storage unit and an external storage device of the test device 6. The memory 61 is used to store an operating system, an application program, a boot loader (BootLoader), data, and other programs, such as the program code of the computer program, etc. The memory 61 may also be used to temporarily store data that has been output or is to be output.

[0112] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in the above-mentioned method embodiments can be implemented.

[0113] An embodiment of the present application provides a computer program product. When the computer program product is run on a test device, the test device can implement the steps in the above-mentioned method embodiments when the computer program product is executed.

[0114] The above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application is described in detail with reference to the above-mentioned embodiments, a person skilled in the art should understand that the technical solutions described in the above-mentioned embodiments can still be modified, or some of the technical features can be replaced by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. An anti-electromagnetic interference test system for electronic chips, characterized in that: It includes a test unit, a control unit and a data processing unit. The test unit includes an electromagnetic signal output device, an electronic chip to be tested and an electromagnetic signal receiving device. The control unit includes a first control module, a second control module and a third control module, wherein: The first control module is used to control the intensity of the electromagnetic interference signal output by the electromagnetic signal output device; The second control module is used to control the electromagnetic signal receiving device to receive the electromagnetic interference signal; The third control module is used to input a test signal to the electronic chip when the electromagnetic signal receiving device receives the electromagnetic interference signal; The data processing unit is used to receive output data obtained by the electronic chip based on the test signal processing, and determine the anti-electromagnetic interference performance of the electronic chip according to the output data; Among them, the data processing unit includes a vehicle simulation module, and the data processing unit sends the signal output by the electronic chip to the vehicle simulation module. The vehicle simulation module responds according to the signal. If the response behavior of the vehicle simulation module is consistent with the vehicle response behavior corresponding to the test signal, it is determined that the output signal is the same as the target output signal, and the electronic chip has the performance of resisting electromagnetic interference of the intensity corresponding to the current electromagnetic interference signal.

2. The system according to claim 1, characterized in that The test unit is packaged in a signal shielding device, and the signal shielding device is used to shield external electromagnetic interference signals.

3. A method for testing the anti-electromagnetic interference of an electronic chip, characterized in that: Applied to the test system of claim 1 or 2, the method comprises: Outputting a first electromagnetic interference signal through the electromagnetic signal output device; When the second electromagnetic interference signal received by the electromagnetic signal receiving device matches the first electromagnetic interference signal, inputting a test signal to the electronic chip to be tested; The electromagnetic interference resistance of the electronic chip is determined according to output data obtained by the electronic chip in response to the test signal processing.

4. The method according to claim 3, characterized in that The electronic chip is a vehicle electronic chip, and the step of inputting a test signal to the electronic chip to be tested includes: Obtain vehicle parameter information for testing; The vehicle parameter information is input into the electronic chip as the test signal.

5. The method according to claim 4, characterized in that The vehicle parameter information has a corresponding target output instruction, and the anti-electromagnetic interference performance of the electronic chip is determined according to the output data obtained by the electronic chip for processing the test signal, including: Obtaining instructions output by the electronic chip after processing the vehicle parameter information; Comparing the instruction with the target output instruction to determine whether the instruction is the same as the target output instruction; If the instruction is the same as the target output instruction, it is determined that the electronic chip has the ability to resist electromagnetic interference of a strength corresponding to the first electromagnetic interference signal.

6. The method according to claim 5, characterized in that The data processing unit includes a spectrum processing device, the target output instruction has corresponding target spectrum information, and the instruction is compared with the target output instruction to determine whether the instruction is the same as the target output instruction, including: Obtaining output spectrum information corresponding to the instruction through the spectrum processing device; Comparing the output spectrum information with the target spectrum information to determine whether the output spectrum information matches the target spectrum information; If the output spectrum information matches the target spectrum information, it is determined that the instruction is the same as the target output instruction.

7. The method according to claim 6, characterized in that The output spectrum information includes an output amplitude, an output period, and an output phase, the target spectrum information includes a target amplitude, a target period, and a target phase, and the comparing the output spectrum information with the target spectrum information to determine whether the output spectrum information matches the target spectrum information includes: If the error value between the output amplitude and the target amplitude is within the amplitude error range, the error value between the output period and the target period is within the period error range, and the error value between the output phase and the target phase is within the phase error range, it is determined that the output spectrum information matches the target spectrum information.

8. The method according to any one of claims 4 to 7, characterized in that: The method further comprises: adjusting the strength of the first electromagnetic interference signal; Determining the electromagnetic interference resistance of the electronic chip under the first electromagnetic interference signal of different intensities; Based on the electromagnetic interference resistance of the electronic chip under the first electromagnetic interference signals of different strengths, the maximum electromagnetic interference resistance strength of the electronic chip is determined.

9. A test device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the method according to any one of claims 3 to 8 is implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 3 to 8 is implemented.

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