IGCT Dynamic Performance Test Circuit and Device

Abstract

This application relates to an IGCT dynamic performance test circuit and device. The IGCT test main circuit can apply a test electrical signal to the IGCT device to be tested. Each auxiliary circuit is respectively connected to the IGCT test main circuit through a corresponding switching device. When the switching device between any one auxiliary circuit and the IGCT test main circuit is turned on and the switching devices between other auxiliary circuits and the IGCT test main circuit are turned off, the turned-on auxiliary circuit corresponding to the switching device is used to assist the IGCT test main circuit to perform dynamic performance tests on the IGCT device to be tested. Moreover, the types of dynamic performance tests realized by different auxiliary circuits are configured to be different from each other. In this way, two or more types of dynamic performance tests of the IGCT device to be tested can be realized in the same IGCT dynamic performance test circuit, reducing the number of press-fitting times of the IGCT device during dynamic performance tests, simplifying the test process, and thus effectively reducing the risk of failure of the IGCT device.

Description

Technical Field

[0001] The present application relates to the technical field of electrical parameter testing of power electronic devices, and in particular to an IGCT dynamic performance testing circuit and device. Background Art

[0002] Integrated Gate-Commutated Thyristor (IGCT), also known as GCT (Gate-Commutated Thyristor), combines the advantages of IGBT (Insulate-Gate Bipolar Transistor) and GTO (Gate Turn-Off Thyristor). Its capacity is comparable to that of GTO, but its switching speed is faster. IGCT devices are gradually being used in the field of power transmission and transformation due to their large capacity, high reliability, and low production cost.

[0003] According to the device type, IGCT is mainly divided into asymmetric (AS) IGCT, reverse conducting (RC) IGCT and reverse blocking (RB) IGCT. The dynamic characteristics of IGCT devices are an indispensable part of the device application process.

[0004] However, in the related art, the dynamic performance of the IGCT requires multiple press-fit tests on the IGCT, which results in a relatively complicated testing process and increases the risk of IGCT device failure. Summary of the invention

[0005] Based on this, it is necessary to provide an IGCT dynamic performance test circuit and device to reduce the risk of IGCT device failure during dynamic performance testing.

[0006] In the first aspect, the IGCT dynamic performance test circuit provided by the present application includes: a switching device, an IGCT test main circuit and more than two auxiliary circuits, the IGCT test main circuit is used to apply a test electrical signal to the IGCT device to be tested; each of the auxiliary circuits is connected to the IGCT test main circuit through the corresponding switching device; when the switching device between any one of the auxiliary circuits and the IGCT test main circuit is turned on and the switching devices between other auxiliary circuits and the IGCT test main circuit are disconnected, the auxiliary circuit corresponding to the turned-on switching device is used to assist the IGCT test main circuit in performing a dynamic performance test on the IGCT device to be tested; wherein the types of dynamic performance tests assisted by different auxiliary circuits are different.

[0007] In one embodiment, the IGCT test main circuit includes a power supply, an inductor, an inductive load and an IGCT branch to be tested, the first end of the power supply is connected to the first end of the inductor, the second end of the inductor is connected to the first end of the inductive load, the first end of the inductive load is also connected to the first end of the IGCT branch to be tested, the second end of the inductive load is connected to the second end of the IGCT branch to be tested, and the third end of the IGCT branch to be tested is connected to the second end of the power supply.

[0008] In one embodiment, the auxiliary circuit includes a clamping circuit and an energy absorption circuit, the switching device includes a first switching device, a second switching device and a third switching device, the first end of the clamping circuit is connected to the first end of the power supply and the first end of the inductor through the first switching device, the second end of the clamping circuit is connected to the second end of the inductor and the first end of the inductive load through the second switching device, and the third end of the clamping circuit is connected to the second end of the power supply and the third end of the IGCT branch to be tested; the first end of the energy absorption circuit is connected to the second end of the IGCT branch to be tested through the third switching device, and the second end of the energy absorption circuit is connected to the third end of the IGCT branch to be tested.

[0009] In one embodiment, the auxiliary circuit further includes a first resistor-capacitor circuit and a second resistor-capacitor circuit, and the switch device further includes a fourth switch device and a fifth switch device, the first end of the first resistor-capacitor circuit is connected to the first end of the IGCT branch to be tested through the fourth switch device, the second end of the first resistor-capacitor circuit is connected to the second end of the IGCT branch to be tested, the first end of the second resistor-capacitor circuit is connected to the second end of the IGCT branch to be tested through the fifth switch device, and the second end of the second resistor-capacitor circuit is connected to the third end of the IGCT branch to be tested.

[0010] In one embodiment, the IGCT branch to be tested includes an auxiliary power switch, a first IGCT device to be tested, a sixth switch device and a first gate driver, the cathode of the first IGCT device to be tested is connected to the first end of the inductive load and the fourth switch device through the sixth switch device, the anode of the first IGCT device to be tested is connected to the second end of the inductive load, the second end of the first resistor-capacitor circuit and the fifth switch device, the anode of the first IGCT device to be tested is also connected to the first end of the auxiliary power switch, the second end of the auxiliary power switch is connected to the third end of the clamping circuit and the second end of the second resistor-capacitor circuit, and the gate of the first IGCT device to be tested is connected to the first gate driver.

[0011] In one embodiment, the IGCT branch to be tested includes a freewheeling diode, a seventh switching device, a second gate driver and a second IGCT device to be tested, the cathode of the freewheeling diode is connected to the first end of the inductive load through the seventh switching device, the anode of the freewheeling diode is connected to the second end of the inductive load and the first end of the energy absorption circuit, the anode of the freewheeling diode is also connected to the anode of the second IGCT device to be tested, the cathode of the second IGCT device to be tested is connected to the third end of the clamping circuit and the second end of the energy absorption circuit, and the gate of the second IGCT device to be tested is connected to the second gate driver.

[0012] In one embodiment, the clamping circuit includes a first diode, a first resistor and a first capacitor, wherein a first end of the first resistor is connected to a first end of a power supply and a first end of the inductor through the first switching device, an anode of the first diode is connected to a second end of the inductor and a first end of the inductive load through the second switching device, a first end of the first capacitor is connected to a cathode of the first diode and a second end of the first resistor, and a second end of the first capacitor is connected to a second end of the power supply and a third end of the IGCT branch to be tested.

[0013] In one embodiment, the energy absorption circuit includes a second resistor, a second capacitor and a lightning arrester, wherein the first end of the second resistor is connected to the first end of the second capacitor, the second end of the second resistor is connected to the first end of the lightning arrester and the second end of the IGCT branch to be tested, and the second end of the second capacitor is connected to the second end of the lightning arrester and the third end of the IGCT branch to be tested;

[0014] Or, the energy absorption circuit includes a second resistor, a second capacitor, a second diode and a lightning arrester, the first end of the second resistor is connected to the first end of the second capacitor and the cathode of the second diode, the second end of the second resistor is connected to the anode of the second diode, the first end of the lightning arrester and the second end of the IGCT branch to be tested, and the second end of the second capacitor is connected to the second end of the lightning arrester and the third end of the IGCT branch to be tested.

[0015] In one embodiment, the first RC circuit and the second RC circuit have the same structure and include a third resistor and a third capacitor connected in series.

[0016] In the second aspect, the IGCT dynamic performance testing device provided in the present application includes a test signal processor and the above-mentioned IGCT dynamic performance testing circuit, wherein the test signal processor is used to obtain the operating parameters of the IGCT device to be tested during the dynamic performance test, and perform dynamic performance analysis on the IGCT device to be tested based on the operating parameters.

[0017] The above-mentioned IGCT dynamic performance test circuit and device include a switch device, an IGCT test main circuit and two or more auxiliary circuits. The IGCT test main circuit can apply a test electrical signal to the IGCT device to be tested; each auxiliary circuit is connected to the IGCT test main circuit through a corresponding switch device. When the switch device between any auxiliary circuit and the IGCT test main circuit is turned on and the switch device between other auxiliary circuits and the IGCT test main circuit is turned off, the auxiliary circuit corresponding to the turned-on switch device is used to assist the IGCT test main circuit in performing a dynamic performance test on the IGCT device to be tested. In addition, the types of dynamic performance tests assisted by different auxiliary circuits are configured to be different from each other. Through this solution, two or more dynamic performance tests of the IGCT device to be tested can be implemented in the same IGCT dynamic performance test circuit, and it is not necessary to press-fit the IGCT device to be tested every time a dynamic performance test is performed, which simplifies the test process and reduces the number of press-fits of the IGCT device during the dynamic performance test, thereby effectively reducing the risk of IGCT device failure. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0019] Figure 1 This is a structural block diagram of an IGCT dynamic performance test circuit in an embodiment of the present application;

[0020] Figure 2 This is a schematic diagram of the main circuit structure of the IGCT test in one embodiment of the present application;

[0021] Figure 3 This is a schematic diagram of the structure of an IGCT dynamic performance test circuit in an embodiment of the present application;

[0022] Figure 4 This is a schematic diagram of the structure of an IGCT dynamic performance test circuit in another embodiment of the present application;

[0023] Figure 5 Schematic diagram of the clamping circuit structure in one embodiment of the present application;

[0024] Figure 6 This is a schematic diagram of a conventional switch characteristic test result curve in an embodiment of the present application;

[0025] Figure 7 This is a schematic diagram of a conventional switch characteristic test result curve in another embodiment of the present application;

[0026] Figure 8 This is a schematic diagram of the structure of an energy absorption circuit in one embodiment of the present application;

[0027] Fig. 9 This is a schematic diagram of the structure of an energy absorption circuit in another embodiment of the present application;

[0028] Fig.10 This is a schematic diagram of an equivalent structure of a reverse recovery characteristic test circuit in an embodiment of the present application;

[0029] Fig.11 This is a schematic diagram of a reverse recovery characteristic test result curve in an embodiment of the present application;

[0030] Fig.12 This is a schematic diagram of the structure of an IGCT dynamic performance test circuit in another embodiment of the present application;

[0031] Fig.13 This is a schematic diagram of the structure of the IGCT dynamic performance test circuit in another embodiment of the present application.

[0032] Description of reference numerals:

[0033] 100-IGCT test main circuit, 200-switching device, 300-auxiliary circuit, VDC-power supply, Li-inductor, Lload-inductive load, 110-IGCT branch to be tested; 310-clamping circuit, 320-energy absorption circuit, 330-first resistor-capacitor circuit, 340-second resistor-capacitor circuit, K1-first switching device, K2-second switching device, K3-third switching device, K4-fourth switching device, K5-fifth switching device, K6-sixth switching device, K7-seventh switching device, 112-first gate driver, 111-second gate driver, DX-freewheeling diode, DUT1-first IGCT device to be tested, DUT2-second IGCT device to be tested, AUX-auxiliary power switch; D1-first diode, D2-second diode, R1-first resistor, R2-second resistor, R3-third resistor, C1-first capacitor, C2-second capacitor, MOV-lightning arrester. DETAILED DESCRIPTION

[0034] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0035] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0036] It is understood that the terms "first", "second", etc. used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish a first element from another element. For example, without departing from the scope of this application, a first resistor may be referred to as a second resistor, and similarly, a second resistor may be referred to as a first resistor. Both the first resistor and the second resistor are resistors, but they are not the same resistor.

[0037] It can be understood that the “connection” in the following embodiments should be understood as “electrical connection”, “communication connection”, etc. if the connected circuits, modules, units, etc. have electrical signals or data transmission between each other.

[0038] It can be understood that “at least one” means one or more, “plurality” means two or more, and “at least part of an element” means part or all of an element.

[0039] When used herein, the singular forms "a", "an", and "said / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" and the like specify the presence of stated features, wholes, steps, operations, components, parts, or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts, or combinations thereof. At the same time, the term "and / or" used in this specification includes any and all combinations of the relevant listed items.

[0040] The IGCT dynamic performance test circuit provided in the present application is used for the dynamic performance test of the IGCT. It can be understood that the dynamic performance of the IGCT will be different depending on the specific type of the IGCT. In one embodiment, for AS IGCT, RCIGCT and RB IGCT, the IGCT dynamic performance test circuit of this embodiment can be used to implement conventional switching characteristic test and limit shutdown capability test. Furthermore, for RB IGCT, the IGCT dynamic performance test circuit of the present application can also be used to implement its reverse recovery characteristic test. There is no specific limitation, and it can be selected in combination with the actual scenario.

[0041] Please refer to Figure 1The IGCT dynamic performance test circuit provided in the present application includes: a switching device 200, an IGCT test main circuit 100 and two or more auxiliary circuits 300, the IGCT test main circuit 100 is used to apply a test electrical signal to the IGCT device to be tested; each auxiliary circuit 300 is connected to the IGCT test main circuit 100 through the corresponding switching device 200; when the switching device 200 between any auxiliary circuit 300 and the IGCT test main circuit 100 is turned on and the switching devices 200 between other auxiliary circuits 300 and the IGCT test main circuit 100 are disconnected, the auxiliary circuit 300 corresponding to the turned-on switching device 200 is used to assist the IGCT test main circuit 100 in performing a dynamic performance test on the IGCT device to be tested; wherein, the types of dynamic performance tests assisted by different auxiliary circuits 300 are different from each other.

[0042] Specifically, the switch device 200 is a device with on and off functions. The IGCT test main circuit 100 is a circuit that provides a test electrical signal for the IGCT to be tested during the dynamic performance test. The IGCT device to be tested can be used as a part of the IGCT test main circuit 100, or can be set up as an independent IGCT test main circuit 100, and there is no specific limitation. The auxiliary circuit 300 is connected to the IGCT test main circuit 100, and cooperates with the IGCT test main circuit 100 to simulate the circuit of the IGCT device to be tested in different test states.

[0043] In the solution of this embodiment, each auxiliary circuit 300 is configured with a switch device 200, and the auxiliary circuit 300 is connected to the IGCT test main circuit 100 through the corresponding switch device 200. When there is a test requirement, the corresponding dynamic performance test can be implemented by turning on the switch device 200 between the auxiliary circuit 300 and the IGCT test main circuit 100. When there is no test requirement, the corresponding auxiliary circuit 300 can be removed from the IGCT dynamic performance test circuit by simply disconnecting the corresponding switch device 200. Specifically, in order to realize multiple dynamic performance tests, in the IGCT dynamic performance test circuit, multiple auxiliary circuits 300 capable of realizing different auxiliary functions are configured. In actual scenarios, it is only necessary to control one of the auxiliary circuits 300 to be turned on and connected to complete the dynamic performance test of the IGCT device to be tested of the corresponding type of the auxiliary circuit 300.

[0044] In this way, compared with the method of press-installing the IGCT device to be tested into different test circuits for each dynamic performance test, the number of press-installations of the IGCT device to be tested is greatly reduced. Through this method, only one press-installation is required to complete all dynamic performance tests of the IGCT device to be tested. While reducing the risk of failure of the IGCT device to be tested due to press-installation, it also has a higher test efficiency.

[0045] It should be pointed out that the specific type of the switching device 200 is not unique. It can be a manual switch, that is, a switch that is manually controlled to be turned on and off by a tester. In another embodiment, the switching device 200 can also be a controllable switch, that is, a switch that performs the on and off functions through a signal sent by a controller or processor. The specific selection can be made based on actual needs and is not limited here.

[0046] The above-mentioned IGCT dynamic performance test circuit includes a switch device 200, an IGCT test main circuit 100 and two or more auxiliary circuits 300. The IGCT test main circuit 100 can apply a test electrical signal to the IGCT device to be tested; each auxiliary circuit 300 is connected to the IGCT test main circuit 100 through the corresponding switch device 200. When the switch device 200 between any auxiliary circuit 300 and the IGCT test main circuit 100 is turned on and the switch device 200 between other auxiliary circuits 300 and the IGCT test main circuit 100 is turned off, the auxiliary circuit 300 corresponding to the turned-on switch device 200 is used to assist the IGCT test main circuit 100 in performing dynamic performance test on the IGCT device to be tested. In addition, the dynamic performance test types assisted by different auxiliary circuits 300 are configured to be different from each other. Through this solution, two or more dynamic performance tests of the IGCT device to be tested can be implemented in the same IGCT dynamic performance test circuit. There is no need to press-install the IGCT device to be tested every time the dynamic performance test is performed, which simplifies the test process and reduces the number of press-installations of the IGCT device during the dynamic performance test, thereby effectively reducing the risk of failure of the IGCT device.

[0047] See also Figure 2 In one embodiment, the IGCT test main circuit 100 includes a power supply VDC, an inductor Li, an inductive load Lload and an IGCT branch to be tested 110, a first end of the power supply VDC is connected to a first end of the inductor Li, a second end of the inductor Li is connected to a first end of the inductive load Lload, a first end of the inductive load Lload is also connected to a first end of the IGCT branch to be tested 110, a second end of the inductive load Lload is connected to a second end of the IGCT branch to be tested 110, and a third end of the IGCT branch to be tested 110 is connected to a second end of the power supply VDC.

[0048] Specifically, the IGCT branch 110 to be tested is a branch configured with an IGCT device. The IGCT device can be the IGCT device to be tested or an IGCT device used to assist in the test, and there is no specific limitation. Depending on the actual test scenario, the specific structure of the IGCT branch 110 to be tested will also be different, and it can be configured in combination with the actual test requirements. In the scheme of this embodiment, the inductor Li is used to limit the current rise rate of the IGCT device in the IGCT branch 110 to be tested when it is turned on, thereby improving the operational reliability of the test circuit. The type of inductive load Lload is not unique. In a more detailed embodiment, an inductor can be used as the inductive load Lload.

[0049] Specifically, the IGCT device can be configured between the second end and the third end of the IGCT branch 110 to be tested, and a freewheeling component is configured between the first end and the second end of the IGCT branch 110 to be tested. The first end of the power supply VDC can be the positive end of the power supply VDC, and the second end of the power supply VDC is the negative end of the power supply VDC. The negative end of the power supply VDC can be further grounded. In this way, when the IGCT device in the IGCT branch 110 to be tested is turned on for the first time, the power supply VDC generates a gradually increasing current through the inductor Li and the inductive load Lload, and flows through the IGCT device. After the current increases to a set value, the IGCT device can be turned off so that the current of the inductive load Lload is switched to the freewheeling component of the IGCT branch 110 to be tested for freewheeling. After the IGCT device is completely turned off, the IGCT device is turned on again, and the current of the inductive load Lload flows into the IGCT device again. In this way, the dynamic performance test is achieved by detecting the voltage and current flowing through the IGCT, or detecting the voltage and current flowing through the freewheeling component.

[0050] The above scheme uses power supply VDC, inductor Li, inductive load Lload and IGCT branch 110 to build an IGCT test main circuit 100 to simulate different working conditions of IGCT. It can cooperate with the auxiliary circuit 300 to realize various dynamic performance tests. The circuit structure is simple and the circuit cost is effectively saved.

[0051] See also Figure 3In one embodiment, the auxiliary circuit 300 includes a clamping circuit 310 and an energy absorption circuit 320, and the switch device 200 includes a first switch device K1, a second switch device K2, and a third switch device K3. The first end of the clamping circuit 310 is connected to the first end of the power supply VDC and the first end of the inductor Li through the first switch device K1, the second end of the clamping circuit 310 is connected to the second end of the inductor Li and the first end of the inductive load Lload through the second switch device K2, and the third end of the clamping circuit 310 is connected to the second end of the power supply VDC and the third end of the IGCT branch 110 to be tested; the first end of the energy absorption circuit 320 is connected to the second end of the IGCT branch 110 to be tested through the third switch device K3, and the second end of the energy absorption circuit 320 is connected to the third end of the IGCT branch 110 to be tested.

[0052] Specifically, the clamping circuit 310 is a circuit that can clamp the voltage to a certain voltage value at the turn-off transient state during the conventional switching characteristic test of the IGCT device. Thus, by connecting the clamping circuit 310, the conventional switching characteristic test of the IGCT device can be implemented in cooperation with the IGCT test main circuit 100. The energy absorption circuit 320 is a circuit that transfers and stores the overvoltage energy of the IGCT device at the turn-off transient state during the extreme turn-off capability test of the IGCT device to protect the IGCT device from overvoltage. Thus, by connecting the energy absorption circuit 320, the extreme turn-off capability test of the IGCT device can be implemented in cooperation with the IGCT test main circuit 100.

[0053] In the solution of this embodiment, the auxiliary circuit 300 includes a clamping circuit 310 and an energy absorption circuit 320. The clamping circuit 310 is connected to the test main circuit through the first switch device K1 and the second switch device K2, and the energy absorption circuit 320 is connected to the IGCT test main circuit 100 through the third switch device K3. In this way, when the IGCT device to be tested in the IGCT branch 110 to be tested has a conventional switching characteristic test requirement, it is only necessary to turn on the first switch device K1 and the second switch device K2, and turn off the third switch device K3, and connect the clamping circuit 310 to the IGCT test main circuit 100. When the IGCT device to be tested in the IGCT branch 110 to be tested has an extreme shutoff capability test requirement, it is only necessary to turn off the first switch device K1 and the second switch device K2, and turn on the third switch device K3, and connect the energy absorption circuit 320 to the IGCT test main circuit 100.

[0054] Through this solution, the requirements of conventional switching characteristic test and ultimate shutdown capability test of IGCT devices can be met through the same IGCT dynamic performance test circuit.

[0055] See also Figure 4In one embodiment, the auxiliary circuit 300 further includes a first resistor-capacitor circuit 330 and a second resistor-capacitor circuit 340, and the switch device 200 further includes a fourth switch device K4 and a fifth switch device K5. The first end of the first resistor-capacitor circuit 330 is connected to the first end of the IGCT branch 110 to be tested through the fourth switch device K4, the second end of the first resistor-capacitor circuit 330 is connected to the second end of the IGCT branch 110 to be tested, the first end of the second resistor-capacitor circuit 340 is connected to the second end of the IGCT branch 110 to be tested through the fifth switch device K5, and the second end of the second resistor-capacitor circuit 340 is connected to the third end of the IGCT branch 110 to be tested.

[0056] Specifically, the RC circuit is a circuit that provides a freewheeling circuit during the switch switching dead time of the IGCT device of the IGCT branch 110 to be tested, and reduces the voltage spike across the device when the IGCT device is turned off, during the reverse recovery characteristic test of the IGCT device. In this way, by turning on the fourth switch device K4 and the fifth switch device K5, and turning off the first switch device K1, the second switch device K2, and the third switch device K3, the first RC circuit 330 and the second RC circuit 340 are connected to the IGCT test main circuit 100, and the reverse recovery characteristic test is realized in cooperation with the IGCT test main circuit 100.

[0057] In the solution of this embodiment, the auxiliary circuit 300 further includes a first resistor-capacitor circuit 330 and a second resistor-capacitor circuit 340. The first resistor-capacitor circuit 330 is connected in parallel between the first end and the second end of the IGCT branch 110 to be tested, and a fourth switch device K4 is arranged between the first resistor-capacitor circuit 330 and the first end of the IGCT branch; the second resistor-capacitor circuit 340 is connected in parallel between the second end and the third end of the IGCT branch 110 to be tested, and a fifth switch device K5 is arranged between the second resistor-capacitor circuit 340 and the second end of the IGCT branch.

[0058] The above scheme adopts the method of connecting a RC circuit in parallel at the IGCT branch 110 to be tested to implement the reverse recovery characteristic test of the IGCT device in the IGCT branch 110 to be tested, and has high test efficiency and test accuracy.

[0059] Please refer to Figure 4In one embodiment, the IGCT branch 110 to be tested includes an auxiliary power switch AUX, a first IGCT device to be tested DUT1, a sixth switch device K6 and a first gate driver 112. The cathode of the first IGCT device to be tested DUT1 is connected to the first end of the inductive load Lload and the fourth switch device K4 through the sixth switch device K6. The anode of the first IGCT device to be tested DUT1 is connected to the second end of the inductive load Lload, the second end of the first resistor-capacitor circuit 330 and the fifth switch device K5. The anode of the first IGCT device to be tested DUT1 is also connected to the first end of the auxiliary power switch AUX. The second end of the auxiliary power switch AUX is connected to the third end of the clamping circuit 310 and the second end of the second resistor-capacitor circuit 340. The gate of the first IGCT device to be tested DUT1 is connected to the first gate driver 112.

[0060] Specifically, in the solution of this embodiment, the freewheeling component of the IGCT branch 110 to be tested is configured as a series structure of the first IGCT device DUT1 to be tested and the sixth switch device K6, and the auxiliary power switch AUX is configured between the second end and the third end of the IGCT branch 110 to be tested. In this way, when performing a reverse recovery characteristic test, it is only necessary to disconnect the first switch device K1, the second switch device K2 and the third switch device K3, and turn on the fourth switch device K4, the fifth switch device K5 and the sixth switch device K6, so that the first resistor-capacitor circuit 330 is connected in parallel to the two ends of the first IGCT device DUT1 to be tested, and the second resistor-capacitor circuit 340 is connected in parallel to the two ends of the auxiliary power switch AUX, wherein the first gate driver 112 can be suspended, or can be connected to a circuit, for example, connected to the second end of the inductive load Lload, and is not specifically limited, as long as it does not affect the driving of the IGCT device.

[0061] It should be pointed out that, in actual scenarios, generally, RB IGCT devices have a need for reverse recovery characteristic testing, while AS IGCT has no reverse recovery characteristic, and the reverse recovery characteristic of RC IGCT does not require the configuration of an auxiliary power switch AUX. Therefore, in a more detailed embodiment, the first IGCT device to be tested DUT1 is an RB IGCT device, and the type of the auxiliary power switch AUX is not unique, and can be various power semiconductor switching devices 200. For example, any one of RB IGCT, AS IGCT, RC IGCT and IGBT can be used, and it can be set according to actual needs.

[0062] In more detail, in one embodiment, the auxiliary power switch AUX may include an RB IGCT, wherein an anode of the RB IGCT is connected to an anode of the first IGCT device DUT1 to be tested, a second end of the inductive load Lload, a second end of the first RC circuit 330, and a fifth switch (connected to a first end of the second RC circuit 340 via the fifth switch), a cathode of the RB IGCT is connected to a second end of the second RC circuit 340 and a third end of the clamping circuit 310, and a gate of the RB IGCT is connected to a gate driver.

[0063] In the above scheme, when the auxiliary circuit 300 is configured with the first RC circuit 330 and the second RC circuit 340, the IGCT branch 110 to be tested is further configured to include an auxiliary power switch AUX, a first IGCT device to be tested DUT1, a sixth switch device K6 and a first gate driver 112, so that the reverse recovery characteristic test of the first IGCT device to be tested DUT1 can be implemented.

[0064] Please refer to Figure 3 In one embodiment, the IGCT branch 110 to be tested includes a freewheeling diode DX, a seventh switch device K7, a second gate driver 111 and a second IGCT device to be tested DUT2, the cathode of the freewheeling diode DX is connected to the first end of the inductive load Lload through the seventh switch device K7, the anode of the freewheeling diode DX is connected to the second end of the inductive load Lload and the first end of the energy absorption circuit 320, the anode of the freewheeling diode DX is also connected to the anode of the second IGCT device to be tested DUT2, the cathode of the second IGCT device to be tested DUT2 is connected to the third end of the clamping circuit 310 and the second end of the energy absorption circuit 320, and the gate of the second IGCT device to be tested DUT2 is connected to the second gate driver 111.

[0065] Specifically, in the solution of this embodiment, the freewheeling component of the IGCT branch 110 to be tested is configured as a series structure of a freewheeling diode DX and a seventh switch device K7; and between the second end and the third end of the IGCT branch 110 to be tested, a second IGCT device DUT2 to be tested is configured. In this way, when performing a conventional switch characteristic test, it is only necessary to turn on the first switch device K1, the second switch device K2, and the seventh switch device K7, and disconnect the third switch device K3, the fourth switch device K4, and the fifth switch device K5, and connect the clamping circuit 310. When performing an extreme shutoff capability test, it is necessary to disconnect the first switch device K1, the second switch device K2, the fourth switch device K4, and the fifth switch device K5, and turn on the third switch device K3 and the seventh switch device K7, and connect the energy absorption circuit 320.

[0066] In the above scheme, the IGCT branch 110 to be tested is configured to include a freewheeling diode DX, a second IGCT device to be tested DUT2, a seventh switch device K7, and a second gate driver 111, so that a conventional switching characteristic test and a limit switching capability test of the second IGCT device to be tested DUT2 can be implemented.

[0067] It should be noted that the specific type of the clamping circuit 310 is not unique, and any circuit can be used as long as it can clamp the voltage of the IGCT device to be tested to a certain value during the turn-off transient during the conventional switch characteristic test. Figure 5 The clamping circuit 310 includes a first diode D1, a first resistor R1 and a first capacitor C1. The first end of the first resistor R1 is connected to the first end of the power supply VDC and the first end of the inductor Li through the first switch device K1 (the connection relationship diagram is not shown), the anode of the first diode D1 is connected to the second end of the inductor Li and the first end of the inductive load Lload through the second switch device K2, the first end of the first capacitor C1 is connected to the cathode of the first diode D1 and the second end of the first resistor R1, and the second end of the first capacitor C1 is connected to the second end of the power supply VDC and the third end of the IGCT branch 110 to be tested (the connection relationship diagram is not shown).

[0068] Specifically, the first resistor R1 can be a single resistor device, or a resistor component formed by multiple resistor devices connected in series and / or in parallel; the first capacitor C1 can also be a single capacitor, or a capacitor component formed by multiple capacitors connected in series and / or in parallel, without specific limitation.

[0069] In the solution of this embodiment, the first diode D1 of the clamping circuit 310 is turned on when the voltage value of the IGCT device to be tested (that is, the second IGCT device to be tested DUT2) is higher than the power supply voltage. After the first diode D1 is turned on, the first capacitor C1 absorbs the voltage to clamp the voltage of the second IGCT device to be tested DUT2, and forms a discharge loop with the inductor Li and the first capacitor C1.

[0070] Taking the IGCT branch 110 to be tested including the freewheeling diode DX, the seventh switching device K7, the second gate driver 111 and the second IGCT device DUT2 to be tested as an example for explanation, the second end of the first capacitor C1 is connected to the cathode of the second IGCT device DUT2 to be tested in the IGCT branch 110 to perform a conventional switching characteristic test on the second IGCT device DUT2 to be tested.

[0071] First, the first switch device K1, the second switch device K2 and the seventh switch device K7 of the IGCT branch 110 to be tested are turned on. When the second IGCT device DUT2 to be tested is turned on for the first time, the power supply VDC voltage generates a gradually increasing current through the inductor Li and the inductive load Lload. The current flows through the second IGCT device DUT2 to be tested. After a certain period of time, the current increases to a specified value (which can be preset). At this time, the second IGCT device DUT2 to be tested is turned off. By observing the current flowing through the second IGCT device DUT2 to be tested and the voltage at both ends thereof, the conventional turn-off characteristics of the second IGCT device DUT2 to be tested can be obtained. After the second IGCT device DUT2 to be tested is turned off, the current of the inductive load Lload will be switched to the branch where the freewheeling diode DX is located for freewheeling. After the second IGCT device DUT2 to be tested is completely turned off, the second IGCT device DUT2 to be tested is turned on for the second time, and the current of the inductive load Lload will be switched to flow to the second IGCT device DUT2 to be tested again. At this time, by observing the current flowing through the second IGCT device DUT2 to be tested and the voltage across the second IGCT device DUT2 to be tested, the normal turn-on characteristics of the second IGCT device DUT2 to be tested can be obtained.

[0072] It should be noted that, in the actual test process, the current flowing through the second IGCT device DUT2 to be tested and the voltage across both ends thereof can be collected and analyzed by the test signal processor to obtain a conventional switch characteristic curve. It can be understood that the type of the test signal processor is not unique. In a more detailed embodiment, it can be an oscilloscope. In another embodiment, it can also be a combination of an electrical parameter collector and a terminal device, which is not specifically limited.

[0073] For details, please refer to Figure 6 and Figure 7 , VD represents the voltage waveform, IT represents the current waveform, CS and SF represent the switching waveforms. By collecting the current waveform and voltage waveform of the second IGCT device DUT2 to be tested and analyzing them, the time intervals (t don SF ,t don ,t r ) and turn-on energy; and the time intervals during which the second IGCT device DUT2 to be tested is turned off (t doff SF ,t doff ) and turn-off energy.

[0074] The specific type of the energy absorption circuit 320 is not limited, as long as it can transfer and store the overvoltage energy of the IGCT device to be tested in the shutdown transient state to protect the IGCT device to be tested. Figure 8The energy absorption circuit 320 includes a second resistor R2, a second capacitor C2 and a lightning arrester MOV, a first end of the second resistor R2 is connected to a first end of the second capacitor C2, a second end of the second resistor R2 is connected to a first end of the lightning arrester MOV and a second end of the IGCT branch 110 to be tested (the connection relationship diagram is not shown), and a second end of the second capacitor C2 is connected to a second end of the lightning arrester MOV and a third end of the IGCT branch 110 to be tested (the connection relationship diagram is not shown).

[0075] See also Fig. 9 In one embodiment, the energy absorption circuit 320 includes a second resistor R2, a second capacitor C2, a second diode D2 and a lightning arrester MOV, a first end of the second resistor R2 is connected to a first end of the second capacitor C2 and a cathode of the second diode D2, a second end of the second resistor R2 is connected to an anode of the second diode D2, a first end of the lightning arrester MOV and a second end of the IGCT branch 110 to be tested (the connection relationship diagram is not shown), and a second end of the second capacitor C2 is connected to a second end of the lightning arrester MOV and a third end of the IGCT branch 110 to be tested (the connection relationship diagram is not shown).

[0076] Specifically, the second resistor R2 can also be a single resistor, or a resistor component formed by connecting multiple resistors in series and / or in parallel; the second capacitor C2 can also be a single capacitor, or a capacitor component formed by connecting multiple capacitors in series and / or in parallel, and there is no specific limitation. During the extreme shutdown capability test, the energy absorption circuit 320 transfers the overvoltage energy of the IGCT device to be tested to the second capacitor C2 and the lightning arrester MOV in the shutdown transient state, thereby performing overvoltage protection on the IGCT device to be tested.

[0077] In the energy absorption circuit 320 of this embodiment, the second diode D2 is an optional element. If the energy absorption circuit 320 is configured with the second diode D2, the energy absorption circuit 320 has a better overvoltage protection effect. If the energy absorption circuit 320 is not configured with the second diode D2, the energy absorption circuit 320 is more concise, reducing the circuit volume and circuit cost. Therefore, the specific structure of the energy absorption circuit 320 can be selected in combination with actual needs.

[0078] For ease of understanding, the IGCT branch 110 to be tested includes a freewheeling diode DX, a seventh switching device K7, a second gate driver 111 and a second IGCT device to be tested DUT2. The second end of the second resistor R2 is connected to the anode of the second IGCT device to be tested DUT2 in the IGCT branch 110 to be tested, and the second end of the second capacitor C2 is connected to the cathode of the second IGCT device to be tested DUT2 in the IGCT branch 110 to be tested.

[0079] First, the third switch device K3 and the seventh switch device K7 are turned on, and the first switch device K1, the second switch device K2, the fourth switch device K4 and the fifth switch device K5 are turned off, and the second IGCT device DUT2 to be tested is triggered to be turned on. The power supply VDC voltage generates a gradually increasing current through the inductor Li and the inductive load Lload. The current flows through the second IGCT device DUT2 to be tested. After a certain period of time, the current increases to a specified value. At this time, the second IGCT device DUT2 to be tested is turned off, and the energy absorption circuit 320 will perform overvoltage protection on the second IGCT device DUT2 to be tested. By observing the current flowing through the second IGCT device DUT2 to be tested and the voltage at both ends, the limit shutdown capability test of the second IGCT device DUT2 to be tested can be achieved. Similarly, in this process, the current flowing through the second IGCT device DUT2 to be tested and the voltage at both ends are observed by the test signal processor.

[0080] Please refer to Fig.10 In one embodiment, the first RC circuit 330 and the second RC circuit 340 have the same structure and include a third resistor R3 and a third capacitor C3 connected in series.

[0081] Specifically, in the solution of this embodiment, the IGCT branch 110 to be tested includes an auxiliary power switch AUX, a first IGCT device to be tested DUT1, a sixth switch device K6 and a first gate driver 112. When the reverse recovery characteristic test is performed on the first IGCT device to be tested DUT1, the first switch device K1, the second switch device K2 and the third switch device K3 are turned off, and the fourth switch device K4, the fifth switch device K5 and the sixth switch device K6 are turned on, and the following is obtained: Fig.10 The equivalent circuit diagram is shown.

[0082] When the auxiliary power switch AUX is turned on for the first time, the power supply VDC voltage generates a gradually increasing current through the inductor Li and the inductive load Lload. The current flows through the auxiliary power switch AUX. After a certain period of time, the current increases to a specified value. At this time, the auxiliary power switch AUX is turned off, and the current of the inductive load Lload will be switched to the branch where the first IGCT device to be tested DUT1 and the sixth switch device K6 are located for continuous flow. After the auxiliary power switch AUX is completely turned off, the auxiliary power switch AUX is turned on for the second time, and the current of the inductive load Lload will be switched through the auxiliary power switch AUX again, and the first IGCT device to be tested DUT1 will be changed from the on state to the off state, and the reverse recovery process will be performed. At this time, by observing the current flowing through the first IGCT device to be tested DUT1 and the voltage at both ends thereof, the reverse recovery characteristics of the first IGCT device to be tested DUT1 can be obtained. Similarly, in this process, the current flowing through the first IGCT device to be tested DUT1 and the voltage at both ends thereof are observed by the test signal processor.

[0083] It should be noted that the reverse recovery characteristics mainly include the reverse recovery charge and reverse recovery time of the device. The specific reverse recovery waveform can be found in Fig.11 , IT represents the current waveform, VD represents the voltage waveform, IRM represents the peak current, Qrr represents the reverse recovery charge, and VG represents the reverse voltage.

[0084] In order to facilitate understanding of the technical solution of the present application, the present application is explained below in conjunction with more detailed embodiments.

[0085] In this solution, the auxiliary circuit 300 includes a clamping circuit 310, an energy absorption circuit 320, a first resistor-capacitor circuit 330 and a second resistor-capacitor circuit 340. The clamping circuit 310 includes a first diode D1, a first resistor R1 and a first capacitor C1. The energy absorption circuit 320 includes a second resistor R2, a second capacitor C2 and a lightning arrester MOV. The first resistor-capacitor circuit 330 and the second resistor-capacitor circuit 340 respectively include a third resistor R3 and a third capacitor C3 connected in series. The IGCT test main circuit 100 includes a power supply VDC, an inductor Li, an inductive load Lload, a second IGCT device to be tested DUT2, a freewheeling diode DX and a seventh switch device K7. The switch device 200 includes a first switch device K1, a second switch device K2, a third switch device K3, a fourth switch device K4 and a fifth switch device K5. The specific connection relationship is as follows: Fig.12 shown.

[0086] When performing a conventional switch characteristic test, the first switch device K1, the second switch device K2 and the seventh switch device K7 are turned on, and the remaining switch devices 200 are turned off. When the second IGCT device DUT2 to be tested is turned on for the first time, the power supply VDC voltage generates a gradually increasing current through the inductor Li and the inductive load Lload, and the current flows through the second IGCT device DUT2 to be tested. After a certain period of time, the current increases to a specified value. At this time, the second IGCT device DUT2 to be tested is turned off, and the conventional turn-off characteristic of the second IGCT device DUT2 to be tested can be obtained by observing the current flowing through the second IGCT device DUT2 to be tested and the voltage at both ends thereof. After the second IGCT device DUT2 to be tested is turned off, the current of the inductive load Lload will be switched to the branch where the freewheeling diode DX is located for freewheeling. After the second IGCT device DUT2 to be tested is completely turned off, the second IGCT device DUT2 to be tested is turned on for the second time, and the current of the inductive load Lload will be switched to flow to the second IGCT device DUT2 to be tested again. At this time, by observing the current flowing through the second IGCT device DUT2 to be tested and the voltage across the second IGCT device DUT2 to be tested, the normal turn-on characteristics of the second IGCT device DUT2 to be tested can be obtained.

[0087] When performing the ultimate shutdown capability test, the third switch device K3 and the seventh switch device K7 are turned on, and the remaining switch devices 200 are turned off. The second IGCT device DUT2 to be tested is triggered to turn on, and the power supply VDC voltage generates a gradually increasing current through the inductor Li and the inductive load Lload. The current flows through the second IGCT device DUT2 to be tested. After a certain period of time, the current increases to a specified value. At this time, the second IGCT device DUT2 to be tested is turned off, and the energy absorption circuit 320 will perform overvoltage protection on the second IGCT device DUT2 to be tested. By observing the current flowing through the second IGCT device DUT2 to be tested and the voltage at both ends thereof, the ultimate shutdown capability test of the second IGCT device DUT2 to be tested can be achieved.

[0088] When a reverse recovery characteristic test is required, the freewheeling diode DX is replaced by the first IGCT device to be tested DUT1 (specifically RB IGCT), the second IGCT device to be tested DUT2 is used as the auxiliary power switch AUX, and the seventh switch device K7 is used as the sixth switch device K6. Fig.13 , at this time, the fourth switch device K4, the fifth switch device K5 and the sixth switch device K6 are turned on, and the remaining switch devices 200 are turned off. When the auxiliary power switch AUX is turned on for the first time, the power supply VDC voltage generates a gradually increasing current through the inductor Li and the inductive load Lload, and the current flows through the auxiliary power switch AUX. After a certain period of time, the current increases to a specified value. At this time, the auxiliary power switch AUX is turned off, and the current of the inductive load Lload will be switched to the branch where the first IGCT device to be tested DUT1 and the sixth switch device K6 are located for continuous flow. After the auxiliary power switch AUX is completely turned off, the auxiliary power switch AUX is turned on for the second time, and the current of the inductive load Lload will be switched through the auxiliary power switch AUX again, and the first IGCT device to be tested DUT1 will be changed from the on state to the off state, and the reverse recovery process will be performed. At this time, by observing the current flowing through the first IGCT device to be tested DUT1 and the voltage at both ends thereof, the reverse recovery characteristics of the first IGCT device to be tested DUT1 can be obtained.

[0089] The IGCT dynamic performance test device provided in the present application includes a test signal processor and the above-mentioned IGCT dynamic performance test circuit. The test signal processor is used to obtain the operating parameters of the IGCT device to be tested during the dynamic performance test, and perform dynamic performance analysis on the IGCT device to be tested based on the operating parameters.

[0090] Specifically, the specific structure and operating principle of the IGCT dynamic performance test circuit are as shown in the above-mentioned embodiments and the accompanying drawings, and will not be repeated here. The operating parameters of the IGCT device to be tested include current parameters and voltage parameters. The type of test signal processor is not unique, and it can be an oscilloscope, or a combination of an electrical parameter collector and a terminal device, which is not specifically limited. The test signal processor is connected to the first gate driver 112 and / or the second gate driver 111 to realize the on and off control of the IGCT. If the above-mentioned switching devices 200 are controllable switches, the control end of the switching device 200 can also be connected to the test signal processor to improve the degree of test automation.

[0091] The above-mentioned IGCT dynamic performance test device can apply a test electrical signal to the IGCT device to be tested through the IGCT test main circuit 100; each auxiliary circuit 300 is connected to the IGCT test main circuit 100 through the corresponding switch device 200. When the switch device 200 between any auxiliary circuit 300 and the IGCT test main circuit 100 is turned on and the switch device 200 between other auxiliary circuits 300 and the IGCT test main circuit 100 is turned off, the auxiliary circuit 300 corresponding to the turned-on switch device 200 is used to assist the IGCT test main circuit 100 in performing a dynamic performance test on the IGCT device to be tested. In addition, the types of dynamic performance tests assisted by different auxiliary circuits 300 are configured to be different from each other. Through this solution, two or more dynamic performance tests of the IGCT device to be tested can be implemented in the same IGCT dynamic performance test circuit, and it is not necessary to press-fit the IGCT device to be tested every time the dynamic performance test is performed, which simplifies the test process, reduces the number of press-fits of the IGCT device during the dynamic performance test, and can effectively reduce the risk of failure of the IGCT device.

[0092] In the description of this specification, the description with reference to the terms "another embodiment", "other embodiments", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic description of the above terms does not necessarily refer to the same embodiment or example.

[0093] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0094] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. IGCT dynamic performance test circuit, characterized in that: include: Switching devices; IGCT test main circuit, used to apply test electrical signals to the IGCT device to be tested; More than two auxiliary circuits, each of which is connected to the IGCT test main circuit through the corresponding switch device; when the switch device between any one of the auxiliary circuits and the IGCT test main circuit is turned on and the switch devices between other auxiliary circuits and the IGCT test main circuit are turned off, the auxiliary circuit corresponding to the turned-on switch device is used to assist the IGCT test main circuit in performing dynamic performance test on the IGCT device to be tested; wherein the types of dynamic performance tests assisted by different auxiliary circuits are different from each other; The IGCT test main circuit comprises a power supply, an inductor, an inductive load and an IGCT branch to be tested, wherein a first end of the power supply is connected to a first end of the inductor, a second end of the inductor is connected to a first end of the inductive load, a first end of the inductive load is also connected to a first end of the IGCT branch to be tested, a second end of the inductive load is connected to a second end of the IGCT branch to be tested, and a third end of the IGCT branch to be tested is connected to a second end of the power supply; The auxiliary circuit includes a clamping circuit and an energy absorption circuit, and the switching device includes a first switching device, a second switching device and a third switching device. The first end of the clamping circuit is connected to the first end of the power supply and the first end of the inductor through the first switching device, the second end of the clamping circuit is connected to the second end of the inductor and the first end of the inductive load through the second switching device, and the third end of the clamping circuit is connected to the second end of the power supply and the third end of the IGCT branch to be tested; the first end of the energy absorption circuit is connected to the second end of the IGCT branch to be tested through the third switching device, and the second end of the energy absorption circuit is connected to the third end of the IGCT branch to be tested.

2. The IGCT dynamic performance test circuit according to claim 1, characterized in that: The auxiliary circuit also includes a first resistor-capacitor circuit and a second resistor-capacitor circuit, and the switch device also includes a fourth switch device and a fifth switch device, the first end of the first resistor-capacitor circuit is connected to the first end of the IGCT branch to be tested through the fourth switch device, the second end of the first resistor-capacitor circuit is connected to the second end of the IGCT branch to be tested, the first end of the second resistor-capacitor circuit is connected to the second end of the IGCT branch to be tested through the fifth switch device, and the second end of the second resistor-capacitor circuit is connected to the third end of the IGCT branch to be tested.

3. The IGCT dynamic performance test circuit according to claim 2, characterized in that: The IGCT branch to be tested includes an auxiliary power switch, a first IGCT device to be tested, a sixth switch device and a first gate driver. The cathode of the first IGCT device to be tested is connected to the first end of the inductive load and the fourth switch device through the sixth switch device. The anode of the first IGCT device to be tested is connected to the second end of the inductive load, the second end of the first resistor-capacitor circuit and the fifth switch device. The anode of the first IGCT device to be tested is also connected to the first end of the auxiliary power switch. The second end of the auxiliary power switch is connected to the third end of the clamping circuit and the second end of the second resistor-capacitor circuit. The gate of the first IGCT device to be tested is connected to the first gate driver.

4. The IGCT dynamic performance test circuit according to claim 1, characterized in that: The IGCT branch to be tested includes a freewheeling diode, a seventh switching device, a second gate driver and a second IGCT device to be tested, the cathode of the freewheeling diode is connected to the first end of the inductive load through the seventh switching device, the anode of the freewheeling diode is connected to the second end of the inductive load and the first end of the energy absorption circuit, the anode of the freewheeling diode is also connected to the anode of the second IGCT device to be tested, the cathode of the second IGCT device to be tested is connected to the third end of the clamping circuit and the second end of the energy absorption circuit, and the gate of the second IGCT device to be tested is connected to the second gate driver.

5. The IGCT dynamic performance test circuit according to any one of claims 1 to 4, characterized in that: The clamping circuit includes a first diode, a first resistor and a first capacitor, wherein a first end of the first resistor is connected to a first end of a power supply and a first end of the inductor through the first switching device, an anode of the first diode is connected to a second end of the inductor and a first end of the inductive load through the second switching device, a first end of the first capacitor is connected to a cathode of the first diode and a second end of the first resistor, and a second end of the first capacitor is connected to a second end of the power supply and a third end of the IGCT branch to be tested.

6. The IGCT dynamic performance test circuit according to any one of claims 1 to 4, characterized in that: The energy absorption circuit comprises a second resistor, a second capacitor and a lightning arrester, wherein a first end of the second resistor is connected to a first end of the second capacitor, a second end of the second resistor is connected to a first end of the lightning arrester and a second end of the IGCT branch to be tested, and a second end of the second capacitor is connected to a second end of the lightning arrester and a third end of the IGCT branch to be tested; Or, the energy absorption circuit includes a second resistor, a second capacitor, a second diode and a lightning arrester, the first end of the second resistor is connected to the first end of the second capacitor and the cathode of the second diode, the second end of the second resistor is connected to the anode of the second diode, the first end of the lightning arrester and the second end of the IGCT branch to be tested, and the second end of the second capacitor is connected to the second end of the lightning arrester and the third end of the IGCT branch to be tested.

7. The IGCT dynamic performance test circuit according to claim 2 or 3, characterized in that: The first resistor-capacitor circuit and the second resistor-capacitor circuit have the same structure and include a third resistor and a third capacitor connected in series. 8.IGCT dynamic performance test device, characterized in that: It comprises a test signal processor and the IGCT dynamic performance test circuit as described in any one of claims 1 to 7, wherein the test signal processor is used to obtain the operating parameters of the IGCT device to be tested during the dynamic performance test, and perform dynamic performance analysis on the IGCT device to be tested according to the operating parameters.

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