An optoelectronic detector testing device and its usage method

Abstract

The present invention belongs to the technical field of optoelectronic detector testing, and particularly relates to an optoelectronic detector testing device and a using method thereof, which include an alignment block and a testing tool. The alignment block is provided with a mounting hole and an alignment hole, the mounting hole and the alignment hole are coaxially arranged, a laser is detachably connected in the mounting hole, the aperture of the alignment hole is larger than the outer diameter of the head of the optoelectronic detector to be tested, and the depth of the alignment hole is greater than the height of the head of the optoelectronic detector to be tested; the testing tool is provided with a plug-in member, and the plug-in member is provided with a plurality of jacks, and the pins of the optoelectronic detector to be tested can be inserted into the jacks; this solution at least solves the problems of difficult alignment operation, long alignment time, and low product testing efficiency existing in the existing testing device.

Description

Technical Field

[0001] The present invention relates to the technical field of optoelectronic detector testing, and particularly relates to an optoelectronic detector testing device and a method for using the same. Background Art

[0002] An optoelectronic detector mainly converts an external laser signal through an optoelectronic detector chip, so as to convert the laser signal into an electrical signal for output; the structure of the optoelectronic detector is as shown in the appendix Figure 4 and includes a head. A light window is provided at the upper end of the head, a convex edge is formed at the lower end of the head, and a plurality of pins are provided on the convex edge. Since the volume of the optoelectronic detector is small and the light spot output by the laser is also small, when testing the optoelectronic detector, it is necessary to align the laser with the four quadrants (i.e., four photosensitive regions) of the photosensitive chip of the optoelectronic detector respectively to accurately test the performance of the optoelectronic detector. Therefore, in the production process of the optoelectronic detector, improving the alignment efficiency between the laser and the photosensitive chip of the optoelectronic detector is one of the important ways to improve the testing efficiency of the optoelectronic detector.

[0003] The existing optoelectronic detector testing device includes a test bench, and a positioning mechanism (a commonly used positioning mechanism is a three-dimensional adjustment mechanism) is provided on the test bench, and a test tool is provided on the positioning mechanism. When testing the product performance, the laser is fixedly installed above the test bench, and the optoelectronic detector to be tested is installed on the test tool. The tester adjusts the positions of the test tool in the X-axis and Y-axis directions through the positioning mechanism, so that the optoelectronic detector to be tested moves directly below the laser, and ensures that the laser is aligned with the measured center of the photosensitive chip on the optoelectronic detector to be tested in the Z-axis direction. Due to the small volume of the product (optoelectronic detector) and the small light spot output by the laser, the positioning operation is difficult. Even if the tester is skilled in operation, the positioning process for a single quadrant area takes more than 20 seconds. After the test is completed, it is necessary to continue to adjust the positioning mechanism to move the optoelectronic detector out from below the laser before the optoelectronic detector can be removed, and then replace the next optoelectronic detector to be tested. It can be seen that the entire testing process has cumbersome operation steps and long time consumption, which seriously hinders the testing efficiency and output of the product. Summary of the Invention

[0004] At least aiming at the technical problems mentioned in the background art, the purpose of the present invention is to provide an optoelectronic detector testing device and a method for using the same.

[0005] The present invention adopts the following technical solutions.

[0006] An optoelectronic detector testing device includes an alignment block and a testing tool. The alignment block is provided with a mounting hole and an alignment hole. The mounting hole and the alignment hole are coaxially arranged. A laser is detachably connected in the mounting hole. The aperture of the alignment hole is larger than the outer diameter of the head of the optoelectronic detector to be tested, and the depth of the alignment hole is greater than the height of the head of the optoelectronic detector to be tested; the testing tool is provided with a plug-in member, and the plug-in member is provided with a plurality of jacks, and the pins of the optoelectronic detector to be tested can be inserted into the jacks.

[0007] Further, the aperture of the alignment hole is 1±0.2 mm larger than the outer diameter of the head of the optoelectronic detector to be tested.

[0008] Further, the depth of the alignment hole is 3±0.5 mm.

[0009] Further, the plug-in member includes a base and a cover plate. The jacks are arranged on the base. All the jacks are filled with nano metal particles, and the nano metal particles serve as a flexible conductive part for electrically connecting the optoelectronic detector to be tested and the testing tool. The cover plate is rotatably connected to the base, and the cover plate is provided with a plurality of protrusions capable of blocking the jacks. Adopting such a solution effectively solves the technical problem that the pins of the optoelectronic detector are scratched.

[0010] Preferably, the nano metal particles are nano gold particles, nano copper particles or nano silver particles.

[0011] A using method of the above optoelectronic detector testing device includes the following steps:

[0012] Step 1, fix the laser in the mounting hole of the alignment block;

[0013] Step 2, pry open the cover plate on the plug-in member;

[0014] Step 3, insert the pins of the optoelectronic detector to be tested into the jacks of the plug-in member;

[0015] Step 4, align the alignment block with the optoelectronic detector to be tested and buckle it on the head of the optoelectronic detector to be tested. At this time, the optoelectronic detector to be tested, the alignment hole, and the laser are coaxially arranged. The light hole of the laser faces the area to be tested of the optoelectronic detector to be tested, and there is a gap between the light hole of the laser and the top surface of the light window of the optoelectronic detector to be tested;

[0016] Step 5, test the optoelectronic detector to be tested. After the test is completed, remove the alignment block and pull out the optoelectronic detector to be tested;

[0017] Step 6, refer to the aforementioned steps 3 to 5 to test the next optoelectronic detector to be tested.

[0018] Compared with the prior art, the present invention has the following technical effects.

[0019] During product testing, the photodetector to be tested is inserted into the connector of the test tool, the laser is installed in the mounting hole of the alignment block, and then the alignment block is buckled on the photodetector to be tested, so that the photodetector to be tested is located in the alignment hole. Since the alignment hole and the mounting hole are coaxially arranged, it can be ensured that the laser and the photosensitive chip of the product are exactly on the same axis. At this time, the performance test of the product can be carried out; after the test is completed, the alignment block can be removed to take off the tested product, and the next product can be replaced for testing; the test device of the present invention can quickly and conveniently realize the alignment operation of the photodetector to be tested and the laser, simplifies the operation steps of the test process, and only takes 2 seconds respectively for the processes of aligning and removing the tested product, significantly improving the test efficiency of the product.

[0020] The connector of the existing test tool realizes electrical connection by arranging a spring piece in the jack, and the pin of the photodetector contacts the spring piece after being inserted. Since the pin is prone to angular deviation, during the insertion and extraction processes, the pin is likely to get stuck in the jack. If the pin is stuck, it takes 10 - 15 seconds to pull it out; if the pin is skewed before insertion, the tester needs to use tweezers or other tools to manually correct the angle of the pin, and then insert the corrected product into the connector for subsequent testing; moreover, during the insertion and extraction of the photodetector, the spring piece is likely to scratch the gold plating layer of the pin, and the scratching probability is about 3%; the present invention realizes electrical connection by filling nano-metal particles in the jack as a flexible conductive part to contact the pin. During the insertion and extraction of the photodetector, it is not affected by the skewed state of the pin, can smoothly insert the detector within 1 - 2 seconds, and can smoothly extract the detector within 1 second, effectively avoiding the situation of pin jamming during the plugging and unplugging processes and not scratching the gold plating layer of the pin.

[0021] The present invention fills nano-metal particle materials in the jack, and the pin contacts the nano-metal particle material surface to realize electrical connection (with many contact points / connection points). Compared with the existing technology where the pin contacts the spring piece at a point to realize electrical connection (which essentially belongs to two points or at most two linear connections), the electrical connection effect is more stable and there will be no situation of detection interruption or failure. Description of the Drawings

[0022] Figure 1 is the structural schematic diagram of the present invention;

[0023] Figure 2 is the top view of the partial structure of the present invention;

[0024] Figure 3 is Figure 2 the cross-sectional view in the A - A direction of

[0025] Figure 4 the structural schematic diagram of the photodetector to be tested.

[0026] The reference numerals in the accompanying drawings of the specification include: alignment block 1, mounting hole 11, alignment hole 12; laser 2, fiber optic light outlet 21; test tool 3; connector 4, base 41, jack 411 (with nano metal particles inside the jack 411), cover plate 42, protrusion 421; photodetector to be tested 5, head 51, pin 52, optical window 53. Specific Embodiments

[0027] The technical solutions in the present invention will be clearly and completely described below in conjunction with the embodiments and the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0028] As Figure 1 shown, a photodetector testing device includes an alignment block 1 and a test tool 3; as Figure 3 shown, the alignment block 1 is provided with a mounting hole 11 and an alignment hole 12. The mounting hole 11 and the alignment hole 12 are coaxially arranged, and a laser 2 is detachably connected inside the mounting hole 11; the aperture of the alignment hole 12 is 1 ± 0.2 mm larger than the outer diameter of the head 51 of the photodetector 5 to be tested; the depth of the alignment hole 12 is greater than the height of the head 51 of the photodetector 5 to be tested. In this embodiment, the depth of the hole is set to 3 ± 0.5 mm; the test tool 3 is provided with a connector 4 for mounting the photodetector 5 to be tested.

[0029] During product testing, the photodetector 5 to be tested is mounted on the connector 4 of the test tool 3, the laser 2 is mounted inside the mounting hole 11 of the alignment block 1, and then the alignment block 1 is buckled on the head 51 of the photodetector 5 to be tested, so that the small diameter section (head 51) of the photodetector 5 to be tested is located inside the alignment hole 12. Since the alignment hole 12 and the mounting hole 11 are coaxially arranged, it can ensure that the laser 2 and the photosensitive chip of the product are exactly on the same axis. At this time, the performance test of the product can be carried out; after the test is completed, the alignment block 1 can be removed to take off the tested product, and the next product can be replaced for testing; before the test, the alignment operation of the photodetector 5 to be tested and the laser 2 can be quickly and conveniently realized, simplifying the operation steps of the test process. The processes of aligning and removing the tested product each only take 2 s, effectively improving the product testing efficiency; during the test process, since the alignment hole 12 is larger than the height of the head 51 of the photodetector 5 to be tested, it can ensure that the fiber optic light outlet 21 of the laser 2 does not contact the optical window 53 of the photodetector 5 to be tested, protecting both the fiber optic outlet of the laser 2 and the optical window 53 of the photodetector 5 to be tested.

[0030] As Figures 1-3As shown, the connector 4 includes a base 41 and a cover plate 42. The base 41 is fixed on the test tool 3. A plurality of sockets 411 are provided on the base 41. The number and position of the sockets 411 correspond to the number and position of the pins 52 of the photodetector 5 to be tested. All the sockets 411 are filled with nano-metal particles, which serve as flexible conductive parts for electrically connecting the photodetector to be tested and the test tool. In this embodiment, nano-gold particles, nano-copper particles or nano-silver particles are used to fill the sockets 411. The cover plate 42 is rotatably connected to the base 41 through a latch. A plurality of protrusions 421 corresponding to the positions of the sockets 411 are provided on the cover plate 42. Rotating the cover plate 42 can cause the protrusions 421 to block the sockets 411 to prevent foreign debris from entering the sockets 411 when not in use, thereby affecting the electrical connection stability between the connector 4 and the photodetector 5 to be tested.

[0031] When installing the photoelectric detector 5 to be tested, open the cover plate 42, insert the pin 52 of the photoelectric detector 5 to be tested into the socket 411 of the connector 4, so that the pin 52 is in contact with the surface of the nano-metal particles filled in the socket 411, so as to achieve a stable electrical connection, and effectively avoid detection interruption or failure; during the insertion and removal of the photoelectric detector 5 to be tested, it is not affected by the deflection state of the pin 52, and the detector can be smoothly inserted within 1 to 2 seconds, and the detector can be smoothly removed within 1 second, which effectively avoids the pin 52 from getting stuck during the insertion and removal process, and further improves the detection efficiency of the product; and, during the insertion and removal process, the pin 52 will not be scratched with the connector 4, so as to avoid scratching the gold-plated layer of the pin 52, and ensure the performance of the product.

[0032] A method for using the above-mentioned photoelectric detector testing device comprises the following steps:

[0033] Step 1, fix the laser 2 in the mounting hole 11 of the alignment block 1;

[0034] Step 2, open the cover plate 42 on the connector 4;

[0035] Step 3, inserting the pin 52 of the photodetector 5 to be tested into the socket 411 of the connector 4;

[0036] Step 4, align the alignment block 1 with the photodetector 5 to be tested and buckle it on the head 51 of the photodetector 5 to be tested. At this time, the photodetector 5 to be tested, the alignment hole 12, and the laser 2 are coaxially arranged, the optical hole of the laser 2 is facing the tested area of ​​the photodetector 5 to be tested, and there is a gap between the optical hole of the laser 2 and the top surface of the optical window 53 of the photodetector 5 to be tested;

[0037] Step 5, testing the photoelectric detector 5 to be tested, after the test is completed, removing the alignment block 1 and pulling out the photoelectric detector 5 to be tested;

[0038] Step 6: Referring to the aforementioned Steps 3 to 5, test the next photodetector 5 to be measured.

[0039] The above are only embodiments of the present invention. Specific technical solutions and / or common knowledge such as characteristics well known in the art are not described in detail herein. It should be noted that for those skilled in the art, without departing from the technical solution of the present invention, several deformations and improvements can be made, which should also be regarded as the protection scope of the present invention, and these will not affect the implementation effect of the present invention and the practicality of the patent. The protection scope required by this application shall be subject to the content of its claims, and the specific implementation manners and the like recorded in the specification can be used to interpret the content of the claims.

Claims

1. A photoelectric detector testing device, characterized in that: The invention comprises an alignment block and a test tool. The alignment block is provided with a mounting hole and an alignment hole, the mounting hole and the alignment hole are coaxially arranged, a laser is detachably connected in the mounting hole, the aperture of the alignment hole is 1±0.2mm larger than the outer diameter of the head of the photodetector to be tested, and the hole depth of the alignment hole is greater than the height of the head of the photodetector to be tested; the test tool is provided with a plug-in component, the plug-in component is provided with a plurality of sockets, the pins of the photodetector to be tested can be inserted into the sockets, all the sockets are filled with nano-metal particles, and the nano-metal particles serve as a flexible conductive part electrically connecting the photodetector to be tested and the test tool; the hole depth of the alignment hole is 3±0.5mm; the plug-in component comprises a base and a cover plate, the socket is arranged on the base, the cover plate can be rotatably connected to the base, and the cover plate is provided with a plurality of protrusions that can block the sockets.

2. A photoelectric detector testing device according to claim 1, characterized in that: The nano metal particles are nano gold particles, nano copper particles, or nano silver particles.

3. A method for using the photoelectric detector testing device according to claim 1 or 2, characterized in that the steps include: Step 1, fix the laser in the mounting hole of the alignment block; Step 2, remove the cover on the connector; Step 3, inserting the pin of the photodetector to be tested into the jack of the connector; Step 4, align the alignment block with the photodetector to be tested and buckle it on the head of the photodetector to be tested. At this time, the photodetector to be tested, the alignment hole, and the laser are coaxially arranged, the optical hole of the laser is facing the tested area of ​​the photodetector to be tested, and there is a gap between the optical hole of the laser and the top surface of the optical window of the photodetector to be tested; Step 5, testing the photoelectric detector to be tested, after the test, removing the alignment block and pulling out the photoelectric detector to be tested; Step 6, referring to the above steps 3 to 5, test the next photoelectric detector to be tested.

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