Sensitivity testing method, system and electronic equipment for power concentrator

Abstract

The present application provides a method, system and electronic device for testing the sensitivity of a power concentrator. The method includes: in response to a user's use case selection operation, determining a target test case from preset test cases, each group of test cases is used to indicate a different network environment; configuring the comprehensive tester based on the parameters in each group of target test cases in turn, and the initial emission level of the comprehensive tester is the sensitivity threshold in the current target test case; for any group of target test cases, after completing the configuration of the comprehensive tester based on the group of target test cases, executing a sensitivity test operation, the sensitivity test operation is used to control the comprehensive tester to test the power concentrator to determine the sensitivity of the power concentrator under the network environment indicated by the group of target test cases. This scheme helps to quickly and accurately determine the sensitivity of the power concentrator.

Description

Technical Field

[0001] The present invention relates to the technical field of sensitivity testing, and more specifically to a sensitivity testing method for a power concentrator, a sensitivity testing system for a power concentrator, an electronic device, and a computer-readable storage medium. Background Art

[0002] The power concentrator is a key device in the power system, which can collect, transmit and process power data in real time and accurately to ensure the stable operation of the power grid. In order to ensure the normal operation of the power concentrator, the sensitivity of the power concentrator needs to be tested.

[0003] In the related art, when testing the power concentrator, the user usually manually sets the parameters of the test equipment to simulate different network environments, and when testing in each network environment, the user needs to constantly adjust the transmission level of the test instrument to measure the approximate value of the sensitivity, but this method is time-consuming and labor-intensive, and may cause errors in the measured sensitivity due to insufficient testing. In addition, this test method requires the tester to be very familiar with all standard-related configurations, and has high requirements on the tester's knowledge level and skill proficiency, which affects the test progress and test cost. Summary of the invention

[0004] The present invention is proposed in view of the above problems. According to one aspect of the present invention, a sensitivity test method for a power concentrator is provided, which is applied to a sensitivity test system; the sensitivity test system includes a comprehensive tester, which is connected to the power concentrator; the method includes: in response to a user's use case selection operation, determining at least one group of target test cases from preset test cases, wherein each group of test cases in the preset test cases is used to indicate different network environments, and each group of test cases in the preset test cases includes at least the following parameters: mode, frequency band, line loss, bandwidth, channel, resource block, resource block position and sensitivity threshold; sequentially configuring the comprehensive tester based on the parameters in each group of target test cases in at least one group of target test cases, wherein the initial emission level of the comprehensive tester is the sensitivity threshold in the current target test case; for any group of target test cases in at least one group of target test cases, after completing the configuration of the comprehensive tester based on the group of target test cases, executing a sensitivity test operation, the sensitivity test operation is used to control the comprehensive tester to test the power concentrator to determine the sensitivity of the power concentrator under the network environment indicated by the group of target test cases.

[0005] Exemplarily, for each group of target test cases, the sensitivity test operation includes: based on the initial emission level, controlling the comprehensive tester to test the power concentrator; obtaining test results, the test results including the bit error rate; determining whether the bit error rate is greater than the bit error rate threshold; when the bit error rate is less than or equal to the bit error rate threshold, determining that the current emission level of the comprehensive tester is the minimum reference level; performing an emission level adjustment operation to adjust the emission level of the comprehensive tester; based on the adjusted emission level of the comprehensive tester, returning to execute the step of controlling the comprehensive tester to test the power concentrator; when the bit error rate is greater than the bit error rate threshold, determining that the current emission level of the comprehensive tester is the maximum reference level; determining whether the difference between the maximum reference level and the minimum reference level is within a preset error range; when the difference between the maximum reference level and the minimum reference level is within the preset error range, determining that the minimum reference level is the sensitivity corresponding to the target test case.

[0006] Exemplarily, the emission level adjustment operation includes: adjusting the current emission level of the comprehensive tester based on the minimum reference level and the preset adjustment step, wherein the emission level of the comprehensive tester after adjustment is the difference between the minimum reference level and the preset adjustment step.

[0007] Exemplarily, when the difference between the maximum reference level and the minimum reference level is not within a preset error range, the sensitivity test operation also includes: updating a preset adjustment step, wherein the updated preset adjustment step is smaller than the preset adjustment step before the update; and based on the updated preset adjustment step, returning to execute the step of performing the emission level adjustment operation.

[0008] Exemplarily, before obtaining the test results, the sensitivity test operation also includes: timing the test duration of the power concentrator performed by the comprehensive tester; determining whether the test duration reaches a test duration threshold; wherein the operation of obtaining the test results is performed when the test duration reaches the test duration threshold; or, before obtaining the test results, the sensitivity test operation also includes: obtaining the sensitivity test status of the comprehensive tester; wherein the operation of obtaining the test results is performed when the sensitivity test status is that the test is completed.

[0009] Exemplarily, before configuring the comprehensive tester based on the parameters in each group of target test cases in at least one group of target test cases, the method also includes: determining whether the mode and frequency band in the current target test case are the same as the mode and frequency band in the previous target test case; and resetting the comprehensive tester when at least one of the mode and frequency band in the target test case is different from the mode and frequency band in the previous target test case.

[0010] Exemplarily, before controlling the comprehensive tester to test the power concentrator, the method also includes: obtaining connection status information between the comprehensive tester and the power concentrator; when the connection status indicated by the connection status information is abnormal, performing a reconnection operation to make the connection status between the comprehensive tester and the power concentrator normal; wherein, controlling the comprehensive tester to test the power concentrator is performed when the connection status indicated by the connection status information is normal; preferably, the reconnection operation includes: sending an enable instruction to the comprehensive tester to enable the signaling mode of the comprehensive tester; obtaining network attachment status information of the comprehensive tester; when the network attachment status information indicates successful attachment, controlling the comprehensive tester to establish a data connection with the power concentrator; when the network attachment status information indicates failed attachment, controlling the power concentrator to restart, and after the power concentrator restarts, returning to execute the step of obtaining the network attachment status information of the comprehensive tester; preferably, the reconnection operation also includes: counting the number of times the network attachment status information indicates failed attachment; when the number reaches a threshold number, marking the current target test case as a failed case; wherein, the sensitivity test operation is performed when the current target test case is not marked as a failed case.

[0011] According to another aspect of the present invention, a sensitivity test system for a power concentrator is provided, comprising: a comprehensive tester and a controller, wherein the comprehensive tester is connected to the power concentrator, and the comprehensive tester is connected to the controller, and the controller is connected to the power concentrator, and the controller is used to execute the above method.

[0012] According to another aspect of the present invention, there is provided an electronic device, including a processor and a memory, wherein a computer program is stored in the memory, and the processor is configured to execute the computer program to implement the above method.

[0013] According to another aspect of the present invention, a computer-readable storage medium is provided, storing a computer program / instruction, and the computer program / instruction implements the above method when executed by a processor.

[0014] The above technical solution configures the comprehensive tester based on the parameters in each group of target test cases in at least one group of target test cases, and after completing the configuration of the comprehensive tester based on each group of target test cases, performs a sensitivity test operation, so as to determine the sensitivity of the power concentrator in at least one network environment corresponding to each of the at least one group of target test cases. On the one hand, the scheme is simple to operate, and only requires the user to select the target test case from the preset target test case, without the need for other manual operations, which greatly reduces the labor cost, avoids human errors, and improves the accuracy of the test results. On the other hand, since the preset test cases have been preset, there is no need for the user to manually set the various parameters of the test equipment, which helps to reduce the requirements for the user's knowledge level and skill proficiency, which helps to improve the test progress and reduce the test cost. In short, the scheme helps to quickly and accurately determine the sensitivity of the power concentrator.

[0015] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention, it can be implemented according to the contents of the specification. In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The above and other purposes, features and advantages of the present invention will become more apparent by describing the embodiments of the present invention in more detail in conjunction with the accompanying drawings. The accompanying drawings are used to provide a further understanding of the embodiments of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings, the same reference numerals generally represent the same components or steps.

[0017] Figure 1 A schematic flow chart showing a sensitivity testing method for a power concentrator according to an embodiment of the present invention;

[0018] Figure 2 A schematic flow chart showing a sensitivity testing method according to a specific embodiment of the present invention;

[0019] Figure 3 A schematic block diagram of a sensitivity testing system according to an embodiment of the present invention is shown;

[0020] Figure 4 A schematic block diagram of a sensitivity testing system according to an embodiment of the present invention is shown;

[0021] Figure 5 A schematic block diagram of an electronic device according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0022] In order to make the purpose, technical scheme and advantages of the present invention more obvious, the exemplary embodiments according to the present invention will be described in detail with reference to the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments of the present invention, and it should be understood that the present invention is not limited to the exemplary embodiments described herein. Based on the embodiments of the present invention described in the present invention, all other embodiments obtained by those skilled in the art without creative work should fall within the protection scope of the present invention.

[0023] The sensitivity test of the power concentrator faces pain points such as complex test environment, high test accuracy requirements, inconsistent test standards, and large test data volume. As mentioned above, when testing the power concentrator, it is usually necessary for the user to manually set the various parameters of the test equipment to simulate different network environments, and when testing in each network environment, the user needs to continuously adjust the emission level of the test instrument (such as a comprehensive tester) to measure the approximate value of the sensitivity, but this method is time-consuming and labor-intensive, and may cause errors in the measured sensitivity due to insufficient testing. In addition, this test method requires the tester to be very familiar with all standard-related configurations, and has high requirements on the tester's knowledge level and skill proficiency, thereby affecting the project progress and test costs. In view of this, the present invention provides a sensitivity test method for a power concentrator, a sensitivity test system for a power concentrator, an electronic device, and a computer-readable storage medium, which can quickly and accurately measure the sensitivity of the power concentrator. The method, system, electronic device, and computer-readable storage medium are described in detail below.

[0024] According to one aspect of an embodiment of the present invention, a sensitivity test method for a power concentrator is provided. The method is applied to a sensitivity test system. The sensitivity test system includes a comprehensive tester connected to the power concentrator.

[0025] In this article, the power concentrator to be tested can be any type of power concentrator that is currently available or will be developed in the future. For example, the power concentrator can be a 5G RedCap power concentrator. RedCap (Reduced Capability) is a lightweight 5G technology proposed by 3GPP for IoT scenarios. While maintaining the basic performance advantages of 5G, it reduces hardware costs and power consumption, allowing more IoT devices to enjoy the benefits of 5G technology. 5G RedCap power concentrator is a power concentrator that uses RedCap technology. 5G RedCap power concentrator can collect power data in real time, including key information such as voltage, current, and power, and transmit it to the monitoring center quickly and accurately through the 5G network. The monitoring center can monitor and analyze the power grid status in real time based on this data, identify potential problems in a timely manner, and take corresponding measures. Compared with the power concentrator under the 4G network, the 5G RedCap power concentrator can achieve higher data transmission speed, lower latency, and higher reliability, thereby meeting the smart grid's demand for real-time and accurate data.

[0026] Figure 1 FIG. 1 is a schematic flow chart showing a sensitivity test method for a power concentrator according to an embodiment of the present invention. Figure 1 As shown, the sensitivity testing method 100 may include at least the following steps S110 , S120 and S130 .

[0027] In step S110, in response to the user's use case selection operation, at least one group of target test cases is determined from the preset test cases, wherein each group of test cases in the preset test cases is used to indicate a different network environment, and each group of test cases in the preset test cases includes at least the following parameters: mode, frequency band, line loss, bandwidth, channel, resource block, resource block position and sensitivity threshold.

[0028] In this article, the preset test case is a pre-edited test case. Specifically, the test case can be pre-edited by a professional. When performing a sensitivity test on a power concentrator, a user can select at least one group of target test cases from the preset test cases as needed to test the sensitivity of the power concentrator in at least one network environment. The number of preset test cases can be set according to actual needs and will not be repeated.

[0029] Optionally, the device for executing the sensitivity test method (e.g., the controller described below) may include a display and an input device. The input device may include, but is not limited to, one or more of a mouse, a keyboard, a microphone, a touch screen, etc. In this embodiment, the user can preview the preset test cases on the display, and then select the target test case (i.e., a case selection operation) through the input device.

[0030] Optionally, the number of test cases included in the preset test case may be multiple groups, and the multiple groups of preset test cases may be classified by frequency bands, and the multiple groups of preset test cases are displayed in a tree form. The case selection operation may include a first selection operation and a second selection operation. Step S110, in response to the user's case selection operation, determines at least one group of target test cases from the preset test cases, which may include the following steps: in response to the user's first selection operation, selects a target frequency band where the target test case is located from at least one frequency band; in response to the user's second selection operation, determines the target test case from the subdirectory of the target frequency band. In the scheme of this embodiment, multiple groups of preset test cases are classified by frequency band, that is, the first-level directory is the frequency band, and the second-level directory is the specific preset test case. The second-level directory corresponding to each frequency band is the subdirectory of the frequency band. This method helps the user to quickly determine the target test case in the preset test case without having to browse all the preset test cases, thereby helping to improve the user experience and helping to improve the efficiency of sensitivity testing. The display method of the preset test case in the above embodiment is only an example and is not intended to limit the present invention. In other embodiments of the present invention, multiple groups of preset test cases may be displayed in the form of a three-level directory, where the first-level directory may be a mode, the second-level directory may be a frequency band, and the third-level directory may be a specific preset test case.

[0031] Optionally, the number of target test cases can be multiple groups. In this embodiment, the user can pre-select multiple network environments that need to be tested on the power concentrator, so that when performing sensitivity testing on the power concentrator, the user can complete all test environments at once, which helps to improve the overall test efficiency, especially when there are many network environments that need to be tested, the use of this solution can further improve the test efficiency.

[0032] Optionally, the parameters in the test case may further include a title, and the title of each test case may be set according to user needs, so that the user can quickly distinguish the network environments corresponding to different test cases.

[0033] For ease of understanding, the preset test cases are described below with several specific test cases. In one embodiment, the preset test cases may include the following test cases: Title: N20 10M; Mode: NR-FDD; Frequency band: n20; Sensitivity threshold: -93.8; Channel: 161200; Line loss: 1.5; Bandwidth: 10; Uplink resource blocks: 20; Uplink resource block position: 0; Downlink resource blocks: 52; Downlink resource block position: 0. In this embodiment, the resource blocks include uplink resource blocks and downlink resource blocks, and the resource block positions include uplink resource block positions and downlink resource block positions.

[0034] In step S120, the comprehensive tester is configured based on the parameters in each group of target test cases in at least one group of target test cases, wherein the initial emission level of the comprehensive tester is the sensitivity threshold in the current target test case.

[0035] After determining at least one group of target test cases, the comprehensive tester can be configured in turn based on the parameters in each group of target test cases in the at least one group of target test cases, so that the comprehensive tester can simulate at least one network environment corresponding to each of the at least one group of target test cases in turn, thereby facilitating the sensitivity testing of the power concentrator in the network environment in subsequent steps.

[0036] Optionally, when configuring the comprehensive tester, the configuration order of at least one group of target test cases can be set as needed. For example, the order in which the user determines at least one group of target test cases in step S110 can be used as the above configuration order. Of course, the user can also adjust the above order as needed, which will not be repeated.

[0037] Optionally, step S120, sequentially configuring the comprehensive tester based on the parameters in each group of target test cases in at least one group of target test cases, may specifically include the following steps: for each group of target test cases, performing the following configuration operations: configuring the mode of the comprehensive tester to be the mode in the target test case; configuring the emission level of the comprehensive tester to be a preset emission level; sequentially configuring the line loss, frequency band, bandwidth and channel of the comprehensive tester according to the frequency band, line loss, bandwidth and channel in the target test case; sequentially configuring the resource blocks and resource block positions of the comprehensive tester according to the resource blocks and resource block positions in the target test case; after the power concentrator establishes a data connection with the comprehensive tester, configuring the initial emission level of the comprehensive tester to be the sensitivity threshold in the target test case. In this embodiment, the preset emission level is an emission level used to enable the comprehensive tester to establish a data connection with the power concentrator normally. The size of the specific preset emission level can be determined according to the selected comprehensive tester and the model and working parameters of the power concentrator to be tested, which will not be repeated. In a specific embodiment of the present invention, the preset emission level can be -85.

[0038] Optionally, any existing or future communication instructions may be used to configure the comprehensive tester. For example, the comprehensive tester may be configured through SCPI instructions.

[0039] In this article, SCPI instructions can be used to configure the comprehensive tester, query the status of the comprehensive tester (such as the command execution status, the connection status with the power concentrator, etc.), and control the comprehensive tester to make the comprehensive tester perform specific functions (such as turning on the signaling mode, turning on the signal receiving page, etc.). It can be understood that SCPI (Standard Commands for Programmable Instruments: Standard Commands for Programmable Instruments) instructions are a standardized language for controlling programmable test and measurement equipment. It defines a series of commands for communication and control instruments. In this article, although the type of specific SCPI instructions is not given, those skilled in the art can select appropriate SCPI instructions based on the purpose of the SCPI instructions recorded in this article, and no further details are given.

[0040] In some embodiments, after each configuration is completed, the corresponding information of the comprehensive tester can be obtained to determine whether the configuration is successful. For example, the "*OPC?" instruction can be used to query and confirm in a loop to ensure that the configuration is successful.

[0041] Optionally, before sequentially configuring the resource blocks and resource block positions of the comprehensive tester according to the resource blocks and resource block positions in the target test case, step S120 may also include: sending an enable command to the comprehensive tester to control the OCNG (OFDMAChannel Noise Generator, OFDMA channel noise generator (OFDMA: Orthogonal Frequency Division Multiple Access)) of the comprehensive tester to be enabled. In some embodiments, the "*OPC?" command may be queried and confirmed in a loop to determine whether the enable command is executed.

[0042] In the scheme of this example, the initial emission level of the comprehensive tester is the sensitivity threshold in the current target test case. It can be understood that the emission level of the comprehensive tester is used to control the emission power of the comprehensive tester. By using the sensitivity threshold in the current target test case as the initial emission level of the comprehensive tester, the initial emission power of the comprehensive tester can be controlled.

[0043] In step S130, for any group of target test cases in at least one group of target test cases, after completing the configuration of the comprehensive tester based on the group of target test cases, a sensitivity test operation is performed, and the sensitivity test operation is used to control the comprehensive tester to test the power concentrator to determine the sensitivity of the power concentrator under the network environment indicated by the group of target test cases.

[0044] In this step, after the configuration of the comprehensive tester is completed based on the target test case each time, a sensitivity test can be performed on the power concentrator based on the current configuration to obtain the sensitivity of the power concentrator under the network environment indicated by the group of target test cases. Thus, after the configuration of the comprehensive tester is completed based on each group of target test cases, a sensitivity test operation can be performed respectively to obtain the sensitivity of the power concentrator under at least one network environment corresponding to at least one group of target test cases.

[0045] Optionally, after step S130, the method may further include step S140, displaying the sensitivity corresponding to at least one group of target test cases. In this embodiment, the sensitivity corresponding to at least one group of target test cases may be presented in a table. Specifically, one column in the table may be used to record specific parameters of each group of target test cases, and another column may be used to record the sensitivity corresponding to each group of target test cases.

[0046] According to the above technical solution, by configuring the comprehensive tester based on the parameters in each group of target test cases in at least one group of target test cases, and after completing the configuration of the comprehensive tester based on each group of target test cases, performing a sensitivity test operation, the sensitivity of the power concentrator in at least one network environment corresponding to each of the at least one group of target test cases can be determined. On the one hand, the scheme is simple to operate, and only requires the user to select the target test case from the preset target test case, without the need for other manual operations, which greatly reduces the labor cost, and can avoid human errors and improve the accuracy of the test results. On the other hand, since the preset test cases have been preset, there is no need for the user to manually set the various parameters of the test equipment, which helps to reduce the requirements for the user's knowledge level and skill proficiency, which helps to improve the test progress and reduce the test cost. In short, the scheme helps to quickly and accurately determine the sensitivity of the power concentrator.

[0047] Exemplarily, for each group of target test cases, the sensitivity test operation includes: based on the initial emission level, controlling the comprehensive tester to test the power concentrator; obtaining test results, the test results including the bit error rate; determining whether the bit error rate is greater than the bit error rate threshold; when the bit error rate is less than or equal to the bit error rate threshold, determining that the current emission level of the comprehensive tester is the minimum reference level; performing an emission level adjustment operation to adjust the emission level of the comprehensive tester; based on the adjusted emission level of the comprehensive tester, returning to execute the step of controlling the comprehensive tester to test the power concentrator; when the bit error rate is greater than the bit error rate threshold, determining that the current emission level of the comprehensive tester is the maximum reference level; determining whether the difference between the maximum reference level and the minimum reference level is within a preset error range; when the difference between the maximum reference level and the minimum reference level is within the preset error range, determining that the minimum reference level is the sensitivity corresponding to the target test case.

[0048] It can be understood that determining the minimum reference level as the sensitivity corresponding to the target test case means determining the current minimum reference level as the sensitivity of the power concentrator under the network environment represented by the target test case.

[0049] Optionally, the bit error rate threshold can be determined as needed. For example, when the power concentrator is a 5GRedCap power concentrator, the user can set the bit error rate threshold to 5% according to the provisions of 3GPP. In some embodiments, to further ensure the accuracy of the power concentrator, the bit error rate threshold can be less than the bit error rate specified by 3GPP, for example, the bit error rate threshold can be set to 4.5%.

[0050] In the scheme of this example, the emission level adjustment operation is used to adjust the emission level of the comprehensive tester. In some embodiments, the emission level adjustment operation can be an operation to determine the adjusted emission level based on the minimum reference level and the preset adjustment step size. The method is described in detail below and will not be repeated. In other embodiments, the emission level adjustment operation can be: when there is only a minimum reference level, the adjusted emission level can be a preset ratio times of the minimum reference level, the preset ratio is greater than 1, and the specific value of the preset ratio can be set as needed, which will not be repeated. When there is a maximum reference level and a minimum reference level, the adjusted emission level can be determined based on the minimum reference level and the maximum reference level. In this embodiment, the adjusted emission level can be the mean of the minimum reference level and the maximum reference level.

[0051] Optionally, after determining that the current emission level of the comprehensive tester is the maximum reference level, the sensitivity test operation may further include the following steps: determining whether the maximum reference level is the initial emission level; when the maximum reference level is the initial emission level, determining that the performance of the power concentrator is poor; wherein, the step of determining whether the difference between the maximum reference level and the minimum reference level is within a preset error range is performed when the maximum reference level is not equal to the initial emission level. It can be understood that when the maximum reference level is equal to the initial emission level, it means that the bit error rate when the initial emission level is used for testing under the current test case is greater than the bit error rate threshold. In this case, the minimum reference level is not determined. And the occurrence of this situation indicates that the performance of the power concentrator itself is poor, so there is no need to continue testing. This solution can avoid performing meaningless operations by making the step of determining whether the difference between the maximum reference level and the minimum reference level is within a preset error range performed when the maximum reference level is not equal to the initial emission level, thereby helping to improve test efficiency.

[0052] For ease of understanding, the scheme of this example is described below with a specific embodiment. In this embodiment, the comprehensive tester can be controlled to test the power concentrator based on the initial transmission level. Then, the test result (which can be referred to as the first test result) is obtained. If the bit error rate in the test result is less than or equal to the bit error rate threshold, the initial transmission level can be determined as the minimum reference level, and then the transmission level adjustment operation is performed to adjust the transmission level of the comprehensive tester. For ease of description, the adjusted transmission level can be referred to as the first transmission level. After the transmission level adjustment is completed, the comprehensive tester can be controlled to test the power concentrator based on the first transmission level. Then, the test result (which can be referred to as the second test result) is obtained. If the bit error rate in the test result is greater than the bit error rate threshold, the first transmission level can be determined to be the maximum reference level. Next, it can be determined whether the difference between the determined maximum reference level and the minimum reference level is within the preset error range. If the difference between the maximum reference level and the minimum reference level is within the preset error range, the minimum reference level can be determined to be the sensitivity of the power concentrator in the network environment represented by the target test case. In this case, the sensitivity of the power concentrator is the initial transmission level.

[0053] Optionally, the preset error range can be determined according to actual needs. For example, the preset error range can be determined according to the accuracy requirements for the test results. In a specific embodiment, the preset error range can be [-0.2, 0, 2].

[0054] It can be understood that when the difference between the current maximum reference level and the minimum reference level is within the preset error range, it means that the current minimum reference level is not much different from the actual sensitivity of the power concentrator. Considering the influence of factors such as network fluctuations, it is meaningless to continue testing. Therefore, the current minimum reference level can be directly determined as the sensitivity of the power concentrator.

[0055] In the above technical solution, when the difference between the maximum reference level and the minimum reference level is within the preset error range, the minimum reference level is determined to be the sensitivity corresponding to the target test case. The method is simple to operate, does not require human intervention, helps to improve test efficiency, and can avoid introducing human errors and improve the accuracy of test results.

[0056] Exemplarily, the emission level adjustment operation includes: adjusting the emission level of the comprehensive tester based on the minimum reference level and the preset adjustment step, wherein the emission level of the comprehensive tester after adjustment is the difference between the minimum reference level and the preset adjustment step.

[0057] As described above, when the bit error rate is less than or equal to the bit error rate threshold, the current emission level of the comprehensive tester can be first determined to be the minimum reference level, and then the emission level adjustment operation can be performed. In the scheme of this embodiment, the emission level adjustment operation is an operation to determine the adjusted emission level based on the minimum reference level and the preset adjustment step. For example, N can be used to represent the emission level of the comprehensive tester during the current test process. If the bit error rate of the test result obtained during the current test process is less than or equal to the bit error rate threshold, the minimum reference level N can be set. min =N, and let N = N min -M, to adjust the transmission level of the comprehensive tester.

[0058] Optionally, the size of the preset adjustment step may be a fixed value or a variable value. In some embodiments, the size of the preset adjustment step is a fixed value, and the preset adjustment step is within a preset error range. In other embodiments, the size of the preset adjustment step is a variable value. In this embodiment, the preset adjustment step may be reduced when the difference between the maximum reference level and the minimum reference level is not within the preset error range. Compared with the solution in which the preset adjustment step is a fixed value, this method of gradually reducing the preset adjustment step helps to quickly make the minimum reference level approach the sensitivity of the power concentrator, thereby helping to improve the test efficiency.

[0059] According to the above scheme, by adjusting the emission level of the comprehensive tester based on the minimum reference level and the preset adjustment step, the gap between the emission level and the actual sensitivity of the power concentrator can be shortened, thereby facilitating a more accurate determination of the sensitivity of the power concentrator.

[0060] Exemplarily, when the difference between the maximum reference level and the minimum reference level is not within a preset error range, the sensitivity test operation also includes: updating a preset adjustment step, wherein the updated preset adjustment step is smaller than the preset adjustment step before the update; and based on the updated preset adjustment step, returning to execute the step of performing the emission level adjustment operation.

[0061] Optionally, the updated preset adjustment step size may be determined according to the size of the current preset adjustment step size. For example, the current preset adjustment step size may be reduced according to a preset ratio to obtain the updated preset adjustment step size.

[0062] Optionally, the next preset adjustment step in the adjustment step set after the current preset adjustment step can be determined as the updated preset adjustment step, wherein the adjustment step set includes multiple preset adjustment steps, and the multiple preset adjustment steps are reduced in sequence according to the arrangement order in the set, and the minimum adjustment step in the adjustment step set is within the preset error range. The adjustment step set can be preset as needed, for example, the adjustment step set can be preset by professionals. For example, in one embodiment, the adjustment step set can be [10, 3, 1, 0.3]. In this embodiment, the initial preset adjustment step is 10. When the difference between the maximum reference level and the minimum reference level is not within the preset error range, the preset adjustment step can be updated to 3. When the preset adjustment step is 3, if the difference between the maximum reference level and the minimum reference level is not within the preset error range, the preset adjustment step is updated to 1... Repeat the above operation until the difference between the maximum reference level and the minimum reference level is within the preset error range.

[0063] According to the above technical solution, by continuously reducing the preset adjustment step, the adjusted emission level can be made closer to the actual sensitivity of the power concentrator, thereby helping to improve the accuracy of the determined sensitivity.

[0064] Exemplarily, before obtaining the test results, the sensitivity test operation also includes: timing the test duration of the power concentrator performed by the comprehensive tester; determining whether the test duration reaches a test duration threshold; wherein the operation of obtaining the test results is performed when the test duration reaches the test duration threshold; or, before obtaining the test results, the sensitivity test operation also includes: obtaining the sensitivity test status of the comprehensive tester; wherein the operation of obtaining the test results is performed when the sensitivity test status is that the test is completed.

[0065] Optionally, before obtaining the test results, the sensitivity test operation also includes: timing the test duration of the comprehensive tester to test the power concentrator; judging whether the test duration reaches the test duration threshold; wherein the operation of obtaining the test results is performed when the test duration reaches the test duration threshold. In this embodiment, the timing can be started at the same time as the comprehensive tester is controlled to test the power concentrator, and the test results are obtained when the test duration reaches the test duration threshold. The test duration threshold can be determined according to actual needs, for example, the test duration threshold can be determined according to the data interaction duration between the comprehensive tester and the power concentrator. It can be understood that data interaction will be performed between the comprehensive tester and the device to be tested during the test, and this process takes a certain amount of time. This embodiment can ensure that the comprehensive tester has completed the test of the power concentrator based on the current emission level by obtaining the test results when the test duration reaches the test duration threshold, thereby helping to ensure the accuracy of the test results.

[0066] Optionally, before obtaining the test results, the sensitivity test operation also includes: obtaining the sensitivity test status of the comprehensive tester; wherein the operation of obtaining the test results is performed when the sensitivity test status is the test completed. In a specific embodiment, the sensitivity test status of the comprehensive tester for performing a sensitivity test on the power concentrator can be queried through SCPI instructions. When the status contains the key fields "RDY, ADJ, INV", the sensitivity test status is determined to be the test completed, and the test results can be obtained at this time. By obtaining the sensitivity test status of the comprehensive tester, this solution can obtain the test results in time after the sensitivity test is completed. Compared with the above-mentioned scheme of timing the test duration, this scheme can further improve the test efficiency.

[0067] According to the above technical solution, by timing the test duration or obtaining the sensitivity test status of the comprehensive tester, it can be ensured that the test results are obtained after the comprehensive tester has completed the test of the power concentrator based on the current emission level, thereby helping to obtain the test results more accurately.

[0068] Exemplarily, before configuring the comprehensive tester based on the parameters in each group of target test cases in at least one group of target test cases, the method also includes: determining whether the mode and frequency band in the current target test case are the same as the mode and frequency band in the previous target test case; and resetting the comprehensive tester when at least one of the mode and frequency band in the target test case is different from the mode and frequency band in the previous target test case.

[0069] It can be understood that the test case configuration parameters are quite different after the mode or frequency band is changed, that is, if the modes and / or frequency bands of the two groups of target test cases are different, there are also large differences between the other parameters of the two groups of target test cases. In the scheme of this example, if the mode and frequency band in the current target test case are different from at least one of the modes and frequency bands in the previous target test case (e.g., different modes, different frequency bands, and both modes and frequency bands are different), the comprehensive tester can be reset. Thus, it is helpful to avoid test anomalies caused by excessive parameter differences between the two groups of target test cases.

[0070] It can be understood that when the current target test case is the first group of target test cases in at least one group of target test cases, since there is no previous target test case before this group of target test cases, it is possible to directly determine that the mode and frequency band have changed (the mode and frequency band in this target test case are different from the mode and frequency band in the previous target test case) and reset the comprehensive tester.

[0071] According to the above technical solution, by resetting the comprehensive tester when the mode and / or frequency band changes, it helps to avoid test anomalies caused by excessive parameter differences between two groups of target test cases, thereby helping to improve test efficiency.

[0072] Exemplarily, before controlling the comprehensive tester to test the power concentrator, the method also includes: obtaining connection status information between the comprehensive tester and the power concentrator; when the connection status indicated by the connection status information is abnormal, performing a reconnection operation to make the connection status between the comprehensive tester and the power concentrator normal; wherein, controlling the comprehensive tester to test the power concentrator is performed when the connection status indicated by the connection status information is normal.

[0073] In the scheme of this example, before controlling the comprehensive tester to test the power concentrator, the connection status information between the comprehensive tester and the power concentrator can be first obtained to determine whether the data connection between the comprehensive tester and the power concentrator is normal. It can be understood that the comprehensive tester may be reset or affected by some other abnormal factors, resulting in the disconnection of the data connection with the power concentrator (the connection status indicated by the connection status information is abnormal at this time). In this embodiment, by obtaining the connection status information between the comprehensive tester and the power concentrator, it can be determined whether the data connection between the comprehensive tester and the power concentrator is normal, thereby ensuring that the comprehensive tester tests the power concentrator when the data connection is normal, thereby helping to avoid performing meaningless operations.

[0074] In a specific embodiment, the connection status information between the comprehensive tester and the power concentrator can be obtained through SCPI instructions. If the connection status information contains the keyword "CEST", it is considered that the connection status is normal, otherwise the connection is abnormal.

[0075] According to the above technical solution, by judging whether the data connection between the comprehensive tester and the power concentrator is normal, it can be ensured that the comprehensive tester tests the power concentrator when the data connection is normal, thereby helping to avoid performing meaningless operations and improving the efficiency of sensitivity testing.

[0076] Exemplarily, the reconnection operation includes: sending an enable command to the comprehensive tester to enable the signaling mode of the comprehensive tester; obtaining the network attachment status information of the comprehensive tester; when the network attachment status information indicates successful attachment, controlling the comprehensive tester to establish a data connection with the power concentrator; when the network attachment status information indicates failed attachment, controlling the power concentrator to restart, and after the power concentrator restarts, returning to execute the step of obtaining the network attachment status information of the comprehensive tester.

[0077] In some embodiments, the signaling mode of the comprehensive tester can be turned on through SCPI instructions, and the query instruction loop query can be used to confirm whether the signaling mode is successfully turned on. If the query result contains the key field "ON, ADJ", it means that the signaling mode has been successfully turned on. In a specific embodiment, the query time (which can be called the first query time) can be timed. If the query result still indicates that the signaling mode is not successfully turned on when the first query time reaches the first query time threshold, the turn-on instruction is sent to the comprehensive tester again. The first query time threshold can be set according to actual needs, for example, it can be set to 60 seconds.

[0078] In some embodiments, after the signaling mode is turned on, the SCPI command can be used to query whether the network of the comprehensive tester is attached (i.e., obtain the network attachment status information). If the network attachment status information contains the key field "ATT", it indicates that the attachment is successful. If not, it indicates that the attachment fails. In a specific embodiment, it is possible to repeatedly query whether the network of the comprehensive tester is attached, and time the query time (which can be called the second query time). If the second query time does not reach the second query time threshold and the query result indicates that the attachment fails, the network attachment status information of the comprehensive tester is obtained again; if the query result still indicates that the attachment fails when the second query time reaches the second query time threshold, it is determined that the network attachment status information is an attachment failure. In this case, a SCPI command can be sent to the programmable power supply used to power the power concentrator, so that the power concentrator is powered on after powering off to restart the module, and after the power concentrator is restarted, the SCPI command is used to query whether the network of the comprehensive tester is attached again. When the network attachment status information is successful, the SCPI command can be used to control the comprehensive tester to establish a data connection with the power concentrator.

[0079] The above solution can quickly establish a data connection between the comprehensive tester and the power concentrator by performing a reconnection operation, thereby helping to improve test efficiency.

[0080] Exemplarily, the reconnection operation also includes: counting the number of times the network attachment status information is attachment failure; when the number reaches a threshold, marking the current target test case as a failure case; wherein the sensitivity test operation is performed when the current target test case is not marked as a failure case.

[0081] As described above, when the network attachment status information is attachment failure, the power concentrator is controlled to restart, and after the power concentrator is restarted, the network attachment status information is reacquired. In the scheme of this example, the number of times the network attachment status information is attachment failure can be counted, and if the number reaches the number threshold, the current target test case can be marked as a failure case. The number threshold can be set according to actual needs, for example, the number threshold can be 4. In this example, when the number of times the network attachment status information is attachment failure reaches 4 times, that is, the number of restarts of the power concentrator reaches 3 times, if the network attachment status information is still attachment failure, the current target test case can be determined as a failure case. In this case, step S120 can be performed based on the next set of target test cases.

[0082] It can be understood that when the number reaches the number threshold, it means that the network attachment has failed for many consecutive times. This may be due to an abnormality in the device under the current target test case. For example, the sensitivity level of the power concentrator may drop rapidly after exceeding the standard, resulting in an abnormal disconnection. In this case, the target test case can be directly determined as a failed case, which helps to avoid wasting time and improve test efficiency.

[0083] Optionally, after the control tester establishes a data connection with the power concentrator, the method may further include: controlling the tester to open a signal receiving page. In some embodiments, after the control tester establishes a data connection with the power concentrator, the tester may be controlled by SCPI instructions to open a signal receiving interface, and the "*OPC?" instruction may be circulated to query and confirm to ensure that the instruction is correctly executed.

[0084] Exemplarily, the method further includes the following steps: in response to the user's use case addition operation, adding a new preset test case; in response to the user's use case editing operation, editing the parameters in any preset test case. In a specific embodiment, the power concentrator is a 5G RedCap power concentrator. In this embodiment, the user can add new preset test cases, and can also edit and modify the parameters of any test case as needed. For example, the user can manually configure the title, mode, frequency band, bandwidth, channel, line loss, resource block and resource block position to add a new preset test case, wherein the sensitivity threshold in the new preset test case can be automatically matched according to the 3GPP (3rd Generation Partnership Project) protocol.

[0085] Figure 2 A schematic flow chart of a sensitivity testing method according to a specific embodiment of the present invention is shown.

[0086] like Figure 2 As shown, the method comprises the following steps:

[0087] In step S201, at least one group of target test cases is determined. After at least one group of target test cases is determined, steps S202 to S220 may be performed for each group of target test cases in the at least one group of target test cases until all target test cases are executed.

[0088] In step S202, it is determined whether the comprehensive tester needs to be reset. If reset is required, step S203 is executed, otherwise, step S204 is executed.

[0089] In step S203, the comprehensive tester is reset.

[0090] In step S204, the reference level is set to -85 (ie, the preset emission level).

[0091] In step S205, the comprehensive tester is configured. In this step, the parameters of the comprehensive tester may be configured based on the parameters in the current target test case.

[0092] In step S206, it is determined whether the power concentrator and the comprehensive tester are in a connected state, that is, it is determined whether the connection state indicated by the connection state information between the comprehensive tester and the power concentrator is normal. If they are not in a connected state (that is, the connection state is abnormal), step S207 is executed, otherwise, step S208 is executed.

[0093] In step S207, a data connection is established. In this step, a reconnection operation may be performed to make the connection state between the comprehensive tester and the power concentrator normal.

[0094] In step S208, the receiving interface (ie, signal receiving page) of the comprehensive tester is opened.

[0095] In step S209, the threshold value in the target test case is used as the initial value of the emission level: N, that is, the sensitivity threshold in the target test case is used as the initial emission level of the comprehensive tester.

[0096] In step S210, the test starts.

[0097] In step S211, it is determined whether the test is completed. If the test is not completed, the sensitivity test status of the comprehensive tester is re-acquired. If the test is completed, step S212 is executed.

[0098] In step S212, the test result is read.

[0099] In step S213, it is determined whether the bit error rate in the test result is greater than 4.5% (ie, the bit error rate threshold). If the bit error rate is less than or equal to 4.5%, step S214 is executed, otherwise, step S215 is executed.

[0100] In step S214, let Nmin =N, N=N min -M, and then return to step S210 to control the comprehensive tester to test the power concentrator with the adjusted N.

[0101] In step S215, let N max =N.

[0102] In step S216, determine N min With N max If the difference is not within the preset error range, then step S217 is executed; otherwise, step S218 is executed.

[0103] In step S217, the step length M is shortened. After the step length M is shortened, the process may return to step S214 based on the shortened step length M.

[0104] In step S218, the limit sensitivity of the power concentrator is determined to be N min .

[0105] In step S219, the test result of the current target test case is output.

[0106] In step S220, it is determined whether all test cases (ie, target test cases) have been executed. If the result is no, the process returns to step S202. Otherwise, it is determined that all test cases have been completed.

[0107] Figure 2 The specific implementation process of the steps in the illustrated embodiment has been described in detail above and will not be repeated here.

[0108] According to another aspect of an embodiment of the present invention, a sensitivity testing system for a power concentrator is provided. Figure 3 FIG. 2 is a schematic block diagram of a sensitivity testing system according to an embodiment of the present invention. Figure 3 As shown, the system 300 includes: a comprehensive tester 310 and a controller 320, the comprehensive tester 310 is connected to the power concentrator 410, and the comprehensive tester 310 is connected to the controller 320, the controller 320 is connected to the power concentrator 410, and the controller 320 is used to execute the above method 100.

[0109] Optionally, the controller 320 may be any control device currently available or developed in the future. In a specific embodiment, the controller 320 may be a computer.

[0110] Optionally, the power concentrator is connected to a programmable power supply for supplying power to the power concentrator, and the controller is connected to the programmable power supply.

[0111] Optionally, the system may also include an intelligent shielding box for simulating the actual working environment of the power concentrator. It is understandable that the working environment of the power concentrator is often complex and changeable, involving various electromagnetic interference, temperature changes, humidity effects and other factors. This complex environment will have a significant impact on the sensitivity of the 5G RedCap power concentrator. Therefore, when performing sensitivity tests, it is necessary to simulate these actual working environments to ensure the accuracy and reliability of the test results. However, building a test platform that can fully simulate the actual working environment is a challenging task that requires a lot of time and resources. The power concentrator needs to collect and process power data accurately and quickly, which requires its sensitivity to reach a very high level. When performing sensitivity tests, high-precision test equipment and methods are required to ensure the accuracy of the test results. However, high-precision test equipment is often expensive and complex to operate, which brings certain difficulties to the testing work. In the scheme of this example, by using an intelligent shielding box to simulate the actual working environment of the power concentrator, and by configuring the comprehensive tester using the target test case to simulate the network environment, the hardware requirements for testing the power concentrator can be met, and the test results obtained have high test accuracy.

[0112] In a specific embodiment, the power concentrator is a 5G RedCap power concentrator, and the controller is a computer. In this embodiment, the 5G RedCap power concentrator is physically connected to the comprehensive tester through a radio frequency line; the computer is physically connected to the comprehensive tester through GPIB (General-Purpose Interface Bus) or a network cable, and the computer sends SCPI instructions through GPIB to control the comprehensive tester; the computer is physically connected to the programmable power supply through GPIB, and the computer sends SCPI instructions through GPIB to control the programmable power supply; the programmable power supply is physically connected to the 5G RedCap power concentrator to be tested through the power line to control the power on and off of the 5G RedCap power concentrator to be tested.

[0113] Figure 4 FIG. 2 is a schematic block diagram of a sensitivity testing system according to an embodiment of the present invention. Figure 4 As shown, in this embodiment, the power concentrator 410 can be placed in the intelligent shielding box 420, and the comprehensive tester 310 is connected to the power concentrator 410. When testing the power concentrator 400, the actual working environment of the power concentrator can be simulated in the intelligent shielding box 420, and the parameters of the comprehensive tester can be configured through the target test case so that the comprehensive tester simulates the network environment. The intelligent shielding box 420 can select environmental experimental equipment such as a constant temperature and humidity chamber, a salt spray chamber, etc. as needed, which will not be described in detail.

[0114] According to yet another aspect of the embodiments of the present invention, an electronic device is provided. Figure 5 FIG. 2 shows a schematic block diagram of an electronic device according to an embodiment of the present invention. Figure 5 As shown, the electronic device 500 includes: a processor 510 and a memory 520. The memory 520 stores a computer program, and the processor 510 is used to execute the computer program to implement the above method.

[0115] According to another aspect of an embodiment of the present invention, a computer-readable storage medium is also provided. The storage medium stores a computer program / instruction, and the computer program / instruction implements the above method when executed by a processor. The storage medium may include, for example, a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a portable compact disk read-only memory (CD-ROM), a USB memory, or any combination of the above storage media. The computer-readable storage medium may be any combination of one or more computer-readable storage media.

[0116] A person skilled in the art can easily understand the implementation structure, working principle and beneficial effects of the sensitivity testing system, electronic device and computer-readable storage medium by reading the above sensitivity testing method. For the sake of brevity, no further description is given here.

[0117] Although example embodiments have been described herein with reference to the accompanying drawings, it should be understood that the above example embodiments are merely exemplary and are not intended to limit the scope of the present invention thereto. Various changes and modifications may be made therein by one of ordinary skill in the art without departing from the scope and spirit of the present invention. All such changes and modifications are intended to be included within the scope of the present invention as required by the appended claims.

[0118] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0119] In the several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed.

[0120] In the description provided herein, a large number of specific details are described. However, it is understood that embodiments of the present invention can be practiced without these specific details. In some instances, well-known methods, structures and techniques are not shown in detail so as not to obscure the understanding of this description.

[0121] Similarly, it should be understood that in order to streamline the present invention and help understand one or more of the various inventive aspects, in the description of the exemplary embodiments of the present invention, the various features of the present invention are sometimes grouped together into a single embodiment, figure, or description thereof. However, the method of the present invention should not be interpreted as reflecting the following intention: the claimed invention requires more features than the features explicitly stated in each claim. More specifically, as reflected in the corresponding claims, the inventive point is that the corresponding technical problem can be solved with less than all the features of a single disclosed embodiment. Therefore, the claims following the specific embodiment are hereby expressly incorporated into the specific embodiment, wherein each claim itself serves as a separate embodiment of the present invention.

[0122] It will be understood by those skilled in the art that, except for mutually exclusive features, all features disclosed in this specification (including the accompanying claims, abstracts and drawings) and all processes or units of any method or device disclosed in this specification may be combined in any combination. Unless otherwise expressly stated, each feature disclosed in this specification (including the accompanying claims, abstracts and drawings) may be replaced by an alternative feature that provides the same, equivalent or similar purpose.

[0123] In addition, those skilled in the art will appreciate that, although some embodiments described herein include certain features included in other embodiments but not other features, the combination of features of different embodiments is meant to be within the scope of the present invention and form different embodiments. For example, in the claims, any one of the claimed embodiments may be used in any combination.

[0124] The various component embodiments of the present invention can be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. It should be understood by those skilled in the art that a microprocessor or a digital signal processor (DSP) can be used in practice to implement some or all functions of some modules in the sensitivity test system and electronic equipment according to an embodiment of the present invention. The present invention can also be implemented as a device program (e.g., a computer program and a computer program product) for executing part or all of the methods described herein. Such a program implementing the present invention can be stored on a computer-readable medium, or can have the form of one or more signals. Such a signal can be downloaded from an Internet website, or provided on a carrier signal, or provided in any other form.

[0125] It should be noted that the above embodiments illustrate the present invention rather than limit it, and that those skilled in the art may devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference symbol between brackets shall not be construed as a limitation on the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "one" or "an" preceding an element does not exclude the presence of a plurality of such elements. The present invention may be implemented by means of hardware comprising a number of different elements and by means of a suitably programmed computer. In a unit claim enumerating a number of devices, several of these devices may be embodied by the same hardware item. The use of the words first, second, and third, etc., does not indicate any order. These words may be interpreted as names.

[0126] The above is only a specific embodiment of the present invention or an explanation of a specific embodiment, and the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. The protection scope of the present invention shall be based on the protection scope of the claims.

Claims

1. A sensitivity testing method for a power concentrator, characterized in that: Applied to sensitivity test system; The sensitivity test system includes a comprehensive tester, which is connected to the power concentrator; the method includes: In response to the user's use case selection operation, at least one group of target test cases is determined from preset test cases, wherein each group of test cases in the preset test cases is used to indicate a different network environment, and each group of test cases in the preset test cases includes at least the following parameters: mode, frequency band, line loss, bandwidth, channel, resource block, resource block position and sensitivity threshold; sequentially configuring the comprehensive tester based on the parameters in each group of target test cases in the at least one group of target test cases, wherein the initial emission level of the comprehensive tester is the sensitivity threshold in the current target test case; For any one of the at least one group of target test cases, after completing the configuration of the comprehensive tester based on the group of target test cases, a sensitivity test operation is performed, wherein the sensitivity test operation is used to control the comprehensive tester to test the power concentrator to determine the sensitivity of the power concentrator under the network environment indicated by the group of target test cases; Before configuring the comprehensive tester based on the parameters in each group of target test cases in the at least one group of target test cases in sequence, the method further includes: Determine whether the mode and frequency band in the current target test case are the same as the mode and frequency band in the previous target test case; When at least one of the mode and the frequency band in the target test case is different from the mode and the frequency band in the previous target test case, resetting the comprehensive tester; Before controlling the comprehensive tester to test the power concentrator, the method further includes: Obtaining connection status information between the comprehensive tester and the power concentrator; When the connection state indicated by the connection state information is abnormal, performing a reconnection operation to make the connection state between the comprehensive tester and the power concentrator normal; The step of controlling the comprehensive tester to test the power concentrator is performed when the connection status indicated by the connection status information is normal.

2. The method according to claim 1, characterized in that For each set of target test cases, the sensitivity test operation includes: Based on the initial emission level, controlling the comprehensive tester to test the power concentrator; Obtaining a test result, wherein the test result includes a bit error rate; Determining whether the bit error rate is greater than a bit error rate threshold; When the bit error rate is less than or equal to the bit error rate threshold, Determining that the current emission level of the comprehensive tester is a minimum reference level; Performing an emission level adjustment operation to adjust the emission level of the comprehensive tester; Based on the adjusted emission level of the comprehensive tester, returning to the step of controlling the comprehensive tester to test the power concentrator; When the bit error rate is greater than the bit error rate threshold, Determining that the current emission level of the comprehensive tester is a maximum reference level; Determining whether a difference between the maximum reference level and the minimum reference level is within a preset error range; When the difference between the maximum reference level and the minimum reference level is within the preset error range, the minimum reference level is determined to be the sensitivity corresponding to the target test case.

3. The method according to claim 2, characterized in that The emission level adjustment operation includes: Based on the minimum reference level and the preset adjustment step, the emission level of the comprehensive tester is adjusted, wherein the emission level of the comprehensive tester after adjustment is the difference between the minimum reference level and the preset adjustment step.

4. The method according to claim 3, characterized in that When the difference between the maximum reference level and the minimum reference level is not within the preset error range, the sensitivity test operation further includes: Updating the preset adjustment step, wherein the preset adjustment step after updating is smaller than the preset adjustment step before updating; Based on the updated preset adjustment step, the step of performing the emission level adjustment operation is returned to.

5. The method according to claim 2, characterized in that: Before obtaining the test result, the sensitivity test operation further includes: timing the test time of the comprehensive tester on the power concentrator; Determine whether the test duration reaches a test duration threshold; The operation of obtaining the test result is performed when the test duration reaches the test duration threshold; or, Before obtaining the test result, the sensitivity test operation further includes: Obtaining the sensitivity test status of the comprehensive tester; The operation of obtaining the test result is performed when the sensitivity test status is test completion.

6. The method according to any one of claims 1 to 5, characterized in that: The reconnection operation includes: Sending an opening instruction to the comprehensive tester to open the signaling mode of the comprehensive tester; Obtaining network attachment status information of the comprehensive tester; When the network attachment status information indicates that the attachment is successful, controlling the comprehensive tester to establish a data connection with the power concentrator; When the network attachment status information indicates attachment failure, the power concentrator is controlled to restart, and after the power concentrator is restarted, the step of obtaining the network attachment status information of the comprehensive tester is returned to be executed.

7. The method according to claim 6, characterized in that The reconnection operation further includes: Counting the number of times the network attachment status information is attachment failure; When the number of times reaches the number threshold, mark the current target test case as a failed test case; The sensitivity test operation is performed when the current target test case is not marked as a failed case.

8. A sensitivity test system for a power concentrator, characterized in that: include: A comprehensive tester and a controller, wherein the comprehensive tester is connected to the power concentrator, and the comprehensive tester is connected to the controller, and the controller is connected to the power concentrator, and the controller is used to execute the method described in any one of claims 1-7.

9. An electronic device, characterized in that: The method comprises a processor and a memory, wherein the memory stores a computer program, and the processor is used to execute the computer program to implement the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: A computer program / instruction is stored, and when the computer program / instruction is executed by a processor, the method according to any one of claims 1 to 7 is implemented.

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