A solid state hard disk intelligent testing method and system

Abstract

The present invention is applicable to the technical field of solid-state drive production testing, and provides a solid-state drive intelligent testing method and system, which performs a power-off fault injection test on a target solid-state drive, and analyzes whether abnormal data loss occurs in the target solid-state drive during the test. In the process of performing a power-off fault injection test on the test solid-state drive, the electrical parameter performance of the tested solid-state drive and the standard solid-state drive can be intelligently analyzed to determine whether the data loss is caused by the mismatch between the power of a specific physical storage component and the solid-state drive. Once the mismatch is confirmed, an adaptation solution for the specific physical storage component of the tested solid-state drive with an abnormality can also be provided to optimize its performance and improve stability. This method is not only limited to finding problems, but through in-depth analysis and intelligent identification, it can accurately locate the root cause of data loss.

Description

Technical Field

[0001] The present invention belongs to the technical field of solid state hard disk production testing, and in particular relates to a solid state hard disk intelligent testing method and system. Background Art

[0002] As one of the key storage devices in modern computer systems, the performance and reliability of solid-state drives (SSDs) are crucial to the overall operation of the system. Before a newly designed SSD is put into batch production, comprehensive testing is an important step to ensure its quality and stability. Among them, power-off fault injection testing is a commonly used test method that aims to simulate the data loss problem that SSDs may face in the event of a sudden power outage. Current technology usually relies on detecting the fact of data loss in such tests, but it is impossible to accurately determine whether the data loss is caused by the mismatch between the power of a specific physical storage component and the SSD design.

[0003] Current technologies have several major flaws: First, for data loss that occurs during power outage fault injection testing, existing methods have difficulty accurately determining whether it is due to a mismatch between the power of a specific physical storage component and the hard drive design. This leads to difficulties in locating the source of the problem and taking precise repair measures. Second, existing technologies lack intelligent analysis capabilities and cannot effectively provide targeted physical storage component adaptation solutions to optimize the performance of the SSD under test in the event of a power outage. Therefore, these flaws limit the stability and reliability of the SSD in the face of sudden power outages, affecting its performance and durability in actual applications. Summary of the invention

[0004] The purpose of the present invention is to provide a solid state hard disk intelligent testing method and system, aiming to solve the problems raised in the background technology.

[0005] The present invention is implemented as follows: a solid state hard disk intelligent testing method, the method comprising:

[0006] Perform a power failure fault injection test on the target SSD and analyze whether abnormal data loss occurs on the target SSD during the test;

[0007] If it is determined that abnormal data loss occurs on the target solid-state drive, determine the abnormal data loss coverage time and the specific physical storage component where the abnormal data is lost, and obtain a change in the first electrical parameter of the specific physical storage component where the abnormal data is lost within the abnormal data loss coverage time;

[0008] Perform the same power-off fault injection test on a preset standard solid-state hard disk, and obtain a change in a second electrical parameter of a standard physical storage component corresponding to a specific physical storage component of the target solid-state hard disk where abnormal data is lost within the abnormal data loss coverage time of the standard solid-state hard disk;

[0009] Intelligently analyze the change of the first electrical parameter and the change of the second electrical parameter, and generate hardware selection recommendation information according to the difference between the two.

[0010] As a further limitation of the technical solution of the embodiment of the present invention, the steps of performing a power-off fault injection test on the target solid-state hard disk and analyzing whether abnormal data loss occurs in the target solid-state hard disk during the test include:

[0011] Writing a target test file into a target solid-state drive, and after writing a predetermined amount of the target test file, powering off the target solid-state drive, powering on the target solid-state drive again after a preset period of time, and using data recovery software to scan and analyze whether the target test file is lost;

[0012] If it is determined that the target test file has data loss, record the abnormal data loss of the target solid state drive during the test and obtain the lost abnormal data;

[0013] If it is determined that there is no data loss in the target test file, record that there is no abnormal data loss in the target solid state drive during the test.

[0014] As a further limitation of the technical solution of the embodiment of the present invention, if it is determined that abnormal data loss occurs in the target solid state drive, the steps of determining the abnormal data loss coverage time and the specific physical storage component of the abnormal data loss, and obtaining the first electrical parameter change of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time include:

[0015] If it is determined that abnormal data loss occurs on the target solid state drive, determine the starting address of the lost abnormal data, and obtain the writing time point of the starting address;

[0016] Obtaining the time point of the power-off operation, calculating the time length from the writing time point of the start address to the time point of the power-off operation, and setting the time length as the abnormal data loss coverage time;

[0017] Determine the logical address range of the abnormal data and map it to a specific physical storage location of the target solid state drive to determine the specific physical storage component where the abnormal data is lost;

[0018] The first current change data and the first voltage change data of the specific physical storage component where the abnormal data is lost within the abnormal data loss coverage time are obtained, and these data are packaged to obtain the first electrical parameter change situation.

[0019] As a further limitation of the technical solution of the embodiment of the present invention, the steps of performing the same power-off fault injection test on a preset standard solid-state hard disk and obtaining a change in a second electrical parameter of a standard physical storage component corresponding to a specific physical storage component of the target solid-state hard disk where abnormal data is lost within the abnormal data loss coverage time of the standard solid-state hard disk include:

[0020] Perform the same power-off fault injection test on a preset standard SSD;

[0021] Determine a standard physical storage component in the standard solid state drive corresponding to a specific physical storage component in which abnormal data of the target solid state drive is lost;

[0022] The second current change data and the second voltage change data of the standard physical storage component within the abnormal data loss coverage time are obtained, and these data are packaged to obtain the second electrical parameter change situation.

[0023] As a further limitation of the technical solution of the embodiment of the present invention, the step of intelligently analyzing the change of the first electrical parameter and the change of the second electrical parameter, and generating hardware selection suggestion information according to the difference between the two comprises:

[0024] The first current change data and the second current change data are obtained, the corresponding first current change curve and the second current change curve are generated, the average slopes of the two are calculated, and the average slope of the first current change curve is divided by the average slope of the second current change curve to obtain the current optimization recommendation index.

[0025] Acquire first voltage change data and second voltage change data, generate corresponding first voltage change curve and second voltage change curve, calculate average slopes of the two, and divide the average slope of the first voltage change curve by the average slope of the second voltage change curve to obtain a voltage optimization recommendation index;

[0026] The current optimization recommendation index and the voltage optimization recommendation index are integrated to obtain hardware selection recommendation information of the target solid state drive.

[0027] As a further limitation of the technical solution of the embodiment of the present invention, after obtaining the hardware selection recommendation information, determining the model information of the specific physical storage component of the target solid-state hard disk where abnormal data is lost, and determining its current demand parameter and voltage tolerance range according to the model information;

[0028] According to the current optimization recommendation index and the voltage optimization recommendation index, the current demand parameters and voltage tolerance range of the specific physical storage components of the target solid-state hard disk with abnormal data loss are adjusted and optimized to obtain the optimized current demand parameters and voltage tolerance range, and according to the optimized current demand parameters and voltage tolerance range, a suitable physical storage component is selected for the target solid-state hard disk to replace the specific physical storage component of the target solid-state hard disk with abnormal data loss.

[0029] A solid state drive intelligent testing system, the system comprising: a data loss judgment module, a first electrical parameter change acquisition module, a second electrical parameter change acquisition module and a hardware selection suggestion information generation module, wherein:

[0030] The data loss judgment module is used to perform a power failure fault injection test on the target solid-state drive and analyze whether abnormal data loss occurs in the target solid-state drive during the test;

[0031] A first electrical parameter change acquisition module is used to determine the abnormal data loss coverage time and the specific physical storage component of the abnormal data loss if it is determined that the target solid state drive has abnormal data loss, and obtain the first electrical parameter change of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time;

[0032] A second electrical parameter change acquisition module is used to perform the same power-off fault injection test on a preset standard solid-state hard disk, and obtain a second electrical parameter change of a standard physical storage component corresponding to a specific physical storage component of the target solid-state hard disk where abnormal data is lost within the abnormal data loss coverage time of the standard solid-state hard disk;

[0033] The hardware selection suggestion information generating module is used to intelligently analyze the change of the first electrical parameter and the change of the second electrical parameter, and generate the hardware selection suggestion information according to the difference between the two.

[0034] As a further limitation of the technical solution of the embodiment of the present invention, the data loss judgment module specifically includes:

[0035] A first power-off fault injection test unit is used to write a target test file into a target solid-state hard disk, and after writing a predetermined amount of the target test file, the target solid-state hard disk is powered off, and after a preset time period, the target solid-state hard disk is powered on again, and a data recovery software is used to scan and analyze whether the target test file is lost;

[0036] A first recording unit is used to record abnormal data loss of the target solid state drive during the test process if it is determined that the target test file has data loss, and obtain the lost abnormal data;

[0037] The second recording unit is used to record that no abnormal data loss occurs in the target solid state drive during the test process if it is determined that no data loss occurs in the target test file.

[0038] As a further limitation of the technical solution of the embodiment of the present invention, the first electrical parameter change acquisition module specifically includes:

[0039] The abnormal data analysis unit is used to determine the starting address of the lost abnormal data and obtain the writing time point of the starting address if it is determined that the target solid state drive has abnormal data loss;

[0040] The abnormal data loss coverage time determination unit is used to obtain the time point of the power-off operation, calculate the time length from the writing time point of the start address to the time point of the power-off operation, and set the time length as the abnormal data loss coverage time;

[0041] A first physical storage component determination unit, configured to determine a logical address range of abnormal data and map it to a specific physical storage location of a target solid state drive, so as to determine a specific physical storage component where the abnormal data is lost;

[0042] The first electrical parameter change situation generating unit is used to obtain the first current change data and the first voltage change data of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time, and package these data to obtain the first electrical parameter change situation.

[0043] As a further limitation of the technical solution of the embodiment of the present invention, the second electrical parameter change acquisition module specifically includes:

[0044] A second power-off fault injection test unit, used for performing the same power-off fault injection test on a preset standard solid-state hard disk;

[0045] A second physical storage component determination unit is used to determine a standard physical storage component in the standard solid state drive corresponding to the specific physical storage component to which abnormal data of the target solid state drive is lost;

[0046] The second electrical parameter change situation generating unit is used to obtain the second current change data and the second voltage change data of the standard physical storage component within the abnormal data loss coverage time, and package these data to obtain the second electrical parameter change situation.

[0047] Compared with the prior art, the present invention performs a power-off fault injection test on the target solid-state hard disk, and analyzes whether the target solid-state hard disk has abnormal data loss during the test process; if it is determined that the target solid-state hard disk has abnormal data loss, the abnormal data loss coverage time and the specific physical storage component of the abnormal data loss are determined, and the first electrical parameter change of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time is obtained; the same power-off fault injection test is performed on the preset standard solid-state hard disk, and the second electrical parameter change of the standard physical storage component corresponding to the specific physical storage component of the target solid-state hard disk abnormal data loss within the abnormal data loss coverage time is obtained; the first electrical parameter change and the second electrical parameter change are intelligently analyzed, and hardware selection recommendation information is generated according to the difference between the two. In the process of performing a power-off fault injection test on the test solid-state hard disk, the electrical parameter performance of the tested solid-state hard disk and the standard solid-state hard disk can be intelligently analyzed to determine whether the data loss is caused by the mismatch between the power of the specific physical storage component and the solid-state hard disk. Once the mismatch is confirmed, an adaptation scheme for the specific physical storage component of the tested solid-state hard disk with abnormality can also be provided to optimize its performance and improve stability. This approach is not limited to finding problems, but can accurately locate the root cause of data loss through in-depth analysis and intelligent identification. Furthermore, by providing an adaptive physical storage component for each abnormal component, the problem of data loss caused by power mismatch is effectively solved, thereby improving the reliability and durability of the SSD. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] Figure 1 A flowchart of a method provided by an embodiment of the present invention;

[0049] Figure 2 A flowchart of determining whether abnormal data loss occurs in the method provided in an embodiment of the present invention;

[0050] Figure 3 A flow chart of obtaining a change in a first electrical parameter in a method provided in an embodiment of the present invention;

[0051] Figure 4 A flow chart of obtaining a change in a second electrical parameter in a method provided in an embodiment of the present invention;

[0052] Figure 5 A flowchart of generating hardware selection suggestion information in the method provided in an embodiment of the present invention;

[0053] Figure 6 An application architecture diagram of a system provided by an embodiment of the present invention;

[0054] Figure 7A structural block diagram of a data loss judgment module in a system provided by an embodiment of the present invention;

[0055] Figure 8 A structural block diagram of a first electrical parameter change acquisition module in a system provided by an embodiment of the present invention;

[0056] Fig. 9 This is a structural block diagram of a module for acquiring a change in a second electrical parameter in a system provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0057] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0058] It is understood that the terms "first", "second", etc. used in this application may be used herein to describe various elements, but unless otherwise specified, these elements are not limited by these terms. These terms are only used to distinguish a first element from another element. For example, without departing from the scope of this application, a first xx script may be referred to as a second xx script, and similarly, a second xx script may be referred to as a first xx script.

[0059] Figure 1 A flow chart of a method provided by an embodiment of the present invention is shown.

[0060] Specifically, a solid state drive intelligent testing method is provided, the method specifically comprising the following steps:

[0061] Step S100, performing a power failure fault injection test on a target solid state drive, and analyzing whether abnormal data loss occurs in the target solid state drive during the test.

[0062] Specifically, Figure 2 A flow chart for determining whether abnormal data loss occurs is shown.

[0063] The following steps are specifically included in the process of performing a power failure fault injection test on the target solid state drive and analyzing whether abnormal data loss occurs in the target solid state drive during the test:

[0064] Step S101, writing a target test file into a target solid-state drive, and after writing a predetermined amount of the target test file, powering off the target solid-state drive, and after a preset period of time, powering on the target solid-state drive again, and using data recovery software to scan and analyze whether the target test file is lost;

[0065] Step S102, if it is determined that the target test file has data loss, record the abnormal data loss of the target solid state drive during the test process, and obtain the lost abnormal data;

[0066] Step S103: If it is determined that there is no data loss in the target test file, it is recorded that there is no abnormal data loss in the target solid state drive during the test.

[0067] In the embodiment of the present invention, the target SSD refers to a SSD that has been subjected to hardware design testing before mass production under a specific design. In this application, the main purpose of the target SSD is to ensure through testing that when a sudden power outage occurs, the physical storage components in the batch of SSDs will not suffer from serious data loss problems, thereby avoiding potential quality risks in production.

[0068] Power failure fault injection testing refers to the process of artificially simulating sudden power failures during the test to evaluate the performance of the solid-state drive under such conditions, especially to detect whether its physical storage components will cause data loss.

[0069] When testing a target SSD, you first need to write specific test files into it. The contents of these files can be randomly generated data blocks or carefully designed test data, the purpose of which is to simulate the data writing process in actual use. For example, if you want to test a target SSD with a capacity of 1TB, you can generate a 500GB test file and write it continuously to the target SSD. This process can be controlled using specialized test tools or software to ensure that the data is written completely and sequentially to the specified storage area.

[0070] When the writing process is completed to a predetermined amount (for example, half of a 500GB file has been written), the tester will deliberately interrupt the power supply of the target SSD, which is called a "power-off operation." The purpose of power off is to simulate an unexpected power outage or power failure that may occur in reality, and to evaluate the data retention ability of the target SSD under such extreme conditions. The power off operation is usually performed at a specific moment, such as when a file is written to a key point or storage area.

[0071] After a preset period of time (e.g., 5 seconds or 30 seconds), re-power the target SSD to resume operation. After power is restored, use data recovery software (e.g., R-Studio) to scan the target SSD to check whether the previously written test files are intact. If files are missing, it means that the target SSD may have lost data during the power outage, and the hardware design or firmware may need further optimization.

[0072] Furthermore, the solid state drive intelligent testing method further includes the following steps:

[0073] Step S200, if it is determined that abnormal data loss occurs in the target solid state drive, determine the abnormal data loss coverage time and the specific physical storage component of the abnormal data loss, and obtain the first electrical parameter change of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time.

[0074] Specifically, Figure 3 A flow chart for obtaining a change in a first electrical parameter is shown.

[0075] Among them, if it is determined that the target solid state drive has abnormal data loss, determining the abnormal data loss coverage time and the specific physical storage component of the abnormal data loss, and obtaining the first electrical parameter change of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time specifically includes the following steps:

[0076] Step S201, if it is determined that abnormal data loss occurs in the target solid state drive, the starting address of the lost abnormal data is determined, and the writing time point of the starting address is obtained;

[0077] Step S202, obtaining the time point of the power-off operation, calculating the time length from the writing time point of the start address to the time point of the power-off operation, and setting the time length as the abnormal data loss coverage time;

[0078] Step S203, determining the logical address range of the abnormal data and mapping it to a specific physical storage location of the target solid state drive to determine the specific physical storage component where the abnormal data is lost;

[0079] Step S204, obtaining first current change data and first voltage change data of a specific physical storage component with abnormal data loss within the abnormal data loss coverage time, and packaging these data to obtain first electrical parameter change information.

[0080] In the embodiment of the present invention, the first current change data and the first voltage change data of the specific physical storage component of abnormal data loss can be obtained by an electrical monitoring module integrated in the solid state drive controller or by using external instruments such as a high-precision oscilloscope.

[0081] Furthermore, the solid state drive intelligent testing method further includes the following steps:

[0082] Step S300, performing the same power-off fault injection test on a preset standard solid-state hard disk, and obtaining the second electrical parameter change of the standard physical storage component corresponding to the specific physical storage component of the target solid-state hard disk where abnormal data is lost within the abnormal data loss coverage time.

[0083] Specifically, Figure 4 A flow chart for obtaining the change of the second electrical parameter is shown.

[0084] The same power-off fault injection test is performed on a preset standard solid-state hard disk, and the second electrical parameter change of the standard physical storage component corresponding to the specific physical storage component of the target solid-state hard disk with abnormal data loss during the abnormal data loss coverage time of the standard solid-state hard disk specifically includes the following steps:

[0085] Step S301, performing the same power failure fault injection test on a preset standard solid state drive;

[0086] Step S302, determining a standard physical storage component in the standard solid state drive corresponding to the specific physical storage component where abnormal data is lost in the target solid state drive;

[0087] Step S303, obtaining the second current change data and the second voltage change data of the standard physical storage component within the abnormal data loss coverage time, and packaging these data to obtain the second electrical parameter change situation.

[0088] In the embodiment of the present invention, the preset standard SSD refers to a SSD that has been strictly tested and verified, and its model and function are the same as those of the target SSD, or the target SSD is designed, improved, or revised on the basis of the SSD. The SSD has been confirmed to be stable and reliable in design and manufacturing process, so it is used as a benchmark when performing power-off fault injection testing to ensure that it can provide reference electrical parameter data and performance under the same test conditions, so as to compare and analyze with the target SSD to determine whether there are potential problems or optimization space in the target SSD.

[0089] Performing the same power-off fault injection test on a preset standard solid-state drive refers to writing the same target test file to the preset standard solid-state drive to ensure that the written content and the power-off time are completely consistent with those of the target solid-state drive.

[0090] The second current change data and the second voltage change data of the standard physical storage component within the abnormal data loss coverage time refer to the second current change data and the second voltage change data recorded by the standard physical storage component within the time period of the abnormal data loss coverage time when writing the target test file.

[0091] Furthermore, the solid state drive intelligent testing method further includes the following steps:

[0092] Step S400: intelligently analyzing the change of the first electrical parameter and the change of the second electrical parameter, and generating hardware selection suggestion information according to the difference between the two.

[0093] Specifically, Figure 5 A flow chart for generating hardware selection recommendation information is shown.

[0094] The intelligent analysis of the change of the first electrical parameter and the change of the second electrical parameter, and the generation of hardware selection suggestion information according to the difference between the two specifically includes the following steps:

[0095] Step S401, obtaining first current change data and second current change data, generating corresponding first current change curve and second current change curve, calculating the average slope of the two, and dividing the average slope of the first current change curve by the average slope of the second current change curve to obtain a current optimization recommendation index;

[0096] Step S402, obtaining first voltage change data and second voltage change data, generating corresponding first voltage change curve and second voltage change curve, calculating the average slope of the two, and dividing the average slope of the first voltage change curve by the average slope of the second voltage change curve to obtain a voltage optimization recommendation index;

[0097] Step S403 , integrating the current optimization suggestion index and the voltage optimization suggestion index to obtain hardware selection suggestion information of the target solid state drive.

[0098] After obtaining the hardware selection recommendation information, determine the model information of the specific physical storage component of the target solid-state hard disk where abnormal data loss occurs, and determine its current demand parameter and voltage tolerance range based on the model information;

[0099] According to the current optimization recommendation index and the voltage optimization recommendation index, the current demand parameters and voltage tolerance range of the specific physical storage components of the target solid-state hard disk with abnormal data loss are adjusted and optimized to obtain the optimized current demand parameters and voltage tolerance range, and according to the optimized current demand parameters and voltage tolerance range, a suitable physical storage component is selected for the target solid-state hard disk to replace the specific physical storage component of the target solid-state hard disk with abnormal data loss.

[0100] In the embodiments of the present invention, the technicians in this field understand based on common technical knowledge that after the newly produced batch of solid-state hard disks are modified and upgraded in hardware or software, unexpected usage problems may occur, among which power failure data loss is a relatively common fault. Through multiple tests and observations by technicians, it is found that when the modified solid-state hard disk loses or damages data during the power failure fault injection test, it is often because the power parameters (including current demand parameters and voltage tolerance range) of the specific storage components of the modified solid-state hard disk are not compatible with the new hardware design or software configuration during the power failure operation. This incompatibility causes power fluctuations in the storage component during the power failure process, thereby causing data loss or damage.

[0101] Specifically, when writing data, the SSD requires the storage component to have a stable current supply and appropriate voltage tolerance. If these power parameters are not adjusted accordingly after the hardware is modified, the storage component may not be able to maintain the necessary power stability when a power outage occurs, resulting in errors in the data writing process, which in turn causes data loss or corruption. This situation is particularly likely to occur when the write operation is close to completion but the write has not yet been confirmed to be successful.

[0102] In view of the above technical problems, the present invention first compares and analyzes the change of the first electrical parameter and the change of the second electrical parameter, and determines whether there is a significant difference between the two, so as to determine whether the power-off data loss is caused by the power parameters of the specific storage component not matching the new hardware design or software configuration. Specifically, when the absolute difference between the average slope of the first current change curve and the average slope of the second current change curve exceeds the preset first threshold, it indicates that the abnormal data loss of the target solid-state hard disk is related to the current demand parameter of its specific physical storage component not matching the new hardware design or software configuration; and when the absolute difference between the average slope of the first voltage change curve and the average slope of the second voltage change curve exceeds the preset second threshold, it indicates that the abnormal data loss of the target solid-state hard disk is related to the voltage tolerance range of its specific physical storage component not matching the new hardware design or software configuration.

[0103] In the process of optimizing the current demand parameters and voltage tolerance range of the specific physical storage components of the target SSD with abnormal data loss, it is first necessary to divide the current demand parameters and voltage tolerance range of the specific physical storage components of the target SSD with abnormal data loss by the current optimization recommendation index and the voltage optimization recommendation index respectively to achieve parameter adjustment optimization. Subsequently, it is necessary to find physical storage components with the same functions to ensure that their current demand parameters and voltage tolerance range match the optimized parameters. These selected replacement physical storage components will be recommended as the preferred replacements for this batch of SSDs to solve the problem of data loss in the case of power failure of the target SSDs and further improve the design and production process of this batch of SSDs.

[0104] In summary, modern SSDs often face problems such as power outage data loss after design upgrades. Through power-off fault injection testing, technicians have found that these problems often stem from the mismatch between the power parameters of specific physical storage components and the new design. By analyzing the differences in the change curves of current and voltage, it is possible to accurately determine which components are not suitable for new hardware designs or software configurations. The introduction of the optimization suggestion index effectively guides the adjustment of the current demand parameters and voltage tolerance range of the target SSD to ensure its stability and data integrity in the event of a power outage.

[0105] The key is to scientifically select replacement physical storage components. Based on the optimized parameters, replacement components with the same functions are accurately matched to solve the data loss problem and optimize the hard drive design. This process not only improves the reliability and stability of the hard drive, but also optimizes the production process to ensure that product quality and performance meet the expected standards. With this method, technicians can effectively identify potential problems in the early stages of hard drive production, reduce later product adjustments and customer complaints, and thus improve overall production efficiency and customer satisfaction.

[0106] This comprehensive application of advanced power-off fault injection testing and precise power parameter analysis methods provides an efficient and reliable quality control method for SSD design and production. With the continuous advancement of technology and the widespread application of these methods, it is expected to bring more stable and reliable products to the SSD industry and promote its further development and application in the field of digital storage.

[0107] Furthermore, Figure 6 The application architecture diagram of the system provided by the embodiment of the present invention is shown.

[0108] In another preferred embodiment of the present invention, a solid state drive intelligent testing system includes:

[0109] The data loss determination module 100 is used to perform a power failure fault injection test on a target solid state drive and analyze whether abnormal data loss occurs in the target solid state drive during the test.

[0110] Specifically, Figure 7 The structure block diagram of the data loss judgment module 100 in the system provided by the embodiment of the present invention is shown.

[0111] Among them, in the preferred implementation manner provided by the present invention, the data loss judgment module 100 specifically includes:

[0112] The first power-off fault injection test unit 101 is used to write a target test file into a target solid-state hard disk, and after writing a predetermined amount of the target test file, the target solid-state hard disk is powered off, and after a preset time period, the target solid-state hard disk is powered on again, and a data recovery software is used to scan and analyze whether the target test file is lost;

[0113] The first recording unit 102 is used to record abnormal data loss of the target solid state drive during the test process if it is determined that the target test file has data loss, and obtain the lost abnormal data;

[0114] The second recording unit 103 is used to record that no abnormal data loss occurs in the target solid state drive during the test process if it is determined that no data loss occurs in the target test file.

[0115] In the embodiment of the present invention, the target SSD refers to a SSD that has been subjected to hardware design testing before mass production under a specific design. In this application, the main purpose of the target SSD is to ensure through testing that when a sudden power outage occurs, the physical storage components in the batch of SSDs will not suffer from serious data loss problems, thereby avoiding potential quality risks in production.

[0116] Power failure fault injection testing refers to the process of artificially simulating sudden power failures during the test to evaluate the performance of the solid-state drive under such conditions, especially to detect whether its physical storage components will cause data loss.

[0117] When testing a target SSD, you first need to write specific test files into it. The contents of these files can be randomly generated data blocks or carefully designed test data, the purpose of which is to simulate the data writing process in actual use. For example, if you want to test a target SSD with a capacity of 1TB, you can generate a 500GB test file and write it continuously to the target SSD. This process can be controlled using specialized test tools or software to ensure that the data is written completely and sequentially to the specified storage area.

[0118] When the writing process is completed to a predetermined amount (for example, half of a 500GB file has been written), the tester will deliberately interrupt the power supply of the target SSD, which is called a "power-off operation." The purpose of power off is to simulate an unexpected power outage or power failure that may occur in reality, and to evaluate the data retention ability of the target SSD under such extreme conditions. The power off operation is usually performed at a specific moment, such as when a file is written to a key point or storage area.

[0119] After a preset period of time (e.g., 5 seconds or 30 seconds), re-power the target SSD to resume operation. After power is restored, use data recovery software (e.g., R-Studio) to scan the target SSD to check whether the previously written test files are intact. If files are missing, it means that the target SSD may have lost data during the power outage, and the hardware design or firmware may need further optimization.

[0120] Furthermore, the solid state drive intelligent testing system also includes:

[0121] The first electrical parameter change acquisition module 200 is used to determine the abnormal data loss coverage time and the specific physical storage component of the abnormal data loss if it is determined that the target solid state drive has abnormal data loss, and obtain the first electrical parameter change of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time.

[0122] Specifically, Figure 8 It shows a structural block diagram of the first electrical parameter change condition acquisition module 200 in the system provided by an embodiment of the present invention.

[0123] Among them, in the preferred embodiment provided by the present invention, the first electrical parameter change acquisition module 200 includes:

[0124] The abnormal data analysis unit 201 is used to determine the starting address of the lost abnormal data and obtain the writing time point of the starting address if it is determined that the target solid state drive has abnormal data loss;

[0125] The abnormal data loss coverage time determination unit 202 is used to obtain the time point of the power-off operation, calculate the time length from the writing time point of the start address to the time point of the power-off operation, and set the time length as the abnormal data loss coverage time;

[0126] A first physical storage component determination unit 203 is used to determine the logical address range of the abnormal data and map it to a specific physical storage location of the target solid state drive to determine the specific physical storage component where the abnormal data is lost;

[0127] The first electrical parameter change situation generating unit 204 is used to obtain the first current change data and the first voltage change data of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time, and package these data to obtain the first electrical parameter change situation.

[0128] In the embodiment of the present invention, the first current change data and the first voltage change data of the specific physical storage component of abnormal data loss can be obtained by an electrical monitoring module integrated in the solid state drive controller or by using external instruments such as a high-precision oscilloscope.

[0129] Furthermore, the solid state drive intelligent testing system also includes:

[0130] The second electrical parameter change acquisition module 300 is used to perform the same power-off fault injection test on the preset standard solid-state hard disk, and obtain the second electrical parameter change of the standard physical storage component corresponding to the specific physical storage component of the target solid-state hard disk where the abnormal data is lost within the abnormal data loss coverage time of the standard solid-state hard disk;

[0131] The hardware selection suggestion information generating module 400 is used to intelligently analyze the change of the first electrical parameter and the change of the second electrical parameter, and generate hardware selection suggestion information according to the difference between the two.

[0132] After obtaining the hardware selection recommendation information, determine the model information of the specific physical storage component of the target solid-state hard disk where abnormal data loss occurs, and determine its current demand parameter and voltage tolerance range based on the model information;

[0133] According to the current optimization recommendation index and the voltage optimization recommendation index, the current demand parameters and voltage tolerance range of the specific physical storage components of the target solid-state hard disk with abnormal data loss are adjusted and optimized to obtain the optimized current demand parameters and voltage tolerance range, and according to the optimized current demand parameters and voltage tolerance range, a suitable physical storage component is selected for the target solid-state hard disk to replace the specific physical storage component of the target solid-state hard disk with abnormal data loss.

[0134] Specifically, Fig. 9 It shows a structural block diagram of the second electrical parameter change condition acquisition module 300 in the system provided by an embodiment of the present invention.

[0135] Among them, in the preferred embodiment provided by the present invention, the second electrical parameter change acquisition module 300 specifically includes:

[0136] A second power failure fault injection test unit 301, used to perform the same power failure fault injection test on a preset standard solid state drive;

[0137] The second physical storage component determination unit 302 is used to determine a standard physical storage component in the standard solid state drive corresponding to the specific physical storage component to which the abnormal data of the target solid state drive is lost;

[0138] The second electrical parameter change situation generating unit 303 is used to obtain the second current change data and the second voltage change data of the standard physical storage component within the abnormal data loss coverage time, and package these data to obtain the second electrical parameter change situation.

[0139] In the embodiment of the present invention, the preset standard SSD refers to a SSD that has been strictly tested and verified, and its model and function are the same as those of the target SSD, or the target SSD is designed, improved, or revised on the basis of the SSD. The SSD has been confirmed to be stable and reliable in design and manufacturing process, so it is used as a benchmark when performing power-off fault injection testing to ensure that it can provide reference electrical parameter data and performance under the same test conditions, so as to compare and analyze with the target SSD to determine whether there are potential problems or optimization space in the target SSD.

[0140] Performing the same power-off fault injection test on a preset standard solid-state drive refers to writing the same target test file to the preset standard solid-state drive to ensure that the written content and the power-off time are completely consistent with those of the target solid-state drive.

[0141] The second current change data and the second voltage change data of the standard physical storage component within the abnormal data loss coverage time refer to the second current change data and the second voltage change data recorded by the standard physical storage component within the time period of the abnormal data loss coverage time when writing the target test file.

[0142] Based on common technical knowledge, technicians in this field understand that after the hardware or software of a newly produced batch of solid-state drives is modified and upgraded, unexpected usage problems may occur, among which power-off data loss is a relatively common fault. Through multiple tests and observations by technicians, it is found that when a modified solid-state drive loses or damages data during a power-off fault injection test, it is often because the power parameters (including current demand parameters and voltage tolerance range) of the specific storage components of the modified solid-state drive are not compatible with the new hardware design or software configuration during the power-off operation. This incompatibility causes power fluctuations in the storage component during the power-off process, which causes data loss or damage.

[0143] Specifically, when writing data, the SSD requires the storage component to have a stable current supply and appropriate voltage tolerance. If these power parameters are not adjusted accordingly after the hardware is modified, the storage component may not be able to maintain the necessary power stability when a power outage occurs, resulting in errors in the data writing process, which in turn causes data loss or corruption. This situation is particularly likely to occur when the write operation is close to completion but the write has not yet been confirmed to be successful.

[0144] In view of the above technical problems, the present invention first compares and analyzes the change of the first electrical parameter and the change of the second electrical parameter, and determines whether there is a significant difference between the two, so as to determine whether the power-off data loss is caused by the power parameters of the specific storage component not matching the new hardware design or software configuration. Specifically, when the absolute difference between the average slope of the first current change curve and the average slope of the second current change curve exceeds the preset first threshold, it indicates that the abnormal data loss of the target solid-state hard disk is related to the current demand parameter of its specific physical storage component not matching the new hardware design or software configuration; and when the absolute difference between the average slope of the first voltage change curve and the average slope of the second voltage change curve exceeds the preset second threshold, it indicates that the abnormal data loss of the target solid-state hard disk is related to the voltage tolerance range of its specific physical storage component not matching the new hardware design or software configuration.

[0145] In the process of optimizing the current demand parameters and voltage tolerance range of the specific physical storage components of the target SSD with abnormal data loss, it is first necessary to divide the current demand parameters and voltage tolerance range of the specific physical storage components of the target SSD with abnormal data loss by the current optimization recommendation index and the voltage optimization recommendation index respectively to achieve parameter adjustment optimization. Subsequently, it is necessary to find physical storage components with the same functions to ensure that their current demand parameters and voltage tolerance range match the optimized parameters. These selected replacement physical storage components will be recommended as the preferred replacements for this batch of SSDs to solve the problem of data loss in the case of power failure of the target SSDs and further improve the design and production process of this batch of SSDs.

[0146] In summary, modern SSDs often face problems such as power outage data loss after design upgrades. Through power-off fault injection testing, technicians have found that these problems often stem from the mismatch between the power parameters of specific physical storage components and the new design. By analyzing the differences in the change curves of current and voltage, it is possible to accurately determine which components are not suitable for new hardware designs or software configurations. The introduction of the optimization suggestion index effectively guides the adjustment of the current demand parameters and voltage tolerance range of the target SSD to ensure its stability and data integrity in the event of a power outage.

[0147] The key is to scientifically select replacement physical storage components. Based on the optimized parameters, replacement components with the same functions are accurately matched to solve the data loss problem and optimize the hard drive design. This process not only improves the reliability and stability of the hard drive, but also optimizes the production process to ensure that product quality and performance meet the expected standards. With this method, technicians can effectively identify potential problems in the early stages of hard drive production, reduce later product adjustments and customer complaints, and thus improve overall production efficiency and customer satisfaction.

[0148] This comprehensive application of advanced power-off fault injection testing and precise power parameter analysis methods provides an efficient and reliable quality control method for SSD design and production. With the continuous advancement of technology and the widespread application of these methods, it is expected to bring more stable and reliable products to the SSD industry and promote its further development and application in the field of digital storage.

[0149] It should be understood that, although each step in the flow chart of each embodiment of the present invention is shown in sequence according to the indication of the arrow, these steps are not necessarily performed in sequence according to the order indicated by the arrow. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be performed in other orders. Moreover, at least a portion of the steps in each embodiment may include a plurality of sub-steps or a plurality of stages, and these sub-steps or stages are not necessarily performed at the same time, but can be performed at different times, and the execution order of these sub-steps or stages is not necessarily performed in sequence, but can be performed in turn or alternately with at least a portion of other steps or sub-steps or stages of other steps.

[0150] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the program can be stored in a non-volatile computer-readable storage medium. When the program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0151] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0152] The above-mentioned embodiments only express several implementation methods of the present invention, and the description thereof is relatively specific and detailed, but it cannot be understood as limiting the scope of the patent of the present invention. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

[0153] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A solid state hard disk intelligent testing method, characterized in that: The method comprises: Perform a power failure fault injection test on the target SSD and analyze whether abnormal data loss occurs on the target SSD during the test; The steps of performing a power failure fault injection test on a target solid state drive and analyzing whether abnormal data loss occurs in the target solid state drive during the test include: Writing a target test file into a target solid-state drive, and after writing a predetermined amount of the target test file, powering off the target solid-state drive, powering on the target solid-state drive again after a preset period of time, and using data recovery software to scan and analyze whether the target test file is lost; If it is determined that the target test file has data loss, record the abnormal data loss of the target solid state drive during the test and obtain the lost abnormal data; If it is determined that there is no data loss in the target test file, record that there is no abnormal data loss in the target solid state drive during the test; If it is determined that abnormal data loss occurs on the target solid-state drive, determine the abnormal data loss coverage time and the specific physical storage component where the abnormal data is lost, and obtain a change in the first electrical parameter of the specific physical storage component where the abnormal data is lost within the abnormal data loss coverage time; If it is determined that abnormal data loss occurs in the target solid state drive, the steps of determining the abnormal data loss coverage time and the specific physical storage component where the abnormal data is lost, and obtaining the first electrical parameter change of the specific physical storage component where the abnormal data is lost within the abnormal data loss coverage time include: If it is determined that abnormal data loss occurs on the target solid state drive, determine the starting address of the lost abnormal data, and obtain the writing time point of the starting address; Obtaining the time point of the power-off operation, calculating the time length from the writing time point of the start address to the time point of the power-off operation, and setting the time length as the abnormal data loss coverage time; Determine the logical address range of the abnormal data and map it to a specific physical storage location of the target solid state drive to determine the specific physical storage component where the abnormal data is lost; Acquire first current change data and first voltage change data of the specific physical storage component where abnormal data is lost within the abnormal data loss coverage time, and package these data to obtain first electrical parameter change information; Perform the same power-off fault injection test on a preset standard solid-state hard disk, and obtain a change in a second electrical parameter of a standard physical storage component corresponding to a specific physical storage component of the target solid-state hard disk where abnormal data is lost within the abnormal data loss coverage time of the standard solid-state hard disk; Intelligently analyze the change of the first electrical parameter and the change of the second electrical parameter, and generate hardware selection recommendation information according to the difference between the two.

2. The intelligent testing method for solid state drives according to claim 1, characterized in that: The steps of performing the same power-off fault injection test on a preset standard solid-state hard disk and obtaining a change in a second electrical parameter of a standard physical storage component corresponding to a specific physical storage component of the target solid-state hard disk where abnormal data is lost during the abnormal data loss coverage time of the standard solid-state hard disk include: Perform the same power-off fault injection test on a preset standard SSD; Determine a standard physical storage component in the standard solid state drive corresponding to a specific physical storage component in which abnormal data of the target solid state drive is lost; The second current change data and the second voltage change data of the standard physical storage component within the abnormal data loss coverage time are obtained, and these data are packaged to obtain the second electrical parameter change situation.

3. The intelligent testing method for solid state drives according to claim 2, characterized in that: The steps of intelligently analyzing the change of the first electrical parameter and the change of the second electrical parameter and generating hardware selection recommendation information according to the difference between the two include: Acquire first current change data and second current change data, generate corresponding first current change curve and second current change curve, calculate the average slope of the two, and divide the average slope of the first current change curve by the average slope of the second current change curve to obtain a current optimization recommendation index; Acquire first voltage change data and second voltage change data, generate corresponding first voltage change curve and second voltage change curve, calculate average slopes of the two, and divide the average slope of the first voltage change curve by the average slope of the second voltage change curve to obtain a voltage optimization recommendation index; The current optimization recommendation index and the voltage optimization recommendation index are integrated to obtain hardware selection recommendation information of the target solid state drive.

4. The intelligent testing method for solid state drives according to claim 3, characterized in that: After obtaining the hardware selection recommendation information, determine the model information of the specific physical storage component of the target solid-state hard disk where abnormal data loss occurs, and determine its current demand parameter and voltage tolerance range based on the model information; According to the current optimization recommendation index and the voltage optimization recommendation index, the current demand parameters and voltage tolerance range of the specific physical storage components of the target solid-state hard disk with abnormal data loss are adjusted and optimized to obtain the optimized current demand parameters and voltage tolerance range, and according to the optimized current demand parameters and voltage tolerance range, a suitable physical storage component is selected for the target solid-state hard disk to replace the specific physical storage component of the target solid-state hard disk with abnormal data loss.

5. A solid state drive intelligent testing system, characterized in that: The system comprises: a data loss judgment module, a first electrical parameter change acquisition module, a second electrical parameter change acquisition module and a hardware selection suggestion information generation module, wherein: The data loss judgment module is used to perform a power failure fault injection test on the target solid-state drive and analyze whether abnormal data loss occurs in the target solid-state drive during the test; The data loss judgment module specifically includes: A first power-off fault injection test unit is used to write a target test file into a target solid-state hard disk, and after writing a predetermined amount of the target test file, the target solid-state hard disk is powered off, and after a preset time period, the target solid-state hard disk is powered on again, and a data recovery software is used to scan and analyze whether the target test file is lost; A first recording unit is used to record abnormal data loss of the target solid state drive during the test process if it is determined that the target test file has data loss, and obtain the lost abnormal data; The second recording unit is used to record that no abnormal data loss occurs in the target solid state drive during the test process if it is determined that no data loss occurs in the target test file; A first electrical parameter change acquisition module is used to determine the abnormal data loss coverage time and the specific physical storage component of the abnormal data loss if it is determined that the target solid state drive has abnormal data loss, and obtain the first electrical parameter change of the specific physical storage component of the abnormal data loss within the abnormal data loss coverage time; The first electrical parameter change acquisition module specifically includes: The abnormal data analysis unit is used to determine the starting address of the lost abnormal data and obtain the writing time point of the starting address if it is determined that the target solid state drive has abnormal data loss; The abnormal data loss coverage time determination unit is used to obtain the time point of the power-off operation, calculate the time length from the writing time point of the start address to the time point of the power-off operation, and set the time length as the abnormal data loss coverage time; A first physical storage component determination unit, configured to determine a logical address range of abnormal data and map it to a specific physical storage location of a target solid state drive, so as to determine a specific physical storage component where the abnormal data is lost; A first electrical parameter change situation generating unit is used to obtain first current change data and first voltage change data of a specific physical storage component where abnormal data is lost within the abnormal data loss coverage time, and pack these data to obtain first electrical parameter change situation; A second electrical parameter change acquisition module is used to perform the same power-off fault injection test on a preset standard solid-state hard disk, and obtain a second electrical parameter change of a standard physical storage component corresponding to a specific physical storage component of the target solid-state hard disk where abnormal data is lost within the abnormal data loss coverage time of the standard solid-state hard disk; The hardware selection suggestion information generating module is used to intelligently analyze the change of the first electrical parameter and the change of the second electrical parameter, and generate the hardware selection suggestion information according to the difference between the two.

6. The intelligent testing system for solid state drives according to claim 5, characterized in that: The second electrical parameter change acquisition module specifically includes: A second power-off fault injection test unit, used for performing the same power-off fault injection test on a preset standard solid-state hard disk; A second physical storage component determination unit is used to determine a standard physical storage component in the standard solid state drive corresponding to the specific physical storage component to which abnormal data of the target solid state drive is lost; The second electrical parameter change situation generating unit is used to obtain the second current change data and the second voltage change data of the standard physical storage component within the abnormal data loss coverage time, and package these data to obtain the second electrical parameter change situation.

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