Dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device and method

Abstract

The present invention provides a dynamic true three-axis electromagnetic Hopkinson bar sample installation and collection device and method, the device includes a sample collection box, a connecting rod adjustment device, and a perforated baffle; the method includes step 1: assembling the connecting rod adjustment device, step 2: installing the first perforated baffle of the protective plate, step 3: placing the sample, step 4: installing the X-axis protective plate, step 5: installing the Z+ protective plate, step 6: moving the waveguide rod to make the waveguide rod contact the sample, and step 7: installing the Y-axis protective plate. The present invention can be respectively applied to single-axis two-way, two-axis four-way and three-axis six-way synchronous impact loading test research, sample installation during the test, sample crushing and collection after the test, and preventing sample fragments from splashing and damaging the ultra-high-speed camera lens during the test, and can use an ultra-high-speed camera to take real-time photos of the sample destruction process.

Description

Technical Field

[0001] The present invention relates to the field of high-end equipment manufacturing, and in particular to the field of rock material dynamics experimental technology. Background Art

[0002] During the construction and operation periods, rock masses or engineering structures may be subjected to multi-axial and multi-directional synchronous impact loads, which may easily lead to dynamic disasters, resulting in casualties and property losses.

[0003] In multi-axis and multi-directional synchronous impact tests, correct installation of the specimen is an important step to ensure the reliability of the test results and the safety of the equipment. The destruction process and crack propagation law of the specimen during the test, the crushing state and degree of destruction after the impact are important bases for judging the dynamic mechanical behavior and fracture law of rock or concrete specimens.

[0004] When the dynamic true triaxial electromagnetic Hopkinson bar system is used for testing, it is difficult to correctly install the sample, and it is difficult to effectively observe the crack propagation and failure process of the rock or concrete sample in real time during the test, especially it is very difficult to collect the complete fragments after the sample is destroyed. Therefore, it is urgent to invent a sample installation and collection device suitable for multi-axis multi-directional synchronous impact loading, and to realize the real-time observation of the crack propagation and dynamic failure process of the sample using an ultra-high-speed camera in the uniaxial and biaxial states.

[0005] Difficulty: The sample is installed at the center of multiple waveguide rods (2, 4 or 6). The destruction of the sample is not affected by its supporting structure. The fragments after the sample is destroyed are splashed and difficult to collect completely. The optical lens of the ultra-high-speed camera is easily damaged by the splashing fragments. Summary of the invention

[0006] In order to solve the problems in the prior art, quickly and accurately install the sample, limit the splashing of fragments after the sample is destroyed and protect the optical lens of the ultra-high-speed camera, and effectively collect the complete fragments after the sample is destroyed, the present invention provides a dynamic true three-axis electromagnetic Hopkinson bar sample installation and collection device and method.

[0007] The device includes a loading waveguide rod system, a sample, and a sample collection box. The loading waveguide rod system includes six mutually perpendicular waveguide rods, which are coaxially aligned and adjacent to each other, and the cross section of the waveguide rod is square. The sample installation and collection device includes six protective plates, which can be easily disassembled and assembled according to the mortise and tenon structure, and the protective plates are made of transparent materials, such as acrylic plates, and the process is filmed externally with a camera. Among them, a sample support structure is provided on the Z-protective plate to prevent the sample from falling due to its own weight. The support structure is composed of four wedge-shaped bodies, and the sliding can be controlled by the corresponding traction structure. At the same time, a square perforation with a side length greater than the side length of the waveguide rod is provided at the center of each protective plate, so that the waveguide rod can pass freely. A perforated baffle is also provided, and the side length of the perforated baffle is greater than the side length of the perforation, which can completely cover the perforation. The perforated baffle is a non-fixed structure that can be lifted up with the extension of the waveguide rod, and pulled out and dropped to cover the perforation.

[0008] The present invention provides a dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device, comprising a sample collection box, a connecting rod adjustment device, and a perforated baffle;

[0009] The sample collection box is a cubic structure, and includes six faces, which are six protective plates, namely, X+ protective plate, X- protective plate, Y+ protective plate, Y- protective plate, Z+ protective plate, and Z- protective plate. The six faces are assembled into an integral structure according to the mortise and tenon connection principle;

[0010] The connecting rod adjustment device comprises an adjusting nut, a screw, a spring, a first fastening nut, a connecting medium, a second fastening nut, a mounting groove and a cover plate; the screw is arranged in the mounting groove, the two ends of the screw pass through the through holes at the two ends of the mounting groove, the spring is sleeved in the middle of the screw, the first fastening nut, the connecting medium and the second fastening nut are sequentially connected to the first end of the screw from the inside to the outside, the adjusting nut is connected to the second end of the screw, the cover plate covers the mounting groove, the part of the cover plate close to the first end of the screw is provided with a rectangular through hole, the upper end of the connecting medium passes through the rectangular through hole; the mounting groove is arranged in the Z+ groove and the Z- groove and fixed; the supporting structure is embedded in the upper end of the connecting medium; the sample is placed on the supporting structure;

[0011] The protective plate is provided with a waveguide rod perforation, which is square and located at the center of the protective plate. A perforated baffle is provided at the waveguide rod perforation, which can completely cover the waveguide rod perforation on the protective plate. The perforated baffles of X+, X-, Y+, Y-, and Z- have the same structure. Such perforated baffles are collectively referred to as first perforated baffles, and the perforated baffle of Z+ is referred to as the second perforated baffle.

[0012] As a further improvement of the present invention, a transparent material is selected to make the protective plate, and the transparent material is an acrylic plate.

[0013] As a further improvement of the present invention, for the X+ direction, the connection method between the perforated baffle plate and the protective plate is: an X+ connecting nut is fixed on the X+ protective plate, and a fastening pin is used to pass through the baffle connecting hole and the X+ connecting nut. The connection methods in the X- direction, Y+ direction, Y- direction, Z- direction and X+ direction are the same.

[0014] As a further improvement of the present invention, for the Z+ direction, a second perforated baffle is inserted into the slot to cover the Z+ waveguide rod perforation.

[0015] As a further improvement of the present invention, there are four Z+ grooves and four Z- grooves respectively.

[0016] A method for installing and collecting a dynamic true triaxial electromagnetic Hopkinson bar sample, using any of the above-mentioned dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection devices to install and collect samples, the steps are as follows:

[0017] Step 1: Assemble the connecting rod adjustment device, place the mounting groove in the Z+ groove and Z- groove and fix it;

[0018] Put the spring in the installation slot, insert the screw rod through the through hole at the right end of the installation slot, and put on the spring. The right end is the end close to the adjustment nut. When the screw rod is close to the through hole at the left end, screw the first fastening nut onto the screw rod, put the connecting medium onto the screw rod, then screw the second fastening nut onto the screw rod, fix the connecting medium, and finally pass the screw rod close to the second fastening nut end through the through hole at the left end.

[0019] Put the cover plate on the installation slot, first extend the right end of the cover plate into the installation slot. The right end is the end close to the adjusting nut, which is also the end close to the outer edge of the protective plate. Pass the upper end of the connecting medium through the right end of the hole above the cover plate, and then push the cover plate to the right end. When the cover plate cannot be pushed, the assembly is completed; screw the adjusting nut on the screw rod, and embed the supporting structure into the upper end of the connecting medium;

[0020] Step 2: Install the first perforated baffles of the protective plate, and connect the four first perforated baffles to the X+ protective plate, X- protective plate, Y+ protective plate, and Y- protective plate respectively;

[0021] Step 3: Place the sample, close the four support structures on the Z-protection plate respectively through the connecting rod adjustment device, then place the sample on the support structure, and adjust the connecting rod adjustment device so that the support structure clamps the chamfer of the sample;

[0022] Step 4: Install the X-axis protection plate. According to the mortise and tenon structure of the protection plate, install the X+ protection plate and the X- protection plate on the Z- protection plate;

[0023] Step 5: Install the Z+ protective plate, separate the support structure through the connecting rod adjustment device, and install the Z+ protective plate on the X+ protective plate and the X- protective plate according to the mortise and tenon structure of the protective plate; adjust the position of the support structure so that the closed support structure can be clamped at the chamfer of the specimen; at this time, the specimen is limited by the support structure of the Z+ protective plate and the Z- protective plate;

[0024] Step 6: Move the waveguide rod so that the waveguide rod contacts the sample;

[0025] Step 7: Install the Y-axis protection plate, and respectively put the Y+ protection plate and Y- protection plate on the Y+ waveguide rod and Y- waveguide rod through the holes of the waveguide rod. After reconfirming that the X+ waveguide rod and X- waveguide rod are in contact with the end face of the sample, move the Y+ protection plate and Y- protection plate, and install the Y+ protection plate and Y- protection plate on the X-axis and Z-axis protection plates according to the mortise and tenon structure. Then move the Y+ waveguide rod and Y- waveguide rod from the inner end face of the protection plate toward the sample until they touch the sample. The sample installation and collection device are assembled.

[0026] As a further improvement of the present invention, the distance L between each end face of the sample and the inner end face of each protective plate is calculated based on the size, and the waveguide rod to be loaded is moved from the inner end face of the protective plate, and after moving L in the direction of the sample, it contacts the end face of the sample; or the sample is moved to a point where it cannot move.

[0027] As a further improvement of the present invention, step 8 is also included: installing a camera, the camera monitors the deformation and destruction process of the sample, the camera is vertically arranged above the sample, and the destruction process of the Z+ end face of the sample during the loading process is photographed through the second perforated baffle.

[0028] As a further improvement of the present invention, step 9 is also included: cleaning the sample fragments, removing the protective plate, and adjusting the supporting structure of the Z-protective plate to diffuse them to all sides; opening the perforated baffle, and collecting the sample fragments scattered on the Z-protective plate into the sample bag through the perforations of the Z-waveguide rod.

[0029] As a further improvement of the present invention, when the mounting groove is placed in the Z+ groove and the Z- groove and fixed, glue is used for fixing.

[0030] The beneficial effects of the present invention are:

[0031] The present invention provides a testing device based on a dynamic true triaxial electromagnetic Hopkinson bar test, which can be respectively applied to single-axis bidirectional, dual-axis four-directional and triaxial six-directional synchronous impact loading test research. During the test, the device can be used to install samples, collect sample crushing after the test, prevent sample fragments from splashing and damaging an ultra-high-speed camera lens during the test, and can use an ultra-high-speed camera to shoot the sample destruction process in real time.

[0032] The six protective plates are tightly connected by the mortise and tenon principle, which can quickly and accurately install the sample and collect the broken pieces after the damage, making it easy to collect the complete pieces of the sample. It prevents the sample pieces from splashing and protects the lens of the ultra-high-speed camera from being damaged when shooting the sample damage process, and realizes real-time observation of the sample damage process.

[0033] The clamping and loosening of the support structure are controllable and adjustable, so that the specimen can be supported and its movement can be restricted, and the destruction of the specimen is not affected by its support structure. The connecting rod adjustment device can control the closing and separation of the support structure. When the specimen needs to be clamped, the connecting rod adjustment device is controlled to close the support structure in four directions. The support structure can clamp the chamfered part of the specimen under the action of the spring in the connecting rod adjustment device, which does not affect the loading of the waveguide rod on the specimen, and at the same time limits the displacement of the specimen in three axes. When the specimen is destroyed during the impact process, the fragments will fly around, and the part in contact with the support structure can compress the spring, so that the destruction mode of the specimen will not be affected by the support structure. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 A three-dimensional diagram of the dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device;

[0035] Figure 2 This is a structural diagram of the sample collection box;

[0036] Figure 3 This is an exploded view of the sample collection box;

[0037] Figure 4A This is the structural diagram of the X-axis protection plate. The X+ protection plate and the X- protection plate have the same structure.

[0038] Figure 4B for Figure 4A Enlarged pictures of some details;

[0039] Figure 5 This is the structure diagram of the Y-axis protection plate. The Y+ protection plate and the Y- protection plate have the same structure.

[0040] Figure 6 This is the structural diagram of the Z+ direction protection plate;

[0041] Figure 7 It is the structural diagram of the Z-direction protection plate;

[0042] Figure 8 It is the three-dimensional structure diagram of the sample;

[0043] Fig.9A It is a schematic diagram of the connection between the protective plate and the first perforated baffle;

[0044] Fig. 9B for Fig.9A Schematic diagram with labeled data;

[0045] Fig. 10A It is an enlarged structural diagram of the support structure 16 and the connecting rod adjustment device 15;

[0046] Fig. 10B for Fig. 10A Schematic diagram with labeled data;

[0047] Fig.11 It is an enlarged structural diagram of the connecting rod adjusting device 15;

[0048] Fig.12 It is an exploded view of the connecting rod adjusting device 15.

[0049] The numbers in the figure correspond to the component names:

[0050] X+ waveguide rod 1, X- waveguide rod 2, Y+ waveguide rod 3, Y- waveguide rod 4, Z+ waveguide rod 5, Z- waveguide rod 6, X+ protective plate 7, X- protective plate 8, Y+ protective plate 9, Y- protective plate 10, Z+ protective plate 11, Z- protective plate 12, sample 13, first perforated baffle 14, connecting rod adjustment device 15, support structure 16, second perforated baffle 17;

[0051] X+ Z+ tenon structure 701, X+ Y+ tenon structure 702, X+ Z-tenon structure 703, X+ Y-tenon structure 704, X+ waveguide rod through hole 705, X+ connecting nut 706;

[0052] Y+ Z+ tenon structure 901, Y+ X-mortise structure 902, Y+ Z-mortise structure 903, Y+ X+ mortise structure 904, Y+ waveguide rod through hole 905, Y+ connecting nut 906;

[0053] Y+ mortise structure 1101 of Z+, X-mortise structure 1102 of Z+, Y-mortise structure 1103 of Z+, X+ mortise structure 1104 of Z+, Z+ waveguide rod through hole 1105, slot 1106, Z+ groove 1107;

[0054] Z-Y+mortise structure 1201, Z-X-mortise structure 1202, Z-Y-mortise structure 1203, Z-X+mortise structure 1204, Z-waveguide rod through hole 1205, Z-connecting nut 1206, Z-groove 1207;

[0055] A baffle body 1401, a fastening pin 1402, and a baffle connecting hole 1403 of a first perforated baffle;

[0056] Adjusting nut 1501 , screw rod 1502 , spring 1503 , first fastening nut 1504 , connecting medium 1505 , second fastening nut 1506 , mounting groove 1507 , cover plate 1508 . DETAILED DESCRIPTION

[0057] The present invention will be further described below in conjunction with the accompanying drawings.

[0058] The following dimensions are for illustrative purposes only and are not intended to be limiting.

[0059] Specific implementation method 1: Dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device.

[0060] like Figure 8 , Sample 13 is a cubic sample with a side length of 51 mm, and each side is chamfered with a 0.5 mm angle.

[0061] like Fig.12 As shown, the connecting rod adjustment device 15 includes an adjustment nut 1501, a screw rod 1502, a spring 1503, a first fastening nut 1504, a connecting medium 1505, a second fastening nut 1506, a mounting groove 1507 and a cover plate 1508;

[0062] The screw 1502 is arranged in the installation groove 1507, and the two ends of the screw 1502 pass through the through holes at the two ends of the installation groove. The spring 1503 is sleeved on the middle part of the screw 1502. The first fastening nut 1504, the connecting medium 1505 and the second fastening nut 1506 are connected to the first end of the screw 1502 from the inside to the outside in sequence. The adjusting nut 1501 is connected to the second end of the screw 1502. The cover plate 1508 covers the installation groove 1507. The part of the cover plate 1508 close to the first end of the screw 1502 is provided with a rectangular through hole. The upper end of the connecting medium 1505 passes through the rectangular through hole. Under the action of external force, the connecting medium 1505 can move in the rectangular through hole.

[0063] like Figure 6 , Figure 7 , the mounting groove 1507 is arranged in the Z+ groove 1107 and the Z- groove 1207 and fixed; preferably, there are four Z+ grooves 1107 and four Z- grooves 1207 respectively; the support structure 16 is embedded in the upper end of the connecting medium 1505; and the sample 13 is placed on the support structure 16.

[0064] like Figure 2 , is a sample collection box, which is a sample installation and collection device; the sample collection box is a cubic structure, and the side length of the cube is 200mm.

[0065] like Figure 3The sample collection box can be split into six faces, which are six protective plates, namely X+ protective plate 7, X- protective plate 8, Y+ protective plate 9, Y- protective plate 10, Z+ protective plate 11, and Z- protective plate 12. The protective plates are made of transparent materials, such as acrylic plates, preferably 3mm thick acrylic plates, and the process is filmed externally with a camera. The six faces are assembled into an integral structure according to the mortise and tenon connection principle, wherein the mortise and tenon depth is preferably 3mm.

[0066] like Figure 2 and Figure 3 The protective plate is provided with a waveguide rod through hole, which is a square with a side length of 50.5 mm and is located in the center of the protective plate.

[0067] The perforated baffles of X+, X-, Y+, Y-, and Z- have the same structure. Such perforated baffles are collectively referred to as first perforated baffles, and the perforated baffle of Z+ is referred to as second perforated baffle. If described as a perforated baffle in the text, it applies to both the first perforated baffle and the second perforated baffle.

[0068] like Figure 2 and Figure 3 The perforated baffle is a rectangular parallelepiped of 52mm×52mm×3mm (the overall dimensions of the first perforated baffle and the second perforated baffle are both of this value, but the structures of the two perforated baffles are different), which can completely cover the waveguide rod perforations on the protective plate.

[0069] like Fig.9A , Fig. 9B As shown, the first perforated baffle 14 includes a baffle body 1401 of the first perforated baffle, a fastening pin 1402, and a baffle connecting hole 1403. For the perforated baffles on the protective plates in the X-direction, Y-direction, and Z-direction, the baffle connecting hole 1403 has a diameter of 3.5 mm, the fastening pin 1402 has a diameter of 3 mm, and the fastening pin 1402 connects the protective plate and the baffle connecting hole 1403.

[0070] like Fig. 10B The vertical height of the support structure 16 of the Z-protection plate is 100 mm, the side length of the bottom surface is 100 mm, and the side length in contact with the sample is 50.5 mm.

[0071] Specific implementation method 2: Dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection method.

[0072] Step 1: Assemble the connecting rod adjustment device 15. Figure 6 and Figure 7 , the mounting groove 1507 is placed in the Z+ groove 1107 and the Z- groove 1207 and fixed, such as by glue.

[0073] like Fig.11 , Fig.12, put the spring 1503 in the installation groove 1507. Insert the screw rod 1502 through the through hole at the right end of the installation groove 1507, and put on the spring 1503. The right end is the end close to the adjustment nut 1501. When the screw rod 1502 is close to the through hole at the left end, then screw the first fastening nut 1504 onto the screw rod 1502, put the connecting medium 1505 on the screw rod 1502, and then screw the second fastening nut 1506 onto the screw rod 1502 to fix the connecting medium 1505. The right end is the end close to the adjustment nut 1501. Make the two ends of the screw rod 1502 pass through the through holes of the installation groove, so that the screw rod 1502 can be positioned to prevent deviation during installation or adjustment.

[0074] Put the cover plate 1508 on the installation groove 1507. First, extend the right end of the cover plate 1508 into the installation groove 1507. The right end is the end close to the adjustment nut 1501 and the end close to the outer edge of the protective plate. Figure 7 and Fig.12 The reason for first extending the right end of the cover plate 1508 into the installation groove 1507 is that the edges of the Z+ protective plate 11 and the Z- protective plate 12 are blocked by mortise and tenon structures.

[0075] Then pass the upper end of the connection medium 1505 through the right end of the hole above the cover 1508, and then push the cover 1508 to the right end by pushing and pulling. There is a baffle-like structure at the rightmost end. When the cover 1508 cannot be pushed, the assembly is completed.

[0076] The adjusting nut 1501 is screwed onto the screw rod 1502 , and the supporting structure 16 is embedded into the upper end of the connecting medium 1505 .

[0077] Step 2: Install the first perforated baffle of the protective plate. Fig.9A As shown, the four first perforated baffles 14 are connected to the X+ protective plate 7, X- protective plate 8, Y+ protective plate 9, and Y- protective plate 10 respectively by using a fastening pin 1402 through the baffle connecting hole 1403. Fig.9A Take the X+ protective plate 7 as an example, wherein the X+ connecting nut 706 is fixed on the X+ protective plate 7.

[0078] Step 3: Place the sample 13. Figure 3 As shown, the four support structures 16 on the Z-protection plate 12 are closed respectively by the connecting rod adjusting device 15. Then the sample 13 is placed on the supporting structure 16. The connecting rod adjusting device 15 is adjusted so that the supporting structure 16 can clamp the chamfer of the sample.

[0079] Step 4: Install the X-axis protection plate. Figure 3 As shown, the X+ protective plate 7 and the X- protective plate 8 are installed on the Z- protective plate 12 according to the mortise and tenon structure of the protective plate.

[0080] Step 5: Install the Z+ protective plate 11. Separate the support structure 16 through the connecting rod adjustment device 15. The purpose of separating the support structure 16 is to leave space for the installation of the Z+ protective plate 11. According to the mortise and tenon structure of the protective plate, the Z+ protective plate 11 is installed on the X+ protective plate 7 and the X- protective plate 8. Adjust the position of the support structure 16 so that the closed support structure can be clamped at the chamfer structure of the specimen. At this time, the support structure of the Z+ protective plate 11 and the Z- protective plate 12 realizes the limitation of the specimen.

[0081] Step 6: Move the waveguide rod. According to the dimensions in the example, the distance between each end face of the sample and the inner end face of each protective plate is 74.5 mm. Move the waveguide rods to be loaded from the inner end face of the protective plate, and after moving 74.5 mm in the direction of the sample, they can contact the end face of the sample. The specific value of the movement in the direction of the sample is calculated based on the example dimensions. This is a quantitative description, and it can also be moved to the point where it cannot move.

[0082] Calculation method: (200-51) / 2=74.5mm.

[0083] 200mm is the distance between the protective plates at both ends of the specimen, and 51mm is the width of the specimen.

[0084] The two end faces of the specimen are symmetrical to the end faces of the waveguide rod, so it is divided by 2.

[0085] Step 7: Install the Y-axis protection plate. Put the Y+ protection plate 9 and Y- protection plate 10 on the Y+ waveguide rod 3 and Y- waveguide rod 4 through the waveguide rod perforation holes. After reconfirming that the X+ waveguide rod 1 and X- waveguide rod 2 are in contact with the end face of the sample (because the X-axis waveguide rod must be confirmed to be in contact with the end face of the sample before the Y-axis protection plate installation can be operated, which is a review before the Y-axis operation), move the Y+ protection plate 9 and Y- protection plate 10, and install the Y+ protection plate 9 and Y- protection plate 10 on the X-axis and Z-axis protection plates according to the mortise and tenon structure, and then move the Y+ waveguide rod 3 and Y- waveguide rod 4 from the inner end face of the protection plate to the sample direction by 74.5mm. The sample installation and collection device can be assembled, and the sample is correctly installed and loaded.

[0086] Step 8: Install an ultra-high-speed camera. Ultra-high-speed camera: This is a professional camera with a current maximum frame rate of 5Mfps / s, which is equivalent to one photo in 0.2μs.

[0087] When conducting uniaxial bidirectional and biaxial four-way synchronous impact tests, a high-speed camera can be used to monitor the deformation and damage process of the sample. The second perforated baffle 17 is inserted into the slot 1106 to cover the Z+ waveguide rod perforation 1105. The ultra-high-speed camera is set vertically above the sample, which can be considered to be the position of the Z+ waveguide rod. The damage process of the Z+ end face of the sample 13 during the loading process is photographed through the second perforated baffle 17.

[0088] Step 9: Cleaning of sample fragments. Remove the protective plates according to the Y-axis, Z+ axis and X-axis in turn, and adjust the support structure 16 of the Z-protective plate to spread them around. Open the X-perforated baffle, and collect the sample fragments scattered on the Z-protective plate into the sample bag through the Z-waveguide rod perforation 1205. The entire test process is completed. Note: In this implementation example, because the protective plate of the Y-axis locks the Z+ protective plate, the Z+ protective plate restricts the X-axis protective plate. Therefore, it is necessary to remove the Y-axis first, then the Z+ axis, and finally the X-axis protective plate.

[0089] The above contents are further detailed descriptions of the present invention in combination with specific preferred embodiments, and it cannot be determined that the specific implementation of the present invention is limited to these descriptions. For ordinary technicians in the technical field to which the present invention belongs, several simple deductions or substitutions can be made without departing from the concept of the present invention, which should be regarded as falling within the protection scope of the present invention.

Claims

1. Dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device, characterized by: It includes a sample collection box, a connecting rod adjustment device (15), and a perforated baffle; The sample collection box is a cubic structure, comprising six faces, each of which is a six protection plate, namely an X+ protection plate (7), an X- protection plate (8), a Y+ protection plate (9), a Y- protection plate (10), a Z+ protection plate (11), and a Z- protection plate (12). The six faces are assembled into an integral structure according to the mortise and tenon connection principle; The connecting rod adjustment device (15) comprises an adjustment nut (1501), a screw rod (1502), a spring (1503), a first fastening nut (1504), a connecting medium (1505), a second fastening nut (1506), a mounting groove (1507) and a cover plate (1508); the screw rod (1502) is arranged in the mounting groove (1507), two ends of the screw rod (1502) pass through through holes at two ends of the mounting groove, the spring (1503) is sleeved in the middle of the screw rod (1502), the first fastening nut (1504), the connecting medium (1505) and the second fastening nut (1506) are connected to the first end of the screw rod (1502) in sequence from the inside to the outside, and the adjustment The nut (1501) is connected to the second end of the screw rod (1502), the cover plate (1508) covers the installation groove (1507), the portion of the cover plate (1508) close to the first end of the screw rod (1502) is provided with a rectangular through hole, and the upper end of the connection medium (1505) passes through the rectangular through hole; the installation groove (1507) is arranged in the Z+ groove (1107) and the Z- groove (1207) and fixed; the support structure (16) is embedded in the upper end of the connection medium (1505); the sample (13) is placed on the support structure (16), and the support structure (16) can clamp the chamfered portion of the sample under the action of the spring in the connecting rod adjustment device, without affecting the loading of the waveguide rod on the sample; The protective plate is provided with a waveguide rod perforation, which is square and located at the center of the protective plate. A perforated baffle is provided at the waveguide rod perforation, which can completely cover the waveguide rod perforation on the protective plate. The perforated baffles of X+, X-, Y+, Y-, and Z- have the same structure. Such perforated baffles are collectively referred to as first perforated baffles, and the perforated baffle of Z+ is referred to as the second perforated baffle.

2. The dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device according to claim 1, characterized in that: A transparent material is selected to make the protective plate, and the transparent material is an acrylic plate.

3. The dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device according to claim 1, characterized in that: For the X+ direction, the connection method between the perforated baffle plate and the protective plate is as follows: an X+ connecting nut (706) is fixed on the X+ protective plate (7), and a fastening pin (1402) is used to pass through the baffle connecting hole (1403) and the X+ connecting nut (706). The connection method for the X- direction, Y+ direction, Y- direction, Z- direction and X+ direction is the same.

4. The dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device according to claim 1, characterized in that: For the Z+ direction, the second perforated baffle (17) is inserted into the slot (1106) to cover the Z+ waveguide rod perforation (1105).

5. The dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device according to claim 1, characterized in that: There are four Z+ grooves (1107) and four Z- grooves (1207).

6. Dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection method, characterized by: A method for installing and collecting samples using the dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection device according to any one of claims 1 to 5, comprising the following steps: Step 1: Assemble the connecting rod adjustment device (15), place the mounting groove (1507) in the Z+ groove (1107) and the Z- groove (1207) and fix them; Place the spring (1503) in the installation groove (1507), insert the screw rod (1502) through the right end through hole of the installation groove (1507), and put on the spring (1503), the right end being the end close to the adjustment nut (1501), when the screw rod (1502) is close to the left end through hole, screw the first fastening nut (1504) onto the screw rod (1502), put the connection medium (1505) onto the screw rod (1502), then screw the second fastening nut (1506) onto the screw rod, fix the connection medium (1505), and finally pass the screw rod (1502) close to the second fastening nut (1506) through the left end through hole; Put the cover plate (1508) on the installation groove (1507), first extend the right end of the cover plate (1508) into the installation groove (1507), the right end is the end close to the adjustment nut (1501), and is also the end of the protective plate close to the outer edge, pass the upper end of the connecting medium (1505) through the right end of the upper hole of the cover plate (1508), and then push the cover plate (1508) to the right end. When the cover plate (1508) cannot be pushed, the assembly is completed; screw the adjustment nut (1501) onto the screw rod (1502), and embed the support structure (16) into the upper end of the connecting medium (1505); Step 2: Install the first perforated baffles of the protective plate, and connect the four first perforated baffles (14) to the X+ protective plate (7), the X- protective plate (8), the Y+ protective plate (9), and the Y- protective plate (10) respectively; Step 3: placing the sample (13), closing the four support structures (16) on the Z-protection plate (12) respectively through the connecting rod adjustment device (15), then placing the sample (13) on the support structure (16), and adjusting the connecting rod adjustment device (15) so that the support structure (16) clamps the chamfer of the sample; Step 4: Install the X-axis protection plate. According to the mortise and tenon structure of the protection plate, install the X+ protection plate (7) and the X- protection plate (8) on the Z- protection plate (12); Step 5: Install the Z+ protective plate (11), separate the support structure (16) through the connecting rod adjustment device (15), and install the Z+ protective plate (11) on the X+ protective plate (7) and the X- protective plate (8) according to the mortise and tenon structure of the protective plate; adjust the position of the support structure (16) so that the closed support structure can be clamped at the chamfer of the specimen; at this time, the specimen is limited by the support structure of the Z+ protective plate (11) and the Z- protective plate (12); Step 6: Move the waveguide rod so that the waveguide rod contacts the sample; Step 7: Install the Y-axis protection plate. Place the Y+ protection plate (9) and the Y- protection plate (10) on the Y+ waveguide rod (3) and the Y- waveguide rod (4) through the holes of the waveguide rods. After re-confirming that the X+ waveguide rod (1) and the X- waveguide rod (2) are in contact with the end surface of the sample, move the Y+ protection plate (9) and the Y- protection plate (10). Install the Y+ protection plate (9) and the Y- protection plate (10) on the X-axis and Z-axis protection plates according to the mortise and tenon structure. Then move the Y+ waveguide rod (3) and the Y- waveguide rod (4) from the inner end surface of the protection plate toward the sample until they contact the sample. The sample installation and collection device is assembled.

7. The dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection method according to claim 6, characterized in that: According to the size calculation, the distance between each end face of the sample and the inner end face of each protective plate is L, and the waveguide rods to be loaded are moved from the inner end face of the protective plate, and after moving L in the direction of the sample, they come into contact with the end face of the sample; or the sample is moved until it cannot move.

8. The dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection method according to claim 6, characterized in that: The method further includes step 8: installing a camera, the camera monitoring the deformation and destruction process of the sample, and vertically arranging the camera above the sample to photograph the destruction process of the Z+ end face of the sample (13) during the loading process through the second perforated baffle (17).

9. The dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection method according to claim 8, characterized in that: The method also includes step 9: cleaning the sample fragments, removing the protective plate, and adjusting the support structure (16) of the Z-protective plate to diffuse the sample fragments in all directions; opening the perforated baffle plate, and collecting the sample fragments scattered on the Z-protective plate into the sample bag through the Z-waveguide rod perforation (1205).

10. The dynamic true triaxial electromagnetic Hopkinson bar sample installation and collection method according to claim 6, characterized in that: When the mounting groove (1507) is placed in the Z+ groove (1107) and the Z- groove (1207) and fixed, it is fixed by glue.

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