Backlight source static elimination device, method, system and medium

Abstract

The invention discloses a backlight source static elimination device, method, system and medium, which relate to the field of testing and are used to solve the problem that the current backlight source static elimination technology cannot test and analyze the static electric field strength to which it is subjected, and then eliminate the static electricity accordingly according to the test results. The invention comprises a static electricity detection module, a static electricity determination module and a static electricity elimination module. The static electricity detection module is used to detect the static electricity situation of the backlight source, and the static electricity data corresponding to the backlight source under the static electricity environment is sent to the static electricity determination module or the normal signal generated by the detection is sent to the display terminal; the static electricity determination module is used to determine the static electricity degree of the backlight source, and if a minimum static electricity elimination signal, a primary elimination signal or a secondary elimination signal corresponding to the backlight source is generated, it is sent to the static electricity elimination module; the static electricity elimination module is used to eliminate the static electricity existing in the backlight source. The invention realizes intelligent elimination of the static electricity of the backlight source based on the data test results.

Description

Technical Field

[0001] The invention belongs to the field of testing, and relates to a backlight source static elimination technology, in particular to a backlight source static elimination device, method, system and medium. Background Art

[0002] A backlight is a light source used to provide backlighting, and is widely used in liquid crystal displays and other optical devices. It is located behind the LCD screen and enables the LCD screen to display images and text by irradiating light forward; the function of the backlight is to provide bright, uniform background lighting so that the image of the LCD display can be clearly seen in a dark environment. Due to the characteristics of liquid crystal molecules, they cannot emit light by themselves, so a backlight is needed to illuminate the LCD screen behind them; when the backlight is in use, static electricity will accumulate on the surface. When the static electricity accumulates to a certain amount, it will cause damage to the backlight;

[0003] However, the current static elimination technology for backlight sources only performs a simple static elimination operation, and does not test and analyze the static electric field strength of the backlight source, and then performs different degrees of static elimination based on the test results of the static electric field strength of the backlight source. The current method is prone to incomplete static elimination or waste of static elimination resources.

[0004] To this end, we propose a backlight source static elimination device, method, system and medium. Summary of the invention

[0005] The purpose of the present invention is to propose a backlight source static elimination system to solve the problems raised in the above background technology.

[0006] In order to achieve the above object, the present invention adopts the following technical solutions:

[0007] A backlight source static electricity elimination device includes a backlight source and a detection and elimination device for performing static electricity detection on the backlight source, the detection and elimination device includes a processor and a display terminal, and the processor includes a data acquisition module, a static electricity detection module, a static electricity determination module, a static electricity elimination module and a database;

[0008] Select two groups of qualified backlight sources for electrostatic testing, the data acquisition module is used to collect the luminous information of the two groups of backlight sources, and send the luminous information corresponding to the two groups of backlight sources to the electrostatic detection module;

[0009] The data acquisition module is also used to collect the actual brightness values ​​of the two groups of backlight sources, and send the actual brightness values ​​of the two groups of backlight sources to the static electricity detection module;

[0010] The database is used to store the film coefficients of the reflective films corresponding to the backlight sources of different models, the light guide plate shape coefficients of the light guide plates corresponding to the backlight sources, the light emitting surface coefficients of the light emitting surfaces corresponding to the backlight sources, and the current coefficients of the light emitting nodes corresponding to the backlight sources;

[0011] The static electricity detection module is used to detect the static electricity condition of the backlight source. If the static electricity data corresponding to the backlight source under the static electricity environment is detected, it is sent to the static electricity determination module. If the normal signal generated by the detection is sent to the display terminal;

[0012] The static electricity determination module is used to determine the static electricity degree of the backlight source. If a normal signal corresponding to the backlight source is generated, it is sent to the display terminal; if a minimum static electricity elimination signal, a first-level elimination signal or a second-level elimination signal corresponding to the backlight source is generated, it is sent to the static electricity elimination module;

[0013] The static electricity elimination module is used to eliminate the static electricity existing in the backlight source, and after the elimination is completed, an elimination completion signal is generated and sent to the display terminal;

[0014] The display terminal is used for receiving and displaying an elimination completion signal and a normal signal corresponding to the backlight source.

[0015] Furthermore, the luminous information is the height and width of the luminous areas in the two groups of backlight sources, and the real-time brightness values ​​of the brightness detection points in the luminous areas; wherein each luminous node radiates a fixed common area, and the common areas of multiple luminous nodes constitute the luminous area, and then the height and width of the luminous area are counted, and a corresponding number of brightness detection points are selected according to the height and width of the luminous area, and the real-time brightness value of each brightness detection point is measured.

[0016] Furthermore, the detection process of the electrostatic detection module is as follows:

[0017] Obtain the luminous information of the backlight source, obtain the height and width of the luminous area corresponding to the backlight source, and the real-time brightness value of the brightness detection point in the luminous area;

[0018] For the backlight source that is not affected by static electricity, the real-time brightness values ​​corresponding to the light-emitting nodes are added and averaged to obtain the node brightness mean of the light-emitting nodes in the backlight source, and then the real-time brightness value corresponding to each light-emitting node is subtracted from the node brightness mean and the absolute value is taken to obtain the node luminescence difference corresponding to each light-emitting node;

[0019] Compare the node luminescence difference corresponding to the luminous node with the brightness deviation threshold one by one. If all the node brightness deviation values ​​are less than the brightness deviation threshold, no operation is performed; if there is a node brightness deviation value greater than or equal to the brightness deviation threshold, the estimated brightness value corresponding to the backlight source is calculated by the formula;

[0020] The first backlight brightness difference value of the backlight source not affected by static electricity is obtained by subtracting the corresponding actual brightness value from the estimated brightness value of the backlight source and taking the absolute value;

[0021] Repeat the above steps to obtain a second backlight brightness difference value of the backlight source under the influence of static electricity, and compare the second backlight brightness difference value with the first backlight brightness difference value;

[0022] If the second backlight brightness difference is less than or equal to the first backlight brightness difference, a normal signal is generated;

[0023] If the second backlight brightness difference is greater than the first backlight brightness difference, static electricity data of the backlight source under the influence of static electricity is obtained.

[0024] Furthermore, the electrostatic data specifically refers to the charge amount of the electrostatic charge corresponding to the backlight source and the position of the electrostatic charge.

[0025] Furthermore, the determination process of the static electricity determination module is as follows:

[0026] Obtaining electrostatic data of the backlight source, and obtaining the charge amount and position of the electrostatic charge on the surface corresponding to the backlight source;

[0027] If the distribution of electrostatic charges tends to the same area, the electrostatic charges of the backlight source are recorded as point-distributed electrostatics, and the area where the point-distributed electrostatics are located is defined as the point-distributed area. A plurality of pre-selected points are set in the point-distributed area, and it is ensured that the straight-line distance between the position of the pre-selected point and the electrostatic charge farthest from the pre-selected point is less than or equal to a first preset distance. Then, the straight-line distance between the pre-selected point and each electrostatic charge is counted, and the sum of the straight-line distances is obtained by adding up the sum of the distances, and the pre-selected point with the smallest distance sum is selected as the core point.

[0028] If the electrostatic charges are distributed on an extended line, and the length of all the electrostatic charges is greater than or equal to a first preset length, the line distribution length of the corresponding length of all the electrostatic charges is calculated, and the electrostatic charges of the backlight source are recorded as line distribution static electricity. If the length of all the electrostatic charges is less than the first preset length, a minimum static elimination signal is generated;

[0029] If the electrostatic charge is distributed on a two-dimensional plane, and the component area of ​​all the electrostatic charges is greater than or equal to the second preset area, the surface distribution area of ​​the component area corresponding to all the electrostatic charges is calculated, and the electrostatic charge of the backlight source is recorded as surface distribution static electricity. If the component area is less than the second preset area, a minimum static elimination signal is generated;

[0030] If the electrostatic charge is randomly distributed in the three-dimensional space, the volume distribution of the space composed of all electrostatic charges is calculated, and the electrostatic charge of the backlight source is recorded as the volume distribution electrostatic;

[0031] For the backlight source corresponding to the point-distributed static electricity, the point-distributed static electricity is regarded as an equivalent point charge with the center as the core point, and the static electric field intensity of any position of the equivalent point charge corresponding to the backlight source within the radiation range is calculated;

[0032] For the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics, the electrostatic charge density of the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics is calculated respectively, and then the electrostatic electric field strength of the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics is calculated;

[0033] comparing the electrostatic electric field strength with the electric field strength threshold;

[0034] If the electrostatic field strength at all positions is less than or equal to the first electrostatic field strength threshold, a normal signal is generated;

[0035] If all electrostatic field strengths are less than or equal to the second electrostatic field strength threshold, and there is an electrostatic field strength greater than the first electrostatic field strength threshold, a first-level elimination signal is generated;

[0036] If there is an electrostatic field strength greater than the second electrostatic field strength threshold, a secondary elimination signal is generated; wherein the first electrostatic field strength threshold is less than the second electrostatic field strength threshold, and the elimination strength of the primary elimination signal is less than the elimination strength of the secondary elimination signal.

[0037] Furthermore, the determination process of the static electricity determination module further includes:

[0038] For the backlight source corresponding to the point-distributed static electricity, the point-distributed static electricity is regarded as an equivalent point charge with the center as the core point, and the static electric field intensity of any position of the equivalent point charge corresponding to the backlight source within the radiation range is calculated;

[0039] For the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics, the electrostatic charge density of the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics is calculated respectively, and then the electrostatic electric field strength of the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics is calculated;

[0040] comparing the electrostatic electric field strength with the electric field strength threshold;

[0041] If the electrostatic electric field strength is less than or equal to the first electrostatic electric field strength threshold, a normal signal is generated;

[0042] If the electrostatic electric field strength is greater than the first electrostatic electric field strength threshold and less than or equal to the second electrostatic electric field strength threshold, a first-level elimination signal is generated;

[0043] If the electrostatic electric field strength is greater than the second electrostatic electric field strength threshold, a secondary elimination signal is generated.

[0044] Further, the first electrostatic electric field strength threshold is less than the second electrostatic electric field strength threshold;

[0045] The canceling strength of the primary canceling signal is less than the canceling strength of the secondary canceling signal.

[0046] In a second aspect, a method for eliminating static electricity from a backlight source is provided, and the method is specifically as follows:

[0047] Step S100, selecting two groups of backlight sources for electrostatic testing, the data acquisition module respectively acquires the luminous information of the two groups of backlight sources, and sends the luminous information corresponding to the two groups of backlight sources to the electrostatic detection module;

[0048] Step S200, the static electricity detection module detects the static electricity condition of the backlight source, and if a normal signal is generated, it is sent to the display terminal; if static electricity data corresponding to the backlight source in the static electricity environment is obtained, it is sent to the static electricity determination module;

[0049] Step S300, the static electricity determination module determines the static electricity level of the backlight source, and if a normal signal is generated, it is sent to the display terminal; if a minimum static electricity elimination signal, a first-level elimination signal, or a second-level elimination signal is generated, it is sent to the static electricity elimination module;

[0050] Step S400: the static electricity elimination module eliminates the static electricity in the backlight source with different elimination strengths according to the elimination signal.

[0051] In a third aspect, a backlight source static electricity elimination system is provided, the backlight source static electricity elimination system comprising:

[0052] A memory storing a computer program;

[0053] The processor is connected to the memory for communication, and when the computer program is executed by the processor, the backlight source static electricity elimination method is implemented.

[0054] In a fourth aspect, a computer-readable storage medium stores a computer program, which implements a backlight source static electricity elimination method when executed by a processor.

[0055] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are:

[0056] The present invention firstly selects two groups of backlight sources for electrostatic testing. The data acquisition module respectively collects the luminous information of the two groups of backlight sources, and sends the luminous information corresponding to the two groups of backlight sources to the electrostatic detection module. The electrostatic detection module is used to detect the electrostatic situation of the backlight source. If the electrostatic data corresponding to the backlight source in the electrostatic environment is obtained, it is sent to the electrostatic determination module. The electrostatic determination module determines the degree of static electricity of the backlight source. If a minimum static electricity elimination signal, a first-level elimination signal or a second-level elimination signal is generated, it is sent to the static electricity elimination module. The static electricity elimination module adopts different elimination strengths to eliminate the static electricity existing in the backlight source according to the elimination signal. The present invention realizes intelligent elimination of static electricity of the backlight source based on the data test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] In order to facilitate understanding by those skilled in the art, the present invention is further described below in conjunction with the accompanying drawings;

[0058] Figure 1 is the overall system block diagram of the present invention;

[0059] Figure 2 is a schematic diagram of the light emitting area in the present invention;

[0060] Figure 3 It is a schematic diagram of the point distribution area corresponding to the point distribution of electrostatics in the present invention;

[0061] Figure 4 It is a schematic diagram of the static electricity distribution in the center line of the present invention;

[0062] Figure 5 Schematic diagram of surface static electricity distribution in the present invention;

[0063] Figure 6 Schematic diagram of body distributed electrostatics in the present invention;

[0064] Figure 7 It is a schematic diagram of the equivalent point charge corresponding to the point distribution electrostatics of the present invention;

[0065] Figure 8 is a flow chart of the method of the present invention;

[0066] Fig. 9 It is a schematic diagram of the structure of the computer device in the present invention. DETAILED DESCRIPTION

[0067] The technical solution of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0068] Example 1: Please refer to Figure 1-Figure 7 As shown, the technical solution provided by the present invention is: a backlight source static elimination device, including a backlight source and a detection and elimination device for performing static detection on the backlight source, the detection and elimination device is composed of software and hardware, including a processor, a display terminal, a static electricity detector, etc., and the processor includes a data acquisition module, a static electricity detection module, a static electricity determination module, a static electricity elimination module and a database;

[0069] The backlight source refers to a light source located behind the liquid crystal display. Since the liquid crystal glass in the liquid crystal display itself does not have the light-emitting property, a light source, i.e., a backlight source, is added behind the liquid crystal glass according to the demand. The light-emitting effect of the backlight source will directly affect the visual effect of the corresponding liquid crystal display. The backlight source is usually composed of a plurality of point light sources. In this embodiment, each point light source in the backlight source is recorded as a light-emitting node.

[0070] See also Figure 2 As shown, when the backlight source is subjected to an electrostatic test, two groups of backlight sources with qualified quality are selected for testing, wherein one group of backlight sources is tested in an electrostatic environment, and the other group of backlight sources is measured in an environment where the influence of electrostatics is negligible, and the data acquisition module is used to collect the luminous information of the two groups of backlight sources, and send the luminous information corresponding to the two groups of backlight sources to the electrostatic detection module;

[0071] It should be specifically explained that the luminous information is the height and width of the luminous areas in the two groups of backlight sources, and the real-time brightness value of the brightness detection points in the luminous areas; wherein each luminous node radiates a fixed common area, the common area is approximately a rectangle, and the common areas of multiple luminous nodes constitute the luminous area, and then the height and width of the luminous area are counted, and the corresponding number of brightness detection points are selected according to the height and width of the luminous area, and the real-time brightness value of each brightness detection point is measured. It should be emphasized that the height and width of the corresponding luminous areas of the two groups of backlight sources are equal, and the number of brightness detection points is the same;

[0072] In this embodiment, the selection process of the brightness detection point is as follows: A1×A2 brightness detection points are selected according to the height and width of the luminous area, wherein A1 is the point selection coefficient corresponding to the height of the luminous area, and A2 is the point selection coefficient corresponding to the width of the luminous area. The larger the values ​​of the height and width of the luminous area, the larger the corresponding values ​​of A1 and A2 will be. The values ​​of A1 and A2 can refer to the detection point selection comparison table. For example, a detection point selection comparison table is shown in the following table:

[0073] Height or Width A1 value The value of A2 ≤30cm X1 Y1 30cm-60cm X2 Y2 60cm-140cm X3 Y3 140cm-250cm X4 Y4

[0074] In the detection point selection comparison table, 1≤X1<X2<X3<X4, and X1, X2, X3 and X4 are all positive integers, 1≤Y1<Y2<Y3<Y4, and Y1, Y2, Y3 and Y4 are all positive integers.

[0075] In an embodiment, the data acquisition module is further used to collect actual brightness values ​​of two groups of backlight sources, and send the actual brightness values ​​of the two groups of backlight sources to the electrostatic detection module; the database is used to store the film coefficient of the reflective film corresponding to different models of backlight sources, the light guide plate shape coefficient of the light guide plate corresponding to the backlight source, the light exit surface coefficient of the light exit surface corresponding to the backlight source, and the current coefficient of the light emitting node corresponding to the backlight source; in practice, the backlight source is usually composed of components such as a light source (light emitting node), a light guide plate, a reflective film, and a light exit surface (diffusion film), wherein the material and performance of each part will affect the brightness of the corresponding backlight source;

[0076] Furthermore, the static electricity detection module is used to detect the static electricity condition of the backlight source, and the detection process is specifically as follows:

[0077] Step S1, obtaining the luminous information of the backlight source, obtaining the height and width of the luminous area corresponding to the backlight source, and the real-time brightness value of the brightness detection point in the luminous area;

[0078] Step S2, for the backlight source in an environment where the influence of static electricity can be ignored, the real-time brightness values ​​corresponding to the light-emitting nodes are added and averaged to obtain the node brightness mean of the light-emitting nodes in the backlight source, and then the node brightness difference corresponding to each light-emitting node is obtained by subtracting the real-time brightness value corresponding to each light-emitting node from the node brightness mean and taking the absolute value, and the node brightness difference corresponding to the light-emitting node is compared with the brightness deviation threshold one by one. If all the node brightness deviation values ​​are less than the brightness deviation threshold, no operation is performed, wherein the preferred value of the node brightness deviation value is 80%;

[0079] Step S3: If there is a node whose brightness deviation value is greater than or equal to the brightness deviation threshold, the estimated brightness value YLD corresponding to the backlight source is calculated by the formula, and the specific formula is as follows:

[0080] ; Where MJ is the area of ​​the luminous area (mm 2 ), GQ is the rated luminous intensity of each light-emitting node, λ=λ1×λ2×λ3×λ4, λ1 is the diaphragm coefficient of the reflective film corresponding to the backlight source, λ2 is the light guide plate shape coefficient of the light guide plate corresponding to the backlight source, λ3 is the light output surface coefficient of the light output surface corresponding to the backlight source, λ4 is the current coefficient of the light-emitting node corresponding to the backlight source, and the diaphragm coefficient, light guide plate shape coefficient, light output surface coefficient and current coefficient can be obtained by model comparison. Model comparison is a prior art and is not specifically described here;

[0081] Exemplarily, if the reflective film corresponding to the backlight source is a metal reflective film, the value of λ1 is between 1.2-1.4; if the reflective film corresponding to the backlight source is a fully dielectric reflective film, the value of λ1 is between 1.4-1.8; if the light guide plate corresponding to the backlight source is a flat light guide plate, the value of λ2 is 1; if the light guide plate corresponding to the backlight source is a wedge-shaped light guide plate, the value of λ2 is between 0.5-0.8; if the light emitting surface corresponding to the backlight source is a single-sided light emitting surface, the value of λ3 is 1; if the light emitting surface corresponding to the backlight source is a double-sided light emitting surface, the value of λ3 is between 0.7-0.9; if the rated current of the light emitting node corresponding to the backlight source is 15mA, the current coefficient λ4 of the light emitting node corresponding to the backlight source is 1; if the rated current of the light emitting node corresponding to the backlight source is 20mA, the current coefficient λ4 of the light emitting node corresponding to the backlight source is between 1.3-1.5;

[0082] Step S4, subtracting the corresponding actual brightness value from the estimated brightness value of the backlight source and taking the absolute value to obtain a first backlight brightness difference value of the backlight source not affected by static electricity;

[0083] Repeating steps S1 to S4, a second backlight brightness difference value of the backlight source under the influence of static electricity can be obtained;

[0084] Step S5, comparing the second backlight brightness difference with the first backlight brightness difference, if the second backlight brightness difference is less than or equal to the first backlight brightness difference, a normal signal is generated, indicating that the backlight source in the electrostatic environment is not affected by static electricity;

[0085] If the second backlight brightness difference is greater than the first backlight brightness difference, it is determined that the backlight source in the electrostatic environment is affected by static electricity, and then an electrostatic tester is used to measure the electrostatic data of the backlight source in the electrostatic environment, where the electrostatic data specifically includes the amount of electrostatic charge corresponding to the backlight source and the location of the electrostatic charge;

[0086] The static electricity detection module sends static electricity data corresponding to the backlight source under the static electricity environment to the static electricity determination module or sends the generated normal signal to the display terminal.

[0087] See also Figure 3-Figure 7 As shown, the static electricity determination module is used to determine the static electricity level of the backlight source, and the determination process is as follows:

[0088] Obtaining electrostatic data of the backlight source, obtaining the charge amount DHLn of the electrostatic charge on the surface corresponding to the backlight source and the position of the electrostatic charge, where n is the number of the electrostatic charge, n=1, 2, ..., z, and z is a positive integer;

[0089] like Figure 3As shown, if the distribution of all electrostatic charges tends to the same area, the electrostatic charge of the backlight source is recorded as point-distributed electrostatic charge, and the area where the point-distributed electrostatic charge is located is defined as the point-distributed area, and multiple pre-selected points are set in the point-distributed area, and it is ensured that the straight-line distance between the position of the pre-selected point and the electrostatic charge farthest from the pre-selected point is less than or equal to a first preset distance, and then the straight-line distance between the pre-selected point and each electrostatic charge is counted, and the straight-line distances are added and summed to obtain the distance sum, and the pre-selected point with the smallest distance sum is selected as the core point;

[0090] For example, the pre-selected points are M and N, the electrostatic charges are a, b and c, the straight-line distances between M and N and the farthest electrostatic charge a are all less than the first preset distance, the straight-line distances between M and electrostatic charge a, electrostatic charge b and electrostatic charge c are 1, 2 and 3 respectively, and the straight-line distances between N and electrostatic charge a, electrostatic charge b and electrostatic charge c are 2, 1 and 3 respectively, then M is selected as the core point;

[0091] like Figure 4 As shown, if the electrostatic charge is distributed on an extension line, and the composition length of all the electrostatic charges is greater than or equal to the first preset length, the line distribution length C of the corresponding composition length of all the electrostatic charges is calculated, and the electrostatic charge of the backlight source is recorded as line distribution electrostatic. If the composition length of all the electrostatic charges is less than the first preset length, a minimum static elimination signal is generated, and it is determined that the electrostatic charge will only have a small impact on the backlight source. When specifically calculating the line distribution length, the distance between the two end points on the extension line where the electrostatic charge is located can be calculated as the line distribution length;

[0092] like Figure 5 As shown, if the electrostatic charge is distributed on a two-dimensional plane, and the component area of ​​all the electrostatic charges is greater than or equal to the second preset area, the surface distribution area S of the component area corresponding to all the electrostatic charges is calculated, and the electrostatic charge of the backlight source is recorded as surface distribution electrostatic. If the component area is less than the second preset area, a minimum static elimination signal is generated, and it is determined that the electrostatic charge will only have a small impact on the backlight source. When calculating the surface distribution area, the outermost electrostatic charge can be regarded as the endpoint of a polygon, and then the area of ​​the polygon is calculated as the surface distribution area;

[0093] like Figure 6As shown, if the electrostatic charge is randomly distributed in the three-dimensional space, that is, it is not the distribution of surface distribution electrostatics, line distribution electrostatics and point distribution electrostatics, then the volume distribution volume V of the space composed of all electrostatic charges is calculated, and the electrostatic charge of the backlight source is recorded as volume distribution electrostatics; when calculating the volume distribution volume specifically, the electrostatic charge on the outside can be regarded as the endpoint of an irregular geometric body, and the irregular geometric body can be specifically composed of side 1, side 2, bottom surface, etc., and then the volume of the corresponding irregular object is calculated; among which surface distribution electrostatics is the extreme case of volume distribution electrostatics, line distribution electrostatics is the extreme case of surface distribution electrostatics, and point distribution electrostatics is the extreme case of line distribution electrostatics;

[0094] like Figure 7 As shown, for the backlight source corresponding to the point-distributed static electricity, the point-distributed static electricity is regarded as an equivalent point charge with the center as the core point, and the static electric field intensity DCQ of the equivalent point charge corresponding to the backlight source at any position within the radiation range is calculated. The calculation formula of the static electric field intensity is as follows: , where ε represents the dielectric constant of the electric field, and R represents the distance between any position of the equivalent point charge within the radiation range and the position of the core point;

[0095] The electrostatic charge density of the backlight source corresponding to the line distribution electrostatics, surface distribution electrostatics and volume distribution electrostatics is calculated respectively. The calculation process is as follows:

[0096] The calculation formula of the electrostatic charge density of the backlight source corresponding to the line distribution electrostatic is as follows:

[0097] , where C is the line distribution length corresponding to the line distribution electrostatics, ∑DHLn refers to the total charge of the electrostatic charge contained in the line distribution length C;

[0098] The calculation formula for the electrostatic charge density of the backlight source corresponding to the surface distribution static electricity is as follows:

[0099] , where S is the surface distribution area corresponding to the surface distribution electrostatics, ∑DHLn refers to the total charge of the electrostatic charge contained in the surface distribution area S;

[0100] The calculation formula of the electrostatic charge density of the backlight source corresponding to the body distributed static electricity is as follows:

[0101] , where V is the volume distribution volume corresponding to the volume distribution electrostatics, ∑DHLn refers to the total charge of the electrostatic charges contained in the volume distribution volume V;

[0102] Then calculate the electrostatic field strength of the backlight source corresponding to the line distribution electrostatics, surface distribution electrostatics and volume distribution electrostatics;

[0103] For the backlight source corresponding to the volumetric distributed electrostatics, the volumetric distributed electrostatics corresponding to the volumetric distributed electrostatics is divided into several independent small spaces. It is assumed that the charge in each small space is concentrated at the geometric center. For each small space, the charge amount is equal to the charge density multiplied by the volume. Then the electrostatic field strength of each small space is , where m is the number of each small space, R is the distance between the corresponding position and the geometric center of the small space; the electrostatic electric field intensity DCQ at the corresponding position = ∑DCQm;

[0104] Similarly, the calculation process of the electrostatic field strength of surface distributed electrostatics is obtained from the derivation process of the electrostatic field strength of volume distributed electrostatics. The surface distribution area corresponding to the surface distributed electrostatics is divided into several independent small areas, and the area of ​​each small area is recorded as s, and then we get , DCQ=∑DCQm;

[0105] Divide the line distribution length corresponding to the line distribution electrostatics into several small line segments, and record the length of each small line segment as c. Then the electrostatic field intensity DCQ of the line distribution electrostatics is DCQ=∑DCQm. ;

[0106] For any position in the backlight source, the electrostatic electric field intensity is compared with the electric field intensity threshold;

[0107] If the electrostatic field strength at all positions is less than or equal to the first electrostatic field strength threshold, a normal signal is generated, indicating that the backlight source will not be affected by static electricity;

[0108] If all electrostatic field intensities are less than or equal to the second electrostatic field intensity threshold, and there is an electrostatic field intensity greater than the first electrostatic field intensity threshold, a first-level elimination signal is generated, and it is determined that the backlight source will be slightly affected by static electricity;

[0109] If there is an electrostatic field strength greater than the second electrostatic field strength threshold, a secondary elimination signal is generated, and it is determined that the backlight source will be greatly affected by static electricity; wherein the first electrostatic field strength threshold is less than the second electrostatic field strength threshold, and the elimination strength of the primary elimination signal is less than the elimination strength of the secondary elimination signal;

[0110] The static electricity determination module sends a normal signal corresponding to the backlight source to the display terminal, and sends a minimum static electricity elimination signal, a primary elimination signal or a secondary elimination signal corresponding to the backlight source to the static electricity elimination module;

[0111] The static electricity elimination module is used to eliminate the static electricity in the backlight source, and the elimination process is as follows:

[0112] Obtaining a minimum static elimination signal, a primary elimination signal, or a secondary elimination signal corresponding to a backlight source;

[0113] If it is a minimum static elimination signal, spray static elimination agent on the corresponding backlight surface and generate an elimination completion signal;

[0114] If it is a first-level elimination signal, the power supply of the corresponding backlight source is cut off, and the backlight source is connected to the ground wire, and then the corresponding backlight source is detected using an electrostatic detector. If the reading of the electrostatic detector is 0, an elimination completion signal is generated;

[0115] If it is a secondary elimination signal, cut off the power supply of the corresponding backlight source, and eliminate the static electricity of the backlight source through the static eliminator, and use the static detector to detect the corresponding backlight source at the same time, until the static detector can detect the reading, and then connect the backlight source to the ground wire until the reading of the static detector is 0, and generate an elimination completion signal;

[0116] The static electricity elimination module sends an elimination completion signal to a display terminal, and the display terminal is used to display the elimination completion signal and the normal signal corresponding to the backlight source. The user can know the status of the backlight source by checking the elimination completion signal and the normal signal corresponding to the backlight source;

[0117] In this application, if corresponding calculation formulas appear, the above calculation formulas are all dimensionless and take their numerical calculations. The weight coefficients, proportional coefficients and other coefficients in the formulas are set to a result value obtained by quantifying each parameter. The size of the weight coefficient and the proportional coefficient can be determined as long as it does not affect the proportional relationship between the parameter and the result value.

[0118] Embodiment 2: Another conception based on the same invention, such as Figure 8 As shown, a backlight source static elimination method is now proposed, comprising the following steps:

[0119] Step S100, selecting two groups of backlight sources for electrostatic testing, the data acquisition module respectively acquires the luminous information of the two groups of backlight sources, and sends the luminous information corresponding to the two groups of backlight sources to the electrostatic detection module;

[0120] Step S200, the static electricity detection module detects the static electricity condition of the backlight source, and if a normal signal is generated, it is sent to the display terminal; if static electricity data corresponding to the backlight source in the static electricity environment is obtained, it is sent to the static electricity determination module;

[0121] Step S300, the static electricity determination module determines the static electricity level of the backlight source, and if a normal signal is generated, it is sent to the display terminal; if a minimum static electricity elimination signal, a first-level elimination signal, or a second-level elimination signal is generated, it is sent to the static electricity elimination module;

[0122] Step S400: the static electricity elimination module eliminates the static electricity in the backlight source with different elimination strengths according to the elimination signal.

[0123] Embodiment 3: Fig. 9 As shown, Fig. 9 The structure diagram of a backlight static elimination system is shown in FIG. 1 , which may include: a processor, a communications interface, a memory, and a communications bus, wherein the processor, the communications interface, and the memory communicate with each other via the communications bus. The processor may call the logic instructions in the memory to execute a backlight static elimination method.

[0124] In addition, the logic instructions in the above-mentioned memory can be implemented in the form of software functional units and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0125] On the other hand, the present application also provides a computer program product, which includes a computer program stored on a computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute a backlight source static electricity elimination method provided by the above methods.

[0126] On the other hand, the present application further provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the method for eliminating static electricity from a backlight source provided above is implemented.

[0127] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0128] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0129] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A backlight source static elimination device, comprising a backlight source and a detection and elimination device for detecting static electricity on the backlight source, the detection and elimination device comprising a processor and a display terminal, characterized in that: The processor includes a data acquisition module, a static electricity detection module, a static electricity determination module, a static electricity elimination module and a database; Select two groups of qualified backlight sources for electrostatic testing, the data acquisition module is used to collect the luminous information of the two groups of backlight sources, and send the luminous information corresponding to the two groups of backlight sources to the electrostatic detection module; The data acquisition module is also used to collect the actual brightness values ​​of the two groups of backlight sources, and send the actual brightness values ​​of the two groups of backlight sources to the static electricity detection module; The database is used to store the film coefficients of the reflective films corresponding to the backlight sources of different models, the light guide plate shape coefficients of the light guide plates corresponding to the backlight sources, the light emitting surface coefficients of the light emitting surfaces corresponding to the backlight sources, and the current coefficients of the light emitting nodes corresponding to the backlight sources; The static electricity detection module is used to detect the static electricity situation of the backlight source. The detection process is as follows: Obtain the luminous information of the backlight source, obtain the height and width of the luminous area corresponding to the backlight source, and the real-time brightness value of the brightness detection point in the luminous area; For the backlight source that is not affected by static electricity, the real-time brightness values ​​corresponding to the light-emitting nodes are added and averaged to obtain the node brightness mean of the light-emitting nodes in the backlight source, and then the real-time brightness value corresponding to each light-emitting node is subtracted from the node brightness mean and the absolute value is taken to obtain the node luminescence difference corresponding to each light-emitting node; Compare the node luminescence difference corresponding to the luminous node with the brightness deviation threshold one by one. If all the node brightness deviation values ​​are less than the brightness deviation threshold, no operation is performed; if there is a node brightness deviation value greater than or equal to the brightness deviation threshold, the estimated brightness value corresponding to the backlight source is calculated by the formula; The first backlight brightness difference value of the backlight source not affected by static electricity is obtained by subtracting the corresponding actual brightness value from the estimated brightness value of the backlight source and taking the absolute value; Repeat the above steps to obtain a second backlight brightness difference value of the backlight source under the influence of static electricity, and compare the second backlight brightness difference value with the first backlight brightness difference value; If the second backlight brightness difference is less than or equal to the first backlight brightness difference, a normal signal is generated; If the second backlight brightness difference is greater than the first backlight brightness difference, obtaining static electricity data of the backlight source under the influence of static electricity; If the static data corresponding to the backlight source in the static environment is detected, it is sent to the static judgment module; if the detection generates a normal signal, it is sent to the display terminal; The static electricity determination module is used to determine the static electricity degree of the backlight source, and if a normal signal corresponding to the backlight source is generated, it is sent to the display terminal; if a minimum static electricity elimination signal, a first-level elimination signal or a second-level elimination signal corresponding to the backlight source is generated, it is sent to the static electricity elimination module; The static electricity elimination module is used to eliminate the static electricity existing in the backlight source, and after the elimination is completed, an elimination completion signal is generated and sent to the display terminal; The display terminal is used for receiving and displaying an elimination completion signal and a normal signal corresponding to the backlight source.

2. The backlight source static elimination device according to claim 1, characterized in that: The luminous information is the height and width of the luminous areas in the two groups of backlight sources, and the real-time brightness values ​​of the brightness detection points in the luminous areas; wherein, each luminous node radiates a fixed common area, and the common areas of multiple luminous nodes constitute the luminous area, and then the height and width of the luminous area are counted, and the corresponding number of brightness detection points are selected according to the height and width of the luminous area, and the real-time brightness value of each brightness detection point is measured.

3. The backlight source static elimination device according to claim 1, characterized in that: The electrostatic data specifically refers to the amount of electrostatic charge corresponding to the backlight source and the position of the electrostatic charge.

4. The backlight source static elimination device according to claim 1, characterized in that: The determination process of the static electricity determination module is as follows: Obtaining electrostatic data of the backlight source, and obtaining the charge amount and position of the electrostatic charge on the surface corresponding to the backlight source; If the distribution of electrostatic charges tends to the same area, the electrostatic charges of the backlight source are recorded as point-distributed electrostatics, and the area where the point-distributed electrostatics are located is defined as the point-distributed area. A plurality of pre-selected points are set in the point-distributed area, and it is ensured that the straight-line distance between the position of the pre-selected point and the electrostatic charge farthest from the pre-selected point is less than or equal to a first preset distance. Then, the straight-line distance between the pre-selected point and each electrostatic charge is counted, and the sum of the straight-line distances is obtained by adding up the sum of the distances, and the pre-selected point with the smallest distance sum is selected as the core point. If the electrostatic charges are distributed on an extended line, and the length of all the electrostatic charges is greater than or equal to a first preset length, the line distribution length of the corresponding length of all the electrostatic charges is calculated, and the electrostatic charges of the backlight source are recorded as line distribution static electricity. If the length of all the electrostatic charges is less than the first preset length, a minimum static elimination signal is generated; If the electrostatic charge is distributed on a two-dimensional plane, and the component area of ​​all the electrostatic charges is greater than or equal to the second preset area, the surface distribution area of ​​the component area corresponding to all the electrostatic charges is calculated, and the electrostatic charge of the backlight source is recorded as surface distribution static electricity. If the component area is less than the second preset area, a minimum static elimination signal is generated; If the electrostatic charges are randomly distributed in the three-dimensional space, the volume distribution of the space composed of all the electrostatic charges is calculated, and the electrostatic charges of the backlight source are recorded as volume distribution electrostatics.

5. The backlight source static elimination device according to claim 4, characterized in that: The determination process of the static electricity determination module also includes: For the backlight source corresponding to the point-distributed static electricity, the point-distributed static electricity is regarded as an equivalent point charge with the center as the core point, and the static electric field intensity of any position of the equivalent point charge corresponding to the backlight source within the radiation range is calculated; For the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics, the electrostatic charge density of the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics is calculated respectively, and then the electrostatic electric field strength of the backlight sources corresponding to the line distributed electrostatics, the surface distributed electrostatics and the volume distributed electrostatics is calculated; comparing the electrostatic electric field strength with the electric field strength threshold; If the electrostatic field strength is less than or equal to the first electrostatic field strength threshold, a normal signal is generated; If the electrostatic electric field strength is greater than the first electrostatic electric field strength threshold and less than or equal to the second electrostatic electric field strength threshold, a first-level elimination signal is generated; If the electrostatic electric field strength is greater than the second electrostatic electric field strength threshold, a secondary elimination signal is generated.

6. The backlight source static elimination device according to claim 5, characterized in that: The first electrostatic electric field strength threshold is less than the second electrostatic electric field strength threshold; The canceling strength of the primary canceling signal is less than the canceling strength of the secondary canceling signal.

7. A method for eliminating static electricity from a backlight source, characterized in that: A backlight source static elimination device according to any one of claims 1 to 6, wherein the method is as follows: Step S100, selecting two groups of backlight sources for electrostatic testing, the data acquisition module respectively acquires the luminous information of the two groups of backlight sources, and sends the luminous information corresponding to the two groups of backlight sources to the electrostatic detection module; Step S200, the static electricity detection module detects the static electricity condition of the backlight source, and if a normal signal is generated, it is sent to the display terminal; if static electricity data corresponding to the backlight source in the static electricity environment is obtained, it is sent to the static electricity determination module; Step S300, the static electricity determination module determines the static electricity level of the backlight source, and if a normal signal is generated, it is sent to the display terminal; if a minimum static electricity elimination signal, a first-level elimination signal, or a second-level elimination signal is generated, it is sent to the static electricity elimination module; Step S400: the static electricity elimination module eliminates the static electricity in the backlight source with different elimination strengths according to the elimination signal.

8. A backlight source static elimination system, characterized in that: The backlight source static elimination system comprises: A memory storing a computer program; A processor is communicatively connected to the memory, and when the computer program is executed by the processor, the method of claim 7 is implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the method described in claim 7 is implemented.

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