An ultrasonic probe, testing device, and testing method for inspecting the bottom of in-service steel rails.

Abstract

This invention provides an ultrasonic probe, detection device, and detection method for inspecting the bottom of in-service rails. The ultrasonic probe includes a dual-crystal hybrid probe for detecting a second blind zone of the rail bottom and a triple-crystal hybrid probe for detecting a first blind zone of the rail bottom. The dual-crystal hybrid probe includes a first housing, a first crystal, and a second crystal disposed within the first housing. The first crystal forms a first preset angle with the longitudinal extension surface of the rail, and the second crystal forms a second preset angle with the longitudinal extension surface of the rail. The first and second crystals form a third preset angle. The triple-crystal hybrid probe includes a second housing, a third crystal, and two crystals disposed within the second housing. The third crystal forms a fourth preset angle with the longitudinal extension surface of the rail, and the two crystals form a fifth preset angle with the longitudinal extension surface of the rail. The third crystal and the two crystals form a sixth preset angle. This invention enables effective and comprehensive inspection of the bottom of in-service rails.

Description

Technical Field

[0001] This invention relates to the field of rail inspection technology, and in particular to an ultrasonic probe, inspection device and inspection method for inspecting the bottom of in-service rails. Background Technology

[0002] Ultrasonic testing methods for in-service rails mainly include two types: large rail flaw detectors and portable rail flaw detectors (monorail and double-rail). Large rail flaw detectors have a fast testing speed and can detect transverse cracks in the rail head, bolt hole cracks, and longitudinal horizontal cracks in the rail head and web; portable rail flaw detectors have high testing accuracy but a slower testing speed. However, all of the above rail flaw detection methods have certain blind spots (see...). Figure 1 During inspection, the ultrasonic waves are primarily incident on the rail head. The detectable areas for the ultrasonic waves include the rail head, rail web, and the middle of the rail base. Analysis of actual detected defects and the causes of rail breaks reveals that defects at the rail base, caused by corrosion, track shifting, etc., often occur there. These defects are relatively hidden, especially since the sides of the rail base are blind spots for the ultrasonic automatic inspection device. Currently, it is difficult to effectively and quickly detect defects on the sides of the rail base, leading to the failure to detect these defects in a timely manner, which is one of the important causes of rail breaks.

[0003] Currently, Hu Jianhong et al. have used ultrasonic guided waves to detect rail base defects and found that a frequency of 64kHz is suitable for detecting the bottom of rail turnouts. Their designed system can effectively detect turnout rail base defects. Zeng Ziyan et al. have conducted in-depth research on the propagation characteristics of ultrasonic guided waves in rails and designed a guided wave transducer suitable for rail base defect detection. By analyzing and processing the ultrasonic guided wave signals, they have achieved the identification and location of rail base cracks. Madhuri et al. have used laser-induced ultrasonic guided waves and used finite element analysis to simulate the detection of rail base defects, obtaining suitable guided wave frequencies and sensor installation positions. However, the above studies are mainly conducted under laboratory conditions, only testing a single section of rail, without considering the on-site conditions of rails laid on the track. Applying the above studies to actual service rails for defect detection, especially for non-destructive testing of the rail base of service rails, the detection effect is unknown.

[0004] Traditionally, a Chinese patent with application number ZL202311424580.2 discloses an ultrasonic testing device for railbed damage in service, including a main frame. Two clamping mechanisms are hinged to the left and right sides of the main frame. The two clamping mechanisms are respectively hinged to the lower ends of two connecting rods, and the upper ends of the two connecting rods are hinged to the same front grip rod. Each clamping mechanism is equipped with a row of detection probes. However, the detection probes and clamping mechanisms provided by this patent cannot make the detection probes fit tightly against the rail surface, thus affecting the detection effect.

[0005] Therefore, there is an urgent need for an ultrasonic probe, testing device, and testing method for inspecting the bottom of in-service rails, which can effectively and comprehensively inspect the bottom of in-service rails. Summary of the Invention

[0006] The purpose of this invention is to provide an ultrasonic probe, testing device, and testing method for inspecting the bottom of in-service rails, aiming to solve the technical problem that traditional non-destructive testing probes and devices have poor testing effects when inspecting the bottom of in-service rails.

[0007] To achieve the above objectives, in a first aspect, the present invention provides an ultrasonic probe for detecting the bottom of in-service rails, comprising a dual-crystal hybrid probe and a tri-crystal hybrid probe; the tri-crystal hybrid probe is used to detect a first detection blind zone of the rail bottom, and the dual-crystal hybrid probe is used to detect a second detection blind zone of the rail bottom;

[0008] The dual-crystal hybrid probe includes a first housing, a first wafer assembly and a second wafer assembly spaced apart at the bottom of the first housing;

[0009] The first wafer assembly includes a first wafer and a first wafer mount for mounting the first wafer;

[0010] The second wafer assembly includes a second wafer and a second wafer mount for mounting the second wafer;

[0011] The plane containing the first wafer forms a first preset angle with the longitudinal extension surface of the rail, and the plane containing the second wafer forms a second preset angle with the longitudinal extension surface of the rail; the plane containing the first wafer and the plane containing the second wafer form a third preset angle.

[0012] The triple-crystal hybrid probe includes a second housing, a third wafer assembly spaced apart at the bottom of the second housing, and a dual-crystal assembly.

[0013] The third wafer assembly includes a third wafer and a third wafer mount for mounting the third wafer;

[0014] The dual-chip assembly includes two chips arranged side by side and a fourth chip holder for mounting the two chips;

[0015] The plane where the third wafer is located forms a fourth preset angle with the longitudinal extension surface of the rail; the plane where the two wafers are located forms a fifth preset angle with the longitudinal extension surface of the rail; the plane where the third wafer is located and the plane where the two wafers are located form a sixth preset angle.

[0016] As a further improvement to the above scheme, the first preset included angle is 40 to 50°; preferably, the first preset included angle is 45°.

[0017] As a further improvement to the above scheme, the second preset included angle is 40 to 50°; preferably, the second preset included angle is 45°.

[0018] As a further improvement to the above scheme, the third preset included angle is 10 to 20°; preferably, the third preset included angle is 15°.

[0019] As a further improvement to the above scheme, the spacing between the first wafer assembly and the second wafer assembly is 3 to 8 mm.

[0020] As a further improvement to the above scheme, the fourth preset included angle is 40 to 50°; preferably, the fourth preset included angle is 45°.

[0021] As a further improvement to the above scheme, the fifth preset included angle is -5 to 5°; preferably, the fifth preset included angle is 0°.

[0022] In a second aspect, the present invention also provides a detection device, including an ultrasonic probe for detecting the bottom of in-service rails as described in the first aspect, and a detection vehicle matched with the rails;

[0023] The vehicle-mounted inspection vehicle includes a frame, with a flaw detector mounted on the upper part of the frame, and the ultrasonic probe mounted on the bottom of the frame via a clamping mechanism;

[0024] The clamping mechanism includes a clamping bracket connected to the bottom of the vehicle frame and two clamping components disposed on opposite sides of the clamping bracket. The two clamping components are used to attach the ultrasonic probe to both sides of the rail. One end of each clamping component is connected to the clamping bracket via a slidable adjustment structure, and the other end is provided with the ultrasonic probe.

[0025] The dual-crystal hybrid probe and the tri-crystal hybrid probe of the ultrasonic probe are spaced apart along the extension direction of the rail at the far end of the corresponding clamping assembly.

[0026] The bottom of the frame is also equipped with a spraying assembly for spraying ultrasonic coupling medium onto the rails so that the ultrasonic probe can perform coupling detection on the bottom of the rails.

[0027] As a further improvement to the above solution, the ultrasonic probe can be operably attached to or lifted away from both sides of the rail via a probe support structure.

[0028] As a further improvement to the above solution, the probe support structure includes a probe hanger, a probe bracket, and a probe hook.

[0029] One end of the probe hanger is disposed at the other end of the clamping assembly, one end of the probe bracket is hinged to the other end of the probe hanger, and the ultrasonic probe is disposed at the other end of the probe bracket; a hanging shaft for the probe hook to be engaged is disposed at the end of the probe bracket away from its hinge, and correspondingly, the probe hook is disposed on the probe hanger;

[0030] Alternatively, the probe support structure includes a probe hanger, a probe bracket, and a telescopic power source. One end of the probe hanger is located at the other end of the clamping assembly, and one end of the probe bracket is hinged to the other end of the probe hanger. The other end of the probe bracket is where the ultrasound probe is located. The telescopic end of the telescopic power source is connected to the probe bracket at the end furthest from its hinge, and the telescopic end furthest from its telescopic end is connected to the probe hanger. Preferably, the telescopic power source is a miniature cylinder or a miniature electric cylinder.

[0031] As a further improvement to the above solution, the probe bracket includes two bent members arranged in parallel and spaced intervals, and a mounting member for mounting the ultrasonic probe;

[0032] The hanging shaft is disposed between the two bending parts and connects the two bending parts into one piece; the mounting part is disposed at the end of the probe bracket away from the hinge, and the dual-crystal hybrid probe or the triple-crystal hybrid probe is rotatably disposed within the mounting space of the mounting part.

[0033] As a further improvement to the above solution, the clamping assembly includes a clamping frame, one end of which is provided with a first arc-shaped sliding groove;

[0034] The slidable adjustment structure includes a first arc-shaped groove, a connecting bolt, and a rolling sleeve. The rolling sleeve is sleeved outside the connecting bolt. The connecting bolt passes through the first arc-shaped groove and is connected to the clamping hanger. The rolling sleeve is slidably in contact with the first arc-shaped groove.

[0035] As a further improvement to the above solution, the clamping frame includes a transverse support member and two arc-shaped members spaced apart on the transverse support member, each of the arc-shaped members being provided with the first arc-shaped groove.

[0036] As a further improvement to the above solution, the spray assembly includes a nozzle, a pipe connected to the nozzle, and an ultrasonic coupling medium container connected to the pipe;

[0037] The nozzle is disposed on the mounting component and adjacent to the ultrasonic probe; the ultrasonic coupling medium container is disposed on the vehicle frame.

[0038] Thirdly, the present invention also provides a detection method for a detection device as described in the second aspect, the steps of which include:

[0039] S1. The dual-crystal hybrid probe and the triple-crystal hybrid probe are respectively set on both sides of the rail; the sliding adjustment structure is adjusted so that the ultrasonic probes for detecting the bottom of the service rail on both sides of the rail are attached to the bottom of the rail.

[0040] S2. Start the mounted inspection vehicle, flaw detector and spray assembly. The mounted inspection vehicle drives the ultrasonic probe to perform inspection along the extension direction of the rail.

[0041] The three-crystal hybrid probes, which are correspondingly installed on both sides of the rail, detect the first detection blind zone on both sides of the rail base, and the dual-crystal hybrid probes detect the second detection blind zone on both sides of the rail base.

[0042] When the testing vehicle moves to the joint of the rails, both the three-crystal hybrid probe and the two-crystal hybrid probe are raised until they pass the joint. Then, the three-crystal hybrid probe and the two-crystal hybrid probe are lowered and aligned with both sides of the rails to continue the testing.

[0043] As a further improvement to the above scheme, in step S1, the first preset angle and the second preset angle of the dual-crystal hybrid probe are both set to 45°; the third preset angle is set to 15°.

[0044] The fourth preset angle of the three-crystal hybrid probe is set to 45°, and the fifth preset angle is set to 0°.

[0045] Because the present invention adopts the above technical solutions, the beneficial effects of this application are as follows:

[0046] 1. This invention provides an ultrasonic probe for inspecting the bottom of in-service rails, including a dual-crystal hybrid probe and a tri-crystal hybrid probe. The ultrasonic probe provided by this invention uses a tri-crystal hybrid probe to detect a first blind spot on the rail bottom, and a dual-crystal hybrid probe to detect a second blind spot on the rail bottom. The use of both hybrid probes enables comprehensive coverage detection of the blind spot on one side of the rail bottom. Specifically, in the dual-crystal hybrid probe, the plane of the first crystal forms a first preset angle (preferably 45°) with the longitudinal extension surface of the rail; the plane of the second crystal forms a second preset angle (preferably 45°) with the longitudinal extension surface of the rail; and the planes of the first and second crystals form a third preset angle (preferably 15°). See [reference needed for further details]. Figure 1 and Figure 6This allows for effective coverage detection of defects near the rail bottom edge in area C (the second blind zone) on one side of the rail base. In the three-crystal hybrid probe, the plane of the third crystal forms a fourth preset angle (preferably 45°) with the longitudinal extension surface of the rail, and the plane of the two crystals forms a fifth preset angle (preferably 0°) with the longitudinal extension surface of the rail. For this configuration, see [reference needed]. Figure 1 and Figure 6 The three-crystal hybrid probe can effectively cover and detect defects near the edge of the rail bottom in areas A and B (i.e., the first detection blind zone) on one side of the rail bottom; the combined use of the dual-crystal hybrid probe and the three-crystal hybrid probe can effectively cover and detect the blind zone of the rail bottom.

[0047] 2. The present invention also provides a detection device, including the aforementioned ultrasonic probe for inspecting the bottom of in-service rails, and a testing vehicle matched with the rail; the testing vehicle includes a frame, a flaw detector is mounted on the upper part of the frame, and the ultrasonic probe is mounted on the bottom of the frame via a clamping mechanism; the clamping mechanism includes a clamping hanger connected to the bottom of the frame and two clamping assemblies disposed on opposite sides of the clamping hanger, the two clamping assemblies being used to attach the ultrasonic probe to both sides of the rail; one end of each clamping assembly is connected to the clamping hanger via a slidable adjustment structure, and the other end... An ultrasonic probe is provided at one end; the dual-crystal hybrid probe and the tri-crystal hybrid probe of the ultrasonic probe are spaced apart along the extension direction of the rail at the corresponding clamping assembly away from the sliding end; a spraying assembly is also provided at the bottom of the frame for spraying an ultrasonic coupling medium onto the rail so that the ultrasonic probe can couple and detect the bottom of the rail; in this invention, the ultrasonic probe for detecting the bottom of the in-service rail is mounted on the frame of the inspection vehicle by means of a clamping assembly, and one end of the clamping assembly is connected to the clamping hanger through a slidable adjustment structure. This arrangement allows for the use of the slidable adjustment structure... Adjusting the tightness of the fit between the ultrasonic probe and the bottom of the rail to be tested ensures effective contact between the ultrasonic probe and the rail bottom, guaranteeing the testing effect. Furthermore, the slidable adjustment structure allows the testing device to be used with rails of different specifications. The opening angle of the two clamping components can be flexibly adjusted according to the rail model and / or manufacturer to ensure effective contact between the ultrasonic probe and the rail bottom, making the testing device versatile. In some preferred embodiments, the ultrasonic probe is operably fitted to the rail bottom via a probe support structure. The probe support structure, which allows the ultrasonic probe to be lifted off the bottom of the rails when it reaches the splicing area of ​​the two rail connecting plates, enables this function. After the testing trolley has passed smoothly, the probe support structure can be used to lower the ultrasonic probe back onto the rail bottom for continued testing. This design facilitates a smooth testing process, ensures testing efficiency, and prevents the ultrasonic probe from being damaged by contact with the two rail connecting plates. Attached Figure Description

[0048] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0049] Figure 1 This is a schematic diagram of blind spots in rail inspection.

[0050] Figure 2 This is an exploded view of a dual-crystal hybrid ultrasonic probe for detecting the bottom of in-service steel rails, as disclosed in this invention.

[0051] Figure 3 for Figure 2 A partial perspective view of the dual-crystal hybrid probe;

[0052] Figure 4 This is an exploded view of a three-crystal hybrid ultrasonic probe for detecting the bottom of in-service steel rails, as disclosed in this invention.

[0053] Figure 5 for Figure 4 A partial perspective view of the tri-crystal hybrid probe;

[0054] Figure 6 This is a schematic diagram showing the ultrasonic beam coverage range of the rail bottom using an ultrasonic probe for detecting the rail bottom of an in-service rail disclosed in this invention.

[0055] Figure 7 This is a three-dimensional schematic diagram of a detection device disclosed in this invention installed on a steel rail;

[0056] Figure 8 This is a side view of a detection device disclosed in this invention, mounted on a steel rail.

[0057] Figure 9 This is a front view schematic diagram of a detection device disclosed in this invention installed on a steel rail;

[0058] Figure 10 This is a three-dimensional schematic diagram of a detection device disclosed in this invention;

[0059] Figure 11 This is a three-dimensional schematic diagram of a detection device disclosed in this invention, excluding the detection vehicle and flaw detector.

[0060] Figure 12 This is a three-dimensional schematic diagram of the ultrasonic probe disclosed in this invention mounted on a clamping structure on one side.

[0061] Figure 13 This is a side view of the ultrasonic probe disclosed in this invention, which is mounted on a clamping structure on one side (the ultrasonic probe is in contact with the steel rail).

[0062] Figure 14 This is a side view schematic diagram of the ultrasonic probe disclosed in this invention mounted on a clamping structure on one side (the ultrasonic probe is lifted away from the rail);

[0063] Figure 15This is a front view schematic diagram of the ultrasonic probe disclosed in this invention mounted on a clamping structure on one side;

[0064] Figure 16 The images show a comparison of the 60kg / m standard rail disclosed in this invention and a 60kg / m rail with defects.

[0065] Figure 17 This is a schematic diagram showing the detection results of rail base defects of a 60kg / m steel rail using the detection device disclosed in this invention.

[0066] Figure label:

[0067] 0. Ultrasonic probe; 01. Dual-crystal hybrid probe; 011. First housing; 012. First crystal; 013. First crystal holder; 014. Second crystal; 015. Second crystal holder;

[0068] 02. Tri-crystal hybrid probe; 021. Second housing; 022. Third wafer; 023. Third wafer mount; 024. Dual wafers; 025. Fourth wafer mount;

[0069] 1. Mounted inspection vehicle; 11. Vehicle frame; 2. Flaw detector; 3. Clamping mechanism; 31. Clamping hanger; 32. Clamping assembly; 34. Clamping frame; 341. First arc-shaped slide groove; 342. Lateral support component; 343. Arc-shaped component;

[0070] 33. Sliding adjustment structure; 331. Connecting bolts; 332. Rolling sleeve;

[0071] 4. Spray assembly; 41. Nozzle; 42. Pipeline; 43. Ultrasonic coupling medium container;

[0072] 5. Probe support structure; 51. Probe hanger; 52. Probe bracket; 53. Probe hook; 54. Hanging shaft; 55. Bending component; 56. Mounting component; 6. Rail.

[0073] The realization of the objective, functional characteristics and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0074] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0075] It should be noted that all directional indicators (such as up, down, etc.) in the embodiments of the present invention are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.

[0076] Furthermore, in this invention, descriptions involving "first," "second," etc., are for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature.

[0077] Furthermore, the technical solutions of the various embodiments of the present invention can be combined with each other, but only if they are based on the ability of those skilled in the art to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection claimed by the present invention.

[0078] Example 1

[0079] See Figures 1-6 The present invention provides an ultrasonic probe 0 for detecting the bottom of in-service rails, including a dual-crystal hybrid probe 01 and a tri-crystal hybrid probe 02; the tri-crystal hybrid probe 02 is used to detect the first detection blind zone of the bottom of the rail 6, and the dual-crystal hybrid probe 01 is used to detect the second detection blind zone of the bottom of the rail 6.

[0080] See Figure 2 and Figure 3 The dual-crystal hybrid probe 01 includes a first housing 011, a first wafer 012 assembly and a second wafer 014 assembly spaced apart at the bottom of the first housing 011;

[0081] The first chip 012 assembly includes a first chip 012 and a first chip socket 013 for setting the first chip 012;

[0082] The second wafer 014 assembly includes a second wafer 014 and a second wafer mount 015 for setting the second wafer 014;

[0083] The plane where the first wafer 012 is located forms a first preset angle with the longitudinal extension surface of the rail 6, and the plane where the second wafer 014 is located forms a second preset angle with the longitudinal extension surface of the rail 6; the planes where the first wafer 012 and the second wafer 014 are located form a third preset angle; the first preset angle is 40-50°; the second preset angle is 40-50°; in this embodiment, the first preset angle is 45° and the second preset angle is 45°. Since the wafer is tilted by 45°, the path of the wafer emitting and collecting sound waves will be interfered with by the side wall of the housing. In order to avoid this interference, in this embodiment, the installation positions of the first wafer 012 and the second wafer 014 are separated front and back, and the interval between the first wafer 012 assembly and the second wafer 014 assembly is 3-8mm. Specifically, the front and back separation distance of the two wafers is about 5mm, and the third preset angle is 10-20°. Preferably, the third preset angle is about 15°, which is beneficial to the reception of defect echo signals.

[0084] See Figure 4 and Figure 5 The triple-crystal hybrid probe 02 includes a second housing 021, a third wafer 022 assembly and a dual wafer 024 assembly spaced apart at the bottom of the second housing 021.

[0085] The third wafer 022 assembly includes a third wafer 022 and a third wafer mount 023 for mounting the third wafer 022;

[0086] The dual-chip 024 assembly includes two chips 024 arranged side by side and a fourth chip holder 025 for setting the dual chips 024;

[0087] The plane containing the third wafer 022 forms a fourth preset angle with the longitudinal extension surface of the rail 6; the plane containing the dual wafer 024 forms a fifth preset angle with the longitudinal extension surface of the rail 6; the plane containing the third wafer 022 and the plane containing the dual wafer 024 form a sixth preset angle.

[0088] Specifically, due to the different curvatures of the upper surface cross-section of the bottom of rail 6, the width dimensions of the dual-crystal hybrid probe 01 and the triple-crystal hybrid probe 02 are limited. In order to maximize the contact area, in this embodiment, the dimensions are set to 40mm×22mm×20mm; the first wafer holder 013, the second wafer holder 015, the third wafer holder 023 and the fourth wafer holder 025 are all wedge-shaped blocks;

[0089] The ultrasonic probe 0 provided by this invention uses a three-crystal hybrid probe 02 to detect the first blind zone of the rail base 6, and a two-crystal hybrid probe 01 to detect the second blind zone of the rail base 6. The use of these two hybrid probes enables comprehensive coverage detection of the blind zone on one side of the rail base 6. Specifically, in the two-crystal hybrid probe 01, the plane of the first crystal 012 forms a first preset angle with the longitudinal extension surface of the rail 6 (preferably 45°), the plane of the second crystal 014 forms a second preset angle with the longitudinal extension surface of the rail 6 (preferably 45°), and the planes of the first crystal 012 and the second crystal 014 form a third preset angle (preferably 15°). See [reference needed for further details]. Figure 1 and Figure 6 This allows for effective coverage detection of defects near the rail bottom edge in area C (the second blind zone) on one side of the rail bottom of rail 6. In the three-crystal hybrid probe 02, the plane of the third crystal 022 forms a fourth preset angle (preferably 45°) with the longitudinal extension surface of rail 6, and the plane of the dual crystal 024 forms a fifth preset angle (preferably 0°) with the longitudinal extension surface of rail 6. For this configuration, see [reference needed]. Figure 1 and Figure 6 The three-crystal hybrid probe 02 can effectively cover and detect defects near the edge of the rail bottom in areas A and B (i.e., the first detection blind zone) on one side of the rail bottom of rail 6; the combined use of the dual-crystal hybrid probe 01 and the three-crystal hybrid probe 02 can effectively cover and detect the detection blind zone of the rail bottom of rail 6.

[0090] To further illustrate the effective coverage of the ultrasonic probe 0 provided by this invention on both sides of the rail base of rail 6, see [link to documentation]. Figure 1 The blind spots on both sides of the bottom of the rail are divided into three different detection areas: A, B, and C. In the simulation experiment of the ultrasonic probe's 0-radiation sound beam, the sound wave will be incident from the area where the probe can be placed, so as to achieve coverage of each area of ​​the bottom of the rail.

[0091] The inspection of the bottom of rail 6 primarily focuses on detecting transverse cracks. Since ultrasonic transverse waves are more sensitive to cracks, a longitudinal wave angle probe is used for detection via waveform conversion. Considering the current status of rail 6 inspection, the center frequency of ultrasonic probe 0 is selected as 2.5MHz. A three-element combination is employed to find the appropriate deflection angle of the element at the bottom of rail 6, achieving coverage of different inspection areas. During the simulation, the probe element size is set to 12mm × 12mm, and a combination of K1 and K2 angled element probes is used to inspect the bottom of rail 6. In ultrasonic testing methods, there are many methods for modeling the radiated sound field of ultrasonic probe 0. The purpose of this simulation is to explore the coverage range of the main sound beam of ultrasonic probe 0. Therefore, the width of the probe element is chosen as the width of the main sound beam to simplify the simulation process, while also exploring the influence of different deflection angles on the sound beam coverage range.

[0092] By simulating the coverage range of ultrasonic beams at different deflection angles, when the deflection angle between the crystal and rail 6 in the longitudinal direction (length direction) is less than 25°, there is a blind zone in the detection of the bottom of rail 6, mainly because the sound waves cannot radiate to the corner area of ​​rail 6. When the crystal is at an angle greater than 65°, because the upper surface of rail 6 bottom is composed of a combination of flat and curved surfaces, the probe bottom surface cannot completely contact the surface of rail 6, and its placement will be greatly restricted. At this time, when the sound beam is incident on the transverse crack at the bottom of rail 6, the contact area between the sound wave and the defect is very small, and the sensitivity and detection effect of transverse crack detection are reduced. Therefore, the deflection angle should not be too large. When the crystal tilt angle is 45°, it can ensure the sensitivity to defects and minimize the blind zone. Therefore, 45° is preferred when selecting the deflection angle between the crystal and rail 6 in the longitudinal direction. To achieve coverage of different detection areas, the detection range of each crystal is shown in [reference needed]. Figure 1 and Figure 6 ,in Figure 6 a is a schematic diagram of the placement position of the K1 chip with a 0° deflection. Figure 6 b is a schematic diagram of the wafer coverage area of ​​the 0° deflection section K1; Figure 6 c is a schematic diagram showing the placement of the K1 chip with a 45° deflection. Figure 6 d represents a schematic diagram of the wafer coverage area at a 45° deflection section K1; Figure 6 e is a schematic diagram showing the placement of the K2 chip with a 45° deflection. Figure 6 f is a schematic diagram of the coverage area of ​​the K2 wafer at a 45° deflection section; area A is detected by the K1 oblique wafer parallel to the longitudinal direction of rail 6, area B is detected by the K1 oblique wafer at a 45° deflection, and area C is detected by the K2 oblique wafer at a 45° deflection. When detecting areas B and C, the detection areas of the two oblique incident probes overlap, which further ensures the effective detection of defects in these areas.

[0093] Example 2

[0094] See Figures 7-15The present invention also provides a detection device, including an ultrasonic probe 0 for detecting the bottom of a service rail 6 as described in Embodiment 1, and a detection vehicle 1 that is matched with the rail 6;

[0095] The inspection vehicle 1 includes a frame 11, a flaw detector 2 is provided on the upper part of the frame 11, and an ultrasonic probe 0 is set at the bottom of the frame 11 by a clamping mechanism 3;

[0096] The clamping mechanism 3 includes a clamping hanger 31 connected to the bottom of the frame 11 and two clamping components 32 disposed on opposite sides of the clamping hanger 31. The two clamping components 32 are used to attach the ultrasonic probe 0 to both sides of the rail 6. One end of the clamping component 32 is connected to the clamping hanger 31 through a slidable adjustment structure 33, and the other end is provided with the ultrasonic probe 0. The ultrasonic probe 0 can be operably attached to or lifted away from both sides of the rail 6 through the probe support structure 5.

[0097] The dual-crystal hybrid probe 01 and the tri-crystal hybrid probe 02 of the ultrasonic probe 0 are spaced apart along the extension direction of the rail 6 at the opposite end of the corresponding clamping assembly 32.

[0098] The bottom of the frame 11 is also provided with a spray assembly 4, which is used to spray ultrasonic coupling medium onto the rail 6 so that the ultrasonic probe 0 can perform coupling detection on the bottom of the rail 6.

[0099] In this invention, the ultrasonic probe 0 for detecting the bottom of the in-service rail 6 is mounted on the frame 11 of the inspection vehicle 1 using a clamping assembly 32. One end of the clamping assembly 32 is connected to the clamping hanger 31 via a slidable adjustment structure 33. This arrangement allows the slidable adjustment structure 33 to adjust the tightness of the fit between the ultrasonic probe 0 and the bottom of the rail 6 to be inspected, thereby ensuring that the ultrasonic probe 0 can effectively fit the bottom of the rail 6 to guarantee the inspection effect. In addition, the slidable adjustment structure 33 allows the inspection device provided by this invention to be applicable to rails 6 of different specifications. The opening angle of the two clamping assemblies 32 can be flexibly adjusted according to the rail 6 model and / or manufacturer differences to ensure that the ultrasonic probe 0 can effectively fit the bottom of the rail 6, making this inspection device versatile.

[0100] The ultrasonic probe 0 can be operably attached to or lifted away from both sides of the steel rail 6 via the probe support structure 5. With the probe support structure 5 in place, when the ultrasonic probe 0 reaches the splicing area of ​​the connecting plates of the two steel rails 6, it can be lifted away from the bottom of the steel rail 6 simply by operating the probe support structure 5. After the testing trolley has passed smoothly, the probe support structure 5 can be operated again to lower the ultrasonic probe 0, allowing it to reattach to the bottom of the steel rail 6 for continued testing. The probe support structure 5 facilitates a smooth testing process, ensuring testing efficiency, and also prevents the ultrasonic probe 0 from contacting the connecting plates of the two steel rails 6 and being damaged.

[0101] In a preferred embodiment, the probe support structure 5 includes a probe hanger 51, a probe bracket 52, and a probe hook 53.

[0102] One end of the probe bracket 51 is disposed at the other end of the clamping assembly 32, and one end of the probe support 52 is hinged to the other end of the probe bracket 51. The other end of the probe support 52 is provided with the ultrasound probe 0. The probe support 52 is provided with a hanging shaft 54 ​​for the probe hook 53 to be engaged at its hinged end. Correspondingly, the probe hook 53 is disposed on the probe bracket 51. Specifically, the probe hook 53 is disposed on the side of the probe bracket 51 by screws and a first torsion spring. The probe hook 53 includes a hook body and a lever disposed on the hook body. The lever is provided to facilitate moving the hook body to a suitable position so that the hanging shaft 54 ​​on the probe support 52 can be easily engaged in the slot of the hook body.

[0103] The probe bracket 52 includes two bent parts 55 arranged parallel to each other at intervals, and a mounting part 56 for mounting the ultrasonic probe 0;

[0104] The hanging shaft 54 ​​is disposed between the two bent parts 55 and connects the two bent parts 55 into one piece; one end of the bent part 55 is hinged to the other end of the probe hanger 51 through a pin and a second torsion spring; the mounting part 56 is disposed at the other end of the bent part 55; the dual-crystal hybrid probe 01 or the triple-crystal hybrid probe 02 is rotatably disposed within the mounting space of the mounting part 56; the rotatable arrangement of the dual-crystal hybrid probe 01 or the triple-crystal hybrid probe 02 gives the ultrasonic probe 0 a certain degree of floating ability, which can better fit the bottom of the rail 6;

[0105] Alternatively, the probe support structure 5 includes a probe hanger 51, a probe bracket 52, and a telescopic power source. One end of the probe hanger 51 is located at the other end of the clamping assembly 32, and one end of the probe bracket 52 is hinged to the other end of the probe hanger 51. The other end of the probe bracket 52 is where the ultrasound probe 0 is located. The telescopic end of the telescopic power source is connected to the probe bracket 52 away from its hinge end, and the telescopic end away from its telescopic end is connected to the probe hanger 51. Preferably, the telescopic power source is a miniature cylinder or a miniature electric cylinder.

[0106] Specifically, the probe bracket 52 includes two bent pieces 55 arranged parallel to each other at intervals, and a mounting piece 56 for mounting the ultrasonic probe 0;

[0107] A hanging shaft 54 ​​is provided between the two bent parts 55, and the two bent parts 55 are connected into one piece; one end of the bent part 55 is hinged to the other end of the probe hanger 51 through a pin and a second torsion spring, and the mounting part 56 is provided at the other end of the bent part 55. The dual-crystal hybrid probe 01 or the triple-crystal hybrid probe 02 is rotatably disposed in the mounting space of the mounting part 56.

[0108] In this embodiment, the telescopic power is a miniature cylinder. The telescopic end of the miniature cylinder is connected to the hanging shaft 54. The telescopic end of the miniature cylinder is fixedly mounted on the probe hanger 51. By controlling the telescopic movement of the miniature cylinder, the dual-crystal hybrid probe 01 or the triple-crystal hybrid probe 02 can be lifted away from or attached to the bottom of the rail 6. The telescopic power setting facilitates control and enables automatic control.

[0109] In a preferred embodiment, the clamping assembly 32 includes a clamping frame 34, one end of which is provided with a first arc-shaped groove 341;

[0110] The slidable adjustment structure 33 includes a first arc-shaped groove 341, a connecting bolt 331, and a rolling sleeve 332. The rolling sleeve 332 is sleeved on the outside of the connecting bolt 331. The connecting bolt 331 passes through the first arc-shaped groove 341 and is connected to the clamping hanger 31. The rolling sleeve 332 is slidably in contact with the first arc-shaped groove 341. The rolling sleeve 332 and the first arc-shaped groove 341 facilitate the adjustment of the opening angle and clamping lever arm length of the two relatively arranged clamping frames 34. Specifically, it is only necessary to loosen the corresponding connecting bolt 331, adjust the required opening angle and / or clamping lever arm of the two relatively arranged clamping frames, and then tighten the connecting bolt 331 to fix the current position. The operation is convenient.

[0111] In this embodiment, each of the first arc-shaped grooves 341 is provided with two connecting bolts 331. Correspondingly, the clamping hanger 31 is provided with two threaded holes on both sides. Specifically, the two threaded holes on one side of the clamping hanger 31 are used to fix the connecting bolts 331 corresponding to the clamping assembly 32 on one side, and the two threaded holes on the other side of the clamping hanger 31 are used to fix the connecting bolts 331 corresponding to the clamping assembly 32 on the other side.

[0112] In a preferred embodiment, the clamping frame 34 includes a transverse support 342 and two arc-shaped members 343 spaced apart on the transverse support 342, each of the arc-shaped members 343 being provided with the first arc-shaped groove 341;

[0113] Two clamping frames 34 are arranged opposite each other on both sides of the clamping hanger 31.

[0114] In a preferred embodiment, the spray assembly 4 includes a nozzle 41, a pipe 42 connected to the nozzle 41, and an ultrasonic coupling medium container 43 connected to the pipe 42.

[0115] The nozzle 41 is disposed on the mounting component 56, adjacent to the ultrasonic probe 0; the ultrasonic coupling medium container 43 (not shown in the drawing) is disposed on the frame 11;

[0116] Specifically, each of the dual-crystal hybrid probes 01 or the triple-crystal hybrid probes 02 is provided with a nozzle 41, and each nozzle 41 is connected to a pipe 42. The ultrasonic coupling medium container 43 provides ultrasonic coupling medium to each nozzle 41 so as to ensure that the medium is adequately sprayed onto the bottom of the rail 6.

[0117] To verify the feasibility of using this testing device for comprehensive inspection of the bottom of rail 6, and to verify the ability of the improved rail 6 flaw detection vehicle to detect defects in the bottom of rail 6, artificial defects were set on standard rail 6, and the modified rail 6 bottom flaw detection vehicle was used to detect these artificial defects. The ultrasonic probe 0 used was one of the ultrasonic probes 0 disclosed in Example 1 for inspecting the bottom of in-service rail 6, and its performance was tested. The center frequency range of each probe crystal was 2.3–2.6 MHz, the relative bandwidth of the -6 dB band was approximately 60%, and the energy excited by the probe also maintained good consistency.

[0118] Ultrasonic testing of rail base defects was conducted on an actual rail (6), which is a 60kg / m standard rail (according to Chinese standards). Since there is currently no standard for detecting rail base defects in rail (6), the designed defects were primarily based on common damage scenarios. Transverse cracks were incorporated into the bottom of the rail (see [reference needed]). Figure 16 ,in, Figure 16 Image 'a' shows a physical picture of a 60kg / m standard steel rail (model 6). Figure 16 b is a photograph of the defective 60kg / m rail 6. Figure 16 Four defects were manually marked in section b, all of which were transverse cracks, arranged in this order from the bottom edge of rail 6 to the middle of the bottom. The transverse cracks were 5mm x 1mm in length and width, and 2mm in depth; detailed defect parameters are shown in Table 1.

[0119] Four artificial defects were detected, and the results are shown below. Figure 17 ,in Figure 17 a is the waveform of defect number 1 detected by the dual-crystal hybrid probe 01. Figure 17 b is the waveform diagram of defect No. 2 detected by the three-crystal hybrid probe 02;

[0120] Figure 17 c shows the waveform of defect No. 3 detected by the triple crystal hybrid probe 02; Figure 17 Figure d shows the waveform of defect #4 detected by the three-crystal hybrid probe 02. When detecting different defects, the gain setting of the flaw detector 2 is different. Because the distance between the defect and the probe varies when detecting different defects, the propagation distance of the ultrasonic wave in the rail 6 differs, resulting in varying attenuation of the echo signal for each defect. Therefore, different gains are used to ensure effective defect detection. Since the sound beam radiated by the actual ultrasonic probe 0 has a certain diffusion angle, one defect may be detected by multiple probes; only the optimal detection result is shown here.

[0121] Table 1 Detailed parameters of defects (mm)

[0122]

[0123] The detection results of defect No. 1 using the dual-crystal hybrid probe 01 are shown below. Figure 17 a. Because the defect is close to the track angle, only this probe can detect it, and the defect echo can only be displayed when the defect is present.

[0124] The three-crystal hybrid probe 02 can detect defects 2-4. The corresponding detection results are shown below. Figure 17 b— Figure 17 d. The initial wave exists in the detection results and may interfere with the judgment of defects, but the presence or absence of defect signals can be used to determine whether a defect exists.

[0125] The test results show that the rail bottom flaw detector 2 can successfully detect four transverse cracks, verifying the feasibility of using this detection device to comprehensively detect defects at the bottom of rail 6.

[0126] Example 3

[0127] The present invention also provides a detection method for a detection device as described in Embodiment 2, the steps of which include:

[0128] S1. The dual-crystal hybrid probe 01 and the tri-crystal hybrid probe 02 are respectively positioned on both sides of the rail 6; the sliding adjustment structure 33 is adjusted so that the ultrasonic probes 0 for detecting the bottom of the service rail 6 on both sides of the rail 6 are attached to the bottom of the rail 6; preferably, the first preset angle and the second preset angle of the dual-crystal hybrid probe 01 are both set to 45°; the third preset angle is set to 15°; the fourth preset angle of the tri-crystal hybrid probe 02 is set to 45°, and the fifth preset angle is set to 0°;

[0129] S2. Start the inspection vehicle 1, flaw detector 2 and spray assembly 4. The inspection vehicle 1 drives the ultrasonic probe 0 to perform inspection along the extension direction of the rail 6.

[0130] The three-crystal hybrid probe 02, which is set on both sides of the rail 6, detects the first detection blind zone on both sides of the bottom of the rail 6, and the dual-crystal hybrid probe 01 detects the second detection blind zone on both sides of the bottom of the rail 6.

[0131] When the testing vehicle 1 travels to the splicing point of the rail 6, it lifts both the three-crystal hybrid probe 02 and the two-crystal hybrid probe 01 until it passes the splicing point. Then, it lowers the three-crystal hybrid probe 02 and the two-crystal hybrid probe 01 and aligns them with both sides of the rail 6 to continue the testing.

[0132] The detection method provided by the present invention, through the clamping mechanism 3 to properly attach the ultrasonic probe 0 to the bottom of the rail 6, and the setting that the ultrasonic probe 0 can be lifted, can not only realize the stable operation of the ultrasonic probe 0 on the detection device at the detectable position on the bottom of the rail to detect defects, but also lift the ultrasonic probe 0 when it travels to the splicing area of ​​the connecting plates of the two rails 6, thereby avoiding damage to the ultrasonic probe 0.

[0133] The above are merely preferred embodiments of the present invention and do not limit the patent scope of the present invention. Any equivalent structural transformations made using the contents of the present invention's specification and drawings under the inventive concept of the present invention, or direct or indirect applications in other related technical fields, are within the patent protection scope of the present invention.

Claims

1. A detection device, characterized in that, The application relates to a kind of ultrasonic probe for detecting the rail bottom of service rail and a detection vehicle matched with the rail; The detection vehicle comprises a frame, an ultrasonic detector is arranged on the upper part of the frame, and the ultrasonic probe is arranged on the bottom of the frame through a clamping mechanism; The clamping mechanism comprises a clamping hanger connected with the bottom of the frame, two clamping components arranged on the opposite sides of the clamping hanger, and the two clamping components are used to arrange the ultrasonic probe on the two sides of the rail; one end of the clamping component is connected with the clamping hanger through a slidable adjusting structure, and the other end is provided with the ultrasonic probe; The ultrasonic probe comprises a double-crystal hybrid probe and a three-crystal hybrid probe, and the two probes are arranged on the corresponding clamping components away from the slidable end along the extension direction of the rail through a probe support structure, so that the ultrasonic probe can be operatively attached to or lifted from the two sides of the rail; The three-crystal hybrid probe is used to detect the first detection blind area of the rail bottom, and the double-crystal hybrid probe is used to detect the second detection blind area of the rail bottom; The double-crystal hybrid probe comprises a first shell, a first wafer component and a second wafer component arranged on the inner bottom of the first shell; The first wafer component comprises a first wafer and a first wafer seat for arranging the first wafer; The second wafer component comprises a second wafer and a second wafer seat for arranging the second wafer; The plane where the first wafer is located is 40-50 DEG with the longitudinal extension plane of the rail, and the plane where the second wafer is located is 40-50 DEG with the longitudinal extension plane of the rail; the plane where the first wafer is located and the plane where the second wafer is located are 10-20 DEG; The three-crystal hybrid probe comprises a second shell, a third wafer component and a double wafer component arranged on the inner bottom of the second shell, The third wafer component comprises a third wafer and a third wafer seat for arranging the third wafer; The double wafer component comprises a double wafer arranged side by side and a fourth wafer seat for arranging the double wafer; The plane where the third wafer is located is 40-50 DEG with the longitudinal extension plane of the rail, and the plane where the double wafer is located is -5-5 DEG with the longitudinal extension plane of the rail; the plane where the third wafer is located and the plane where the double wafer are located are a sixth preset angle; The probe support structure comprises a probe hanger, a probe support and a probe hook, One end of the probe hanger is arranged on the other end of the clamping component, one end of the probe support is hinged to the other end of the probe hanger, and the other end of the probe support is provided with the ultrasonic probe; the probe support is provided with a hook shaft for clamping the probe hook away from the hinged end, and correspondingly, the probe hook is arranged on the probe hanger; Alternatively, the probe support structure comprises a probe hanger, a probe support and a telescopic power, one end of the probe hanger is arranged on the other end of the clamping component, one end of the probe support is hinged to the other end of the probe hanger, and the other end of the probe support is provided with the ultrasonic probe; the telescopic end of the telescopic power is connected with the probe support away from the hinged end, and the other end is connected with the probe hanger. The bottom of the frame is also provided with a spraying assembly for spraying ultrasonic coupling medium on the rail, so that the ultrasonic probe couples with the rail bottom for detection.

2. The detection device of claim 1, wherein, The probe support comprises two bending pieces arranged in parallel at intervals, and a mounting piece for mounting the ultrasonic probe; The hanging shaft is arranged between the two bending pieces and connects the two bending pieces into one body; the mounting piece is arranged at the end of the probe support away from the hinged end, and the double-crystal mixed probe or the triple-crystal mixed probe is rotatably arranged in the mounting space of the mounting piece.

3. A detection device according to claim 1 or 2, characterised in that The clamping assembly comprises a clamping frame, one end of the clamping frame is provided with a first arc-shaped sliding groove; The slidable adjusting structure comprises the first arc-shaped sliding groove, a connecting bolt and a rolling sleeve, the rolling sleeve is sleeved outside the connecting bolt, the connecting bolt is connected with the clamping hanger through the first arc-shaped sliding groove, and the rolling sleeve is in slidable contact with the first arc-shaped sliding groove.

4. The detection device of claim 3, wherein, The clamping frame comprises a transverse support and two arc-shaped pieces arranged at intervals on the transverse support, and the first arc-shaped sliding groove is arranged on each arc-shaped piece.

5. A method of detecting a device as claimed in any one of claims 1 to 4, characterized by The steps include: S1, the double-crystal mixed probe and the triple-crystal mixed probe are arranged on the two sides of the rail respectively; the slidable adjusting structure is adjusted so that the ultrasonic probes for detecting the rail bottom on the two sides of the service rail are attached to the rail bottom; S2, start the detection vehicle, the flaw detector and the spraying assembly, the detection vehicle drives the ultrasonic probe to detect along the extension direction of the rail; The triple-crystal mixed probe arranged on the two sides of the rail detects the first detection blind area on the two sides of the rail bottom, and the double-crystal mixed probe detects the second detection blind area on the two sides of the rail bottom; When the detection vehicle travels to the joint of the rail, the triple-crystal mixed probe and the double-crystal mixed probe are lifted until passing through the joint, and then the triple-crystal mixed probe and the double-crystal mixed probe are put down and attached to the two sides of the rail to continue the detection.

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