A method and system for testing the stability accuracy of an optoelectronic pod based on stability performance analysis

Abstract

The present invention relates to the field of optoelectronic pod testing technology, and is a method and system for testing the stability accuracy of an optoelectronic pod based on stability performance analysis, comprising: within an effective test duration, using an optoelectronic pod to be tested to shoot a test target board to obtain a test target board image set, extracting test target board images in the test target board image set in sequence, converting the test target board image into a grayscale target board image, performing rectangular cutting on the grayscale target board image to obtain a cut target board image, determining the test center coordinates based on the cut target board image, calculating the offset of the optoelectronic pod to be tested according to the test center coordinates to obtain an optical axis offset angle, performing azimuth offset analysis on the optoelectronic pod to be tested to obtain an azimuth offset angle group, summarizing the optical axis offset angle and the azimuth offset angle group to obtain a stability performance information set, and obtaining a stability accuracy test table according to the stability performance information set. The present invention can improve the accuracy and versatility of the stability accuracy test of the optoelectronic pod.

Description

Technical Field

[0001] The present invention relates to the technical field of photoelectric pod testing, and in particular to a photoelectric pod stability accuracy testing method and system based on stability performance analysis. Background Art

[0002] The optoelectronic pod is a highly integrated optoelectronic reconnaissance device. It can be carried on aerial platforms such as airplanes, helicopters, and drones. It uses high-definition imaging equipment to conduct long-distance and large-scale observations of ground targets. The stability and accuracy of the optoelectronic pod will affect the imaging effect of the optoelectronic pod. Therefore, it is of great significance to conduct stability and accuracy tests on the optoelectronic pod.

[0003] At present, the stability and accuracy test of the optoelectronic pod is mainly achieved by detecting the inertial sensors in the optoelectronic pod with a spectrum analyzer. Although this method can complete the stability and accuracy test of the optoelectronic pod, it cannot intuitively reflect the image jitter, which makes the test results less versatile. In addition, since there are many precision optical components in the optoelectronic pod, this method will be interfered by the optical components, resulting in a low accuracy rate of the test results. Summary of the invention

[0004] The present invention provides a method and system for testing the stability accuracy of an optoelectronic pod based on stability performance analysis, the main purpose of which is to improve the accuracy and versatility of the stability accuracy test of the optoelectronic pod.

[0005] To achieve the above purpose, the present invention provides a method for testing the stability accuracy of an optoelectronic pod based on stability effectiveness analysis, comprising:

[0006] Receiving a precision test instruction, and starting a pre-built optoelectronic pod to be tested based on the precision test instruction, wherein the optoelectronic pod to be tested is built into a precision test platform, and the precision test platform further includes: a test target plate and a moving vehicle, and the optoelectronic pod to be tested is placed in the moving vehicle, and the moving vehicle can move in six directions;

[0007] During the preset effective test time, the test target plate is photographed by the photoelectric pod to be tested to obtain a test target plate image set, wherein the optical axis of the photoelectric pod to be tested and the center of the test target plate are in the same plane, and the running vehicle will vibrate in six directions during the test time;

[0008] Extracting test target images in the test target image set in sequence, and converting the test target images into grayscale target images, wherein the background of the test target image is white and there is a circular black spot in the center of the test target image;

[0009] Performing rectangular cutting on the grayscale target plate image to obtain a cut target plate image, and determining the test center coordinates based on the cut target plate image, wherein the cut target plate image includes a complete circular black spot;

[0010] Calculate the offset of the optoelectronic pod to be tested according to the test center coordinates to obtain the optical axis offset angle;

[0011] Performing azimuth offset analysis on the optoelectronic pod to be tested to obtain an azimuth offset angle group, wherein the azimuth offset angle group includes: an additional transverse axis offset angle and an additional longitudinal axis offset angle;

[0012] Summarizing the optical axis offset angle and the azimuth offset angle group to obtain a stable performance information set, wherein the stable performance information set includes: an optical axis offset angle set and an azimuth offset angle group set;

[0013] According to the stability performance information set, a stability accuracy analysis is performed on the optoelectronic pod to be tested, a stability accuracy test table is obtained, and a stability accuracy test of the optoelectronic pod based on the stability performance analysis is completed.

[0014] Optionally, photographing the test target board using the photoelectric pod to be tested to obtain a test target board image set includes:

[0015] Recording the current test start time, and starting the motion vehicle based on the test start time;

[0016] Using the photoelectric pod to be tested to photograph a test target plate to obtain a vibration photographed image, and determining whether the vibration photographed image is a valid vibration image;

[0017] If the vibration-captured image is not a valid vibration image, returning to the step of recording the current test start time;

[0018] If the vibration captured image is a valid vibration image, the vibration direction and vibration amplitude of the moving vehicle at the start of the test are identified, and the effective vibration image is marked with the vibration direction and vibration amplitude to obtain a test target plate image;

[0019] Record the current test end time, calculate the current test duration based on the test start time and the test end time, and calculate the current cumulative duration based on the current test duration and the preset historical cumulative duration, wherein the current test duration and the current cumulative duration are respectively expressed as:

[0020] ;

[0021] in, Indicates the current test duration. Indicates the end time of the test. Indicates the test start time. Indicates the current cumulative duration. Indicates the historical accumulation time;

[0022] Using the current cumulative duration to update the historical cumulative duration, and returning to the step of recording the current test start time, until the current cumulative duration is not less than the effective test duration;

[0023] The test target plate images are aggregated to obtain a test target plate image set.

[0024] Optionally, converting the test target plate image into a grayscale target plate image comprises:

[0025] Performing noise filtering on the test target plate image to obtain a denoised target plate image, wherein the noise filtering method is a Gaussian filtering method;

[0026] Extract denoised pixels in the denoised target image in sequence, identify the RGB pixel values ​​of the denoised pixels, and set the RGB coefficients, wherein the RGB coefficients include: R coefficient, G coefficient and B coefficient, and the RGB pixel value is expressed as:

[0027] ;

[0028] in, Represents RGB pixel value, represents the red pixel value, represents the green pixel value, Represents the blue pixel value;

[0029] The RGB pixel value is gray-converted based on the RGB coefficient to obtain a gray-scale pixel value, wherein the gray-scale pixel value is expressed as:

[0030] ;

[0031] in, represents the grayscale pixel value, represents the R coefficient, represents the G factor, represents the B coefficient;

[0032] The denoised pixel points are updated using the grayscale pixel values ​​to obtain grayscale pixel points, the grayscale pixel points are summarized to obtain a grayscale pixel point set, and the denoised target plate image is updated using the grayscale pixel point set to obtain a grayscale target plate image.

[0033] Optionally, performing rectangular cutting on the grayscale target plate image to obtain a cut target plate image includes:

[0034] Identify the lower left vertex, long side and short side of the cutting target plate image, record the lower left vertex, long side and short side as the coordinate origin, coordinate horizontal axis and coordinate vertical axis respectively, and add the coordinate system to the cutting target plate image according to the coordinate origin, coordinate horizontal axis and coordinate vertical axis to obtain the coordinate target plate image;

[0035] Extracting coordinate axis points in the coordinate target plate image in sequence, wherein the coordinate axis points are pixel points on the horizontal axis and the vertical axis, wherein the coordinate axis points include: horizontal axis points and vertical axis points;

[0036] Identifying a conjugate axis point group of the coordinate axis point in the coordinate target plate image, wherein the conjugate axis point and the coordinate axis point have the same non-zero coordinate value;

[0037] The main axis grayscale value of the coordinate axis point and the conjugate grayscale value group of the conjugate axis point group are respectively identified, and the single axis grayscale total value is calculated based on the main axis grayscale value and the conjugate grayscale value group, wherein the single axis grayscale total value is expressed as:

[0038] ;

[0039] in, Represents the total gray value of the single axis, represents the gray value of the main axis, It represents the number of conjugate gray values ​​in the conjugate gray value group. represents the i-th conjugate gray value;

[0040] Extracting the non-zero coordinate value of the coordinate axis point, performing key value pairing on the non-zero coordinate value and the single-axis grayscale total value to obtain a single-axis grayscale group, wherein the non-zero coordinate value includes: a non-zero horizontal axis coordinate value and a non-zero vertical axis coordinate value;

[0041] Summarizing the single-axis grayscale groups to obtain a horizontal-axis single-axis grayscale group set and a vertical-axis single-axis grayscale group set, and drawing a horizontal-axis grayscale curve and a vertical-axis grayscale curve based on the horizontal-axis single-axis grayscale group set and the vertical-axis single-axis grayscale group set respectively;

[0042] Respectively identifying the extreme horizontal axis inflection point of the horizontal axis grayscale curve and the extreme vertical axis inflection point of the vertical axis grayscale curve, wherein the extreme horizontal axis inflection point includes: the maximum horizontal axis inflection point and the minimum horizontal axis inflection point, and the extreme vertical axis inflection point includes: the maximum vertical axis inflection point and the minimum vertical axis inflection point;

[0043] Based on the maximum horizontal axis inflection point, the minimum horizontal axis inflection point, the maximum vertical axis inflection point and the minimum vertical axis inflection point, a cutting pixel point group is obtained, wherein the cutting pixel point group includes four pixel points, and the coordinates of the four pixel points are respectively expressed as:

[0044] ;

[0045] in, represents the abscissa of the point of minimum horizontal axis inflection, represents the abscissa of the point of minimum vertical axis inflection, represents the abscissa of the point of maximum horizontal axis inflection, The abscissa represents the point of maximum vertical axis inflection;

[0046] According to the cutting pixel point group, rectangular cutting is performed on the coordinate target plate image to obtain a cutting target plate image.

[0047] Optionally, determining the test center coordinates based on the cut target plate image includes:

[0048] Performing edge detection on the cutting target plate image to obtain a black spot contour map, wherein the edge detection method is a Sobel algorithm;

[0049] Identify a target black spot contour in the black spot contour image, and extract a black spot pixel point set of the target black spot contour, wherein the black spot pixel points in the black spot pixel point set represent the target black spot contour;

[0050] Obtaining a black spot coordinate point set of the black spot pixel point set, extracting black spot coordinate points in the black spot coordinate point set in sequence, and identifying a neighboring coordinate point group of the black spot coordinate point in the black spot coordinate point set, wherein the neighboring coordinate point group includes two neighboring coordinate points, and the neighboring coordinate point and the black spot coordinate point are connected in a black spot contour map;

[0051] Respectively obtain the black spot gray value of the black spot coordinate point and the neighboring gray value group of the neighboring coordinate point group;

[0052] Calculating a black spot confidence value according to the black spot gray value and a neighboring gray value group, and determining whether the black spot confidence value is less than a preset standard confidence value;

[0053] If the black spot confidence value is not less than the standard confidence value, the black spot gray value is subjected to median smoothing to obtain a smoothed gray value, wherein the smoothed gray value is expressed as:

[0054] ;

[0055] in, Represents smooth grayscale value;

[0056] Using the smoothed grayscale value to update the black spot grayscale value, and returning to the step of calculating the black spot confidence value according to the black spot grayscale value and the neighboring grayscale value group;

[0057] If the black spot confidence value is less than the standard confidence value, the black spot coordinate point is recorded as the target black spot coordinate point;

[0058] Summarizing the target dark spot coordinate points to obtain a target dark spot coordinate point set, and identifying a target abscissa value set and a target ordinate value set of the target dark spot coordinate point set;

[0059] According to the target abscissa value set and the target ordinate value set, a test abscissa value and a test ordinate value are determined, wherein the test abscissa value and the test ordinate value are respectively expressed as:

[0060] ;

[0061] in, Indicates the test horizontal axis value, Indicates the number of target black spot coordinate points in the target black spot coordinate point set, Indicates Target horizontal coordinate value, Indicates the test ordinate value, Indicates Target ordinate value;

[0062] Based on the test abscissa value and the test ordinate value, the test center coordinates are determined.

[0063] Optionally, calculating the black spot confidence value according to the black spot gray value and the neighboring gray value group includes:

[0064] According to the gray value of the black spot and the gray value group of its neighbors, the gray value of the black spot is calculated using the following formula:

[0065] ;

[0066] in, represents the black spot confidence value, represents the gray value of black spots, Represents the gray value of the jth neighbor.

[0067] Optionally, the calculating the offset of the optoelectronic pod to be tested according to the test center coordinates to obtain the optical axis offset angle includes:

[0068] Querying a standard target plate image of the test target plate, wherein the standard target plate image has a dot mark of a circular black spot;

[0069] Based on the cut target plate image, the standard target plate image is cut to the same size and position to obtain a control target plate image, and the standard dot coordinates of the control target plate image are identified;

[0070] Obtaining the diameter of the circular black spot in the test target plate image and the pixel diameter of the cut target plate image, and measuring the test distance between the test target plate and the optoelectronic pod to be tested;

[0071] According to the standard dot coordinates and the test center coordinates, the coordinate offset is calculated, and based on the coordinate offset, pixel diameter, black spot diameter and test distance, the optical axis offset angle is calculated, wherein the coordinate offset and the optical axis offset angle are respectively expressed as:

[0072] ;

[0073] ;

[0074] in, Indicates the coordinate offset, The horizontal coordinate represents the coordinates of the standard point. The ordinate represents the standard point coordinates, represents the optical axis deviation angle, represents the diameter of the black spot, represents the pixel diameter, Indicates the measured distance.

[0075] Optionally, the performing azimuth offset analysis on the optoelectronic pod to be tested to obtain an azimuth offset angle group includes:

[0076] Querying the shooting focal length of the optoelectronic pod to be tested, obtaining the offset test duration corresponding to the coordinate offset, and determining the number of pixels on the horizontal axis and the number of pixels on the vertical axis in the cutting target plate image;

[0077] The axial offset angle is calculated according to the shooting focal length, the coordinate offset, the offset test duration, the number of horizontal axis pixels and the number of vertical axis pixels, wherein the axial offset angle includes: a horizontal axis offset angle and a vertical axis offset angle, and the horizontal axis offset angle and the vertical axis offset angle are respectively expressed as:

[0078] ;

[0079] ;

[0080] in, represents the horizontal axis offset angle, Indicates the number of pixels on the horizontal axis. Indicates the duration of the offset test. Indicates the shooting focal length. represents pi, represents the longitudinal axis offset angle, Indicates the number of pixels on the vertical axis;

[0081] The stable deviation angle is calculated using the following formula:

[0082] ;

[0083] in, represents the stable deviation angle, represents the inverse tangent function;

[0084] Calculating an additional transverse axis offset angle and an additional longitudinal axis offset angle according to the stable offset angle, the transverse axis offset angle and the longitudinal axis offset angle, wherein the additional transverse axis offset angle is the difference between the stable offset angle and the transverse axis offset angle, and the additional longitudinal axis offset angle is the difference between the stable offset angle and the longitudinal axis offset angle;

[0085] The additional transverse axis offset angle and the additional longitudinal axis offset angle are paired to obtain an azimuth offset angle group.

[0086] Optionally, the stability accuracy analysis is performed on the optoelectronic pod to be tested according to the stability performance information set to obtain a stability accuracy test table, including:

[0087] Extracting optical axis offset angles in sequence from the optical axis offset angle set, identifying the same family azimuth offset angle group corresponding to the optical axis offset angle in the azimuth offset angle group set, wherein the same family azimuth offset angle group and the optical axis offset angle are obtained by analyzing the same test target plate image, and the same family azimuth offset angle group includes: the same family transverse axis offset angle and the same family longitudinal axis offset angle;

[0088] The optical axis weight coefficient and the azimuth weight coefficient are set, and the stable precision factor is calculated using the following formula according to the optical axis weight coefficient, the azimuth weight coefficient, the optical axis offset angle and the same family azimuth offset angle group:

[0089] ;

[0090] in, represents the stable precision factor, represents the optical axis weight coefficient, represents the orientation weight coefficient, represents the maximum value function, represents the horizontal axis offset angle of the same family, It represents the vertical axis deviation angle of the same family;

[0091] Pairing the stability precision factor and the same family azimuth offset angle group to obtain a stability precision information group;

[0092] Querying the same family test target plate image corresponding to the optical axis offset angle, identifying the same family vibration direction and the same family vibration amplitude in the same family test target plate image, pairing the same family vibration direction and the same family vibration amplitude to obtain a test vibration information group;

[0093] Summarizing the test vibration information group and the stable precision information group respectively to obtain a test vibration information group set and a stable precision information group set;

[0094] Based on the test vibration information set and the stable accuracy information set, a stable accuracy test table is drawn, wherein the rows of the stable accuracy test table represent the test vibration information set and the columns represent the stable accuracy information set.

[0095] To achieve the above object, the present invention also provides a photoelectric pod stability accuracy test system based on stability performance analysis, comprising:

[0096] A test instruction receiving module is used to receive a precision test instruction, and start a pre-built optoelectronic pod to be tested based on the precision test instruction, wherein the optoelectronic pod to be tested is built into a precision test platform, and the precision test platform also includes: a test target plate and a moving vehicle, and the optoelectronic pod to be tested is placed in the moving vehicle, and the moving vehicle can move in six directions;

[0097] A test image shooting module is used to shoot the test target board with the photoelectric pod to be tested within a preset effective test time to obtain a test target board image set, wherein the optical axis of the photoelectric pod to be tested and the center of the test target board are in the same plane, and the running vehicle will vibrate in six directions within the test time, and the test target board images are sequentially extracted from the test target board image set, and the test target board images are converted into grayscale target board images, wherein the background of the test target board image is white, and there is a circular black spot in the center of the test target board image;

[0098] A stability performance analysis module is used to perform rectangular cutting on the grayscale target plate image to obtain a cut target plate image, determine the test center coordinates based on the cut target plate image, wherein the cut target plate image contains a complete circular black spot, calculate the offset of the optoelectronic pod to be tested according to the test center coordinates, obtain the optical axis offset angle, perform azimuth offset analysis on the optoelectronic pod to be tested, and obtain an azimuth offset angle group, wherein the azimuth offset angle group includes: an additional horizontal axis offset angle and an additional vertical axis offset angle;

[0099] A test table construction module is used to summarize the optical axis offset angle and the azimuth offset angle group to obtain a stable performance information set, wherein the stable performance information set includes: an optical axis offset angle set and an azimuth offset angle group set. According to the stable performance information set, a stable accuracy analysis is performed on the optoelectronic pod to be tested to obtain a stable accuracy test table.

[0100] In order to solve the above problem, the present invention further provides an electronic device, the electronic device comprising:

[0101] a memory storing at least one instruction; and

[0102] The processor executes the instructions stored in the memory to implement the above-mentioned optoelectronic pod stability accuracy testing method based on stability performance analysis.

[0103] In order to solve the above problems, the present invention also provides a computer-readable storage medium, in which at least one instruction is stored. The at least one instruction is executed by a processor in an electronic device to implement the above-mentioned optoelectronic pod stability accuracy test method based on stability performance analysis.

[0104] In order to solve the problems described in the background technology, the present invention first receives an accuracy test instruction, and based on the accuracy test instruction, starts a pre-built optoelectronic pod to be tested. The accuracy test instruction can ensure the consistency and repeatability of each test. Then, within the effective test time, the optoelectronic pod to be tested is used to shoot the test target board to obtain a test target board image set. By shooting the test target board within the effective test time, the imaging conditions in the actual use environment can be simulated, and the imaging stability of the optoelectronic pod under dynamic conditions can be evaluated, thereby improving the accuracy and versatility of subsequent stable accuracy analysis. Then, the test target board images are sequentially extracted from the test target board image set, and the test target board images are converted into grayscale target board images. This step can reduce the processing complexity of image data through grayscale image processing, while retaining key image feature information, which is convenient for subsequent image analysis and processing. Furthermore, the grayscale target board image is rectangularly cut to obtain a cut target board image, and the test center coordinates are determined based on the cut target board image. Through rectangular cutting, a cut target board image containing a complete circular black spot can be obtained. , which helps to accurately locate and analyze specific areas in the image, provides accurate reference points for subsequent image analysis, improves stability accuracy analysis and reduces the complexity of image processing. According to the test center coordinates, the offset of the photoelectric pod to be tested is calculated to obtain the optical axis offset angle. This step accurately measures the visual axis stability of the photoelectric pod. By calculating the optical axis offset angle, the accuracy and reliability of the photoelectric pod in actual use can be evaluated. At the same time, the azimuth offset analysis of the photoelectric pod to be tested is performed to obtain an azimuth offset angle group. The acquisition of the azimuth offset angle group helps to evaluate the stability performance of the photoelectric pod in terms of center of gravity adjustment. More judgment conditions are added to the optical axis offset angle, which improves the accuracy of the stability accuracy test. Finally, the optical axis offset angle and the azimuth offset angle group are summarized to obtain a stability performance information set. According to the stability performance information set, the stability accuracy of the photoelectric pod to be tested is analyzed to obtain a stability accuracy test table. The construction of the stability accuracy test table enables relevant personnel to evaluate the stability accuracy of the photoelectric pod to be tested under various vibration conditions, which improves the versatility of the accuracy test. Therefore, the present invention can improve the accuracy and versatility of the stability accuracy test of the photoelectric pod. BRIEF DESCRIPTION OF THE DRAWINGS

[0105] Figure 1 A schematic flow chart of a method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis provided by an embodiment of the present invention;

[0106] Figure 2A functional module diagram of a photoelectric pod stability accuracy test system based on stability effectiveness analysis provided by an embodiment of the present invention;

[0107] Figure 3 A schematic diagram of the structure of an electronic device for implementing the electro-optical pod stability accuracy testing method based on stability effectiveness analysis provided in one embodiment of the present invention.

[0108] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0109] It should be understood that the specific embodiments described herein are only used to explain the present invention, and are not used to limit the present invention.

[0110] The embodiment of the present application provides a method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis. The execution subject of the method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis includes but is not limited to at least one of the electronic devices such as a server and a terminal that can be configured to execute the method provided in the embodiment of the present application. In other words, the method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis can be executed by software or hardware installed on a terminal device or a server device, and the software can be a blockchain platform. The server includes but is not limited to: a single server, a server cluster, a cloud server or a cloud server cluster, etc.

[0111] Reference Figure 1 FIG. 1 is a flow chart of a method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis according to an embodiment of the present invention. In this embodiment, the method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis includes:

[0112] S1. Receive a precision test instruction, and start a pre-built optoelectronic pod to be tested based on the precision test instruction, wherein the optoelectronic pod to be tested is built into a precision test platform, and the precision test platform also includes: a test target plate and a motion vehicle, and the optoelectronic pod to be tested is placed in the motion vehicle, and the motion vehicle can move in six directions.

[0113] It can be understood that the accuracy test instruction refers to an instruction manually initiated to perform a stable accuracy test on the optoelectronic pod to be tested, and the optoelectronic pod to be tested refers to an optoelectronic pod that needs to be tested for stable accuracy, wherein the optoelectronic pod is a device installed on an aircraft, such as an airplane, helicopter, drone, etc., for performing reconnaissance, surveillance and other tasks. The optoelectronic pod has photo and video recording functions, and can track, record and monitor distant targets under all-weather conditions.

[0114] It is understandable that the test target board refers to the shooting target used to be photographed by the optoelectronic pod to be tested. In order to analyze the shooting results later, the image on the test target board should have strong contrast and simple pattern, for example: a circular black spot in the center of a white background. The moving vehicle refers to a vehicle with a vibration function, for example: a metal plate-shaped platform equipped with a vibration motor. The running vehicle can vibrate in six directions: up, down, left, right, front and back, so as to simulate the actual working environment of the optoelectronic pod to be tested.

[0115] For example, Xiao Zhang is a staff member of an optoelectronic laboratory. One day, Xiao Zhang needs to perform a stability accuracy test on an optoelectronic pod to be tested. So Xiao Zhang correctly installs the optoelectronic pod to be tested on the accuracy test platform, and sends an accuracy test instruction to the optoelectronic pod to be tested through computer software. The optoelectronic pod to be tested completes the startup after receiving the accuracy test instruction.

[0116] S2. Within a preset effective test duration, the test target plate is photographed using the optoelectronic pod to be tested to obtain a test target plate image set, wherein the optical axis of the optoelectronic pod to be tested and the center of the test target plate are in the same plane, and the running vehicle will vibrate in six directions during the test duration.

[0117] It can be understood that the effective test duration refers to the duration of testing the optoelectronic pod to be tested, which is set manually, and the test target board image set refers to the images of the test target board taken by the optoelectronic pod to be tested.

[0118] In detail, the method of photographing the test target board using the photoelectric pod to be tested to obtain a test target board image set includes:

[0119] Recording the current test start time, and starting the motion vehicle based on the test start time;

[0120] Using the photoelectric pod to be tested to photograph a test target plate to obtain a vibration photographed image, and determining whether the vibration photographed image is a valid vibration image;

[0121] If the vibration-captured image is not a valid vibration image, returning to the step of recording the current test start time;

[0122] If the vibration captured image is a valid vibration image, the vibration direction and vibration amplitude of the moving vehicle at the start of the test are identified, and the effective vibration image is marked with the vibration direction and vibration amplitude to obtain a test target plate image;

[0123] Record the current test end time, calculate the current test duration based on the test start time and the test end time, and calculate the current cumulative duration based on the current test duration and the preset historical cumulative duration, wherein the current test duration and the current cumulative duration are respectively expressed as:

[0124] ;

[0125] in, Indicates the current test duration. Indicates the end time of the test. Indicates the test start time. Indicates the current cumulative duration. Indicates the historical accumulation time;

[0126] Using the current cumulative duration to update the historical cumulative duration, and returning to the step of recording the current test start time, until the current cumulative duration is not less than the effective test duration;

[0127] The test target plate images are aggregated to obtain a test target plate image set.

[0128] It should be explained that the test start time refers to the time when the stability accuracy test of the optoelectronic pod to be tested begins, and the vibration image refers to the image obtained by the optoelectronic pod to be tested of the test target plate. Since the optoelectronic pod to be tested will have unclear images under the vibration of the running vehicle, it is necessary to perform simple manual recognition of the vibration image. When relevant personnel determine that the vibration image is unclear, the vibration image will be discarded, and the duration of the shooting will not be included in the final current cumulative duration.

[0129] It is clear that the vibration direction refers to the current vibration direction of the moving vehicle, the vibration amplitude refers to the displacement of the current vibration of the moving vehicle, and the test target plate image includes the vibration direction and vibration amplitude when the effective vibration image is captured. The test end time refers to the time when the test target plate is completed once for image capture, the current test duration refers to the duration of this test target plate capture, the historical cumulative duration is the duration of the capture before this capture, when this image capture is the first time to capture the target plate, the historical cumulative duration is 0, and the current cumulative duration refers to the duration of the current capture.

[0130] For example, Xiao Zhang sets the test duration to 10s, and records the current 20min 20s as the test start time and starts the motion vehicle. At the same time, he uses the optoelectronic pod to be tested to shoot the test target plate and obtains a vibration shot image. After observing the vibration shot image, Xiao Zhang finds that the central circular black spot of the image is blurred to a large extent, which will cause a large deviation for subsequent image processing. Therefore, Xiao Zhang does not record the vibration shot image as a valid shot image, re-records the current test time, and repeats the above steps.

[0131] S3, extracting test target images in the test target image set in sequence, and converting the test target images into grayscale target images, wherein the background of the test target image is white, and there is a circular black spot in the center of the test target image.

[0132] It can be understood that the grayscale target image refers to the test target image after grayscale conversion. Since the pixel information of the grayscale image is less than that of the color image, the processing speed will be faster during the subsequent image processing.

[0133] In detail, the converting the test target plate image into a grayscale target plate image includes:

[0134] Performing noise filtering on the test target plate image to obtain a denoised target plate image, wherein the noise filtering method is a Gaussian filtering method;

[0135] Extract denoised pixels in the denoised target image in sequence, identify the RGB pixel values ​​of the denoised pixels, and set the RGB coefficients, wherein the RGB coefficients include: R coefficient, G coefficient and B coefficient, and the RGB pixel value is expressed as:

[0136] ;

[0137] in, Represents RGB pixel value, represents the red pixel value, represents the green pixel value, Represents the blue pixel value;

[0138] The RGB pixel value is gray-converted based on the RGB coefficient to obtain a gray-scale pixel value, wherein the gray-scale pixel value is expressed as:

[0139] ;

[0140] in, represents the grayscale pixel value, represents the R coefficient, represents the G factor, represents the B coefficient;

[0141] The denoised pixel points are updated using the grayscale pixel values ​​to obtain grayscale pixel points, the grayscale pixel points are summarized to obtain a grayscale pixel point set, and the denoised target plate image is updated using the grayscale pixel point set to obtain a grayscale target plate image.

[0142] It can be understood that the denoised target plate image refers to the test target plate image after noise filtering. Since the optoelectronic pod to be tested will be disturbed by vibration during shooting, the vibration interference will cause partial blurring of the test target plate image. In order to make the subsequent image processing more accurate, it is necessary to denoise the test target plate image. The denoising method is Gaussian filtering. Gaussian filtering can smooth the test target plate image and reduce image noise. At the same time, this method can retain the main features of the test target plate image. The denoised pixel points refer to the pixel points in the denoised target plate image.

[0143] It can be understood that the RGB pixel value refers to the pixel value of the denoised pixel in the RGB color space, and the R coefficient, G coefficient and B coefficient refer to the sensitivity coefficients of the human eye to red, green and blue respectively. The RGB coefficient can be obtained by consulting relevant literature or set manually, for example: the R coefficient, G coefficient and B coefficient are set to 0.299, 0.587 and 0.114 respectively. The grayscale pixel refers to the denoised pixel after the grayscale pixel value is updated, and the pixel value of the grayscale pixel is the grayscale pixel value.

[0144] S4, performing rectangular cutting on the grayscale target plate image to obtain a cut target plate image, and determining the test center coordinates based on the cut target plate image, wherein the cut target plate image contains a complete circular black spot.

[0145] It can be understood that the cut target plate image refers to the grayscale target plate image after cutting. Since the grayscale target plate image contains a large number of white background areas, and these white background areas will increase the calculation amount of subsequent image analysis and affect the efficiency of the test, these white background areas need to be cut to the greatest extent. The test center coordinates refer to the center coordinates of the circular black spots in the cut target plate image.

[0146] In detail, the rectangular cutting of the grayscale target plate image to obtain the cut target plate image includes:

[0147] Identify the lower left vertex, long side and short side of the cutting target plate image, record the lower left vertex, long side and short side as the coordinate origin, coordinate horizontal axis and coordinate vertical axis respectively, and add the coordinate system to the cutting target plate image according to the coordinate origin, coordinate horizontal axis and coordinate vertical axis to obtain the coordinate target plate image;

[0148] Extracting coordinate axis points in the coordinate target plate image in sequence, wherein the coordinate axis points are pixel points on the horizontal axis and the vertical axis, wherein the coordinate axis points include: horizontal axis points and vertical axis points;

[0149] Identifying a conjugate axis point group of the coordinate axis point in the coordinate target plate image, wherein the conjugate axis point and the coordinate axis point have the same non-zero coordinate value;

[0150] The main axis grayscale value of the coordinate axis point and the conjugate grayscale value group of the conjugate axis point group are respectively identified, and the single axis grayscale total value is calculated based on the main axis grayscale value and the conjugate grayscale value group, wherein the single axis grayscale total value is expressed as:

[0151] ;

[0152] in, Represents the total gray value of the single axis, represents the gray value of the main axis, It represents the number of conjugate gray values ​​in the conjugate gray value group. represents the i-th conjugate gray value;

[0153] Extracting the non-zero coordinate value of the coordinate axis point, performing key value pairing on the non-zero coordinate value and the single-axis grayscale total value to obtain a single-axis grayscale group, wherein the non-zero coordinate value includes: a non-zero horizontal axis coordinate value and a non-zero vertical axis coordinate value;

[0154] Summarizing the single-axis grayscale groups to obtain a horizontal-axis single-axis grayscale group set and a vertical-axis single-axis grayscale group set, and drawing a horizontal-axis grayscale curve and a vertical-axis grayscale curve based on the horizontal-axis single-axis grayscale group set and the vertical-axis single-axis grayscale group set respectively;

[0155] Respectively identifying the extreme horizontal axis inflection point of the horizontal axis grayscale curve and the extreme vertical axis inflection point of the vertical axis grayscale curve, wherein the extreme horizontal axis inflection point includes: the maximum horizontal axis inflection point and the minimum horizontal axis inflection point, and the extreme vertical axis inflection point includes: the maximum vertical axis inflection point and the minimum vertical axis inflection point;

[0156] Based on the maximum horizontal axis inflection point, the minimum horizontal axis inflection point, the maximum vertical axis inflection point and the minimum vertical axis inflection point, a cutting pixel point group is obtained, wherein the cutting pixel point group includes four pixel points, and the coordinates of the four pixel points are respectively expressed as:

[0157] ;

[0158] in, represents the abscissa of the point of minimum horizontal axis inflection, represents the abscissa of the point of minimum vertical axis inflection, represents the abscissa of the point of maximum horizontal axis inflection, The abscissa represents the point of maximum vertical axis inflection;

[0159] According to the cutting pixel point group, rectangular cutting is performed on the coordinate target plate image to obtain a cutting target plate image.

[0160] It can be understood that the coordinate target plate image refers to the cutting target plate coordinates after the coordinate system is added, the coordinate horizontal axis point refers to the pixel point located on the horizontal axis of the coordinate system, and the coordinate vertical axis point refers to the pixel point located on the vertical axis of the coordinate system, for example: the pixel point with coordinates (1,0) is the coordinate horizontal axis point, and the pixel point with coordinates (0,1) is the coordinate vertical axis point. The conjugate axis point refers to the pixel point with the same non-zero coordinate value as the coordinate axis point, for example: if the coordinate of a coordinate axis point is (1,0), then the pixel point with coordinates (1,x) is the conjugate axis point of the coordinate axis point, where x is any non-zero integer.

[0161] It should be explained that the main axis grayscale value refers to the grayscale value of the coordinate axis point, the conjugate grayscale value refers to the grayscale value of the conjugate axis point, the single-axis grayscale total value refers to the sum of the main axis grayscale value and all conjugate grayscale values, the non-zero horizontal axis coordinate value refers to the horizontal coordinate value of the coordinate horizontal axis point, for example: the non-zero horizontal axis coordinate value of the coordinate horizontal axis point (1,0) is 1, and the non-zero vertical axis coordinate value refers to the vertical coordinate value of the coordinate vertical axis point, for example: the non-zero vertical axis coordinate value of the coordinate vertical axis point (0,2) is 2. The single-axis grayscale group refers to a combination of non-zero coordinate values ​​and single-axis grayscale total values, the horizontal axis grayscale curve refers to a curve with a horizontal axis of non-zero horizontal axis coordinate values ​​and a vertical axis of single-axis grayscale total values, and the vertical axis grayscale curve refers to a curve with a horizontal axis of non-zero vertical axis coordinate values ​​and a vertical axis of single-axis grayscale total values.

[0162] Furthermore, the maximum horizontal axis inflection point and the minimum horizontal axis inflection point refer to the point with the largest slope and the point with the smallest slope in the horizontal axis grayscale curve, respectively; the maximum vertical axis inflection point and the minimum vertical axis inflection point refer to the point with the largest slope and the point with the smallest slope in the vertical axis grayscale curve, respectively; and the cutting pixel point group refers to the intersection points of the horizontal coordinates of the maximum horizontal axis inflection point, the minimum horizontal axis inflection point, the maximum vertical axis inflection point and the minimum vertical axis inflection point in the coordinate target image.

[0163] For example, the maximum horizontal axis inflection point and the minimum horizontal axis inflection point are (50, 200) and (100, 10), respectively, where 50 and 100 are non-zero horizontal axis coordinate values, 200 and 10 are the grayscale values ​​corresponding to the vertical axis in the horizontal axis grayscale curve, and the maximum vertical axis inflection point and the minimum vertical axis inflection point are (250, 30) and (20, 80), respectively, where 250 and 20 are the grayscale values ​​corresponding to the vertical axis in the vertical axis grayscale curve, and 30 and 80 are non-zero vertical axis coordinate values, and their corresponding cutting pixel point groups are: (50, 30), (50, 80), (100, 30) and (100, 80).

[0164] In detail, the method of determining the test center coordinates based on the cutting target plate image includes:

[0165] Performing edge detection on the cutting target plate image to obtain a black spot contour map, wherein the edge detection method is a Sobel algorithm;

[0166] Identify a target black spot contour in the black spot contour image, and extract a black spot pixel point set of the target black spot contour, wherein the black spot pixel points in the black spot pixel point set represent the target black spot contour;

[0167] Obtaining a black spot coordinate point set of the black spot pixel point set, extracting black spot coordinate points in the black spot coordinate point set in sequence, and identifying a neighboring coordinate point group of the black spot coordinate point in the black spot coordinate point set, wherein the neighboring coordinate point group includes two neighboring coordinate points, and the neighboring coordinate point and the black spot coordinate point are connected in a black spot contour map;

[0168] Respectively obtain the black spot gray value of the black spot coordinate point and the neighboring gray value group of the neighboring coordinate point group;

[0169] Calculating a black spot confidence value according to the black spot gray value and a neighboring gray value group, and determining whether the black spot confidence value is less than a preset standard confidence value;

[0170] If the black spot confidence value is not less than the standard confidence value, the black spot gray value is subjected to median smoothing to obtain a smoothed gray value, wherein the smoothed gray value is expressed as:

[0171] ;

[0172] in, Represents smooth gray value;

[0173] Using the smoothed grayscale value to update the black spot grayscale value, and returning to the step of calculating the black spot confidence value according to the black spot grayscale value and the neighboring grayscale value group;

[0174] If the black spot confidence value is less than the standard confidence value, the black spot coordinate point is recorded as the target black spot coordinate point;

[0175] Summarizing the target dark spot coordinate points to obtain a target dark spot coordinate point set, and identifying a target abscissa value set and a target ordinate value set of the target dark spot coordinate point set;

[0176] According to the target abscissa value set and the target ordinate value set, a test abscissa value and a test ordinate value are determined, wherein the test abscissa value and the test ordinate value are respectively expressed as:

[0177] ;

[0178] in, Indicates the test horizontal axis value, Indicates the number of target black spot coordinate points in the target black spot coordinate point set, Indicates Target horizontal coordinate value, Indicates the test ordinate value, Indicates Target ordinate value;

[0179] Based on the test abscissa value and the test ordinate value, the test center coordinates are determined.

[0180] It can be understood that the black spot contour map refers to a cutting target plate image containing a circular black spot contour, the target black spot contour refers to the specific contour of the circular black spot in the black spot contour map, the black spot coordinate point refers to the coordinate of the black spot pixel point, the neighboring coordinate point refers to the coordinate point adjacent to the black spot coordinate point, the black spot gray value refers to the gray value of the black spot coordinate point, the neighboring gray value refers to the gray value of the neighboring coordinate point, and the black spot confidence refers to a value used to indicate the degree of environmental interference of the black spot gray value, for example: there is a stain on the test target plate, and the stain will cause the black spot gray value to be larger than the actual gray value. The standard confidence value refers to an artificially set constant, the smoothed gray value refers to the black spot gray value after smoothing, the target abscissa value refers to the abscissa of the target black spot coordinate, and the target ordinate value refers to the ordinate of the target black spot coordinate point.

[0181] In detail, the calculating of the black spot confidence value according to the black spot gray value and the neighboring gray value group includes:

[0182] According to the gray value of the black spot and the gray value group of its neighbors, the gray value of the black spot is calculated using the following formula:

[0183] ;

[0184] in, represents the black spot confidence value, represents the gray value of black spots, Represents the gray value of the jth neighbor.

[0185] S5. Calculate the offset of the optoelectronic pod to be tested according to the test center coordinates to obtain the optical axis offset angle.

[0186] It can be understood that the optical axis offset angle refers to the deviation angle between the optical axis of the optoelectronic pod to be tested and the actual circular point of the circular black spot on the test target plate.

[0187] In detail, the offset calculation of the optoelectronic pod to be tested is performed according to the test center coordinates to obtain the optical axis offset angle, including:

[0188] Querying a standard target plate image of the test target plate, wherein the standard target plate image has a dot mark of a circular black spot;

[0189] Based on the cut target plate image, the standard target plate image is cut to the same size and position to obtain a control target plate image, and the standard dot coordinates of the control target plate image are identified;

[0190] Obtaining the diameter of the circular black spot in the test target plate image and the pixel diameter of the cut target plate image, and measuring the test distance between the test target plate and the optoelectronic pod to be tested;

[0191] According to the standard dot coordinates and the test center coordinates, the coordinate offset is calculated, and based on the coordinate offset, pixel diameter, black spot diameter and test distance, the optical axis offset angle is calculated, wherein the coordinate offset and the optical axis offset angle are respectively expressed as:

[0192] ;

[0193] ;

[0194] in, Indicates the coordinate offset, The horizontal coordinate represents the coordinates of the standard point. The ordinate represents the standard point coordinates, represents the optical axis deviation angle, represents the diameter of the black spot, represents the pixel diameter, Indicates the measured distance.

[0195] It can be understood that the standard target plate image refers to the target plate image obtained by artificially photographing at the same position of the optoelectronic pod to be tested and in a static state, and the control target plate image refers to the standard target plate image after cutting. The cutting process, for example: the cut target plate image represents the image of area A in the test target plate, then the image area corresponding to area A is identified in the standard target plate image, and the image area is cut to obtain the control target plate image. The standard dot coordinates refer to the dot coordinates of the circular black spots in the control target plate image. The pixel diameter refers to the diameter of the pixel point in the cut target plate image, and the coordinate offset refers to the numerical value used to represent the degree of offset between the test center coordinates and the standard dot coordinates.

[0196] S6. Performing azimuth offset analysis on the optoelectronic pod to be tested to obtain an azimuth offset angle group, wherein the azimuth offset angle group includes: an additional transverse axis offset angle and an additional longitudinal axis offset angle.

[0197] It can be understood that the azimuth offset angle refers to the offset angle between the position of the optoelectronic pod to be tested and the actual set position when the position is adjusted. Since the optoelectronic pod to be tested continues to shake under the action of the running vehicle, in order to maintain the stability of shooting, the optoelectronic pod to be tested can adjust the shooting center of gravity in real time through the built-in gyro sensor to ensure that the captured target image is a horizontal image, but the adjustment of the shooting center of gravity will cause errors, so that the target image actually captured is not a horizontal image. The azimuth offset angle group can indicate the accuracy of the center of gravity adjustment. The additional horizontal axis offset angle and the additional vertical axis offset angle refer to the azimuth errors of the optoelectronic pod to be tested on the horizontal axis and the vertical axis respectively.

[0198] In detail, the azimuth offset analysis is performed on the optoelectronic pod to be tested to obtain an azimuth offset angle group, including:

[0199] Querying the shooting focal length of the optoelectronic pod to be tested, obtaining the offset test duration corresponding to the coordinate offset, and determining the number of pixels on the horizontal axis and the number of pixels on the vertical axis in the cutting target plate image;

[0200] The axial offset angle is calculated according to the shooting focal length, the coordinate offset, the offset test duration, the number of horizontal axis pixels and the number of vertical axis pixels, wherein the axial offset angle includes: a horizontal axis offset angle and a vertical axis offset angle, and the horizontal axis offset angle and the vertical axis offset angle are respectively expressed as:

[0201] ;

[0202] ;

[0203] in, represents the horizontal axis offset angle, Indicates the number of pixels on the horizontal axis. Indicates the duration of the offset test. Indicates the shooting focal length. represents pi, represents the longitudinal axis offset angle, Indicates the number of pixels on the vertical axis;

[0204] The stable deviation angle is calculated using the following formula:

[0205] ;

[0206] in, represents the stable deviation angle, represents the inverse tangent function;

[0207] Calculating an additional transverse axis offset angle and an additional longitudinal axis offset angle according to the stable offset angle, the transverse axis offset angle and the longitudinal axis offset angle, wherein the additional transverse axis offset angle is the difference between the stable offset angle and the transverse axis offset angle, and the additional longitudinal axis offset angle is the difference between the stable offset angle and the longitudinal axis offset angle;

[0208] The additional transverse axis offset angle and the additional longitudinal axis offset angle are paired to obtain an azimuth offset angle group.

[0209] It can be understood that the offset test duration refers to the current test duration when the coordinate offset is obtained, the horizontal axis pixel number refers to the number of pixels on the horizontal axis in the cutting target plate image, and the vertical axis pixel number refers to the number of pixels on the vertical axis in the cutting target plate image. The horizontal axis pixel number and the vertical axis pixel number represent the size of the cutting target plate image, and the stable offset angle refers to the maximum acceptable offset angle.

[0210] S7 summarizes the optical axis offset angles and the azimuth offset angle groups to obtain a stable performance information set, wherein the stable performance information set includes: an optical axis offset angle set and an azimuth offset angle group set.

[0211] It needs to be explained that for different vibration directions and vibration amplitudes, the optoelectronic pod to be tested has different optical axis offset angles and azimuth offset angle groups. Subsequently, a table used to represent the test results can be drawn based on the optical axis offset angle set and the azimuth offset angle set, as well as their corresponding vibration amplitudes and vibration directions of the moving vehicle.

[0212] S8. According to the stability performance information set, a stability accuracy analysis is performed on the optoelectronic pod to be tested, a stability accuracy test table is obtained, and a stability accuracy test of the optoelectronic pod based on the stability performance analysis is completed.

[0213] It can be understood that the stability accuracy test table refers to a table used to represent the relationship between the optical axis offset angle, the azimuth offset angle and the vibration information of the optoelectronic pod to be tested, wherein the vibration information of the optoelectronic pod to be tested is represented by the vibration direction and vibration amplitude of the moving vehicle.

[0214] In detail, the stability accuracy analysis is performed on the optoelectronic pod to be tested according to the stability performance information set to obtain a stability accuracy test table, including:

[0215] Extracting optical axis offset angles in sequence from the optical axis offset angle set, identifying the same family azimuth offset angle group corresponding to the optical axis offset angle in the azimuth offset angle group set, wherein the same family azimuth offset angle group and the optical axis offset angle are obtained by analyzing the same test target plate image, and the same family azimuth offset angle group includes: the same family transverse axis offset angle and the same family longitudinal axis offset angle;

[0216] The optical axis weight coefficient and the azimuth weight coefficient are set, and the stable precision factor is calculated using the following formula according to the optical axis weight coefficient, the azimuth weight coefficient, the optical axis offset angle and the same family azimuth offset angle group:

[0217] ;

[0218] in, represents the stable precision factor, represents the optical axis weight coefficient, represents the orientation weight coefficient, represents the maximum value function, represents the horizontal axis offset angle of the same family, It represents the vertical axis deviation angle of the same family;

[0219] Pairing the stability precision factor and the same family azimuth offset angle group to obtain a stability precision information group;

[0220] Querying the same family test target plate image corresponding to the optical axis offset angle, identifying the same family vibration direction and the same family vibration amplitude in the same family test target plate image, pairing the same family vibration direction and the same family vibration amplitude to obtain a test vibration information group;

[0221] Summarizing the test vibration information group and the stable precision information group respectively to obtain a test vibration information group set and a stable precision information group set;

[0222] Based on the test vibration information set and the stable accuracy information set, a stable accuracy test table is drawn, wherein the rows of the stable accuracy test table represent the test vibration information set and the columns represent the stable accuracy information set.

[0223] It can be understood that the same family azimuth offset angle group refers to the azimuth offset angle group that represents the same test target image deviation information as the azimuth offset angle, the same family transverse axis offset angle and the same family longitudinal axis offset angle refer to the transverse axis offset angle and the longitudinal axis offset angle in the same family azimuth offset angle group, respectively, the optical axis weight coefficient refers to the constant of the degree of influence of the artificially set optical axis offset angle on the stability accuracy of the optoelectronic pod to be tested, and the azimuth weight coefficient refers to the constant of the degree of influence of the artificially set azimuth offset angle group on the stability accuracy of the optoelectronic pod to be tested. For example, Xiao Wang is the operator of an optoelectronic pod. Xiao Wang believes that the optical axis offset angle has a greater influence on the stability accuracy of the optoelectronic pod to be tested, while the azimuth offset angle group has a smaller influence on the stability accuracy of the optoelectronic pod to be tested. Then, the optical axis weight coefficient and the azimuth weight coefficient can be set to 0.6 and 0.4 respectively. The stability accuracy factor refers to a value used to represent the stability accuracy of the optoelectronic pod to be tested.

[0224] The same family test target plate image refers to the test target plate image corresponding to the same family azimuth offset angle group and azimuth offset angle, and the same family vibration direction and same family vibration amplitude respectively refer to the vibration direction and vibration amplitude represented by the same family test target plate image.

[0225] In order to solve the problems described in the background technology, the present invention first receives an accuracy test instruction, and based on the accuracy test instruction, starts a pre-built optoelectronic pod to be tested. The accuracy test instruction can ensure the consistency and repeatability of each test. Then, within the effective test time, the optoelectronic pod to be tested is used to shoot the test target board to obtain a test target board image set. By shooting the test target board within the effective test time, the imaging conditions in the actual use environment can be simulated, and the imaging stability of the optoelectronic pod under dynamic conditions can be evaluated, thereby improving the accuracy and versatility of subsequent stable accuracy analysis. Then, the test target board images are sequentially extracted from the test target board image set, and the test target board images are converted into grayscale target board images. This step can reduce the processing complexity of image data through grayscale image processing, while retaining key image feature information, which is convenient for subsequent image analysis and processing. Furthermore, the grayscale target board image is rectangularly cut to obtain a cut target board image, and the test center coordinates are determined based on the cut target board image. Through rectangular cutting, a cut target board image containing a complete circular black spot can be obtained. , which helps to accurately locate and analyze specific areas in the image, provides accurate reference points for subsequent image analysis, improves stability accuracy analysis and reduces the complexity of image processing. According to the test center coordinates, the offset of the photoelectric pod to be tested is calculated to obtain the optical axis offset angle. This step accurately measures the visual axis stability of the photoelectric pod. By calculating the optical axis offset angle, the accuracy and reliability of the photoelectric pod in actual use can be evaluated. At the same time, the azimuth offset analysis of the photoelectric pod to be tested is performed to obtain an azimuth offset angle group. The acquisition of the azimuth offset angle group helps to evaluate the stability performance of the photoelectric pod in terms of center of gravity adjustment. More judgment conditions are added to the optical axis offset angle, which improves the accuracy of the stability accuracy test. Finally, the optical axis offset angle and the azimuth offset angle group are summarized to obtain a stability performance information set. According to the stability performance information set, the stability accuracy of the photoelectric pod to be tested is analyzed to obtain a stability accuracy test table. The construction of the stability accuracy test table enables relevant personnel to evaluate the stability accuracy of the photoelectric pod to be tested under various vibration conditions, which improves the versatility of the accuracy test. Therefore, the present invention can improve the accuracy and versatility of the stability accuracy test of the photoelectric pod.

[0226] like Figure 2 , is a functional module diagram of an optoelectronic pod stability accuracy test system based on stability performance analysis provided by an embodiment of the present invention.

[0227] The photoelectric pod stability accuracy test system 100 based on stability performance analysis of the present invention can be installed in an electronic device. According to the functions implemented, the photoelectric pod stability accuracy test system 100 based on stability performance analysis can include a test instruction receiving module 101, a test image shooting module 102, a stability performance analysis module 103 and a test table construction module 104. The module of the present invention can also be called a unit, which refers to a series of computer program segments that can be executed by an electronic device processor and can complete fixed functions, which are stored in the memory of the electronic device.

[0228] The test instruction receiving module 101 is used to receive the precision test instruction, and start the pre-built optoelectronic pod to be tested based on the precision test instruction, wherein the optoelectronic pod to be tested is built into the precision test platform, and the precision test platform also includes: a test target plate and a moving vehicle, and the optoelectronic pod to be tested is placed in the moving vehicle, and the moving vehicle can move in six directions;

[0229] The test image shooting module 102 is used to shoot the test target board with the photoelectric pod to be tested within a preset effective test time to obtain a test target board image set, wherein the optical axis of the photoelectric pod to be tested and the center of the test target board are in the same plane, and the running vehicle will vibrate in six directions within the test time, and the test target board images are sequentially extracted from the test target board image set, and the test target board images are converted into grayscale target board images, wherein the background of the test target board image is white, and there is a circular black spot in the center of the test target board image;

[0230] The stability performance analysis module 103 is used to perform rectangular cutting on the grayscale target plate image to obtain a cut target plate image, determine the test center coordinates based on the cut target plate image, wherein the cut target plate image contains a complete circular black spot, calculate the offset of the optoelectronic pod to be tested according to the test center coordinates, obtain the optical axis offset angle, perform azimuth offset analysis on the optoelectronic pod to be tested, and obtain an azimuth offset angle group, wherein the azimuth offset angle group includes: an additional horizontal axis offset angle and an additional vertical axis offset angle;

[0231] The test table construction module 104 is used to summarize the optical axis offset angle and the azimuth offset angle group to obtain a stable performance information set, wherein the stable performance information set includes: an optical axis offset angle set and an azimuth offset angle group set. According to the stable performance information set, the stability accuracy analysis of the optoelectronic pod to be tested is performed to obtain a stable accuracy test table.

[0232] In detail, the modules in the photoelectric pod stability accuracy test system 100 based on stability performance analysis in the embodiment of the present invention are used in the same manner as above. Figure 1The technical means are the same as the photoelectric pod stability accuracy test method based on stability performance analysis described in, and can produce the same technical effects, so they will not be repeated here.

[0233] like Figure 3 , is a schematic diagram of the structure of an electronic device for implementing a method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis provided by an embodiment of the present invention.

[0234] The electronic device 1 may include a processor 10, a memory 11 and a bus 12, and may also include a computer program stored in the memory 11 and executable on the processor 10, such as a method program for testing the stability accuracy of an optoelectronic pod based on stability performance analysis.

[0235] The memory 11 includes at least one type of readable storage medium, and the readable storage medium includes flash memory, mobile hard disk, multimedia card, card-type memory (for example, SD or DX memory, etc.), magnetic memory, disk, optical disk, etc. The memory 11 may be an internal storage unit of the electronic device 1 in some embodiments, such as a mobile hard disk of the electronic device 1. The memory 11 may also be an external storage device of the electronic device 1 in other embodiments, such as a plug-in mobile hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (SecureDigital, SD) card, a flash card (Flash Card), etc. equipped on the electronic device 1. Further, the memory 11 also includes an internal storage unit of the electronic device 1 and an external storage device. The memory 11 can not only be used to store application software and various types of data installed in the electronic device 1, such as the code of the program of the stability accuracy test method of the optoelectronic pod based on the stability performance analysis, but also can be used to temporarily store the data that has been output or is to be output.

[0236] The processor 10 may be composed of an integrated circuit in some embodiments, for example, a single packaged integrated circuit, or a plurality of packaged integrated circuits with the same or different functions, including one or more central processing units (CPUs), microprocessors, digital processing chips, graphics processors, and combinations of various control chips, etc. The processor 10 is the control core (Control Unit) of the electronic device, and uses various interfaces and lines to connect various components of the entire electronic device, and executes or executes programs or modules stored in the memory 11 (such as a stable accuracy test method program for an optoelectronic pod based on stable performance analysis, etc.), and calls data stored in the memory 11, so as to execute various functions of the electronic device 1 and process data.

[0237] The bus 12 may be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The bus 12 may be divided into an address bus, a data bus, a control bus, etc. The bus 12 is configured to realize connection and communication between the memory 11 and at least one processor 10, etc.

[0238] Figure 3 Only an electronic device with components is shown, and those skilled in the art will understand that Figure 3 The structure shown does not constitute a limitation on the electronic device 1, and may include fewer or more components than shown in the figure, or combine certain components, or arrange the components differently.

[0239] For example, although not shown, the electronic device 1 may also include a power source (such as a battery) for supplying power to various components. Preferably, the power source may be logically connected to the at least one processor 10 through a power management system, so that the power management system can realize functions such as charging management, discharging management, and power consumption management. The power source may also include any components such as one or more DC or AC power sources, recharging systems, power failure detection circuits, power converters or inverters, and power status indicators. The electronic device 1 may also include a variety of sensors, Bluetooth modules, Wi-Fi modules, etc., which will not be repeated here.

[0240] Furthermore, the electronic device 1 may also include a network interface. Optionally, the network interface may include a wired interface and / or a wireless interface (such as a WI-FI interface, a Bluetooth interface, etc.), which is generally used to establish a communication connection between the electronic device 1 and other electronic devices.

[0241] Optionally, the electronic device 1 may further include a user interface, which may be a display, an input unit (such as a keyboard), or a standard wired interface or a wireless interface. Optionally, in some embodiments, the display may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, and an OLED (Organic Light-Emitting Diode) touch device. The display may also be appropriately referred to as a display screen or a display unit, which is used to display information processed in the electronic device 1 and to display a visual user interface.

[0242] The program of the photoelectric pod stability accuracy test method based on stability effectiveness analysis stored in the memory 11 of the electronic device 1 is a combination of multiple instructions. When running in the processor 10, it can achieve:

[0243] Receiving a precision test instruction, and starting a pre-built optoelectronic pod to be tested based on the precision test instruction, wherein the optoelectronic pod to be tested is built into a precision test platform, and the precision test platform further includes: a test target plate and a moving vehicle, and the optoelectronic pod to be tested is placed in the moving vehicle, and the moving vehicle can move in six directions;

[0244] During the preset effective test time, the test target plate is photographed by the photoelectric pod to be tested to obtain a test target plate image set, wherein the optical axis of the photoelectric pod to be tested and the center of the test target plate are in the same plane, and the running vehicle will vibrate in six directions during the test time;

[0245] Extracting test target images in the test target image set in sequence, and converting the test target images into grayscale target images, wherein the background of the test target image is white and there is a circular black spot in the center of the test target image;

[0246] Performing rectangular cutting on the grayscale target plate image to obtain a cut target plate image, and determining the test center coordinates based on the cut target plate image, wherein the cut target plate image includes a complete circular black spot;

[0247] Calculate the offset of the optoelectronic pod to be tested according to the test center coordinates to obtain the optical axis offset angle;

[0248] Performing azimuth offset analysis on the optoelectronic pod to be tested to obtain an azimuth offset angle group, wherein the azimuth offset angle group includes: an additional transverse axis offset angle and an additional longitudinal axis offset angle;

[0249] Summarizing the optical axis offset angle and the azimuth offset angle group to obtain a stable performance information set, wherein the stable performance information set includes: an optical axis offset angle set and an azimuth offset angle group set;

[0250] According to the stability performance information set, a stability accuracy analysis is performed on the optoelectronic pod to be tested, a stability accuracy test table is obtained, and a stability accuracy test of the optoelectronic pod based on the stability performance analysis is completed.

[0251] Specifically, the specific implementation method of the processor 10 for the above instructions can refer to Figures 1 to 3 The description of the relevant steps in the corresponding embodiments will not be repeated here.

[0252] Furthermore, if the module / unit integrated in the electronic device 1 is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. The computer-readable storage medium can be volatile or non-volatile. For example, the computer-readable medium can include: any entity or system that can carry the computer program code, a recording medium, a USB flash drive, a mobile hard disk, a magnetic disk, an optical disk, a computer memory, and a read-only memory (ROM).

[0253] The present invention further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor of an electronic device, the computer program can implement:

[0254] Receiving a precision test instruction, and starting a pre-built optoelectronic pod to be tested based on the precision test instruction, wherein the optoelectronic pod to be tested is built into a precision test platform, and the precision test platform further includes: a test target plate and a moving vehicle, and the optoelectronic pod to be tested is placed in the moving vehicle, and the moving vehicle can move in six directions;

[0255] During the preset effective test time, the test target plate is photographed by the photoelectric pod to be tested to obtain a test target plate image set, wherein the optical axis of the photoelectric pod to be tested and the center of the test target plate are in the same plane, and the running vehicle will vibrate in six directions during the test time;

[0256] Extracting test target images in the test target image set in sequence, and converting the test target images into grayscale target images, wherein the background of the test target image is white and there is a circular black spot in the center of the test target image;

[0257] Performing rectangular cutting on the grayscale target plate image to obtain a cut target plate image, and determining the test center coordinates based on the cut target plate image, wherein the cut target plate image includes a complete circular black spot;

[0258] Calculate the offset of the optoelectronic pod to be tested according to the test center coordinates to obtain the optical axis offset angle;

[0259] Performing azimuth offset analysis on the optoelectronic pod to be tested to obtain an azimuth offset angle group, wherein the azimuth offset angle group includes: an additional transverse axis offset angle and an additional longitudinal axis offset angle;

[0260] Summarizing the optical axis offset angle and the azimuth offset angle group to obtain a stable performance information set, wherein the stable performance information set includes: an optical axis offset angle set and an azimuth offset angle group set;

[0261] According to the stability performance information set, a stability accuracy analysis is performed on the optoelectronic pod to be tested, a stability accuracy test table is obtained, and a stability accuracy test of the optoelectronic pod based on the stability performance analysis is completed.

[0262] In the several embodiments provided by the present invention, it should be understood that the disclosed devices, systems and methods can be implemented in other ways. For example, the system embodiments described above are only illustrative, and actual implementation may have other division methods.

[0263] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0264] In addition, each functional module in each embodiment of the present invention may be integrated into one processing unit, each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of hardware plus software functional modules.

[0265] It is obvious to those skilled in the art that the present invention is not limited to the details of the above exemplary embodiments, and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention.

[0266] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solution of the present invention can be modified or replaced by equivalents without departing from the spirit and scope of the technical solution of the present invention.

Claims

1. A method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis, characterized in that: The method comprises: Receiving a precision test instruction, and starting a pre-built optoelectronic pod to be tested based on the precision test instruction, wherein the optoelectronic pod to be tested is built into a precision test platform, and the precision test platform further includes: a test target plate and a moving vehicle, and the optoelectronic pod to be tested is placed in the moving vehicle, and the moving vehicle can move in six directions; During the preset effective test time, the test target plate is photographed by the photoelectric pod to be tested to obtain a test target plate image set, wherein the optical axis of the photoelectric pod to be tested and the center of the test target plate are in the same plane, and the running vehicle will vibrate in six directions during the test time; Extracting test target images in the test target image set in sequence, and converting the test target images into grayscale target images, wherein the background of the test target image is white and there is a circular black spot in the center of the test target image; Performing rectangular cutting on the grayscale target plate image to obtain a cut target plate image, and determining the test center coordinates based on the cut target plate image, wherein the cut target plate image includes a complete circular black spot; Calculate the offset of the optoelectronic pod to be tested according to the test center coordinates to obtain the optical axis offset angle; Performing azimuth offset analysis on the optoelectronic pod to be tested to obtain an azimuth offset angle group, wherein the azimuth offset angle group includes: an additional transverse axis offset angle and an additional longitudinal axis offset angle; Summarizing the optical axis offset angle and the azimuth offset angle group to obtain a stable performance information set, wherein the stable performance information set includes: an optical axis offset angle set and an azimuth offset angle group set; According to the stability performance information set, a stability accuracy analysis is performed on the optoelectronic pod to be tested, a stability accuracy test table is obtained, and a stability accuracy test of the optoelectronic pod based on the stability performance analysis is completed.

2. The photoelectric pod stability accuracy test method based on stability performance analysis according to claim 1 is characterized in that: The method of photographing the test target board by using the photoelectric pod to be tested to obtain a test target board image set includes: Recording the current test start time, and starting the motion vehicle based on the test start time; Using the photoelectric pod to be tested to photograph a test target plate to obtain a vibration photographed image, and determining whether the vibration photographed image is a valid vibration image; If the vibration-captured image is not a valid vibration image, returning to the step of recording the current test start time; If the vibration captured image is a valid vibration image, the vibration direction and vibration amplitude of the moving vehicle at the start of the test are identified, and the effective vibration image is marked with the vibration direction and vibration amplitude to obtain a test target plate image; Record the current test end time, calculate the current test duration based on the test start time and the test end time, and calculate the current cumulative duration based on the current test duration and the preset historical cumulative duration, wherein the current test duration and the current cumulative duration are respectively expressed as: ； in, Indicates the current test duration. Indicates the end time of the test. Indicates the test start time. Indicates the current cumulative duration. Indicates the historical accumulation time; Using the current cumulative duration to update the historical cumulative duration, and returning to the step of recording the current test start time, until the current cumulative duration is not less than the effective test duration; The test target plate images are aggregated to obtain a test target plate image set.

3. The photoelectric pod stability accuracy test method based on stability performance analysis as claimed in claim 2 is characterized in that: The step of converting the test target plate image into a grayscale target plate image comprises: Performing noise filtering on the test target plate image to obtain a denoised target plate image, wherein the noise filtering method is a Gaussian filtering method; Extract denoised pixels in the denoised target image in sequence, identify the RGB pixel values ​​of the denoised pixels, and set the RGB coefficients, wherein the RGB coefficients include: R coefficient, G coefficient and B coefficient, and the RGB pixel value is expressed as: ； in, Represents RGB pixel value, represents the red pixel value, represents the green pixel value, Represents the blue pixel value; The RGB pixel value is gray-converted based on the RGB coefficient to obtain a gray-scale pixel value, wherein the gray-scale pixel value is expressed as: ； in, represents the grayscale pixel value, represents the R coefficient, represents the G factor, represents the B coefficient; The denoised pixel points are updated using the grayscale pixel values ​​to obtain grayscale pixel points, the grayscale pixel points are summarized to obtain a grayscale pixel point set, and the denoised target plate image is updated using the grayscale pixel point set to obtain a grayscale target plate image.

4. The method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis as claimed in claim 3, characterized in that: The rectangular cutting of the grayscale target plate image to obtain the cut target plate image includes: Identify the lower left vertex, long side and short side of the cutting target plate image, record the lower left vertex, long side and short side as the coordinate origin, coordinate horizontal axis and coordinate vertical axis respectively, and add the coordinate system to the cutting target plate image according to the coordinate origin, coordinate horizontal axis and coordinate vertical axis to obtain the coordinate target plate image; Extracting coordinate axis points in the coordinate target plate image in sequence, wherein the coordinate axis points are pixel points on the horizontal axis and the vertical axis, wherein the coordinate axis points include: horizontal axis points and vertical axis points; Identifying a conjugate axis point group of the coordinate axis point in the coordinate target plate image, wherein the conjugate axis point and the coordinate axis point have the same non-zero coordinate value; The main axis grayscale value of the coordinate axis point and the conjugate grayscale value group of the conjugate axis point group are respectively identified, and the single axis grayscale total value is calculated based on the main axis grayscale value and the conjugate grayscale value group, wherein the single axis grayscale total value is expressed as: ； in, Represents the total gray value of the single axis, represents the gray value of the main axis, It represents the number of conjugate gray values ​​in the conjugate gray value group. represents the i-th conjugate gray value; Extracting the non-zero coordinate value of the coordinate axis point, performing key value pairing on the non-zero coordinate value and the single-axis grayscale total value to obtain a single-axis grayscale group, wherein the non-zero coordinate value includes: a non-zero horizontal axis coordinate value and a non-zero vertical axis coordinate value; Summarizing the single-axis grayscale groups to obtain a horizontal-axis single-axis grayscale group set and a vertical-axis single-axis grayscale group set, and drawing a horizontal-axis grayscale curve and a vertical-axis grayscale curve based on the horizontal-axis single-axis grayscale group set and the vertical-axis single-axis grayscale group set respectively; Respectively identifying the extreme horizontal axis inflection point of the horizontal axis grayscale curve and the extreme vertical axis inflection point of the vertical axis grayscale curve, wherein the extreme horizontal axis inflection point includes: the maximum horizontal axis inflection point and the minimum horizontal axis inflection point, and the extreme vertical axis inflection point includes: the maximum vertical axis inflection point and the minimum vertical axis inflection point; Based on the maximum horizontal axis inflection point, the minimum horizontal axis inflection point, the maximum vertical axis inflection point and the minimum vertical axis inflection point, a cutting pixel point group is obtained, wherein the cutting pixel point group includes four pixel points, and the coordinates of the four pixel points are respectively expressed as: ； in, represents the abscissa of the point of minimum horizontal axis curvature, represents the abscissa of the point of minimum vertical axis inflection, represents the abscissa of the point of maximum horizontal axis inflection, The abscissa represents the point of maximum vertical axis inflection; According to the cutting pixel point group, rectangular cutting is performed on the coordinate target plate image to obtain a cutting target plate image.

5. The method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis according to claim 4, characterized in that: The method of determining the test center coordinates based on the cutting target plate image includes: Performing edge detection on the cutting target plate image to obtain a black spot contour map, wherein the edge detection method is a Sobel algorithm; Identify a target black spot contour in the black spot contour image, and extract a black spot pixel point set of the target black spot contour, wherein the black spot pixel points in the black spot pixel point set represent the target black spot contour; Obtaining a black spot coordinate point set of the black spot pixel point set, extracting black spot coordinate points in the black spot coordinate point set in sequence, and identifying a neighboring coordinate point group of the black spot coordinate point in the black spot coordinate point set, wherein the neighboring coordinate point group includes two neighboring coordinate points, and the neighboring coordinate point and the black spot coordinate point are connected in a black spot contour map; Respectively obtain the black spot gray value of the black spot coordinate point and the neighboring gray value group of the neighboring coordinate point group; Calculating a black spot confidence value according to the black spot gray value and a neighboring gray value group, and determining whether the black spot confidence value is less than a preset standard confidence value; If the black spot confidence value is not less than the standard confidence value, the black spot gray value is subjected to median smoothing to obtain a smoothed gray value, wherein the smoothed gray value is expressed as: ； in, Represents smooth gray value; Using the smoothed grayscale value to update the black spot grayscale value, and returning to the step of calculating the black spot confidence value according to the black spot grayscale value and the neighboring grayscale value group; If the black spot confidence value is less than the standard confidence value, the black spot coordinate point is recorded as the target black spot coordinate point; Summarizing the target dark spot coordinate points to obtain a target dark spot coordinate point set, and identifying a target abscissa value set and a target ordinate value set of the target dark spot coordinate point set; According to the target abscissa value set and the target ordinate value set, a test abscissa value and a test ordinate value are determined, wherein the test abscissa value and the test ordinate value are respectively expressed as: ； in, Indicates the test horizontal axis value, Indicates the number of target black spot coordinate points in the target black spot coordinate point set, Indicates Target horizontal coordinate value, Indicates the test ordinate value, Indicates Target ordinate value; Based on the test abscissa value and the test ordinate value, the test center coordinates are determined.

6. The method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis according to claim 5, characterized in that: The step of calculating the black spot confidence value according to the black spot gray value and the neighboring gray value group includes: According to the gray value of the black spot and the gray value group of its neighbors, the gray value of the black spot is calculated using the following formula: ； in, represents the black spot confidence value, represents the gray value of black spots, Represents the gray value of the jth neighbor.

7. The method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis according to claim 6, characterized in that: The method of calculating the offset of the photoelectric pod to be tested according to the test center coordinates to obtain the optical axis offset angle includes: Querying a standard target plate image of the test target plate, wherein the standard target plate image has a dot mark of a circular black spot; Based on the cut target plate image, the standard target plate image is cut to the same size and position to obtain a control target plate image, and the standard dot coordinates of the control target plate image are identified; Obtaining the diameter of the circular black spot in the test target plate image and the pixel diameter of the cut target plate image, and measuring the test distance between the test target plate and the optoelectronic pod to be tested; According to the standard dot coordinates and the test center coordinates, the coordinate offset is calculated, and based on the coordinate offset, pixel diameter, black spot diameter and test distance, the optical axis offset angle is calculated, wherein the coordinate offset and the optical axis offset angle are respectively expressed as: ； ； in, Indicates the coordinate offset, The horizontal coordinate represents the coordinates of the standard point. The ordinate represents the standard point coordinates, represents the optical axis deviation angle, represents the diameter of the black spot, represents the pixel diameter, Indicates the measured distance.

8. The method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis according to claim 7, characterized in that: The azimuth offset analysis of the optoelectronic pod to be tested is performed to obtain an azimuth offset angle group, including: Querying the shooting focal length of the optoelectronic pod to be tested, obtaining the offset test duration corresponding to the coordinate offset, and determining the number of pixels on the horizontal axis and the number of pixels on the vertical axis in the cutting target plate image; The axial offset angle is calculated according to the shooting focal length, the coordinate offset, the offset test duration, the number of horizontal axis pixels and the number of vertical axis pixels, wherein the axial offset angle includes: a horizontal axis offset angle and a vertical axis offset angle, and the horizontal axis offset angle and the vertical axis offset angle are respectively expressed as: ； ； in, represents the horizontal axis offset angle, Indicates the number of pixels on the horizontal axis. Indicates the duration of the offset test. Indicates the shooting focal length. represents pi, represents the longitudinal axis offset angle, Indicates the number of pixels on the vertical axis; The stable deviation angle is calculated using the following formula: ； in, represents the stable deviation angle, represents the inverse tangent function; Calculating an additional transverse axis offset angle and an additional longitudinal axis offset angle according to the stable offset angle, the transverse axis offset angle and the longitudinal axis offset angle, wherein the additional transverse axis offset angle is the difference between the stable offset angle and the transverse axis offset angle, and the additional longitudinal axis offset angle is the difference between the stable offset angle and the longitudinal axis offset angle; The additional transverse axis offset angle and the additional longitudinal axis offset angle are paired to obtain an azimuth offset angle group.

9. The method for testing the stability accuracy of an optoelectronic pod based on stability performance analysis according to claim 8, characterized in that: According to the stable performance information set, the stable accuracy analysis is performed on the photoelectric pod to be tested to obtain a stable accuracy test table, including: Extracting optical axis offset angles in sequence from the optical axis offset angle set, identifying the same family azimuth offset angle group corresponding to the optical axis offset angle in the azimuth offset angle group set, wherein the same family azimuth offset angle group and the optical axis offset angle are obtained by analyzing the same test target plate image, and the same family azimuth offset angle group includes: the same family transverse axis offset angle and the same family longitudinal axis offset angle; The optical axis weight coefficient and the azimuth weight coefficient are set, and the stable precision factor is calculated using the following formula according to the optical axis weight coefficient, the azimuth weight coefficient, the optical axis offset angle and the same family azimuth offset angle group: ； in, represents the stable precision factor, represents the optical axis weight coefficient, represents the orientation weight coefficient, represents the maximum value function, represents the horizontal axis offset angle of the same family, It represents the vertical axis deviation angle of the same family; Pairing the stability precision factor and the same family azimuth offset angle group to obtain a stability precision information group; Querying the same family test target plate image corresponding to the optical axis offset angle, identifying the same family vibration direction and the same family vibration amplitude in the same family test target plate image, pairing the same family vibration direction and the same family vibration amplitude to obtain a test vibration information group; Summarizing the test vibration information group and the stable precision information group respectively to obtain a test vibration information group set and a stable precision information group set; Based on the test vibration information set and the stable accuracy information set, a stable accuracy test table is drawn, wherein the rows of the stable accuracy test table represent the test vibration information set and the columns represent the stable accuracy information set.

10. An optoelectronic pod stability accuracy test system based on stability performance analysis, characterized in that: The system comprises: A test instruction receiving module is used to receive a precision test instruction, and start a pre-built optoelectronic pod to be tested based on the precision test instruction, wherein the optoelectronic pod to be tested is built into a precision test platform, and the precision test platform also includes: a test target plate and a moving vehicle, and the optoelectronic pod to be tested is placed in the moving vehicle, and the moving vehicle can move in six directions; A test image shooting module is used to shoot the test target board with the photoelectric pod to be tested within a preset effective test time to obtain a test target board image set, wherein the optical axis of the photoelectric pod to be tested and the center of the test target board are in the same plane, and the running vehicle will vibrate in six directions within the test time, and the test target board images are sequentially extracted from the test target board image set, and the test target board images are converted into grayscale target board images, wherein the background of the test target board image is white, and there is a circular black spot in the center of the test target board image; A stability performance analysis module is used to perform rectangular cutting on the grayscale target plate image to obtain a cut target plate image, determine the test center coordinates based on the cut target plate image, wherein the cut target plate image contains a complete circular black spot, calculate the offset of the optoelectronic pod to be tested according to the test center coordinates, obtain the optical axis offset angle, perform azimuth offset analysis on the optoelectronic pod to be tested, and obtain an azimuth offset angle group, wherein the azimuth offset angle group includes: an additional horizontal axis offset angle and an additional vertical axis offset angle; A test table construction module is used to summarize the optical axis offset angle and the azimuth offset angle group to obtain a stable performance information set, wherein the stable performance information set includes: an optical axis offset angle set and an azimuth offset angle group set. According to the stable performance information set, a stable accuracy analysis is performed on the optoelectronic pod to be tested to obtain a stable accuracy test table.

Images