Method, system, medium and equipment for measuring leakage magnetic eddy current loss of nanocrystalline core

Abstract

Disclosed are a method, system, medium, and device for measuring the leakage magnetic eddy current loss of a nanocrystalline core. The secondary winding of a nanocrystalline core high-frequency transformer is short-circuited, and the two terminals of an impedance measuring instrument are clamped on the primary winding of the transformer. The impedance measuring instrument is used to measure the AC resistance of the high-frequency transformer under short-circuit conditions. R ac,nano , select a ferrite core and winding with the same structure and size as the nanocrystalline iron core high-frequency transformer to form a ferrite core high-frequency transformer with the same structure and size, and use an impedance measuring instrument to measure the AC resistance of the ferrite core transformer under short-circuit conditions R ac,ferrite , Nanocrystalline core high frequency transformer calculates the leakage flux distribution of nanocrystalline core high frequency transformer under short circuit conditions, and calculates the magnetic loss density of nanocrystalline core and then integrates it to obtain the total magnetic loss of nanocrystalline core P c,nano ; The leakage magnetic eddy current loss of the nanocrystalline iron core high frequency transformer is obtained by the difference method.

Description

Technical Field

[0001] The present invention relates to the technical field of nanocrystalline iron core high-frequency transformer measurement, and in particular to a method, system, medium and equipment for measuring magnetic leakage eddy current loss of a nanocrystalline iron core. Background Art

[0002] The main components of a high-frequency transformer include the core and windings. The losses of a high-frequency transformer primarily include core loss and winding loss. Accurately calculating the core loss of a high-frequency transformer is crucial for efficiency evaluation and heat dissipation design. Nanocrystalline cores are made of wound nanocrystalline strips. During actual operation, the normal leakage flux on the core surface induces large eddy currents in the nanocrystalline strips, generating leakage eddy current losses. For nanocrystalline core high-frequency transformers, core loss includes not only traditional magnetic losses but also leakage eddy current losses. Eddy current losses are a significant component of nanocrystalline core loss, making accurate measurement of the core's leakage eddy current losses crucial.

[0003] The traditional two-winding open-circuit method is widely used to measure core loss. This method opens the transformer's secondary winding, applies voltage excitation to the primary winding, measures the primary winding current waveform and the secondary winding voltage waveform, and calculates the core loss by multiplying and integrating the secondary voltage and primary current waveforms. However, this traditional two-winding open-circuit method only measures the core's magnetic loss and cannot measure the magnitude of the leakage eddy current loss. Using an infrared thermal imager to measure the temperature distribution of a nanocrystalline core high-frequency transformer under short-circuit conditions only qualitatively indicates the presence of leakage eddy current loss, but cannot quantitatively measure it. Currently, no method exists for quantitatively measuring the leakage eddy current loss in nanocrystalline cores.

[0004] The above information disclosed in this Background section is only for enhancement of understanding of the background of the invention and therefore it may contain information that does not form the prior art that is already known to a person of ordinary skill in the art. Summary of the Invention

[0005] In view of the deficiencies in the prior art, the purpose of the present invention is to provide a method, system, medium and equipment for measuring the leakage magnetic eddy current loss of nanocrystalline cores, so as to achieve quantitative measurement of the leakage magnetic eddy current loss.

[0006] In order to achieve the above object, the present invention provides the following technical solutions:

[0007] A method for measuring magnetic leakage eddy current loss in a nanocrystalline core of a high-frequency transformer according to the present invention comprises:

[0008] Short-circuit the secondary winding of the nanocrystalline iron core high-frequency transformer, clamp the two terminals of the impedance measuring instrument on the primary winding of the transformer, and use the impedance measuring instrument to measure the AC resistance R of the high-frequency transformer under short-circuit conditions. ac,nano , where the AC resistance is composed of the winding AC resistance R w,nano , leakage magnetic eddy current loss equivalent resistance R leakage And the core loss equivalent resistance R c,nano Composition, that is, R ac,nano =R w,nano +R leakage +R c,nano ;

[0009] A ferrite core and winding having the same structure and size as the nanocrystalline core and winding of the nanocrystalline core high-frequency transformer are selected to form a ferrite core high-frequency transformer having the same structure and size. The secondary winding of the ferrite core high-frequency transformer is short-circuited, and the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer. The AC resistance R of the ferrite core transformer under short-circuit conditions is measured using the impedance measuring instrument. ac,ferrite , where the AC resistance R ac,ferrite Only the winding AC resistance R of the ferrite core high-frequency transformer w,ferrite , that is, R ac,ferrite =R w,ferrite The leakage magnetic field distribution in the core window of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same. The winding AC resistance of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same, and R w,nano =R w,ferrite =R ac,ferrite ;

[0010] Nanocrystalline core high frequency transformer calculates the leakage flux distribution of nanocrystalline core high frequency transformer under short circuit conditions, and calculates the magnetic loss density of nanocrystalline core and then integrates it to obtain the total magnetic loss P of nanocrystalline core. c,nano ; Then the leakage magnetic eddy current loss of the nanocrystalline iron core high frequency transformer is obtained by the difference method.

[0011] In the method, finite element simulation software is used to calculate the leakage flux distribution of the nanocrystalline iron core high frequency transformer under short-circuit conditions.

[0012] In the method described, the finite element simulation software is COMSOL Multiphysics, Ansys or Maxwell.

[0013] In the method described, the Steinmetz formula is used to calculate the magnetic loss density of the nanocrystalline core.

[0014] A high-frequency transformer nanocrystalline core leakage magnetic eddy current loss measurement system, comprising:

[0015] Impedance measuring instrument, which is used for: When the secondary winding of the nanocrystalline iron core high-frequency transformer is short-circuited, the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer to measure the AC resistance R of the high-frequency transformer under short-circuit conditions ac,nano , where the AC resistance is composed of the winding AC resistance R w,nano , leakage magnetic eddy current loss equivalent resistance R leakage And the core loss equivalent resistance R c,nano Composition, that is, R ac,nano =R w,nano +R leakage +R c,nano ;

[0016] A ferrite core high-frequency transformer, whose ferrite core and winding have the same structure and size as the nanocrystalline core and winding of the nanocrystalline core high-frequency transformer, is used to: when the secondary winding of the ferrite core high-frequency transformer is short-circuited, the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer, and the impedance measuring instrument is used to measure the AC resistance R of the ferrite core transformer under short-circuit conditions. ac,ferrite , where the AC resistance R ac,ferrite Only the winding AC resistance R of the ferrite core high-frequency transformer w,ferrite , that is, R ac,ferrite =R w,ferrite The leakage magnetic field distribution in the core window of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same. The winding AC resistance of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same, and R w,nano =R w,ferrite =R ac,ferrite ;

[0017] The calculation unit is used to calculate the leakage flux distribution of the nanocrystalline core high-frequency transformer under short-circuit conditions, and calculate the magnetic loss density of the nanocrystalline core and then integrate it to obtain the total magnetic loss P of the nanocrystalline core. c,nano ; Then the leakage magnetic eddy current loss of the nanocrystalline iron core high frequency transformer is obtained by the difference method.

[0018] In the system, the ferrite core high frequency transformer has the same structure and size as the nanocrystalline core high frequency transformer.

[0019] In the system, the calculation unit includes a finite element simulation unit for calculating the leakage flux distribution of the nanocrystalline iron core high frequency transformer under short-circuit conditions.

[0020] In the system, the impedance measuring instrument includes an impedance analyzer or an LCR meter.

[0021] A computer storage medium, wherein the storage medium includes computer instructions, which, when executed on a computer, cause the computer to perform the method described.

[0022] An electronic device, wherein the electronic device comprises:

[0023] A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein:

[0024] When the processor executes the program, the method described is implemented.

[0025] Beneficial effects

[0026] A method for measuring the leakage magnetic eddy current loss of a nanocrystalline core of a high-frequency transformer is disclosed. A ferrite core high-frequency transformer with the same structure and size is constructed, and its AC resistance under short-circuit conditions is measured. Since the loss of the ferrite core is very small and can be ignored, and the leakage magnetic field distribution of the two transformer core windows is the same, the present invention can use the winding AC resistance of the ferrite core high-frequency transformer to approximately replace the winding AC resistance of the nanocrystalline core high-frequency transformer. Furthermore, based on the difference principle, the winding loss and magnetic loss are deducted from the total short-circuit loss of the nanocrystalline core high-frequency transformer, and the winding loss and magnetic loss are deducted from the total short-circuit loss of the nanocrystalline core high-frequency transformer, thereby achieving quantitative measurement of the leakage magnetic eddy current loss.

[0027] The above description is only an overview of the technical solution of the present invention. In order to make the technical means of the present invention clearer and easier to understand, so that those skilled in the art can implement it according to the contents of the specification, and to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the specific embodiments of the present invention are described below by way of example. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments described in the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0029] Various other advantages and benefits of the present invention will become apparent to those skilled in the art upon reading the detailed description of the preferred embodiments below. The accompanying drawings are intended only to illustrate preferred embodiments and are not to be construed as limiting the present invention. It should be understood that the drawings described below are merely examples of the present invention, and that those skilled in the art will be able to derive other drawings from these drawings without inventive effort. Throughout the drawings, identical reference numerals are used to denote identical components.

[0030] In the attached figure:

[0031] Figure 1 This is a schematic diagram of the steps of a method for measuring leakage magnetic eddy current loss in a nanocrystalline core of a high-frequency transformer provided by the present invention.

[0032] The present invention will be further explained below with reference to the accompanying drawings and embodiments. DETAILED DESCRIPTION

[0033] To make the purpose, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0034] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the invention as claimed, but rather merely represents selected embodiments of the present invention. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of the present invention without creative effort are also within the scope of protection of the present invention.

[0035] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, it does not need to be further defined or explained in subsequent drawings.

[0036] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like to indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0037] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature identified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0038] In the present invention, unless otherwise expressly specified or limited, terms such as "mounted," "connected," "connect," and "fixed" should be understood broadly. For example, they may refer to fixed connection, detachable connection, or integration; they may refer to direct connection or indirect connection through an intermediate medium; they may refer to internal communication between two components or interaction between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0039] In the present invention, unless otherwise expressly specified or limited, a first feature being "above" or "below" a second feature may include the first and second features being in direct contact, or may include the first and second features being in contact not directly but through another feature between them. Furthermore, a first feature being "above," "above," and "above" a second feature may include the first feature being directly above or obliquely above the second feature, or may simply mean that the first feature is higher in level than the second feature. A first feature being "below," "below," and "below" a second feature may include the first feature being directly below or obliquely below the second feature, or may simply mean that the first feature is lower in level than the second feature.

[0040] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings, and the accompanying drawings do not constitute a limitation on the embodiments of the present invention.

[0041] In one embodiment, Figure 1 As shown, the present disclosure provides a method for measuring the leakage magnetic eddy current loss of a nanocrystalline core of a high-frequency transformer, comprising the following steps:

[0042] Short-circuit the secondary winding of the nanocrystalline iron core high-frequency transformer, clamp the two terminals of the impedance measuring instrument on the primary winding of the transformer, and use the impedance measuring instrument to measure the AC resistance R of the high-frequency transformer under short-circuit conditions. ac,nano , the AC resistance is composed of the winding AC resistance R w,nano , leakage magnetic eddy current loss equivalent resistance R leakage And the core loss equivalent resistance R c,nano Composition, that is, R ac,nano =R w,nano +R leakage +R c,nano ;

[0043] A ferrite core and winding with the same structure and size as the nanocrystalline core high-frequency transformer are selected to form a ferrite core high-frequency transformer with the same structure and size. The secondary winding of the ferrite core high-frequency transformer is short-circuited, and the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer. The AC resistance R of the ferrite core transformer under short-circuit conditions is measured using the impedance measuring instrument.ac,ferrite , AC resistance R ac,ferrite Only the winding AC resistance R of the ferrite core high-frequency transformer w,ferrite , that is, R ac,ferrite =R w,ferrite The leakage magnetic field distribution in the core window of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same. The winding AC resistance of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same, and R w,nano =R w,ferrite =R ac,ferrite ;

[0044] Nanocrystalline core high frequency transformer calculates the leakage flux distribution of nanocrystalline core high frequency transformer under short circuit conditions, and calculates the magnetic loss density of nanocrystalline core and then integrates it to obtain the total magnetic loss P of nanocrystalline core. c,nano ; Then the leakage magnetic eddy current loss of the nanocrystalline core high frequency transformer is obtained by the difference method:

[0045] P leakage =I 2 (R ac,nano -R ac,ferrite )-P c,nano ,

[0046] Where I is the short-circuit current.

[0047] In a preferred embodiment of the method, the impedance measuring instrument includes an impedance analyzer or an LCR meter.

[0048] In a preferred embodiment of the method, finite element simulation software is used to calculate the leakage flux distribution of the nanocrystalline iron core high frequency transformer under short-circuit conditions.

[0049] In a preferred embodiment of the method, the finite element simulation software is COMSOL Multiphysics, Ansys or Maxwell.

[0050] In a preferred embodiment of the method, the Steinmetz formula is used to calculate the magnetic loss density of the nanocrystalline core.

[0051] In one embodiment, the method includes,

[0052] (1) Short-circuit the secondary winding of the nanocrystalline iron core high-frequency transformer, clamp the two terminals of the impedance measuring instrument (such as impedance analyzer, LCR meter, etc.) on the primary winding of the transformer, and use the impedance measuring instrument to measure the AC resistance R of the nanocrystalline iron core high-frequency transformer under short-circuit conditions. ac,nano The AC resistance consists of three parts, namely the winding AC resistance R w,nano , leakage magnetic eddy current loss equivalent resistance R leakageAnd the core loss equivalent resistance R c,nano . That is R ac,nano =R w,nano +R leakage +R c,nano .

[0053] (2) Select ferrite cores and windings of the same structure and size to form a ferrite core high-frequency transformer with the same structure and size. Short-circuit the secondary winding of the ferrite core high-frequency transformer. Clamp the two terminals of an impedance measuring instrument (such as an impedance analyzer, LCR meter, etc.) on the primary winding of the transformer. Use the impedance measuring instrument to measure the AC resistance R of the ferrite core transformer under short-circuit conditions. ac,ferrite The magnetic loss of the ferrite core under short-circuit conditions is very small and can be ignored, so R ac,ferrite Only the winding AC resistance R of the ferrite core high-frequency transformer w,ferrite , that is, R ac,ferrite =R w,ferrite Since the nanocrystalline core transformer and the ferrite core transformer have the same structural dimensions, the leakage magnetic field distribution in the core windows of the two transformers is the same, the winding AC resistance of the two transformers is the same, and R w,nano =R w,ferrite =R ac,ferrite .

[0054] (3) Use finite element simulation software (such as COMSOL Multiphysics, Ansys, Maxwell, etc.) to calculate the leakage flux distribution of the nanocrystalline core high-frequency transformer under short-circuit conditions, use the Steinmetz formula to calculate the magnetic loss density of the nanocrystalline core, and then integrate to obtain the total magnetic loss P of the nanocrystalline core. c,nano .

[0055] (4) Obtain the leakage eddy current loss P of the nanocrystalline core high-frequency transformer by the difference method leakage =I 2 (R ac,nano -R ac,ferrite )-P c,nano .

[0056] In one embodiment, a system for measuring magnetic flux leakage eddy current loss in a nanocrystalline core of a high-frequency transformer includes:

[0057] Impedance measuring instrument, which is used for: When the secondary winding of the nanocrystalline iron core high-frequency transformer is short-circuited, the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer to measure the AC resistance R of the high-frequency transformer under short-circuit conditions ac,nano , the AC resistance is composed of the winding AC resistance R w,nano , leakage magnetic eddy current loss equivalent resistance R leakage And the core loss equivalent resistance Rc,nano Composition, that is, R ac,nano =R w,nano +R leakage +R c,nano ;

[0058] A ferrite core high-frequency transformer, whose ferrite core and winding have the same structure and size as the nanocrystalline core and winding of the nanocrystalline core high-frequency transformer, is short-circuited on the secondary winding of the ferrite core high-frequency transformer, and the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer. The AC resistance R of the ferrite core transformer under short-circuit conditions is measured using the impedance measuring instrument. ac,ferrite , where the AC resistance R ac,ferrite Only the winding AC resistance R of the ferrite core high-frequency transformer w,ferrite , that is, R ac,ferrite =R w,ferrite The leakage magnetic field distribution in the core window of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same. The winding AC resistance of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same, and R w,nano =R w,ferrite =R ac,ferrite ;

[0059] The calculation unit calculates the leakage flux distribution of the nanocrystalline core high-frequency transformer under short-circuit conditions, calculates the magnetic loss density of the nanocrystalline core, and then integrates it to obtain the total magnetic loss P of the nanocrystalline core. c,nano ; The leakage magnetic eddy current loss of the nanocrystalline core high-frequency transformer is obtained by the difference method:

[0060] P leakage =I 2 (R ac,nano -R ac,ferrite )-P c,nano ,

[0061] Where I is the short-circuit current.

[0062] In the system, the ferrite core high frequency transformer has the same structure and size as the nanocrystalline core high frequency transformer.

[0063] In the system, the calculation unit includes a finite element simulation unit for calculating the leakage flux distribution of the nanocrystalline iron core high frequency transformer under short-circuit conditions.

[0064] In the system, the impedance measuring instrument includes an impedance analyzer or an LCR meter.

[0065] A computer storage medium, wherein the storage medium includes computer instructions, which, when executed on a computer, cause the computer to perform the method described.

[0066] An electronic device, wherein the electronic device comprises:

[0067] A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein:

[0068] When the processor executes the program, the method described is implemented.

[0069] Although the embodiments of the present invention have been described above with reference to the accompanying drawings, the present invention is not limited to the above-mentioned specific embodiments and application fields. The above-mentioned specific embodiments are merely illustrative and instructive, and are not restrictive. A person skilled in the art, guided by this specification and without departing from the scope of protection of the claims of the present invention, may also devise various forms, all of which fall within the scope of protection of the present invention.

Claims

1. A method for measuring the leakage magnetic eddy current loss of a nanocrystalline core of a high-frequency transformer, characterized in that: It includes the following steps: Short-circuit the secondary winding of the nanocrystalline iron core high-frequency transformer, clamp the two terminals of the impedance measuring instrument on the primary winding of the transformer, and use the impedance measuring instrument to measure the AC resistance of the high-frequency transformer under short-circuit conditions. R ac,nano , wherein the AC resistance is composed of the winding AC resistance R w,nano , leakage magnetic eddy current loss equivalent resistance R leakage and core loss equivalent resistance R c,nano Composition, that is R ac,nano = R w,nano + R leakage + R c,nano ; A ferrite core and winding having the same structure and size as the nanocrystalline core and winding of the nanocrystalline core high-frequency transformer are selected to form a ferrite core high-frequency transformer having the same structure and size. The secondary winding of the ferrite core high-frequency transformer is short-circuited, and the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer. The AC resistance of the ferrite core transformer under short-circuit conditions is measured using the impedance measuring instrument. R ac,ferrite , where the AC resistance R ac,ferrite Contains only the winding AC resistance of the ferrite core high-frequency transformer R w,ferrite ,Right now R ac,ferrite = R w,ferrite The leakage magnetic field distribution in the core window of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same, the winding AC resistance of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same, and R w,nano = R w,ferrite = R ac,ferrite ; Calculate the leakage flux distribution of the nanocrystalline core high-frequency transformer under short-circuit conditions, calculate the magnetic loss density of the nanocrystalline core, and then integrate to obtain the total magnetic loss of the nanocrystalline core P c,nano ; Then the leakage magnetic eddy current loss of the nanocrystalline iron core high frequency transformer is obtained by the difference method.

2. The method according to claim 1, characterized in that Preferably, finite element simulation software is used to calculate the leakage flux distribution of the nanocrystalline iron core high frequency transformer under short-circuit conditions.

3. The method according to claim 2, characterized in that The finite element simulation software is COMSOL Multiphysics, Ansys or Maxwell.

4. The method according to claim 1, wherein The Steinmetz formula is used to calculate the magnetic loss density of the nanocrystalline core.

5. A high-frequency transformer nanocrystalline core leakage magnetic eddy current loss measurement system, characterized in that: It includes, Impedance measuring instrument, which is used for: When the secondary winding of the nanocrystalline iron core high-frequency transformer is short-circuited, the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer to measure the AC resistance of the high-frequency transformer under short-circuit conditions R ac,nano , wherein the AC resistance is composed of the winding AC resistance R w,nano , leakage magnetic eddy current loss equivalent resistance R leakage and core loss equivalent resistance R c,nano Composition, that is R ac,nano = R w,nano + R leakage + R c,nano ; A ferrite core high-frequency transformer, whose ferrite core and winding are similar to the nanocrystalline core and winding of the nanocrystalline core high-frequency transformer, is used to: when the secondary winding of the ferrite core high-frequency transformer is short-circuited, the two terminals of the impedance measuring instrument are clamped on the primary winding of the transformer, and the impedance measuring instrument is used to measure the AC resistance of the ferrite core transformer under short-circuit conditions. R ac,ferrite , where the AC resistance R ac,ferrite Contains only the winding AC resistance of the ferrite core high-frequency transformer R w,ferrite ,Right now R ac,ferrite = R w,ferrite The leakage magnetic field distribution in the core window of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same, the winding AC resistance of the nanocrystalline iron core high frequency transformer and the ferrite iron core high frequency transformer is the same, and R w,nano = R w,ferrite = R ac,ferrite ; The calculation unit is used to calculate the leakage flux distribution of the nanocrystalline core high-frequency transformer under short-circuit conditions, and calculate the magnetic loss density of the nanocrystalline core and then integrate it to obtain the total magnetic loss of the nanocrystalline core. P c,nano ; Then the leakage magnetic eddy current loss of the nanocrystalline iron core high frequency transformer is obtained by the difference method.

6. The system according to claim 5, characterized in that The ferrite core high frequency transformer and the nanocrystalline core high frequency transformer have the same structure and size.

7. The system according to claim 6, characterized in that The calculation unit includes a finite element simulation unit for calculating the leakage flux distribution of the nanocrystalline iron core high frequency transformer under a short circuit condition.

8. The system according to claim 5, wherein: The impedance measuring instrument includes an impedance analyzer or an LCR meter.

9. A computer storage medium, wherein: The storage medium includes computer instructions, which, when executed on a computer, enable the computer to execute the method according to any one of claims 1 to 4.

10. An electronic device, wherein: The electronic device comprises: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, the method according to any one of claims 1 to 4 is implemented.

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