Method and device for calibrating and testing noise performance of tested piece and electronic equipment

Abstract

The invention provides a method and a device for calibrating and testing noise performance of a tested piece and electronic equipment. The method comprises the following steps: acquiring a noise factor # imgabs0 # of a receiver of a vector signal transceiving module; obtaining a gain # imgabs 1 # and a noise factor # imgabs 2 # of the switch module; obtaining the gain # imgabs3 # of the tested piece; acquiring a noise factor # imgabs4 # of the tested piece and the switch module as an integral device; on the basis of the # imgabs5 #, the # imgabs6 #, the # imgabs7 # and the # imgabs8 #, the total noise factor # imgabs9 # of the whole device is obtained; and on the basis of the # imgabs 10 #, the # imgabs 11 # and the # imgabs 12 #, the noise factor # imgabs 13 # of the tested piece is obtained. According to the invention, the noise performance of the tested piece can be tested more accurately.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical signal testing, and in particular to a method, device and electronic equipment for calibrating and testing noise performance of a test piece. Background Art

[0002] Noise is ubiquitous in electronic devices. Noise Figure (NF) is an important parameter to measure the additional noise introduced by electronic devices or systems when processing signals. Noise figure testing is of great significance in communication system, radio frequency (RF) and microwave circuit design.

[0003] With the development of semiconductor technology, higher requirements are put forward for signal receiving sensitivity, signal transmission rate, etc., and noise has an important impact on signal transmission, so the test of noise coefficient is becoming more and more important. There are two traditional noise coefficient test methods: cold source method and Y factor method. In the actual test process of noise coefficient, the cold source method is widely used in the field of RF testing because of its convenience and economy. However, at this stage, when using the cold source method to actually test the noise coefficient, it usually only tests the noise coefficient values ​​of several required frequency points, and because the switch module is matched with 50 ohms, it only calibrates the vector signal transceiver module, and ignores the influence of the switch module itself on the test system. As a result, errors caused by the switch module will be introduced in the actual test, and the noise coefficient test deviation of the device under test is large.

[0004] The information disclosed in this background technology section is only intended to deepen the understanding of the overall background technology of the present invention, and should not be regarded as an admission or any form of suggestion that the information constitutes the prior art already known to those skilled in the art. Summary of the invention

[0005] In view of the problems existing in the prior art, the present invention provides a method, a device and an electronic device for calibrating the noise performance of a device under test.

[0006] The technical solution of the present invention provides a method for calibrating the noise performance of a device under test, the method comprising: obtaining the noise factor of a receiver of a vector signal transceiver module ; Get the gain of the switch module and noise factor ; Get the gain of the device under test ; Obtain the noise factor of the device under test and the switch module as a whole device ;based on , , and , find the overall noise factor of the whole device ;based on , and , and obtain the noise factor of the device under test .

[0007] Optionally, the method further comprises: based on , and obtain the noise coefficient of the device under test .

[0008] Optionally, the method also includes: transmitting a frequency signal with a predetermined frequency point as the center frequency point to the device under test, and obtaining multiple noise coefficients in the frequency signal; smoothing the multiple noise coefficients to obtain the median value of the noise coefficient of the frequency signal as the noise coefficient of the predetermined frequency point.

[0009] Optionally, based on , , and , find the overall noise factor of the whole device , further comprising: based on the formula , find the overall noise factor of the whole device .

[0010] Optionally, based on , and , and obtain the noise factor of the device under test , further comprising: based on the formula , and obtain the noise factor of the device under test .

[0011] Optionally, obtain the gain of the switch module and noise factor , further comprising: connecting a power meter to the front-end link of the device under test, and directly connecting the front-end link and the back-end link of the device under test; the vector signal transceiver module receiver can measure the power of the signal transmitted by the vector signal transceiver module transmitter after passing through the front-end link and the back-end link, and compare the power measured by the power meter to obtain the noise coefficient of the back-end link; ignoring the influence of the noise coefficient of the front-end link in the resistance matching state, measuring and calculating the gain of the switch module and noise factor .

[0012] Optionally, obtain the noise factor of the device under test and the switch module as a whole device , further comprising: based on the signal power at the receiver of the vector signal transceiver module , signal power at the transmitter of the vector signal transceiver module , the gain of the switch module , the gain of the device under test ; Based on the formula , obtain the noise factor of the device under test and the switch module as a whole device .

[0013] The technical solution of the present invention also provides a device for calibrating the noise performance of a device under test, the device comprising: an acquisition module for acquiring the noise factor of the receiver of the vector signal transceiver module , the gain of the switch module and noise factor , the gain of the device under test , the noise factor of the device under test and the switch module as a whole device ; The first calculation module is used based on , , and , find the overall noise factor of the whole device ; The second calculation module is used based on , and , and obtain the noise factor of the device under test .

[0014] The technical solution of the present invention also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, the steps of any of the above-mentioned noise performance calibration test methods for the device under test are implemented.

[0015] The technical solution of the present invention also provides a non-transitory computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of any of the above-mentioned noise performance calibration test methods for the device under test are implemented.

[0016] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention.

[0017] The beneficial effect of the present invention is that it can achieve more accurate testing of the noise performance of the tested device. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 The figure is a schematic diagram of the structure of a test system according to an embodiment of the present invention.

[0020] Figure 2 for Figure 1Another structural decomposition diagram of the test system.

[0021] Figure 3 A schematic diagram of a flow chart of a method for calibrating noise performance of a device under test provided by an embodiment of the present invention.

[0022] Figure 4 A schematic diagram of the structure of a system for testing primary noise provided by an embodiment of the present invention.

[0023] Figure 5 A schematic diagram of the structure of a system for testing secondary noise provided by an embodiment of the present invention.

[0024] Figure 6 A schematic diagram of the structure of a device for calibrating noise performance of a device under test is also provided in an embodiment of the present invention.

[0025] Figure 7 A schematic diagram of the physical structure of an electronic device provided by the present invention. DETAILED DESCRIPTION

[0026] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0027] The present invention classifies the test system, adopts a cascade algorithm, and fully considers the influence of various components such as matrix switches on the test system. It also tests the noise coefficient under a certain frequency, uses a smoothing algorithm, reduces the influence of measurement errors on the noise coefficient, and makes the test results more accurate.

[0028] The noise performance calibration test method for the device under test provided in the embodiment of the present application is described in detail below with reference to the accompanying drawings through specific embodiments and their application scenarios.

[0029] Figure 1 FIG. 1 is a schematic diagram of a structure of a test system according to an embodiment of the present invention. Figure 1 As shown, the present invention tests the noise coefficient based on the cold source method, including a device under test, a matrix switch, and a vector signal transceiver module. Figure 2 for Figure 1 Another structural decomposition diagram of the test system in Figure 2 As shown, the matrix switch includes a 50 ohm load at the front end of the DUT and a switch module at the rear end of the DUT. The gain of the DUT is , Measured by the automatic test machine, the noise factor of the device under test is , the gain of the switch module , the noise factor of the switch module is , when the switch module and the device under test are regarded as an integrated device, the overall noise factor of the integrated device is , the signal power at the receiver of the vector signal transceiver module is , the signal power at the transmitter of the vector signal transceiver module is , the noise factor of the vector signal transceiver module receiver is , the noise floor of the vector signal transceiver module receiver is Before testing the noise coefficient of the device under test, it is generally necessary to calibrate the test system to eliminate the influence of the test system noise coefficient on the test results.

[0030] It should be noted that the receiver noise floor and noise factor of the vector signal transceiver module are calibrated using a traditional calibration method.

[0031] Figure 3 A flow chart of a method for calibrating noise performance of a device under test provided by an embodiment of the present invention is shown in FIG. Figure 3 As shown, the technical solution of the present invention provides a method for calibrating the noise performance of a device under test, the method comprising: S110, obtaining the noise factor of the receiver of the vector signal transceiver module ; S120, obtain the gain of the switch module and noise factor ; S130, obtain the gain of the device under test ; S140, obtain the noise factor of the device under test and the switch module as a whole device ; S150, based on , , and , find the overall noise factor of the whole device ; S160, based on , and , and obtain the noise factor of the device under test The calibration test method of the present invention takes into account the noise performance of the switch module and more accurately calibrates the noise performance of the device under test. Furthermore, the noise factor of the entire device is first considered, and then the noise factor of the device under test is obtained. The test system is graded and a cascade algorithm is used to improve the accuracy of the noise coefficient test.

[0032] Optionally, the method further comprises: based on , and obtain the noise coefficient of the device under test Specifically, the noise figure of the device under test is calculated .

[0033] Optionally, the method further includes: transmitting a frequency signal with a predetermined frequency point as the center frequency point to the device under test, and obtaining multiple noise coefficients in the frequency signal; performing smoothing processing on the multiple noise coefficients to obtain the median value of the noise coefficient of the frequency signal as the noise coefficient of the predetermined frequency point. The noise coefficient under a certain frequency is tested, and a smoothing algorithm is adopted to improve the accuracy of the noise coefficient test.

[0034] Furthermore, the data smoothing algorithm adopted by the present invention measures the noise coefficient of the device under test at a certain frequency point. In the traditional noise coefficient test, the noise coefficient at several frequency points will only transmit the signal of the required frequency point for testing, but in the actual test link, it is inevitable to introduce other noises and cause the test results to drift. Because it is generally recognized that the noise coefficient of the device under test can be considered consistent at nearby frequencies, when testing the noise coefficient of the device under test at a certain frequency point, a frequency signal with this frequency point as the center frequency point is transmitted, and multiple noise coefficients in the frequency band signal are obtained. After smoothing, the median value is obtained as the noise coefficient of the device under test at this frequency point, which reduces the impact of local oscillator leakage and other factors on the noise coefficient performance test of the device under test.

[0035] Optionally, based on , , and , find the overall noise factor of the whole device , further comprising: based on the formula , find the overall noise factor of the whole device .

[0036] Optionally, based on , and , and obtain the noise factor of the device under test , further comprising: based on the formula , and obtain the noise factor of the device under test .

[0037] Optionally, obtain the gain of the switch module and noise factor , further comprising: connecting a power meter to the front-end link of the device under test, and directly connecting the front-end link and the back-end link of the device under test; the vector signal transceiver module receiver can measure the power of the signal transmitted by the vector signal transceiver module transmitter after passing through the front-end link and the back-end link, and compare the power measured by the power meter to obtain the noise coefficient of the back-end link; ignoring the influence of the noise coefficient of the front-end link in the resistance matching state, measuring and calculating the gain of the switch module and noise factor .

[0038] Optionally, obtain the noise factor of the device under test and the switch module as a whole device , further comprising: based on the signal power at the receiver of the vector signal transceiver module , signal power at the transmitter of the vector signal transceiver module , the gain of the switch module , the gain of the device under test ; Based on the formula , obtain the noise factor of the device under test and the switch module as a whole device .

[0039] Furthermore, the noise factor cascade algorithm of the cold source method test is as follows: The noise factor is the linear equivalent physical quantity of the noise factor, which is the reduction of the signal-to-noise ratio when a specific signal passes through a specific component. Therefore, the noise factor is expressed as: , and the noise figure is expressed in logarithmic form as: ,in, is the input signal power, is the output signal power, is the input noise power, is the output noise power.

[0040] In actual measurement, due to the complexity of the test system and the device under test, the above physical quantities cannot often be measured directly. When the gain G of the device under test is known, the following formula can be derived: .

[0041] When the cold source method is used to test the noise factor, a 50Ω resistor needs to be matched to the RF system. According to Planck's black body law, the random voltage generated at both ends of the resistor by the random movement of electrons in the resistor is: .

[0042] In the microwave frequency band, , which can be simplified to , where k is Planck's constant, h is Boltzmann's constant, T is Kelvin temperature, B is system bandwidth, f is system operating center frequency, and R is resistance. The maximum noise power transmitted to the outside by a 50Ω load is: .

[0043] Figure 4 A schematic diagram of a structure of a system for testing primary noise provided by an embodiment of the present invention is shown in FIG. Figure 4 As shown, the total noise power output by the first-level noise system is ,in, is the noise floor of DUT3, is the gain of DUT3, and the noise factor of DUT3 , from which we can get the noise floor of DUT3 .

[0044] Figure 5A schematic diagram of a structure of a secondary noise testing system provided by an embodiment of the present invention is shown in FIG. Figure 5 As shown, the total noise power output by the secondary noise system is ,in, is the noise floor of DUT4, is the gain of DUT4; and the system noise factor ,Right now ,in, is the noise coefficient of DUT4.

[0045] The above algorithm is brought into the actual test process, the DUT and the switch module are regarded as a whole device, and the two-level noise system is formed with the vector signal transceiver module receiver. The overall noise factor of the two-level noise system ,in, , find the overall noise factor of the DUT and the switch module ,pass Obtain , then based on the F bottom and Calculate .

[0046] Similarly, if the DUT and the switch module are considered as a secondary noise measurement system, we can get , In the second step of calibration test, the noise factor of the device under test can be obtained. .

[0047] The device for calibrating the noise performance of the device under test provided by the present invention is described below. The device for calibrating the noise performance of the device under test described below and the method for calibrating the noise performance of the device under test described above can be referred to in correspondence with each other. It should be noted that the device described here includes a virtual device on a program running device such as a computer or a processor.

[0048] Figure 6 A schematic diagram of a device for calibrating noise performance of a device under test is also provided in an embodiment of the present invention. Figure 6 As shown, the technical solution of the present invention also provides a device for calibrating the noise performance of a device under test, the device comprising: an acquisition module for acquiring the noise factor of the receiver of the vector signal transceiver module , the gain of the switch module and noise factor , the gain of the device under test , the noise factor of the device under test and the switch module as a whole device ; The first calculation module is used based on , , and , find the overall noise factor of the whole device ; The second calculation module is used based on , and , and obtain the noise factor of the device under test .

[0049] This embodiment can achieve a more accurate test of the noise performance of the device under test.

[0050] Figure 7 A schematic diagram of the physical structure of an electronic device provided by the present invention, such as Figure 7 As shown, the electronic device may include: a processor 810, a communications interface 820, a memory 830 and a communication bus 840, wherein the processor 810, the communications interface 820 and the memory 830 communicate with each other through the communication bus 840. The processor 810 may call the logic instructions in the memory 830 to execute the noise performance calibration test method of the device under test, the method comprising: obtaining the noise factor of the receiver of the vector signal transceiver module ; Get the gain of the switch module and noise factor ; Get the gain of the device under test ; Obtain the noise factor of the device under test and the switch module as a whole device Based on the , , and , find the overall noise factor of the overall device Based on the , and , and obtain the noise factor of the device under test .

[0051] In addition, the logic instructions in the above-mentioned memory 830 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when it is sold or used as an independent product. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art or the part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program codes.

[0052] On the other hand, the present invention also provides a computer program product, the computer program product includes a computer program stored on a non-transitory computer-readable storage medium, the computer program includes program instructions, when the program instructions are executed by a computer, the computer can execute the noise performance calibration test method of the device under test provided by the above methods, the method includes: obtaining the noise factor of the receiver of the vector signal transceiver module ; Get the gain of the switch module and noise factor ; Get the gain of the device under test ; Obtain the noise factor of the device under test and the switch module as a whole device Based on the , , and , find the overall noise factor of the overall device Based on the , and , and obtain the noise factor of the device under test .

[0053] In another aspect, the present invention further provides a non-transitory computer-readable storage medium having a computer program stored thereon, which is implemented when the computer program is executed by a processor to perform the noise performance calibration test method of the device under test provided above, the method comprising: obtaining the noise factor of the receiver of the vector signal transceiver module ; Get the gain of the switch module and noise factor ; Get the gain of the device under test ; Obtain the noise factor of the device under test and the switch module as a whole device Based on the , , and , find the overall noise factor of the overall device Based on the , and , and obtain the noise factor of the device under test .

[0054] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0055] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0056] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for calibrating the noise performance of a device under test, characterized in that: The method comprises: Get the noise factor of the vector signal transceiver module receiver ; Get the gain of the switch module and noise factor ; Get the gain of the device under test ; Obtain the noise factor of the device under test and the switch module as a whole device ; Based on the , , and , find the overall noise factor of the overall device ; Based on the , and , and obtain the noise factor of the device under test .

2. The noise performance calibration test method of the device under test according to claim 1, characterized in that: The method further comprises: Based on the , and obtain the noise coefficient of the device under test .

3. The noise performance calibration test method of the device under test according to claim 1, characterized in that: The method further comprises: For the device under test, transmitting a frequency signal with a predetermined frequency point as a center frequency point, and obtaining a plurality of noise coefficients in the frequency signal; Smoothing is performed on the multiple noise coefficients to obtain a median value of the noise coefficient of the frequency signal as the noise coefficient of the predetermined frequency point.

4. The noise performance calibration test method of the device under test according to claim 1, characterized in that: Based on the , , and , find the overall noise factor of the overall device , further comprising: Based on the formula , find the overall noise factor of the overall device .

5. The noise performance calibration test method of the device under test according to claim 1, characterized in that: Based on the , and , and obtain the noise factor of the device under test , further comprising: Based on the formula , and obtain the noise factor of the device under test .

6. The noise performance calibration test method of the device under test according to claim 1, characterized in that: The gain of the switch module is obtained and noise factor , further comprising: Connecting a power meter to the front-end link of the device under test, and directly connecting the front-end link and the back-end link of the device under test; The vector signal transceiver module receiver can measure the power of the signal transmitted by the vector signal transceiver module transmitter after passing through the front-end link and the back-end link, and compare the power measured by the power meter to obtain the noise coefficient of the back-end link; Ignoring the influence of the noise coefficient of the front-end link in the resistor matching state, the gain of the switch module is measured and calculated. and noise factor .

7. The noise performance calibration test method of the device under test according to claim 1, characterized in that: The noise factor of the device under test and the switch module as a whole device is obtained , further comprising: Based on the signal power at the receiver of the vector signal transceiver module , signal power at the transmitter of the vector signal transceiver module , the gain of the switch module , the gain of the device under test ; Based on the formula , obtain the noise factor of the device under test and the switch module as a whole device .

8. A device for calibrating the noise performance of a device under test, characterized in that: The device comprises: Acquisition module, used to obtain the noise factor of the receiver of the vector signal transceiver module , the gain of the switch module and noise factor , the gain of the device under test , the noise factor of the device under test and the switch module as a whole device ; The first calculation module is used to calculate the , , and , find the overall noise factor of the overall device ; The second calculation module is used to calculate the , and , and obtain the noise factor of the device under test .

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, the steps of the noise performance calibration test method of the device under test as described in any one of claims 1-7 are implemented.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the noise performance calibration test method of the device under test as described in any one of claims 1 to 7 are implemented.

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