Integrated circuit production test tool

Abstract

The invention provides an integrated circuit production test tool, which comprises a shell, a conveying mechanism, a plurality of clamp mechanisms and a test mechanism, and is characterized in that the two ends and the upper part of the shell are arranged in an open structure; the conveying mechanism is mounted on the shell; the multiple clamp mechanisms are connected with the conveying mechanism, each clamp mechanism comprises a connecting plate, a base plate and two elastic clamping pieces, and the connecting plates are arranged on a conveying chain of the conveying mechanism; the base plate is mounted on the connecting plate; the two elastic clamping pieces are symmetrically arranged on the base plate. According to the integrated circuit production test tool provided by the embodiment of the invention, the point locations on the integrated circuit are simultaneously tested by virtue of the plurality of test assemblies, and the test point locations do not need to be replaced in the test process, so that the condition of short circuit between pins of the integrated circuit caused by sliding between the test assemblies and the integrated circuit is avoided; detection work on an assembly line can be achieved, the method is suitable for a general test mode, and test data are more representative.

Description

Technical Field

[0001] The present application relates to the technical field of integrated circuit production, and in particular to an integrated circuit production test tool. Background Art

[0002] Integrated circuits are a technology that integrates a large number of electronic components (such as transistors, resistors, and capacitors) on a small chip. It can perform a variety of functions such as logical operations, signal processing, and data storage. With the development of integrated circuit technology, the scale of chips continues to increase, and the functions are becoming more and more complex. Therefore, through production testing, manufacturing defects, design problems, and potential reliability risks can be discovered during the integrated circuit manufacturing process.

[0003] In the related art, during the integrated circuit testing process, the relevant technicians usually use a voltmeter to measure the voltage or use an oscilloscope probe to test the waveform. However, since the printed circuits on the integrated circuit are close to each other, the sliding of the test lead or probe can easily cause a short circuit between the integrated circuit pins, or even damage the integrated circuit. In addition, the above test methods are inefficient and are only applicable to sampling tests, which affects the representativeness of the test data. Summary of the invention

[0004] The present application aims to solve one of the technical problems in the above-mentioned technology at least to some extent.

[0005] To this end, one purpose of the present application is to propose an integrated circuit production test tool, which uses multiple test components to test points on the integrated circuit at the same time. There is no need to replace the test points during the test process, thereby avoiding the occurrence of short circuits between integrated circuit pins due to sliding between the test components and the integrated circuit. In addition, it can realize on-line detection operations, which is suitable for general testing methods, making the test data more representative.

[0006] To achieve the above-mentioned purpose, the first aspect of the present application proposes an integrated circuit production and testing tool, comprising: a shell, a conveying mechanism, a plurality of clamping mechanisms and a testing mechanism, wherein the two ends and the upper part of the shell are arranged in an open structure; the conveying mechanism is installed on the shell; the plurality of clamping mechanisms are respectively connected to the conveying mechanism, the clamping mechanism comprises a connecting plate, a substrate and two elastic clamping members, wherein the connecting plate is arranged on the conveying chain of the conveying mechanism; the substrate is installed on the connecting plate; the two elastic clamping members are symmetrically arranged on the substrate; the testing mechanism is arranged above the conveying mechanism, the testing mechanism comprises a bracket, a first reciprocating drive module, a plurality of bases, a plurality of second reciprocating drive modules and a plurality of testing components, wherein the bracket is installed on the shell; the first reciprocating drive module is arranged on the bracket; the plurality of bases are installed on the first slide corresponding to the first reciprocating drive module; the plurality of the second reciprocating drive modules are installed on the corresponding bases; and the plurality of testing components are arranged on the second slide corresponding to the second reciprocating drive module.

[0007] In addition, the integrated circuit production test tooling proposed in the above embodiments of the present application may also have the following additional technical features:

[0008] In one embodiment of the present application, the elastic clamp includes a bottom plate and two first spring sheets, wherein the bottom plate is arranged on the base plate; the two first spring sheets are integrally connected to the bottom plate, and the first spring sheets are arranged in a wavy structure.

[0009] In one embodiment of the present application, the bottom plate is arranged in a fit with the base plate, a connecting seat is provided on the bottom plate, a double-headed screw is threadedly connected between the two connecting seats, and a driving plate is provided at one end of the double-headed screw; rotating parts are respectively provided at both ends of the bottom plate, and the rotating parts are arranged around the outside of the base plate.

[0010] In one embodiment of the present application, the test assembly includes an electric telescopic rod and a test piece, wherein the electric telescopic rod is mounted on a second slider of the second reciprocating drive module; the test piece is connected to the telescopic end of the electric telescopic rod, the test piece is arranged in a U-shaped structure, and a plurality of probes are provided at one end of the test piece.

[0011] In one embodiment of the present application, a plurality of grooves are respectively formed on the inner wall and the outer wall of the test piece.

[0012] In one embodiment of the present application, a guide portion is provided on the telescopic rod of the electric telescopic rod, the telescopic end of the electric telescopic rod passes through the test piece, and a limit plate is provided on the telescopic end of the electric telescopic rod.

[0013] In one embodiment of the present application, an auxiliary unloading assembly is also included, and the auxiliary unloading assembly includes a third reciprocating drive module and a cylinder, wherein the third reciprocating drive module is installed on the inner wall of the shell; the cylinder is arranged on the third slider of the third reciprocating drive module, and the cylinder is located on one side of one of the clamping mechanisms.

[0014] In one embodiment of the present application, a connecting component is provided between the connecting plate and the base plate, and the connecting component includes a shaft body, a ring body, a rotating member and two second spring sheets, wherein one end of the shaft body is rotatably connected to the connecting plate, and the other end of the shaft body is connected to the base plate; the ring body is sleeved on the outside of the shaft body, and the ring body is connected to the connecting plate; the rotating member is connected to the shaft body; one ends of the two second spring sheets are respectively pivotally connected to the inner wall of the ring body, and the two second spring sheets are symmetrically arranged in an arc-shaped structure, the other ends of the two second spring sheets are in contact with the inner wall of the ring body, and the outer walls of the two second spring sheets are in contact with the outer wall of the rotating member.

[0015] In one embodiment of the present application, extension parts are respectively provided at the four corners of the base, rollers are mounted on the extension parts, and the rollers are rollingly connected to the bracket.

[0016] Compared with the prior art, the present application has the following beneficial effects: the integrated circuit production test tooling of the embodiment of the present application uses multiple test components to test points on the integrated circuit at the same time. During the test, there is no need to replace the test points of a single test component, and the test component moves synchronously with the conveying mechanism, thereby avoiding the short circuit between the integrated circuit pins caused by sliding between the test component and the integrated circuit. In addition, the conveying mechanism drives the clamp mechanism and the integrated circuit to be tested to move at a constant speed, which can realize the detection operation on the assembly line, is suitable for general test methods, and makes the test data more representative.

[0017] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the following description of the embodiments in conjunction with the accompanying drawings, in which:

[0019] Figure 1 A schematic diagram of a three-dimensional structure of an integrated circuit production test tool according to an embodiment of the present application;

[0020] Figure 2 This is a schematic diagram of the connection structure between the conveying mechanism and the fixture mechanism of the integrated circuit production test tool according to one embodiment of the present application;

[0021] Figure 3 This is a partial structural diagram of an integrated circuit production test tooling test mechanism according to an embodiment of the present application;

[0022] Figure 4 A schematic diagram of a partial structure of an integrated circuit production test fixture mechanism according to an embodiment of the present application;

[0023] Figure 5 A schematic diagram of the structure of a test assembly for integrated circuit production test tooling according to an embodiment of the present application;

[0024] Figure 6 This is a schematic diagram of the structure of an auxiliary unloading assembly of an integrated circuit production test tool according to an embodiment of the present application;

[0025] Figure 7 The present invention is a schematic diagram of the structure of the connection components of the integrated circuit production test tool according to one embodiment of the present application.

[0026] 1. a plurality of movable members are provided with a plurality of movable members, each of which is provided with a plurality of movable members, and each of which is provided with a plurality of movable members. The movable members are provided with a plurality of movable members, each of which is provided with a plurality of movable members. DETAILED DESCRIPTION

[0027] Embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limiting the present application.

[0028] The integrated circuit production and testing tooling according to an embodiment of the present application is described below with reference to the accompanying drawings.

[0029] like Figure 1-Figure 7 As shown, the integrated circuit production and testing tooling of the embodiment of the present application may include: a housing 1, a conveying mechanism 2, a plurality of fixture mechanisms 3 and a testing mechanism 4.

[0030] The two ends and the upper part of the shell 1 are arranged in an open structure, and the shell 1 is used to provide support for the conveying mechanism 2 and the testing mechanism 4.

[0031] It should be noted that the two ends and the upper part of the housing 1 described in this embodiment are arranged in an open structure, which facilitates the implementation of steps such as placing, testing and unloading the integrated circuit.

[0032] The conveying mechanism 2 is installed on the housing 1, and is used to drive the fixture mechanism 3 and the integrated circuit under test to move at a constant speed to achieve assembly line testing operations.

[0033] It should be noted that the conveying mechanism 2 includes a driving device, two transmission wheels and a transmission chain. The output shaft of the driving device is connected to a transmission wheel, and the transmission chain is wound around the outside of the two transmission wheels. In addition, the external AC power is used to power the conveying mechanism 2 in this device, thereby ensuring the normal operation of this tooling.

[0034] A plurality of clamp mechanisms 3 are respectively connected to the conveying mechanism 2 , and the clamp mechanisms 3 include a connecting plate 31 , a base plate 32 and two elastic clamping members 33 .

[0035] The connecting plate 31 is arranged on the conveying chain of the conveying mechanism 2 , the base plate 32 is installed on the connecting plate 31 , and two elastic clamping members 33 are symmetrically arranged on the base plate 32 .

[0036] It can be understood that the elastic clamp 33 clamps the edge of the integrated circuit (board) without causing damage to the integrated circuit (board). The elastic clamp 33 can be used for integrated circuits (boards) of various models and sizes, thereby expanding the scope of application of the tooling.

[0037] The testing mechanism 4 is disposed above the conveying mechanism 2 , and includes a bracket 41 , a first reciprocating driving module 42 , a plurality of bases 43 , a plurality of second reciprocating driving modules 44 and a plurality of testing components 45 .

[0038] Among them, the bracket 41 is installed on the shell 1, and the first reciprocating drive module 42 is set on the bracket 41. The first reciprocating drive module 42 is used to drive the base 43 and the test component 45 to move at a uniform speed along the movement direction of the conveying mechanism 2, and move synchronously with the integrated circuit, and the two are relatively stationary.

[0039] Multiple bases 43 are installed on the first slide corresponding to the first reciprocating drive module 42, and multiple second reciprocating drive modules 44 are installed on the corresponding bases 43. The second reciprocating drive module 44 is used to drive the test component 45 to move along the vertical direction of the conveying mechanism 2 so that the test component 45 is located above the integrated circuit test point. Multiple test components 45 are arranged on the second slide corresponding to the second reciprocating drive module 44, and the test component 45 is used to test the test points of the integrated circuit.

[0040] It should be noted that the test component 45 described in this embodiment is connected to an external receiving device (eg, a computer) via a data connection line (not shown in the figure).

[0041] Specifically, in the process of testing a batch of integrated circuits (boards) using the tooling, the tooling is operated, the conveying mechanism 2 is started, and the integrated circuits (boards) to be tested are picked up by an external device (manipulator).

[0042] The robot moves the integrated circuit to the top of the clamp mechanism 3, and then moves the integrated circuit in the direction of the clamp mechanism 3. The elastic clamp 33 is deformed, and the elastic clamp 33 fixes the integrated circuit. The conveying mechanism 2 drives multiple clamp mechanisms 3 to move at a uniform speed. When the next clamp mechanism 3 moves to the discharge position, the robot places another integrated circuit in the next clamp mechanism 3.

[0043] When the integrated circuit moves to the bottom of a test component 45 (this working condition can be obtained by the first laser sensor), the second reciprocating drive module 44 drives the test component 45 to move above the integrated circuit's test point in accordance with a predetermined procedure (which can be determined based on actual conditions) (this working condition can be obtained by the first position sensor). At the same time, the first reciprocating drive module 42 drives the base 43 and the conveying mechanism 2 to move synchronously. The test component 45 and the integrated circuit are relatively stationary, and the test component 45 runs to test the above-mentioned points and transmit the test data to the external receiving device.

[0044] After the point test is completed, a test component 45 is reset, and the above steps are repeated to continue testing the point at the same position on the next integrated circuit.

[0045] The integrated circuit moves to the bottom of the next test component 45 (this working condition can be obtained by the second laser sensor), and the above steps are repeated. The next test component 45 can test the next test point and transmit the test data to the inside of the external receiving device.

[0046] It should be noted that during the return movement of the conveying mechanism 2 , that is, multiple test components 45 can still be arranged at the bottom of the housing 1 , so as to complete the testing of multiple points on the integrated circuit.

[0047] The tooling uses a plurality of test components 45 to test points on the integrated circuit at the same time. During the test, there is no need to replace the test point of a single test component 45, and the test component 45 moves synchronously with the conveying mechanism 2, thereby avoiding the occurrence of a short circuit between the integrated circuit pins due to sliding between the test component 45 and the integrated circuit. In addition, the conveying mechanism 2 drives the clamping mechanism 3 and the integrated circuit to be tested to move at a constant speed, which can realize the detection operation on the assembly line, is suitable for general testing methods, and makes the test data more representative.

[0048] In one embodiment of the present application, Figure 2 and Figure 4 As shown, the elastic clamping member 33 includes a bottom plate 331 and two first spring leaves 332 .

[0049] The bottom plate 331 is disposed on the base plate 32 , and the two first spring pieces 332 are integrally connected to the bottom plate 331 , and the first spring pieces 332 are disposed in a wave-shaped structure.

[0050] It can be understood that arranging the first spring piece 332 into a wave-shaped structure can clamp the integrated circuit (board).

[0051] In one embodiment of the present application, Figure 2 and Figure 4 As shown, the bottom plate 331 is fitted with the base plate 32, a connecting seat 333 is provided on the bottom plate 331, a double-headed screw 334 is threadedly connected between the two connecting seats 333, and a driving plate 335 is provided at one end of the double-headed screw 334; rotating parts 336 are respectively provided at both ends of the bottom plate 331, and the rotating parts 336 are wrapped around the outer side of the base plate 32.

[0052] It should be noted that the bottom plate 331 described in this embodiment is also made of a metal elastic material. Under normal conditions, the rotating parts 336 at both ends of the bottom plate 331 are tightly clamped on the outer side of the base plate 32 .

[0053] Specifically, when the external manipulator presses the IC (board) to be tested toward the substrate 32 , the IC (board) contacts the two first spring pieces 332 , and continues to press the IC (board) to be tested, and the IC (board) is stuck at the bend of the first spring pieces 332 .

[0054] When the length of the integrated circuit (board) is not compatible with the distance between the two first spring pieces 332, relevant technicians can rotate the drive plate 335, threadedly connect the double-headed screw 334 with the connecting seat 333, and then change the distance between the two first spring pieces 332, so that the length of the integrated circuit (board) to be tested is compatible with the distance between the two first spring pieces 332, ultimately expanding the scope of application of the tooling.

[0055] In one embodiment of the present application, Figure 3 and Figure 5 As shown, the test assembly 45 includes an electric telescopic rod 451 and a test piece 452 .

[0056] The electric telescopic rod 451 is installed on the second slider of the second reciprocating drive module 44 , the test piece 452 is connected to the telescopic end of the electric telescopic rod 451 , the test piece 452 is arranged in a U-shaped structure, and a plurality of probes 4521 are provided at one end of the test piece 452 .

[0057] It should be noted that the vertical rod of the test piece 452 described in this embodiment is made of metal material, and the horizontal rod is made of insulating material.

[0058] In one embodiment of the present application, Figure 3 and Figure 5 As shown, a plurality of grooves 453 are respectively formed on the inner wall and the outer wall of the test piece 452 .

[0059] It can be understood that when the test point of the integrated circuit is not directly below the probe 4521, that is, when the electric telescopic rod 451 is in operation, the probe 4521 does not contact the test point. The relevant technicians can arbitrarily bend the test piece 452 at the groove 453 so that the test point is located directly below the probe 4521, thereby ensuring the reliability of the test process.

[0060] In one embodiment of the present application, Figure 3 and Figure 5 As shown, a guide portion 454 is provided on the telescopic rod of the electric telescopic rod 451 , the telescopic end of the electric telescopic rod 451 passes through the test piece 452 , and a limit plate 455 is provided at the telescopic end of the electric telescopic rod 451 .

[0061] It can be understood that the telescopic rod of the electric telescopic rod 451 runs a fixed length, and the telescopic rod is slidably connected to the test piece 452, which can avoid height differences at various test points (for example, the height of the support leg solder joint is larger than the printed circuit). The test piece 452 slides on the telescopic rod, and the probe 4521 can contact the test point normally without slipping or excessive bending of the probe 4521, thereby ensuring the reliability of the test data.

[0062] In one embodiment of the present application, Figure 1 and Figure 6 As shown, it also includes an auxiliary unloading assembly 5, which includes a third reciprocating drive module 51 and a cylinder 52.

[0063] The third reciprocating drive module 51 is installed on the inner wall of the housing 1 , and the cylinder 52 is arranged on the third slider of the third reciprocating drive module 51 . The cylinder 52 is located at one side of a clamp mechanism 3 .

[0064] Specifically, after the integrated circuit test is completed, the third reciprocating drive module 51 drives the cylinder 52 to move synchronously with the conveying mechanism 2, and the cylinder 52 is facing the integrated circuit on a clamp mechanism 3 (this working condition can be obtained by the second laser sensor). When the cylinder 52 is started, the integrated circuit can be pushed off the clamp mechanism 3, and the integrated circuit falls onto the external collection device for the next step of operation.

[0065] In one embodiment of the present application, Figure 7 As shown, a connecting assembly 6 is provided between the connecting plate 31 and the base plate 32 , and the connecting assembly 6 includes a shaft 61 , a ring 62 , a rotating member 63 and two second spring sheets 64 .

[0066] Among them, one end of the shaft body 61 is rotatably connected to the connecting plate 31, the other end of the shaft body 61 is connected to the base plate 32, the ring body 62 is sleeved on the outside of the shaft body 61, the ring body 62 is connected to the connecting plate 31, the rotating member 63 is connected to the shaft body 61, one end of the two second spring sheets 64 are respectively pivotally connected to the inner wall of the ring body 62, the two second spring sheets 64 are symmetrically arranged in an arc structure, the other ends of the two second spring sheets 64 are in contact with the inner wall of the ring body 62, and the outer walls of the two second spring sheets 64 are in contact with the outer wall of the rotating member 63.

[0067] It is understandable that, according to the test requirements of the integrated circuit, relevant technicians can rotate the substrate 32 and the elastic clamping member 33 thereon to be parallel to the movement direction of the conveying mechanism 2 .

[0068] Specifically, refer to Figure 7 The shape of the rotating member 63 is shown in the figure. The relevant technicians rotate the substrate 32, the substrate 32 drives the shaft 61 to rotate, the shaft 61 drives the rotating member 63 to rotate, the rotating member 63 squeezes the second spring piece 64, the second spring piece 64 is deformed, and the outer walls of the two second spring pieces 64 are separated from the outer wall of the rotating member 63. When the substrate 32 drives the shaft 61 to rotate 90°, the outer walls of the two second spring pieces 64 are fitted with the outer wall of the rotating member 63 again, so that the substrate 32 and the elastic clamping member 33 above it are parallel to the movement direction of the conveying mechanism 2, thereby facilitating the testing of points on the integrated circuit.

[0069] It should be noted that during the rotation of the substrate 32 , the hands of the relevant technicians can clearly feel the buffering force brought by the second spring piece 64 under the action of the elastic potential energy thereof, thereby facilitating the relevant technicians to judge the angle of rotation.

[0070] In one embodiment of the present application, Figure 1 and Figure 3 As shown, the four corners of the base 43 are respectively provided with extension parts 71 , and rollers 72 are installed on the extension parts 71 , and the rollers 72 are rollingly connected to the bracket 41 .

[0071] It is understandable that the provision of the extension portion 71 can ensure the stability of the movement of the base 43 , and the roller 72 can reduce the friction between the extension portion 71 and the bracket 41 .

[0072] In summary, the integrated circuit production test tooling of the embodiment of the present application uses multiple test components to test points on the integrated circuit at the same time. During the test, there is no need to replace the test points of a single test component, and the test component moves synchronously with the conveying mechanism, thereby avoiding the short circuit between the integrated circuit pins caused by sliding between the test component and the integrated circuit. In addition, the conveying mechanism drives the clamp mechanism and the integrated circuit to be tested to move at a uniform speed, which can realize the detection operation on the assembly line, is suitable for general testing methods, and makes the test data more representative.

[0073] In the description of this specification, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0074] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0075] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and deform the above embodiments within the scope of the present application.

Claims

1. An integrated circuit production test tool, characterized in that: include: A housing, a conveying mechanism, a plurality of fixture mechanisms and a testing mechanism, wherein: The two ends and the upper part of the shell are arranged in an open structure; The conveying mechanism is mounted on the housing; The plurality of clamping mechanisms are respectively connected to the conveying mechanism, and the clamping mechanism comprises a connecting plate, a base plate and two elastic clamping members, wherein: The connecting plate is arranged on the conveying chain of the conveying mechanism; The base plate is mounted on the connecting plate; The two elastic clamping members are symmetrically arranged on the base plate; The testing mechanism is arranged above the conveying mechanism, and comprises a bracket, a first reciprocating drive module, a plurality of bases, a plurality of second reciprocating drive modules and a plurality of testing components, wherein: The bracket is mounted on the housing; The first reciprocating drive module is arranged on the bracket; A plurality of the bases are mounted on the first slide corresponding to the first reciprocating drive module; A plurality of the second reciprocating drive modules are mounted on the corresponding bases; The plurality of test components are arranged on the second slide table of the corresponding second reciprocating drive module.

2. The integrated circuit production test tool according to claim 1, characterized in that: The elastic clamping member includes a bottom plate and two first spring sheets, wherein: The bottom plate is arranged on the base plate; The two first spring pieces are integrally connected to the bottom plate, and the first spring pieces are arranged in a wave-shaped structure.

3. The integrated circuit production test tool according to claim 2, characterized in that: The bottom plate is fitted with the base plate, a connecting seat is provided on the bottom plate, a double-headed screw is threadedly connected between the two connecting seats, and a driving plate is provided at one end of the double-headed screw; The two ends of the bottom plate are respectively provided with a rotating part, and the rotating part is arranged around the outer side of the base plate.

4. The integrated circuit production test tool according to claim 1, characterized in that: The test assembly includes an electric telescopic rod and a test piece, wherein: The electric telescopic rod is mounted on the second slider of the second reciprocating drive module; The test piece is connected to the telescopic end of the electric telescopic rod, the test piece is arranged in a U-shaped structure, and one end of the test piece is provided with a plurality of probes.

5. The integrated circuit production test tool according to claim 4, characterized in that: A plurality of grooves are respectively formed on the inner wall and the outer wall of the test piece.

6. The integrated circuit production test tool according to claim 4, characterized in that: A guide portion is arranged on the telescopic rod of the electric telescopic rod, the telescopic end of the electric telescopic rod passes through the test piece, and a limit plate is arranged on the telescopic end of the electric telescopic rod.

7. The integrated circuit production test tool according to claim 1, characterized in that: It also includes an auxiliary unloading assembly, which includes a third reciprocating drive module and a cylinder, wherein: The third reciprocating drive module is mounted on the inner wall of the housing; The cylinder is arranged on the third slider of the third reciprocating drive module, and the cylinder is located on one side of one of the clamping mechanisms.

8. The integrated circuit production test tool according to claim 1, characterized in that: A connecting assembly is provided between the connecting plate and the base plate, and the connecting assembly includes a shaft body, a ring body, a rotating member and two second spring sheets, wherein: One end of the shaft is rotatably connected to the connecting plate, and the other end of the shaft is connected to the base plate; The ring body is sleeved on the outer side of the shaft body, and the ring body is connected to the connecting plate; The rotating member is connected to the shaft body; One end of the two second spring sheets is pivotally connected to the inner wall of the ring body respectively, the two second spring sheets are symmetrically arranged in an arc structure, the other ends of the two second spring sheets are in contact with the inner wall of the ring body, and the outer walls of the two second spring sheets are in contact with the outer wall of the rotating member.

9. The integrated circuit production test tool according to claim 1, characterized in that: Extension parts are respectively arranged at the four corners of the base, rollers are installed on the extension parts, and the rollers are rollingly connected to the bracket.

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