Electronic component testing equipment

Abstract

The invention provides electronic component testing equipment, which comprises a machine table, a testing device and a testing device, the testing plate is arranged on the table top of the machine table and can be driven to intermittently rotate in one direction, and a feeding unit, a checking unit, a discharging unit and a collecting mechanism are arranged outside the periphery of the testing plate; the checking unit is provided with a first checking unit for checking the insulation resistance of the capacitor, and the first checking unit is provided with a plurality of measuring stations; the measuring station comprises a pulse voltage station for applying pulse voltage; therefore, the electronic component can fully pass through the detection of the impact-resistant voltage.

Description

Technical Field

[0001] The invention relates to a testing device, and in particular to an electronic component testing device suitable for testing electronic components. Background Art

[0002] After manufacturing, general electronic components usually need to be tested to determine their physical properties. For example, the prior art provided by the patent application for "Circuit Component Loading and Unloading Device" with the announcement number 411735 for testing capacitor-type electronic components is that one or more concentric ring seats of component slots can rotate relative to the ring center. The slots are evenly spaced at angles and rotate in increments, and the rotation increment is the angular interval between adjacent slots. The ring seat is inclined at a certain angle, and when the ring seat rotates, the component flow path dumps the component toward the ring seat. The fixed grid plate adjacent to the outer plate side of the slot seat restricts the components that have not been returned to their original position to randomly roll down to the empty slot seat passing through the arc segment of the ring seat rotation path due to the power. The random rolling causes the components to The components are returned to the slot seats, and there is an electronic contactor for connecting the components and the testing machine in the path of the rotating ring seat. The tested components pass under a spray manifold. The spray manifold plate defines many spray holes, and each time the ring seat rotates an increment, the spray holes are aligned with a group of slot seats. The spray pipe is connected to the spray port, and the components are sprayed out from the slot seats by the air blowing of each air pressure valve selectively started. Due to the air blowing and gravity, the sprayed components fall through the pipe and enter the classification storage box under the guidance of the pipeline plate. The component flow path can be selectively directed to the grid plate in response to the signal of the detector indicating that the grid plate lacks components. The sensor can detect the components in the seat slot that have not yet been sprayed out by the spray manifold.

[0003] The terminal composition of the prior art is to open five hollow slots on a frame, and then set a terminal module in each slot. The five terminal modules and the terminals below can be used as five separate test benches. In this way, when testing ceramic capacitors, the ceramic capacitors are tested in five stages. In the typical first stage, the capacitance and dissipation coefficient of the component are tested. In the typical second stage test, usually called the "flash" test, a high voltage (typically 2-2.5 times the rated voltage of the component) is applied for a short time (typically 40-50ms). In the typical third stage test, a low voltage (such as 50V) is used to test the leakage current and insulation resistance. In the typical fourth stage test, the rated voltage of the component is used to apply to the component for a saturation time (typically hundreds of ms) and the leakage / insulation resistance is tested again. In the typical fifth stage test, the capacitance value of the component is tested again to check whether it is affected by the previous test. The terminal module that is first encountered by the component in the rotation direction of the test board can be used to perform the first stage test on each slot column passed. The second terminal module encountered by the component in the rotation direction of the test plate can be used to perform the second stage test on each slot column passed, and so on. In this way, the five test times can be overlapped and shortened to a minimum range.

[0004] Another prior art is the patent application No. 55038 entitled "Capacitor Insulation Resistance Measuring Device", which discloses that a turntable supplied with capacitors passes through multiple workstations during intermittent rotation. In addition to detecting low voltage resistance, a withstand voltage measurement is also performed. The withstand voltage measurement uses a higher voltage than the insulation resistance measurement.

[0005] Although the prior art of the patent application with announcement number 411735 provides testing and classification collection of capacitor electronic components, it adopts a "flash" test during the test, which includes applying a high voltage (typically 2-2.5 times the rated voltage of the component) for a short period of time (typically 40-50ms), which is a one-time instantaneous high voltage; the withstand voltage measurement of the patent application with announcement number 55038 is also a one-time instantaneous high voltage. Although the two prior arts can test the withstand voltage of capacitor electronic elements, for the capacitor electronic products that are gradually developing today, the one-time instantaneous high voltage test in the "flash" method is still not enough to cope with the high voltage impact they face in practical applications, especially the capacitor electronic products used in electric vehicles and low-orbit satellites. Summary of the invention

[0006] Therefore, an object of the present invention is to provide an electronic component testing device that improves at least one disadvantage of the prior art.

[0007] The electronic component testing equipment according to the purpose of the present invention includes: a machine table, on which a machine table surface is provided; a test board, which is arranged on the machine table surface and can be driven to rotate intermittently in one direction, and a feeding unit, an inspection unit, a discharge unit and a collection mechanism are arranged outside the periphery of the test board; the inspection unit is provided with a first inspection unit that can be used to inspect the insulation impedance of the capacitor, and the first inspection unit is provided with multiple measuring stations; the measuring station includes a pulse voltage station for applying a pulse voltage.

[0008] The electronic component testing equipment of the embodiment of the present invention has a first inspection unit for performing insulation resistance inspection of a capacitor, in which a pulse voltage station is provided for applying a pulse voltage. The pulse voltage station can fully inspect the ability of the electronic component to withstand voltage shocks. For electronic components such as capacitors that pass the inspection, they can be safer in related applications in the future. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Figure 1 The present invention is a three-dimensional schematic diagram of an electronic component testing device, which is used to illustrate an embodiment of the present invention.

[0010] Figure 2 It is a schematic diagram of the configuration of various mechanisms on the table of the electronic component testing equipment.

[0011] Figure 3 is a schematic diagram of an inspection unit in the electronic component testing equipment.

[0012]

Explanation of symbols

[0013] A: Machine

[0014] A1: Machine table

[0015] A2: Desktop

[0016] B: Test board

[0017] B1: Seat groove

[0018] C: Feeding unit

[0019] D: Inspection unit

[0020] D1: First inspection unit

[0021] D11: First stand

[0022] D12: Measuring station

[0023] D121: Low voltage station

[0024] D122: Pulse voltage station

[0025] D123: High Voltage Station

[0026] D124: General Station

[0027] D125: Discharge Station

[0028] D2: Second inspection unit

[0029] D21: Second stand

[0030] D3: The third inspection unit

[0031] D31: The third mount

[0032] E: Discharge unit

[0033] F: Feeding mechanism

[0034] G: Guide rack

[0035] H: Collection Agency

[0036] H1: Material box DETAILED DESCRIPTION

[0037] See also Figure 1 , 2 As shown, the embodiment of the present invention is explained by an electronic component testing device for testing a capacitor-type component to be tested, but is not limited to the implementation of capacitor-type electronic components; a disc-shaped test board B that can be driven to rotate intermittently in a clockwise direction is provided on a machine table A1 inclined at about sixty degrees on a machine A, and a feeding unit C for loading the component to be tested, an inspection unit D for testing the characteristics of the component to be tested, and a discharge unit E for discharging and collecting the component to be tested that has completed the test are provided outside the periphery of the test board B, and a feeding mechanism F for providing the component to be tested and a guide rack G for guiding the discharge unit E to a collection mechanism H are provided on a machine table A2 horizontal to the machine A, and the collection mechanism H is provided at the front side of the machine A with a plurality of material boxes H1.

[0038] See also Figure 2 As shown, the inspection unit D is provided with a first inspection unit D1 for inspecting the insulation resistance (commonly known as IR) of the capacitor, and a second inspection unit D2 and a third inspection unit D3 for inspecting the capacitance, loss or quality factor (commonly known as CD) of the capacitor, which are respectively located before and after the first inspection unit D1 in the direction in which the test board B intermittently rotates; wherein the third inspection unit D3 located after the first inspection unit D1 in the direction in which the test board B intermittently rotates can be omitted as needed.

[0039] The first inspection unit D1 is provided with a first frame D11 that can be opened up and down, the second inspection unit D2 is provided with a second frame D21, and the third inspection unit D3 is provided with a third frame D31; the first frame D11, the second frame D21 and the third frame D31 are spaced apart from each other and are not linked to each other.

[0040] The upper surface of the test board B is provided with a plurality of rows (two rows in this embodiment) of concentrically arranged rectangular seat grooves B1 at intervals in the radial direction. A plurality of the seat grooves B1 are arranged at intervals in each row of the seat grooves B1, and the seat grooves B1 corresponding to each row are arranged in a plurality of straight lines at intervals. Each seat groove B1 can be used to accommodate a component to be tested, such as a capacitor-type electronic component, with electrodes respectively provided on the upper and lower ends. The component to be tested is placed in the seat groove B1 at the feeding unit C with the electrodes respectively located at the upper and lower ends.

[0041] The first inspection unit D1 is provided with a plurality of measuring stations D12 which are arranged in an arc-shaped parallel manner with a spacing therebetween. Each measuring station D12 includes an upper terminal located on the first mount D11, and a corresponding lower terminal (or probe) (not shown in the figure) located below the test board B. The second inspection unit D2 and the third inspection unit D3 have the same structure, and can be deduced by the same logic. Both are provided with an upper terminal located on the second mount D21 or the third mount D31, and a corresponding lower terminal (or probe) (not shown in the figure) located below the test board B.

[0042] See also Figure 3 The measuring station D12 of the first inspection unit D1 is provided with the following in sequence according to the clockwise intermittent rotation direction of the test plate B:

[0043] A low voltage station D121, located next to the second inspection unit D1, is used to measure the insulation resistance (IR) of the capacitor. The voltage is measured;

[0044] A pulse voltage station D122 is located downstream of the low voltage station D121 and supplies a pulse frequency of The voltage is A pulse voltage (pulse) is applied without measuring the voltage;

[0045] A high voltage station D123, located at the downstream side of the pulse voltage station D122, is used to measure the insulation resistance (IR) or leakage current of the capacitor. Direct current (DC) or alternating current (AC), or both according to program settings The voltage of direct current DC plus alternating current AC;

[0046] A group of general stations D124, located at the downstream side of the high-voltage station D123, is used to measure the insulation resistance (IR) of the capacitor. In this embodiment, ten stations are provided, each of which supplies a voltage less than 1KV for measurement;

[0047] A discharging station D125 is located adjacent to the previous station of the third inspection unit D3 for discharging.

[0048] When the inspection unit D is testing electronic components, taking capacitor-type electronic components as an example, the electronic components are carried by the test board B and first inspected by the second inspection unit D2 for capacitance, loss or quality factor (CD) of the capacitor. The second inspection unit D2 may also increase the bias setting when inspecting; then the components are transported to the low voltage station D121 of the first inspection unit D1 for insulation resistance (IR) measurement of the capacitor, which is provided with a discharge function and is discharged after the measurement is completed; then the pulse voltage station D122 only applies the voltage without measuring; then the high voltage station D123 measures the insulation resistance (IR) or leakage current of the capacitor, and a multi-step measurement method with different voltages may be selected at this time; and then in a In general, each station of the station D124 performs insulation resistance (IR) measurement of the capacitor. Each station has a discharge function. After the measurement is completed, the discharge is performed. Each station can select the charging direction, such as charging from the upper terminal to the lower terminal or from the lower terminal to the upper terminal. The measurement can also be performed at a single station with multiple steps of different voltages. After completing the operations of the aforementioned stations, before entering the third inspection unit D3 to perform capacitance, loss or quality factor (CD) inspection of the capacitor, it is necessary to pass through the discharge station D125 for sufficient discharge to confirm that the voltage must be below 1V to avoid damaging the capacitance, loss or quality factor (CD) inspection instrument of the capacitor. Finally, it enters the third inspection unit D3 to perform capacitance, loss or quality factor (CD) inspection of the capacitor.

[0049] The pulse voltage station D122 is located between the low voltage station D121 and the high voltage station D123. Voltage measurement instrument, so in this embodiment, the pulse voltage station D122 only applies a pulse frequency of The voltage is Instead of measuring the pulse voltage, the high voltage station D123 is added to measure the insulation resistance (IR) of the capacitor. Voltage measuring instrument, then in the pulse voltage station D122, the pulse frequency can be applied The voltage is In addition to the pulse voltage, the insulation resistance (IR) of the capacitor can be measured without setting up the high voltage station D123.

[0050] The electronic component testing equipment of the embodiment of the present invention has a first inspection unit D1 for inspecting the insulation resistance of the capacitor, in which a pulse voltage station D122 for applying a pulse voltage is provided. The pulse voltage station D122 can fully inspect the ability of the electronic components to withstand voltage shocks. Electronic components that pass the inspection, such as capacitors, can be safer in related applications in the future.

[0051] The above descriptions are merely embodiments of the present invention, and should not be used to limit the scope of implementation of the present invention. All simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the contents of the patent specification are still within the scope of the patent of the present invention.

Claims

1. An electronic component testing device, comprising: A machine platform, on which a machine platform table is provided; A test plate is arranged on the table of the machine and can be driven to rotate intermittently in one direction. A feeding unit, an inspection unit, a discharge unit and a collection mechanism are arranged outside the periphery of the test plate; The inspection unit is provided with a first inspection unit for inspecting the insulation resistance of the capacitor, and the first inspection unit is provided with a plurality of measuring stations; Features: The measuring station includes a pulse voltage station for applying a pulse voltage.

2. The electronic component testing device according to claim 1, wherein: The pulse voltage station supplies a pulse frequency of The voltage is A pulse voltage is applied without measuring it.

3. The electronic component testing device according to claim 1, wherein: The first inspection unit is provided with a high voltage station for measuring the insulation resistance of the capacitor, located at the downstream side of the pulse voltage station, supplying The voltage of direct current or alternating current, or both The voltage of direct current plus alternating current.

4. The electronic component testing device according to claim 3, wherein: The high voltage station can select multiple steps of different voltage measurement methods, and can be used for insulation resistance measurement of capacitors or leakage current measurement.

5. The electronic component testing device according to claim 1, wherein: The inspection unit is provided with a second inspection unit and a third inspection unit for inspecting the capacitance, loss or quality factor of the capacitor, which are respectively located before and after the first inspection unit in the direction in which the test board intermittently rotates.

6. The electronic component testing device according to claim 5, wherein: According to the direction in which the test plate rotates intermittently, a discharge station for discharging is located in front of the third inspection unit.

7. The electronic component testing device according to claim 1, wherein: The measuring station is provided with the following sequence according to the direction in which the test plate rotates intermittently: A set of low voltage stations for carrying out insulation resistance measurements of capacitors; The pulse voltage station; A high voltage station for carrying out insulation resistance measurements of capacitors; A set of general stations for carrying out insulation resistance measurements of capacitors; A discharge station for discharging.

8. The electronic component testing device according to claim 7, wherein: The low pressure station supplies The voltage is measured.

9. The electronic component testing device according to claim 7, wherein: The general station has ten stations, each supplying 1KV voltage for measurement.

10. The electronic component testing device according to claim 9, wherein: Each station of the general station has a discharge function, a selectable charging direction, or a single station can measure different voltages in multiple steps.

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