Switchable multi-loop switch integrated test device

By designing a multi-loop switch integrated test device, the combination of knob and mounting plate can achieve fast loop switching, and the coordination of clamping blocks and torsion springs can achieve stable line clamping, which solves the problem of cumbersome loop switching operations in the existing technology and improves the Test efficiency.

CN119147794AInactive Publication Date: 2024-12-17HUBEI ELECTRIC POWER CO JINGZHOU POWER SUPPLY CO
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Patent Information

Application Number
CN202411324594.1
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-23
Publication Date
2024-12-17
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

The existing switch integrated test device is cumbersome to operate during loop switching and has low efficiency. It is necessary to pull out the line first and then switch the connection.

Method used

A multi-loop switch integrated test device including display screen, heat sink, wiring assembly, loop switching assembly, limit assembly, clamping assembly, wire management assembly and handle is designed to achieve rapid development through the design of knobs and mounting plates. Loop switching, the coordination of the clamp block and torsion spring achieves stable clamping and quick connection of the circuit.

Benefits of technology

It realizes rapid switching of test lines, improves the efficiency of multi-sample testing, simplifies the operation process, and improves the efficiency and convenience of testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to the technical field of switch integrated testing, in particular to a switchable multi-loop switch integrated testing device which comprises a testing device body, a display screen is installed on the top of the testing device body, and heat dissipation plates are installed on the left side and the right side of the testing device body. The test device body is provided with three wiring assemblies. According to the invention, after the first test is completed, the second mounting plate can be rotated by pressing the knob downwards and carrying out rotation operation, so that the positions of the first loop groove and the second loop groove are adjusted, loops can be rapidly switched to carry out second test operation after the first test is completed, the switching of test circuits is more convenient and rapid, and the test efficiency is improved. And the multi-sample testing efficiency is improved.
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Description

Technical Field

[0001] The invention relates to the technical field of switch integrated testing, and in particular to a switchable multi-circuit switch integrated testing device. Background Art

[0002] The switch integrated test device usually refers to a set of equipment used to test the performance of switches in electrical equipment. In the power system, the performance of switchgear is crucial because they are directly related to the safe and stable operation of the power system. Under normal test conditions, in order to ensure the accuracy of the test, it is necessary to continuously switch the power supply circuit to ensure the diversity of the test samples, so that the test results are more scientific and convincing. However, in the process of circuit switching, the specific operation is relatively cumbersome. It is necessary to unplug the line first, and then switch the circuit connection, and the overall efficiency is low.

[0003] Therefore, in order to solve the above problems, a switchable multi-circuit switch integrated test device is now developed. Summary of the invention

[0004] In order to overcome the shortcomings of the existing device in which the specific operation is complicated during the circuit switching process, the line needs to be unplugged first, and then the circuit connection and switching are performed, resulting in low overall efficiency, the present invention provides a switchable multi-circuit switch integrated test device.

[0005] The technical solution of the present invention is: a switchable multi-circuit switch integrated test device, including a test device body, a display screen is installed on the top of the test device body, heat dissipation plates are installed on the left and right sides of the test device body, and three wiring components are arranged on the test device body, and the wiring components include a first mounting plate, a first limiting hole, a first through hole, a bolt, a first wiring port and a second wiring port. A through hole is opened in the middle position of the first mounting plate, the first mounting plate is installed on the upper front side of the test device body, three first limiting holes are opened on the first mounting plate, two first through holes are opened on the first mounting plate, the first through holes are all located on the right side of the through holes, the first through holes are all slidably connected with bolts, and the first mounting plate has the first wiring port and the second wiring port.

[0006] Optionally, a circuit switching component is also included, the circuit switching component includes a knob, the circuit switching component is rotatably arranged on the wiring component, the knob is rotatably connected to the first mounting plate, the lower side of the knob is connected to a second mounting plate, three slot-shaped second limiting holes are opened on the second mounting plate, two second through holes are opened on the second mounting plate, the second through holes are located on the right side of the knob, the second through holes correspond to the position of the first through holes, and are clamped with the bolt, the second mounting plate is provided with a first circuit groove and a second circuit groove, the first circuit groove and the second circuit groove can be aligned with the corresponding first wiring port and second wiring port.

[0007] Optionally, a limiting component is further included, which includes a connecting block. Three groups of limiting blocks are connected to the upper front side of the test device body. Limiting members are slidably connected to the limiting blocks. Reset springs are connected between the limiting members and adjacent connecting blocks. The limiting members are slidably connected to the second limiting holes at corresponding positions and are snap-fitted to the corresponding first limiting holes.

[0008] Optionally, a clamping assembly is also included, the clamping assembly includes a mounting part, the mounting parts are installed on the first mounting plate, the number of the mounting parts corresponds to the total number of the first wiring ports and the second wiring ports, two clamping blocks are rotatably connected to the mounting parts, the clamping blocks are used to clamp and fix the lines, and torsion springs are connected between the clamping blocks and adjacent mounting parts.

[0009] Optionally, it also includes a wire management assembly, which includes a third mounting plate. The third mounting plate is slidingly connected to the front side of the test device body. Five nuts are threadedly connected to the front side of the test device body. The nuts are used to press and fix the third mounting plate. A wire management ring is installed on the third mounting plate.

[0010] Optionally, a handle is further included, and the handle is rotatably connected to the front side of the test device body, so that the handle is convenient for an operator to carry.

[0011] Optionally, a foot support is further included, and the four corners of the bottom of the test device body are connected to the foot support, and the foot support facilitates the placement of the test device body.

[0012] Optionally, the clamping bolt is provided with a limiting ring, and the limiting ring is located on the upper part of the clamping bolt.

[0013] By adopting the above technical solution, the beneficial effects of the present invention are: 1. After the first test is completed, the present invention can press down the knob and rotate it to rotate the second mounting plate, thereby adjusting the positions of the first loop slot and the second loop slot, so that after the first test is completed, the loop can be quickly switched to perform the second test operation, making the switching of the test line more convenient and quick, and improving the efficiency of multi-sample testing.

[0014] 2. When installing and connecting the line, the present invention first passes the line through the wire management ring, then rotates the clamping blocks to both sides to open them, so that the torsion spring is deformed, and then the line is inserted into the corresponding first wiring port and the second wiring port. After the wiring operation is completed, the clamping blocks are released, so that the clamping blocks are flipped and reset under the action of the corresponding torsion springs, and the line is clamped and stabilized. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a schematic diagram of the three-dimensional structure of the present invention.

[0016] Figure 2 It is a schematic diagram of a first partial three-dimensional structure of the present invention.

[0017] Figure 3 It is a partial cross-sectional three-dimensional structural schematic diagram of the present invention.

[0018] Figure 4 It is a schematic diagram of a partially exploded three-dimensional structure of the present invention.

[0019] Figure 5 It is a schematic diagram of the three-dimensional structure of the clamping assembly of the present invention.

[0020] Figure 6 It is a schematic diagram of the three-dimensional structure of the cable management assembly of the present invention.

[0021] Figure 7 It is a schematic diagram of a second partial three-dimensional structure of the present invention.

[0022] Markings in the accompanying drawings: 1_test device body, 2_display screen, 3_heat sink, 4_wiring assembly, 41_first mounting plate, 42_first limiting hole, 43_first through hole, 44_bolt, 45_first wiring port, 46_second wiring port, 5_circuit switching assembly, 51_knob, 52_second mounting plate, 53_second limiting hole, 54_second through hole, 55_first circuit groove, 56_second circuit groove, 6_limiting assembly, 61_limiting member, 62_reset spring, 63_connecting block, 7_clamping assembly, 71_mounting member, 72_clamping block, 73_torsion spring, 8_cable management assembly, 81_third mounting plate, 82_cable management ring, 83_nut, 9_handle, 10_foot support. DETAILED DESCRIPTION

[0023] The following descriptions are merely preferred embodiments of the present invention and are not intended to limit the protection scope of the present invention. Example 1

[0024] A switchable multi-circuit switch integrated test device, such as Figure 1-Figure 4 As shown, it includes a test device body 1, 1 and 2, a display screen 2 is installed on the top of the test device body 1, heat dissipation plates 3 are installed on the left and right sides of the test device body 1, and three wiring components 4 are arranged on the test device body 1. The wiring components 4 include a first mounting plate 41, a first limiting hole 42, a first through hole 43, a clamping bolt 44, a first wiring port 45 and a second wiring port 46. A through hole is opened in the middle of the first mounting plate 41, and the first mounting plate 41 is installed on the upper front side of the test device body 1. Three first limiting holes 42 are opened on the first mounting plate 41, two first through holes 43 are opened on the first mounting plate 41, and the first through holes 43 are all located on the right side of the through holes. The first through holes 43 are all slidably connected with clamping bolts 44, and the clamping bolts 44 are provided with limiting rings, and the limiting rings are located on the upper part of the clamping bolts 44. The first mounting plate 41 is provided with first wiring ports 45 and second wiring ports 46.

[0025] like Figure 1 , Figure 3 and Figure 4 As shown, it also includes a circuit switching component 5, the circuit switching component 5 includes a knob 51, the circuit switching component 5 is rotatably arranged on the wiring component 4, the knob 51 is rotatably connected to the first mounting plate 41, the lower side of the knob 51 is connected to the second mounting plate 52, the second mounting plate 52 is provided with three slot-shaped second limiting holes 53, the second mounting plate 52 is provided with two second through holes 54, the second through holes 54 are located on the right side of the knob 51, the second through holes 54 correspond to the position of the first through holes 43, and are clamped with the bolt 44, the second mounting plate 52 is provided with a first circuit groove 55 and a second circuit groove 56, the first circuit groove 55 and the second circuit groove 56 can be aligned with the corresponding first wiring port 45 and the second wiring port 46.

[0026] like Figure 1 , Figure 3 and Figure 4 As shown, it also includes a limit assembly 6, which includes a connecting block 63. Three groups of limit blocks are connected to the upper front side of the test device body 1. The limit blocks are all slidably connected to limit members 61. Reset springs 62 are connected between the limit members 61 and the adjacent connecting blocks 63. The limit members 61 are slidably connected to the second limit holes 53 at the corresponding positions, and are clamped with the corresponding first limit holes 42.

[0027] It should be noted that when conducting the switch integration test, the device can be used for auxiliary operation. First, connect the line between the device and the switch so that the line passes through the wiring assembly 4. The specific operation is to pass the line through the corresponding first wiring port 45 and the second wiring port 46 so that the line is connected to the first circuit groove 55. At this time, the first test begins. After the test is completed, press the knob 51 downward to make the second mounting plate 52 slide downward. At this time, the limit members 61 are disengaged from the first limit holes 42, and the reset springs 62 are compressed. At the same time, the bolts 44 are pulled upward and pulled out so that the bolts 44 are no longer engaged with the first through holes 43 and the second through holes 54. At this time, the second mounting plate 52 is no longer locked and limited. Next, turn the knob 51 counterclockwise to make The second mounting plate 52 rotates counterclockwise. When the second mounting plate 52 rotates counterclockwise to the limit position, the knob 51 is released. Under the action of the reset spring 62, the limit member 61 will slide upward and reset, thereby pushing the second mounting plate 52 to slide upward and reset. At this time, the limit member 61 will be engaged with the first limit hole 42 again to complete the limit fixation of the second mounting plate 52. Then, the latch 44 is inserted back to reset, so that the second mounting plate 52 and the first mounting plate 41 are relatively fixed to avoid accidental rotation of the first mounting plate 41 or the second mounting plate 52. When the second mounting plate 52 completes the rotation reset operation, the line connected through the first wiring port 45 and the second wiring port 46 will be connected to the second circuit groove 56, thereby completing the quick switching of the test line and improving the efficiency of multi-sample testing. Example 2

[0028] On the basis of Example 1, Figure 1 , Figure 3 , Figure 4 and Figure 5 As shown, a clamping assembly 7 is also included, and the clamping assembly 7 includes a mounting member 71. The first mounting plate 41 is equipped with the mounting members 71, and the number of the mounting members 71 corresponds to the total number of the first wiring ports 45 and the second wiring ports 46. Two clamping blocks 72 are rotatably connected to the mounting members 71, and the clamping blocks 72 are used to clamp and fix the circuit. A torsion spring 73 is connected between the clamping blocks 72 and the adjacent mounting members 71.

[0029] like Figure 1 and Figure 6 As shown, it also includes a wire management component 8, which includes a third mounting plate 81. The third mounting plate 81 is slidably connected to the front side of the test device body 1. Five nuts 83 are threadedly connected to the front side of the test device body 1. The nuts 83 are used to press and fix the third mounting plate 81. A wire management ring 82 is installed on the third mounting plate 81.

[0030] It should be noted that when installing and connecting the line, first pass the line through the wire management ring 82, then rotate the clamping block 72 to both sides to open it, so that the torsion spring 73 is deformed, and then insert the line into the corresponding first wiring port 45 and second wiring port 46. After completing the wiring operation, release the clamping block 72, so that the clamping block 72 is flipped and reset under the action of the corresponding torsion spring 73, and the line is clamped and stabilized.

[0031] like Figure 1 , Figure 6 and Figure 7 As shown, a handle 9 is also included. The front side of the test device body 1 is rotatably connected with the handle 9, and the handle 9 is convenient for operators to carry.

[0032] like Figure 6 and Figure 7 As shown, a foot support 10 is also included. The four corners of the bottom of the test device body 1 are connected with the foot support 10, and the foot support 10 is convenient for placing the test device body 1.

[0033] The above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art who is familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A switchable multi-circuit switch integrated test device, characterized in that: The invention comprises a test device body (1), a display screen (2) is installed on the top of the test device body (1), heat sinks (3) are installed on the left and right sides of the test device body (1), three wiring components (4) are arranged on the test device body (1), the wiring components (4) include a first mounting plate (41), a first limiting hole (42), a first through hole (43), a clamping bolt (44), a first wiring port (45) and a second wiring port (46), a through hole is opened in the middle of the first mounting plate (41), the first mounting plate (41) is installed on the upper front side of the test device body (1), the first mounting plate (41) has three first limiting holes (42), the first mounting plate (41) has two first through holes (43), the first through holes (43) are located on the right side of the through holes, the first through holes (43) are slidably connected to the clamping bolts (44), and the first mounting plate (41) has the first wiring port (45) and the second wiring port (46).

2. A switchable multi-circuit switch integrated test device as claimed in claim 1, characterized in that: The circuit switching assembly (5) also includes a circuit switching assembly (5), the circuit switching assembly (5) including a knob (51), the circuit switching assembly (5) being rotatably arranged on the wiring assembly (4), the knob (51) being rotatably connected to the first mounting plate (41), the lower side of the knob (51) being connected to a second mounting plate (52), the second mounting plate (52) being provided with three slot-shaped second limiting holes (53), the second mounting plate (52) being provided with two second through holes (54), the second through holes (54) being located on the right side of the knob (51), the second through holes (54) corresponding to the positions of the first through holes (43) and being engaged with the clamping bolt (44), the second mounting plate (52) being provided with a first circuit groove (55) and a second circuit groove (56), the first circuit groove (55) and the second circuit groove (56) being able to be aligned with the positions of the corresponding first wiring port (45) and the second wiring port (46).

3. A switchable multi-circuit switch integrated test device as claimed in claim 2, characterized in that: It also includes a limit assembly (6), the limit assembly (6) includes a connecting block (63), three groups of limit blocks are connected to the upper front side of the test device body (1), the limit blocks are all slidably connected to limit members (61), the limit members (61) and the adjacent connecting blocks (63) are connected with return springs (62), the limit members (61) are all slidably connected to the second limit holes (53) at the corresponding positions, and are snap-fitted to the corresponding first limit holes (42).

4. A switchable multi-circuit switch integrated test device as claimed in claim 3, characterized in that: The device also includes a clamping assembly (7), the clamping assembly (7) including a mounting member (71), the mounting members (71) being mounted on the first mounting plate (41), the number of the mounting members (71) corresponding to the total number of the first wiring ports (45) and the second wiring ports (46), the mounting members (71) being rotatably connected to two clamping blocks (72), the clamping blocks (72) being used to clamp and fix the circuit, and a torsion spring (73) being connected between the clamping blocks (72) and the adjacent mounting members (71).

5. A switchable multi-circuit switch integrated test device as claimed in claim 4, characterized in that: The test device also includes a wire management component (8), the wire management component (8) including a third mounting plate (81), the front side of the test device body (1) being slidably connected to the third mounting plate (81), the front side of the test device body (1) being threadedly connected to five nuts (83), the nuts (83) being used to press and fix the third mounting plate (81), and a wire management ring (82) being installed on the third mounting plate (81).

6. A switchable multi-circuit switch integrated test device as claimed in claim 5, characterized in that: It also comprises a handle (9), the front side of the test device body (1) is rotatably connected to the handle (9), and the handle (9) is convenient for an operator to carry.

7. A switchable multi-circuit switch integrated test device as claimed in claim 6, characterized in that: It also includes a foot support (10), and the four corners of the bottom of the test device body (1) are connected to the foot support (10), and the foot support (10) facilitates the placement of the test device body (1).

8. A switchable multi-circuit switch integrated test device as claimed in claim 1, characterized in that: The clamping bolt (44) is provided with a limiting ring, and the limiting ring is located on the upper part of the clamping bolt (44).