High-voltage switch integrated test device for variable resistance data test

Abstract

The invention relates to the field of switch integrated testing, in particular to a high-voltage switch integrated testing device for variable resistance data testing, which comprises a testing device main body, a display screen arranged at the top of the testing device main body, a rheostat assembly arranged on the testing device main body, and a connecting end connected to the rheostat assembly. The connecting end is connected with an interface on the test device main body, and the rheostat assembly is connected with six adjusting pieces in a sliding manner. In the high-voltage test process, the resistance in the test process is manually adjusted through the adjusting part, the test variable is changed, the effect of various tests is achieved, the test accuracy is improved, the connecting end can be rapidly stored after the test is completed, the connecting end is prevented from being damaged, and the service life of operation and use is prolonged; and the safety of the device in the using process is improved.

Description

Technical Field

[0001] The invention relates to the field of switch integration test, and in particular to a high-voltage switch integration test device for variable resistance data testing. Background Art

[0002] In the process of conducting integrated tests of high-voltage switches, in order to simulate various situations that the high-voltage switches may encounter under actual operating conditions, the response characteristics of the switches under different load conditions are generally tested by changing the resistance value. Existing devices are internally provided with a load adjustment module, which changes the load size in the circuit by adjusting the internal or externally connected resistor group, thereby realizing the study of the switch behavior under different working conditions. However, it still essentially requires an external variable resistor group for assistance. At this time, the selection of the variable resistor is extremely troublesome. At the same time, the externally connected variable resistor circuit may not be compatible with the device itself and may be difficult to accommodate.

[0003] Therefore, in order to solve the above problems, a high voltage switch integrated test device for variable resistance data testing is now developed. Summary of the invention

[0004] In order to overcome the problem that the selection of a variable resistor in the existing device is extremely troublesome, and the externally connected variable resistor circuit also has the disadvantages of being incompatible with the device itself and difficult to accommodate, the present invention provides a high-voltage switch integrated test device for variable resistance data testing.

[0005] The technical implementation scheme of the present invention is: an integrated test device for high-voltage switches for variable resistance data testing, including a test device body, a display screen is arranged on the top of the test device body, a variable resistor assembly is arranged on the test device body, a connecting end is connected to the variable resistor assembly, and the connecting end is connected to the interface on the test device body, and six adjusting parts are slidably connected to the variable resistor assembly, and the movement of the adjusting parts can adjust the resistance of the variable resistor assembly.

[0006] Optionally, a placement block is also included, and the placement block is installed on the variable resistor assembly. The placement block is used to clamp and place the connecting end. The left and right sides of the variable resistor assembly are connected to a first fixed plate, and the first fixed plate is slidably connected to a limiting plate. The limiting plate is used to clamp and limit the connecting end that has been placed and fixed.

[0007] Optionally, an installation frame is also included, and the installation frame is connected to the left and right sides of the test device body. Fans are installed on the installation frame, and the fans are used to guide air flow movement to avoid overheating and overload. A cooling component is installed on the variable resistor assembly, and the cooling component is used to cool the variable resistor assembly to avoid damage to the variable resistor assembly.

[0008] Optionally, a fixing seat is further included, and the fixing seat is installed at the middle position on the top of the test device body. A cover plate is clamped on the display screen, and the fixing seat is used to limit and lock the cover plate, and the cover plate is used to cover the display screen for dust protection.

[0009] Optionally, a second fixing plate is also included. The second fixing plates are symmetrically installed on the left and right sides of the test device body. Soft suction cups are slidably connected to the second fixing plates. A pressing piece is installed on the top of the soft suction cup. A spring is connected between the pressing piece and the adjacent second fixing plate.

[0010] Optionally, a fixing rod is further included, and the adjusting members on the right are all connected to the fixing rod, and the adjusting members on the left are all slidably connected to a sleeve rod, and the sleeve rod can be clamped with the adjacent fixing rod.

[0011] Optionally, the top of the pressing member is a curved surface structure, which can reduce the pressure on the operator's hands.

[0012] By adopting the above technical solution, the present invention has the following advantages: 1. In the process of high-voltage testing, the present invention relies on the adjustment part to manually adjust the resistance size during the test, change the test variables, achieve the effect of various tests, improve the test accuracy, and can quickly store the connection end after the test is completed to avoid damage to the connection end, thereby increasing the operating life and improving the safety of the device during use.

[0013] 2. During the test process of the present invention, as the variable resistor component enters the use state, the cooling component and the fan are turned on synchronously, and the variable resistor component is cooled in real time by the cooling component. At the same time, the fan is started to accelerate the air flow during this process, further improving the cooling efficiency and avoiding overheating and overload.

[0014] 3. When the main body of the test device is in use, the pressing piece is pressed downward so that the soft suction cup can slide downward along the adjacent second fixed plate. When the soft suction cup moves downward, the bottom of the soft suction cup will contact the ground, thereby establishing an adsorption connection with the ground. At this time, the spring will be compressed by force, and the adsorption effect of the soft suction cup will improve the stability of the main body of the test device after placement, thereby avoiding the problem of loose circuits caused by accidental sliding of the main body of the test device. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a schematic diagram of the three-dimensional structure of the present invention.

[0016] Figure 2 It is a partial three-dimensional structural schematic diagram of the present invention.

[0017] Figure 3 It is a partial three-dimensional structural schematic diagram of the present invention.

[0018] Figure 4 It is a partial cross-sectional three-dimensional structural schematic diagram of the present invention.

[0019] Figure 5 It is a partial three-dimensional structural schematic diagram of the present invention.

[0020] Figure 6 It is a partial cross-sectional three-dimensional structural schematic diagram of the present invention.

[0021] Figure 7 It is a partial cross-sectional structural schematic diagram of the present invention.

[0022] Figure 8 It is a partial three-dimensional structural schematic diagram of the present invention.

[0023] The meanings of the reference numerals in the figure are as follows: 1: test device body, 2: display screen, 3: rheostat assembly, 4: connecting end, 5: adjusting member, 6: placing block, 7: first fixing plate, 8: limiting plate, 9: mounting frame, 10: fan, 11: cooling assembly, 12: cover plate, 13: fixing seat, 14: second fixing plate, 15: soft suction cup, 16: pressing member, 17: spring, 18: fixing rod, 19: sleeve rod. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings. It is hereby stated that the directional terms such as up, down, left, right, front, back, inside, outside, etc. that appear or will appear in the text of the present invention are only based on the accompanying drawings of the present invention, and are not specific limitations of the present invention. Example 1

[0025] An integrated test device for high voltage switches with variable resistance data testing, such as Figure 1 and Figure 2 As shown, the test device includes a main body 1, a display screen 2 is arranged on the top of the main body 1, a variable resistor assembly 3 is arranged on the main body 1, a connecting terminal 4 is connected to the variable resistor assembly 3, and the connecting terminal 4 is connected to the interface on the main body 1 of the test device, and six adjusting members 5 are slidably connected to the variable resistor assembly 3, and the movement of the adjusting members 5 can adjust the resistance of the variable resistor assembly 3.

[0026] like Figure 2 As shown, a placement block 6 is also included. The placement block 6 is installed on the variable resistor component 3. The placement block 6 is used to clamp and place the connection end 4. The left and right sides of the variable resistor component 3 are connected to the first fixed plate 7. The first fixed plate 7 is slidably connected to the limit plate 8. The limit plate 8 is used to clamp and limit the connection end 4 that has been placed and fixed.

[0027] It should be noted that in the process of conducting integrated testing of high-voltage switches, the present device can be used to assist in operation. First, the switch circuit is connected to the variable resistor assembly 3, and then normal testing processing is started. After one test is completed, the test resistance is changed by sliding the adjustment member 5 to adjust the position, thereby achieving the effect of various tests. After the test is completed, the wiring is removed, and then the limit plate 8 is pulled forward, and then the connection end 4 is inserted into the placement block 6 for placement, and finally the limit plates 8 are pushed backward to reset, and the connection end 4 is limited and locked. In summary, in the process of high-voltage testing, the resistance size during the test is manually adjusted by relying on the adjustment member 5 to change the test variables, achieve the effect of various tests, and improve the test accuracy. Example 2

[0028] On the basis of Example 1, Figure 3 and Figure 4 As shown, it also includes a mounting frame 9, and the mounting frames 9 are connected to the left and right sides of the test device body 1. Fans 10 are installed on the mounting frames 9, and the fans 10 are used to guide the air flow movement to avoid overheating and overload. A cooling component 11 is installed on the variable resistor component 3, and the cooling component 11 is used to cool the variable resistor component 3 to avoid damage to the variable resistor component 3.

[0029] It should be noted that during the test, as the variable resistor component 3 enters the use state, the cooling component 11 and the fan 10 are turned on synchronously, and the cooling component 11 is used to perform real-time cooling on the variable resistor component 3. At the same time, the fan 10 is started to accelerate the air flow during this process, further improving the cooling efficiency and avoiding overheating and overload.

[0030] like Figure 1 and Figure 5 As shown, a fixing seat 13 is also included. The fixing seat 13 is installed at the middle position of the top of the test device body 1. A cover plate 12 is clamped on the display screen 2. The fixing seat 13 is used to limit and lock the cover plate 12. The cover plate 12 is used to cover the display screen 2 for dust protection.

[0031] like Figure 1 , Figure 6 and Figure 7 As shown, a second fixing plate 14 is also included. The left and right sides of the test device body 1 are both equipped with front-to-back symmetrical second fixing plates 14. Soft suction cups 15 are slidably connected to the second fixing plates 14. A pressing piece 16 is installed on the top of the soft suction cup 15. The top of the pressing piece 16 has an arc structure, which can reduce the pressure on the operator's hands. A spring 17 is connected between the pressing piece 16 and the adjacent second fixing plate 14.

[0032] It should be noted that when the test device main body 1 is in use, by pressing the pressing piece 16 downward, the soft suction cup 15 can slide downward along the adjacent second fixed plate 14. When the soft suction cup 15 moves downward, the bottom of the soft suction cup 15 will contact the ground, thereby establishing an adsorption connection with the ground. At this time, the spring 17 will be compressed by force, and the adsorption effect of the soft suction cup 15 will be relied upon to improve the stability of the test device main body 1 after placement, thereby avoiding the problem of loose circuits caused by accidental sliding of the test device main body 1.

[0033] like Figure 8 As shown, a fixing rod 18 is also included. The fixing rod 18 is connected to the adjusting member 5 on the right side, and a sleeve rod 19 is slidably connected to the adjusting member 5 on the left side. The sleeve rod 19 can be clamped with the adjacent fixing rod 18.

[0034] It should be noted that when it is necessary to synchronously adjust two adjacent adjustment members 5 on the left and right, the sleeve rod 19 can be pushed to the right so that the sleeve rod 19 is snap-connected with the corresponding fixed rod 18. Relying on the connection relationship formed by the sleeve rod 19 and the fixed snap-connection, the two adjacent adjustment members 5 on the left and right can move synchronously, thereby improving the convenience of the resistance adjustment process.

[0035] It should be understood that this embodiment is only used to illustrate the present invention and is not used to limit the scope of the present invention. In addition, it should be understood that after reading the content taught by the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms also fall within the scope limited by the appended claims of the application.

Claims

1. A high voltage switch integrated test device for variable resistance data testing, characterized in that: The invention comprises a test device body (1), a display screen (2) is arranged on the top of the test device body (1), a variable resistor assembly (3) is arranged on the test device body (1), a connection end (4) is connected to the variable resistor assembly (3), the connection end (4) is connected to an interface on the test device body (1), and six adjustment members (5) are slidably connected to the variable resistor assembly (3), and the movement of the adjustment members (5) can adjust the resistance of the variable resistor assembly (3).

2. A high voltage switch integrated test device for variable resistance data testing according to claim 1, characterized in that: It also comprises a placement block (6), the placement block (6) being mounted on the variable resistor assembly (3), the placement block (6) being used to clamp and place the connection end (4), the left and right sides of the variable resistor assembly (3) being connected to first fixing plates (7), the first fixing plates (7) being slidably connected to limit plates (8), the limit plates (8) being used to clamp and limit the connection end (4) that has been placed and fixed.

3. A high voltage switch integrated test device for variable resistance data testing according to claim 2, characterized in that: The test device also includes a mounting frame (9), the mounting frame (9) being connected to both left and right sides of the test device body (1), a fan (10) being mounted on each mounting frame (9), the fan (10) being used to guide airflow movement, thereby avoiding overheating and overloading, and a cooling component (11) being mounted on the variable resistor component (3), the cooling component (11) being used to cool the variable resistor component (3), thereby avoiding damage to the variable resistor component (3).

4. A high voltage switch integrated test device for variable resistance data testing according to claim 3, characterized in that: The test device also comprises a fixing seat (13), the fixing seat (13) being installed at the middle position of the top of the test device body (1), a cover plate (12) being clamped on the display screen (2), the fixing seat (13) being used to limit and lock the cover plate (12), and the cover plate (12) being used to cover the display screen (2) for dust protection.

5. A high voltage switch integrated test device for variable resistance data testing according to claim 4, characterized in that: The test device further comprises a second fixing plate (14), wherein the second fixing plates (14) are symmetrically mounted on both left and right sides of the test device body (1), and soft suction cups (15) are slidably connected to the second fixing plates (14), and a pressing member (16) is mounted on the top of the soft suction cups (15), and a spring (17) is connected between the pressing member (16) and the adjacent second fixing plate (14).

6. A high voltage switch integrated test device for variable resistance data testing according to claim 5, characterized in that: It also includes a fixing rod (18), the fixing rod (18) being connected to the adjusting member (5) on the right side, and a sleeve rod (19) being slidably connected to the adjusting member (5) on the left side, the sleeve rod (19) being capable of being snap-fitted with an adjacent fixing rod (18).

7. A high voltage switch integrated test device for variable resistance data testing according to claim 5, characterized in that: The top of the pressing member (16) is a curved surface structure, which can reduce the pressure on the operator's hands.

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