Copper product quality defect traceability system and method

Abstract

The invention discloses a copper product quality defect traceability system and method. The system comprises a data acquisition module, a data processing module, a quality detection module and a defect traceability module. Relates to the technical field of copper product quality defect traceability, and solves the technical problem that quality defect information of a copper product is difficult to accurately obtain in the prior art. The method comprises the following steps: calculating a quality evaluation coefficient based on surface defect characteristics and performance data; integrating the quality evaluation coefficient and the basic information into traceability information; coding the traceability information based on a coding algorithm and storing the coded traceability information in a database; and performing defect traceability on the copper product based on the quality evaluation result and the traceability code. The performance standard-reaching rate is calculated according to the performance data and the preset performance standard, and the performance standard-reaching rate corresponding to each piece of performance data is multiplied by the corresponding proportionality coefficient to obtain the second evaluation coefficient, so that the performance of the copper product can be accurately reflected, and the quality defect tracing accuracy of the copper product can be improved.

Description

Technical Field

[0001] The invention belongs to the technical field of copper product quality defect tracing, and specifically relates to a copper product quality defect tracing system and method. Background Art

[0002] With the rapid development of industrial technology and increasingly fierce market competition, the requirements for copper product quality are getting higher and higher. However, in the production and processing of copper products, due to the influence of various factors such as complex processes, diversity of raw materials and fluctuations in equipment status, it is difficult to completely avoid product quality defects. Therefore, tracing the quality defects of copper products has become a technical problem that needs to be solved urgently.

[0003] The existing technology realizes the traceability of copper product quality defects by monitoring the production, processing, transportation and other links of copper products. However, the traceability method of the existing technology can only obtain the manufacturer information, processing manufacturer information and transportation logistics information of copper products, and it is difficult to accurately obtain the quality defect information of copper products; in addition, the traceability method of the existing technology also has the problem of low security.

[0004] The present invention provides a copper product quality defect tracing system and method to solve the above technical problems. Summary of the invention

[0005] The present invention aims to solve at least one of the technical problems existing in the prior art; to this end, the present invention proposes a copper product quality defect traceability system and method, which is used to solve the problem that the traceability method in the prior art can only obtain the manufacturer information, processing manufacturer information and transportation logistics information of the copper product, and it is difficult to accurately obtain the quality defect information of the copper product; in addition, the traceability method in the prior art also has the technical problem of low security.

[0006] To achieve the above-mentioned object, the first aspect of the present invention provides a copper product quality defect tracing system, comprising: a data acquisition module, a data processing module, a quality detection module and a defect tracing module;

[0007] The data acquisition module is used to obtain basic information of copper products and collect sample images of copper products; obtain surface defect features in sample images through image recognition technology; and measure performance data of copper products through experiments; wherein the basic information includes raw material information, processing information and transportation information; the surface defect features include the area proportions corresponding to pore defects, crack defects, rust defects and tolerance defects; and the performance data include tensile strength, yield strength, hardness and conductivity;

[0008] The data processing module is used to calculate the quality assessment coefficient based on the surface defect characteristics and performance data; integrate the quality assessment coefficient and basic information into traceability information; encode the traceability information based on the encoding algorithm and store it in the database;

[0009] The quality inspection module is used to perform quality assessment on the copper product based on the quality assessment coefficient and the preset assessment threshold interval to obtain a quality assessment result; wherein the quality assessment result includes high quality, qualified and defective;

[0010] The defect tracing module is used to trace defects of copper products based on quality assessment results and traceability codes.

[0011] Preferably, the data processing module communicates and / or is electrically connected to the data acquisition module, the quality inspection module, and the defect tracing module respectively.

[0012] Preferably, the calculation of the quality assessment coefficient based on the surface defect characteristics and performance data includes:

[0013] A1: Extract surface defect characteristics and performance data;

[0014] A2: Calculate the first evaluation coefficient PX1 based on the surface defect characteristics;

[0015] A3: Calculate a second evaluation coefficient PX2 based on the performance data;

[0016] A4: The quality assessment coefficient ZPX is calculated by the formula ZPX=(a×PX2) / (b×PX1+c); wherein a and b are proportional coefficients greater than 0, and c is a constant greater than 0 and less than 1.

[0017] Preferably, the calculation of the first evaluation coefficient PX1 based on the surface defect characteristics includes:

[0018] Extract surface defect features; calculate the first evaluation coefficient PX1 by the formula PX1=k1×QK+k2×LW+k3×XS+k4×GC; wherein, QK is the area ratio of pore defects, LW is the area ratio of crack defects, XS is the area ratio of rust defects, GC is the area ratio of tolerance defects, and k1, k2, k3, and k4 are proportional coefficients greater than 0.

[0019] The present invention obtains surface defect characteristics of copper products, including area proportions corresponding to pore defects, crack defects, corrosion defects and tolerance defects, and multiplies each surface defect characteristic by a corresponding proportional coefficient to obtain a first evaluation coefficient, which can accurately reflect the surface defect conditions of the copper products, thereby facilitating improving the accuracy of tracing the quality defects of the copper products.

[0020] Preferably, the calculating of the second evaluation coefficient PX2 based on the performance data comprises:

[0021] C1: Extract tensile strength, yield strength, hardness and conductivity from performance data;

[0022] C2: The tensile strength in the performance data is marked as XN1, the yield strength is marked as XN2, the hardness is marked as XN3 and the conductivity is marked as XN4;

[0023] C3: Calculate the performance compliance rate based on performance data and preset performance standards;

[0024] C4: The second evaluation coefficient PX2 is calculated by the formula PX2=h1×DBL1+h2×DBL2+h3×DBL3+h4×DBL4; wherein DBL1 is the performance compliance rate corresponding to tensile strength, DBL2 is the performance compliance rate corresponding to yield strength, DBL3 is the performance compliance rate corresponding to hardness, DBL4 is the performance compliance rate corresponding to conductivity, and h1, h2, h3, and h4 are proportional coefficients greater than 0.

[0025] The present invention calculates the performance compliance rate according to the performance data and the preset performance standard, and multiplies the performance compliance rate corresponding to each performance data by the corresponding proportional coefficient to obtain the second evaluation coefficient, which can accurately reflect the performance of the copper product, thereby facilitating improving the accuracy of tracing the quality defects of the copper product.

[0026] Preferably, the calculating of the performance compliance rate based on the performance data and the preset performance standard includes:

[0027] D1: Extract performance data;

[0028] D2: Set the performance standards corresponding to each performance data;

[0029] D3: By formula The compliance rate DBLi corresponding to the i-th performance data is calculated; wherein XNi is the value of the i-th performance data, and XBi is the performance standard corresponding to the i-th performance data; i=1, 2, ..., 4.

[0030] Preferably, encoding the traceability information based on a coding algorithm and storing it in a database includes:

[0031] E1: Extract traceability information and obtain the current timestamp;

[0032] E2: Generate a unique serial number based on the current timestamp;

[0033] E3: Encrypt the unique serial number based on an encryption algorithm to obtain a traceability code; the encryption algorithm includes an AES algorithm and an RSA algorithm;

[0034] E4: Bind the traceability code with the traceability information to obtain a mapping relationship;

[0035] E5: Store the traceability code, traceability information and mapping relationship into the database.

[0036] The present invention can ensure the uniqueness of the generated traceability code by generating a unique serial number according to the current timestamp, and encrypts the unique serial number through an encryption algorithm to obtain the traceability code, so that the generated traceability code is difficult to be stolen, which is beneficial to improving the security of tracing the quality defects of copper products.

[0037] Preferably, the quality assessment of the copper product based on the quality assessment coefficient and the preset assessment threshold interval includes:

[0038] T1: Extraction quality assessment coefficient ZPX;

[0039] T2: Set the evaluation threshold interval [PY1, PY2]; where PY1 <PY2;

[0040] T3: Determine whether the quality assessment coefficient ZPX is within the assessment threshold interval [PY1, PY2]; if yes, mark the quality assessment result as normal; if not, jump to T4;

[0041] T4: Determine whether the quality assessment coefficient ZPX is greater than PY2; if yes, mark the quality assessment result as high quality; if no, mark the quality assessment result as defective.

[0042] Preferably, the defect tracing of the copper product based on the quality assessment result and the traceability code includes:

[0043] Z1: Extract quality assessment results;

[0044] Z2: Determine whether the quality assessment result is a defect; if yes, jump to Z3; if no, jump to Z1;

[0045] Z3: Input the traceability code into the database query to obtain the quality assessment coefficient and basic information of the copper product.

[0046] A second aspect of the present invention provides a method for tracing the quality defects of copper products, comprising:

[0047] S1: Obtain basic information of copper products and collect sample images of copper products;

[0048] S2: Obtain surface defect features in sample images through image recognition technology;

[0049] S3: Measure the performance data of copper products through experiments;

[0050] S4: Calculate the quality assessment coefficient based on surface defect characteristics and performance data;

[0051] S5: Integrate the quality assessment coefficient and basic information into traceability information;

[0052] S6: Encode the traceability information based on the encoding algorithm and store it in the database;

[0053] S7: Performing quality assessment on the copper product based on the quality assessment coefficient and a preset assessment threshold interval to obtain a quality assessment result;

[0054] S8: Conduct defect traceability of copper products based on quality assessment results and traceability codes.

[0055] Compared with the prior art, the present invention has the following beneficial effects:

[0056] 1. The present invention obtains the surface defect characteristics of copper products: the area proportions corresponding to pore defects, crack defects, corrosion defects and tolerance defects, and multiplies each surface defect characteristic by the corresponding proportional coefficient to obtain a first evaluation coefficient, which can accurately reflect the surface defect conditions of copper products, thereby facilitating improving the accuracy of tracing the quality defects of copper products.

[0057] 2. The present invention calculates the performance compliance rate according to the performance data and the preset performance standards, and multiplies the performance compliance rate corresponding to each performance data by the corresponding proportional coefficient to obtain the second evaluation coefficient, which can accurately reflect the performance of the copper product, thereby facilitating improving the accuracy of tracing the quality defects of the copper product.

[0058] 3. The present invention can ensure the uniqueness of the generated traceability code by generating a unique serial number according to the current timestamp, and encrypt the unique serial number through an encryption algorithm to obtain the traceability code, so that the generated traceability code is difficult to be stolen, which is beneficial to improve the security of tracing the quality defects of copper products. BRIEF DESCRIPTION OF THE DRAWINGS

[0059] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0060] Figure 1 It is an overall flow chart of the copper product quality defect tracing method of the present invention;

[0061] Figure 2 It is a schematic diagram of the principle of the copper product quality defect tracing system of the present invention;

[0062] Figure 3 A flowchart of encoding the traceability information and storing it in a database in the present invention;

[0063] Figure 4 The flowchart of the present invention is a method for evaluating the quality of copper products based on the quality evaluation coefficient. DETAILED DESCRIPTION

[0064] The technical solution of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0065] See also Figure 1-Figure 4 , the first aspect of the present invention provides a copper product quality defect tracing system and method, including: a data acquisition module, a data processing module, a quality detection module and a defect tracing module;

[0066] Data acquisition module: used to obtain basic information of copper products and collect sample images of copper products; obtain surface defect features in sample images through image recognition technology; measure performance data of copper products through experiments; among which, basic information includes raw material information, processing information and transportation information; surface defect features include the area proportion corresponding to pore defects, crack defects, rust defects and tolerance defects; performance data include tensile strength, yield strength, hardness and conductivity;

[0067] Data processing module: used to calculate the quality assessment coefficient based on surface defect characteristics and performance data; integrate the quality assessment coefficient and basic information into traceability information; encode the traceability information based on the encoding algorithm and store it in the database;

[0068] Quality inspection module: used to conduct quality assessment on copper products based on the quality assessment coefficient and the preset assessment threshold interval to obtain quality assessment results; wherein the quality assessment results include high quality, qualified and defective;

[0069] Defect traceability module: used to trace defects of copper products based on quality assessment results and traceability codes.

[0070] In this embodiment, the data processing module communicates with and / or is electrically connected to the data acquisition module, the quality inspection module, and the defect tracing module respectively.

[0071] In this embodiment, the quality assessment coefficient is calculated based on the surface defect characteristics and performance data, including:

[0072] A1: Extract surface defect characteristics and performance data;

[0073] A2: Calculate the first evaluation coefficient PX1 based on the surface defect characteristics;

[0074] A3: Calculate a second evaluation coefficient PX2 based on the performance data;

[0075] A4: The quality assessment coefficient ZPX is calculated by the formula ZPX=(a×PX2) / (b×PX1+c); wherein a and b are proportional coefficients greater than 0, and c is a constant greater than 0 and less than 1.

[0076] Exemplarily, it is set that a=1.2, b=1, c=0.1, the first evaluation coefficient PX1=39.6, and the second evaluation coefficient PX2=48.885; the quality evaluation coefficient ZPX≈1.48 is calculated by the formula.

[0077] In this embodiment, the first evaluation coefficient PX1 is calculated based on the surface defect characteristics, including:

[0078] Extract surface defect features; calculate the first evaluation coefficient PX1 by the formula PX1=k1×QK+k2×LW+k3×XS+k4×GC; wherein, QK is the area ratio of pore defects, LW is the area ratio of crack defects, XS is the area ratio of rust defects, GC is the area ratio of tolerance defects, and k1, k2, k3, and k4 are proportional coefficients greater than 0.

[0079] Exemplarily, k1=1000, k2=1200, k3=900, k4=1500 are set, the area proportion of porosity defects is QK=0.3%, the area proportion of crack defects is LW=0.8%, the area proportion of rust defects is XS=2%, and the area proportion of tolerance defects is GC=0.6%; the first evaluation coefficient PX1=39.6 is calculated by the formula.

[0080] The present invention obtains surface defect characteristics of copper products, including area proportions corresponding to pore defects, crack defects, corrosion defects and tolerance defects, and multiplies each surface defect characteristic by a corresponding proportional coefficient to obtain a first evaluation coefficient, which can accurately reflect the surface defect conditions of the copper products, thereby facilitating improving the accuracy of tracing the quality defects of the copper products.

[0081] In this embodiment, the second evaluation coefficient PX2 is calculated based on the performance data, including:

[0082] C1: Extract tensile strength, yield strength, hardness and conductivity from performance data;

[0083] C2: The tensile strength in the performance data is marked as XN1, the yield strength is marked as XN2, the hardness is marked as XN3 and the conductivity is marked as XN4;

[0084] C3: Calculate the performance compliance rate based on performance data and preset performance standards;

[0085] C4: The second evaluation coefficient PX2 is calculated by the formula PX2=h1×DBL1+h2×DBL2+h3×DBL3+h4×DBL4; wherein DBL1 is the performance compliance rate corresponding to tensile strength, DBL2 is the performance compliance rate corresponding to yield strength, DBL3 is the performance compliance rate corresponding to hardness, DBL4 is the performance compliance rate corresponding to conductivity, and h1, h2, h3, and h4 are proportional coefficients greater than 0.

[0086] Exemplarily, set h1=12, h2=12, h3=11, h4=15, the performance compliance rate DBL1 corresponding to the tensile strength is 93%, the performance compliance rate DBL2 corresponding to the yield strength is 100%, the performance compliance rate DBL3 corresponding to the hardness is 97.5%, and the performance compliance rate DBL4 corresponding to the conductivity is 100%; the second evaluation coefficient PX2=48.885 is calculated by the formula.

[0087] The present invention calculates the performance compliance rate according to the performance data and the preset performance standard, and multiplies the performance compliance rate corresponding to each performance data by the corresponding proportional coefficient to obtain the second evaluation coefficient, which can accurately reflect the performance of the copper product, thereby facilitating improving the accuracy of tracing the quality defects of the copper product.

[0088] In this embodiment, the performance compliance rate is calculated based on the performance data and the preset performance standard, including:

[0089] D1: Extract performance data;

[0090] D2: Set the performance standards corresponding to each performance data;

[0091] D3: By formula The compliance rate DBLi corresponding to the i-th performance data is calculated; wherein XNi is the value of the i-th performance data, and XBi is the performance standard corresponding to the i-th performance data; i=1, 2, ..., 4.

[0092] For example, it is assumed that in the performance data, the tensile strength XN1=280MPa, the yield strength XN2=103MPa, the hardness XN3=78, and the conductivity XN4=1.67×10^-8Ω·m;

[0093] The performance standard corresponding to the tensile strength is set to XB1 = ​​300 MPa, the performance standard corresponding to the yield strength is set to XB2 = 100 MPa, the performance standard corresponding to the hardness is set to XB3 = 80, and the performance standard corresponding to the conductivity is set to XB4 = 1.65 × 10^-8Ω·m;

[0094] By calculating through the formula, the performance compliance rate corresponding to the tensile strength is DBL1s≈93%, the performance compliance rate corresponding to the yield strength is DBL2=100%, the performance compliance rate corresponding to the hardness is DBL3=97.5%, and the performance compliance rate corresponding to the conductivity is DBL4=100%.

[0095] It should be noted that the hardness of the copper product in this embodiment is expressed by Vickers hardness.

[0096] In this embodiment, the traceability information is encoded based on the encoding algorithm and stored in the database, including:

[0097] E1: Extract traceability information and obtain the current timestamp;

[0098] E2: Generate a unique serial number based on the current timestamp;

[0099] E3: Encrypt the unique serial number based on an encryption algorithm to obtain a traceability code; the encryption algorithm includes an AES algorithm and an RSA algorithm;

[0100] E4: Bind the traceability code with the traceability information to obtain a mapping relationship;

[0101] E5: Store the traceability code, traceability information and mapping relationship into the database.

[0102] The present invention can ensure the uniqueness of the generated traceability code by generating a unique serial number according to the current timestamp, and encrypts the unique serial number through an encryption algorithm to obtain the traceability code, so that the generated traceability code is difficult to be stolen, which is beneficial to improving the security of tracing the quality defects of copper products.

[0103] In this embodiment, the quality assessment of the copper product is performed based on the quality assessment coefficient and the preset assessment threshold interval, including:

[0104] T1: Extraction quality assessment coefficient ZPX;

[0105] T2: Set the evaluation threshold interval [PY1, PY2]; where PY1 <PY2;

[0106] T3: Determine whether the quality assessment coefficient ZPX is within the assessment threshold interval [PY1, PY2]; if yes, mark the quality assessment result as normal; if not, jump to T4;

[0107] T4: Determine whether the quality assessment coefficient ZPX is greater than PY2; if yes, mark the quality assessment result as high quality; if no, mark the quality assessment result as defective.

[0108] Exemplarily, the quality assessment coefficient ZPX is set to 1.48, and the assessment threshold interval [PY1, PY2] is set to [1.3, 1.6]; since the quality assessment coefficient ZPX is within the assessment threshold interval [PY1, PY2], the quality assessment result is marked as normal.

[0109] In this embodiment, defect tracing of copper products is performed based on the quality assessment results and the traceability code, including:

[0110] Z1: Extract quality assessment results;

[0111] Z2: Determine whether the quality assessment result is a defect; if yes, jump to Z3; if no, jump to Z1;

[0112] Z3: Input the traceability code into the database query to obtain the quality assessment coefficient and basic information of the copper product.

[0113] Exemplarily, the quality assessment result is set to defect, and jump to Z3; the traceability code is input into the database query to obtain the quality assessment coefficient and basic information of the copper product.

[0114] A second aspect of the present invention provides a method for tracing quality defects of copper products, comprising:

[0115] S1: Obtain basic information of copper products and collect sample images of copper products;

[0116] S2: Obtain surface defect features in sample images through image recognition technology;

[0117] S3: Measure the performance data of copper products through experiments;

[0118] S4: Calculate the quality assessment coefficient based on surface defect characteristics and performance data;

[0119] S5: Integrate the quality assessment coefficient and basic information into traceability information;

[0120] S6: Encode the traceability information based on the encoding algorithm and store it in the database;

[0121] S7: Performing quality assessment on the copper product based on the quality assessment coefficient and a preset assessment threshold interval to obtain a quality assessment result;

[0122] S8: Conduct defect traceability of copper products based on quality assessment results and traceability codes.

[0123] Part of the data in the above formula is calculated by removing the dimension and taking its numerical value. The formula is a formula closest to the actual situation obtained by software simulation of a large amount of collected data; the preset parameters and preset thresholds in the formula are set by technical personnel in this field according to actual conditions or obtained through simulation of a large amount of data.

[0124] Working principle of the present invention:

[0125] The present invention obtains basic information of copper products and collects sample images of copper products; obtains surface defect features in sample images through image recognition technology; measures performance data of copper products through experiments; calculates quality assessment coefficients based on surface defect features and performance data; integrates the quality assessment coefficients and basic information into traceability information; encodes the traceability information based on a coding algorithm and stores it in a database; conducts quality assessment on copper products based on the quality assessment coefficients and a preset assessment threshold interval to obtain quality assessment results; and conducts defect traceability on copper products based on the quality assessment results and traceability codes.

[0126] The above embodiments are only used to illustrate the technical method of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical method of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical method of the present invention.

Claims

1. A copper product quality defect traceability system, comprising: Data acquisition module, data processing module, quality inspection module and defect tracing module; characterized in that, The data acquisition module is used to obtain basic information of copper products and collect sample images of copper products; obtain surface defect features in sample images through image recognition technology; and measure performance data of copper products through experiments; wherein the basic information includes raw material information, processing information and transportation information; the surface defect features include the area proportions corresponding to pore defects, crack defects, rust defects and tolerance defects; and the performance data include tensile strength, yield strength, hardness and conductivity; The data processing module is used to calculate the quality assessment coefficient based on the surface defect characteristics and performance data; integrate the quality assessment coefficient and basic information into traceability information; encode the traceability information based on the encoding algorithm and store it in the database; The quality inspection module is used to perform quality assessment on the copper product based on the quality assessment coefficient and the preset assessment threshold interval to obtain a quality assessment result; wherein the quality assessment result includes high quality, qualified and defective; The defect tracing module is used to trace defects of copper products based on quality assessment results and traceability codes.

2. A copper product quality defect tracing system according to claim 1, characterized in that: The data processing module is in communication and / or electrically connected with the data acquisition module, the quality inspection module, and the defect tracing module respectively.

3. A copper product quality defect tracing system according to claim 1, characterized in that: The quality assessment coefficient is calculated based on the surface defect characteristics and performance data, including: A1: Extract surface defect characteristics and performance data; A2: Calculate the first evaluation coefficient PX1 based on the surface defect characteristics; A3: Calculate a second evaluation coefficient PX2 based on the performance data; A4: The quality assessment coefficient ZPX is calculated by the formula ZPX=(a×PX2) / (b×PX1+c); wherein a and b are proportional coefficients greater than 0, and c is a constant greater than 0 and less than 1.

4. A copper product quality defect tracing system according to claim 3, characterized in that: The calculating of the first evaluation coefficient PX1 based on the surface defect characteristics comprises: Extract surface defect features; calculate the first evaluation coefficient PX1 by the formula PX1=k1×QK+k2×LW+k3×XS+k4×GC; wherein, QK is the area ratio of pore defects, LW is the area ratio of crack defects, XS is the area ratio of rust defects, GC is the area ratio of tolerance defects, and k1, k2, k3, and k4 are proportional coefficients greater than 0.

5. A copper product quality defect tracing system according to claim 3, characterized in that: The calculating of the second evaluation coefficient PX2 based on the performance data comprises: C1: Extract tensile strength, yield strength, hardness and conductivity from performance data; C2: The tensile strength in the performance data is marked as XN1, the yield strength is marked as XN2, the hardness is marked as XN3 and the conductivity is marked as XN4; C3: Calculate the performance compliance rate based on performance data and preset performance standards; C4: The second evaluation coefficient PX2 is calculated by the formula PX2=h1×DBL1+h2×DBL2+h3×DBL3+h4×DBL4; wherein DBL1 is the performance compliance rate corresponding to tensile strength, DBL2 is the performance compliance rate corresponding to yield strength, DBL3 is the performance compliance rate corresponding to hardness, DBL4 is the performance compliance rate corresponding to conductivity, and h1, h2, h3, and h4 are proportional coefficients greater than 0.

6. A copper product quality defect tracing system according to claim 5, characterized in that: The calculation of the performance compliance rate based on the performance data and the preset performance standard includes: D1: Extract performance data; D2: Set the performance standards corresponding to each performance data; D3: By formula The compliance rate DBLi corresponding to the i-th performance data is calculated; wherein XNi is the value of the i-th performance data, and XBi is the performance standard corresponding to the i-th performance data; i=1, 2, ..., 4.

7. A copper product quality defect tracing system according to claim 1, characterized in that: The step of encoding the traceability information based on the encoding algorithm and storing it in the database includes: E1: Extract traceability information and obtain the current timestamp; E2: Generate a unique serial number based on the current timestamp; E3: Encrypt the unique serial number based on an encryption algorithm to obtain a traceability code; the encryption algorithm includes an AES algorithm and an RSA algorithm; E4: Bind the traceability code with the traceability information to obtain a mapping relationship; E5: Store the traceability code, traceability information and mapping relationship into the database.

8. A copper product quality defect tracing system according to claim 1, characterized in that: The quality assessment of the copper product based on the quality assessment coefficient and the preset assessment threshold interval includes: T1: Extraction quality assessment coefficient ZPX; T2: Set the evaluation threshold interval [PY1, PY2]; where PY1 <PY2; T3: Determine whether the quality assessment coefficient ZPX is within the assessment threshold interval [PY1, PY2]; if yes, mark the quality assessment result as normal; if not, jump to T4; T4: Determine whether the quality assessment coefficient ZPX is greater than PY2; if yes, mark the quality assessment result as high quality; if no, mark the quality assessment result as defective.

9. A copper product quality defect tracing system according to claim 1, characterized in that: The defect tracing of copper products based on the quality assessment results and the traceability code includes: Z1: Extract quality assessment results; Z2: Determine whether the quality assessment result is a defect; if yes, jump to Z3; if no, jump to Z1; Z3: Input the traceability code into the database query to obtain the quality assessment coefficient and basic information of the copper product.

10. A copper product quality defect tracing method, based on the copper product quality defect tracing system according to any one of claims 1 to 9, characterized in that: include: S1: Obtain basic information of copper products and collect sample images of copper products; S2: Obtain surface defect features in sample images through image recognition technology; S3: Measure the performance data of copper products through experiments; S4: Calculate the quality assessment coefficient based on surface defect characteristics and performance data; S5: Integrate the quality assessment coefficient and basic information into traceability information; S6: Encode the traceability information based on the encoding algorithm and store it in the database; S7: Performing quality assessment on the copper product based on the quality assessment coefficient and a preset assessment threshold interval to obtain a quality assessment result; S8: Conduct defect traceability of copper products based on quality assessment results and traceability codes.

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