MEMS inertial navigation equipment batch test method, test system and test device

Abstract

The invention relates to the technical field of MEMS inertial navigation equipment testing, and provides a batch testing method, system and device for MEMS inertial navigation equipment, and the method comprises the following steps: connecting a plurality of sets of to-be-tested MEMS inertial navigation equipment with a test board; collecting output data to obtain test data; preprocessing the test data to obtain initial judgment data; performing abnormal data judgment on the initial judgment data, and performing abnormal data elimination according to a judgment result to obtain process judgment data; filtering processing is carried out on the process judgment data to obtain filtering judgment data; and setting a threshold value according to the calibration condition of the inertial device, and judging the working condition of the MEMS inertial navigation equipment to be detected according to the threshold value and the filtering judgment data. According to the invention, batch testing of the MEMS inertial navigation equipment is realized, the operation is simple, great flexibility and convenience are realized, the influence of errors caused by installation stress and temperature change on testing is reduced, and the testing result is more accurate.

Description

Technical Field

[0001] The present invention relates to the technical field of MEMS inertial navigation equipment testing, and in particular to a MEMS inertial navigation equipment batch testing method, testing system and testing device. Background Art

[0002] MEMS (Micro-Electro-Mechanical-System) sensors consist of a micro-mechanical MEMS chip and an integrated circuit chip. MEMS sensors convert external signals to be sensed into electrical signals and drive the MEMS chip and external communications. Compared with traditional manufacturing processes, MEMS has the advantages of small size, light weight, low power consumption, low cost, high reliability, batch production, easy integration and intelligentization.

[0003] MEMS inertial navigation equipment is small in size and simple in structure. It is generally composed of MEMS gyroscope, MEMS accelerometer, MCU processor and interface conversion chip. The signal measured and output by the MEMS sensor is collected and processed by the MCU and then output by the connector through the interface conversion chip. In the process of testing a single set of equipment, each set of equipment needs to be powered separately, and the output signal line is connected to the conversion box and the host computer through the DB9 plug, and the data of the host computer is used to observe whether the equipment is operating normally. When multiple sets of equipment are tested at the same time, the number of test instruments and equipment required will also increase exponentially; at the same time, before the test, the output cable needs to be welded with the DB plug and connected to the conversion box. As the number increases, the time to make the test tool will also increase accordingly; after the test starts, when observing the operation of the equipment through the host computer, experienced testers are needed to quickly identify whether the equipment is operating normally, which has high requirements for testers. Therefore, for a large number of MEMS inertial navigation equipment, a lot of manpower and material resources are required, and it takes a long time. Summary of the invention

[0004] The present invention aims to solve at least one of the technical problems existing in the related art. To this end, the present invention provides a batch testing method and testing device for MEMS inertial navigation equipment, which can realize simultaneous testing of multiple sets of MEMS inertial navigation equipment.

[0005] The present invention provides a method for batch testing of MEMS inertial navigation equipment, comprising: S1: Connect multiple sets of MEMS inertial navigation devices to be tested to the test board; collect output data of the MEMS inertial navigation devices to be tested through the test board to obtain test data; S2: preprocess the test data to obtain initial judgment data; S3: Perform abnormal data judgment on the initial judgment data, and remove the abnormal data according to the judgment result to obtain process judgment data; S4: Obtaining filtered judgment data by filtering the process judgment data; S5: Set a threshold value according to the calibration condition of the inertial device, and judge the working condition of the MEMS inertial navigation device to be tested according to the threshold value and the filtering judgment data.

[0006] According to a MEMS inertial navigation device batch testing method provided by the present invention, the method further includes step S2, judging the correctness of the test data according to whether the MEMS inertial navigation device to be tested can send data normally, If the MEMS inertial navigation device to be tested can send data normally, the test data is correct and is the initial judgment data; If the MEMS inertial navigation device to be tested cannot send data normally, the test data is wrong, and it is determined that the output of the MEMS inertial navigation device to be tested is abnormal.

[0007] According to a MEMS inertial navigation device batch testing method provided by the present invention, the method further includes, in step S3, using the Grubbs algorithm to remove abnormal data from the initial judgment data, including: S31: Setting significance level ; S32: According to the significance level and sample size , find the critical value of the statistic in the Grubbs statistic table by looking up the table ; S33: Calculate the Grubbs statistic; in, No. Initial judgment data The corresponding Grubbs statistic, is the average value of the initial judgment data, is the mean error of the initial judgment data; S34: abnormal data judgment; like ,but There are significant differences in the distribution of Contains abnormal data, removes the initial judgment data ; like , then the initial judgment data It does not contain abnormal data and is process judgment data.

[0008] According to a MEMS inertial navigation device batch testing method provided by the present invention, the method further includes, in step S4, filtering the process judgment data using a wavelet filtering algorithm. S41: Take the process judgment data as the input signal, decompose the input signal into high-frequency components and low-frequency components through a set of orthogonal wavelet bases, take the low-frequency components as the input signal and perform wavelet decomposition to obtain the high-frequency components and low-frequency components of the next level, take the high-frequency components as the input signal and perform wavelet decomposition to obtain the high-frequency components and low-frequency components of the next level, and repeat this process Decompose the components into different levels; obtain the detail coefficients of each level’s high-frequency components and each level’s low-frequency components; S42: Process the detail coefficients of each level of high-frequency components and each level of low-frequency components through a scaling function. The calculation expression is: in, is the detail coefficient after processing, is the detail coefficient; S43: Reconstruct the judgment data by processing the detail coefficients of each level of high-frequency components and the detail coefficients of each level of low-frequency components to obtain filtered judgment data.

[0009] According to a MEMS inertial navigation device batch testing method provided by the present invention, the method further includes step S5: S51: Set the threshold value according to the calibration of the MEMS inertial navigation device , S52: Obtain reference data according to the technical manual of MEMS inertial navigation equipment ; S53: Data determination based on filtering , Reference Data And the threshold value determines the working condition of the MEMS inertial navigation device to be tested; like , then the filter judgment data is normal, and the MEMS inertial navigation device to be tested is working normally. like , then the filter judgement data is abnormal and the MEMS inertial navigation device to be tested is not working properly.

[0010] The present invention also provides a MEMS inertial navigation device batch testing system, which uses any one of the above-mentioned MEMS inertial navigation device batch testing methods, including: An acquisition module, wherein the acquisition module is used to connect multiple sets of MEMS inertial navigation devices to be tested to the test board; the output data of the MEMS inertial navigation devices to be tested are collected through the test board to obtain test data; A preprocessing module, wherein the preprocessing module preprocesses the test data to obtain initial judgment data; A rejection module, wherein the rejection module performs abnormal data judgment on the initial judgment data, and rejects the abnormal data according to the judgment result to obtain process judgment data; A filtering module, wherein the filtering module obtains filtered judgment data by filtering the process judgment data; The determination module sets a threshold value according to the calibration condition of the inertial device, and determines the working condition of the MEMS inertial navigation device to be tested according to the threshold value and the filtered determination data.

[0011] The present invention also provides a MEMS inertial navigation equipment batch testing device, comprising: A test board, wherein the test board is provided with a plurality of crimping sockets, and the crimping sockets are connected to the MEMS inertial navigation device to be tested via cables; The stacked structure assembly includes a transition plate and a calibration plate, the calibration plate is fixed to the transition plate by screws, and the multiple sets of MEMS inertial navigation devices to be tested are fixed to the calibration plate by screws.

[0012] According to a MEMS inertial navigation equipment batch testing device provided by the present invention, an indicator light is provided on one side of the test board, and the indicator light is connected to the crimping socket.

[0013] According to a MEMS inertial navigation equipment batch testing device provided by the present invention, the calibration plate includes one or more calibration plates, and the multiple calibration plates are stacked and fixed by screws.

[0014] A MEMS inertial navigation device batch testing device provided by the present invention also includes a power supply module and a signal conversion module. The power supply module is used to provide the power required for the test. The signal conversion module is connected to multiple sets of the MEMS inertial navigation devices to be tested, and is used to perform signal conversion, signal isolation and level matching on the MEMS inertial navigation devices to be tested.

[0015] The above one or more technical solutions in the embodiments of the present invention have at least one of the following technical effects: The present invention provides a batch testing method, testing system and testing device for MEMS inertial navigation equipment, which realizes batch testing of MEMS inertial navigation equipment, is simple to operate, has great flexibility and convenience, reduces repetitive cable connections, and reduces testing errors caused by process operations. It reduces the influence of errors caused by installation stress and temperature changes of MEMS inertial navigation equipment on testing, and the test results are more accurate.

[0016] The test method of the present invention has a simple structure, intuitive test results, and can intuitively identify abnormal conditions at different stages. The test device of the present invention has low manufacturing cost and strong scalability.

[0017] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 It is a flow chart of a method for batch testing of MEMS inertial navigation equipment provided by the present invention.

[0020] Figure 2 It is a structural schematic diagram of a batch test of a MEMS inertial navigation device provided by the present invention.

[0021] Figure 3 The present invention provides a schematic diagram of the structure of a single calibration board of a MEMS inertial navigation equipment batch testing device.

[0022] Figure 4 The present invention provides a schematic diagram of the structure of a multi-calibration plate of a MEMS inertial navigation equipment batch testing device.

[0023] Reference numerals: 1. Transition board; 2. Calibration board; 3. Test board; 4. MEMS inertial navigation device to be tested; 5. First screw; 6. Second screw; 7. Crimp socket; 8. Third screw; 9. Cable; 101. Acquisition module; 102. Preprocessing module; 103. Rejection module; 104. Filtering module; 105. Judgment module. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical scheme and advantages of the present invention clearer, the technical scheme in the present invention will be clearly and completely described below. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present invention. The following embodiments are used to illustrate the present invention, but cannot be used to limit the scope of the present invention.

[0025] In the description of the embodiments of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "connected" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present invention can be understood according to specific circumstances.

[0026] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the embodiment of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0027] Combine the following Figures 1 to 4 A batch testing method and a testing device for MEMS inertial navigation equipment of the present invention are described.

[0028] like Figure 1 As shown, a batch testing method for MEMS inertial navigation equipment includes: S1: Multiple sets of MEMS inertial navigation devices to be tested are connected to the test board; the output data of the MEMS inertial navigation devices to be tested are collected through the test board to obtain test data; At room temperature, multiple sets of MEMS inertial navigation devices to be tested are connected to the test board. The MEMS inertial navigation devices to be tested are tested in the zero position state. Test times to get a set of test data , the test data is arranged in descending order ,and It follows a normal distribution. The average value is: in, is the average value of the test data; The error between each test data and the average value of the test data is: in, For the The error between the test data and the average value of the test data; The mean error is: in, is the mean error.

[0029] S2: preprocess the test data to obtain initial judgment data; The correctness of the test data can be determined based on whether the MEMS inertial navigation device under test can send data normally. If the MEMS inertial navigation device to be tested can send data normally, the test data is correct and is the initial judgment data; If the MEMS inertial navigation device to be tested cannot send data normally, the test data is wrong, and it is determined that the output of the MEMS inertial navigation device to be tested is abnormal.

[0030] S3: Perform abnormal data judgment on the initial judgment data, and remove the abnormal data according to the judgment result to obtain process judgment data; The Grubbs algorithm is used to remove abnormal data from the initial judgment data, including: S31: Setting significance level ; S32: According to the significance level and sample size , find the critical value of the statistic in the Grubbs statistic table by looking up the table ; at this time, for The value that should not appear when following a normal distribution, where is the probability, that is, the abnormal data that should be eliminated; the Grubbs statistic table can be obtained from the Internet or the tool manual; the Grubbs statistic table is shown in Table 1. Table 1 Grubbs statistic S33: Calculate the Grubbs statistic; in, No. Initial judgment data The corresponding Grubbs statistic, is the average value of the initial judgment data, is the mean error of the initial judgment data; S34: abnormal data judgment; like ,but There are significant differences in the distribution of Contains abnormal data, removes the initial judgment data ; like , then the initial judgment data It does not contain abnormal data and is process judgment data.

[0031] The Grubbs algorithm is used to eliminate abnormal data output by the equipment at the initial stage of operation due to installation stress, avoiding the influence of individual abnormal data on the overall operation status judgment of the equipment.

[0032] S4: Obtaining filtered judgment data by filtering the process judgment data; Due to the influence of temperature changes, environmental magnetic fields, etc., the output signal contains noise, which makes it difficult to identify the real data output, leading to wrong conclusions. Therefore, it is necessary to filter the data after removing abnormal data; The wavelet filtering algorithm is used to filter the process judgment data, and the wavelet transform is: in, is the wavelet function, is the scale parameter, is the translation parameter, is the wavelet coefficient, is the input signal, For time; S41: Take the process judgment data as the input signal, decompose the input signal into high-frequency components and low-frequency components through a set of orthogonal wavelet bases, take the low-frequency components as the input signal and perform wavelet decomposition to obtain the high-frequency components and low-frequency components of the next level, take the high-frequency components as the input signal and perform wavelet decomposition to obtain the high-frequency components and low-frequency components of the next level, and repeat this process Decompose the components into different levels; obtain the detail coefficients of each level’s high-frequency components and each level’s low-frequency components; S42: Process the detail coefficients of each level of high-frequency components and each level of low-frequency components through a scaling function. The calculation expression is: in, is the detail coefficient after processing, is the detail coefficient; S43: reconstructing the judgment data through the processed detail coefficients of each level of high frequency components and each level of low frequency components to obtain filtered judgment data; The high-frequency and low-frequency components with zero detail coefficients after processing are noise items and are filtered out; The high-frequency components and low-frequency components with a detail coefficient of 1 after processing are normal items and constitute the filtering judgment data.

[0033] The noise in the device output data is filtered through the wavelet filtering algorithm to reduce the impact of noise on the judgment of the device operation status.

[0034] S5: setting a threshold value according to the calibration of the inertial device, and judging the working condition of the MEMS inertial navigation device to be tested according to the threshold value and the filter judgment data; S51: Set the threshold value according to the calibration of the MEMS inertial navigation device ; After the MEMS inertial navigation device is calibrated, the working range under normal working conditions is set as the threshold; S52: Obtain reference data according to the technical manual of MEMS inertial navigation equipment ; Obtain reference data by consulting the technical manual of the MEMS inertial navigation device ; S53: Data determination based on filtering , Reference Data And the threshold value determines the working condition of the MEMS inertial navigation device to be tested; like , then the filter judgment data is normal, and the MEMS inertial navigation device to be tested is working normally. like , then the filter judgment data is normal, and the MEMS inertial navigation device to be tested is not working properly.

[0035] A MEMS inertial navigation device batch testing system, using the above-mentioned MEMS inertial navigation device batch testing method, comprises: The acquisition module 101 is used to connect multiple sets of MEMS inertial navigation devices to be tested to the test board; the output data of the MEMS inertial navigation devices to be tested are collected through the test board to obtain test data; The preprocessing module 102 preprocesses the test data to obtain initial judgment data; The elimination module 103 performs abnormal data judgment on the initial judgment data, and eliminates the abnormal data according to the judgment result to obtain process judgment data; The filtering module 104 obtains filtered judgment data by filtering the process judgment data; The determination module 105 sets a threshold value according to the calibration condition of the inertial device, and determines the working condition of the MEMS inertial navigation device to be tested according to the threshold value and filtering.

[0036] Through the coordinated work of the above modules, batch testing of MEMS inertial navigation equipment can be achieved, which is simple to operate, has great flexibility and convenience, reduces repetitive cable connections, reduces test errors caused by process operations, and reduces the impact of errors caused by installation stress and temperature changes on MEMS inertial navigation equipment on testing, making the test results more accurate.

[0037] A MEMS inertial navigation device batch testing device, using the above-mentioned MEMS inertial navigation device batch testing method, comprises: The test board 3 is provided with a plurality of crimping sockets 7, which are connected to the MEMS inertial navigation device 4 to be tested via cables 9; the test board 3 realizes signal acquisition and processing; an expandable area is provided on the periphery of the test board 3, and the expansion design is performed according to the actual number of tests, and the crimping socket 7 is provided with a cable connector that matches the connector of the MEMS inertial navigation device 4 to be tested, and when accessing the device, it is only necessary to plug the connectors together.

[0038] The superimposed structure assembly includes a transition plate 1 and a calibration plate 2. The calibration plate 2 is fixed to the transition plate 1 by a first screw 5. Multiple sets of MEMS inertial navigation devices 4 to be tested are fixed to the calibration plate 2 by screws. The test plate 3 is fixed to any side of the calibration plate 2 by a third screw 8.

[0039] There are one or more calibration plates 2 , and the multiple calibration plates are stacked and fixed by second screws 6 .

[0040] By superimposing structural components, batch testing of multiple sets of MEMS inertial navigation devices to be tested is achieved.

[0041] An indicator light is provided on one side of the test board 3 , and the indicator light is connected to the crimping socket 7 .

[0042] The indicator light is connected to the crimping socket 7 to indicate the operating status of the MEMS inertial navigation device 4 to be tested. The indicator light is placed on the edge of the test board 3 to facilitate observation by testers.

[0043] In some embodiments of the present invention, the indicator light is a three-color indicator light. During the signal preprocessing process, if the MEMS inertial navigation device 4 to be tested cannot send data normally, the red light corresponding to the MEMS inertial navigation device 4 to be tested will light up; if the preprocessing judgment is correct and the signal processing shows that the operation is abnormal, the yellow light corresponding to the MEMS inertial navigation device 4 to be tested will light up; if there is no problem with the output of the MEMS inertial navigation device 4 to be tested, the green light will light up, thereby the operating status of the MEMS inertial navigation device 4 to be tested can be intuitively judged according to the display color of the indicator light.

[0044] The power supply module is used to provide the power required for the test. The power supply module can realize wide voltage input. When multiple sets of MEMS inertial navigation devices 4 to be tested are tested, only one voltage-stabilized power supply is needed to realize simultaneous power supply of multiple sets of MEMS inertial navigation devices 4 to be tested and the test board; the signal conversion module is connected to the multiple sets of MEMS inertial navigation devices 4 to be tested, and is used to perform signal conversion, signal isolation and level matching on the MEMS inertial navigation devices 4 to be tested.

[0045] The present invention provides a batch testing method, testing system and testing device for MEMS inertial navigation equipment, which realizes batch testing of MEMS inertial navigation equipment, is simple to operate, has great flexibility and convenience, reduces repetitive cable connections, and reduces testing errors caused by process operations. It reduces the influence of errors caused by installation stress and temperature changes of MEMS inertial navigation equipment on testing, and the test results are more accurate.

[0046] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for batch testing of MEMS inertial navigation equipment, characterized in that: include: S1: Connect multiple sets of MEMS inertial navigation devices to be tested to the test board; collect output data of the MEMS inertial navigation devices to be tested through the test board to obtain test data; S2: preprocess the test data to obtain initial judgment data; S3: Perform abnormal data judgment on the initial judgment data, and remove the abnormal data according to the judgment result to obtain process judgment data; S4: Obtaining filtered judgment data by filtering the process judgment data; S5: Set a threshold value according to the calibration condition of the inertial device, and judge the working condition of the MEMS inertial navigation device to be tested according to the threshold value and the filtering judgment data.

2. A method for batch testing of MEMS inertial navigation equipment according to claim 1, characterized in that: In step S2, the correctness of the test data is determined based on whether the MEMS inertial navigation device to be tested can send data normally. If the MEMS inertial navigation device to be tested can send data normally, the test data is correct and is the initial judgment data; If the MEMS inertial navigation device to be tested cannot send data normally, the test data is wrong, and it is determined that the output of the MEMS inertial navigation device to be tested is abnormal.

3. A method for batch testing of MEMS inertial navigation equipment according to claim 1, characterized in that: In step S3, the Grubbs algorithm is used to remove abnormal data from the initial judgment data, including: S31: Setting significance level ; S32: According to the significance level and sample size , find the critical value of the statistic in the Grubbs statistic table by looking up the table ; S33: Calculate the Grubbs statistic; in, No. Initial judgment data The corresponding Grubbs statistic, is the average value of the initial judgment data, is the mean error of the initial judgment data; S34: abnormal data judgment; like ,but There are significant differences in the distribution of Contains abnormal data, removes the initial judgment data ; like , then the initial judgment data It does not contain abnormal data and is process judgment data.

4. A method for batch testing of MEMS inertial navigation equipment according to claim 1, characterized in that: In step S4, the process judgment data is filtered using the wavelet filtering algorithm. S41: Take the process judgment data as the input signal, decompose the input signal into high-frequency components and low-frequency components through a set of orthogonal wavelet bases, take the low-frequency components as the input signal and perform wavelet decomposition to obtain the high-frequency components and low-frequency components of the next level, take the high-frequency components as the input signal and perform wavelet decomposition to obtain the high-frequency components and low-frequency components of the next level, and repeat this process Decompose the components into different levels; obtain the detail coefficients of each level’s high-frequency components and each level’s low-frequency components; S42: Process the detail coefficients of each level of high-frequency components and each level of low-frequency components through a scaling function. The calculation expression is: in, is the detail coefficient after processing, is the detail coefficient; S43: Reconstruct the judgment data by processing the detail coefficients of each level of high-frequency components and the detail coefficients of each level of low-frequency components to obtain filtered judgment data.

5. A method for batch testing of MEMS inertial navigation equipment according to claim 1, characterized in that: In step S5, S51: Set the threshold value according to the calibration of the MEMS inertial navigation device , S52: Obtain reference data according to the technical manual of MEMS inertial navigation equipment ; S53: Data determination based on filtering , Reference Data And the threshold Determine the working condition of the MEMS inertial navigation device to be tested; like , then the filter judgment data is normal, and the MEMS inertial navigation device to be tested is working normally. like , then the filter judgement data is abnormal and the MEMS inertial navigation device to be tested is not working properly.

6. A MEMS inertial navigation device batch testing system, applying a MEMS inertial navigation device batch testing method according to any one of claims 1 to 5, characterized in that: include: An acquisition module, which is used to connect multiple sets of MEMS inertial navigation devices to be tested to the test board; The test board collects the output data of the MEMS inertial navigation device to be tested to obtain the test data; A preprocessing module, wherein the preprocessing module preprocesses the test data to obtain initial judgment data; A rejection module, wherein the rejection module performs abnormal data judgment on the initial judgment data, and rejects the abnormal data according to the judgment result to obtain process judgment data; A filtering module, wherein the filtering module obtains filtered judgment data by filtering the process judgment data; The determination module sets a threshold value according to the calibration condition of the inertial device, and determines the working condition of the MEMS inertial navigation device to be tested according to the threshold value and the filtered determination data.

7. A MEMS inertial navigation device batch testing device, using a MEMS inertial navigation device batch testing method according to any one of claims 1 to 5, characterized in that: include: A test board, wherein the test board is provided with a plurality of crimping sockets, and the crimping sockets are connected to the MEMS inertial navigation device to be tested via cables; The stacked structure assembly includes a transition plate and a calibration plate, the calibration plate is fixed to the transition plate by screws, and the multiple sets of MEMS inertial navigation devices to be tested are fixed to the calibration plate by screws.

8. A MEMS inertial navigation equipment batch testing device according to claim 7, characterized in that: An indicator light is provided on one side of the test board, and the indicator light is connected to the crimping socket.

9. A MEMS inertial navigation equipment batch testing device according to claim 7, characterized in that: There are one or more calibration plates, and the multiple calibration plates are stacked and fixed by screws.

10. A MEMS inertial navigation equipment batch testing device according to claim 7, characterized in that: It also includes a power module and a signal conversion module. The power module is used to provide power required for the test. The signal conversion module is connected to multiple sets of the MEMS inertial navigation devices to be tested, and is used to perform signal conversion, signal isolation and level matching on the MEMS inertial navigation devices to be tested.

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