Multi-channel Sampled Value Consistency Calibration Method and System for Power System Devices

Abstract

The present invention relates to the technical field of power system devices, and provides a multi-channel sampled value consistency correction method and system for power system devices. The method includes: grouping the same type of channels in the device for testing, and designating a reference channel for the test group; designating the only reference channel of the same type in the device; designating the only reference channel of the device; calculating the first relative value of all channels within the test group; calculating the second relative value of all channels of the same type; calculating the modulus relative value in the third relative value of all channels of the same type; calculating the phase difference in the third relative value of all channels of the same type; calculating the relative time difference; storing the third relative value of each channel and the relative time difference of each channel as correction parameters; calculating the sampled value after consistency correction; and calculating the phasor value after consistency correction. The present invention can effectively solve the problem of inconsistent multi-channel sampled values of power system devices.

Description

Technical Field

[0001] The present invention relates to the technical field of power system devices, and particularly to a multi-channel sampled value consistency correction method and system for power system devices. Background Art

[0002] The device converts analog signals into digital signals through digital sampling. Digital sampling includes links such as analog quantity transformation, filtering, and analog-to-digital conversion circuits. There are certain errors in each link. The small CT and VT inside the device are respectively used for the current analog quantity transformation and voltage analog quantity transformation links, and their errors are more difficult to accurately control. The product standard of power system relay protection devices stipulates that the accuracy requirements for a single current analog quantity channel are that the angular difference is not greater than ±60', the amplitude relative error is not greater than 2.5%, or the absolute error is not greater than 0.02 times the rated value, which is the highest level that can be achieved in the current production process control. In the functions that require multi-channel sampled values to participate in calculations in the device, the sampled values of multiple channels should achieve the best consistency with each other. Otherwise, the inconsistency caused by only limitedly controlling the discreteness of the accuracy of a single channel will have an adverse impact on the function. For example, in the differential protection function in the device, the unbalanced current should be as small as possible during normal operation. Due to the fact that the consistency of the analog quantity channels in the device currently cannot achieve the best, in engineering applications, the unbalanced current often shows a large value. First, the operating personnel are very confused about this. Second, it leads to a large setting value of the unbalanced current alarm threshold, and faults with non-obvious abnormal characteristics of the analog quantity channels cannot be detected. Third, the performance of the differential protection function deteriorates. Therefore, the problem of inconsistency needs to be solved urgently. Moreover, with the rapid development of new power systems, the adaptability of the device faces severe challenges, and the severity of the inconsistency problem becomes more prominent. There is currently no relevant economic and practical technology on how to economically and efficiently achieve the best consistency of multi-channel sampled values of the device under economic constraint conditions to ensure the safe and stable operation of the power system. Summary of the Invention

[0003] The purpose of the present invention is to solve at least one technical problem in the background art and provide a multi-channel sampled value consistency correction method and system for power system devices.

[0004] To achieve the above purpose, the present invention provides a multi-channel sampled value consistency correction method for power system devices, including:

[0005] Group the same-type channels in the device for experiments and specify one channel in each experimental group as the experimental group reference channel;

[0006] Specify one channel among all the same-type channels in the device as the same-type unique reference channel;

[0007] Specify one channel in the device as the device unique reference channel;

[0008] Apply a fixed excitation quantity to each test group, and calculate the first relative value of all channels within the test group, where the reference for the first relative value is the reference channel of the test group;

[0009] Based on the first relative value and the phasor values of all channels within the test group at the same time saved during the calculation of the first relative value, calculate the second relative value of all channels within the same type, where the reference for the second relative value is the unique reference channel of the same type;

[0010] Based on the modulus relative value in the second relative value and the excitation quantity of a fixed value applied to each unique reference channel of the same type, calculate the modulus relative value in the third relative value of all channels within the same type, where the reference for the modulus relative value in the third relative value is the excitation quantity of the fixed value applied;

[0011] Based on the phase difference in the second relative value and the excitation quantity of a fixed value applied to the unique reference channel of the same type and the unique reference channel of the device simultaneously, calculate the phase difference in the third relative value of all channels within the same type, where the reference for the phase difference in the third relative value is the unique reference channel of the device;

[0012] Based on the phase difference in the third relative value and the frequency parameter of the excitation quantity of the fixed value applied, calculate the relative time difference;

[0013] Store the third relative value of each channel and the relative time difference of each channel as calibration parameters;

[0014] Based on the calibration parameters, perform consistency calibration calculation on the original sampling values of each channel to obtain the sampling values after consistency calibration;

[0015] Based on the calibration parameters, perform consistency calibration calculation on the original phasor values of each channel to obtain the phasor values after consistency calibration.

[0016] According to one aspect of the present invention, the test grouping of the same type of channels in the device includes:

[0017] The number of test groups is greater than or equal to 1;

[0018] Any two test groups of the same type of channels can be connected through a common channel or through the transition of other test groups and common channels;

[0019] The number of channels in each test group is greater than or equal to 2 and less than or equal to the maximum value of the number of channels in the same type of test groups.

[0020] According to one aspect of the present invention, applying a fixed excitation quantity to each test group includes:

[0021] If the channels within a test group are of the current analog channel type, the small CTs of all the current analog channels within the test group are connected end to end in series, ensuring that all inputs are of the same polarity. The current output of the test instrument is connected to the head and tail ends of the series-connected small CTs to apply an excitation quantity of a fixed value.

[0022] According to one aspect of the present invention, applying an excitation quantity of a fixed value to each test group further includes:

[0023] If the channels within a test group are of the voltage analog channel type, the small VTs of all the voltage analog channels within the test group are connected in parallel, ensuring that all inputs are of the same polarity. The voltage output of the test instrument is connected to the head and tail ends of the parallel-connected small VTs to apply an excitation quantity of a fixed value.

[0024] According to one aspect of the present invention, applying an excitation quantity of a fixed value to each test group and calculating the first relative values of all the channels within the test group includes:

[0025] After applying the correct excitation quantity to the corresponding test group, select to enter the calculation process of the correction parameters for the consistency correction of the corresponding test group;

[0026] Calculate and save the phasor values of all the channels within the corresponding test group at the same moment using the original sampling values;

[0027] Determine whether the modulus values of the phasor values of all the channels within the corresponding test group are within the range of the applied excitation quantity of a fixed value;

[0028] If so, taking the reference channel of the corresponding test group as the reference, calculate the first relative values of all the channels within the corresponding test group relative to the reference using the phasor values;

[0029] Determine whether the first relative values of all the channels within the corresponding test group are within a reasonable range;

[0030] If so, the first relative values can be used.

[0031] According to one aspect of the present invention, the range of the excitation quantity of a fixed value applied to each test group is:

[0032] [(1 - W F ) * I e1 * K1, (1 + W F ) * I e1 * K2];

[0033] Wherein, W F is the percentage limit of the channel ratio difference of the device, I e1 is the effective value of the excitation quantity of a fixed value applied to the test group, K1 is the lower limit reliability coefficient of the modulus range; K2 is the upper limit reliability coefficient of the modulus range.

[0034] According to one aspect of the present invention, the value range of the lower limit reliability coefficient K1 of the modulus value range is: 0.8 ≤ K1 ≤ 0.98.

[0035] According to one aspect of the present invention, the value range of the upper limit reliability coefficient K2 of the modulus value range is: 1.02 ≤ K2 ≤ 1.2.

[0036] According to one aspect of the present invention, it is characterized in that the reasonable range includes:

[0037] Specific reasonable range of the relative value of the modulus value:

[0038] Wherein, W F is the percentage of the channel ratio difference limit value of the device, K3 is the lower limit reliability coefficient of the relative value of the modulus value; K4 is the upper limit reliability coefficient of the relative value of the modulus value.

[0039] According to one aspect of the present invention, the value range of the lower limit reliability coefficient K3 of the relative value of the modulus value is: 0.9 ≤ K3 ≤ 0.98.

[0040] According to one aspect of the present invention, the value range of the upper limit reliability coefficient K4 of the relative value of the modulus value is: 1.02 ≤ K4 ≤ 1.1.

[0041] According to one aspect of the present invention, the reasonable range further includes:

[0042] Specific reasonable range of the phase difference: ≤ 2 * W Δθ * K5;

[0043] Wherein, K5 is the reliability coefficient of the phase difference range; W Δθ is the channel phase difference limit value of the device.

[0044] According to one aspect of the present invention, the value range of the reliability coefficient K5 of the phase difference range is: 1.01 ≤ K5 ≤ 1.1.

[0045] According to one aspect of the present invention, when calculating the second relative value, the following operations are respectively performed on the test groups:

[0046] Based on the phasor values of all channels at the same moment within the test group saved during the calculation process of the first relative value, calculate the relative value between the reference channel of the test group and the only reference channel of the same type; if the reference channel of the test group and the only reference channel of the same type are not in the same test group, it is necessary to perform superposition calculation through the connection of the common channels between the test groups to obtain the relative value between the reference channel of the test group and the only reference channel of the same type;

[0047] Calculate the second relative value of all channels within the test group using the relative value between the test group reference channel and the same-type unique reference channel and the first relative value.

[0048] According to one aspect of the present invention, the superposition calculation includes:

[0049] Step 1: Use the phasor values of all channels within the saved test group at the same time to calculate the relative value between the test group reference channel and the common channel of another test group having a common channel with it;

[0050] Step 2: Determine whether the other test group contains a same-type unique reference channel;

[0051] Step 3: If so, use the phasor values of all channels within the saved other test group at the same time to calculate the relative value between the common channel of the other test group and the same-type unique reference channel in the other test group; superimpose and calculate all the relative values connected through the common channel to obtain the relative value between the test group reference channel and the same-type unique reference channel, and the superposition calculation ends;

[0052] Step 4: If not, use the phasor values of all channels within the saved other test group at the same time to calculate the relative value between the common channel of the other test group and the common channel of a third test group having a common channel with it;

[0053] Step 5: Repeat Steps 2 - 4 for iterative calculation to obtain the corresponding relative value.

[0054] According to one aspect of the present invention, the calculation of the relative time difference includes:

[0055] Find the channel with the minimum phase difference among the third relative values in all channels;

[0056] Taking the channel with the minimum value as the reference, calculate the phase difference of all channels relative to the reference;

[0057] Use the frequency parameter of the excitation amount of the applied fixed value to convert the phase difference relative to the channel with the minimum value as the reference into a relative time difference.

[0058] According to one aspect of the present invention, when calculating the modulus relative value in the third relative value, the following operations are respectively performed on the same-type unique reference channels:

[0059] After applying the correct excitation amount to the corresponding same-type unique reference channel, select to enter the calculation process of the correction parameter of the modulus of the corresponding same-type unique reference channel;

[0060] Calculate the effective value of the corresponding unique reference channel of the same type, and calculate the relative modulus value between the effective value and the excitation amount of the applied fixed value for the corresponding unique reference channel of the same type;

[0061] Determine whether the relative modulus value is within a reasonable range;

[0062] If so, use the relative modulus value between the corresponding unique reference channel of the same type and the excitation amount of the applied fixed value, and the relative modulus value in the second relative value to calculate the relative modulus value in the third relative value of all channels within the corresponding type.

[0063] According to one aspect of the present invention, when calculating the phase difference in the third relative value, the following operations are respectively performed on the unique reference channel of the same type:

[0064] After applying the correct excitation amount to the corresponding unique reference channel of the same type and the unique reference channel of the device, select to enter the calculation process of the calibration parameters for the corresponding unified unique reference channel of the same type;

[0065] Calculate the phasor values of the corresponding unique reference channel of the same type and the unique reference channel of the device at the same moment;

[0066] Use the phasor values to calculate the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device, and subtract the phase difference between the excitation amounts of the fixed values applied to the corresponding unique reference channel of the same type and the unique reference channel of the device;

[0067] Determine whether the phase difference is within a reasonable range;

[0068] If so, use the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device, and the phase difference in the second relative value to calculate the phase difference in the third relative value of all channels within the corresponding type.

[0069] According to one aspect of the present invention, the obtained sampled values after consistency calibration include:

[0070] Use the relative modulus value of each channel in the calibration parameters to perform calibration calculation on the original sampled value of each channel to obtain the sampled value of each channel after being corrected by the relative modulus value;

[0071] Use the relative time difference of each channel in the calibration parameters to perform interpolation calculation of the relative time difference on the sampled value of each channel after being corrected by the relative modulus value to obtain the sampled value after consistency calibration.

[0072] According to one aspect of the present invention, the obtained phasor values after consistency calibration include:

[0073] Use the relative modulus value and phase difference of each channel in the calibration parameters to perform calibration calculations on the modulus and argument of the original phasor value of each channel respectively, and obtain the phasor value after consistency calibration.

[0074] To achieve the above object, the present invention also provides a multi-channel sampled value consistency calibration system for a power system device, including:

[0075] A test grouping reference channel designating module, which groups the same type of channels in the device for testing and designates one channel in each test grouping as the test grouping reference channel;

[0076] A same type unique reference channel designating module, which designates one channel among all the same type of channels in the device as the same type unique reference channel;

[0077] A device unique reference channel designating module, which designates one channel in the device as the device unique reference channel;

[0078] A first relative value calculation module, which applies an excitation quantity with a fixed value to each test grouping and calculates the first relative value of all channels within the test grouping, where the reference of the first relative value is the test grouping reference channel;

[0079] A second relative value calculation module, which calculates the second relative value of all channels within the same type based on the first relative value and the phasor values of all channels within the test grouping at the same time saved during the calculation of the first relative value, where the reference of the second relative value is the same type unique reference channel;

[0080] A modulus relative value calculation module in the third relative value, which calculates the modulus relative value in the third relative value of all channels within the same type based on the modulus relative value in the second relative value and applying an excitation quantity with a fixed value to each same type unique reference channel, where the reference of the modulus relative value in the third relative value is the excitation quantity with the fixed value applied;

[0081] A phase difference calculation module in the third relative value, which calculates the phase difference in the third relative value of all channels within the same type based on the phase difference in the second relative value and applying an excitation quantity with a fixed value to the same type unique reference channel and the device unique reference channel at the same time, where the reference of the phase difference in the third relative value is the device unique reference channel;

[0082] A relative time difference calculation module, which calculates the relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation quantity with the fixed value applied;

[0083] A calibration parameter acquisition module, which stores the third relative value of each channel and the relative time difference of each channel as calibration parameters;

[0084] A sampling value acquisition module performs consistency correction calculation on the original sampling values of each channel based on the correction parameters to obtain the sampling values after consistency correction.

[0085] A phasor value acquisition module performs consistency correction calculation on the original phasor values of each channel based on the correction parameters to obtain the phasor values after consistency correction.

[0086] To achieve the above object, the present invention also provides an electronic device, including a processor, a memory, and a computer program stored on the memory and executable on the processor. When the computer program is executed by the processor, it implements the multi-channel sampling value consistency correction method of the power system device as described above.

[0087] To achieve the above object, the present invention also provides a computer-readable storage medium. A computer program is stored on the computer-readable storage medium. When the computer program is executed by a processor, it implements the multi-channel sampling value consistency correction method of the power system device as described above.

[0088] According to the solution of the present invention, the present invention effectively solves the problem of inconsistent multi-channel sampling values of the power system device, such as reducing the unbalanced current of differential protection, ensuring the safe and reliable operation of the power system, and the method has strong economic practicality.

[0089] Based on the digital processing capabilities already possessed by digital devices, the present invention does not additionally increase the hardware cost of the device and the cost of auxiliary equipment. Only by adding software functions and cooperating with conventional tests, the optimal consistency of multi-channel sampling values of the power system device can be achieved, including the optimal consistency between multi-channels and between multi-channels and the standard input source.

[0090] The present invention has the advantages of the same environment, the same signal source input, the same moment, the same algorithm, online calculation, etc., ensuring the optimal consistency in terms of method. BRIEF DESCRIPTION OF THE DRAWINGS

[0091] Figure 1 Schematically shows a flowchart of a multi-channel sampling value consistency correction method of a power system device according to an embodiment of the present invention.

[0092] Figure 2 Is a flowchart of the calculation of correction parameters for the device consistency correction in Embodiment 1 of the present invention.

[0093] Figure 3 Is a flowchart of performing operation calculations on relative values for all test groups respectively in Embodiment 1 of the present invention. [[ID=3�]]

[0094] Figure 4 Is a flowchart of unifying the reference of relative values of all channels of the same type in Embodiment 1 of the present invention.

[0095] Figure 5 Flow chart for calculating correction parameters of the only reference channel modulus of the same type in Embodiment 1 of the present invention;

[0096] Figure 6 Flow chart for calculating correction parameters of the unified and only reference channel of the same type in Embodiment 1 of the present invention;

[0097] Figure 7 Flow chart for calculating relative time difference in Embodiment 1 of the present invention;

[0098] Figure 8 Flow chart for calling correction parameters in Embodiment 1 of the present invention;

[0099] Figure 9 Flow chart for performing consistency correction on original sampling values in Embodiment 1 of the present invention;

[0100] Figure 10 Schematic diagram of the sampling value consistency correction calculation of two-point linear interpolation in Embodiment 1 of the present invention. Detailed implementation manners

[0101] The content of the present invention will now be described with reference to exemplary embodiments. It should be understood that the described embodiments are only for enabling those of ordinary skill in the art to better understand and thus implement the content of the present invention, rather than implying any limitation to the scope of the present invention.

[0102] As used herein, the term "comprising" and its variants are to be construed as open-ended terms meaning "including but not limited to". The term "based on" is to be construed as "at least partially based on". The terms "one embodiment" and "an embodiment" are to be construed as "at least one embodiment".

[0103] Figure 1 Schematic representation of a flow chart of a multi-channel sampling value consistency correction method for a power system device according to an embodiment of the present invention. As Figure 1 shown, in the present embodiment, the multi-channel sampling value consistency correction method for a power system device includes:

[0104] Grouping the channels of the same type in the device for testing, and designating one channel in each test group as the test group reference channel;

[0105] Designating one channel among the channels of the same type in the device as the only reference channel of the same type;

[0106] Designating one channel in the device as the only reference channel of the device;

[0107] Apply a fixed excitation quantity to each test group, and calculate the first relative value of all channels within the test group, where the reference of the first relative value is the reference channel of the test group;

[0108] Based on the first relative value and the phasor values of all channels within the test group at the same moment that have been saved during the calculation of the first relative value, calculate the second relative value of all channels within the same type, where the reference of the second relative value is the unique reference channel of the same type;

[0109] Based on the modulus relative value in the second relative value and the excitation quantity with a fixed value applied to each unique reference channel of the same type, calculate the modulus relative value in the third relative value of all channels within the same type, where the reference of the modulus relative value in the third relative value is the excitation quantity with the fixed value applied;

[0110] Based on the phase difference in the second relative value and the excitation quantity with a fixed value applied to the unique reference channel of the same type and the unique reference channel of the device simultaneously, calculate the phase difference in the third relative value of all channels within the same type, where the reference of the phase difference in the third relative value is the unique reference channel of the device;

[0111] Based on the phase difference in the third relative value and the frequency parameter of the excitation quantity with the fixed value applied, calculate the relative time difference;

[0112] Store the third relative value of each channel and the relative time difference of each channel as calibration parameters;

[0113] Based on the calibration parameters, perform consistency calibration calculation on the original sampling values of each channel to obtain the sampling values after consistency calibration;

[0114] Based on the calibration parameters, perform consistency calibration calculation on the original phasor values of each channel to obtain the phasor values after consistency calibration.

[0115] It should be noted that the types include: current analog channel type, voltage analog channel type, protection current analog channel type, measurement current analog channel type, protection voltage analog channel type, measurement voltage analog channel type, etc.

[0116] It should be noted that the relative values and calibration parameters correspond to the frequency parameter and the fixed value parameter. By default, the corresponding relationship is not explicitly shown. It is obvious that only when multiple frequencies and / or fixed values are required, it can be extended according to the content of the present invention.

[0117] Furthermore, preferably, the fixed value is the rated value.

[0118] According to an embodiment of the present invention, the test grouping of channels of the same type in the device includes:

[0119] The number of test groups is greater than or equal to 1;

[0120] Any two test groups of the same type of channels can be connected through a common channel or through the transition of other test groups and common channels;

[0121] The number of channels within each test group is greater than or equal to 2 and less than or equal to the maximum value of the number of channels of the same type of test groups.

[0122] Furthermore, preferably, the reference channels of all test groups of the same type are the only reference channels of the same type;

[0123] Furthermore, preferably, the number of common channels between two test groups is less than or equal to 1;

[0124] Furthermore, preferably, the number of channels within a test group is grouped according to the maximum value of the number of channels of the same type of test groups;

[0125] It should be noted that the common channel is a channel included in both test groups; the maximum value of the number of channels of the same type of test groups is the maximum value of the number of channels for which the single-port output of the test instrument used can simultaneously apply a fixed-value excitation amount to the same type of channels. In this application case, the requirement for the output accuracy of the test instrument can be reduced, which is determined by the load-carrying capacity of the test instrument used;

[0126] Furthermore, according to an embodiment of the present invention, the maximum value of the number of channels of the same type of test groups is determined by consulting the test instrument manufacturer.

[0127] Taking a device with 14 current analog channels as an example, it is determined that the maximum value of the number of channels of the same type of test groups for the current analog channels is 5. As shown in Table 1, the preferred test group results are: the number of test groups for the current analog channels is 4, and the number of channels in the test groups of the current analog channels are 5, 5, 5, and 2 respectively. The only reference channel of the same type, the reference channel of the test group, and the common channel are all current analog channel 1;

[0128]

[0129] Table 1

[0130] Note: In Table 1, ▲ is the only reference channel of the same type, △ is the reference channel of the test group, ◎ is the common channel, and ● is the channel included in the test group.

[0131] Furthermore, preferably, the only reference channel of the device is one of the only reference channels of the same type;

[0132] Further, according to an embodiment of the present invention, applying a fixed excitation quantity to each test group includes:

[0133] If the channels within a test group are current analog channel types, the small CTs of all current analog channels within the test group are connected end to end in series, ensuring that all are input with the same polarity. The current output of the test instrument is connected to the head and tail ends of the series-connected small CTs to apply a fixed excitation quantity.

[0134] Further, according to an embodiment of the present invention, applying a fixed excitation quantity to each test group further includes:

[0135] If the channels within a test group are voltage analog channel types, the small VTs of all voltage analog channels within the test group are connected in parallel, ensuring that all are input with the same polarity. The voltage output of the test instrument is connected to the head and tail ends of the parallel-connected small VTs to apply a fixed excitation quantity.

[0136] Further, according to an embodiment of the present invention, applying a fixed excitation quantity to each test group and calculating the first relative values of all channels within the test group includes:

[0137] After applying the correct excitation quantity to the corresponding test group, select to enter the calculation process of the calibration parameters for the consistency calibration of the corresponding test group;

[0138] Calculate and save the phasor values of all channels within the corresponding test group at the same moment using the original sampling values;

[0139] Determine whether the modulus values of the phasor values of all channels within the corresponding test group are within the range of the applied fixed excitation quantity;

[0140] If so, taking the reference channel of the corresponding test group as the reference, calculate the first relative values of all channels within the corresponding test group relative to the reference using the phasor values;

[0141] Determine whether the first relative values of all channels within the corresponding test group are within a reasonable range;

[0142] If so, the first relative values are available.

[0143] Further, according to an embodiment of the present invention, the range of the fixed excitation quantity applied to each test group is:

[0144] [(1 - W F ) * I e1 * K1, (1 + W F ) * I e1 * K2];

[0145] Wherein, W F is the percentage limit of the channel ratio difference of the device, Ie1 The effective value of the excitation amount of the fixed value applied for the test grouping, K1 is the lower limit reliability coefficient of the modulus range; K2 is the upper limit reliability coefficient of the modulus range.

[0146] Further, according to an embodiment of the present invention, the value range of the lower limit reliability coefficient K1 of the modulus range is: 0.8 ≤ K1 ≤ 0.98.

[0147] Further, according to an embodiment of the present invention, the value range of the upper limit reliability coefficient K2 of the modulus range is: 1.02 ≤ K2 ≤ 1.2.

[0148] Further, according to an embodiment of the present invention, the reasonable range includes:

[0149] The reasonable range of the specific modulus relative value:

[0150] Wherein, W F is the percentage of the channel ratio difference limit value of the device, K3 is the lower limit reliability coefficient of the modulus relative value; K4 is the upper limit reliability coefficient of the modulus relative value.

[0151] Further, according to an embodiment of the present invention, the value range of the lower limit reliability coefficient K3 of the modulus relative value is: 0.9 ≤ K3 ≤ 0.98.

[0152] Further, according to an embodiment of the present invention, the value range of the upper limit reliability coefficient K4 of the modulus relative value is: 1.02 ≤ K4 ≤ 1.1.

[0153] Further, according to an embodiment of the present invention, the reasonable range also includes:

[0154] The reasonable range of the specific phase difference: ≤ 2 * W Δθ * K5;

[0155] Wherein, K5 is the phase difference range reliability coefficient; W Δθ is the channel phase difference limit value of the device.

[0156] Further, according to an embodiment of the present invention, the value range of the phase difference range reliability coefficient K5 is: 1.01 ≤ K5 ≤ 1.1.

[0157] Further, according to an embodiment of the present invention, when calculating the second relative value, the following operations are respectively performed on the test groupings:

[0158] Based on the phasor values of all channels at the same time within the test group saved during the first relative value calculation process, calculate the relative value between the reference channel of the test group and the unique reference channel of the same type; if the reference channel of the test group and the unique reference channel of the same type are not in the same test group, through the connection of the common channels between the test groups, perform superposition calculation to obtain the relative value between the reference channel of the test group and the unique reference channel of the same type;

[0159] Use the relative value between the reference channel of the test group and the unique reference channel of the same type and the first relative value to calculate the second relative value of all channels within the test group.

[0160] Further, according to an embodiment of the present invention, the superposition calculation includes:

[0161] Step 1: Use the phasor values of all channels at the same time within the saved test group to calculate the relative value between the reference channel of the test group and the common channel of another test group that has a common channel with it;

[0162] Step 2: Determine whether the other test group contains the unique reference channel of the same type;

[0163] Step 3: If so, use the phasor values of all channels at the same time within the saved other test group to calculate the relative value between the common channel of the other test group and the unique reference channel of the same type in the other test group; perform superposition calculation on all the relative values connected through the common channel to obtain the relative value between the reference channel of the test group and the unique reference channel of the same type, and the superposition calculation ends;

[0164] Step 4: If not, use the phasor values of all channels at the same time within the saved other test group to calculate the relative value between the common channel of the other test group and the common channel of a third test group that has a common channel with it;

[0165] Step 5: Repeat Step 2 - Step 4 to perform iterative calculation to obtain the corresponding relative value.

[0166] Further, according to an embodiment of the present invention, calculating the relative time difference includes:

[0167] Find the channel with the minimum phase difference among the third relative values in all channels;

[0168] Taking the channel with the minimum value as the reference, calculate the phase difference of all channels relative to the reference;

[0169] Use the frequency parameter of the excitation amount of the applied fixed value to convert the phase difference with the channel with the minimum value as the reference into a relative time difference.

[0170] Further, according to an embodiment of the present invention, when calculating the modulus relative value in the third relative value, the following operations are respectively performed on the unique reference channels of the same type:

[0171] After applying the correct excitation amount to the corresponding unique reference channel of the same type, select to enter the calculation process of the correction parameter of the modulus value of the corresponding unique reference channel of the same type;

[0172] Calculate the effective value of the corresponding unique reference channel of the same type, and use the effective value to calculate the modulus relative value between the corresponding unique reference channel of the same type and the excitation amount of the applied fixed value;

[0173] Judge whether the modulus relative value is within a reasonable range;

[0174] If so, use the modulus relative value between the corresponding unique reference channel of the same type and the excitation amount of the applied fixed value, and the modulus relative value in the second relative value to calculate the modulus relative value in the third relative value of all channels within the corresponding type.

[0175] Further, according to an embodiment of the present invention, when calculating the phase difference in the third relative value, the following operations are respectively performed on the unique reference channels of the same type:

[0176] After applying the correct excitation amounts to the corresponding unique reference channel of the same type and the device unique reference channel, select to enter the calculation process of the correction parameter of the corresponding unified unique reference channel of the same type;

[0177] Calculate the phasor values of the corresponding unique reference channel of the same type and the device unique reference channel at the same time;

[0178] Use the phasor values to calculate the phase difference between the corresponding unique reference channel of the same type and the device unique reference channel, and subtract the phase difference between the excitation amounts of the fixed values applied to the corresponding unique reference channel of the same type and the device unique reference channel from the phase difference;

[0179] Judge whether the phase difference is within a reasonable range;

[0180] If so, use the phase difference between the corresponding unique reference channel of the same type and the device unique reference channel, and the phase difference in the second relative value to calculate the phase difference in the third relative value of all channels within the corresponding type.

[0181] Further, according to an embodiment of the present invention, obtaining the sampled values after consistency correction includes:

[0182] Use the modulus relative value of each channel in the correction parameters to perform correction calculation on the original sampled value of each channel to obtain the sampled value of each channel corrected by the modulus relative value;

[0183] Interpolate the relative time differences of the sampled values corrected by the relative modulus values of each channel in the correction parameters for each channel to obtain the sampled values after consistency correction.

[0184] Further, according to an embodiment of the present invention, obtaining the phasor values after consistency correction includes:

[0185] Use the relative modulus values and phase differences of each channel in the correction parameters to correct the modulus and argument of the original phasor values of each channel respectively, to obtain the phasor values after consistency correction.

[0186] Further, to achieve the above object, the present invention also provides a multi-channel sampled value consistency correction system for a power system device, including:

[0187] A test grouping reference channel designating module, which groups the channels of the same type in the device for testing and designates one channel in each test grouping as the test grouping reference channel;

[0188] A same-type unique reference channel designating module, which designates one channel among the channels of the same type in the device as the same-type unique reference channel;

[0189] A device unique reference channel designating module, which designates one channel in the device as the device unique reference channel;

[0190] A first relative value calculation module, which applies a fixed value of excitation quantity to each test grouping and calculates the first relative values of all channels within the test grouping, where the reference of the first relative value is the test grouping reference channel;

[0191] A second relative value calculation module, which calculates the second relative values of all channels within the same type based on the first relative values and the phasor values of all channels within the test grouping at the same moment saved during the calculation of the first relative values, where the reference of the second relative value is the same-type unique reference channel;

[0192] A modulus relative value calculation module in the third relative value, which calculates the modulus relative value in the third relative value of all channels within the same type based on the modulus relative value in the second relative value and applying a fixed value of excitation quantity to each same-type unique reference channel, where the reference of the modulus relative value in the third relative value is the applied fixed value of excitation quantity;

[0193] A phase difference calculation module in the third relative value, which calculates the phase difference in the third relative value of all channels within the same type based on the phase difference in the second relative value and applying a fixed value of excitation quantity to the same-type unique reference channel and the device unique reference channel simultaneously, where the reference of the phase difference in the third relative value is the device unique reference channel;

[0194] A relative time difference calculation module calculates a relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount of the applied fixed value.

[0195] A calibration parameter acquisition module stores the third relative value of each channel and the relative time difference of each channel as calibration parameters.

[0196] A sampled value acquisition module performs consistency calibration calculation on the original sampled values of each channel based on the calibration parameters to obtain the sampled values after consistency calibration.

[0197] A phasor value acquisition module performs consistency calibration calculation on the original phasor values of each channel based on the calibration parameters to obtain the phasor values after consistency calibration.

[0198] The multi-channel sampled value consistency calibration system of the power system device according to the present invention can implement the multi-channel sampled value consistency calibration method of the power system device. The specific method steps are as described above and will not be elaborated here.

[0199] Furthermore, to achieve the above object, the present invention also provides an electronic device, including a processor, a memory, and a computer program stored on the memory and executable on the processor. When the computer program is executed by the processor, it implements the multi-channel sampled value consistency calibration method of the power system device as described above.

[0200] Furthermore, to achieve the above object, the present invention also provides a computer-readable storage medium with a computer program stored thereon. When the computer program is executed by the processor, it implements the multi-channel sampled value consistency calibration method of the power system device as described above.

[0201] According to the above solution of the present invention, the present invention effectively solves the problem of inconsistent multi-channel sampled values of the power system device, such as reducing the unbalanced current of differential protection and ensuring the safe and reliable operation of the power system. The method has strong economic practicality.

[0202] Based on the digital processing capabilities already possessed by the digital device, the present invention does not incur additional costs for device hardware and auxiliary equipment. Only by adding software functions and cooperating with conventional tests, the optimal consistency of multi-channel sampled values of the device can be achieved, including the optimal consistency between multi-channels and between multi-channels and the standard input source.

[0203] The present invention has the advantages of the same environment, the same signal source input, the same moment, the same algorithm, and online calculation, ensuring the optimal consistency in terms of method.

[0204] Based on the above solution of the present invention, the solution of the present invention will be described in detail below in a specific embodiment in conjunction with the accompanying drawings.

[0205] Embodiment 1

[0206] A multi-channel sampled value consistency correction method for a power system device, the flowchart is as Figure 2 shown, including:

[0207] Step 101, determine whether the test state process of calculating the correction parameters is over. If so, enter the next step 102. If not, jump to step 107 to start the test state process of calculating the correction parameters;

[0208] Step 102, select the correction parameter calculation function for consistency correction as needed. If selected, enter the next step 103. If not selected, jump to step 126 to call the correction parameters;

[0209] The selection as needed means that under the condition that the device and the sampling-related hardware have not changed or the calculated and saved correction parameter data has not been lost, and on the premise that the analog quantity channels of the device pass the routine test, theoretically, it only needs to be selected once during the factory test in the entire life cycle of the device. This method provides a selection function, and the need is judged manually. The present invention does not limit the specific implementation manner, but preferably, the selection function is implemented by means of man-machine dialogue.

[0210] Step 103, set all the calculation flags corresponding to this calculation as unsuccessful;

[0211] Step 104, group the tests for the same type of channels in the device, and specify one channel in each test group as the test group reference channel;

[0212] Step 105, specify one channel in each of the same type of channels in the device as the unique reference channel of the same type;

[0213] Step 106, specify one channel in the device as the unique reference channel of the device;

[0214] The test grouping, common channels, specified reference channels, etc. of the device in Embodiment 1 are shown in Tables 2 and 3 as follows:

[0215]

[0216] Table 2

[0217] Note: In Table 2, ▲ is the unique reference channel of the same type of current analog quantity channels, △ is the reference channel of the test group, ◎ is the common channel, and ● is the channel included in the test group;

[0218]

[0219] Table 3

[0220] Note: In Table 3, ▲ is the only reference channel of the same type as the voltage analog channel, △ is the reference channel of the test group, ● is the channel included in the test group, and ⊙ is the only reference channel of the device.

[0221] Step 107, start the test state process of calibration parameter calculation;

[0222] Step 108, selecting to forcibly end the test state process of the calibration parameter calculation, if selected, jump to step 125 to end the test state process of the calibration parameter calculation, if not selected, go to the next step 109;

[0223] Step 109: Apply a fixed value of excitation to each test group, and calculate the first relative value of all channels in the test group, wherein the reference of the first relative value is the test group reference channel. The present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows: Figure 3 Shown, including:

[0224] Step 201, determine whether the calibration parameter calculation flag of the currently executed test group consistency calibration is successful. If so, jump to step 212 to determine whether all calibration parameter calculation processes of the test group consistency calibration are completed. If not, go to the next step 202;

[0225] Step 202, determining whether the calibration parameter calculation process for the currently executed test group consistency calibration has ended, if so, proceeding to the next step 203, if not, jumping to step 204 to start the calibration parameter calculation process for the corresponding test group consistency calibration;

[0226] Step 203: After applying the correct stimulus amount to the corresponding test group in conjunction with the operation of the test instrument, select to enter the correction parameter calculation process for the corresponding test group consistency correction. If selected, proceed to the next step 204; if not, jump to step 212 to determine whether all correction parameter calculation processes for the test group consistency correction have been completed.

[0227] It should be noted that the corresponding test group corresponds to the test group to which the fixed value of the stimulus is applied, and corresponds to the currently executed test group; the currently executed test group is the test group to which the current cycle is executed, and all test groups execute the same process in a loop.

[0228] Step 204, starting the correction parameter calculation process for the corresponding test group consistency correction;

[0229] Step 205, using the original sampling values to calculate and save the phasor values of all channels in the corresponding test group at the same moment;

[0230] Taking the devices in Table 2 and Table 3 as an example, the calculated phasor values include: I[j][z][c] ∠θ [j][z][c] ;

[0231] Wherein, j is the channel serial number, the current channel serial number range is [1, 14], and the voltage channel serial number range is [1, 6]; z is the test grouping serial number, the current analog channel type test grouping serial number range is [1, 4], and the voltage analog channel type test grouping serial number range is [1]; c is the channel type serial number, serial number 1 represents the current analog channel type, and serial number 2 represents the voltage analog channel type; I [j][z][c] is the modulus of the phasor value, and θ [j][z][c] is the argument of the phasor value;

[0232] It should be noted that the calculation of the phasor value corresponds to the frequency of the applied fixed-value excitation quantity. The present invention does not limit the specific implementation manner, but preferably, an algorithm with high precision is adopted, and all algorithms for calculating the phasor value need to be unified;

[0233] Step 206, determine whether the modulus values of the phasor values of all channels in the corresponding test grouping are within the range of the applied fixed-value excitation quantity. If so, proceed to the next step 207. If not, jump to step 210 to prompt and save that the correction parameter calculation flag for the consistency correction of the corresponding test grouping is unsuccessful;

[0234] The range of the applied fixed-value excitation quantity for each test grouping is:

[0235] [(1 - W F ) * I e1 * K1, (1 + W F ) * I e1 * K2];

[0236] Wherein, W F is the percentage limit of the channel ratio difference of the device, I e1 is the effective value of the applied fixed-value excitation quantity of the test grouping, K1 is the lower limit reliability coefficient of the modulus range, and K2 is the upper limit reliability coefficient of the modulus range;

[0237] The value range of the lower limit reliability coefficient K1 of the modulus range is: 0.8 ≤ K1 ≤ 0.98. Further, preferably, the selection principle is to take a low value as much as possible;

[0238] The value range of the upper limit reliability coefficient K2 of the modulus range is: 1.02 ≤ K2 ≤ 1.2. Further, preferably, the selection principle is to take a high value as much as possible.

[0239] Step 207, taking the reference channel of the corresponding test grouping as the reference, calculate the first relative value of all channels in the corresponding test grouping relative to the reference using the phasor value; taking the device in Table 2 and Table 3 as an example, the specific calculation of test grouping 1 of channel type 1 of the device includes: Δθ[j][1][1] = θ [j][1][1] -θ [2][1][1] , j ∈ [1, 5];

[0240] where Δθ [j][1][1] is the phase difference in the first relative values of all channels in test group 1 of channel type 1 with respect to the reference, and K [j][1][1] is the modulus relative value in the first relative values of all channels in test group 1 of channel type 1 with respect to the reference. The reference channel for test group 1 of channel type 1 is current channel number 2;

[0241] Step 208: Determine whether the first relative values of all channels in the corresponding test group are within a reasonable range. If so, proceed to the next step 209. If not, jump to step 210 to prompt and save that the calculation flag of the correction parameter for the consistency correction of the corresponding test group is unsuccessful;

[0242] The reasonable range includes:

[0243] Specifically, the reasonable range of the modulus relative value is:

[0244] where W F is the percentage limit of the channel ratio difference of the device, K3 is the lower reliability coefficient of the modulus relative value, and K4 is the upper reliability coefficient of the modulus relative value;

[0245] The value range of the lower reliability coefficient K3 of the modulus relative value is: 0.9 ≤ K3 ≤ 0.98. Further, as a preference, the selection principle is to take the higher value as much as possible;

[0246] The value range of the upper reliability coefficient K4 of the modulus relative value is: 1.02 ≤ K4 ≤ 1.1. Further, as a preference, the selection principle is to take the lower value as much as possible.

[0247] The reasonable range also includes:

[0248] Specifically, the reasonable range of the phase difference is: ≤ 2 * W Δθ * K5;

[0249] where K5 is the reliability coefficient of the phase difference range, and W Δθ is the channel phase difference limit of the device;

[0250] The value range of the reliability coefficient K5 of the phase difference range is: 1.01 ≤ K5 ≤ 1.1. Further, as a preference, the selection principle is to take the lower value as much as possible.

[0251] Step 209: Prompt and save that the calculation flag of the correction parameter for the consistency correction of the corresponding test group is successful, and jump to step 211 to end the calculation process of the correction parameter for the consistency correction of the corresponding test group;

[0252] Step 210 , prompting and saving the correction parameter calculation flag of the corresponding test group consistency correction as unsuccessful;

[0253] Step 211, ending the correction parameter calculation process for the corresponding test group consistency correction;

[0254] Step 212, determine whether the correction parameter calculation process of all test group consistency corrections has been fully executed. If so, go to the next step 110 to determine whether the correction parameter calculation flags of all test group consistency corrections of the same type currently being executed are all successful. If not, jump to step 201 to determine whether the correction parameter calculation flag of the test group consistency correction currently being executed is successful, and continue the correction parameter calculation process of other test group consistency corrections.

[0255] Step 110, determining whether the calibration parameter calculation flags of all the test group consistency calibrations of the same type currently being executed are all successful, if so, proceeding to the next step 111, if not, jumping to step 112 to determine whether all the above two steps of the same type are all executed;

[0256] Step 111, based on the first relative value and the phasor values of all channels in the test group at the same moment that have been saved in the process of calculating the first relative value, calculate the second relative value of all channels in the same type, wherein the reference of the second relative value is the only reference channel of the same type; the present invention does not limit the specific implementation method, but as a preferred embodiment, the flow chart is as follows Figure 4 Shown, including:

[0257] Step 301: Determine whether the currently executed test group contains a unique reference channel of the same type. If so, proceed to step 302. If not, jump to step 305 to find other test groups of the same type that share the same channel with the currently executed test group.

[0258] Step 302: Use the saved phasor values of all channels in the currently executed test group at the same moment to calculate the relative value between the reference channel of the currently executed test group and the only reference channel of the same type. Taking the devices in Tables 2 and 3 as an example, the currently executed test group is channel type 1 test group 2. The specific calculation includes: Δα [2][1] =θ [8][2][1] -θ [7][2][1] , j∈[5,9];

[0259] Among them, Δα [2][1] is the phase difference in relative value between the reference channel of test group 2 of channel type 1 and the only reference channel of the same type, M [2][1]It is the modulus relative value in the relative value between the reference channel of test group 2 of channel type 1 and the only reference channel of the same type. The reference channel of test group 2 of channel type 1 is current channel number 8, and the only reference channel of the same type of channel type 1 is current channel number 7;

[0260] Step 303, calculate the second relative value of all channels within the currently executed test group using the relative value between the currently executed test group reference channel and the only reference channel of the same type and the first relative value; Taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 2 of channel type 1, and the specific calculation includes: Δσ [j][1] =Δθ [j][2][1] +Δα [2][1] , H [j][1] =K [j][2][1] *M [2][1] , j∈[5,9];

[0261] Among them, Δσ [j][1] is the phase difference in the second relative value of channel number j of channel type 1, and H [j][1] is the modulus relative value in the second relative value of channel number j of channel type 1;

[0262] Step 304, prompt and save that the unified reference calculation flag of the currently executed test group is successful, and jump to step 314 to end the unified reference calculation process of the currently executed test group;

[0263] Step 305, find the remaining test groups in the same type that have common channels with the currently executed test group. If found, enter the next step 306. If not found, jump to step 316 to prompt unified reference exception; Taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 3 of channel type 1 of the device. Then the found test groups are: test group 2 of channel type 1 with the common channel being current channel number 9, and test group 4 of channel type 1 with the common channel being current channel number 13;

[0264] Step 306, calculate the relative value between the reference channel of the currently executed test group and the common channel of the found test group using the phasor values of all channels at the same time saved for the currently executed test group; Taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 3 of channel type 1 of the device. If using the found test group 2 of channel type 1, the specific calculation includes: k = 1, Δg [k] =θ

[12] [3][1] -θ [9][3][1] ,

[0265] Among them, Δg [k] 、G [k]They are the phase difference and the relative value of the modulus in the relative value between the reference channel of test group 3 of channel type 1 and the current channel serial number 9 of the common channel, which are calculated using the phasor values of all channels at the same time in test group 3 of channel type 1 that have been saved; the common channel of test group 3 of channel type 1 and test group 2 of channel type 1 is the current channel serial number 9; the reference channel of test group 3 of channel type 1 is the current channel serial number 12;

[0266] Step 307: Determine whether the found test group contains the unique reference channel of the same type. If yes, proceed to the next step 308. If not, jump to step 312 to continue finding the remaining test groups of the same type that have a common channel with the previously found test group. Taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 3 of channel type 1 of the device. If judged using the found test group 2 of channel type 1, the judgment result is yes. If judged using the found test group 4 of channel type 1, the judgment result is no;

[0267] Step 308: Use the phasor values of all channels at the same time in the found test group that have been saved to calculate the relative value between the common channel of the found test group and the unique reference channel of the same type. Taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 3 of channel type 1 of the device. If judged using the found test group 2 of channel type 1, the judgment result is yes. The specific calculation includes: k = k + 1, Δg [k] = θ [9][2][1] - θ [7][2][1] ,

[0268] where, Δg [k] , G [k] are respectively the phase difference and the relative value of the modulus in the relative value between the current channel serial number 9 of the common channel and the unique reference channel of the same type of channel type 1, which are calculated using the phasor values of all channels at the same time in test group 2 of channel type 1 that have been saved; the common channel of test group 3 of channel type 1 and test group 2 of channel type 1 is the current channel serial number 9; the unique reference channel of the same type of channel type 1 is the current channel serial number 7;

[0269] Step 309: Superpose and calculate all the relative values connected through the common channel to obtain the relative value between the reference channel of the currently executed test group and the unique reference channel of the same type. Taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 3 of channel type 1 of the device. If judged using the found test group 2 of channel type 1, the judgment result is yes. The specific calculation includes:

[0270] where, Δα [3][1]is the phase difference in the relative value between the reference channel of test group 3 of channel type 1 and the only reference channel of the same type, M [3][1] is the relative value of the modulus value in the relative value between the reference channel of test group 3 of channel type 1 and the only reference channel of the same type;

[0271] Step 310, calculate the second relative value of all channels within the test group using the relative value between the reference channel of the currently executed test group and the only reference channel of the same type and the first relative value; taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 3 of channel type 1 of the device. Using the found test group 2 of channel type 1 for judgment, and the judgment result is yes. The specific calculation includes: Δσ [j][1] =Δθ [j][3][1] +Δα [3][1] , H [j][1] =K [j][3][1] *M [3][1] , j∈[9,13];

[0272] Step 311, prompt and save that the unified reference calculation flag of the currently executed test group is successful, and jump to step 314 to end the unified reference calculation process of the currently executed test group;

[0273] Step 312, continue to find the remaining test groups in the same type that have common channels with the previously found test group. If found, jump to step 307 to judge whether the found test group contains the only reference channel of the same type. If not found, enter the next step 313; taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 3 of channel type 1 of the device. If using the found test group 4 of channel type 1 in step 305 for judgment, and the result of continuing to find the remaining test groups in the same type that have common channels with the previously found test group 4 is not found, enter the next step 313;

[0274] Step 313, judge whether all of the seven steps above have been executed for the test group found in step 305. If so, jump to step 316 to prompt unified reference exception. If not, jump to step 306 to calculate the relative value between the reference channel of the currently executed test group and the common channel of the found test group using the phasor values of all channels at the same time saved for the currently executed test group, and continue with other test groups of the test group found in step 305; taking the devices in Table 2 and Table 3 as an example, the currently executed test group is test group 3 of channel type 1 of the device. If using the found test group 4 of channel type 1 in step 305 for judgment, and the result of judging whether all of the seven steps above have been executed for the test group found in step 305 is no, jump to step 306, and continue with test group 2 of channel type 1 found in step 305;

[0275] Step 314, end the current execution of the unified benchmark calculation process for test groups;

[0276] Step 315, determine whether all the unified benchmark calculation flags for all test groups of the same type are successful. If so, jump to Step 112 to determine whether the above two steps for all test groups of the same type are all executed. If not, jump to Step 301 to determine whether the currently executed test group contains the unique reference channel of the same type, and continue with the unified benchmark calculation process for other test groups;

[0277] Step 316, prompt that the unified benchmark is abnormal, and jump to Step 125 to end the test status process of calculating calibration parameters.

[0278] It should be noted that for the currently executed test group, all test groups of the same type execute the same process in a loop for one round, and it is the test group currently looped to;

[0279] Step 112, determine whether the above two steps for all test groups of the same type are all executed. If so, enter the next step 113. If not, jump to Step 110 to determine whether all the calibration parameter calculation flags for all test groups of the same type currently executed are successful, and continue with the execution of the above two steps for other test groups of the same type;

[0280] For the currently executed type of the same type, all types of the same type execute Steps 110 and 111 in a loop for one round, and it is the type of the same type currently looped to;

[0281] Step 113, based on the modulus relative value in the second relative value and the excitation amount of applying a fixed value to each unique reference channel of the same type, calculate the modulus relative value in the third relative value for all channels within the same type, where the benchmark of the modulus relative value in the third relative value is the excitation amount of the applied fixed value. The present invention does not limit the specific implementation manner, but preferably, the flowchart is as Figure 5 shown, including:

[0282] Step 401, determine whether the calibration parameter calculation flag for the modulus value of the currently executed unique reference channel of the same type is successful. If so, jump to Step 412 to determine whether all the calibration parameter calculation processes for the modulus values of all unique reference channels of the same type are all executed. If not, enter the next step 402;

[0283] Step 402, determine whether the calibration parameter calculation process for the modulus value of the currently executed unique reference channel of the same type is ended. If so, enter the next step 403. If not, jump to Step 405 to start the corresponding calibration parameter calculation process for the modulus value of the unique reference channel of the same type;

[0284] Step 403: Determine whether all the unified benchmark calculation flags for the currently executed test groups of the same type are successful. If so, proceed to the next step 404. If not, jump to step 412 to determine whether all the calibration parameter calculation processes for the unique reference channel modulus values of the same type have been executed;

[0285] Step 404: After applying the correct excitation amount to the corresponding unique reference channel of the same type in combination with the operation of the test instrument, select to enter the calibration parameter calculation process for the modulus value of the corresponding unique reference channel of the same type. If selected, proceed to the next step 405. If not selected, jump to step 412 to determine whether all the calibration parameter calculation processes for the unique reference channel modulus values of the same type have been executed;

[0286] Step 405: Start the calibration parameter calculation process for the modulus value of the corresponding unique reference channel of the same type;

[0287] Step 406: Calculate the effective value of the corresponding unique reference channel of the same type, and use the effective value to calculate the modulus relative value between the corresponding unique reference channel of the same type and the applied fixed-value excitation amount. Taking the devices in Table 2 and Table 3 as an example, the currently executed unique reference channel of the same type is type 1. The specific calculation includes:

[0288] where, B [1] is the modulus relative value between the unique reference channel of the same type of channel type 1 and the fixed-value excitation amount applied in the test, N [1] is the effective value of the unique reference channel of the same type of channel type 1 calculated, and I e[1] is the effective value of the fixed-value excitation amount applied to the unique reference channel of the same type of channel type 1;

[0289] Step 407: Determine whether the modulus relative value is within a reasonable range. If so, proceed to the next step 408. If not, jump to step 410 to prompt and save the calibration parameter calculation flag for the modulus value of the corresponding unique reference channel as unsuccessful;

[0290] Step 408: Use the modulus relative value between the corresponding unique reference channel of the same type and the applied fixed-value excitation amount, and the modulus relative value in the second relative value to calculate the modulus relative value in the third relative value for all channels within the corresponding type. Taking the devices in Table 2 and Table 3 as an example, the currently executed unique reference channel of the same type is type 1. The specific calculation includes: H [j][1] = H [j][1] * B [1] , j ∈ [1, 14];

[0291] where, H [j][1] becomes the modulus relative value in the third relative value of the channel serial number j of channel type 1;

[0292] Step 409, prompt and save that the calibration parameter calculation flag of the corresponding unique reference channel modulus value of the same type is successful, and jump to Step 411 to end the calibration parameter calculation process of the corresponding unique reference channel modulus value of the same type;

[0293] Step 410, prompt and save that the calibration parameter calculation flag of the corresponding unique reference channel modulus value of the same type is unsuccessful;

[0294] Step 411, end the calibration parameter calculation process of the corresponding unique reference channel modulus value of the same type;

[0295] Step 412, determine whether all the calibration parameter calculation processes of the unique reference channel modulus values of the same type have been executed. If so, enter the next Step 114. Based on the phase difference in the second relative value and the excitation amount of applying a fixed value to both the unique reference channel of the same type and the unique reference channel of the device, calculate the phase difference in the third relative value of all channels within the same type. If not, jump to Step 401 to determine whether the calibration parameter calculation flag of the currently executed unique reference channel modulus value of the same type is successful, and continue with the calibration parameter calculation processes of other unique reference channel modulus values of the same type.

[0296] The corresponding same type corresponds to the same type of the excitation amount of the fixed value applied in the test and the currently executed same type; for the currently executed same type, all same types are cycled through the same process once, and it is the currently cycled same type.

[0297] Step 114, based on the phase difference in the second relative value and the excitation amount of applying a fixed value to both the unique reference channel of the same type and the unique reference channel of the device, calculate the phase difference in the third relative value of all channels within the same type, where the reference of the phase difference in the third relative value is the unique reference channel of the device. The present invention does not limit the specific implementation manner, but preferably, the flowchart is as Figure 6 shown, including:

[0298] Step 501, determine whether the calibration parameter calculation flag of the currently executed unified unique reference channel of the same type is successful. If so, jump to Step 513 to determine whether all the calibration parameter calculation processes of the unified unique reference channel of the same type have been executed. If not, enter the next Step 502;

[0299] Step 502, determine whether the calibration parameter calculation process of the currently executed unified unique reference channel of the same type has ended. If so, enter the next Step 503. If not, jump to Step 505 to start the calibration parameter calculation process of the corresponding unified unique reference channel of the same type;

[0300] Step 503: Determine whether all the unified benchmark calculation flags for all the currently executed test groups of the same type are successful. If so, proceed to the next step 504. If not, jump to step 513 to determine whether all the calibration parameter calculation processes for all the unified unique benchmark channels of the same type have been executed;

[0301] Step 504: After applying the correct excitation amount to the corresponding unified unique benchmark channel and device unique benchmark channel in combination with the operation of the test instrument, select to enter the calibration parameter calculation process for the corresponding unified unique benchmark channel. If selected, proceed to the next step 505. If not selected, jump to step 513 to determine whether all the calibration parameter calculation processes for all the unified unique benchmark channels of the same type have been executed;

[0302] Step 505: Start the calibration parameter calculation process for the corresponding unified unique benchmark channel;

[0303] Step 506: Calculate the phasor values at the same moment for the corresponding unified unique benchmark channel and device unique benchmark channel; Taking the devices in Table 2 and Table 3 as examples, the specific calculation results include: V [c] ∠v [c] , U∠u, c ∈ [1, 2];

[0304] Among them, V [c] ∠v [c] is the phasor value of the unified unique benchmark channel of the same type, and U∠u is the phasor value of the device unique benchmark channel;

[0305] Step 507: Calculate the phase difference between the corresponding unified unique benchmark channel and device unique benchmark channel using the phasor values, and then subtract the phase difference between the excitation amounts with fixed values applied to the corresponding unified unique benchmark channel and device unique benchmark channel; Taking the devices in Table 2 and Table 3 as examples, the specific calculation includes: Δβ [c] = v [c] - u - s [c] , c ∈ [1, 2];

[0306] Among them, Δβ [c] is the phase difference between the corresponding unified unique benchmark channel and device unique benchmark channel, and s [c] is the phase difference between the excitation amounts with fixed values applied to the corresponding unified unique benchmark channel and device unique benchmark channel;

[0307] Step 508: Determine whether the phase difference is within a reasonable range. If so, proceed to the next step 509. If not, jump to step 511 to prompt and save the calibration parameter calculation flag for the corresponding unified unique benchmark channel of the same type as unsuccessful;

[0308] Step 509: Calculate the phase difference in the third relative value of all channels of the corresponding same type using the phase difference between the corresponding unique reference channel of the same type and the device-unique reference channel, and the phase difference in the second relative value. Taking the devices in Table 2 and Table 3 as examples, the specific calculation includes: Δσ [j][c] = Δσ [j][c] + Δβ [c] , j ∈ [1, 14] or j ∈ [1, 6], c ∈ [1, 2];

[0309] where Δσ [j][c] becomes the phase difference in the third relative value of channel number j of channel type c;

[0310] Step 510: Prompt and save that the calculation flag of the calibration parameter of the corresponding same-type unified unique reference channel is successful, and jump to Step 512 to end the calibration parameter calculation process of the corresponding same-type unified unique reference channel;

[0311] Step 511: Prompt and save that the calculation flag of the calibration parameter of the corresponding same-type unified unique reference channel is unsuccessful;

[0312] Step 512: End the calibration parameter calculation process of the corresponding same-type unified unique reference channel;

[0313] Step 513: Determine whether the calibration parameter calculation processes of all same-type unified unique reference channels have been fully executed. If so, enter the next Step 115 to calculate the relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount with a fixed value applied. If not, jump to Step 501 to determine whether the calculation flag of the calibration parameter of the currently executed same-type unified unique reference channel is successful, and continue with the calibration parameter calculation processes of other same-type unified unique reference channels;

[0314] The corresponding same type corresponds to the same type of excitation amount applied in the test and the currently executed same type; for the currently executed same type, all same types are cycled through the same process once, and it is the currently cycled-to same type.

[0315] Step 115: Calculate the relative time difference based on the phase difference in the third relative value and the frequency parameter of the excitation amount with a fixed value applied. The present invention does not limit the specific implementation manner, but preferably, the flowchart is as Figure 7 shown, and the calculation of the relative time difference includes:

[0316] Step 601: Find the channel with the minimum phase difference in the third relative value among all channels;

[0317] Step 602: Taking the channel with the minimum value as the reference, calculate the phase differences of all channels relative to the reference; taking the devices in Table 2 and Table 3 as examples, assume that the channel with the minimum value is the channel number 3 of channel type 1. The specific calculation includes: Δα [j][c] = Δσ [j][c] - σ [3][1] , j ∈ [1, 14] or j ∈ [1, 6], c ∈ [1, 2];

[0318] where, Δα [j][c] is the phase difference of each channel relative to the channel with the minimum value as the reference, in radians;

[0319] Step 603: Using the frequency parameter of the excitation amount with the applied fixed value, convert the phase difference relative to the channel with the minimum value as the reference into a relative time difference; taking the devices in Table 2 and Table 3 as examples, assume that the channel with the minimum phase difference is the channel number 3 of channel type 1. The specific calculation includes: j ∈ [1, 14] or j ∈ [1, 6], c ∈ [1, 2];

[0320] where, ΔT [j][c] is the relative time difference, in milliseconds, and f e is the frequency of the excitation amount with the applied fixed value.

[0321] Step 116: Determine whether the process of storing the calibration parameters is completed. If so, proceed to the next step 117. If not, jump to step 119 to start the process of storing the calibration parameters;

[0322] Step 117: Determine whether all the calculation flags corresponding to the current calculation are successful. If so, proceed to the next step 118. If not, jump to step 126 to call the calibration parameters;

[0323] Step 118: Store the third relative values of each channel and the relative time differences of each channel as calibration parameters;

[0324] Step 119: Start the process of storing the calibration parameters;

[0325] Step 120: Determine whether the result of storing the calibration parameters is fed back. If so, proceed to the next step 121. If not, jump to step 126 to call the calibration parameters;

[0326] Step 121: Determine whether the result of storing the calibration parameters is successful. If so, proceed to the next step 122. If not, jump to step 123 to prompt that the storage of the calibration parameters is unsuccessful and send out a device exception warning signal;

[0327] Step 122: Prompt that the storage of the calibration parameters is successful and it is necessary to restart the machine. Jump to step 124 to end the process of storing the calibration parameters;

[0328] Step 123, prompt that the storage of calibration parameters is unsuccessful and send out an abnormal device alarm signal;

[0329] Step 124, end the process of storing calibration parameters;

[0330] Step 125, end the test status process of calculating calibration parameters;

[0331] Step 126, call calibration parameters; the present invention does not limit the specific implementation manner, but preferably, the flowchart is as Figure 8 shown, including:

[0332] Step 701, determine whether the process of calling calibration parameters is ended. If so, enter the next step 702. If not, jump to step 705 to start the process of calling calibration parameters;

[0333] Step 702, determine whether the calibration parameter abnormal alarm flag of the device is set. If so, jump to other steps of the normal operation status process in step 129. If not, enter the next step 703;

[0334] For the calibration parameter abnormal alarm flag of the device, it is set to no when the device is powered on and also set to no when the device performs an alarm reset operation.

[0335] Step 703, determine whether the call calibration parameter flag is successful. If so, jump to step 127 to perform consistency calibration calculation on the original sampling values of each channel based on the calibration parameters to obtain the consistency-calibrated sampling values. If not, enter the next step 704;

[0336] For the call calibration parameter flag, it is set to unsuccessful when the device is powered on.

[0337] Step 704, call the successfully saved calibration parameters;

[0338] Step 705, start the process of calling calibration parameters;

[0339] Step 706, determine whether the called calibration parameter data is ready. If so, enter the next step 707. If not, jump to other steps of the normal operation status process in step 129;

[0340] Step 707, determine whether the calibration parameter data is correct. If so, enter the next step 708. If not, jump to step 709 to save the calibration parameter abnormal alarm flag of the device as yes and send out an abnormal device alarm signal;

[0341] The data processing method for securely and reliably storing and determining whether calibration parameter data is correct is very common in devices. Similar data processing methods include system parameters and set value data of the device. The present invention does not limit the specific implementation manner, but preferably, it follows the data processing method of system parameters.

[0342] Step 708, save that the call of the calibration parameter flag is successful, and jump to step 711 to end the process of calling the calibration parameter;

[0343] Step 709, save that the calibration parameter exception alarm flag of the device is yes, and send a device exception alarm signal;

[0344] Step 710, end the process of calling the calibration parameter, and jump to other steps of the normal operation state process in step 129;

[0345] Step 711, end the process of calling the calibration parameter;

[0346] Step 127, based on the calibration parameter, perform a consistency correction calculation on the original sampled values of each channel to obtain the sampled values after consistency correction;

[0347] The present invention does not limit the specific implementation manner, but preferably, the flowchart is as Figure 9 shown, and the obtaining of the sampled values after consistency correction includes:

[0348] Step 801, use the relative value of the modulus of each channel in the calibration parameter to perform a correction calculation on the original sampled value of each channel to obtain the sampled value of each channel after correction by the relative value of the modulus; taking the devices in Table 2 and Table 3 as examples, the specific calculation includes: j ∈ [1, 14] or j ∈ [1, 6], c ∈ [1, 2];

[0349] Among them, u [j][c][t] is the original sampled value at time t, and x [j][c][t] is the sampled value at time t after correction by the relative value of the modulus.

[0350] Step 802, use the relative time difference of each channel in the calibration parameter to perform an interpolation calculation of the relative time difference on the sampled values of each channel after correction by the relative value of the modulus to obtain the sampled values after consistency correction; further, preferably, a two-point linear interpolation method is used. Taking the devices in Table 2 and Table 3 as examples, the specific calculation includes: j ∈ [1, 14] or j ∈ [1, 6], c ∈ [1, 2], as Figure 10 shown, the dotted line is the waveform schematic of the sampled values after consistency correction, and the solid line is the waveform schematic of the sampled values after correction by the relative value of the modulus;

[0351] Among them, i [j][c][t]is the sampled value after consistency correction at time t, x [j][c][t] is the sampled value after correction of the relative modulus value at time t, is the sampled value after correction of the relative modulus value at the previous sampling time at time t, t s is the sampling interval time, in milliseconds.

[0352] Step 128, based on the correction parameters, perform consistency correction calculation on the original phasor values of each channel to obtain the phasor values after consistency correction;

[0353] The present invention does not limit the specific implementation manner, but preferably, the obtaining of the phasor values after consistency correction includes:

[0354] Use the relative modulus value and phase difference of each channel in the correction parameters to correct and calculate the modulus and argument of the original phasor value of each channel respectively to obtain the phasor values after consistency correction; taking the devices in Table 2 and Table 3 as examples, the specific calculation includes: α [j][c][t] = γ [j][c][t] -Δσ [j][c] , j ∈ [1, 14] or j ∈ [1, 6], c ∈ [i, 2];

[0355] where, U [j][c][t] is the modulus of the original phasor value at time t, γ [j][c][t] is the argument of the original phasor value at time t, X [j][c][t] is the modulus of the phasor value after consistency correction at time t, α [j][c][t] is the argument of the phasor value after consistency correction at time t.

[0356] Step 129, for other steps of the normal operation state process, jump to Step 101 to determine whether the test state process of correction parameter calculation is ended, and continue the next cycle.

[0357] Those of ordinary skill in the art can realize that the modules and algorithm steps described in combination with the embodiments disclosed herein can be implemented by electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods for each specific application to implement the described functions, but such implementation should not be considered to exceed the scope of the present invention.

[0358] Those skilled in the art can clearly understand that for the convenience and conciseness of description, the specific working processes of the devices and equipment described above can refer to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0359] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections of the devices or modules can be in electrical, mechanical or other forms.

[0360] The modules described as separate components may or may not be physically separated. The components shown as modules may or may not be physical modules, that is, they can be located in one place or distributed to multiple network modules. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of the embodiments of the present invention.

[0361] In addition, each functional module in the embodiments of the present invention can be integrated into a processing module, or each module can exist physically alone, or two or more modules can be integrated into one module.

[0362] If the functions are implemented in the form of software function modules and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the method for sending / receiving energy-saving signals in various embodiments of the present invention. The foregoing storage medium includes: USB flash drives, mobile hard disks, ROM, RAM, magnetic disks, or optical discs, etc., which can store program codes.

[0363] The above description is only the preferred embodiment of the present application and the description of the applied technical principles. Those skilled in the art should understand that the scope of the invention involved in the present application is not limited to the technical solution formed by the specific combination of the above technical features, but should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the inventive concept. For example, the technical solutions formed by mutually replacing the above features with the (but not limited to) technical features with similar functions disclosed in the present application.

[0364] It should be understood that the magnitudes of the sequence numbers of the steps in the disclosure and implementation manners of the present invention do not absolutely mean the sequence of execution. The execution sequence of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the implementation manners of the present invention.

Claims

1. A multi-channel sampled value consistency correction method for a power system device, characterized in that Including: Group the same - type channels in the device for testing, and designate one channel in each test group as the reference channel for the test group; Designate one channel in each of the same - type channels in the device as the unique reference channel for the same type; Designate one channel in the device as the unique reference channel for the device; Apply an excitation quantity with a fixed value to each test group, and calculate the first relative value of all channels within the test group, where the reference for the first relative value is the reference channel of the test group; Based on the first relative value and the phasor values of all channels within the test group at the same time saved during the calculation of the first relative value, calculate the second relative value of all channels within the same type, where the reference for the second relative value is the unique reference channel for the same type; Based on the modulus relative value in the second relative value and applying an excitation quantity with a fixed value to each unique reference channel of the same type, calculate the modulus relative value in the third relative value of all channels within the same type, where the reference for the modulus relative value in the third relative value is the applied excitation quantity with a fixed value; Based on the phase difference in the second relative value and applying excitation quantities with fixed values to the unique reference channel for the same type and the unique reference channel for the device simultaneously, calculate the phase difference in the third relative value of all channels within the same type, where the reference for the phase difference in the third relative value is the unique reference channel for the device; Based on the phase difference in the third relative value and the frequency parameter of the applied excitation quantity with a fixed value, calculate the relative time difference; Store the third relative value of each channel and the relative time difference of each channel as calibration parameters; Based on the calibration parameters, perform consistency calibration calculation on the original sampling values of each channel to obtain the sampling values after consistency calibration; Based on the calibration parameters, perform consistency calibration calculation on the original phasor values of each channel to obtain the phasor values after consistency calibration.

2. The multi-channel sampled value consistency correction method for the power system device according to claim 1, characterized in that, The grouping of the same - type channels in the device for testing includes: The number of test groups is greater than or equal to 1; Any two test groups of the same - type channels can be connected through a common channel or through the transition of other test groups and common channels; The number of channels in each test group is greater than or equal to 2 and less than or equal to the maximum value of the number of channels in the same - type test group.

3. The multi-channel sampled value consistency correction method for the power system device according to claim 1, wherein Applying an excitation quantity with a fixed value to each test group includes: If the channels in the test group are of the current analog quantity channel type, the small CTs of all current analog quantity channels in the test group are connected end - to - end in series, ensuring the same - polarity input, and the current output of the test instrument is connected to the head and tail ends of the series - connected small CTs to apply an excitation quantity with a fixed value.

4. The multi-channel sampled value consistency correction method for the power system device according to claim 1, characterized in that Applying an excitation quantity with a fixed value to each test group also includes: If the channels in the test group are of the voltage analog quantity channel type, the small VTs of all voltage analog quantity channels in the test group are connected in parallel, ensuring the same - polarity input, and the voltage output of the test instrument is connected to the head and tail ends of the parallel - connected small VTs to apply an excitation quantity with a fixed value.

5. The multi-channel sampled value consistency correction method for the power system device according to claim 1, characterized in that, The step of applying an excitation quantity with a fixed value to each test group and calculating the first relative value of all channels within the test group includes: After applying the correct excitation quantity to the corresponding test group, select to enter the calculation process of the calibration parameters for the consistency calibration of the corresponding test group; Calculate and save the phasor values of all channels at the same time within the corresponding test group using the original sampled values; Judge whether the modulus values of the phasor values of all channels within the corresponding test group are within the excitation quantity range of the applied fixed value; If so, taking the reference channel of the corresponding test group as the reference, calculate the first relative value of all channels within the corresponding test group relative to the reference using the phasor values; Judge whether the first relative values of all channels within the corresponding test group are within a reasonable range; If so, the first relative value can be used.

6. The multi-channel sampled value consistency correction method for the power system device according to claim 5, characterized in that, The excitation quantity range for applying a fixed value to each test group is: [(1 - W F ) * I e1 * K1, (1 + W F ) * I e1 * K2]; Among them, W F is the percentage limit value of the channel ratio difference of the device, I e1 is the effective value of the excitation amount of the fixed value applied in the test grouping; K1 is the lower limit reliability coefficient of the modulus range; K2 is the upper limit reliability coefficient of the modulus range.

7. The multi-channel sampled value consistency correction method for the power system device according to claim 6, characterized in that, The value range of the lower limit reliability coefficient K1 of the modulus range is: 0.8 ≤ K1 ≤ 0.

98.

8. The multi-channel sampled value consistency correction method for the power system device according to claim 6, characterized in that, The value range of the upper limit reliability coefficient K2 of the modulus range is: 1.02 ≤ K2 ≤ 1.

2.

9. The multi-channel sampled value consistency correction method for the power system device according to claim 5, characterized in that The reasonable range includes: Specific reasonable range of modulus relative value: Among them, W F is the percentage limit of the channel ratio difference of the device, K3 is the lower reliability coefficient of the relative modulus value; K4 is the upper reliability coefficient of the relative modulus value.

10. The multi-channel sampled value consistency correction method for the power system device according to claim 9, characterized in that, The value range of the lower limit reliability coefficient K3 of the relative modulus value is: 0.9 ≤ K3 ≤ 0.

98.

11. The multi-channel sampled value consistency correction method for the power system device according to claim 9, characterized in that The value range of the upper limit reliability coefficient K4 of the relative modulus value is: 1.02 ≤ K4 ≤ 1.

1.

12. The multi-channel sampled value consistency correction method for the power system device according to claim 5, characterized in that, The reasonable range also includes: Specific reasonable range of phase difference: ≤ 2 * W Δθ * K5; Among them, K5 is the reliable coefficient of the phase difference range; W Δθ is the channel phase difference limit value of the device.

13. The multi-channel sampled value consistency correction method for the power system device according to claim 12, characterized in that, The value range of the reliability coefficient K5 of the phase difference range is: 1.01 ≤ K5 ≤ 1.

1.

14. The multi-channel sampled value consistency correction method for the power system device according to claim 1, characterized in that When calculating the second relative value, the following operations are performed on each test group respectively: Based on the phasor values of all channels at the same time within the test group saved during the calculation of the first relative value, calculate the relative value between the reference channel of the test group and the only reference channel of the same type; If the reference channel of the test group and the only reference channel of the same type are not in the same test group, it is necessary to perform superposition calculation through the connection of the common channels between the test groups to obtain the relative value between the reference channel of the test group and the only reference channel of the same type; Calculate the second relative value of all channels within the test group using the relative value between the reference channel of the test group and the only reference channel of the same type and the first relative value.

15. The multi-channel sampled value consistency correction method for the power system device according to claim 14, characterized in that, The superposition calculation includes: Step 1: Using the phasor values of all channels at the same time within the test group saved, calculate the relative value between the reference channel of the test group and the common channel of another test group that has a common channel with it; Step 2: Judge whether the other test group contains the only reference channel of the same type; Step 3: If so, using the phasor values of all channels at the same time within the other test group saved, calculate the relative value between the common channel of the other test group and the only reference channel of the same type in the other test group; superimpose and calculate all the relative values connected through the common channel to obtain the relative value between the reference channel of the test group and the only reference channel of the same type, and the superposition calculation ends; Step 4: If not, using the phasor values of all channels at the same time within the other test group saved, calculate the relative value between the common channel of the other test group and the common channel of the third test group that has a common channel with it; Step 5: Repeat steps 2 - step 4 to perform iterative calculation to obtain the corresponding relative value.

16. The multi-channel sampled value consistency correction method for the power system device according to claim 1, characterized in that The calculation of the relative time difference includes: Find the channel with the minimum phase difference among the third relative values in all channels; Based on the channel with the minimum value, calculate the phase difference of all channels relative to the reference; Using the frequency parameter of the excitation amount of the applied fixed value, convert the phase difference relative to the channel with the minimum value into a relative time difference.

17. The multi-channel sampled value consistency correction method for the power system device according to claim 1, characterized in that When calculating the modulus relative value in the third relative value, the following operations are respectively performed on the unique reference channel of the same type: After applying the correct excitation amount to the corresponding unique reference channel of the same type, select to enter the calculation process of the correction parameter of the modulus value of the corresponding unique reference channel of the same type; Calculate the effective value of the corresponding unique reference channel of the same type, and use the effective value to calculate the modulus relative value between the corresponding unique reference channel of the same type and the excitation amount of the applied fixed value; Judge whether the modulus relative value is within a reasonable range; If so, use the modulus relative value between the corresponding unique reference channel of the same type and the excitation amount of the applied fixed value, and the modulus relative value in the second relative value, to calculate the modulus relative value in the third relative value of all channels within the corresponding type.

18. The multi-channel sampled value consistency correction method for the power system device according to claim 1, characterized in that When calculating the phase difference in the third relative value, the following operations are respectively performed on the unique reference channel of the same type: After applying the correct excitation amount to the corresponding unique reference channel of the same type and the unique reference channel of the device, select to enter the calculation process of the correction parameter of the corresponding unique unified reference channel of the same type; Calculate the phasor values of the corresponding unique reference channel of the same type and the unique reference channel of the device at the same moment; Use the phasor values to calculate the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device, and subtract the phase difference between the corresponding unique reference channel of the same type and the excitation amount of the applied fixed value of the unique reference channel of the device; Judge whether the phase difference is within a reasonable range; If so, use the phase difference between the corresponding unique reference channel of the same type and the unique reference channel of the device, and the phase difference in the second relative value, to calculate the phase difference in the third relative value of all channels within the corresponding type.

19. The multi-channel sampled value consistency correction method for the power system device according to claim 1, characterized in that, The obtained sampled values after consistency correction include: Use the modulus relative value of each channel in the correction parameter to perform correction calculation on the original sampled value of each channel to obtain the sampled value of each channel corrected by the modulus relative value; Use the relative time difference of each channel in the correction parameter to perform interpolation calculation of the relative time difference on the sampled value of each channel corrected by the modulus relative value to obtain the sampled value after consistency correction.

20. The multi-channel sampled value consistency correction method for the power system device according to any one of claims 1-19, characterized in that, The obtained phasor values after consistency correction include: Use the modulus relative value and phase difference of each channel in the correction parameter to respectively perform correction calculation on the modulus and argument of the original phasor value of each channel to obtain the phasor value after consistency correction.

21. Multi-channel sampled value consistency correction system for power system devices, characterized in that, Include: The test grouping reference channel designation module groups the channels of the same type in the device for testing, and designates one channel in each test grouping as the test grouping reference channel; The unique reference channel designation module of the same type designates one channel among the channels of the same type in the device as the unique reference channel of the same type; The unique reference channel designation module of the device designates one channel in the device as the unique reference channel of the device; The first relative value calculation module applies a fixed-value excitation quantity to each test group, and calculates the first relative value of all channels within the test group, where the reference of the first relative value is the reference channel of the test group; The second relative value calculation module calculates the second relative value of all channels within the same type based on the first relative value and the phasor values of all channels within the test group at the same moment saved during the calculation of the first relative value, where the reference of the second relative value is the unique reference channel of the same type; The modulus relative value calculation module of the third relative value calculates the modulus relative value of the third relative value of all channels within the same type based on the modulus relative value of the second relative value and the fixed-value excitation quantity applied to each unique reference channel of the same type, where the reference of the modulus relative value of the third relative value is the fixed-value excitation quantity applied; The phase difference calculation module of the third relative value calculates the phase difference of the third relative value of all channels within the same type based on the phase difference of the second relative value and the fixed-value excitation quantities applied to the unique reference channel of the same type and the unique reference channel of the device simultaneously, where the reference of the phase difference of the third relative value is the unique reference channel of the device; The relative time difference calculation module calculates the relative time difference based on the phase difference of the third relative value and the frequency parameter of the fixed-value excitation quantity applied; The correction parameter acquisition module stores the third relative value of each channel and the relative time difference of each channel as correction parameters; The sampled value acquisition module performs a consistency correction calculation on the original sampled values of each channel based on the correction parameters to obtain the sampled values after consistency correction; The phasor value acquisition module performs a consistency correction calculation on the original phasor values of each channel based on the correction parameters to obtain the phasor values after consistency correction.

22. An electronic device, characterized in that, It includes a processor, a memory, and a computer program stored on the memory and executable on the processor. When the computer program is executed by the processor, it implements the multi-channel sampled value consistency correction method of the power system device as described in any one of claims 1-20.

23. A computer-readable storage medium, characterized in that, A computer program is stored on the computer-readable storage medium. When the computer program is executed by the processor, it implements the multi-channel sampled value consistency correction method of the power system device as described in any one of claims 1-20.

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