A LPDDR5 fast training system and method based on OTP technology

Abstract

The present invention discloses a LPDDR5 quick training system and method based on OTP technology, and relates to the field of data processing technology. The central processing module of the system is connected to the OTP storage module and the register module respectively; the OTP storage module is used to burn the training data of the register when it is powered on for the first time; the central processing module is used to obtain the storage data of the OTP storage module and send the storage data to the register module; the register module is used to fill the storage data back into the register and adjust the working state of the register. The present invention burns the training data of LPDDR5 into the OTP storage module. When LPDDR5 resumes the working state, the central processing module obtains the storage data in the OTP storage module as the training data and fills it back into the register, which saves the time of retraining LPDDR5, reduces the startup time of LPDDR5, and improves the working efficiency of LPDDR5.

Description

Technical Field

[0001] The present invention relates to the field of data processing technology, and in particular to an LPDDR5 quick training system and method based on OTP technology. Background Art

[0002] One Time Programmable (OTP) technology plays an important role in the field of data storage, and its applications cover multiple fields. Because of its power-off non-volatility, OTP memory can still maintain the storage data in the event of a power outage.

[0003] LPDDR5 is a low-power double data rate memory standard, mainly used in chips for mobile electronic products. Compared with its predecessor LPDDR4, LPDDR5 has higher input and output speeds, which means it has higher transmission efficiency. As a high-speed interface, LPDDR5 is susceptible to process errors, temperature drift, and signal instability. In order to ensure the stability and reliability of the system where LPDDR5 is located during operation, initialization and training are required before starting LPDDR5. The purpose of training is to obtain the backfill values ​​of the registers. After the delays corresponding to these values, the high-speed signals can meet the DRAM protocol for data transmission.

[0004] This means that every time a system including LPDDR5 is started, it needs to obtain the corresponding backfill value through training, which actually prolongs the startup time of the computer. In existing technologies, the startup time of the computer is reduced by optimizing the training process and speeding up the training time, but the training time is always difficult to eliminate or reduce to an acceptable value. Every time the computer is started, it always needs to wait for a period of training time, which reduces the working efficiency of LPDDR5. Summary of the invention

[0005] The purpose of the present invention is to provide an LPDDR5 quick training system and method based on OTP technology. The present invention burns the training data of LPDDR5 into the OTP storage module. When LPDDR5 resumes working state, the central processing module obtains the storage data in the OTP storage module as training data and fills it back into the register, which saves the time of retraining LPDDR5, reduces the startup time of LPDDR5, and improves the working efficiency of LPDDR5.

[0006] The purpose of the present invention is achieved by the following technical means:

[0007] In a first aspect, the present invention provides an LPDDR5 quick training system based on OTP technology, comprising: a central processing module, an OTP storage module and a register module;

[0008] The central processing module is connected to the OTP storage module and the register module respectively;

[0009] The OTP storage module is used to burn the training data of the register when the LPDDR5 is powered on for the first time;

[0010] The central processing module is used to obtain the storage data of the OTP storage module and send the storage data to the register module;

[0011] The register module is used to fill the stored data back into the register and adjust the working state of the register.

[0012] Preferably, the register module is further used to test the stored data to obtain a backfill test result, and send the backfill test result to the central processing module.

[0013] Preferably, the register module is further used to test the stored data to obtain a backfill test result, and send the backfill test result to the central processing module, specifically including:

[0014] The register module tests the stored data to obtain a correct backfill value and an incorrect backfill value;

[0015] Filling the correct backfill value back into the register;

[0016] The incorrect backfill value is returned to the central processing module.

[0017] Preferably, the central processing module is also used to train the register and fill the training data obtained by the training into the register, which specifically includes:

[0018] The central processing module obtains the register to be trained according to the incorrect backfill value;

[0019] Training the register to be trained to obtain updated training data;

[0020] The updated training data is filled into the register.

[0021] Preferably, the OTP storage module includes one or more of OTP and eFuse.

[0022] Preferably, the OTP storage module is used to burn the training data of the register, specifically including:

[0023] Burning the training data into the first memory;

[0024] Reading the storage data of the first memory to obtain first storage data;

[0025] Comparing the first stored data with the training data to determine whether the first stored data is the same as the training data;

[0026] If the first stored data is the same as the training data, using the first stored data as training data of the register;

[0027] If the first storage data is different from the training data, the training data is re-burned.

[0028] Preferably, if the first stored data is different from the training data, re-burning the training data specifically includes:

[0029] Obtaining data addresses and data values ​​at locations where the first stored data differ from the training data;

[0030] Determining whether all the data values ​​at the locations where the first stored data differ from the training data are first data values;

[0031] If the data values ​​at the locations where the first stored data and the training data differ are all the first data values, burning the first stored data into second data values ​​according to the data addresses at the locations where the first stored data and the training data differ;

[0032] If the data value at the place where the first storage data and the training data differ has the second data value, the training data is burned into the second memory, and the storage data of the second memory is used as the training data of the register.

[0033] Preferably, it also includes a first memory control module;

[0034] The first memory control module is connected to the register module and the memory particle;

[0035] The first memory control module is used to generate a clock enable signal, a chip select signal and an instruction input signal to control the transmission and processing of memory data.

[0036] Preferably, it also includes a second memory control module;

[0037] The second memory control module is connected to the register module and the memory particle;

[0038] The second memory control module is used to generate a data signal, a read data selection signal, a write clock signal and a data shielding signal to control the transmission and processing of memory data.

[0039] Second aspect

[0040] The present invention provides an LPDDR5 quick training method based on OTP technology, which is applied to the above-mentioned LPDDR5 quick training system based on OTP technology, including:

[0041] Get the storage data of the OTP storage module;

[0042] Using the stored data as training data to perform testing and obtain a backfill test result;

[0043] Determining whether all the backfill test results are correct;

[0044] If the backfill test results are all correct, the training data is backfilled into the register as the backfill value;

[0045] If the backfill test result is incorrect, a register to be trained is obtained according to the incorrect training data, the register to be trained is trained to obtain updated training data, and the updated training data is filled into the register.

[0046] Compared with the prior art, the present invention has the following beneficial effects:

[0047] The present invention burns the training data of LPDDR5 into the OTP storage module. When LPDDR5 resumes working state, the central processing module obtains the storage data in the OTP storage module as training data and fills it back into the register, which saves the time of retraining LPDDR5, reduces the startup time of LPDDR5, and improves the working efficiency of LPDDR5.

[0048] The present invention performs a backfill test on the training data through a register module to test whether there are incorrect backfill values ​​in the training data, thereby avoiding the problem of deviation in the training data caused by differences in environmental factors such as temperature and voltage when LPDDR5 is started, which is beneficial to the normal operation of LPDDR5.

[0049] The present invention controls the registers by retraining the registers corresponding to the incorrect backfill values, thereby reducing the training time of LPDDR5.

[0050] The present invention reads the burned training data, checks whether the burned training data has failed, and modifies the burning of the training data by obtaining the position and value of the burning failure point, thereby improving the accuracy of burning the training data of the OTP storage module and reducing the cost of re-burning the OTP storage module. BRIEF DESCRIPTION OF THE DRAWINGS

[0051] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0052] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0053] Figure 1 A schematic diagram of the structure of an LPDDR5 fast training system based on OTP technology provided in this embodiment;

[0054] Figure 2 A flowchart of a LPDDR5 quick training method based on OTP technology provided in this embodiment;

[0055] Figure 3 A schematic diagram of the structure of an electronic device provided in this embodiment. DETAILED DESCRIPTION

[0056] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0057] It should be noted that all directional indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present invention are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0058] In addition, the descriptions of "first", "second", etc. in the present invention are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in the field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0059] One Time Programmable (OTP) technology plays an important role in the field of data storage, and its applications cover multiple fields. Because of its power-off non-volatility, OTP memory can still maintain the storage data in the event of a power outage.

[0060] LPDDR5 is a low-power double data rate memory standard, mainly used in chips for mobile electronic products. Compared with its predecessor LPDDR4, LPDDR5 has higher input and output speeds, which means it has higher transmission efficiency. As a high-speed interface, LPDDR5 is susceptible to process errors, temperature drift, and signal instability. In order to ensure the stability and reliability of the system where LPDDR5 is located during operation, initialization and training are required before starting LPDDR5. The purpose of training is to obtain the backfill values ​​of the registers. After the delays corresponding to these values, the high-speed signals can meet the DRAM protocol for data transmission.

[0061] This means that every time a system including LPDDR5 is started, it needs to obtain the corresponding backfill value through training, which actually prolongs the startup time of the computer. In existing technologies, the startup time of the computer is reduced by optimizing the training process and speeding up the training time, but the training time is always difficult to eliminate or reduce to an acceptable value. Every time the computer is started, it always needs to wait for a period of training time, which reduces the working efficiency of LPDDR5.

[0062] The present invention burns the training data of LPDDR5 into the OTP storage module. When LPDDR5 resumes working state, the central processing module obtains the storage data in the OTP storage module as training data and fills it back into the register, which saves the time of retraining LPDDR5, reduces the startup time of LPDDR5, and improves the working efficiency of LPDDR5.

[0063] Example 1

[0064] A LPDDR5 fast training system based on OTP technology, such as Figure 1 Said, comprising: a central processing module 10, an OTP storage module 20 and a register module 30;

[0065] The central processing module 10 is connected to the OTP storage module 20 and the register module 30 respectively;

[0066] The OTP storage module 20 is used to burn the training data of the register when the LPDDR5 is powered on for the first time;

[0067] The central processing module 10 is used to obtain the storage data of the OTP storage module 20 and send the storage data to the register module 30;

[0068] The register module 30 is used to fill the stored data back into the register and adjust the working state of the register.

[0069] It should be noted that the training data in the OTP storage module 20 is obtained when the central processing module 10 trains the registers when the system is powered on for the first time. After completing all the training steps, the correct training data is obtained and filled into all the registers. At the same time, it is also sent to the OTP storage module 20 for burning. The storage data of the OTP storage module 20 has the characteristic of not being easily lost when power is off. When the work is completed or an emergency causes the LPDDR5 to need to be restarted, due to the basic consistency of the environment, the training data obtained by training is also consistent. Therefore, there is no need to re-train all the steps. The storage data can be directly read from the OTP storage module 20, and the storage data can be sent to the register module 30 and backfilled into the register. The OTP storage module 20 can be set in the LPDDR5 chip or outside the chip. The central processing module 10 communicates with the OTP storage module 20 through the physical layer interface to realize read and write access to the training data.

[0070] In this embodiment, by burning the training data of LPDDR5 into the OTP storage module 20, when LPDDR5 resumes working state, the central processing module 10 obtains the storage data in the OTP storage module as training data and fills it back into the register, which saves the time of retraining LPDDR5, reduces the startup time of LPDDR5, and improves the working efficiency of LPDDR5.

[0071] In some embodiments, the register module 30 is further used to test the stored data to obtain a backfill test result, and send the backfill test result to the central processing module 10 .

[0072] It should be noted that in order to verify the correctness of the training data, a backfill test can be performed on the backfill value. When the backfill test result is correct, the working state of LPDDR5 can be started directly. When the backfill test result is incorrect due to environmental factors such as temperature and voltage, the backfill test result will be sent to the central processing module 10 for subsequent processing.

[0073] In this embodiment, the register module 30 performs a backfill test on the training data to test whether there is an incorrect backfill value in the training data, thereby avoiding the problem of deviation in the training data caused by differences in environmental factors such as temperature and voltage when the LPDDR5 is started, which is beneficial to the normal operation of the LPDDR5.

[0074] In some embodiments, the register module 30 is further used to test the stored data to obtain a backfill test result, and send the backfill test result to the central processing module 10, specifically including:

[0075] The register module 30 tests the stored data to obtain a correct backfill value and an incorrect backfill value;

[0076] Fill the correct backfill value back into the register;

[0077] Incorrect backfill values ​​are returned to the central processing module 10 .

[0078] In some embodiments, the central processing module 10 is further used to train the register and fill the training data obtained by the training into the register, which specifically includes:

[0079] The central processing module 10 obtains the register to be trained according to the incorrect backfill value;

[0080] Train the register to be trained to obtain updated training data;

[0081] Fill the updated training data into the register.

[0082] It should be noted that there are multiple registers in the register module 30, each register has a backfill value, and the backfill values ​​are not necessarily the same. The central processing module 10 confirms the register where the problem is through the incorrect backfill value, and uses those registers as registers to be trained, and only trains them. Registers with correct backfill values ​​do not need to be trained.

[0083] In this embodiment, by retraining the registers corresponding to the incorrect backfill values, updated training data is obtained to control the registers, thereby reducing the training time of LPDDR5.

[0084] In some embodiments, the OTP storage module 20 includes one or more of OTP and eFuse.

[0085] It should be noted that both OTP and eFuse are one-time programmable memories, which only allow programming once. Once programmed, the data is permanently valid. From the perspective of technical principles, the working mechanisms of OTP and eFuse are opposite. OTP is an anti-fuse device, and its initial state is open circuit, that is, the initial logical state is 0. When it is broken down through the burning process, it becomes a path, and current can pass through. At this time, the logical state becomes 1. The eFuse is a fuse-type device, which is in a path state at the beginning, that is, the initial logical state is 1. During programming, a high current is applied to make it fuse, thereby blocking the current path, and the logical state at this time becomes 0. This difference does not have much impact on the data storage to be achieved in this embodiment, and can be adjusted according to the actual power consumption and area.

[0086] In some embodiments, the OTP storage module 20 is used to burn the training data of the register, specifically including:

[0087] Burning the training data into the first memory;

[0088] Reading the storage data of the first memory to obtain the first storage data;

[0089] Comparing the first stored data with the training data to determine whether the first stored data is the same as the training data;

[0090] If the first stored data is the same as the training data, using the first stored data as the training data of the register;

[0091] If the first stored data is different from the training data, the training data is re-burned.

[0092] Because the OTP storage module 20 is a non-volatile memory, it only allows one-time programming. Once the internal space is burned, it cannot be changed. When the temperature and voltage environmental factors cause the training data to deviate, the training data needs to be burned again, so that data burning may occur frequently. During the burning process of the OTP storage module 20, burning failure may occur. The training data is not correctly burned into the OTP storage module 20. The storage of the data stored in the OTP storage module 20 is stable. The storage of training data with burning failure will seriously affect the work of the system.

[0093] In this embodiment, the training data to be burned is read to check whether the training data to be burned is invalid, thereby improving the accuracy of the training data burned by the OTP storage module 20.

[0094] In some embodiments, if the first stored data is different from the training data, re-burning the training data specifically includes:

[0095] Obtaining data addresses and data values ​​at locations where the first stored data differ from the training data;

[0096] Determining whether all data values ​​at which the first stored data differ from the training data are first data values;

[0097] If the data values ​​at the locations where the first storage data and the training data differ are all the first data values, burning the first storage data into the second data value according to the data addresses at the locations where the first storage data and the training data differ;

[0098] If the data value at the place where the first storage data and the training data differ has a second data value, the training data is burned into the second memory, and the storage data of the second memory is used as the training data of the register.

[0099] It should be noted that the burning failure of the OTP storage module 20 can be divided into the following two types: one is that it is not burned in, that is, the data value of a certain address is always 0, not burned into 1, or the data value of a certain address is always 1, not blown to 0; the other is wrongly burned, that is, the data value of a certain address should be 0, but it is burned into 1, or the data value of a certain address should be 1, but it is blown to 0. Such a situation can be regarded as a problem with the burning, and there will be errors in the burned data. This embodiment distinguishes these two types of burning failures. When the burning failures that occur are all not burned in, the address with abnormal data value can be obtained and modified directly in the existing stored data. When the burning error occurs, the training data is re-burned. The first memory and the second memory mentioned in this embodiment can be two memories of the same type, or different storage spaces of the same memory. It is described that the first memory and the second memory only distinguish that the storage location of the re-burned training data is different from that of the first burned training data.

[0100] In this embodiment, by reading the burned training data, checking whether the burned training data has any failure, and by obtaining the position and value of the burning failure point, the burning of the training data is modified, thereby improving the accuracy of burning the training data in the OTP storage module 20 and reducing the cost of re-burning the OTP storage module 20.

[0101] In some embodiments, Figure 1 As shown, it also includes a first memory control module 40;

[0102] The first memory control module 40 is connected to the register module 30 and the memory particles;

[0103] The first memory control module 40 is used to generate a clock enable signal, a chip select signal and a command input signal to control the transmission and processing of memory data.

[0104] It should be noted that the first memory control module 40 is connected to the DRAM particles through a physical layer interface, and mainly generates CK, CS and CA signals. Only when the backfill values ​​of the registers are correct can the correct communication between the first memory control module 40 and the DRAM particles be guaranteed. In this embodiment, the first memory control module 40 is a hard-core AC module.

[0105] In some embodiments, Figure 1 As shown, it also includes a second memory control module 50;

[0106] The second memory control module 50 is connected to the register module 30 and the memory particles;

[0107] The second memory control module 50 is used to generate data signals, read data selection signals, write clock signals and data shielding signals, and control the transmission and processing of memory data.

[0108] It should be noted that the second memory control module 50 is connected to the DRAM particles through a physical layer interface, and mainly generates and receives DQ, RDQS, WCK and DMI signals. Only when the backfill values ​​of the registers are correct can the correct communication between the second memory control module 50 and the DRAM particles be guaranteed. In this embodiment, the second memory control module 50 is a DBYTE module.

[0109] It should be understood that the disclosed system can be implemented in other ways. For example, the system embodiments described above are merely schematic. For example, the division of the modules is only a logical function division. There may be other division methods in actual implementation. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, each functional module can be integrated into a processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The above-mentioned integrated modules can be implemented in the form of hardware or in the form of software functional modules.

[0110] An LPDDR5 quick training method based on OTP technology is applied to the above-mentioned LPDDR5 quick training system based on OTP technology, such as Figure 2 As shown, the following steps are included:

[0111] S100, obtaining storage data of the OTP storage module;

[0112] S200, testing the stored data as training data to obtain a backfill test result;

[0113] S300, determining whether all backfill test results are correct;

[0114] S400, if the backfill test results are all correct, the training data is backfilled into the register as the backfill value;

[0115] S500, if the backfill test result is incorrect, obtain the register to be trained according to the incorrect training data, train the register to be trained to obtain updated training data, and fill the updated training data into the register.

[0116] In this embodiment, by burning the training data of LPDDR5 into the OTP storage module, when LPDDR5 resumes working state, the central processing module obtains the storage data in the OTP storage module as training data and fills it back into the register, which saves the time of retraining LPDDR5, reduces the startup time of LPDDR5, and improves the working efficiency of LPDDR5.

[0117] An electronic device 2, such as Figure 3 As shown, a processor 21 and a memory 22, the memory 22 is used to store computer program codes, the computer program codes include computer instructions, and when the processor 21 executes the computer instructions, the electronic device executes the above-mentioned LPDDR5 quick training method based on OTP technology.

[0118] The electronic device 2 includes a processor 21, a memory 22, an output device 23, and an input device 24. The processor 21, the memory 22, the output device 23, and the input device 24 are coupled via a connector, and the connector includes various interfaces, transmission lines, or buses, etc., which are not limited in the embodiments of the present invention. It should be understood that in various embodiments of the present invention, coupling refers to mutual connection in a specific manner, including direct connection or indirect connection through other devices, for example, through various interfaces, transmission lines, buses, etc.

[0119] The processor 21 may be one or more graphics processing units (GPUs). When the processor 21 is a GPU, the GPU may be a single-core GPU or a multi-core GPU. Optionally, the processor 21 may be a processor group consisting of multiple GPUs, and the multiple processors are coupled to each other via one or more buses. Optionally, the processor 21 may also be other types of processors, etc., which are not limited in the embodiments of the present invention.

[0120] The memory 22 can be used to store computer program instructions and various computer program codes including program codes for executing the scheme of the present invention. Optionally, the memory 22 includes but is not limited to random access memory (RAM), read-only memory (ROM), erasable programmable read only memory (EPROM), or portable read only memory (CD-ROM), and the memory 22 is used for related instructions and data.

[0121] The input device 24 is used to input data and / or signals, and the output device 23 is used to output data and / or signals. The output device 23 and the input device 24 can be independent devices or an integrated device.

[0122] A computer-readable storage medium stores a computer program, wherein the computer program includes program instructions. When the program instructions are executed by a processor of an electronic device, the processor executes the above-mentioned method of LPDDR5 quick training based on OTP technology.

[0123] The foregoing is merely a specific embodiment of the present invention, which enables those skilled in the art to understand or implement the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A LPDDR5 fast training system based on OTP technology, characterized in that: include: Central processing module, OTP storage module and register module; The central processing module is connected to the OTP storage module and the register module respectively; The OTP storage module is used to burn the training data of the register when the LPDDR5 is powered on for the first time; The central processing module is used to obtain the storage data of the OTP storage module and send the storage data to the register module; The register module is used to fill the stored data back into the register and adjust the working state of the register; The register module is also used to test the stored data to obtain a backfill test result, and send the backfill test result to the central processing module; The register module is also used to test the stored data to obtain a backfill test result, and send the backfill test result to the central processing module, specifically including: The register module tests the stored data to obtain a correct backfill value and an incorrect backfill value; Filling the correct backfill value back into the register; returning the incorrect backfill value to the central processing module; The central processing module is also used to train the register and fill the training data obtained by the training into the register, which specifically includes: The central processing module obtains the register to be trained according to the incorrect backfill value; Training the register to be trained to obtain updated training data; The updated training data is filled into the register.

2. The LPDDR5 fast training system based on OTP technology according to claim 1, characterized in that: The OTP storage module includes one or more of OTP and eFuse.

3. The LPDDR5 fast training system based on OTP technology according to claim 2, characterized in that: The OTP storage module is used to burn the training data of the register, specifically including: Burning the training data into the first memory; Reading the storage data of the first memory to obtain first storage data; Comparing the first stored data with the training data to determine whether the first stored data is the same as the training data; If the first stored data is the same as the training data, using the first stored data as training data of the register; If the first storage data is different from the training data, the training data is re-burned.

4. The LPDDR5 fast training system based on OTP technology according to claim 3, characterized in that: If the first stored data is different from the training data, re-burning the training data specifically includes: Obtaining data addresses and data values ​​at locations where the first stored data differ from the training data; Determining whether all the data values ​​at the locations where the first stored data differ from the training data are first data values; If the data values ​​at the locations where the first stored data and the training data differ are all the first data values, burning the first stored data into second data values ​​according to the data addresses at the locations where the first stored data and the training data differ; If the data value at the place where the first storage data and the training data differ has the second data value, the training data is burned into the second memory, and the storage data of the second memory is used as the training data of the register.

5. The LPDDR5 fast training system based on OTP technology according to claim 1, characterized in that: Also included is a first memory control module; The first memory control module is connected to the register module and the memory particle; The first memory control module is used to generate a clock enable signal, a chip select signal and an instruction input signal to control the transmission and processing of memory data.

6. The LPDDR5 fast training system based on OTP technology according to claim 1, characterized in that: Also included is a second memory control module; The second memory control module is connected to the register module and the memory particle; The second memory control module is used to generate a data signal, a read data selection signal, a write clock signal and a data shielding signal to control the transmission and processing of memory data.

7. An LPDDR5 fast training method based on OTP technology, applied to an LPDDR5 fast training system based on OTP technology as claimed in any one of claims 1 to 6, characterized in that: include: Get the storage data of the OTP storage module; Using the stored data as training data to perform testing and obtain a backfill test result; Determining whether all the backfill test results are correct; If the backfill test results are all correct, the training data is backfilled into the register as the backfill value; If the backfill test result is incorrect, a register to be trained is obtained according to the incorrect training data, the register to be trained is trained to obtain updated training data, and the updated training data is filled into the register.

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