Reliability test data fusion method for multi-level series relation electronic information system

Abstract

The invention discloses a reliability test data fusion method for a multi-level series relation electronic information system, and belongs to the technical field of reliability evaluation of electronic information systems. The invention aims to solve the problem that the reliability evaluation period and cost are influenced because the reliability test data of subsystems and equipment of different levels are not fully utilized in the reliability evaluation of the existing complex multi-level electronic information system. Comprising the following steps: converting data in different environments to obtain unit fault data after environment fusion; converting data in different test stages to obtain unit fault data after stage fusion; converting different levels of data to obtain a unit reliability first-order moment and a unit reliability second-order moment; and calculating a system first-order moment and a system second-order moment based on the system subunits according to the system type of the electronic information system, and obtaining system-level reliability test data by combining the service life distribution of the system. The method is used for fusion of test data in reliability evaluation of the electronic information system.

Description

Technical Field

[0001] The invention relates to a reliability test data fusion method for a multi-level serial electronic information system, and belongs to the technical field of electronic information system reliability evaluation. Background Art

[0002] Complex multi-level electronic information systems, represented by the new generation of aircraft avionics systems and ship electronic information systems, have the characteristics of diverse composition, dynamic operation, and frequent failures. Traditional reliability assessment adopts the method of conducting whole machine reliability tests after system development, and completes the whole machine reliability assessment by collecting a large amount of reliability test data. Therefore, it faces problems such as long reliability assessment cycle and high cost.

[0003] In the process of developing complex multi-level electronic information systems, each manufacturer has carried out a large number of reliability tests under different environmental conditions for subsystems and equipment at different levels at different stages, and collected a large amount of reliability test data to evaluate the reliability indicators of each subsystem and equipment. At present, the above data has not been used in the reliability evaluation process of the whole system, resulting in a serious waste of data resources. Making full use of the above multi-source reliability test data to realize the reliability evaluation of complex multi-level electronic information systems can effectively reduce product development costs and improve product development efficiency. Summary of the invention

[0004] In view of the problem that reliability test data of subsystems and equipment at different levels are not fully utilized in reliability assessment of existing complex multi-level electronic information systems, which affects the reliability assessment cycle and cost, the present invention provides a reliability test data fusion method for multi-level serial electronic information systems.

[0005] A reliability test data fusion method for a multi-level serial electronic information system of the present invention comprises:

[0006] 1. Conversion of data in different environments:

[0007] The unit failure data of environment 1 is obtained by performing constant number truncation tests or timed truncation tests on n system subunits at different levels in environment 1; meanwhile, the unit failure data of other environments are obtained by performing constant number truncation tests or timed truncation tests on n system subunits at different levels in other environments;

[0008] Calculate the environmental factors of other environments relative to environment one, and convert the unit failure data in other environments to environment one, and then fuse them with the unit failure data in environment one to obtain the unit failure data after environment fusion;

[0009] 2. Conversion of data from different test stages:

[0010] Assuming that the development of n system subunits goes through M test stages, the unit failure rate of M test stages is calculated based on the unit failure data of each system subunit after environmental fusion in each test stage, and then the ratio of the unit failure rate of each test stage in the first M-1 test stages to the Mth test stage is calculated; according to the ratio of unit failure rates, the unit failure data after environmental fusion in the first M-1 test stages is converted to the Mth test stage to obtain the unit failure data after stage fusion;

[0011] 3. Conversion of data at different levels:

[0012] Calculate the first-order moment of unit reliability and the second-order moment of unit reliability of each system subunit according to the unit type and stage-fused unit failure data of each system subunit in all levels;

[0013] Then, according to the system type of the electronic information system, the system first-order moment and system second-order moment based on the system subunits are calculated, and combined with the system life distribution, the system-level reliability test data is obtained.

[0014] According to the reliability test data fusion method of the multi-level serial electronic information system of the present invention, in the conversion of data under different environments, the unit failure data of environment one includes the failure number r1 and the total test time T1; the unit failure data of other environments includes the failure number r2 and the total test time T2;

[0015] The method for determining the failure number r1 and total test time T1 for environment 1 is the same as the method for determining the failure number r2 and total test time T2 for other environments;

[0016] For the constant number truncation test, the method for determining the failure number r1 and the total test time T1 is:

[0017] In the constant truncation test of n system subunits, the failure number r1 is obtained by observation;

[0018] For r1 failed system subunits, the corresponding failure times are The total test time T1 is:

[0019]

[0020] For the timed truncation test, the method for determining the number of failures r1 and the total test time T1 is:

[0021] Set the deadline t D , in the timed truncation test of n system subunits, the failure number r1 is obtained by observation;

[0022] For r1 failed system subunits, the corresponding failure times are The total test time T1 is:

[0023]

[0024] Calculate the environmental factor k 2,1 =T1r2 / T2r1;

[0025] Convert (r2, T2) to the environment and we get in Then we can get the unit fault data after environment fusion in is the number of unit failures after environmental fusion, is the total test time of the unit after environmental integration.

[0026] According to the reliability test data fusion method of the multi-level serial electronic information system of the present invention, in the conversion of data at different test stages,

[0027] Assume that the total unit test time after environment fusion in the mth test stage is τ m , the number of unit failures after environmental fusion is R m , m=1,2,…,M;

[0028] If the number of unit failures after environmental fusion of the i-th system subunit in the m-th test phase is R m,i ,but:

[0029]

[0030] The qth failure time corresponding to the ith system subunit in the mth test phase determined based on the total test time of the unit after environment fusion is expressed as S m,i,q , q=1,2,…,R m,i , then the time reliability growth test data S of the ith system subunit in the mth test phase m,i for

[0031] According to the time reliability growth test data S m,i , the number of unit failures after environmental fusion R m,i And the total test time of the unit after environment fusion τ m The unit failure rate Q of the system subunit in the m0th test phase is calculated m0 and the unit failure rate Q of the system subunit in the Mth test phase M , m0=1,2,…,M-1; then the ratio of the unit failure rate of the m0th test stage to the Mth test stage is K m0,M for:

[0032] K m0,M =Q m0 / Q M ,

[0033] Where Q M The calculation method is:

[0034]

[0035] In the formula

[0036] According to K m0,M The total unit test time and the corresponding time reliability growth test data after environmental fusion in the m0th test stage are converted to the Mth test stage to obtain the converted environmental fusion fault data (τ M,m0 , S M,m0,i ):

[0037]

[0038] The number of unit failures R after environmental fusion in the m0th test phase m0 It remains unchanged after switching to the Mth trial stage;

[0039] The transformed environment is integrated with the fault data (τ M,m0 , S M,m0,i ) and the number of unit failures after environmental fusion R m0 It is fused with the unit fault data after environment fusion in the Mth test stage to obtain the unit fault data after stage fusion.

[0040] According to the reliability test data fusion method of the multi-level serial electronic information system of the present invention, if the system subunit is a binomial unit, in M ​​test stages, the total number of tests of the system subunit is N1, the total number of failures is f1, and the total number of successes is G1, G1=N1-f1;

[0041] The first-order moment μ1 of unit reliability is obtained as:

[0042]

[0043] The second-order moment v1 of unit reliability is:

[0044]

[0045] According to the reliability test data fusion method of the multi-level serial electronic information system of the present invention, if the system subunit is an exponential unit, in M ​​test stages, the total number of tests of the system subunit is N2, and the total number of failures is f2 based on the unit failure data after stage fusion:

[0046] The first-order moment μ2 of unit reliability is obtained as:

[0047]

[0048] The second-order moment v2 of unit reliability is:

[0049]

[0050] According to the reliability test data fusion method of the multi-level serial electronic information system of the present invention, if the system subunit is n Weibull type units, in M ​​test stages, the total failure number of the system subunits obtained based on the unit failure data after stage fusion is f3, and the failure times are H1, H2, ..., H f The test cut-off time is H D ,

[0051] The first-order moment μ3 of unit reliability is obtained as:

[0052]

[0053] The second-order moment v of unit reliability is:

[0054]

[0055] The intermediate variable A is:

[0056]

[0057] According to the reliability test data fusion method of the multi-level serial electronic information system of the present invention, it is assumed that the serial electronic information system includes X1 binomial units, X2 exponential units and X3 Weibull units;

[0058] The first-order moment μX of the system is:

[0059]

[0060] Where G1 x1 is the total number of successes of the x1th binomial unit, N1 x1 is the total number of trials for the x1th binomial unit, N2 x2 is the total number of trials for the x2th exponential unit, f2 x2 is the total failure number of the x2th exponential unit, μ3 x3 is the first-order moment of the unit reliability of the x3th Weibull type unit;

[0061] The second-order moment vX of the system is:

[0062]

[0063] Where v3 x3 is the second-order moment of the unit reliability of the x3th Weibull type unit.

[0064] According to the reliability test data fusion method of the multi-level serial electronic information system of the present invention, it is assumed that the life distribution of the serial electronic information system obeys the exponential distribution, and the calculation method of the system failure number z and the total system test number η in the system-level reliability test data is:

[0065]

[0066] η=(3-c) / [2(c-1)-0.335(c-1) 3 ],

[0067]

[0068] c is an intermediate variable.

[0069] Beneficial effects of the present invention: The method of the present invention collects reliability test data of system subunits under different environmental conditions, different test stages and different levels for data fusion to obtain fused system-level reliability test data. Using the fused system-level reliability test data for reliability assessment of the entire system can shorten the reliability assessment cycle, help reduce product development costs and improve product development efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0070] Figure 1 It is a flow chart of the reliability test data fusion method of the multi-level serial electronic information system of the present invention;

[0071] Figure 2 It is a flow chart that combines data at different levels. DETAILED DESCRIPTION

[0072] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0073] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments may be combined with each other.

[0074] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but they are not intended to limit the present invention.

[0075] Specific implementation method 1. Combination Figure 1 and Figure 2 As shown, the present invention provides a reliability test data fusion method for a multi-level serial electronic information system, comprising:

[0076] 1. Conversion of data in different environments:

[0077] The unit failure data of environment 1 is obtained by performing constant number truncation tests or timed truncation tests on n system subunits at different levels in environment 1; meanwhile, the unit failure data of other environments are obtained by performing constant number truncation tests or timed truncation tests on n system subunits at different levels in other environments;

[0078] Calculate the environmental factors of other environments relative to environment one, and convert the unit failure data in other environments to environment one, and then fuse them with the unit failure data in environment one to obtain the unit failure data after environment fusion;

[0079] 2. Conversion of data from different test stages:

[0080] Assuming that the development of n system subunits goes through M test stages, the unit failure rate of M test stages is calculated based on the unit failure data of each system subunit after environmental fusion in each test stage, and then the ratio of the unit failure rate of each test stage in the first M-1 test stages to the Mth test stage is calculated; according to the ratio of unit failure rates, the unit failure data after environmental fusion in the first M-1 test stages is converted to the Mth test stage to obtain the unit failure data after stage fusion;

[0081] 3. Conversion of data at different levels:

[0082] Calculate the first-order moment of unit reliability and the second-order moment of unit reliability of each system subunit according to the unit type and stage-fused unit failure data of each system subunit in all levels;

[0083] Then, according to the system type of the electronic information system, the system first-order moment and system second-order moment based on the system subunits are calculated, and combined with the system life distribution, the system-level reliability test data is obtained.

[0084] The system-level reliability test data obtained in this embodiment can be used to calculate the system reliability at the observation time in combination with a given confidence level. The system reliability data may include the system failure rate and the upper and lower confidence limits of the system failure rate, the system reliability and the upper and lower confidence limits of the system reliability, and the system mean time between failures at the observation time and the upper and lower limits of the system mean time between failures at the observation time.

[0085] In this embodiment, the system subunit includes a subsystem or a device.

[0086] To convert reliability data under different environments, it is first necessary to calculate the environmental factors based on the timed truncated or constant truncated data, give the point estimate and confidence limit of the environmental factors, and then convert the test data under different environments into the test data under the working environment.

[0087] Furthermore, in the conversion of data under different environments, the unit failure data of environment 1 includes the failure number r1 and the total test time T1; the unit failure data of other environments includes the failure number r2 and the total test time T2;

[0088] The method for determining the failure number r1 and total test time T1 for environment 1 is the same as the method for determining the failure number r2 and total test time T2 for other environments;

[0089] For the constant number truncation test, the method for determining the failure number r1 and the total test time T1 is:

[0090] In the constant truncation test of n system subunits, the failure number r1 is obtained by observation;

[0091] For r1 failed system subunits, the corresponding failure times are The total test time T1 is:

[0092]

[0093] For the timed truncation test, the method for determining the number of failures r1 and the total test time T1 is:

[0094] Set the deadline t D , in the timed truncation test of n system subunits, the failure number r1 is obtained by observation;

[0095] For r1 failed system subunits, the corresponding failure times are The total test time T1 is:

[0096]

[0097] Calculate the environmental factor k 2,1 =T1r2 / T2r1;

[0098] Convert (r2, T2) to the environment and we get in Then we can get the unit fault data after environment fusion in is the number of unit failures after environmental fusion, is the total test time of the unit after environmental integration.

[0099] Furthermore, after obtaining the reliability test data of the subsystem or equipment at different stages, the growth factor is calculated and the reliability data is converted accordingly.

[0100] Assume that the total unit test time after environment fusion in the mth test stage is τ m , the number of unit failures after environmental fusion is R m, m=1,2,…,M;

[0101] If the number of unit failures after environmental fusion of the i-th system subunit in the m-th test phase is R m,i ,but:

[0102]

[0103] The qth failure time corresponding to the ith system subunit in the mth test phase determined based on the total test time of the unit after environment fusion is expressed as S m,i,q , q=1,2,…,R m,i , then the time reliability growth test data S of the ith system subunit in the mth test phase m,i for

[0104] According to the time reliability growth test data S m,i , the number of unit failures after environmental fusion R m,i And the total test time of the unit after environment fusion τ m The unit failure rate Q of the system subunit in the m0th test phase is calculated m0 and the unit failure rate Q of the system subunit in the Mth test phase M , m0=1,2,…,M-1; then the ratio of the unit failure rate of the m0th test stage to the Mth test stage is K m0,M for:

[0105] K m0,M =Q m0 / Q M ,

[0106] Where Q M The calculation method is:

[0107]

[0108] In the formula

[0109] According to K m0,M The total unit test time and the corresponding time reliability growth test data after environmental fusion in the m0th test stage are converted to the Mth test stage to obtain the converted environmental fusion fault data (τ M,m0 , S M,m0,i ):

[0110]

[0111] The number of unit failures R after environmental fusion in the m0th test phase m0 It remains unchanged after switching to the Mth trial stage;

[0112] The transformed environment is integrated with the fault data (τ m,m0 , S M,m0,i ) and the number of unit failures after environmental fusion R m0 It is fused with the unit fault data after environment fusion in the Mth test stage to obtain the unit fault data after stage fusion.

[0113] The different levels of reliability data conversion method can convert the unit reliability test data of the bottom subsystem or equipment into the top system reliability test data. The specific process is as follows Figure 2 As shown, input the unit reliability test data of subsystems or equipment, calculate the unit reliability first-order moment and unit reliability second-order moment, and calculate the system first-order moment and second-order moment according to the reliability logic relationship between the unit and the system, such as series, parallel, voting and other reliability logic relationships. This implementation method takes the series relationship electronic information system as an example for calculation.

[0114] As an example, if the system subunit is a binomial unit, in M ​​test stages, the total number of tests of the system subunit based on the unit failure data after stage fusion is N1, the total number of failures is f1, and the total number of successes is G1, G1 = N1-f1;

[0115] The first-order moment μ1 of unit reliability is obtained as:

[0116]

[0117] The second-order moment v1 of unit reliability is:

[0118]

[0119] As an example, if the system subunit is an exponential unit, in M ​​test stages, the total number of tests of the system subunit is N2, and the total number of failures is f2 based on the unit failure data after stage fusion:

[0120] The first-order moment μ2 of unit reliability is obtained as:

[0121]

[0122] The second-order moment v2 of unit reliability is:

[0123]

[0124] As an example, if the system subunits are n Weibull type units, in M ​​test stages, the total number of failures of the system subunits obtained based on the unit failure data after stage fusion is f3, and the failure times are H1, H2, …, H f The test cut-off time is H D ,

[0125] The first-order moment μ3 of unit reliability is obtained as:

[0126]

[0127] The second-order moment v of unit reliability is:

[0128]

[0129] The intermediate variable A is:

[0130]

[0131] Furthermore, suppose that the serial relation electronic information system includes X1 binomial units, X2 exponential units, and X3 Weibull units;

[0132] The first-order moment μX of the system is:

[0133]

[0134] Where G1 x1 is the total number of successes of the x1th binomial unit, N1 x1 is the total number of trials for the x1th binomial unit, N2 x2 is the total number of trials for the x2th exponential unit, f2 x2 is the total failure number of the x2th exponential unit, μ3 x3 is the first-order moment of the unit reliability of the x3th Weibull type unit;

[0135] The second-order moment vX of the system is:

[0136]

[0137] Where v3 x3 is the second-order moment of the unit reliability of the x3th Weibull type unit.

[0138] In this embodiment, it is assumed that the life distribution of the electronic information system in series relationship follows an exponential distribution, and the calculation method of the system failure number z and the total system test number η in the system-level reliability test data is:

[0139]

[0140] η=(3-c) / [2(c-1)-0.335(c-1) 3 ],

[0141]

[0142] c is an intermediate variable.

[0143] Experimental verification shows that the method of the present invention can solve the problem of reliability assessment of electronic information systems of ships with new architectures.

[0144] Although the present invention is described herein with reference to specific embodiments, it should be understood that these embodiments are merely examples of the principles and applications of the present invention. It should therefore be understood that many modifications may be made to the exemplary embodiments and that other arrangements may be devised without departing from the spirit and scope of the present invention as defined by the appended claims. It should be understood that the various dependent claims and features described herein may be combined in a manner different from that described in the original claims. It should also be understood that the features described in conjunction with a single embodiment may be used in other described embodiments.

Claims

1. A reliability test data fusion method for a multi-level serial electronic information system, characterized in that: include:

1. Conversion of data in different environments: The unit failure data of environment 1 is obtained by performing constant number truncation tests or timed truncation tests on n system subunits at different levels in environment 1; meanwhile, the unit failure data of other environments are obtained by performing constant number truncation tests or timed truncation tests on n system subunits at different levels in other environments; Calculate the environmental factors of other environments relative to environment one, and convert the unit failure data in other environments to environment one, and then fuse them with the unit failure data in environment one to obtain the unit failure data after environment fusion; 2. Conversion of data from different test stages: Assuming that the development of n system subunits goes through M test stages, the unit failure rate of M test stages is calculated based on the unit failure data of each system subunit after environmental fusion in each test stage, and then the ratio of the unit failure rate of each test stage in the first M-1 test stages to the Mth test stage is calculated; according to the ratio of unit failure rates, the unit failure data after environmental fusion in the first M-1 test stages is converted to the Mth test stage to obtain the unit failure data after stage fusion; 3. Conversion of data at different levels: Calculate the first-order moment of unit reliability and the second-order moment of unit reliability of each system subunit according to the unit type and stage-fused unit failure data of each system subunit in all levels; Then, according to the system type of the electronic information system, the system first-order moment and system second-order moment based on the system subunits are calculated, and combined with the system life distribution, the system-level reliability test data is obtained.

2. The reliability test data fusion method of multi-level serial electronic information system according to claim 1 is characterized in that: In the conversion of data under different environments, the unit failure data of environment 1 includes the failure number r1 and the total test time T1; the unit failure data of other environments includes the failure number r2 and the total test time T2; The method for determining the failure number r1 and total test time T1 for environment 1 is the same as the method for determining the failure number r2 and total test time T2 for other environments; For the constant number truncation test, the method for determining the failure number r1 and the total test time T1 is: In the constant truncation test of n system subunits, the failure number r1 is obtained by observation; For r1 failed system subunits, the corresponding failure times are The total test time T1 is: For the timed truncation test, the method for determining the number of failures r1 and the total test time T1 is: Set the deadline t D , in the timed truncation test of n system subunits, the failure number r1 is obtained by observation; For r1 failed system subunits, the corresponding failure times are The total test time T1 is: Calculate the environmental factor k 2,1 =T1r2 / T2r1; Convert (r2, T2) to the environment and we get in Then we can get the unit fault data after environment fusion in is the number of unit failures after environmental fusion, is the total test time of the unit after environmental integration.

3. The reliability test data fusion method of multi-level serial electronic information system according to claim 2 is characterized in that: In the integration of data from different test phases, Assume that the total unit test time after environment fusion in the mth test stage is τ m , the number of unit failures after environmental fusion is R m , m=1,2,…,M; If the number of unit failures after environmental fusion of the i-th system subunit in the m-th test phase is R m,i ,but: The qth failure time corresponding to the ith system subunit in the mth test phase determined based on the total test time of the unit after environment fusion is expressed as S m,i,q , q=1,2,…,R m,i , then the time reliability growth test data S of the ith system subunit in the mth test phase m,i for According to the time reliability growth test data S m,i , the number of unit failures after environmental fusion R m,i And the total test time of the unit after environment fusion τ m The unit failure rate Q of the system subunit in the m0th test phase is calculated m0 and the unit failure rate Q of the system subunit in the Mth test phase M , m0=1,2,…,M-1; then the ratio of the unit failure rate of the m0th test stage to the Mth test stage is K m0,M for: K m0,M =Q m0 / Q M , Where Q M The calculation method is: In the formula According to K m0,M The total unit test time and the corresponding time reliability growth test data after environmental fusion in the m0th test stage are converted to the Mth test stage to obtain the converted environmental fusion fault data (τ M,m0 , S M,m0,i ): The number of unit failures R after environmental fusion in the m0th test phase m0 It remains unchanged after switching to the Mth trial stage; The transformed environment is integrated with the fault data (τ M,m0 , S M,m0,i ) and the number of unit failures after environmental fusion R m0 It is fused with the unit fault data after environment fusion in the Mth test stage to obtain the unit fault data after stage fusion.

4. The reliability test data fusion method of multi-level serial electronic information system according to claim 3 is characterized in that: If the system subunit is a binomial unit, in M ​​test stages, the total number of tests of the system subunit based on the unit failure data after stage fusion is N1, the total number of failures is f1, and the total number of successes is G1, G1 = N1-f1; The first-order moment μ1 of unit reliability is obtained as: The second-order moment ν1 of unit reliability is:

5. The reliability test data fusion method of multi-level serial electronic information system according to claim 4 is characterized in that: If the system subunit is an exponential unit, in M ​​test stages, the total number of tests of the system subunit is N2, and the total number of failures is f2 based on the unit failure data after stage fusion: The first-order moment μ2 of unit reliability is obtained as: The second-order moment v2 of unit reliability is:

6. The reliability test data fusion method of multi-level serial electronic information system according to claim 5 is characterized in that: If the system subunits are n Weibull type units, in M ​​test stages, the total failure number of the system subunits obtained based on the unit failure data after stage fusion is f3, and the failure times are H1, H2, …, H f The test cut-off time is H D , The first-order moment μ3 of unit reliability is obtained as: The second-order moment v of unit reliability is: The intermediate variable A is:

7. The reliability test data fusion method of multi-level serial electronic information system according to claim 6 is characterized in that: Assume that the serial relation electronic information system includes X1 binomial units, X2 exponential units and X3 Weibull units; The first-order moment μX of the system is: Where G1 x1 is the total number of successes of the x1th binomial unit, N1 x1 is the total number of trials for the x1th binomial unit, N2 x2 is the total number of trials for the x2th exponential unit, f2 x2 is the total failure number of the x2th exponential unit, μ3 x3 is the first-order moment of the unit reliability of the x3th Weibull type unit; The second-order moment νX of the system is: Where v3 x3 is the second-order moment of the unit reliability of the x3th Weibull type unit.

8. The reliability test data fusion method of multi-level serial electronic information system according to claim 7 is characterized in that: Assuming that the life distribution of the electronic information system with a series relationship follows an exponential distribution, the calculation method of the system failure number z and the total number of system tests η in the system-level reliability test data is: η=(3-c) / [2(c-1)-0.335(c-1) 3 ], c is an intermediate variable.

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