A data interaction system based on short-circuit protection test of dedicated transformer terminal interface

Abstract

The present invention relates to the technical field of electric power measurement, and discloses a data interaction system based on a short-circuit protection test of a special transformer terminal interface; the system comprises constructing a basic scenario, dividing an interface into a target interface and a test interface, converting the interface into a simulation test scenario, acquiring comprehensive test data, calculating an interface short-circuit coefficient, constructing an interaction channel with sub-channels, and importing a test data packet into the sub-channel to control the orderly interaction of the test data; compared with the prior art, the present invention facilitates rapid iteration of relevant test parameters and variables in a simulation test environment, and based on the interaction channel, can control the relevant test data in the interface short-circuit protection test to achieve efficient and smooth two-way interaction between a test tool and a special transformer terminal, thereby ensuring that the terminal participating in the interface short-circuit protection test can timely and comprehensively understand the test results, and provide accurate data support for the subsequent evaluation of the safety and reliability performance of the special transformer terminal.

Description

Technical Field

[0001] The present invention relates to the technical field of electric power measurement, and more specifically, to a data interaction system based on short-circuit protection test of a dedicated transformer terminal interface. Background Art

[0002] The dedicated transformer terminal is a device that collects electricity consumption information of dedicated transformer users. It can realize the collection of electricity meter data, the working condition of electricity metering equipment and the monitoring of power supply quality. In the electrical system, the dedicated transformer terminal is an important node for monitoring and control. With the continuous development of the field application of the dedicated transformer terminal, the short-circuit protection test is very important to ensure the safe operation of the electrical system. Whether from the perspective of safety, equipment protection, preventive measures or regulatory requirements, it is very necessary to conduct short-circuit protection testing of the dedicated transformer terminal interface.

[0003] The patent application with reference publication number CN118465617A discloses an artificial intelligence-based short-circuit test system for a cable interface, which can quickly perform short-circuit test analysis on the cable interface through a short-circuit test module, monitor the short-circuit status of adjacent pins, perform differential sorting when a short-circuit test fails, and mark the pins with short circuits to provide data support for the short-circuit test data processing and analysis process; the short-circuit test data of the cable interface can be processed and analyzed through the test analysis module, and the analysis object can be differentially marked according to the occupancy coefficient, and then the short-circuit characteristics of the processing cycle can be marked by the proportion of the number of covering objects in the analysis object, and the processing procedures of the cable interface can be optimized to reduce the failure rate of subsequent short-circuit tests; the distribution analysis module can perform pin distribution analysis on the independently marked processing cycle, and the concentration coefficient of the distribution set can be calculated in a cyclic processing manner, so as to determine the optimization direction of the wire processing of the cable interface through the concentration coefficient, and the abnormal process of the cable processing can be checked when the short-circuit test state is abnormal, so as to improve the efficiency of abnormal processing;

[0004] When the existing interface short-circuit protection test performs data interaction, it is necessary to use complex hardware connections and separate test tools to perform functional verification and fault diagnosis of the special transformer terminal interface, which makes the maintenance cost of the special transformer terminal interface short-circuit protection test high, and the test data cannot be quickly and bidirectionally interacted with each other, which results in the test data and test results of the interface short-circuit protection test cannot be fully and accurately provided to users for understanding and analysis, and thus the quality of the special transformer terminal cannot be quickly and accurately analyzed and screened, which reduces the test detection effect of the special transformer terminal in the electrical system.

[0005] In view of this, the present invention proposes a data interaction system based on a short-circuit protection test of a dedicated transformer terminal interface to solve the above-mentioned problem. Summary of the invention

[0006] In order to overcome the above defects of the prior art and to achieve the above objectives, the present invention provides the following technical solutions: a data interaction system based on short-circuit protection test of a dedicated transformer terminal interface, applied to a data interaction center, comprising:

[0007] The scenario construction module is used to construct a scenario outline with a scenario station, and import the test tooling and the special transformer terminal into the scenario station to generate a basic scenario;

[0008] The interface sorting module is used to obtain the test attributes of the dedicated terminal interface, including the test fixed bit and the test simulation bit, divide the interface into the target interface and the test interface, calculate the priority value of the test interface, and test the test interface.

[0009] A scenario conversion module is used to select a corresponding interface short circuit protection test instruction, which includes an interface short circuit instruction and an interface regular instruction, control the target interface and the test interface to enter a test mode, and convert the basic scenario into a simulation test scenario;

[0010] The coefficient calculation module is used to obtain the comprehensive test data in the simulation test scenario and calculate the interface short-circuit coefficient. The comprehensive test data includes the voltage difference value, the instruction delay time and the data processing rate;

[0011] A data aggregation module is used to generate an interface short-circuit level of the test interface according to the interface short-circuit coefficient, and aggregate the test interface and the corresponding comprehensive test data to generate a test data packet;

[0012] The channel interaction module is used to construct an interactive channel with sub-channels, import test data packets into the sub-channels, and control the orderly interaction of test data.

[0013] Furthermore, the scenario workstations include test workstations and special change workstations;

[0014] The scene outline construction method includes:

[0015] A blank infrastructure is constructed through virtual simulation technology, and a circular closed line is drawn outside the infrastructure to form a closed area;

[0016] Mark the center of the closed area, and use the center as the reference point to build two rectangular frames on both sides of the center, which are marked as the test station and the special transformer station;

[0017] I ports are marked equidistantly on the test station and the special transformer station and on the border close to the center of the circle, and the i ports are numbered in ascending order from top to bottom to generate a scene outline.

[0018] Furthermore, the basic scene generation method includes:

[0019] Import the test tool and the dedicated transformer terminal into the test station and the dedicated transformer station respectively, and adjust the positions of the test tool and the dedicated transformer terminal until the directions of the interfaces on the test tool and the dedicated transformer terminal face the directions of the ports on the test tool and the dedicated transformer terminal respectively;

[0020] Connect i test pins on the test fixture to i ports on the test station one by one, and connect i interface pins on the dedicated transformer terminal to i ports on the dedicated transformer station one by one, and obtain i valid fixture ports and i valid terminal ports respectively;

[0021] After i valid tooling ports and i valid terminal ports with the same number are connected one by one, a basic scene is generated, and a state switching box is established on the basic scene to control the state in the state switching box to be a standby state.

[0022] Furthermore, the method for dividing the target interface and the test interface includes:

[0023] The property boxes of i interfaces on the dedicated transformer terminal are queried in sequence through the technical parameter table, and the remark values ​​in the property boxes are identified to obtain i remark values;

[0024] Through natural language processing technology, key semantics of i remark values ​​are identified in turn to obtain i key semantics;

[0025] The remark value with the key semantics of short circuit is recorded as the target remark value, and the test attribute of the interface corresponding to the target remark value is recorded as the test fixed bit;

[0026] The remark value with the key semantics of simulation is recorded as simulation remark value, and the test attribute of the interface corresponding to the simulation remark value is recorded as test simulation bit;

[0027] The interface whose test attribute is to test fixed bit is recorded as the target interface, and the interface whose test attribute is to test simulated bit is recorded as the test interface. A test interface.

[0028] Furthermore, the calculation method of the priority value includes:

[0029] Real-time detection through current sensor The real-time load current of each test interface is measured, and the real-time load current greater than the standard current is recorded as abnormal current;

[0030] In the preset operation cycle, the The duration of abnormal current in the test interface is obtained abnormal duration, and After comparing each abnormal duration with the preset operation cycle duration, we can obtain The abnormal proportion value;

[0031] The expression of abnormal proportion is:

[0032] ;

[0033] In the formula, For the The abnormal percentage of the test interface, For the The abnormal duration of the test interface, The duration of the preset operation cycle;

[0034] Through the fault management system, The number of times a test interface fails within a preset operating cycle is obtained. Fault value;

[0035] Will The abnormal percentage and The fault values ​​are assigned different weight factors and then added together to generate priority value;

[0036] The expression for the priority value is:

[0037] ;

[0038] In the formula, For the The priority value of the test interface. For the The fault value of each test interface, , are all weight factors greater than 0.

[0039] Furthermore, the control method for the target interface and the test interface to enter the test mode includes:

[0040] When the interface is a target interface, the target interface selects an interface short circuit instruction, switches the interface power circuit of the target interface to a short circuit state, and controls the target interface to enter a test mode;

[0041] When the interface is a test interface, the test interface is controlled to select interface normal instructions in sequence according to the sequence of the arranged test interfaces, the interface power circuit of the test interface is kept in a normal power-on state, and the test interface is controlled to enter a test mode.

[0042] Furthermore, the method for obtaining the instruction delay duration includes:

[0043] At time T1, the voltage sensor detects The voltage of the test interface is obtained Real-time voltage value;

[0044] Towards Each test interface sends a voltage reduction command, and after a preset voltage reduction cycle, the The voltage of the test interface is obtained Step-down voltage value;

[0045] Query one by one by timestamp When the voltage drop value of the test interface is lower than the real-time voltage value for the first time, the A depressurization moment;

[0046] Set T1 to The duration of the pressure reduction moment is recorded as the pressure reduction duration, and the obtained The voltage reduction time is After subtracting the pressure reduction time from the standard time, we can get The delay time of each instruction;

[0047] The expression of instruction delay time is:

[0048] ;

[0049] In the formula, For the The command delay time of each test interface, For the The voltage reduction time of each test interface, The standard duration.

[0050] Furthermore, the method for obtaining the data processing rate includes:

[0051] At time T2, A test interface sends y data samples and marks the processing status of the y data samples one by one, which is recorded as the starting status;

[0052] At time T3, the processing status of the data samples output by the data processor is identified one by one, and recorded as the termination status;

[0053] The data samples whose ending state is inconsistent with the starting state are recorded as valid samples, and the number of valid samples is counted to obtain Processing value;

[0054] Will The processing value is compared with the time between time T2 and time T3 to obtain Data processing rate;

[0055] The expression of data processing rate is:

[0056] ;

[0057] In the formula, For the The data processing rate of each test interface, For the The throughput value of the test interface, is the duration between time T2 and time T3;

[0058] The expression of the interface short-circuit coefficient is:

[0059] ;

[0060] In the formula, For the The interface short-circuit coefficient of the test interface, For the The voltage difference value of each test interface, , , are all weight factors greater than 0.

[0061] Furthermore, the interface short circuit level includes a primary short circuit level and a secondary short circuit level, and the generation method of the primary short circuit level and the secondary short circuit level includes:

[0062] Will Interface short-circuit coefficient The interface short circuit threshold is preset Compare;

[0063] when Less than When , a short circuit level is generated;

[0064] when Greater than or equal to When , a secondary short circuit level is generated;

[0065] The test data packet includes a primary data packet and a secondary data packet, and the generation method of the primary data packet and the secondary data packet includes:

[0066] Arrange m test interfaces whose interface short-circuit level is the first-level short-circuit level one by one, and draw containment frames on the m test interfaces in sequence to obtain m first containment frames;

[0067] Import the integrated test data corresponding to the m test interfaces into the m first containing frames in sequence, and mark the m first containing frames with the remark word "level 1" to form m level 1 summary data;

[0068] Arrange n test interfaces whose interface short-circuit levels are secondary short-circuit levels one by one, and draw containment frames on the n test interfaces in turn to obtain n second containment frames;

[0069] Import the comprehensive test data corresponding to the n test interfaces into the n second containing frames in sequence, and mark the remark word "secondary" on the n second containing frames respectively, so as to form n secondary summary data;

[0070] The compression management system compresses the m first-level summary data and the n second-level summary data one by one to generate m first-level data packets and n second-level data packets.

[0071] Furthermore, the control method for orderly interaction of test data includes:

[0072] A closed channel outline is constructed by virtual reality technology, and data ports are drawn at both ends of the channel outline, which are recorded as a first data end and a second data end;

[0073] Import the test tool and the special transformer terminal into the first data terminal and the second data terminal respectively, and establish a first point position and a second point position at the midpoint position of the channel contour;

[0074] An interactive trigger point is set at a first point of the channel contour, and a switching trigger condition corresponding to the interactive trigger point is configured at a second point to generate an initial channel;

[0075] m first sub-channels and n second sub-channels are respectively planned in parallel in the initial channel, and interaction areas are respectively constructed at both ends of the m first sub-channels and the n second sub-channels to generate interaction channels;

[0076] First, m first-level data packets are imported into m sub-channels one by one, and then n second-level data packets are imported into n sub-channels one by one, and the first-level data packets and second-level data packets in the sub-channels are decompressed one by one through the compression management system to obtain a first-level test data set and a second-level test data set;

[0077] The switching is triggered by controlling the interaction trigger point according to the switching trigger condition, forcing the sub-channel to be turned on or off, and controlling the first-level test data set and the second-level test data set to interact bidirectionally in two interaction areas through the sub-channel.

[0078] The technical effects and advantages of the data interaction system based on the short-circuit protection test of the dedicated transformer terminal interface of the present invention are as follows:

[0079] The present invention constructs a scenario outline with a scenario station, and imports a test tool and a special transformer terminal into the scenario station to generate a basic scenario, obtain the test properties of the special transformer terminal interface, divide the interface into a target interface and a test interface, and calculate the priority value of the test interface, test the test interface in a sorted order, select a corresponding interface short-circuit protection test instruction, control the target interface and the test interface to enter a test mode, and convert the basic scenario into a simulation test scenario, obtain comprehensive test data in the simulation test scenario, calculate the interface short-circuit coefficient, generate an interface short-circuit level of the test interface according to the interface short-circuit coefficient, and summarize the test interface and the corresponding comprehensive test data to generate a test data packet, construct an interactive channel with sub-channels, and import the test data packet into the sub-channel to control the orderly interaction of the test data; compared with the prior art, by constructing the basic scenario, a real and reliable simulation test environment can be provided for the interface short-circuit protection test of the special transformer terminal, which is convenient By quickly changing the relevant test parameters and variables in the simulated test environment and combining the comparison of test attributes and priority values, the role of each interface in the test process can be accurately identified. On the basis of ensuring the independence and stability of different interfaces, it is also convenient to accurately collect relevant data in the interface short-circuit protection test, thereby improving the safety, reliability and automation level of the interface short-circuit protection test. At the same time, based on the interactive channel with sub-channels, the relevant test data in the interface short-circuit protection test can be controlled to achieve efficient and smooth two-way interaction between the test tooling and the dedicated transformer terminal, ensuring that the terminals participating in the interface short-circuit protection test can understand the test results in a timely and comprehensive manner, thereby providing accurate data support for the subsequent evaluation of the safety and reliability performance of the dedicated transformer terminal, and can help guide the development and iteration of intelligent fusion terminals in the substation area, thereby providing good technical guarantees for the product quality of the dedicated transformer terminal and the subsequent on-site trial operation stage. BRIEF DESCRIPTION OF THE DRAWINGS

[0080] Figure 1 A schematic diagram of a data interaction system based on a short-circuit protection test of a dedicated transformer terminal interface provided by Embodiments 1 and 2 of the present invention;

[0081] Figure 2 A flow chart of a data interaction method based on a short-circuit protection test of a dedicated transformer terminal interface provided in Embodiment 3 of the present invention. DETAILED DESCRIPTION

[0082] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0083] Example 1: Please refer to Figure 1 As shown, the data interaction system based on the short-circuit protection test of the dedicated transformer terminal interface described in this embodiment is applied to the data interaction center, including:

[0084] The scenario construction module constructs a scenario outline with a scenario station, and imports the test tooling and special transformer terminal into the scenario station to generate a basic scenario;

[0085] When performing short-circuit protection tests on the interfaces of dedicated transformer terminals, it is necessary to use an interface short-circuit protection test fixture with a large number of test stations, so that multiple interfaces of the dedicated transformer terminal can be connected to multiple test stations of the test fixture at the same time, achieving a multi-interface integrated test effect;

[0086] The profile scenario refers to the basic profile architecture that can provide interface short-circuit protection test operations for test tools and special transformer terminals, and provides a basis for subsequent specific interface short-circuit protection tests of test tools and special transformer terminals. It is also a blank template for building basic scenarios. The scenario station is the limitation of the position of the test tools and special transformer terminals in the scenario profile, ensuring that the test tools and special transformer terminals can be efficiently and accurately combined with the scenario profile.

[0087] The scene station includes a test station and a special transformer station; the test station is used to provide a location for the test tool to be imported into the scene outline, and the special transformer station is used to provide a location for the special transformer terminal to be imported into the scene outline;

[0088] The scene outline construction method includes:

[0089] A basic framework with blank content is constructed through virtual simulation technology, and a circular closed line is drawn outside the basic framework to form a closed area; the basic framework refers to the framework that constitutes the scene outline, and it also serves as a prerequisite for subsequent scene construction to ensure the integrity of the scene outline construction;

[0090] Mark the center of the closed area, and use the center as the reference point to build two rectangular frames on both sides of the center, which are marked as the test station and the special transformer station;

[0091] I ports are marked equidistantly on the test station and the special transformer station and on the border close to the center of the circle, and the i ports are numbered in ascending order from top to bottom to generate a scene outline.

[0092] After the scenario outline is obtained, a virtual simulation environment can be provided for the test tooling and the dedicated transformer terminal to perform the interface short-circuit protection test, so that the test tooling, the dedicated transformer terminal and the scenario outline can form a basic scenario for the interface short-circuit protection test;

[0093] The generation method of the basic scene includes:

[0094] Import the test tool and the dedicated transformer terminal into the test station and the dedicated transformer station respectively, and adjust the positions of the test tool and the dedicated transformer terminal until the directions of the interfaces on the test tool and the dedicated transformer terminal face the directions of the ports on the test tool and the dedicated transformer terminal respectively; by adjusting the directions, the directions of the interfaces and the ports can be adjusted to be aligned with each other, which facilitates the subsequent connection operations of the interfaces and ports;

[0095] Connect i test pins on the test fixture to i ports on the test station one by one, and connect i interface pins on the dedicated transformer terminal to i ports on the dedicated transformer station one by one, and obtain i valid fixture ports and i valid terminal ports respectively;

[0096] After connecting i valid tooling ports and i valid terminal ports with the same number one by one, a basic scenario is generated, and a state switching box is established on the basic scenario to control the state in the state switching box to be the standby state. The state switching box is a framework used to represent the state of the basic scenario. The state of the state switching box includes the standby state and the trigger state, which is used to meet the test requirements of different stages.

[0097] It should be noted that the hardware between the test tooling and the dedicated transformer terminal in the basic scenario is in a state of interconnection and power supply, so that the test tooling and the dedicated transformer terminal have the hardware foundation to be powered on for interface short-circuit protection testing, and provide a solid foundation for the software instructions of subsequent interface short-circuit protection testing, and also ensure the stable electrical connection effect between the test tooling and the dedicated transformer terminal.

[0098] The interface sorting module obtains the test attributes of the dedicated transformer terminal interface, divides the interface into a target interface and a test interface, calculates the priority value of the test interface, and sorts the test interface;

[0099] The test attribute is used to represent the role played by each interface on the dedicated transformer terminal in the interface short-circuit protection test, which can accurately represent the role played by each interface on the dedicated transformer terminal and provide different roles for the subsequent interface short-circuit protection test. After identifying the test attribute of the interface, the interface can be divided according to different test attributes, and the target interface and the test interface can be divided to meet the test requirements of the interface short-circuit protection test;

[0100] The test attributes include a test fixed bit and a test simulation bit; the test fixed bit means that the dedicated terminal interface is the execution interface of the interface short circuit protection test instruction in the interface short circuit protection test, and it is in a short circuit state; the test simulation bit means that the terminal interface is the test interface of the interface short circuit protection test instruction in the interface short circuit protection test, and it is in a simulation state;

[0101] The division methods of target interface and test interface include:

[0102] The attribute boxes of i interfaces on the dedicated transformer terminal are queried in sequence through the technical parameter table, and the remark values ​​in the attribute boxes are identified to obtain i remark values; the attribute box is used to represent the overall type of the interface, while the remark value represents the specific content in the attribute box and provides a basis for distinguishing the subsequent target interface and the test interface;

[0103] Through natural language processing technology, key semantics of i remark values ​​are identified in turn to obtain i key semantics;

[0104] The remark value with the key semantics of short circuit is recorded as the target remark value, and the test attribute of the interface corresponding to the target remark value is recorded as the test fixed bit;

[0105] The remark value with the key semantics of simulation is recorded as simulation remark value, and the test attribute of the interface corresponding to the simulation remark value is recorded as test simulation bit;

[0106] The interface whose test attribute is to test fixed bit is recorded as the target interface, and the interface whose test attribute is to test simulated bit is recorded as the test interface. A test interface.

[0107] After dividing the target interface and the test interface, since the number of test interfaces is greater than 1 and the target interface is in the interface short circuit state during simulation, The status of each test interface is tested one by one, so it is necessary to The test interfaces are sorted to ensure Each test interface maintains order during testing, improving the normal operation of the interface short-circuit protection test;

[0108] For the sake of To sort the test interfaces, The priority value of each test interface is calculated, and the priority value is used to determine the importance of the test interface. The test interfaces are used to arrange the test sequence;

[0109] The calculation method of the priority value includes:

[0110] Real-time detection through current sensor The real-time load current of each test interface is measured, and the real-time load current greater than the standard current is recorded as abnormal current; the standard current refers to the maximum value of the real-time load current of the interface of the dedicated transformer terminal when there is no short circuit risk, and is used as the numerical limit for subsequent judgment of abnormal current;

[0111] In the preset operation cycle, the The duration of abnormal current in the test interface is obtained abnormal duration, and After comparing each abnormal duration with the preset operation cycle duration, we can obtain The preset operation cycle refers to the range that can limit the calculation and collection time of the abnormal proportion value in the priority value;

[0112] The expression of abnormal proportion is:

[0113] ;

[0114] In the formula, For the The abnormal percentage of the test interface, For the The abnormal duration of the test interface, The duration of the preset operation cycle;

[0115] Through the fault management system, The number of times a test interface fails within a preset operating cycle is obtained. Fault value;

[0116] Will The abnormal percentage and The fault values ​​are assigned different weight factors and then added together to generate priority value;

[0117] The expression for the priority value is:

[0118] ;

[0119] In the formula, For the The priority value of the test interface. For the The fault value of each test interface, , All are weight factors greater than 0;

[0120] in, , exemplary, is 0.522, is 0.478; , The setting is to balance the proportion of abnormal proportion value and fault value in the priority value, which can ensure that the change of balanced abnormal proportion value and fault value can cause the priority value to change by a corresponding amount.

[0121] When you get After you have determined the priority values ​​of the test interfaces, you can then test the interfaces in descending order of priority. The priority values ​​of the test interfaces are arranged in descending order, and the test interface corresponding to the first priority value is used as the first interface for test data collection, and the test interface corresponding to the second priority value is used as the second interface for test data collection, and so on. The test interface corresponding to the priority value of the bit is the first An interface for test data collection can ensure that all test interfaces are arranged in order.

[0122] The scenario conversion module selects the corresponding interface short-circuit protection test instruction, controls the target interface and the test interface to enter the test mode, and converts the basic scenario into a simulation test scenario;

[0123] The interface short circuit protection test instruction refers to the control instruction corresponding to the target interface and the test interface when they are in the interface short circuit state, so as to simulate the actual state of the target interface and the test interface in the interface short circuit protection test;

[0124] The interface short circuit protection test instruction includes an interface short circuit instruction and an interface normal instruction; the interface short circuit instruction is an instruction for switching the test state of the target interface to the interface short circuit state, and the interface normal instruction is an instruction for controlling the test state of the test interface to a non-short circuit state;

[0125] When the target interface and the test interface receive different interface short-circuit protection test instructions respectively, the target interface and the test interface will control the target interface and the test interface to enter the test mode according to the specific contents of the instructions. The target interface and the test interface that enter the test mode can have the corresponding preparations required for the interface short-circuit protection test, thereby providing the best basis for the simulation operation of the subsequent interface short-circuit protection test.

[0126] The control method of the target interface and the test interface entering the test mode includes:

[0127] When the interface is a target interface, it means that the target interface at this time can be used as an interface in a short-circuit state during the subsequent interface short-circuit protection test. At this time, the target interface selects the interface short-circuit instruction;

[0128] When the target interface receives the interface short-circuit instruction, the interface power circuit of the target interface is switched to a short-circuit state, and the target interface is controlled to enter a test mode;

[0129] When the interface is a test interface, it means that the test interface at this time can be used as an interface in a non-short-circuit state during the subsequent interface short-circuit protection test. At this time, according to the sequence of the arranged test interfaces, the test interface selection interface general instructions are controlled in sequence;

[0130] When the test interface receives a normal interface instruction, the interface power circuit of the test interface is kept in a normal power-on state, and the test interface is controlled to enter a test mode.

[0131] When both the target interface and the test interface enter the test mode, the basic scenario at this time already has the prerequisites for performing short-circuit protection tests on the dedicated terminal interface. You only need to update and upgrade the basic scenario to a simulation test scenario to perform efficient short-circuit protection tests on the dedicated terminal interface in the simulation test scenario. When you want to convert the basic scenario to a simulation test scenario, you need to control the status switch in the status switch box on the basic scenario to the trigger state, so that the basic scenario can be converted to a simulation test scenario.

[0132] The coefficient calculation module obtains the comprehensive test data in the simulation test scenario and calculates the interface short-circuit coefficient. The comprehensive test data includes the voltage difference value, the instruction delay time and the data processing rate.

[0133] When in a simulated test scenario, the target interface will be in a short-circuit state, while the test interface will be powered on. It is necessary to monitor the safety and stability of the test interface in the short-circuit state. Therefore, it is necessary to collect comprehensive test data and calculate the reliability of the test interface in the short-circuit state through the comprehensive test data, so as to achieve the effect of distinguishing interfaces with different reliability levels on the dedicated transformer terminal.

[0134] Comprehensive test data includes voltage difference value, instruction delay time and data processing rate;

[0135] The voltage difference value refers to the difference between the actual voltage value of the test interface in the interface short-circuit protection test of the simulated test scenario and the standard voltage value, which can be used to represent the voltage at the test interface. The larger the voltage difference value, the larger the difference between the actual voltage value of the test interface in the interface short-circuit protection test of the simulated test scenario and the standard voltage value, the worse the safety and stability strength of the test interface, and the smaller the interface short-circuit coefficient;

[0136] When obtaining the voltage difference value, the voltage sensor is used to detect in real time The real-time voltage value of the test interface is After subtracting the real-time voltage value of each test interface from the standard voltage value, we can get Voltage difference value of each test interface;

[0137] The instruction delay time refers to the difference between the time taken by the test interface to process instructions in the interface short-circuit protection test of the simulated test scenario and the standard time, which can be used to represent the processing time at the test interface. The longer the instruction delay time is, the greater the difference between the time taken by the test interface to process instructions in the interface short-circuit protection test of the simulated test scenario and the standard time is, the worse the safety and stability strength of the test interface is, and the smaller the interface short-circuit coefficient is;

[0138] Methods for obtaining instruction delay duration include:

[0139] At time T1, the voltage sensor detects The voltage of the test interface is obtained Real-time voltage value;

[0140] Towards Each test interface sends a voltage reduction command, and after a preset voltage reduction cycle, the The voltage of the test interface is obtained The preset step-down cycle refers to the maximum time from when the voltage of the test interface receives the step-down instruction to when the step-down operation is completed, so as to ensure that the voltage of the test interface has enough time to complete the step-down operation, and avoid the test interface failing to step down normally due to insufficient step-down time.

[0141] Query one by one by timestamp When the voltage drop value of the test interface is lower than the real-time voltage value for the first time, the A depressurization moment;

[0142] Set T1 to The duration of the pressure reduction moment is recorded as the pressure reduction duration, and the obtained The voltage reduction time is After subtracting the pressure reduction time from the standard time, we can get The standard duration refers to the maximum voltage reduction duration of the test interface under normal circumstances, which can effectively and accurately distinguish the instruction delay duration;

[0143] The expression of instruction delay time is:

[0144] ;

[0145] In the formula, For the The command delay time of each test interface, For the The voltage reduction time of each test interface, The standard duration.

[0146] The data processing rate refers to the speed at which the test interface processes data per unit time in the interface short-circuit protection test of the simulated test scenario, which can be used to represent the processing performance at the test interface. The larger the data processing rate, the faster the test interface processes data per unit time in the interface short-circuit protection test of the simulated test scenario, the better the safety and stability of the test interface, and the larger the interface short-circuit coefficient;

[0147] Methods for obtaining data processing rate include:

[0148] At time T2, A test interface sends y data samples and marks the processing status of the y data samples one by one, which is recorded as the starting state; the processing status is used to indicate whether the data sample has been processed, and the processing status includes the processed state and the unprocessed state;

[0149] At time T3, the processing status of the data samples output by the data processor is identified one by one, and recorded as the termination status;

[0150] The data samples whose ending state is inconsistent with the starting state are recorded as valid samples, and the number of valid samples is counted to obtain Processing value;

[0151] Will The processing value is compared with the time between time T2 and time T3 to obtain Data processing rate;

[0152] The expression of data processing rate is:

[0153] ;

[0154] In the formula, For the The data processing rate of each test interface is For the The throughput value of the test interface, It is the duration between time T2 and time T3.

[0155] After the comprehensive test data is obtained, the interface short-circuit coefficient can be calculated based on the comprehensive test data, so that the interface short-circuit coefficient can numerically represent the safety and stability of each test interface under the interface short-circuit state, and serve as a basis for subsequent accurate distinction of the test interfaces;

[0156] The expression of the interface short-circuit coefficient is:

[0157] ;

[0158] In the formula, For the The interface short-circuit coefficient of the test interface, For the The voltage difference value of each test interface, , , All are weight factors greater than 0; , , The setting logic is the same as above , The setting logic is consistent.

[0159] The data aggregation module generates the interface short-circuit level of the test interface according to the interface short-circuit coefficient, and aggregates the test interface and the corresponding comprehensive test data to generate a test data packet;

[0160] The interface short circuit level is used to indicate the severity of abnormal phenomena in the test interface during the interface short circuit protection test, which can accurately indicate the abnormality of different test interfaces and facilitate further processing of the relevant data of the test interface.

[0161] The interface short circuit level includes a primary short circuit level and a secondary short circuit level; the short circuit abnormality degree of the test interface corresponding to the primary short circuit level is higher than the short circuit abnormality degree of the test interface corresponding to the secondary short circuit level;

[0162] The generation method of the primary short circuit level and the secondary short circuit level includes:

[0163] Will Interface short-circuit coefficient The interface short circuit threshold is preset Comparison; The preset interface short-circuit threshold refers to the value of the critical interface short-circuit coefficient when the interface short-circuit abnormality of the test interface is between the primary short-circuit level and the secondary short-circuit level, which can effectively distinguish the actual interface short-circuit level of the test interface; The preset interface short-circuit threshold is obtained by collecting a large number of critical interface short-circuit coefficients when the test interface is at the primary short-circuit level and the secondary short-circuit level in history, and calculating the average value thereof;

[0164] when Less than , explain The interface short-circuit coefficient of the test interface is less than the preset interface short-circuit threshold. If the interface short circuit abnormality of the test interface is serious, and the probability of failure of the interface of the dedicated transformer terminal is high, a first-level short circuit level is generated;

[0165] when Greater than or equal to , explain The interface short-circuit coefficient of the test interface is greater than or equal to the preset interface short-circuit threshold. If the interface short circuit abnormality of the test interface is relatively minor and the probability of failure of the interface of the dedicated transformer terminal is low, a secondary short circuit level is generated.

[0166] After the test interface is divided into the primary short circuit level and the secondary short circuit level, the test interfaces and comprehensive test data corresponding to the primary short circuit level and the secondary short circuit level can be packaged and integrated accordingly, so that the related interfaces and data at the same interface short circuit level can be aggregated together to form a test data packet, and facilitate subsequent data interaction processing;

[0167] The test data packet includes a primary data packet and a secondary data packet; the primary data packet refers to a data summary formed by a test interface with a primary short circuit level and the corresponding comprehensive test data, and the secondary data packet refers to a data summary formed by a test interface with a secondary short circuit level and the corresponding comprehensive test data;

[0168] The method for generating the primary data packet and the secondary data packet includes:

[0169] Arrange m test interfaces whose interface short-circuit level is the first-level short-circuit level one by one, and draw containment frames on the m test interfaces in sequence to obtain m first containment frames; the containment frame is used to provide an import space for the comprehensive test data to ensure that the comprehensive test data can be effectively and completely combined with the containment frame;

[0170] Import the integrated test data corresponding to the m test interfaces into the m first containing frames in sequence, and mark the m first containing frames with the remark word "level 1" to form m level 1 summary data;

[0171] Arrange n test interfaces whose interface short-circuit levels are secondary short-circuit levels one by one, and draw containment frames on the n test interfaces in turn to obtain n second containment frames;

[0172] Import the comprehensive test data corresponding to the n test interfaces into the n second containing frames in sequence, and mark the remark word "secondary" on the n second containing frames respectively, so as to form n secondary summary data;

[0173] The compression management system compresses the m first-level summary data and the n second-level summary data one by one to generate m first-level data packets and n second-level data packets.

[0174] It should be noted that the m first-level data packets and the n second-level data packets are independent of each other, and there will be no data cross-mixing between the two. Only when data interaction is performed subsequently, the data in the m first-level data packets and the n second-level data packets will interact with each other.

[0175] The channel interaction module constructs an interactive channel with sub-channels, imports test data packets into the sub-channels, and controls the orderly interaction of test data;

[0176] The interactive channel refers to a two-way channel that can provide data interaction for m primary data packets and n secondary data packets, and a platform that can efficiently interact with the data in the interface short-circuit protection test of the dedicated transformer terminal, so as to facilitate the management department to fully control the relevant process data of the dedicated transformer terminal interface short-circuit protection test, thereby improving the efficiency of the dedicated transformer terminal interface short-circuit protection test, and the sub-channel is the specific location in the interactive channel for importing and interacting with the test data packets;

[0177] When the interactive channel is established, it is necessary to import the obtained m first-level data packets and n second-level data packets into the corresponding sub-channel, and control all the data in the interactive channel to be displayed in order, so as to realize the interactive effect of all the data in the interface short-circuit protection test process on the dedicated transformer terminal;

[0178] The control methods for orderly interaction of test data include:

[0179] A closed channel outline is constructed by virtual reality technology, and data ports are drawn at both ends of the channel outline, which are recorded as the first data port and the second data port; the data port is used to provide a spatial position representation for the test tooling and the special transformer terminal, and to help build a data interaction channel between the test tooling and the special transformer terminal;

[0180] Import the test tool and the special transformer terminal into the first data terminal and the second data terminal respectively, and establish a first point position and a second point position at the midpoint position of the channel contour;

[0181] An interactive trigger point is set at the first point of the channel profile, and a switching trigger condition corresponding to the interactive trigger point is configured at the second point to generate an initial channel; the interactive trigger point refers to a node that can control the on / off state of the initial channel, so that the initial channel can be kept in the on state and the off state, providing a control basis for subsequent data interaction;

[0182] In the initial channel, m first sub-channels and n second sub-channels are respectively planned and distributed in parallel, and interaction areas are respectively constructed at both ends of the m first sub-channels and the n second sub-channels to generate an interaction channel; the interaction area refers to an area located at both ends of the interaction channel and capable of providing data interaction and fusion for the test data on the test tooling and the dedicated transformer terminal, so that the test data on the test tooling and the dedicated transformer terminal can be kept in an independent and stable area for interaction, thereby avoiding the loss of test data;

[0183] First, m first-level data packets are imported into m sub-channels one by one, and then n second-level data packets are imported into n sub-channels one by one, and the first-level data packets and second-level data packets in the sub-channels are decompressed one by one through the compression management system to obtain a first-level test data set and a second-level test data set;

[0184] The switching is triggered by controlling the interaction trigger point according to the switching trigger condition, forcing the sub-channel to be turned on or off, and controlling the first-level test data set and the second-level test data set to interact bidirectionally in two interaction areas through the sub-channel.

[0185] It should be noted that the two interactive areas correspond to the test tooling and the special transformer terminal respectively, which enables the test tooling and the special transformer terminal to perform two-way interaction of data during the interface short-circuit protection test through the interactive channel, thereby improving the safety and convenience of the special transformer terminal interface short-circuit protection test, and providing an accurate basis for the quality testing and inspection of the special transformer terminal.

[0186] In this embodiment, a scene outline with a scene station is constructed, and the test tooling and the special transformer terminal are imported into the scene station to generate a basic scene, obtain the test properties of the special transformer terminal interface, divide the interface into a target interface and a test interface, and calculate the priority value of the test interface, test sort the test interface, select the corresponding interface short-circuit protection test instruction, control the target interface and the test interface to enter the test mode, and convert the basic scene into a simulation test scene, obtain the comprehensive test data in the simulation test scene, calculate the interface short-circuit coefficient, generate the interface short-circuit level of the test interface according to the interface short-circuit coefficient, and summarize the test interface and the corresponding comprehensive test data to generate a test data packet, construct an interactive channel with sub-channels, and import the test data packet into the sub-channel to control the orderly interaction of test data. Compared with the prior art, by constructing the basic scene, a real and reliable simulation test environment can be provided for the interface short-circuit protection test of the special transformer terminal, which is convenient for It is convenient to quickly change the relevant test parameters and variables in the simulated test environment, and combine the comparison of test attributes and priority values ​​to accurately identify the role played by each interface in the test process. On the basis of ensuring the independence and stability of different interfaces, it is also convenient to accurately collect relevant data in the interface short-circuit protection test, thereby improving the safety, reliability and automation level of the interface short-circuit protection test. At the same time, based on the interactive channel with sub-channels, the relevant test data in the interface short-circuit protection test can be controlled to achieve efficient and smooth two-way interaction between the test tooling and the dedicated transformer terminal, ensuring that the terminals participating in the interface short-circuit protection test can understand the test results in a timely and comprehensive manner, thereby providing accurate data support for the subsequent evaluation of the safety and reliability performance of the dedicated transformer terminal, and can help guide the development and iteration of the intelligent fusion terminal in the substation area, thereby providing good technical guarantees for the product quality of the dedicated transformer terminal and the subsequent on-site trial operation stage.

[0187] Example 2: Please refer to Figure 1 As shown, the part not described in detail in this embodiment can be found in the description of the first embodiment, and the difference between this embodiment and the first embodiment is that the comprehensive test data can also be a voltage curve difference value, a ripple value curve difference value and a noise voltage curve difference value;

[0188] The voltage curve difference value refers to the difference between the real-time interface voltage curve and the standard interface voltage curve of the test interface in the interface short-circuit protection test of the simulated test scenario, which can be used to represent the voltage curve difference amplitude at the test interface. When the voltage curve difference value is larger, the safety and stability strength of the test interface is worse, and the interface short-circuit coefficient is smaller;

[0189] The ripple value curve difference value refers to the difference between the real-time ripple value curve and the standard ripple value curve of the test interface in the interface short-circuit protection test of the simulated test scenario, which can be used to represent the difference amplitude of the ripple value curve at the test interface. When the ripple value curve difference value is larger, the safety and stability strength of the test interface is worse, and the interface short-circuit coefficient is smaller;

[0190] The noise voltage curve difference value refers to the difference between the real-time noise voltage curve and the standard noise voltage curve of the test interface in the interface short-circuit protection test of the simulated test scenario, which can be used to represent the difference amplitude of the noise voltage curve at the test interface. When the noise voltage curve difference value is larger, the safety and stability strength of the test interface is worse, and the interface short-circuit coefficient is smaller;

[0191] In order to accurately obtain the precise data of voltage curve difference value, ripple value curve difference value and noise voltage curve difference value, it is necessary to use oscilloscope, spectrum analyzer and other analysis sampling tools to analyze the voltage curve at each sampling point in the preset step-down cycle. Collect comprehensive test data of each test interface;

[0192] Specifically, at each sampling time point in the preset voltage reduction cycle, The interface voltage of each test interface is collected, and the collected interface voltage is linked to the sampling time point, with the sampling time point as the horizontal coordinate and the interface voltage as the vertical coordinate, each sampling time point is matched with the corresponding interface voltage one by one, and a real-time interface voltage curve can be drawn. At the same time, the real-time interface voltage curve is compared with the standard interface voltage curve for the interface voltage difference between each sampling time point to obtain the interface voltage difference, and all the interface voltage differences are accumulated and averaged to obtain the voltage curve difference value;

[0193] At each sampling point in the preset voltage reduction cycle, The ripple value of each test interface is collected, and the collected ripple value is linked to the sampling time point, with the sampling time point as the horizontal coordinate and the ripple value as the vertical coordinate. Each sampling time point is matched with the corresponding ripple value one by one, and a real-time ripple value curve can be drawn. At the same time, the real-time ripple value curve and the standard ripple value curve are compared by comparing the ripple value between each sampling time point to obtain the ripple value difference, and all the ripple value differences are accumulated and averaged to obtain the ripple value curve difference value;

[0194] At each sampling point in the preset voltage reduction cycle, The noise voltage of each test interface is collected, and the collected noise voltage is linked to the sampling time point, with the sampling time point as the horizontal coordinate and the noise voltage as the vertical coordinate, each sampling time point is matched with the corresponding noise voltage one by one, and a real-time noise voltage curve can be drawn. At the same time, the real-time noise voltage curve is compared with the standard noise voltage curve for the difference of the noise voltage between each sampling time point to obtain the noise voltage difference, and all the noise voltage differences are accumulated and averaged to obtain the difference value of the noise voltage curve;

[0195] It should be noted that the standard interface voltage curve, standard ripple value curve and standard noise voltage curve are all The real-time voltage curve, real-time ripple value curve and real-time noise voltage curve of each test interface when not in a short circuit state can be used as a basis for obtaining the voltage curve difference value, the ripple value curve difference value and the noise voltage curve difference value;

[0196] After obtaining the voltage curve difference value, ripple value curve difference value and noise voltage curve difference value, the voltage curve difference value, ripple value curve difference value and noise voltage curve difference value can be calculated based on the voltage curve difference value, ripple value curve difference value and noise voltage curve difference value. Interface short-circuit coefficient of each test interface;

[0197] The expression of the interface short-circuit coefficient is:

[0198] ;

[0199] In the formula, For the The interface short-circuit coefficient of the test interface, For the The voltage curve difference value of each test interface, For the The difference value of the ripple value curve of the test interface, For the The difference value of the noise voltage curve of the test interface, , , All are weight factors greater than 0; , , The setting logic is the same as above , , The setting logic is consistent.

[0200] Example 3: Please refer to Figure 2 As shown, the part not described in detail in this embodiment is described in the first embodiment, and a data interaction method based on a short-circuit protection test of a dedicated transformer terminal interface is provided, which is applied to a data interaction center and implemented based on a data interaction system based on a short-circuit protection test of a dedicated transformer terminal interface, including:

[0201] S1: Construct a scenario outline with a scenario station, and import the test tooling and special transformer terminal into the scenario station to generate a basic scenario;

[0202] S2: obtaining the test attributes of the dedicated transformer terminal interface, the test attributes including the test fixed bit and the test simulation bit, dividing the interface into a target interface and a test interface, calculating the priority value of the test interface, and testing the test interface in a test order;

[0203] S3: Select a corresponding interface short circuit protection test instruction, which includes an interface short circuit instruction and an interface general instruction, control the target interface and the test interface to enter a test mode, and convert the basic scenario into a simulation test scenario;

[0204] S4: Obtain comprehensive test data in the simulation test scenario and calculate the interface short-circuit coefficient. The comprehensive test data includes voltage difference value, instruction delay time and data processing rate;

[0205] S5: Generate an interface short-circuit level of the test interface according to the interface short-circuit coefficient, and aggregate the test interface and the corresponding comprehensive test data to generate a test data packet;

[0206] S6: Construct an interactive channel with sub-channels, import the test data packets into the sub-channels, and control the orderly interaction of the test data.

[0207] The above description is only a specific implementation mode of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A data interaction system based on short-circuit protection test of special transformer terminal interface, applied to data interaction center, characterized in that: include: The scenario construction module is used to construct a scenario outline with a scenario station, and import the test tooling and the special transformer terminal into the scenario station to generate a basic scenario; The interface sorting module is used to obtain the test attributes of the dedicated terminal interface, including the test fixed bit and the test simulation bit, divide the interface into the target interface and the test interface, calculate the priority value of the test interface, and test the test interface. The calculation method of the priority value includes: Real-time detection through current sensor The real-time load current of each test interface is measured, and the real-time load current greater than the standard current is recorded as abnormal current; In the preset operation cycle, the The duration of abnormal current in the test interface is obtained abnormal duration, and After comparing each abnormal duration with the preset operation cycle duration, we can obtain The abnormal proportion value; The expression of abnormal proportion is: ； In the formula, For the The abnormal percentage of the test interface, For the The abnormal duration of the test interface, The duration of the preset operation cycle; Through the fault management system, The number of times a test interface fails within a preset operating cycle is obtained. Fault value; Will The abnormal percentage and The fault values ​​are assigned different weight factors and then added together to generate priority value; A scenario conversion module is used to select a corresponding interface short circuit protection test instruction, which includes an interface short circuit instruction and an interface regular instruction, control the target interface and the test interface to enter a test mode, and convert the basic scenario into a simulation test scenario; The coefficient calculation module is used to obtain the comprehensive test data in the simulation test scenario and calculate the interface short-circuit coefficient. The comprehensive test data includes the voltage difference value, the instruction delay time and the data processing rate; Methods for obtaining instruction delay duration include: At time T1, the voltage sensor detects The voltage of the test interface is obtained Real-time voltage value; Towards Each test interface sends a voltage reduction command, and after a preset voltage reduction cycle, the The voltage of the test interface is obtained Step-down voltage value; Query one by one by timestamp When the voltage drop value of the test interface is lower than the real-time voltage value for the first time, the A depressurization moment; Set T1 to The duration of the pressure reduction moment is recorded as the pressure reduction duration, and the obtained The voltage reduction time is After subtracting the pressure reduction time from the standard time, we can get The delay time of each instruction; The expression of instruction delay time is: ； In the formula, For the The command delay time of each test interface, For the The voltage reduction time of each test interface, is the standard duration; Methods for obtaining data processing rate include: At time T2, A test interface sends y data samples and marks the processing status of the y data samples one by one, which is recorded as the starting status; At time T3, the processing status of the data samples output by the data processor is identified one by one, and recorded as the termination status; The data samples whose ending state is inconsistent with the starting state are recorded as valid samples, and the number of valid samples is counted to obtain Processing value; Will The processing value is compared with the time between time T2 and time T3 to obtain Data processing rate; The expression of data processing rate is: ； In the formula, For the The data processing rate of each test interface, For the The throughput value of the test interface, is the duration between time T2 and time T3; The expression of the interface short-circuit coefficient is: ； In the formula, For the The interface short-circuit coefficient of the test interface, For the The voltage difference value of each test interface, , , All are weight factors greater than 0; A data aggregation module is used to generate an interface short-circuit level of the test interface according to the interface short-circuit coefficient, and aggregate the test interface and the corresponding comprehensive test data to generate a test data packet; The channel interaction module is used to construct an interactive channel with sub-channels, import test data packets into the sub-channels, and control the orderly interaction of test data.

2. According to claim 1, a data interaction system based on short-circuit protection test of a dedicated transformer terminal interface is characterized in that: The scenario workstations include a test workstation and a special change workstation; The scene outline construction method includes: A blank infrastructure is constructed through virtual simulation technology, and a circular closed line is drawn outside the infrastructure to form a closed area; Mark the center of the closed area, and use the center as the reference point to build two rectangular frames on both sides of the center, which are marked as the test station and the special transformer station; I ports are marked equidistantly on the test station and the special transformer station and on the border close to the center of the circle, and the i ports are numbered in ascending order from top to bottom to generate a scene outline.

3. A data interaction system based on short-circuit protection test of a dedicated transformer terminal interface according to claim 2, characterized in that: The method for generating the basic scene includes: Import the test tool and the dedicated transformer terminal into the test station and the dedicated transformer station respectively, and adjust the positions of the test tool and the dedicated transformer terminal until the directions of the interfaces on the test tool and the dedicated transformer terminal face the directions of the ports on the test tool and the dedicated transformer terminal respectively; Connect i test pins on the test fixture to i ports on the test station one by one, and connect i interface pins on the dedicated transformer terminal to i ports on the dedicated transformer station one by one, and obtain i valid fixture ports and i valid terminal ports respectively; After i valid tooling ports and i valid terminal ports with the same number are connected one by one, a basic scene is generated, and a state switching box is established on the basic scene to control the state in the state switching box to be a standby state.

4. A data interaction system based on short-circuit protection test of a dedicated transformer terminal interface according to claim 3, characterized in that: The method for dividing the target interface and the test interface includes: The property boxes of i interfaces on the dedicated transformer terminal are queried in sequence through the technical parameter table, and the remark values ​​in the property boxes are identified to obtain i remark values; Through natural language processing technology, key semantics of i remark values ​​are identified in turn to obtain i key semantics; The remark value with the key semantics of short circuit is recorded as the target remark value, and the test attribute of the interface corresponding to the target remark value is recorded as the test fixed bit; The remark value with the key semantics of simulation is recorded as simulation remark value, and the test attribute of the interface corresponding to the simulation remark value is recorded as test simulation bit; The interface whose test attribute is to test fixed bit is recorded as the target interface, and the interface whose test attribute is to test simulated bit is recorded as the test interface. A test interface.

5. A data interaction system based on short-circuit protection test of a dedicated transformer terminal interface according to claim 4, characterized in that: The expression of the priority value is: ； In the formula, For the The priority value of the test interface. For the The fault value of each test interface, , are all weight factors greater than 0.

6. A data interaction system based on short-circuit protection test of a dedicated transformer terminal interface according to claim 5, characterized in that: The control method for the target interface and the test interface to enter the test mode includes: When the interface is a target interface, the target interface selects an interface short circuit instruction, switches the interface power circuit of the target interface to a short circuit state, and controls the target interface to enter a test mode; When the interface is a test interface, the test interface is controlled to select interface normal instructions in sequence according to the sequence of the arranged test interfaces, the interface power circuit of the test interface is kept in a normal power-on state, and the test interface is controlled to enter a test mode.

7. A data interaction system based on short-circuit protection test of a dedicated transformer terminal interface according to claim 6, characterized in that: The interface short circuit level includes a primary short circuit level and a secondary short circuit level, and the generation method of the primary short circuit level and the secondary short circuit level includes: Will Interface short-circuit coefficient The short circuit threshold of the interface is preset Compare; when Less than When , a short circuit level is generated; when Greater than or equal to When , a secondary short circuit level is generated; The test data packet includes a primary data packet and a secondary data packet, and the generation method of the primary data packet and the secondary data packet includes: Arrange m test interfaces whose interface short-circuit level is the first-level short-circuit level one by one, and draw containment frames on the m test interfaces in sequence to obtain m first containment frames; Import the integrated test data corresponding to the m test interfaces into the m first containing frames in sequence, and mark the m first containing frames with the remark word "first level" respectively, so as to form m first level summary data; Arrange n test interfaces whose interface short-circuit levels are secondary short-circuit levels one by one, and draw containment frames on the n test interfaces in turn to obtain n second containment frames; Import the comprehensive test data corresponding to the n test interfaces into the n second containing frames in sequence, and mark the remark word "secondary" on the n second containing frames respectively, so as to form n secondary summary data; The compression management system compresses the m first-level summary data and the n second-level summary data one by one to generate m first-level data packets and n second-level data packets.

8. A data interaction system based on short-circuit protection test of a dedicated transformer terminal interface according to claim 7, characterized in that: The control method for orderly interaction of test data includes: A closed channel outline is constructed by virtual reality technology, and data ports are drawn at both ends of the channel outline, which are recorded as a first data end and a second data end; Import the test tool and the special transformer terminal into the first data terminal and the second data terminal respectively, and establish a first point position and a second point position at the midpoint position of the channel contour; An interactive trigger point is set at a first point of the channel contour, and a switching trigger condition corresponding to the interactive trigger point is configured at a second point to generate an initial channel; m first sub-channels and n second sub-channels are respectively planned in parallel in the initial channel, and interaction areas are respectively constructed at both ends of the m first sub-channels and the n second sub-channels to generate interaction channels; First, m first-level data packets are imported into m sub-channels one by one, and then n second-level data packets are imported into n sub-channels one by one, and the first-level data packets and second-level data packets in the sub-channels are decompressed one by one through the compression management system to obtain a first-level test data set and a second-level test data set; The switching is triggered by controlling the interaction trigger point according to the switching trigger condition, forcing the sub-channel to be turned on or off, and controlling the first-level test data set and the second-level test data set to interact bidirectionally in two interaction areas through the sub-channel.

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