Automobile intelligent distribution box hardware-in-the-loop test system

Abstract

The invention discloses an automobile intelligent power distribution box hardware-in-the-loop test system, and the system comprises an upper computer which is electrically connected with a port of an intelligent power distribution box through a PC bus, and carries out the data communication with the intelligent power distribution box through a CANFD bus; the intelligent power distribution box is connected with the simulation load and the real load through the load switcher. The upper computer is electrically connected with the simulation load and the real load. A communication port CANFD1 of the intelligent power distribution box is connected with a vehicle condition mode communication port of the automobile central control unit CCU, and a communication port CANFD2 of the intelligent power distribution box is connected with an intelligent power distribution communication port of the automobile central control unit CCU. The upper computer, the intelligent power distribution box, the load switcher, the simulation load, the real load and other components are integrated, hardware-in-loop testing of the automobile intelligent power distribution box is achieved, high-speed data communication is carried out through the CANFD bus, and the testing accuracy and reliability are improved.

Description

Technical Field

[0001] The invention belongs to the technical field of automobile electronic testing, and in particular relates to a hardware-in-the-loop testing system for an automobile intelligent power distribution box. Background Art

[0002] The Intelligent Power Distribution Unit (IPDU) is a core component of the power distribution of automobiles, especially new energy electric vehicles. It is responsible for managing the power flow between batteries, motors and other electronic devices, and is an important part of the automobile electrical system. The Intelligent Power Distribution Unit (IPDU) is a unit that integrates power distribution, monitoring and protection functions, provides overload, short circuit and overheating protection, ensures the effective operation of the power system, maintains the safety and reliability of the vehicle, and improves the energy efficiency and performance of the vehicle.

[0003] The intelligent power distribution box for cars is usually installed in one or more specific parts of the vehicle. When an electrical circuit fails, it acts as a hub to quickly locate the problem. It contains multiple fuses that automatically blow when the current is too large, thereby protecting the electrical circuit and electrical equipment from damage. In addition, the intelligent power distribution box for cars also has the function of connecting, distributing and managing various circuits in the automotive electrical system, and can distribute the power from the battery to various electrical equipment to ensure the normal operation of the vehicle.

[0004] The working principle of the intelligent power distribution box of electric vehicles involves the intelligent management and distribution of electric energy in electric vehicles. The components are relatively complex and mainly include the following units:

[0005] Power distribution unit : Responsible for distributing the power provided by the battery pack to various electrical loads of the vehicle, such as motors, air conditioning systems, lighting systems, on-board electronic equipment, etc. This unit manages these distribution paths through internal circuits and control logic, optimizes the use of power, and configures power distribution strategies according to specific needs; Circuit protection unit : Integrating functions such as overload protection, short circuit protection, and overvoltage protection, the unit protects the vehicle's electrical system from damage by preventing current abnormalities using fuses, circuit breakers, or electronic switches such as MOSFETs;

[0006] Current and voltage monitoring and fault diagnosis unit : Through current and voltage sensors, the current and voltage levels in the circuit are monitored in real time to detect and diagnose faults in the electrical system, such as open circuit, short circuit or ground fault; Communication interface unit : Communicate with other vehicle control units (such as BMS, VCU, etc.) through CAN, CANFD, and Ethernet protocols to coordinate the distribution of electrical energy and the status of the management system;

[0007] Control Logic Unit : Built-in control logic automatically adjusts power distribution based on the vehicle's operating status and needs. This includes cutting power to non-critical systems to extend driving range when the battery is low.

[0008] Since the process of realizing power distribution in electric vehicles by intelligent power distribution boxes involves multiple circuit units and dynamic and complex control strategies, there are many difficulties in testing them during the design and production process. These difficulties include high voltage and high current test environment, complex and diverse functional test requirements, real-time and synchronization test requirements, dynamic load and fault simulation, and integrated and modular test structure. Summary of the invention

[0009] One of the embodiments of the present disclosure is a hardware-in-the-loop testing system for an intelligent power distribution box of an automobile, the system comprising:

[0010] A host computer is electrically connected to the port of the intelligent power distribution box via a PC bus, and performs data communication with the intelligent power distribution box via a CANFD bus;

[0011] The intelligent distribution box is connected to the simulated load and the real load through a load switch;

[0012] The host computer is electrically connected to the simulated load and the real load.

[0013] The test system includes 2 sets of power supply battery outputs.

[0014] The communication port CANFD1 of the intelligent power distribution box is connected to the vehicle condition mode communication port of the automobile central control unit CCU, and the communication port CANFD2 of the intelligent power distribution box is connected to the intelligent power distribution communication port of the automobile central control unit CCU. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The above and other objects, features and advantages of the exemplary embodiments of the present invention will become readily understood by reading the following detailed description with reference to the accompanying drawings. In the accompanying drawings, several embodiments of the present invention are shown in an exemplary and non-limiting manner, in which:

[0016] Figure 1 A schematic diagram of an existing intelligent power distribution box hardware-in-the-loop test system.

[0017] Figure 2 A schematic diagram of the principle of a hardware-in-the-loop test system for an intelligent power distribution box according to one embodiment of the present invention. DETAILED DESCRIPTION

[0018] In the three-level module system of a car, the full name of the car CCU is the car central control unit. CCU is an important component in the automotive field, mainly responsible for processing and controlling various functions of the car. Together with BMS (battery management system), ECU (engine electronic control unit), GCU (generator controller), MCU (motor controller), TCU (transmission control system) and VCU (vehicle control unit), they constitute the control system of the car. These control systems are responsible for coordinating various operations of the vehicle to ensure that the car can run safely and efficiently. The intelligent distribution box IPDU in this disclosure is connected to the CCU in the vehicle control system, so the test of IPDU has always been an important part of automotive electronic testing.

[0019] In order to solve the testing difficulties of smart distribution boxes, hardware-in-the-loop (HIL) testing technology can be used, combined with a real-time simulation platform, a high-precision simulation model and fault injection to meet the needs of comprehensive testing of smart distribution boxes during design and production.

[0020] HIL (Hardware-in-the-Loop) testing technology is to verify the performance and reliability of hardware components or the entire system by simulating the operating environment of the system under test and creating a closed-loop testing environment. The characteristics of the HIL test system include:

[0021] 1. Through real-time simulation, simulate the system or environment that the hardware under test will encounter in actual application;

[0022] 2. Through the input / output (I / O) interface, the simulation model and the hardware under test realize real-time signal interaction;

[0023] 3. Simulate various sensor signals, actuator responses, and communication bus signals to test the behavior of the hardware under different operating conditions;

[0024] 4. The output of the hardware components is fed back into the simulation model, forming a closed-loop system that allows the test system to dynamically respond to changes in the hardware;

[0025] 5. Fault codes can be injected into the simulation model to test the hardware’s fault tolerance and fault diagnosis logic;

[0026] 6. The input and output data of the tested hardware are collected in real time to analyze hardware performance and identify potential problems; 7. Support simulation and acquisition of multi-channel signals to meet complex system testing requirements;

[0027] 8. Various software tools can be integrated, such as Matlab / Simulink, LabVIEW, etc., for model development, test sequence design and result analysis;

[0028] 9. Support automated testing processes, including test sequence execution, data collection, and result analysis and evaluation, to verify whether the hardware under test meets the design specifications and performance requirements.

[0029] One of the mainstream HIL testing solutions in the automotive testing field is the test solution proposed by Vector, which includes its software tools such as CANoe, LINtool and vTESTstudio, as well as various hardware interface modules. These tools and modules together constitute Vector's HIL test platform.

[0030] like Figure 1 As shown in the figure, the CANoe tool provides a simulation setting module for the simulation communication of IPDU and a test module for the test sequence of IPDU. Although they can cover many test cases for IPDU, they have the disadvantages of being non-portable and inflexible in writing. The host PC software of the test system uses a combination of vTEST and LabView. The host computer and the CANoe platform tool perform two-way data communication. At the same time, the simulated load is controlled by a third-party supporting load control module to simulate various required test environments for the IPDU test. At present, this test architecture cannot deeply control or test all units and functions of IPDU because the CANoe platform tool and the test object IPDU can only communicate through the bus, and the communication instructions and data volume are small. It is even more impossible to debug the internal setting parameters of IPDU. Therefore, the compatibility of this test architecture is small, and it cannot adapt to the different requirements of diverse test objects. The test requirements are not flexible to modify and the adaptability is poor.

[0031] According to one or more embodiments, a hardware-in-the-loop testing system for an automotive intelligent power distribution box is provided. Figure 2 As shown. The disclosed embodiment uses an industrial computer PC, loads a PCI-CANFD control card, replaces the installation of CANOE and VTESTStudio, and uses LabView to design test cases to communicate and diagnose IPDU. PC and IPDU perform two-way data communication, and IPDU is connected to a simulated load or a real load, and these two loads can be controlled and switched. The load application mode control and online real-time sampling program are written based on LabView software.

[0032] CANFD (CAN with Flexible Data-Rate) is a communication protocol based on the CAN (Controller Area Network) protocol, with higher data rates, larger data packets, flexible data rates, improved timestamps and error handling. CAN FD can be combined with the PC bus in a variety of ways to achieve communication between the PC and the CAN FD network, including USB to CAN FD interface, PCI / PCIe interface card, and virtual bus.

[0033] In this embodiment, the test object, the intelligent distribution box, is responsible for the vehicle's primary load distribution, overload and short-circuit protection of the wiring harness circuit, and isolation of the A and B power grids. The test system includes port fault diagnosis and upload, dark current monitoring and other functions. The test system includes two sets of A and B power grid isolation schemes corresponding to two completely independent battery output systems, and the BMS battery management system intelligently manages the output distribution of the two networks according to the output power balance. The power grid here refers to the power supply battery system.

[0034] The test system of the disclosed embodiment includes a switch detection function for monitoring the power supply status and performing fault diagnosis. The test system includes multiple power modules, including BAT1, DCDC1, BAT2, and DCDC2. DCDC1 and DCDC2 are responsible for converting the direct current of the battery into the voltage and current required by the system, and controlling the power supply through the NMOS tube, for example, through the configurations of D+NMOS+BYPASS and NMOS+B to achieve switching or bypassing of the power supply path. For fuel vehicles, BAT is the car battery and DCDC is the car generator. For new energy vehicles, BAT is the car battery and DCDC is the power supply converted from high voltage electricity.

[0035] In the disclosed embodiment, the intelligent power distribution box has communication ports CANFD1 and CANFD2, as well as switch signal input ports, battery input port 1 and battery input port 2, and also includes a number of A network input ports and B network input ports. The intelligent power distribution box is connected to the CCU (central control unit) of the vehicle. Specifically, the port CANFD1 of the intelligent power distribution box is connected to the vehicle condition mode communication port of the CCU, and CANFD2 is connected to the intelligent power distribution communication port of the CCU. The host computer of the test system simulates the CCU communication command, switches the vehicle condition mode of the intelligent power distribution box IPDU and performs the test procedure of the intelligent distribution function.

[0036] According to one or more embodiments, a HIL test system compatible with different intelligent distribution boxes uses multi-channel expansion characteristics to simulate in-loop control and diagnosis of intelligent distribution boxes. Not only load simulation and parameter monitoring under different working conditions, but also switching tests of simulated loads and actual loads of the distribution box are realized, and the diagnostic data of the output channel of the distribution box is calibrated. The test system includes a control cabinet and a load cabinet, wherein the fourth layer at the bottom of the control cabinet is provided with an industrial control chassis. On the third layer of the control cabinet, a digital multimeter, a main power control box, and a DA analog module are provided. A DC / DC power supply is provided on the second layer of the control cabinet. On the top layer of the control cabinet, the first layer, there are batteries and two high-current relays. On the first layer, there are test fixtures and display screens of the test system. The test fixture is connected to the simulated load in the load cabinet through a load harness.

[0037] The industrial computer in the control cabinet is responsible for switching and controlling the simulated load and the real load, while monitoring the load temperature.

[0038] The test system builds various fault mode loops for the intelligent distribution box, uses a high-speed DO control module controlled by CANFD communication, outputs control relay matrix signals with the CANFD bus, and uses an isolated drive module to drive the relay matrix. The test signal is read back with the CANFD bus in a signal sampling isolation manner and transmitted to the PC. The host computer implemented by the industrial computer uses LABVIEW to write the test software, which allows flexible test selection, convenient parameter changes, and step-by-step channel expansion according to resource requirements.

[0039] The working steps of the test system include:

[0040] (1) The host computer selects the simulated load / actual load operation mode and starts;

[0041] (2) The test system sends instructions to switch the test mode;

[0042] (3) The host computer sends a test command to the IPDU, and the IPDU enters the test service;

[0043] (4) The host computer sends the corresponding test item instructions to the IPDU and the test system;

[0044] (5) The test system executes the corresponding test circuit construction according to the item instructions;

[0045] (6) The current and voltage data collected and transmitted to the host computer corresponding to the internal self-detection of the IDU;

[0046] (7) The test system collects actual load current data and transmits it to the host computer.

[0047] The test system switches between simulated load and actual load modes including:

[0048] (1) Simulated load test: Use a resistance load equivalent to the rated load size, connect a relay as a switch to form a path loop, and diagnose the loop current and voltage values ​​within the IPDU. The test system samples the loop current synchronously, and two sets of data are uploaded to the system for waveform display. Here, one set of data is the IPDU internal diagnostic data, and the other set is the simulated load data collected by the test system.

[0049] (2) Actual load path test: Use the rated actual load, connect the relay as a switch to form a path loop, the IPDU internal diagnosis loop current and voltage value, the test system synchronously samples the loop current, and two sets of data are uploaded to the system waveform display. Here, one set of two sets of data is the IPDU internal diagnosis data, and the other set is the actual real load data collected by the test system.

[0050] (3) Actual load overcurrent test: Use a load that is more than twice the rated load to connect to the circuit, and connect the relay as a switch to form a circuit. The IDU internally diagnoses the circuit current and voltage values, and the test system synchronously samples the circuit current. Two sets of data are uploaded to the system for waveform display.

[0051] The diagnostic strategy and fault mode judgment of the test system for the intelligent power distribution box are shown in Table 1 below:

[0052]

[0053]

[0054] The test system's diagnostic strategy and fault mode judgment for the intelligent power distribution box are shown in Table 2 below:

[0055]

[0056]

[0057]

[0058] According to Table 1 and Table 2 above, in the test system diagnostic strategy and fault mode judgment of the intelligent distribution box, the fault modes tested include: open circuit, short circuit to ground, short circuit to power, overload, undervoltage, overvoltage, terminal overtemperature, hardware overtemperature, power-on abnormality, power-off abnormality, static current, etc. Specifically, for the BATT channel and DCDC channel, the diagnostic strategy is as follows:

[0059] 1. Open circuit mode

[0060] BATT channel: Open circuit diagnosis can be performed only in sleep mode.

[0061] DCDC channel: The status of the DCDC port is monitored by the smart distribution box MCU. If there is no voltage or current on the port, it is diagnosed as an open circuit.

[0062] 2. Short circuit to ground

[0063] BATT channel: The intelligent power distribution box MCU reads the diagnostic status pin of the output port high-side output intelligent MOS tube 2ED2410-EM to determine whether there is a short circuit.

[0064] DCDC channel: The intelligent distribution box MCU also reads the output port high-side output intelligent MOS tube 2ED2410-EM diagnostic status pin to make a judgment.

[0065] 3. Short circuit

[0066] BATT channel and DCDC channel: The power supply cannot diagnose electrical shorts.

[0067] 4. Overload

[0068] BATT channel and DCDC channel: During normal operation, if the following conditions are met, it is diagnosed as overload:

[0069] Preconditions: The power supply is normal, the port is open normally, there is no hardware overtemperature T0, and the port overload current does not exceed the hardware shutdown threshold.

[0070] Judgment conditions: the current increases during the process and i2t exceeds the threshold; the MCU monitors the hardware temperature rise.

[0071] Processing after the fault: If it enters the over-temperature protection state, the MCU tries to open it every 500 milliseconds.

[0072] 5. Undervoltage

[0073] BATT channel: In the working state, if the battery is in the charging state for a long time (the current direction is from IDU to BATT), it is considered that the battery voltage is abnormally low and cannot be charged and boosted; when the DCDC is not working, if the IDU detects that the BATT voltage is lower than 8V, it is considered that the battery is under-voltage.

[0074] DCDC channel: In the working state, the current is not allowed to flow from IDU to DCDC; if the DCDC voltage is lower than the battery voltage, or the system voltage drops below 8V, it is considered undervoltage.

[0075] 6. Overvoltage

[0076] BATT channel: no overvoltage involved.

[0077] DCDC channel: If the DCDC voltage is higher than 18.5V, it is overvoltage.

[0078] 7. Terminal over temperature

[0079] BATT channel and DCDC channel: monitor the OT terminal temperature through the MCU, send fault status, and wait for the host to decide whether to keep the output on or off.

[0080] 8. Hardware overheating

[0081] BATT channel and DCDC channel: When the channel current is normal, if the hardware temperature rises abnormally (hardware absolute temperature > 150°C; or relative temperature rise > 80°C), it is hardware overheating. Send a fault status and wait for the host to make a decision.

[0082] 9. Power-on abnormality

[0083] BATT channel: Can be diagnosed under certain conditions, such as DCDC voltage is above BATT and there is no charging current.

[0084] DCDC channel: If the DCDC port voltage is inconsistent with the IDU system voltage and there is no current in the channel, it is a power-on abnormality.

[0085] 10. Abnormal power off

[0086] BATT channel: It can be diagnosed under certain conditions, for example, after turning off the mosfet, there is still a large current to charge BAT1.

[0087] DCDC channel: If the DCDC port voltage is consistent with the IDU system voltage and the channel still has continuous current, it is a power-off abnormality.

[0088] 11. Quiescent current

[0089] BATT channel and DCDC channel: The power channel does not perform static current monitoring.

[0090] The power output circuit of the intelligent power distribution box of the test system of the embodiment of the present disclosure has two structural forms, one is the bypass output circuit of NMOS (MOS+BYPASS), and the other is the bypass output circuit of intelligent high-side MOS (HSD+BYPASS). The diagnostic strategy for circuit output 1 (MOS+BYPASS) and circuit output 2 (HSD+BYPASS) is as follows.

[0091] 1. Open circuit

[0092] Open circuit diagnosis is not performed on the normally powered load channel.

[0093] 2. Short circuit to ground

[0094] In normal operation, if the following conditions are met, a short circuit to ground is diagnosed:

[0095] Preconditions: The power supply is normal, the port is open normally, there is no hardware overtemperature T0, and the port short-circuit current exceeds the hardware shutdown threshold.

[0096] Judgment conditions: The overcurrent indication signal outputs a high level and the port output voltage is 0; there is no obvious temperature rise in the hardware during the process.

[0097] Processing after a fault: After detecting a short circuit, the MCU attempts to open once every 500 milliseconds.

[0098] 3. Short circuit

[0099] The normal current load channel does not perform short circuit diagnosis.

[0100] 4. Overload

[0101] During normal operation, an overload is diagnosed if the following conditions are met:

[0102] Preconditions: The power supply is normal, the port is open normally, there is no hardware overtemperature T0, and the port overload current does not exceed the hardware shutdown threshold.

[0103] Judgment conditions: the current increases during the process and i2t exceeds the threshold; the MCU monitors the temperature rise of the hardware.

[0104] Processing after a fault: If the overload protection state is entered, the MCU attempts to open it every 500 milliseconds.

[0105] 5. Undervoltage

[0106] Undervoltage diagnosis is generally not performed on the load channel, and diagnosis is performed by judging the system voltage.

[0107] 6. Overvoltage

[0108] The load channel generally does not undergo overvoltage diagnosis, but is diagnosed by judging the system voltage.

[0109] 7. Terminal over temperature

[0110] The connector does not perform terminal overtemperature diagnosis.

[0111] For OT terminals, the MCU monitors the temperature of the OT terminals, sends fault status, and waits for the host to make a decision.

[0112] 8. Hardware overheating

[0113] When the channel current is normal, if the hardware temperature rises abnormally (hardware absolute temperature > 150°C; or relative temperature rise > 80°C), it means the hardware is overheated. Send a fault status and wait for the host to make a decision.

[0114] 9. Power-on abnormality

[0115] It can be diagnosed under certain conditions.

[0116] 10. Abnormal power off

[0117] It can be diagnosed under certain conditions.

[0118] 11. Quiescent current

[0119] The normal power channel periodically detects the static current when in sleep mode. If it is detected that the current exceeds the threshold for three consecutive times, the network will be awakened to send a fault code to the bus. If no abnormality is detected, the network will not be awakened.

[0120] According to one or more embodiments, a test process of a hardware-in-the-loop test system for an intelligent power distribution box of an automobile includes the following different functional tests:

[0121] 1. Normal test, the specific steps include:

[0122] (1) Connect the wiring harness between the simulated load or real load and the test bench, and turn on the power of the load cabinet;

[0123] (2) Run the test program;

[0124] (3) Select the test port and test load in the test port load selection box;

[0125] (4) Click the "Parameter Setting" button to set the test parameters and save them;

[0126] (5) Click the "Start Test" button to start the test. The current and voltage values ​​during the test will be automatically plotted until the test is completed.

[0127] (6) During the test, the test bench will automatically determine the current and voltage values ​​during the test based on the set parameters.

[0128] 2. Undervoltage test, the specific steps include:

[0129] (1) Connect the wiring harness between the load and the test bench, and turn on the power of the load cabinet;

[0130] (2) Run the test program;

[0131] (3) Check the test port and simulated load in the test port load selection box;

[0132] (4) Check "Undervoltage test selection";

[0133] (5) Click the "Parameter Setting" button to set the test parameters and save them;

[0134] (6) Click the "Start Test" button to start the test. The current and voltage values ​​during the test will be automatically plotted. During the undervoltage test, the IDU will report an undervoltage fault sign.

[0135] (7) Click the voltage recovery button, and the DCDC voltage will automatically return to the rated voltage. At this time, the undervoltage fault sign disappears until the test is completed;

[0136] (8) During the test, the test bench will automatically determine the current and voltage values ​​during the test based on the set parameters.

[0137] 3. Overvoltage test, the specific test steps include:

[0138] (1) Connect the wiring harness between the load and the test bench, and turn on the power of the load cabinet;

[0139] (2) Run the test program;

[0140] (3) Check the test port and simulated load in the test port load selection box;

[0141] (4) Check "Overvoltage test selection";

[0142] (5) Click the "Parameter Setting" button to set the test parameters and save them;

[0143] (6) Click the "Start Test" button to start the test. The current and voltage values ​​during the test will be automatically plotted. During the overvoltage test, the IDU will report an overvoltage fault sign.

[0144] (7) Click the voltage recovery button, and the DCDC voltage will automatically return to the rated voltage. At this time, the overvoltage fault sign disappears until the test is completed;

[0145] (8) During the test, the test bench will automatically determine the current and voltage values ​​during the test based on the set parameters.

[0146] 4. Short circuit to GND test, the test steps include:

[0147] (1) Connect the wiring harness between the load and the test bench, and turn on the power of the load cabinet;

[0148] (2) Run the test program;

[0149] (3) Check the test port and actual load in the test port load selection box;

[0150] (4) At the actual load interface, short the port to GND;

[0151] (5) Click the "Parameter Setting" button to set the test parameters and save them;

[0152] (6) Click the "Start Test" button to start the test. The current and voltage values ​​during the test will be automatically plotted. During the short-circuit test, the IDU will report a short-circuit to ground fault sign. This fault will not disappear. You need to disconnect the port and short it to GND, and then power on the IDU again, and the short-circuit to ground fault will disappear;

[0153] (7) After a short circuit, the product port automatically stops outputting until the test is completed;

[0154] (8) During the test, the test bench will automatically determine the current and voltage values ​​during the test based on the set parameters.

[0155] 5. Short circuit to power test, the test steps include:

[0156] (1) Connect the wiring harness between the load and the test bench, and turn on the power of the load cabinet;

[0157] (2) Run the test program;

[0158] (3) Check the test port and actual load in the test port load selection box;

[0159] (4) At the actual load interface, short-circuit the port to the power supply;

[0160] (5) Click the "Parameter Setting" button to set the test parameters and save them;

[0161] (6) Click the "Start Test" button to start the test. The current and voltage values ​​during the test will be automatically plotted. After the port is turned off, it is still in a high level state, and the IDU will report a short circuit to power failure flag.

[0162] (7) During the test, the test bench will automatically determine the current and voltage values ​​during the test based on the set parameters.

[0163] 6. Overcurrent test, the test steps include:

[0164] (1) Connect the wiring harness between the load and the test bench, and turn on the power of the load cabinet;

[0165] (2) Run the test program;

[0166] (3) Check the test port and actual load in the test port load selection box;

[0167] (4) Connect 1.5 times the actual load to the actual load interface;

[0168] (5) Click the "Parameter Setting" button to set the test parameters and save them;

[0169] (6) Click the "Start Test" button to start the test. The current and voltage values ​​during the test will be automatically plotted. During the overcurrent test, after a certain period of overcurrent, the port will stop outputting, and the IDU will report an overcurrent fault sign. The fault will not disappear. The overcurrent fault will disappear only after the IDU is powered on again.

[0170] (7) After over-current protection, the product port automatically stops output until the test is completed;

[0171] (8) During the test, the test bench will automatically determine the current and voltage values ​​during the test based on the set parameters.

[0172] 7. Sleep current test, the test steps include:

[0173] (1) Connect the wiring harness between the load and the test bench, and turn on the power of the load cabinet;

[0174] (2) Run the test program;

[0175] (3) Check "Sleep current selection";

[0176] (4) Click the "Parameter Setting" button to set the test parameters and save them;

[0177] (5) Click the "Start Test" button to start the test, and the test bench will automatically perform the test until the test is completed;

[0178] (6) After the test is completed, the test bench automatically determines whether the sleep current value is qualified based on the set parameters.

[0179] According to one or more embodiments, a hardware-in-the-loop test system for an automotive intelligent power distribution box can provide a calibration function in the IPDU development process while testing. The system uses dual-channel CANFD to communicate with the load control and sampling modules in real time while driving and diagnosing the IDU, thereby obtaining the IPDU internal diagnostic waveform and the actual sampling waveform of the real load, and comparing and analyzing them to determine the IPDU internal sampling resistance error and the intelligent MOS diagnostic voltage V IS The error and chip sampling error are compensated and calibrated. This function is of great significance for the calibration of nonlinear control circuits. For example, in the calibration test of PWM fan overcurrent, the nonlinear calibration of data is very important.

[0180] In the process of compensation calibration of IPDU, the current value of the sampling resistor is first collected through the current sensor, and then amplified and analyzed. The PC in the test system receives the signal data through CAN FD and marks the signal data with the ID (identifier) ​​of the data message. The system determines the specific message to be parsed based on the received message ID. After parsing the data message, the system obtains the current detection value.

[0181] In summary, the beneficial effects of the present disclosure include:

[0182] 1. This system integrates the host computer, intelligent distribution box, load switch, simulated load and real load components into one, realizing the hardware-in-the-loop test of the automotive intelligent distribution box and improving the systematicness and integrity of the test.

[0183] 2. High-speed data communication through the CANFD bus ensures real-time transmission and synchronous collection of data during the test, improving the accuracy and reliability of the test.

[0184] 3. Taking into account different test requirements, the test mode and parameters can be flexibly selected as needed, while supporting multi-channel expansion to adapt to the testing of different types of intelligent distribution boxes.

[0185] 4. It provides the function of compensating and calibrating the internal sampling resistance error of the intelligent distribution box, the intelligent MOS diagnosis voltage VIS error and the chip sampling error, thus improving the accuracy of the test results.

[0186] 5. The system integrates multiple testing and calibration functions, reducing duplication of work in the R&D process and shortening the product R&D cycle.

[0187] These beneficial effects reflect the advantages of the present invention in terms of operational convenience, test results and economic benefits, which help to improve the performance and reliability of the smart distribution box, and also provide an effective solution for the research and development and testing of the smart distribution box.

[0188] It is worth noting that, although the foregoing content has described the spirit and principle of the invention with reference to several specific embodiments, it should be understood that the invention is not limited to the disclosed specific embodiments, and the division of various aspects does not mean that the features in these aspects cannot be combined, and such division is only for the convenience of expression. The invention is intended to cover various modifications and equivalent arrangements included in the spirit and scope of the appended claims.

Claims

1. A hardware-in-the-loop test system for an intelligent automobile distribution box, characterized in that: The system includes, A host computer is electrically connected to the port of the intelligent power distribution box via a PC bus, and performs data communication with the intelligent power distribution box via a CANFD bus; The intelligent distribution box is connected to the simulated load and the real load through a load switch; The host computer is electrically connected to the simulated load and the real load.

2. The test system according to claim 1, characterized in that: The test system includes 2 sets of power supply battery outputs.

3. The test system according to claim 1, characterized in that: The communication port CANFD1 of the intelligent power distribution box is connected to the vehicle condition mode communication port of the automobile central control unit CCU, and the communication port CANFD2 of the intelligent power distribution box is connected to the intelligent power distribution communication port of the automobile central control unit CCU.

4. The test system according to claim 1, characterized in that: The test system test steps include: The host computer starts after selecting the simulated load / actual load operation mode, and sends instructions to switch the test mode; The host computer sends a test command to IPDU, and IPDU enters the test service and executes the corresponding test circuit construction according to the entry command sent by the host computer; The current and voltage data collected by the IPDU's internal self-detection are transmitted to the host computer, and the host computer receives and collects the actual load current data.

5. The test system according to claim 4, characterized in that: The test system builds various fault mode circuits for the intelligent distribution box, uses a high-speed DO control module controlled by CANFD communication, outputs control signals from the relay matrix via the CANFD bus, and uses an isolation drive module to drive the relay matrix. The test signal is read back via the CANFD bus in a signal sampling isolation manner and transmitted to the host computer.

6. The test system according to claim 5, characterized in that: The test system switches test modes for simulated load and actual load including: (1) Simulated load test: Use a resistance load equivalent to the rated load to form a path loop through the switch. The IPDU internally diagnoses the loop current and voltage value, and the test system synchronously samples the loop current. (2) Actual load path test: Use the rated actual load to form a path loop through the switch. The IPDU internally diagnoses the loop current and voltage value, and the test system synchronously samples the loop current. (3) Actual load overcurrent test: Use a load that is twice the rated load or more to connect to the loop, form a path through the switch, diagnose the loop current and voltage values ​​inside the IDU, and the test system samples the loop current simultaneously.

7. The test system according to claim 6, characterized in that: The failure modes tested by the test system include: open circuit, short circuit to ground, short circuit to power, overload, undervoltage, overvoltage, terminal overtemperature, hardware overtemperature, power-on abnormality, power-off abnormality, and static current.

8. The test system according to claim 6, characterized in that: The test system compares and analyzes the internal diagnostic data of IPDU and the actual sampling data waveform of the real load, and the internal sampling resistance error of IPDU and the intelligent MOS diagnostic voltage V IS The error and chip sampling error are compensated and calibrated.

9. The test system according to claim 1, characterized in that: The host computer is loaded with an operation load simulation model of the intelligent power distribution box, and tests the behavior of the intelligent power distribution box under different operating conditions by simulating various sensor signals, actuator responses and communication bus signals.

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