Photovoltaic module testing and sorting mechanism

Abstract

The invention provides a photovoltaic module testing and sorting mechanism, and relates to the technical field of testing and sorting machines, the photovoltaic module testing and sorting mechanism comprises a mounting rack, the top surface of the mounting rack is provided with a conveying channel, a testing plate is mounted in the conveying channel, and two size measuring structures which are symmetrically arranged about the testing plate are mounted in the conveying channel. According to the photovoltaic module testing and sorting mechanism, through the arrangement of the mounting frame, the testing plate, the size measuring structures, the first motion amount measurer and the circulating pushing structure, when a solar silicon wafer reaches the distance between the two size measuring structures, the size of the solar silicon wafer is measured through physical displacement generated by measuring rings in the size measuring structures; therefore, the width and the thickness of the solar silicon wafer are measured, the deformation condition of the solar silicon wafer is judged, faults of optical image detection equipment are reduced, and the device can be matched with the optical image detection equipment for mutual verification and use, so that the testing and sorting effects are better; and the accuracy of testing and sorting the periphery curl of the solar silicon wafer is ensured.

Description

Technical Field

[0001] The invention relates to the technical field of testing and sorting machines, and in particular to a photovoltaic module testing and sorting mechanism. Background Art

[0002] A photovoltaic module is a device that converts solar energy into electrical energy. It is mostly used in situations where solar power is used for power generation, such as solar power plants, solar street lights, etc. A photovoltaic module includes a solar cell assembly, glass packaging, a bracket, connecting wires and connectors.

[0003] Solar cell module: It is the core component of photovoltaic module and the key element that converts sunlight into electrical energy. Solar cell module is usually assembled from multiple solar silicon wafers. Solar silicon wafers need to go through a series of tests and screening to ensure their quality and performance. Common testing and screening methods include the following aspects: 1. Appearance inspection: Visually inspect the appearance of solar silicon wafers to check for surface defects such as cracks, scratches, bubbles, etc. to ensure that the surface of solar silicon wafers is flat and complete; 2. Photoelectric performance test: Use photoelectric performance testing equipment, such as photoelectric conversion efficiency tester, photovoltaic cell tester, etc. to test the performance parameters such as photoelectric conversion efficiency, open circuit voltage, short circuit current of solar silicon wafers to evaluate their power generation performance; 3. Dimensional accuracy test: By measuring the size, thickness accuracy and other parameters of solar silicon wafers, ensure that the silicon wafers meet the specified dimensional requirements to ensure that they can be correctly assembled into solar cells; 4. Insulation resistance test: Test the insulation performance of solar silicon wafers to ensure that the silicon wafers can be used safely and reliably during operation; 5. Curvature test: Test the curvature of solar silicon wafers to ensure that the silicon wafers will not be excessively bent during installation and use, resulting in damage or performance degradation.

[0004] Solar silicon wafers may be deformed in many ways during the production process, the most common of which is edge curling. During inspection and sorting, the surface morphology and deformation of solar silicon wafers are usually observed through optical imaging instruments such as two-dimensional scanning electron microscopes and white light interferometers. However, the above-mentioned inspection equipment may cause equipment accuracy and stability (inaccurate focusing, equipment vibration, light changes) after long-term use or environmental influences, and may also fail, affecting the inspection results and the results of the inspection of solar silicon wafer deformation. Summary of the invention

[0005] Based on the technical problems existing in the background technology, the present invention proposes a photovoltaic module testing and sorting mechanism.

[0006] A photovoltaic module testing and sorting mechanism proposed in the present invention comprises a mounting frame, a conveying channel is provided on the top surface of the mounting frame, a test board is installed in the conveying channel, and two dimension measuring structures symmetrically arranged with respect to the test board are installed in the conveying channel; The dimension measurement structure includes a vertical rod arranged vertically, two of the vertical rods are respectively located on both sides of the test plate, a plurality of measuring rings are mounted on the vertical rod, and the plurality of measuring rings are arranged in sequence from top to bottom, and the measuring rings can move laterally on the vertical rod. When the solar silicon wafer slides on the test plate, both sides of the solar silicon wafer can push the measuring ring to move laterally on the vertical rod, and a No. 1 motion quantity measuring device capable of measuring the lateral motion of the measuring ring on the vertical rod is installed on the vertical rod; A circulating pushing structure is installed on the mounting frame, and the circulating pushing structure is used to push the solar silicon wafer on the test board to pass through the gap between the two size measuring structures.

[0007] Preferably, the dimension measurement structure further comprises a side frame, a lifting block, a distance measuring sensor and a No. 1 reset spring; the side frame is fixedly mounted on the side of the conveying channel, a mounting notch is provided on the side of the side frame close to the test plate, the vertical rod is vertically mounted in the mounting notch, and the lowest measuring ring of the vertical rod abuts against the bottom inner wall of the mounting notch; The lifting block is slidably mounted on the vertical rod, the motion quantity measuring device No. 1 is installed on the lifting block, the measuring ring is installed on the motion quantity measuring device No. 1, the distance measuring sensor is installed on the top inner wall of the mounting notch, and a top plate is fixedly mounted on the top surface of the uppermost measuring ring of the same vertical rod, the output shaft end of the distance measuring sensor is fixedly connected with a top plate slidably mounted on the vertical rod, the top plate abuts against the top surface of the uppermost measuring ring of the vertical rod, the No. 1 reset spring is mounted on the output shaft of the distance measuring sensor, and the two ends of the No. 1 reset spring abut against the top plate and the top inner wall of the mounting notch respectively.

[0008] Preferably, the outer circumference of the measuring ring is rotatably sleeved with an anti-snapping ring, and the thickness of the anti-snapping ring is the same as that of the measuring ring.

[0009] Preferably, the No. 1 motion quantity measuring device includes a resistor tube, a conductive rod and a No. 2 reset spring. The outer periphery of the lifting block is provided with a mounting hole, the resistor tube is fixedly installed in the mounting hole, the end of the conductive rod is provided with a motion hole that slidably cooperates with the large end of the resistor tube, the large end of the conductive rod is slidably installed in the motion hole of the resistor tube, the No. 2 reset spring is sleeved on the resistor tube, and the two ends of the No. 2 reset spring respectively abut against the outer periphery of the lifting block and the inner wall of the measuring ring.

[0010] Preferably, the sliding direction of the conductive rod in the movement hole on the resistor cylinder is horizontal.

[0011] Preferably, the circulating pushing structure includes a linear slide rail, a vertical push plate rod and a lifting assembly; a conveying movement groove is opened on the bottom inner wall of the conveying channel, the linear slide rail is fixedly installed in the conveying movement groove, the vertical push plate rod slides through the slider on the linear slide rail, and the vertical push plate rod is arranged vertically, and the lifting assembly is used to drive the vertical push plate rod to rise and fall on the slider of the linear slide rail.

[0012] Preferably, the lifting assembly includes an annular slide rail; the bottom end of the vertical push plate rod is rotatably mounted on a slider of the annular slide rail.

[0013] Preferably, it also includes a No. 1 conveyor belt, a No. 2 conveyor belt and a sorting structure; the No. 1 conveyor belt and the No. 2 conveyor belt are respectively located at the two ends of the test board, the No. 1 conveyor belt is located at the upstream position of the test board, and the No. 2 conveyor belt is located at the downstream position of the test board, and the sorting structure can transport the solar silicon wafers on the No. 2 conveyor belt.

[0014] Preferably, the sorting structure includes a mobile frame, an electric push rod and a U-shaped frame; the mobile frame is located below the downstream of the No. 2 conveyor belt, the electric push rod is slidably installed on the mobile frame, and the U-shaped frame is fixedly installed on the output shaft of the electric push rod, and the bending sections on both sides of the U-shaped frame are respectively located on both sides of the No. 2 conveyor belt.

[0015] Preferably, a bellows is connected to the top plate, and the top end of the bellows is fixedly connected to the top inner wall of the installation notch.

[0016] A photovoltaic module testing and sorting mechanism proposed by the present invention has the following beneficial effects: through the arranged mounting frame, testing plate, dimension measuring structure, No. 1 motion quantity measuring device and circulating pushing structure, when the solar silicon wafer reaches the spacing between the two dimension measuring structures, the physical displacement generated by the measuring ring in the dimension measuring structure is used to measure the width and thickness of the solar silicon wafer, thereby judging the deformation of the solar silicon wafer, reducing the failure of the optical image detection equipment, and can also be used together with the optical image detection equipment for mutual verification, so that the testing and sorting effect is better, and the accuracy of the curling test and sorting of the solar silicon wafer is ensured. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a schematic diagram of the overall structure of a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0018] Figure 2 This is a front view of a mounting frame in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0019] Figure 3This is a side sectional view of a No. 1 motion quantity measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0020] Figure 4 This is a top view of a sectional view of a No. 1 motion quantity measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0021] Figure 5 This is a schematic diagram of the positions of the measuring ring and the solar silicon wafer when the No. 1 motion quantity measuring device in the photovoltaic module testing and sorting mechanism proposed by the present invention contacts the normal solar silicon wafer.

[0022] Figure 6 This is a schematic diagram of the positions of a measuring ring and a solar silicon wafer when a No. 1 motion quantity measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention contacts a solar silicon wafer with a partially curled edge.

[0023] Figure 7 This is a schematic diagram of the positions of a measuring ring and a solar silicon wafer when a No. 1 motion quantity measuring device in a photovoltaic module testing and sorting mechanism proposed by the present invention contacts a warped solar silicon wafer.

[0024] Figure 8 This is a three-dimensional cross-sectional view of a circulating pushing structure on a mounting frame in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0025] Fig. 9 This is a schematic structural diagram of a vertical rod in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0026] Fig.10 A schematic diagram of the position between the conductive rods and the solar silicon wafers before testing in a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0027] Fig.11 This is a side sectional view of a motion quantity measuring device No. 1 in Embodiment 2 of a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0028] Fig.12 This is a top view of a sectional view of a motion quantity measuring device No. 1 in Embodiment 2 of a photovoltaic module testing and sorting mechanism proposed by the present invention.

[0029] In the figure: 1. mounting frame; 2. test plate; 3. measuring instrument; 4. vertical rod; 5. measuring ring; 6. side frame; 7. lifting block; 8. distance sensor; 9. No. 1 reset spring; 10. bellows; 11. top plate; 12. anti-snapping ring; 13. resistor tube; 14. conductive rod; 15. No. 2 reset spring; 16. linear slide rail; 17. vertical push plate rod; 18. circular slide rail; 19. No. 1 conveyor belt; 20. No. 2 conveyor belt; 21. moving frame; 22. electric push rod; 23. U-shaped frame; 24. rotating rod; 25. No. 3 reset spring. DETAILED DESCRIPTION Example

[0030] Reference Figure 1-Figure 10 The present invention proposes a photovoltaic module testing and sorting mechanism, comprising a mounting frame 1, a No. 1 conveyor belt 19, a No. 2 conveyor belt 20 and a sorting structure; the No. 1 conveyor belt 19 and the No. 2 conveyor belt 20 are respectively located at the two ends of the test board 2, the No. 1 conveyor belt 19 is located at the upstream position of the test board 2, and the No. 2 conveyor belt 20 is located at the downstream position of the test board 2, and the sorting structure can transport the solar silicon wafer on the No. 2 conveyor belt 20 down, and a conveying channel is opened on the top surface of the mounting frame 1, and a test board 2 is installed in the conveying channel. A measuring instrument 3 is installed on the mounting frame 1, and the measuring instrument 3 includes a camera, a two-dimensional scanning electron microscope, a white light interferometer and other optical imaging instruments. The measuring instrument 3 is located above the test board 2, and two size measuring structures symmetrically arranged about the test board 2 are installed in the conveying channel. It should be noted that the width of the solar silicon wafer is greater than that of the No. 1 conveyor belt 19, the No. 2 conveyor belt 20 and the measuring instrument. The width of the test plate 2; the size measuring structure includes a vertical rod 4 arranged vertically, and the two vertical rods 4 are respectively located on both sides of the test plate 2. A plurality of measuring rings 5 ​​are mounted on the vertical rod 4, and the plurality of measuring rings 5 ​​are arranged in sequence from top to bottom. The measuring rings 5 ​​can move laterally on the vertical rod 4. When the solar silicon wafer slides on the test plate 2, both sides of the solar silicon wafer can push the measuring ring 5 to move laterally on the vertical rod 4. A motion measuring device capable of measuring the lateral movement of the measuring ring 5 on the vertical rod 4 is installed on the vertical rod 4. A circulating pushing structure is installed on the mounting frame 1. The circulating pushing structure is used to push the solar silicon wafer on the test plate 2 through the gap between the two size measuring structures. In a normal state, the axes of the plurality of measuring rings 5 ​​on the same vertical rod 4 are in an overlapping state, and the distance between the two vertical rods 4 is fixed and greater than the width of the solar silicon wafer. Assuming that Figure 5As shown in, when a normal solar silicon wafer reaches the position of the two size measuring structures, the two sides of the solar silicon wafer respectively push the two measuring rings 5 ​​on the two size measuring structures to move (the movement directions of the measuring rings 5 ​​on the two size measuring structures move away from each other, and in the embodiment, only the movement state of the rings 5 ​​on one side is measured). The thickness of the solar silicon wafer is the same as the thickness of the two measuring rings 5. In actual use, the solar silicon wafer is placed on the No. 1 conveyor belt 19, and the No. 1 conveyor belt 19 conveys the solar silicon wafer to the test board 2. The circular pushing structure pushes the solar silicon wafer on the test board 2 to slide along the top surface of the test board 2. When both sides of the solar silicon wafer abut against the measuring ring 5, the measuring ring 5 can be pushed to move. The spacing between the measuring rings 5 ​​abutting against the two sides of the solar silicon wafer is the actual width of the solar silicon wafer. As the solar silicon wafer moves, the change in the movement of the measuring ring 5 is measured, and the change in the spacing between the measuring rings 5 ​​on both sides can be calculated. The change in the width of the solar silicon wafer can be judged based on the test data, because the solar silicon wafer is usually rectangular and the spacing is consistent everywhere. When the width of the solar silicon wafer changes, it may be due to deformation. In addition, the thickness of the solar silicon wafer can also be tested, for example, Figure 5 The normal thickness of the solar silicon wafer is the thickness of the two measuring rings 5. The thickness of the measuring ring 5 can be designed according to the actual situation. When the corners of the solar silicon wafer are curled, Figure 7 As shown in , the edge of the solar silicon wafer pushes the three measuring rings 5 ​​to move, and the thickness of the two measuring rings 5 ​​is the same as the thickness of the solar silicon wafer. In this way, it can be judged whether the corners of the solar silicon wafer are curled or warped. At the same time, when the corners of the solar silicon wafer are curled or warped, the width of the solar silicon wafer will change. The deformation of the solar silicon wafer can be accurately tested, and the test values ​​are recorded to reduce the inaccurate test results due to failure of the measuring instrument 3 or other external factors. The data is then compared with the situation measured by the measuring instrument 3 to make the test results more accurate. After the solar silicon wafer is tested, it is pushed to the No. 2 conveyor belt 20, and the No. 2 conveyor belt 20 conveys the qualified solar silicon wafer after the test to the next process, and the other two sides of the solar silicon wafer are measured and processed. The unqualified solar silicon wafer is transported from the No. 2 conveyor belt 20 by the sorting structure to facilitate the sorting of the unqualified solar silicon wafer.

[0031] At the same time, a pressure sensor is also installed on the test board 2. When the solar silicon wafer curls up on all sides, the two sides of the solar silicon wafer press against the measuring ring 5, which will cause the pressure of the solar silicon wafer on the test board 2 to change. Based on the pressure change of the solar silicon wafer on the test board 2 and the movement change of the measuring ring 5, the deformation of the solar silicon wafer can be judged.

[0032] like Figure 1 , Figure 2 and Figure 3 As shown, the size measurement structure also includes a side frame 6, a lifting block 7, a distance sensor 8 and a No. 1 reset spring 9; the distance sensor 8 is a submicron contact displacement sensor, the side frame 6 is fixedly installed on the side of the conveying channel, the side frame 6 is arranged vertically, but the side inner wall of the side frame 6 and the conveying channel is arranged obliquely, and a mounting notch is opened on the side of the side frame 6 close to the test plate 2, the vertical rod 4 is vertically installed in the mounting notch, and the lowermost measuring ring 5 of the vertical rod 4 is against the bottom inner wall of the mounting notch; the lifting block 7 is slidably sleeved on the vertical rod 4, and the No. 1 motion quantity measuring device is installed on the lifting block 7, the thickness of the lifting block 7 is the same as the thickness of the measuring ring 5, and under the action of the No. 1 reset spring 9 and gravity, multiple lifting blocks 7 are stacked together from top to bottom in sequence, and the lifting blocks 7 are vertically When the rod 4 is lifted or lowered, the measuring ring 5, the lifting block 7 and the No. 1 motion measuring device are regarded as a whole and lifted or lowered synchronously. The measuring ring 5 is installed on the No. 1 motion measuring device, and the distance sensor 8 is installed on the top inner wall of the installation gap. The top surface of the measuring ring 5 at the top of the same vertical rod 4 is fixedly installed with a top plate 11. The end of the output shaft of the distance sensor 8 is fixedly connected with the top plate 11 slidably mounted on the vertical rod 4. The top plate 11 abuts against the top surface of the measuring ring 5 at the top of the vertical rod 4. The No. 1 reset spring 9 is sleeved on the output shaft of the distance sensor 8, and the two ends of the No. 1 reset spring 9 abut against the top plate 11 and the top inner wall of the installation gap respectively. Assuming that the thickness of the solar silicon wafer is the same as the thickness of the two measuring rings 5, three situations will be encountered during the actual test process, and the specific situations are as follows: Case 1: The solar wafer is normal and has no deformation. In this case, the positional relationship between the solar wafer and the measuring ring 5 is always the same. Figure 5 As shown in; Case 2: The edge of the solar wafer is partially deformed, while the four corners are in normal position. When the two corners of the solar wafer are against the measuring ring 5 and push the measuring ring 5 to move, the position relationship between the solar wafer and the measuring ring 5 is as follows: Figure 5 As shown in FIG. 1 , when the deformed position of the solar silicon wafer contacts the measuring ring 5, the following will occur: Figure 6 In the position state shown in , the local edge of the solar silicon wafer is curled. Usually, the edge of the curled position and the normal position is an inclined surface or bevel. The inclined surface or bevel will gradually lift the upper measuring ring 5, so that the upper measuring ring 5 will be displaced when it is lifted. The distance measuring sensor 8 measures the upward movement displacement of the measuring ring 5, thereby judging the degree of curling of the edge of the solar silicon wafer; Case 3: If Figure 7As shown in , when the solar silicon wafer is warped, the corner of the solar silicon wafer will push more than two measuring rings 5 ​​to move. At this time, the situation and degree of the warping of the solar silicon wafer are judged according to the number of measuring rings 5 ​​that generate motion.

[0033] like Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 , Figure 6 and Figure 7 As shown in the figure, the outer peripheral rotating sleeve of the measuring ring 5 is provided with an anti-clamping ring 12, and the thickness of the anti-clamping ring 12 is the same as the thickness of the measuring ring 5. The rotation between the anti-clamping ring 12 and the measuring ring 5 replaces the sliding friction between the measuring ring 5 and the solar silicon wafer, reducing damage to the edge of the solar silicon wafer.

[0034] like Figure 4 and Fig. 9 As shown in , the No. 1 motion quantity measuring device includes a resistor tube 13, a conductive rod 14 and a No. 2 reset spring 15. The conductive rod 14 includes a thin rod and a large head end. A mounting hole is provided on the outer periphery of the lifting block 7. The resistor tube 13 is fixedly installed in the mounting hole. A motion hole that is slidably matched with the large head end of the resistor tube 13 is provided at the end of the conductive rod 14. The large head end of the conductive rod 14 is slidably installed in the motion hole of the resistor tube 13. The No. 2 reset spring 15 is sleeved on the resistor tube 13, and the two ends of the No. 2 reset spring 15 are respectively against the outer periphery of the lifting block 7 and the inner wall of the measuring ring 5, as shown in FIG. Figure 4 As shown in FIG. 1 , when the solar silicon wafer abuts against the outer periphery of the anti-clamp ring 12, since the lifting block 7 cannot rotate on the vertical rod 4, the edge of the solar silicon wafer pushes the anti-clamp ring 12 and the measuring ring 5 to move synchronously. Figure 4 When the anti-clamp ring 12 and the measuring ring 5 are pushed to move, the large end of the conductive rod 14 will be pushed to slide in the resistor tube 13, so that the energized length in the resistor tube 13 becomes shorter, thereby changing the resistance. According to the change in resistance, the displacement of the anti-clamp ring 12 and the measuring ring 5 is calculated, such as Figure 7 As shown in the figure, two vertical conductive rails are connected to the side of the vertical rod 4, which are powered by the circuit between the conductive rails and the resistor tube 13 and the conductive rod 14, while ensuring that there is no power outage between the resistor tube 13 and the conductive rod 14 when the lifting block 7 is lifted or lowered; the sliding direction of the conductive rod 14 in the moving hole on the resistor tube 13 is horizontal, which facilitates the sliding movement of the conductive rod 14.

[0035] In actual situations, Fig.10 As shown in the figure, the conductive rod 14 is not arranged perpendicular to the inner wall of the side of the conveying channel, and the conductive rod 14 and the side of the solar silicon wafer are arranged at an angle. When the solar silicon wafer abuts against the outer periphery of the anti-clamping ring 12, it is convenient for the conductive rod 14 to telescopically slide in the resistor tube 13.

[0036] like Figure 8 As shown in the figure, the circulating pushing structure includes a linear slide rail 16, a vertical push plate rod 17 and a lifting assembly, and the lifting assembly includes an annular slide rail 18; a conveying motion groove is opened on the bottom inner wall of the conveying channel, the linear slide rail 16 is fixedly installed in the conveying motion groove, the vertical push plate rod 17 slides through the slider on the linear slide rail 16, and the vertical push plate rod 17 is arranged vertically, and the lifting assembly is used to drive the vertical push plate rod 17 to rise and fall on the slider of the linear slide rail 16, and the bottom end of the vertical push plate rod 17 is rotatably installed on the slider of the annular slide rail 18, and the annular slide rail 18 and the linear slide 16 work simultaneously. When pushing the solar silicon wafer, the slider on the annular slide 18 is located at the upper section of the annular slide 18. When driving the vertical push plate rod 17 to reset, the slider on the annular slide 18 is located at the lower section of the annular slide 18, thereby ensuring that when the vertical push plate rod 17 pushes the solar silicon wafer, the top end of the vertical push plate rod 17 exceeds the top surface of the test plate 2. When driving the vertical push plate rod 17 to reset, it is necessary to ensure that the top end of the vertical push plate rod 17 is lower than the top surface of the test plate 2 and will not contact the solar silicon wafer during the reset process.

[0037] like Figure 1 As shown in the figure, the sorting structure includes a moving frame 21, an electric push rod 22 and a U-shaped frame 23; the moving frame 21 is located below the downstream of the No. 2 conveyor belt 20, the electric push rod 22 is slidably installed on the moving frame 21, and the U-shaped frame 23 is fixedly installed on the output shaft of the electric push rod 22, and the bending sections on both sides of the U-shaped frame 23 are respectively located on both sides of the No. 2 conveyor belt 20. When the solar silicon wafers are tested to be unsuitable, the solar silicon wafers are conveyed to the end on the No. 2 conveyor belt 20, and the electric push rod 22 drives the U-shaped frame 23 to rise, and the U-shaped frame 23 lifts the unqualified solar silicon wafers on the No. 2 conveyor belt 20, and then the moving frame 21 drives the electric push rod 22, the U-shaped frame 23 and the unqualified solar silicon wafers to move sideways, and sorts the unqualified solar silicon wafers down, waiting for subsequent work.

[0038] like Figure 1 , Figure 2 and Figure 3 As shown in , a bellows 10 is connected to the top plate 11, and the top of the bellows 10 is fixedly connected to the top inner wall of the installation notch. The bellows 10 can be retracted to protect the internal distance sensor 8, No. 1 reset spring 9 and conveying conductive rail. Example

[0039] like Fig.11 and Fig.12As shown in , the difference between this embodiment and embodiment 1 is that the structure of the motion quantity measuring device No. 1 is different. The motion quantity measuring device No. 1 includes a rotating rod 24 and a No. 3 reset spring 25. The inner wall of the measuring ring 5 is provided with a rotating telescopic hole that slides with the end of the rotating rod 24. The No. 3 reset spring 25 is located in the rotating telescopic hole, and the No. 3 reset spring 25 can drive the rotating rod 24 to retract into the rotating telescopic hole. It should be noted that in this embodiment, the measuring ring 5 is rotatably installed on the outer periphery of the lifting block 7, and the axis of the measuring ring 5 and the lifting block 7 do not coincide. The rotating rod 24 is a hard rod. When the solar silicon wafer abuts against the outer periphery of the anti-clamp ring 12, it will push the anti-clamp ring 12 and the measuring ring 5 to rotate around the lifting block 7. When the measuring ring 5 rotates, it drives the rotating rod 24 to rotate together. By detecting the change in the rotation angle of the rotating rod 24, the distance between the contact position between the outer periphery of the anti-clamping ring 12 and the side edge of the solar silicon wafer and the vertical rod 4 changes, thereby calculating the width change of the solar silicon wafer. The rotation angle of the rotating rod 24 is measured by a laser goniometer or an electronic angle sensor. When the solar silicon wafer passes over the anti-clamping ring 12, the rotating rod 24 is retracted into the rotating telescopic hole under the rebound action of the No. 3 reset spring 25, until the rotating rod 24 can no longer retract into the rotating telescopic hole, that is, the distance between the opening position of the rotating telescopic hole of the inner wall of the measuring ring 5 and the rotating connection between the rotating rod 24 and the lifting block 7 is the smallest, that is, Fig.12 When the rotating rod 24 is in the middle position state, the resetting of the rotating rod 24 is completed; the rotation of the rotating rod 24 is smoother than the extension and contraction of the conductive rod 14 in the resistor tube 13, reducing the occurrence of jams.

[0040] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A photovoltaic module testing and sorting mechanism, characterized in that: It comprises a mounting frame (1), the top surface of the mounting frame (1) is provided with a conveying channel, a test board (2) is installed in the conveying channel, and two dimension measuring structures arranged symmetrically with respect to the test board (2) are installed in the conveying channel; The dimension measurement structure comprises a vertical rod (4) arranged vertically, two of the vertical rods (4) being respectively located on both sides of the test plate (2), a plurality of measuring rings (5) being sleeved on the vertical rod (4), the plurality of measuring rings (5) being arranged in sequence from top to bottom and stacked one on the other, the measuring rings (5) being capable of moving laterally on the vertical rod (4), when the solar silicon wafer slides on the test plate (2), both sides of the solar silicon wafer can push the measuring rings (5) to move laterally on the vertical rod (4), and a No. 1 motion quantity measuring device capable of measuring the amount of lateral motion of the measuring rings (5) on the vertical rod (4) is installed on the vertical rod (4); A circulating pushing structure is installed on the mounting frame (1), and the circulating pushing structure is used to push the solar silicon wafer on the test plate (2) to pass through the gap between the two size measurement structures.

2. A photovoltaic module testing and sorting mechanism according to claim 1, characterized in that: The dimension measurement structure further comprises a side frame (6), a lifting block (7), a distance sensor (8) and a No. 1 return spring (9); the side frame (6) is fixedly mounted on the side of the conveying channel, a mounting notch is provided on a side of the side frame (6) close to the test plate (2), the vertical rod (4) is vertically mounted in the mounting notch, and the lowest measuring ring (5) of the vertical rod (4) abuts against the bottom inner wall of the mounting notch; The lifting block (7) is slidably mounted on the vertical rod (4), the first motion quantity measuring device is mounted on the lifting block (7), the measuring ring (5) is mounted on the first motion quantity measuring device, the distance sensor (8) is mounted on the top inner wall of the mounting notch, a top plate (11) is fixedly mounted on the top surface of the measuring ring (5) at the top of the same vertical rod (4), the output shaft end of the distance sensor (8) is fixedly connected to the top plate (11) slidably mounted on the vertical rod (4), the top plate (11) abuts against the top surface of the measuring ring (5) at the top of the vertical rod (4), the first return spring (9) is mounted on the output shaft of the distance sensor (8), and the two ends of the first return spring (9) abut against the top plate (11) and the top inner wall of the mounting notch respectively.

3. A photovoltaic module testing and sorting mechanism according to claim 2, characterized in that: An anti-snapping ring (12) is rotatably sleeved on the outer circumference of the measuring ring (5), and the thickness of the anti-snapping ring (12) is the same as that of the measuring ring (5).

4. A photovoltaic module testing and sorting mechanism according to claim 1, characterized in that: The first movement quantity measuring device comprises a resistor tube (13), a conductive rod (14) and a second reset spring (15); a mounting hole is provided on the outer periphery of the lifting block (7); the resistor tube (13) is fixedly installed in the mounting hole; a movement hole is provided at the end of the conductive rod (14) for slidingly cooperating with the large end of the resistor tube (13); the large end of the conductive rod (14) is slidably installed in the movement hole of the resistor tube (13); the second reset spring (15) is sleeved on the resistor tube (13), and the two ends of the second reset spring (15) respectively abut against the outer periphery of the lifting block (7) and the inner wall of the measuring ring (5).

5. A photovoltaic module testing and sorting mechanism according to claim 4, characterized in that: The sliding direction of the conductive rod (14) in the movement hole on the resistor cylinder (13) is a horizontal direction.

6. A photovoltaic module testing and sorting mechanism according to claim 4, characterized in that: The circulating pushing structure comprises a linear slide rail (16), a vertical push plate rod (17) and a lifting assembly; a conveying movement groove is opened on the bottom inner wall of the conveying channel, the linear slide rail (16) is fixedly installed in the conveying movement groove, the vertical push plate rod (17) slides through the slider on the linear slide rail (16), and the vertical push plate rod (17) is arranged vertically, and the lifting assembly is used to drive the vertical push plate rod (17) to rise and fall on the slider of the linear slide rail (16).

7. A photovoltaic module testing and sorting mechanism according to claim 6, characterized in that: The lifting assembly comprises an annular slide rail (18); the bottom end of the vertical push plate rod (17) is rotatably mounted on a slider of the annular slide rail (18).

8. A photovoltaic module testing and sorting mechanism according to claim 1, characterized in that: It also includes a No. 1 conveyor belt (19), a No. 2 conveyor belt (20) and a sorting structure; the No. 1 conveyor belt (19) and the No. 2 conveyor belt (20) are respectively located at two ends of the test board (2), the No. 1 conveyor belt (19) is located at an upstream position of the test board (2), and the No. 2 conveyor belt (20) is located at a downstream position of the test board (2), and the sorting structure can transport the solar silicon wafers on the No. 2 conveyor belt (20).

9. A photovoltaic module testing and sorting mechanism according to claim 8, characterized in that: The sorting structure comprises a moving frame (21), an electric push rod (22) and a U-shaped frame (23); the moving frame (21) is located below the downstream of the No. 2 conveyor belt (20), the electric push rod (22) is slidably mounted on the moving frame (21), the U-shaped frame (23) is fixedly mounted on the output shaft of the electric push rod (22), and the bending sections on both sides of the U-shaped frame (23) are respectively located on both sides of the No. 2 conveyor belt (20).

10. A photovoltaic module testing and sorting mechanism according to claim 1, characterized in that: The top plate (11) is connected to a bellows (10), and the top end of the bellows (10) is fixedly connected to the top inner wall of the installation notch.

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