Time-triggered Ethernet switching component testing device and method

Abstract

The invention belongs to the technical field of time-triggered Ethernet switching, particularly relates to a time-triggered Ethernet switching component testing device and method, and aims to solve the problems that in the prior art, the communication behavior of a TTE end system cannot be simulated, and whether the circuit state in testing equipment is normal or not cannot be rapidly judged. The system comprises a test PC (Personal Computer), test equipment and DUT (Device Under Test), the test PC is connected to a management network port of the test equipment through a network cable; the test equipment simulates a plurality of end system nodes to access the DUT; ports deployed by the DUT comprise a network port, a management port, a monitoring port and an I / O port. Based on a common Ethernet tester and an Ethernet test protocol standard, a traditional end node board card test TTE switch is changed, a complex private network does not need to be constructed, only a test vector needs to be changed, product testing can be rapidly completed, logic iteration efficiency is effectively improved, meanwhile, bandwidth is improved, and cost and space are reduced to a great extent.

Description

Technical Field

[0001] The invention belongs to the technical field of time-triggered Ethernet switching, and in particular relates to a time-triggered Ethernet switching component testing device and method. Background Art

[0002] TTE (Time-Triggered Ethernet) is a customized system network that is compatible with the transmission characteristics of time and space compared to the event-triggered standard Ethernet. The planning and scheduling of the TTE switching network is the core. The traffic is reasonably planned on the basis of distributed time synchronization so that TT, RC, and BE traffic are transmitted as required. At present, there are no mature TTE switching component testing products in China, and the technical indicator parameter schemes of TTE switching are strictly confidential abroad. In order to simulate the communication behavior of the TTE switching component, this application draws on the standard Ethernet protocol, Ethernet testing, and circuit design of the switching component to construct a time-triggered Ethernet switching component testing device and method. Summary of the invention

[0003] In order to solve the above-mentioned problems in the prior art, that is, to solve the problem that the prior art cannot simulate the communication behavior of the TTE end system and cannot quickly determine whether the circuit state in the test equipment is normal, the first aspect of the present invention proposes a time-triggered Ethernet switch component test device, which includes: a test PC, a test device, and a device under test DUT;

[0004] The test PC is connected to the management network port of the test device through a network cable; the test PC is used to generate a TTE network configuration and a TTE switching test vector, and send the TTE network configuration and the TTE switching test vector to the test device through the management network port; and is also used to generate a test report according to the test results;

[0005] The test equipment simulates multiple end system nodes to access the device under test DUT;

[0006] The device under test (DUT) is used to interact with the test device to perform application-level testing, and its deployed ports include network ports, management ports, monitoring ports, and I / O ports;

[0007] The test device is used to initialize the device under test DUT according to the TTE network configuration; it is also used to send test messages to the device under test DUT according to the TTE exchange test vector, simulate TTE network communication behavior, and count the processing results of the device under test DUT, that is, the test results; and send the test results to the test PC.

[0008] In some preferred implementations, after the test PC is connected to the management network port of the test device via a network cable, the IP addresses of the test PC and the test device are set in the same network segment, and the test device is initialized via the management network port.

[0009] In some preferred embodiments, the test PC comprises a test tool;

[0010] The test tool is used to construct TTE exchange test vectors for service data of different priorities according to different test requirements and scenarios; it is also used to sample the test results of the test equipment, compare the test results with expected values, and generate a test report.

[0011] In some preferred implementations, a test message is sent to the device under test DUT according to the TTE exchange test vector to simulate TTE network communication behavior, and the method is:

[0012] Send different types of data services in order to communicate with the device under test DUT; wherein the data services include TT messages, RC messages, BE messages, and PCF messages; the priorities of the data services are: PCF messages>TT messages>RC messages>BE messages.

[0013] In some preferred implementations, different types of data services are sent in order to communicate with the device under test DUT, and the method is:

[0014] Sending an IN frame through the PCF message causes each node in the current network to enter a clock synchronization state;

[0015] After the clock is synchronized, the TT message starts to be transmitted according to the TTE exchange test vector, and at the same time, it is detected whether the RC message meets the set time interval. If so, the RC message is scheduled and forwarded;

[0016] The BE message starts to be transmitted between the TT message and the RC message.

[0017] In some preferred implementations, the application-level test includes fault injection, TT, RC, BE traffic test, mixed traffic test, functional test, performance test, mixed message test, synchronization test, message monitoring test, MIB information test and management message test.

[0018] In some preferred embodiments, the TTE network configuration is generated by: generating a TTE switch component structure configuration and a TTE switch component parameter configuration;

[0019] The TTE switching component structure configuration includes network topology, transmission rate, redundancy, virtual links of TT frames and RC frames; the TTE switching component parameter configuration includes synchronization priority, synchronization domain, synchronization cycle, and clock accuracy.

[0020] In some preferred implementations, the I / O port is connected to an oscilloscope, and the oscilloscope is used to capture and analyze the synchronization traffic and data traffic in the TTE switching network.

[0021] A second aspect of the present invention provides a time-triggered Ethernet switch component testing method. Based on the above-mentioned time-triggered Ethernet switch component testing device, the method comprises:

[0022] S100, according to the TTE switching component test requirements, pre-plan different types of data services in the TTE network configuration, and complete the relevant network configuration deployment of the device under test DUT;

[0023] S200, drawing on the standard Ethernet test protocol, writing TTE exchange test vectors under different test scenarios and protocol standards in the test tool;

[0024] S300, the test tool sends the TTE exchange test vector to the test device through the management network port, completes the test device initialization, and simulates the TTE network communication behavior;

[0025] S400, the test device continuously sends test messages according to the TTE exchange test vector, the test messages are injected into the device under test DUT through the network interface, and the processing results of the device under test DUT are counted;

[0026] S500, the test device feeds back the processing results to the test tool, and the test tool completes the statistics and generates a final test report.

[0027] Beneficial effects of the present invention:

[0028] 1) The present invention is based on a common Ethernet tester and Ethernet test protocol standards, which changes the traditional end node board test TTE switch. It does not need to build a complex dedicated network. It only needs to change the test vector to quickly complete the product test. According to the test results, the effective improvement of the device under test is achieved, the logic iteration efficiency is effectively improved, and the bandwidth is increased at the same time, which greatly reduces the cost and space.

[0029] 2) The present invention uses test equipment to construct mixed traffic containing PCF, TT, RC, and BE messages, which can preliminarily verify whether the basic status of the circuit is normal in a system simply and efficiently without building a complex dedicated network, greatly reducing the demand for network systems for product testing;

[0030] 3) Based on the original test protocol, the present invention constructs a PCF frame to make the current network enter a synchronous state. After synchronization, network resources are accessed according to the sending time and receiving time of the schedule. The pre-planned schedule not only realizes data predictability, but also avoids data conflicts during transmission, while taking into account the utilization rate of network bandwidth. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Other features, objects and advantages of the present application will become more apparent by reading the detailed description of non-limiting embodiments made with reference to the following drawings.

[0032] Figure 1 It is a structural schematic diagram of a time-triggered Ethernet switch component testing device according to an embodiment of the present invention;

[0033] Figure 2 It is a schematic diagram of a flow chart of a TTE exchange test according to an embodiment of the present invention;

[0034] Figure 3 It is a schematic diagram of a hardware system for application-level testing of a TTE chip according to an embodiment of the present invention;

[0035] Figure 4 It is a schematic diagram of a software system for application-level testing of a TTE chip according to an embodiment of the present invention;

[0036] Figure 5 It is a schematic diagram of a TTE exchange test vector according to an embodiment of the present invention. DETAILED DESCRIPTION

[0037] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution in the embodiment of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiment is a part of the embodiment of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0038] The present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the relevant invention, rather than to limit the invention. It is also necessary to explain that, for ease of description, only the parts related to the relevant invention are shown in the accompanying drawings.

[0039] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application may be combined with each other.

[0040] A time-triggered Ethernet switch component testing device according to a first embodiment of the present invention comprises: a test PC, a test device, and a device under test (DUT);

[0041] The test PC is connected to the management network port of the test device through a network cable; the test PC is used to generate a TTE network configuration and a TTE switching test vector, and send the TTE network configuration and the TTE switching test vector to the test device through the management network port; and is also used to generate a test report according to the test results;

[0042] The test equipment simulates multiple end system nodes to access the device under test DUT;

[0043] The device under test (DUT) is used to interact with the test device to perform application-level testing, and its deployed ports include network ports, management ports, monitoring ports, and I / O ports;

[0044] The test device is used to initialize the device under test DUT according to the TTE network configuration; it is also used to send test messages to the device under test DUT according to the TTE exchange test vector, simulate TTE network communication behavior, and count the processing results of the device under test DUT, that is, the test results; and send the test results to the test PC.

[0045] In order to more clearly illustrate a time-triggered Ethernet switch component testing device of the present invention, each module in an embodiment of the system of the present invention is described in detail below with reference to the accompanying drawings.

[0046] The present invention is based on common Ethernet testers and Ethernet test protocol standards, and changes the traditional end node board test TTE switch. It does not need to build a complex dedicated network, and only needs to change the test vector to quickly complete product testing, effectively improving the efficiency of logic iteration, while increasing bandwidth and greatly reducing costs and space. The details are as follows:

[0047] The present invention provides a time-triggered Ethernet switch component testing device, such as Figure 1 As shown, the device includes: a test PC, a test device, and a device under test DUT;

[0048] The test PC is connected to the management network port of the test device through a network cable; after the test PC is connected to the management network port of the test device through the network cable, the IP addresses of the test PC and the test device are set to be in the same network segment, and the test device is initialized through the management network port;

[0049] The test PC includes a test tool; the test tool is used to construct TTE switching test vectors of different priority service data according to different test requirements and scenarios; it is also used to sample the test results of the test equipment, compare the test results with expected values, and generate a test report; that is, the test PC is used to generate TTE network configuration, TTE switching test vectors (such as Figure 5As shown), and send TTE network configuration and TTE exchange test vector to the test device through the management network port; also used to generate a test report based on the test results for user analysis;

[0050] The method for generating the TTE network configuration is as follows: generating the TTE switching component structure configuration and the TTE switching component parameter configuration; the TTE switching component structure configuration includes the network topology, transmission rate, redundancy, and virtual links of TT frames and RC frames; the TTE switching component parameter configuration includes synchronization priority, synchronization domain, synchronization cycle, and clock accuracy;

[0051] After the above initialization is completed, the present invention simulates VTP testing, and the test equipment simulates multiple end system nodes to access the device under test DUT, so as to realize the transmission of pre-planned mixed messages in the switching component network. The test equipment is used to configure the device under test DUT according to the TTE network; it is also used to send test messages to the device under test DUT according to the TTE switching test vector, simulate the TTE network communication behavior, and count the processing results of the device under test DUT, that is, the test results; send the test results to the test PC; Figure 2 As shown;

[0052] Among them, sending a test message to the device under test DUT according to the TTE exchange test vector to simulate TTE network communication behavior, the method is:

[0053] Different types of data services are sent in order to communicate with the device under test DUT; wherein, data services include TT messages, RC messages, BE messages, and PCF messages; the priority of data services is: PCF messages>TT messages>RC messages>BE messages; that is, the basis for the normal operation of the TTE network is the clock synchronization of each node in the system. After synchronization, network resources are accessed according to the sending time and receiving time of the schedule. The pre-planned schedule not only realizes data predictability, but also avoids data conflicts during transmission, while taking into account the utilization of network bandwidth. The synchronization (PCF) message is a TTE network clock designed based on the AS6802 standard, which is used to synchronize the test equipment with the device under test. The system sends an IN frame through PCF to make each node of the current network enter a synchronized state. After the network clock is synchronized, the TT traffic starts to be transmitted according to the network configuration rules, and at the same time detects whether the RC traffic meets the set time interval. If it meets the time interval, it is scheduled and forwarded, and the BE message starts to be transmitted in the gap between the TT message and the RC message. The network configuration ensures the determinism of the time-triggered (TT) message, and is not affected by other low-priority services. The RC message is a flow control packet, which improves network determinism by limiting the flow rate. BE is a best-effort traffic, which is transmitted during idle time periods when no other services are scheduled to be sent. In addition, since there are no mature TTE switching component testing products in China, the present invention is based on ordinary Ethernet testers and Ethernet test protocol standards. Among them, PCF messages are based on AS6802 standards; the main standard of RC messages is ARINC664 P7; BE messages are compatible with IEEE 802.3 series standards; firmware testing (i.e. firmware applications) supports ARINC615A and SNMP standards; and subsequent enhanced protocol testing: ICMP, ARP, IEEE802.1Q protocols; link layer standards are: IEEE 802.3, AS6802, ARINC664 P7;

[0054] The device under test (DUT) is equipped with network ports, management ports, monitoring ports, and I / O ports. The I / O ports are used to capture and analyze the synchronization traffic and data traffic in the TTE switching component network through an oscilloscope.

[0055] According to the test requirements and network configuration data, the TTE test equipment (i.e., the test device) interacts with the device under test (DUT) to provide data communication, MIB information management, monitoring management, and SNMP service management, etc. (i.e., the device under test (DUT) is a standard TTE switching component, which mainly performs core functions such as receiving and filtering data frames, alarm management, storage and scheduling forwarding, and interacts with the test equipment to perform application-level testing);

[0056] Application-level tests include fault injection, TT, RC, BE traffic tests, mixed traffic tests, functional tests, performance tests, mixed message tests, synchronization tests, message monitoring tests, MIB information tests, and management message tests;

[0057] Fault injection: construct error frames or abnormal frames of different types of messages in the TTE switching network to test the error filtering capability of TTE switching;

[0058] Functional testing to verify the routing and forwarding relationship and store-and-forward function of TT, RC, and BE messages in the TTE switching network, as well as the unicast, multicast, and broadcast forwarding capabilities;

[0059] Performance testing: construct TT, RC, and BE messages to test the unicast, multicast, and broadcast forwarding performance of the TTE switching network;

[0060] Mixed message test: Mixed messages include TT, RC, BE and PCF messages. They test the operation of the TTE switching network under mixed traffic and determine whether the basic status of its circuit is normal.

[0061] Synchronous test, based on the TTE network clock synchronization of the AS6802 standard, has the highest priority and is used to synchronize the test equipment with the device under test;

[0062] Message monitoring test: Verify the monitoring capability of TTE switching network through port message monitoring and keyword monitoring;

[0063] MIB information test, statistics of MIB information of input ports, output ports and switching buffer;

[0064] Management message test, implement SNMP protocol test and ARINC615 configuration loading management protocol test;

[0065] In addition, the time-triggered Ethernet switch component test device also includes a TTE tool installed in a test PC and a TTE board driver installed in the device under test;

[0066] TTE tool is used to generate network planning and scheduling, configuration loading; TTE board driver mainly includes register management module, phy management module, device management module, configuration management module, communication management module, monitoring management module and mib management module;

[0067] Test system hardware, the traditional end node card test TTE switch system consists of an onboard computer, backplane switching and related end test cards. There are three main tasks to be completed: the production of test cards, system environment integration and the production of related test cases. The test equipment simulates multiple end system nodes to access the device under test DUT, replacing the traditional end node card and simplifying the time-triggered Ethernet switch component test device.

[0068] In summary, the present invention is based on the Ethernet test standard, combines the time-triggered Ethernet protocol and product structure to develop a time-triggered Ethernet switching component testing device and method; based on the Ethernet test platform, simulates the TTE end node, forms a product test vector by constraining the time period sequence number of each flow, and finally forms relevant test standards, which have the ability to test time-deterministic network chips.

[0069] In order to further understand the present invention, the present invention combines the ATP (Acceptance Test Procedure) test platform and performs application-level testing of the TTE chip through a time-triggered Ethernet switch component testing device of the present invention, such as Figure 3 and Figure 4 As shown in the figure, the test is based on TTE chip network equipment, constructing network environment and scenarios for application-level testing. By connecting the device under test to the TTE network for communication, the application and interface functions can be quickly verified. Figure 3 The test equipment in the test simulates multiple end nodes ES to access the device under test DUT, and the test PC manages and configures the test equipment.

[0070] It should be noted that the time-triggered Ethernet switch component test device provided in the above embodiment is only illustrated by the division of the above functional modules. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the modules or steps in the embodiments of the present invention can be decomposed or combined. For example, the modules in the above embodiment can be combined into one module, or further divided into multiple sub-modules to complete all or part of the functions described above. The names of the modules and steps involved in the embodiments of the present invention are only for distinguishing the modules or steps, and are not regarded as improper limitations of the present invention.

[0071] A time-triggered Ethernet switch component testing method according to a second embodiment of the present invention is based on the above-mentioned time-triggered Ethernet switch component testing device and includes the following steps:

[0072] S100, according to the TTE switching component test requirements, pre-plan different types of data services in the TTE network configuration, and complete the relevant network configuration deployment of the device under test DUT;

[0073] S200, drawing on the standard Ethernet test protocol, writing TTE exchange test vectors under different test scenarios and protocol standards in the test tool;

[0074] S300, the test tool sends the TTE exchange test vector to the test device through the management network port, completes the test device initialization, and simulates the TTE network communication behavior;

[0075] S400, the test device continuously sends test messages according to the TTE exchange test vector, the test messages are injected into the device under test DUT through the network interface, and the processing results of the device under test DUT are counted;

[0076] S500, the test device feeds back the processing results to the test tool, and the test tool completes the statistics and generates a final test report.

[0077] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working process and related instructions of the method described above can refer to the corresponding process in the aforementioned device example, and will not be repeated here.

[0078] Those skilled in the art should be able to appreciate that the modules and method steps of each example described in conjunction with the embodiments disclosed herein can be implemented with electronic hardware, computer software or a combination of the two, and the programs corresponding to the software modules and method steps can be placed in random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disks, removable disks, CD-ROMs, or any other form of storage medium known in the technical field. In order to clearly illustrate the interchangeability of electronic hardware and software, the composition and steps of each example have been generally described in the above description according to the function. Whether these functions are performed in electronic hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0079] The terms "first", "second", etc. are used to distinguish similar objects rather than to describe or indicate a particular order or sequence.

[0080] The term "comprise" or any other similar term is intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus / device that includes a list of elements includes not only those elements but also other elements not expressly listed, or also includes elements inherent to such process, method, article, or apparatus / device.

[0081] So far, the technical solutions of the present invention have been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to these specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the protection scope of the present invention.

Claims

1. A time-triggered Ethernet switch component test device, characterized in that: The device includes: a test PC, a test device, and a device under test DUT; The test PC is connected to the management network port of the test device through a network cable; the test PC is used to generate a TTE network configuration and a TTE switching test vector, and send the TTE network configuration and the TTE switching test vector to the test device through the management network port; and is also used to generate a test report according to the test results; The test equipment simulates multiple end system nodes to access the device under test DUT; The device under test (DUT) is used to interact with the test device to perform application-level testing, and its deployed ports include network ports, management ports, monitoring ports, and I / O ports; The test device is used to initialize the device under test DUT according to the TTE network configuration; it is also used to send test messages to the device under test DUT according to the TTE exchange test vector, simulate TTE network communication behavior, and count the processing results of the device under test DUT, that is, the test results; and send the test results to the test PC.

2. A time-triggered Ethernet switch component testing device according to claim 1, characterized in that: After the test PC is connected to the management network port of the test device through a network cable, the IP addresses of the test PC and the test device are set in the same network segment, and the test device is initialized through the management network port.

3. A time-triggered Ethernet switch component testing device according to claim 1, characterized in that: The test PC includes a test tool; The test tool is used to construct TTE exchange test vectors for service data of different priorities according to different test requirements and scenarios; It is also used to sample the test results of the test equipment, compare the test results with expected values, and generate a test report.

4. A time-triggered Ethernet switch component testing device according to claim 2, characterized in that: The method of sending a test message to the device under test DUT according to the TTE exchange test vector to simulate TTE network communication behavior is as follows: Send different types of data services in order to communicate with the device under test DUT; wherein the data services include TT messages, RC messages, BE messages, and PCF messages; the priorities of the data services are: PCF messages>TT messages>RC messages>BE messages.

5. A time-triggered Ethernet switch component testing device according to claim 3, characterized in that: The method of sending different types of data services in order to communicate with the device under test DUT is as follows: Sending an IN frame through the PCF message causes each node in the current network to enter a clock synchronization state; After the clock is synchronized, the TT message starts to be transmitted according to the TTE exchange test vector, and at the same time, it is detected whether the RC message meets the set time interval. If so, the RC message is scheduled and forwarded; The BE message starts to be transmitted between the TT message and the RC message.

6. A time-triggered Ethernet switch component testing device according to claim 3, characterized in that: The application-level tests include fault injection, TT, RC, BE traffic test, mixed traffic test, functional test, performance test, mixed message test, synchronization test, message monitoring test, MIB information test and management message test.

7. A time-triggered Ethernet switch component testing device according to claim 4, characterized in that: Generate a TTE network configuration, wherein the method comprises: generating a TTE switching component structure configuration and a TTE switching component parameter configuration; The TTE switching component structure configuration includes network topology, transmission rate, redundancy, virtual links of TT frames and RC frames; the TTE switching component parameter configuration includes synchronization priority, synchronization domain, synchronization cycle, and clock accuracy.

8. A time-triggered Ethernet switch component testing device according to claim 7, characterized in that: The I / O port is connected to an oscilloscope, and the oscilloscope is used to capture and analyze the synchronization traffic and data traffic in the TTE switching network.

9. A time-triggered Ethernet switch component testing method, based on the time-triggered Ethernet switch component testing device according to any one of claims 1 to 8, characterized in that: The method comprises the following steps: S100, according to the TTE switching component test requirements, pre-plan different types of data services in the TTE network configuration, and complete the relevant network configuration deployment of the device under test DUT; S200, drawing on the standard Ethernet test protocol, writing TTE exchange test vectors under different test scenarios and protocol standards in the test tool; S300, the test tool sends the TTE exchange test vector to the test device through the management network port, completes the test device initialization, and simulates the TTE network communication behavior; S400, the test device continuously sends test messages according to the TTE exchange test vector, the test messages are injected into the device under test DUT through the network interface, and the processing results of the device under test DUT are counted; S500, the test device feeds back the processing results to the test tool, and the test tool completes the statistics and generates a final test report.

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