High-bandwidth coaxial interface test fixing device

Abstract

A system (1100) for testing a plurality of devices (250) includes a connector bracket (208) having a plurality of apertures (908), wherein each aperture (908) included in the plurality of apertures (908) is configured to hold a respective cable connector (960) connected to a cable (270); a device holder (240) configured to hold the first device (250) in a test position; and an engagement mechanism (222) supporting the connector bracket (208) and operable to move the connector bracket (208) to an engaged position. A contact point (920) associated with a first cable connector (960) contacts a signal pad (804) associated with the first device (250) when the first device (250) is held in a test position by the device holder (240) and a first aperture (908) included in the plurality of apertures (908) holds the first cable connector (960).

Description

background Technical Field

[0002] Embodiments of the present disclosure relate generally to electronic device testing and test fixtures for electronic devices, and more particularly, to high bandwidth coaxial interface test fixtures. Background Art

[0003] As integrated circuits and computer devices evolve to have increased clock rates, designers of computing systems are required to consider increased clock rates and different interface protocols when developing new computing systems. The increased clock rates achieved in newer devices require insertion loss data to be measured at higher frequencies using more Nyquist frequency points. For example, the Nyquist frequency of newer devices can be as high as 26.56 GHz. When designing systems containing such devices, board-level system designers need accurate loss performance of printed circuit boards (PCBs) and / or substrate materials within a bandwidth of no less than 30 GHz in order to accurately predict the insertion loss of the device in the board and accurately predict the performance of the board containing the device. The accurate loss performance of the PCB and / or substrate material is usually determined by measuring the loss performance of several (e.g., three to five) sample PCBs at least two different lengths (e.g., four inches and eight inches) per sample PCB. That is, each sample PCB has at least two sets of traces, each set of traces has a different length, and the loss of all sets of traces is measured to characterize the PCB material. Board-level system designers use the measured loss performance of the PCB material when designing the PCB containing the device.

[0004] Once a PCB containing a device is designed, the manufacturer typically chooses to manufacture a large number (e.g., 10,000) of PCBs. However, for PCBs and substrates, various factors (e.g., different manufacturers' processes and different materials) can cause similar PCBs and substrates to have different loss performance. Therefore, in order to ensure that the performance of the manufactured PCB matches the design specifications of the PCB, the system manufacturer typically tests a certain number of samples selected from the PCB or substrate and compares the measured test data with the specifications of the PCB or substrate received from the supplier. In some cases, the PCB supplier manufactures and supplies one or more coupons with a batch of PCBs, which are made of the same materials and under the same conditions as the batch and have traces of a specific length for testing. In this case, the system manufacturer tests the coupons and compares the measured test data with the specifications of the PCB. In some cases, the system manufacturer tests all PCBs or substrates to ensure that the loss performance of each PCB or substrate meets the design specifications.

[0005] One method of testing the loss performance of a PCB or substrate requires the test engineer to contact the signal pads of the PCB or substrate (called the device under test (DUT)) with a handheld flexible microprobe. The handheld flexible microprobe is connected to a network analyzer via a cable. Contacting the signal pads with the microprobe puts the DUT into electrical communication with the network analyzer, allowing the network analyzer to measure the performance of the DUT. One disadvantage of this test method is that testing with a handheld microprobe results in impedance discontinuities, which are caused by sudden changes in inductance and resistance in the current path from the network analyzer through the cable and the microprobe into the DUT. The sudden changes in inductance and resistance are caused by the cross-section of the microprobe's contact point on the signal pad being different from the cross-section of the microprobe and the cross-section of the signal pad on the DUT. In general, impedance discontinuities can cause high-frequency signals (e.g., signals measured when testing the DUT) to be unstable, which can lead to poor or inaccurate test results. In addition, because the microprobe is handheld, different test engineers may cause the microprobe to contact the signal pad with different amounts of force, resulting in impedance discontinuities that vary from test engineer to test engineer, which can have a negative impact on the repeatability of test results. Furthermore, alignment of the handheld microprobe to the DUT is typically controlled by ensuring that the four guide pins to which the microprobe is connected are inserted into four corresponding guide holes on the DUT (which guide the microprobe to the correct location on the DUT). This type of connection structure is inherently imprecise because the guide holes must be larger than the guide pins to allow the guide pins to be inserted into the guide holes, resulting in misalignments between the guide pins and the guide holes. These misalignments can cause variations in the alignment between the microprobe and the DUT, which can also negatively impact the repeatability of test results, especially when different test engineers are testing a group of DUTs from a particular batch.

[0006] Another method of testing the loss performance of a PCB or substrate uses a cable connector (e.g., a coaxial connector) to contact the signal pads of the DUT. The cable connector is connected to a network analyzer via a cable. Contact of the signal pads with the cable connector puts the DUT in electrical communication with the network analyzer, thereby enabling the network analyzer to measure the performance of the DUT. In one example of this method, a solderless cable connector can be attached to the DUT using screws so that the contact points on the cable connector contact the signal pads of the DUT. FIG. 1 shows such a configuration, in which a cable connector 104 is connected to the DUT 100 using screws 102. Importantly, as discussed above, the use of screws to mount the cable connector to the DUT allows the contact points of the cable connector to be more accurately positioned on the signal pads of the DUT relative to the positioning that can be achieved using a handheld microprobe aligned with guide pins and guide holes, because the screws are more accurately loaded into the corresponding threaded holes than the guide pins are loaded into the corresponding guide holes. However, one disadvantage of this test method is that the time required to test the DUT due to the installation and removal of the screws increases relative to the time required to test the DUT using a handheld microprobe, as described above. The additional test time required makes this method unsuitable for testing a large number of samples.

[0007] As previously stated, there is a need in the art for more efficient techniques for testing printed circuit boards and substrates. Summary of the invention

[0008] Various embodiments of the present disclosure set forth a system for testing a plurality of devices. The system includes: a connector holder having a plurality of holes, wherein each hole included in the plurality of holes is configured to hold a corresponding cable connector connected to a cable; a device holder configured to hold a first device in a test position; and an engagement mechanism that supports the connector holder and is operable to move the connector holder to an engagement position, wherein when the first device is held in the test position by the device holder and a first hole included in the plurality of holes holds a first cable connector, a contact point associated with the first cable connector contacts a signal pad associated with the device.

[0009] At least one technical advantage of the disclosed design over the prior art is that using the disclosed design, devices can be tested much faster than prior art designs and techniques. Another technical advantage is that the disclosed design enables more robust and consistent device-to-device testing than using prior art designs and techniques. Another technical advantage is that the disclosed design reduces wear on cable connectors, thereby reducing testing costs, compared to prior art designs and techniques. These technical advantages provide one or more technical improvements over prior art methods. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] In order to be able to understand the features of the various embodiments described above in detail, the inventive concepts briefly outlined above may be described in more detail with reference to various embodiments, some of which are shown in the accompanying drawings. However, it should be noted that the drawings only illustrate typical embodiments of the inventive concepts and are therefore not to be construed as limiting the scope in any way, and there are other equally effective embodiments.

[0011] FIG. 1 is a diagram of a device under test (DUT) with a cable connector mounted with screws according to the prior art;

[0012] Figure 2 is an isometric view of a fixture in a ready position according to various embodiments;

[0013] Figure 3 is in an engaged position according to various embodiments Figure 2 A front view of a fixing device;

[0014] Figure 4 is in a ready position according to various embodiments Figure 2 A side view of a fixing device;

[0015] Figure 5 is in a ready position according to various embodiments Figure 2 An isometric view of the fixture with cables for single-ended testing;

[0016] Figure 6 is in the middle position according to various embodiments Figure 2 An isometric view of an engagement mechanism of a fixture;

[0017] Figure 7 According to various embodiments Figure 2 An isometric view of a device holder in a fixture;

[0018] Figure 8 is installed in accordance with various embodiments Figure 7 Isometric view of the DUT on the device holder;

[0019] Fig. 9 According to various embodiments Figure 2 A side cross-sectional view of a connector bracket of a fixing device;

[0020] Fig.10 According to various embodiments Fig. 9 A front cross-sectional view of a connector bracket; and

[0021] Fig.11 is an isometric view of a system configured to implement one or more aspects of the various embodiments. DETAILED DESCRIPTION

[0022] In the following description, numerous specific details are set forth in order to provide a more thorough understanding of various embodiments. However, it will be apparent to one skilled in the art that the concepts of the present invention may be practiced without one or more of these specific details.

[0023] Figure 2 2 is an isometric view of a fixture 200 in a ready position according to various embodiments. As shown, the fixture 200 includes, but is not limited to, a connector bracket frame 202, a connector bracket 208, a support frame 210, an engagement mechanism 222, and a device bracket 240. The illustrated position is referred to as the "ready position" because the connector bracket 208 is separated from the device bracket 240, making the device bracket 240 accessible, which allows a test engineer to remove a device under test (DUT) 250 from the device bracket 240 and install a new DUT 250 on the device bracket 240. When the connector bracket 208 and / or the engagement mechanism 222 are referred to as being in the ready position, the connector bracket 208 and / or the engagement mechanism 222 are in the position that the connector bracket 208 and / or the engagement mechanism 222 occupy when the fixture 200 is in the ready position.

[0024] The connector bracket frame 202 rigidly connects the connector bracket 208 to the engagement mechanism 222. The connector bracket frame 202 can be assembled from a connector bracket cross member 204 connected to two or more connector bracket frame vertical members 206, as shown, or can be a single integral piece (not shown). The connector bracket frame 202 transmits motion from the engagement mechanism 222 to the connector bracket 208, so that the connector bracket 208 moves from the ready position to the engaged position in response to the engagement mechanism 222 being activated.

[0025] The connector support frame cross beam 204 can be formed of any rigid material, such as aluminum, steel, or plastic. The connector support frame cross beam 204 is rigidly connected to the connector support frame vertical member 206. The connector support frame cross beam 204 can be bolted to the connector support frame vertical member 206, as shown, or can be connected to the connector support frame vertical member 206 by any technically feasible rigid means. The connector support cross beam 204 is also rigidly connected to the engagement mechanism 222. The connector support cross beam 204 can be bolted to the push rod 234, such as with a force adjustment screw 238, as shown.

[0026] The connector bracket frame vertical members 206 can be formed of any rigid material, such as aluminum, steel, or plastic. The connector bracket frame vertical members are rigidly connected to the connector bracket frame cross members 204. The connector bracket frame vertical members 206 can be bolted to the connector bracket frame cross members 204, as shown, or can be connected to the connector bracket frame cross members 204 by any technically feasible rigid means. The connector bracket frame vertical members 206 are rigidly and removably connected to the connector bracket 208. That is, the connector bracket frame vertical members 206 are rigidly connected to the connector bracket 208, but the connector bracket frame vertical members 206 can be disconnected from the connector bracket 208 (e.g., by removing the bolts) and another connector bracket (e.g., Figure 5 The connector bracket 508 shown in FIG. 5A can be connected to the connector bracket frame vertical member 206 .

[0027] The connector bracket 208 can be formed of any rigid material. The connector bracket 208 is rigidly and removably connected to the connector bracket frame vertical member 206. The connector bracket 208 is also rigidly and removably connected to the guide 212. Fig. 9 As shown in more detail, the connector bracket has a plurality of holes, each of which is configured to hold a cable connector (e.g., a 2.92 mm coaxial connector). The connector bracket 208 may also have a cable connector cutout, each of which is configured to hold at least one base of a cable connector. The connector bracket 208 may also have one or more cable end cutouts, wherein one or more of the cable end cutouts are configured to provide a gap between the connector bracket 208 and the cable connector. The gap enables a hand (e.g., a test engineer's hand) or a hand tool (e.g., a wrench) to access the cable end of a cable attached to a cable connector held in the connector bracket 208.

[0028] The support frame 210 includes, but is not limited to, a support frame cross beam 214, two or more support frame vertical members 216, a base 218, one or more rails 220, and guides 212 for each rail. The support frame 210 supports the engagement mechanism 222 and rigidly connects the engagement mechanism 222 to the base 218.

[0029] The support frame cross beam 214 can be made of any rigid material. The support frame cross beam 214 is rigidly connected to the support frame vertical member 216. The support frame cross beam 214 supports the engagement mechanism 222 and is rigidly connected to the engagement mechanism 222. The support frame cross beam 214 is also rigidly connected to the guide rail 220.

[0030] The support frame vertical members 216 are rigidly connected to and support the support frame cross beams 214. The support frame vertical members 216 and the support frame cross beams 214 may be bolted together as shown, or may be formed as a single unitary piece.

[0031] The base 218 can be made of any rigid material. The base 218 supports the support frame vertical member 216 and is rigidly connected to the support frame vertical member 216. The base 218 also supports the guide rail 220 and is rigidly connected to the guide rail 220. The base 218 also supports the device bracket 240 and is rigidly and removably connected to the device bracket 240.

[0032] The guide rail 220 continues between the support frame cross beam 214 and the base 218. The guide rail has a smooth surface and can be made of any rigid material. The guide 212 is configured to be rigidly and removably connected to the connector bracket 208 and slide smoothly along the guide rail 220. The guide 212 can, for example, include a bearing or a bushing to enable the guide 212 to slide along the guide rail 220.

[0033] The engagement mechanism 222 is rigidly connected to the support frame crossbar 214 and the connector bracket frame crossbar 204. The engagement mechanism 222 is operable to move the connector bracket frame 202 and the connector bracket 208 between the ready position and the engaged position. The engagement mechanism 222 includes, but is not limited to, a handle 224, a first link 226, a first pivot 228, a second pivot 230, a third pivot 232, a push rod 234, and a push rod guide 236. Figure 4 As shown in more detail, the engagement mechanism 222 also includes a second link, a fourth pivot, a fifth pivot, and a sixth pivot. Although the engagement mechanism 222 is described as a handle 224, a first link 226, a second link, a first pivot 228, a second pivot 230, a third pivot 232, a fourth pivot, a fifth pivot, a sixth pivot, and a push rod 234, the engagement mechanism 222 can be any technically feasible mechanism type (e.g., a scissor mechanism or a pneumatic punch) that can be operated to vertically move the connector bracket frame 202 and the connector bracket 208.

[0034] The handle 224 can be made of any rigid material. The handle 224 has a hole through which the coaxial rotation axes of the third pivot 232 and the sixth pivot pass, and the handle can rotate around the rotation axes of the third pivot 232 and the sixth pivot. The second pivot 230 and the fifth pivot are mounted on the handle 224.

[0035] The first link 226 can be made of any rigid material. The first link 226 has a hole through which the rotation axes of the first pivot 228 and the second pivot 230 pass, and the first link 226 can rotate around the rotation axis of the first pivot 228 and around the rotation axis of the second pivot 230.

[0036] The first pivot 228 connects the push rod guide 236 with the first link 226. The first pivot 228 forms a hinge point around which the push rod guide 236 and the first link 226 can rotate relative to each other. The second pivot 230 connects the handle 224 with the first link 226. The second pivot 228 also forms a hinge point around which the handle 224 and the first link 226 can rotate relative to each other. The third pivot 232 connects the handle 224 with the push rod 234. The third pivot 232 also forms a hinge point around which the handle 224 and the push rod 234 can rotate relative to each other.

[0037] The push rod 234 can be made of any rigid material and have a smooth surface. The push rod 234 is rigidly and adjustably connected to the connector bracket frame cross beam 204. The push rod 234 passes through and is guided by the push rod guide 236. The push rod guide 236 can be made of any rigid material and can include a bushing or bearing that allows the push rod 234 to slide through the push rod guide 236. The push rod guide 236 is rigidly connected to the support frame cross beam 214.

[0038] The force adjustment screw 238 enables adjustment of the connection between the push rod 234 and the connector bracket frame crossbar 204. The force adjustment screw 238 can be turned to move the connector bracket frame crossbar 204 closer to or further away from the end of the push rod 234. By adjusting the connection between the push rod 234 and the connector bracket frame crossbar 204, the vertical distance traveled by the connector bracket 208 between the ready position and the engaged position (described below in conjunction with Figure 3 Description) can be adjusted.

[0039] The device support 240 can be made of any rigid material. The device support 240 can be horizontally aligned with the base 218 by bolts or screws. The optional pads 242 below the device support 240 can allow the device support 240 to move vertically relative to the base 218. The optional pads 242 can be made of any flexible material, such as rubber.

[0040] Figure 3 is in an engaged position according to various embodiments Figure 2 As shown in the figure, when the handle 224 is moved from the left side of the fixing device 200 (such as Figure 2When the connector bracket 208 and / or the engagement mechanism 222 are moved to the right side of the fixture 200 (as shown), the engagement mechanism 222 causes the push rod 234 to move downward to the engagement position. The illustrated position is referred to as the "engaged position" because the connector bracket 208 is close to the device bracket 240 and the cable connector held in the connector bracket 208 can contact the DUT 250 on the device bracket 240. When the connector bracket 208 and / or the engagement mechanism 222 are referred to as being in the engagement position, the connector bracket 208 and / or the engagement mechanism 222 are in the position that the connector bracket 208 and / or the engagement mechanism 222 occupy when the fixture 200 is in the engagement position.

[0041] Movement of the push rod 234 causes the force adjustment screw 238 to move downward, thereby causing the connector bracket frame 202 and the attached connector bracket 208 to move downward. When the fixture 200 is in the engaged position, the cable connector held by the connector bracket 208 moves downward and contacts the DUT 250.

[0042] The movement of the push rod 234 is limited by the push rod guide 236 to be vertical relative to the support frame 210. Similarly, the movement of the connector bracket 208 is limited by the guide 212 to be along the guide rail 220, which is rigidly connected to the connector bracket 208. Since each guide rail 220 is rigidly connected to the support frame cross beam 214 and the base 218 in a vertical orientation, the movement of the connector bracket 208 is also vertical relative to the support frame cross beam 214, the base 218 and the support frame 210 as a whole.

[0043] When the DUT 250 is tested in the fixture 200, the DUT 250 is located in a test position on the device holder 240. The cable 270 is connected between the cable connector held by the connector holder 208 and a network analyzer (not shown). The engagement mechanism 222 is activated (e.g., the movement handle 224) to move the connector holder 208 to the engaged position. As the connector holder 208 moves from the ready position to the engaged position, the guide 212 guides the connector holder 208 along the guide rail 220. When the connector holder 208 is in the engaged position, the contact points associated with the cable connector held by the connector holder 208 touch the signal pads of the DUT 250. When the connector holder 208 is in the engaged position, the test signal from the network analyzer can be conducted to the DUT 250 and back again through the cable 270 and the cable connector held by the connector holder 208. When the testing of the DUT 250 is completed, the engagement mechanism 222 can be deactivated to return the connector holder 208 to the ready position, as shown in FIG. Figure 2 With the connector holder 208 in the ready position, the DUT 250 can be removed and replaced with a new DUT 250. In this way, multiple devices can be tested one by one in the fixture 200.

[0044] When the fixture 200 is in the engaged position, the handle 224 applies a downward force to the push rod 234 via the third pivot 232. The push rod 234 transmits the downward force into the force adjustment screw 238, which transmits the downward force into the connector bracket frame 202. The connector bracket frame 202 transmits the downward force into the connector bracket 208. The connector bracket 208 transmits at least a portion of the downward force into the cable connector held by the connector bracket 208. In some cases, the connector bracket 208 also transmits a portion of the downward force into the DUT 250 and / or the device bracket 240. The cable connector held by the connector bracket 208 transmits the downward force into the DUT 250, which transmits the downward force into the device bracket 240. The device bracket 240 transmits the downward force into the optional pad 242 (if present) and / or the base 218.

[0045] The downward force applied by the handle 224 on the push rod 234 via the third pivot 232 (as described above) is opposite to the upward force applied by the handle 224 on the second pivot 230. The second pivot 230 transmits the upward force to the first link 226. The first link 226 transmits the upward force into the push rod guide 236. The push rod guide 236 transmits the upward force into the support frame 210. The support frame 210 transmits the upward force into the base 218.

[0046] The combination of the downward force transmitted into the connector bracket 208 and the upward force transmitted into the base 218 causes the DUT 250, the device bracket 240, and the optional pad 242 to be compressed between the connector bracket 208 and the base 218. The downward force and the upward force can be adjusted by rotating the force adjustment screw 238. Rotating the force adjustment screw 238 in one direction raises the connector bracket frame 202 and the connector bracket 208 relative to the push rod 234. Rotating the force adjustment screw 238 in the opposite direction lowers the connector bracket frame 202 and the connector bracket 208 relative to the push rod 234. Raising or lowering the connector bracket 208 relative to the push rod 234 causes the connector bracket 208 to also be raised or lowered relative to the base 218. Since the engagement mechanism 222 moves the push rod 234, the connector holder frame 202, and the connector holder 208 a consistent distance at each engagement, adjusting the vertical position of the connector holder 208 relative to the base 218 can adjust the stress experienced by the connector holder 208, the DUT 250, the device holder 240, and the base 218 when the fixture 200 is in the engaged position, thereby adjusting the downward force applied by the connector holder 208 to the DUT 250. In this way, the downward force and the upward force applied by the fixture 200 can be adjusted to accommodate different DUTs 250 that may have different thicknesses, while still ensuring that the cable connector held by the connector holder 208 contacts each DUT 250 with a consistent force, thereby enabling consistent testing of each DUT 250 in sequence.

[0047] Figure 4 is in a ready position according to various embodiments Figure 2 200. As shown, the joint mechanism 222 includes but is not limited to a second link 402, a fourth pivot 404, a fifth pivot 406, and a sixth pivot 408. As shown, the first pivot 228 and the fourth pivot 404 are coaxial. Similarly, the second pivot 230 and the fifth pivot 406 are coaxial. The third pivot 232 and the sixth pivot 408 are also coaxial.

[0048] The second link 402 can be made of any rigid material. The second link 402 has a first hole and a second hole, the rotation axis of the fourth pivot 404 passes through the first hole, and the rotation axis of the fifth pivot 406 passes through the second hole. The fourth pivot 404 connects the push rod guide 236 to the second link 402. The fourth pivot 404 forms a hinge point aligned with the hinge point formed by the first pivot 228, and the push rod guide 236 and the second link 402 can rotate relative to each other around this hinge point. The fifth pivot 406 connects the handle 224 to the second link 402. The fifth pivot 406 forms a hinge point aligned with the hinge point formed by the second pivot 230, and the handle 224 and the second link 402 can rotate relative to each other around this hinge point. The sixth pivot 408 connects the handle 224 and the push rod 234. The sixth pivot 408 forms a hinge point that is aligned with the hinge point formed by the third pivot 232, and the handle 224 and the push rod 234 can rotate relative to each other about this hinge point.

[0049] When the fixing device 200 is in the engaged position, as shown in FIG. Figure 3 As shown, the handle 224 applies a downward force to the push rod 234 via the sixth pivot 408. The push rod 234 transmits the downward force into the force adjustment screw 238, which transmits the downward force into the connector bracket frame 202. The connector bracket frame 202 transmits the downward force into the connector bracket 208. The connector bracket 208 transmits at least a portion of the downward force into the cable connector held by the connector bracket 208. In some cases, the connector bracket 208 also transmits a portion of the downward force into the DUT 250 and / or the device bracket 240. The cable connector held by the connector bracket 208 transmits the downward force into the DUT 250, and the DUT 250 transmits the downward force into the device bracket 240. The device bracket 240 transmits the downward force into the optional pad 242 (if present) and / or the base 218.

[0050] The downward force applied by the handle 224 to the push rod 234 via the sixth pivot 408 (as described above) opposes the upward force applied by the handle 224 to the fifth pivot 406. The fifth pivot 406 transmits the upward force to the second link 402. The second link 402 transmits the upward force to the push rod guide 236. The push rod guide 236 transmits the upward force to the support frame 210. The support frame 210 transmits the upward force to the base 218. The combination of the downward force transmitted to the connector bracket 208 and the upward force transmitted to the base 218 causes the DUT 250, the device bracket 240, and the optional pad 242 to be compressed between the connector bracket 208 and the base 218, as described herein.

[0051] Figure 5 According to various embodiments Figure 22 is an isometric view of the fixture in a ready position with two cables 270. As shown, a connector bracket 508 that is different from the connector bracket 208 can be used with the support frame 210, the base 218, and the engagement mechanism 222. The connector bracket 508 has two holes that are configured to hold two cable connectors to which the two cables 270 are connected.

[0052] Figure 6 According to various embodiments Figure 2 A front isometric view of the engagement mechanism 222 of the fixture 200 in the middle position. As shown, the handle 224 is Figure 2 The ready position shown is the same as Figure 3 As the handle 224 moves from the ready position to the engaged position, the handle 224 rotates about the coaxial axis of the third pivot 232 and the sixth pivot and about the coaxial axis of the second pivot 230 and the fifth pivot. As the handle 224 moves from the ready position to the engaged position, the first link 226 rotates about the axis of the first pivot 228 and the second link rotates about the axis of the fourth pivot coaxial with the first pivot 228. As the handle 224 moves from the ready position to the engaged position, the third pivot 232 and the sixth pivot move vertically with the push rod 234.

[0053] Figure 7 According to various embodiments Figure 2 2 is an isometric view of a device holder 240 in a fixture 200. As shown, the device holder 240 has at least two guide pins 702 for ensuring that a DUT 250 (not shown) placed in a test position on the device holder 240 is aligned with the connector holder 208. The guide pins 702 are configured so that the height of the guide pins 702 protruding above the device holder 240 is less than or equal to the thickness of the DUT 250, so that when the fixture 200 is in the engaged position, the connector holder 208 does not contact the guide pins 702, nor does it contact the DUT 250.

[0054] Figure 8 is installed in accordance with various embodiments Figure 72 is an isometric view of a DUT 250 on a device holder 240 of FIG. 2. As shown, at least two holes 802 in the DUT 250 are located above guide pins 702 in the device holder 240. The at least two guide pins 702 are used to ensure that when the DUT 250 is placed in the test position on the device holder 240, the DUT 250 is aligned with the connector holder so that the contact points associated with each connector held by the connector holder touch the corresponding signal pads 804 on the DUT 250. This also ensures that when the fixture 200 is in the engaged position, the connectors held in the connector holder can contact the signal pads 804 of the DUT 250. Additionally or alternatively, the device holder 240 can have a cutout (not shown) that is configured to hold the DUT 250 in the test position and aligned with the connector holder.

[0055] Fig. 9 According to various embodiments Figure 2 2 is a side cross-sectional view of a connector bracket 208 of a fixture 200. As shown, the connector bracket 208 has a cable connector cutout 902 and a hole 908, which is configured to hold a cable connector 960. Also shown are an end connector 930 of a cable 270, a cable connector 960, and a contact point 920 associated with the cable connector 960. When the fixture 200 is in Figure 3 In the engaged position shown, the signal pins 920 and ground rings 926 on each cable connector 960 held by the connector holder 208 are brought to contact with the signal pads 804 (eg, Figure 8 The cable connector cutout 902 has a depth sufficient to allow the base 924 of the cable connector 960 to be recessed into the connector bracket 208, so that the bottom surface 922 of the cable connector 960 is aligned with the bottom surface 912 of the connector bracket 208 or protrudes below the bottom surface 912 of the connector bracket 208.

[0056] As also shown, the connector bracket 208 has an optional cable end cutout 904 to allow a hand (e.g., a test engineer's hand) or a hand tool to connect (e.g., thread) the end connector 930 of the cable 270 to the cable connector 960. The cable end cutout 904 is optional because, in some cases, the connector bracket 208 allows the end connector 930 of the cable 270 to be connected to the cable connector 960 without the presence of the cable end cutout 904.

[0057] The cable connectors 960 are removable from the connector holder 208, so that the cable connectors can be easily replaced. For example, if the cable connectors 960 have exceeded their life cycle, the test engineer can replace the cable connectors 960 that have exceeded their life cycle with new cable connectors 960. In another example, if the test engineer wishes to perform testing at a different bandwidth, the test engineer can replace a set of first type cable connectors 960 (e.g., 2.92 mm coaxial connectors) with a set of new second type cable connectors 960 (e.g., 1.85 mm coaxial connectors).

[0058] The connector bracket 208, the cable end cutout 904, and the cable connector cutout 902 are configured such that a thickness 906 of the connector bracket 208 between the cable end cutout 904 and the cable connector cutout 902 can be clamped by the cable end 930 and the base 924 of the cable connector 960. When the end connector 930 is threaded onto the cable connector 960, the cable end 930 and the base 924 of the cable connector 960 can effectively clamp the thickness 906 of the connector bracket 208. When the fixture 200 is in the ready position, clamping the thickness 906 of the connector bracket 208 between the end connector 930 and the base 924 of the cable connector 960 can prevent the cables 270 and the cable connector 960 from loosening and disengaging from the connector bracket 208, thereby enabling continued testing of each DUT 250 without straightening or otherwise repositioning the cables 270 and the cable connector 960.

[0059] Fig.10 According to various embodiments Figure 2 208. As shown, each hole 908 in the connector bracket 208 holds a corresponding cable connector 960. Fig. 9 As shown in more detail, there is a cable connector cutout 902 aligned with each hole 908 for allowing the base 924 of each connector 960 to be embedded in the connector bracket 208 so that the bottom surface 922 of the cable connector 960 protrudes below or is aligned with the bottom surface 912 of the connector bracket 208. Figure 3 In the illustrated engaged position, contact points 920 associated with the cable connector 960 contact corresponding signal pads 804 of the DUT 250 , while a bottom surface 912 of the connector holder 208 is proximate to and / or in contact with other portions of the DUT 250 .

[0060] Although connector bracket 208 has four holes 908, connector bracket 208 can be used to perform testing (e.g., single-ended testing) using two cables instead of four cables if only two cable connectors 960 are held in connector bracket 208. In addition, although connector bracket 208 has four holes 908 and connector bracket 508 has two holes, other connector brackets having other numbers of holes can also be used with fixture 200.

[0061] Fig.11 1 is an isometric view of a system 1100 configured to implement one or more aspects of various embodiments. As shown, the cable 270 connected to the cable connector in the connector bracket 208 can be connected to the network analyzer 1110 at its other end 1102, 1104, 1106 and 1108. Thus, when the fixture 200 is in Figure 3 When the DUT 250 is in the engaged position shown, the DUT 250 is in electrical communication with the network analyzer 1110, and the test engineer can see the test results of the DUT 250 on the display 1114 of the network analyzer 1110. The test engineer can control the tests run by the network analyzer 1110 through the controls on the control panel 1112 of the network analyzer 1110. When the test engineer is satisfied with the test results of the DUT 250, the test engineer moves the handle 224 of the fixture 200 to the ready position as shown, removes the DUT 250, places a new DUT 250 on the device holder 240, moves the handle 224 of the fixture 200 to the ready position as shown, removes the DUT 250, places a new DUT 250 on the device holder 240, moves the handle 224 of the fixture 200 to the ready position as shown, and removes the DUT 250. Figure 3 The bonding position is shown, and the new DUT 250 can be tested using the network analyzer 1110.

[0062] In summary, embodiments of the present disclosure set forth a fixture for holding a device under test (DUT) during testing. The fixture includes: a connector holder having holes, each hole being configured to hold a cable connector; a device holder configured to hold the device in a test position; and a push rod configured to support the connector holder and operable to move the connector holder. When the push rod moves the connector holder to an engagement position in the fixture, the contact points of the connector in the connector holder move to contact with the signal pads of the device. The fixture enables rapid testing of the device by simultaneously moving multiple contact points of the cable connector to contact with the signal pads of the device. Using a locking mechanism to move the push rod and the connector holder to an engagement position applies a consistent force from the contact points associated with the cable connector to the test pads associated with each device tested in sequence, thereby enabling consistent and repeatable testing of each device.

[0063] At least one technical advantage of the disclosed design over the prior art is that, using the disclosed design, devices can be tested much faster than prior art designs and techniques. Another technical advantage is that the disclosed design enables more robust and consistent device-to-device testing than can be achieved using prior art designs and techniques. Another technical advantage is that the disclosed design reduces wear on cable connectors, thereby reducing testing costs, compared to prior art designs and techniques. These technical advantages provide one or more technical improvements over prior art methods.

[0064] 1. In various embodiments, a system for testing multiple devices includes: a connector bracket having a plurality of holes, wherein each hole included in the plurality of holes is configured to hold a corresponding cable connector connected to a cable; a device bracket, wherein the device bracket is configured to hold a first device in a test position; and an engagement mechanism, wherein the engagement mechanism supports the connector bracket and is operable to move the connector bracket to an engagement position, wherein, when the first device is held in the test position by the device bracket and a first hole included in the plurality of holes holds a first cable connector, a contact point associated with the first cable connector contacts a signal pad associated with the first device.

[0065] 2. A system according to claim 1, wherein the connector bracket includes a first cable connector cutout, the first cable connector cutout is aligned with the first hole so that when the first hole holds the first cable connector, the contact point associated with the first cable connector is aligned with the bottom surface of the connector bracket.

[0066] 3. The system of any of clauses 1-2, wherein the connector bracket has a cable end cutout.

[0067] 4. A system according to any one of clauses 1-3, wherein: the thickness of the connector bracket is between the top surface of the cable connector cutout and the surface of the connector bracket opposite to the top surface of the cable connector cutout; and the connector bracket is configured so that the first cable connector and the cable end of the cable connected to the first cable connector clamp the thickness.

[0068] 5. The system of any one of clauses 1-4, wherein the device holder comprises at least two guide pins configured to fit into corresponding guide holes associated with the first device.

[0069] 6. The system of any one of clause 5, wherein the height of each guide pin included in the at least two guide pins is less than or equal to the sum of the height of the device support and the thickness of the first device.

[0070] 7. The system of any of clauses 1-6, further comprising a screw that adjusts an amount of force applied by the connector bracket to the first component when the engagement mechanism is operated to move the connector bracket.

[0071] 8. The system of any one of clauses 1-7, further comprising: a base beneath the device holder; and a pad compressed between the device holder and the base when the engagement mechanism is operated to move the connector holder to the engagement position.

[0072] 9. The system of clause 8, wherein the pad comprises rubber.

[0073] 10. The system of any of clauses 1-9, further comprising a connector bracket frame, wherein the connector bracket is removably connected to the connector bracket frame, and the connector bracket frame is connected to the engagement mechanism.

[0074] 11. A system for testing multiple devices, comprising: a first cable; a first cable connector, the first cable connector being connected to the first cable; a connector bracket, the connector bracket having a plurality of holes, wherein a first hole included in the plurality of holes holds the first cable connector; a device bracket, the device bracket being configured to hold a first device in a test position; and an engagement mechanism, the engagement mechanism supporting the connector bracket and being operable to move the connector bracket to an engagement position, wherein when the first device is held in the test position by the device bracket, a first contact point associated with the first cable connector contacts a first signal pad associated with the first device.

[0075] 12. The system of clause 11, wherein the connector bracket includes a first cable connector cutout that is aligned with the first hole so that the first contact point associated with the first cable connector is aligned with a bottom surface of the connector bracket.

[0076] 13. The system of any of clauses 11-12, wherein the connector holder has a cable end cutout.

[0077] 14. The system of any of clauses 11-13, wherein the connector holder is clamped between the first cable connector and a cable end of the first cable.

[0078] 15. The system of any of clauses 11-14, wherein the device holder comprises at least two guide pins configured to fit into corresponding guide holes associated with the first device.

[0079] 16. The system of clause 15, wherein a height of each guide pin included in the at least two guide pins is less than or equal to a sum of a height of the device support and a thickness of the first device.

[0080] 17. The system of any of clauses 11-16, further comprising a screw that adjusts an amount of force applied by the connector bracket to the first component when the engagement mechanism is operated to move the connector bracket.

[0081] 18. The system according to any one of clauses 11-17 further includes: a support frame, which supports the coupling mechanism; a base, which supports the support frame; a guide rail, which is rigidly connected to the support frame and the base; and a guide, which is rigidly connected to the connector bracket and can be operated to slide along the guide rail.

[0082] 19. The system according to any one of clauses 11-18, further comprising: one or more second cables; one or more second cable connectors, wherein: each of the second cable connectors is connected to a different second cable; one or more second holes included in the plurality of holes hold a corresponding second cable connector; and when the first device is held in the test position by the device holder, a second contact point associated with the one or more second cable connectors contacts a second signal pad associated with the first device.

[0083] 20. The system of clause 19, further comprising a network analyzer, wherein the first cable and the one or more second cables are connected to the network analyzer.

[0084] Any and all combinations of any claim elements recited in any claim and / or any elements described in this application, in any manner, are within the intended scope of the invention and protection.

[0085] The description of the various embodiments is given for purposes of illustration, but is not intended to be exhaustive or limited to the embodiments disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments.

[0086] The aspects of the present embodiment may be embodied as a system, an apparatus or a method. Therefore, the aspects of the present disclosure may take the form of a complete hardware embodiment or a partial hardware embodiment.

[0087] While the foregoing is directed to embodiments of the present disclosure, other and further embodiments of the disclosure may be devised without departing from the basic scope thereof, and the scope of the disclosure is determined by the claims that follow.

Claims

1. A system for testing a plurality of devices, comprising: a connector bracket having a plurality of apertures, wherein each aperture included in the plurality of apertures is configured to retain a corresponding cable connector connected to a cable; a device support configured to hold a first device in a testing position; as well as an engagement mechanism that supports the connector holder and is operable to move the connector holder to an engagement position, wherein, when the first device is held in the test position by the device holder and a first hole included in the plurality of holes holds a first cable connector, a contact point associated with the first cable connector contacts a signal pad associated with the first device.

2. The system of claim 1 , wherein the connector bracket includes a first cable connector cutout, the first cable connector cutout being aligned with the first hole so that when the first hole holds the first cable connector, the contact point associated with the first cable connector is aligned with a bottom surface of the connector bracket.

3. The system of claim 1, wherein the connector bracket has a cable end cutout.

4. The system of claim 1, wherein: The connector bracket has a thickness between a top surface of the cable connector cutout and a surface of the connector bracket opposite the top surface of the cable connector cutout; and The connector bracket is configured such that the first cable connector and a cable end of a cable connected to the first cable connector clamp the thickness.

5. The system of claim 1, wherein the device holder comprises at least two guide pins configured to fit into corresponding guide holes associated with the first device. 6 . The system of claim 5 , wherein a height of each guide pin included in the at least two guide pins is less than or equal to a sum of a height of the device support and a thickness of the first device.

7. The system of claim 1, further comprising a screw that adjusts an amount of force applied by the connector bracket to the first component when the engagement mechanism is operated to move the connector bracket.

8. The system of claim 1, further comprising: a base, the base being below the device support; as well as A pad is compressed between the device holder and the base when the engagement mechanism is operated to move the connector holder to the engaged position.

9. The system of claim 8, wherein the pad comprises rubber.

10. The system of claim 1, further comprising a connector bracket frame, wherein the connector bracket is removably connected to the connector bracket frame, and the connector bracket frame is connected to the engagement mechanism.

11. A system for testing a plurality of devices, comprising: First Cable; a first cable connector connected to the first cable; a connector bracket having a plurality of holes, wherein a first hole included in the plurality of holes retains the first cable connector; a device support configured to hold a first device in a testing position; as well as an engagement mechanism that supports the connector holder and is operable to move the connector holder to an engagement position, wherein a first contact point associated with the first cable connector contacts a first signal pad associated with the first device when the first device is held in the test position by the device holder.

12. The system of claim 11, wherein the connector bracket includes a first cable connector cutout aligned with the first hole such that the first contact point associated with the first cable connector is aligned with a bottom surface of the connector bracket.

13. The system of claim 11, wherein the connector bracket has a cable end cutout.

14. The system of claim 11, wherein the connector holder is clamped between the first cable connector and a cable end of the first cable.

15. The system of claim 11, wherein the device holder comprises at least two guide pins configured to fit into corresponding guide holes associated with the first device.

16. The system of claim 15, wherein a height of each guide pin included in the at least two guide pins is less than or equal to a sum of a height of the device support and a thickness of the first device.

17. The system of claim 11, further comprising a screw that adjusts an amount of force applied by the connector bracket to the first component when the engagement mechanism is operated to move the connector bracket.

18. The system of claim 11, further comprising: a support frame, the support frame supporting the engagement mechanism; a base, the base supporting the support frame; A guide rail, the guide rail being rigidly connected to the support frame and the base; as well as A guide is rigidly connected to the connector bracket and is operable to slide along the guide rail.

19. The system of claim 11, further comprising: one or more second cables; One or more second cable connectors, wherein: Each of the second cable connectors is connected to a different second cable; One or more second holes included in the plurality of holes retain a corresponding second cable connector; and When the first component is held in the testing position by the component holder, second contact points associated with the one or more second cable connectors contact second signal pads associated with the first component.

20. The system of claim 19, further comprising a network analyzer, wherein the first cable and the one or more second cables are connected to the network analyzer.

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